WO2019145754A1 - Numériseur pour un imageur de tomographie par cohérence optique - Google Patents

Numériseur pour un imageur de tomographie par cohérence optique Download PDF

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Publication number
WO2019145754A1
WO2019145754A1 PCT/IB2018/050489 IB2018050489W WO2019145754A1 WO 2019145754 A1 WO2019145754 A1 WO 2019145754A1 IB 2018050489 W IB2018050489 W IB 2018050489W WO 2019145754 A1 WO2019145754 A1 WO 2019145754A1
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WIPO (PCT)
Prior art keywords
signal
digital
oct
digitizer
clock
Prior art date
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PCT/IB2018/050489
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English (en)
Inventor
Daniel Aebischer
Pierre-François Maistre
Tobias BLASER
Original Assignee
Acqiris Sa
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Acqiris Sa filed Critical Acqiris Sa
Priority to US16/963,582 priority Critical patent/US11397076B2/en
Priority to CA3088605A priority patent/CA3088605A1/fr
Priority to JP2020560618A priority patent/JP7252977B2/ja
Priority to CN201880087659.1A priority patent/CN111699358A/zh
Priority to PCT/IB2018/050489 priority patent/WO2019145754A1/fr
Priority to EP18703637.1A priority patent/EP3743678A1/fr
Publication of WO2019145754A1 publication Critical patent/WO2019145754A1/fr

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02001—Interferometers characterised by controlling or generating intrinsic radiation properties
    • G01B9/02002—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies
    • G01B9/02004—Interferometers characterised by controlling or generating intrinsic radiation properties using two or more frequencies using frequency scans
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02055—Reduction or prevention of errors; Testing; Calibration
    • G01B9/02062—Active error reduction, i.e. varying with time
    • G01B9/02067—Active error reduction, i.e. varying with time by electronic control systems, i.e. using feedback acting on optics or light
    • G01B9/02069—Synchronization of light source or manipulator and detector
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/02083—Interferometers characterised by particular signal processing and presentation
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G01B9/0209—Low-coherence interferometers
    • G01B9/02091—Tomographic interferometers, e.g. based on optical coherence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/60—Reference interferometer, i.e. additional interferometer not interacting with object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B2290/00—Aspects of interferometers not specifically covered by any group under G01B9/02
    • G01B2290/70—Using polarization in the interferometer

Definitions

  • the present invention concerns, in embodiments, an electronic digitizer for an optical coherence tomography imaging system.
  • OCT Optical Coherence Tomography
  • ophthalmology possibly the most developed use case
  • gastroenterology cardiology
  • cardiology cardiology
  • oncology intra-surgical imaging
  • many others including non-biologic applications.
  • OCT imaging is based on intensive digital signal processing techniques and requires, together with advanced optical systems, powerful signal processing platforms with specific architectures and innovative algorithms.
  • OCT uses an optical interferometer, for example having the classical Michelson structure, in combination with a low-coherency optical source to analyse subsurface structures in a sample, usually of biologic nature.
  • TD-OCT Time Domain OCT
  • an interference pattern is obtained by moving linearly the mirror of the reference arm of an interferometer, for example of the Michelson type, so that an interference pattern is obtained when the reference path length matches the optical path due to a reflection in the sample.
  • the axial resolution is determined by the coherence length of the light source and is typically of the order of the micrometre.
  • FD-OCT Fourier-domain Optical Coherence Tomography
  • Reflections at different depth in the sample generate oscillation in the interference spectrum.
  • the frequency of these oscillations is linked to the delay, or to the optical path, of the original reflection, such that an inverse Fourier transform of the interference spectrum provides depth-scan information.
  • Spectral Domain OCT also known as SD-OCT, uses a broadband light source with short temporal coherence (often a superluminescent light emitting diode: SLED), and the depth by measuring the spectral density in the detection arm of the interferometer, using a spectrometer, for example a diffraction grating.
  • SLED superluminescent light emitting diode
  • the spectrogram is often collected by a line photo detector, and the depth resolved structure of the sample can be derived by a Fourier transformation on the spectrogram.
  • Swept-source OCT replaces the broadband source with a frequency-swept optical source.
  • the spectral components of the signal are resolved in time; the detection arm of the interferometer is equipped with a single detector and a high-speed ADC, rather than with a spectrometer, with significant advantages in size, speed, performance, and cost.
  • Swept sources for OCT are, in general, tuneable lasers that are specially designed to allow high-speed scans.
  • Current SS-OCT sources achieve 100 nm wavelength sweep range, with a repetition rate of 100 kHz, and an instantaneous linewidth of 100 pm, or better.
  • a sweep cycle is common denoted as "A-scan", since it provides information on the axial profile in the sample, while the terms "B-scan” and “C-scan” indicate the motion of the light beam with respect to the sample to acquire the optical density in a slice, respectively a volume, of the sample.
  • the axial profile in the sample is obtained by the spectral density of signal detected at the interferometer detection arm, which can be readily obtained by a digital Fourier transform operation on the digitized signal, provided the sampled points are linearly spaced in optical wavenumber k.
  • Most sources are incapable to produce a sweep in which the instantaneous wavenumber k is a linear function of time, and diverse hardware and software solutions have been devised to address this shortcoming. Usually, they involve the generation of a reference signal, denoted as k-clock, which varies together with the optical wavenumber (or equivalently, the optical frequency) of the source.
  • a k-clock signal may be obtained with an interferometer (for example a Mach-Zehnder
  • OCT optical coherence tomography
  • Figure 1 shows schematically a view of a SS-OCT system according to an aspect of the present invention.
  • Figure 2 plots spectra of input waveforms on which the device of the invention operates.
  • FIG. 3 is a block diagram showing a data processing system according to the invention.
  • Figure 4 illustrates a process of generating an OCT signal.
  • Figure 5 illustrates a trigger generator.
  • FIG. 1 illustrates schematically the structure of a swept-source OCT system according to the invention.
  • the light source 30 is a broadband frequency-swept optical source optically connected with an interferometer setup 50.
  • the interferometer 50 is used to analyse the light backscattered from a sample 10, and generates two or more electrical OCT signals OCT1, OCT2, as well as a k-clock signal.
  • the sampling beam is focused by an optic device 44 and steered by a controlled mirror 43, under the supervision of a control unit 40, as it is known in the art.
  • the OCT signals OCT1, OCT2, as well as the k-clock signal are transmitted to an acquisition unit 24 that is especially adapted to digitize and process OCT signals.
  • the acquisition unit 24 is included in the same host system 20 as the optics control unit 80, although this is not an essential feature of the invention.
  • the host system could be a personal computer, an industrial PC, or any other suitable device capable of digital processing.
  • the acquisition unit 24 is preferably a modular card equipped with an interface compatible with a
  • the system comprises, preferably in the same acquisition unit 24, a digitizing unit 60, and a data processing unit 70.
  • the latter may be embodied by a specially programmed FPGA, a programmable signal processor, or any suitable computing means.
  • the purpose of the processing unit 70 is to provide a spectrogram, an A-scan profile, or an equivalent information to the application 80. This information can then be displayed on the visualization unit 90, stored for further analysis, transmitted to another processing unit (not illustrated), or put to any other use.
  • the acquisition unit includes also a trigger time- interpolation module 175 whose function is to improve the stability and the repeatability of the measurement, overcoming the discrete nature of the digital signal processing related to digitized reference time
  • the k-clock is not related with the optical properties of the sample under study 10, but uniquely with the
  • the OCT signals OCT1, OCT2 and the k-clock present quite different spectral features, and, the OCT1, OCT2 signals can be shifted in a desired frequency band by changing the length of the reference arm 53 ( Figure 1); the optical device that generates the k-clock signal (for example, a Mach-Zehnder interferometer) can also be chosen or dimensioned in such a way that the k-clock spectrum is limited to a desired band of frequencies. According to an aspect of the invention, these parameters are chosen such that the spectra of the k-clock signal does not significantly overlap with the spectra of the OCT signal or signals, as illustrated in figure 2.
  • Figure 2 shows the k-clock signal 210 in a lower frequency band than the OCT signal 220.
  • the invention contemplates the case in which the k-clock signal is in a frequency band above that of the OCT signal.
  • the acquisition card receives, as mentioned above, three analogue signals: the OCT signals OCT1, OCT2 from
  • the first OCT signal OCT1 is fed to the input of an analogue/digital converter 67a.
  • an anti-aliasing filter will be inserted before the ADC, but it is not indicated in the drawing.
  • the A/D converter 67a generates a digital OCT1 signal 68 that is a digital
  • the digital signal 68 may have a sampling rate of 1 GS/s or 2 GS/s, each sample consisting in a 12 bits or 14 bits word, and a depth of 2048 to 8192 samples. These values are not limiting, however.
  • the second OCT signal OCT2 and the k-clock instead, are summed together and fed to a second analogue/digital converter 67b.
  • a low-pass filter 120 and/or a high-pass filter 125 ensure that the spectra of the k-clock signal and of the OCT2 signal do not overlap.
  • the illustrated example has a low-pass filter 120 on the k-clock input and a high-pass filter 125 on the OCT2 one but, these filters may be of the opposite kind if the k-clock signal is shifted above the OCT one.
  • the filters 120 and 125 could possibly be omitted if the k-clock and OCT signal are inherently frequency-limited such that their spectra do not overlap.
  • the sum node 130 could be embodied by a passive 50W splitter used as mixer, or any other suitable device.
  • the second A/D converter 67b generates a digital signal 69, which is a digital representation of OCT2+k- clock.
  • the sampling rate, bit resolution, and buffer depth of the composite digital signal 69 are the same as those of the first digital signal 68, and the samples of the composite signal 69 are synchronous with those of the first signal 68.
  • the A-trigger signals the start of a wavelength sweep cycle of the source 30, and is used to align the digital signals 68, 69 in their respective data buffers. It is also made available to the data processing unit 70, through the trigger time-interpolation module 175.
  • the A-trigger may be generated by the scanned source 30 or, preferably, by an optical detector arranged to determine when the light generated by the source 30 has a predetermined wavelength in the sweep range.
  • a detector may include a fibre Bragg Grating 115, a circulator 110, and a photodetector sensitive to the radiation reflected from the grating, as illustrated in figure 5.
  • the data processing unit 70 may comprise a signal extraction filter 150 arranged to extract the k-clock signal from the digital composite signal 69, and possibly a second filter 155 arranged to extract the OCT2 signal from the composite signal 69; a k-clock processing unit 77, and a resampling/spectral processing unit 78 that is arranged to produce one or several profiles of the sample 10.
  • the data processing unit includes a field-programmable gate array (FPGA).
  • FPGA field-programmable gate array
  • the signal extraction filter 150 is a low- pass filter and the second filter 155 is a high-pass one, because the frequency domain of the k-clock signal is below that of the OCT signal.
  • filter 150 would be of high-pass type, and filter 155 of low-pass type.
  • Step marked 185 consists in a calibration of the k-space that is, the definition of a correspondence between the sample index of the digital signals 68, 69 and the instantaneous wave number of the light from the source 30 or, otherwise said, determining the values of the wavenumber corresponding to sample times of the digital OCT signal, based on the digital k-clock signal.
  • a possible algorithm to reconstruct the wavenumber k consists, for example, in computing the Hilbert transform of the k-clock signal, selecting its complex argument that corresponds to the phase of the k- clock, and unwrapping it to eliminate discontinuities.
  • the unwrapped phase is proportional to the wavenumber, and can converted into it by applying a suitable calibration.
  • the reconstruction of k can be made for each A-scan in real time, or result from the combined processing of several A-scans.
  • the timing information of the A-scan trigger is used to time the A/D converters 66, 67 (arrow 63) such that the trigger falls at a
  • the TTI unit 175 includes a fast TDC (Time to Digital Converter) that measures a time offset between the sampling clock of the A/D converter and the leading edge of the A-scan trigger signal.
  • the TTI unit can determine the position in time of the trigger with an uncertainty much smaller than the sampling period, for example a factor 10 or smaller, or with an uncertainty lower than 100 ps.
  • the TTI unit introduces a correction (array 65) to the values of the wavenumber computed in the k-space calibration step 185, based on the temporal position of the trigger relative to the sampling clock of the A/D converters.
  • the correction may include any or more of the following:
  • any other suitable correction any other suitable correction.
  • the inventors have found that such corrections improve considerably the phase stabitity of the resulting OCT profiles, which is especially significant for polarization-sensitive applications.
  • the digital signals 68, 69 that are sampled by the A/D converters at uniformly spaced points in time, are resampled at evenly spaced points in the wavenumber k (step 190).
  • the resulting vectors may then be windowed (step 198), based on a window function selected by the host system (step 200), a digital Fourier
  • the amplitude and preferably also the phase of the resulting spectrum are detected (step 220).
  • the data processing unit implements also background subtraction (step 230) and averaging (step 233).
  • the digital signals OCT1 and OCT2 may be treated as nonuniform samples in k-space and processed by a suitable non- uniform discrete Fourier transform operator, rather than evenly resampled in k and then DFT-transformed.
  • the input high-pass filter 155 may possibly be omitted, considering that the contribution of the k-clock 210 will be negligible in the depth range of interest.
  • a prefilter 155, operating on the t-sampled data rather than in k- space may be advantageous, however.
  • the processed data are stored in a memory unit 235 whence the host system can collect them (step 240) through the card's data interface, for example a PCIe bus.
  • the resampled OCT signals and/or the raw OCT signals (arrow 232), as well as the complex DFT output (arrow 234) are addressable in memory and can be uploaded to the host on request.
  • the invention has been described in the important use case of a dual-channel OCT, this is not an essential limitation.
  • the invention could in fact be usefully applied to a single-channel OCT system, with a single ADC digitizing a composite signal combining an OCT signal and a k- clock signal.
  • the invention includes system with an arbitrary number N of OCT channels, with N A/D converters, in which at least one converter digitizes a composite signal combining an OCT signal and a k-clock signal in distinct frequency bands.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Radiology & Medical Imaging (AREA)
  • Signal Processing (AREA)
  • Automation & Control Theory (AREA)
  • Optics & Photonics (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

L'invention concerne un numériseur et un dispositif processeur pour un système d'imagerie de tomographie par cohérence optique à source balayée (SS-OCT), comprenant : une entrée configurée pour recevoir un signal OCT ; une entrée de commande configurée pour recevoir un signal d'horloge k ; une unité de combinaison (130) recevant le signal OCT et le signal d'horloge k configurée pour délivrer en sortie un signal composite ; une unité de numérisation (60) conçue pour convertir le signal composite en un signal composite numérique (69) ; une unité de traitement de données (70) conçue pour déterminer un profil de densité optique dans un échantillon qui a généré le signal OCT sur la base du signal composite numérique (69).
PCT/IB2018/050489 2018-01-26 2018-01-26 Numériseur pour un imageur de tomographie par cohérence optique WO2019145754A1 (fr)

Priority Applications (6)

Application Number Priority Date Filing Date Title
US16/963,582 US11397076B2 (en) 2018-01-26 2018-01-26 Digitizer for an optical coherence tomography imager
CA3088605A CA3088605A1 (fr) 2018-01-26 2018-01-26 Numeriseur pour un imageur de tomographie par coherence optique
JP2020560618A JP7252977B2 (ja) 2018-01-26 2018-01-26 波長掃引式光干渉断層撮影システム用の収集装置
CN201880087659.1A CN111699358A (zh) 2018-01-26 2018-01-26 用于光学相干断层扫描成像仪的数字转换器
PCT/IB2018/050489 WO2019145754A1 (fr) 2018-01-26 2018-01-26 Numériseur pour un imageur de tomographie par cohérence optique
EP18703637.1A EP3743678A1 (fr) 2018-01-26 2018-01-26 Numériseur pour un imageur de tomographie par cohérence optique

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/IB2018/050489 WO2019145754A1 (fr) 2018-01-26 2018-01-26 Numériseur pour un imageur de tomographie par cohérence optique

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EP (1) EP3743678A1 (fr)
JP (1) JP7252977B2 (fr)
CN (1) CN111699358A (fr)
CA (1) CA3088605A1 (fr)
WO (1) WO2019145754A1 (fr)

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Publication number Priority date Publication date Assignee Title
CN112587086A (zh) * 2021-03-04 2021-04-02 季华实验室 一种双模式偏振光学相干成像系统及其成像方法
CN112603255B (zh) * 2021-03-04 2021-07-20 季华实验室 一种可消除固有噪声的光学相干成像系统及成像方法

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JP6262762B2 (ja) * 2012-12-06 2018-01-17 リーハイ・ユニバーシティー 空間分割多重光コヒーレンストモグラフィー装置
JP6047059B2 (ja) * 2013-04-22 2016-12-21 日本電信電話株式会社 データ処理装置およびリサンプリング方法
JP6426974B2 (ja) * 2014-10-20 2018-11-21 株式会社トプコン データ処理方法及びｏｃｔ装置
JP6779662B2 (ja) * 2016-05-23 2020-11-04 キヤノン株式会社 撮像装置、撮像装置の制御方法、及びプログラム
CN106949966B (zh) * 2017-03-24 2018-05-08 中国科学院上海光学精密机械研究所 扫频光学相干层析成像系统的光谱标定方法

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US20150109621A1 (en) * 2012-03-21 2015-04-23 Ludwig Maximilians Universität Swept source oct system and method with phase-locked detection
JP2015198757A (ja) * 2014-04-08 2015-11-12 株式会社トーメーコーポレーション 断層撮影装置
US20160025478A1 (en) * 2014-07-25 2016-01-28 Axsun Technologies Llc Real Time FPGA Resampling for Swept Source Optical Coherence Tomography
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US20210055096A1 (en) 2021-02-25
US11397076B2 (en) 2022-07-26
EP3743678A1 (fr) 2020-12-02
CN111699358A (zh) 2020-09-22
JP2021517254A (ja) 2021-07-15
CA3088605A1 (fr) 2019-08-01
JP7252977B2 (ja) 2023-04-05

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