JP7306575B2 - イオン化装置及び質量分析装置 - Google Patents

イオン化装置及び質量分析装置 Download PDF

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Publication number
JP7306575B2
JP7306575B2 JP2022516784A JP2022516784A JP7306575B2 JP 7306575 B2 JP7306575 B2 JP 7306575B2 JP 2022516784 A JP2022516784 A JP 2022516784A JP 2022516784 A JP2022516784 A JP 2022516784A JP 7306575 B2 JP7306575 B2 JP 7306575B2
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Japan
Prior art keywords
assist gas
heater
ionization
heat transfer
transfer member
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JP2022516784A
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English (en)
Japanese (ja)
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JPWO2021214964A5 (https=
JPWO2021214964A1 (https=
Inventor
陽平 藤次
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Shimadzu Corp
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Shimadzu Corp
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Publication of JPWO2021214964A5 publication Critical patent/JPWO2021214964A5/ja
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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H01J49/167—Capillaries and nozzles specially adapted therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Sampling And Sample Adjustment (AREA)
JP2022516784A 2020-04-24 2020-04-24 イオン化装置及び質量分析装置 Active JP7306575B2 (ja)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/017638 WO2021214964A1 (ja) 2020-04-24 2020-04-24 イオン化装置及び質量分析装置

Publications (3)

Publication Number Publication Date
JPWO2021214964A1 JPWO2021214964A1 (https=) 2021-10-28
JPWO2021214964A5 JPWO2021214964A5 (https=) 2022-10-14
JP7306575B2 true JP7306575B2 (ja) 2023-07-11

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ID=78270663

Family Applications (1)

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JP2022516784A Active JP7306575B2 (ja) 2020-04-24 2020-04-24 イオン化装置及び質量分析装置

Country Status (4)

Country Link
US (1) US12476096B2 (https=)
JP (1) JP7306575B2 (https=)
CN (1) CN115335960B (https=)
WO (1) WO2021214964A1 (https=)

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2688087A2 (en) 2012-07-16 2014-01-22 Bruker Daltonics, Inc. Assembly for an electrospray ion source
JP2015049077A (ja) 2013-08-30 2015-03-16 株式会社島津製作所 イオン化プローブ
US20160086784A1 (en) 2014-09-18 2016-03-24 Bruker Daltonik Gmbh Ionization chamber with temperature-controlled gas feed

Family Cites Families (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5360976A (en) * 1992-08-25 1994-11-01 Southwest Research Institute Time of flight mass spectrometer, ion source, and methods of preparing a sample for mass analysis and of mass analyzing a sample
JP3310171B2 (ja) * 1996-07-17 2002-07-29 松下電器産業株式会社 プラズマ処理装置
US5756995A (en) * 1997-07-09 1998-05-26 The United States Of America As Represented By The Secretary Of The Army Ion interface for mass spectrometer
JP2000162185A (ja) * 1998-11-25 2000-06-16 Jeol Ltd ガスクロマトグラフ質量分析装置
JP4151592B2 (ja) * 2004-03-10 2008-09-17 株式会社島津製作所 質量分析装置
US7199364B2 (en) 2004-05-21 2007-04-03 Thermo Finnigan Llc Electrospray ion source apparatus
JP2011113832A (ja) 2009-11-27 2011-06-09 Shimadzu Corp 質量分析装置
CN105845540A (zh) * 2016-03-28 2016-08-10 复旦大学 一种通过加热去溶剂化和离子化的方法与装置
EP3550586A1 (en) * 2016-11-29 2019-10-09 Shimadzu Corporation Ionizer and mass spectrometer
JP7032286B2 (ja) * 2018-11-08 2022-03-08 株式会社日立ハイテク イオン源
US11056330B2 (en) * 2018-12-21 2021-07-06 Thermo Finnigan Llc Apparatus and system for active heat transfer management in ESI ion sources

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2688087A2 (en) 2012-07-16 2014-01-22 Bruker Daltonics, Inc. Assembly for an electrospray ion source
JP2015049077A (ja) 2013-08-30 2015-03-16 株式会社島津製作所 イオン化プローブ
US20160086784A1 (en) 2014-09-18 2016-03-24 Bruker Daltonik Gmbh Ionization chamber with temperature-controlled gas feed

Also Published As

Publication number Publication date
WO2021214964A1 (ja) 2021-10-28
US20230162961A1 (en) 2023-05-25
JPWO2021214964A1 (https=) 2021-10-28
CN115335960B (zh) 2025-09-05
CN115335960A (zh) 2022-11-11
US12476096B2 (en) 2025-11-18

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