WO2019205739A1 - 显示面板及其制造方法、检测方法和显示装置 - Google Patents
显示面板及其制造方法、检测方法和显示装置 Download PDFInfo
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- WO2019205739A1 WO2019205739A1 PCT/CN2019/070618 CN2019070618W WO2019205739A1 WO 2019205739 A1 WO2019205739 A1 WO 2019205739A1 CN 2019070618 W CN2019070618 W CN 2019070618W WO 2019205739 A1 WO2019205739 A1 WO 2019205739A1
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- layer
- fluorescent probe
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- 238000001514 detection method Methods 0.000 title claims abstract description 27
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 9
- 239000007850 fluorescent dye Substances 0.000 claims abstract description 84
- 239000000758 substrate Substances 0.000 claims abstract description 23
- 230000007613 environmental effect Effects 0.000 claims description 52
- 238000000034 method Methods 0.000 claims description 21
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 claims description 12
- 229910052760 oxygen Inorganic materials 0.000 claims description 12
- 239000001301 oxygen Substances 0.000 claims description 12
- 230000005284 excitation Effects 0.000 claims description 6
- 230000001678 irradiating effect Effects 0.000 claims 1
- 230000007547 defect Effects 0.000 description 9
- 238000010586 diagram Methods 0.000 description 7
- 239000000523 sample Substances 0.000 description 5
- KDLHZDBZIXYQEI-UHFFFAOYSA-N Palladium Chemical compound [Pd] KDLHZDBZIXYQEI-UHFFFAOYSA-N 0.000 description 2
- 239000012327 Ruthenium complex Substances 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 238000002347 injection Methods 0.000 description 2
- 239000007924 injection Substances 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- BASFCYQUMIYNBI-UHFFFAOYSA-N platinum Chemical compound [Pt] BASFCYQUMIYNBI-UHFFFAOYSA-N 0.000 description 2
- 239000000243 solution Substances 0.000 description 2
- 230000015572 biosynthetic process Effects 0.000 description 1
- 239000003990 capacitor Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 230000005525 hole transport Effects 0.000 description 1
- 238000005286 illumination Methods 0.000 description 1
- 229910052763 palladium Inorganic materials 0.000 description 1
- 229910052697 platinum Inorganic materials 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/80—Constructional details
- H10K59/88—Dummy elements, i.e. elements having non-functional features
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
- G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
- G01N21/64—Fluorescence; Phosphorescence
- G01N21/6428—Measuring fluorescence of fluorescent products of reactions or of fluorochrome labelled reactive substances, e.g. measuring quenching effects, using measuring "optrodes"
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/02—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor bodies
- H01L33/26—Materials of the light emitting region
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/30—Devices specially adapted for multicolour light emission
- H10K59/35—Devices specially adapted for multicolour light emission comprising red-green-blue [RGB] subpixels
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K59/00—Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
- H10K59/90—Assemblies of multiple devices comprising at least one organic light-emitting element
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/70—Testing, e.g. accelerated lifetime tests
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F2203/00—Function characteristic
- G02F2203/69—Arrangements or methods for testing or calibrating a device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L25/00—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof
- H01L25/16—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits
- H01L25/167—Assemblies consisting of a plurality of individual semiconductor or other solid state devices ; Multistep manufacturing processes thereof the devices being of types provided for in two or more different main groups of groups H01L27/00 - H01L33/00, or in a single subclass of H10K, H10N, e.g. forming hybrid circuits comprising optoelectronic devices, e.g. LED, photodiodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/341—Transition metal complexes, e.g. Ru(II)polypyridine complexes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/30—Coordination compounds
- H10K85/351—Metal complexes comprising lanthanides or actinides, e.g. comprising europium
Definitions
- the present disclosure relates to the field of display technologies, and in particular, to a display panel, a manufacturing method thereof, a detecting method, and a display device.
- OLED Organic Light-Emitting Diode
- a display panel includes: one or more detecting units on a substrate, each detecting unit including: a first electrode layer and a second electrode layer disposed opposite to each other; and a light emitting layer, Located between the first electrode layer and the second electrode layer; and a fluorescent probe layer between the first electrode layer and the light emitting layer.
- At least one of the one or more detection units is located in a non-pixel area of the display panel.
- each of the one or more detection units is located in the non-pixel region.
- the first electrode layer is between the substrate and the luminescent layer.
- the fluorescent probe layer comprises a fluorescent probe layer that is sensitive to one of the following parameters: temperature, humidity, oxygen concentration.
- the fluorescent probe layer has a thickness of from 1 ⁇ m to 5 ⁇ m.
- a display device comprising: the display panel of any one of the above embodiments.
- a method of detecting a display panel comprising: illuminating a detecting unit in the display panel with excitation light such that the detecting unit The fluorescent probe layer emits light; detects a parameter of the light emitted by the fluorescent probe layer; and determines an environmental parameter of the light emitting layer in the detecting unit according to a parameter of the light emitted by the fluorescent probe layer.
- determining an environmental parameter of the luminescent layer in the detecting unit according to a correspondence between a parameter of the light emitted by the fluorescent probe layer and an environmental parameter of an environment in which the fluorescent probe layer is located .
- the environmental parameter comprises one of: temperature, humidity, oxygen concentration.
- the parameter of the light comprises at least one of a wavelength and a light intensity of the light.
- determining an environmental parameter of the luminescent layer in the detecting unit according to a parameter of the light emitted by the fluorescent probe layer comprises: determining the detecting according to a wavelength of light emitted by the fluorescent probe layer a first environmental parameter of the luminescent layer in the unit; determining a second environmental parameter of the luminescent layer in the detecting unit according to a light intensity of the light emitted by the fluorescent probe layer; according to the first environmental parameter and the The second environmental parameter determines an environmental parameter of the luminescent layer in the detecting unit.
- determining the environmental parameters of the illuminating layer in the detecting unit according to the first environment parameter and the second environment parameter comprises: calculating the first environment parameter and the second environment parameter The average value is taken as the environmental parameter of the light-emitting layer in the detecting unit.
- a method of manufacturing a display panel includes: forming one or more detecting units on a substrate; wherein forming each detecting unit includes: forming a first electrode on the substrate a layer; a fluorescent probe layer and a light emitting layer are formed on a side of the first electrode layer away from the substrate; and a second electrode layer is formed, wherein the fluorescent probe layer and the light emitting layer are located at the first Between the electrode layer and the second electrode layer.
- At least one of the one or more detection units is located in a non-pixel area of the display panel.
- each of the one or more detection units is located in the non-pixel region.
- the luminescent layer is formed on a side of the fluorescent probe layer away from the first electrode layer.
- the fluorescent probe layer comprises a fluorescent probe layer that is sensitive to one of the following parameters: temperature, humidity, oxygen concentration.
- the fluorescent probe layer has a thickness of from 1 ⁇ m to 5 ⁇ m.
- FIG. 1 is a schematic structural view of a display panel according to some embodiments of the present disclosure.
- FIG. 2 is a schematic structural diagram of a display panel according to further embodiments of the present disclosure.
- FIG. 3 is a flow diagram of a method of detecting a display panel in accordance with some embodiments of the present disclosure
- FIG. 4 is a flow diagram of a method of fabricating a display panel in accordance with some embodiments of the present disclosure
- FIG. 5 is a schematic structural diagram of a display device according to some embodiments of the present disclosure.
- a particular component when it is described that a particular component is located between the first component and the second component, there may be intervening components between the particular component and the first component or the second component, or there may be no intervening components.
- that particular component when it is described that a particular component is connected to other components, that particular component can be directly connected to the other component without the intervening component, or can be directly connected to the other component without having the intervening component.
- the inventors have found that the luminous efficiency of the light-emitting layer is easily affected by the environment surrounding the light-emitting layer. For example, a high-temperature or high-humidity environment causes a significant decrease in the luminous efficiency of the light-emitting layer.
- the inventors have thus realized that if the environmental parameters of the luminescent layer can be obtained, it is possible to provide a reference for analyzing the cause of the display defect.
- FIG. 1 is a schematic structural view of a display panel according to some embodiments of the present disclosure.
- the display panel includes one or more detection units 102 located on the substrate 101.
- FIG. 1 schematically shows a detecting unit 102.
- different ones of the plurality of detection units 102 may be spaced apart by the pixel defining layer 103 shown in FIG.
- a driving circuit and various circuit elements such as a thin film transistor (TFT), a capacitor, a resistor, or the like can be formed in the substrate 101.
- TFT thin film transistor
- the substrate 101 may also be referred to as a TFT substrate.
- Each of the detecting units 102 includes a first electrode layer 112 and a second electrode layer 122, a light emitting layer 132, and a fluorescent probe layer 142 disposed opposite to each other.
- one of the first electrode layer 112 and the second electrode layer 122 is an anode, and the other is a cathode.
- the light emitting layer 132 is located between the first electrode layer 112 and the second electrode layer 122.
- the light emitting layer 132 may include a layer of a light emitting material.
- the light emitting layer 132 may further include one or more of an electron transport layer, a hole transport layer, an electron injection layer, and a hole injection layer.
- the fluorescent probe layer 142 is located between the first electrode layer 112 and the light emitting layer 132.
- the first electrode layer 112 is located between the substrate 101 and the luminescent layer 132, as shown in FIG. That is, the first electrode layer 112 is closer to the substrate 101 than the second electrode layer 122. Such a manner can avoid adversely affecting the performance of the light-emitting layer 132 when the fluorescent probe layer 142 is formed.
- the fluorescent probe layer 142 can include a fluorescent probe layer that is sensitive to one of the following parameters: temperature, humidity, oxygen concentration.
- the temperature sensitive fluorescent probe layer may include, for example, a triarylboron compound or the like.
- the moisture sensitive fluorescent probe layer may, for example, comprise one or more of the following: a complex of Eu 3+ , a complex of Tb 3+ .
- the fluorescent probe layer sensitive to oxygen concentration may, for example, include one or more of the following: a ruthenium complex, a platinum complex, a palladium complex, a ruthenium complex.
- the fluorescent probe layer has a thickness of from 1 ⁇ m to 5 ⁇ m, for example, from 2 ⁇ m to 4 ⁇ m, for example, 3 ⁇ m, and the like. Within such a thickness range, the fluorescent probe layer can be normally subjected to excitation light without affecting the formation of the light-emitting layer.
- the display panel is provided with a detecting unit including a fluorescent probe layer, and the light emitting condition of the fluorescent probe layer can reflect the environmental parameter of the light emitting layer, and further, whether the light emitting layer is a display panel can be determined according to the environmental parameter of the light emitting layer. Shows the cause of the defect.
- FIG. 2 is a schematic structural view of a display panel according to further embodiments of the present disclosure.
- the display panel includes one or more detecting units 102 on the substrate 101, and a pixel unit 104. Between different pixel units 104, and between the detection unit 102 and the pixel unit 104 may be spaced apart by the pixel defining layer 103.
- the pixel unit 104 includes a first electrode layer 114 and a second electrode layer 124 disposed opposite to each other, and a light emitting layer 134 between the first electrode layer 114 and the second electrode layer 124.
- each pixel unit 104 can be regarded as one sub-pixel.
- the three pixel units 104 can constitute one pixel.
- the display panel includes a pixel area 111 and a non-pixel area 121 other than the pixel area 111.
- the pixel unit 104 is located in the pixel area 111, and at least one of the one or more detection units 102 is located in the non-pixel area 121.
- a portion of the detection unit 102 is located in the non-pixel region 121 and another portion of the detection unit 102 is located in the pixel region 121.
- one pixel area 111 is correspondingly provided with one pixel unit 104.
- some of the pixel regions 111 may also be provided with the detecting unit 102 correspondingly. In other words, a portion of the detection unit 102 can occupy the location of the pixel unit 104.
- all of the detection units 102 are located in the non-pixel region 121.
- the detecting unit 102 may occupy the position of the pixel defining layer 103, that is, the detecting unit 102 may be disposed in an opening of the pixel defining layer 103 other than the opening for the pixel unit 104. Such a manner can prevent the normal illumination of the pixel unit 104 from being affected.
- the fluorescent probe layer 142 is provided between the light emitting layer 132 and the first electrode layer 112 in the detecting unit 102, even if a voltage is applied to the first electrode layer 112 and the second electrode layer 122 in the detecting unit 102, the detecting unit 102 It is also not luminous. Therefore, the detecting unit 102 located in the non-pixel area 121 does not affect the normal lighting of the pixel unit 104.
- At least one detecting unit 102 is located in the non-pixel area 121 to minimize the influence of the detecting unit 102 on the pixel unit 104.
- the display panel of each of the above embodiments includes the detecting unit 102. Therefore, in the case where a display defect occurs in the display panel, for example, some portions are dark, the illuminating condition of the fluorescent probe layer 142 in the display panel can be detected to determine whether the luminescent layer 132 is normal.
- FIG. 3 is a flow diagram of a method of detecting a display panel in accordance with some embodiments of the present disclosure.
- the detection unit in the display panel is illuminated with excitation light such that the fluorescent probe layer in the detection unit emits light.
- the excitation light may be selected according to the type of the fluorescent probe layer so that the fluorescent probe layer can emit light after being irradiated with the excitation light.
- step 304 parameters of the light emitted by the fluorescent probe layer are detected.
- the parameters of the light can include the intensity of the light. In other embodiments, the parameters of the light can include the wavelength of the light. In still other embodiments, the parameters of the light can include both the light intensity and the wavelength of the light. For example, a spectrometer can be utilized to detect the intensity or wavelength of light emitted by the fluorescent probe layer.
- an environmental parameter of the luminescent layer in the detecting unit is determined based on the parameters of the light emitted by the fluorescent probe layer.
- the parameters of the light emitted by the fluorescent probe layer are affected by the environmental parameters of the luminescent layer. Therefore, the environmental parameters of the luminescent layer can be determined based on the parameters of the light emitted by the fluorescent probe layer.
- the environmental parameters of the luminescent layer in the detection unit can be determined based on one of the wavelength and intensity of the light emitted by the fluorescent probe layer.
- the environmental parameters of the luminescent layer in the detection unit can be determined based on both the wavelength and intensity of the light emitted by the fluorescent probe layer.
- the environmental parameters of the luminescent layer in the detecting unit determined in such a manner are more accurate.
- the first environmental parameter of the luminescent layer in the detecting unit may be determined according to the wavelength of the light emitted by the fluorescent probe layer; and the second environment of the luminescent layer in the detecting unit is determined according to the light intensity of the light emitted by the fluorescent probe layer a parameter; determining an environmental parameter of the light emitting layer in the detecting unit according to the first environmental parameter and the second environmental parameter.
- an average of the first environmental parameter and the second environmental parameter may be calculated to calculate the average value as an environmental parameter of the luminescent layer in the detecting unit.
- the environmental parameters of the luminescent layer can include one of the following: temperature, humidity, oxygen concentration. For example, if the temperature, humidity, or oxygen concentration of the light-emitting layer exceeds a corresponding threshold, it may be considered that there is a possibility of display defects due to the light-emitting layer.
- the environmental parameter of the light emitting layer may be determined according to the parameter of the light emitted by the fluorescent probe layer in the detecting unit, and further, whether the light emitting layer is the cause of the display panel display defect may be determined.
- the environmental parameters of the luminescent layer in the detection unit can be determined based on the correspondence between the parameters of the light emitted by the fluorescent probe layer and the environmental parameters of the environment in which the fluorescent probe layer is located.
- a fluorescent probe layer is deposited on a substrate (for example, a glass substrate) to prepare a sample.
- the sample is then placed in a closed environment (eg, a glove box). After that, adjust the environmental parameters in a closed environment, such as adjusting the temperature, humidity or oxygen concentration to a certain value. Then, the parameters of the light emitted by the sample, such as light intensity or wavelength, are measured. After that, the correspondence between the parameters of the light emitted by the sample and the current environmental parameters of the closed environment can be obtained.
- the correspondence between the parameters of the different light emitted by the sample and the different environmental parameters of the sealed environment can be obtained, that is, the parameters of the light emitted by the fluorescent probe layer and the environment in which the fluorescent probe layer is located can be obtained.
- Correspondence between environmental parameters can be obtained.
- FIG. 4 is a flow diagram of a method of fabricating a display panel in accordance with some embodiments of the present disclosure.
- each of the detecting units may be formed in accordance with steps 402-406 to form one or more detecting units on the substrate.
- the at least one detection unit is located in a non-pixel area of the display panel.
- a first electrode layer is formed on the substrate.
- the first electrode layer is, for example, an anode.
- a fluorescent probe layer and a light-emitting layer are formed on a side of the first electrode layer away from the substrate.
- the fluorescent probe layer can include a fluorescent probe layer that is sensitive to one of the following parameters: temperature, humidity, oxygen concentration.
- the fluorescent probe layer may have a thickness of from 1 ⁇ m to 5 ⁇ m.
- a light emitting layer is formed on a side of the fluorescent probe layer away from the first electrode layer.
- a second electrode layer is formed.
- the second electrode layer is, for example, a cathode.
- the fluorescent probe layer and the light emitting layer are located between the first electrode layer and the second electrode layer.
- the second electrode layer may be located on the light emitting layer, that is, the light emitting layer is located between the second electrode layer and the fluorescent probe layer; or the second electrode layer may be located on the fluorescent probe layer, that is, the fluorescent probe layer is located Between the second electrode layer and the luminescent layer.
- the display panel formed by the above embodiment includes a detecting unit having a fluorescent probe layer, and the light emitting condition of the fluorescent probe layer can reflect the environmental parameter of the light emitting layer, so that whether the light emitting layer is displayed on the display panel can be determined according to the environmental parameter of the light emitting layer. The cause of the defect.
- FIG. 5 is a schematic structural diagram of a display device according to some embodiments of the present disclosure.
- the display device 500 may include the display panel 501 of any of the above embodiments.
- the display device 500 may be, for example, a mobile terminal, a television, a display, a notebook computer, a digital photo frame, a navigator, electronic paper, or the like, having any display function.
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Abstract
Description
Claims (19)
- 一种显示面板,包括位于基板上的一个或多个检测单元,至少一个检测单元包括:相对设置的第一电极层和第二电极层;发光层,位于所述第一电极层与所述第二电极层之间;和荧光探针层,位于所述第一电极层和所述发光层之间。
- 根据权利要求1所述的显示面板,其中,所述一个或多个检测单元中的至少一个位于所述显示面板的非像素区域。
- 根据权利要求2所述的显示面板,其中,所述一个或多个检测单元中的每一个均位于所述非像素区域。
- 根据权利要求1所述的显示面板,其中,所述第一电极层位于所述基板和所述发光层之间。
- 根据权利要求1所述的显示面板,其中,所述荧光探针层包括对下列参数之一敏感的荧光探针层:温度、湿度、氧浓度。
- 根据权利要求1所述的显示面板,其中,所述荧光探针层的厚度为1μm-5μm。
- 一种显示装置,包括:如权利要求1-6任意一项所述的显示面板。
- 一种基于如权利要求1-6任意一项所述的显示面板的检测方法,包括:利用激发光照射所述显示面板中的检测单元,以使得所述检测单元中的荧光探针层发光;检测所述荧光探针层发出的光的参数;和根据所述荧光探针层发出的光的参数,确定所述检测单元中的发光层的环境参数。
- 根据权利要求8所述的方法,其中,根据所述荧光探针层发出的光的参数与所述荧光探针层所处的环境的环境参数之间的对应关系,确定所述检测单元中的发光层的环境参数。
- 根据权利要求8所述的方法,其中,所述环境参数包括下列之一:温度、湿度、氧浓度。
- 根据权利要求8所述的方法,其中,所述光的参数包括所述光的波长和光强中的至少一个。
- 根据权利要求11所述的方法,其中,根据所述荧光探针层发出的光的参数,确定所述检测单元中的发光层的环境参数包括:根据所述荧光探针层发出的光的波长,确定所述检测单元中的发光层的第一环境参数;根据所述荧光探针层发出的光的光强,确定所述检测单元中的发光层的第二环境参数;根据所述第一环境参数和所述第二环境参数,确定所述检测单元中的发光层的环境参数。
- 根据权利要求12所述的方法,其中,根据所述第一环境参数和所述第二环境参数,确定所述检测单元中的发光层的环境参数包括:计算所述第一环境参数和所述第二环境参数的平均值,以所述平均值作为所述检测单元中的发光层的环境参数。
- 一种显示面板的制造方法,包括在基板上形成一个或多个检测单元,其中,形成至少一个检测单元包括:在所述基板上形成第一电极层;在所述第一电极层远离所述基板的一侧形成荧光探针层和发光层;和形成第二电极层,其中,所述荧光探针层和所述发光层位于所述第一电极层和所述第二电极层之间。
- 根据权利要求14所述的方法,其中,所述一个或多个检测单元中的至少一个位于所述显示面板的非像素区域。
- 根据权利要求15所述的方法,其中,所述一个或多个检测单元中的每一个均位于所述非像素区域。
- 根据权利要求14所述的方法,其中,在形成所述荧光探针层后,在所述荧光探针层远离所述第一电极层的一侧形成所述发光层。
- 根据权利要求14所述的方法,其中,所述荧光探针层包括对下列参数之一敏感的荧光探针层:温度、湿度、氧浓度。
- 根据权利要求14所述的方法,其中,所述荧光探针层的厚度为1μm-5μm。
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