WO2020164317A1 - 阵列基板及其制备方法、显示面板和显示装置 - Google Patents
阵列基板及其制备方法、显示面板和显示装置 Download PDFInfo
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- WO2020164317A1 WO2020164317A1 PCT/CN2019/128735 CN2019128735W WO2020164317A1 WO 2020164317 A1 WO2020164317 A1 WO 2020164317A1 CN 2019128735 W CN2019128735 W CN 2019128735W WO 2020164317 A1 WO2020164317 A1 WO 2020164317A1
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- pixel defining
- defining layer
- pixel
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- array substrate
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- 239000000758 substrate Substances 0.000 title claims abstract description 38
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 239000000463 material Substances 0.000 claims description 13
- 229920002120 photoresistant polymer Polymers 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 7
- 229910052581 Si3N4 Inorganic materials 0.000 claims description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 6
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 claims description 6
- 229910052814 silicon oxide Inorganic materials 0.000 claims description 6
- 239000010410 layer Substances 0.000 description 123
- 239000010408 film Substances 0.000 description 8
- 238000005516 engineering process Methods 0.000 description 7
- 230000015572 biosynthetic process Effects 0.000 description 6
- 238000001035 drying Methods 0.000 description 6
- 230000009194 climbing Effects 0.000 description 5
- 238000010586 diagram Methods 0.000 description 5
- 239000002904 solvent Substances 0.000 description 5
- 238000007641 inkjet printing Methods 0.000 description 4
- 239000000243 solution Substances 0.000 description 4
- 230000000694 effects Effects 0.000 description 3
- 208000032750 Device leakage Diseases 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000012044 organic layer Substances 0.000 description 2
- 238000000059 patterning Methods 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000007639 printing Methods 0.000 description 2
- 239000003086 colorant Substances 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000001312 dry etching Methods 0.000 description 1
- 238000005401 electroluminescence Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 239000007788 liquid Substances 0.000 description 1
- 239000004973 liquid crystal related substance Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 229920000642 polymer Polymers 0.000 description 1
- 239000002861 polymer material Substances 0.000 description 1
- 238000012827 research and development Methods 0.000 description 1
- 239000013557 residual solvent Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 238000001039 wet etching Methods 0.000 description 1
Images
Classifications
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/122—Pixel-defining structures or layers, e.g. banks
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/10—OLED displays
- H10K59/12—Active-matrix OLED [AMOLED] displays
- H10K59/1201—Manufacture or treatment
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/20—Changing the shape of the active layer in the devices, e.g. patterning
- H10K71/231—Changing the shape of the active layer in the devices, e.g. patterning by etching of existing layers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K2102/00—Constructional details relating to the organic devices covered by this subclass
- H10K2102/301—Details of OLEDs
- H10K2102/351—Thickness
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/10—Deposition of organic active material
- H10K71/12—Deposition of organic active material using liquid deposition, e.g. spin coating
- H10K71/13—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing
- H10K71/135—Deposition of organic active material using liquid deposition, e.g. spin coating using printing techniques, e.g. ink-jet printing or screen printing using ink-jet printing
Definitions
- the present disclosure relates to the field of display technology, in particular to an array substrate and a preparation method thereof, a display panel and a display device.
- PLED Inkjet printing polymer electroluminescence display
- the solvent vapor evaporates faster at the edge of the droplet, which will cause the droplet to flow from the center to the edge of the solution. This flow will drive the solute to migrate to the edge of the droplet, and finally at the edge.
- the formation of a thicker edge and a thinner edge is called the “coffee ring effect", which makes the film formation in the pixel very uneven, which will cause uneven light emission of the device.
- an array substrate including: a base substrate; a planarization layer formed on the base substrate; a plurality of pixel electrodes formed on the planarization layer; and a pixel defining layer, including a first A pixel defining layer and a second pixel defining layer, the first pixel defining layer covers the outer periphery of the pixel electrode and exposing the central area of the pixel electrode, and the second pixel defining layer is formed between adjacent pixel electrodes
- the planarization layer has a plurality of openings defining each sub-pixel unit; the bottom of the bank of the second pixel defining layer is spaced a predetermined distance from the bottom of the bank of the adjacent first pixel defining layer, and The thickness of the second pixel defining layer is greater than the thickness of the first pixel defining layer.
- the thickness of the first pixel defining layer is 100-500 nanometers, and the thickness of the second pixel defining layer is 1-3 microns.
- the width of the first pixel defining layer covering the outer periphery of the pixel electrode is 1-10 microns.
- the first pixel defining layer includes one or more of silicon nitride and silicon oxide.
- the second pixel defining layer includes a photoresist material.
- Another aspect of the present disclosure provides a display panel including any of the above-mentioned array substrates.
- the plurality of openings of the second pixel defining layer are formed with organic light emitting layers of each sub-pixel unit, and the thickness of the organic light emitting layer is greater than the thickness of the first pixel defining layer.
- Another aspect of the present disclosure also provides a display device including any of the above-mentioned display panels.
- the present disclosure provides a method for preparing an array substrate, including: forming a planarization layer on a base substrate; forming a plurality of pixel electrodes corresponding to each sub-pixel unit on the planarization layer; A pixel defining layer to cover the outer circumference of the pixel electrode, the first pixel defining layer exposing the central area of the pixel electrode; and forming a second pixel defining layer on the planarization layer between adjacent pixel electrodes
- the second pixel defining layer has a plurality of openings defining each sub-pixel unit; wherein the bottom of the bank of the second pixel defining layer is spaced apart from the bottom of the bank of the adjacent first pixel defining layer. And the thickness of the second pixel defining layer is greater than the thickness of the first pixel defining layer.
- forming the first pixel defining layer includes: forming an insulating dielectric layer covering the planarization layer and the pixel electrode; and etching the insulating dielectric layer to form the first pixel defining layer Floor.
- the insulating dielectric layer includes one or more of silicon nitride and silicon oxide.
- forming the second pixel defining layer includes: forming a photoresist material layer covering the planarization layer, the first pixel defining layer, and the pixel electrode; and patterning the light The resist material layer forms the second pixel defining layer.
- FIG. 1 is a schematic diagram of an array substrate according to an embodiment of the present disclosure.
- FIG. 2 is a schematic diagram of a display panel according to an embodiment of the present disclosure.
- 3A to 3E are schematic diagrams of the manufacturing process of the array substrate according to an embodiment of the present disclosure.
- 4A to 4C are schematic diagrams of the principle of forming an organic light-emitting layer according to the present disclosure.
- Inkjet printing technology is to spray hole injection materials, hole injection materials, and solutions of red, green, and blue luminescent materials on a pre-patterned ITO substrate through a micron-level print nozzle. In the pit, a light-emitting pixel unit of three primary colors of red, green and blue is formed. The thickness of the film is determined by the amount of solute printed in the pixel. Because this method can greatly save expensive luminescent materials, and printing with multiple nozzles (128 or 256 nozzles) can greatly shorten the film production time. Therefore, inkjet printing color patterning technology is used in PLED The manufacturing field has been recognized as the mainstream technology for industrialization.
- Fig. 1 shows a schematic diagram of an array substrate according to an embodiment of the present disclosure. As shown in FIG. 1, it includes a base substrate 10, a planarization layer 20, a plurality of pixel electrodes 30, and a pixel defining layer.
- the pixel defining layer includes a first pixel defining layer 41 and a second pixel defining layer 51.
- the first pixel defining layer 41 covers the periphery of the pixel electrode 30 and exposing the central area of the pixel electrode 30.
- the second pixel defining layer 51 is formed on the adjacent pixel electrode 30
- the planarization layer 20 in between has multiple openings defining each sub-pixel unit.
- the bottom of the bank of the second pixel defining layer 51 is spaced apart from the bottom of the bank of the adjacent first pixel defining layer 41 by a predetermined distance.
- the thickness of the second pixel defining layer 51 is greater than the thickness of the first pixel defining layer 41.
- the thickness of the first pixel defining layer 41 is 100-500 nanometers, and the thickness of the second pixel defining layer 51 is 1-3 micrometers.
- the thickness of the first pixel defining layer 41 is 300 nanometers, and the thickness of the second pixel defining layer 51 is 1.5 micrometers.
- the first pixel defining layer 41 covers the outer periphery of the pixel electrode 30 to prevent device leakage. Therefore, the width of the first pixel defining layer 41 covering the outer periphery of the pixel electrode 30 is too narrow to prevent leakage of the device; if it is too wide, the area covering the pixel electrode 30 is too large and affects the light-emitting area, thereby reducing the light-emitting efficiency. Therefore, the width of the first pixel defining layer 41 covering the outer periphery of the pixel electrode 30 can be 1-10 microns, for example, 3 microns.
- the first pixel defining layer 41 may be formed of an inorganic insulating material, such as one or more of silicon nitride and silicon oxide.
- the second pixel defining layer 51 may be formed of an organic insulating material, such as but not limited to a photoresist material.
- the bottom of the bank of the second pixel defining layer 51 is spaced apart from the bottom of the bank of the first pixel defining layer 41 by a predetermined distance, so that the bank of the second pixel defining layer 51 in the opening defined by the second pixel defining layer 51 and its adjacent first There is no pixel electrode 30 in the area between the banks of the pixel defining layer 41. Refer to FIG. 1 for the specific structure.
- FIG. 2 shows a display panel including the array substrate shown in FIG. 1, in which the thickness of the organic light emitting layer 62 is greater than the thickness of the first pixel defining layer 41. That is, the organic light emitting layer 62 covers the first pixel defining layer 41 in the display panel.
- 3A to 3E show a method of manufacturing an array substrate according to an embodiment of the present disclosure.
- a planarization layer 20 is formed on the base substrate 10 first.
- a plurality of pixel electrodes 30 corresponding to each sub-pixel unit are formed on the planarization layer 20.
- an insulating dielectric layer 40 covering the planarization layer 20 and the pixel electrode 30 is formed.
- the insulating dielectric layer 40 may be formed of one or more of silicon nitride and silicon oxide.
- the insulating dielectric layer 40 may be formed in any form, for example, the insulating dielectric layer 40 may be formed by vapor deposition or the like.
- the insulating dielectric layer 40 is etched by a dry etching or wet etching process to form a first pixel defining layer 41.
- the first pixel defining layer 41 covers the outer periphery of the pixel electrode 30 to avoid device leakage.
- a photoresist material layer 50 covering the planarization layer 20, the first pixel defining layer 41 and the pixel electrode 30 is formed.
- the photoresist material layer 50 is patterned, such as exposure and development, to form the second pixel defining layer 51.
- the second pixel defining layer 51 is formed on the planarization layer 20 spaced apart from adjacent pixel electrodes 30.
- the bottom of the bank of the second pixel defining layer 51 is spaced apart from the bottom of the bank of the first pixel defining layer 41 by a predetermined distance.
- FIG. 3E shows the structure of the array substrate after the second pixel defining layer 51 is formed.
- the array substrate of the present disclosure has two pixel defining layers, and adjacent banks of the two pixel defining layers are separated by a predetermined distance, thereby avoiding edge climbing defects generated during the ink drying process in the opening.
- the specific principle is shown in Figure 4A to Figure 4C.
- the edge solvent evaporates faster, which will cause the droplets to flow from the center to the edge of the solution. This flow will drive the solute to migrate to the edge. This is the reason why the conventional pixel boundary layer causes the edge to climb.
- the liquid level of the incompletely dried ink 61 in the opening is similar to the second pixel defining layer 51, and the incompletely dried ink 61 changes from a solution to a sol-like shape, and the viscosity increases.
- the height of the incompletely dried ink 61 is close to that of the second pixel defining layer 51, since the drying solvent volatilizes very quickly under high vacuum, the volatilization volume of the solvent is basically the same at all positions. Since the adjacent banks of the two pixel defining layers are separated by a predetermined distance, and there is no pixel electrode 30 at the bottom of this area, the incompletely dried ink in this area contains more solvent than the ink in other areas.
- the viscosity of the ink is lower than that in other areas, so the Marangoni reflow effect will occur in this area, so that the solute flows back from the edge to the middle, which alleviates the phenomenon of edge climbing and improves the uniformity of film formation.
- This situation is maintained for a predetermined time, the viscosity of the ink in the opening continues to increase, and finally the residual solvent is basically removed, the ink no longer flows, and a flat organic light-emitting layer 62 is formed at the bottom of the opening of the pixel defining layer.
- the specific structure is shown in FIG. 4C.
- the "predetermined distance" between the bottom of the bank of the second pixel defining layer 51 and the bottom of the first pixel defining layer 41 is to prevent the incompletely dried ink 61 from forming the organic light emitting layer 62.
- the Marangoni backflow effect is formed inside, thereby alleviating the edge climbing phenomenon. Therefore, those skilled in the art can reasonably set the "predetermined distance” according to the type and viscosity of the ink; the drying pressure and temperature; the size of the array substrate to achieve the above-mentioned purpose.
- the organic light emitting layer 62 is formed adjacent to the edge of the bank of the second pixel defining layer 51 there is no corresponding pixel electrode 30, so the edge portion of the organic light emitting layer 62 adjacent to the second pixel defining layer 51 does not emit light, which can effectively suppress the light emission of the organic layer at the edge of the pixel defining layer, thereby further improving the uniformity of light emission within the pixel.
- adjacent banks in the two pixel defining layers are separated by a predetermined distance, so that the ink climbing at the edge can be relieved and the uniformity of film formation can be improved. Furthermore, in the display panel including the above-mentioned array substrate, since the first pixel defining layer and the second pixel defining layer are separated by a predetermined distance, the organic light-emitting layer formed adjacent to the edge of the second pixel defining layer does not have a corresponding pixel electrode. The edge position of the layer does not emit light, which can effectively suppress the light emission of the organic layer at the edge of the pixel defining layer, thereby further improving the uniformity of light emission within the pixel.
- an embodiment of the present disclosure further provides a display device, which may include the above-mentioned display panel, and the display device may be: a liquid crystal panel, an electronic paper, a mobile phone, a tablet computer, a television, a monitor, a notebook computer, a digital photo frame, a navigation Any product or component with display function such as instrument.
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- Engineering & Computer Science (AREA)
- Manufacturing & Machinery (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Electroluminescent Light Sources (AREA)
Abstract
Description
Claims (12)
- 一种阵列基板,包括:衬底基板;形成于所述衬底基板的平坦化层;形成在所述平坦化层上的多个像素电极;及像素界定层,包括第一像素界定层和第二像素界定层,所述第一像素界定层覆盖所述像素电极外周并露出所述像素电极中央区域,所述第二像素界定层形成于相邻所述像素电极之间的所述平坦化层上、并具有限定各个子像素单元的多个开口;所述第二像素界定层堤部的底部与其相邻的所述第一像素界定层堤部的底部间隔预定距离,且所述第二像素界定层的厚度大于所述第一像素界定层的厚度。
- 根据权利要求1所述的阵列基板,其中,所述第一像素界定层的厚度为100纳米-500纳米,所述第二像素界定层的厚度为1微米-3微米。
- 根据权利要求1所述的阵列基板,其中,所述第一像素界定层覆盖所述像素电极外周的宽度为1微米-10微米。
- 根据权利要求1所述的阵列基板,其中,所述第一像素界定层包括氮化硅、氧化硅中的一种或多种。
- 根据权利要求1所述的阵列基板,其中,所述第二像素界定层包括光阻材料。
- 一种显示面板,包括权利要求1-5任一项所述的阵列基板。
- 根据权利要求6所述的显示面板,其中,所述第二像素界定层的多个开口内形成有各个子像素单元的有机发光层,所述有机发光层的厚度大于所述第一像素界定层的厚度。
- 一种显示装置,包括权利要求6或7所述的显示面板。
- 一种阵列基板的制备方法,包括:在衬底基板上形成平坦化层;在所述平坦化层上形成对应于各个子像素单元的多个像素电极;在形成第一像素界定层以覆盖所述像素电极外周,所述第一像素界定层 露出所述像素电极的中央区域;及在相邻所述像素电极之间的所述平坦化层上形成第二像素界定层,所述第二像素界定层具有限定各个子像素单元的多个开口;其中,所述第二像素界定层堤部的底部与其相邻的所述第一像素界定层堤部的底部间隔预定距离,且所述第二像素界定层的厚度大于所述第一像素界定层的厚度。
- 根据权利要求9所述的制备方法,其中,形成所述第一像素界定层包括:形成覆盖所述平坦化层和所述像素电极的绝缘介质层;及刻蚀所述绝缘介质层形成所述第一像素界定层。
- 根据权利要求10所述的制备方法,其中,所述绝缘介质层包括氮化硅、氧化硅中的一种或多种。
- 根据权利要求9所述的制备方法,其中,形成所述第二像素界定层包括:形成覆盖所述平坦化层、所述第一像素界定层和所述像素电极的光阻材料层;图案化所述光阻材料层形成所述第二像素界定层。
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CN110620133B (zh) | 2019-09-25 | 2022-09-09 | 京东方科技集团股份有限公司 | 一种透明显示面板及其制备方法和显示装置 |
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CN115360315A (zh) * | 2022-09-14 | 2022-11-18 | 京东方科技集团股份有限公司 | 显示基板及其制备方法、显示面板 |
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US20210175302A1 (en) | 2021-06-10 |
CN109887961A (zh) | 2019-06-14 |
US11315992B2 (en) | 2022-04-26 |
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