JP2023545138A - Built-in capacitor detection method, device, detection equipment, and storage medium - Google Patents

Abstract

Embodiments of the present invention relate to built-in capacitor detection methods, devices, detection equipment, and storage media. The method is to obtain a charging current value of each detection target channel, and the built-in capacitor of the detection target chip is connected to at least one detection target channel via a pin of the detection target chip. , each channel to be detected is controlled to charge the connected built-in capacitor with the corresponding charging current value, and the detected voltage value of each built-in capacitor is obtained, and based on each charging current value and each detected voltage value. and determining whether each built-in capacitor of the detection target chip is correctly mounted, and generating a detection result. By adopting the above technical means, the embodiment of the present invention can shorten the time required to detect the built-in capacitor of the chip to be detected, improve the detection efficiency of the built-in capacitor, and improve the detection efficiency of the chip to be detected. Detection of built-in capacitors at the mass production stage can be realized. [Selection diagram] Figure 1

Description

TECHNICAL FIELD The present invention relates to the technical field of detection, and in particular to a method, device, detection device, and storage medium for detecting a built-in capacitor.

Currently, most chip external pins employ connections with capacitors inside the chip to achieve the filtering performance of the chip pins.

In order to ensure that there are no omissions or mounting errors in capacitor mounting during the chip production process, it is necessary to detect built-in capacitors corresponding to chip pins according to the chip design drawing. Traditional capacitor testing techniques often employ oscillator circuits to obtain the capacitance size by measuring the resonant frequency, and further determine whether the chip's built-in capacitors are correctly mounted. .

However, with such a detection method, it takes a long time to detect the built-in capacitor of the chip once, and the cost is high, and it is not possible to realize the detection of the built-in capacitor at the stage of mass production of the chip.

In view of this, embodiments of the present invention provide a built-in capacitor detection method, apparatus, detection device, and storage medium for realizing built-in capacitor detection during the mass production stage of chips.

In a first aspect, embodiments of the present invention provide a method for detecting a built-in capacitor, the method comprising:
acquiring a charging current value of each detection target channel, the built-in capacitor of the detection target chip being connected to at least one detection target channel via a pin of the detection target chip;
controlling each detection target channel to charge a connected built-in capacitor with a corresponding charging current value, and obtaining a detected voltage value of each built-in capacitor;
The method includes determining whether each built-in capacitor of the detection target chip is correctly mounted based on each charging current value and each detected voltage value, and generating a detection result.

In a second aspect, embodiments of the present invention provide an apparatus for detecting a built-in capacitor, the apparatus comprising:
A current acquisition module for acquiring a charging current value of each detection target channel, wherein a built-in capacitor of the detection target chip is connected to at least one detection target channel via a pin of the detection target chip. module and
a voltage detection module for controlling each detection target channel to charge a connected built-in capacitor with a corresponding charging current value and acquiring a detected voltage value of each built-in capacitor;
A result generation module is provided for determining whether each built-in capacitor of the detection target chip is correctly mounted based on each charging current value and each detected voltage value, and generating a detection result.

As a third aspect, embodiments of the invention provide a detection device, the detection device comprising:
one or more processors;
a memory for storing one or more programs;
When the one or more programs are executed by the one or more processors, the one or more processors implement the built-in capacitor detection device method according to the embodiment of the present invention.

As a fourth aspect, embodiments of the present invention further provide a computer-readable storage medium on which a computer program is stored, and when the program is executed by a processor, detecting the built-in capacitor according to the embodiments of the present invention. An apparatus method is implemented.

In the above technical means of detecting the built-in capacitor, the charging current value of the detection target channel connected to each built-in capacitor of the detection target chip via the pin of the detection target chip is obtained, and each detection target channel is charged. The built-in capacitor connected to the corresponding detection target channel is charged with each current value, the detected voltage value of each built-in capacitor is acquired, and the detection target chip is further detected based on the charging current value and charging voltage value of each built-in capacitor. A detection result is generated by determining whether each built-in capacitor is correctly mounted. By adopting the above-mentioned technical means, the embodiment of the present invention can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and also realizes parallel detection of each built-in capacitor of the chip to be detected. As a result, the time required to detect the built-in capacitor of the detection target chip can be shortened, the detection efficiency of the built-in capacitor can be improved, and the detection of the built-in capacitor of the detection target chip at the mass production stage can be realized.

Other features, objects and advantages of the invention will become apparent from the detailed description given of non-limiting examples with reference to the following drawings.

3 is a flowchart of a method for detecting a built-in capacitor provided by Embodiment 1 of the present invention. 3 is a flowchart of a method for detecting a built-in capacitor provided by a second embodiment of the present invention. FIG. 3 is a structural block diagram of a built-in capacitor detection device provided by a third embodiment of the present invention; FIG. 4 is a schematic structural diagram of a detection device provided by Example 4 of the present invention.

The invention will now be described in more detail with reference to the accompanying drawings and examples. It is to be understood that the specific examples described herein are used only for interpretation of the invention and are not limitations thereon. It should be noted that for convenience of explanation, only the parts related to the present invention are shown in the attached drawings, rather than the entire contents. Moreover, unless there is a contradiction, the embodiments of the present invention and the features in the embodiments can be combined with each other.

Embodiment 1 of the present invention provides a method for detecting a built-in capacitor. This method can be carried out by a detection device for the built-in capacitor, which device can be realized by software and/or hardware, can be integrated into the detection equipment, and is suitable for the case of performing detection on the built-in capacitor of the chip. There is. FIG. 1 is a flowchart of a built-in capacitor detection method provided by the first embodiment of the present invention. As shown in FIG. 1, the built-in capacitor detection method provided in this embodiment may include the following.

In S110, the charging current value of each detection target channel is acquired, and the built-in capacitor of the detection target chip is connected to at least one detection target channel via the pin of the detection target chip.

Here, the charging current value can be understood as the current value of the current that should be input to the connected built-in capacitor in each detection channel when detecting the built-in capacitor. The detection target chip can be understood as a chip whose built-in capacitor needs to be detected, for example, a mass-produced chip. The detection target channel may be a detection channel that needs to be opened in this detection, different detection target channels are connected to different pins of the detection target chip, and the pins connected to each detection target channel are connected to the same detection target It may be a pin of a chip or a pin of a different detection target chip. That is, the detection device may detect the built-in capacitor of only one chip to be detected each time, or may detect the built-in capacitors of different chips to be detected. Specifically, it may be determined according to actual detection needs and the number of built-in capacitors to be detected in the detection target chip. For example, if the number of detection target chips to be detected is large and the number of built-in capacitors to be detected in each detection target chip is small (for example, not exceeding 180), multiple detection target chips may be detected simultaneously. . On the other hand, if the number of detection target chips to be detected is small or the number of built-in capacitors to be detected in each detection target chip is large (for example, greater than 300), only one detection target chip may be detected each time. .

In this example, the detection device may be provided with a plurality of detection channels, e.g. the number of detection channels may be greater than 100 or greater than 200, and the detection device may be provided with e.g. 360 detection channels. It's fine. Correspondingly, when performing detection on each built-in capacitor in the chip to be detected, the pins connected to each built-in capacitor can be connected to one or two detection channels of the detection equipment. For example, if one end of the built-in capacitor is grounded, a pin connected to the other end of the built-in capacitor can be connected to one detection channel of the detection instrument. On the other hand, if both ends of the built-in capacitor are not grounded, connect the pin connected to one end of the built-in capacitor to one detection channel of the detection device, and connect the pin connected to the other end of the built-in capacitor to one detection channel of the detection device. can be connected to one other detection channel. In the following, a case where one end of the built-in capacitor is grounded will be described as an example.

In one embodiment, the charging current value for each detection target channel may be set by the examiner. For example, the examiner needs to connect each built-in capacitor to be detected in the chip to be detected to a different detection channel of the detection equipment via the pin connected to the built-in capacitor, and then open it this time (i.e., the current charge (required) The detection target channel and the charging current value of each detection target channel can be set by the host device. That is, the examiner may input the charging current value of each detection channel using the higher-level device, and the higher-level device may acquire the detected current value input by the examiner and write it into a memory arranged in the detection device. Here, the memory of the detection instrument may be any type of memory, preferably a Double Data Rate synchronous dynamic random memory. This memory may be physically connected to a processor of the detection instrument, which may be a Field Programmable Gate Array (FPGA).

In other embodiments, the charging current value for each channel to be detected may be calculated by the detection device. In this case, acquiring the charging current value of each detection target channel means acquiring capacitor parameters including the theoretical capacity value, charging current threshold, and detection voltage threshold of the built-in capacitor connected to each detection target channel. Preferably, the method further includes determining a charging current value of each detection target channel based on a preset detection time and the capacitor parameter.

Here, the capacitor parameters may include a theoretical capacitance value, a charging current threshold, and a detection voltage value of the built-in capacitor, and the theoretical capacitance value can be understood as the theoretical value of the capacitance of the built-in capacitor, and the charging current threshold is , the current threshold when the built-in capacitor is operating normally, and can be understood as including the maximum current threshold and minimum current threshold, and the detection voltage threshold is the current threshold when the built-in capacitor is operating normally. It can be understood as a voltage value. The capacitor parameters of each built-in capacitor can be input into the host machine by the examiner. The detection time range can be understood as the detection time at which the current detection is performed, and may be a preset time value or a preset time range. An example in which the detection time is a preset time value will be described below.

In the above embodiment, the examiner can set the current detection time, and accordingly, the detection equipment will set the voltage value of each built-in capacitor to the appropriate voltage value within this detection time in order to perform the detection. By this, the detection of each built-in capacitor is completed when this detection time is reached, and the detection of each built-in capacitor in the same detection is completed as synchronized as possible, and the examiner's Waiting time can be reduced.

For example, before detecting the current mass-produced detection target chip, the examiner may identify the detection target channels that need to be opened this time, and the connection relationship between each detection target channel and each built-in capacitor in the detection target chip. can be set, and the capacitor parameters and detection time of each built-in capacitor of the chip to be detected can be input to the host device. Accordingly, the host device can write the identification information of the detection target channel that needs to be opened this time inputted by the examiner, the capacitor parameters of the built-in capacitor connected to each detection target channel, and the detection time to the detection equipment. . As a result, the detection device determines the detection target channels that need to be opened based on the identification information written to the host machine, and also determines the detection time written to the host machine and the built-in capacitor connected to each detection target channel. A charging current value of the detection channel can be determined based on the capacitor parameters. For example, the charging current value of each detection target channel can be calculated based on the formula i ₀ = C ₀ × u ₀ /t ₀ , where i ₀ is the charging current value of the detection target channel, and C ₀ is the detection target channel. The theoretical capacitance value of the built-in capacitor connected to the channel, u ₀ is the detected voltage value of the built-in capacitor connected to the channel to be detected, and t ₀ is the detection time.

When writing the identification information of the detection target channel that needs to be opened this time, which was input by the examiner, to the detection device, the host machine, for example, writes the detection channels that need to be opened and the detection channels that do not need to be opened in the detection device. A channel register may be provided for recording, each bit in the channel register corresponding to one detection channel, where a bit being 1 indicates that its corresponding detection channel needs to be opened upon detection. A bit of 0 indicates that there is no need to open the corresponding detection channel at the time of detection. As a result, the host device sets the corresponding bit to 1 in the channel register of the detection target channel that needs to be opened this time, and sets the corresponding bit to 0 in the channel register of the non-detection target channel that needs to be opened this time. be able to.

As will be appreciated, the examiner typically considered the charging current threshold of the built-in capacitor when setting the detection time. That is, the detection time set by the examiner usually does not cause the actual charging current of the built-in capacitor to fall outside the charging current range during normal operation. Therefore, in this embodiment, when determining the charging current value of each channel to be detected, the charging current threshold value of each built-in capacitor is not taken into consideration, but only based on the preset detection time and the theoretical capacitance value of the built-in capacitor. A charging current value for each detection channel may be determined, in which case the capacitor parameters may accordingly only include a theoretical capacitance value and a detection voltage threshold.

In S120, each channel to be detected is controlled to charge the connected built-in capacitor with a corresponding charging current value, and the detected voltage value of each built-in capacitor is obtained.

Here, the detected voltage value of the built-in capacitor can be understood as the voltage value of the built-in capacitor detected during charging.

In this embodiment, the detection device can detect the detection capacitance of the built-in capacitor connected to each detection target channel in parallel. Controls the charging component to charge the built-in capacitor connected to the detection target channel to which it belongs with the charging current value of the detection target channel to which it belongs, and also controls the detection components installed in each detection target channel to connect the detection target channel to which it belongs. The detection voltage value of the detection target channel can be detected.

In one embodiment, the live component located within the sensing channel may be a Parametric Measurement Unit (PMU), and the sensing component located within the sensing channel may be an Analog to Digital Conversion (PMU). Conversion, ADC) chip may be used. Accordingly, controlling each detection target channel to charge the connected built-in capacitor with a corresponding charging current value and acquiring the detected voltage value of each built-in capacitor is as follows for each detection target channel: Controlling the parameter measurement unit in the detection target channel to charge a built-in capacitor connected to the detection target channel with a target current, and converting the detected voltage value of the built-in capacitor by an analog-to-digital conversion chip in the detection target channel. The current value of the target current is a charging current value of a built-in capacitor connected to the channel to be detected.

In the above embodiment, a parameter measurement unit and an analog-to-digital conversion chip may be provided in each detection channel of the detection device, and the parameter measurement unit in a certain detection target channel is used for analog-to-digital conversion in the detection target channel to which it belongs. The analog-to-digital conversion chip in a certain detection target channel may be connected to the pin of the detection target chip and the processor of the detection equipment, respectively. .

Exemplarily, the processor of the sensing device may cause the parameter measurement unit in each sensing target channel to perform parameter measurement to charge a built-in capacitor connected to the sensing target channel according to a charging current value of the corresponding sensing target channel. Charging commands can be sent simultaneously to control the unit. Accordingly, after receiving the charging command sent from the processor, the parameter measuring unit in each sensing target channel will be connected to the internal sensing target channel to which it belongs, according to the charging current value corresponding to the charging command. Capacitors can be charged.

In this embodiment, each detection target channel may continue to charge the connected built-in capacitor until the built-in capacitor reaches the maximum amount of electricity that it can accommodate or until it receives a charging stop command sent from the processor. However, when the charging time reaches a preset timeout time, charging of the connected built-in capacitor may be stopped. In this case, the built-in capacitor detection method provided by this embodiment is such that when the charging time of each built-in capacitor reaches a preset timeout time, each detection target channel is stopped from charging the connected built-in capacitor. It is preferable to further include controlling to stop. Here, the timeout time may be set by the examiner, or may be calculated based on the detection time set by the examiner using the detection device. For example, the timeout time may be a set multiple of the detection time (for example, 3 times ), etc. If the detection device can determine whether or not the built-in capacitor connected to the detection target channel is correctly mounted based on the magnitude or number of detection voltage values detected in the detection target channel, the detection device A charging stop command may be sent, or it may be determined whether the built-in capacitor connected to the corresponding detection channel is correctly mounted or not based on the magnitude or number of detection voltage values detected in all detection target channels. In this case, a charging stop command may be sent to each detection target channel. This embodiment is not limited to this.

In S130, based on each charging current value and each detected voltage value, it is determined whether each built-in capacitor of the detection target chip is correctly mounted, and a detection result is generated.

In this embodiment, the method for determining whether each built-in capacitor is correctly mounted can be selected as necessary. For example, the difference value between the first voltage value that the voltage value of a certain built-in capacitor actually reaches within a certain time period and the second voltage value that should be reached within that time period is within a certain voltage range. If it is within the range, it is determined that the built-in capacitor is correctly mounted, and if not, it is determined that the built-in capacitor is not correctly mounted. In addition, the capacitance value of the built-in capacitor is calculated based on the charging current value and detected voltage value of the built-in capacitor, and if the difference between the capacitance value and the theoretical capacitance value is within a certain error range, the built-in capacitor is It may be determined that the capacitor is correctly mounted, and if not, it may be determined that the built-in capacitor is not correctly mounted.

In the built-in capacitor detection method provided in the first embodiment of the present invention, the charging current value of the detection target channel connected to each built-in capacitor of the detection target chip via the pin of the detection target chip is acquired, and each detection target The built-in capacitor connected to the corresponding detection target channel is charged with each charging current value of the channel, the detected voltage value of each built-in capacitor is obtained, and then the detection voltage value of each built-in capacitor is obtained. A detection result is generated by determining whether each built-in capacitor of the detection target chip is correctly mounted. By adopting the above technical means, this embodiment can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and also realizes parallel detection of each built-in capacitor of the chip to be detected. , the time required to detect the built-in capacitor of the detection target chip can be shortened, the detection efficiency of the built-in capacitor can be improved, and the detection of the built-in capacitor of the detection target chip at the mass production stage can be realized.

FIG. 2 is a flowchart of the built-in capacitor detection method provided by this embodiment. This embodiment is based on the above-mentioned embodiments, and includes the following steps: "Determine whether or not each built-in capacitor of the detection target chip is correctly mounted based on each charging current value and each detected voltage value." By calculating the detection capacitance value of each built-in capacitor based on the charging current value and detection voltage value of each built-in capacitor, and by sending the detection capacitance value of each built-in capacitor to the host device, the host device can detect each It is optimized to determine whether each built-in capacitor of the chip to be detected is correctly mounted based on the capacitance value.

Furthermore, before each of the detection target channels is controlled and the connected built-in capacitor is charged with the corresponding charging current value, a voltage of 0V is applied to the connected built-in capacitor by controlling each of the detection target channels respectively. The method further includes discharging residual charge in each built-in capacitor.

Accordingly, as shown in FIG. 2, the built-in capacitor detection method provided in this embodiment may include the following.

In S210, the charging current value of each detection target channel is acquired, and the built-in capacitor of the detection target chip is connected to at least one detection target channel via the pin of the detection target chip.

In S220, each detection target channel is controlled to apply a voltage of 0V to the connected built-in capacitor, thereby discharging the residual charge in each built-in capacitor.

In this example, since there is a possibility that charge may remain in the built-in capacitor of the detection target chip, after enabling each detection target channel, first control the parameter measurement unit in each detection target channel to detect the detection target to which it belongs. By outputting 0V to the built-in capacitors connected to the channels, each built-in capacitor may be controlled to be discharged so that the residual charge in the built-in capacitors does not affect the detection of the built-in capacitors. Here, the residual charge can be understood as the charge remaining in the built-in capacitor.

In S230, for each channel to be detected, the parameter measurement unit in the channel to be detected is controlled to charge a built-in capacitor connected to the channel to be detected with a target current, and the analog/digital capacitor in the channel to be detected is charged with a target current. A detection voltage value of the built-in capacitor is periodically detected by a conversion chip, and the current value of the target current is a charging current value of the built-in capacitor connected to the detection target channel.

In S240, the detected capacitance value of each built-in capacitor is calculated based on the charging current value and detected voltage value of each built-in capacitor.

Here, the detected capacitance value can be understood as the capacitance value of the built-in capacitor obtained by detection by the detection device.

Specifically, the amount of change in the detected voltage value of each built-in capacitor per unit time is calculated based on the monitored voltage value of each built-in capacitor in at least two detection cycles, and the amount of change in the detected voltage value of each built-in capacitor per unit time is calculated based on the charging current of each built-in capacitor and the unit time of each built-in capacitor. The detected capacitance value of each built-in capacitor can be calculated based on the amount of change in the detected voltage value.

In order to further improve the accuracy of the calculated detection capacitance value of the built-in capacitor and improve the accuracy of the finally generated detection result, based on the charging current value and detection voltage value of each built-in capacitor, Calculating the detected capacitance value of each built-in capacitor means that the built-in capacitor is calculated in advance from a preset minimum voltage value based on the detected voltage value of the built-in capacitor within each detection cycle. specifying a voltage rise time for rising to a preset maximum voltage value; and determining a voltage rise time between the charging current value, the voltage rise time, and the preset maximum voltage value and the preset minimum voltage value. Preferably, the method further includes calculating a detected capacitance value of the built-in capacitor based on the voltage difference value. Here, the preset minimum voltage value and the preset maximum voltage value may be two voltage values during a time period when charging of the capacitor is stable, and may be set in advance by the examiner.

For example, the detection device controls each detection target channel to charge the connected built-in capacitor, and then periodically detects the detected voltage value of each built-in capacitor, so that the detected voltage value is It determines whether the preset minimum voltage value has been reached, and when the preset minimum voltage value is reached, timekeeping starts, and the detected voltage value of the built-in capacitor continues to reach the preset maximum voltage value. It is determined whether the voltage has reached the preset maximum value, and when the preset maximum voltage value is reached, the time measurement is stopped to obtain the voltage rise time of the built-in capacitor. Then, calculate the ratio between the difference value between the preset maximum voltage value and the preset minimum voltage value and the voltage rise time, and then calculate the product of this ratio and the charging current value of the built-in capacitor. By doing this, the detected capacitance value of the built-in capacitor can be obtained.

In S250, by transmitting the detected capacitance value of each built-in capacitor to the host machine, the host machine determines whether each built-in capacitor of the detection target chip is correctly mounted based on each detected capacitance value, and performs the detection. produce results;

For example, after detecting the detection capacitance value of each built-in capacitor, the detection device can store the detection capacitance value of each built-in capacitor in memory and notify the host device of completion of detection. By setting the internal detection register from 0 to 1, it can be indicated that the detection of the detection capacitance value of each built-in capacitor has been completed. When the host machine detects that the detection register is set to 1, it determines that the detection of the detection capacitance value of each built-in capacitor has been completed, reads the detection capacitance value of each built-in capacitor from the memory of the detection device, and further performs further processing. It can be determined whether the difference value between the detected capacitance value and the theoretical capacitance value of each built-in capacitor is within a preset capacitance range. If it is within the range, the built-in capacitor is correctly mounted. If not, it can be determined that the built-in capacitor is not correctly mounted, and furthermore, it can be determined that the detection result of the detection target chip is defective.

In the built-in capacitor detection method provided in the second embodiment of the present invention, the charging current value of each detection target channel is acquired, and first, a voltage of 0V is applied to the connected built-in capacitor by controlling each detection target channel. Then, by controlling the detection target channel to charge the connected built-in capacitor with the corresponding charging current value and detecting the detected voltage value of each built-in capacitor, each charging current value and detected voltage value are determined. The detected capacitance value of each built-in capacitor is calculated based on the detected capacitance value of each built-in capacitor, and the detected capacitance value of each built-in capacitor is sent to the host device.The host device then correctly detects each built-in capacitor based on the detected capacitance value of each built-in capacitor. Determine whether it is implemented or not and generate a detection result. By adopting the above-mentioned technical means, this embodiment can further improve the accuracy of the detected capacitance value of the detected built-in capacitor, thereby improving the accuracy of the detection result of the chip to be detected. be able to.

Embodiment 3 of the present invention provides a built-in capacitor detection device. The device can be realized by software and/or hardware and can be integrated into the detection equipment and can perform the detection on the built-in capacitor by performing the method of detecting the built-in capacitor. FIG. 3 is a structural block diagram of a built-in capacitor detection device provided by a third embodiment of the present invention. As shown in FIG. 3, the device includes a current acquisition module 301, a voltage detection module 302, and a result generation module 303,
The current acquisition module 301 is used to acquire the charging current value of each detection target channel, and the built-in capacitor of the detection target chip is connected to at least one detection target channel via a pin of the detection target chip. .
The voltage detection module 302 is used to control each detection target channel to charge the connected built-in capacitors with a corresponding charging current value, and to obtain the detected voltage value of each built-in capacitor.
The result generation module 303 is used to determine whether each built-in capacitor of the detection target chip is correctly mounted based on each charging current value and each detected voltage value, and to generate a detection result.

In the built-in capacitor detection device provided in the third embodiment of the present invention, the current acquisition module 301 acquires the charging current value of the detection target channel connected to each built-in capacitor of the detection target chip via the pin of the detection target chip. Then, the voltage detection module 302 charges the built-in capacitor connected to the corresponding detection target channel with each charging current value of each detection target channel, obtains the detected voltage value of each built-in capacitor, and then the result generation module 303 Based on the charging current value and charging voltage value of each built-in capacitor, it is determined whether each built-in capacitor of the detection target chip is correctly mounted or not, and a detection result is generated. By adopting the above technical means, this embodiment can detect the capacitance value of the built-in capacitor without using an oscillation circuit, and also realizes parallel detection of each built-in capacitor of the chip to be detected. , the time required to detect the built-in capacitor of the detection target chip can be shortened, the detection efficiency of the built-in capacitor can be improved, and the detection of the built-in capacitor of the detection target chip at the mass production stage can be realized.

In the above configuration, the voltage detection module 302 specifically controls the parameter measurement unit in the detection target channel for each detection target channel to supply a built-in capacitor connected to the detection target channel with a target current. The current value of the target current is used for charging and periodically detecting the detection voltage value of the built-in capacitor by an analog-to-digital conversion chip in the detection target channel, and the current value of the target current is determined by the built-in capacitor connected to the detection target channel. may be the charging current value.

In the above configuration, the result generation module 303 includes a capacitance calculation unit for calculating the detected capacitance value of each built-in capacitor based on the charging current value and detected voltage value of each built-in capacitor, and the detected capacitance of each built-in capacitor. A result generation unit for generating a detection result by transmitting the value to a higher-level machine so that the higher-level machine determines whether each built-in capacitor of a chip to be detected is correctly mounted based on each detected capacitance value. It may also include.

In the above configuration, the capacitance calculation unit calculates, for each built-in capacitor, a preset value of the built-in capacitor from a preset minimum voltage value based on a detected voltage value of the built-in capacitor within each detection cycle. a time detection subunit for specifying a voltage rise time for rising to a maximum voltage value; and a time detection subunit for determining a voltage rise time for rising to a maximum voltage value; and a capacitance calculation subunit for calculating a detected capacitance value of the built-in capacitor based on a voltage difference value between them.

Furthermore, the built-in capacitor detection device provided by this embodiment stops each detection target channel from charging the connected built-in capacitor when the charging time of each built-in capacitor reaches a preset timeout time. The battery may further include a charging stop module for controlling the battery to stop charging.

Furthermore, the built-in capacitor detection device provided by this embodiment controls each of the detection target channels before respectively controlling the detection target channels and charging the connected built-in capacitors with the corresponding charging current values. The device may further include a charge discharge module for discharging the residual charge of each built-in capacitor by applying a voltage of 0 V to the built-in capacitors connected to each other.

In the above configuration, the current acquisition module includes a parameter acquisition unit for acquiring capacitor parameters including a theoretical capacitance value, a charging current threshold value, and a detection voltage threshold value of a built-in capacitor connected to each detection target channel; The device may further include a current determining unit for determining a charging current value of each detection target channel based on the set detection time and the capacitor parameter.

The built-in capacitor detection device provided by the third embodiment of the present invention is capable of implementing the built-in capacitor detection method provided in any embodiment of the present invention, and corresponds to the implementation of the built-in capacitor detection method provided in any embodiment of the present invention. Equipped with functional modules and beneficial effects. Note that for technical details not explained in detail in this embodiment, reference may be made to the built-in capacitor detection method provided in any embodiment of the present invention.

FIG. 4 is a schematic structural diagram of a detection device provided by a fourth embodiment of the present invention, and as shown in FIG. 4, the detection device includes a processor 40 and a memory 41, and further includes a plurality of detection channels 42. It's okay. The number of processors 40 within the detection device may be one or more, and is illustrated as one processor 40 in FIG. Processor 40, memory 41, and each detection channel within the detection instrument may be connected by a bus or other means.

The memory 41 may include, as a computer readable storage medium, software programs, computer executable programs and modules, e.g. It may be used to store the current acquisition module 301, voltage detection module 302, and result generation module 303) in the device. The processor 40 implements the above-described built-in capacitor detection method by executing software programs, instructions, and modules stored in the memory 41 to perform various functional applications and data processing of the detection device.

The memory 41 mainly includes an operating system, a program storage area that can store application programs necessary for at least one function, and a data storage area that can store data generated in response to the use of the terminal. good. Memory 41 may also include high speed random access memory and may also include non-volatile memory, such as at least one magnetic disk storage component, flash memory component, or other non-volatile solid state storage component. In some examples, memory 41 may further include memories located remotely to processor 40, and these remote memories may be connected to the detection equipment via a network. Examples of such networks include, but are not limited to, the Internet, intranets, local area networks, mobile communication networks, and combinations thereof.

The detection channel 42 may include a parameter measurement unit 421 for charging the built-in capacitor, and an analog-to-digital conversion chip 422 for detecting the detected capacitance value of the built-in capacitor and converting it from an analog signal to a digital signal. . Embodiment 4 of the present invention further provides a storage medium containing computer-executable instructions for performing the built-in capacitor detection method when executed by a processor of a computer. The method includes acquiring a charging current value of each channel to be detected, and the built-in capacitor of the chip to be detected is connected to at least one channel to be detected via a pin of the chip to be detected. , each detection target channel is controlled to charge the connected built-in capacitor with the corresponding charging current value, and the detected voltage value of each built-in capacitor is obtained, and based on each charging current value and each detected voltage value. and determining whether each built-in capacitor of the detection target chip is correctly mounted, and generating a detection result.

Of course, in a storage medium containing computer-executable instructions provided in any of the embodiments of the present invention, the computer-executable instructions are not limited to the operation of the method described above, but are provided in any of the embodiments of the present invention. Related operations in the built-in capacitor detection method may also be performed.

From the above description of the embodiments, it will be clear to those skilled in the art that the invention can be implemented in software and the necessary general-purpose hardware, and can of course also be implemented in hardware, although in many cases the former is more suitable. This is a preferred embodiment. Based on this understanding, the essence of the technical means of the present invention or the part contributing to the prior art can be embodied in the form of a software product, and this computer software product is a computer flexible disk, a read-only It may be stored in a computer-readable storage medium such as Read-Only Memory (ROM), Random Access Memory (RAM), Flash memory (FLASH), hard disk, or optical disk, and may be stored in one computer device ( The method includes a number of instructions for causing a computer (which may be a personal computer, a server, a network device, etc.) to perform the methods described in each embodiment of the present invention.

In addition, in the embodiment of the built-in capacitor detection device described above, the units and modules provided are classified only by functional logic, but the classification is not limited to the above classification as long as the corresponding functions can be realized. Further, the specific names of each functional unit are also provided to facilitate mutual distinction, and do not limit the scope of protection of the present invention.

It should be noted that the above description is only illustrative of the preferred embodiment of the invention and the technical principles used. Those skilled in the art will appreciate that the invention is not limited to the particular embodiments described herein, and that various obvious changes, rearrangements, and substitutions can be made without departing from the scope of the invention. I can understand it. Therefore, although the present invention has been described in detail with reference to the above embodiments, the present invention is not limited to the above embodiments, and may further include other equivalent embodiments without departing from the spirit of the present invention. The scope of the invention is determined by the claims.

As a third aspect, embodiments of the invention provide a detection device, the detection device comprising:
one or more processors;
a memory for storing one or more programs;
When the one or more programs are executed by the one or more processors, the one or more processors implement the built-in capacitor detection method according to the embodiment of the present invention.

As a fourth aspect, embodiments of the invention further provide a computer readable storage medium on which a computer program is stored, which when executed by a processor, detects the built-in capacitor according to the embodiment of the invention. The method of output is realized.

Here, the capacitor parameters may include a theoretical capacitance value, a charging current threshold, and a detection voltage value of the built-in capacitor, and the theoretical capacitance value can be understood as the theoretical value of the capacitance of the built-in capacitor, and the charging current threshold is , the current threshold when the built-in capacitor is operating normally, and can be understood as including the maximum current threshold and minimum current threshold, and the detection voltage threshold is the current threshold when the built-in capacitor is operating normally. It can be understood as a voltage value. The capacitor parameters of each built-in capacitor can be input into the host machine by the examiner. The detection time can be understood as the detection time at which the current detection is performed, and may be a preset time value or a preset time range. An example in which the detection time is a preset time value will be described below.

When writing the identification information of the detection target channel that needs to be opened this time, which was input by the examiner, to the detection device, the host machine, for example, writes the detection channels that need to be opened and the detection channels that do not need to be opened in the detection device. A channel register may be provided for recording, each bit in the channel register corresponding to one detection channel, where a bit being 1 indicates that its corresponding detection channel needs to be opened upon detection. A bit of 0 indicates that there is no need to open the corresponding detection channel at the time of detection. As a result, the host device sets the corresponding bit to 1 in the channel register of the detection target channel that does not need to be opened this time, and sets the corresponding bit to 0 in the channel register of the non-detection target channel that needs to be opened this time. be able to.

Claims (10)

A method for detecting a built-in capacitor, the method comprising:
acquiring a charging current value of each detection target channel, the built-in capacitor of the detection target chip being connected to at least one detection target channel via a pin of the detection target chip;
controlling each detection target channel to charge a connected built-in capacitor with a corresponding charging current value, and obtaining a detected voltage value of each built-in capacitor;
A method characterized by comprising: determining whether each built-in capacitor of the detection target chip is correctly mounted based on each charging current value and each detected voltage value, and generating a detection result. . Controlling each of the detection target channels to charge the connected built-in capacitors with the corresponding charging current values, and acquiring the detected voltage values of each built-in capacitor,
For each detection target channel, a parameter measurement unit in the detection target channel is controlled to charge a built-in capacitor connected to the detection target channel with a target current, and an analog-to-digital conversion chip in the detection target channel including periodically detecting a detection voltage value of the built-in capacitor,
The method according to claim 1, wherein the current value of the target current is a charging current value of a built-in capacitor connected to the detection target channel. Determining whether each built-in capacitor of the detection target chip is correctly mounted based on each charging current value and each detected voltage value,
Calculating the detected capacitance value of each built-in capacitor based on the charging current value and detected voltage value of each built-in capacitor,
The method includes: transmitting the detected capacitance value of each built-in capacitor to a higher-level device, and determining whether each built-in capacitor of the detection target chip is correctly mounted based on the detected capacitance value by the higher-level device; 3. A method according to claim 2, characterized in that: Calculating the detected capacitance value of each built-in capacitor based on the charging current value and detected voltage value of each built-in capacitor is as follows:
For each built-in capacitor, determine the voltage rise time during which the built-in capacitor rises from a preset minimum voltage value to a preset maximum voltage value based on the detected voltage value of the built-in capacitor within each detection cycle. to do and
Calculating a detection capacitance value of the built-in capacitor based on the charging current value, the voltage rise time, and a voltage difference value between the preset maximum voltage value and the preset minimum voltage value. 4. The method of claim 3, comprising: A claim characterized in that the method further comprises controlling each detection target channel to stop charging the connected built-in capacitor when the charging time of each built-in capacitor reaches a preset timeout time. The method according to any one of 1 to 4. Before controlling each of the channels to be detected and charging the connected built-in capacitors with the corresponding charging current values,
Any one of claims 1 to 4, further comprising discharging the residual charge in each built-in capacitor by controlling each detection target channel and applying a voltage of 0V to the connected built-in capacitor. The method described in paragraph 1. Obtaining the charging current value of each detection target channel includes:
Obtaining capacitor parameters including the theoretical capacitance value, charging current threshold, and detection voltage threshold of the built-in capacitor connected to each detection target channel;
The method according to any one of claims 1 to 4, comprising determining a charging current value for each channel to be detected based on a preset detection time and the capacitor parameter. A built-in capacitor detection device,
A current acquisition module for acquiring a charging current value of each detection target channel, wherein a built-in capacitor of the detection target chip is connected to at least one detection target channel via a pin of the detection target chip. module and
a voltage detection module for controlling each detection target channel to charge a connected built-in capacitor with a corresponding charging current value and acquiring a detected voltage value of each built-in capacitor;
a result generation module for determining whether each built-in capacitor of the detection target chip is correctly mounted, based on each charging current value and each detected voltage value, and generating a detection result. Features a built-in capacitor detection device. A detection device,
one or more processors;
a memory for storing one or more programs;
When the one or more programs are executed by the one or more processors, the one or more processors execute the built-in capacitor detection device method according to any one of claims 1 to 7. A detection device characterized by realizing the following. A computer-readable storage medium storing a computer program, wherein when the program is executed by a processor, the built-in capacitor detection device method according to any one of claims 1 to 7 is realized. A computer-readable storage medium characterized by: