WO2022027896A1 - 振镜的参数调节方法、装置、设备及可读存储介质 - Google Patents
振镜的参数调节方法、装置、设备及可读存储介质 Download PDFInfo
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- WO2022027896A1 WO2022027896A1 PCT/CN2020/136295 CN2020136295W WO2022027896A1 WO 2022027896 A1 WO2022027896 A1 WO 2022027896A1 CN 2020136295 W CN2020136295 W CN 2020136295W WO 2022027896 A1 WO2022027896 A1 WO 2022027896A1
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0816—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more reflecting elements
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- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/08—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light
- G02B26/0875—Optical devices or arrangements for the control of light using movable or deformable optical elements for controlling the direction of light by means of one or more refracting elements
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/80—Analysis of captured images to determine intrinsic or extrinsic camera parameters, i.e. camera calibration
Definitions
- the present invention relates to the technical field of galvanometer mirrors, and in particular, to a parameter adjustment method, device, device and computer-readable storage medium of a galvanometer mirror.
- the galvanometer is an opto-mechanical component located between the DMD (Digital Micromirror Device) and the lens.
- the main body is a glass lens and two coils, the coils can drive the lens to vibrate slightly up and down in both x/y directions.
- the main principle is that there is refraction when the light passes through the lens, and the refraction angle is related to the angle of the lens. Using this principle, the lens is controlled to vibrate left and right up and down through the driving coil, so that one pixel on the DMD is reflected to four positions at four time points. The purpose of improving the resolution of the optical machine picture.
- the purpose of the present invention is to provide a method, device, device and computer-readable storage medium for adjusting parameters of a galvanometer, which solves the problem of low working performance of the galvanometer due to inappropriate parameter settings.
- the present invention provides a method for adjusting parameters of a galvanometer mirror, which is characterized in that:
- each vibration image corresponding to the galvanometer in the state of a plurality of different parameters set wherein, the parameters include a gain parameter and a duration parameter;
- the gain parameter and the duration parameter corresponding to the smallest offset value among the offset values are selected as the parameters of the galvanometer, and the parameters of the galvanometer are adjusted.
- obtaining the offset value between the thick vibration lines and the thin vibration lines in each of the vibration images including:
- the offset value is determined according to the pixel coordinate values of the thick vibration lines and the thin vibration lines in the transformed vibration image.
- determining the offset value according to the pixel coordinate values of the thick vibration lines and the thin vibration lines in the transformed vibration image including:
- the unit vibration image in the transformed vibration image according to the area range of the standard unit vibration image in the standard vibration image, wherein the unit vibration image includes a set of horizontal vibration thick lines and vibration thin lines and a Group vertical vibration thick lines and vibration thin lines;
- Collecting the offset value of the thick vibration line and the thin vibration line in the horizontal direction is a first offset value, and collecting the offset value of the thick vibration line and the thin vibration line in the vertical direction as a second offset value;
- the first offset value and the second offset value are summed to obtain the offset value.
- each group of thick vibration lines and thin vibration lines in the unit vibration image includes a thick red vibration line and a thin red vibration line, a thick green vibration line and a thin green vibration line, and a thick blue vibration line and a blue vibration line. thin line;
- performing a sum operation on the first offset value and the second offset value to obtain the offset value including:
- the gain parameter and the duration parameter corresponding to the smallest offset value in each of the offset values as the parameters of the galvanometer, including:
- the gain parameter and the duration parameter corresponding to the specific offset value are used as the parameters of the galvanometer.
- identifying the white point pixel coordinate value of the white point in the vibration image including:
- the contours of all white points are found in the binarized vibration image by the method of finding contours, and the centroid of the contours is used as the pixel coordinate value of the white points.
- a homography matrix between the vibration image and the standard vibration image according to the white point pixel coordinate value and the standard white point pixel coordinate value including:
- a center white point that satisfies a preset condition and three adjacent white points closest to the center white point are identified in the vibration image, wherein the preset The condition is that the central white point and the three adjacent white points are respectively connected by lines, and the angles between the three line segments formed are 105 degrees, 145 degrees, and 110 degrees in turn.
- each vibration image corresponding to the galvanometer in the set multiple different parameter states collects each vibration image corresponding to the galvanometer in the set multiple different parameter states, and obtain the offset value between the vibration thick line and the vibration thin line in each of the vibration images, including:
- the gain parameter before the increase is used as the benchmark to collect the galvanometer's gain parameters when the gain parameter decreases successively.
- the corresponding vibration images are obtained and a plurality of corresponding offset values are obtained until the current obtained offset value is greater than the last obtained offset value;
- the increased gain parameter is used as a benchmark to collect the gain parameters of the galvanometer.
- the corresponding vibration images are obtained and a plurality of corresponding offset values are obtained until the currently obtained offset value is greater than the last obtained offset value;
- the offset value corresponding to the increased duration parameter is greater than the offset value corresponding to the duration parameter before the increase, then using the duration parameter before the increase as a benchmark, collect the galvanometer in which the duration parameter decreases successively. In the state, the corresponding vibration images are obtained and a plurality of corresponding offset values are obtained until the current obtained offset value is greater than the last obtained offset value;
- the duration parameter of the galvanometer is collected based on the increased duration parameter In the state of increasing successively, the corresponding vibration images are obtained and a plurality of corresponding offset values are obtained until the currently obtained offset value is greater than the last obtained offset value.
- the application also provides a parameter adjustment device for a galvanometer, including:
- the data acquisition module is used to collect the vibration image of the galvanometer
- an offset value module for obtaining an offset value between the thick vibration lines and the thin vibration lines in each of the vibration images
- the parameter determination module is configured to select the gain parameter and the duration parameter corresponding to the smallest offset value among the offset values as the parameters of the galvanometer, and adjust the parameters of the galvanometer.
- the present application also provides a device for adjusting parameters of a galvanometer, including a projector, a projection screen, a camera and a processor;
- the projector is used for projecting the image generated by the vibration of the galvanometer to the projection screen
- the camera is used to capture the image on the projection screen to obtain a vibration image
- the processor is configured to execute the steps of the parameter adjustment method of the galvanometer according to any one of the above vibration images.
- the present application also provides a computer-readable storage medium, where the computer-readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps of the method for adjusting parameters of a galvanometer as described in any one of the above.
- the method for adjusting the parameters of the galvanometer includes collecting each vibration image corresponding to the galvanometer under a plurality of different parameter states that are set; wherein, the parameters include a gain parameter and a duration parameter; obtaining the vibration in each vibration image The offset value between the thick line and the vibrating thin line; select the gain parameter and the duration parameter corresponding to the smallest offset value among the offset values as the parameters of the galvanometer, and adjust the parameters of the galvanometer.
- This application utilizes the principle that the smaller the offset value between the thick vibration line and the thin line of vibration in the vibration image of the galvanometer, the more suitable the parameter setting of the galvanometer, and the vibration image of the galvanometer is used as a reference to adjust the Gain parameters and duration parameters, and obtain the offset value between the vibration thick line and the vibration thin line corresponding to different gain parameters and duration parameters of the galvanometer, and take the gain parameter and duration parameter when the offset value is the smallest as the vibration value.
- the final parameters of the mirror thus ensuring the reasonable degree of the galvanometer parameter setting and the performance of the galvanometer in the actual application process.
- the present application also provides a parameter adjustment device and equipment for a galvanometer, which have the above beneficial effects.
- FIG. 1 is a schematic diagram of a vibrating image of a galvanometer
- Fig. 2 is the schematic diagram of vibration offset in the vibration image of galvanometer
- FIG. 3 is a schematic flowchart of a method for adjusting parameters of a galvanometer according to an embodiment of the present application
- FIG. 4 is a schematic diagram of an optical path structure for collecting a vibration image provided by the application
- FIG. 5 is a schematic flowchart of determining a first offset value and a second offset value according to an embodiment of the present application
- Fig. 6 is a schematic diagram of local white point distribution in the vibration image shown in Fig. 1;
- FIG. 7 is a schematic flowchart of obtaining a plurality of offset values according to an embodiment of the present application.
- FIG. 8 is a structural block diagram of an apparatus for adjusting parameters of a galvanometer according to an embodiment of the present invention.
- FIG. 1 is a schematic diagram of a vibration image of a galvanometer.
- the vibration image referred to in this application is the image generated by the use of three light sources of red, green and blue to emit parallel beams and incident on the galvanometer and output to the photosensitive chip by the galvanometer. Commonly used test images, which will not be described in detail.
- the vibration image includes a plurality of basic vibration images 01 , and the content of the entire vibration image is a repetition of the plurality of basic vibration images 01 .
- the basic vibration image 01 includes four groups of thick vibration lines and thin vibration lines, namely vibration line one 011, vibration line two 012, vibration line three 013, and vibration line four 014.
- 1011 kinds of vibration lines include red vibration thick line 11, red vibration thin line 21, green vibration thick line 12, green vibration thin line 22, blue vibration thick line 13, blue vibration thin line 23, each vibration thick line
- the lines and the individual vibrating thin lines are parallel to each other.
- Similar vibration lines 2 012, 3 013 and 4 014 have the same distribution of thick and thin vibration lines; Thin and vibrating lines 1011.
- the thick and thin vibrating lines and the vibrating lines are perpendicular to each other.
- the thick and thin vibrating lines in vibrating lines 2 012 and 3 013 are distributed in opposite ways, while the vibrating lines are in opposite directions.
- One 011 and four vibrating lines 014 have opposite distributions of the thick vibration lines and the thin vibration lines to the left and right.
- vibration line 1 011 As an example, theoretically, if the gain parameters and duration parameters of the galvanometer are very suitable, two thick red vibration lines 11 and one thin red vibration line 21 of the same type should be distributed in a Y shape, and the red vibration is thin.
- the symmetry axis of line 21 and the two red vibration thick lines 11 of the same color are located on the same straight line, and the similar green and blue vibration thickness and vibration thin lines are also distributed in the same way; and vibration line two 012, vibration line three 013 and Vibration Line 4 014 also have a similar distribution for the thick and thin vibration lines of various colors.
- Figure 2 is a schematic diagram of the vibration offset in the vibration image of the galvanometer, and when the gain parameters and duration parameters of the galvanometer are not properly set, the thin vibration line 2 and the thick vibration line 1 will be perpendicular to The direction of the vibration thin line 2 is relatively shifted, that is to say, the line where the vibration thin line 2 is located has an offset relative to the line where the symmetry axis of the vibration thick line 1 is located. The larger the displacement.
- the parameters of the galvanometer are repeatedly adjusted only by observing the vibration image with the human eye, which is obviously inefficient and inaccurate.
- the present application provides a technical solution for automatically realizing adjustment of vibration parameters based on image recognition, which greatly improves the efficiency and accuracy of adjustment, and is beneficial to the wide application of galvanometers.
- FIG. 3 is a schematic flowchart of a method for adjusting parameters of a galvanometer according to an embodiment of the present application, and the method may include
- S11 Collect each vibration image corresponding to the galvanometer in the state of a plurality of different parameters set.
- the parameters of the galvanometer may include gain parameters and duration parameters.
- an optical path structure as shown in FIG. 4 can be built, so that the vibration image of the galvanometer can be projected onto the projection screen 6 through the projector 4 , and then the camera 5 can shoot the image on the projection screen 6 . Vibrate image.
- the offset value between the thick vibration wire 1 and the thin vibration wire 2 should be the offset value that satisfies the following conditions:
- the first refers to the offset value between the vibration thick line and the vibration thin line in the same group.
- the vibration line 1 011 is the vibration thick line 1 and the vibration thin line 2 in the same group;
- the distributions between the thick vibration lines 1 and the thin vibration lines 2 of different groups are not completely the same.
- the vibration lines in the first vibration line 011 and the second vibration line 012 in FIG. 1 are distributed perpendicular to each other. Therefore, in order to obtain the offset value between the thick vibration line 1 and the thin vibration line 2 to better reflect the overall imaging situation of the vibration image, when the offset value is obtained, two thick vibration lines 1 in mutually perpendicular directions are also obtained.
- the first offset value may be L1 in FIG. 2
- the second offset value may be L2.
- each group of thick vibration lines 1 and thin vibration lines 2 includes a thick red vibration line 11 and a thin red vibration line 21, a thick green vibration line 12 and a thin green vibration line 22, and a blue vibration thick line 22. Wire 13 and blue vibrating thin wire 23.
- the offset value is two sets of vibrating thick lines 1 and vibrating thin lines 2 which are perpendicular to each other. In the actual calculation of the offset value, the offset value can be calculated for each color of the thick vibration line 1 and the thin vibration line 2.
- each group of thick vibration lines 1 and thin vibration lines 2 includes three colors. 3 offset values, and the two groups of vertical vibration thick lines 1 and vibration thin lines 2 include 6 offset values, and the finally obtained offset value can be the sum of the 6 offset values.
- the gain parameter and the duration parameter corresponding to the minimum offset value are used as the vibration parameters.
- the parameters of the mirror can guarantee the working performance of the galvanometer to a certain extent.
- the first offset value L1 may be 0, while the second offset value L2 is relatively large, and the sum of the two is the smallest among the offset values corresponding to various parameters, In this case the parameter corresponding to the minimum offset value is not available.
- the offset value should also satisfy the condition that neither the first offset value L1 nor the second offset value L2 is too large, for example, it may be not greater than a certain threshold value, It may also be no greater than two-thirds of the offset value, etc., which can be set according to actual conditions, and is not specifically limited in this application.
- the relative positional relationship between the thick vibration line and the thin vibration line in the vibration image of the galvanometer and the relationship between the gain parameter and the duration parameter of the vibration are used to carry out the parameters of the galvanometer several times.
- the most suitable galvanometer parameters are determined according to the corresponding offset values under different parameters, which improves the accuracy of the gain parameters and duration parameters of the galvanometer to a certain extent, thereby improving the working performance of the galvanometer.
- FIG. 5 is a schematic flowchart of determining a first offset value and a second offset value provided by an embodiment of the present application, and the process may include:
- each group of thick vibration lines and thin vibration lines of the standard vibration image is distributed in the horizontal direction and the vertical direction.
- the vibration image in addition to the thick vibration line 1 and the thin vibration line 2, the vibration image also includes a white spot 3, and the white spot 3 is located at one end of the thick vibration line away from the thin vibration line 2. Each There is a white spot 3 at the end of the two vibrating thick wires 1 .
- the vibration image can be converted into a grayscale image first, and then the grayscale image can be binarized to obtain a binarized vibration image;
- the binarized vibration image finds all the contours of the white point 3 in the way of finding the contour, and uses the centroid of the contour as the pixel coordinate value of the white point 3 .
- the obtained binarized vibration image only shows white Point 3 is conducive to the identification of white point 3; and when determining the position of white point 3, only the pixel coordinates of white point centroid are used to represent the pixel coordinates of white point 3, which simplifies the complexity of subsequent homography matrix operations.
- each white point is identified, which may specifically include:
- each white point identify a center white point and three adjacent white points that meet the preset conditions in the vibration image, wherein the preset conditions are the center white point and the three adjacent white points that are closest to the center white point.
- the adjacent white points are respectively connected, and the angles between the three line segments formed are 105°, 145°, and 110° in turn.
- the homography matrix is obtained with the pixel coordinate values of a central white point and three adjacent white points, and the standard white point coordinate values of the four white points in the standard vibration image that satisfy the preset conditions.
- two groups of two groups of thick vibration lines 1 and thin vibration lines 2 vertically distributed in the vibration image have white spots at the ends of the thick vibration lines 1, while a group of thick vibration lines perpendicular to the group has white spots.
- each white point 3 is identified according to this characteristic.
- FIG. 6 is a schematic diagram of the distribution of local white points in the vibration image shown in FIG. 1.
- one of the most edge points of the three white points 3 at the end of the thick vibration line 1 in the vertical direction is the center.
- the white point 31 and the three nearest white points 3 adjacent to it are adjacent white points 32 .
- the angles of the three line segments formed by connecting such a central white point 31 and three adjacent white points 32 are respectively 105 degrees, 145 degrees and 110 degrees, and there is no other positional relationship and a central white point in the vibration image.
- the positional relationship between 31 and three adjacent white points 32 is different, and white points 3 with the same angle are formed. Therefore, in this embodiment, each white point 3 is identified in sequence.
- angles of the three line segments formed by connecting a central white point 31 and three adjacent white points 32 respectively may have errors when calculated according to the pixel coordinate values of the white points. As long as the errors are within the allowable range, the It is considered to be the white point 3 that satisfies the condition.
- S23 Perform coordinate transformation on the vibration image according to the homography matrix to obtain the transformed vibration image.
- the thick vibration lines 1 and the thin vibration lines 2 are distributed in a horizontal direction or in a vertical direction.
- the vibration image actually collected by the camera 5 it is not necessarily taken at the angle shown in Fig. 1, and the thick vibration line 1 and the thin vibration line 2 in the finally obtained vibration image may not be in the vertical state. It is difficult to determine the vibration thick line 1, the vibration thin line 2 and the offset value in the image.
- a known pixel coordinate value of each thick vibration line 1, thin vibration line 2, white point 3, etc., and the thick vibration line 1 and thin vibration line 2 are distributed in the horizontal and vertical directions.
- the standard vibration image is used as a reference.
- Figure 1 is a partial image of the standard vibration image.
- the vibration image collected based on the camera is converted, so that in the converted image, the distribution of the thick vibration lines 1 and the thin vibration lines 2 is the same as The same in the standard vibration image, then the thick vibration line 1 and the thin vibration line 2 are distributed in the horizontal direction and the vertical direction.
- the offset value can be obtained as long as the center pixel point of the two vibration thick lines 1 and the pixel ordinate value of the center pixel point of the vibration thin line 2 are compared;
- the vertical vibration thick line 1 and the vibration thin line 2 can be offset by comparing the pixel ordinate values of the center pixel of the two vibration thick lines 1 and the center pixel of the vibration thin line 2.
- the vibration image contains a plurality of repeated basic image units 01, in order to simplify the difficulty of identifying a single group of thick vibration lines and thin vibration lines in the converted image.
- the unit vibration image in the transformed vibration image may be identified according to the area range of the standard unit vibration image in the standard vibration image.
- the unit vibration image 02 includes a set of horizontal vibration thick lines 1 and vibration thin lines 2 and a set of vertical vibration thick lines 1 and vibration thin lines 2;
- the center offset value of the thick and thin vibration lines in the horizontal direction can be collected as the first offset value L1, and the center offset of the thick and thin vibration lines in the vertical direction can be collected.
- the offset value is the second offset value L2, and the sum of the first offset value L1 and the second offset value L2 is the final offset value.
- the pixel coordinate values of the vibration thick line 1, the vibration thin line 2 and the white point 3 are all known, and the vibration thick line 1 and the vibration thin line 2 are standard vibration images distributed in the horizontal and vertical directions as Standard, the vibration image of the galvanometer is converted into a form consistent with the standard vibration image, which simplifies the difficulty of dividing the vibration image 02 of the unit and the difficulty of calculating the first offset value L1 and the second offset value L2, so that to a large extent This simplifies the implementation difficulty of the present application.
- FIG. 7 is a schematic flowchart of obtaining multiple offset values provided by the embodiment of the present application, for the above-mentioned gain parameters and duration of the galvanometer mirror The parameters are adjusted, and the process of collecting the vibration image of the galvanometer to obtain a plurality of offset values is repeatedly performed, which may include:
- the gain parameter can also be reduced first, which can be set based on experience in actual operation, which is not specifically limited in this application.
- S310 Determine whether the offset value corresponding to the current duration parameter is greater than the offset value obtained last time, if so, end, if not, enter S39;
- S312 Determine whether the offset value corresponding to the current duration parameter is greater than the offset value obtained last time, if yes, end, if not, enter S311.
- the offset value is the smallest when the parameter setting of the galvanometer is the most suitable, then when the gain parameter and the duration parameter change from appropriate to inappropriate, the offset value must first decrease and then increase.
- the gain parameter and the duration parameter are gradually adjusted, and finally the gain parameter and the duration parameter with the smallest offset value are obtained.
- the step size of each increase or decrease of the gain parameter and the duration parameter can be set to be the same to simplify the adjustment process.
- the determined minimum deviation can be Set a smaller step size near the gain parameter and duration parameter corresponding to the shift value.
- FIG. 8 is a structural block diagram of a device for adjusting parameters of a galvanometer according to an embodiment of the present invention, and the device for adjusting parameters of a galvanometer with reference to FIG. 8 may include:
- the data acquisition module 100 is used for acquiring the vibration image of the galvanometer
- an offset value module 200 configured to obtain an offset value between the thick vibration line and the thin vibration line in each of the vibration images
- the parameter determination module 300 is configured to select the gain parameter and the duration parameter corresponding to the smallest offset value among the offset values as the parameters of the galvanometer, and adjust the parameters of the galvanometer.
- the parameter adjustment device of the galvanometer in this embodiment is used to realize the aforementioned parameter adjustment method of the galvanometer. Therefore, the specific implementation of the parameter adjustment device of the galvanometer can be found in the embodiment part of the parameter adjustment method of the galvanometer above, for example , the data acquisition module 100, the offset value module 200, and the parameter determination module 300 are respectively used to implement steps S11 to S13 in the above-mentioned parameter adjustment method of the galvanometer. Therefore, the specific implementation can refer to the descriptions of the corresponding partial embodiments, It is not repeated here.
- the present application also provides an embodiment of a device for adjusting parameters of a galvanometer, the device may include a projector 4, a projection screen 6, a camera 5 and a processor;
- the projector 4 is used to project the image generated by the vibration of the galvanometer to the projection screen 6;
- the camera 5 is used to capture the image on the projection screen 6 to obtain the vibration image
- the processor is configured to execute the steps of the method for adjusting parameters of the galvanometer according to any one of the above vibration images.
- this embodiment provides a parameter adjustment device for the galvanometer.
- the camera 5 is used to capture the vibration image, and then the processor is based on the vibration image.
- the offset value between the thick vibration line and the thin vibration line in the image changes with the gain parameter and duration parameter of the galvanometer, and finally the most suitable gain parameter and duration parameter are obtained.
- the adjustment efficiency is too high and the adjustment result is accurate.
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Abstract
一种振镜的参数调节方法,包括采集振镜在设定的多个不同参数状态下对应的各个振动图像(S11);其中,参数包括增益参数和时长参数;获得每个振动图像中的振动粗线(1)和振动细线(2)之间的偏移值(S12);选取各个偏移值中最小的偏移值对应的增益参数和时长参数为振镜的参数,对振镜的参数进行调节(S13)。利用振动图像中振动粗线(1)和振动细线(2)之间的偏移值大小和振镜参数是否合适的关联性,确定振镜的参数大小,保证了振镜的工作性能。还提供了一种振镜的参数调节装置和设备。
Description
本发明涉及振镜技术领域,特别是涉及一种振镜的参数调节方法、装置、设备以及计算机可读存储介质。
振镜,是光机的一种组件,位于DMD(数字微镜器件)与镜头之间。主体为一个玻璃镜片和两个线圈,线圈可以驱动镜片沿x/y两个方向上下轻微震动。主要原理为光线穿过镜片时存在折射现象,折射角度与镜片角度相关,利用这个原理,通过驱动线圈来控制镜片左右上下震动达到使DMD上一个像素点在四个时间点反射到四个位置,提高光机画面分辨率的目的。
振镜在实际工作过程中,需要预先设定好多种不同的参数,而参数设置的准确度是直接影响振镜在和光机等配合工作的性能,进而影响光机画面的清晰度。因此,为振镜设定合适的参数是目前亟待解决的技术问题之一。
发明内容
本发明的目的是提供一种振镜的参数调节方法、装置、设备以及计算机可读存储介质,解决了振镜因参数设定不合适,导致振镜工作性能低的问题。
为解决上述技术问题,本发明提供一种振镜的参数调节方法,其特征在于,包括:
采集振镜在设定的多个不同参数状态下对应的各个振动图像;其中,所述参数包括增益参数和时长参数;
获得每个所述振动图像中的振动粗线和振动细线之间的偏移值;
选取各个所述偏移值中最小的偏移值对应的增益参数和时长参数为所述振镜的参数,对所述振镜的参数进行调节。
可选地,获得每个所述振动图像中的振动粗线和振动细线之间的偏移值,包括:
识别所述振动图像中白点的白点像素坐标值以及获得标准振动图像中白点的标准白点像素坐标值,其中,所述标准振动图像的各组振动粗线和振动细线是呈水平方向和垂直方向分布;
根据所述白点像素坐标值和所述标准白点像素坐标值,获得所述振动图像和所述标准振动图像之间的单应矩阵;
根据所述单应矩阵对所述振动图像进行坐标变换,获得变换振动图像;
根据所述变换振动图像中的振动粗线和振动细线的像素坐标值,确定所述偏移值。
可选地,根据所述变换振动图像中的振动粗线和振动细线的像素坐标值,确定所述偏移值,包括:
根据所述标准振动图像中标准单元振动图像的区域范围,识别所述变换振动图像中的单元振动图像,其中,所述单元振动图像中包括一组水平方向的振动粗线和振动细线以及一组竖直方向的振动粗线和振动细线;
采集所述水平方向的振动粗线和振动细线的偏移值为第一偏移值,采集所述竖直方向的振动粗线和振动细线的偏移值为第二偏移值;
对所述第一偏移值和所述第二偏移值进行求和运算,获得所述偏移值。
可选地,所述单元振动图像中每组振动粗线和振动细线中包括红色振动粗线和红色振动细线、绿色振动粗线和绿色振动细线、蓝色振动粗线和蓝色振动细线;
相应地,对所述第一偏移值和所述第二偏移值进行求和运算,获得所述偏移值,包括:
对所述单元振动图像中水平方向一组振动粗线和振动细线的3个第一偏移值和竖直方向一组振动粗线和振动细线的3个第二偏移值进行求和运算,获得所述偏移值。
可选地,选取各个所述偏移值中最小的偏移值对应的增益参数和时长参数为所述振镜的参数,包括:
在各个所述偏移值中选取最小且对应的第一偏移值和第二偏移值均不大于预设偏移值的特定偏移值;
以所述特定偏移值对应的增益参数和时长参数为所述振镜的参数。
可选地,识别所述振动图像中白点的白点像素坐标值,包括:
将所述振动图像进行灰度化处理和二值化处理,得到二值化振动图像;
以找轮廓的方式在所述二值化振动图像找到所有白点的轮廓,以轮廓质心作为白点的像素坐标值。
可选地,根据所述白点像素坐标值和所述标准白点像素坐标值,获得所述振动图像和所述标准振动图像之间的单应矩阵,包括:
根据各个所述白点像素坐标值,在所述振动图像中识别满足预设条件的一个中心白点和三个与所述中心白点距离最近的三个相邻白点,其中,所述预设条件为所述中心白点和所述三个相邻白点分别连线,形成的三条线段之间的夹角依次为105度、145度、110度。
以一个所述中心白点和三个所述相邻白点的像素坐标值,以及所述标准振动图像中满足所述预设条件的四个白点的标准白点坐标值获得所述单应矩阵。
可选地,采集所述振镜在设定的多个不同参数状态下对应的各个振动图像,获得每个所述振动图像中的振动粗线和振动细线之间的偏移值,包括:
采集所述振镜在时长参数不变,增益参数增大前后两个状态下的振动图像,并获得两个所述振动图像的偏移值;
若增大后的增益参数对应的偏移值大于增大前的增益参数对应的偏移值,则以所述增大前的增益参数为基准,采集所述振镜在增益参数逐次减小的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值;
若所述增大后的增益参数对应的偏移值小于所述增大前的增益参数对应的偏移值,则以所述增大后的增益参数为基准,采集所述振 镜在增益参数逐次增大的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值;
采集所述振镜在保持增益参数不变,时长参数增大前后两个状态下的振动图像,并获得两个所述振动图像的偏移值,其中,所述增益参数为多个增益参数对应的偏移值中最小偏移值对应的增益参数;
若增大后的时长参数对应的偏移值大于增大前的时长参数对应的偏移值,则以所述增大前的时长参数为基准,采集所述振镜在时长参数逐次减小的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值;
若所述增大后的时长参数对应的偏移值小于所述增大前的时长参数对应的偏移值,则以所述增大后的时长参数为基准,采集所述振镜在时长参数逐次增大的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值。
本申请还提供了一种振镜的参数调节装置,包括:
数据采集模块,用于采集振镜的振动图像;
偏移值模块,用于获得每个所述振动图像中的振动粗线和振动细线之间的偏移值;
参数确定模块,用于选取各个所述偏移值中最小的偏移值对应的增益参数和时长参数为所述振镜的参数,对所述振镜的参数进行调节。
本申请还提供了一种振镜的参数调节设备,包括投影仪、投影屏幕、相机以及处理器;
所述投影仪用于将振镜的振动产生的图像向投影屏幕投影;
所述相机用于拍摄所述投影屏幕上的图像,获得振动图像;
所述处理器用于根据所述振动图像,执行如上任一项所述的振镜的参数调节方法的步骤。
本申请还提供了一种计算机可读存储介质,所述计算机可读存储介质存储有计算机程序,所述计算机程序被处理器执行实现如上任一项所述的振镜的参数调节方法的步骤。
本发明所提供的振镜的参数调节方法,包括采集振镜在设定的多 个不同参数状态下对应的各个振动图像;其中,参数包括增益参数和时长参数;获得每个振动图像中的振动粗线和振动细线之间的偏移值;选取各个偏移值中最小的偏移值对应的增益参数和时长参数为振镜的参数,对振镜的参数进行调节。
本申请利用振镜的振动图像中振动粗线和振动细线之间的偏移值越小,振镜参数设定越合适这一原理,以振镜的振动图像作为参考依据,调节振镜的增益参数和时长参数,并获得振镜不同的增益参数和时长参数下对应的振动粗线和振动细线之间的偏移值,并以偏移值最小时对应增益参数和时长参数,作为振镜最终的参数,从而保证了振镜参数设定的合理程度,保证了振镜在实际应用过程的性能。
本申请还提供了一种振镜的参数调节装置和设备,具有上述有益效果。
为了更清楚的说明本发明实施例或现有技术的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作简单的介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动的前提下,还可以根据这些附图获得其他的附图。
图1为振镜的振动图像的示意图;
图2为振镜的振动图像中振动偏移的示意图;
图3为本申请实施例提供的振镜的参数调节方法的流程示意图;
图4为本申请提供的采集振动图像的光路结构示意图;
图5为本申请实施例提供的确定第一偏移值和第二偏移值的流程示意图;
图6为图1所示的振动图像中局部白点分布示意图;
图7为本申请实施例提供的获得多个偏移值的流程示意图;
图8为本发明实施例提供的振镜的参数调节装置的结构框图。
如图1所示,图1为振镜的振动图像的示意图。需要说明的是, 本申请中所指的振动图像是利用红、绿、蓝三个光源发出相互平行的光束混合入射至振镜并由振镜输出至感光芯片后产生的图像,是振镜检测常用的测试图像,对此不再详细说明。
在该振动图像包含有多个基本振动图像01,整个振动图像的内容是多个基本振动图像01的重复。基本振动图像01中包括四组振动粗线和振动细线,分别为振动线一011、振动线二012、振动线三013和振动线四014。
其中,振动线一011种包括红色振动粗线11、红色振动细线21、绿色振动粗线12、绿色振动细线22、蓝色振动粗线13、蓝色振动细线23,各条振动粗线和各条振动细线之间相互平行。
类似的振动线二012、振动线三013以及振动线四014中振动粗线和振动细线的分布情况相同;不同的是,振动线二012以及振动线三013中各条振动粗线和振动细线与振动线一011中的各条振动粗线和振动细线与振动线相互垂直,振动线二012和振动线三013中的振动粗线和振动细线上下分布方式相反,而振动线一011和振动线四014的振动粗线和振动细线左右分布方式相反。
以振动线一011为例,理论上如果振镜的增益参数和时长参数设定非常合适,同种两条红色振动粗线11和一条红色振动细线21应当呈Y字型分布,红色振动细线21和同种颜色的两条红色振动粗线11的对称轴位于同一直线上,类似的绿色和蓝色的振动粗细和振动细线也是相同的分布方式;并且振动线二012、振动线三013以及振动线四014中各种颜色的振动粗线和振动细线也是类似的分布方式。
如图2所示,图2为振镜的振动图像中振动偏移的示意图,而当振镜的增益参数和时长参数设定不合适时,振动细线2和振动粗线1会沿垂直于振动细线2的方向发生相对平移,也即是说振动细线2所在直线相对于振动粗线1的对称轴所在直线存在偏移量,且增益参数和时长参数设定越不合适,该偏移量就越大。
目前,对振镜的增益参数和时长参数进行设定时,仅仅是通过人眼观测振动图像,对振镜的参数进行反复调整,这种调节防线显然效 率较低,且准确性差。
为此,本申请中提供了一种基于图像识别自动实现振动参数的调节的技术方案,在很大程度上提高了调节的效率和准确度,有利于振镜的广泛应用。
为了使本技术领域的人员更好地理解本发明方案,下面结合附图和具体实施方式对本发明作进一步的详细说明。显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。
如图3所示,图3为本申请实施例提供的振镜的参数调节方法的流程示意图,该方法可以包括
S11:采集振镜在设定的多个不同参数状态下对应的各个振动图像。
该振镜的参数可以包括增益参数和时长参数。
在对振镜的参数进行调节之前,可以搭建如图4所示的光路结构,使得振镜的振动图像可以通过投影仪4投影至投影屏幕6上,再通过相机5拍摄该投影屏幕6上的振动图像。
S12:获得每个振动图像中的振动粗线和振动细线之间的偏移值。
如前所述,结合图1和图2,当振镜的增益参数和时长参数设定非常合理的情况下,一组振动粗线1和振动细线2中,同种颜色的振动细线2应当在两条振动粗线1的对称轴所在直线上。
相应地,当参数设定不合适的情况下,振动粗线1和振动细线2之间的偏移值应当是满足如下条件的偏移值:
第一是指同一组内振动粗线和振动细线之间的偏移值,例如振动线一011内的就是属于同一组内的振动粗线1和振动细线2;
第二,应当是指同种颜色的振动粗线1和振动细线2之间的偏移值。
第三,应当是振动粗线1和振动细线2在垂直于振动细线2的方向的像素距离,也即相当于振动粗线1的对称轴所在直线和振动细线 2所在直线之间的像素距离。
可选地,参考图1和图2可知,在振动图像中,不同组的振动粗线1和振动细线2之间的分布并不是完全相同的。例如图1中振动线一011和振动线二012中的振动线是相互垂直分布的。因此,为了获得的振动粗线1和振动细线2之间的偏移值更能反应整体的振动图像的成像情况,在获得偏移值时,也是获得两个相互垂直方向的振动粗线1和振动细线2之间的偏移值。如图2所示,该第一偏移值可以是图2中的L1,第二偏移值可以是L2。
进一步地,如图2所示,每组振动粗线1和振动细线2中包括红色振动粗线11和红色振动细线21、绿色振动粗线12和绿色振动细线22、蓝色振动粗线13和蓝色振动细线23。而偏移值是两组相互垂直的振动粗线1和振动细线2。在实际计算偏移值时,可以对每种颜色的振动粗线1和振动细线2进行偏移值计算,相应地,每组振动粗线1和振动细线2中就包括三种颜色,3个偏移值,而相互垂直的两组振动粗线1和振动细线2就包括6个偏移值,最终获得的偏移值可以是6个偏移值之和。
S13:选取各个偏移值中最小的偏移值对应的增益参数和时长参数为振镜的参数,对振镜的参数进行调节。
如前所述,当振镜的参数设定越合适,振动粗线1和振动细线2之间的相对偏移越小,因此,以偏移值最小时对应的增益参数和时长参数为振镜的参数,能够在一定程度上保证振镜的工作性能。
进一步地,考虑到在实际检测过程中可能存在第一偏移值L1为0,而第二偏移值L2相对较大,并且两者之和在多种不同参数对应的偏移值中最小,这种情况最小偏移值对应的参数并不可用。
为此,在选择最小偏移值时,该偏移值还应当满足第一偏移值L1和第二偏移值L2都不至于过大的条件,例如,可以是不大于某个特定阈值,也可以是不大于偏移值的三分之二等等,对此可以根据实际情况设定,本申请中不做具体限制。
综上所述,本申请中利用振镜的振动图像中振动粗线和振动细线 之间分布的相对位置关系和振动的增益参数以及时长参数之间的关系,对振镜的参数进行多次调整,并根据不同参数下对应的偏移值大小确定出最为合适的振镜参数,在一定程度上提高了振镜的增益参数和时长参数的准确性,进而提升振镜的工作性能。
下面将以具体实施例对上述实施例中确定振动粗线和振动细线的第一偏移值和第二偏移值的过程进行详细介绍。
如图5所示,图5为本申请实施例提供的确定第一偏移值和第二偏移值的流程示意图,该过程可以包括:
S21:识别振动图像中白点的白点像素坐标值以及获得标准振动图像中白点的标准白点像素坐标值。
其中,标准振动图像的各组振动粗线和振动细线是呈水平方向和垂直方向分布。
如图1所示,在振动图像中除了包含有振动粗线1和振动细线2之外,还包括有白点3,且该白点3位于振动粗线背离振动细线2的一端,每两条振动粗线1的端部有一个白点3。
另外,为了能够更清晰的识别出振动图像中的白点3,可以先将该振动图像转换为灰度图像,再将该灰度图像进行二值化处理,获得二值化振动图像;再对该二值化振动图像以找轮廓的方式找到所有白点3轮廓,并以轮廓质心作为白点3的像素坐标值。
因为振动图像中振动粗线1和振动细线2在振动图像中颜色较深,将振动图像转换为灰度图像并进行二值化处理后,获得的二值化振动图像中仅仅只显示出白点3,有利于白点3的识别;并且在确定白点3位置时,仅仅以白点质心的像素坐标代表白点3的像素坐标,简化了后续单应矩阵运算的复杂程度。
S22:根据白点像素坐标值和标准白点像素坐标值,获得振动图像和标准振动图像之间的单应矩阵。
可以理解的是,要基于白点像素坐标值和标准白点像素坐标值,确定单应矩阵,需要找到振动图像中的白点3和标准振动图像中的白 点的一一对应关系。
为此,本实施例中在确定振动图像中的进行单应矩阵运算的白点时,对各个白点进行了识别,具体可以包括:
根据各个白点像素坐标值,在振动图像中识别满足预设条件的一个中心白点和三个与中心白点距离最近的三个相邻白点,其中,预设条件为中心白点和三个相邻白点分别连线,形成的三条线段之间的夹角依次为105°、145°、110°。
以一个中心白点和三个相邻白点的像素坐标值,以及标准振动图像中满足预设条件的四个白点的标准白点坐标值获得单应矩阵。
如图1所述,在振动图像中竖直分布的两组振动粗线1和振动细线2中的两组在振动粗线1端部存在白点,而与该组垂直的一组振动粗线1和振动细线2中振动粗线1端部不存在白点3;另外,水平分布的两组振动粗线1和振动细线2中是一组振动粗线1的端部有两个白点3而另一组振动粗线1的端部只有一个白点3。本实施例中就依据这一特性对各个白点3进行识别。
参考图6,图6为图1所示的振动图像中局部白点分布示意图,本实施例中以竖直方向的振动粗线1端部的三个白点3中最边缘的一个点为中心白点31,与其相邻的最近的三个白点3为相邻白点32。这样一个中心白点31和三个相邻白点32分别连线形成的三条线段的角度分别为105度、145度、110度,且振动图像中并不存在其他和位置关系和一个中心白点31和三个相邻白点32位置关系不同,而形成角度相同的白点3,因此,本实施例中依次作为识别各个白点3的依据。
当然,可以理解的是,一个中心白点31和三个相邻白点32分别连线形成的三条线段的角度在依据白点像素坐标值计算时,可能存在误差,只要误差允许范围内,就认为是满足条件的白点3。
在实际应用过程中,还可以存在多种其他识别的方式,例如,识别出位于同一水平线上的三个白点3、位于同一竖直线上的白点3等等,对此,本申请中不做具体限制。
S23:根据单应矩阵对振动图像进行坐标变换,获得变换振动图 像。
S24:根据变换振动图像中的振动粗线和振动细线的像素坐标值,确定偏移值。
图1和图2中所示的振动图像中振动粗线1和振动细线2是呈水平方向分布或是呈竖直方向分布的。但是相机5在实际采集到的振动图像中,并不一定是按照图1所示的角度进行拍摄,最终获得的振动图像中振动粗线1和振动细线2可能均不是垂直状态,这对振动图像中振动粗线1、振动细线2以及偏移值的确定都带来困难。
为此,本实施例中以一个已知各个振动粗线1、振动细线2、白点3等像素坐标值,以及振动粗线1和振动细线2均是水平方向和竖直方向分布的标准振动图像作为参考,例如,图1即是标准振动图像的局部图像,对基于相机采集到的振动图像进行转换,使得转换后的图像中,振动粗线1和振动细线2的分布方式和标准振动图像中相同,那么振动粗线1和振动细线2就均是水平方向和竖直方向分布,在获得振动粗线1和振动细线2的第一偏移值L1和第二偏移值L2时,对于水平方向的振动粗线1和振动细线2,只要对比两个振动粗线1的中心像素点和振动细线2中心像素点的像素纵坐标值即可获得偏移值;同理,竖直方向的振动粗线1和振动细线2,只要对比两个振动粗线1中心像素点和振动细线2中心像素点的像素纵坐标值即可偏移值。
如前所述,振动图像中是包含有多个重复的基本图像单元01的,为了简化在转换图像中识别出单组的振动粗线和振动细线的难度。可选地,可以根据标准振动图像中标准单元振动图像的区域范围,识别变换振动图像中的单元振动图像。
其中,如图1和图2所示,单元振动图像02中包括一组水平方向的振动粗线1和振动细线2以及一组竖直方向的振动粗线1和振动细线2;
包含有多个重复的基本图像单元01的振动图像中识别搜索出一个单元振动图像02存在一定的困难。而本实施例中因为振动图像是转 换成和标准振动图像一致的格式,因此,标准振动图像和振动图像中单元振动图像02的位置范围近似,由此,可以比较简单的划分出振动图像中的单元振动图像02,简化了划分识别单元振动图像02的难度。
在识别出单元振动图像02后,即可采集水平方向的振动粗线和振动细线的中心偏移值为第一偏移值L1,采集竖直方向的振动粗线和振动细线的中心偏移值为第二偏移值L2,并以第一偏移值L1和第二偏移值L2之和为最终的偏移值。
本实施例中通过振动粗线1、振动细线2以及白点3的像素坐标值均已知,且振动粗线1和振动细线2均是水平方向和竖直方向分布的标准振动图像作为标准,将振镜的振动图像转换为和标准振动图像一致的形式,简化了划分单元振动图像02的难度和计算第一偏移值L1以及第二偏移值L2的难度,从而在很大程度上简化了本申请的实现难度。
基于上述实施例,在本申请的另一实施例中,如图7所示,图7位本申请实施例提供的获得多个偏移值的流程示意图,对于上述对振镜的增益参数和时长参数进行调节,并重复执行采集振镜的振动图像,以获得多个偏移值的过程,可以包括:
S31:保持时长参数不变增大增益参数,获得增大后的增益参数对应的偏移值;
S32:判断当前增益参数对应的偏移值是否小于上一次获得偏移值,若是,则进入S33,若否,则进入步骤S35;
当然,也可以是先减小增益参数,在实际操作可以凭经验设定,对此本申请中不做具体限制。
S33:增大当前增益参数并获得对应的偏移值;
S34:判断当前增益参数对应的偏移值是否大于上一次获得偏移值,若是,则进入S37,若否,则进入S33;
S35:减小当前增益参数并获得对应的偏移值;
S36:判断当前增益参数对应的偏移值是否大于上一次获得偏移 值,若是,进入S35,若否,则进入S37;
S37:保持振镜的增益参数为偏移值最小时对应的增益参数不变,增大时长参数并获得增大后的时长参数对应的偏移值;
S38:判断当前时长参数对应的偏移值是否小于上一次获得偏移值,若是,则进入S39,若否,则进入步骤S311;
S39:增大当前时长参数并获得对应的偏移值;
S310:判断当前时长参数对应的偏移值是否大于上一次获得偏移值,若是,则结束,若否,则进入S39;
S311:减小当前时长参数并获得对应的偏移值;
S312:判断当前时长参数对应的偏移值是否大于上一次获得偏移值,若是,则结束,若否,则进入S311。
如前所述偏移值在振镜的参数设置最合适时最小,那么当增益参数和时长参数由合适变为不合适,偏移值也必然是先减小后增大的,本实施例中依据这一原理逐步调整增益参数和时长参数,最终获得偏移值最小的增益参数和时长参数。
可以理解的是,在进行参数调节时,是先调节增益参数还是先调节时长参数并没有必然的先后顺序,本实施例中仅仅是以先调节增益参数为例进行说明。
另外,每次增益参数和时长参数增大或减小的步长可以全部设置成一致,以简化调整过程,当然,为了提高确定的增益参数和时长参数的准确性,可以在确定出的最小偏移值对应的增益参数和时长参数附近设定更小的步长。
下面对本发明实施例提供的振镜的参数调节装置进行介绍,下文描述的振镜的参数调节装置与上文描述的振镜的参数调节方法可相互对应参照。
图8为本发明实施例提供的振镜的参数调节装置的结构框图,参照图8的振镜的参数调节装置可以包括:
数据采集模块100,用于采集振镜的振动图像;
偏移值模块200,用于获得每个所述振动图像中的振动粗线和所述振动细线之间的偏移值;
参数确定模块300,用于选取各个所述偏移值中最小的偏移值对应的增益参数和时长参数为所述振镜的参数,对所述振镜的参数进行调节。
本实施例的振镜的参数调节装置用于实现前述的振镜的参数调节方法,因此振镜的参数调节装置中的具体实施方式可见前文中的振镜的参数调节方法的实施例部分,例如,数据采集模块100,偏移值模块200,参数确定模块300分别用于实现上述振镜的参数调节方法中步骤S11至S13,所以,其具体实施方式可以参照相应的各个部分实施例的描述,在此不再赘述。
本申请还提供了一种振镜的参数调节设备的实施例,该设备可以包括投影仪4、投影屏幕6、相机5以及处理器;
投影仪4用于将振镜的振动产生的图像向投影屏幕6投影;
相机5用于拍摄投影屏幕6上的图像,获得振动图像;
处理器用于根据振动图像,执行如上任一项所述的振镜的参数调节方法的步骤。
如图4所示,本实施例提供振镜的参数调节设备,通过投影仪4将振镜产生的振动图像投影至投影屏幕6后,利用相机5拍摄获得振动图像,再由处理器基于该振动图像中振动粗线和振动细线之间的偏移值随着振镜的增益参数和时长参数的变化,最终获得最为合适的增益参数和时长参数,调节效率过,调节结果准确。
需要说明的是,在本文中,诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来,而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。而且,术语“包括”、“包含”或者其任何其他变体意在涵盖非排他性的包含,从而使得包括一系列要素的过程、方法、物品或者设 备所固有的要素。在没有更多限制的情况下,由语句“包括一个……”限定的要素,并不排除在包括所述要素的过程、方法、物品或者设备中还存在另外的相同要素。另外,本申请实施例提供的上述技术方案中与现有技术中对应技术方案实现原理一致的部分并未详细说明,以免过多赘述。
本说明书中各个实施例采用递进的方式描述,每个实施例重点说明的都是与其它实施例的不同之处,各个实施例之间相同或相似部分互相参见即可。对于实施例公开的装置而言,由于其与实施例公开的方法相对应,所以描述的比较简单,相关之处参见方法部分说明即可。
Claims (8)
- 一种振镜的参数调节方法,其特征在于,包括:采集振镜在设定的多个不同参数状态下对应的各个振动图像;其中,所述参数包括增益参数和时长参数;获得每个所述振动图像中的振动粗线和振动细线之间的偏移值;选取各个所述偏移值中最小的偏移值对应的增益参数和时长参数为所述振镜的参数,对所述振镜的参数进行调节;所述获得每个所述振动图像中的振动粗线和振动细线之间的偏移值,包括:识别所述振动图像中白点的白点像素坐标值以及获得标准振动图像中白点的标准白点像素坐标值,其中,所述标准振动图像的各组振动粗线和振动细线是呈水平方向和垂直方向分布;根据所述白点像素坐标值和所述标准白点像素坐标值,获得所述振动图像和所述标准振动图像之间的单应矩阵;根据所述单应矩阵对所述振动图像进行坐标变换,获得变换振动图像;根据所述变换振动图像中的振动粗线和振动细线的像素坐标值,确定所述偏移值;所述根据所述变换振动图像中的振动粗线和振动细线的像素坐标值,确定所述偏移值,包括:根据所述标准振动图像中标准单元振动图像的区域范围,识别所述变换振动图像中的单元振动图像,其中,所述单元振动图像中包括一组水平方向的振动粗线和振动细线以及一组竖直方向的振动粗线和振动细线;采集所述水平方向的振动粗线和振动细线的偏移值为第一偏移值,采集所述竖直方向的振动粗线和振动细线的偏移值为第二偏移值;对所述第一偏移值和所述第二偏移值进行求和运算,获得所述偏移值。
- 如权利要求1所述的振镜的参数调节方法,其特征在于,所述单元振动图像中每组振动粗线和振动细线中包括红色振动粗线和红色振动细线、绿色振动粗线和绿色振动细线、蓝色振动粗线和蓝色 振动细线;相应地,对所述第一偏移值和所述第二偏移值进行求和运算,获得所述偏移值,包括:对所述单元振动图像中水平方向一组振动粗线和振动细线的3个第一偏移值和竖直方向一组振动粗线和振动细线的3个第二偏移值进行求和运算,获得所述偏移值。
- 如权利要求1所述的振镜的参数调节方法,其特征在于,选取各个所述偏移值中最小的偏移值对应的增益参数和时长参数为所述振镜的参数,包括:在各个所述偏移值中选取最小且对应的第一偏移值和第二偏移值均不大于预设偏移值的特定偏移值;以所述特定偏移值对应的增益参数和时长参数为所述振镜的参数。
- 如权利要求1所述的振镜的参数调节方法,其特征在于,识别所述振动图像中白点的白点像素坐标值,包括:将所述振动图像进行灰度化处理和二值化处理,得到二值化振动图像;以找轮廓的方式在所述二值化振动图像找到所有白点的轮廓,以轮廓质心作为白点的像素坐标值。
- 如权利要求1所述的振镜的参数调节方法,其特征在于,根据所述白点像素坐标值和所述标准白点像素坐标值,获得所述振动图像和所述标准振动图像之间的单应矩阵,包括:根据各个所述白点像素坐标值,在所述振动图像中识别满足预设条件的一个中心白点和三个与所述中心白点距离最近的三个相邻白点,其中,所述预设条件为所述中心白点和所述三个相邻白点分别连线,形成的三条线段之间的夹角依次为105度、145度、110度。以一个所述中心白点和三个所述相邻白点的像素坐标值,以及所述标准振动图像中满足所述预设条件的四个白点的标准白点坐标值获得所述单应矩阵。
- 如权利要求1至5任一项所述的振镜的参数调节方法,其特 征在于,采集所述振镜在设定的多个不同参数状态下对应的各个振动图像,获得每个所述振动图像中的振动粗线和振动细线之间的偏移值,包括:采集所述振镜在时长参数不变,增益参数增大前后两个状态下的振动图像,并获得两个所述振动图像的偏移值;若增大后的增益参数对应的偏移值大于增大前的增益参数对应的偏移值,则以所述增大前的增益参数为基准,采集所述振镜在增益参数逐次减小的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值;若所述增大后的增益参数对应的偏移值小于所述增大前的增益参数对应的偏移值,则以所述增大后的增益参数为基准,采集所述振镜在增益参数逐次增大的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值;采集所述振镜在保持增益参数不变,时长参数增大前后两个状态下的振动图像,并获得两个所述振动图像的偏移值,其中,所述增益参数为多个增益参数对应的偏移值中最小偏移值对应的增益参数;若增大后的时长参数对应的偏移值大于增大前的时长参数对应的偏移值,则以所述增大前的时长参数为基准,采集所述振镜在时长参数逐次减小的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值;若所述增大后的时长参数对应的偏移值小于所述增大前的时长参数对应的偏移值,则以所述增大后的时长参数为基准,采集所述振镜在时长参数逐次增大的状态下,对应的各个振动图像并获得对应的多个偏移值,直到当前获得偏移值大于上一次获得的偏移值。
- 一种振镜的参数调节装置,其特征在于,包括:数据采集模块,用于采集振镜的振动图像;偏移值模块,用于获得每个所述振动图像中的振动粗线和振动细线之间的偏移值;参数确定模块,用于选取各个所述偏移值中最小的偏移值对应的增益参数和时长参数为所述振镜的参数,对所述振镜的参数进行调节;所述偏移值模块获得每个所述振动图像中的振动粗线和振动细线之间的偏移值的方法包括:识别所述振动图像中白点的白点像素坐标值以及获得标准振动图像中白点的标准白点像素坐标值,其中,所述标准振动图像的各组振动粗线和振动细线是呈水平方向和垂直方向分布;根据所述白点像素坐标值和所述标准白点像素坐标值,获得所述振动图像和所述标准振动图像之间的单应矩阵;根据所述单应矩阵对所述振动图像进行坐标变换,获得变换振动图像;根据所述变换振动图像中的振动粗线和振动细线的像素坐标值,确定所述偏移值;所述根据所述变换振动图像中的振动粗线和振动细线的像素坐标值,确定所述偏移值,包括:根据所述标准振动图像中标准单元振动图像的区域范围,识别所述变换振动图像中的单元振动图像,其中,所述单元振动图像中包括一组水平方向的振动粗线和振动细线以及一组竖直方向的振动粗线和振动细线;采集所述水平方向的振动粗线和振动细线的偏移值为第一偏移值,采集所述竖直方向的振动粗线和振动细线的偏移值为第二偏移值;对所述第一偏移值和所述第二偏移值进行求和运算,获得所述偏移值。
- 一种振镜的参数调节设备,其特征在于,包括投影仪、投影屏幕、相机以及处理器;所述投影仪用于将振镜的振动产生的图像向投影屏幕投影;所述相机用于拍摄所述投影屏幕上的图像,获得振动图像;所述处理器用于根据所述振动图像,执行如权利要求1至6任一项所述的振镜的参数调节方法的步骤。
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CN113610779B (zh) * | 2021-07-20 | 2024-06-11 | 歌尔光学科技有限公司 | 振镜状态检测方法、装置、设备及计算机可读存储介质 |
CN113588719A (zh) * | 2021-07-30 | 2021-11-02 | 歌尔光学科技有限公司 | 一种振镜失效检测方法及装置 |
CN114022571B (zh) * | 2022-01-05 | 2022-05-17 | 中国科学院自动化研究所 | 基于振镜的高速虚拟相机系统、观测方法及设备 |
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