WO2022021839A1 - 一种带校验功能的板件智能测试系统 - Google Patents
一种带校验功能的板件智能测试系统 Download PDFInfo
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- WO2022021839A1 WO2022021839A1 PCT/CN2021/076110 CN2021076110W WO2022021839A1 WO 2022021839 A1 WO2022021839 A1 WO 2022021839A1 CN 2021076110 W CN2021076110 W CN 2021076110W WO 2022021839 A1 WO2022021839 A1 WO 2022021839A1
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- 238000012360 testing method Methods 0.000 title claims abstract description 70
- 230000001960 triggered effect Effects 0.000 claims abstract description 22
- 238000004891 communication Methods 0.000 claims abstract description 17
- 238000012795 verification Methods 0.000 claims description 28
- 238000001514 detection method Methods 0.000 claims description 24
- 230000009471 action Effects 0.000 description 21
- 238000000034 method Methods 0.000 description 14
- 230000008569 process Effects 0.000 description 11
- 238000010586 diagram Methods 0.000 description 3
- 230000002159 abnormal effect Effects 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 238000007689 inspection Methods 0.000 description 2
- 238000012544 monitoring process Methods 0.000 description 2
- 230000005856 abnormality Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000000844 transformation Methods 0.000 description 1
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2884—Testing of integrated circuits [IC] using dedicated test connectors, test elements or test circuits on the IC under test
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0416—Connectors, terminals
Definitions
- the invention relates to the technical field of board testing, and more particularly, to an intelligent testing system for boards with a calibration function.
- the technical problem to be solved by the present invention is to provide a panel intelligent test system with a calibration function, aiming at the above-mentioned part of the technical defects of the prior art.
- the technical solution adopted by the present invention to solve the technical problem is: constructing a board intelligent testing system with a calibration function, including: a board socket that can be pluggable and installed with the board to be tested, and can be connected with the board socket Electrically connected board working circuit, connecting the board socket and/or the array switch of the board working circuit, connecting the control unit of the array switch, connecting the communication unit of the control unit, connecting the communication the display unit of the unit; wherein,
- the display unit displays virtual nodes corresponding to the connection nodes of the array switches, the display unit includes a verification unit and an execution unit,
- the verification unit verifies the corresponding relationship of the virtual node and outputs a verification result, and the execution unit generates or clears the connection between the virtual nodes according to the verification result.
- the control unit triggers the connection or disconnection of the corresponding connection node in the array switch according to the connection.
- the board working circuit includes a power supply unit, a reference signal output unit and an output detection unit;
- the array switch includes:
- the communication unit is connected to the reference signal output unit for controlling the reference signal output unit to output the reference signal; and/or
- the communication unit is connected to the output detection unit for acquiring a detection signal of the output detection unit.
- the display unit includes a first trigger unit
- the execution unit clears all the connections between the virtual nodes when the first trigger unit is triggered, and the control unit triggers the array when the execution unit clears the connections between the virtual nodes All connected nodes in the switch are disconnected.
- the display unit includes a first storage unit and a second trigger unit;
- the display unit saves the connection state corresponding to the current operation of the virtual node to the first storage unit when the second trigger unit is triggered.
- the display unit includes a third trigger unit
- the execution unit acquires when the third trigger unit is triggered, and generates or clears the connection between the virtual nodes according to the connection state of the virtual node corresponding to the previous operation.
- the display unit includes a panel information input unit
- the board information input unit is used for inputting board information of the board to be tested
- the execution unit acquires and saves the board information of the board to be tested when saving the connection state corresponding to the current operation of the virtual node to the first storage unit.
- the display unit further includes a second storage unit and a fourth trigger unit;
- the second storage unit is used to store the preset connection state corresponding to the board to be tested
- the execution unit acquires the corresponding preset connection state according to the board information when the fourth trigger unit is triggered, and generates or clears the connection between the virtual nodes according to the preset connection state. connect.
- the board information of the board to be tested includes a board name of the board to be tested and/or a board test case of the board to be tested.
- the array switch consists of a contactless photorelay, and/or
- the display unit is a touch display screen.
- Fig. 1 is a logic block diagram of an embodiment of a panel intelligent test system with calibration function of the present invention
- FIG. 2 is a logical block diagram of another embodiment of a panel intelligent test system with a calibration function of the present invention
- FIG. 3 is a schematic diagram of an embodiment of a display interface of a display unit of the present invention.
- a board intelligent test system with a calibration function of the present invention includes: a board socket 110 that can be pluggable and installed with the board to be tested, and can be connected to the board socket 110 .
- 110 Electrically connected board working circuit 120, connected to the board socket 110 and/or the array switch 130 of the board working circuit 120, connected to the control unit 140 of the array switch 130, connected to the communication unit 150 of the control unit 140, connected to the communication unit
- the display unit 160 of 150 wherein, the display unit 160 displays the virtual node 161 corresponding to the connection node of the array switch 130, the display unit 160 includes a verification unit and an execution unit, and the verification unit verifies the virtual node when the virtual node 161 is triggered 161 and output the verification result, the execution unit generates or clears the connection between the virtual nodes according to the verification result; the control unit 140 triggers the array switch according to the connection when the execution unit generates or clears the connection between the virtual nodes The corresponding connection node in is
- the board to be tested is matched with the board socket 110 and is pluggable and installed with the board socket 110.
- the board to be tested is placed in the board socket 110.
- the above is to form the test circuit of the board to be tested.
- the board working circuit 120 corresponds to a working circuit used to realize various application functions of the board when the board is tested.
- the array switch 130 can be arranged between the pins of the board socket 110 or between the board socket 110 and the board working circuit 120 , and the array switch 130 can be formed by the on and off coordination of each switch in the array switch 130 .
- connection nodes finally form different electrical connection relationships between the pins of the board socket 110 or between the board socket 110 and the board working circuit 120 . Different electrical connection relationships correspond to tests of different functions or indicators of the board to be tested.
- the operation of the array switch 130 can be controlled by the control unit 140 .
- the control unit 140 is connected to the display unit 160 through the communication unit 150 .
- the display unit 160 displays a virtual node 161 , and the virtual node 161 and the connection node of the array switch 130 are in a one-to-one relationship.
- the connection node of the array switch 130 is understood as a connection node used by the array switch 130 to connect external units.
- the verification unit will verify the relationship between the two virtual nodes 161 . It first determines whether there is a connection between the two virtual nodes 161, and if the two virtual nodes 161 are disconnected, then confirms the two virtual nodes according to the connection relationship between the two virtual nodes 161. Whether the connection node of the array switch corresponding to 161 can be connected, that is, whether the connection of the virtual node 161 is legal.
- connection relationship between the pins during the test is preset. All other connection relationships are not connectable. Therefore, before the connection between the virtual nodes 161 is generated, it is necessary to judge the connection relationship between the current virtual nodes. When it is determined that the pre-connected virtual node meets the actual connection requirements of the board under test, or the connection requirements of the test process of the board under test, or the connection will not cause circuit abnormalities, etc., it is considered that the verification is valid.
- the execution unit When the result is passed, the execution unit generates a connection between the two virtual nodes 161 on the display unit 160 .
- the connection relationship between the current virtual nodes it is determined that the connection of the pre-connected virtual node is not the connection required in the test process of the board under test, or the connection will cause abnormal circuits and other illegal connections. If the line is connected, it is considered that the verification result is not passed, and it can be prompted that the verification is not passed, and the execution unit does not perform the connection action. It can be understood that the operations of the virtual nodes 161 are performed in sequence. During each operation of the virtual nodes 161, it is necessary to judge whether the current operation on the virtual nodes 161 is based on the connection relationship between the existing virtual nodes 161.
- control unit 140 triggers the connection or disconnection of the connection node corresponding to the triggered virtual node in the array switch according to the execution result of the execution unit when the execution unit executes the connection between the virtual nodes according to the verification result.
- control unit 161 monitors the actions of the execution units and controls the corresponding array switch actions according to the execution actions of the execution units to form an electrical connection relationship in the actual test unit corresponding to the virtual node 161 connection on the display unit 160 .
- the execution unit will clear the connection between the two virtual nodes 161 on the display unit 160 .
- the control unit 140 triggers the disconnection of the connection node corresponding to the triggered virtual node in the array switch 130 according to the execution result of the execution unit, thus disconnecting the connection node with the virtual node.
- the board working circuit 120 includes a power supply unit 121 , a reference signal output unit 122 and an output detection unit 123 ;
- the array switch 130 includes: a first attribute pin connected to the board socket 110 to form a first attribute pin.
- a first array switch 131 with a connection relationship between attribute pins a second array switch 132 connecting the second attribute pin of the board socket 110 and the power supply unit 121 to form a connection relationship between the power supply unit 121 and the second attribute pin a third array switch 133 connecting the third attribute pin of the board socket 110 and the reference signal output unit 122 to form a connection relationship between the reference signal output unit 122 and the third attribute pin;
- the four attribute pins and the output detection unit 123 form a fourth array switch 134 in a connection relationship between the fourth attribute pin and the output detection unit 123 .
- the board working circuit 120 corresponding to the board to be tested can be divided into a power supply unit 121 , a reference signal output unit 122 and an output detection unit 123 .
- a power supply unit 121 is used to supply power to the board under test, which can be connected to the power supply pin of the board under test through the second attribute pin of the board socket 110, and a second array switch 132 is set to realize the power supply unit 121 and the first power supply pin.
- the two attribute pins are turned on or off; the reference signal output unit 122 is used to provide the test input signal of the board under test, which is also understood as a reference signal, which can pass through the third attribute pin of the board socket 110 and the board under test.
- the reference signal input pin is connected to the pin, and the third array switch 133 is set to realize the turn-on or turn-off of the reference signal output unit 122 and the third attribute pin; the output detection unit 123 is used to obtain the test output signal of the board under test. , which can be connected to the test signal output pin of the board to be tested through the fourth attribute pin of the board socket 110, and set the fourth array switch 134 to realize the turn-on or turn-off of the output detection unit 123 and the fourth attribute pin .
- the power supply unit 121 supplies power to the board under test, triggers the virtual node 161 corresponding to the third array switch 133, and inputs the board under test.
- the reference signal by triggering the virtual node 161 corresponding to the fourth array switch 134, causes the output detection unit 123 to obtain the output signal of the board to be tested, and determines the output signal of the board to be tested by testing the output signal or the relationship between the test output signal and the reference signal. Performance.
- some pins of some boards to be tested need to be connected during the working process.
- the first attribute pin of the board socket 110 can be connected to the corresponding pin of the board to be tested, and set The first array switch 131 realizes the turn-on or turn-off between the first attribute pins.
- the first array switch 131 realizes the turn-on or turn-off between the first attribute pins.
- the corresponding relationship between each array switch and the virtual node 161 is that the virtual node 161 corresponds to the connection node of the array switch as described above.
- the first array switch 131 , the second array switch 132 , the third array switch 133 and the fourth array switch 134 can be selectively set as required.
- the communication unit 150 is connected to the reference signal output unit 122 for controlling the reference signal output unit 122 to output the reference signal; and/or the communication unit 150 is connected to the output detection unit 123 for acquiring and outputting the detection signal of the detection unit 123 . That is, the display unit 160 can control the reference signal output unit 122 to output the required reference signal through the communication unit 150. In addition, the display unit 160 can also receive the detection signal obtained by the output detection unit 123 through the communication unit 150 and perform the test results of the board under test. confirm.
- the display unit 160 includes a first trigger unit; the execution unit clears the connections between all virtual nodes 161 when the first trigger unit is triggered, and the control unit 140 clears the virtual nodes between the execution units. All connection nodes in the array switch 130 are triggered to be disconnected when connecting between them. That is, a clear instruction can be generated by triggering the first trigger unit, and the execution unit clears the connections between all the currently displayed virtual nodes 161 according to the clear instruction. After the clear instruction is executed, all virtual nodes 161 displayed on the display unit 160 There is no connection between them.
- the control unit 140 triggers all connection nodes in the array switch to be disconnected according to the clear action of the execution unit, that is, disconnects the connection relationship between the connection nodes of all the array switches.
- the clear instruction can be generated by triggering the clear button 162 set on the display unit 160 .
- the display unit 160 includes a first storage unit and a second trigger unit; the display unit saves the connection state corresponding to the current operation of the virtual node to the first storage unit when the second trigger unit is triggered. That is, a storage instruction can be generated by triggering the second triggering unit, and the display unit stores the connections between all the currently displayed virtual nodes 161 according to the storage instruction, and the execution of the storage instruction may not affect the displayed connections of the display unit 160 , that is, the execution unit does not perform the action of generating or clearing the connection between the virtual nodes 161 , the execution unit monitored by the control unit is not in action, and the array switch action is not triggered.
- the storage instruction may be generated by triggering a save button set by the display unit 160 .
- the display unit 160 includes a third trigger unit; the execution unit acquires when the third trigger unit is triggered and generates or clears the connection between the virtual nodes according to the connection state of the virtual node corresponding to the previous operation. That is, a return instruction can be generated by triggering the third trigger unit, and the execution unit 160 obtains according to the return instruction and generates or clears the connection between the virtual nodes 161 according to the connection state corresponding to the last operation of the virtual node 161, which will be displayed soon.
- the displayed connection line of the unit 160 is displayed as the connection relationship corresponding to the last virtual node 161 .
- the control unit 140 triggers the connection or disconnection of the corresponding connection node in the array switch according to the action of the execution unit.
- the return instruction can be generated by triggering the return button 163 set by the display unit 160 .
- the display unit 160 includes a board information input unit; the board information input unit is used to input the board information of the board to be tested; the display unit 160 saves the connection state corresponding to the current operation of the virtual node 161 to the first When storing the unit, obtain and save the board information of the board to be tested.
- the display unit 160 saves the connection state corresponding to the current operation of the virtual node 161, it can obtain the board information through the board information input unit, so as to correspond the current connection state with the board related information.
- the panel information input unit may input relevant information by setting a corresponding information input window on the display unit 160 .
- the display unit 160 also includes a second storage unit and a fourth trigger unit; the second storage unit is used to store the preset connection state corresponding to the board to be tested; the execution unit is triggered according to the fourth trigger unit.
- the board information of the board to be tested acquires the corresponding preset connection state, and generates or clears the connection between the virtual nodes 161 according to the preset connection state.
- connection relationship between the virtual nodes 161 When generating the connection relationship between the virtual nodes 161, it can be preset and stored according to the board information of the board to be tested and corresponding to its possible connection state, and when the board to be tested is tested, it can be based on Trigger the fourth trigger unit to generate a call instruction, directly call the corresponding pre-stored connection state according to the obtained board information of the board to be tested, generate a connection between the virtual nodes 161, or clear the connection between some virtual nodes 161 String. Meanwhile, when monitoring the action of the execution unit, the control unit 140 triggers the connection or disconnection of the corresponding connection nodes in the array switch according to the action of the execution unit to form a connection relationship between connection nodes of the array switch.
- the calling instruction may be generated by triggering a calling key set by the display unit 160 .
- the board information of the board to be tested includes a board name of the board to be tested and/or a board test case of the board to be tested. That is, when saving or calling the connection state of the board to be tested, it can be distinguished according to the board name of the board to be tested, or according to the test case of the board corresponding to the board to be tested. The combination of the two is differentiated.
- the array switch 130 is composed of non-contact photorelays, and the array switches are composed of non-contact photorelays with low thermal potential and low on-resistance, which can improve system reliability, reduce power consumption and save space.
- the display unit 160 is a touch display screen.
- the virtual contact can be directly triggered by touching the display screen, and the connection relationship of the test unit can be quickly realized.
- the board intelligent test system with verification function it triggers the virtual node and verifies the trigger action that triggers the virtual node, and forms a connection relationship between the virtual nodes after the verification is passed, and Corresponding connection lines are generated, and at the same time, the array switch actions are controlled according to the connection actions between the virtual nodes to form the connection relationship between the corresponding connection nodes, so as to form the final connection circuit connection relationship.
- the test result of the board to be tested is obtained, and the test of the board to be tested is completed. Specifically, it also performs various operations according to the board intelligent testing system to test different boards to be tested.
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Abstract
一种带校验功能的板件智能测试系统，包括：与待测板件可插拔安装的板件插座（110），可与板件插座（110）电性连接的板件工作电路（120），连接板件插座（110）和/或板件工作电路（120）的阵列开关（130），连接阵列开关（130）的控制单元（140），连接控制单元（140）的通信单元（150），连接通信单元（150）的显示单元（160）；显示单元（160）显示与阵列开关（130）的连接节点对应的虚拟节点（161），显示单元（160）包括校验单元和执行单元，校验单元在虚拟节点（161）被触发时根据虚拟节点（161）的对应关系校验并输出校验结果，执行单元根据校验结果生成或清除虚拟节点（161）之间的连线；控制单元（140）在执行单元生成或清除虚拟节点（160）之间的连线时根据连线触发阵列开关（130）中对应的连接节点连接或断开。测试系统操作方便，且能够提高测试结果的可靠性。
Description
本发明涉及板件测试技术领域，更具体地说，涉及一种带校验功能的板件智能测试系统。
大亚湾、岭澳核电站每轮次大修校验板件的数量庞大，接近300块，传统板件校验方式存在的主要的弊端和缺陷：接线方式通过几十个甚至上百个针脚的线缆接线实现，不仅不直观而且凌乱，增加接线错误概率；同时在进行板件校验时需要外接较多信号源和测量仪表，其测试过程中场地布置管理难度加大；同时由于布线复杂，出现异常时查找故障点困难，很难快速准确定位故障点。同时，在板件测试过程中，由于不能主动识别板件之间的错误连线，导致测试过程异常，使得不能得到准确的测试结果，测试结果不可靠。
本发明要解决的技术问题在于，针对现有技术的上述部分技术缺陷，提供一种带校验功能的板件智能测试系统。
本发明解决其技术问题所采用的技术方案是：构造一种带校验功能的板件智能测试系统，包括：与待测板件可插拔安装的板件插座，可与所述板件插座电性连接的板件工作电路，连接所述板件插座和/或所述板件工作电路的阵列开关，连接所述阵列开关的控制单元，连接所述控制单元的通信单元，连接所述通信单元的显示单元；其中，
所述显示单元显示与所述阵列开关的连接节点对应的虚拟节点，所述显示单元包括校验单元和执行单元，
所述校验单元在所述虚拟节点被触发时校验所述虚拟节点的对应关系并输出校验结果，所述执行单元根据所述校验结果生成或清除所述虚拟节点之间的连线；
所述控制单元在所述执行单元生成或清除所述虚拟节点之间的连线时根据所述连线触发所述阵列开关中对应的连接节点连接或断开。
优选地，所述板件工作电路包括供电单元、基准信号输出单元和输出检测单元；
所述阵列开关包括：
连接所述板件插座的第一属性管脚以形成所述第一属性管脚之间的连接关系的第一阵列开关；
连接所述板件插座的第二属性管脚与所述供电单元以形成所述供电单元对所述第二属性管脚连接关系的第二阵列开关；
连接所述板件插座的第三属性管脚与所述基准信号输出单元以形成所述基准信号输出单元与所述第三属性管脚连接关系的第三阵列开关；和/或
连接所述板件插座的第四属性管脚与所述输出检测单元以形成所述第四属性管脚与所述输出检测单元连接关系的第四阵列开关。
优选地，所述通信单元连接所述基准信号输出单元、用于控制所述基准信号输出单元输出基准信号；和/或
所述通信单元连接所述输出检测单元、用于获取所述输出检测单元的检测信号。
优选地，所述显示单元包含第一触发单元，
所述执行单元在所述第一触发单元被触发时清除所有所述虚拟节点之间的连线，所述控制单元在所述执行单元清除所述虚拟节点之间的连线时触发所述阵列开关中所有连接节点为断开。
优选地，所述显示单元包括第一存储单元和第二触发单元；
所述显示单元在所述第二触发单元被触发时保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元。
优选地，所述显示单元包括第三触发单元；
所述执行单元在所述第三触发单元被触发时获取并根据所述虚拟节点在上一操作对应的连线状态生成或清除所述虚拟节点之间的连线。
优选地，所述显示单元包括板件信息输入单元；
所述板件信息输入单元用于输入所述待测板件的板件信息；
所述执行单元在保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元时，获取并保存所述待测板件的板件信息。
优选地，所述显示单元还包括第二存储单元和第四触发单元；
所述第二存储单元用于存储与所述待测板件对应的预设连线状态；
所述执行单元在所述第四触发单元被触发时根据所述板件信息获取对应的所述预设连线状态、并根据所述预设连线状态生成或清除所述虚拟节点之间的连线。
优选地，所述待测板件的板件信息包括所述待测板件的板件名称和/或所述待测板件的板件测试用例。
优选地，所述阵列开关由无触点光电继电器组成，和/或
所述显示单元为触摸显示屏。
实施本发明的一种带校验功能的板件智能测试系统，具有以下有益效果：操作方便，在减少板件测试过程的工作量的同时，能够提高测试结果的可靠性。
下面将结合附图及实施例对本发明作进一步说明，附图中：
图1是本发明一种带校验功能的板件智能测试系统一实施例的逻辑框图；
图2是本发明一种带校验功能的板件智能测试系统另一实施例的逻辑框图；
图3是本发明显示单元显示界面一实施例的示意图。
为了对本发明的技术特征、目的和效果有更加清楚的理解，现对照附图详细说明本发明的具体实施方式。
如图1所示，在本发明的一种带校验功能的板件智能测试系统第一实施例中，包括：与待测板件可插拔安装的板件插座110，可与板件插座110电性连接的板件工作电路120，连接板件插座110和/或板件工作电路120的阵列开关130，连接阵列开关130的控制单元140，连接控制单元140的通信单元150，连接通信单元150的显示单元160；其中，显示单元160显示与阵列开关130的连接节点对应的虚拟节点161，显示单元160包括校验单元和执行单元，校验单元在虚拟节点161被触发时校验虚拟节点161的对应关系并输出校验结果，执行单元根据校验结果生成或清除虚拟节点之间的连线；控制单元140在执行单元生成或清除虚拟节点之间的连线时根据连线触发阵列开关中对应的连接节点连接或断开。具体的，在测试系统中，待测板件与板件插座110配合并与板件插座110可插拔安装，在需要对待测板件进行测试时，将待测板件置于板件插座110上以构成待测板件的测试电路。板件工作电路120即对应为板件测试时，用于实现板件各种应用功能的工作电路。其中板件插座110的管脚之间或板件插座110与板件工作电路120之间可以设置阵列开关130，其可以通过阵列开关130的中各开关的导通与关断配合设置形成阵列开关130各连接节点之间的导通与关断，最终形成板件插座110的各管脚之间或者板件插座110与板件工作电路120之间不同的电性连接关系。不同的电性连接关系对应待测板件的不同的功能或指标的测试。可以通过控制单元140控制阵列开关130动作。控制单元140通过通信单元150连接显示单元160，显示单元160上显示有虚拟节点161，虚拟节点161与阵列开关130的连接节点为一一对应的关系。阵列开关130的连接节点理解为阵列开关130用来外接单元的连接节点。
当触发端点对应的阵列开关130的连接节点对应的虚拟节点161时，如依次点击两个虚拟节点161，校验单元会对两个虚拟节点161的关系校验。其先判断两个虚拟节点161之间为是否已有连线，若该两个虚拟节点161之间为未连线状态时，再根据两个虚拟节点161的连线关系确认该两个虚拟节点161对应的阵列开关的连接节点是否可以连接，即虚拟节点161的连接是否合法。可以理解，由于一些待测板件中，其一些管脚与另外一些管脚不能形成连接关系，或者一些管脚的使用会使得另外的某些管脚不能被使用，或者对一些待测板件，其测试过程中管脚之间的连接关系为预先设定的。其他的连接关系均为不可以连接的。因此，在虚拟节点161之间生成连线之前，需要对当前的虚拟节点之间的连接关系进行判断。在判定预连接的虚拟节点满足待测板件实际的连接要求，或者待测板件的测试过程连线要求，或者其连线不会造成电路的异常等等合法连线时，则认为校验结果通过，执行单元才会在显示单元160上生成该两个虚拟节点161之间的连线。当根据当前虚拟节点之间的连线关系，判定预连接的虚拟节点的连线不是该待测板件测试过程中需要的连线，或者其连线会造成电路的异常等等不合法的连线，则认为校验结果为不通过，可以提示校验不通过，同时执行单元不执行该连线动作。可以理解，虚拟节点161的操作为依次进行的，在每一次的虚拟节点161的操作过程中，均需要根据现有的虚拟节点161之间的连线关系判断当前的对虚拟节点161的操作是否合法，以输出对应的校验结果。同时，控制单元140在执行单元根据校验结果执行生成虚拟节点之间的连线过程中，会根据执行单元的执行结果触发阵列开关中与被触发的虚拟节点对应的连接节点连接或断开。也可以为，控制单元161监测执行单元的动作并根据执行单元的执行动作控制对应的阵列开关动作，形成与显示单元160上虚拟节点161连线对应的实际的测试单元中的电性连接关系。在校验过程中，当该两个虚拟节点161之间为已连线状态时，执行单元则会在显示单元160上清除该两个虚拟节点161之间的连线。控制单元140在执行单元执行清除虚拟节点之间的连线过程中，根据执行单元的执行结果触发阵列开关130中与被触发的虚拟节点对应的连接节点断开，这样就断开了与虚拟节点161连线对应的实际的测试单元中的电性连接关系。即，控制单元140控制阵列开关动作的过程为控制单元140监测执行单元动作，在执行单元动作后，根据执行单元的动作结果执行对应的操作。即每一次，执行单元执行生成或清除虚拟节点之间的连线后，控制单元根据执行单元执行的生成或清除连线的动作控制对应的阵列开关动作。
可选的，如图2所示，板件工作电路120包括供电单元121、基准信号输出单元122和输出检测单元123；阵列开关130包括：连接板件插座110的第一属性管脚以形成第一属性管脚之间的连接关系的第一阵列开关131；连接板件插座110的第二属性管脚与供电单元121以形成供电单元121对第二属性管脚连接关系的第二阵列开关132；连接板件插座110的第三属性管脚与基准信号输出单元122以形成基准信号输出单元122与第三属性管脚连接关系的第三阵列开关133；和/或连接板件插座110的第四属性管脚与输出检测单元123以形成第四属性管脚与输出检测单元123连接关系的第四阵列开关134。具体的，根据板件的工作及测试过程各具体电路的工作原理，可以将待测板件对应的板件工作电路120划分为供电单元121、基准信号输出单元122和输出检测单元123。为了方便控制，对不同的电路连接关系，其设置不同的阵列开关形成不同的电路连接关系。其中，供电单元121用于对待测板件供电，其可以通过板件插座110的第二属性管脚与待测板件的供电管脚连接，并设置第二阵列开关132实现供电单元121与第二属性管脚导通或关断；基准信号输出单元122用于提供待测板件的测试输入信号也理解为基准信号，其可以通过板件插座110的第三属性管脚与待测板件的基准信号输入管脚管脚连接，并设置第三阵列开关133实现基准信号输出单元122与第三属性管脚导通或关断；输出检测单元123用于获取待测板件的测试输出信号，其可以通过板件插座110的第四属性管脚与待测板件的测试信号输出管脚连接，并设置第四阵列开关134实现输出检测单元123与第四属性管脚导通或关断。待测板件测试过程中，通过触发与第二阵列开关132对应的虚拟节点161，使得供电单元121对待测板件供电，触发与第三阵列开关133对应的虚拟节点161，对待测板件输入基准信号，通过触发与第四阵列开关134对应的虚拟节点161，使得输出检测单元123获取待测板件的输出信号，通过测试输出信号或者测试输出信号与基准信号的关系判定待测板件的性能指标。同时，某些待测板件在工作过程中，其部分管脚是需要进行连接的，此时可以通过板件插座110的第一属性管脚与待测板件的对应管脚连接，并设置第一阵列开关131实现第一属性管脚之间导通或关断。触发与第一阵列开关131对应的虚拟节点161，即可以实现待测板件内部工作管脚之间的连接或断开关系。各阵列开关与虚拟节点161的对应关系为上文描述虚拟节点161与阵列开关的连接节点对应。第一阵列开关131、第二阵列开关132、第三阵列开关133和第四阵列开关134可以根据需要进行选择性设置。
可选的，通信单元150连接基准信号输出单元122、用于控制基准信号输出单元122输出基准信号；和/或通信单元150连接输出检测单元123、用于获取与输出检测单元123的检测信号。即，显示单元160可以通过通信单元150控制基准信号输出单元122输出需要的基准信号，此外显示单元160也可以通过通信单元150接收输出检测单元123获取的检测信号并对待测板件的测试结果进行确认。
可选的，如图3所示，显示单元160包括第一触发单元；执行单元在第一触发单元被触发时清除所有虚拟节点161之间的连线，控制单元140在执行单元清除虚拟节点之间的连线时触发阵列开关130中所有连接节点为断开。即，可以通过触发第一触发单元生成清除指令，执行单元根据该清除指令清除当前显示的所有虚拟节点161之间的连线，在清除指令执行后，显示单元160上显示的所有虚拟节点161之间均没有连线关系。同时，控制单元140在执行单元执行清除指令时，根据执行单元的清除动作触发阵列开关中所有连接节点为断开，即断开所有的阵列开关的连接节点之间的连接关系。该清除指令可以通过触发显示单元160设置的清除按键162生成。
可选的，显示单元160包括第一存储单元和第二触发单元；显示单元在第二触发单元被触发时保存虚拟节点的当前操作对应的连线状态至第一存储单元。即，可以通过触发第二触发单元触发生成存储指令，显示单元根据该存储指令存储当前显示的所有虚拟节点161之间的连线，存储指令的执行对显示单元160的显示的连线可以不影响，即执行单元不执行生成或清除虚拟节点161之间的连线的动作，控制单元监测到的执行单元未动作，不触发阵列开关动作。该存储指令可以通过触发显示单元160设置的保存按键生成。
可选的，显示单元160包括第三触发单元；执行单元在第三触发单元被触发时获取并根据虚拟节点在上一操作对应的连线状态生成或清除虚拟节点之间的连线。即，可以通过触发第三触发单元生成返回指令，执行单元160根据该返回指令获取并根据虚拟节点161在上一操作对应的连线状态以生成或清除虚拟节点161之间的连线，即将显示单元160的显示连线显示为上一次的虚拟节点161对应的连线关系。同时，控制单元140在监测到执行单元动作时，根据执行单元的动作触发阵列开关中对应的连接节点连接或断开。该返回指令可以通过触发显示单元160设置的返回按键163生成。
可选的，显示单元160包括板件信息输入单元；板件信息输入单元用于输入待测板件的板件信息；显示单元160在保存虚拟节点161的当前操作对应的连线状态至第一存储单元时，获取并保存待测板件的板件信息。显示单元160在对虚拟节点161的当前操作对应的连线状态进行保存时，其可以通过板件信息输入单元获取板件信息，以将当前的连线状态同板件相关信息对应。板件信息输入单元可以通过在显示单元160设置对应的信息输入窗口进行相关信息的输入。
可选的，显示单元160还包括第二存储单元和第四触发单元；第二存储单元用于存储与待测板件对应的预设连线状态；执行单元在第四触发单元被触发时根据待测板件的板件信息获取对应的预设连线状态、并根据预设连线状态生成或清除虚拟节点161之间的连线。在生成虚拟节点161之间的连接关系时，其可以根据待测板件的板件信息对应其可能的连线状态进行预设设定并存储，在对待测板件进行测试时，其可以根据触发第四触发单元生成调用指令，根据获取的待测板件的板件信息直接调用预存的对应的连线状态，在虚拟节点161之间生成连线，或者清除一些虚拟节点161之间的连线。同时，控制单元140在监测到执行单元动作时，根据执行单元的动作触发阵列开关中对应的连接节点连接或断开，形成的阵列开关的连接节点之间的连接关系。该调用指令可以通过触发显示单元160设置的调用按键生成。
可选的，待测板件的板件信息包括待测板件的板件名称和/或待测板件的板件测试用例。即，对待测板件进行连线状态的保存或调用时，其可以根据待测板件的板件名称进行区分，也可以根据待测板件对应的板件测试用例进行区分，还可以通过两者的结合进行区分。
可选的，阵列开关130由无触点光电继电器组成，通过低热电势、低导通阻抗的无触点光电继电器组成阵列开关，其可以提高系统可靠性，降低功耗和节省空间。
可选的，显示单元160为触摸显示屏。为了方便操作，通过触摸显示屏能够直接进行虚拟触点的触发，快速实现测试单元的连接关系。
即，通过上面描述带校验功能的板件智能测试系统，其通过触发虚拟节点，并对触发虚拟节点的触发动作进行校验，其在校验通过后形成虚拟节点之间的连接关系，并生成对应的连线，同时根据虚拟节点之间的连线动作控制阵列开关动作形成对应的连接节点之间的连接关系，以形成最终的连接电路连接关系。在该电路连接关系下，获取待测板件的测试结果，完成对待测板件的测试。其具体还根据板件智能测试系统进行各种操作，以实现对不同的待测板件的测试。
可以理解的，以上实施例仅表达了本发明的优选实施方式，其描述较为具体和详细，但并不能因此而理解为对本发明专利范围的限制；应当指出的是，对于本领域的普通技术人员来说，在不脱离本发明构思的前提下，可以对上述技术特点进行自由组合，还可以做出若干变形和改进，这些都属于本发明的保护范围；因此，凡跟本发明权利要求范围所做的等同变换与修饰，均应属于本发明权利要求的涵盖范围。
Claims (10)
- 一种带校验功能的板件智能测试系统，其特征在于，包括：与待测板件可插拔安装的板件插座，可与所述板件插座电性连接的板件工作电路，连接所述板件插座和/或所述板件工作电路的阵列开关，连接所述阵列开关的控制单元，连接所述控制单元的通信单元，连接所述通信单元的显示单元；其中，所述显示单元显示与所述阵列开关的连接节点对应的虚拟节点，所述显示单元包括校验单元和执行单元，所述校验单元在所述虚拟节点被触发时校验所述虚拟节点的对应关系并输出校验结果，所述执行单元根据所述校验结果生成或清除所述虚拟节点之间的连线；所述控制单元在所述执行单元生成或清除所述虚拟节点之间的连线时根据所述连线触发所述阵列开关中对应的连接节点连接或断开。
- 根据权利要求1所述的带校验功能的板件智能测试系统，其特征在于，所述板件工作电路包括供电单元、基准信号输出单元和输出检测单元；所述阵列开关包括：连接所述板件插座的第一属性管脚以形成所述第一属性管脚之间的连接关系的第一阵列开关；连接所述板件插座的第二属性管脚与所述供电单元以形成所述供电单元对所述第二属性管脚连接关系的第二阵列开关；连接所述板件插座的第三属性管脚与所述基准信号输出单元以形成所述基准信号输出单元与所述第三属性管脚连接关系的第三阵列开关；和/或连接所述板件插座的第四属性管脚与所述输出检测单元以形成所述第四属性管脚与所述输出检测单元连接关系的第四阵列开关。
- 根据权利要求2所述的板件智能测试系统，其特征在于，所述通信单元连接所述基准信号输出单元、用于控制所述基准信号输出单元输出基准信号；和/或所述通信单元连接所述输出检测单元、用于获取所述输出检测单元的检测信号。
- 根据权利要求1所述的带校验功能的板件智能测试系统，其特征在于，所述显示单元包含第一触发单元，所述执行单元在所述第一触发单元被触发时清除所有所述虚拟节点之间的连线，所述控制单元在所述执行单元清除所述虚拟节点之间的连线时触发所述阵列开关中所有连接节点为断开。
- 根据权利要求1所述的带校验功能的板件智能测试系统，其特征在于，所述显示单元包括第一存储单元和第二触发单元；所述显示单元在所述第二触发单元被触发时保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元。
- 根据权利要求5所述的带校验功能的板件智能测试系统，其特征在于，所述显示单元包括第三触发单元；所述执行单元在所述第三触发单元被触发时获取并根据所述虚拟节点在上一操作对应的连线状态生成或清除所述虚拟节点之间的连线。
- 根据权利要求5所述的带校验功能的板件智能测试系统，其特征在于，所述显示单元包括板件信息输入单元；所述板件信息输入单元用于输入所述待测板件的板件信息；所述执行单元在保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元时，获取并保存所述待测板件的板件信息。
- 根据权利要求7所述的带校验功能的板件智能测试系统，其特征在于，所述显示单元还包括第二存储单元和第四触发单元；所述第二存储单元用于存储与所述待测板件对应的预设连线状态；所述执行单元在所述第四触发单元被触发时根据所述板件信息获取对应的所述预设连线状态、并根据所述预设连线状态生成或清除所述虚拟节点之间的连线。
- 根据权利要求7所述的带校验功能的板件智能测试系统，其特征在于，所述待测板件的板件信息包括所述待测板件的板件名称和/或所述待测板件的板件测试用例。
- 根据权利要求1所述的带校验功能的板件智能测试系统，其特征在于，所述阵列开关由无触点光电继电器组成，和/或所述显示单元为触摸显示屏。
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