CN115335960B - 离子化装置以及质量分析装置 - Google Patents

离子化装置以及质量分析装置

Info

Publication number
CN115335960B
CN115335960B CN202080099032.5A CN202080099032A CN115335960B CN 115335960 B CN115335960 B CN 115335960B CN 202080099032 A CN202080099032 A CN 202080099032A CN 115335960 B CN115335960 B CN 115335960B
Authority
CN
China
Prior art keywords
heater
flow path
ionization
assist gas
heat transfer
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Active
Application number
CN202080099032.5A
Other languages
English (en)
Chinese (zh)
Other versions
CN115335960A (zh
Inventor
藤次阳平
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shimadzu Corp
Original Assignee
Shimadzu Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shimadzu Corp filed Critical Shimadzu Corp
Publication of CN115335960A publication Critical patent/CN115335960A/zh
Application granted granted Critical
Publication of CN115335960B publication Critical patent/CN115335960B/zh
Active legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/0445—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol
    • H01J49/045—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for introducing as a spray, a jet or an aerosol with means for using a nebulising gas, i.e. pneumatically assisted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0468—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components with means for heating or cooling the sample
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/10—Ion sources; Ion guns
    • H01J49/16—Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165—Electrospray ionisation
    • H01J49/167—Capillaries and nozzles specially adapted therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00—Particle spectrometers or separator tubes
    • H01J49/02—Details
    • H01J49/04—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components
    • H01J49/0431—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples
    • H01J49/044—Arrangements for introducing or extracting samples to be analysed, e.g. vacuum locks; Arrangements for external adjustment of electron- or ion-optical components for liquid samples with means for preventing droplets from entering the analyzer; Desolvation of droplets

Landscapes

  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Dispersion Chemistry (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
  • Electron Tubes For Measurement (AREA)
  • Sampling And Sample Adjustment (AREA)
CN202080099032.5A 2020-04-24 2020-04-24 离子化装置以及质量分析装置 Active CN115335960B (zh)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2020/017638 WO2021214964A1 (ja) 2020-04-24 2020-04-24 イオン化装置及び質量分析装置

Publications (2)

Publication Number Publication Date
CN115335960A CN115335960A (zh) 2022-11-11
CN115335960B true CN115335960B (zh) 2025-09-05

Family

ID=78270663

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202080099032.5A Active CN115335960B (zh) 2020-04-24 2020-04-24 离子化装置以及质量分析装置

Country Status (4)

Country Link
US (1) US12476096B2 (https=)
JP (1) JP7306575B2 (https=)
CN (1) CN115335960B (https=)
WO (1) WO2021214964A1 (https=)

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5360976A (en) * 1992-08-25 1994-11-01 Southwest Research Institute Time of flight mass spectrometer, ion source, and methods of preparing a sample for mass analysis and of mass analyzing a sample
JP3310171B2 (ja) * 1996-07-17 2002-07-29 松下電器産業株式会社 プラズマ処理装置
US5756995A (en) * 1997-07-09 1998-05-26 The United States Of America As Represented By The Secretary Of The Army Ion interface for mass spectrometer
JP2000162185A (ja) * 1998-11-25 2000-06-16 Jeol Ltd ガスクロマトグラフ質量分析装置
JP4151592B2 (ja) * 2004-03-10 2008-09-17 株式会社島津製作所 質量分析装置
US7199364B2 (en) 2004-05-21 2007-04-03 Thermo Finnigan Llc Electrospray ion source apparatus
JP2011113832A (ja) 2009-11-27 2011-06-09 Shimadzu Corp 質量分析装置
US8772709B2 (en) * 2012-07-16 2014-07-08 Bruker Daltonics, Inc. Assembly for an electrospray ion source
JP6136773B2 (ja) 2013-08-30 2017-05-31 株式会社島津製作所 イオン化プローブ
DE102014113482B4 (de) 2014-09-18 2019-01-03 Bruker Daltonik Gmbh Ionisierungskammer mit temperierter Gaszufuhr
CN105845540A (zh) * 2016-03-28 2016-08-10 复旦大学 一种通过加热去溶剂化和离子化的方法与装置
EP3550586A1 (en) * 2016-11-29 2019-10-09 Shimadzu Corporation Ionizer and mass spectrometer
JP7032286B2 (ja) * 2018-11-08 2022-03-08 株式会社日立ハイテク イオン源
US11056330B2 (en) * 2018-12-21 2021-07-06 Thermo Finnigan Llc Apparatus and system for active heat transfer management in ESI ion sources

Also Published As

Publication number Publication date
WO2021214964A1 (ja) 2021-10-28
JP7306575B2 (ja) 2023-07-11
US20230162961A1 (en) 2023-05-25
JPWO2021214964A1 (https=) 2021-10-28
CN115335960A (zh) 2022-11-11
US12476096B2 (en) 2025-11-18

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