WO2022021838A1 - 一种板件智能测试系统 - Google Patents

一种板件智能测试系统 Download PDF

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Publication number
WO2022021838A1
WO2022021838A1 PCT/CN2021/076109 CN2021076109W WO2022021838A1 WO 2022021838 A1 WO2022021838 A1 WO 2022021838A1 CN 2021076109 W CN2021076109 W CN 2021076109W WO 2022021838 A1 WO2022021838 A1 WO 2022021838A1
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WO
WIPO (PCT)
Prior art keywords
board
unit
connection
array switch
display unit
Prior art date
Application number
PCT/CN2021/076109
Other languages
English (en)
French (fr)
Inventor
陈永伟
索凌平
谢永靖
胥籽任
Original Assignee
中广核核电运营有限公司
中国广核集团有限公司
中国广核电力股份有限公司
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Publication date
Application filed by 中广核核电运营有限公司, 中国广核集团有限公司, 中国广核电力股份有限公司 filed Critical 中广核核电运营有限公司
Publication of WO2022021838A1 publication Critical patent/WO2022021838A1/zh

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2803—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP] by means of functional tests, e.g. logic-circuit-simulation or algorithms therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Definitions

  • the invention relates to the technical field of board testing, and more particularly, to an intelligent testing system for boards.
  • the technical problem to be solved by the present invention is to provide an intelligent testing system for panels in view of the above-mentioned part of the technical defects of the prior art.
  • the technical solution adopted by the present invention to solve the technical problem is: constructing a board intelligent testing system, including: a board socket that can be pluggable and installed with the board to be tested, and a board that can be electrically connected to the board socket A piece of working circuit, connected to the board socket and/or the array switch of the board working circuit, connected to the control unit of the array switch, connected to the communication unit of the control unit, and connected to the display unit of the communication unit; in,
  • the display unit displays a virtual node corresponding to the connection node of the array switch, and the display unit generates or clears the connection between the virtual nodes when the virtual node is triggered, and the control unit is in the When the virtual node is triggered, the corresponding connection node in the array switch is triggered to connect or disconnect.
  • the board working circuit includes a power supply unit, a reference signal output unit and an output detection unit;
  • the array switch includes:
  • the communication unit is connected to the reference signal output unit for controlling the reference signal output unit to output the reference signal; and/or
  • the communication unit is connected to the output detection unit for acquiring a detection signal of the output detection unit.
  • the display unit includes a first trigger unit
  • the display unit clears all the connections between the virtual nodes when the first trigger unit is triggered, and the control unit triggers all the connection nodes in the array switch to be when the first trigger unit is triggered. disconnect.
  • the display unit includes a first storage unit and a second trigger unit;
  • the display unit saves the connection state corresponding to the current operation of the virtual node to the first storage unit when the second trigger unit is triggered.
  • the display unit includes a third trigger unit
  • the display unit acquires when the third triggering unit is triggered, and generates or clears the connection between the virtual nodes according to the connection state corresponding to the virtual node in the previous operation, and the control unit is in the When the third trigger unit is triggered, it acquires and triggers the connection or disconnection of the corresponding connection node in the array switch according to the connection state corresponding to the previous operation.
  • the display unit includes a panel information input unit
  • the board information input unit is used for inputting board information of the board to be tested
  • the display unit acquires and saves the board information of the board to be tested when saving the connection state corresponding to the current operation of the virtual node to the first storage unit.
  • the display unit further includes a second storage unit and a fourth trigger unit;
  • the second storage unit is used to store the preset connection state corresponding to the board to be tested
  • the display unit acquires the corresponding preset connection state according to the board information of the board to be tested when the fourth trigger unit is triggered, and generates or clears the corresponding preset connection state according to the preset connection state.
  • the control unit triggers the connection or disconnection of the connection nodes in the array switch according to the preset connection state when the fourth trigger unit is triggered.
  • the board information of the board to be tested includes a board name of the board to be tested and/or a board test case of the board to be tested.
  • the array switch consists of a contactless photorelay, and/or
  • the display unit is a touch display screen.
  • the implementation of an intelligent panel testing system of the present invention has the following beneficial effects: the operation is convenient, and the workload of the panel testing process can be greatly reduced.
  • Fig. 1 is a logic block diagram of an embodiment of a board intelligent testing system of the present invention
  • Fig. 2 is a logic block diagram of another embodiment of a board intelligent testing system of the present invention.
  • FIG. 3 is a schematic diagram of an embodiment of a display interface of a display unit of the present invention.
  • a board intelligent testing system of the present invention includes: a board socket 110 that can be pluggable and installed with the board to be tested, and a board socket 110 that can be electrically connected
  • the corresponding connection node in the array switch 130 When triggered, the corresponding connection node in the array switch 130 is triggered to connect or disconnect.
  • the board to be tested is matched with the board socket 110 and is pluggable and installed with the board socket 110.
  • the board to be tested When the board to be tested needs to be tested, the board to be tested is placed in the board socket 110.
  • the above is to form the test circuit of the board to be tested.
  • the board working circuit 120 corresponds to a working circuit used to realize various application functions of the board when the board is tested.
  • An array switch can be arranged between the pins of the board socket 110 or between the board socket 110 and the board working circuit 120, which can form the on and off of the connection node of the array switch through the setting of each switch in the array switch , so as to finally form different electrical connection relationships between the pins of the board socket 110 or between the board socket 110 and the board working circuit 120 .
  • Different electrical connection relationships correspond to tests of different functions or indicators of the board to be tested.
  • the control of the array switch 130 can be controlled by the control instruction of the control unit 140 .
  • the control unit 140 is connected to the display unit 160 through the communication unit 150 .
  • the display unit 160 displays a virtual node 161 , and the virtual node 161 and the connection node of the array switch 130 are in a one-to-one relationship.
  • connection node of the array switch 130 is understood as a connection node used by the array switch 130 to connect an external circuit.
  • it can trigger the virtual node 161 corresponding to the connection node of the array switch 130 corresponding to the endpoint, for example, click two virtual nodes 161 in sequence , when the two virtual nodes 161 are disconnected, a connection between the two virtual nodes 161 will be generated on the display unit 160 .
  • the control unit 140 triggers the connection of the connection node corresponding to the triggered virtual node in the array switch 130, thus forming The electrical connection relationship in the actual test circuit corresponding to the connection of the virtual node 161 on the display unit 160 .
  • the virtual node 161 corresponding to the connection node corresponding to the endpoint endpoint can be triggered in turn, for example, two virtual nodes can be clicked in turn 161 , when the two virtual nodes 161 are in a connected state, the connection between the two virtual nodes 161 is cleared on the display unit 160 .
  • the control unit 140 triggers the disconnection of the connected node corresponding to the triggered virtual node in the array switch 130, so that The electrical connection relationship in the actual test circuit corresponding to the connection line of the virtual node 161 on the display unit 160 is disconnected.
  • the control unit 140 and the display unit 160 receive the trigger instruction that the virtual node 161 is triggered, they can first judge whether the current virtual node 161 has a connection, so as to trigger the actual array respectively according to the judgment result.
  • the switching action and the action of generating or clearing the connection on the display unit 160 realize the consistency between the display state of the display unit 160 and the electrical connection relationship in the actual test system.
  • the board working circuit 120 includes a power supply unit 121 , a reference signal output unit 122 and an output detection unit 123 ;
  • the array switch 130 includes: a first attribute pin connected to the board socket 110 to form a first attribute pin.
  • a first array switch 131 with a connection relationship between attribute pins a second array switch 132 connecting the second attribute pin of the board socket 110 and the power supply unit 121 to form a connection relationship between the power supply unit 121 and the second attribute pin a third array switch 133 connecting the third attribute pin of the board socket 110 and the reference signal output unit 122 to form a connection relationship between the reference signal output unit 122 and the third attribute pin;
  • the four attribute pins and the output detection unit 123 form a fourth array switch 134 in a connection relationship between the fourth attribute pin and the output detection unit 123 .
  • the board working circuit 120 corresponding to the board to be tested can be divided into a power supply unit 121 , a reference signal output unit 122 and an output detection unit 123 .
  • different array switches 130 are set to form different circuit connection relationships.
  • the power supply unit 121 is used to supply power to the board under test, which can be connected to the power supply pin of the board under test through the second attribute pin of the board socket 110 , and the power supply unit 121 and the first power supply unit 121 can be connected to the power supply pin of the board under test by setting the second array switch 132 .
  • the two attribute pins are turned on or off; the reference signal output unit 122 is used to provide the test input signal of the board under test, which is also understood as a reference signal, which can pass through the third attribute pin of the board socket 110 and the board under test.
  • the reference signal input pin is connected, and the reference signal output unit 122 and the third attribute pin are turned on or off by setting the third array switch 133; the output detection unit 123 is used to obtain the test output signal of the board under test, which
  • the fourth attribute pin of the board socket 110 can be connected to the test signal output pin of the board to be tested, and the output detection unit 123 can be turned on or off with the fourth attribute pin through the fourth array switch 134 .
  • the power supply unit 121 supplies power to the board under test, triggers the virtual node 161 corresponding to the third array switch 133, and inputs the board under test.
  • the reference signal by triggering the virtual node 161 corresponding to the fourth array switch 134, causes the output detection unit 123 to obtain the output signal of the board to be tested, and determines the output signal of the board to be tested by testing the output signal or the relationship between the test output signal and the reference signal. Performance.
  • some pins of some boards to be tested need to be connected during the working process.
  • the first attribute pin of the board socket 110 can be connected to the corresponding pin of the board to be tested, and set The first array switch 131 realizes the turn-on or turn-off between the first attribute pins.
  • the first array switch 131 realizes the turn-on or turn-off between the first attribute pins.
  • the corresponding relationship between each array switch and the virtual node 161 is that the virtual node 161 corresponds to the connection node of the array switch as described above.
  • the first array switch 131 , the second array switch 132 , the third array switch 133 and the fourth array switch 134 can be selectively set as required.
  • the communication unit 150 is connected to the reference signal output unit 122 for controlling the reference signal output unit 122 to output the reference signal; and/or the communication unit 150 is connected to the output detection unit 123 for acquiring and outputting the detection signal of the detection unit 123 . That is, the display unit 160 can control the reference signal output unit 122 to output the required reference signal through the communication unit 150, and the display unit 160 can also receive the detection signal obtained by the output detection unit 123 through the communication unit 150 and perform the test results of the board under test. confirm.
  • the display unit 160 includes a first trigger unit; the display unit 160 clears the connections between all virtual nodes 161 when the first trigger unit is triggered, and the control unit 140 is triggered by the first trigger unit.
  • the display unit 160 clears the connections between all the currently displayed virtual nodes 161 according to the clear instruction.
  • the clear instruction is executed, all the virtual nodes 161 displayed on the display unit 160 are cleared. There is no connection between them.
  • the control unit 140 when the control unit 140 generates a clear command when the first trigger unit is triggered, according to the received clear command, all the connection nodes in the array switch are triggered to be disconnected, that is, the connection relationship between the connection nodes of all the array switches is disconnected .
  • the clear instruction can be generated by triggering the clear button 162 set by the display unit 160 .
  • the display unit 160 includes a first storage unit and a second trigger unit; the display unit 160 saves the connection state corresponding to the current operation of the virtual node 161 to the first storage unit when the second trigger unit is triggered. That is, a storage instruction can be generated by triggering the second triggering unit, and the display unit 160 stores the connections between all the currently displayed virtual nodes 161 according to the storage instruction, and the execution of the storage instruction may not affect the displayed connections of the display unit 160.
  • the control unit 140 may not respond to the storage instruction and not trigger the array switch action.
  • the storage instruction may be generated by triggering a save button set by the display unit 160 .
  • the display unit 160 includes a third trigger unit; the display unit 160 acquires when the third trigger unit is triggered and generates or clears the connection between the virtual nodes 161 according to the connection state corresponding to the last operation of the virtual node 161 , the control unit 140 acquires when the third trigger unit is triggered and triggers the connection or disconnection of the corresponding connection node in the array switch 130 according to the connection state corresponding to the previous operation. That is, a return instruction can be generated by triggering the third trigger unit, and the display unit 160 obtains according to the return instruction and generates or clears the connection between the virtual nodes 161 according to the connection state corresponding to the last operation of the virtual node 161, and the display will be displayed soon.
  • a return instruction can be generated by triggering the third trigger unit, and the display unit 160 obtains according to the return instruction and generates or clears the connection between the virtual nodes 161 according to the connection state corresponding to the last operation of the virtual node 161, and the display will be displayed soon.
  • the displayed connection line of the unit 160 is displayed as the connection relationship corresponding to the last virtual node 161 .
  • the control unit 140 when the control unit 140 generates a return instruction when the third trigger unit is triggered, it triggers the connection or disconnection of the corresponding connection node in the array switch 130 according to the connection state of the virtual node 161 corresponding to the previous operation, so as to form the last connection
  • the return instruction can be generated by triggering the return button 163 set by the display unit 160 .
  • the display unit 160 includes a board information input unit; the board information input unit is used to input the board information of the board to be tested; the display unit 160 saves the connection state corresponding to the current operation of the virtual node 161 to the first When storing the unit, obtain and save the board information of the board to be tested.
  • the display unit 160 saves the connection state corresponding to the current operation of the virtual node 161, it can obtain the board information through the board information input unit, so as to correspond the current connection state with the board related information.
  • the panel information input unit may input relevant information by setting a corresponding information input window on the display unit 160 .
  • the display unit 160 further includes a second storage unit and a fourth trigger unit; the second storage unit is used to store the preset connection state corresponding to the board to be tested; the display unit 160 is triggered when the fourth trigger unit is triggered The corresponding preset connection state is obtained according to the board information of the board to be tested, and the connection between the virtual nodes 161 is generated or cleared according to the preset connection state.
  • the control unit 140 according to the preset The connection state is set to trigger the corresponding connection or disconnection of the connection node in the array switch 130 .
  • connection relationship between the virtual nodes 161 When generating the connection relationship between the virtual nodes 161, it can be preset and stored according to the board information of the board to be tested and corresponding to its possible connection state, and when the board to be tested is tested, it can be based on Trigger the fourth trigger unit to generate a call instruction, directly call the corresponding pre-stored connection state according to the obtained board information of the board to be tested, generate a connection between the virtual nodes 161, or clear the connection between some virtual nodes 161 String.
  • the control unit 140 when the fourth trigger unit is triggered, it triggers the connection or disconnection of the connection nodes in the array switch 130 according to the acquired preset connection state, and the connection nodes of the formed array switch are among the connection nodes. connection between.
  • the calling instruction may be generated by triggering a calling key set by the display unit 160 .
  • the board information of the board to be tested includes a board name of the board to be tested and/or a board test case of the board to be tested. That is, when saving or calling the connection state of the board to be tested, it can be distinguished according to the board name of the board to be tested, or according to the test case of the board corresponding to the board to be tested. The combination of the two is differentiated.
  • the array switch 130 is composed of non-contact photorelays, and the array switches are composed of non-contact photorelays with low thermal potential and low on-resistance, which can improve system reliability, reduce power consumption and save space.
  • the display unit 160 is a touch display screen.
  • the virtual contact can be directly triggered by touching the display screen, and the connection relationship of the test circuit can be quickly realized.
  • the virtual node is triggered to form the connection relationship between the virtual nodes, and the corresponding connection line is generated.
  • the connection relationship forms the final connection circuit connection relationship.
  • the test result of the board to be tested is obtained, and the test of the board to be tested is completed. Specifically, it also performs various operations according to the board intelligent testing system to test different boards to be tested.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

一种板件智能测试系统，包括：与待测板件可插拔安装的板件插座（110），可与板件插座（110）电性连接的板件工作电路（120），连接板件插座（110）和/或板件工作电路（120）的阵列开关（130），连接阵列开关（130）的控制单元（140），连接控制单元（140）的通信单元（150），连接通信单元（150）的显示单元（160）；其中，显示单元（160）显示与阵列开关（130）的连接节点对应的虚拟节点（161），且显示单元（160）在虚拟节点（161）被触发时生成或清除虚拟节点（161）之间的连线，控制单元（140）在虚拟节点（161）被触发时触发阵列开关（130）中对应的连接节点连接或断开。本系统操作方便，能够减少板件测试过程的工作量。

Description

一种板件智能测试系统 技术领域
本发明涉及板件测试技术领域，更具体地说，涉及一种板件智能测试系统。
 背景技术
大亚湾、岭澳核电站每轮次大修校验板件的数量庞大，接近300块，传统板件校验方式存在的主要的弊端和缺陷：接线方式通过几十个甚至上百个针脚的线缆接线实现，不仅不直观而且凌乱，增加接线错误概率；同时在进行板件校验时需要外接较多信号源和测量仪表，其测试过程中场地布置管理难度加大；同时由于布线复杂，出现异常时查找故障点困难，很难快速准确定位故障点。
 技术问题
本发明要解决的技术问题在于，针对现有技术的上述部分技术缺陷，提供一种板件智能测试系统。
 技术解决方案
本发明解决其技术问题所采用的技术方案是：构造一种板件智能测试系统，包括：与待测板件可插拔安装的板件插座，可与所述板件插座电性连接的板件工作电路，连接所述板件插座和/或所述板件工作电路的阵列开关，连接所述阵列开关的控制单元，连接所述控制单元的通信单元，连接所述通信单元的显示单元；其中，
所述显示单元显示与所述阵列开关的连接节点对应的虚拟节点，且所述显示单元在所述虚拟节点被触发时生成或清除所述虚拟节点之间的连线，所述控制单元在所述虚拟节点被触发时触发所述阵列开关中对应的连接节点连接或断开。
优选地，所述板件工作电路包括供电单元、基准信号输出单元和输出检测单元；
所述阵列开关包括：
连接所述板件插座的第一属性管脚以形成所述第一属性管脚之间的连接关系的第一阵列开关；
连接所述板件插座的第二属性管脚与所述供电单元以形成所述供电单元对所述第二属性管脚连接关系的第二阵列开关；
连接所述板件插座的第三属性管脚与所述基准信号输出单元以形成所述基准信号输出单元与所述第三属性管脚连接关系的第三阵列开关；和/或
连接所述板件插座的第四属性管脚与所述输出检测单元以形成所述第四属性管脚与所述输出检测单元连接关系的第四阵列开关。
优选地，所述通信单元连接所述基准信号输出单元、用于控制所述基准信号输出单元输出基准信号；和/或
所述通信单元连接所述输出检测单元、用于获取所述输出检测单元的检测信号。
优选地，所述显示单元包括第一触发单元；
所述显示单元在所述第一触发单元被触发时清除所有所述虚拟节点之间的连线，所述控制单元在所述第一触发单元被触发时触发所述阵列开关中所有连接节点为断开。
优选地，所述显示单元包括第一存储单元和第二触发单元；
所述显示单元在所述第二触发单元被触发时保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元。
优选地，所述显示单元包括第三触发单元；
所述显示单元在所述第三触发单元被触发时获取并根据所述虚拟节点在上一操作对应的连线状态生成或清除所述虚拟节点之间的连线，所述控制单元在所述第三触发单元被触发时获取并根据所述上一操作对应的连线状态触发所述阵列开关中对应的连接节点连接或断开。
优选地，所述显示单元包括板件信息输入单元；
所述板件信息输入单元用于输入所述待测板件的板件信息；
所述显示单元在保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元时，获取并保存所述待测板件的板件信息。
优选地，所述显示单元还包括第二存储单元和第四触发单元；
所述第二存储单元用于存储与所述待测板件对应的预设连线状态；
所述显示单元在所述第四触发单元被触发时根据所述待测板件的板件信息获取对应的所述预设连线状态、并根据所述预设连线状态生成或清除所述虚拟节点之间的连线，所述控制单元在所述第四触发单元被触发时根据所述预设连线状态以触发所述阵列开关中的所述连接节点对应的连接或断开。
优选地，所述待测板件的板件信息包括所述待测板件的板件名称和/或所述待测板件的板件测试用例。
优选地，所述阵列开关由无触点光电继电器组成，和/或
所述显示单元为触摸显示屏。
 有益效果
实施本发明的一种板件智能测试系统，具有以下有益效果：操作方便，能够大大减少板件测试过程的工作量。
 附图说明
下面将结合附图及实施例对本发明作进一步说明，附图中：
图1是本发明一种板件智能测试系统一实施例的逻辑框图；
图2是本发明一种板件智能测试系统另一实施例的逻辑框图；
图3是本发明显示单元显示界面一实施例的示意图。
 本发明的实施方式
为了对本发明的技术特征、目的和效果有更加清楚的理解，现对照附图详细说明本发明的具体实施方式。
如图1所示，在本发明的一种板件智能测试系统第一实施例中，包括：与待测板件可插拔安装的板件插座110，可与板件插座110电性连接的板件工作电路120，连接板件插座110和/或板件工作电路120的阵列开关130，连接阵列开关130的控制单元140，连接控制单元140的通信单元150，连接通信单元150的显示单元160；其中，显示单元160显示与阵列开关130的连接节点对应的虚拟节点161，且显示单元160在虚拟节点161被触发时生成或清除虚拟节点161之间的连线，控制单元140在虚拟节点161被触发时触发阵列开关130中对应的连接节点连接或断开。具体的，在测试系统中，待测板件与板件插座110配合并与板件插座110可插拔安装，在需要对待测板件进行测试时，将待测板件置于板件插座110上以构成待测板件的测试电路。板件工作电路120即对应为板件测试时，用于实现板件各种应用功能的工作电路。其中板件插座110的管脚之间或板件插座110与板件工作电路120之间可以设置阵列开关，其可以通过阵列开关的中各开关的设置形成阵列开关的连接节点的导通与关断，以最终形成板件插座110的各管脚之间或者板件插座110与板件工作电路120之间不同的电性连接关系。不同电性连接关系对应待测板件的不同功能或指标的测试。阵列开关130的控制可以通过控制单元140的控制指令进行控制。控制单元140通过通信单元150连接显示单元160，显示单元160上显示有虚拟节点161，虚拟节点161与阵列开关130的连接节点为一一对应的关系。阵列开关130的连接节点理解为阵列开关130用来外接电路的连接节点。当板件插座110和/或板件工作电路120的端点之间的某一连接关系时，其可以触发端点对应的阵列开关130的连接节点对应的虚拟节点161，例如依次点击两个虚拟节点161，当该两个虚拟节点161之间为未连线状态时，则会在显示单元160上生成该两个虚拟节点161之间的连线。同时控制单元140在该虚拟节点161被触发时，并当该两个虚拟节点161之间为未连线状态时，触发阵列开关130中与被触发的虚拟节点对应的连接节点连接，这样就形成与显示单元160上虚拟节点161连线对应的实际的测试电路中的电性连接关系。当要断开板件插座110和/或板件工作电路120的端点之间的某一连接关系时，其可以依次触发端点端点对应的连接节点对应的虚拟节点161，例如依次点击两个虚拟节点161，当该两个虚拟节点161之间为已连线状态时，则会在显示单元160上清除该两个虚拟节点161之间的连线。同时控制单元140在该虚拟节点161被触发时，并当该两个虚拟节点161之间为已连线状态时，触发阵列开关130中与被触发的虚拟节点对应的连接节点断开，这样就断开了与显示单元160上虚拟节点161连线对应的实际的测试电路中的电性连接关系。其可以理解，控制单元140和显示单元160在接收到虚拟节点161被触发的触发指令时，其均可以先对当前的虚拟节点161是否已有连线进行判断，以根据判断结果分别触发实际阵列开关动作和在显示单元160上进行生成或者清除连线的动作，实现显示单元160的显示状态与实际的测试系统中电性连接关系的一致性。
可选的，如图2所示，板件工作电路120包括供电单元121、基准信号输出单元122和输出检测单元123；阵列开关130包括：连接板件插座110的第一属性管脚以形成第一属性管脚之间的连接关系的第一阵列开关131；连接板件插座110的第二属性管脚与供电单元121以形成供电单元121对第二属性管脚连接关系的第二阵列开关132；连接板件插座110的第三属性管脚与基准信号输出单元122以形成基准信号输出单元122与第三属性管脚连接关系的第三阵列开关133；和/或连接板件插座110的第四属性管脚与输出检测单元123以形成第四属性管脚与输出检测单元123连接关系的第四阵列开关134。具体的，根据板件的工作及测试过程各具体电路的工作原理，可以将待测板件对应的板件工作电路120划分为供电单元121、基准信号输出单元122和输出检测单元123。为了方便控制，对不同的电路连接关系，其设置不同的阵列开关130形成不同的电路连接关系。其中，供电单元121用于对待测板件供电，其可以通过板件插座110的第二属性管脚与待测板件的供电管脚连接，通过设置第二阵列开关132实现供电单元121与第二属性管脚导通或关断；基准信号输出单元122用于提供待测板件的测试输入信号也理解为基准信号，其可以通过板件插座110的第三属性管脚与待测板件的基准信号输入管脚连接，通过设置第三阵列开关133实现基准信号输出单元122与第三属性管脚导通或关断；输出检测单元123用于获取待测板件的测试输出信号，其可以通过板件插座110的第四属性管脚与待测板件的测试信号输出管脚连接，通过第四阵列开关134实现输出检测单元123与该第四属性管脚导通或关断。待测板件测试过程中，通过触发与第二阵列开关132对应的虚拟节点161，使得供电单元121对待测板件供电，触发与第三阵列开关133对应的虚拟节点161，对待测板件输入基准信号，通过触发与第四阵列开关134对应的虚拟节点161，使得输出检测单元123获取待测板件的输出信号，通过测试输出信号或者测试输出信号与基准信号的关系判定待测板件的性能指标。同时，某些待测板件在工作过程中，其部分管脚是需要进行连接的，此时可以通过板件插座110的第一属性管脚与待测板件的对应管脚连接，并设置第一阵列开关131实现第一属性管脚之间导通或关断。触发与第一阵列开关131对应的虚拟节点161，即可以实现待测板件内部工作管脚之间的连接或断开关系。各阵列开关与虚拟节点161的对应关系为上文描述虚拟节点161与阵列开关的连接节点对应。第一阵列开关131、第二阵列开关132、第三阵列开关133和第四阵列开关134可以根据需要进行选择性设置。
可选的，通信单元150连接基准信号输出单元122、用于控制基准信号输出单元122输出基准信号；和/或通信单元150连接输出检测单元123、用于获取与输出检测单元123的检测信号。即，显示单元160可以通过通信单元150控制基准信号输出单元122输出需要的基准信号，此外显示单元160也可以通过通信单元150接收输出检测单元123获取的检测信号并对待测板件的测试结果进行确认。
可选的，如图3所示，显示单元160包括第一触发单元；显示单元160在第一触发单元被触发时清除所有虚拟节点161之间的连线，控制单元140在第一触发单元被触发时触发阵列开关130中所有连接节点为断开。即，可以通过触发第一触发单元生成清除指令，显示单元160根据该清除指令清除当前显示的所有虚拟节点161之间的连线，在清除指令执行后，显示单元160上显示的所有虚拟节点161之间均没有连线关系。同时，控制单元140在第一触发单元被触发时生成清除指令时，根据接收到的清除指令触发阵列开关中所有连接节点为断开，即断开所有的阵列开关的连接节点之间的连接关系。该清除指令可以通过触发显示单元160设置的清除按键162生成。
可选的，显示单元160包括第一存储单元和第二触发单元；显示单元160在第二触发单元被触发时保存虚拟节点161的当前操作对应的连线状态至第一存储单元。即，可以通过触发第二触发单元触发生成存储指令，显示单元160根据该存储指令存储当前显示的所有虚拟节点161之间的连线，存储指令的执行对显示单元160的显示的连线可以不影响，同时控制单元140可以不响应该存储指令，不触发阵列开关动作。该存储指令可以通过触发显示单元160设置的保存按键生成。
可选的，显示单元160包括第三触发单元；显示单元160在第三触发单元被触发时获取并根据虚拟节点161在上一操作对应的连线状态生成或清除虚拟节点161之间的连线，控制单元140在第三触发单元被触发时获取并根据上一操作对应的连线状态触发阵列开关130中对应的连接节点连接或断开。即，可以通过触发第三触发单元生成返回指令，显示单元160根据该返回指令获取并根据虚拟节点161在上一操作对应的连线状态来生成或清除虚拟节点161之间的连线，即将显示单元160的显示连线显示为上一次的虚拟节点161对应的连线关系。同时，控制单元140在第三触发单元被触发时生成返回指令时，根据虚拟节点161在上一操作对应的连线状态触发阵列开关130中对应的连接节点连接或断开，以形成上一次连接节点动作后形成的阵列开关的连接节点之间的连接关系。该返回指令可以通过触发显示单元160设置的返回按键163生成。
可选的，显示单元160包括板件信息输入单元；板件信息输入单元用于输入待测板件的板件信息；显示单元160在保存虚拟节点161的当前操作对应的连线状态至第一存储单元时，获取并保存待测板件的板件信息。显示单元160在对虚拟节点161的当前操作对应的连线状态进行保存时，其可以通过板件信息输入单元获取板件信息，以将当前的连线状态同板件相关信息对应。板件信息输入单元可以通过在显示单元160设置对应的信息输入窗口进行相关信息的输入。
可选的，显示单元160还包括第二存储单元和第四触发单元；第二存储单元用于存储与待测板件对应的预设连线状态；显示单元160在第四触发单元被触发时根据待测板件的板件信息获取对应的预设连线状态、并根据预设连线状态生成或清除虚拟节点161之间的连线，控制单元140在第四触发单元被触发时根据预设连线状态以触发阵列开关130中的连接节点对应的连接或断开。在生成虚拟节点161之间的连接关系时，其可以根据待测板件的板件信息对应其可能的连线状态进行预设设定并存储，在对待测板件进行测试时，其可以根据触发第四触发单元生成调用指令，根据获取的待测板件的板件信息直接调用预存的对应的连线状态，在虚拟节点161之间生成连线，或者清除一些虚拟节点161之间的连线。同时，控制单元140在第四触发单元被触发时生成调用指令时，根据获取的预设连线状态以触发阵列开关130中的连接节点对应的连接或断开，形成的阵列开关的连接节点之间的连接关系。该调用指令可以通过触发显示单元160设置的调用按键生成。
可选的，待测板件的板件信息包括待测板件的板件名称和/或待测板件的板件测试用例。即，对待测板件进行连线状态的保存或调用时，其可以根据待测板件的板件名称进行区分，也可以根据待测板件对应的板件测试用例进行区分，还可以通过两者的结合进行区分。
可选的，阵列开关130由无触点光电继电器组成，通过低热电势、低导通阻抗的无触点光电继电器组成阵列开关，其可以提高系统可靠性，降低功耗和节省空间。
可选的，显示单元160为触摸显示屏。为了方便操作，通过触摸显示屏能够直接进行虚拟触点的触发，快速实现测试电路的连接关系。
通过上面描述的板件智能测试系统，其通过触发虚拟节点形成虚拟节点之间的连接关系，并生成对应的连线，同时阵列开关根据虚拟节点的触发指令动作，形成对应的连接节点之间的连接关系，形成最终的连接电路连接关系。在该电路连接关系下，获取待测板件的测试结果，完成对待测板件的测试。其具体还根据板件智能测试系统进行各种操作，以实现对不同的待测板件的测试。 
可以理解的，以上实施例仅表达了本发明的优选实施方式，其描述较为具体和详细，但并不能因此而理解为对本发明专利范围的限制；应当指出的是，对于本领域的普通技术人员来说，在不脱离本发明构思的前提下，可以对上述技术特点进行自由组合，还可以做出若干变形和改进，这些都属于本发明的保护范围；因此，凡跟本发明权利要求范围所做的等同变换与修饰，均应属于本发明权利要求的涵盖范围。

Claims (10)

  1. 一种板件智能测试系统，其特征在于，包括：与待测板件可插拔安装的板件插座，可与所述板件插座电性连接的板件工作电路，连接所述板件插座和/或所述板件工作电路的阵列开关，连接所述阵列开关的控制单元，连接所述控制单元的通信单元，连接所述通信单元的显示单元；其中，
    所述显示单元显示与所述阵列开关的连接节点对应的虚拟节点，且所述显示单元在所述虚拟节点被触发时生成或清除所述虚拟节点之间的连线，所述控制单元在所述虚拟节点被触发时触发所述阵列开关中对应的连接节点连接或断开。
  2. 根据权利要求1所述的板件智能测试系统，其特征在于，所述板件工作电路包括供电单元、基准信号输出单元和输出检测单元；
    所述阵列开关包括：
    连接所述板件插座的第一属性管脚以形成所述第一属性管脚之间的连接关系的第一阵列开关；
    连接所述板件插座的第二属性管脚与所述供电单元以形成所述供电单元对所述第二属性管脚连接关系的第二阵列开关；
    连接所述板件插座的第三属性管脚与所述基准信号输出单元以形成所述基准信号输出单元与所述第三属性管脚连接关系的第三阵列开关；和/或
    连接所述板件插座的第四属性管脚与所述输出检测单元以形成所述第四属性管脚与所述输出检测单元连接关系的第四阵列开关。
  3. 根据权利要求2所述的板件智能测试系统，其特征在于，
    所述通信单元连接所述基准信号输出单元、用于控制所述基准信号输出单元输出基准信号；和/或
    所述通信单元连接所述输出检测单元、用于获取所述输出检测单元的检测信号。
  4. 根据权利要求1所述的板件智能测试系统，其特征在于，所述显示单元包括第一触发单元；
    所述显示单元在所述第一触发单元被触发时清除所有所述虚拟节点之间的连线，所述控制单元在所述第一触发单元被触发时触发所述阵列开关中所有连接节点为断开。
  5. 根据权利要求1所述的板件智能测试系统，其特征在于，所述显示单元包括第一存储单元和第二触发单元；
    所述显示单元在所述第二触发单元被触发时保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元。
  6. 根据权利要求5所述的板件智能测试系统，其特征在于，所述显示单元包括第三触发单元；
    所述显示单元在所述第三触发单元被触发时获取并根据所述虚拟节点在上一操作对应的连线状态生成或清除所述虚拟节点之间的连线，所述控制单元在所述第三触发单元被触发时获取并根据所述上一操作对应的连线状态触发所述阵列开关中对应的连接节点连接或断开。
  7. 根据权利要求5所述的板件智能测试系统，其特征在于，所述显示单元包括板件信息输入单元；
    所述板件信息输入单元用于输入所述待测板件的板件信息；
    所述显示单元在保存所述虚拟节点的当前操作对应的连线状态至所述第一存储单元时，获取并保存所述待测板件的板件信息。
  8. 根据权利要求7所述的板件智能测试系统，其特征在于，所述显示单元还包括第二存储单元和第四触发单元；
    所述第二存储单元用于存储与所述待测板件对应的预设连线状态；
    所述显示单元在所述第四触发单元被触发时根据所述待测板件的板件信息获取对应的所述预设连线状态、并根据所述预设连线状态生成或清除所述虚拟节点之间的连线，所述控制单元在所述第四触发单元被触发时根据所述预设连线状态以触发所述阵列开关中的所述连接节点对应的连接或断开。
  9. 根据权利要求7所述的板件智能测试系统，其特征在于，所述待测板件的板件信息包括所述待测板件的板件名称和/或所述待测板件的板件测试用例。
  10. 根据权利要求1所述的板件智能测试系统，其特征在于，
    所述阵列开关由无触点光电继电器组成，和/或
    所述显示单元为触摸显示屏。
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