TWI800098B - 測試板 - Google Patents

測試板 Download PDF

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Publication number
TWI800098B
TWI800098B TW110142450A TW110142450A TWI800098B TW I800098 B TWI800098 B TW I800098B TW 110142450 A TW110142450 A TW 110142450A TW 110142450 A TW110142450 A TW 110142450A TW I800098 B TWI800098 B TW I800098B
Authority
TW
Taiwan
Prior art keywords
testing board
testing
board
Prior art date
Application number
TW110142450A
Other languages
English (en)
Other versions
TW202322493A (zh
Inventor
謝金安
Original Assignee
貿聯國際股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 貿聯國際股份有限公司 filed Critical 貿聯國際股份有限公司
Priority to TW110142450A priority Critical patent/TWI800098B/zh
Priority to US18/055,417 priority patent/US20230152366A1/en
Application granted granted Critical
Publication of TWI800098B publication Critical patent/TWI800098B/zh
Publication of TW202322493A publication Critical patent/TW202322493A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2844—Fault-finding or characterising using test interfaces, e.g. adapters, test boxes, switches, PIN drivers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0416—Connectors, terminals

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Coupling Device And Connection With Printed Circuit (AREA)
TW110142450A 2021-11-15 2021-11-15 測試板 TWI800098B (zh)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW110142450A TWI800098B (zh) 2021-11-15 2021-11-15 測試板
US18/055,417 US20230152366A1 (en) 2021-11-15 2022-11-15 Testing board

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110142450A TWI800098B (zh) 2021-11-15 2021-11-15 測試板

Publications (2)

Publication Number Publication Date
TWI800098B true TWI800098B (zh) 2023-04-21
TW202322493A TW202322493A (zh) 2023-06-01

Family

ID=86324479

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110142450A TWI800098B (zh) 2021-11-15 2021-11-15 測試板

Country Status (2)

Country Link
US (1) US20230152366A1 (zh)
TW (1) TWI800098B (zh)

Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015109208A2 (en) * 2014-01-17 2015-07-23 Nuvotronics, Llc Wafer scale test interface unit: low loss and high isolation devices and methods for high speed and high density mixed signal interconnects and contactors
WO2018019132A1 (zh) * 2016-07-27 2018-02-01 深圳市华讯方舟微电子科技有限公司 芯片测试夹具及芯片测试系统
TWI637181B (zh) * 2017-10-20 2018-10-01 中華精測科技股份有限公司 半導體封裝元件之高頻訊號量測裝置
WO2019095792A1 (zh) * 2017-11-15 2019-05-23 深圳市华扬通信技术有限公司 一种环形器/隔离器测试工装
US20190302159A1 (en) * 2018-03-29 2019-10-03 Rohde & Schwarz Gmbh & Co. Kg Test arrangement and test method
US20200241044A1 (en) * 2017-11-30 2020-07-30 Leeno Industrial Inc. Test device
US20200313725A1 (en) * 2019-03-28 2020-10-01 Intel Corporation Near-field test apparatus for far-field antenna properties
TW202109059A (zh) * 2019-08-16 2021-03-01 稜研科技股份有限公司 天線封裝驗證板
US11029351B1 (en) * 2018-08-20 2021-06-08 Christos Tsironis Transforming load pull test fixture for wave measurements
WO2021174583A1 (zh) * 2020-03-02 2021-09-10 瑞声声学科技(深圳)有限公司 传输模组的测试装置

Patent Citations (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015109208A2 (en) * 2014-01-17 2015-07-23 Nuvotronics, Llc Wafer scale test interface unit: low loss and high isolation devices and methods for high speed and high density mixed signal interconnects and contactors
WO2018019132A1 (zh) * 2016-07-27 2018-02-01 深圳市华讯方舟微电子科技有限公司 芯片测试夹具及芯片测试系统
TWI637181B (zh) * 2017-10-20 2018-10-01 中華精測科技股份有限公司 半導體封裝元件之高頻訊號量測裝置
WO2019095792A1 (zh) * 2017-11-15 2019-05-23 深圳市华扬通信技术有限公司 一种环形器/隔离器测试工装
US20200241044A1 (en) * 2017-11-30 2020-07-30 Leeno Industrial Inc. Test device
US20190302159A1 (en) * 2018-03-29 2019-10-03 Rohde & Schwarz Gmbh & Co. Kg Test arrangement and test method
US11029351B1 (en) * 2018-08-20 2021-06-08 Christos Tsironis Transforming load pull test fixture for wave measurements
US20200313725A1 (en) * 2019-03-28 2020-10-01 Intel Corporation Near-field test apparatus for far-field antenna properties
TW202109059A (zh) * 2019-08-16 2021-03-01 稜研科技股份有限公司 天線封裝驗證板
WO2021174583A1 (zh) * 2020-03-02 2021-09-10 瑞声声学科技(深圳)有限公司 传输模组的测试装置

Also Published As

Publication number Publication date
TW202322493A (zh) 2023-06-01
US20230152366A1 (en) 2023-05-18

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