WO2019095792A1 - 一种环形器/隔离器测试工装 - Google Patents

一种环形器/隔离器测试工装 Download PDF

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Publication number
WO2019095792A1
WO2019095792A1 PCT/CN2018/103593 CN2018103593W WO2019095792A1 WO 2019095792 A1 WO2019095792 A1 WO 2019095792A1 CN 2018103593 W CN2018103593 W CN 2018103593W WO 2019095792 A1 WO2019095792 A1 WO 2019095792A1
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Prior art keywords
circulator
isolator
pcb board
microstrip circuit
test tool
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PCT/CN2018/103593
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English (en)
French (fr)
Inventor
熊飞
张伟
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深圳市华扬通信技术有限公司
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Publication of WO2019095792A1 publication Critical patent/WO2019095792A1/zh

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Definitions

  • the present invention relates to the field of circulator/isolator technology, and more particularly to a circulator/isolator test tooling.
  • passive microwave devices such as isolator and circulator are basically manual manual tests.
  • the connection of the test is mainly by manual connection, the reliability is poor, and the consistency is relatively poor, especially the SMD type (surface mount type) circulator, basically
  • the performance test was performed after the contact with the pad. As the frequency increases, the processing size error of the test PCB will cause changes in the standing wave of the test port, which will affect the change of the test environment, resulting in inaccurate device performance test.
  • the technical problem to be solved by the present invention is to provide a circulator/isolator test tool with more accurate and reliable test data.
  • a circulator/isolator test tool comprising a grounding plate, a PCB board, a tunable capacitor and a high frequency connector, and the microstrip circuit is arranged on the PCB board
  • One end of the microstrip circuit is electrically connected to the ferrule of the high frequency connector, and the other end of the microstrip circuit is provided with a pad
  • one end of the adjustable capacitor is electrically connected to the microstrip circuit, and the other end of the adjustable capacitor It is electrically connected to the grounding wire on the PCB board; the PCB board and the high-frequency connector are respectively fixed on the grounding plate.
  • the resistance value of the microstrip circuit is 40 ⁇ - 60 ⁇ .
  • the PCB board is provided with a positioning hole, and the positioning hole is matched with the positioning post at the bottom of the circulator/isolator.
  • the PIN on the pad and the circulator/isolator should be set.
  • microstrip circuit is gold plated.
  • grounding plate is made of copper.
  • the high frequency connector is connected to the ground plate by screws.
  • a side of the grounding plate adjacent to the PCB board is provided with an auxiliary block protruding from the PCB board, and the auxiliary block is provided with a curved surface, and the curved surface corresponds to a diameter and a circulator/ The outer diameter of the isolator is equal.
  • auxiliary block is integrally formed or detachably connected to the ground plate.
  • the PCB board is provided with a avoidance slot for avoiding the auxiliary block.
  • the beneficial effects of the invention are: setting a tunable capacitor, and the user can adjust the overall standing wave of the high-frequency connector and the PCB board with the adjustable capacitor before testing the performance of the circulator/isolator, thereby making the circulator/isolator test environment The best condition is achieved, which makes the test data of the circulator/isolator more accurate and reliable; the structure is simple, the processing is convenient, and the manufacturing cost is low.
  • FIG. 1 is a schematic view showing the cooperation of a circulator/isolator test tool and a circulator/isolator according to Embodiment 1 of the present invention
  • FIG. 2 is a schematic view showing the overall structure of a circulator/isolator test tool according to Embodiment 1 of the present invention
  • FIG 3 is an exploded view of the circulator/isolator test tool of the first embodiment of the present invention.
  • the most critical idea of the present invention is to erect a tunable capacitor between the microstrip circuit and the PCB grounding wire, so that the user can adjust the overall standing wave of the connector and the PCB before testing the circulator/isolator performance.
  • a circulator/isolator test tool includes a grounding plate 1, a PCB board 2, a tunable capacitor 3, and a high frequency connector 4, and the PCB board 2 is provided with a microstrip circuit 5
  • One end of the microstrip circuit 5 is electrically connected to the ferrule of the high frequency connector 4, and the other end of the microstrip circuit 5 is provided with a pad 6;
  • one end of the adjustable capacitor 3 is electrically connected to the microstrip circuit 5,
  • the other end of the adjustable capacitor 3 is electrically connected to a ground line on the PCB 2; the PCB board 2 and the high frequency connector 4 are respectively fixed to the ground board 1.
  • the structural principle of the present invention is briefly described as follows: After the user adjusts the whole standing wave of the PCB board 2 and the high-frequency connector 4 by using the adjustable capacitor 3, the PIN pin of the circulator/isolator 100 and the microstrip circuit 5 are soldered. The performance of the circulator/isolator 100 can be tested by the contact of the disk 6, and the operation is simple.
  • the beneficial effect of the present invention is that a tunable capacitor is provided, and the user can adjust the overall standing wave of the high-frequency connector and the PCB board by using the adjustable capacitor before testing the performance of the circulator/isolator, thereby making the circulator/
  • the test environment of the isolator is in an optimal state, which makes the test data of the circulator/isolator more accurate and reliable; the structure is simple, the processing is convenient, and the manufacturing cost is low.
  • microstrip circuit 5 has a resistance value of 40 ⁇ - 60 ⁇ .
  • the PCB board 2 is provided with a positioning hole 7 which is matched with a positioning post at the bottom of the circulator/isolator 100.
  • the positioning hole matched with the positioning post on the circulator/isolator facilitates the accurate positioning of the circulator/isolator, and is beneficial for ensuring the reliability of the circulator/isolator and the test microstrip circuit connection.
  • the PIN on the pad 6 and the circulator/isolator 100 should be set.
  • microstrip circuit 5 is gold plated.
  • the RF microstrip connection circuit adopts a gold plating process to ensure the consistency and stability of the test.
  • grounding plate 1 is made of copper.
  • the high frequency connector 4 is connected to the ground plate 1 by screws.
  • the housing of the high frequency connector is grounded.
  • the side of the grounding plate 1 adjacent to the PCB board 2 is provided with an auxiliary block 8 protruding from the PCB board 2, and the auxiliary block 8 is provided with a curved surface 9 corresponding to the curved surface 9
  • the diameter is equal to the outer diameter of the circulator/isolator 100.
  • auxiliary block 8 is integrally formed or detachably connected to the ground plate 1.
  • the PCB board 2 is provided with a cutout 10 for avoiding the auxiliary block 8.
  • the auxiliary block is arranged to facilitate the employee to install the PCB board and the circulator/isolator to be tested, which is beneficial to improve the testing efficiency of the circulator/isolator.
  • a first embodiment of the present invention is: a circulator/isolator test tool comprising a grounding plate 1, a PCB board 2, a tunable capacitor 3, and a high frequency connector 4, the PCB board 2 is provided with a microstrip circuit 5, one end of the microstrip circuit 5 is electrically connected to the ferrule of the high frequency connector 4, and the other end of the microstrip circuit 5 is provided with a pad 6; one end of the adjustable capacitor 3 The micro-band circuit 5 is electrically connected, and the other end of the adjustable capacitor 3 is electrically connected to the ground line on the PCB board 2; the PCB board 2 and the high-frequency connector 4 are respectively fixed on the ground board 1.
  • the circulator/isolator test tool of the present embodiment Since the circulator/isolator test tool of the present embodiment is used to test the three-end circulator/isolator 100, the circulator/isolator test tool of the present embodiment has three high-frequency connectors 4 and Three pads 6, three pads 6 are arranged in a triangle and the pads 6 correspond to the PIN on the circulator/isolator 100.
  • the resistance value of the microstrip circuit 5 is 40 ⁇ to 60 ⁇ , and preferably the resistance value of the microstrip circuit 5 is 50 ⁇ .
  • the PCB board 2 is provided with a positioning hole 7 which is adapted to the positioning post at the bottom of the circulator/isolator 100.
  • the grounding plate 1 is provided with an extending hole corresponding to the positioning hole 7.
  • the microstrip circuit 5 is gold-plated, the grounding plate 1 is made of copper, the high-frequency connector 4 is connected to the grounding plate 1 by screws, and the PCB board 2 is screwed, snapped or soldered to the grounding plate 1. .
  • one side of the grounding plate 1 adjacent to the PCB board 2 is provided with an auxiliary block 8 protruding from the PCB board 2, and the auxiliary block 8 is provided with a curved surface 9 on the curved surface 9
  • the corresponding diameter is equal to the outer diameter of the circulator/isolator 100, and the auxiliary block 8 is integrally or detachably connected to the ground plate 1.
  • the PCB board 2 is provided with a cutout 10 for avoiding the auxiliary block 8.
  • the circulator/isolator test tool provided by the present invention is provided with a tunable capacitor, and the user can adjust the overall standing wave of the high-frequency connector and the PCB board by using the adjustable capacitor before testing the circulator/isolator performance. Therefore, the test environment of the circulator/isolator is optimized, and the test data of the circulator/isolator is more accurate and more reliable; the structure is simple, the processing is convenient, the manufacturing cost is low; the setting and the circulator/isolator
  • the matching positioning holes on the upper positioning column facilitate the accurate positioning of the circulator/isolator, which is beneficial to ensure the reliability of the connection of the circulator/isolator and the test microstrip circuit; the RF microstrip connection circuit is ensured by the gold plating process. Consistency and stability; setting up auxiliary blocks to facilitate the installation of the circulator/isolator to be tested, which is beneficial to improve the test efficiency of the circulator/isolator.

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

本发明公开了一种环形器/隔离器测试工装，包括接地板、PCB板、可调电容和高频连接器，PCB板上设有微带电路，微带电路的一端与高频连接器的插芯电连接，微带电路的另一端设有焊盘；可调电容的一端与微带电路电连接，可调电容的另一端与PCB板上的接地线电连接；PCB板和高频连接器分别固定在接地板上。本发明提供的环形器/隔离器测试工装，设置可调电容，用户在测试环形器/隔离器性能之前可利用可调电容调节高频连接器与PCB板的整体驻波，从而使环形器/隔离器的测试环境达到最佳状态，进而使环形器/隔离器的测试数据更为精确、更为可靠；结构简单、加工方便、制造成本低。

Description

一种环形器/隔离器测试工装 技术领域
本发明涉及环形器/隔离器技术领域，尤其涉及一种环形器/隔离器测试工装。
 背景技术
目前隔离器、环形器等无源微波器件基本都是人工手动测试，测试的连接主要靠人工连接，可靠性差，一致性比较差，特别是SMD类型（表贴类）的环形器，基本上要靠和焊盘的接触连接后来进行性能测试。随着频率的升高，测试PCB的加工尺寸误差会导致测试端口驻波的变化，从而影响测试环境的变化，导致器件性能测试不准。
 技术问题
本发明所要解决的技术问题是：提供一种测试数据更为精准、可靠的环形器/隔离器测试工装。
 技术解决方案
为了解决上述技术问题，本发明采用的技术方案为：一种环形器/隔离器测试工装，包括接地板、PCB板、可调电容和高频连接器，所述PCB板上设有微带电路，所述微带电路的一端与高频连接器的插芯电连接，微带电路的另一端设有焊盘；所述可调电容的一端与微带电路电连接，可调电容的另一端与PCB板上的接地线电连接；PCB板和高频连接器分别固定在接地板上。
进一步的，所述微带电路的电阻值为40Ω-60Ω。
进一步的，所述PCB板上设有定位孔，所述定位孔与环形器/隔离器底部的定位柱相适配。
进一步的，所述焊盘与环形器/隔离器上的PIN针对应设置。
进一步的，所述微带电路镀金处理。
进一步的，所述接地板的材质为铜。
进一步的，所述高频连接器与接地板通过螺钉连接。
进一步的，所述接地板靠近PCB板的一侧设有凸出于所述PCB板的辅助块，所述辅助块上设有弧形面，所述弧形面对应的直径与环形器/隔离器的外径相等。
进一步的，所述辅助块与所述接地板一体成型或可拆卸连接。
进一步的，所述PCB板上设有用于对所述辅助块进行避位的避空槽。
 有益效果
本发明的有益效果在于：设置可调电容，用户在测试环形器/隔离器性能之前可利用可调电容调节高频连接器与PCB板的整体驻波，从而使环形器/隔离器的测试环境达到最佳状态，进而使环形器/隔离器的测试数据更为精确、更为可靠；结构简单、加工方便、制造成本低。
 附图说明
图1为本发明实施例一的环形器/隔离器测试工装与环形器/隔离器配合的示意图；
图2为本发明实施例一的环形器/隔离器测试工装的整体结构的示意图；
图3为本发明实施例一的环形器/隔离器测试工装的爆炸图。
标号说明：
1、接地板；
2、PCB板；
3、可调电容；
4、高频连接器；
5、微带电路；
6、焊盘；
7、定位孔；
8、辅助块；
9、弧形面；
10、避空槽；
100、环形器/隔离器。
 本发明的实施方式
为详细说明本发明的技术内容、所实现目的及效果，以下结合实施方式并配合附图予以说明。
本发明最关键的构思在于：在微带电路与PCB板接地线之间架设可调电容，从而让用户在测试环形器/隔离器性能之前可以调整好连接器与PCB板的整体驻波。
请参照图1至图3，一种环形器/隔离器测试工装，包括接地板1、PCB板2、可调电容3和高频连接器4，所述PCB板2上设有微带电路5，所述微带电路5的一端与高频连接器4的插芯电连接，微带电路5的另一端设有焊盘6；所述可调电容3的一端与微带电路5电连接，可调电容3的另一端与PCB板2上的接地线电连接；PCB板2和高频连接器4分别固定在接地板1上。
本发明的结构原理简述如下：用户在利用可调电容3调整好PCB板2与高频连接器4整体驻波之后，将环形器/隔离器100的PIN针与微带电路5中的焊盘6接触即可进行环形器/隔离器100的性能测试，操作简便。
从上述描述可知，本发明的有益效果在于：设置可调电容，用户在测试环形器/隔离器性能之前可利用可调电容调节高频连接器与PCB板的整体驻波，从而使环形器/隔离器的测试环境达到最佳状态，进而使环形器/隔离器的测试数据更为精确、更为可靠；结构简单、加工方便、制造成本低。
进一步的，所述微带电路5的电阻值为40Ω-60Ω。
进一步的，所述PCB板2上设有定位孔7，所述定位孔7与环形器/隔离器100底部的定位柱相适配。
由上述描述可知，设置与环形器/隔离器上定位柱相匹配的定位孔，有利于环形器/隔离器的准确定位，有利于保证环行器/隔离器和测试微带电路连接的可靠性。
进一步的，所述焊盘6与环形器/隔离器100上的PIN针对应设置。
进一步的，所述微带电路5镀金处理。
由上述描述可知，射频微带连接电路采用镀金处理工艺保证了测试的一致性和稳定性。
进一步的，所述接地板1的材质为铜。
进一步的，所述高频连接器4与接地板1通过螺钉连接。
由上述描述可知，高频连接器的外壳接地。
进一步的，所述接地板1靠近PCB板2的一侧设有凸出于所述PCB板2的辅助块8，所述辅助块8上设有弧形面9，所述弧形面9对应的直径与环形器/隔离器100的外径相等。
进一步的，所述辅助块8与所述接地板1一体成型或可拆卸连接。
进一步的，所述PCB板2上设有用于对所述辅助块8进行避位的避空槽10。
由上述描述可知，设置辅助块，方便员工安装PCB板以及待测试的环形器/隔离器，有利于提高环形器/隔离器的测试效率。
实施例一
请参照图1至图3，本发明的实施例一为：一种环形器/隔离器测试工装，包括接地板1、PCB板2、可调电容3和高频连接器4，所述PCB板2上设有微带电路5，所述微带电路5的一端与高频连接器4的插芯电连接，微带电路5的另一端设有焊盘6；所述可调电容3的一端与微带电路5电连接，可调电容3的另一端与PCB板2上的接地线电连接；PCB板2和高频连接器4分别固定在接地板1上。
由于本实施例的环形器/隔离器测试工装是用来测试三端头的环形器/隔离器100的，因此，本实施例的环形器/隔离器测试工装具有三个高频连接器4及三个焊盘6，三个焊盘6呈三角形布置且焊盘6与环形器/隔离器100上的PIN针对应。
所述微带电路5的电阻值为40Ω-60Ω，优选所述微带电路5的电阻值为50Ω。
为便于对环形器/隔离器100精确定位，所述PCB板2上设有定位孔7，所述定位孔7与环形器/隔离器100底部的定位柱相适配。可选的，接地板1上设有与所述定位孔7对应的延伸孔。
所述微带电路5镀金处理，所述接地板1的材质为铜，所述高频连接器4与接地板1通过螺钉连接，所述PCB板2与接地板1螺接、卡接或焊接。
可选的，所述接地板1靠近PCB板2的一侧设有凸出于所述PCB板2的辅助块8，所述辅助块8上设有弧形面9，所述弧形面9对应的直径与环形器/隔离器100的外径相等，所述辅助块8与所述接地板1一体成型或可拆卸连接。
进一步的，所述PCB板2上设有用于对所述辅助块8进行避位的避空槽10。
综上所述，本发明提供的环形器/隔离器测试工装，设置可调电容，用户在测试环形器/隔离器性能之前可利用可调电容调节高频连接器与PCB板的整体驻波，从而使环形器/隔离器的测试环境达到最佳状态，进而使环形器/隔离器的测试数据更为精确、更为可靠；结构简单、加工方便、制造成本低；设置与环形器/隔离器上定位柱相匹配的定位孔，有利于环形器/隔离器的准确定位，有利于保证环行器/隔离器和测试微带电路连接的可靠性；射频微带连接电路采用镀金处理工艺保证了测试的一致性和稳定性；设置辅助块，方便员工安装待测试的环形器/隔离器，有利于提高环形器/隔离器的测试效率。
以上所述仅为本发明的实施例，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等同变换，或直接或间接运用在相关的技术领域，均同理包括在本发明的专利保护范围内。

Claims (10)

  1. 一种环形器/隔离器测试工装，其特征在于：包括接地板、PCB板、可调电容和高频连接器，所述PCB板上设有微带电路，所述微带电路的一端与高频连接器的插芯电连接，微带电路的另一端设有焊盘；所述可调电容的一端与微带电路电连接，可调电容的另一端与PCB板上的接地线电连接；PCB板和高频连接器分别固定在接地板上。
  2. 根据权利要求1所述的环形器/隔离器测试工装，其特征在于：所述微带电路的电阻值为40Ω-60Ω。
  3. 根据权利要求1所述的环形器/隔离器测试工装，其特征在于：所述PCB板上设有定位孔，所述定位孔与环形器/隔离器底部的定位柱相适配。
  4. 根据权利要求1所述的环形器/隔离器测试工装，其特征在于：所述焊盘与环形器/隔离器上的PIN针对应设置。
  5. 根据权利要求1所述的环形器/隔离器测试工装，其特征在于：所述微带电路镀金处理。
  6. 根据权利要求1所述的环形器/隔离器测试工装，其特征在于：所述接地板的材质为铜。
  7. 根据权利要求1所述的环形器/隔离器测试工装，其特征在于：所述高频连接器与接地板通过螺钉连接。
  8. 根据权利要求1所述的环形器/隔离器测试工装，其特征在于：所述接地板靠近PCB板的一侧设有凸出于所述PCB板的辅助块，所述辅助块上设有弧形面，所述弧形面对应的直径与环形器/隔离器的外径相等。
  9. 根据权利要求8所述的环形器/隔离器测试工装，其特征在于：所述辅助块与所述接地板一体成型或可拆卸连接。
  10. 根据权利要求8所述的环形器/隔离器测试工装，其特征在于：所述PCB板上设有用于对所述辅助块进行避位的避空槽。
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI800098B (zh) * 2021-11-15 2023-04-21 貿聯國際股份有限公司 測試板

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN207636708U (zh) * 2017-11-15 2018-07-20 深圳市华扬通信技术有限公司 一种环形器/隔离器测试工装
CN110954718B (zh) * 2019-12-18 2022-09-20 成都八九九科技有限公司海宁分公司 一种smd环行器的测试方法
CN112924780B (zh) * 2021-01-26 2023-08-04 安徽华东光电技术研究所有限公司 用于微波模块的调试装置及其制作方法
CN114113696A (zh) * 2021-10-21 2022-03-01 北京无线电测量研究所 一种测试装置

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201117776Y (zh) * 2007-08-27 2008-09-17 武汉虹信通信技术有限责任公司 增益可调射频衰减器
CN204740269U (zh) * 2015-06-10 2015-11-04 航天科工防御技术研究试验中心 一种微带隔离器测试夹具
CN105633521A (zh) * 2016-02-25 2016-06-01 电子科技大学 一种基于介电可调薄膜的微波铁氧体环形器
CN205353140U (zh) * 2016-01-26 2016-06-29 中国振华集团云科电子有限公司 微带环形器测试夹具
CN207636708U (zh) * 2017-11-15 2018-07-20 深圳市华扬通信技术有限公司 一种环形器/隔离器测试工装

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN201117776Y (zh) * 2007-08-27 2008-09-17 武汉虹信通信技术有限责任公司 增益可调射频衰减器
CN204740269U (zh) * 2015-06-10 2015-11-04 航天科工防御技术研究试验中心 一种微带隔离器测试夹具
CN205353140U (zh) * 2016-01-26 2016-06-29 中国振华集团云科电子有限公司 微带环形器测试夹具
CN105633521A (zh) * 2016-02-25 2016-06-01 电子科技大学 一种基于介电可调薄膜的微波铁氧体环形器
CN207636708U (zh) * 2017-11-15 2018-07-20 深圳市华扬通信技术有限公司 一种环形器/隔离器测试工装

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI800098B (zh) * 2021-11-15 2023-04-21 貿聯國際股份有限公司 測試板

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