WO2021214964A1 - イオン化装置及び質量分析装置 - Google Patents

イオン化装置及び質量分析装置 Download PDF

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Publication number
WO2021214964A1
WO2021214964A1 PCT/JP2020/017638 JP2020017638W WO2021214964A1 WO 2021214964 A1 WO2021214964 A1 WO 2021214964A1 JP 2020017638 W JP2020017638 W JP 2020017638W WO 2021214964 A1 WO2021214964 A1 WO 2021214964A1
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WO
WIPO (PCT)
Prior art keywords
heater
assist gas
ionization
flow path
heat transfer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2020/017638
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English (en)
French (fr)
Japanese (ja)
Inventor
陽平 藤次
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
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Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Priority to US17/919,951 priority Critical patent/US12476096B2/en
Priority to CN202080099032.5A priority patent/CN115335960B/zh
Priority to JP2022516784A priority patent/JP7306575B2/ja
Priority to PCT/JP2020/017638 priority patent/WO2021214964A1/ja
Publication of WO2021214964A1 publication Critical patent/WO2021214964A1/ja
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H01J49/167—Capillaries and nozzles specially adapted therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets

Definitions

  • the present invention relates to an ionizer.
  • liquid chromatograph mass spectrometer As one of the devices that analyze substances contained in liquid samples.
  • the liquid sample is introduced into the column of the liquid chromatograph on the flow of the mobile phase, and the target substance is separated from other substances inside the column.
  • the target substance flowing out of the column is ionized by the ionization source of the mass spectrometer, and then separated and measured according to the mass-to-charge ratio.
  • an electrospray ionization (ESI) source is used as the ion source of the mass spectrometer.
  • the ESI source is a nozzle (ESI nozzle) having a double-tube structure in which a liquid sample is introduced, charged, and sprayed into an ionization chamber.
  • the first flow path into which the liquid sample is introduced and the first flow path are It has a second flow path formed on the outer periphery of the surface and into which the nebulizer gas is introduced.
  • ESI voltage a predetermined voltage
  • nebulizer gas is sprayed onto the charged droplets of the liquid sample flowing out from the tip of the first flow path to the ionization chamber. Spray on.
  • the charged droplet sprayed into the ionization chamber is ionized by splitting due to charge repulsion inside the droplet and vaporization (desolvent) of the mobile phase.
  • Patent Documents 1 and 2 describe an ESI source provided with a mechanism for supplying an assist gas for promoting desolvation of charged droplets of a liquid sample.
  • the mechanism for supplying the assist gas includes a third flow path to which the assist gas is supplied and an assist gas nozzle for supplying the assist gas supplied from the third flow path to the outer periphery of the jet of the liquid sample from the ESI nozzle. There is.
  • a heater is arranged inside the third flow path, and desolvation is promoted by supplying the assist gas heated by the heater to the charged droplets of the liquid sample.
  • Patent Documents 1 and 2 describe that an assist gas heated to 400 to 500 ° C. is blown onto a charged droplet, but in the case of analysis of a substance that is difficult to vaporize or analysis of supplying a mobile phase at a high flow rate. Is not always sufficient for desolvation, and it is required to promote desolvation of charged droplets by using a higher temperature assist gas.
  • Patent Document 2 describes that a microsheath heater is used as a heater for heating the assist gas.
  • the heat-resistant temperature of the microsheath heater is as high as about 600 ° C, the wire of the microsheath heater is thin, so if the power supply increases even a little, the heater may break. Further, if a heater having high heat resistance is used to prevent this, the cost increases.
  • the problem to be solved by the present invention is to provide a technique capable of accelerating the desolvation of a liquid sample by an assist gas having a higher temperature than the conventional one at a low cost.
  • the ionization apparatus made to solve the above problems is Ionization room and A sample nozzle that allows a liquid sample to flow out into the ionization chamber, An assist gas flow path that supplies an assist gas that promotes desolvation of the liquid sample to the ionization chamber, A heater arranged inside the assist gas flow path and A heat transfer member arranged in contact with the heater is provided inside the assist gas flow path.
  • an assist gas that promotes desolvation of the liquid sample is supplied to the liquid sample flowing out from the sample nozzle.
  • a heat transfer member is arranged in contact with the heater in the assist gas flow path through which the assist gas flows.
  • the heat transfer member is arranged in addition to the heater, the contact area between the assist gas flowing through the assist gas flow path and the heat source (heater and heat transfer member) becomes larger than before. , The assist gas is heated with higher efficiency, and the assist gas having a higher temperature than the conventional one can be supplied.
  • the heater itself may be the same as the conventional one, and the ionization apparatus can be configured at low cost.
  • SUS mesh which is a heat transfer member in this embodiment.
  • the ionizing device of this embodiment is incorporated as an ionizing part of a mass spectrometer, and ionizes a liquid sample containing a target substance.
  • FIG. 1 is a configuration diagram of a main part of the mass spectrometer.
  • This mass spectrometer includes an ionization chamber 2, a first intermediate vacuum chamber 3, a second intermediate vacuum chamber 4, and an analysis chamber 5 inside the chamber 1.
  • the ionization chamber 2 is provided with an ESI ionization probe 60 that ionizes the components in the liquid sample.
  • ion guides 11 and 13 for transporting ions while converging are arranged in the first intermediate vacuum chamber 3 and the second intermediate vacuum chamber 4, respectively.
  • a quadrupole mass filter 15 and an ion detector 16 for separating ions according to a mass-to-charge ratio m / z are arranged in the analysis chamber 5.
  • the ionization chamber 2 and the first intermediate vacuum chamber 3 communicate with each other through a small-diameter heating capillary 10. Further, the first intermediate vacuum chamber 3 and the second intermediate vacuum chamber 4 communicate with each other through an ion passage hole formed at the top of the skimmer 12. Further, the second intermediate vacuum chamber 4 and the analysis chamber 5 communicate with each other through the ion passage opening 14.
  • the inside of the ionization chamber 2 has a substantially atmospheric pressure atmosphere.
  • the inside of the analysis chamber 5 is evacuated to a high vacuum state of, for example, about 10-3 to 10-4 Pa by a high-performance vacuum pump (not shown).
  • the first intermediate vacuum chamber 3 and the second intermediate vacuum chamber 4 sandwiched between the ionization chamber 2 and the analysis chamber 5 are also evacuated by a vacuum pump, respectively, and the degree of vacuum is gradually increased. It is composed.
  • the analysis operation in the mass spectrometer of this embodiment will be briefly described.
  • the liquid sample to be analyzed is introduced into the liquid sample supply tube 7 of the ionization probe 60 for ESI.
  • the liquid sample supply pipe 7 has, for example, a configuration in which two capillaries are connected by a conductive flow path connecting jig, and a predetermined voltage (ESI voltage) is applied to the flow path connecting jig. This charges the liquid sample.
  • nebulizer gas atomization promoting gas
  • the assist gas which is a heating gas, is supplied to the charged droplets sprayed into the ionization chamber 2, so that the mobile phase (solvent) is desolved from the charged droplets and the substance in the sample is ionized.
  • the ions generated in the ionization chamber 2 are drawn into the heating capillary 10 by the pressure difference between the ionization chamber 2 and the first intermediate vacuum chamber 3. While passing through the heated capillary 10, desolvation proceeds further, and the generation of ions is promoted.
  • the ions introduced into the first intermediate vacuum chamber 3 through the heating capillary 10 are converged by the action of the electric field formed by the ion guide 11, and pass through the ion passage holes at the top of the skimmer 12 into the second intermediate vacuum chamber 4. be introduced.
  • the ions are converged by the action of the electric field formed by the ion guide 13 in the second intermediate vacuum chamber 4 and sent to the analysis chamber 5 through the ion passage opening 14.
  • only ions having a specific mass-to-charge ratio pass through the space in the long axis direction of the quadrupole mass filter 15 and reach the ion detector 16 to be detected.
  • the mass-to-charge ratio of ions passing through the quadrupole mass filter 15 depends on the DC voltage and high-frequency voltage applied to the filter 15, for example, by scanning the applied voltage, the ions incident on the ion detector 16 The mass-to-charge ratio of can be scanned over a predetermined range.
  • FIG. 2 is a schematic cross-sectional view showing the internal structure of the tip of the ionization probe 60 for ESI shown in FIG.
  • FIG. 3 is a schematic view of a cross section of the tip of the ionization probe 60 for ESI (a cross section orthogonal to the direction in which the liquid sample flows).
  • the heat transfer member 64 is not shown in order to show the assist gas flow path 61 in an easy-to-understand manner.
  • the nozzle 65 for spraying the liquid sample has a capillary 66 through which the liquid sample flows, and a nebulizer gas pipe 67 provided coaxially with the capillary 66 on the outer periphery thereof.
  • the space between the outer circumference of the capillary 66 and the inner circumference of the nebulizer gas pipe 67 serves as a nebulizer gas flow path through which the nebulizer gas flows.
  • a conductive member (not shown) is arranged on the upstream side of the capillary 66 shown in FIG. 2, and an ESI voltage is applied to the conductive member to apply an electric charge to the liquid sample.
  • an assist gas nozzle 63 is arranged coaxially with the capillary 66 and the nebulizer gas pipe 67.
  • the tip of the assist gas nozzle 63 is processed into a tapered shape.
  • the assist gas is supplied from the assist gas ejection hole 631 opened in a ring shape so as to surround the outside of the jet of the charged droplet of the liquid sample ejected from the nozzle 65.
  • An annular housing 68 is provided around the assist gas nozzle 63.
  • An assist gas flow path 61 is formed inside the housing 68.
  • a gas introduction port 611 is formed at one location of the assist gas flow path 61, and a gas outlet 612 communicating with the assist gas nozzle 63 is formed on the side opposite to the gas introduction port 611 with the center O of the housing 68 interposed therebetween. ..
  • a substantially annular heater 62 that covers almost the entire circumference thereof and a heat transfer member 64 are arranged.
  • a stainless steel (SUS) mesh is formed into a shape that matches the space between the assist gas flow path 61 and the heater 62, or the space inside the heater 62.
  • the molded one is used.
  • the upper left of FIG. 4 is a plan view of the heat transfer member 64 arranged inside the heater 62, and the lower left is a side view of the heat transfer member 64.
  • the heat transfer member 64 shown on the right side of FIG. 4 is a perspective view of the heat transfer member 64 arranged between the inner wall surface of the assist gas flow path 61 and the heater 62.
  • FIG. 5 shows the arrangement of the heat transfer member 64 inside the assist gas flow path 61 on the left side in FIG. 2
  • FIG. 6 shows the arrangement of the heat transfer member 64 inside the assist gas flow path 61 on the right side in FIG. .
  • the heat transfer member 64 is arranged in contact with the heater 62 so as to fill the space between the inner wall surface of the assist gas flow path 61 and the heater 62.
  • the heat transfer member 64 is also arranged inside the annular heater 62. Inside the heater 62, a heat transfer member 64 shown on the left side of FIG. 4 is folded back and formed into a U shape.
  • the inside of the assist gas flow path 61 is heated by the heater 62 and the heat transfer member 64 to which the heat from the heater 62 is transferred.
  • the heat transfer member 64 arranged in the space between the inner wall of the assist gas flow path 61 and the heater 62 has an L-shaped or linear cross section, but the one having a circular cross section is used. It can be changed as appropriate, such as by using it. Further, in FIGS. 5 and 6, the heat transfer member 64 arranged inside the heater 62 has a U-shaped cross section, but the heat transfer member 64 having a circular cross section can be appropriately changed. Further, the heat transfer member 64 may be partially in contact with the heater 62, and the arrangement of the heat transfer member 64 is not limited to that shown in FIGS. 5 and 6.
  • the heat transfer member 64 since a SUS mesh that is easily deformed is used as the heat transfer member 64, it can be arranged without a gap corresponding to the shape of the assist gas flow path 61 and the shape of the heater 62. Further, since the mesh-shaped heat transfer member 64 has a large number of holes, it does not interfere with the flow of the assist gas.
  • the configuration of the heater 62 will be described with reference to FIGS. 7 to 10.
  • the heater 62 of this embodiment is a microsheath heater, and by winding both wings of one heater wire 620 processed into a substantially Y shape as shown in FIG. 7, as shown in FIG. It is molded into a coil to form two heating portions 621 and 622 as shown in FIG. Then, as shown in FIG. 10, each heating portion 621 and 622 is curved in a substantially semicircular ring shape, and the ends of both heating portions 621 and 622 are abutted against each other to form two heating portions 621 having a substantially semicircular ring shape. , 622 to complete the heater 62.
  • the two heating units 621 and 622 each have two heater wires 620 that flow in opposite directions are integrally wound and spirally wound, and the outside thereof is covered with an insulating material. Therefore, the directions of the magnetic fluxes induced by the currents flowing through the two heater wires 620 that are in close contact with each other are exactly opposite directions and cancel each other out. Therefore, even if a heating current is passed through the heating units 621 and 622, the influence of the magnetic field induced by the heating current does not occur. Moreover, since it is covered with an insulating material, it can be used safely without worrying about electric leakage.
  • the assist gas is introduced into the assist gas flow path 61 from the gas introduction port 611.
  • the direction in which the assist gas flows from the gas introduction port 611 toward the assist gas flow path 61 is substantially orthogonal to the assist gas flow path 61.
  • the gas flow path from the gas introduction port 611 to the gas outlet port 612 has two paths, that is, an upper semicircular flow path and a lower semicircular flow path in FIG. Since the flow path resistances are almost equal, the assist gas flows in the upper and lower paths in half.
  • the assist gas flowing in the two paths is heated by the heater 62 and the heat transfer member 64, respectively, merges in front of the gas outlet 612, and flows into the assist gas nozzle 63.
  • the heating portions 621 and 622 have substantially the same shape, and heat transfer members 64 having the same degree are arranged in the two paths.
  • the amount of assist gas flowing through the two paths is about the same, and the gas passing through both paths is heated to about the same temperature. Therefore, the temperature of the assist gas is less likely to be uneven, and the high temperature assist gas is stably supplied.
  • the assist gas that has flowed into the assist gas flow path 61 from the gas introduction port 611 is heated as it advances toward the gas outlet port 612, so that the temperature of the assist gas near the gas introduction port 611 is low and the gas conduction The temperature of the assist gas near the outlet 612 is high. Since the assist gas nozzle 63 is provided at a position far from the gas introduction port 611 and conversely close to the gas outlet port 612, the assist gas heated to a high temperature by the heater 62 is hardly cooled, and the assist gas nozzle 63 is hardly cooled. And ejects from the assist gas ejection hole 631.
  • the assist gas nozzle 63 is located away from the assist gas flow path 61 near the gas introduction port 611 in which the assist gas having a relatively low temperature exists, the assist gas nozzle 63 itself is not easily cooled. Therefore, the heat from the heater 62 and the heat transfer member 64 can be utilized without waste, and a stable high-temperature assist gas can be ejected from the assist gas ejection hole 631.
  • the heater 62 is arranged in the assist gas flow path 61, and most of the assist gas flowing in the assist gas flow path 61 is discharged without contacting the heater 62. Therefore, even if a microsheath heater capable of heating up to about 600 ° C. was used, the temperature of the assist gas actually supplied remained at 400 to 500 ° C.
  • the heat transfer member 64 is arranged in addition to the heater 62 in the assist gas flow path 61, and the assist gas and the heat source (heater 62 and the heat transfer member 64) flowing through the assist gas flow path 61 are arranged.
  • the contact area of is larger than before.
  • the assist gas is heated with higher efficiency, and the assist gas having a higher temperature than the conventional one can be supplied.
  • the heater 62 itself may be the same as the conventional one, and the ionization apparatus can be configured at low cost.
  • Figure 11 shows the experimental results.
  • the assist gas becomes faster and higher in temperature (about 50 when 15 minutes have passed after the start of heating). It was heated (to a high temperature of ° C).
  • the heating temperature of the assist gas was kept at 450 ° C, but it is considered that the assist gas can be heated to a temperature exceeding 500 ° C by supplying electric power of the same magnitude as before.
  • the above embodiment is an example and can be appropriately modified according to the gist of the present invention.
  • the case of using the ionization probe 60 for ESI has been described, but the ionization probe for atmospheric pressure chemical ionization (APCI) and the ionization for atmospheric pressure photo ionization (APPI: Atmospheric Pressure Photo Ionization) have been described. It can also be used in combination with other ionization probes such as probes.
  • APCI atmospheric pressure chemical ionization
  • APPI Atmospheric Pressure Photo Ionization
  • the heat transfer member 64 is arranged both between the assist gas flow path 61 and the heater 62 and inside the heater 62, but it may be arranged in only one of them.
  • the heating efficiency can be sufficiently improved even if the heat transfer member 64 is arranged only inside the heater 62.
  • the ionization device is Ionization room and A sample nozzle that allows a liquid sample to flow out into the ionization chamber, An assist gas flow path that supplies an assist gas that promotes desolvation of the liquid sample to the ionization chamber, A heater arranged inside the assist gas flow path and A heat transfer member arranged in contact with the heater is provided inside the assist gas flow path.
  • an assist gas that promotes desolvation of the liquid sample is supplied to the liquid sample flowing out from the sample nozzle.
  • a heat transfer member is arranged in contact with the heater in the assist gas flow path through which the assist gas flows.
  • the conventional ionization device only the heater is arranged in the assist gas flow path, and most of the assist gas flowing in the assist gas flow path is discharged without contacting the heater.
  • the heat transfer member is arranged in addition to the heater, the contact area between the assist gas flowing through the assist gas flow path and the heat source (heater and heat transfer member) is larger than that in the conventional case. The size becomes larger, the assist gas is heated with higher efficiency, and the assist gas having a higher temperature than the conventional one can be supplied.
  • the heater itself may be the same as the conventional one, and the ionization apparatus can be configured at low cost.
  • the sample nozzle sprays the liquid sample into the ionization chamber with an atomization promoting gas.
  • the assist gas is supplied in a direction that pushes out a jet of the liquid sample ejected from the sample nozzle.
  • the ionization apparatus described in item 2 can promote the desolvation of the jet of the liquid sample sprayed into the ionization chamber by the atomization promoting gas.
  • the heat transfer member has a mesh shape.
  • the ionization device of the third item uses a mesh-shaped heat transfer member that is easily deformed, it can be arranged without gaps according to the shape of the assist gas flow path. Further, since the mesh-shaped heat transfer member has a large number of holes, it does not interfere with the flow of the assist gas.
  • the ionizing device according to item 4 is the ionizing device according to any one of items 1 to 3.
  • the heat transfer member is arranged between the inner wall of the assist gas flow path and the heater.
  • the assist gas flowing between the inner wall of the assist gas flow path and the heater can be efficiently heated.
  • the ionizing device according to item 5 is the ionizing device according to any one of items 1 to 4.
  • the heater is a spirally wound heater wire.
  • the inside of the assist gas flow path can be uniformly heated by the heater.
  • the ionizing device of the sixth item is the ionizing device of the fifth item.
  • the heat transfer member is arranged inside a heater in which the heater wire is spirally wound.
  • the assist gas flowing inside the spirally wound heater can be efficiently heated.
  • the ionizing device according to item 7 is the ionizing device according to item 5 or 6.
  • the heater wire is covered with an insulating material.
  • the ionizer of item 7 can be used safely because the heater wire is insulated. In addition, the durability of the heater wire is improved.
  • the mass spectrometer of item 8 is The ionizing device according to any one of items 1 to 7 and the ionizing device. It is provided with a mass spectrometer for mass spectrometry of ions generated by the ionization apparatus.
  • the ionizing apparatus according to items 1 to 7 can be suitably used as an ionizing portion of the mass spectrometer.

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Sampling And Sample Adjustment (AREA)
PCT/JP2020/017638 2020-04-24 2020-04-24 イオン化装置及び質量分析装置 Ceased WO2021214964A1 (ja)

Priority Applications (4)

Application Number Priority Date Filing Date Title
US17/919,951 US12476096B2 (en) 2020-04-24 2020-04-24 Ionizer and mass spectrometer
CN202080099032.5A CN115335960B (zh) 2020-04-24 2020-04-24 离子化装置以及质量分析装置
JP2022516784A JP7306575B2 (ja) 2020-04-24 2020-04-24 イオン化装置及び質量分析装置
PCT/JP2020/017638 WO2021214964A1 (ja) 2020-04-24 2020-04-24 イオン化装置及び質量分析装置

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Application Number Priority Date Filing Date Title
PCT/JP2020/017638 WO2021214964A1 (ja) 2020-04-24 2020-04-24 イオン化装置及び質量分析装置

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EP2688087A2 (en) * 2012-07-16 2014-01-22 Bruker Daltonics, Inc. Assembly for an electrospray ion source
JP2015049077A (ja) * 2013-08-30 2015-03-16 株式会社島津製作所 イオン化プローブ
US20160086784A1 (en) * 2014-09-18 2016-03-24 Bruker Daltonik Gmbh Ionization chamber with temperature-controlled gas feed

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US5360976A (en) * 1992-08-25 1994-11-01 Southwest Research Institute Time of flight mass spectrometer, ion source, and methods of preparing a sample for mass analysis and of mass analyzing a sample
JP3310171B2 (ja) * 1996-07-17 2002-07-29 松下電器産業株式会社 プラズマ処理装置
US5756995A (en) * 1997-07-09 1998-05-26 The United States Of America As Represented By The Secretary Of The Army Ion interface for mass spectrometer
JP2000162185A (ja) * 1998-11-25 2000-06-16 Jeol Ltd ガスクロマトグラフ質量分析装置
JP4151592B2 (ja) * 2004-03-10 2008-09-17 株式会社島津製作所 質量分析装置
US7199364B2 (en) 2004-05-21 2007-04-03 Thermo Finnigan Llc Electrospray ion source apparatus
JP2011113832A (ja) 2009-11-27 2011-06-09 Shimadzu Corp 質量分析装置
CN105845540A (zh) * 2016-03-28 2016-08-10 复旦大学 一种通过加热去溶剂化和离子化的方法与装置
EP3550586A1 (en) * 2016-11-29 2019-10-09 Shimadzu Corporation Ionizer and mass spectrometer
JP7032286B2 (ja) * 2018-11-08 2022-03-08 株式会社日立ハイテク イオン源
US11056330B2 (en) * 2018-12-21 2021-07-06 Thermo Finnigan Llc Apparatus and system for active heat transfer management in ESI ion sources

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2688087A2 (en) * 2012-07-16 2014-01-22 Bruker Daltonics, Inc. Assembly for an electrospray ion source
JP2015049077A (ja) * 2013-08-30 2015-03-16 株式会社島津製作所 イオン化プローブ
US20160086784A1 (en) * 2014-09-18 2016-03-24 Bruker Daltonik Gmbh Ionization chamber with temperature-controlled gas feed

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US20230162961A1 (en) 2023-05-25
JPWO2021214964A1 (https=) 2021-10-28
CN115335960B (zh) 2025-09-05
CN115335960A (zh) 2022-11-11
US12476096B2 (en) 2025-11-18

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