WO2019227731A1 - 显示屏点灯测试装置及方法 - Google Patents

显示屏点灯测试装置及方法 Download PDF

Info

Publication number
WO2019227731A1
WO2019227731A1 PCT/CN2018/102916 CN2018102916W WO2019227731A1 WO 2019227731 A1 WO2019227731 A1 WO 2019227731A1 CN 2018102916 W CN2018102916 W CN 2018102916W WO 2019227731 A1 WO2019227731 A1 WO 2019227731A1
Authority
WO
WIPO (PCT)
Prior art keywords
display
display screen
gate array
field programmable
programmable gate
Prior art date
Application number
PCT/CN2018/102916
Other languages
English (en)
French (fr)
Inventor
王海
蔡昆岳
Original Assignee
武汉华星光电半导体显示技术有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 武汉华星光电半导体显示技术有限公司 filed Critical 武汉华星光电半导体显示技术有限公司
Priority to US16/099,863 priority Critical patent/US10847069B2/en
Publication of WO2019227731A1 publication Critical patent/WO2019227731A1/zh

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix

Definitions

  • the invention relates to the field of display, in particular to a display device lighting test device and method.
  • An object of the present invention is to provide a display lighting test device and method for solving the problem that different types and different models each require a set of lighting test fixtures in the prior art.
  • Another object of the present invention is to provide a display screen lighting test device and method, which can simplify the display screen lighting test device without significantly changing the original display screen lighting test process, especially in response to different types of connectors.
  • the hardware part is designed, and under the premise of different types of mobile phones, only the integrated connector in it can be replaced, and the lighting and testing can be used to save costs.
  • Another object of the present invention is to provide a display lighting test device and method. By connecting to a field programmable gate array, more complex functions such as automatic testing of voltage, current, power consumption, processor interface decoding, etc. Message and send it to the display.
  • a technical solution adopted by the present invention is to provide a display screen lighting test device, which is used to simultaneously perform a one-point light test process on multiple display screen modules to be tested.
  • the device includes: several D-type connectors, which are used to connect display screen modules to be tested in mobile phones with different connector models, and receive and transmit processor interface / positive voltage / negative voltage / TIC power signal data; sampling The processor quantizes the power data received after receiving the DIC, TIC, positive voltage, and negative voltage into the required digital and / or picture signals and outputs them to the field programmable gate array chip, and outputs the corresponding signals according to the instructions received by the sampling processor.
  • Micro-control instructions field-programmable gate array chips, which are respectively connected to D-type connectors and sampling processors to receive such signal data and generate corresponding micro-control parameters according to the micro-control instructions, and to these signals according to the micro-control parameters
  • the data is processed to output the signal data required for the lighting test to the display module under test, thereby performing the lighting test on the display module under test.
  • the display lighting test device also includes: an integrated connector, which is provided with rows of test lead plugs (male) and test lead sockets (female) on the left and right sides; each test lead plug and test lead socket are It can be connected with the matching voltage switch, current switch and standard current switch; that is, the voltage switch, current switch and standard current switch can be installed on the left test lead plug; the right test lead socket can be installed with Line voltmeter, incoming line ammeter, and current regulator. Therefore, the display panel on the left and the application processor of the mobile phone on the right can be connected to form a display screen module to be tested.
  • D-type connectors through several D-type connectors, one to one correspondingly connected to a plurality of display module to be tested with different connector models, which can detect and perform one-point lamp test at one time.
  • the display lighting test device only needs to be replaced, and the integrated connector is adapted to the corresponding mobile phone, and the lighting test can be performed.
  • a microprocessor, a display controller, and a storage controller with a storage calculation program are integrated in the field-programmable gate array chip.
  • the microprocessor is used to output initialization information, and the microprocessor is connected to the display controller.
  • the controller is connected to the D-type connector and the sampling processor to receive and store such required digital and / or picture signal data and micro-control instructions, and can read the internally stored digital and / or picture signal data, and then appropriately Provided to the microprocessor.
  • the field programmable gate array chip is connected to the display module under test through the display controller connected to the D-type connector to output initialization information to the display module under test to initialize the display module under test and output the processed test module.
  • the display module needs to perform digital test and / or picture data required for the lighting test to the display module under test, so as to perform a lighting test on the display module under test.
  • the display screen lighting test device of the present invention is field-programmable when several D-type connectors are connected to the display screen modules to be tested corresponding to a plurality of different models of mobile phones.
  • the gate array chip connects multiple D-type connectors through the display controller to connect multiple display screen modules under test to output initialization information to multiple display screen modules under test to initialize multiple display screen modules under test and output
  • the digital data and / or picture data required for the lighting test are transmitted to multiple display modules, so that multiple display modules can be tested at one time and a one-point lighting test can be performed at the same time.
  • the field programmable gate array chip further includes: a parameter configurator, which can receive the micro-control instructions output by the storage controller, and generate corresponding micro-control parameters according to the micro-control instructions, and respond to these signals according to the micro-control parameters.
  • the data automatically processes the signal data such as digital and / or pictures required after sampling, which is initialization information and then provides it to the microprocessor.
  • the microprocessor is connected to the display controller and the display controller is connected to the display module to be tested.
  • the initialization information is output to the display module under test, so that the display module under test is initialized, and the final result is displayed on the display screen under test.
  • the field programmable gate array chip further includes: a digital / picture processor, the digital / picture processor is connected to the storage controller to receive digital and / or picture signal data output by the storage controller, and the digital / picture
  • the processor is further connected with a parameter configurator to process digital and / or picture signal data according to the micro-control parameters; select a controller and connect a digital / picture processor to perform digital / picture processing according to the model mode selected by the controller;
  • the processor outputs the processed digital data and / or picture data output by selecting one of the numbers and / or pictures as the digital data and / or picture data required for the lighting test of the processed display screen module to be tested, and
  • the selection controller is further connected to the display controller and connected to the D-type connector, so as to output the digital data and / or picture data selected and processed by the digital / picture processor to the corresponding display screen module under test through the display controller.
  • the selection controller is further connected to a microprocessor to receive a mode selection instruction output by the microprocessor and operates in a corresponding selection matching model mode according to the mobile phone model selection instruction.
  • the display lighting test device further includes a power micro-control module connected between the field programmable gate array chip and the D-type connector to receive the power micro control parameters output by the field programmable gate array chip. And according to the power micro-control parameters, the corresponding power supply voltage is output to a plurality of display module to be tested through the D-type connector to control the plurality of display module to be tested at the same time under different power.
  • the field programmable gate array chip further includes: a power micro-controller, which is connected to the parameter configurator and the power micro-control module, wherein the micro-control parameters generated by the parameter configurator also include power micro-control parameters, and power micro-controllers.
  • the controller receives the power micro-control parameter, generates a corresponding power micro-control instruction according to the power micro-control parameter, and outputs it to the power micro-control module to control the power micro-control module to output the corresponding power voltage.
  • the sampling processor further includes a digital-to-analog converter, which can collect the voltage, current signals, and power consumption received by the sampling processor through the digital-to-analog converter to quantify the required digital signal and output it to the field programmable gate array chip.
  • a digital-to-analog converter which can collect the voltage, current signals, and power consumption received by the sampling processor through the digital-to-analog converter to quantify the required digital signal and output it to the field programmable gate array chip.
  • the field programmable gate array chip can realize automatic test work.
  • the field programmable gate array chip uses an internally integrated storage controller.
  • the processor interface initialization code of the display panel DIC is known, the display panel can be directly illuminated by the field programmable gate array chip, even without the need for
  • the application processor is used to provide power to the display panel, and the field programmable gate array chip can be used to provide power to the display panel.
  • the processor interface initialization code of the display panel DIC is not known, the picture can be compressed first. Into a standardized VESC picture accepted by DIC, then light up the display panel through the application processor, then turn off the processor interface switch, and then send the compressed picture through the field programmable gate array chip, and the final result can be fed back to the measured display Displayed on the screen.
  • field programmable gate array chips can also be combined with optical algorithms to study optical problems.
  • test lead plugs male
  • test lead sockets female
  • each of the test lead plugs and the test lead sockets can be connected with a voltage switch and a current switch matching the test lead socket
  • a standard current switch to connect the display panel with the mobile phone's application processor to build a display module under test; through several D-type connectors, it can be connected to multiple matching models with different connectors one by one
  • the display module under test receives and transmits power signals; collects and quantizes the received power signals into the required digital and / or picture signal data through the sampling processor and outputs them to the field programmable gate array chip; through field programmable
  • the microprocessor integrated in the gate array chip outputs initialization information, and the initialization information is output to the display screen module to be tested through the D
  • the module performs the initialization operation; reads the stored data to be lighted through the storage controller integrated in the field programmable gate array chip.
  • Digital data and / or picture data required for testing are processed, and the D-connector is connected to the display controller integrated in the field programmable gate array chip to output the processed digital data required for the display display module to be tested for lighting test.
  • / or picture data to a plurality of display module to be tested, so that the plurality of display module to be tested is tested at one time and a little light test is performed at the same time.
  • a display screen lighting test device which is used to perform a lighting test on a plurality of display screen modules to be tested at the same time, which includes:
  • a plurality of integrated connectors are provided with corresponding test lead plugs on each side, and the corresponding test lead sockets are connected to corresponding voltage switches, current switches and standard current switches, so that the integrated connectors will correspond to several
  • the display panels of mobile phones with different connector models are connected to an application processor to form a plurality of said display screen modules to be tested;
  • a plurality of D-type connectors to connect a plurality of said display screen modules to be tested, and receive and transmit power signals
  • a sampling processor that receives the power signal collection and quantization into required digital data and / or picture data and outputs it to a field programmable gate array chip, and receives and outputs a corresponding micro-control instruction according to the instruction;
  • a field programmable gate array chip integrates a microprocessor, a display controller, and a storage controller.
  • the microprocessor is used to output initialization information, and the microprocessor is connected to the display controller, and the field programmable
  • the gate array chip outputs the initialization information through the display controller to the plurality of display module under test through the plurality of D-type connectors for initialization operation.
  • the storage controller and the D-type connector are A sample processor is connected to receive the digital data and / or picture data and the micro control instruction, and the field programmable gate array chip generates corresponding micro control parameters according to the micro control instruction, and according to the micro control instruction, Micro-control parameters process the digital data and / or picture data to output digital data and / or picture data required by a plurality of display screen modules under test for lighting test to a plurality of display screen modules under test, Thereby, one-point lamp test is performed on a plurality of the display screen modules to be tested at the same time.
  • the sampling processor includes: a digital-to-analog converter that quantizes the voltage, current signals, and power consumption received by the sampling processor into the required digital signals and outputs the signals to a field programmable gate.
  • Array chips to facilitate subsequent lighting tests of field programmable gate array chips.
  • the sampling processor is further connected to a mobile phone / user instruction receiving module for receiving a mobile phone / user input of the mobile phone / user instruction to output the mobile phone / user instruction to the sampling process.
  • a mobile phone / user instruction receiving module for receiving a mobile phone / user input of the mobile phone / user instruction to output the mobile phone / user instruction to the sampling process.
  • the field programmable gate array chip further includes:
  • a parameter configurator connected to the storage controller to generate corresponding micro-control parameters according to the micro-control instruction
  • a digital / picture processor connected to the storage controller and a parameter configurator, respectively, to receive the digital data and / or picture data output by the storage controller, and to receive and configure the controller according to the parameters Processing the digital data and / or picture data by sending the micro control parameters;
  • Selecting a controller connected to the digital / picture processor to work in a corresponding mode according to a model mode selection instruction, and selecting and processing the processed digital data and / or picture data output by the digital / picture processor, And outputting the processed digital data and / or picture data required for the lighting test of the plurality of display screen modules to be tested, and the selection controller is further connected to the display controller to control the display
  • the digital data and / or picture data after the selection and output are transmitted to a plurality of corresponding display screen modules under test through a D-type connector.
  • the selection controller is further connected to the microprocessor to receive the model mode selection instruction output by the microprocessor and work in a corresponding mode according to the model mode selection instruction. .
  • the display screen lighting test device further includes a power micro-control module connected between the field programmable gate array chip and the D-type connector to receive the field programmable
  • the power control parameters output by the gate array chip and the corresponding power supply voltage according to the power control parameters are transmitted to the display module under test through the D-type connector to control the display module under test at different powers. Light test.
  • the field programmable gate array chip further includes: a power micro-controller connected to the parameter configurator and the power micro-control module, respectively, wherein the parameter configurator generates The control parameter includes the power control parameter, and the power microcontroller is configured to receive and generate a corresponding power control instruction according to the power control parameter, and output it to the power microcontrol module to control the output response. Power supply voltage.
  • a display screen lighting test device which is used to perform a lighting test on a plurality of display screen modules to be tested at the same time, which includes:
  • the integrated connector is provided with test lead plugs on both sides, and the test lead sockets are connected with matching voltage switches, current switches and standard current switches to connect the display panel to the application processor to form the display screen module under test;
  • a plurality of D-type connectors to connect a plurality of said display screen modules to be tested, and receive and transmit power signals
  • a sampling processor that receives the power signal collection and quantization into required digital data and / or picture data and outputs it to a field programmable gate array chip, and receives and outputs a corresponding micro-control instruction according to the instruction;
  • a field programmable gate array chip integrates a microprocessor, a display controller, and a storage controller.
  • the microprocessor is used to output initialization information, and the microprocessor is connected to the display controller, and the field programmable
  • the gate array chip outputs the initialization information through the display controller to the plurality of display module under test through the plurality of D-type connectors for initialization operation.
  • the storage controller and the D-type connector are A sample processor is connected to receive the digital data and / or picture data and the micro control instruction, and the field programmable gate array chip generates corresponding micro control parameters according to the micro control instruction, and according to the micro control instruction,
  • the micro control parameters process the digital data and / or picture data to output the digital data and / or picture data required by the display screen module under test for lighting test to a plurality of display screen modules under test, thereby A plurality of display screen modules under test perform a one-point light test at the same time.
  • the sampling processor includes: a digital-to-analog converter that quantizes the voltage, current signals, and power consumption received by the sampling processor into the required digital signals and outputs the signals to a field programmable gate.
  • Array chips to facilitate subsequent lighting tests of field programmable gate array chips.
  • the sampling processor is further connected to a mobile phone / user instruction receiving module for receiving a mobile phone / user input of the mobile phone / user instruction to output the mobile phone / user instruction to the sampling process.
  • a mobile phone / user instruction receiving module for receiving a mobile phone / user input of the mobile phone / user instruction to output the mobile phone / user instruction to the sampling process.
  • the field programmable gate array chip further includes:
  • a parameter configurator connected to the storage controller to generate corresponding micro-control parameters according to the micro-control instruction
  • a digital / picture processor connected to the storage controller and a parameter configurator, respectively, to receive the digital data and / or picture data output by the storage controller, and to receive and configure the controller according to the parameters Processing the digital data and / or picture data by sending the micro control parameters;
  • Selecting a controller connected to the digital / picture processor to work in a corresponding mode according to a model mode selection instruction, and selecting and processing the processed digital data and / or picture data output by the digital / picture processor, And outputting the processed digital data and / or picture data required by the display screen module to be tested for lighting test, and the selection controller is further connected to the display controller so as to pass the display controller
  • the digital data and / or picture data after the output selection process are transmitted to a plurality of corresponding display screen modules to be tested through D-type connectors.
  • the selection controller is further connected to the microprocessor to receive the model mode selection instruction output by the microprocessor and work in a corresponding mode according to the model mode selection instruction. .
  • the display screen lighting test device further includes a power micro-control module connected between the field programmable gate array chip and the D-type connector to receive the field programmable
  • the power control parameters output by the gate array chip and the corresponding power supply voltage according to the power control parameters are transmitted to the display module under test through the D-type connector to control the display module under test at different powers. Light test.
  • the field programmable gate array chip further includes: a power micro-controller connected to the parameter configurator and the power micro-control module, respectively, wherein the parameter configurator generates The control parameter includes the power control parameter, and the power microcontroller is configured to receive and generate a corresponding power control instruction according to the power control parameter, and output it to the power microcontrol module to control the output response. Power supply voltage.
  • another technical solution adopted by the present invention is to provide a display screen lighting test method, which is applied to the foregoing display screen lighting test device, and the method includes:
  • test lead plugs and test lead sockets By integrating test lead plugs and test lead sockets on both sides of the connector, the test lead plug and the test lead socket are connected with voltage switches, current switches, and standard current switches that match them, so as to process the display panel and the application. Connected to form a display module under test;
  • the initialization information is output through a microprocessor integrated in the field programmable gate array chip, and the initialization information is output through the D-type connector through a display controller integrated in the field programmable gate array chip.
  • the display screen lighting test device can perform the lighting test only by changing the integrated connector to a corresponding mobile phone.
  • the field programmable gate array chip passes the storage controller internally integrated, and when the processor interface initialization code of the display panel is known, the field programmable gate array chip directly passes through the field programmable gate array chip. It does not even need to use the application processor to provide power to the display panel, and instead the field programmable gate array chip provides power to the display panel; or, when it is not known
  • the processor interface initialization code of the display panel is described, the picture is first compressed into a standardized VESC picture accepted by the display panel DIC, and then the display panel is lit by the application processor, and then the processor The interface switch is turned off, and then the compressed picture is sent through the field programmable gate array chip, and the final result is fed back to the tested display screen for display.
  • the display screen lighting test method further includes receiving a mobile phone / user input into the mobile phone / user instruction through a mobile phone / user instruction receiving module, and outputting the mobile phone / user instruction to the sampling processor.
  • a micro-control instruction sent by the sampling processor is received through the field programmable gate array chip, a corresponding micro-control parameter is generated according to the micro-control instruction, and according to the micro-control
  • the parameters process the required digital data and / or picture data, and connect the D-type connector through the display controller integrated in the field programmable gate array chip to output the processed display screen module to be tested.
  • the steps of performing the digital data and / or picture data required for the lighting test to a plurality of the display module under test include:
  • the D-type connector is used to transmit to a plurality of corresponding display screen modules under test.
  • the selection controller receives the model mode selection instruction output by the microprocessor and operates in a corresponding mode according to the model mode selection instruction.
  • the present invention has the specific effects of the technology of the above scheme.
  • the test lead plug (male) and test lead socket (female) of the left and right sides of the integrated connector can be connected to a voltage switch, a current switch, and a standard current switch matched thereto.
  • the application processor of the mobile phone In order to connect the display panel with the application processor of the mobile phone to form a display module under test, 2.
  • 3 integrate the microprocessor, display controller and storage controller into the field programmable gate array chip, 4.
  • Several D-type connectors one by one Correspondingly connect a plurality of display screen modules to be tested accordingly.
  • FIG. 1 is a schematic structural diagram of an embodiment of a display screen module to be tested of a display screen lighting test device according to the present invention
  • FIG. 2 is a schematic diagram of the overall structure of a display screen lighting test device according to the present invention.
  • FIG. 3 is a schematic structural diagram of a part of an embodiment of the display screen lighting test device of the present invention.
  • FIG. 4 is a schematic structural diagram of a part of another embodiment of a display screen lighting test device according to the present invention.
  • FIG. 5 is a schematic flowchart of an embodiment of a display lamp lighting test method according to the present invention.
  • FIG. 1 is a schematic structural diagram of an embodiment of a display screen module to be tested of the display screen lighting test device of the present invention.
  • FIG. 2 is a schematic view of the overall structure of the display screen lighting test device of the present invention. Partial structure diagram of an embodiment of a display screen lighting test device.
  • the display screen lighting test device of the present invention is used to perform a one-time detection on a plurality of display screen modules to be tested and simultaneously perform a one-point lighting test.
  • the display lighting test device 1 includes: an integrated connector 10, which is provided with a row of test lead plugs (male) 101 on the left side and a row of test lead sockets (female) 102 on the right side.
  • Each of the test lead plug 101 and the test lead socket 102 can be connected with a voltage switch, a current switch, and a standard current switch that can be matched with it.
  • a voltage switch, a current switch, and a standard current switch can be installed on the test lead plug 101 on the left.
  • the test lead socket 102 on the right side can be installed with a line voltage meter, a line current meter, and a current regulator.
  • the display panel 70 on the left and the application processor 80 of the mobile phone on the right can be connected to form a display screen module 60 to be tested.
  • the display lighting test device 1 only needs to replace the integrated connector 10 ′ (10 ′) to fit the corresponding mobile phone. In this way, it can be connected to the left display panel 71 (72) and the right mobile application processor 81 (82) respectively, so as to form another display screen module 60 '(60' ') to be tested, which can be performed. Used for subsequent lighting and test operations.
  • the display module lighting test device 1 further includes a plurality of D-type connectors 11, a sampling processor 12, and a field programmable gate array chip 13.
  • the field programmable gate array chip 13 is connected to the D-type connector 11 and the sampling processor 12 respectively.
  • the field programmable gate array chip 13 includes a microprocessor 131, a display controller 132, and a storage controller 133 having a storage calculation program.
  • the D-type connector 11 is used to connect the display module 60 (60 ', 60' ') to be tested in a mobile phone with a different connector model, so the number of the D-type connector 11 can be connected to multiple Phone. Please refer to FIG. 2 for cooperation. In this embodiment, three mobile phones with different connector models are connected as an example.
  • the three D-type connectors 11 are connected to the matching display module 60, 60 ', 60' 'to be tested; the D-type connector 11 can receive and transmit processor interface, positive voltage, negative voltage, current, TIC and other power Signal; sampling processor 12 for receiving a mobile phone (or user) instruction and outputting a corresponding micro-control instruction according to the mobile phone (or user) instruction, and collecting power signals that receive DIC, TIC, positive voltage, negative voltage, etc.
  • the required signal data (including numbers and / or pictures) are quantized and output to the field programmable gate array chip 13; the field programmable gate array chip 13 is connected to the D-type connector ⁇ sampling processor 12 to receive such signals.
  • Signal data and micro-control instructions and corresponding micro-control parameters are generated according to the micro-control instructions, and the signal data is processed according to the micro-control parameters to output the signal data required for the lighting test to the display module 60, 60 to be tested. ', 60' ', so that the display screen module 60, 60', 60 '' to be tested is lighted at the same time.
  • the field programmable gate array chip 13 integrates a microprocessor 131, a display controller 132, and a storage controller 133 having a storage calculation program, and the microprocessor 131 is connected to the display controller 132, and the display controller 132
  • the display module 60, 60 ', 60' 'to be tested is also connected through the D-type connector 11, the storage controller 133 and the D-type connector are connected to the sample processor, and the internally stored numbers and / or The signal data of the picture is appropriately provided to the microprocessor 131.
  • the microprocessor 131 integrated in the field programmable gate array chip 13 is used to output initialization information, and the display controller 132 is used to output the initialization information to the display screen module 60 (60 ', 60' ') to be tested, Thereby, the display screen module 60 (60 ', 60' ') to be tested is initialized.
  • the field programmable gate array chip 13 is further provided with a storage calculation program through an integrated storage controller 133, and is connected with the D-type connector 11 ⁇ sampling processor 12 to receive the D-type connector 11 ⁇ sampling processor. 12
  • the digital data and / or picture data sent for lighting test are stored with the micro control instruction, and the internally stored digital data and / or picture data can be read and analyzed and classified.
  • the field programmable gate The array chip 13 generates corresponding micro-control parameters according to the micro-control instructions, and further processes the digital data and / or picture data according to the micro-control parameters to output the numbers required by the processed display screen module to be tested for lighting.
  • the data and / or picture data are appropriately provided to the microprocessor 131, and are connected to the D-type connector 11 through the display controller 132 and transmitted to the display module 60, 60 ', 60' 'to be tested.
  • the display screen module 60, 60 ', 60' 'to be tested performs a one-time detection and simultaneously performs a one-point light test.
  • the sampling processor 12 further includes a digital-to-analog converter 121, which can collect the voltage, current signals, and power consumption received by the sampling processor 12 through the digital-to-analog converter to quantify the required digital signal and output it to the scene.
  • the gate array chip 13 is programmed so that the field-programmable gate array chip 13 performs subsequent lighting tests, and can realize automatic test work.
  • the display panel is connected to the application processor of the mobile phone through the integrated connector to form a display module to be tested. Then, for different types of mobile phones, only the integrated connector needs to be replaced to fit the corresponding type of mobile phone. In this way, multiple test display module modules with different connector types can be constructed.
  • the microprocessor, display controller, and storage controller are integrated in the field editable gate array chip, and through several D-type connections Device, one by one correspondingly connected to a plurality of display screen modules to be tested correspondingly, in this way, a plurality of different models of mobile phones can be tested at one time and a one-point light test operation can be performed at the same time, so it simplifies the display light test
  • the hardware design of the device reduces the use of electronic components, improves the breadth and stability of the display lighting test device, saves costs, and facilitates the R & D personnel's lighting test work and subsequent maintenance of the display lighting test device.
  • the field programmable gate array chip uses an internally integrated storage controller.
  • the processor interface initialization code of the display panel DIC is known, the display screen can be directly illuminated by the field programmable gate array chip, even without the need for
  • the application processor is used to provide power to the display panel, and the field programmable gate array chip can be used to provide power to the display panel.
  • the processor interface initialization code of the display panel DIC is not known, the picture can be compressed first. Into a standardized VESC picture accepted by DIC, then light up the display panel through the application processor, then turn off the processor interface switch, and then send the compressed picture through the field programmable gate array chip, and the final result can be fed back to the measured display Displayed on the screen.
  • field programmable gate array chips can also be combined with optical algorithms to study optical problems.
  • FIG. 4 is a partial structural diagram of another embodiment of a display screen lighting test device according to the present invention.
  • the display module lighting test device 2 in this embodiment includes: integration The connector 10, the D-type connector 21, the sample processor 22, the field editable gate array chip 23, the mobile phone / user instruction receiving module 24, and the power micro-control module 25.
  • the field programmable gate array chip 23 is connected to the D-type connector 21 and the sampling processor 22 respectively.
  • the field editable gate array chip 23 includes a microprocessor 231, a display controller 232, a storage controller 233, and a digital / picture.
  • the sampling processor 22 further includes a digital-to-analog converter 221, which can collect the voltage, current signals, and power consumption received by the sampling processor 22 through the digital-to-analog converter to quantify the required digital signal and output it to the site.
  • the gate array chip 23 is programmed so that the field-programmable gate array chip 23 performs subsequent lighting tests, and can realize automatic test work.
  • the microprocessor 231 is connected to the display controller 232, and the display controller 232 is connected to the display module 60, 60 ', 60' 'to be tested through the D-type connector 21; the storage controller 233 is provided with a storage calculation
  • the program is connected to the D-type connector 21 and the sampling processor 22, and can read the signal data of digital and / or pictures stored internally, and then provide it to the microprocessor 131 appropriately.
  • the microprocessor 231 is also connected to the selection controller 235.
  • the mobile phone / user instruction receiving module 24 is connected to the sample processor 22.
  • the storage controller 233 is also connected to the digital / picture processor 234 and the parameter configurator 236, and the digital / picture processor 234 is further connected to the selection controller 235 and the parameter configurator 236, respectively, and the selection controller 235 is further connected.
  • Display controller 232 is also connected to the digital / picture processor 234 and the parameter configurator 236, and the digital / picture processor 234 is further connected to the selection controller 235 and the parameter configurator 236, respectively, and the selection controller 235 is further connected.
  • the parameter configurator 236 is also connected to the power micro-controller 237; the power micro-controller 237 is connected to the power micro-control module 25.
  • the storage controller 233 is connected to the D-type connector 21 ⁇ sampling processor 22 to receive the digital data sent by the D-type connector 21 ⁇ sampling processor 22 for the lighting test and / Or the picture data is stored with the micro-control instruction, and the digital data and / or picture data stored in the picture can be read and analyzed and classified;
  • the parameter configurator 236 can receive the micro-control instruction output from the storage controller 233, and The micro control instruction generates corresponding micro control parameters;
  • the digital / picture processor 234 is used for receiving digital data and / or picture data output from the storage controller 233, and the digital / picture processor 234 further outputs according to the parameter configurator 236 Digital data and / or picture data are processed by the control parameters;
  • the selection controller 235 further receives a model mode selection instruction output from the microprocessor 231 (that is, the D-type connector 21 receives a display screen module of different models to be tested), And according to the model mode selection instruction to work in the corresponding mode, the digital data and / or
  • the back-to-be-tested display module 60 outputs digital data and / or picture data required for lighting test, and connects the D-type connector 11 through the display controller 132 to transmit the matched digital data and / or picture data to The display screen modules 60, 60 ', 60' 'to be tested, thereby performing a one-time test on a plurality of display screen modules 60, 60', 60 '' to be tested and simultaneously performing a one-point light test.
  • the sample processor 22 is configured to receive the mode instruction output by the mobile phone / user instruction receiving module 24, and analyze the mode instruction to become a micro-control instruction, and transmit it to the parameter configurator 236 through the storage controller 233, and obtain the analysis result.
  • the digital / picture processor 234 further processes the received digital data and / or picture data according to the control parameters output by the parameter configurator 236.
  • the selection controller 235 is based on the model mode selection instruction output by the microprocessor 231, and outputs the selected processed digital and / or picture information control parameters to the digital / picture processor 234, and the power control parameters are output to Power microcontroller 237.
  • the power micro-controller 237 receives the power control parameter output from the selection controller 235, generates a corresponding power control instruction according to the power control parameter, and outputs it to the power micro-control module 25 to further control the power micro-control module. 25 Output corresponding power supply voltage.
  • the power micro-control module 25 is configured to receive the power control parameters output by the field programmable gate array chip 23, and output the corresponding power supply voltage according to the power control parameters to be transmitted to the display module 60 (60) to be tested through the D-type connector. ', 60' ') to control the display module 60 (60', 60 '') under test to perform lighting tests at different powers.
  • the display screen is connected to the application processor of the mobile phone through an integrated connector to form a display screen module to be tested. Then, for different types of mobile phones, only the integrated connector needs to be replaced to fit the corresponding type of mobile phone.
  • a plurality of display screen modules with different connector types can be constructed, and the microprocessor, display controller and storage controller are integrated in the field editable gate array chip, and through several D-type connections Device, one by one correspondingly connected to a plurality of display screen modules to be tested correspondingly, so that one-time detection of a plurality of different models of mobile phones can be performed at the same time and one-point light test operation can be used, that is, can be
  • the mobile phone performs one-time detection and performs one-point light test operation at the same time, so it simplifies the design of the hardware part of the display light-up test device, reduces the number of electronic components, improves the breadth and stability of the display-light test device, and saves The cost facilitates the R & D personnel's lighting
  • the field programmable gate array chip uses an internally integrated storage controller.
  • the processor interface initialization code of the display panel DIC is known, the display screen can be directly illuminated by the field programmable gate array chip, even without the need for
  • the application processor is used to provide power to the display panel, and the field programmable gate array chip can be used to provide power to the display panel.
  • the processor interface initialization code of the display panel DIC is not known, the picture can be compressed first. Into a standardized VESC picture accepted by DIC, then light up the display panel through the application processor, then turn off the processor interface switch, and then send the compressed picture through the field programmable gate array chip, and the final result can be fed back to the measured display Displayed on the screen.
  • field programmable gate array chips can also be combined with optical algorithms to study optical problems.
  • FIG. 5 is a schematic flowchart of an embodiment of a display lamp lighting test method according to the present invention.
  • the display screen lighting test method of the present invention is applied to the display screen lighting test device described above, and as shown in FIG. 5, the method includes the following steps:
  • Test lead plugs and test lead sockets are provided on the left and right sides of the integrated connector. Each test lead plug and test lead socket can be connected to the corresponding voltage switch, current switch and standard current switch to display The panel is connected with the application processor of the mobile phone to build a display module to be tested;
  • S502 through several D-type connectors, one by one can be connected to a plurality of matching display screen modules with different connector models to receive and transmit power signals;
  • S503 quantize the received power signal into the required digital and / or picture signal data through the sampling processor and output it to the field programmable gate array chip;
  • S504 Output initialization information through the microprocessor integrated in the field programmable gate array chip, and output the initialization information to the display module under test through the D-type connector through the display controller integrated in the field programmable gate array chip. To initialize the display module under test;
  • S505 Read the stored digital data and / or picture data required for the lighting test through the integrated storage controller of the field programmable gate array chip;
  • S506 Receiving micro-control instructions from the sampling processor through the field programmable gate array chip, generating corresponding micro-control parameters according to the micro-control instructions, and performing required digital data and / or picture data according to the micro-control parameters Process, and connect the D-type connector through the display controller integrated in the field programmable gate array chip to output the processed digital data and / or picture data required for the lighting test to be tested to the multiple display to be tested Screen module, so that multiple test screen modules to be tested can be tested at one time and a little light test can be performed at the same time.
  • the display screen is connected to the application processor of the mobile phone through an integrated connector to form a display screen module to be tested. Then, for different types of mobile phones, only the integrated connector needs to be replaced to fit the corresponding type of mobile phone.
  • a plurality of display screen modules with different connector types can be constructed, and the microprocessor, display controller and storage controller are integrated in the field editable gate array chip, and through several D-type connections Device, one by one correspondingly connected to a plurality of display screen modules to be tested correspondingly, so that one-time detection of a plurality of different models of mobile phones can be performed at the same time and one-point light test operation can be used, that is, can be
  • the mobile phone performs one-time detection and performs one-point light test operation at the same time, so it simplifies the design of the hardware part of the display light-up test device, reduces the number of electronic components, improves the breadth and stability of the display-light test device, and saves The cost facilitates the R & D personnel's
  • the field programmable gate array chip uses an internally integrated storage controller.
  • the processor interface initialization code of the display panel DIC is known, the display screen can be directly illuminated by the field programmable gate array chip, even without the need for
  • the application processor is used to provide power to the display panel, and the field programmable gate array chip can be used to provide power to the display panel.
  • the processor interface initialization code of the display panel DIC is not known, the picture can be compressed first. Into a standardized VESC picture accepted by DIC, then light up the display panel through the application processor, then turn off the processor interface switch, and then send the compressed picture through the field programmable gate array chip, and the final result can be fed back to the measured display Displayed on the screen.
  • field programmable gate array chips can also be combined with optical algorithms to study optical problems.

Abstract

一种显示屏点灯测试装置及方法，装置用于对多个待测显示屏模块(60,60',60'')同时执行一点灯测试，包括：数个D型连接器(11,21)，用于连接不同连接器型号的手机，接收并传输电力信号；采样处理器(12,22)，将接收到电力信号采集量化成所需数字和/或图片数据处理后输出给现场可编程门阵列芯片(13,23)，并根据接收到指令输出对应的微控指令；现场可编程门阵列芯片(13,23)分别与D型连接器 (11,21)、采样处理器(12,22)连接以接收数据和微控指令而产生对应的微控参数，依微控参数对数据进行处理以输出点灯测试所需的数据至待测显示屏模块(60,60',60'')，从而对待测显示屏模块(60,60',60'')进行点灯测试。通过上述方式，能一次性检测多个待测显示屏模块(60,60',60'')同时执行一点灯测试，简化装置的硬件部分及工作流程，提高工作效率。

Description

显示屏点灯测试装置及方法 技术领域
本发明涉及显示领域，特别是涉及一种显示屏点灯测试装置及方法。
 背景技术
自IPhone X发布以来，OLED的显示技术的全面屏已经被广大消费者接受，且市场反向剧烈，在可预见的未来，应用PI基板的柔性显示必是极具竞争优势的显示技术。不管是全面屏还是柔性显示，它们共有的技术基础就是将DIC、TIC、Force Touch、S-Pen等结合设置在柔性电路板上，然后绕设到面板的背面，此柔性电路板再通过具有复数个pin脚的连接器与手机、pad等电子装置的具应用处理器的主板连接。其中除了这些不同种类的IC，甚至同种类的IC在不同的厂家的各种不同的要求下，所需要配置的连接器的长短、宽窄、pin数目和pin间距等等的规格也都可能相差很大。如此一来，在对面板进行光学、电性、功耗、Timing、Issue分析等方面的操作时，因应这些不同型号的连接器都需要一个相应的连接器，甚至是一个相应的连接测试治具才得以适配，不仅造成物料成本的浪费，还对测试上需要随时更换，造成费工费时。
现有技术，例如为了测试手机DIC、TIC、显示屏等的功耗、Timing及处理器界面信号，往往需要把手机主板的应用处理器与面板分开设计，通过制作专用的转板治具(例如设置一个FPC柔性电路板)，并在中间预留探点来实现此测试功能。但是由于不同种类的手机其连接器型号的差别很大，如果因此每种型号的连接器都制作一套测试治具，对制作厂商而言其成本势必会大幅提高。
 技术问题
本发明的一个目的在于提供一种显示屏点灯测试装置及方法，以解决现有技术中不同种类､不同型号各自需要一套点灯测试治具的问题。
本发明的另一个目的在于提供一种显示屏点灯测试装置及方法，在不大幅改变原有显示屏点灯测试工艺中特别因应不同种类的连接器型号的前提下，能够简化显示屏点灯测试装置的硬件部分设计，且对不同型号的手机的前提下，只需更换其中整合连接器, 即能进行点灯､测试使用，以节省成本。
本发明的又一个目的在于提供一种显示屏点灯测试装置及方法，通过与现场可编程门阵列的连接，将实现更加复杂的功能，比如自动测试电压，电流，功耗，处理器界面解码等信息，然后将此信息送到显示屏上显示。
 技术解决方案
为解决上述技术问题，本发明采用的一个技术方案是：提供一种显示屏点灯测试装置，该装置用于对多个待测显示屏模块同时执行一点灯测试过程。 该装置包括：数个D型连接器，用于连接具不同连接器型号的手机中与其匹配的待测显示屏模块，接收并传输处理器界面/正电压/负电压/TIC电力信号数据；采样处理器，将接收到DIC、TIC、正电压、负电压的电力数据采集量化成所需数字和/或图片信号输出送给现场可编程门阵列芯片, 并根据采样处理器接收到指令可输出对应的微控指令；现场可编程门阵列芯片，分别与D型连接器､采样处理器连接以接收该等信号数据和依据微控指令而产生对应的微控参数，依据微控参数对该等信号数据进行处理以输出点灯测试所需的信号数据至该待测显示屏模块，从而对待测显示模块进行点灯测试。
其中，显示屏点灯测试装置还包括：整合连接器，其左、右侧各设有成排的测试引线插头(公)､测试引线插座(母)；每个测试引线插头、测试引线插座上均可连接与其匹配的电压开关、电流开关和标准电流开关；亦即电压开关、电流开关和标准电流开关均可安装在左侧的测试引线插头上；右侧的测试引线插座上则可安装有进线电压表、进线电流表、和电流调整器等。由此可分别将左侧的显示面板与右侧的手机的应用处理器连接起来，建构成一个待测显示屏模块。
其中，通过数个D型连接器，一一相应地连接于多个具不同connector型号中与其匹配的待测显示屏模块，即能一次性检测并同时执行一点灯测试。
其中，对不同型号的手机，显示屏点灯测试装置只需更换其中整合连接器为适配于相应手机,即能进行操作点灯､测试使用。
其中，现场可编程门阵列芯片内集成设置有微处理器、显示控制器和具有存储计算程序的存储配控器，微处理器用于输出初始化信息，且微处理器连接显示控制器，通过存储配控器与D型连接器､采样处理器连接以接收､存储该等所需数字和/或图片信号数据和微控指令，并可读取内部存储的数字和/或图片信号数据，再适当地提供给微处理器。现场可编程门阵列芯片通过显示控制器连接D型连接器而连接待测显示屏模块，以输出初始化信息至待测显示屏模块从而对待测显示屏模块进行初始化操作，并输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至待测显示屏模块，从而对待测显示屏模块进行点灯测试。
再者，基于上述结构的实施方式，本发明显示屏点灯测试装置通过数个D型连接器，一一相应地连接于多个不同型号手机的与其匹配的待测显示屏模块时，现场可编程门阵列芯片通过显示控制器连接多个D型连接器而连接多个待测显示屏模块，以输出初始化信息至多个待测显示屏模块从而对多个待测显示屏模块进行初始化操作，并输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至多个待测显示屏模块，从而可对多个待测显示屏模块进行一次性检测并同时执行一点灯测试。
其中，现场可编程门阵列芯片内进一步包括：参数配置器，可接收存储配控器所输出的微控指令，并根据微控指令而产生对应的微控参数，依微控参数对该等信号数据自动处理采样后所需数字和/或图片该等信号数据，即为初始化信息，再提供给微处理器，通过微处理器连接显示控制器，显示控制器连接待测显示屏模块，俾以输出初始化信息至待测显示屏模块，从而对待测显示屏模块进行初始化操作，并将最终结果反馈到所测显示屏上显示出来。
其中，现场可编程门阵列芯片内进一步包括：数字/图片处理器，数字/图片处理器与存储配控器连接以接收存储配控器所输出的数字和/或图片信号数据，且数字/图片处理器进一步与参数配置器连接，以根据微控参数而对数字和/或图片信号数据进行处理；选择控制器，连接数字/图片处理器，用以根据其选择的型号模式而对数字/图片处理器进行选择数字和/或图片之一所输出的处理后数字数据和/或图片数据作为处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据进行输出，且选择控制器进一步连接显示控制器而连接于D型连接器，以通过显示控制器而输出经数字/图片处理器所选择并处理后的数字数据和/或图片数据给相应的待测显示屏模块。
其中，选择控制器进一步连接微处理器以接收微处理器所输出的模式选择指令并根据手机型号选择指令而工作在相应的选择匹配型号模式下。
其中，显示屏点灯测试装置内进一步包括：功率微控模块，其连接在现场可编程门阵列芯片与待D型连接器之间，以接收现场可编程门阵列芯片所输出的功率微控参数，并根据功率微控参数而输出对应的电源电压通过D型连接器传至多个待测显示屏模块，以控制多个待测显示屏模块在不同功率下同时进行点灯测试。
其中，现场可编程门阵列芯片内进一步包括：功率微控器，其分别与参数配置器和功率微控模块连接，其中，参数配置器所产生的微控参数还包括功率微控参数，功率微控器接收功率微控参数，并根据功率微控参数而产生对应的功率微控指令，并将其输出至功率微控模块以控制功率微控模块输出对应的电源电压。
其中，采样处理器内进一步包括：数字模拟转换器，可将由采样处理器接收到电压、电流信号、功耗经数字模拟转换器采集量化成所需数字信号并输出送至现场可编程门阵列芯片，以利现场可编程门阵列芯片进行后续的点灯测试，可以实现自动测试工作。
其中，现场可编程门阵列芯片通过内部集成设置的存储配控器，当已知显示面板DIC的处理器界面初始化代码时，可以直接通过现场可编程门阵列芯片进行点亮显示面板，甚至不需要使用到应用处理器给显示面板提供电源，可改由现场可编程门阵列芯片提供给显示面板提供电源；或者，当不知道显示面板DIC 的处理器界面初始化代码时，是可以通过先将图片压缩成DIC 接受的标准化VESC图片,然后通过应用处理器将显示面板点亮起来，再将处理器界面开关断开，接续通过现场可编程门阵列芯片送出压缩的图片，最终结果可反馈到所测显示屏上显示出来。另外，通过现场可编程门阵列芯片还可以结合光学算法，来研究光学问题。
为解决上述技术问题，本发明采用的另一个技术方案是：提供一种显示屏点灯测试方法，该方法可应用于以上任一项显示屏点灯测试装置。该方法包括：通过整合连接器左、右侧各设有测试引线插头(公)､测试引线插座(母)，每个测试引线插头、测试引线插座上均可连接与其匹配的电压开关、电流开关和标准电流开关，以将显示面板与手机的应用处理器连接起来，建构成一个待测显示屏模块；通过数个D型连接器，可一一连接于多个具不同连接器型号的与其匹配的待测显示屏模块，接收并传输电力信号；通过采样处理器，将接收到的电力信号采集量化成所需数字和/或图片信号数据并输出至现场可编程门阵列芯片；通过现场可编程门阵列芯片内集成的微处理器而输出初始化信息，并通过现场可编程门阵列芯片内集成的显示控制器通过D型连接器而将初始化信息输出至待测显示屏模块，以对待测显示屏模块进行初始化操作；通过现场可编程门阵列芯片集成的存储配控器读取所存储要进行点灯测试所需的数字数据和/或图片数据；通过现场可编程门阵列芯片接收由采样处理器传出的微控指令，根据微控指令而产生对应的微控参数，并根据微控参数对所需的数字数据和/或图片数据进行处理，并通过现场可编程门阵列芯片内集成的显示控制器连接D型连接器而输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至多个待测显示屏模块，从而对多个待测显示屏模块进行一次性检测并同时执行一点灯测试工作。
为解决上述技术问题，本发明采用的另一个技术方案是：提供一种显示屏点灯测试装置，用于对多个待测显示屏模块同时进行点灯测试，其包括：
数个整合连接器，其每一两侧设有对应测试引线插头､对应测试引线插座均连接与其匹配的电压开关、电流开关和标准电流开关，以使所述数个整合连接器将对应数个具不同连接器型号的手机的显示面板与应用处理器连接，构成多个所述待测显示屏模块；
数个D型连接器，连接多个所述待测显示屏模块，接收并传输电力信号；
采样处理器，接收所述电力信号采集量化成所需数字数据和/或图片数据并输出至现场可编程门阵列芯片，接收并根据指令而输出对应的微控指令；以及
现场可编程门阵列芯片内集成有微处理器、显示控制器和存储配控器，所述微处理器用于输出初始化信息，且所述微处理器连接所述显示控制器，所述现场可编程门阵列芯片通过所述显示控制器输出所述初始化信息通过所述数个D型连接器而传至多个所述待测显示屏模块进行初始化操作，所述存储配控器与D型连接器与釆样处理器连接，以接收所述数字数据和/或图片数据与所述微控指令，所述现场可编程门阵列芯片根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所述数字数据和/或图片数据进行处理，以输出多个所述待测显示屏模块进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块，从而对多个所述待测显示屏模块同时进行一点灯测试。
根据本发明一实施方式，所述采样处理器内包括：数字模拟转换器，将所述采样处理器接收到电压、电流信号、功耗采集量化成所需数字信号并输出送至现场可编程门阵列芯片，以利现场可编程门阵列芯片进行后续的点灯测试。
根据本发明一实施方式，所述采样处理器进一步连接至一用于接收手机/用户输入所述手机/用户指令的手机/用户指令接收模块，以输出所述手机/用户指令至所述采样处理器。
根据本发明一实施方式，所述现场可编程门阵列芯片内进一步包括：
参数配置器，与所述存储配控器连接以根据所述微控指令而产生对应的微控参数；
数字/图片处理器，分别与所述存储配控器与参数配置器连接，以接收所述存储配控器所输出的所述数字数据和/或图片数据，以及接收并根据所述参数配置器发送的所述微控参数而对所述数字数据和/或图片数据进行处理；
选择控制器，连接所述数字/图片处理器，以根据型号模式选择指令而工作在相应模式下，对所述数字/图片处理器所输出的处理后数字数据和/或图片数据进行选择处理，作为处理后的多个所述待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据进行输出，且所述选择控制器进一步连接所述显示控制器，以通过所述显示控制器而输出选择处理后的数字数据和/或图片数据通过D型连接器传送至多个且相应的所述待测显示屏模块。
根据本发明一实施方式，所述选择控制器进一步连接所述微处理器以接收所述微处理器所输出的所述型号模式选择指令并根据所述型号模式选择指令而工作在相应的模式下。
根据本发明一实施方式，所述显示屏点灯测试装置进一步包括：功率微控模块，其连接于所述现场可编程门阵列芯片与所述D型連接器之间，以接收所述现场可编程门阵列芯片所输出的功率控制参数，并根据所述功率控制参数而输出对应的电源电压通过D型连接器传至所述待测显示屏模块，以控制所述待测显示屏模块在不同功率下进行点灯测试。
根据本发明一实施方式，所述现场可编程门阵列芯片内进一步包括：功率微控器，其分别连接于所述参数配置器和所述功率微控模块，其中，所述参数配置器所产生的所述控制参数包括所述功率控制参数，所述功率微控器用于接收并根据所述功率控制参数而产生对应的功率控制指令，并将其输出至所述功率微控模块以控制输出对应的电源电压。
为解决上述技术问题，本发明采用的另一个技术方案是：提供一种显示屏点灯测试装置，用于对多个待测显示屏模块同时进行点灯测试，其包括：
整合连接器，其两侧设有测试引线插头､测试引线插座均连接与其匹配的电压开关、电流开关和标准电流开关，以将显示面板与应用处理器连接，构成所述待测显示屏模块；
数个D型连接器，连接多个所述待测显示屏模块，接收并传输电力信号；
采样处理器，接收所述电力信号采集量化成所需数字数据和/或图片数据并输出至现场可编程门阵列芯片，接收并根据指令而输出对应的微控指令；以及
现场可编程门阵列芯片内集成有微处理器、显示控制器和存储配控器，所述微处理器用于输出初始化信息，且所述微处理器连接所述显示控制器，所述现场可编程门阵列芯片通过所述显示控制器输出所述初始化信息通过所述数个D型连接器而传至多个所述待测显示屏模块进行初始化操作，所述存储配控器与D型连接器与釆样处理器连接，以接收所述数字数据和/或图片数据与所述微控指令，所述现场可编程门阵列芯片根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所述数字数据和/或图片数据进行处理，以输出所述待测显示屏模块进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块，从而对多个所述待测显示屏模块同时进行一点灯测试。
根据本发明一实施方式，所述采样处理器内包括：数字模拟转换器，将所述采样处理器接收到电压、电流信号、功耗采集量化成所需数字信号并输出送至现场可编程门阵列芯片，以利现场可编程门阵列芯片进行后续的点灯测试。
根据本发明一实施方式，所述采样处理器进一步连接至一用于接收手机/用户输入所述手机/用户指令的手机/用户指令接收模块，以输出所述手机/用户指令至所述采样处理器。
根据本发明一实施方式，所述现场可编程门阵列芯片内进一步包括：
参数配置器，与所述存储配控器连接以根据所述微控指令而产生对应的微控参数；
数字/图片处理器，分别与所述存储配控器与参数配置器连接，以接收所述存储配控器所输出的所述数字数据和/或图片数据，以及接收并根据所述参数配置器发送的所述微控参数而对所述数字数据和/或图片数据进行处理；
选择控制器，连接所述数字/图片处理器，以根据型号模式选择指令而工作在相应模式下，对所述数字/图片处理器所输出的处理后数字数据和/或图片数据进行选择处理，作为处理后的所述待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据进行输出，且所述选择控制器进一步连接所述显示控制器，以通过所述显示控制器而输出选择处理后的数字数据和/或图片数据通过D型连接器传送至多个且相应的所述待测显示屏模块。
根据本发明一实施方式，所述选择控制器进一步连接所述微处理器以接收所述微处理器所输出的所述型号模式选择指令并根据所述型号模式选择指令而工作在相应的模式下。
根据本发明一实施方式，所述显示屏点灯测试装置进一步包括：功率微控模块，其连接于所述现场可编程门阵列芯片与所述D型連接器之间，以接收所述现场可编程门阵列芯片所输出的功率控制参数，并根据所述功率控制参数而输出对应的电源电压通过D型连接器传至所述待测显示屏模块，以控制所述待测显示屏模块在不同功率下进行点灯测试。
根据本发明一实施方式，所述现场可编程门阵列芯片内进一步包括：功率微控器，其分别连接于所述参数配置器和所述功率微控模块，其中，所述参数配置器所产生的所述控制参数包括所述功率控制参数，所述功率微控器用于接收并根据所述功率控制参数而产生对应的功率控制指令，并将其输出至所述功率微控模块以控制输出对应的电源电压。
为解决上述技术问题，本发明采用的另一个技术方案是：提供一种显示屏点灯测试方法，其应用于上述的显示屏点灯测试装置，所述方法包括：
通过整合连接器两侧设有测试引线插头､测试引线插座，所述测试引线插头与所述测试引线插座上均连接与其匹配的电压开关、电流开关和标准电流开关，以将显示面板与应用处理器连接起来，构成一待测显示屏模块；
通过数个D型连接器，连接多个所述待测显示屏模块，接收并传输电力信号；
通过采样处理器，将接收到所述电力信号采集量化成所需数字和/或图片数据并输出至现场可编程门阵列芯片；
通过所述现场可编程门阵列芯片内集成的微处理器而输出初始化信息，并通过所述现场可编程门阵列芯片内集成的显示控制器通过所述D型连接器而将所述初始化信息输出至多个所述待测显示屏模块，以对多个所述待测显示屏模块进行初始化操作；
通过所述现场可编程门阵列芯片集成的存储配控器读取所存储要进行点灯测试所需的数字数据和/或图片数据；
通过所述现场可编程门阵列芯片接收由所述采样处理器传出的微控指令，根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所需的数字数据和/或图片数据进行处理，并通过所述现场可编程门阵列芯片内集成的所述显示控制器连接所述D型连接器而输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块，从而对多个所述待测显示屏模块进行一次性检测并同时执行一点灯测试工作。
根据本发明一实施方式，所述显示屏点灯测试装置只需更换所述整合连接器为适配对应手机,即能进行点灯测试。
根据本发明一实施方式，所述现场可编程门阵列芯片通过内部集成设置的所述存储配控器，当已知显示面板的处理器界面初始化代码时，直接通过所述现场可编程门阵列芯片进行点亮所述显示面板，甚至不需要使用到所述应用处理器提供电源给所述显示面板，改由所述现场可编程门阵列芯片提供电源给所述显示面板；或者，当不知道所述显示面板的处理器界面初始化代码时，是通过先将图片压缩成所述显示面板DIC 接受的标准化VESC图片,然后通过所述应用处理器将所述显示面板点亮，再将所述处理器界面开关断开，接续通过所述现场可编程门阵列芯片送出所述压缩的图片，最终结果反馈到所测显示屏上显示出来。
根据本发明一实施方式，所述显示屏点灯测试方法还包括通过手机/用户指令接收模块接收手机/用户输入所述手机/用户指令，并输出所述手机/用户指令至所述采样处理器。
根据本发明一实施方式，通过所述现场可编程门阵列芯片接收由所述采样处理器传出的微控指令，根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所需的数字数据和/或图片数据进行处理，并通过所述现场可编程门阵列芯片内集成的所述显示控制器连接所述D型连接器而输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块的步骤包括:
通过所述现场可编程门阵列芯片内集成的参数配置器而根据所述微控指令而产生对应的微控参数；
通过所述现场可编程门阵列芯片内集成的数字/图片处理器而接收所述存储配控器所输出的所述数字数据和/或图片数据，以及接收并根据所述参数配置器发送的所述微控参数而对所述数字数据和/或图片数据进行处理；
通过所述现场可编程门阵列芯片内集成的选择控制器而根据型号模式选择指令而工作在相应模式下，对所述数字/图片处理器所输出的处理后数字数据和/或图片数据进行选择处理，作为处理后的所述待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据进行输出，且通过所述显示控制器而输出选择处理后的数字数据和/或图片数据通过D型连接器传送至多个且相应的所述待测显示屏模块。
根据本发明一实施方式，所述选择控制器接收所述微处理器所输出的所述型号模式选择指令并根据所述型号模式选择指令而工作在相应的模式下。
 有益效果
本发明通过以上方案的技术具体的功效，①.通过整合连接器左、右侧的测试引线插头(公)､测试引线插座(母)均可连接与其匹配的电压开关、电流开关和标准电流开关，以将显示面板与手机的应用处理器连接构成一个待测显示屏模块，②.对不同型号的手机，只需更换整合连接器为适配于相应型号的手机，如此即可建构成多个具不同连接器型号的待测显示屏模块，③.把微处理器、显示控制器和存储配控器集成整合到现场可编程门阵列芯片中，④.把数个D型连接器，一一相应地连接与其匹配的多个待测显示屏模块，如此，即能对多个不同型号的手机进行一次性检测并同时执行一点灯测试操作使用，也简化了显示屏点灯测试装置的硬件部分设计，减少电子元器件的使用数量，提升显示屏点灯装置的使用广度及稳定性，节省成本，方便了研发人员对显示屏点灯测试装置的使用与后续的维护。
 附图说明
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面对实施例中所需要使用的附图作简单的介绍。下面描述中的附图仅为本发明的部分实施例，对于本领域普通技术人员而言，在不付出创造性劳动的前提下，还可以根据这些附图获取其他的附图。
图1是本发明显示屏点灯测试装置的待测显示屏模块一实施方式的结构示意图；
图2是本发明显示屏点灯测试装置的整体结构示意图；
图3是图2本发明显示屏点灯测试装置一实施方式的部份结构示意图；
图4是本发明显示屏点灯测试装置另一实施方式的部份结构示意图；
图5是本发明显示屏点灯测试方法一实施方式的流程示意图。
 本发明的实施方式
请参照附图中的图式，其中相同的组件符号代表相同的组件。以下结构附图和实施方式的说明是基于所例示的本发明具体实施例。应当理解，此处所描述的具体实施方式仅仅用以解释本发明，其不应被视为限制本发明未在此详述的其它具体实施例。
请参阅图1，图1是本发明显示屏点灯测试装置的待测显示屏模块一实施方式的结构示意图；图2是本发明显示屏点灯测试装置的整体结构示意图；图3是图2本发明显示屏点灯测试装置一实施方式的部份结构示意图。
本实施方式中，本发明显示屏点灯测试装置用于对多个待测显示屏模块进行一次性检测并同时执行一点灯测试。该显示屏点灯测试装置1包括：整合连接器10，整合连接器10的左侧设有成排的测试引线插头(公)101､右侧设有成排的测试引线插座(母)102，每个测试引线插头101及测试引线插座102上均可连接可与其匹配的电压开关、电流开关和标准电流开关。具体地，例如电压开关、电流开关和标准电流开关均可安装在左侧的测试引线插头101上。右侧的测试引线插座102上则可安装有进线电压表、进线电流表、和电流调整器等。由此可分别连接于左侧的显示面板70与右侧的手机的应用处理器80，从而建构成一个待测显示屏模块60。
其中，当不同型号的手机内具有不同种类的连接器时，请配合参阅图2，显示屏点灯测试装置1只需更换其中整合连接器10＇(10＇＇)为适配于相应手机。由此可分别连接于左侧的显示面板71(72)与右侧的手机的应用处理器81(82)，从而建构成另一个待测显示屏模块60＇(60＇＇)，即能进行后续的点灯､测试操作使用。
请参阅图2与图3,本实施方式中，该显示模组点灯测试装置1还包括：数个D型连接器11、采样处理器12、现场可编程门阵列芯片13。其中，现场可编程门阵列芯片13分别与D型连接器11与采样处理器12连接。现场可编程门阵列芯片13包括：微处理器131、显示控制器132和具有存储计算程序的存储配控器133。
具体地，D型连接器11用于连接具不同连接器型号的手机中与其匹配的待测显示屏模块60(60＇,60＇＇)，因此D型连接器11的数量可视连接多个手机而决定。请配合参阅图2，本实施方式中，是以同时连接3个具不同连接器型号的手机为例示。3个D型连接器11均连接与其匹配的待测显示屏模块60、60＇、60＇＇；D型连接器11可接收并传输处理器界面、正电压、负电压、电流、TIC等电力信号；采样处理器12，用于接收手机(或用户)指令并根据手机(或用户)指令而输出对应的微控指令，以及将接收到DIC、TIC、正电压、负电压等的电力信号采集量化成所需信号数据(包括数字和/或图片)，都输出给现场可编程门阵列芯片13；现场可编程门阵列芯片13分别与D型连接器､采样处理器12连接，以接收该等信号数据和微控指令并依微控指令而产生对应的微控参数，且依据微控参数对该等信号数据进行处理以输出点灯测试所需的信号数据至该待测显示屏模块60、60＇、60＇＇，从而对待测显示屏模块60、60＇、60＇＇同时进行点灯测试。
具体地，现场可编程门阵列芯片13内集成有微处理器131、显示控制器132和具有存储计算程序的存储配控器133，且微处理器131与显示控制器132连接，显示控制器132还通过D型连接器11连接待测显示模组60、60＇、60＇＇，存储配控器133与D型连接器与釆样处理器连接，并可读取内部存储的数字和/或图片的信号数据，再适当地提供给微处理器131。
具体地，现场可编程门阵列芯片13内集成设置的微处理器131用于输出初始化信息，显示控制器132用于输出该初始化信息至待测显示屏模块60(60＇、60＇＇)，从而对待测显示屏模块60(60＇、60＇＇)进行初始化操作。此外，现场可编程门阵列芯片13进一步通过集成的存储配控器133内部设有存储计算程序，且与D型连接器11､采样处理器12连接以接收由D型连接器11､采样处理器12发送的用以进行点灯测试所需的该等数字数据和/或图片数据与微控指令并存储，且可读取内部存储的数字数据和/或图片数据并进行分析分类，现场可编程门阵列芯片13并根据微控指令而产生对应的微控参数，进而根据微控参数对数字数据和/或图片数据进行处理以输出经处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据，再适当地提供给微处理器131，并通过显示控制器132连接D型连接器11而传输至待测显示屏模块60、60＇、60＇＇，从而对多个待测显示屏模块60、60＇、60＇＇进行一次性检测并同时执行一点灯测试。
具体地，采样处理器12内进一步包括：数字模拟转换器121，可将由采样处理器12接收到电压、电流信号、功耗经数字模拟转换器采集量化成所需数字信号并输出送至现场可编程门阵列芯片13，以利现场可编程门阵列芯片13进行后续的点灯测试，可以实现自动测试工作。
本实施方式中，通过整合连接器将显示面板与手机的应用处理器连接构成一个待测显示屏模块，再通过对不同型号的手机，只需更换整合连接器为适配于相应型号的手机，如此即可建构成多个具不同连接器型号的待测显示屏模块，另外由于现场可编辑门阵列芯片中集成了微处理器、显示控制器和存储配控器，且通过数个D型连接器，一一相应地连接与其匹配的多个待测显示屏模块，如此，即能对多个不同型号的手机进行一次性检测并同时执行一点灯测试操作使用，因此其简化了显示屏点灯测试装置的硬件部分设计，减少电子元器件的使用数量，提升显示屏点灯测试装置的使用广度及稳定性，节省成本，方便了研发人员对显示屏点灯测试装置的点灯测试工作与后续维护。
其中，现场可编程门阵列芯片通过内部集成设置的存储配控器，当已知显示面板DIC的处理器界面初始化代码时，可以直接通过现场可编程门阵列芯片进行点亮显示屏，甚至不需要使用到应用处理器给显示面板提供电源，可改由现场可编程门阵列芯片提供给显示面板提供电源；或者，当不知道显示面板DIC 的处理器界面初始化代码时，是可以通过先将图片压缩成DIC 接受的标准化VESC图片,然后通过应用处理器将显示面板点亮起来，再将处理器界面开关断开，接续通过现场可编程门阵列芯片送出压缩的图片，最终结果可反馈到所测显示屏上显示出来。另外，通过现场可编程门阵列芯片还可以结合光学算法，来研究光学问题。
请参阅图4并配合图2，图4是本发明显示屏点灯测试装置另一实施方式的部份结构示意图；区别于上述实施方式，本实施方式中的显示模组点灯测试装置2包括：整合连接器10，D型连接器21、釆样处理器 22、现场可编辑门阵列芯片23、手机/用户指令接收模块24、功率微控模块25。其中，现场可编程门阵列芯片23分别与D型连接器21与采样处理器22连接，现场可编辑门阵列芯片23包括微处理器231、显示控制器232、存储配控器233、数字/图片处理器234、选择控制器235、参数配置器236、功率微控器237。
具体地，采样处理器22内进一步包括：数字模拟转换器221，可将由采样处理器22接收到电压、电流信号、功耗经数字模拟转换器采集量化成所需数字信号并输出送至现场可编程门阵列芯片23，以利现场可编程门阵列芯片23进行后续的点灯测试，可以实现自动测试工作。
具体地，微处理器231与显示控制器232连接，显示控制器232通过D型连接器21连接于待测显示模组60、60＇、60＇＇；存储配控器233内部设有存储计算程序，且与D型连接器21､采样处理器22连接，并可读取内部存储的数字和/或图片的信号数据，再适当地提供给微处理器131。微处理器231还与选择控制器235连接。手机/用户指令接收模块24与釆样处理器22连接。
其中，存储配控器233还分别连接数字/图片处理器234和参数配置器236连接，数字/图片处理器234还进一步分别与选择控制器235和参数配置器236连接，选择控制器235进一步连接显示控制器232。
其中，参数配置器236还与功率微控器237连接；功率微控器237与功率微控模块25连接。
具体地，存储配控器233与D型连接器21､采样处理器22连接，以接收由D型连接器21､采样处理器22发送的用以进行点灯测试所需的该等数字数据和/或图片数据与微控指令并存储，且可读取其内部存储的数字数据和/或图片数据并进行分析分类；参数配置器236可接收存储配控器233所输出的微控指令，并根据微控指令而产生对应的微控参数；数字/图片处理器234用于接收存储配控器233所输出的数字数据和/或图片数据，且数字/图片处理器234进一步根据参数配置器236输出的控制参数而对数字数据和/或图片数据进行处理；选择控制器 235进一步接收微处理器231所输出型号模式选择指令(即D型连接器21所接收不同型号的待测显示屏模块)，并根据型号模式选择指令而工作在相应模式下，对经数字/图片处理器234所输出处理后数字数据和/或图片数据进行选择处理，作为处理后待测显示屏模块60要进行点灯测试所需的数字数据和/或图片数据而进行输出，并通过显示控制器132连接D型连接器11而将匹配的数字数据和/或图片数据传输至待测显示屏模块60、60＇、60＇＇，从而对多个待测显示屏模块60、60＇、60＇＇进行一次性检测并同时执行一点灯测试。
具体地，釆样处理器22用于接收手机/用户指令接收模块24所输出的模式指令，且解析该模式指令成为微控指令，并通过存储配控器233传给参数配置器236，解析得到的控制指令而产出对应的控制参数；数字/图片处理器234进一步根据参数配置器236输出的控制参数而对所接收到的数字数据和/或图片数据进行处理。其中，选择控制器235是根据微处理器231所输出的型号模式选择指令，而输出选择相应的处理后数字和/或图片信息控制参数至数字/图片处理器234，而功率控制参数则输出至功率微控器237。其中，功率微控器237是接收选择控制器235输出的功率控制参数，并根据该功率控制参数而产生对应的功率控制指令，并将其输出至功率微控模块25以进一步控制功率微控模块25输出对应的电源电压。
进一步，功率微控模块25用于接收现场可编程门阵列芯片23所输出的功率控制参数，并根据功率控制参数而输出对应的电源电压通过D型连接器传至待测显示屏模块60(60＇、60＇＇)，以控制待测显示屏模块60(60＇、60＇＇)在不同功率下可进行点灯测试。
本实施方式中，通过整合连接器将显示屏与手机的应用处理器连接构成一个待测显示屏模块，再通过对不同型号的手机，只需更换整合连接器为适配于相应型号的手机，如此即可建构成多个具不同连接器型号的待测显示屏模块，另由于现场可编辑门阵列芯片中集成了微处理器、显示控制器和存储配控器，且通过数个D型连接器，一一相应地连接与其匹配的多个待测显示屏模块，如此，即能对多个不同型号的手机进行一次性检测并同时执行一点灯测试操作使用，即能对多个不同型号的手机进行一次性检测并同时执行一点灯测试操作使用，因此其简化了显示屏点灯测试装置的硬件部分设计，减少电子元器件的使用数量，提升显示屏点灯测试装置的使用广度及稳定性，节省成本，方便了研发人员对显示屏点灯测试装置的点灯测试工作与后续维护。
其中，现场可编程门阵列芯片通过内部集成设置的存储配控器，当已知显示面板DIC的处理器界面初始化代码时，可以直接通过现场可编程门阵列芯片进行点亮显示屏，甚至不需要使用到应用处理器给显示面板提供电源，可改由现场可编程门阵列芯片提供给显示面板提供电源；或者，当不知道显示面板DIC 的处理器界面初始化代码时，是可以通过先将图片压缩成DIC 接受的标准化VESC图片,然后通过应用处理器将显示面板点亮起来，再将处理器界面开关断开，接续通过现场可编程门阵列芯片送出压缩的图片，最终结果可反馈到所测显示屏上显示出来。另外，通过现场可编程门阵列芯片还可以结合光学算法，来研究光学问题。
请参阅图5，图5是本发明显示屏点灯测试方法一实施方式的流程示意图。其中，本发明的显示屏点灯测试方法是应用在上述的显示屏点灯测试装置中，且如图5所示，所述方法包括如下步骤：
S501：通过整合连接器左、右侧各设有测试引线插头､测试引线插座，每个测试引线插头与测试引线插座上均可连接与其匹配的电压开关、电流开关和标准电流开关，以将显示面板与手机的应用处理器连接起来，建构成一个待测显示屏模块；
S502：通过数个D型连接器，可一一连接于多个具不同连接器型号的与其匹配的待测显示屏模块，接收并传输电力信号；
S503：通过采样处理器，将接收到的电力信号采集量化成所需数字和/或图片信号数据并输出至现场可编程门阵列芯片；
S504：通过现场可编程门阵列芯片内集成的微处理器而输出初始化信息，并通过现场可编程门阵列芯片内集成的显示控制器通过D型连接器而将初始化信息输出至待测显示屏模块，以对待测显示屏模块进行初始化操作；
S505：通过现场可编程门阵列芯片集成的存储配控器读取所存储要进行点灯测试所需的数字数据和/或图片数据；
S506：通过现场可编程门阵列芯片接收由采样处理器传出的微控指令，根据微控指令而产生对应的微控参数，并根据微控参数对所需的数字数据和/或图片数据进行处理，并通过现场可编程门阵列芯片内集成的显示控制器连接D型连接器而输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至多个待测显示屏模块，从而对多个待测显示屏模块进行一次性检测并同时执行一点灯测试工作。
详细的测试过程如上面的实施方式所述，在此不再赘述。
本实施方法中，通过整合连接器将显示屏与手机的应用处理器连接构成一个待测显示屏模块，再通过对不同型号的手机，只需更换整合连接器为适配于相应型号的手机，如此即可建构成多个具不同连接器型号的待测显示屏模块，另由于现场可编辑门阵列芯片中集成了微处理器、显示控制器和存储配控器，且通过数个D型连接器，一一相应地连接与其匹配的多个待测显示屏模块，如此，即能对多个不同型号的手机进行一次性检测并同时执行一点灯测试操作使用，即能对多个不同型号的手机进行一次性检测并同时执行一点灯测试操作使用，因此其简化了显示屏点灯测试装置的硬件部分设计，减少电子元器件的使用数量，提升显示屏点灯测试装置的使用广度及稳定性，节省成本，方便了研发人员对显示屏点灯测试装置的点灯测试工作与后续维护。
其中，现场可编程门阵列芯片通过内部集成设置的存储配控器，当已知显示面板DIC的处理器界面初始化代码时，可以直接通过现场可编程门阵列芯片进行点亮显示屏，甚至不需要使用到应用处理器给显示面板提供电源，可改由现场可编程门阵列芯片提供给显示面板提供电源；或者，当不知道显示面板DIC 的处理器界面初始化代码时，是可以通过先将图片压缩成DIC 接受的标准化VESC图片,然后通过应用处理器将显示面板点亮起来，再将处理器界面开关断开，接续通过现场可编程门阵列芯片送出压缩的图片，最终结果可反馈到所测显示屏上显示出来。另外，通过现场可编程门阵列芯片还可以结合光学算法，来研究光学问题。
综上所述，虽然本发明已以优选实施例揭露如上，但以上所述仅为本发明的实施方式，并非因此限制本发明的专利范围，本领域的普通技术人员，在不脱离本发明的精神和范围内，均可作各种更动与润饰，凡是利用本发明说明书及附图内容所作的等效结构或等效流程变换，或直接或间接运用在其他相关的技术领域，均同理包括在本发明的专利保护范围内。

Claims (20)

  1. 一种显示屏点灯测试装置，用于对多个待测显示屏模块同时进行点灯测试，其包括：
    数个整合连接器，其每一两侧设有对应测试引线插头､对应测试引线插座均连接与其匹配的电压开关、电流开关和标准电流开关，以使所述数个整合连接器将对应数个具不同连接器型号的手机的显示面板与应用处理器连接，构成多个所述待测显示屏模块；
    数个D型连接器，连接多个所述待测显示屏模块，接收并传输电力信号；
    采样处理器，接收所述电力信号采集量化成所需数字数据和/或图片数据并输出至现场可编程门阵列芯片，接收并根据指令而输出对应的微控指令；以及
    现场可编程门阵列芯片内集成有微处理器、显示控制器和存储配控器，所述微处理器用于输出初始化信息，且所述微处理器连接所述显示控制器，所述现场可编程门阵列芯片通过所述显示控制器输出所述初始化信息通过所述数个D型连接器而传至多个所述待测显示屏模块进行初始化操作，所述存储配控器与D型连接器与釆样处理器连接，以接收所述数字数据和/或图片数据与所述微控指令，所述现场可编程门阵列芯片根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所述数字数据和/或图片数据进行处理，以输出多个所述待测显示屏模块进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块，从而对多个所述待测显示屏模块同时进行一点灯测试。
  2. 根据权利要求1所述的显示屏点灯测试装置，其中, 所述采样处理器内包括：
    数字模拟转换器，将所述采样处理器接收到电压、电流信号、功耗采集量化成所需数字信号并输出送至现场可编程门阵列芯片，以利现场可编程门阵列芯片进行后续的点灯测试。
  3. 根据权利要求1所述的显示屏点灯测试装置，其中, 所述采样处理器进一步连接至一用于接收手机/用户输入所述手机/用户指令的手机/用户指令接收模块，以输出所述手机/用户指令至所述采样处理器。
  4. 根据权利要求1所述的显示屏点灯测试装置，其中,所述现场可编程门阵列芯片内进一步包括：
    参数配置器，与所述存储配控器连接以根据所述微控指令而产生对应的微控参数；
    数字/图片处理器，分别与所述存储配控器与参数配置器连接，以接收所述存储配控器所输出的所述数字数据和/或图片数据，以及接收并根据所述参数配置器发送的所述微控参数而对所述数字数据和/或图片数据进行处理；
    选择控制器，连接所述数字/图片处理器，以根据型号模式选择指令而工作在相应模式下，对所述数字/图片处理器所输出的处理后数字数据和/或图片数据进行选择处理，作为处理后的多个所述待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据进行输出，且所述选择控制器进一步连接所述显示控制器，以通过所述显示控制器而输出选择处理后的数字数据和/或图片数据通过D型连接器传送至多个且相应的所述待测显示屏模块。
  5. 根据权利要求4所述的显示屏点灯测试装置，其中，所述选择控制器进一步连接所述微处理器以接收所述微处理器所输出的所述型号模式选择指令并根据所述型号模式选择指令而工作在相应的模式下。
  6. 根据权利要求5所述的显示屏点灯测试装置，其中，所述显示屏点灯测试装置进一步包括：
    功率微控模块，其连接于所述现场可编程门阵列芯片与所述D型連接器之间，以接收所述现场可编程门阵列芯片所输出的功率控制参数，并根据所述功率控制参数而输出对应的电源电压通过D型连接器传至所述待测显示屏模块，以控制所述待测显示屏模块在不同功率下进行点灯测试。
  7. 根据权利要求6所述的显示屏点灯测试装置，其中，所述现场可编程门阵列芯片内进一步包括：
    功率微控器，其分别连接于所述参数配置器和所述功率微控模块，其中，所述参数配置器所产生的所述控制参数包括所述功率控制参数，所述功率微控器用于接收并根据所述功率控制参数而产生对应的功率控制指令，并将其输出至所述功率微控模块以控制输出对应的电源电压。
  8. 一种显示屏点灯测试装置，用于对多个待测显示屏模块同时进行点灯测试，其包括：
    整合连接器，其两侧设有测试引线插头､测试引线插座均连接与其匹配的电压开关、电流开关和标准电流开关，以将显示面板与应用处理器连接，构成所述待测显示屏模块；
    数个D型连接器，连接多个所述待测显示屏模块，接收并传输电力信号；
    采样处理器，接收所述电力信号采集量化成所需数字数据和/或图片数据并输出至现场可编程门阵列芯片，接收并根据指令而输出对应的微控指令；以及
    现场可编程门阵列芯片内集成有微处理器、显示控制器和存储配控器，所述微处理器用于输出初始化信息，且所述微处理器连接所述显示控制器，所述现场可编程门阵列芯片通过所述显示控制器输出所述初始化信息通过所述数个D型连接器而传至多个所述待测显示屏模块进行初始化操作，所述存储配控器与D型连接器与釆样处理器连接，以接收所述数字数据和/或图片数据与所述微控指令，所述现场可编程门阵列芯片根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所述数字数据和/或图片数据进行处理，以输出所述待测显示屏模块进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块，从而对多个所述待测显示屏模块同时进行一点灯测试。
  9. 根据权利要求8所述的显示屏点灯测试装置，其中, 所述采样处理器内包括：
    数字模拟转换器，将所述采样处理器接收到电压、电流信号、功耗采集量化成所需数字信号并输出送至现场可编程门阵列芯片，以利现场可编程门阵列芯片进行后续的点灯测试。
  10. 根据权利要求8所述的显示屏点灯测试装置，其中,所述采样处理器进一步连接至一用于接收手机/用户输入所述手机/用户指令的手机/用户指令接收模块，以输出所述手机/用户指令至所述采样处理器。
  11. 根据权利要求8所述的显示屏点灯测试装置，其中,所述现场可编程门阵列芯片内进一步包括：
    参数配置器，与所述存储配控器连接以根据所述微控指令而产生对应的微控参数；
    数字/图片处理器，分别与所述存储配控器与参数配置器连接，以接收所述存储配控器所输出的所述数字数据和/或图片数据，以及接收并根据所述参数配置器发送的所述微控参数而对所述数字数据和/或图片数据进行处理；
    选择控制器，连接所述数字/图片处理器，以根据型号模式选择指令而工作在相应模式下，对所述数字/图片处理器所输出的处理后数字数据和/或图片数据进行选择处理，作为处理后的所述待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据进行输出，且所述选择控制器进一步连接所述显示控制器，以通过所述显示控制器而输出选择处理后的数字数据和/或图片数据通过D型连接器传送至多个且相应的所述待测显示屏模块。
  12. 根据权利要求11所述的显示屏点灯测试装置，其中，所述选择控制器进一步连接所述微处理器以接收所述微处理器所输出的所述型号模式选择指令并根据所述型号模式选择指令而工作在相应的模式下。
  13. 根据权利要求12所述的显示屏点灯测试装置，其中，所述显示屏点灯测试装置进一步包括：
    功率微控模块，其连接于所述现场可编程门阵列芯片与所述D型連接器之间，以接收所述现场可编程门阵列芯片所输出的功率控制参数，并根据所述功率控制参数而输出对应的电源电压通过D型连接器传至所述待测显示屏模块，以控制所述待测显示屏模块在不同功率下进行点灯测试。
  14. 根据权利要求13所述的显示屏点灯测试装置，其中，所述现场可编程门阵列芯片内进一步包括：
    功率微控器，其分别连接于所述参数配置器和所述功率微控模块，其中，所述参数配置器所产生的所述控制参数包括所述功率控制参数，所述功率微控器用于接收并根据所述功率控制参数而产生对应的功率控制指令，并将其输出至所述功率微控模块以控制输出对应的电源电压。
  15. 一种显示屏点灯测试方法，其应用于如权利要求8所述的显示屏点灯测试装置，所述方法包括：
    通过整合连接器两侧设有测试引线插头､测试引线插座，所述测试引线插头与所述测试引线插座上均连接与其匹配的电压开关、电流开关和标准电流开关，以将显示面板与应用处理器连接起来，构成一待测显示屏模块；
    通过数个D型连接器，连接多个所述待测显示屏模块，接收并传输电力信号；
    通过采样处理器，将接收到所述电力信号采集量化成所需数字和/或图片数据并输出至现场可编程门阵列芯片；
    通过所述现场可编程门阵列芯片内集成的微处理器而输出初始化信息，并通过所述现场可编程门阵列芯片内集成的显示控制器通过所述D型连接器而将所述初始化信息输出至多个所述待测显示屏模块，以对多个所述待测显示屏模块进行初始化操作；
    通过所述现场可编程门阵列芯片集成的存储配控器读取所存储要进行点灯测试所需的数字数据和/或图片数据；
    通过所述现场可编程门阵列芯片接收由所述采样处理器传出的微控指令，根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所需的数字数据和/或图片数据进行处理，并通过所述现场可编程门阵列芯片内集成的所述显示控制器连接所述D型连接器而输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块，从而对多个所述待测显示屏模块进行一次性检测并同时执行一点灯测试工作。
  16. 根据权利要求15所述的显示屏点灯测试方法，其中,所述显示屏点灯测试装置只需更换所述整合连接器为适配对应手机,即能进行点灯测试。
  17. 根据权利要求15所述的显示屏点灯测试方法，其中,所述现场可编程门阵列芯片通过内部集成设置的所述存储配控器，当已知显示面板的处理器界面初始化代码时，直接通过所述现场可编程门阵列芯片进行点亮所述显示面板，甚至不需要使用到所述应用处理器提供电源给所述显示面板，改由所述现场可编程门阵列芯片提供电源给所述显示面板；或者，当不知道所述显示面板的处理器界面初始化代码时，是通过先将图片压缩成所述显示面板DIC 接受的标准化VESC图片,然后通过所述应用处理器将所述显示面板点亮，再将所述处理器界面开关断开，接续通过所述现场可编程门阵列芯片送出所述压缩的图片，最终结果反馈到所测显示屏上显示出来。
  18. 根据权利要求15所述的显示屏点灯测试方法，还包括通过手机/用户指令接收模块接收手机/用户输入所述手机/用户指令，并输出所述手机/用户指令至所述采样处理器。
  19. 根据权利要求15所述的显示屏点灯测试方法，其中,通过所述现场可编程门阵列芯片接收由所述采样处理器传出的微控指令，根据所述微控指令而产生对应的微控参数，并根据所述微控参数对所需的数字数据和/或图片数据进行处理，并通过所述现场可编程门阵列芯片内集成的所述显示控制器连接所述D型连接器而输出处理后的待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据至多个所述待测显示屏模块的步骤包括:
    通过所述现场可编程门阵列芯片内集成的参数配置器而根据所述微控指令而产生对应的微控参数；
    通过所述现场可编程门阵列芯片内集成的数字/图片处理器而接收所述存储配控器所输出的所述数字数据和/或图片数据，以及接收并根据所述参数配置器发送的所述微控参数而对所述数字数据和/或图片数据进行处理；
    通过所述现场可编程门阵列芯片内集成的选择控制器而根据型号模式选择指令而工作在相应模式下，对所述数字/图片处理器所输出的处理后数字数据和/或图片数据进行选择处理，作为处理后的所述待测显示屏模块要进行点灯测试所需的数字数据和/或图片数据进行输出，且通过所述显示控制器而输出选择处理后的数字数据和/或图片数据通过D型连接器传送至多个且相应的所述待测显示屏模块。
  20. 根据权利要求19所述的显示屏点灯测试方法，其中,所述选择控制器接收所述微处理器所输出的所述型号模式选择指令并根据所述型号模式选择指令而工作在相应的模式下。
PCT/CN2018/102916 2018-06-01 2018-08-29 显示屏点灯测试装置及方法 WO2019227731A1 (zh)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US16/099,863 US10847069B2 (en) 2018-06-01 2018-08-29 Display light-on test device and method

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
CN201810557646.8 2018-06-01
CN201810557646.8A CN108806565B (zh) 2018-06-01 2018-06-01 显示屏点灯测试装置及方法

Publications (1)

Publication Number Publication Date
WO2019227731A1 true WO2019227731A1 (zh) 2019-12-05

Family

ID=64090246

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/CN2018/102916 WO2019227731A1 (zh) 2018-06-01 2018-08-29 显示屏点灯测试装置及方法

Country Status (3)

Country Link
US (1) US10847069B2 (zh)
CN (1) CN108806565B (zh)
WO (1) WO2019227731A1 (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108806565B (zh) * 2018-06-01 2020-08-04 武汉华星光电半导体显示技术有限公司 显示屏点灯测试装置及方法
CN109857469B (zh) * 2019-01-15 2022-07-08 Oppo广东移动通信有限公司 显示屏控制方法及相关产品
CN110534045B (zh) * 2019-08-20 2022-11-29 武汉精立电子技术有限公司 一种高效的Demura流程运行方法及系统
CN114019405A (zh) * 2021-07-15 2022-02-08 重庆康佳光电技术研究院有限公司 一种点灯测试装置、方法和系统

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06167945A (ja) * 1992-11-30 1994-06-14 Yokogawa Electric Corp 多点入出力装置の表示装置
KR20140045855A (ko) * 2012-10-09 2014-04-17 엘지디스플레이 주식회사 평판 표시 장치의 검사 방법 및 검사 장치
CN203941680U (zh) * 2014-06-12 2014-11-12 厦门赛特勒电子有限公司 一种液晶显示屏模块智能测试系统
CN107564447A (zh) * 2017-10-12 2018-01-09 京东方科技集团股份有限公司 一种点灯治具、点灯测试系统及其测试方法
CN108806565A (zh) * 2018-06-01 2018-11-13 武汉华星光电半导体显示技术有限公司 显示屏点灯测试装置及方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100767191B1 (ko) * 2006-01-06 2007-10-17 주식회사 파이컴 회로기판 연결 유닛 및 그것을 갖는 평판표시패널 검사장치
KR100844337B1 (ko) * 2008-04-03 2008-07-07 (주)엠아이케이 이십일 터치판넬의 전원인가용 멀티연결부
CN202196020U (zh) * 2011-09-06 2012-04-18 苏州日和科技有限公司 一种多玻璃片测试座
KR101146722B1 (ko) * 2012-02-29 2012-05-17 한동희 디스플레이용 패널의 검사장치
CN104360509B (zh) * 2014-11-21 2018-02-13 京东方科技集团股份有限公司 点灯测试方法及装置
CN105304000B (zh) * 2015-09-23 2019-01-22 昆山龙腾光电有限公司 液晶显示模组老化测试系统
CN205405001U (zh) * 2016-02-22 2016-07-27 无锡市速波精密机械有限公司 车载老化测试液晶屏治具
CN105785607A (zh) * 2016-03-31 2016-07-20 京东方科技集团股份有限公司 显示基板、点灯设备及点灯测试探针对位检测方法
CN205539809U (zh) * 2016-04-19 2016-08-31 鄂尔多斯市源盛光电有限责任公司 用于点灯测试的调节装置和点灯测试装置
CN106771974B (zh) * 2016-12-29 2019-07-12 武汉华星光电技术有限公司 显示模组点灯测试装置及方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH06167945A (ja) * 1992-11-30 1994-06-14 Yokogawa Electric Corp 多点入出力装置の表示装置
KR20140045855A (ko) * 2012-10-09 2014-04-17 엘지디스플레이 주식회사 평판 표시 장치의 검사 방법 및 검사 장치
CN203941680U (zh) * 2014-06-12 2014-11-12 厦门赛特勒电子有限公司 一种液晶显示屏模块智能测试系统
CN107564447A (zh) * 2017-10-12 2018-01-09 京东方科技集团股份有限公司 一种点灯治具、点灯测试系统及其测试方法
CN108806565A (zh) * 2018-06-01 2018-11-13 武汉华星光电半导体显示技术有限公司 显示屏点灯测试装置及方法

Also Published As

Publication number Publication date
US20200074898A1 (en) 2020-03-05
CN108806565B (zh) 2020-08-04
CN108806565A (zh) 2018-11-13
US10847069B2 (en) 2020-11-24

Similar Documents

Publication Publication Date Title
WO2019227731A1 (zh) 显示屏点灯测试装置及方法
CN104318882A (zh) 一种显示模组检测设备
CN101577078A (zh) 液晶显示器的全自动调整测试系统
CN110567987A (zh) 一种基于自动视觉技术的馈线终端基板检测系统及方法
CN103149495A (zh) 一种用于多路导线\连接器测试的综合测试仪
CN204288754U (zh) 一种显示模组检测设备
CN105954623B (zh) 一种通用频率源类插件的调测系统及其测试方法
CN105511443A (zh) 一种充电桩控制器测试装置
CN203658514U (zh) 扁平电缆测试装置
CN208188289U (zh) 一种电路功耗的测试系统
CN217385736U (zh) 一种mcu的ate设备及其系统
CN100523856C (zh) 电子元件的模拟治具以及供电异常检测方法
TWI765421B (zh) 產品檢測裝置、產品檢測系統及應用於其上的產品檢測方法
CN203479945U (zh) 航插接口测试装置
CN211478919U (zh) 一种光模块测试装置
CN208537630U (zh) Lcr机台在线自检控制装置
CN203466874U (zh) 一种手机产线lcd自动测试装置
CN113281639A (zh) 一种板卡测试装置、系统及方法
CN104639039A (zh) 中小型光伏并网逆变器单板自动化测试平台
CN108828464A (zh) 一种不间断电源测试系统
CN210155335U (zh) 一种用于多模导航接收机的测试装置
CN112985591B (zh) 一种感光检测设备及系统
CN220141673U (zh) 一种心电记录仪测试装置
CN212460245U (zh) 一种液晶模组测试系统
CN218212659U (zh) 一种应用于老化试验板的半自动点亮检查装置

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 18920471

Country of ref document: EP

Kind code of ref document: A1

NENP Non-entry into the national phase

Ref country code: DE

122 Ep: pct application non-entry in european phase

Ref document number: 18920471

Country of ref document: EP

Kind code of ref document: A1