WO2021120274A1 - 探针检测装置及面板点亮测试装置 - Google Patents

探针检测装置及面板点亮测试装置 Download PDF

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Publication number
WO2021120274A1
WO2021120274A1 PCT/CN2019/128697 CN2019128697W WO2021120274A1 WO 2021120274 A1 WO2021120274 A1 WO 2021120274A1 CN 2019128697 W CN2019128697 W CN 2019128697W WO 2021120274 A1 WO2021120274 A1 WO 2021120274A1
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Prior art keywords
detection
probe
key
resistor
electrically connected
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PCT/CN2019/128697
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English (en)
French (fr)
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骆尧明
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深圳市华星光电半导体显示技术有限公司
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Application filed by 深圳市华星光电半导体显示技术有限公司 filed Critical 深圳市华星光电半导体显示技术有限公司
Priority to US16/627,771 priority Critical patent/US20210190824A1/en
Publication of WO2021120274A1 publication Critical patent/WO2021120274A1/zh

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Definitions

  • the present invention relates to the technical field of panel lighting test, in particular to a probe detection device and a panel lighting test device.
  • the test method is to use a pin to touch the test point of the panel using a shorting probe (Shorting). bar) to light up the panel and observe whether the panel has defects.
  • Shorting shorting probe
  • FIG. 1 is a schematic structural diagram of a panel lighting test device 90 for performing the first lighting test on a semi-finished panel 95.
  • the panel lighting test device 90 includes a signal generator 91, a signal transfer board 92, and a signal
  • the expansion board 93 has a plurality of probes 94 connected to the signal expansion board 93.
  • the signal transfer board 92 is electrically connected to the signal generator 91, receives the signal generated by the signal generator 91 and transfers the received signal, separates the data data interface and the scan data interface, and connects to the signal expansion board 93 for signal expansion
  • the board 93 converts the voltage signal generated by the data data interface into multiple parallel outputs through the probe 94, and each path is connected to the test point of the corresponding semi-finished panel 95 through the probe 94, and the signals in each path are consistent.
  • TEG Test Key TEG Test Key
  • the current value can be obtained by dividing the voltage value by the resistance value. That is, the current value change curve of the array substrate can be detected, and the uniformity and other characteristics of the semi-finished panel can be obtained through comparison and analysis, and then the quality of the semi-finished panel can be understood.
  • the parallelism between the probe and the panel is not up to standard, resulting in inconsistent contact resistance on the left and right sides of the panel, resulting in an abnormal picture.
  • increasing the probe pressure can solve the problem. When the pressure is too large, the panel may be pierced;
  • the GOA probe test fixture is small in size and the probes are dense, and the probe breaks during the test, causing an abnormal picture
  • the signal from the image signal generator needs to pass through three or four sets of signal interfaces to the probe. If the signal interface is not plugged in well or the connector is oxidized, it will cause extremely high contact resistance and cause abnormal images.
  • the probe touches the panel, and visually observes the pressing amount of the probe and the panel;
  • the probe does not touch the panel, and observe the fracture and deformation of the probe with naked eyes;
  • the observation space is narrow, the visual observation is not accurate, it takes a long time to enter the machine for repeated inspections, and the signal interface is easily damaged when it is plugged and unplugged multiple times.
  • This kind of visual method cannot directly detect the needle resistance, and can only infer that the needle resistance is too high through the broken or deformed phenomenon of the probe; if the abnormality cannot be found by visual inspection, remove the probe unit and measure the resistance with a multimeter.
  • the present invention provides a probe detection device, which includes a jig board having a detection end, and the detection end is provided with a data data detection area and a scan data detection area.
  • the data detection area includes a plurality of first detection keys, a plurality of first probe holes, and a plurality of first resistors; the plurality of first detection keys are arranged in a row on the detection end; The first probe holes are arranged in a row on the side surface of the detection end, respectively corresponding to each first detection key, and the bottom of the hole exposes the first detection key; the plurality of first resistors are arranged in a row with the The first detection keys are arranged in one-to-one correspondence, one end of each first resistor is electrically connected to each corresponding first detection key, and the other ends of the plurality of first resistors are electrically connected to each other.
  • the scan data detection area includes two second detection keys, two second probe holes, and two second resistors; the two second detection keys are respectively located at two ends of the data detection area; The two second probe holes are provided on the side surface of the detection end, respectively corresponding to each second detection key, and the bottom of the hole exposes the second detection key; the two second resistors are respectively connected to the The second detection keys are correspondingly arranged, one end of each second resistor is electrically connected to each corresponding second detection key, and the other ends of the two second resistors are electrically connected to each other.
  • first detection key and the second detection key are arranged in a row; and/or, the first resistance and the second resistance are arranged in a row.
  • the material of the first detection key and/or the second detection key includes copper.
  • first detection key and/or the second detection key are arranged inside the detection terminal.
  • the resistance value of the first resistor and/or the second resistor is 100 ⁇ .
  • first resistor and/or the second resistor are arranged inside the detection terminal.
  • the material of the jig plate includes any one of polyethylene, polypropylene or polyvinyl chloride.
  • the present invention also provides a panel lighting test device, which includes the above-mentioned probe detection device.
  • the panel lighting test device further includes a signal generator, a signal adapter board, and a signal expansion board; specifically, the signal generator is used to generate an impedance detection signal; the signal adapter board and the signal The generator is electrically connected to receive the impedance detection signal and perform switching. It separates a data data interface and a scan data interface; the scan data interface is connected with a probe, and the probe passes through the The first probe hole is electrically connected to the second detection key; the signal expansion board is electrically connected to the data data interface; a plurality of probes are connected to the signal expansion board, and the probes pass through The second probe hole is electrically connected to the first detection key.
  • the shape and size of the jig board are the same as the shape and size of the semi-finished panel detected by the panel lighting test device.
  • the beneficial effect of the present invention is to provide a probe detection device and its panel lighting test device.
  • a probe detection device By setting up a dedicated probe detection device, it can solve the problem that the prior art cannot accurately detect whether the probe is normal and affect the panel lighting test.
  • the technical problem does not require repeated insertion and removal of the probe and removal of the probe, and the resistance of the probe can be detected quickly and accurately, so as to determine whether it is abnormal and ensure the accuracy of the panel lighting test.
  • FIG. 1 is a schematic diagram of the structure of a conventional panel lighting test device
  • FIG. 2 is a schematic diagram of the structure of a probe detection device in an embodiment of the present invention.
  • FIG. 3 is a schematic structural diagram of a panel lighting test device in an embodiment of the present invention.
  • the first detection key 12.
  • the first probe hole 13.
  • the first resistance 14.
  • first and second are only used for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of indicated technical features. Therefore, the features defined with “first” and “second” may explicitly or implicitly include one or more of the features. In the description of the present application, “multiple” means two or more than two, unless otherwise specifically defined.
  • connection should be understood in a broad sense, unless otherwise clearly specified and limited.
  • it can be a fixed connection or a detachable connection.
  • Connected or integrally connected it can be mechanically connected, or electrically connected or can communicate with each other; it can be directly connected or indirectly connected through an intermediate medium, it can be the internal communication of two components or the interaction of two components relationship.
  • connection should be understood according to specific circumstances.
  • the "on" or “under” of the first feature of the second feature may include direct contact between the first and second features, or may include the first and second features Not in direct contact but through other features between them.
  • the "above”, “above” and “above” of the first feature on the second feature include the first feature directly above and obliquely above the second feature, or it simply means that the first feature is higher in level than the second feature.
  • the “below”, “below” and “below” of the second feature of the first feature include the first feature directly below and obliquely below the second feature, or it simply means that the level of the first feature is smaller than the second feature.
  • a probe detection device 10 which includes a jig board 101, the jig board 101 has a detection end 102, and the detection end 102 is provided with Data data detection area 1 and scan data detection area 2.
  • the data detection area 1 includes a plurality of first detection keys 11, a plurality of first probe holes 12, and a plurality of first resistors 13; the plurality of first detection keys 11 are arranged in a row at the detection end 102; The plurality of first probe holes 12 are arranged in a row on the side surface of the detection end 102, respectively corresponding to each first detection key 11, and the bottom of the hole exposes the first detection key 11; The plurality of first resistors 13 are arranged in a row in a one-to-one correspondence with the first detection keys 11, and one end of each first resistor 13 is electrically connected to each first detection key 11 provided correspondingly. The other end of a resistor 13 is electrically connected to each other; wherein, there are preferably 13 first detection keys 11, first probe holes 12, and first resistors 13.
  • the scan data detection area 2 includes two second detection keys 21, two second probe holes 22, and two second resistors 23; the two second detection keys 21 are respectively located in the data data detection area 1; the two second probe holes 22 are provided on the side surface of the detection end 102, respectively corresponding to each second detection key 21, and the bottom of the hole exposes the second detection key 21, It is convenient for an external probe to be electrically connected to the second detection key 21; the two second resistors 23 are respectively arranged corresponding to the second detection key 21, and one end of each second resistor 23 is corresponding to each The second detection key 21 is electrically connected, and the other ends of the two second resistors 23 are electrically connected to each other.
  • the first detection key 11 and the second detection key 21 are arranged in a row; and/or, the first resistor 13 and the second resistor 23 are arranged in a row.
  • the material of the first detection key 11 and/or the second detection key 21 includes copper, which has good electrical conductivity.
  • the first detection key 11 and/or the second detection key 21 are provided inside the detection terminal 102.
  • the resistance value of the first resistor 13 and/or the second resistor 23 is 100 ⁇ .
  • the first resistor 13 and/or the second resistor 23 are provided inside the detection terminal 102.
  • the material of the jig plate 101 includes any one of polyethylene, polypropylene or polyvinyl chloride. It is understandable that the jig plate 101 is made of plastic or hard plastic material, which is portable and easy to take.
  • the dedicated probe detection device 10 can solve the technical problem in the prior art that cannot accurately detect whether the probe is normal and affects the panel lighting test. There is no need to repeatedly insert and remove the probe and remove the probe. Quickly and accurately detect the resistance of the probe to determine whether it is abnormal and ensure the accuracy of the panel lighting test.
  • the present invention also provides a panel lighting test device 100, which includes the above-mentioned probe detection device 10.
  • the panel lighting test device 100 is used to detect whether the probe and the connection circuit are normal.
  • the panel lighting test device 100 further includes a signal generator 20, a signal transfer board 30, and a signal expansion board 40; specifically, the signal generator 20 is used to generate an impedance detection signal;
  • the signal transfer board 30 is electrically connected to the signal generator 20, and is used to receive the impedance detection signal and perform transfer. It separates a data data interface 31 and a scan data interface 32; the scan data interface 32 A probe 50 is connected, and the probe 50 passes through the first probe hole 12 and is electrically connected to the second detection key 21; the signal expansion board 40 is electrically connected to the data interface 31;
  • a plurality of probes 50 are connected to the signal expansion board 40, and the probes 50 pass through the second probe hole 22 and are electrically connected to the first detection key 11.
  • the signal expansion board 40 includes a first signal expansion board 41 and a second signal expansion board 42, the number of probes 50 of the first signal expansion board 41 is preferably seven, and the second signal expansion board 42 has The number of probes 50 is preferably six.
  • the shape and size of the jig board 101 are the same as the shape and size of the semi-finished panel detected by the panel lighting test device 100, so that the jig board 101 can be perfectly clamped to the The panel lights up the panel detection area of the testing device 100.
  • the signal generator is set to impedance detection, and the impedance detection is set to Set a special model, and test the resistance value of a set of probes 50 or a set of probes 50 under the condition that the probe 50 is in normal condition, press-in amount, and wiring.
  • the detected resistance value can be directly displayed on the signal generator 20.
  • the probe impedance detection is performed by the panel lighting test device 100, which can quantify the data of the needle sticking condition, greatly increase the abnormality processing speed, and reduce the loss of accessories. Improve the stability and effectiveness of the lighting detection system, reduce the proportion of screen abnormalities in the detection, and prevent personnel from repeatedly plugging and plugging the interface and causing component damage.
  • the beneficial effect of the present invention is to provide a probe detection device 10 and its panel lighting test device 100.
  • a dedicated probe detection device 10 it can solve the problem that the prior art cannot accurately detect whether the probe is normal and affect the panel.
  • the technical problem of the lighting test does not need to repeatedly insert and remove the probe and remove the probe.
  • the resistance of the probe can be quickly and accurately detected, thereby judging whether it is abnormal, and ensuring the accuracy of the panel lighting test.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

一种探针检测装置（10）及面板点亮测试装置（100），其中面板点亮测试装置（100）包括探针检测装置（10），探针检测装置（10）包括治具板（101），治具板具有一检测端（102），检测端（102）设有资料数据检测区（1）和扫描数据检测区（2）。在资料数据检测区（1）包括多个第一检测键（11）、多个第一探针孔（12）以及多个第一电阻（13）；在扫描数据检测区（2）包括两个第二检测键（21）、两个第二探针孔（22）以及两个第二电阻（23）。

Description

探针检测装置及面板点亮测试装置 技术领域
本发明涉及面板点亮测试技术领域，尤其涉及一种探针检测装置及面板点亮测试装置。
 背景技术
在液晶显示面板的制造流程中有一个流程是对半成品面板进行第一次点灯测试，测试方法为使用扎针接触面板的测试点采用短路探针（Shorting bar）的驱动方式点亮面板，观察面板是否有缺陷存在。
请参阅图1所示，为现有对半成品面板95进行第一次点灯测试的面板点亮测试装置90的结构示意图，面板点亮测试装置90包括信号产生器91、信号转接板92以及信号扩展板93，在信号扩展板93上连接有多个探针94。信号转接板92与信号产生器91电连接，接收信号产生器91产生的信号并将接收的信号进行转接，分出资料数据接口和扫描数据接口，并与信号扩展板93连接，信号扩展板93通过探针94将资料数据接口产生的电压信号转换成多路并联输出，每一路都通过探针94连接到对应半成品面板95的测试点，在每一路的信号均一致。
在半成品面板制作的同时在其周边同时制作检测键（TEG Test Key）作为测试点，通过对半成品面板施加电压，并在检测键处测量方块电阻，用电压值除以电阻值可得到电流值，即可检测阵列基板的电流值变化曲线，通过对比分析可得出半成品面板的均匀性等特性，进而可了解半成品面板的品质。
在测试过程中常发生一些异常造成面板不能显示真实的缺陷，异常现象如下：
一、探针与面板的平行度不达标导致面板左右两边的接触电阻不一致，造成画面异常，有时增加探针压入量可以解决问题，当过大的压入量面板有被扎破的风险；
二、GOA探针测试治具尺寸小且探针密集，测试时发生探针断裂造成画面异常；
三、画面信号产生器的信号输送到探针需经过三组或四组信号接口，信号接口未插好或接头氧化会造成接触电阻超高进而引起画面异常。
现有处理这些异常的方法为：
一、探针接触面板，肉眼观察探针与面板的压入量；
二、探针不接触面板，肉眼观察探针断裂变形情况；
三、反复拔插信号接口，观察点灯画面是否正常。
使用这些方法的缺陷是：观察空间狭小，肉眼观察判定不准确，需要进机台反复检查耗时很长，多次拔插信号接口易造成接口损坏。此种目视的方法无法直接检测到扎针电阻，只能通过探针断裂或变形现象推测扎针电阻偏高；如目视检查不出异常，则拆下探针单元用万用表量测电阻。
因此，有必要提供一种新的探针检测装置及面板点亮测试装置，以克服现有技术中存在的问题。
 技术问题
解决现有技术中的无法准确检测探针是否正常而影响面板点亮测试的技术问题，不需反复插拔探针和拆卸探针操作，可快速准确的检测出探针的电阻，从而判断出是否异常，保证了面板点亮测试的准确性。
 技术解决方案
为了实现上述目的，本发明中提供一种探针检测装置，其包括治具板，所述治具板具有一检测端，所述检测端设有资料数据检测区和扫描数据检测区。
在所述资料数据检测区包括多个第一检测键、多个第一探针孔以及多个第一电阻；所述多个第一检测键成一排设于所述检测端；所述多个第一探针孔成一排设于所述检测端的侧面上，分别与每一第一检测键对应设置，其孔底裸露所述第一检测键；所述多个第一电阻成一排与所述第一检测键一一对应设置，每一第一电阻的一端与对应设置的每一第一检测键电性连接，所述多个第一电阻的另一端相互电性连接。
在所述扫描数据检测区包括两个第二检测键、两个第二探针孔以及两个第二电阻；所述两个第二检测键分别位于所述资料数据检测区的两端；所述两个第二探针孔设于所述检测端的侧面上，分别与每一第二检测键对应设置，其孔底裸露所述第二检测键；所述两个第二电阻分别与所述第二检测键对应设置，每一第二电阻的一端与对应设置的每一第二检测键电性连接，所述两个第二电阻的另一端相互电性连接。
进一步地，所述第一检测键与所述第二检测键成一排设置；和/或，所述第一电阻与所述第二电阻成一排设置。
进一步地，所述第一检测键和/或所述第二检测键的材质包括铜。
进一步地，所述第一检测键和/或所述第二检测键设于所述检测端的内部。
进一步地，所述第一电阻和/或所述第二电阻的阻值为100Ω。
进一步地，所述第一电阻和/或所述第二电阻设于所述检测端的内部。
进一步地，所述治具板的材质包括聚乙烯、聚丙烯或聚氯乙烯中的任一种。
本发明还提供一种面板点亮测试装置，包括上述探针检测装置。
进一步地，所述面板点亮测试装置还包括信号产生器、信号转接板以及信号扩展板；具体地讲，所述信号产生器用于产生阻抗检测信号；所述信号转接板与所述信号产生器电性连接，用于接收所述阻抗检测信号并进行转接，其分出一资料数据接口和一扫描数据接口；所述扫描数据接口连接有探针，所述探针穿过所述第一探针孔与所述第二检测键电性连接；所述信号扩展板与所述资料数据接口电性连接；在所述信号扩展板上连接有多个探针，所述探针穿过所述第二探针孔与所述第一检测键电性连接。
进一步地，所述治具板的形状和尺寸与所述面板点亮测试装置检测的半成品面板的形状和尺寸相同。
 有益效果
本发明的有益效果是：提供一种探针检测装置及其面板点亮测试装置，通过设置专用的探针检测装置可解决现有技术中的无法准确检测探针是否正常而影响面板点亮测试的技术问题，不需反复插拔探针和拆卸探针操作，可快速准确的检测出探针的电阻，从而判断出是否异常，保证了面板点亮测试的准确性。
 附图说明
图1为现有的一种面板点亮测试装置的结构示意图；
图2为本发明实施例中一种探针检测装置的结构示意图；
图3为本发明实施例中一种面板点亮测试装置的结构示意图。
图中部件标识如下：
1、资料数据检测区，2、扫描数据检测区，10、探针检测装置，
11、第一检测键，12、第一探针孔，13、第一电阻，
20、信号产生器，21、第二检测键，22、第二探针孔，
23、第二电阻，30、信号转接板，31、资料数据接口，
32、扫描数据接口，40、信号扩展板，41、第一信号扩展板，
42、第二信号扩展板，50、探针，100、面板点亮测试装置，
101、治具板，102、检测端。
 本发明的实施方式
下面将结合本申请实施例中的附图，对本申请实施例中的技术方案进行清楚、完整地描述。显然，所描述的实施例仅仅是本申请一部分实施例，而不是全部的实施例。基于本申请中的实施例，本领域技术人员在没有作出创造性劳动前提下所获得的所有其他实施例，都属于本申请保护的范围。
在本申请的描述中，需要理解的是，术语“中心”、“纵向”、“横向”、“长度”、“宽度”、“厚度”、“上”、“下”、“前”、“后”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”、“顺时针”、“逆时针”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个所述特征。在本申请的描述中，“多个”的含义是两个或两个以上，除非另有明确具体的限定。
在本申请的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接或可以相互通讯；可以是直接相连，也可以通过中间媒介间接相连，可以是两个元件内部的连通或两个元件的相互作用关系。对于本领域的普通技术人员而言，可以根据具体情况理解上述术语在本申请中的具体含义。
在本申请中，除非另有明确的规定和限定，第一特征在第二特征之“上”或之“下”可以包括第一和第二特征直接接触，也可以包括第一和第二特征不是直接接触而是通过它们之间的另外的特征接触。而且，第一特征在第二特征“之上”、“上方”和“上面”包括第一特征在第二特征正上方和斜上方，或仅仅表示第一特征水平高度高于第二特征。第一特征在第二特征“之下”、“下方”和“下面”包括第一特征在第二特征正下方和斜下方，或仅仅表示第一特征水平高度小于第二特征。
下文的公开提供了许多不同的实施方式或例子用来实现本申请的不同结构。为了简化本申请的公开，下文中对特定例子的部件和设置进行描述。当然，它们仅仅为示例，并且目的不在于限制本申请。此外，本申请可以在不同例子中重复参考数字和/或参考字母，这种重复是为了简化和清楚的目的，其本身不指示所讨论各种实施方式和/或设置之间的关系。此外，本申请提供了的各种特定的工艺和材料的例子，但是本领域普通技术人员可以意识到其他工艺的应用和/或其他材料的使用。
具体的，请参阅图2所示，本发明实施例中提供一种探针检测装置10，其包括治具板101，所述治具板101具有一检测端102，所述检测端102设有资料数据检测区1和扫描数据检测区2。
在所述资料数据检测区1包括多个第一检测键11、多个第一探针孔12以及多个第一电阻13；所述多个第一检测键11成一排设于所述检测端102；所述多个第一探针孔12成一排设于所述检测端102的侧面上，分别与每一第一检测键11对应设置，其孔底裸露所述第一检测键11；所述多个第一电阻13成一排与所述第一检测键11一一对应设置，每一第一电阻13的一端与对应设置的每一第一检测键11电性连接，所述多个第一电阻13的另一端相互电性连接；其中，所述第一检测键11、所述第一探针孔12、所述第一电阻13均优选为13个。
在所述扫描数据检测区2包括两个第二检测键21、两个第二探针孔22以及两个第二电阻23；所述两个第二检测键21分别位于所述资料数据检测区1的两端；所述两个第二探针孔22设于所述检测端102的侧面上，分别与每一第二检测键21对应设置，其孔底裸露所述第二检测键21，便于外界探针与所述第二检测键21电性连接；所述两个第二电阻23分别与所述第二检测键21对应设置，每一第二电阻23的一端与对应设置的每一第二检测键21电性连接，所述两个第二电阻23的另一端相互电性连接。
本实施例中，所述第一检测键11与所述第二检测键21成一排设置；和/或，所述第一电阻13与所述第二电阻23成一排设置。
本实施例中，所述第一检测键11和/或所述第二检测键21的材质包括铜，具有良好的导电性能。
本实施例中，所述第一检测键11和/或所述第二检测键21设于所述检测端102的内部。
本实施例中，所述第一电阻13和/或所述第二电阻23的阻值为100Ω。
本实施例中，所述第一电阻13和/或所述第二电阻23设于所述检测端102的内部。
本实施例中，所述治具板101的材质包括聚乙烯、聚丙烯或聚氯乙烯中的任一种。可理解的是，所述治具板101为塑料或硬质塑料材质，具有轻便特性，便于拿取。
本实施例通过设置专用的探针检测装置10可解决现有技术中的无法准确检测探针是否正常而影响面板点亮测试的技术问题，不需反复插拔探针和拆卸探针操作，可快速准确的检测出探针的电阻，从而判断出是否异常，保证了面板点亮测试的准确性。
请参阅图3所示，本发明还提供一种面板点亮测试装置100，包括上述探针检测装置10。所述面板点亮测试装置100用于检测探针及连接回路是否正常。
本实施例中，所述面板点亮测试装置100还包括信号产生器20、信号转接板30以及信号扩展板40；具体地讲，所述信号产生器20用于产生阻抗检测信号；所述信号转接板30与所述信号产生器20电性连接，用于接收所述阻抗检测信号并进行转接，其分出一资料数据接口31和一扫描数据接口32；所述扫描数据接口32连接有探针50，所述探针50穿过所述第一探针孔12与所述第二检测键21电性连接；所述信号扩展板40与所述资料数据接口31电性连接；在所述信号扩展板40上连接有多个探针50，所述探针50穿过所述第二探针孔22与所述第一检测键11电性连接。优选的，所述信号扩展板40包括第一信号扩展板41和第二信号扩展板42，所述第一信号扩展板41的探针50优选为7个，所述第二信号扩展板42的探针50优选为6个。
本实施例中，所述治具板101的形状和尺寸与所述面板点亮测试装置100检测的半成品面板的形状和尺寸相同，这样能够完好地将所述治具板101卡接在所述面板点亮测试装置100的面板检测区内。
在使用时，用所述治具板101代替半成品面板放到点灯机工作台上的所述探针检测装置10的面板检测区内，所述信号发生器设定为阻抗检测，阻抗检测是设定一个专用的机种，在探针50状况及压入量、接线都正常的情况下测试一组各探针50或探针50组之间的电阻值。其中检测的电阻值可直接显示在所述信号产生器20上。
通过后续测试实现以下功能：
一、在两种探针50压入量下分别检测所述第一信号扩展板41的探针50与所述第二信号扩展板42的探针50的电阻值，如果检测值不在标准值的误差范围内，则说明探针50与半成品面板的平行度不达标或接线电阻超标；
二、分别检测所述扫描数据检测区2的所述第二检测键21之间的电阻值，如果检测值不在标准值的误差范围内，则说明探针50有断裂或弯曲；
三、分别检测所述扫描数据检测区2的所述第二检测键21之间的电阻值，如果检测值不在标准值的误差范围内，则说明信号接口未插好。
本实施例通过所述面板点亮测试装置100进行探针阻抗检测，可对扎针状况进行数据量化，大幅提高异常处理速度，并减少配件损耗。提升了点灯检测系统的稳定性和有效性，降低了检测出现的画面异常比例，防止了人员反复拔插接口造成部件损坏。
本发明的有益效果是：提供一种探针检测装置10及其面板点亮测试装置100，通过设置专用的探针检测装置10可解决现有技术中的无法准确检测探针是否正常而影响面板点亮测试的技术问题，不需反复插拔探针和拆卸探针操作，可快速准确的检测出探针的电阻，从而判断出是否异常，保证了面板点亮测试的准确性。
以上所述仅是本发明的优选实施方式，应当指出，对于本技术领域的普通技术人员，在不脱离本发明原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也应视为本发明的保护范围。

Claims (10)

  1. 一种探针检测装置，其包括治具板，所述治具板具有一检测端，所述检测端设有资料数据检测区和扫描数据检测区；
    在所述资料数据检测区包括：
    多个第一检测键，成一排设于所述检测端；
    多个第一探针孔，成一排设于所述检测端的侧面上，分别与每一第一检测键对应设置，其孔底裸露所述第一检测键；以及
    多个第一电阻，成一排与所述第一检测键一一对应设置，每一第一电阻的一端与对应设置的每一第一检测键电性连接，所述多个第一电阻的另一端相互电性连接；
    在所述扫描数据检测区包括：
    两个第二检测键，分别位于所述资料数据检测区的两端；
    两个第二探针孔，设于所述检测端的侧面上，分别与每一第二检测键对应设置，其孔底裸露所述第二检测键；以及
    两个第二电阻，分别与所述第二检测键对应设置，每一第二电阻的一端与对应设置的每一第二检测键电性连接，所述两个第二电阻的另一端相互电性连接。
  2. 根据权利要求1所述的探针检测装置，其中，
    所述第一检测键与所述第二检测键成一排设置；和/或
    所述第一电阻与所述第二电阻成一排设置。
  3. 根据权利要求1所述的探针检测装置，其中，所述第一检测键和/或所述第二检测键的材质包括铜。
  4. 根据权利要求1所述的探针检测装置，其中，所述第一检测键和/或所述第二检测键设于所述检测端的内部。
  5. 根据权利要求1所述的探针检测装置，其中，所述第一电阻和/或所述第二电阻的阻值为100Ω。
  6. 根据权利要求1所述的探针检测装置，其中，所述第一电阻和/或所述第二电阻设于所述检测端的内部。
  7. 根据权利要求1所述的探针检测装置，其中，所述治具板的材质包括聚乙烯、聚丙烯或聚氯乙烯中的任一种。
  8. 一种面板点亮测试装置，其包括权利要求1所述的探针检测装置。
  9. 根据权利要求8所述的面板点亮测试装置，其中，还包括：
    信号产生器，用于产生阻抗检测信号；
    信号转接板，与所述信号产生器电性连接，用于接收所述阻抗检测信号并进行转接，其分出一资料数据接口和一扫描数据接口；所述扫描数据接口连接有探针，所述探针穿过所述第一探针孔与所述第二检测键电性连接；以及
    信号扩展板，与所述资料数据接口电性连接；在所述信号扩展板上连接有多个探针，所述探针穿过所述第二探针孔与所述第一检测键电性连接。
  10. 根据权利要求8所述的面板点亮测试装置，其中，所述治具板的形状和尺寸与所述面板点亮测试装置检测的半成品面板的形状和尺寸相同。
PCT/CN2019/128697 2019-12-18 2019-12-26 探针检测装置及面板点亮测试装置 WO2021120274A1 (zh)

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