WO2020122191A1 - 研磨用組成物及び合成樹脂研磨方法 - Google Patents
研磨用組成物及び合成樹脂研磨方法 Download PDFInfo
- Publication number
- WO2020122191A1 WO2020122191A1 PCT/JP2019/048762 JP2019048762W WO2020122191A1 WO 2020122191 A1 WO2020122191 A1 WO 2020122191A1 JP 2019048762 W JP2019048762 W JP 2019048762W WO 2020122191 A1 WO2020122191 A1 WO 2020122191A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- polishing
- acid
- polishing composition
- less
- alumina
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1409—Abrasive particles per se
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
Definitions
- the present invention relates to a polishing composition, particularly a polishing composition suitable for use in polishing synthetic resin products and the like, and a method for polishing synthetic resin products and the like using the polishing composition.
- the polishing composition disclosed in Patent Document 1 contains abrasive grains made of alumina, a polishing accelerator containing aluminum nitrate, glycols and the like, and water, and is used for polishing synthetic resin products and the like.
- the polishing composition disclosed in Patent Document 2 contains abrasive grains and an aqueous dispersion of a pyrrolidone compound/or polyvinylcaprolactam, and is used for polishing an organic polymer ophthalmic base material.
- polishing compositions are required to have the ability to rapidly polish an object to be polished (that is, high polishing ability).
- the amount of alumina is increased to enhance the polishing ability, but the raw material cost increases, and when the particle size of alumina is increased, the polishing target after polishing is increased. Surface roughness is increased.
- the amount of aluminum nitrate is increased, problems such as corrosion of the polishing machine and roughening occur, and when the amount of glycols is increased, the raw material cost is increased as in the case of alumina.
- the polishing composition of Patent Document 2 also has improved polishing ability, but the surface properties of the object to be polished after polishing and the stability of the polishing ability of the polishing composition are not clear.
- JP-A-7-11239 Japanese Patent Publication No. 2008-537704
- An object of the present invention is to provide a polishing composition that can be preferably used, particularly to provide a polishing composition that can be more preferably used in an application of polishing a synthetic resin product, and to polish using the polishing composition. It is to provide a polishing method for polishing an object.
- abrasive grains contains abrasive grains, an aluminum salt of 0.01% by weight or more and 15% by weight or less of a monovalent acid, a pyrrolidone compound or a caprolactam compound, and water, and has a pH of 7.0.
- a polishing composition is provided.
- a polishing composition that can be preferably used, and more particularly, a polishing composition that can be more preferably used in applications for polishing synthetic resin products and the like.
- the present invention also provides a polishing method for polishing an object to be polished using such a polishing composition.
- the polishing composition according to one embodiment of the present invention contains abrasive grains, an aluminum salt of a monovalent acid having a valence of 0.01% by mass or more and 15% by mass or less, a pyrrolidone compound or a caprolactam compound, and water,
- the pH is 7.0 or less.
- the object to be polished is not particularly limited, but it can be preferably used for polishing a synthetic resin.
- the polishing composition is used, for example, for polishing a semi-finished product for obtaining a synthetic resin substrate or a synthetic resin product.
- the synthetic resin is not particularly limited, and examples thereof include thermoplastic resins and thermosetting resins.
- thermoplastic resins examples include acrylic resins (polymethylmethacrylic), polycarbonate, polyimide, polystyrene, polyvinyl chloride, polyethylene, polypropylene. , Acrylonitrile/butadiene/styrene, acrylonitrile/styrene, polyvinyl alcohol, polyvinylidene chloride, polyethylene terephthalate, polyamide, polyacetal, polyphenyl ether, polybutylene terephthalate, ultra high molecular weight polyethylene, polyvinylidene fluoride, polysulfone, polyether sulfone, polyphenyl Sulfide, polyarylate, polyamideimide, polyetherimide, polyetheretherketone, liquid crystal polymer, fluororesin (for example, perfluorinated resin such as polytetrafluoroethylene (PTFE), polychlorotrifluoroethylene (PCTFE), polyvinylidene fluoride) (PVDF), partially fluor
- thermosetting resin examples include phenol resin, urea resin, melamine resin, unsaturated polyester, epoxy resin, silicone resin and polyurethane.
- it can be suitably used for polishing acrylic resin, polycarbonate resin, polyimide resin, fluororesin, and epoxy resin, and can be more preferably used for polishing acrylic resin, polyimide resin, and epoxy resin. ..
- the method for molding the object to be polished is not particularly limited, and examples of the method for molding the thermoplastic resin include injection molding, blow molding, extrusion molding, T-die method, inflation method, vacuum molding, pressure molding, calender molding and the like. Is mentioned.
- examples of the molding method of the thermosetting resin include casting, vacuum molding, pressure molding, compression molding, press molding, hand lay-up, compression molding, press molding, injection molding and the like.
- the polishing composition according to one embodiment of the present invention can be suitably used for the purpose of polishing a synthetic resin molded by these molding methods, and specifically, molded by these molding methods, or processed. It is possible to remove defects such as processing marks and undulations that occur in the produced synthetic resin and obtain a low defect, flat, and smooth surface.
- Abrasive grains play a role of mechanically polishing an object to be polished.
- the abrasive grains particles made of oxides of silicon and metal elements such as alumina, silica, cerium oxide, zirconia, titania, iron oxide and manganese oxide can be used. Of these, alumina and silica are preferable.
- the alumina may be any of ⁇ -alumina, ⁇ -alumina, ⁇ -alumina, ⁇ -alumina, and amorphous alumina.
- abrasive grains such as alumina, colloidal silica, colloidal alumina, colloidal zirconia, colloidal titania, fumed silica, fumed alumina, fumed zirconia, fumed titania, silica sol, alumina sol, zirconia sol, and titania sol.
- the colloidal metal oxide increases the viscosity of the polishing composition by being dispersed colloidally in the polishing composition. This improves the dispersibility of the abrasive grains in the polishing composition and suppresses the caking of the abrasive grains. These metal oxides also suppress the aggregation of abrasive grains in the polishing composition. This suppresses the occurrence of scratches due to the aggregated abrasive grains.
- the volume-based average particle diameter of the abrasive grains (hereinafter sometimes referred to as “D50”) is not particularly limited, but for example, in the case of alumina, 0.1 ⁇ m or more is preferable, and 0.2 ⁇ m or more is more preferable.
- the thickness is preferably 0.05 ⁇ m or more, more preferably 0.15 ⁇ m or more, still more preferably 0.2 ⁇ m or more. Within this range, a high polishing rate can be obtained. From the viewpoint of the polishing rate, the volume-based average particle diameter of the abrasive grains is preferably 5 ⁇ m or less, more preferably 3 ⁇ m or less, and even more preferably 1.5 ⁇ m or less in the case of alumina.
- silica it is preferably 1 ⁇ m or less, more preferably 0.5 ⁇ m or less. From the viewpoint of surface properties, for example, in the case of alumina, 1.0 ⁇ m or less is preferable, 0.5 ⁇ m or less is more preferable, and 0.3 ⁇ m or less is further preferable. Further, in the case of silica, it is preferably 0.3 ⁇ m or less, more preferably 0.25 ⁇ m or less, still more preferably 0.2 ⁇ m or less.
- the volume-based average particle size refers to the cumulative median value measured by a laser diffraction/scattering particle size distribution measuring device.
- the 10% particle size in the volume-based integrated particle size distribution of abrasive grains is, for example, 0 for alumina. It is preferably 0.05 ⁇ m or more, more preferably 0.1 ⁇ m or more, still more preferably 0.15 ⁇ m or more. Within this range, a high polishing rate can be obtained. Further, for example, in the case of alumina, D10 is preferably 1 ⁇ m or less, more preferably 0.7 ⁇ m or less, more preferably 0.5 ⁇ m or less, further preferably 0.3 ⁇ m or less, still more preferably 0.25 ⁇ m or less, 0.2 ⁇ m or less. The following are the most preferable. Within this range, the surface properties will be good.
- the 90% particle size in the volume-based cumulative particle size distribution of the abrasive grains is, for example, 0 for alumina. .15 ⁇ m or more is preferable, 0.2 ⁇ m or more is more preferable, 0.25 ⁇ m or more is further preferable, and 0.3 ⁇ m or more is most preferable. Within this range, a high polishing rate can be obtained.
- D90 is preferably 8 ⁇ m or less, more preferably 3 ⁇ m or less, further preferably 2 ⁇ m or less, more preferably 1 ⁇ m or less, further preferably 0.6 ⁇ m or less, still more preferably 0.5 ⁇ m or less, 0 Most preferably, it is not more than 0.4 ⁇ m. Within this range, the surface properties will be good.
- the ratio of D90 to D50 of the abrasive grains is preferably 1.1 or more, and more preferably 1.2 or more in the case of alumina. Within this range, a high polishing rate can be obtained. In the case of alumina, D90/D50 is preferably 2.5 or less, more preferably 1.7 or less, still more preferably 1.5 or less. Within this range, the surface properties will be good.
- the ratio of D90 to D10 of the abrasive grains is, for example, preferably 1.2 or more, more preferably 1.3 or more, even more preferably 1.5 or more, and most preferably 1.7 or more in the case of alumina. .. Within this range, a high polishing rate can be obtained.
- D90/D10 is preferably 6.5 or less, more preferably 3.0 or less, further preferably 2.5 or less, most preferably 2.1 or less. Within this range, the surface properties will be good.
- the ratio of D50 to D10 of abrasive grains is preferably 1.1 or more, more preferably 1.2 or more in the case of alumina. Within this range, a high polishing rate can be obtained. In the case of alumina, D50/D10 is preferably 2.0 or less, more preferably 1.8 or less, still more preferably 1.6 or less. Within this range, the surface properties will be good.
- the BET specific surface area of the abrasive grains is not particularly limited, but in the case of alumina, for example, 5 m 2 /g or more is preferable, 10 m 2 /g or more is more preferable, and 15 m 2 /g or more is further preferable. Further, it is preferably 250 m 2 /g or less, more preferably 50 m 2 /g or less, still more preferably 25 m 2 /g or less. Within this range, a high polishing rate can be achieved while maintaining a good surface shape.
- the BET specific surface area can be measured using, for example, FlowSorbII2300 manufactured by Micromeritex. Nitrogen, argon, krypton or the like can be used as a gas to be adsorbed on the abrasive grains.
- the ⁇ -conversion rate is not particularly limited, but is preferably 30% or more, more preferably 40% or more, and further preferably 50% or more. Within this range, a high polishing rate can be achieved while maintaining a good surface shape.
- the alpha conversion rate can be obtained, for example, from the integrated intensity ratio of the (113) plane diffraction line obtained by X-ray diffraction measurement.
- the concentration of the abrasive grains contained in the polishing liquid of the present invention is not particularly limited, but in the case of alumina, for example, it is usually 0.1% by mass or more, more preferably 1% by mass or more, and 3 It is more preferably at least mass%. Further, in the case of silica, 0.1% by mass or more is preferable, 1% by mass or more is more preferable, and 3% by mass or more is further preferable. Within this range, a high polishing rate can be obtained.
- the concentration of abrasive grains is preferably 40% by mass or less, more preferably 20% by mass or less, and further preferably 15% by mass or less. In the case of silica, 40% by mass or less is preferable, 30% by mass or less is more preferable, and 25% by mass or less is further preferable. Within this range, the cost of the polishing composition becomes appropriate.
- An aluminum salt of a monovalent acid has the function of a polishing accelerator and the function of improving the surface quality of the surface to be polished.
- a polishing composition containing a small amount of an aluminum salt of a monovalent acid has a low polishing ability. Therefore, from the viewpoint of more reliably improving the polishing ability of the polishing composition, the content of the aluminum salt of a monovalent acid in the polishing composition is 0.01% by mass or more. 2% by mass or more is preferable, 4% by mass or more is more preferable, more than 4% by mass is further preferable, and 5% by mass or more is most preferable.
- the polishing composition contains a large amount of an aluminum salt of a monovalent acid, the performance is not significantly improved and it is disadvantageous in terms of cost. Therefore, the content is set to 15% by mass or less. These contents are contents excluding the water of hydration when the aluminum salt of the monovalent acid has water of hydration. In addition, aluminum nitrate, aluminum chloride, etc. are mentioned as a preferable example of the aluminum salt of monovalent acid.
- the polishing composition according to the above embodiment may contain an inorganic acid, an organic acid, or a salt thereof, in addition to aluminum nitrate, as a polishing accelerator.
- the inorganic acid include phosphoric acid, nitric acid, sulfuric acid, hydrochloric acid, hypophosphorous acid, phosphonic acid, boric acid, sulfamic acid and the like.
- the organic acid include citric acid, maleic acid, malic acid, glycolic acid, succinic acid, itaconic acid, malonic acid, iminodiacetic acid, gluconic acid, lactic acid, mandelic acid, tartaric acid, crotonic acid, nicotinic acid, acetic acid.
- Adipic acid formic acid, oxalic acid, propionic acid, valeric acid, caproic acid, caprylic acid, capric acid, cyclohexanecarboxylic acid, phenylacetic acid, benzoic acid, crotonic acid, methacrylic acid, glutaric acid, fumaric acid, phthalic acid, isophthalic acid Acid, terephthalic acid, glycolic acid, tartronic acid, glyceric acid, hydroxybutyric acid, hydroxyacetic acid, hydroxybenzoic acid, salicylic acid, isocitric acid, methylenesuccinic acid, gallic acid, ascorbic acid, nitroacetic acid, oxaloacetic acid, glycine, alanine, glutamic acid , Aspartic acid, valine, leucine, isoleucine, serine, threonine, cysteine, methionine, phenylalanine, tryptophan, ty
- salts include metal salts (for example, alkali metal salts such as lithium salt, sodium salt, potassium salt) of the above-mentioned inorganic acids and organic acids, ammonium salts (for example, tetramethylammonium salt, tetraethylammonium salt, etc.). Quaternary ammonium salt), alkanolamine salt (for example, monoethanolamine salt, diethanolamine salt, triethanolamine salt) and the like.
- metal salts for example, alkali metal salts such as lithium salt, sodium salt, potassium salt
- ammonium salts for example, tetramethylammonium salt, tetraethylammonium salt, etc.
- Quaternary ammonium salt alkanolamine salt (for example, monoethanolamine salt, diethanolamine salt, triethanolamine salt) and the like.
- salts include alkali metal phosphates such as tripotassium phosphate, dipotassium hydrogen phosphate, potassium dihydrogen phosphate, trisodium phosphate, disodium hydrogen phosphate, and sodium dihydrogen phosphate, and alkali metal phosphates.
- the alkali metal in these alkali metal salts can be, for example, lithium, sodium, potassium and the like.
- the polishing composition according to the above embodiment contains a pyrrolidone compound or a caprolactam compound as a water-soluble polymer.
- the weight average molecular weight of the water-soluble polymer is preferably 3,000 or more, more preferably 5,000 or more, still more preferably 10,000 or more, and most preferably 30,000 or more. This has the technical effect of improving the dispersibility of the slurry.
- the weight average molecular weight of the water-soluble polymer is preferably 500,000 or less, more preferably 300,000 or less, still more preferably 100,000 or less. This has the technical effect of improving stability.
- a suitable pyrrolidone compound used in the polishing composition according to the above embodiment is polyvinylpyrrolidone (hereinafter referred to as PVP).
- the weight average molecular weight of PVP used in the slurry composition of the present invention is preferably 3,000 or more, more preferably 10,000 or more. Further, it is preferably 60,000 or less, more preferably 50,000 or less. PVPs with weight average molecular weights within these ranges are readily available from various chemical suppliers.
- Pyrrolidone compounds are compounds other than PVP, such as N-octyl-2-pyrrolidone, N-dodecyl-2-pyrrolidone, N-methyl-2-pyrrolidone, N-ethyl-2-pyrrolidone, N-cyclohexyl-2-pyrrolidone.
- the content of the pyrrolidone compound in the slurry composition is preferably 0.01% by mass or more, more preferably 0.05% by mass or more, and further preferably 0.1% by mass or more. Further, it is preferably 5% by mass or less, more preferably 2% by mass or less, still more preferably 1% by mass or less.
- the pyrrolidone compound effectively works for promoting the polishing of the synthetic resin when it is contained together with the aluminum salt of a monovalent acid.
- the caprolactam compound is a nitrogen-containing organic compound called ⁇ -caprolactam, and most of it is used in the production of nylon 6. Caprolactam can be used as an alternative to the pyrrolidone compound.
- the content of the caprolactam compound in the slurry composition is preferably 0.01% by mass or more, more preferably 0.05% by mass or more, and further preferably 0.1% by mass or more. Further, it is preferably 5% by mass or less, more preferably 2% by mass or less, still more preferably 1% by mass or less.
- a method of synthesizing cyclohexanone oxime from cyclohexanone and converting it into ⁇ -caprolactam by Beckmann rearrangement is known as a major industrial method.
- a method for synthesizing cyclohexanone oxime from cyclohexanone for example, in the presence of a titanosilicate catalyst, when producing cyclohexanone oxime by reacting cyclohexanone, hydrogen peroxide, and ammonia, a used catalyst is used from the reaction system. There is a method of taking out and carrying out the reaction by using the used catalyst and the unused catalyst in combination.
- the polishing composition according to the above embodiment may contain a water-soluble polymer other than the pyrrolidone compound or the caprolactam compound as the water-soluble polymer.
- a water-soluble polymer other than the pyrrolidone compound or the caprolactam compound as the water-soluble polymer.
- polyalkylene oxide alkyl ether ethylene glycol, diethylene glycol, triethylene glycol, polyethylene glycol, propylene glycol, dipropylene glycol, tripropylene glycol, polypropylene glycol and other glycols, cellulose derivatives, starch derivatives, polyacrylic acid, poly It may be acrylamide, polyvinyl alcohol, polyethyleneimine, polyalkylene oxide or the like.
- Water plays a role as a medium for dispersing or dissolving components other than water in the polishing composition.
- the water may be industrial water, tap water, distilled water, or filtered water thereof, and preferably contains as few impurities as possible.
- the pH of the polishing composition is 7.0 or less, preferably 6.0 or less, more preferably 5.0 or less, and further preferably 4.5 or less. Further, it is preferably 2.0 or more, more preferably 2.3 or more. From the viewpoint of improving the polishing ability, the pH is preferably 2.5 or higher, more preferably 3.0 or higher, even more preferably 3.6 or higher. Further, it is preferably 4.5 or less, more preferably 4.4 or less, still more preferably 4.3 or less. When the pH of the polishing composition is in this range, the polishing ability of the polishing composition is improved. In addition, from the viewpoint of stability over time during long-term storage, 2.8 or more is preferable, and 3.0 or more is more preferable.
- the pH of the polishing composition is within this range, stable polishing performance can be maintained for a long period of time.
- the pH can be adjusted by appropriately adding the above-mentioned acid or a known alkali such as potassium hydroxide.
- the zeta potential of the polishing composition is preferably 0 mV or higher. When the zeta potential of the polishing composition is within this range, the polishing ability of the polishing composition is improved and the stability of the polishing composition is improved.
- polishing an object to be polished with the polishing composition while the polishing pad is pressed against the object to be polished, while supplying the polishing composition to the polishing pad, one of the polishing pad and the object to be polished is the other. Slide against. If the temperature of the polishing composition supplied at the time of polishing is too low, the polishing composition may freeze or the cooling cost of the polishing composition may increase.
- the polishing composition of the above embodiment may further contain an antifoaming agent, an antifungal agent, a surfactant, an anticorrosive agent and the like.
- the polishing composition according to the above-described embodiment may be prepared by producing a diluting stock solution at a concentration higher than the concentration at the time of use, and diluting the diluting stock solution with water. By manufacturing the undiluted solution for dilution at a concentration higher than the concentration at the time of use, it is possible to suppress the transportation cost and storage location of the polishing composition.
- Example 1 In Examples 1 to 1 to 1-21, alumina, polyvinylpyrrolidone, a polishing accelerator which is an aluminum salt of a monovalent acid having a valence of 0.01 to 15% by mass and not more than 15% by mass, and water were mixed. A polishing composition was prepared. Content of alumina, polyvinylpyrrolidone and polishing accelerator in each polishing composition of Examples 1-1 to 1-21, average particle diameter of alumina based on volume, and weight average molecular weight of water-soluble polymer, polishing compositions Table 1 shows the positive and negative zeta potentials and pH.
- alumina, a water-soluble polymer, a polishing accelerator and water shown in Table 2 were mixed to prepare polishing compositions.
- the pH was adjusted by adding nitric acid or potassium hydroxide as appropriate.
- the volume-based average particle diameter of the alumina was measured by a laser diffraction/scattering particle size distribution measuring device LA-950 manufactured by HORIBA, Ltd., and the zeta potential of the polishing composition was determined by Kyowa Interface Science Co., Ltd. Positive and negative values were measured with a high concentration zeta potentiometer ZetaProbe, and pH was measured with a pH meter F-72 manufactured by Horiba Ltd.
- polishing object Acrylic resin (Rockwell hardness M85) Polishing machine: EJ-380IN manufactured by Nippon Engis Co., Ltd. Polishing pad: Suede pad N17 manufactured by Fuji Bow Ehime Co., Ltd. Polishing load: 150 g/cm2 (14.7 kPa) Polishing time: 3 minutes Amount of polishing composition used: 45 ml Supply amount of polishing composition: 15 ml/min
- the polishing rate of the acrylic resin was calculated from the weight difference of the acrylic resin before and after polishing with an electronic scale XS205 manufactured by METTLER TOLEDO.
- the obtained polishing rate values are shown in Tables 1 and 2.
- the surface quality was evaluated by observing the polished surface of the acrylic resin after polishing with a laser microscope VK-X200 manufactured by Keyence Corporation, both the objective and eyepieces at a magnification of 20 times and an observation viewing angle of 528 ⁇ 705 ⁇ m.
- the case where no scratches are observed on the surface is indicated by A
- the case where the number of scratches at the above-mentioned viewing angle is 1 or 2 is indicated by B
- the case where the number of scratches is 3-10 is indicated by C
- the case of 11 or more is indicated by D.
- the stability of the polishing composition was changed from the polishing rate before and after storage after the polishing composition was stored for 7 days in a YAMATO blast constant temperature thermostat DK600T heated to 80°C. The rate was calculated.
- the case where the rate of change of the polishing rate is within 10% is represented by A, the case of 10 to 20% is represented by B, and the case of 20% or more is represented by C. Those for which the stability of the polishing composition has not been evaluated are indicated by-.
- Comparative Example 1-4 in which the salt content exceeds 15 mass %, Comparative Examples 1-22 to 1-24 having a pH higher than 7.0, and Comparative Example 1-25 containing no abrasive grains the polishing rate is low. Or, the result was that there were many scratches and the surface quality was not good.
- the polishing rate of Comparative Example 1-2 consisting of abrasive grains and polyvinylpyrrolidone was 1.24 ⁇ m/min
- the polishing rate of Comparative Example 1-3 consisting of abrasive grains and aluminum salt of monovalent acid. Is 1.30 ⁇ m/min
- Example 1-3 in which polyvinylpyrrolidone and aluminum nitrate are mixed in addition to the abrasive grains has a polishing rate of 3.80 ⁇ m/min, which is specifically high. Was confirmed.
- Example 2 In Example 2-1, the silica shown in Table 3, polyvinylpyrrolidone, a polishing accelerator which is an aluminum salt of a monovalent acid having a valence of 0.01% by mass or more and 15% by mass or less, and water are mixed.
- a polishing composition The contents of silica, polyvinylpyrrolidone, and a polishing accelerator in each polishing composition, the volume-based average particle diameter of alumina and the weight average molecular weight of the water-soluble polymer, and the positive and negative zeta potential and pH of each polishing composition are shown in Table 3. As shown in.
- silica, a water-soluble polymer, a polishing accelerator and water shown in Table 3 were mixed to prepare polishing compositions.
- the pH was adjusted by adding nitric acid or potassium hydroxide as appropriate.
- the volume-based average particle size of silica is LA-950, a laser diffraction/scattering particle size distribution measuring device manufactured by Horiba Ltd., and the zeta potential of the polishing composition is electroacoustic manufactured by Kyowa Interface Science Co., Ltd. Positive and negative values were measured with a high concentration zeta potentiometer ZetaProbe, and pH was measured with a pH meter F-72 manufactured by Horiba Ltd. The evaluation was performed under the same evaluation conditions as in Example 1.
- Example 3 In Examples 3-1 and 3-2 and Comparative Examples 3-1 to 3-3, the alumina, the water-soluble polymer, the polishing accelerator, and the water shown in Table 4 were mixed in the same manner as in Example 1. A polishing composition was prepared. The obtained polishing composition was used to polish a polycarbonate resin under the following polishing conditions. In addition, in Table 4, as in Tables 1 and 2, the content of alumina, polyvinylpyrrolidone, the aluminum salt of a monovalent acid in each polishing composition, and the average particle diameter of the alumina based on volume. And the weight average molecular weight of the water-soluble polymer, zeta potential and pH of each polishing composition are shown.
- Polishing object Polycarbonate resin (Rockwell hardness M70) Polishing machine: EJ-380IN manufactured by Nippon Engis Co., Ltd. Polishing pad: Suede pad N17 manufactured by Fuji Bow Ehime Co., Ltd. Polishing load: 150 g/cm2 (14.7 kPa) Polishing time: 3 minutes Amount of polishing composition used: 45 ml Supply amount of polishing composition: 15 ml/min
- the polishing rate of the polycarbonate resin was calculated from the weight difference of the polycarbonate resin before and after polishing with an electronic scale XS205 manufactured by METTLER TOLEDO.
- the obtained polishing rate values are shown in Table 4.
- the surface properties were evaluated by observing the polished surface of the polycarbonate resin after polishing with a laser microscope VK-X200 manufactured by KEYENCE CORPORATION, an objective and an eyepiece lens at a magnification of 20 times and an observation viewing angle of 528 ⁇ 705 ⁇ m.
- the case where no scratches are observed on the surface is indicated by A
- the case where the number of scratches at the above-mentioned viewing angle is 1 or 2 is indicated by B
- the case where the number of scratches is 3-10 is indicated by C
- the case of 11 or more is indicated by D.
- the stability of the polishing composition was evaluated in the same manner as in Example 1.
- Example 4 In Examples 4-1 to 4-2 and Comparative Examples 4-1 to 4-6, similarly to Example 1 and Example 2, alumina or silica shown in Table 5, a water-soluble polymer, a polishing accelerator, And water were mixed to prepare a polishing composition.
- the polyimide composition was polished under the following polishing conditions using the obtained polishing composition.
- Polishing object Polyimide resin (Rockwell hardness M50) Polishing machine: EJ-380IN manufactured by Nippon Engis Co., Ltd. Polishing pad: Suede pad N17 manufactured by Fuji Bow Ehime Co., Ltd.
- Polishing load 200 g/cm 2 (14.7 kPa) Polishing time: 30 minutes Amount of polishing composition used: 45 ml Amount of polishing composition supplied: 15 ml/min
- alumina or silica, polyvinylpyrrolidone, and aluminum salt of monovalent acid in each polishing composition were contained. The amount, the volume-based average particle diameter of the alumina and the weight average molecular weight of the water-soluble polymer, the zeta potential and pH of each polishing composition are shown.
- the polishing rate of the polyimide resin was calculated from the weight difference of the polyimide resin before and after polishing with an electronic scale XS205 manufactured by METTLER TOLEDO.
- the obtained polishing rate values are shown in Table 5.
- the surface quality was evaluated by observing the polished surface of the polyimide resin after polishing with a laser microscope VK-X200 manufactured by Keyence Corporation, both the objective and eyepieces at a magnification of 20 times and an observation viewing angle of 528 ⁇ 705 ⁇ m.
- the case where no scratches are observed on the surface is indicated by A
- the case where the number of scratches at the above-mentioned viewing angle is 1 or 2 is indicated by B
- the case where the number of scratches is 3-10 is indicated by C
- the case of 11 or more is indicated by D.
- the stability of the polishing composition was evaluated in the same manner as in Example 1.
- a polishing composition was used by mixing alumina or silica, polyvinylpyrrolidone, an aluminum salt of a monovalent acid having a valence of 0.01% by mass to 15% by mass and not more than 15%, and water.
- the polishing rate was higher than 0.1 ⁇ m/min, and the number of scratches was small.
- Comparative Examples 4-1 to 4-6 containing no polyvinylpyrrolidone and/or an aluminum salt of a monovalent acid the polishing rate was low and scratches were also obtained in Examples 4-1 to 4-4. The result was slightly inferior to 2.
- Example 5 In Example 5-1 and Comparative Examples 5-1 to 5-3, similarly to Example 1, the polishing composition prepared by mixing the alumina, the water-soluble polymer, the polishing accelerator, and the water shown in Table 6 was used. Was prepared. Polytetrafluoroethylene (PTFE) was polished using the obtained polishing composition under the following polishing conditions.
- Object to be polished Polytetrafluoroethylene (Rockwell hardness R20) Polishing machine: EJ-380IN manufactured by Nippon Engis Co., Ltd. Polishing pad: Suede pad N17 manufactured by Fuji Bow Ehime Co., Ltd. Polishing load: 150 g/cm2 (14.7 kPa) Polishing time: 3 minutes
- Supply amount of polishing composition 15 ml/min
- the polishing rate of polytetrafluoroethylene was calculated from the weight difference of polytetrafluoroethylene before and after polishing with an electronic scale XS205 manufactured by METTLER TOLEDO.
- the obtained polishing rate values are shown in Table 4.
- the surface properties were evaluated by observing the polished surface of polytetrafluoroethylene after polishing with a laser microscope VK-X200 manufactured by Keyence Corporation, both the objective and the eyepiece lens at a magnification of 20 times and an observation viewing angle of 528 ⁇ 705 ⁇ m.
- the case where no scratches are observed on the surface is indicated by A
- the case where the number of scratches at the above-mentioned viewing angle is 1 or 2 is indicated by B
- the case where the number of scratches is 3-10 is indicated by C
- the case of 11 or more is indicated by D.
- the stability of the polishing composition was evaluated in the same manner as in Example 1.
- Example 6 In Example 6-1 and Comparative Examples 6-1 to 6-3, similarly to Example 1, the polishing composition prepared by mixing the alumina, the water-soluble polymer, the polishing accelerator, and the water shown in Table 7 was used. Was prepared. Using the obtained polishing composition, the epoxy resin was polished under the following polishing conditions. Polishing object: Epoxy resin (Rockwell hardness M80-110) Polishing machine: EJ-380IN manufactured by Nippon Engis Co., Ltd. Polishing pad: Suede pad N17 manufactured by Fuji Bow Ehime Co., Ltd. Polishing load: 150 g/cm2 (14.7 kPa) Polishing time: 3 minutes Amount of polishing composition used: 45 ml Supply amount of polishing composition: 15 ml/min
- the polishing rate of the epoxy resin was calculated from the weight difference of the epoxy resin before and after polishing with an electronic scale XS205 manufactured by METTLER TOLEDO.
- the obtained polishing rate values are shown in Table 4.
- the surface properties were evaluated by observing the polished surface of the epoxy resin after polishing with a laser microscope VK-X200 manufactured by Keyence Corporation, both the objective and the eyepiece lens at a magnification of 20 times and an observation viewing angle of 528 ⁇ 705 ⁇ m.
- the case where no scratches are observed on the surface is indicated by A
- the case where the number of scratches at the above-mentioned viewing angle is 1 or 2 is indicated by B
- the case where the number of scratches is 3-10 is indicated by C
- the case of 11 or more is indicated by D.
- the stability of the polishing composition was evaluated in the same manner as in Example 1.
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
Abstract
Description
(実施例1)
実施例1~1~1-21においては、アルミナ、ポリビニルピロリドン、0.01質量%以上15質量%以下の価数が1価の酸のアルミニウム塩である研磨促進剤、及び水を混合して研磨用組成物を調製した。実施例1-1~1-21の各研磨用組成物中のアルミナ、ポリビニルピロリドン、研磨促進剤の含有量、アルミナの体積基準の平均粒子径および水溶性ポリマーの重量平均分子量、各研磨組成物のゼータ電位の正負およびpHは表1に示すとおりである。比較例1-1~1-25においては、表2に示されるアルミナ、水溶性ポリマー、研磨促進剤及び水を混合して研磨用組成物を調製した。pHは、硝酸、または水酸化カリウムを適宜加えて調整した。なお、アルミナの体積基準の平均粒子径は株式会社堀場製作所社製のレーザー回折/散乱式粒子径分布測定装置LA-950で、研磨用組成物のゼータ電位は協和界面化学株式会社製の電気音響法高濃度ゼータ電位計ZetaProbeで正負を測定し、pHは株式会社堀場製作所社製のpHメーターF-72で測定した。
研磨対象物:アクリル樹脂(ロックウェル硬度M85)
研磨機:日本エンギス株式会社製EJ-380IN
研磨パッド:フジボウ愛媛株式会社製スエードパッドN17
研磨荷重:150g/cm2(14.7kPa)
研磨時間:3分
研磨用組成物の使用量:45ml
研磨用組成物の供給量:15ml/分
実施例2-1においては、表3に示されるシリカ、ポリビニルピロリドン、0.01質量%以上15質量%以下の価数が1価の酸のアルミニウム塩である研磨促進剤、及び水を混合して研磨用組成物を調製した。各研磨用組成物中のシリカ、ポリビニルピロリドン、研磨促進剤の含有量、アルミナの体積基準の平均粒子径および水溶性ポリマーの重量平均分子量、各研磨組成物のゼータ電位の正負およびpHは表3に示すとおりである。
比較例2-1~2-3においては、表3に示されるシリカ、水溶性ポリマー、研磨促進剤及び水を混合して研磨用組成物を調製した。pHは、硝酸、または水酸化カリウムを適宜加えて調整した。なお、シリカの体積基準の平均粒子径は株式会社堀場製作所社製のレーザー回折/散乱式粒子径分布測定装置LA-950で、研磨用組成物のゼータ電位は協和界面化学株式会社製の電気音響法高濃度ゼータ電位計ZetaProbeで正負を測定し、pHは株式会社堀場製作所社製のpHメーターF-72で測定した。評価条件は実施例1と同様の条件とし、評価を行った。
実施例3-1および3-2、並びに比較例3-1~3-3では、実施例1と同様に、表4に示されるアルミナ、水溶性ポリマー、研磨促進剤、及び水を混合して研磨用組成物を調製した。得られた研磨用組成物を使用して以下の研磨条件にてポリカーボネート樹脂を研磨した。なお、表4には、表1及び表2と同様に、各研磨用組成物中のアルミナ、ポリビニルピロリドン、価数が1価の酸のアルミニウム塩の含有量、アルミナの体積基準の平均粒子径および水溶性ポリマーの重量平均分子量、各研磨組成物のゼータ電位およびpHが示されている。
研磨対象物:ポリカーボネート樹脂(ロックウェル硬度M70)
研磨機:日本エンギス株式会社製EJ-380IN
研磨パッド:フジボウ愛媛株式会社製スエードパッドN17
研磨荷重:150g/cm2(14.7kPa)
研磨時間:3分
研磨用組成物の使用量:45ml
研磨用組成物の供給量:15ml/分
実施例4-1~4-2、並びに比較例4-1~4-6では、実施例1、実施例2と同様に、表5に示されるアルミナまたはシリカ、水溶性ポリマー、研磨促進剤、及び水を混合して研磨用組成物を調製した。得られた研磨用組成物を使用して以下の研磨条件にてポリイミド樹脂を研磨した。
研磨対象物:ポリイミド樹脂(ロックウェル硬度M50)
研磨機:日本エンギス株式会社製EJ-380IN
研磨パッド:フジボウ愛媛株式会社製スエードパッドN17
研磨荷重:200g/cm2(14.7kPa)
研磨時間:30分
研磨用組成物の使用量:45ml
研磨用組成物の供給量:15ml/分
なお、表5には、表1と同様に、各研磨用組成物中のアルミナまたはシリカ、ポリビニルピロリドン、価数が1価の酸のアルミニウム塩の含有量、アルミナの体積基準の平均粒子径および水溶性ポリマーの重量平均分子量、各研磨組成物のゼータ電位およびpHが示されている。
実施例5-1、並びに比較例5-1~5-3では、実施例1と同様に、表6に示されるアルミナ、水溶性ポリマー、研磨促進剤、及び水を混合して研磨用組成物を調製した。得られた研磨用組成物を使用して以下の研磨条件にてポリテトラフルオロエチレン(PTFE)を研磨した。
研磨対象物:ポリテトラフルオロエチレン(ロックウェル硬度R20)
研磨機:日本エンギス株式会社製EJ-380IN
研磨パッド:フジボウ愛媛株式会社製スエードパッドN17
研磨荷重:150g/cm2(14.7kPa)
研磨時間:3分
研磨用組成物の使用量:45ml
研磨用組成物の供給量:15ml/分
実施例6-1、並びに比較例6-1~6-3では、実施例1と同様に、表7に示されるアルミナ、水溶性ポリマー、研磨促進剤、及び水を混合して研磨用組成物を調製した。得られた研磨用組成物を使用して以下の研磨条件にてエポキシ樹脂を研磨した。
研磨対象物:エポキシ樹脂(ロックウェル硬度M80-110)
研磨機:日本エンギス株式会社製EJ-380IN
研磨パッド:フジボウ愛媛株式会社製スエードパッドN17
研磨荷重:150g/cm2(14.7kPa)
研磨時間:3分
研磨用組成物の使用量:45ml
研磨用組成物の供給量:15ml/分
Claims (13)
- 砥粒、0.01質量%以上15質量%以下の価数が1価の酸のアルミニウム塩、ピロリドン化合物又はカプロラクタム化合物、及び水を含有し、pHが7.0以下である、研磨用組成物。
- pHが4.5以下である、請求項1に記載の研磨用組成物。
- pHが3.4以下である、請求項1に記載の研磨用組成物。
- 前記砥粒がアルミナである、請求項1~3のいずれか1項に記載の研磨用組成物。
- 前記アルミナの体積基準の平均粒子径が0.1μm以上0.5μm以下である、請求項4に記載の研磨用組成物。
- 前記アルミナのBET比表面積が10m2/g以上50m2/g以下である、請求項4または5に記載の研磨用組成物。
- 前記アルミナのα化率が50%以上である、請求項4~6のいずれか1項に記載の研磨用組成物。
- 前記砥粒がシリカである、請求項1~3のいずれか1項に記載の研磨用組成物。
- 前記シリカの体積基準の平均粒子径が0.02μm以上0.3μm以下である、請求項8に記載の研磨用組成物。
- 前記価数が1価の酸のアルミニウム塩の含有量が5質量%以上15質量%以下である、請求項1~9のいずれか1項に記載の研磨用組成物。
- 前記価数が1価の酸のアルミニウム塩が硝酸アルミニウムまたは塩化アルミニウムから選ばれる少なくとも1種である、請求項1~10のいずれか1項に記載の研磨用組成物。
- 合成樹脂の研磨に使用される請求項1~11のいずれか1項に記載の研磨用組成物。
- 請求項1~12のいずれか1項に記載の研磨用組成物を用いて合成樹脂研磨する、合成樹脂研磨方法。
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US17/311,429 US20220025212A1 (en) | 2018-12-14 | 2019-12-12 | Polishing composition and method for polishing synthetic resin |
| KR1020217016343A KR102837555B1 (ko) | 2018-12-14 | 2019-12-12 | 연마용 조성물 및 합성 수지 연마 방법 |
| JP2020559320A JP7413277B2 (ja) | 2018-12-14 | 2019-12-12 | 研磨用組成物及び合成樹脂研磨方法 |
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018-234788 | 2018-12-14 | ||
| JP2018234788 | 2018-12-14 | ||
| JP2019-179366 | 2019-09-30 | ||
| JP2019179366 | 2019-09-30 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2020122191A1 true WO2020122191A1 (ja) | 2020-06-18 |
Family
ID=71076468
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2019/048762 Ceased WO2020122191A1 (ja) | 2018-12-14 | 2019-12-12 | 研磨用組成物及び合成樹脂研磨方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US20220025212A1 (ja) |
| JP (1) | JP7413277B2 (ja) |
| KR (1) | KR102837555B1 (ja) |
| TW (1) | TWI837249B (ja) |
| WO (1) | WO2020122191A1 (ja) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022047869A (ja) * | 2020-09-14 | 2022-03-25 | 株式会社フジミインコーポレーテッド | 研磨用組成物、研磨方法、および半導体基板の製造方法 |
| JPWO2022130839A1 (ja) * | 2020-12-17 | 2022-06-23 | ||
| WO2022209229A1 (ja) * | 2021-03-30 | 2022-10-06 | 株式会社フジミインコーポレーテッド | 研磨用組成物及び研磨方法 |
| JP7638349B1 (ja) | 2023-10-26 | 2025-03-03 | 株式会社トッパンインフォメディア | 研磨スラリー |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN118974198A (zh) * | 2022-03-23 | 2024-11-15 | 福吉米株式会社 | 研磨用组合物及使用其的研磨方法 |
| WO2025019194A2 (en) * | 2023-07-14 | 2025-01-23 | Fujifilm Electronic Materials U.S.A., Inc. | Polishing compositions and methods of use thereof |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001342456A (ja) * | 2000-01-18 | 2001-12-14 | Praxair St Technol Inc | 研磨性スラリー |
| JP2008537704A (ja) * | 2005-04-08 | 2008-09-25 | フエロ コーポレーション | 有機高分子眼科基材のスラリー組成物及び研磨方法 |
| CN102516882A (zh) * | 2011-12-19 | 2012-06-27 | 德米特(苏州)电子环保材料有限公司 | 一种氧化铝基质的树脂镜片抛光液制作方法 |
| CN108188863A (zh) * | 2017-12-27 | 2018-06-22 | 重庆市华阳光学仪器有限公司 | 一种望远镜镜片加工工艺 |
| JP2018533071A (ja) * | 2015-07-10 | 2018-11-08 | フエロ コーポレーション | 有機ポリマー系眼用基材を研磨するためのスラリー組成物及び方法、並びに眼用レンズ |
Family Cites Families (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3582017B2 (ja) | 1993-06-25 | 2004-10-27 | 株式会社フジミインコーポレーテッド | 研磨用組成物およびプラスチック研磨用組成物 |
| US6475407B2 (en) * | 1998-05-19 | 2002-11-05 | Showa Denko K.K. | Composition for polishing metal on semiconductor wafer and method of using same |
-
2019
- 2019-12-12 KR KR1020217016343A patent/KR102837555B1/ko active Active
- 2019-12-12 WO PCT/JP2019/048762 patent/WO2020122191A1/ja not_active Ceased
- 2019-12-12 JP JP2020559320A patent/JP7413277B2/ja active Active
- 2019-12-12 US US17/311,429 patent/US20220025212A1/en not_active Abandoned
- 2019-12-13 TW TW108145773A patent/TWI837249B/zh active
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001342456A (ja) * | 2000-01-18 | 2001-12-14 | Praxair St Technol Inc | 研磨性スラリー |
| JP2008537704A (ja) * | 2005-04-08 | 2008-09-25 | フエロ コーポレーション | 有機高分子眼科基材のスラリー組成物及び研磨方法 |
| CN102516882A (zh) * | 2011-12-19 | 2012-06-27 | 德米特(苏州)电子环保材料有限公司 | 一种氧化铝基质的树脂镜片抛光液制作方法 |
| JP2018533071A (ja) * | 2015-07-10 | 2018-11-08 | フエロ コーポレーション | 有機ポリマー系眼用基材を研磨するためのスラリー組成物及び方法、並びに眼用レンズ |
| CN108188863A (zh) * | 2017-12-27 | 2018-06-22 | 重庆市华阳光学仪器有限公司 | 一种望远镜镜片加工工艺 |
Cited By (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2022047869A (ja) * | 2020-09-14 | 2022-03-25 | 株式会社フジミインコーポレーテッド | 研磨用組成物、研磨方法、および半導体基板の製造方法 |
| JP7575898B2 (ja) | 2020-09-14 | 2024-10-30 | 株式会社フジミインコーポレーテッド | 研磨用組成物、研磨方法、および半導体基板の製造方法 |
| JPWO2022130839A1 (ja) * | 2020-12-17 | 2022-06-23 | ||
| WO2022130839A1 (ja) * | 2020-12-17 | 2022-06-23 | 株式会社フジミインコーポレーテッド | 研磨用組成物およびこれを用いた研磨方法 |
| JP7777088B2 (ja) | 2020-12-17 | 2025-11-27 | 株式会社フジミインコーポレーテッド | 研磨用組成物およびこれを用いた研磨方法 |
| WO2022209229A1 (ja) * | 2021-03-30 | 2022-10-06 | 株式会社フジミインコーポレーテッド | 研磨用組成物及び研磨方法 |
| JP2022154401A (ja) * | 2021-03-30 | 2022-10-13 | 株式会社フジミインコーポレーテッド | 研磨用組成物及び研磨方法 |
| JP7772507B2 (ja) | 2021-03-30 | 2025-11-18 | 株式会社フジミインコーポレーテッド | 研磨用組成物及び研磨方法 |
| JP7638349B1 (ja) | 2023-10-26 | 2025-03-03 | 株式会社トッパンインフォメディア | 研磨スラリー |
| WO2025088837A1 (ja) * | 2023-10-26 | 2025-05-01 | 株式会社トッパンインフォメディア | 研磨スラリー |
| JP2025073409A (ja) * | 2023-10-26 | 2025-05-13 | 株式会社トッパンインフォメディア | 研磨スラリー |
Also Published As
| Publication number | Publication date |
|---|---|
| US20220025212A1 (en) | 2022-01-27 |
| JPWO2020122191A1 (ja) | 2021-10-21 |
| TW202035641A (zh) | 2020-10-01 |
| KR20210102220A (ko) | 2021-08-19 |
| KR102837555B1 (ko) | 2025-07-24 |
| JP7413277B2 (ja) | 2024-01-15 |
| TWI837249B (zh) | 2024-04-01 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| JP7413277B2 (ja) | 研磨用組成物及び合成樹脂研磨方法 | |
| US20080311750A1 (en) | Polishing composition for semiconductor wafer and polishing method | |
| CN104769073B (zh) | 研磨用组合物 | |
| JP6864519B2 (ja) | 研磨用組成物、磁気ディスク基板の製造方法および磁気ディスクの研磨方法 | |
| TW201542792A (zh) | 研磨用組成物 | |
| WO2013118710A1 (ja) | 研磨用組成物、及び半導体基板の製造方法 | |
| CN107735478A (zh) | 研磨用组合物 | |
| WO2019188747A1 (ja) | ガリウム化合物系半導体基板研磨用組成物 | |
| JP2020055915A (ja) | 研磨用組成物、基板の研磨方法および基板の製造方法 | |
| WO2017187689A1 (ja) | 研磨材、研磨用組成物、及び研磨方法 | |
| JP6564638B2 (ja) | 研磨用組成物、磁気ディスク基板製造方法および磁気ディスク基板 | |
| JP6637816B2 (ja) | 研磨用組成物、基板の研磨方法および基板の製造方法 | |
| JP2019178302A (ja) | 研磨用組成物、パッド表面調整用組成物およびその利用 | |
| JP2018174010A (ja) | 研磨用組成物および磁気ディスク基板の製造方法 | |
| JPWO2019189124A1 (ja) | 研磨用組成物 | |
| JP7772507B2 (ja) | 研磨用組成物及び研磨方法 | |
| JP7058097B2 (ja) | 研磨用組成物および磁気ディスク基板の製造方法 | |
| JP6760880B2 (ja) | マグネシウム又はマグネシウム合金の研磨用組成物及びそれを用いた研磨方法 | |
| CN104903052A (zh) | 合金材料的研磨方法和合金材料的制造方法 | |
| JP6637817B2 (ja) | 磁気ディスク基板研磨用組成物、磁気ディスク基板の製造方法および研磨方法 | |
| JP6677558B2 (ja) | 磁気ディスク基板研磨用組成物、磁気ディスク基板の製造方法および研磨方法 | |
| JP2020053108A (ja) | 研磨用組成物およびその利用 | |
| JP2018053147A (ja) | 砥粒分散液、容器入り砥粒分散液およびその製造方法 | |
| JP6656867B2 (ja) | 磁気ディスク基板用研磨組成物、磁気ディスク基板の製造方法および磁気ディスク基板 | |
| JP6572082B2 (ja) | 磁気ディスク基板用研磨組成物、磁気ディスク基板の製造方法および磁気ディスク基板 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 19894491 Country of ref document: EP Kind code of ref document: A1 |
|
| ENP | Entry into the national phase |
Ref document number: 2020559320 Country of ref document: JP Kind code of ref document: A |
|
| ENP | Entry into the national phase |
Ref document number: 20217016343 Country of ref document: KR Kind code of ref document: A |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| 122 | Ep: pct application non-entry in european phase |
Ref document number: 19894491 Country of ref document: EP Kind code of ref document: A1 |






