WO2022065735A1 - 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치 및 그 제어방법 - Google Patents
주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치 및 그 제어방법 Download PDFInfo
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- WO2022065735A1 WO2022065735A1 PCT/KR2021/011928 KR2021011928W WO2022065735A1 WO 2022065735 A1 WO2022065735 A1 WO 2022065735A1 KR 2021011928 W KR2021011928 W KR 2021011928W WO 2022065735 A1 WO2022065735 A1 WO 2022065735A1
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/02—Single-crystal growth by pulling from a melt, e.g. Czochralski method adding crystallising materials or reactants forming it in situ to the melt
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/002—Continuous growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/10—Crucibles or containers for supporting the melt
- C30B15/12—Double crucible methods
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B35/00—Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
- C30B35/002—Crucibles or containers
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B35/00—Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
- C30B35/005—Transport systems
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B35/00—Apparatus not otherwise provided for, specially adapted for the growth, production or after-treatment of single crystals or of a homogeneous polycrystalline material with defined structure
- C30B35/007—Apparatus for preparing, pre-treating the source material to be used for crystal growth
Definitions
- the present invention relates to a pre-melting apparatus for pre-melting silicon supplied to a main crucible and a control method thereof, and more particularly, to control the input amount by accurately measuring the input amount of molten silicon input to the ingot growth crucible. It relates to a pre-melting apparatus for pre-melting silicon supplied to a main crucible that can effectively perform the pre-melting apparatus and a method for controlling the same.
- Single crystal silicon is used as a basic material for most semiconductor components, and these materials are manufactured as single crystals with high purity.
- One of these manufacturing methods is the Czochralski method.
- the general ingot growth apparatus used by this Czochralski method grows the ingot while gradually pulling up after the seed crystal of single crystal silicon is contained at the interface of the molten silicon contained in the crucible.
- the continuous growth Czochralski method is a method of continuously growing an ingot while replenishing consumed molten silicon by continuously injecting solid polysilicon into the crucible. That is, the polysilicon particles and the dopant are continuously supplied to the inside of the crucible to always keep the level of the interface of the molten silicon constant, thereby supplementing the consumption of molten silicon during the growth of the ingot.
- a double crucible is formed by installing a partition wall inside the crucible to form an inner crucible and an outer crucible, so that polysilicon in the solid state is not attached to the ingot, and the solid state After the polysilicon supplied to the furnace is completely melted in the outer crucible, it flows into the inner crucible.
- U.S. Patent No. 7,635,414 discloses a structure of an overflow method in which a solid raw material is supplied into a pre-melting crucible and the raw material as much as the raised liquid level is put into an ingot growth crucible.
- the specific gravity is higher in the liquid state than in the solid state, and the silicon material in the solid state supplied by the specific gravity floats on the liquid level of the molten silicon in the liquid state.
- the partition wall installed in the preliminary melting crucible blocks the inflow of the solid raw material suspended at the liquid level, and the liquefied silicon moved through the space formed under the partition wall is located in the preliminary melting crucible and extends the supply pipe to the ingot growth crucible. It has a structure that is injected into an ingot growth crucible through
- This preliminary melting crucible is formed of a quartz material with low contamination and high heat resistance. Composing the body, bulkhead, and supply pipe of the preliminary melting crucible with quartz material may cause an increase in cost, and damage when handling each part may increase the risk of
- the main body, bulkhead, and supply pipe may be damaged due to volume expansion generated as the remaining molten silicon solidifies.
- the risk may increase, such as having to be very careful about the impact in the operation of the process.
- the preliminary melting crucible In order to prevent this, the preliminary melting crucible must be heated even when the process is not in operation, and a heating system for heating the molten silicon so that the temperature of the molten silicon does not drop in each transfer section to which the molten silicon is transported must be separately provided, thereby complicating the design and making the equipment There is a problem in that the manufacturing cost is increased, and energy consumption is also increased.
- the molten silicon is fused and solidified at the outlet of the supply pipe that supplies the molten silicon to the ingot growth crucible, and the supply pipe is blocked, making it impossible to continuously supply the molten silicon, and eventually stop the operation of the ingot growth device and perform maintenance. In this way, there is a problem in that it affects the continuous operation of the equipment, reduces the productivity, and it is difficult to produce an ingot of uniform quality.
- Patent Document 1 US Patent No. 7,635,414
- the present invention is intended to solve the above problems, and it is possible to exclude the phenomenon that molten silicon is solidified in the supply process of being supplied to a crucible for ingot growth and fusion or sticking, so that continuous operation of equipment is possible and productivity is improved It is a task to provide a preliminary melting part of a continuous ingot growing apparatus and a control method thereof that can make the quality of the ingot uniform.
- the present invention is to provide a pre-melting apparatus for pre-melting the silicon supplied to the main crucible, which can accurately measure the amount of molten silicon supplemented and supplied to the crucible for ingot growth, and a method for controlling the same. .
- a preliminary crucible for supplying silicon in a molten state to a main crucible in which an ingot is grown after receiving a silicon material in a solid state and heating it to become silicon in a molten state; a preliminary crucible moving module for moving the position of the preliminary crucible so that the preliminary crucible heats the silicon in the solid state or supplies the silicon in the molten state to the main crucible;
- a pre-melting apparatus for pre-melting silicon supplied to a main crucible including a control unit for controlling a position of the preliminary crucible by operating the preliminary crucible moving module is disclosed.
- the preliminary crucible includes a container part in the form of a container with an open top, and the preliminary crucible is a first position in which the silicon material in the solid state or the molten silicon is contained in the container part of the preliminary crucible.
- the molten silicon of the preliminary crucible is provided to be movable between a second position where it flows into the main crucible, and the preliminary crucible moving module moves the preliminary crucible between the first position and the second position. It can be provided to tilt in the range of.
- the preliminary crucible moving module a support member for rotatably supporting one side of the preliminary crucible facing the main crucible;
- At least one pair of the support member may be provided to support both sides of the preliminary crucible.
- the support member may be formed in the form of a pin extending upward, and the preliminary crucible may have a pin receiving groove formed in a bottom surface connected to the support member to receive the upper end of the support member in the pin shape.
- the lifter may include: a lifting bar extending upward; and a driving unit for lifting and lowering the lifting bar in a vertical direction, wherein the preliminary crucible may have a rod receiving groove formed on a bottom surface connected to the lifting bar to receive the upper end of the lifting bar.
- the support member and the lifter may be hinged to the preliminary crucible.
- the preliminary crucible moving module may include a weight measuring unit for measuring the weight of the preliminary crucible.
- the weight measuring unit may measure the weight of the preliminary crucible by measuring a load applied to the lifter.
- the control unit first measures the weight of the preliminary crucible before the preliminary crucible supplies the molten silicon to the main crucible, and after the silicon in the molten state from the preliminary crucible is supplied to the main crucible, the preliminary The amount of the molten silicon supplied to the main crucible may be measured as a difference between the two weights measured by secondly measuring the weight of the crucible.
- the control unit first measures the weight of the preliminary crucible while the preliminary crucible is moved from the first position to the second position, and the preliminary crucible is moved from the second position to the first position.
- the weight of the preliminary crucible can be measured secondarily.
- the control unit first measures the weight of the preliminary crucible when the other side of the preliminary crucible that is lifted by the lifter is raised, and when the other side of the preliminary crucible that is lifted by the lifter is lowered, the preliminary crucible can be measured secondarily.
- the weight of the preliminary crucible is measured secondly, the weight of the preliminary crucible is measured while the other side of the preliminary crucible is lowered and then raised again, thereby excluding the effect of backlash of the lifter.
- the slope of the preliminary crucible may be the same.
- the melting by heating the solid silicon material put into the preliminary crucible located at the first position to melt step; a molten silicon replenishment step of supplying the molten silicon of the preliminary crucible to the main crucible by tilting the preliminary crucible of the first position to a second position;
- a control method of a pre-melting apparatus for pre-melting silicon supplied to a main crucible including a molten silicon supply amount measuring step of measuring an amount of the molten silicon supplied to the main crucible through the preliminary crucible.
- the first weight measurement step of measuring the weight of the preliminary crucible while temporarily stopping the movement of the preliminary crucible when the preliminary crucible is moved from the first position to the second position, the first weight measurement step of measuring the weight of the preliminary crucible while temporarily stopping the movement of the preliminary crucible ; a secondary weight measurement step of measuring the weight of the preliminary crucible while temporarily stopping the movement of the preliminary crucible when the preliminary crucible is moved from the second position to the first position.
- the second weight measurement step after the other side of the preliminary crucible is lowered, it may be measured in a raised state again.
- the slope of the preliminary crucible may be the same.
- the pre-melting part of the pre-melting part is tilted and the molten silicon of the pre-melting part is poured into the main crucible and supplied, so a separate pipe is configured Since the occlusion phenomenon caused by the fusion and solidification of molten silicon can be eliminated, the equipment can be operated continuously for a long time, and thus productivity can be improved and the quality of the produced ingot can be uniform.
- the amount of the supplied molten silicon is measured by comparing the weight before and after the molten silicon is supplied to the main crucible in the preliminary melting section, more accurate measurement of the amount is possible.
- the weight can be measured while excluding the effect of mechanical backlash, enabling more accurate measurement.
- FIG. 1 is a view showing an example of a continuous ingot growth apparatus provided with a pre-melting apparatus for pre-melting silicon supplied to a main crucible according to an embodiment of the present invention
- Figure 2 is a view showing when the preliminary crucible of the preliminary melting portion provided in the continuous ingot growth apparatus of Figure 1 is in the first position;
- FIG. 3 is a view showing when the preliminary crucible of the preliminary melting portion provided in the continuous ingot growth apparatus of FIG. 1 is in the second position;
- FIG. 4 is a perspective view showing a preliminary crucible and a preliminary crucible moving module of the preliminary melting apparatus for pre-melting silicon supplied to the main crucible according to an embodiment of the present invention
- Figure 5 is a view showing the bottom surface of the preliminary crucible of Figure 4.
- FIG. 6 is a view showing the state in which the preliminary crucible is tilted step by step
- Figure 6 (a) is a view showing a state in which the preliminary crucible is in the first position
- Figure 6 (b) is a view showing a state in which the preliminary crucible is positioned at a first weight measurement position
- Figure 6 (c) is a view showing a state in which the preliminary crucible is in the second position
- Figure 6 (d) is a view showing a state in which the preliminary crucible is positioned at a second weight measurement position
- Figure 6 (e) is a view showing a state in which the preliminary crucible is returned to the first position
- FIG. 7 is a flowchart illustrating a method for controlling a pre-melting apparatus for pre-melting silicon supplied to a main crucible according to an embodiment of the present invention.
- Words and terms used in the present specification and claims are not limited to their ordinary or dictionary meanings, but in accordance with the principle that the inventor can define terms and concepts in order to best describe his invention. It should be interpreted as meaning and concept consistent with the technical idea.
- an element “in front”, “behind”, “above” or “below” of another element means that, unless otherwise specified, it is directly in contact with another element, such as “front”, “rear”, “above” or “below”. It includes not only being disposed at the “lower side” but also cases in which another component is disposed in the middle.
- a component is “connected” with another component includes not only direct connection to each other, but also indirect connection to each other, unless otherwise specified.
- the preliminary melting part 170 of the continuous ingot growing apparatus 100 may be provided in the continuous ingot growing apparatus 100 as shown in FIG. 1 .
- the continuous ingot growth apparatus 100 may include a growth furnace 110 , a main crucible 120 , a material supply unit 130 , a quantitative supply unit 140 , and a preliminary melting unit 170 .
- the growth furnace 110 may form a space in which the ingot 10 is grown and a space in which the main crucible 120 is installed.
- the main crucible 120 may be heated while containing the molten silicon 20 to be grown into the ingot 10 .
- Such a main crucible 120 is formed in the form of a container with an open upper side, and may be formed in a round shape to form a part of a sphere as a whole.
- molten silicon 20 is grown into an ingot 10 , and the grown ingot 10 is gradually pulled up so that its size and length can be gradually increased.
- a pulling device 114 for pulling up the ingot 10 may be provided in the growth furnace 110 .
- the material supply unit 130 may be a space in which the silicon material 30 in a solid state such as polysilicon in a solid state before being melted into the molten silicon 20 is stored.
- the quantitative supply unit 140 may receive the silicon material 30 from the material supply unit 130 and measure the amount of the supplied silicon material 30 .
- the solidified silicon material 30 measured by the quantitative supply unit 140 may be supplied to a preliminary melting unit 170 to be described later.
- the pre-melting unit 170 is provided on one side of the chamber to receive the solidified silicon material 30 weighed in from the quantitative supply unit 140, and heats the imported solidified silicon material 30 to completely It can be liquefied into molten silicon 20 .
- the pre-melting unit 170 may supply the molten silicon 20 to the main crucible 120 .
- the pre-melting unit 170 may supply the molten silicon 20 to the main crucible 120 after completely melting the solid silicon material 30 supplied from the quantitative supply unit 140 . .
- the preliminary melting unit 170 is a heating space ( 184) and may include a preliminary crucible heating module 182 for heating the preliminary crucible 172.
- the silicon material 30 in the solid state supplied from the quantitative supply unit 140 is accommodated in the preliminary crucible 172, and the preliminary crucible 172 is positioned in the heating space 184 and heated to receive it.
- the silicon material 30 in the solid state may be brought into the state of the molten silicon 20 .
- the preliminary crucible heating module 182 is provided in the body 183 and the body 183 forming the heating space 184 in which the preliminary crucible 172 is accommodated to heat the preliminary crucible 172 . It may include a heater 188 that does.
- the side of the heating space 184 facing the main crucible 120 may form an opening 185 .
- the preliminary crucible 172 is tilted to one side after the accommodated silicon material 30 is heated by the heater 188 and melted in the molten molten silicon 20 state to remove the molten silicon 20. It can be supplied by pouring it into the main crucible 120 .
- a direction from the pre-melting part 170 to the main crucible 120 is referred to as one side, and the opposite side is referred to as the other side.
- the preliminary crucible 172 has a first position where the silicon material 30 is accommodated and melts the accommodated silicon material 30, and the heated and molten silicon 20 is poured into the main crucible 120.
- the posture can be controlled to any one of the second positions inclined to supply.
- the first position is where the silicon material 30 or the molten silicon 20 accommodated in the preliminary crucible 172 is the It means the angle at which the preliminary crucible 172 is inclined so that it does not overflow or flow to the outside of the preliminary crucible 172
- the second position is the molten silicon 20 accommodated in the preliminary crucible 172 is the main crucible ( 120) may mean an angle at which the preliminary crucible 172 is inclined to flow or pour.
- the angle formed by the preliminary crucible 172 with the installation surface may be ⁇ 1
- the angle between the preliminary crucible 172 and the installation surface may be ⁇ 3.
- the installation surface is a bottom surface on which the continuous ingot growth apparatus 100 is installed, and may be a surface parallel to the ground.
- a preliminary crucible moving module 192 for moving the position of the preliminary crucible 172 and a control unit 160 for controlling the preliminary crucible moving module 192 may be provided.
- the preliminary crucible moving module 192 has one side facing the main crucible 120 of the preliminary crucible 172, the main crucible 120.
- the molten silicon 20 accommodated in the preliminary crucible 172 may be poured into the main crucible 120 by tilting toward it.
- the preliminary crucible 172 includes a container portion formed in a container shape with an open upper side.
- the molten silicon 20 of the preliminary crucible 172 is the A side surface of one side of the container part facing the main crucible 120 of the preliminary crucible 172 may be formed to be opened so as to easily flow into the main crucible 120 .
- the present invention is not limited thereto, and the side of one side of the preliminary crucible 172 facing the main crucible 120 has a lower height than the other side or a part is opened to form a separate outlet. It may be formed in various forms, such as may be.
- the silicon material 30 and the molten silicon 20 accommodated in the preliminary crucible 172 do not overflow in the first position.
- the opened side of the crucible 172 may be inclined to face upward.
- the preliminary crucible 172 may be maintained in a horizontal state without being inclined when it is in the first position.
- the molten silicon 20 contained in the preliminary crucible 172 can flow more effectively to the main crucible 120 in the second position.
- One side of the preliminary crucible 172 may be inclined to face downward.
- the molten silicon 20 in the preliminary crucible 172 flows through the open side of the preliminary crucible 172 along the slope by gravity and flows out. It can fall to the main crucible 120 .
- the preliminary crucible moving module 192 is spaced apart from the support member 194 and the support member 194 in which one side of the preliminary crucible 172 is rotatably supported with respect to the body 183 to the other side.
- a lifter 196 controlled by the controller 160 may be provided at a point to raise and lower the other side of the preliminary crucible 172 in the vertical direction.
- the support member 194 may be formed in the form of a pin extending upward from the bottom surface of the body 183 of the preliminary crucible heating module, and the upper end thereof may be formed in a round shape.
- the preliminary crucible may have a hemispherical pin receiving groove 174 formed on a bottom surface that is in contact with the upper end of the support member 194 to receive the upper end of the support member 194 in the form of a pin.
- a pair of the support members 194 may be disposed to be spaced apart from each other to support both sides of the preliminary crucible 172 .
- the lifter 196 may be provided to support the preliminary crucible 172 at a point spaced apart from the other side of the point supported by the support member 194 of the preliminary crucible 172 .
- the pair of support members 194 and the lifter 196 support the preliminary crucible 172 at three points, thereby stably supporting the preliminary crucible 172 .
- the lifter 196 may include a lifting bar 193 and a driving unit 195 .
- the lifting rod 193 extends upwardly from the lower side of the preliminary crucible 172 toward the bottom of the preliminary crucible 172, and may be provided to be raised and lowered by the driving unit 195, and the lifting rod
- the end of (193) may be formed in a spherical shape.
- the driving unit 195 may be provided to elevate the lifting rod 193 .
- Such a driving unit 195 may be implemented in a structure of a motor and a gear, or may be implemented in various structures and methods such as hydraulic, pneumatic, or the like.
- the preliminary crucible 172 is a hemispherical rod on the bottom surface that is connected to the top of the lifting rod 193 to accommodate the upper end of the pin-shaped lifting rod 193 .
- a receiving groove 176 may be formed.
- the support member 194 and the lifter 196 are formed in the form of a pin or a rod, and a receiving groove for accommodating them is formed in the preliminary crucible 172 to be formed as a structure supported by gravity without any restriction.
- the preliminary crucible moving module 192 of the present embodiment may include a weighing unit 197 .
- the weight measurement unit 197 is a component for measuring the weight of the preliminary crucible 172 , and may be provided to transmit the measured value to the control unit 160 .
- the weight measuring unit 197 as described above may be provided to measure the load applied to the lifter 196, and in this embodiment, a lifting bar coupled to the lifting bar to support the preliminary crucible 172 ( 193) can be implemented as a load cell that measures the weight of the
- the present invention is not limited thereto, and the weight of the preliminary crucible 172 may be measured using various possible structures and methods.
- control unit 160 controls the lifting and lowering of the lifting rod 193 by controlling the driving unit 195 of the lifter 196 to control the angle of the preliminary crucible 172 and the weight measurement unit As a signal measured at 197 , the weight of the preliminary crucible 172 may be measured.
- controller 160 may calculate the amount of the molten silicon 20 additionally supplied from the preliminary crucible 172 to the main crucible 120 by measuring the weight of the preliminary crucible 172 .
- the preliminary crucible 172 weighs 1 of the preliminary crucible 172 before supplying the molten silicon 20 to the main crucible 120 .
- the difference is measured, and as shown in (d) of FIG. 6 , after the silicon 20 melted in the preliminary crucible 172 is supplied to the main crucible 120 , the weight of the preliminary crucible 172 is secondary
- the amount of molten silicon 20 supplied to the main crucible 120 may be measured as a difference between the two measured weights.
- the weight of the preliminary crucible 172 is first measured while the movement of the preliminary crucible 172 is temporarily stopped.
- the weight of the preliminary crucible 172 is measured secondly, and then the first The amount of molten silicon 20 supplied to the main crucible 120 may be measured as a difference between the weight measured during the measurement and the weight measured during the secondary measurement.
- the preliminary crucible 172 when the other side of the preliminary crucible 172 is lifted by the lifter 196 of the preliminary crucible 172 to supply the molten silicon 20 to the main crucible 120 is raised, the preliminary crucible ( The weight of the preliminary crucible 172 is first measured in a state in which the movement of 172 is temporarily stopped, and after the preliminary crucible 172 is supplied with the molten silicon 20, a lifter of the preliminary crucible 172 ( 196), when the other side is lowered, in a state where the movement of the preliminary crucible 172 is temporarily stopped, the weight of the preliminary crucible 172 is measured secondly, and the weight measured at the time of the first measurement and the second measurement
- the amount of molten silicon 20 supplied to the main crucible 120 may be measured as a difference in the measured weight.
- the preliminary crucible 172 does not necessarily have to be measured in a stopped state, and the preliminary crucible 172 is measured while the preliminary crucible 172 is moving at a constant constant speed, or Various modifications may be possible, such as may be measured regardless of whether the preliminary crucible 172 is moved and whether the constant velocity is there.
- the slope of the preliminary crucible 172 at the weight measurement point during the first measurement and the second measurement may be the same as ⁇ 2.
- the ⁇ 2 is the angle at which the solidified silicon material 30 or the molten silicon 20 contained in the preliminary crucible 172 does not overflow to the outside of the preliminary crucible 172 when the slope of the preliminary crucible 172 is ⁇ 2.
- an error in weight measurement may occur due to a gap between the parts due to backlash or the like.
- the error in weight measurement is minimized.
- the weight of the preliminary crucible 172 is measured secondarily, the preliminary crucible 172 is rotated to the ⁇ 1 angle more than the ⁇ 2 angle, and the other side of the preliminary crucible 172 is lowered to reach the ⁇ 2 angle again. It is measured in a raised state so as to exclude the effect of backlash of the lifter 196 .
- Pre-melting An embodiment of a method for controlling a pre-melting apparatus for
- the control method of the pre-melting apparatus for pre-melting the silicon supplied to the main crucible is a melting step (S110), a molten silicon replenishment step (S120), a return step (S130) And it may include a molten silicon supply amount measurement step (S140).
- the melting step (S110) is a step of heating the solid silicon material 30 put into the preliminary crucible 172 located at the first position to melt it into the molten silicon 20 state.
- the preliminary crucible 172 may have an angle of ⁇ 1 as shown in (a) of FIG. 6 , and the molten silicon 20 is contained in the preliminary crucible 172 . there may be
- the molten silicon replenishment step (S120) is, as shown in (c) of FIG. 6, the molten silicon 20 of the preliminary crucible 172 by tilting the preliminary crucible 172 of the first position to the second position. ) is supplied to the main crucible 120 .
- a return step (S130) of returning the preliminary crucible 172 to the first position may be performed.
- the molten silicon supply amount measurement step (S140) is a step of measuring the amount of the molten silicon 20 supplied to the main crucible 120 through the preliminary crucible 172, the first weight measurement step (S142) ) and a secondary weight measurement step (S144).
- the preliminary crucible 172 is moved from the first position to the second position, the preliminary crucible 172 is moved It is a step of measuring the weight of the preliminary crucible 172 in a state in which it is temporarily stopped.
- the preliminary crucible 172 may be positioned at an angle of ⁇ 2.
- the preliminary crucible 172 when the preliminary crucible 172 is moved from the second position to the first position, the preliminary crucible 172 It is a step of measuring the weight of the preliminary crucible 172 in a state in which the movement is temporarily stopped. At this time, the preliminary crucible 172 may be positioned at a ⁇ 2 angle.
- the preliminary crucible 172 lowered by the lifter 196 may be measured in a state in which it is raised to the ⁇ 2 angle again after the preliminary crucible 172 is lowered more than the ⁇ 2 angle. This is to exclude the effect of backlash of the lifter 196 .
- control unit 160 as the difference between the weight measured in the first weight measurement step (S142) and the weight measured in the second weight measurement step (S144), in the molten silicon supplement step (S120)
- the amount of molten silicon 20 supplied to the main crucible 120 through the preliminary crucible 172 can be accurately measured.
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Abstract
Description
Claims (18)
- 고형 상태의 실리콘 재료를 공급받아 용융상태의 실리콘이 되도록 가열한 후에 잉곳이 성장되는 주 도가니로 용융 상태의 실리콘을 공급하는 예비도가니;상기 예비도가니가 상기 고형 상태의 실리콘을 가열하거나 상기 주 도가니로 상기 용융 상태의 실리콘을 공급할 수 있도록 상기 예비도가니의 위치를 이동시키는 예비 도가니 이동 모듈;상기 예비 도가니 이동 모듈을 작동시켜 상기 예비 도가니의 위치를 제어하는 제어부를 포함하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제1항에 있어서,상기 예비도가니는 상부가 개방된 용기 형태로 이루어진 용기부를 포함하며,상기 예비도가니는,상기 예비도가니의 상기 용기부에 상기 고형 상태의 실리콘 재료 또는 상기 용융된 실리콘이 담겨있는 자세인 제1위치 또는,상기 예비도가니의 상기 용융된 실리콘이 상기 주 도가니로 흘러나가는 제2위치 사이에서 위치의 이동이 가능하도록 구비되고,상기 예비 도가니 이동 모듈은 상기 예비도가니를 상기 제1위치와 상기 제2위치 사이의 범위에서 기울이도록 구비되는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제2항에 있어서,상기 예비 도가니 이동 모듈은,상기 주 도가니를 향하는 상기 예비도가니의 일측을 회전가능하게 지지하는 지지부재;상기 예비도가니의 일측으로부터 상기 주 도가니 측과 반대방향으로 이격된 타측을 상승 또는 하강시키도록 상기 제어부에 의해 제어되는 리프터;를 포함하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제3항에 있어서,상기 지지부재는,상기 예비도가니의 양 측을 지지하도록 적어도 한 쌍이 구비되는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제3항에 있어서,상기 지지부재는, 상방을 향하여 연장된 핀 형태로 형성되며,상기 예비도가니는, 핀 형태의 상기 지지부재의 상단을 수용하도록 상기 지지부재와 연접되는 저면에 핀 수용홈이 형성되는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제3항에 있어서,상기 리프터는,상방을 향하여 연장된 승강막대;상기 승강막대를 상하 방향으로 승강시키는 구동부;를 포함하며,상기 예비도가니는, 상기 승강막대의 상단을 수용하도록 상기 승강막대와 연접되는 저면에 막대 수용홈이 형성되는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제3항에 있어서,상기 지지부재와 상기 리프터는 상기 예비도가니에 힌지결합되는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제3항에 있어서,상기 예비 도가니 이동 모듈은,상기 예비도가니의 무게를 측정하는 무게측정부를 포함하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제8항에 있어서,상기 무게측정부는,상기 리프터에 작용되는 하중을 측정함으로써 상기 예비도가니의 무게를 측정하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제8항에 있어서,상기 제어부는,상기 예비도가니가 상기 용융상태의 실리콘을 주 도가니로 공급하기 전에 상기 예비도가니의 무게를 1차 측정하고, 상기 예비도가니에서 상기 용융상태의 실리콘이 상기 주 도가니로 공급된 후에 상기 예비도가니의 무게를 2차 측정하여 측정된 두 무게의 차이로서 상기 주 도가니에 공급된 상기 용융된 실리콘의 양을 측정하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제10항에 있어서,상기 제어부는,상기 예비도가니가 상기 제1위치에서 상기 제2위치로 이동되는 중간에 상기 예비도가니의 무게를 1차 측정하고,상기 예비도가니가 상기 제2위치에서 상기 제1위치로 이동되는 중간에, 상기 예비도가니의 무게를 2차 측정하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제10항에 있어서,상기 제어부는,상기 리프터에 의해 승강되는 상기 예비 도가니의 타측이 상승될 때, 상태에서 상기 예비도가니의 무게를 1차 측정하고,상기 리프터에 의해 승강되는 상기 예비 도가니의 타측이 하강될 때, 상기 예비도가니의 무게를 2차 측정하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제12항에 있어서,상기 예비도가니의 무게를 2차 측정할 때에는 상기 예비도가니의 타측이 하강된 후 다시 상승된 상태에서 측정되어 상기 리프터의 백레쉬의 영향을 배제하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 제10항 내지 제12항 중 어느 한 항에 있어서,상기 예비도가니의 무게를 1차 측정할 때와 2차 측정할 때의 상기 예비도가니의 기울기는 동일한 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치.
- 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치의 제어방법에 있어서,제1위치에 위치된 예비도가니에 투입된 고형의 실리콘 재료를 가열하여 용융시키는 용융단계;상기 제1위치의 상기 예비도가니를 제2위치로 기울여 상기 예비도가니의 용융된 실리콘을 상기 주 도가니로 공급하는 용융 실리콘 보충단계;용융된 실리콘을 상기 주 도가니로 공급한 뒤에 상기 예비도가니가 상기 제1위치로 복귀하는 복귀단계;상기 예비도가니를 통해 상기 주 도가니로 공급된 상기 용융된 실리콘의 양을 측정하는 용융 실리콘 공급량 측정단계;를 포함하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치의 제어방법.
- 제15항에 있어서,상기 용융 실리콘 공급량 측정단계는,상기 예비도가니가 상기 제1위치에서 상기 제2위치로 이동될 때, 상기 예비도가니의 이동을 잠시 중지시킨 상태에서 상기 예비도가니의 무게를 측정하는 1차 무게 측정단계;상기 예비도가니가 상기 제2위치에서 상기 제1위치로 이동될 때, 상기 예비도가니의 이동을 잠시 중지시킨 상태에서 상기 예비도가니의 무게를 측정하는 2차 무게 측정단계;를 포함하는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치의 제어방법.
- 제16항에 있어서,상기 2차 무게 측정단계는,상기 예비도가니의 타측이 하강된 후, 다시 상승된 상태에서 측정되는 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치의 제어방법.
- 제16항에 있어서,상기 1차 무게 측정단계와 상기 2차 무게 측정단계에서 상기 예비도가니의 기울기는 동일한 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치의 제어방법.
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NO20230321A NO20230321A1 (en) | 2020-09-24 | 2021-09-03 | Premelter for preliminarily melting silicon to be supplied to main crucible and control method thereof |
| US18/028,251 US12601084B2 (en) | 2020-09-24 | 2021-09-03 | Premelter for preliminarily melting silicon to be supplied to main crucible and control method thereof |
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| KR10-2020-0124116 | 2020-09-24 | ||
| KR1020200124116A KR102271455B1 (ko) | 2020-09-24 | 2020-09-24 | 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치 및 그 제어방법 |
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| US (1) | US12601084B2 (ko) |
| KR (1) | KR102271455B1 (ko) |
| CN (2) | CN114250504A (ko) |
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| KR102271455B1 (ko) * | 2020-09-24 | 2021-07-01 | 한화솔루션 주식회사 | 주 도가니로 공급되는 실리콘을 예비 용융시키기 위한 예비 용융 장치 및 그 제어방법 |
| KR102516630B1 (ko) * | 2021-10-18 | 2023-03-30 | 한화솔루션 주식회사 | 잉곳 성장 장치 |
| CN115652409B (zh) * | 2022-10-25 | 2023-09-05 | 浙江晶盛机电股份有限公司 | 晶体生长炉断电保护方法及晶体生长炉 |
| KR20250146089A (ko) * | 2024-03-29 | 2025-10-13 | 한화솔루션 주식회사 | 용융 폴리실리콘의 유출을 감지하는 장치 |
| CN120591900B (zh) * | 2025-08-07 | 2025-10-28 | 福建福碳新材料科技有限公司 | 三代半导体长晶用等静压石墨坩埚制备的炉体装置 |
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- 2020-12-03 CN CN202011404020.7A patent/CN114250504A/zh active Pending
- 2020-12-03 CN CN202022897529.1U patent/CN215713520U/zh active Active
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2021
- 2021-09-03 NO NO20230321A patent/NO20230321A1/en unknown
- 2021-09-03 WO PCT/KR2021/011928 patent/WO2022065735A1/ko not_active Ceased
- 2021-09-03 US US18/028,251 patent/US12601084B2/en active Active
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Also Published As
| Publication number | Publication date |
|---|---|
| CN114250504A (zh) | 2022-03-29 |
| KR102271455B1 (ko) | 2021-07-01 |
| US20230374696A1 (en) | 2023-11-23 |
| US12601084B2 (en) | 2026-04-14 |
| CN215713520U (zh) | 2022-02-01 |
| NO20230321A1 (en) | 2023-03-23 |
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