WO2020216775A1 - Pvd dickenregelung - Google Patents
Pvd dickenregelung Download PDFInfo
- Publication number
- WO2020216775A1 WO2020216775A1 PCT/EP2020/061168 EP2020061168W WO2020216775A1 WO 2020216775 A1 WO2020216775 A1 WO 2020216775A1 EP 2020061168 W EP2020061168 W EP 2020061168W WO 2020216775 A1 WO2020216775 A1 WO 2020216775A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- layer thickness
- metal strip
- change
- strip
- evaporation rate
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
- C23C14/542—Controlling the film thickness or evaporation rate
- C23C14/545—Controlling the film thickness or evaporation rate using measurement on deposited material
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/24—Vacuum evaporation
Definitions
- the present invention relates to a method for coating a metal strip, in particular a steel strip, by means of a metallic substrate, in particular zinc, in a strip coating system, the coating taking place according to the principle of physical vapor deposition (PVD) and the layer thickness via the parameters of the strip speed and the Evaporation rate is set, as well as a system for coating the metal strip by means of the metallic substrate.
- PVD physical vapor deposition
- JPS6296669 discloses a method for coating steel strips with a zinc layer, the temperature of the steel strip being set to a specific temperature range before coating.
- JPS63128168 discloses a method for coating steel strips with a zinc layer, which has an improved deep-drawability.
- a control unit for a gas phase separator is known in order to improve the quality of the deposited layer.
- the deposited layer thickness is determined by means of a layer thickness detector and the belt speed is continuously determined by means of a speed detector and sent to the control unit. If, for example, the target value for the layer thickness is undershot or exceeded, the belt speed is adjusted accordingly via the control unit so that the deposited layer thickness can be kept constant.
- a method for coating steel strips with aluminum is known from JPS6320448, the formation of an Al-Fe alloy layer being prevented by prior formation of an AlN layer. The layer thickness of the AlN layer is set by adjusting the belt speed.
- DE 1 521 573 discloses a control system for continuous
- EP 0 176 852 discloses a vacuum coating device for the continuous coating of a metal strip, in which a control device is provided for changing the width of the metal vapor channel so that metal strips of different widths can be coated with a uniform layer thickness.
- the desired metallic substrate is evaporated and deposited on a metallic surface, with the evaporation usually taking place in a vacuum using known techniques.
- the vaporized metallic substrate is then deposited on the surface of the metal tape.
- the evaporation process is a thermal process
- the adjustment of the evaporation rate in the event of a process change takes place only slowly, so that a section is formed on the metal strip that does not have the desired layer thickness and therefore does not meet the quality requirements.
- the present invention is therefore based on the object of providing a method and an installation which overcome the disadvantages of the prior art.
- the method is intended for coating a metal strip by means of a metallic substrate in a strip coating system, the coating taking place according to the principle of physical vapor deposition (PVD) and the layer thickness being set via the parameters of the strip speed and the evaporation rate.
- PVD physical vapor deposition
- the evaporation rate and the belt speed are changed simultaneously so that the change in layer thickness can be implemented directly independently of the thermal evaporation process.
- Evaporation rate can be adjusted in advance when changing the layer thickness.
- the coating can be on one side or, preferably, on both sides, i.e. both the top and the bottom of the metal strip are coated.
- the invention provides a system for coating a metal strip by means of a metallic substrate, comprising a continuous treatment line in which the metal strip is moved in a direction of movement (T), one in the treatment line
- Coating device in which the metal strip at least can be coated on one side with the metallic substrate according to the principle of physical vapor deposition (PVD), and the layer thickness can be adjusted via the parameters of the belt speed and the evaporation rate.
- the system has a control unit which changes the evaporation rate and the belt speed simultaneously with a change in layer thickness and / or a change in width of the metal strip, so that the change in layer thickness can be implemented directly regardless of the thermal evaporation process.
- the present invention is based on the essential knowledge that the layer thickness change can be set directly on the metal strip independently of the slow thermal changeover process by a superimposed speed adjustment. In this way, the formation of larger metal strip sections which do not yet have the desired, newly set layer thickness can be effectively avoided. Furthermore, the adjustment of the evaporation rate is advantageous in order to operate the process or the system at an optimal production speed.
- the evaporation rate is adjusted accordingly. If the layer thickness is reduced, the evaporation rate is reduced; if the layer thickness is increased, it is increased. The slow decrease or increase in the evaporation rate, which lasts for several minutes, is compensated in this phase by a continuous adjustment in the form of an increase or decrease in the belt speed, so that the layer thickness deposited on the subsequent metal belt immediately corresponds to the desired target layer thickness. If, for example, the following strip, which is wider or narrower than the preceding metal strip, is to be coated with the same layer thickness, the evaporation rate is adjusted accordingly. If the following belt is narrower, the evaporation rate is reduced.
- the evaporation rate is increased.
- the slow decrease or increase in the evaporation rate which lasts for several minutes, is compensated in this phase by a continuous adjustment in the form of an increase or decrease in the belt speed, so that the layer thickness deposited on the following belt immediately corresponds to the desired target layer thickness
- the following strip can be made wider than the preceding metal strip, the layer thickness on the following strip being intended to be greater than on the preceding metal strip.
- the evaporation rate is increased accordingly and the belt speed is reduced.
- the slow increase in the evaporation rate which lasts for several minutes, is compensated in this phase by continuously lowering the belt speed so that the layer thickness deposited on the following belt immediately corresponds to the desired target layer thickness.
- the following strip can be made wider than the preceding metal strip, the layer thickness on the following strip should be smaller than on the preceding metal strip.
- the change in the evaporation rate and the belt speed are dependent on the change in width of the subsequent belt and the target layer thickness. If, for example, the evaporation rate and the belt speed are kept constant in this constellation, a smaller layer thickness is automatically established due to the larger area to be coated on the subsequent belt. If, for example, only the belt speed is reduced, then, due to the larger surface to be coated on the following belt, an even smaller layer thickness is automatically established. Basically, however, both the evaporation rate and the belt speed become more desirable Targets changed simultaneously in such a way that the layer thickness deposited on the following strip immediately corresponds to the desired target layer thickness.
- the following strip can be made narrower than the preceding metal strip, the layer thickness on the following strip being intended to be greater than on the previous one
- the evaporation rate and the belt speed are changed simultaneously in such a way that the layer thickness deposited on the subsequent belt immediately corresponds to the desired target layer thickness
- the following strip can be made narrower than the preceding metal strip, the layer thickness on the following strip being intended to be smaller than on the previous one
- the evaporation rate and the belt speed are changed simultaneously in such a way that the layer thickness deposited on the subsequent belt immediately corresponds to the desired target layer thickness.
- the evaporation rate and the belt speed are changed together at fixed time intervals so that the two parameters can be matched to one another in a particularly fine manner.
- the smaller the time interval selected the more precisely a change in layer thickness and / or a change in width of the metal strip can be carried out.
- the change in layer thickness and / or the change in width of the metal strip preferably takes place via pairs of values of evaporation rate and strip speed per time interval, which are particularly preferably based on historical data and / or a model relationship.
- the speed adjustment can be precontrolled accordingly per unit of time in order to achieve an immediate adjustment.
- the metal band is preferably a steel band.
- the metallic substrate preferably comprises zinc, so that a pure zinc layer is formed as the resulting coating.
- the metallic substrate can also have contents of magnesium, aluminum, iron or silicon, so that a zinc alloy layer is formed as the resulting coating. In a particularly preferred embodiment variant, this is
- Change in layer thickness and / or the change in width of the metal strip at least 10%, more preferably 15%, even more preferably 20% and most preferably 25%.
- a layer thickness measuring device is preferably used, which is arranged downstream of the coating device. With the downstream layer thickness measuring device, the layer thickness can be regulated by adjusting the belt speed and the evaporation rate.
- FIG. 1 shows a schematically simplified side view of an embodiment variant of the system according to the invention.
- FIG. 1 an embodiment of a system 1 according to the invention is shown in a schematically greatly simplified side view.
- the system 1 is suitable for carrying out the method according to the invention in which a metal strip 10 is carried out by means of a metallic substrate 12 according to the principle of physical vapor deposition (PVD), the layer thickness being set via the parameters of the belt speed and the evaporation rate according to the following formula .
- PVD physical vapor deposition
- the system 1 initially comprises a continuous treatment line 2 in which the metal strip 10 is initially unwound by a first reel device 11 and is rewound again at the end of the treatment line 2 by a second reel device 13. Within the treatment line 2, the metal strip 10 is moved in a direction of movement of the arrow 3 and thereby passes through several stations.
- the system 1 comprises a pickling device 14 arranged in the treatment line 2 and a coating device 16 arranged downstream.
- the surfaces of the metal strip 10, for example a steel strip are prepared so that they can then be coated in the coating device 16.
- the metal strip 10 is then coated on at least one side, preferably on both sides, with the metallic substrate 12, for example a zinc layer, according to the principle of physical vapor deposition (PVD).
- PVD physical vapor deposition
- the belt speed can be adjusted by changing the above formula.
- the same relationship also applies to a change in width or to a combination.
- the method therefore provides that when the layer thickness changes and / or the width of the metal strip 10 changes, the evaporation rate and the strip speed are changed simultaneously, so that the layer thickness change can be implemented directly independently of the thermal evaporation process. With others she can
- the system 1 comprises a control unit 18 which changes the evaporation rate and the belt speed simultaneously when the layer thickness changes and / or the width of the metal strip 10 changes, so that the layer thickness change can be implemented directly independently of the thermal evaporation process.
- the control unit 18 is EDP-supported and additionally comprises a memory unit 19 in which value pairs of evaporation rates and belt speeds are stored per time interval. These can, for example, be based on past data or models. If, for example, a new, 25% smaller layer thickness is to be applied to the metal strip 10, the evaporation rate is reduced via the control unit 18.
- a layer thickness measuring device 20 is additionally arranged in the treatment line 2 downstream of the coating device 16, via which the coating is checked.
- a correction value can then be determined and adapted with this measured value.
- the coating thickness measuring device 20 is connected to the control unit 18 so that if the values fall below or exceed predetermined values, the coating can be readjusted according to the mathematical relationship shown in order to achieve a uniform coating.
Abstract
Description
Claims
Priority Applications (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202080030917.XA CN113728122A (zh) | 2019-04-23 | 2020-04-22 | Pvd厚度控制 |
KR1020217034961A KR20210143889A (ko) | 2019-04-23 | 2020-04-22 | Pvd 두께 제어 장치 |
EP20720821.6A EP3959348A1 (de) | 2019-04-23 | 2020-04-22 | Pvd dickenregelung |
US17/606,224 US20220316050A1 (en) | 2019-04-23 | 2020-04-22 | Pvd thickness control |
Applications Claiming Priority (4)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102019205794.2 | 2019-04-23 | ||
DE102019205794 | 2019-04-23 | ||
DE102020200366.1 | 2020-01-14 | ||
DE102020200366.1A DE102020200366A1 (de) | 2019-04-23 | 2020-01-14 | PVD Dickenregelung |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2020216775A1 true WO2020216775A1 (de) | 2020-10-29 |
Family
ID=72840075
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/EP2020/061168 WO2020216775A1 (de) | 2019-04-23 | 2020-04-22 | Pvd dickenregelung |
Country Status (6)
Country | Link |
---|---|
US (1) | US20220316050A1 (de) |
EP (1) | EP3959348A1 (de) |
KR (1) | KR20210143889A (de) |
CN (1) | CN113728122A (de) |
DE (1) | DE102020200366A1 (de) |
WO (1) | WO2020216775A1 (de) |
Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1521573A1 (de) | 1965-11-10 | 1969-11-06 | Unites States Steel Corp | Regelanlage fuer Bedampfungsapparate |
EP0176852A1 (de) | 1984-09-17 | 1986-04-09 | Nisshin Steel Co., Ltd. | Kontinuierliche Vorrichtung zur Vakuumbedampfung mit Platte zur Regelung der Breite des Dampfstrahls |
JPS6296669A (ja) * | 1985-10-23 | 1987-05-06 | Nisshin Steel Co Ltd | 合金化蒸着亜鉛めっき鋼板の製造方法 |
JPH05287528A (ja) * | 1992-04-10 | 1993-11-02 | Mitsubishi Heavy Ind Ltd | 蒸着膜厚の制御装置 |
JP2008138227A (ja) * | 2006-11-30 | 2008-06-19 | Toray Advanced Film Co Ltd | ウエッブ状被蒸着材の蒸着膜厚制御方法 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5871805A (en) * | 1996-04-08 | 1999-02-16 | Lemelson; Jerome | Computer controlled vapor deposition processes |
IT1291883B1 (it) * | 1997-04-18 | 1999-01-21 | Sviluppo Materiali Spa | Procedimento per la produzione in continuo, tramite deposizione fisica da fase vapore, di nastri metallici rivestiti con elevata |
JP3630220B2 (ja) * | 1999-02-09 | 2005-03-16 | 東洋紡績株式会社 | 真空蒸着装置 |
US6610181B1 (en) * | 2001-04-30 | 2003-08-26 | Advanced Micro Devices, Inc. | Method of controlling the formation of metal layers |
JP4844867B2 (ja) * | 2005-11-15 | 2011-12-28 | 住友電気工業株式会社 | 真空蒸着装置の運転方法および真空蒸着装置 |
-
2020
- 2020-01-14 DE DE102020200366.1A patent/DE102020200366A1/de active Pending
- 2020-04-22 WO PCT/EP2020/061168 patent/WO2020216775A1/de active Application Filing
- 2020-04-22 CN CN202080030917.XA patent/CN113728122A/zh active Pending
- 2020-04-22 US US17/606,224 patent/US20220316050A1/en active Pending
- 2020-04-22 KR KR1020217034961A patent/KR20210143889A/ko not_active Application Discontinuation
- 2020-04-22 EP EP20720821.6A patent/EP3959348A1/de active Pending
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE1521573A1 (de) | 1965-11-10 | 1969-11-06 | Unites States Steel Corp | Regelanlage fuer Bedampfungsapparate |
EP0176852A1 (de) | 1984-09-17 | 1986-04-09 | Nisshin Steel Co., Ltd. | Kontinuierliche Vorrichtung zur Vakuumbedampfung mit Platte zur Regelung der Breite des Dampfstrahls |
JPS6296669A (ja) * | 1985-10-23 | 1987-05-06 | Nisshin Steel Co Ltd | 合金化蒸着亜鉛めっき鋼板の製造方法 |
JPH05287528A (ja) * | 1992-04-10 | 1993-11-02 | Mitsubishi Heavy Ind Ltd | 蒸着膜厚の制御装置 |
JP2008138227A (ja) * | 2006-11-30 | 2008-06-19 | Toray Advanced Film Co Ltd | ウエッブ状被蒸着材の蒸着膜厚制御方法 |
Also Published As
Publication number | Publication date |
---|---|
CN113728122A (zh) | 2021-11-30 |
KR20210143889A (ko) | 2021-11-29 |
DE102020200366A1 (de) | 2020-10-29 |
EP3959348A1 (de) | 2022-03-02 |
US20220316050A1 (en) | 2022-10-06 |
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