WO2020182149A1 - 电阻测试治具 - Google Patents

电阻测试治具 Download PDF

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Publication number
WO2020182149A1
WO2020182149A1 PCT/CN2020/078797 CN2020078797W WO2020182149A1 WO 2020182149 A1 WO2020182149 A1 WO 2020182149A1 CN 2020078797 W CN2020078797 W CN 2020078797W WO 2020182149 A1 WO2020182149 A1 WO 2020182149A1
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WIPO (PCT)
Prior art keywords
board
probe assembly
carrier
substrate
test fixture
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PCT/CN2020/078797
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English (en)
French (fr)
Inventor
许根夫
陆志华
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深圳市杰普特光电股份有限公司
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Publication of WO2020182149A1 publication Critical patent/WO2020182149A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices

Definitions

  • the invention relates to a test auxiliary device, in particular to a resistance test fixture.
  • SMD resistors need to be randomly inspected during the mass production process, and multiple pieces of resistors in the same batch are selected for resistance measurement; when resistance measurement is performed, two sets of probes are required to be placed close to the ports on both ends of the resistor; Different batches of resistors have different specifications, and the distances between the ports on both sides of the resistors of different specifications are different.
  • the existing solutions generally adjust the probes manually to make the distance between the two sets of probes correspond to the distances between the ports on both sides of the resistor. The accuracy of the probe is low, so that the probe cannot contact the port of the resistance, and the resistance measurement of the resistance cannot be accurately realized.
  • a resistance test fixture comprising: a substrate, an electric linear module mounted on the substrate, a movable probe assembly connected to the electric linear module, and a fixed probe assembly connected to the substrate;
  • the linear module includes a base connected to the substrate, a driving motor connected to the base, and a sliding table slidably arranged on the base; the movable probe assembly is connected to the sliding table, and the driving motor drives the The sliding table drives the movable probe assembly to move relative to the fixed probe assembly; the fixed probe assembly is arranged corresponding to the movable probe assembly.
  • the resistance test fixture mentioned above drives the sliding table to move relative to the base through a driving motor. Since the movable probe assembly is connected to the sliding table and the fixed probe assembly is connected to the substrate, the gap between the movable probe assembly and the fixed probe assembly can be precisely adjusted. The distance makes it correspond accurately to the distance between the two ports of the resistor.
  • it further includes a first carrier assembly connected to the sliding table, and the first carrier assembly includes a first adapter plate connected to the sliding table, and a first adapter plate connected to the first adapter plate.
  • the first card board is arranged in a U shape; a first push handle is connected to the first carrier board, and the first card board is arranged corresponding to the first push handle.
  • it further includes a second carrier assembly, the second carrier assembly including a guide rail connected to the substrate, a second adapter plate connected to the guide rail, and a second adapter plate connected to the The locking member; the fixed probe assembly is connected to the second adapter plate; the second adapter plate is provided with a first waist-shaped hole, and the substrate is provided with the first waist-shaped hole Corresponding second screw hole; the locking member penetrates the first waist-shaped hole and the second screw hole respectively.
  • the second carrier assembly further includes an adjuster mounted on the base plate and a spring member connected to the base plate; a top block extends on the second adapter plate, the The movable end of the adjuster is arranged corresponding to the top block; the spring member makes the top block abut against the movable end of the adjuster.
  • the second carrier assembly further includes a second card board connected to the second riser board, and a second carrier board installed on the second riser board; the first A second card slot is formed between the two card boards and the second adapter plate, and the second carrier board is installed in the second card slot; the fixed probe assembly is connected to the second carrier board .
  • the second card board is arranged in a U shape; a second push handle is connected to the second carrier board, and the second card board is arranged corresponding to the second push handle.
  • the second adapter plate is provided with a third screw hole
  • the second carrier plate is provided with a second waist-shaped hole corresponding to the third screw hole;
  • the extending direction of the waist hole is corresponding to the sliding direction of the sliding table.
  • the guide rail includes a rail bar connected to the substrate and a slider slidably disposed on the rail bar; the second carrier assembly further includes a limit block connected to the substrate, The limit block is correspondingly arranged with the slider.
  • the substrate includes a vertically arranged side connecting part, a first boss part and a second boss part extending from the lower part of the side connecting part on the same side; the first boss part and The second boss portions are arranged at intervals, the corresponding end of the first adapter plate and the first carrier plate extends to the lower side of the first boss portion, and the second adapter plate is connected to the The corresponding end of the second carrier board extends to the lower side of the second boss portion.
  • FIG. 1 is a three-dimensional schematic diagram of a resistance test fixture according to a preferred embodiment of the present invention
  • Fig. 2 is an exploded schematic diagram of the resistance test fixture shown in Fig. 1;
  • FIG. 3 is an exploded schematic diagram of the electric linear module and the first carrier assembly in FIG. 2;
  • FIG. 4 is an exploded schematic view of the electric linear module and the first carrier assembly in FIG. 2 from another angle;
  • FIG. 5 is an exploded schematic diagram of the second carrier assembly in FIG. 2;
  • Fig. 6 is an exploded schematic view of the second carrier assembly in Fig. 2 from another angle;
  • Figure 7 is a structural diagram of the control circuit in the resistance test fixture.
  • FIG. 1 to FIG. 7 are a resistance test fixture 100 according to a preferred embodiment of the present invention, which is used for contacting the probe to the port of the resistance.
  • the resistance test fixture 100 includes a substrate 20, an electric linear module 30 mounted on the substrate 20, a movable probe assembly 40 connected to the electric linear module 30, and a fixed probe assembly 50 connected to the substrate 20; an electric linear module 30 includes a base 31 connected to the base plate 20, a driving motor 32 connected to the base 31, and a sliding table 33 slidably arranged on the base 31; the movable probe assembly 40 is connected to the sliding table 33, and the driving motor 32 drives the sliding table 33 to drive the movable probe The assembly 40 moves relative to the fixed probe assembly 50; the fixed probe assembly 50 and the movable probe assembly 40 are arranged correspondingly.
  • the sliding table 33 is driven to move relative to the base 31 by the driving motor 32. Since the movable probe assembly 40 is connected to the sliding table 33 and the fixed probe assembly 50 is connected to the base plate 20, the movable probe assembly 40 and the fixed probe assembly 50 can be adjusted accurately.
  • the distance between the two ports of the resistor corresponds accurately to the distance between the two ports of the resistor, so that the probe can accurately contact the port of the resistor under test, which is beneficial to the accurate measurement of the resistance.
  • the resistance test fixture 100 also includes a first carrier connected to the sliding table 33 Component 60, the first carrier component 60 includes a first adapter plate 61 connected to the sliding table 33, a first card board 62 connected to the first adapter plate 61, and a first carrier mounted on the first adapter plate 61 Plate 63; a first card slot 610 is formed between the first adapter plate 61 and the first card plate 62, and the first carrier plate 63 is installed in the first card slot 610; the movable probe assembly 40 and the first carrier plate 63 Connection; specifically, when the movable probe assembly 40 needs to be replaced, the first carrier plate 63 is taken out from the first card slot 610, and then the first card slot 610 is loaded with other movable probe assemblies 40 The first carrier plate 63 can complete the replacement of the movable probe assembly 40, so that the movable probe assembly 40 of different
  • the first card plate 62 in order to facilitate the movement operation of the first carrier plate 63 in the first card slot 610, the first card plate 62 is arranged in a U shape; the first carrier plate 63 is connected with a first push handle 630, A card plate 62 is provided corresponding to the first push handle 630; after the first carrier plate 63 is installed in the first card slot 610, the first push handle 630 can be accommodated in the first card plate 62, by pushing the first pushing handle 630
  • the handle 630 allows the first carrier board 63 to move in the first card slot 610, thereby facilitating the installation and disassembly of the first carrier board 63; further, in order to realize the gap between the first carrier board 63 and the first adapter board 61
  • the first adapter plate 61 is provided with a first screw hole 611, and the first carrier plate 63 is provided with a first through hole 631 corresponding to the first screw hole 611, which passes through the first through hole in turn through the screw
  • the moving direction of the sliding table 33 relative to the base 31 is the first direction
  • the direction parallel to the resistance mounting surface and perpendicular to the first direction is the second direction.
  • the resistance test fixture 100 also includes a second carrier assembly 70.
  • the second carrier assembly 70 includes a rail 71 connecting the substrate 20 and a connecting rail
  • the fixed probe assembly 50 is connected to the second adapter plate 72;
  • the second adapter plate 72 is provided with a first waist-shaped hole 721,
  • the base plate 20 is provided with a second screw hole 21 corresponding to the first waist-shaped hole 721;
  • the locking member 73 is respectively penetrated through the first waist-shaped hole 721 and the second screw hole 21;
  • the needle assembly 40 includes a first probe 41 and a second probe 42
  • the fixed probe assembly 50 includes a third probe 51 and a fourth probe 52, the first probe 41, the second probe 42, the third probe 51.
  • the fourth probe 52 measures the resistance of the resistance through a four-terminal sensing method; specifically, the guide rail 71 is arranged along the second direction, and the second adapter plate 72 is slidably connected to the substrate 20 through the guide rail 71, The guide rail 71 slides the second adapter plate 72, so that the fixed probe assembly 50 and the movable probe assembly 40 correspond accurately in the second direction.
  • the movable probe assembly 40 After the position adjustment of the movable probe assembly 40 is completed, the movable probe assembly 40, The fixed probe assembly 50 can fully contact both ends of the resistor; specifically, the locking member 73 is a screw member, and the first waist-shaped hole 721 extends in the second direction. After the adjustment of the fixed probe assembly 50 is completed, the The locking member 73 is tightened, so that the second adapter plate 72 is attached and fixed to the base plate 20.
  • the resistance test fixture 100 is used to measure the resistance of the thin film resistor. Because the volume of the thin film resistor is relatively small, the second adapter plate 72 needs to be accurately moved to eliminate the mechanical error.
  • the assembly 70 also includes an adjuster 74 installed on the base plate 20 and a spring member 75 connected to the base plate 20; a top block 723 extends on the second adapter plate 72, and the movable end of the adjuster 74 is arranged corresponding to the top block 723; a spring The piece 75 makes the top block 723 abut against the movable end of the adjuster 74; specifically, a first support rod 22 is connected to the base plate 20, and a second support rod 722 is connected to the second adapter plate 72; the first support rod 22 Set close to the adjuster 74, the second support rod 722 is located away from the adjuster 74, and the two ends of the spring member 75 are respectively connected to the first support rod 22 and the second support rod 722; in this embodiment, the adjuster 74 is a micrometer
  • the second carrier assembly 70 also includes a second adapter plate 72 A second card board 76, and a second carrier board 77 installed on the second riser board 72; a second card slot 724 is formed between the second card board 76 and the second riser board 72, and the second carrier board 77 Installed in the second slot 724; the fixed probe assembly 50 is connected to the second carrier board 77; specifically, when the fixed probe assembly 50 needs to be replaced, the second carrier board 77 is taken out of the second slot 724 , And then install the second carrier plate 77 connected to the other fixed probe assembly 50 in the second card slot 724 to complete the replacement of the fixed probe assembly 50, so that the fixed probe assembly 50 can be replaced with different specifications for different tested resistors.
  • the probe assembly 50 or by replacing the second carrier plate 77 after the fixed probe assembly 50 is worn out, can replace the fixed probe assembly 50 and keep the fixed probe
  • the second carrier board 76 in order to facilitate the movement operation of the second carrier board 77 in the second slot 724, the second carrier board 76 is arranged in a U shape; the second carrier board 77 is connected with a second push handle 771, The two card plates 76 are arranged corresponding to the second push handle 771; after the second carrier plate 77 is installed in the second card slot 724, the second push handle 771 can be accommodated in the second card board 76.
  • the handle 771 allows the second carrier board 77 to move in the second slot 724, thereby facilitating the installation and removal of the second carrier board 77.
  • the second adapter plate 72 is provided There is a third screw hole 725, the second carrier plate 77 is provided with a second waist-shaped hole 770 corresponding to the third screw hole 725; the extension direction of the second waist-shaped hole 770 is set corresponding to the sliding direction of the sliding table 33; The screw member passes through the second waist-shaped hole 770 and the third screw hole 725 in sequence, so that after the second carrier plate 77 is adjusted, the second carrier plate 77 and the second adapter plate 72 can be fixed.
  • the guide rail 71 in order to prevent the second adapter plate 72 from being separated from the base plate 20, includes a rail bar 711 connected to the base plate 20, and a slider 712 slidably disposed on the rail bar 711; the second carrier assembly 70 is also It includes a limit block 78 connected to the substrate 20, and the limit block 78 is arranged corresponding to the slider 712; thus, the limit block 78 is used to limit the moving distance of the slider 712, so as to prevent the second adapter plate 72 from separating from the substrate during the sliding process 20.
  • the substrate 20 in order to prevent the substrate 20 from blocking the movement of the movable probe assembly 40 relative to the fixed probe assembly 50, the substrate 20 includes a vertically arranged side connecting portion 23 and a self The first boss portion 24 and the second boss portion 25 extending on the same side from the lower part of the side connecting portion 23; the first boss portion 24 and the second boss portion 25 are spaced apart, the first adapter plate 61 and the first carrier board The end corresponding to 63 extends to the lower side of the first boss portion 24, and the end corresponding to the second adapter plate 72 and the second carrier plate 77 extends to the lower side of the second boss portion 25; specifically, the movable probe assembly 40.
  • the fixed probe assembly 50 is arranged between the first boss portion 24 and the second boss portion 25, so as to prevent the movement of the movable probe assembly 40 relative to the fixed probe assembly 50 from being affected by the substrate 20, and can facilitate Observe and monitor the detection action of the resistance test fixture 100; specifically, the external lifting movement mechanism is connected to the side connecting portion 23, and the movable probe assembly 40 and the fixed probe assembly 50 are respectively connected to different tested probes through the external lifting movement mechanism.
  • the resistance makes contact.
  • the resistance test fixture 100 may alternately test resistances of several specifications, in order to quickly switch the position of the movable probe assembly 40 and avoid manual repeated adjustments, the resistance test fixture 100 also includes a control circuit 80.
  • the control circuit 80 includes an input unit 81, a comparison unit 82 connected to the input unit 81, a storage unit 83 connected to the comparison unit 82, and an output unit 84 connected to the comparison unit 82; the output unit 84 is used to input the resistance batch to be tested Specifically, the specifications of the resistance to be tested can be input to the input unit 81 through buttons, input signal ports, or other input devices; the storage unit 83 records the current position value of the active probe assembly 40 and the The target position value of the movable probe assembly 40 corresponding to the resistances of different specifications; the comparison unit 82 obtains the corresponding target position value of the movable probe assembly 40 in the storage unit 83 according to the resistance specification input by the input unit 81, and compares the activity probe The target position value of the needle assembly 40 is
  • the sliding table is driven to move relative to the base by the driving motor. Since the movable probe assembly is connected to the sliding table and the fixed probe assembly is connected to the substrate, the distance between the movable probe assembly and the fixed probe assembly can be adjusted accurately , Make it correspond accurately to the distance between the two ports of the resistor.

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  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

一种电阻测试治具（100），包括基板（20）、安装在基板（20）上的电动线性模组（30）、连接电动线性模组（30）的活动探针组件（40）、及连接基板（20）的固定探针组件（50）；电动线性模组（30）包括连接基板（20）的底座（31）、连接底座（31）的驱动电机（32）、及滑动设置在底座（31）上的滑台（33）；活动探针组件（40）连接滑台（33），驱动电机（32）驱动滑台（33）带动活动探针组件（40）相对固定探针组件（50）移动；固定探针组件（50）与活动探针组件（40）对应设置；还包括连接滑台（33）的第一载具组件（60），第一载具组件（60）包括连接滑台（33）的第一转接板（61）、连接第一转接板（61）的第一卡板（62）、及第一载板（63）；通过驱动电机（32）驱动滑台（33）相对底座（31）移动，由于活动探针组件（40）与滑台（33）连接，固定探针组件（50）连接基板（20），从而可精确地调节活动探针组件（40）与固定探针组件（50）之间的距离，使其与电阻的两端口之间的距离准确对应。

Description

电阻测试治具 技术领域
本发明涉及测试辅助装置，特别是涉及一种电阻测试治具。
背景技术
贴片电阻在批量生产的过程中，需要进行抽检，在同一批次的电阻中抽取多片进行阻值测量；在进行阻值测量时，需要利用两组探针分别贴近电阻两端的端口；由于不同批次的电阻的规格不同，不同规格电阻的两侧端口的间距存在差异，现有方案一般通过人工调节探针，令两组探针的间距与电阻两侧端口的间距对应，然而人工调节探针的精度较低，导致探针无法与电阻的端口接触，无法准确实现电阻的阻值测量。
发明内容
基于此，有必要提供一种自动实现探针调节的电阻测试治具。
一种电阻测试治具，包括：基板、安装在所述基板上的电动线性模组、连接所述电动线性模组的活动探针组件、及连接所述基板的固定探针组件；所述电动线性模组包括连接所述基板的底座、连接所述底座的驱动电机、及滑动设置在所述底座上的滑台；所述活动探针组件连接所述滑台，所述驱动电机驱动所述滑台带动所述活动探针组件相对所述固定探针组件移动；所述固定探针组件与所述活动探针组件对应设置。
上述电阻测试治具，通过驱动电机驱动滑台相对底座移动，由于活动探针 组件与滑台连接，固定探针组件连接基板，从而可精确地调节活动探针组件与固定探针组件之间的距离，使其与电阻的两端口之间的距离准确对应。
在其中一个实施例中，还包括连接所述滑台的第一载具组件，所述第一载具组件包括连接所述滑台的第一转接板、连接所述第一转接板的第一卡板、及安装在所述第一转接板上的第一载板；所述第一转接板与所述第一卡板之间形成有第一卡槽，所述第一载板安装在所述第一卡槽中；所述活动探针组件与所述第一载板连接。
在其中一个实施例中，所述第一卡板呈U形设置；所述第一载板上连接有第一推柄，所述第一卡板与所述第一推柄对应设置。
在其中一个实施例中，还包括第二载具组件，所述第二载具组件包括连接所述基板的导轨、连接所述导轨的第二转接板、及连接所述第二转接板的锁定件；所述固定探针组件与所述第二转接板连接；所述第二转接板上设有第一腰型孔，所述基板上设有与所述第一腰型孔对应的第二螺孔；所述锁定件分别穿设所述第一腰型孔及所述第二螺孔中。
在其中一个实施例中，所述第二载具组件还包括安装在所述基板上的调节器、及连接所述基板的弹簧件；所述第二转接板上延伸有顶块，所述调节器的活动端与所述顶块对应设置；所述弹簧件令所述顶块与所述调节器的活动端相抵靠。
在其中一个实施例中，所述第二载具组件还包括连接所述第二转接板的第二卡板、及安装在所述第二转接板上的第二载板；所述第二卡板与所述第二转接板之间形成有第二卡槽，所述第二载板安装在所述第二卡槽中；所述固定探针组件与所述第二载板连接。
在其中一个实施例中，所述第二卡板呈U形设置；所述第二载板上连接有 第二推柄，所述第二卡板与所述第二推柄对应设置。
在其中一个实施例中，所述第二转接板上设有第三螺孔，所述第二载板上设有与所述第三螺孔对应的第二腰型孔；所述第二腰型孔的延伸方向与所述滑台的滑动方向对应设置。
在其中一个实施例中，所述导轨包括连接所述基板的轨道条、及滑动设置在所述轨道条上的滑块；所述第二载具组件还包括连接所述基板的限位块，所述限位块与所述滑块对应设置。
在其中一个实施例中，所述基板包括竖直设置的侧连部、自所述侧连部下部同侧延伸的第一凸台部及第二凸台部；所述第一凸台部与所述第二凸台部之间间隔设置，所述第一转接板与所述第一载板对应的一端延伸至所述第一凸台部的下侧，所述第二转接板与所述第二载板对应的一端延伸至所述第二凸台部的下侧。
附图说明
图1为本发明的一较佳实施例的电阻测试治具的立体示意图；
图2为图1所示的电阻测试治具的分解示意图；
图3为图2中的电动线性模组及第一载具组件的分解示意图；
图4为图2中的电动线性模组及第一载具组件在另一角度的分解示意图；
图5为图2中的第二载具组件的分解示意图；
图6为图2中的第二载具组件在另一角度的分解示意图；
图7为电阻测试治具中的控制电路的结构图。
具体实施方式
为了便于理解本发明，下面将对本发明进行更全面的描述。但是，本发明可以以许多不同的形式来实现，并不限于本文所描述的实施例。相反地，提供这些实施例的目的是使对本发明的公开内容的理解更加透彻全面。
除非另有定义，本文所使用的所有的技术和科学术语与属于本发明的技术领域的技术人员通常理解的含义相同。本文中在本发明的说明书中所使用的术语只是为了描述具体的实施例的目的，不是旨在于限制本发明。
请参阅图1至图7，为本发明一较佳实施方式的电阻测试治具100，用于将探针接触至电阻的端口。该电阻测试治具100包括基板20、安装在基板20上的电动线性模组30、连接电动线性模组30的活动探针组件40、及连接基板20的固定探针组件50；电动线性模组30包括连接基板20的底座31、连接底座31的驱动电机32、及滑动设置在底座31上的滑台33；活动探针组件40连接滑台33，驱动电机32驱动滑台33带动活动探针组件40相对固定探针组件50移动；固定探针组件50与活动探针组件40对应设置。
通过驱动电机32驱动滑台33相对底座31移动，由于活动探针组件40与滑台33连接，固定探针组件50连接基板20，从而可精确地调节活动探针组件40与固定探针组件50之间的距离，使其与电阻的两端口之间的距离准确对应，从而令探针能准确接触被测电阻的端口，有利于阻值的准确测量。
请参阅图3及图4，在其中一个实施方式中，为方便更换活动探针组件40，以适应不同规格的电阻或应对磨损，电阻测试治具100还包括连接滑台33的第一载具组件60，第一载具组件60包括连接滑台33的第一转接板61、连接第一转接板61的第一卡板62、及安装在第一转接板61上的第一载板63；第一转接板61与第一卡板62之间形成有第一卡槽610，第一载板63安装在第一卡槽610中；活动探针组件40与第一载板63连接；具体地，在需更换活动探针组件40 时，通过将第一载板63从第一卡槽610中取出，然后在第一卡槽610中装入连接有其他活动探针组件40的第一载板63，即可完成活动探针组件40的更换，从而可针对不同的被测电阻更换不同规格的活动探针组件40，例如不同弹性、长度、间距的活动探针组件40，或在活动探针组件40长期使用磨损后通过更换第一载板63，实现活动探针组件40的更换，保持活动探针组件40与被测电阻的可靠接触。
在其中一个实施方式中，为方便第一载板63在第一卡槽610中的移动操作，第一卡板62呈U形设置；第一载板63上连接有第一推柄630，第一卡板62与第一推柄630对应设置；在第一载板63安装到第一卡槽610中后，第一推柄630可容置在第一卡板62中，通过推动第一推柄630，可使第一载板63在第一卡槽610中移动，从而方便了第一载板63的安装及拆卸；进一步地，为实现第一载板63与第一转接板61之间的可靠固定，第一转接板61上设有第一螺孔611，第一载板63上设有与第一螺孔611对应的第一通孔631，通过螺钉件依次穿过第一通孔631及第一螺孔611，从而可实现第一载板63与第一转接板61的可靠固定。
请参阅图1及图5，在其中一个实施方式中，滑台33相对底座31移动的方向为第一方向，平行电阻安装面且与第一方向垂直的方向为第二方向，为消除在第二方向上活动探针组件40与固定探针组件50之间的机械误差，电阻测试治具100还包括第二载具组件70，第二载具组件70包括连接基板20的导轨71、连接导轨71的第二转接板72、及连接第二转接板72的锁定件73；固定探针组件50与第二转接板72连接；第二转接板72上设有第一腰型孔721，基板20上设有与第一腰型孔721对应的第二螺孔21；锁定件73分别穿设第一腰型孔721及第二螺孔21中；在本实施方式中，活动探针组件40包括第一探针41及第二 探针42，固定探针组件50包括第三探针51及第四探针52，第一探针41、第二探针42、第三探针51、及第四探针52通过四端传感方式对电阻的阻值进行测量；具体地，导轨71沿第二方向设置，第二转接板72通过导轨71与基板20滑动连接，通过沿导轨71滑动第二转接板72，从而可使固定探针组件50与活动探针组件40在第二方向上准确对应，在活动探针组件40的位置调节完成后，活动探针组件40、固定探针组件50均能充分与电阻的两端接触；具体地，锁定件73为螺钉件，第一腰型孔721沿第二方向延伸，在完成固定探针组件50的调节后，通过收紧锁定件73，从而令第二转接板72贴合固定到基板20上。
在其中一个实施方式中，电阻测试治具100用于薄膜电阻的阻值测量，由于薄膜电阻的体积较为细小，需要对第二转接板72进行精确移动，才能消除机械误差，第二载具组件70还包括安装在基板20上的调节器74、及连接基板20的弹簧件75；第二转接板72上延伸有顶块723，调节器74的活动端与顶块723对应设置；弹簧件75令顶块723与调节器74的活动端相抵靠；具体地，基板20上连接有第一支杆22，第二转接板72上连接有第二支杆722；第一支杆22靠近调节器74设置，第二支杆722远离调节器74设置，弹簧件75的两端分别与第一支杆22、第二支杆722连接；在本实施方式中，调节器74为微分头；通过调节器74的调节，使得固定探针组件50可在第二方向上相对活动探针组件40精确移动，消除微小的机械误差，从而可适用于体积细小的薄膜电阻的阻值测量。
请参阅图5及图6，在其中一个实施方式中，为方便更换固定探针组件50，以适应不同规格的电阻或应对磨损，第二载具组件70还包括连接第二转接板72的第二卡板76、及安装在第二转接板72上的第二载板77；第二卡板76与第二转接板72之间形成有第二卡槽724，第二载板77安装在第二卡槽724中；固定 探针组件50与第二载板77连接；具体地，在需更换固定探针组件50时，通过将第二载板77从第二卡槽724中取出，然后在第二卡槽724中装入连接有其他固定探针组件50的第二载板77，即可完成固定探针组件50的更换，从而可针对不同的被测电阻更换不同规格的固定探针组件50，或在固定探针组件50磨损后通过更换第二载板77，实现固定探针组件50的更换，保持固定探针组件50与被测电阻的可靠接触。
在其中一个实施方式中，为方便第二载板77在第二卡槽724中的移动操作，第二卡板76呈U形设置；第二载板77上连接有第二推柄771，第二卡板76与第二推柄771对应设置；在第二载板77安装到第二卡槽724中后，第二推柄771可容置在第二卡板76中，通过推动第二推柄771，可使第二载板77在第二卡槽724中移动，从而方便了第二载板77的安装及拆卸。
在其中一个实施方式中，为方便沿第一方向调节固定探针组件50的位置，以消除在第一方向上固定探针组件50相对被测电阻的机械误差，第二转接板72上设有第三螺孔725，第二载板77上设有与第三螺孔725对应的第二腰型孔770；第二腰型孔770的延伸方向与滑台33的滑动方向对应设置；通过螺钉件依次穿过第二腰型孔770及第三螺孔725，从而在第二载板77调节完成后，可实现第二载板77与第二转接板72的固定。
在其中一个实施方式中，为避免第二转接板72脱离基板20，导轨71包括连接基板20的轨道条711、及滑动设置在轨道条711上的滑块712；第二载具组件70还包括连接基板20的限位块78，限位块78与滑块712对应设置；从而利用限位块78对滑块712的移动距离进行限制，避免第二转接板72在滑动过程中脱离基板20。
请参阅图1及图2，在其中一个实施方式中，为避免基板20对活动探针组 件40相对固定探针组件50的移动造成遮挡影响，基板20包括竖直设置的侧连部23、自侧连部23下部同侧延伸的第一凸台部24及第二凸台部25；第一凸台部24与第二凸台部25间隔设置，第一转接板61与第一载板63对应的一端延伸至第一凸台部24的下侧，第二转接板72与第二载板77对应的一端延伸至第二凸台部25的下侧；具体地，活动探针组件40、固定探针组件50设置在第一凸台部24与第二凸台部25之间，从而避免活动探针组件40相对固定探针组件50的移动收到基板20的影响，且可方便对电阻测试治具100的检测动作进行观察监控；具体地，外部升降移动机构与侧连部23连接，通过外部升降移动机构使活动探针组件40、固定探针组件50分别与不同的被测电阻进行接触。
请参阅图7，具体地，由于电阻测试治具100可能对几种规格的电阻进行交替测试，为快速切换活动探针组件40的位置，避免人工重复调节，电阻测试治具100还包括控制电路80，控制电路80包括输入单元81、连接输入单元81的比较单元82、连接比较单元82的存储单元83、及连接比较单元82的输出单元84；输出单元84用于输入即将进行测试的电阻批次的规格；具体地，可通过按键、输入信号端口、或其他输入设备向输入单元81输入即将进行测试的电阻的规格；存储单元83中记录有活动探针组件40的当前位置值、以及与不同规格的电阻对应的活动探针组件40目标位置值；比较单元82根据输入单元81输入的电阻规格，在存储单元83中获得所对应的活动探针组件40目标位置值，并将该活动探针组件40目标位置值与活动探针组件40的当前位置值进行对比，并产生活动探针组件40目标位置值与活动探针组件40的当前位置值之间的位置差值；输出单元84根据位置差值向驱动电机32输出转动信号，令活动探针组件40移动预定的距离，使活动探针组件40与固定探针组件50之间的距离刚好与即将进行测试的电阻两端口的距离对应，避免了人工对电动线性模组30的 重复调节；具体地，驱动电机32为步进电机或伺服电机，驱动电机32通过滚珠丝杆驱动滑台33精确移动。
本实施例中，通过驱动电机驱动滑台相对底座移动，由于活动探针组件与滑台连接，固定探针组件连接基板，从而可精确地调节活动探针组件与固定探针组件之间的距离，使其与电阻的两端口之间的距离准确对应。
以上所述实施例的各技术特征可以进行任意的组合，为使描述简洁，未对上述实施例中的各个技术特征所有可能的组合都进行描述，然而，只要这些技术特征的组合不存在矛盾，都应当认为是本说明书记载的范围。
以上所述实施例仅表达了本发明的几种实施方式，其描述较为具体和详细，但并不能因此而理解为对发明专利范围的限制。应当指出的是，对于本领域的普通技术人员来说，在不脱离本发明构思的前提下，还可以做出若干变形和改进，这些都属于本发明的保护范围。因此，本发明专利的保护范围应以所附权利要求为准。

Claims (10)

  1. 一种电阻测试治具，其特征在于，包括：基板、安装在所述基板上的电动线性模组、连接所述电动线性模组的活动探针组件、及连接所述基板的固定探针组件；所述电动线性模组包括连接所述基板的底座、连接所述底座的驱动电机、及滑动设置在所述底座上的滑台；所述活动探针组件连接所述滑台，所述驱动电机驱动所述滑台带动所述活动探针组件相对所述固定探针组件移动；所述固定探针组件与所述活动探针组件对应设置。
  2. 根据权利要求1所述的电阻测试治具，其特征在于，还包括连接所述滑台的第一载具组件，所述第一载具组件包括连接所述滑台的第一转接板、连接所述第一转接板的第一卡板、及安装在所述第一转接板上的第一载板；所述第一转接板与所述第一卡板之间形成有第一卡槽，所述第一载板安装在所述第一卡槽中；所述活动探针组件与所述第一载板连接。
  3. 根据权利要求2所述的电阻测试治具，其特征在于，所述第一卡板呈U形设置；所述第一载板上连接有第一推柄，所述第一卡板与所述第一推柄对应设置。
  4. 根据权利要求2所述的电阻测试治具，其特征在于，还包括第二载具组件，所述第二载具组件包括连接所述基板的导轨、连接所述导轨的第二转接板、及连接所述第二转接板的锁定件；所述固定探针组件与所述第二转接板连接；所述第二转接板上设有第一腰型孔，所述基板上设有与所述第一腰型孔对应的第二螺孔；所述锁定件分别穿设所述第一腰型孔及所述第二螺孔中。
  5. 根据权利要求4所述的电阻测试治具，其特征在于，所述第二载具组件还包括安装在所述基板上的调节器、及连接所述基板的弹簧件；所述第二转接板上延伸有顶块，所述调节器的活动端与所述顶块对应设置；所述弹簧件令所 述顶块与所述调节器的活动端相抵靠。
  6. 根据权利要求4所述的电阻测试治具，其特征在于，所述第二载具组件还包括连接所述第二转接板的第二卡板、及安装在所述第二转接板上的第二载板；所述第二卡板与所述第二转接板之间形成有第二卡槽，所述第二载板安装在所述第二卡槽中；所述固定探针组件与所述第二载板连接。
  7. 根据权利要求6所述的电阻测试治具，其特征在于，所述第二卡板呈U形设置；所述第二载板上连接有第二推柄，所述第二卡板与所述第二推柄对应设置。
  8. 根据权利要求6所述的电阻测试治具，其特征在于，所述第二转接板上设有第三螺孔，所述第二载板上设有与所述第三螺孔对应的第二腰型孔；所述第二腰型孔的延伸方向与所述滑台的滑动方向对应设置。
  9. 根据权利要求4所述的电阻测试治具，其特征在于，所述导轨包括连接所述基板的轨道条、及滑动设置在所述轨道条上的滑块；所述第二载具组件还包括连接所述基板的限位块，所述限位块与所述滑块对应设置。
  10. 根据权利要求4所述的电阻测试治具，其特征在于，所述基板包括竖直设置的侧连部、自所述侧连部下部同侧延伸的第一凸台部及第二凸台部；所述第一凸台部与所述第二凸台部之间间隔设置，所述第一转接板与所述第一载板对应的一端延伸至所述第一凸台部的下侧，所述第二转接板与所述第二载板对应的一端延伸至所述第二凸台部的下侧。
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