TWI799882B - 測試設備 - Google Patents

測試設備 Download PDF

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Publication number
TWI799882B
TWI799882B TW110120010A TW110120010A TWI799882B TW I799882 B TWI799882 B TW I799882B TW 110120010 A TW110120010 A TW 110120010A TW 110120010 A TW110120010 A TW 110120010A TW I799882 B TWI799882 B TW I799882B
Authority
TW
Taiwan
Prior art keywords
test equipment
test
equipment
Prior art date
Application number
TW110120010A
Other languages
English (en)
Other versions
TW202248657A (zh
Inventor
李立偉
王永銘
黃炳傑
許天耀
Original Assignee
矽品精密工業股份有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 矽品精密工業股份有限公司 filed Critical 矽品精密工業股份有限公司
Priority to TW110120010A priority Critical patent/TWI799882B/zh
Priority to CN202110760592.7A priority patent/CN115436774A/zh
Priority to US17/745,709 priority patent/US20220390509A1/en
Publication of TW202248657A publication Critical patent/TW202248657A/zh
Application granted granted Critical
Publication of TWI799882B publication Critical patent/TWI799882B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2896—Testing of IC packages; Test features related to IC packages
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2894—Aspects of quality control [QC]
TW110120010A 2021-06-02 2021-06-02 測試設備 TWI799882B (zh)

Priority Applications (3)

Application Number Priority Date Filing Date Title
TW110120010A TWI799882B (zh) 2021-06-02 2021-06-02 測試設備
CN202110760592.7A CN115436774A (zh) 2021-06-02 2021-07-06 测试设备
US17/745,709 US20220390509A1 (en) 2021-06-02 2022-05-16 Testing equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW110120010A TWI799882B (zh) 2021-06-02 2021-06-02 測試設備

Publications (2)

Publication Number Publication Date
TW202248657A TW202248657A (zh) 2022-12-16
TWI799882B true TWI799882B (zh) 2023-04-21

Family

ID=84239943

Family Applications (1)

Application Number Title Priority Date Filing Date
TW110120010A TWI799882B (zh) 2021-06-02 2021-06-02 測試設備

Country Status (3)

Country Link
US (1) US20220390509A1 (zh)
CN (1) CN115436774A (zh)
TW (1) TWI799882B (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11940478B2 (en) * 2020-12-07 2024-03-26 Duke University Electronic device characterization systems and methods

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050179459A1 (en) * 2004-02-17 2005-08-18 Texas Instruments Incorporated Method and system for testing an electronic device
US20080001618A1 (en) * 2004-08-06 2008-01-03 King Marc E In-process system level test before surface mount
CN101315410A (zh) * 2007-05-30 2008-12-03 京元电子股份有限公司 半导体元件的预烧测试装置
TW200918908A (en) * 2007-10-18 2009-05-01 Chroma Ate Inc Program planning method of a programmable IC test machine
TW201400834A (zh) * 2012-06-29 2014-01-01 Hon Tech Inc 電子元件測試分級設備、測試分級方法及其完測電子元件
US20160018347A1 (en) * 2013-03-11 2016-01-21 S.E.A. Medical Systems, Inc. Designs, systems, configurations, and methods for immittance spectroscopy
CN109633421A (zh) * 2018-11-27 2019-04-16 珠海欧比特宇航科技股份有限公司 一种soc芯片的测试方法、装置、设备和存储介质
CN112462225A (zh) * 2019-09-06 2021-03-09 中兴通讯股份有限公司 检测装置、检测系统及检测方法

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050179459A1 (en) * 2004-02-17 2005-08-18 Texas Instruments Incorporated Method and system for testing an electronic device
US20080001618A1 (en) * 2004-08-06 2008-01-03 King Marc E In-process system level test before surface mount
CN101315410A (zh) * 2007-05-30 2008-12-03 京元电子股份有限公司 半导体元件的预烧测试装置
TW200918908A (en) * 2007-10-18 2009-05-01 Chroma Ate Inc Program planning method of a programmable IC test machine
TW201400834A (zh) * 2012-06-29 2014-01-01 Hon Tech Inc 電子元件測試分級設備、測試分級方法及其完測電子元件
US20160018347A1 (en) * 2013-03-11 2016-01-21 S.E.A. Medical Systems, Inc. Designs, systems, configurations, and methods for immittance spectroscopy
CN109633421A (zh) * 2018-11-27 2019-04-16 珠海欧比特宇航科技股份有限公司 一种soc芯片的测试方法、装置、设备和存储介质
CN112462225A (zh) * 2019-09-06 2021-03-09 中兴通讯股份有限公司 检测装置、检测系统及检测方法

Also Published As

Publication number Publication date
US20220390509A1 (en) 2022-12-08
CN115436774A (zh) 2022-12-06
TW202248657A (zh) 2022-12-16

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