WO2020024837A1 - Device for operating substrate - Google Patents

Device for operating substrate Download PDF

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Publication number
WO2020024837A1
WO2020024837A1 PCT/CN2019/097130 CN2019097130W WO2020024837A1 WO 2020024837 A1 WO2020024837 A1 WO 2020024837A1 CN 2019097130 W CN2019097130 W CN 2019097130W WO 2020024837 A1 WO2020024837 A1 WO 2020024837A1
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WO
WIPO (PCT)
Prior art keywords
annular
substrate
adsorption
adsorption surface
suction
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PCT/CN2019/097130
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French (fr)
Chinese (zh)
Inventor
弓利军
袁福顺
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北京北方华创微电子装备有限公司
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Priority claimed from CN201821232301.7U external-priority patent/CN208478312U/en
Priority claimed from CN201810867124.8A external-priority patent/CN108933099B/en
Application filed by 北京北方华创微电子装备有限公司 filed Critical 北京北方华创微电子装备有限公司
Priority to JP2020572714A priority Critical patent/JP7134267B2/en
Publication of WO2020024837A1 publication Critical patent/WO2020024837A1/en

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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping

Definitions

  • the present invention relates to the technical field of semiconductor manufacturing, and in particular, to an apparatus for operating a substrate.
  • an epitaxial reactor is usually used to manufacture an epitaxial coating of a semiconductor substrate, that is, a deposition gas is passed into the epitaxial chamber, and the deposition gas deposits an epitaxial material when passing through the surface of the semiconductor substrate.
  • substrate transfer is a very important content.
  • the substrate is generally circular and has a front side and a back side.
  • the front side of the substrate is used to manufacture integrated circuit structures, so it is very important to protect the front side of the substrate from damage during the substrate transfer process. For this reason, it is usually chosen to act on the backside of the substrate (such as adsorption) to transfer the substrate.
  • this transfer method cannot be applied to certain areas of epitaxial reactions. For these areas, it can only act on the front side of the substrate for lining. Bottom of the transmission.
  • not the entire front side of the substrate is used to manufacture integrated circuit structures. The area a few millimeters from the edge of the front side of the substrate is a non-operational area and is not used for manufacturing integrated circuit structures. Therefore, the substrate can be transferred by acting on the edge region of the front surface of the substrate.
  • a conventional wafer picking method of a substrate transfer device is to use a vacuum adsorption method to act on a central area of a front surface of a substrate, and only contact an edge area of the front surface of the substrate.
  • a vacuum adsorption method to act on a central area of a front surface of a substrate, and only contact an edge area of the front surface of the substrate.
  • an embodiment of the present invention provides an apparatus for operating a substrate.
  • an apparatus for operating a substrate including:
  • the gripping disc structure has an adsorption surface, and an extraction channel is provided in the gripping disc structure, and the exhaustion channel includes a plurality of exhaustion ports distributed in an annular edge region of the adsorption surface.
  • the maximum radius of the annular edge region is equal to the radius of the substrate; the ratio of the minimum radius of the annular edge region to the radius of the substrate is 7/10.
  • the plurality of air suction ports are evenly distributed on a circumference or a plurality of circumferences having different radii with the center of the adsorption surface as a circle center.
  • an adsorption tank is provided on the adsorption surface, and all of the suction ports are in communication with the adsorption tank.
  • a side surface of the adsorption groove includes a first annular surface and a second annular surface which are sequentially arranged from an edge of the adsorption surface toward a center, wherein the first annular surface is inclined with respect to the adsorption surface. And the vertical gap between the substrate and the substrate gradually increases from the edge of the adsorption surface toward the center; the second annular surface is inclined or perpendicular to the adsorption surface.
  • At least one circumference where the suction port is located is distributed on the first torus; or at least one circumference where the suction port is located on both the first torus and the bottom surface of the adsorption tank .
  • the gripping disc structure includes:
  • a carrier disk has the adsorption surface, and a plurality of first through holes penetrating the carrier disk along its axial direction are provided in the carrier disk. Ports of the first through holes on the adsorption surface are used for the ports. Making the suction port; and
  • a gas-homing disk is connected to the carrier disk and is located on a side of the carrier disk facing away from the adsorption surface; and a gas-homing channel is provided in the gas-homing disk, and the gas-homing channels are connected to each of the The first through hole communicates with each other to form the suction channel.
  • the device further includes: a first annular elastic element and a second annular elastic element, both of which are located between the air homogenizing disc and the bearing disc, so as to form an annular sealed space therebetween.
  • a first annular elastic element and a second annular elastic element both of which are located between the air homogenizing disc and the bearing disc, so as to form an annular sealed space therebetween.
  • annular groove is provided on the opposite surface of the air uniform plate and / or the carrier plate and is located in the annular sealed space, and the annular groove is connected to the air uniform channel and each of the The first through hole communicates.
  • the air homogenization plate includes:
  • An annular body is connected to the carrying plate; the first annular elastic element and the second annular elastic element are located between the annular body and the carrying plate, and a plurality of annular elastic elements are provided along the annular body.
  • a second through hole axially penetrating the annular body, a plurality of the second through holes are evenly distributed along a circumferential direction of the annular body, and each of the second through holes communicates with the annular sealed space;
  • the ventilation structure has a plurality of shunt channels with the same structure, the number of the shunt channels is the same as the number of the second through holes, and one end of the plurality of shunt channels is in one-to-one correspondence with a plurality of the second communication channels.
  • the holes communicate, and the other end converges to the center position of the ring body.
  • the ventilation structure includes a plurality of linear ducts disposed along a radial direction of the annular body, and an inner cavity of each of the linear ducts is used as the shunt channel.
  • the device further includes:
  • One end of the suction pipe is in communication with the other end of each of the shunt channels converging to the center position of the annular body, and the other end of the suction pipe is used to connect with the suction system.
  • the ventilation structure further includes:
  • a central disc which is located at a central position of the annular body and is fixedly connected to each of the straight pipelines, and a connecting channel communicating with each of the diverting channels is provided in the central disc; the central circle
  • the disk is fixedly connected to the exhaust pipe, and both have abutment surfaces.
  • the connection channel and the inner cavity of the exhaust pipe are respectively provided with annular butt openings on the abutting surface of the central disc and the exhaust pipe.
  • the device further includes: a third annular elastic element and a fourth annular elastic element, both of which are coaxially disposed between the central disk and the abutting surface of the suction pipe, and are respectively located inside the annular butt joint. And outside.
  • the device for operating the substrate provided by the present invention can disperse the adsorption force in the area closer to the edge of the substrate by setting the suction port in the annular edge area of the adsorption surface, which is compared with the prior art.
  • the required pumping volume and pumping force are smaller, and the negative pressure at the edge of the substrate is uniform, thereby avoiding deformation of the substrate and even crushing and pollution due to the concentration of the area where the suction force acts.
  • FIG. 1 is a schematic perspective structural view of an embodiment of an apparatus for operating a substrate according to the present invention
  • FIG. 2 is a schematic exploded structure diagram of an embodiment of an apparatus for operating a substrate according to the present invention
  • FIG. 3 is a schematic structural cross-sectional view of an embodiment of an apparatus for operating a substrate according to the present invention.
  • the present invention provides an apparatus for operating a substrate, wherein the substrate may be a plurality of semiconductor wafers.
  • the device has a function of taking or placing a film, such as a substrate transfer device.
  • the device includes a gripping disc structure having a suction surface that can be positioned opposite the substrate when the device handles the substrate.
  • An extraction channel is also provided in the gripping disc structure.
  • the extraction channel includes a plurality of extraction ports distributed in the annular edge area of the adsorption surface. When the device operates the substrate, the extraction channel is used to extract the substrate and the adsorption through the extraction channel. The air between the surfaces attracts the substrate.
  • the substrate can only be transferred on the front side of the substrate.
  • the adsorption surface of the gripping disk structure described above is used to adsorb the front side of the substrate, and only on the edge of the substrate. Contact the non-operational areas to avoid affecting the fabrication of subsequent integrated circuits.
  • the suction force can be dispersed in the area closer to the edge of the substrate.
  • the required suction volume and suction force are smaller, and the edge of the substrate is smaller.
  • the negative pressure is uniform, which can avoid deformation of the substrate and even pressure injury and pollution due to the concentration of the area where the adsorption force is applied.
  • the above-mentioned annular edge region can be any designated region on the adsorption surface, and the setting of the region satisfies: the adsorption force can be dispersed in the region closer to the edge of the substrate to reduce the amount of air extraction and increase the adsorption force The purpose of uniformity.
  • the gripping disc structure includes: a uniform air disc 182 and a carrier disc 183.
  • the carrying tray 183 has the above-mentioned suction surface, and a plurality of first through holes (38, 39) penetrating the carrying tray along its axial direction are provided in the carrying tray 183.
  • the first through holes (38, 39) are formed in the carrying tray 183.
  • the port on the suction surface is used as a suction port.
  • the plurality of first through holes are all located in the above-mentioned annular edge region, and are evenly distributed on two circles with different radii having the center of the adsorption surface as the center of the circle.
  • the radius of the circumference where the first through hole 38 is located is greater than the radius of the circumference where the first through hole 39 is located.
  • the number of circles, the size of the radius, the number of first through holes on each circle, the size of the diameter, etc. can be set according to specific needs.
  • the circumference of the first through hole may also be one or more than three.
  • an adsorption groove 41 is provided on the adsorption surface, and all the suction ports are communicated with the adsorption groove 41.
  • the side surface of the adsorption groove 41 includes a first annular surface and a second annular surface that are sequentially arranged from the edge of the adsorption surface toward the center, wherein the first annular surface is inclined with respect to the adsorption surface and is opposite to the substrate 40.
  • the vertical gap between them gradually increases from the edge of the adsorption surface toward the center; the second annular surface is inclined or perpendicular to the adsorption surface.
  • the contact position between the adsorption surface and the substrate can be made closer to the edge of the substrate, and by making the first torus inclined relative to the adsorption surface, the contact area between the adsorption surface and the substrate 40 can be effectively reduced, thereby ensuring that It can be in contact with only the non-working area at the edge of the substrate 40 to avoid affecting the fabrication of subsequent integrated circuits.
  • the circumference of the first through hole 38 is distributed on the first torus, and the circumference of the first through hole 39 is distributed on the bottom surface of the adsorption groove 41.
  • the adsorption force can be effectively dispersed in the area closer to the edge of the substrate, and the air between the substrate 40 and the entire adsorption surface can be evacuated, so that the substrate 40 can be firmly adsorbed.
  • multiple circumferential suction ports may be distributed on the first annular surface, or multiple circumferential suction ports may be distributed on both the first annular surface and the bottom surface of the adsorption tank.
  • the air distribution plate 182 is connected to the bearing plate 183, and the two can be detached by screw connection or snap-on connection, for example, the connection screw 111 is used to fix the gas distribution plate 182 and the bearing plate 183 together.
  • the gas distribution plate 182 is located on the side of the bearing plate 183 facing away from the adsorption surface, and a gas distribution channel is provided in the gas distribution plate 182, and the gas distribution channel communicates with each of the first through holes (38, 39) to form an air suction channel .
  • the device further includes a first annular elastic element 221 and a second annular elastic element 222, both of which are located between the air homogenizing plate 182 and the carrying plate 183, and are used between the air homogenizing plate 182 and the carrying plate 183 A ring-shaped sealed space is enclosed to communicate the uniform air passage with each first through hole (38, 39).
  • each of the first annular elastic element 221 and the second annular elastic element 222 may be an O-shaped rubber ring, and the O-shaped rubber ring can work for a long time in a temperature range of 350-400 ° C.
  • first ring-shaped elastic element 221 and the second ring-shaped elastic element 222 may be adhered between the air homogenizing plate 182 and the bearing plate 183 with a high elastic polymer glue, and other sealing elastic members such as a sealing butterfly spring may also be used.
  • annular groove is provided on the opposite side of the air uniformity disk 182 and the bearing plate 183 and is located in the annular sealed space.
  • an annular groove may also be provided only on the opposite side of the air homogenizing disc 182 or the bearing disc 183.
  • the air distribution plate 182 includes a ring-shaped body 171 and a ventilation structure, wherein the ring-shaped body 171 is connected to the bearing plate 183; the first ring-shaped elastic element 221 and the second ring-shaped elastic element 222 are located between the ring-shaped body 171 and the bearing plate 183, and, in The ring body 171 is provided with a plurality of second through holes 37 penetrating through the ring body 171 along its axial direction. The plurality of second through holes 37 are evenly distributed along the circumferential direction of the ring body 171. Each of the second through holes 37 and the ring shape The sealed space communicates.
  • the ventilation structure has a plurality of shunt channels 36 having the same structure, the number of the shunt channels 36 is the same as the number of the second through holes 37, and one end of the plurality of shunt channels 36 communicates with the plurality of second through holes 37 one by one, The other end converges to the center position of the ring body 171.
  • the ventilation structure includes a plurality of linear ducts 161 disposed along the radial direction of the annular body 171, and the inner cavity of each linear duct 161 is used as a 36-split channel.
  • the air extraction mode in which the airflow converges from the periphery to the center can be realized, and because the paths of the air passing through each of the shunt channels 36 are the same, this can ensure that the air extraction volume in the circumferential direction of the substrate is consistent, so that the negative pressure at the edge of the substrate is uniform.
  • the shunt channel of any other structure may also be used, for example, a shunt channel capable of extracting air from the edge point to the center, and the edge point to the edge, etc.
  • the device further includes an exhaust pipe 181, one end of which is in communication with the other end of each of the distribution channels 36 converging to the center position of the annular body 171, and the other end of the exhaust pipe 181 is used to communicate with the suction system (in the figure) (Not shown) connected.
  • the ventilation structure includes a central disc 151 located at the center position of the ring-shaped body 171 and fixedly connected to each of the linear pipes 161, such as welding or gluing or integral molding.
  • a connecting channel communicating with each of the diverting channels 36 is provided in the central disk 151; the central disk 151 and the exhaust pipe 181 are fixedly connected with the connecting screw 101, and the two have a butting surface, a connecting channel and
  • the inner cavity 35 is oppositely provided with annular butt openings on the abutting surfaces of the central disc 151 and the suction pipe 181, respectively, for achieving communication between the connection channel and the inner cavity 35 of the suction pipe 181.
  • the device further includes a third annular elastic element 121 and a fourth annular elastic element 122, both of which are coaxially disposed between the abutting surface of the central disc 151 and the suction pipe 181, and are located inside and outside the annular butt joint respectively.
  • the third ring-shaped elastic element 121 and the fourth ring-shaped elastic element 122 have the same functions as the first ring-shaped elastic element 221 and the second ring-shaped elastic element 222 described above, and can both play a sealing role and form an elastic cushioning structure.
  • a heavy buffer is added to further reduce the pressure on the substrate and avoid damaging the substrate during the process of picking and placing the wafer.
  • both the third annular elastic element 121 and the fourth annular elastic element 122 may be O-shaped rubber rings, and the O-shaped rubber rings can work for a long time in a temperature range of 350-400 ° C.
  • the third ring-shaped elastic element 121 and the fourth ring-shaped elastic element 122 may also be bonded between the abutting surface of the central disc 151 and the suction pipe 181 with a high elastic polymer glue, and other sealing elasticity such as a sealing butterfly spring may also be used. Pieces.
  • step one the apparatus 200 for operating the substrate is horizontally moved until the carrier tray 183 is positioned directly above the substrate 40.
  • step two the apparatus 200 is lowered until the suction surface of the carrier tray 183 touches at least one point of the upper edge of the substrate 40.
  • Step three continue to slowly lower the device 200 so that the air-distributing disk 182 rotates relative to its horizontal axis but not relative to its vertical symmetrical axis until the suction surface of the carrier disk 183 touches the entire upper edge of the substrate 40.
  • step three during the process of slowly lowering the device 200, under the effect of the device 200's own gravity, the carrier plate 183 will exert continuous pressure on the substrate 40.
  • the first A ring-shaped elastic element 221 and a second ring-shaped elastic element 222, and a third ring-shaped elastic element 121 and a fourth ring-shaped elastic element 122 between the abutting surface of the central disk 151 and the suction pipe 181 provide double elastic cushioning, which can eliminate the lining.
  • Part of the pressure on the bottom 40 prevents the substrate from being crushed during the pick-and-place process.
  • Step four the suction chamber is used to sequentially pass through the inner cavity 35 of the suction pipe 181, the inner cavity of each linear pipe 161 (that is, the shunt channel 36), each second through hole 37, and each first through hole (38, 39).
  • the gas in the adsorption groove 41 between the substrate 40 and the adsorption surface of the carrier disk 183 is evacuated to form a vacuum negative pressure. This negative pressure will "press" the substrate 40 onto the adsorption surface of the carrier disk 183.
  • the ports (ie, suction ports) of the through holes (38, 39) on the adsorption surface are arranged in the annular edge region of the adsorption surface, which can disperse the adsorption force in the region closer to the edge of the substrate, which is compared with the prior art.
  • the required pumping volume and pumping force are smaller, and the negative pressure at the edge of the substrate is uniform, thereby avoiding deformation of the substrate and even crushing and pollution due to the concentration of the area where the suction force acts.
  • step five the apparatus 200 with the substrate 40 is moved horizontally after being lifted.
  • a fixed connection can be understood as: a detachably fixed connection (such as a bolt or screw connection), or It is understood as: non-removable fixed connection (such as riveting, welding), of course, the fixed connection to each other can also be replaced by an integrated structure (such as manufactured by integral molding using a casting process) (except that an integral molding process cannot obviously be used).
  • any component provided by the present invention can be assembled from a plurality of separate components, or it can be a separate component manufactured by an integral molding process.

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Abstract

Disclosed is a device for operating a substrate, comprising: a grabbing disc structure having an adsorption surface. The grabbing disc structure is provided with an air suction channel; the air suction channel comprises a plurality of air suction openings distributed on an annular edge area of the adsorption surface; when the device operates the substrate, the air suction channel sucks air between the substrate and the adsorption surface to adsorb the substrate. The device in the present invention requires less air suction volume and small suction force, and the pressure applied on the edge of the substrate is uniform, thus avoiding the problem that the substrate is deformed and even crushed and contaminated due to concentration of action areas of the adsorption force.

Description

用于操作衬底的设备Equipment for handling substrates 技术领域Technical field
本发明涉及半导体制造技术领域,尤其涉及一种用于操作衬底的设备。The present invention relates to the technical field of semiconductor manufacturing, and in particular, to an apparatus for operating a substrate.
背景技术Background technique
在半导体集成电路制造领域中,通常采用外延反应器制造半导体衬底的外延涂层,即向外延腔室中通入沉积气体,该沉积气体在经过半导体衬底的表面时沉积外延材料。在使用外延反应器制造外延涂层的过程中,衬底传送属于非常重要的内容。In the field of semiconductor integrated circuit manufacturing, an epitaxial reactor is usually used to manufacture an epitaxial coating of a semiconductor substrate, that is, a deposition gas is passed into the epitaxial chamber, and the deposition gas deposits an epitaxial material when passing through the surface of the semiconductor substrate. In the process of manufacturing an epitaxial coating using an epitaxial reactor, substrate transfer is a very important content.
衬底一般是圆形的,具有正面和背面,衬底正面用于制造集成电路结构,所以在衬底传送过程中,保护衬底正面不受损坏是非常重要的。为此,通常会选择作用于衬底背面(例如吸附)进行衬底的传送,但是,这种传送方式无法适用于外延反应某些领域中,针对这些领域,只能作用于衬底正面进行衬底的传送。不过,并非整个衬底正面都用于制造集成电路结构,衬底正面的距离边缘处几毫米的区域为非作业区域,不用于集成电路结构的制造。因此,可以通过作用于衬底正面的边缘区域来实现衬底的传送。The substrate is generally circular and has a front side and a back side. The front side of the substrate is used to manufacture integrated circuit structures, so it is very important to protect the front side of the substrate from damage during the substrate transfer process. For this reason, it is usually chosen to act on the backside of the substrate (such as adsorption) to transfer the substrate. However, this transfer method cannot be applied to certain areas of epitaxial reactions. For these areas, it can only act on the front side of the substrate for lining. Bottom of the transmission. However, not the entire front side of the substrate is used to manufacture integrated circuit structures. The area a few millimeters from the edge of the front side of the substrate is a non-operational area and is not used for manufacturing integrated circuit structures. Therefore, the substrate can be transferred by acting on the edge region of the front surface of the substrate.
目前,虽然有多种用于传送衬底的设备,但这些设备都有不足之处。例如,现有的一种衬底传送设备的取片方式是:采用真空吸附的方式作用于衬底正面的中心区域,而且仅与衬底正面的边缘区域接触。这虽然可以保护衬底正面不受损坏,但是,由于吸附孔集中布置在衬底的中心区域,一方面需要使用大流量抽吸才能有足够的吸附力,另一方面过大的吸附力还可能致使衬底变形过大,从而容易形成压伤。At present, although there are various apparatuses for transferring substrates, these apparatuses all have disadvantages. For example, a conventional wafer picking method of a substrate transfer device is to use a vacuum adsorption method to act on a central area of a front surface of a substrate, and only contact an edge area of the front surface of the substrate. Although this can protect the front side of the substrate from damage, because the suction holes are concentratedly arranged in the central area of the substrate, on the one hand, a large flow of suction is required to have sufficient adsorption force, and on the other hand, excessive adsorption force may also be possible. As a result, the substrate is deformed too much, so that a bruise is easily formed.
发明内容Summary of the invention
有鉴于此,本发明实施例提供一种用于操作衬底的设备。In view of this, an embodiment of the present invention provides an apparatus for operating a substrate.
根据本发明实施例的一个方面,提供一种用于操作衬底的设备,包括:According to an aspect of an embodiment of the present invention, an apparatus for operating a substrate is provided, including:
抓取盘结构,具有吸附面,且在所述抓取盘结构中设置有抽气通道,所述抽气通道包括分布在所述吸附面的环形边缘区域的多个抽气口,在所述设备操作所述衬底时,通过所述抽气通道抽出在所述衬底与所述吸附面之间的空气来吸附所述衬底。The gripping disc structure has an adsorption surface, and an extraction channel is provided in the gripping disc structure, and the exhaustion channel includes a plurality of exhaustion ports distributed in an annular edge region of the adsorption surface. When the substrate is operated, air is sucked out between the substrate and the adsorption surface through the suction channel to adsorb the substrate.
可选的,所述环形边缘区域的最大半径与所述衬底的半径相等;所述环形边缘区域的最小半径与所述衬底的半径的比值为7/10。Optionally, the maximum radius of the annular edge region is equal to the radius of the substrate; the ratio of the minimum radius of the annular edge region to the radius of the substrate is 7/10.
可选的,所述多个抽气口在以所述吸附面的中心为圆心的一个圆周或半径不同的多个圆周上均匀分布。Optionally, the plurality of air suction ports are evenly distributed on a circumference or a plurality of circumferences having different radii with the center of the adsorption surface as a circle center.
可选的,在所述吸附面上设置有吸附槽,所有的所述抽气口均与所述吸附槽相连通。Optionally, an adsorption tank is provided on the adsorption surface, and all of the suction ports are in communication with the adsorption tank.
可选的,所述吸附槽的侧面包括自所述吸附面的边缘向靠近中心的方向依次设置的第一环面和第二环面,其中,所述第一环面相对于所述吸附面倾斜,且与所述衬底之间的竖直间隙自所述吸附面的边缘向靠近中心的方向逐渐增大;所述第二环面相对于所述吸附面倾斜或者垂直。Optionally, a side surface of the adsorption groove includes a first annular surface and a second annular surface which are sequentially arranged from an edge of the adsorption surface toward a center, wherein the first annular surface is inclined with respect to the adsorption surface. And the vertical gap between the substrate and the substrate gradually increases from the edge of the adsorption surface toward the center; the second annular surface is inclined or perpendicular to the adsorption surface.
可选的,所述第一环面上分布有所述抽气口所在的至少一个圆周;或者,所述第一环面和所述吸附槽的底面均分布有所述抽气口所在的至少一个圆周。Optionally, at least one circumference where the suction port is located is distributed on the first torus; or at least one circumference where the suction port is located on both the first torus and the bottom surface of the adsorption tank .
可选的,所述抓取盘结构包括:Optionally, the gripping disc structure includes:
承载盘,具有所述吸附面,且在所述承载盘中设置有多个沿其轴向贯通所述承载盘的第一通孔,所述第一通孔在所述吸附面上的端口用作所述抽气口;及A carrier disk has the adsorption surface, and a plurality of first through holes penetrating the carrier disk along its axial direction are provided in the carrier disk. Ports of the first through holes on the adsorption surface are used for the ports. Making the suction port; and
匀气盘,与所述承载盘连接,且位于所述承载盘背离所述吸附面的一侧;并且,在所述匀气盘中设置有匀气通道,所述匀气通道与各个所述第一通孔 连通,以构成所述抽气通道。A gas-homing disk is connected to the carrier disk and is located on a side of the carrier disk facing away from the adsorption surface; and a gas-homing channel is provided in the gas-homing disk, and the gas-homing channels are connected to each of the The first through hole communicates with each other to form the suction channel.
可选的,所述设备还包括:第一环形弹性元件和第二环形弹性元件,二者位于所述匀气盘和所述承载盘之间,用以在二者之间围成环形密封空间,用以使所述匀气通道和各个所述第一通孔相连通。Optionally, the device further includes: a first annular elastic element and a second annular elastic element, both of which are located between the air homogenizing disc and the bearing disc, so as to form an annular sealed space therebetween. To communicate the uniform air passage with each of the first through holes.
可选的,在所述匀气盘和/或所述承载盘的相对面上,且位于所述环形密封空间内设置有环形凹槽,所述环形凹槽与所述匀气通道和各个所述第一通孔相连通。Optionally, an annular groove is provided on the opposite surface of the air uniform plate and / or the carrier plate and is located in the annular sealed space, and the annular groove is connected to the air uniform channel and each of the The first through hole communicates.
可选的,所述匀气盘包括:Optionally, the air homogenization plate includes:
环形本体,与所述承载盘连接;所述第一环形弹性元件和第二环形弹性元件位于所述环形本体和所述承载盘之间,并且,在所述环形本体中设置有多个沿其轴向贯通所述环形本体的第二通孔,多个所述第二通孔沿所述环形本体的周向均匀分布,每个所述第二通孔与所述环形密封空间连通;An annular body is connected to the carrying plate; the first annular elastic element and the second annular elastic element are located between the annular body and the carrying plate, and a plurality of annular elastic elements are provided along the annular body. A second through hole axially penetrating the annular body, a plurality of the second through holes are evenly distributed along a circumferential direction of the annular body, and each of the second through holes communicates with the annular sealed space;
通气结构,具有多条结构相同的分流通道,所述分流通道的数量与所述第二通孔的数量相同,且多条所述分流通道的一端一一对应地与多个所述第二通孔连通,另一端汇聚至所述环形本体的中心位置处。The ventilation structure has a plurality of shunt channels with the same structure, the number of the shunt channels is the same as the number of the second through holes, and one end of the plurality of shunt channels is in one-to-one correspondence with a plurality of the second communication channels. The holes communicate, and the other end converges to the center position of the ring body.
可选的,所述通气结构包括多个沿所述环形本体的径向设置的直线管道,每个所述直线管道的内腔用作所述分流通道。Optionally, the ventilation structure includes a plurality of linear ducts disposed along a radial direction of the annular body, and an inner cavity of each of the linear ducts is used as the shunt channel.
可选的,所述设备还包括:Optionally, the device further includes:
抽气管,其一端与各条所述分流通道汇聚至所述环形本体的中心位置处的另一端连通,所述抽气管的另一端用于与抽吸系统连接。One end of the suction pipe is in communication with the other end of each of the shunt channels converging to the center position of the annular body, and the other end of the suction pipe is used to connect with the suction system.
可选的,所述通气结构还包括:Optionally, the ventilation structure further includes:
中心圆盘,位于所述环形本体的中心位置处,且与各个所述直线管道固定连接,并且在所述中心圆盘中设置有与各条所述分流通道连通的连接通道;所述中心圆盘与所述抽气管固定连接,二者分别具有对接面,所述连接通道和所述抽气管的内腔分别在所述中心圆盘和所述抽气管的对接面上相对设置 有环形对接开口;A central disc, which is located at a central position of the annular body and is fixedly connected to each of the straight pipelines, and a connecting channel communicating with each of the diverting channels is provided in the central disc; the central circle The disk is fixedly connected to the exhaust pipe, and both have abutment surfaces. The connection channel and the inner cavity of the exhaust pipe are respectively provided with annular butt openings on the abutting surface of the central disc and the exhaust pipe. ;
所述设备还包括:第三环形弹性元件和第四环形弹性元件,二者同轴设置在所述中心圆盘与所述抽气管的对接面之间,且分别位于所述环形对接口的内侧和外侧。The device further includes: a third annular elastic element and a fourth annular elastic element, both of which are coaxially disposed between the central disk and the abutting surface of the suction pipe, and are respectively located inside the annular butt joint. And outside.
本发明提供的用于操作衬底的设备,其通过将抽气口设置在吸附面的环形边缘区域,可以将吸附力分散作用在更靠近衬底边缘的区域,这与现有技术相比,所需的抽气量、抽力更小,衬底边缘负压均匀,从而可以避免因吸附力作用区域集中而造成衬底变形甚至产生压伤及污染。The device for operating the substrate provided by the present invention can disperse the adsorption force in the area closer to the edge of the substrate by setting the suction port in the annular edge area of the adsorption surface, which is compared with the prior art. The required pumping volume and pumping force are smaller, and the negative pressure at the edge of the substrate is uniform, thereby avoiding deformation of the substrate and even crushing and pollution due to the concentration of the area where the suction force acts.
本发明实施例附加的方面和优点将在下面的描述中部分给出,这些将从下面的描述中变得明显,或通过本发明的实践了解到。Additional aspects and advantages of the embodiments of the present invention will be given in the following description, which will become apparent from the following description or be learned through the practice of the present invention.
附图说明BRIEF DESCRIPTION OF THE DRAWINGS
为了更清楚地说明本发明实施例或现有技术中的技术方案,下面将对实施例或现有技术描述中所需要使用的附图作一简单地介绍,显而易见地,下面描述中的附图仅仅是本发明的一些实施例,对于本领域普通技术人员来讲,在不付出创造性劳动性的前提下,还可以根据这些附图获得其它的附图:In order to more clearly explain the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings in the following description These are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without paying creative labor:
图1为根据本发明的用于操作衬底的设备的一个实施例的立体结构示意图;FIG. 1 is a schematic perspective structural view of an embodiment of an apparatus for operating a substrate according to the present invention; FIG.
图2为根据本发明的用于操作衬底的设备的一个实施例的分解结构示意图;FIG. 2 is a schematic exploded structure diagram of an embodiment of an apparatus for operating a substrate according to the present invention; FIG.
图3为根据本发明的用于操作衬底的设备的一个实施例的结构剖面示意图。FIG. 3 is a schematic structural cross-sectional view of an embodiment of an apparatus for operating a substrate according to the present invention.
具体实施方式detailed description
下面参照附图对本发明进行更全面的描述,其中说明本发明的示例性实施例。下面将结合本发明实施例中的附图,对本发明实施例中的技术方案进 行清楚、完整地描述,显然,所描述的实施例仅仅是本发明一部分实施例,而不是全部的实施例。基于本发明中的实施例,本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例,都属于本发明保护的范围。下面结合图和实施例对本发明的技术方案进行多方面的描述。The invention is described more fully hereinafter with reference to the accompanying drawings, in which exemplary embodiments of the invention are described. In the following, the technical solutions in the embodiments of the present invention will be clearly and completely described with reference to the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, but not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by a person of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention. The technical solution of the present invention will be described in various aspects with reference to the drawings and embodiments.
下文为了叙述方便,下文中所称的“左”、“右”、“上”、“下”与附图本身的左、右、上、下方向一致。For the convenience of description, the "left", "right", "up", and "down" referred to in the following are consistent with the left, right, up, and down directions of the drawing itself.
下文中的“第一”、“第二”等,仅用于描述上相区别,并没有其它特殊的含义。The terms "first" and "second" in the following are only used to describe the differences and have no other special meanings.
本发明提供一种用于操作衬底的设备,其中衬底可为多种半导体晶片。该设备具有取片或放片的功能,例如为衬底传送设备。该设备包括抓取盘结构,该抓取盘结构具有吸附面,该吸附面可在该设备操作衬底时与衬底相对设置。在该抓取盘结构中还设置有抽气通道,该抽气通道包括分布在吸附面的环形边缘区域的多个抽气口,在设备操作衬底时,通过抽气通道抽出在衬底与吸附面之间的空气来吸附衬底。The present invention provides an apparatus for operating a substrate, wherein the substrate may be a plurality of semiconductor wafers. The device has a function of taking or placing a film, such as a substrate transfer device. The device includes a gripping disc structure having a suction surface that can be positioned opposite the substrate when the device handles the substrate. An extraction channel is also provided in the gripping disc structure. The extraction channel includes a plurality of extraction ports distributed in the annular edge area of the adsorption surface. When the device operates the substrate, the extraction channel is used to extract the substrate and the adsorption through the extraction channel. The air between the surfaces attracts the substrate.
对于外延反应某些领域中,只能作用于衬底正面进行衬底的传送,在这种情况下,上述抓取盘结构的吸附面用于吸附衬底的正面,且仅与衬底的边缘处的非作业区域相接触,以避免影响后续集成电路的制造。In some fields of epitaxial reaction, the substrate can only be transferred on the front side of the substrate. In this case, the adsorption surface of the gripping disk structure described above is used to adsorb the front side of the substrate, and only on the edge of the substrate. Contact the non-operational areas to avoid affecting the fabrication of subsequent integrated circuits.
通过将抽气口设置在吸附面的环形边缘区域,可以将吸附力分散作用在更靠近衬底边缘的区域,这与现有技术相比,所需的抽气量、抽力更小,衬底边缘负压均匀,从而可以避免因吸附力作用区域集中而造成衬底变形甚至产生压伤及污染。By setting the suction port in the annular edge area of the suction surface, the suction force can be dispersed in the area closer to the edge of the substrate. Compared with the prior art, the required suction volume and suction force are smaller, and the edge of the substrate is smaller. The negative pressure is uniform, which can avoid deformation of the substrate and even pressure injury and pollution due to the concentration of the area where the adsorption force is applied.
需要说明的是,上述环形边缘区域可以是吸附面上的任意指定区域,该区域的设定满足:能够将吸附力分散作用在更靠近衬底边缘的区域,以达到减少抽气量,提高吸附力均匀性的目的。It should be noted that the above-mentioned annular edge region can be any designated region on the adsorption surface, and the setting of the region satisfies: the adsorption force can be dispersed in the region closer to the edge of the substrate to reduce the amount of air extraction and increase the adsorption force The purpose of uniformity.
例如,上述环形边缘区域的最大半径与衬底的半径相等;环形边缘区域 的最小半径与衬底的半径的比值为7/10。在该区域内,可以有效的将吸附力分散作用在更靠近衬底边缘的区域。下面对本发明提供的用于操作衬底的设备的具体实施方式进行详细描述。如图1至图3所示,在一个实施例中,抓取盘结构包括:匀气盘182和承载盘183。其中,承载盘183具有上述吸附面,且在该承载盘183中设置有多个沿其轴向贯通承载盘的第一通孔(38,39),该第一通孔(38,39)在吸附面上的端口用作抽气口。For example, the maximum radius of the annular edge region is equal to the radius of the substrate; the ratio of the minimum radius of the annular edge region to the radius of the substrate is 7/10. In this region, the adsorption force can be effectively dispersed in the region closer to the edge of the substrate. Hereinafter, specific embodiments of the apparatus for operating a substrate provided by the present invention will be described in detail. As shown in FIG. 1 to FIG. 3, in one embodiment, the gripping disc structure includes: a uniform air disc 182 and a carrier disc 183. The carrying tray 183 has the above-mentioned suction surface, and a plurality of first through holes (38, 39) penetrating the carrying tray along its axial direction are provided in the carrying tray 183. The first through holes (38, 39) are formed in the carrying tray 183. The port on the suction surface is used as a suction port.
在本实施例中,多个第一通孔均位于上述环形边缘区域内,且在以吸附面的中心为圆心的半径不同的两个圆周上均匀分布。具体地,第一通孔38所在圆周的半径大于第一通孔39所在圆周的半径。当然,在实际应用中,可以根据具体需要设定圆周的数量、半径大小及每个圆周上的第一通孔的数量和直径大小等等。例如,第一通孔所在圆周也可以为一个或者三个以上。In this embodiment, the plurality of first through holes are all located in the above-mentioned annular edge region, and are evenly distributed on two circles with different radii having the center of the adsorption surface as the center of the circle. Specifically, the radius of the circumference where the first through hole 38 is located is greater than the radius of the circumference where the first through hole 39 is located. Of course, in practical applications, the number of circles, the size of the radius, the number of first through holes on each circle, the size of the diameter, etc. can be set according to specific needs. For example, the circumference of the first through hole may also be one or more than three.
在本实施例中,在吸附面上设置有吸附槽41,所有的抽气口均与该吸附槽41相连通,在设备操作衬底时,以保证能够抽空衬底40与整个吸附面之间的空气,从而稳固地吸附衬底40。In this embodiment, an adsorption groove 41 is provided on the adsorption surface, and all the suction ports are communicated with the adsorption groove 41. When the substrate is operated by the device, it is ensured that the space between the substrate 40 and the entire adsorption surface can be evacuated. Air, thereby firmly adsorbing the substrate 40.
可选的,吸附槽41的侧面包括自吸附面的边缘向靠近中心的方向依次设置的第一环面和第二环面,其中,第一环面相对于吸附面倾斜,且与衬底40之间的竖直间隙自吸附面的边缘向靠近中心的方向逐渐增大;第二环面相对于吸附面倾斜或垂直。这样,可以使吸附面与衬底的接触位置更靠近衬底的边缘,同时通过使第一环面相对于吸附面倾斜,可以有效减小吸附面与衬底40之间的接触面积,从而可以保证能够仅与衬底40的边缘处的非作业区域相接触,以避免影响后续集成电路的制造。Optionally, the side surface of the adsorption groove 41 includes a first annular surface and a second annular surface that are sequentially arranged from the edge of the adsorption surface toward the center, wherein the first annular surface is inclined with respect to the adsorption surface and is opposite to the substrate 40. The vertical gap between them gradually increases from the edge of the adsorption surface toward the center; the second annular surface is inclined or perpendicular to the adsorption surface. In this way, the contact position between the adsorption surface and the substrate can be made closer to the edge of the substrate, and by making the first torus inclined relative to the adsorption surface, the contact area between the adsorption surface and the substrate 40 can be effectively reduced, thereby ensuring that It can be in contact with only the non-working area at the edge of the substrate 40 to avoid affecting the fabrication of subsequent integrated circuits.
进一步可选的,第一通孔38所在圆周分布在第一环面上,而第一通孔39所在圆周分布在吸附槽41的底面上。这样,既可以有效的将吸附力分散作用在更靠近衬底边缘的区域,又可以保证能够抽空衬底40与整个吸附面之间的空气,从而稳固吸附衬底40。当然,在实际应用中,也可以在第一环面 上分布多个圆周的抽气口,或者,在第一环面和吸附槽的底面均分布多个圆周的抽气口。Further optionally, the circumference of the first through hole 38 is distributed on the first torus, and the circumference of the first through hole 39 is distributed on the bottom surface of the adsorption groove 41. In this way, the adsorption force can be effectively dispersed in the area closer to the edge of the substrate, and the air between the substrate 40 and the entire adsorption surface can be evacuated, so that the substrate 40 can be firmly adsorbed. Of course, in practical applications, multiple circumferential suction ports may be distributed on the first annular surface, or multiple circumferential suction ports may be distributed on both the first annular surface and the bottom surface of the adsorption tank.
匀气盘182和承载盘183连接,二者可以采用螺纹连接或者卡接等的可拆卸连接方式,例如采用连接螺钉111将匀气盘182和承载盘183固定在一起。匀气盘182位于承载盘183背离吸附面的一侧,并且在匀气盘182中设置有匀气通道,该匀气通道与各个第一通孔(38,39)连通,以构成抽气通道。The air distribution plate 182 is connected to the bearing plate 183, and the two can be detached by screw connection or snap-on connection, for example, the connection screw 111 is used to fix the gas distribution plate 182 and the bearing plate 183 together. The gas distribution plate 182 is located on the side of the bearing plate 183 facing away from the adsorption surface, and a gas distribution channel is provided in the gas distribution plate 182, and the gas distribution channel communicates with each of the first through holes (38, 39) to form an air suction channel .
在本实施例中,设备还包括第一环形弹性元件221和第二环形弹性元件222,二者位于匀气盘182和承载盘183之间,用以在匀气盘182和承载盘183之间围成环形密封空间,用以使匀气通道和各个第一通孔(38,39)相连通。In this embodiment, the device further includes a first annular elastic element 221 and a second annular elastic element 222, both of which are located between the air homogenizing plate 182 and the carrying plate 183, and are used between the air homogenizing plate 182 and the carrying plate 183 A ring-shaped sealed space is enclosed to communicate the uniform air passage with each first through hole (38, 39).
借助上述第一环形弹性元件221和第二环形弹性元件222,既可以起到密封作用,又可以构成弹性缓冲结构,用以在承载盘183接触衬底时,可以起到缓冲作用,以减小衬底受到的压力,避免在取放片的过程中压伤衬底。在实际应用中,第一环形弹性元件221和第二环形弹性元件222均可以为O形橡胶圈,该O形橡胶圈能够在350-400℃的温度范围内长期工作。或者,第一环形弹性元件221和第二环形弹性元件222也可以采用高弹性聚合胶粘接在匀气盘182和承载盘183之间,还可以采用密封蝶簧等的其他密封弹性件。With the above-mentioned first annular elastic element 221 and second annular elastic element 222, it can not only play a sealing role, but also form an elastic buffer structure, which can play a buffer function when the carrier tray 183 contacts the substrate, so as to reduce The substrate is under pressure to avoid crushing the substrate during the pick-and-place process. In practical applications, each of the first annular elastic element 221 and the second annular elastic element 222 may be an O-shaped rubber ring, and the O-shaped rubber ring can work for a long time in a temperature range of 350-400 ° C. Alternatively, the first ring-shaped elastic element 221 and the second ring-shaped elastic element 222 may be adhered between the air homogenizing plate 182 and the bearing plate 183 with a high elastic polymer glue, and other sealing elastic members such as a sealing butterfly spring may also be used.
在本实施例中,在匀气盘182和承载盘183的相对面上,且位于环形密封空间内设置有环形凹槽,该环形凹槽与匀气通道和各个第一通孔(38,39)相连通。这样,可以增大环形密封空间的体积,从而可以提高气流的流畅性和气流均匀性。当然,在实际应用中,也可以仅在匀气盘182或者承载盘183的相对面上设置环形凹槽。In this embodiment, an annular groove is provided on the opposite side of the air uniformity disk 182 and the bearing plate 183 and is located in the annular sealed space. The annular groove and the air uniformity channel and each first through hole (38, 39 ) Connected. In this way, the volume of the annular sealed space can be increased, and the smoothness and uniformity of the airflow can be improved. Of course, in practical applications, an annular groove may also be provided only on the opposite side of the air homogenizing disc 182 or the bearing disc 183.
匀气盘182包括环形本体171和通气结构,其中,环形本体171与承载 盘183连接;第一环形弹性元件221和第二环形弹性元件222位于环形本体171和承载盘183之间,并且,在环形本体171中设置有多个沿其轴向贯通环形本体171的第二通孔37,多个第二通孔37沿环形本体171的周向均匀分布,每个第二通孔37与上述环形密封空间连通。The air distribution plate 182 includes a ring-shaped body 171 and a ventilation structure, wherein the ring-shaped body 171 is connected to the bearing plate 183; the first ring-shaped elastic element 221 and the second ring-shaped elastic element 222 are located between the ring-shaped body 171 and the bearing plate 183, and, in The ring body 171 is provided with a plurality of second through holes 37 penetrating through the ring body 171 along its axial direction. The plurality of second through holes 37 are evenly distributed along the circumferential direction of the ring body 171. Each of the second through holes 37 and the ring shape The sealed space communicates.
通气结构具有多条结构相同的分流通道36,该分流通道36的数量与第二通孔37的数量相同,且多条分流通道36的一端一一对应地与多个第二通孔37连通,另一端汇聚至环形本体171的中心位置处。在本实施例中,通气结构包括多个沿环形本体171的径向设置的直线管道161,每个直线管道161的内腔用作36分流通道。这样,可以实现气流从四周向中心汇聚的抽气方式,而且由于空气经过各条分流通道36的路径相同,这可以保证衬底圆周方向上的抽气量一致,从而使衬底边缘负压均匀。当然,在实际应用中,还可以采用其他任意结构的分流通道,例如,能够实现从边缘一点向中心匀气、边缘一点向边缘四周匀气等抽气方式的分流通道。The ventilation structure has a plurality of shunt channels 36 having the same structure, the number of the shunt channels 36 is the same as the number of the second through holes 37, and one end of the plurality of shunt channels 36 communicates with the plurality of second through holes 37 one by one, The other end converges to the center position of the ring body 171. In this embodiment, the ventilation structure includes a plurality of linear ducts 161 disposed along the radial direction of the annular body 171, and the inner cavity of each linear duct 161 is used as a 36-split channel. In this way, the air extraction mode in which the airflow converges from the periphery to the center can be realized, and because the paths of the air passing through each of the shunt channels 36 are the same, this can ensure that the air extraction volume in the circumferential direction of the substrate is consistent, so that the negative pressure at the edge of the substrate is uniform. Of course, in practical applications, the shunt channel of any other structure may also be used, for example, a shunt channel capable of extracting air from the edge point to the center, and the edge point to the edge, etc.
在本实施例中,设备还包括抽气管181,其一端与各条分流通道36汇聚至环形本体171的中心位置处的另一端连通,抽气管181的另一端用于与抽吸系统(图中未示出)连接。In this embodiment, the device further includes an exhaust pipe 181, one end of which is in communication with the other end of each of the distribution channels 36 converging to the center position of the annular body 171, and the other end of the exhaust pipe 181 is used to communicate with the suction system (in the figure) (Not shown) connected.
在本实施例中,通气结构包括中心圆盘151,其位于环形本体171的中心位置处,且与各个直线管道161固定连接,例如焊接或者胶接或者一体成型。并且,在中心圆盘151中设置有与各条分流通道36连通的连接通道;中心圆盘151与抽气管181采用连接螺钉101固定连接,二者分别具有对接面,连接通道和抽气管181的内腔35分别在中心圆盘151和抽气管181的对接面上相对设置有环形对接开口,用以实现连接通道与抽气管181的内腔35的连通。并且,设备还包括:第三环形弹性元件121和第四环形弹性元件122,二者同轴设置在中心圆盘151与抽气管181的对接面之间,且分别位于环形对接口的内侧和外侧。In this embodiment, the ventilation structure includes a central disc 151 located at the center position of the ring-shaped body 171 and fixedly connected to each of the linear pipes 161, such as welding or gluing or integral molding. In addition, a connecting channel communicating with each of the diverting channels 36 is provided in the central disk 151; the central disk 151 and the exhaust pipe 181 are fixedly connected with the connecting screw 101, and the two have a butting surface, a connecting channel and The inner cavity 35 is oppositely provided with annular butt openings on the abutting surfaces of the central disc 151 and the suction pipe 181, respectively, for achieving communication between the connection channel and the inner cavity 35 of the suction pipe 181. In addition, the device further includes a third annular elastic element 121 and a fourth annular elastic element 122, both of which are coaxially disposed between the abutting surface of the central disc 151 and the suction pipe 181, and are located inside and outside the annular butt joint respectively. .
第三环形弹性元件121和第四环形弹性元件122与上述第一环形弹性元件221和第二环形弹性元件222的作用相同,既可以起到密封作用,又可以构成弹性缓冲结构,即,在上述第一环形弹性元件221和第二环形弹性元件222的基础上,又增加了一重缓冲,从而进一步减小衬底受到的压力,避免在取放片的过程中压伤衬底。在实际应用中,第三环形弹性元件121和第四环形弹性元件122均可以为O形橡胶圈,该O形橡胶圈能够在350-400℃的温度范围内长期工作。或者,第三环形弹性元件121和第四环形弹性元件122也可以采用高弹性聚合胶粘接在中心圆盘151与抽气管181的对接面之间,还可以采用密封蝶簧等的其他密封弹性件。The third ring-shaped elastic element 121 and the fourth ring-shaped elastic element 122 have the same functions as the first ring-shaped elastic element 221 and the second ring-shaped elastic element 222 described above, and can both play a sealing role and form an elastic cushioning structure. On the basis of the first annular elastic element 221 and the second annular elastic element 222, a heavy buffer is added to further reduce the pressure on the substrate and avoid damaging the substrate during the process of picking and placing the wafer. In practical applications, both the third annular elastic element 121 and the fourth annular elastic element 122 may be O-shaped rubber rings, and the O-shaped rubber rings can work for a long time in a temperature range of 350-400 ° C. Alternatively, the third ring-shaped elastic element 121 and the fourth ring-shaped elastic element 122 may also be bonded between the abutting surface of the central disc 151 and the suction pipe 181 with a high elastic polymer glue, and other sealing elasticity such as a sealing butterfly spring may also be used. Pieces.
使用如上实施例中的用于操作衬底的设备进行取放片操作的方法,包括:A method for performing a pick-and-place operation using the apparatus for operating a substrate in the above embodiment includes:
步骤一,水平移动用于操作衬底的设备200,直到承载盘183位于衬底40的正上方。In step one, the apparatus 200 for operating the substrate is horizontally moved until the carrier tray 183 is positioned directly above the substrate 40.
步骤二,降低设备200直到承载盘183的吸附面触碰到衬底40的上边缘的至少一个点。In step two, the apparatus 200 is lowered until the suction surface of the carrier tray 183 touches at least one point of the upper edge of the substrate 40.
步骤三,继续缓慢降低设备200,使得匀气盘182相对于其水平轴线但不相对于其竖直对称轴线发生旋转运动,直到承载盘183的吸附面触碰衬底40的整个上边缘。Step three, continue to slowly lower the device 200 so that the air-distributing disk 182 rotates relative to its horizontal axis but not relative to its vertical symmetrical axis until the suction surface of the carrier disk 183 touches the entire upper edge of the substrate 40.
在步骤三中,在继续缓慢降低设备200的过程中,在设备200的自身重力作用下,承载盘183将对衬底40施加持续压力,此时匀气盘182与承载盘183之间的第一环形弹性元件221和第二环形弹性元件222,及中心圆盘151与抽气管181的对接面之间的第三环形弹性元件121和第四环形弹性元件122提供双重弹性缓冲,能够消解掉衬底40所承受的一部分压力,避免在取放片的过程中压伤衬底。In step three, during the process of slowly lowering the device 200, under the effect of the device 200's own gravity, the carrier plate 183 will exert continuous pressure on the substrate 40. At this time, the first A ring-shaped elastic element 221 and a second ring-shaped elastic element 222, and a third ring-shaped elastic element 121 and a fourth ring-shaped elastic element 122 between the abutting surface of the central disk 151 and the suction pipe 181 provide double elastic cushioning, which can eliminate the lining. Part of the pressure on the bottom 40 prevents the substrate from being crushed during the pick-and-place process.
步骤四,通过抽吸系统依次经由抽气管181的内腔35、各个直线管道 161的内腔(即,分流通道36)、各个第二通孔37和各个第一通孔(38,39)将衬底40与承载盘183的吸附面之间的吸附槽41内的气体抽走,形成真空负压,该负压将压迫衬底40“吸附”在承载盘183的吸附面上,由于第一通孔(38,39)在吸附面上的端口(即,抽气口)设置在吸附面的环形边缘区域,可以将吸附力分散作用在更靠近衬底边缘的区域,这与现有技术相比,所需的抽气量、抽力更小,衬底边缘负压均匀,从而可以避免因吸附力作用区域集中而造成衬底变形甚至产生压伤及污染。Step four, the suction chamber is used to sequentially pass through the inner cavity 35 of the suction pipe 181, the inner cavity of each linear pipe 161 (that is, the shunt channel 36), each second through hole 37, and each first through hole (38, 39). The gas in the adsorption groove 41 between the substrate 40 and the adsorption surface of the carrier disk 183 is evacuated to form a vacuum negative pressure. This negative pressure will "press" the substrate 40 onto the adsorption surface of the carrier disk 183. The ports (ie, suction ports) of the through holes (38, 39) on the adsorption surface are arranged in the annular edge region of the adsorption surface, which can disperse the adsorption force in the region closer to the edge of the substrate, which is compared with the prior art. The required pumping volume and pumping force are smaller, and the negative pressure at the edge of the substrate is uniform, thereby avoiding deformation of the substrate and even crushing and pollution due to the concentration of the area where the suction force acts.
步骤五,在提升带有衬底40的设备200后进行水平移动。In step five, the apparatus 200 with the substrate 40 is moved horizontally after being lifted.
上述本发明所公开的任一技术方案除另有声明外,如果其公开了数值范围,那么公开的数值范围均为优选的数值范围,任何本领域的技术人员应该理解:优选的数值范围仅仅是诸多可实施的数值中技术效果比较明显或具有代表性的数值。由于数值较多,无法穷举,所以本发明才公开部分数值以举例说明本发明的技术方案,并且,上述列举的数值不应构成对本发明创造保护范围的限制。Unless otherwise stated in any of the technical solutions disclosed in the present invention, if it discloses a numerical range, the disclosed numerical ranges are all preferred numerical ranges. Any person skilled in the art should understand that the preferred numerical ranges are merely Among the many values that can be implemented, the technical effect is obvious or representative. Because there are many values and cannot be exhausted, only some values are disclosed in the present invention to illustrate the technical solution of the present invention, and the values listed above should not limit the scope of protection of the invention.
同时,上述本发明如果公开或涉及了互相固定连接的零部件或结构件,那么,除另有声明外,固定连接可以理解为:能够拆卸地固定连接(例如使用螺栓或螺钉连接),也可以理解为:不可拆卸的固定连接(例如铆接、焊接),当然,互相固定连接也可以为一体式结构(例如使用铸造工艺一体成形制造出来)所取代(明显无法采用一体成形工艺除外)。At the same time, if the above-mentioned present invention discloses or relates to parts or structural parts that are fixedly connected to each other, unless otherwise stated, a fixed connection can be understood as: a detachably fixed connection (such as a bolt or screw connection), or It is understood as: non-removable fixed connection (such as riveting, welding), of course, the fixed connection to each other can also be replaced by an integrated structure (such as manufactured by integral molding using a casting process) (except that an integral molding process cannot obviously be used).
另外,上述本发明公开的任一技术方案中所应用的用于表示位置关系或形状的术语除另有声明外其含义包括与其近似、类似或接近的状态或形状。本发明提供的任一部件既可以是由多个单独的组成部分组装而成,也可以为一体成形工艺制造出来的单独部件。In addition, the terms used to indicate the positional relationship or shape applied in any of the above technical solutions disclosed in the present invention include, unless otherwise stated, their meanings including states, shapes, or shapes that are similar, similar, or close to each other. Any component provided by the present invention can be assembled from a plurality of separate components, or it can be a separate component manufactured by an integral molding process.
以上实施例仅用以说明本发明的技术方案而非对其限制;尽管参照较佳实施例对本发明进行了详细的说明,所属领域的普通技术人员应当理解:依 然可以对本发明的具体实施方式进行修改或者对部分技术特征进行等同替换;而不脱离本发明技术方案的精神,其均应涵盖在本发明请求保护的技术方案范围当中。The above embodiments are only used to illustrate the technical solution of the present invention and are not limited thereto. Although the present invention has been described in detail with reference to the preferred embodiments, those skilled in the art should understand that specific embodiments of the present invention can still be performed. Modifications or equivalent replacements of some technical features; without departing from the spirit of the technical solution of the present invention, they should all be included in the scope of the technical solution claimed by the present invention.
本发明的描述是为了示例和描述起见而给出的,而并不是无遗漏的或者将本发明限于所公开的形式。很多修改和变化对于本领域的普通技术人员而言是显然的。选择和描述实施例是为了更好说明本发明的原理和实际应用,并且使本领域的普通技术人员能够理解本发明从而设计适于特定用途的带有各种修改的各种实施例。The description of the present invention has been presented for purposes of illustration and description, and is not intended to be exhaustive or limited to the invention in the form disclosed. Many modifications and variations will be apparent to those skilled in the art. The embodiments were chosen and described in order to better explain the principles and practical applications of the invention, and to enable others of ordinary skill in the art to understand the invention to design various embodiments with various modifications as are suited to particular uses.

Claims (14)

  1. 一种用于操作衬底的设备,其特征在于,所述设备包括:An apparatus for operating a substrate, characterized in that the apparatus includes:
    抓取盘结构,所述抓取盘结构具有吸附面,且在所述抓取盘结构中设置有抽气通道,所述抽气通道包括分布在所述吸附面的环形边缘区域的多个抽气口,在所述设备操作所述衬底时,通过所述抽气通道抽出在所述衬底与所述吸附面之间的空气来吸附所述衬底。A gripping disc structure having an adsorption surface, and an extraction channel is provided in the gripping disc structure, and the exhaust channel includes a plurality of extraction channels distributed in an annular edge region of the adsorption surface. An air port, when the device is operating the substrate, sucks the substrate through the suction channel to extract air between the substrate and the adsorption surface.
  2. 如权利要求1所述的设备,其特征在于,所述环形边缘区域的最大半径与所述衬底的半径相等;所述环形边缘区域的最小半径与所述衬底的半径的比值为7/10。The apparatus according to claim 1, wherein a maximum radius of the annular edge region is equal to a radius of the substrate; a ratio of a minimum radius of the annular edge region to a radius of the substrate is 7 / 10.
  3. 如权利要求1所述的设备,其特征在于,所述多个抽气口在以所述吸附面的中心为圆心的一个圆周或半径不同的多个圆周上均匀分布。The apparatus according to claim 1, wherein the plurality of suction ports are evenly distributed on a circle or a plurality of circles having different radii with the center of the adsorption surface as a circle center.
  4. 如权利要求3所述的设备,其特征在于,在所述吸附面上设置有吸附槽,所有的所述抽气口均与所述吸附槽相连通。The device according to claim 3, wherein an adsorption groove is provided on the adsorption surface, and all of the air suction ports are in communication with the adsorption groove.
  5. 如权利要求4所述的设备,其特征在于,所述吸附槽的侧面包括自所述吸附面的边缘向靠近中心的方向依次设置的第一环面和第二环面,其中,所述第一环面相对于所述吸附面倾斜,且与所述衬底之间的竖直间隙自所述吸附面的边缘向靠近中心的方向逐渐增大;所述第二环面相对于所述吸附面倾斜或者垂直。The device according to claim 4, wherein the side surface of the adsorption groove comprises a first annular surface and a second annular surface which are sequentially arranged from an edge of the adsorption surface toward a direction near the center, wherein the first An annular surface is inclined with respect to the adsorption surface, and a vertical gap with the substrate gradually increases from an edge of the adsorption surface toward a center; the second annular surface is inclined with respect to the adsorption surface Or vertical.
  6. 如权利要求5所述的设备,其特征在于,所述第一环面上分布有多个所述抽气口。The apparatus according to claim 5, wherein a plurality of said air outlets are distributed on said first torus.
  7. 如权利要求6所述的设备,其特征在于,所述吸附槽的底面分布有多个所述抽气口。The apparatus according to claim 6, wherein a plurality of said air outlets are distributed on the bottom surface of said adsorption tank.
  8. 如权利要求1-7任意一项所述的设备,其特征在于,所述抓取盘结构包括:The device according to any one of claims 1-7, wherein the grasping disc structure comprises:
    承载盘,具有所述吸附面,且在所述承载盘中设置有多个沿其轴向贯通所述承载盘的第一通孔,所述第一通孔在所述吸附面上的端口用作所述抽气口;及A carrier disk has the adsorption surface, and a plurality of first through holes penetrating the carrier disk along its axial direction are provided in the carrier disk. Ports of the first through holes on the adsorption surface are used for the ports. Making the suction port; and
    匀气盘,与所述承载盘连接,且位于所述承载盘背离所述吸附面的一侧;并且,在所述匀气盘中设置有匀气通道,所述匀气通道与各个所述第一通孔连通,以构成所述抽气通道。A gas-homing disk is connected to the carrier disk and is located on a side of the carrier disk facing away from the adsorption surface; and a gas-homing channel is provided in the gas-homing disk, and the gas-homing channels are connected to each of the The first through hole communicates with each other to form the suction channel.
  9. 如权利要求8所述的设备,其特征在于,所述设备还包括:第一环形弹性元件和第二环形弹性元件,二者位于所述匀气盘和所述承载盘之间,用以在二者之间围成环形密封空间,用以使所述匀气通道和各个所述第一通孔相连通。The device according to claim 8, further comprising: a first ring-shaped elastic element and a second ring-shaped elastic element, both of which are located between the air homogenizing plate and the bearing plate, for An annular sealed space is enclosed between the two to communicate the uniform air passage with each of the first through holes.
  10. 如权利要求9所述的设备,其特征在于,在所述匀气盘和/或所述承载盘的相对面上,且位于所述环形密封空间内设置有环形凹槽,所述环形凹槽与所述匀气通道和各个所述第一通孔相连通。The device according to claim 9, characterized in that an annular groove is provided on the opposite side of the air homogenizing disc and / or the carrier disc and is located in the annular sealed space, and the annular groove It is in communication with the uniform air passage and each of the first through holes.
  11. 如权利要求9所述的设备,其特征在于,所述匀气盘包括:The apparatus according to claim 9, wherein the air homogenizing plate comprises:
    环形本体,与所述承载盘连接;所述第一环形弹性元件和第二环形弹性元件位于所述环形本体和所述承载盘之间,并且,在所述环形本体中设置有多个沿其轴向贯通所述环形本体的第二通孔,多个所述第二通孔沿所述环形本体的周向均匀分布,且每个所述第二通孔与所述环形密封空间连通;An annular body is connected to the carrying plate; the first annular elastic element and the second annular elastic element are located between the annular body and the carrying plate, and a plurality of annular elastic elements are provided along the annular body. A second through hole axially penetrating the annular body, a plurality of the second through holes are uniformly distributed along a circumferential direction of the annular body, and each of the second through holes communicates with the annular sealed space;
    通气结构,具有多条结构相同的分流通道,所述分流通道的数量与所述 第二通孔的数量相同,且多条所述分流通道的一端一一对应地与多个所述第二通孔连通,另一端汇聚至所述环形本体的中心位置处。The ventilation structure has a plurality of shunt channels with the same structure, the number of the shunt channels is the same as the number of the second through holes, and one end of the plurality of shunt channels is in one-to-one correspondence with a plurality of the second communication channels. The holes communicate, and the other end converges to the center position of the ring body.
  12. 如权利要求11所述的设备,其特征在于,所述通气结构包括多个沿所述环形本体的径向设置的直线管道,每个所述直线管道的内腔用作所述分流通道。The device according to claim 11, wherein the ventilation structure comprises a plurality of linear pipes disposed along a radial direction of the annular body, and an inner cavity of each of the linear pipes is used as the shunt channel.
  13. 如权利要求12所述的设备,其特征在于,所述设备还包括:The device according to claim 12, further comprising:
    抽气管,其一端与各条所述分流通道汇聚至所述环形本体的中心位置处的另一端连通,所述抽气管的另一端用于与抽吸系统连接。One end of the suction pipe is in communication with the other end of each of the shunt channels converging to the center position of the annular body, and the other end of the suction pipe is used to connect with the suction system.
  14. 如权利要求13所述的设备,其特征在于,所述通气结构还包括:The device according to claim 13, wherein the ventilation structure further comprises:
    中心圆盘,位于所述环形本体的中心位置处,且与各个所述直线管道固定连接,并且在所述中心圆盘中设置有与各条所述分流通道连通的连接通道;所述中心圆盘与所述抽气管固定连接,二者分别具有对接面,所述连接通道和所述抽气管的内腔分别在所述中心圆盘和所述抽气管的对接面上相对设置有环形对接开口;A central disc, which is located at a central position of the annular body and is fixedly connected to each of the straight pipelines, and a connecting channel communicating with each of the diverting channels is provided in the central disc; the central circle The disk is fixedly connected to the exhaust pipe, and both have abutment surfaces. The connection channel and the inner cavity of the exhaust pipe are respectively provided with annular butt openings on the abutting surface of the central disc and the exhaust pipe ;
    所述设备还包括:第三环形弹性元件和第四环形弹性元件,二者同轴设置在所述中心圆盘与所述抽气管的对接面之间,且分别位于所述环形对接口的内侧和外侧。The device further includes: a third annular elastic element and a fourth annular elastic element, both of which are coaxially disposed between the central disk and the abutting surface of the suction pipe, and are respectively located inside the annular butt joint. And outside.
PCT/CN2019/097130 2018-08-01 2019-07-22 Device for operating substrate WO2020024837A1 (en)

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