WO2018028034A1 - 一种基于磁性开关的半成品触摸屏测试机 - Google Patents

一种基于磁性开关的半成品触摸屏测试机 Download PDF

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Publication number
WO2018028034A1
WO2018028034A1 PCT/CN2016/101029 CN2016101029W WO2018028034A1 WO 2018028034 A1 WO2018028034 A1 WO 2018028034A1 CN 2016101029 W CN2016101029 W CN 2016101029W WO 2018028034 A1 WO2018028034 A1 WO 2018028034A1
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magnetic switch
touch screen
semi
finished touch
testing machine
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French (fr)
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肖敏毅
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EELY Guangzhou Electronic Technology Co Ltd
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EELY Guangzhou Electronic Technology Co Ltd
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

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  • the invention relates to the technical field of touch screens, and in particular to a semi-finished touch screen testing machine based on a magnetic switch.
  • a capacitive touch screen is an important component for various smart terminal electronic devices that enables direct and natural interaction between the user and the electronic device.
  • the semi-finished touch screen is a touch screen that has formed a touch electrode for sensing the position of the touch point, but the touch electrode is not connected to the IC.
  • Such semi-finished products need to be tested before being processed into finished products. In good condition to improve the yield of the finished touch screen.
  • the connector for the test machine mainly uses a probe.
  • the probe is connected to the electrode lead of the product to read the data of the electrode in the sensing layer, and then the product is qualified by judging whether the relevant data is within a predetermined value range.
  • the connector is prone to deformation of the probe, easy to break when the air pressure is too large, and the probe is clogged with a probe after a long time of use. As a result, the maintenance frequency is too high, which indirectly increases the production cost of the product.
  • the object of the present invention is to provide a semi-finished touch screen testing machine based on a magnetic switch to solve It is difficult for the existing semi-finished touch screen tester based on the magnetic switch to effectively detect all short-circuit materials, and the test machine is difficult to be used for different types and sizes of touch screens.
  • the invention provides a semi-finished touch screen testing machine based on a magnetic switch, comprising a working case with a short-circuit test module and a capacitance test module, a test board and a test platform on the working case, and a magnetic switch, the magnetic switch One end of the magnetic switch is electrically connected to the test board, and the other end of the magnetic switch is electrically connected to the short-circuit test module or electrically connected to the capacitance test module, and the test platform is used for placing a product to be tested.
  • the test platform is docked with the test board to electrically connect the product to be tested and the test board.
  • the magnetic switch is one of a reed switch or a magnetic switch.
  • the magnetic switch is a reed switch.
  • an IC is provided in the short-circuit test module and/or the capacitance test module, and the IC is an IC of Atmel Corporation.
  • the magnetic switch-based semi-finished touch screen testing machine further includes a first lifting frame disposed above the working chassis and a first lifting device moving up and down relative to the first supporting frame a vertical projection of the first lifting device on the working chassis is located at abutment between the test platform and the test board, and the first lifting device is lowered to an interface between the test platform and the test board The test product placed on the test platform is electrically connected to the test board.
  • the first lifting device includes a first cylinder fixed to the first support frame and a first pressure plate electrically connected to the first cylinder, the first The pressure plate is located below the first support frame and moves up and down relative to the first support frame, and the first cylinder pushes the first pressure plate down to the docking point of the test platform and the test board, so that the pressure plate is placed
  • the product to be tested on the test platform is electrically connected to the test board.
  • the first lifting device further includes a first guide post, the first guide post vertically passes through the first support frame and the first guide post and the first The pressure plate is fixedly coupled to move the first pressure plate up and down in a vertical direction.
  • the magnetic switch-based semi-finished touch screen testing machine further includes a second lifting frame disposed above the working chassis and a second lifting device moving up and down relative to the second supporting frame, wherein a vertical projection of the second lifting device on the working chassis is located at the The magnetic switch is electrically connected to the short circuit test module when the second lifting device is lowered to the magnetic switch, and the second lifting device is raised to be away from the magnetic switch.
  • the magnetic switch is electrically connected to the capacitance test module.
  • the second lifting device includes a second cylinder fixed to the second support frame and a second pressure plate electrically connected to the second cylinder, the second a pressure plate is located below the second support frame and moves up and down relative to the second support frame, the second pressure plate is magnetic material, and when the second cylinder pushes the second pressure plate down to the magnetic switch, Electrically connecting the magnetic switch to the short circuit test module, and electrically connecting the magnetic switch to the capacitance test module when the second cylinder pulls the second pressure plate to move away from the magnetic switch .
  • the second lifting device further includes a second guiding post, the second guiding post vertically passes through the second supporting frame and the second guiding post and the second The pressure plate is fixedly coupled to move the second pressure plate up and down in a vertical direction.
  • the first support frame is further provided with a CCD aligning device, and the CCD aligning device is configured to enlarge the electrical connection position of the product to be tested and the test board And the opposite.
  • an adjustment knob is further disposed on the test platform, and the adjustment knob is used to adjust an electrical connection position between the product to be tested and the test board.
  • the magnetic switch-based semi-finished touch screen testing machine further includes a display screen disposed above the working chassis, and the display screen is respectively electrically connected to the short-circuit test module and the capacitance test module. A connection for displaying a short circuit test result and/or displaying the capacitance test result.
  • the magnetic switch-based semi-finished touch screen tester is used to test the size of the semi-finished touch screen is less than or equal to 7 inches.
  • the magnetic switch-based semi-finished touch screen tester is used to test a semi-finished touch screen having dimensions of 7 inches, 6 inches, 5.5 inches, 5 inches, 4.5 inches, 4 inches, 3.8 inches, or 3.5 inches.
  • the magnetic switch-based semi-finished touch screen tester is used to test a semi-finished touch screen of a GFF, GF1 or GF2 structure.
  • the present invention has the following beneficial effects:
  • a short-circuit test module and a capacitance test module are respectively disposed inside the working chassis, and the semi-finished touch screen placed in the test platform is electrically connected with the test board to finally realize the connection with the short-circuit test module or the capacitance test module. Therefore, the short-circuit value of the sensing layer in the semi-finished touch screen can be tested, and the capacitance value of the sensing layer can be detected, so that the short-circuit material of the semi-finished touch screen can be effectively detected.
  • a magnetic switch is used instead of the conventional probe as a connector, which can effectively reduce the maintenance probability and reduce the maintenance cost.
  • the test machine of the present invention has high compatibility, because Atmel's IC can support up to 32 electrodes in the X direction and up to 52 electrodes in the Y direction, so it can be compatible with various types of tests.
  • FIG. 1 is a schematic structural view of a semi-finished touch screen testing machine based on a magnetic switch according to a second embodiment of the present invention
  • FIG. 2 is a schematic structural view of a semi-finished touch screen testing machine based on a magnetic switch according to a second embodiment of the present invention (the first support frame, the first lifting device, and the CCD alignment device are omitted);
  • FIG. 3 is a schematic structural view of a first support frame, a first lifting device, and a CCD alignment device according to Embodiment 2 of the present invention.
  • the embodiment provides a semi-finished touch screen testing machine based on a magnetic switch, comprising a working chassis internally provided with a short-circuit test module and a capacitance test module, a test board and a test platform located on the working chassis, and a magnetic switch, One end of the magnetic switch is electrically connected to the test board, and the other end of the magnetic switch is electrically connected to the short circuit test module or the capacitance test module, where the test platform is used for placing a product to be tested, The test platform is docked with the test board to electrically connect the product to be tested to the test board.
  • the present embodiment provides a semi-finished touch screen testing machine based on a magnetic switch, including a working chassis 1 and test boards 2 and test platforms 3 respectively disposed at different positions on the working chassis 1.
  • the working chassis 1 is provided with a short-circuit test module and a capacitance test module, and the short-circuit test module and/or the capacitance test module are provided with an Atmel company IC for driving the short-circuit test module to the semi-finished touch screen.
  • the short-circuit test and the drive capacitance test module perform capacitance tests on the semi-finished touch screen. Because Atmel's IC has high compatibility, it can support up to 32 electrodes in the X direction and up to 52 electrodes in the Y direction. It is compatible with the semi-finished touch screens of various ICs. Test semi-finished touch screens of different structures.
  • the test board 2 is a PCB circuit board, and the test platform 3 is used for placing a product to be tested (ie, a semi-finished touch screen to be tested), and the test platform 3 is docked with the test board 2 to enable the product to be tested placed in the test platform 3. (not shown) is electrically connected to the test board 2, specifically, the electrode lead of the product to be tested is electrically connected to the gold finger in the test board 2.
  • the magnetic switch 6 in this embodiment is specifically a reed switch, and the magnetic switch 6 has different connecting ends, one end of which is electrically connected to the test board 2, and the other end is selectively connected with the short-circuit test module in the working chassis 1. Electrically connected or electrically connected to the capacitance test module.
  • the first support frame 41 is disposed above the work case 1 , and the first lifting device 51 is movably connected to the first support frame 41 and moves up and down relative to the first support frame 41 .
  • the first lifting device The 51 includes a first cylinder 511, a first pressure plate 512, and a first guide post 513.
  • the first cylinder 511 is fixed to the first support frame 41 for providing the first pressure plate 512 with power for moving up and down.
  • the first pressure plate 512 is connected to the first cylinder 511, and the first pressure plate 512 is disposed below the first support frame 41 and moves up and down relative to the first support frame 41.
  • the first pressure plate 512 is vertical on the working chassis 1.
  • the projection is located at the docking of the test platform 3 and the test board 2.
  • the first guide post 513 vertically passes through the first support frame 41 and is fixedly coupled to the first pressure plate 512 for positioning and guiding the vertical movement of the first pressure plate from the vertical direction.
  • the second support frame 42 is located behind the first support frame 41 and the second support frame 42 is disposed above the work case 1.
  • the second lifting device 52 is movably connected with the second support frame 42 and opposite to the second support frame.
  • the frame 42 moves up and down.
  • the second lifting device 52 includes a second cylinder 521, a second pressure plate 522 made of a magnetic material, and a second guide post 523.
  • the second cylinder 521 is fixed to the second support frame 42 for providing the second pressure plate 522 with power for moving up and down.
  • the second pressure plate 522 is dynamically connected to the second cylinder 521 , and the second pressure plate 522 is disposed below the second support frame 42 and moves up and down relative to the second support frame 42 .
  • the second pressure plate 522 is vertical on the working chassis 1 .
  • the projection is located near the magnetic switch 6, specifically at one end of the magnetic switch 6 electrically connected to the short-circuit test module or electrically connected to the capacitance test module.
  • the second guiding post 523 vertically passes through the second supporting frame 42 and is fixedly connected with the second pressing plate 522 for positioning and guiding the vertical movement of the second pressing plate 522 from the vertical direction. .
  • the magnetic switch 6 is electrically connected to the short-circuit test module; the second cylinder 521 pulls the second pressure plate 522 to rise away from the end of the magnetic switch 6 that is electrically connected to the short-circuit test module or electrically connected to the capacitance test module. The influence of the second pressure plate on the magnetic switch 6 disappears, and the magnetic switch 6 is electrically connected to the capacitance test module.
  • the magnetic switch-based semi-finished touch screen tester of the present embodiment further includes a CCD alignment device 7 disposed on the first support frame 41, and the CCD alignment device 7 is configured to perform electrical connection between the product to be tested and the test board 2. Zoom in and align to ensure that the electrical connections are accurate.
  • the magnetic switch-based semi-finished touch screen test machine of the embodiment further includes a test platform disposed on the test platform
  • the adjustment knob 31 on the third is used for fine-tuning the electrical connection position of the product to be tested and the test board 2.
  • the magnetic switch-based semi-finished touch screen testing machine of the embodiment further includes a display screen (not shown) disposed above the working chassis 1, and the display screen is electrically connected to the short-circuit test module and the capacitance test module respectively.
  • the short circuit test result is displayed and/or the capacitance test result is displayed.
  • the semi-finished touch screen tester based on the magnetic switch is used to test the size of the semi-finished touch screen to be less than or equal to 7 inches.
  • a semi-finished touch screen tester based on a magnetic switch is used to test a semi-finished touch screen having dimensions of 7 inches, 6 inches, 5.5 inches, 5 inches, 4.5 inches, 4 inches, 3.8 inches, or 3.5 inches.
  • the magnetic switch-based semi-finished touch screen tester of the present embodiment is used to test a semi-finished touch screen of GFF, GF1 or GF2 structure.
  • the magnetic switch-based semi-finished touch screen tester of the embodiment firstly places the product to be tested on the test platform 3, and the electrode lead of the product to be tested is docked with the gold finger of the test board 2;
  • the device 51 lowers the first pressure plate 512 to the interface between the product to be tested and the test board 2, so that the product to be tested is electrically connected to the test board 2, and one end of the magnetic switch 6 is electrically connected to the test board 2.
  • the second pressing plate 522 is lowered to a position close to the magnetic switch 6 by the second lifting device 52. Since the second pressing plate 522 is made of a magnetic material, the magnetic switch 6 is affected, so that the other end of the magnetic switch 6 is broken.
  • the short-circuit test module is electrically connected, thereby electrically connecting the product to be tested and the short-circuit test module to achieve a short-circuit test of the product to be tested; finally, the second platen 522 is raised by the second lifting device 52 to make the first
  • the second pressure plate 522 is away from the magnetic switch 6, and the influence of the second pressure plate 522 on the magnetic switch 6 disappears, so that the other end of the magnetic switch 6 is electrically connected to the capacitance test module, thereby making the product to be tested. Electrical connection between the test module and the capacitor, is done to achieve the measured capacitance test products.

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  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

一种基于磁性开关的半成品触摸屏测试机，属于触摸屏技术领域，包括内部设有断短路测试模块和电容测试模块的工作机箱（1），位于工作机箱（1）上的测试板（2）、测试平台（3）和磁性开关（6），磁性开关（6）的一端与测试板（2）电性连接，磁性开关（6）的另一端与断短路测试模块或者电容测试模块电性连接，测试平台（3）用于放置待测产品，测试平台（3）与测试板（2）对接设置，以使待测产品与测试板（2）电性连接。基于磁性开关（6）的半成品触摸屏测试机采用磁性开关（6）代替传统的探针作为连接器，能够减少测试机的维修频率、降低维修成本，还具有兼容性高、且既可测试断短路值又可测试电容值的功能。

Description

一种基于磁性开关的半成品触摸屏测试机 技术领域
本发明涉及触摸屏技术领域，尤其涉及一种基于磁性开关的半成品触摸屏测试机。
背景技术
电容式触摸屏是一种用于各种智能终端电子设备的重要部件，其能够实现用户与电子设备之间直接地、自然地交互。在触摸屏的制造过程中，半成品触摸屏是已经形成有用于感应触控点位置的触控电极、但触控电极并没有与IC连接的触摸屏，此类半成品需要在加工为成品之前先测试其功能是否完好，以提高成品触摸屏的良率。
在现有技术中，用于测试机的连接器主要是采用探针。通过连接器的探针与产品的电极引线相连接，以读取传感层中电极的数据，进而通过判断相关数据是否在预定数值范围内，来测定产品是否合格。但是，随着此类测试机生产数量的大规模化及使用时间长期化，连接器容易出现探针变形、气压过大时易断、使用时间长后针缝隙带杂物使用探针堵塞等问题，由此导致维修频率过高、间接提高了产品的生产成本。
此外，在现有技术中，由于半成品触摸屏上并未连接有IC，因此对半成品触摸屏进行测试时，需要先将其与IC连接，再进行半成品功能测试，以判断半成品是否合格。但是，目前能够支持触摸屏产业的IC品牌非常多，且每种IC都有其独立的测试方法，但这些测试方法无法保证短路材料能够有效检出，且方法之间并不通用。这一方面会导致检测后的半成品触摸屏仍存在性能上的缺陷问题；另一方面会导致采用不同IC的半成品触摸屏需要使用不同的IC及其测试方法，相应地，用于不同半成品触摸屏的测试板也需要及时开发更换。当触摸屏生产企业的触摸屏种类较多时，需要开发多种半成品触摸屏的测试板，这既增加测试成本，又会耗费大量人力物力。
发明内容
本发明的目的在于提供一种基于磁性开关的半成品触摸屏测试机，以解 决现有基于磁性开关的半成品触摸屏测试机难以有效检出全部短路材料、且测试机难以通用于不同类型、不同尺寸触摸屏的问题。
本发明的技术方案如下：
本发明提供一种基于磁性开关的半成品触摸屏测试机，包括内部设有断短路测试模块和电容测试模块的工作机箱、位于所述工作机箱上的测试板和测试平台以及磁性开关，所述磁性开关的一端与所述测试板电性连接，所述磁性开关的另一端与所述断短路测试模块电性连接或者与所述电容测试模块电性连接，所述测试平台用于放置待测产品，所述测试平台与所述测试板对接设置，以使所述待测产品与所述测试板电性连接。
可选地，所述磁性开关为干簧管或门磁开关中的一种。优选地，所述磁性开关为干簧管。
【IC】进一步地，所述断短路测试模块和/或所述电容测试模块中设有IC，所述IC为Atmel公司的IC。
【第一升降装置】进一步地，所述基于磁性开关的半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第一支撑架和相对所述第一支撑架上下移动的第一升降装置，所述第一升降装置在所述工作机箱上的垂直投影位于所述测试平台与所述测试板对接处，所述第一升降装置下降至所述测试平台与所述测试板的对接处时，使放置于所述测试平台上的待测产品与所述测试板电性连接。
【第一升降装置-具体】进一步地，所述第一升降装置包括固设于所述第一支撑架上的第一气缸以及与所述第一气缸动力连接的第一压板，所述第一压板位于所述第一支撑架下方且相对于所述第一支撑架上下移动，所述第一气缸推动所述第一压板下降至所述测试平台与所述测试板的对接处时，使放置于所述测试平台上的待测产品与所述测试板电性连接。
【第一导柱】进一步地，所述第一升降装置还包括第一导柱，所述第一导柱竖向穿过所述第一支撑架且所述第一导柱与所述第一压板固定连接，以使所述第一压板沿竖直方向上下移动。
【第二升降装置】进一步地，所述基于磁性开关的半成品触摸屏测试机 还包括横跨设于所述工作机箱上方的第二支撑架和相对所述第二支撑架上下移动的第二升降装置，所述第二升降装置在所述工作机箱上的垂直投影位于所述磁性开关处，所述第二升降装置下降至所述磁性开关处时，使所述磁性开关与所述断短路测试模块电性连接，所述第二升降装置上升至远离所述磁性开关时，使所述磁性开关与所述电容测试模块电性连接。
【第二升降装置-具体】进一步地，所述第二升降装置包括固设于所述第二支撑架上的第二气缸以及与所述第二气缸动力连接的第二压板，所述第二压板位于所述第二支撑架下方且相对于所述第二支撑架上下移动，所述第二压板为磁性材料，所述第二气缸推动所述第二压板下降至所述磁性开关处时，使所述磁性开关与所述断短路测试模块电性连接，所述第二气缸拉动所述第二压板上升至远离所述磁性开关时，使所述磁性开关与所述电容测试模块电性连接。
【第二导柱】进一步地，所述第二升降装置还包括第二导柱，所述第二导柱竖向穿过所述第二支撑架且所述第二导柱与所述第二压板固定连接，以使所述第二压板沿竖直方向上下移动。
【ccd对位装置】进一步地，所述第一支撑架上还设有CCD对位装置，所述CCD对位装置用于对所述待测产品与所述测试板的电性连接位置进行放大和对位。
【微调装置】进一步地，所述测试平台上还设有调节旋钮，所述调节旋钮用于调节所述待测产品与与所述测试板的电性连接位置。
【显示屏】进一步地，所述基于磁性开关的半成品触摸屏测试机还包括设于所述工作机箱上方的显示屏，所述显示屏分别与所述断短路测试模块、所述电容测试模块电性连接，用于显示断短路测试结果和/或显示所述电容测试结果。
【应用】可选地，所述基于磁性开关的半成品触摸屏测试机用于测试半成品触摸屏的尺寸小于或者等于7寸。例如，所述基于磁性开关的半成品触摸屏测试机用于测试半成品触摸屏的尺寸为7寸、6寸、5.5寸、5寸、4.5寸、4寸、3.8寸或3.5寸。
可选地，所述基于磁性开关的半成品触摸屏测试机用于测试GFF、GF1或GF2结构的半成品触摸屏。
与现有技术相比，本发明具有以下有益效果：
在本发明中，在工作机箱内部分别设有断短路测试模块和电容测试模块，放置于测试平台中的半成品触摸屏通过与测试板电性连接，最终实现与断短路测试模块或者电容测试模块的连接，由此既能够测试半成品触摸屏中传感层的断短路值、又能测出传感层的电容值，故能够保证将半成品触摸屏的短路材料有效检出。另外，本发明中采用磁性开关代替传统的探针作为连接器，能够有效减少维修机率、降低维修成本。不仅如此，本发明的测试机具有较高的兼容性，由于Atmel公司的IC最多能够支持半成品触摸屏在X方向上电极多达32条、Y方向上电极多达52条，因此能够兼容测试各类IC对应的半成品触摸屏，并且也能够测试不同结构的半成品触摸屏。
附图说明
为了更清楚地说明本发明实施例中的技术方案，下面将对实施例中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1是本发明实施例二的基于磁性开关的半成品触摸屏测试机的结构示意图；
图2是本发明实施例二的基于磁性开关的半成品触摸屏测试机的结构示意图(省略第一支撑架、第一升降装置和CCD对位装置)；
图3是本发明实施例二中第一支撑架、第一升降装置和CCD对位装置的结构示意图。
具体实施方式
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅是本发明一部分实施例，而不 是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明保护的范围。
实施例一
本实施例提供一种基于磁性开关的半成品触摸屏测试机，包括内部设有断短路测试模块和电容测试模块的工作机箱、位于所述工作机箱上的测试板和测试平台、以及磁性开关，所述磁性开关的一端与所述测试板电性连接，所述磁性开关的另一端与所述断短路测试模块或者所述电容测试模块电性连接，所述测试平台用于放置待测产品，所述测试平台与所述测试板对接设置，以使所述待测产品与所述测试板电性连接。
实施例二
结合图1至图3所示，本实施例提供一种基于磁性开关的半成品触摸屏测试机，包括工作机箱1以及分别设于工作机箱1上不同位置处的测试板2、测试平台3、第一支撑架41、第一升降装置51、第二支撑架42、第二升降装置52以及磁性开关6。
其中，工作机箱1的内部设有断短路测试模块和电容测试模块，且断短路测试模块和/或电容测试模块中设有Atmel公司的IC，该IC用于驱动断短路测试模块对半成品触摸屏进行断短路测试、驱动电容测试模块对半成品触摸屏进行电容测试。由于Atmel公司的IC具有较高的兼容性，能够支持半成品触摸屏在X方向上电极多达32条、Y方向上电极多达52条，因此能够兼容测试各类IC对应的半成品触摸屏，并且也能够测试不同结构的半成品触摸屏。
其中，测试板2为PCB电路板，测试平台3用于放置待测产品(即待测试的半成品触摸屏)，测试平台3与测试板2对接设置，以使放置于测试平台3中的待测产品(图未示)与测试板2电性连接，具体是待测产品的电极引线与测试板2中的金手指电性连接。本实施例中的磁性开关6具体为干簧管，磁性开关6具有不同的连接端，其中的一端与测试板2电性连接，另一端则选择性地与工作机箱1中的断短路测试模块电性连接或者与电容测试模块电性连接。
其中，第一支撑架41横跨设于工作机箱1的上方，第一升降装置51与第一支撑架41活动连接且相对于第一支撑架41上下移动。具体地，第一升降装置 51包括第一气缸511、第一压板512和第一导柱513。第一气缸511固设于第一支撑架41上，用于为第一压板512提供上下移动的动力。第一压板512与第一气缸511动力连接，且第一压板512设于第一支撑架41的下方，并相对于第一支撑架41上下移动，该第一压板512在工作机箱1上的垂直投影位于测试平台3与测试板2对接处。第一导柱513竖向穿过第一支撑架41且与第一压板512固定连接，该第一导柱513用于从竖直方向上对第一压板的上下移动起定位和导向的作用。第一气缸511推动第一压板512下降至测试平台3与测试板2的对接处时，使放置于测试平台3上的待测产品与测试板2电性连接。
其中，第二支撑架42位于第一支撑架41的后方且第二支撑架42横跨设于工作机箱1的上方，第二升降装置52与第二支撑架42活动连接且相对于第二支撑架42上下移动。具体地，第二升降装置52包括第二气缸521、以磁性材料制成的第二压板522以及第二导柱523。第二气缸521固设于第二支撑架42上，用于为第二压板522提供上下移动的动力。第二压板522与第二气缸521动力连接，且第二压板522设于第二支撑架42的下方，并相对于第二支撑架42上下移动，该第二压板522在工作机箱1上的垂直投影位于磁性开关6附近，具体是位于磁性开关6与断短路测试模块电性连接或者与电容测试模块电性连接的一端。第二导柱523竖向穿过第二支撑架42且与第二压板522固定连接，该第二导柱523用于从竖直方向上对第二压板522的上下移动起定位和导向的作用。第二气缸521推动第二压板522下降至靠近磁性开关6与断短路测试模块电性连接或者与电容测试模块电性连接的一端时，由于第二压板为磁性材料，会影响磁性开关6的磁场，使磁性开关6与断短路测试模块电性连接；第二气缸521拉动第二压板522上升至远离磁性开关6与断短路测试模块电性连接或者与电容测试模块电性连接的一端时，由于第二压板对于磁性开关6的影响消失，使磁性开关6与电容测试模块电性连接。
本实施例的基于磁性开关的半成品触摸屏测试机还包括设置在第一支撑架41上的CCD对位装置7，该CCD对位装置7用于对待测产品与测试板2的电性连接位置进行放大和对位，以确保二者的电性连接位置准确。
本实施例的基于磁性开关的半成品触摸屏测试机还包括设置在测试平台 3上的调节旋钮31，该调节旋钮用于微调待测产品与与测试板2的电性连接位置。
另外，本实施例的基于磁性开关的半成品触摸屏测试机还包括设于工作机箱1上方的显示屏(图未示)，该显示屏分别与断短路测试模块、电容测试模块电性连接，用于显示断短路测试结果和/或显示所述电容测试结果。
在本实施例中，基于磁性开关的半成品触摸屏测试机用于测试半成品触摸屏的尺寸小于或者等于7寸。例如，基于磁性开关的半成品触摸屏测试机用于测试半成品触摸屏的尺寸为7寸、6寸、5.5寸、5寸、4.5寸、4寸、3.8寸或3.5寸。分此外，本实施例的基于磁性开关的半成品触摸屏测试机用于测试GFF、GF1或GF2结构的半成品触摸屏。
本实施例的基于磁性开关的半成品触摸屏测试机在工作时，首先将待测产品放置于测试平台3上，并将待测产品的电极引线与测试板2的金手指对接；然后通过第一升降装置51将第一压板512下降至待测产品与测试板2的对接处进行压合，以使待测产品与测试板2电性连接，此时磁性开关6的一端与测试板2电性连接；接着通过第二升降装置52将第二压板522下降至靠近磁性开关6的位置处，由于第二压板522为磁性材料，会对磁性开关6造成影响，因此使得磁性开关6的另一端与断短路测试模块电性连接，由此使待测产品与断短路测试模块之间电性连接，以实现对待测产品的断短路测试；最后通过第二升降装置52将第二压板522上升、使第二压板522远离磁性开关6，由于第二压板522对磁性开关6的影响消失，使得磁性开关6的另一端与电容测试模块电性连接，由此使待测产品与电容测试模块之间电性连接，以实现对待测产品的电容测试。
以上实施例的说明只是用于帮助理解本发明的方法及其核心思想；同时，对于本领域的一般技术人员，依据本发明的思想，在具体实施方式及应用范围上均会有改变之处，综上所述，本说明书内容不应理解为对本发明的限制。

Claims (10)

  1. 一种基于磁性开关的半成品触摸屏测试机，其特征在于，包括内部设有断短路测试模块和电容测试模块的工作机箱、位于所述工作机箱上的测试板和测试平台以及磁性开关。
  2. 根据权利要求1所述的基于磁性开关的半成品触摸屏测试机，其特征在于，IC置于断短路测试模块和/或所述电容测试模块中。
  3. 根据权利要求1所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述磁性开关为干簧管或门磁开关中的一种。
  4. 根据权利要求1所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述基于磁性开关的半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第一支撑架和相对所述第一支撑架上下移动的第一升降装置。
  5. 根据权利要求2所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述基于磁性开关的半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第一支撑架和相对所述第一支撑架上下移动的第一升降装置。
  6. 根据权利要求3所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述基于磁性开关的半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第一支撑架和相对所述第一支撑架上下移动的第一升降装置。
  7. 根据权利要求4至6所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述第一升降装置还包括第一导柱。
  8. 根据权利要求4所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述基于磁性开关的半成品触摸屏测试机还包括横跨设于所述工作机箱上方的第二支撑架和相对所述第二支撑架上下移动的第二升降装置。
  9. 根据权利要求8所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述第二升降装置包括固设于所述第二支撑架上的第二气缸以及与所述第二气缸动力连接的第二压板。
  10. 根据权利要求1所述的基于磁性开关的半成品触摸屏测试机，其特征在于，所述基于磁性开关的半成品触摸屏测试机用于测试半成品触摸屏。
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