WO2018227475A1 - 指纹芯片检测方法、装置及系统 - Google Patents
指纹芯片检测方法、装置及系统 Download PDFInfo
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- G01—MEASURING; TESTING
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- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
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- Embodiments of the present invention relate to the field of chip detection technologies, and in particular, to a fingerprint chip detection method, apparatus, and system.
- Biometric chips such as fingerprint chips
- fingerprint chips are widely used in terminal devices because they can realize the identity verification of terminal device users.
- the requirements for the quality of their products are getting higher and higher, and the service life of fingerprint chips is an important quality indicator.
- the electronic components in the fingerprint chip will eventually damage due to external factors such as heat generation and air oxidation during normal use, which affects the service life of the electronic components. Therefore, it is necessary to test the quality index of the service life before production. To determine whether it meets product quality standards and meet the user's needs.
- the quality detection of the fingerprint chip is mostly performed by manual detection, which makes the detection efficiency low and the detection error is large, which has a serious impact on the production and use of the fingerprint chip.
- the embodiment of the invention provides a fingerprint chip detection scheme to solve the problem that the existing fingerprint chip detection scheme has low efficiency and large detection error.
- a method for detecting a fingerprint chip includes: controlling a fingerprint chip to repeatedly execute a test instruction for testing a service life of the fingerprint chip until the test result reaches a set abnormal condition and/or The test reaches the set test time; the detection result of the fingerprint chip is determined according to the operation parameter of the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time.
- a fingerprint chip detecting apparatus including: a test execution module, configured to control a fingerprint chip to repeatedly execute a test instruction for testing a service life of the fingerprint chip until the test result is reached. Setting the abnormal condition and/or the test reaches the set test time; the result determining module is configured to determine the fingerprint chip according to the operating parameter of the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time Test results.
- a fingerprint chip detecting system is further provided.
- a basic development board, a fingerprint chip, and an adapter wherein the base development board is connected to the fingerprint chip by the adapter, the basic development board including a processing unit, the processing unit is configured to perform the method as described in the first aspect The operation corresponding to the fingerprint chip detection method.
- a computer storage medium storing: a test instruction for controlling a fingerprint chip to repeatedly perform a test for testing the lifetime of the fingerprint chip, until The test result reaches an executable instruction that sets the abnormal condition and/or the test reaches the set test time; and is used to determine the operation parameter according to the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time An executable instruction describing the detection result of the fingerprint chip.
- the test instruction for testing the service life of the fingerprint chip is repeatedly executed by controlling the fingerprint chip to detect the service life of the fingerprint chip. If the test result is abnormal when the fingerprint chip executes a certain test command, it indicates that one or some electronic components of the fingerprint chip are abnormal, the service life is terminated, and further, the operation parameter can be further used to cause the fingerprint.
- the cause of the end of the chip life is analyzed to determine the final test result; if the fingerprint chip does not have an abnormality within the set test time, the state of the fingerprint chip can be determined according to the operating parameters when the test reaches the set test time, according to which Evaluate the life of the fingerprint chip and obtain the final test results.
- FIG. 1 is a flow chart showing the steps of a fingerprint chip detecting method according to a first embodiment of the present invention
- FIG. 2 is a flow chart showing the steps of a fingerprint chip detecting method according to Embodiment 2 of the present invention.
- FIG. 3 is a flow chart showing the steps of a fingerprint chip detecting method according to Embodiment 3 of the present invention.
- FIG. 4 is a schematic diagram of an environment for detecting a fingerprint chip in the embodiment shown in FIG. 3;
- FIG. 5 is a structural block diagram of a fingerprint chip detecting apparatus according to Embodiment 4 of the present invention.
- FIG. 6 is a structural block diagram of a fingerprint chip detecting apparatus according to Embodiment 5 of the present invention.
- FIG. 1 a flow chart of steps of a fingerprint chip detecting method according to a first embodiment of the present invention is shown.
- Step S102 The control fingerprint chip repeatedly executes the test instruction for testing the service life of the fingerprint chip until the test result reaches the set abnormal condition and/or the test reaches the set test time.
- the fingerprint chip detecting method may be implemented by a device or device having a data processing function in any suitable terminal device, including but not limited to a basic development board.
- the test command for testing the service life of the fingerprint chip can be appropriately set by a person skilled in the art according to actual needs, and the service life of the fingerprint chip can be tested.
- the abnormal condition can be set to the test result indicating that the operating parameter of the fingerprint chip exceeds the corresponding standard value or normal value, etc.; A certain length of time is met so that the test instructions can be executed a sufficient number of times.
- Step S104 Determine the detection result of the fingerprint chip according to the operating parameter of the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time.
- the fingerprint chip is abnormal when the test result is executed, it indicates that one or some electronic components of the fingerprint chip are abnormal, the service life is terminated, and the detection result of the life of the fingerprint chip is obtained, and then, according to the appearance
- the operating parameters of the abnormality determine the cause of the abnormality and obtain a more accurate detection result; if the fingerprint chip does not have an abnormality within the set test time, then the root can be According to the operating parameters when the test reaches the set test time, the state of the fingerprint chip is determined, and the service life of the fingerprint chip is evaluated according to this, and the final test result is obtained.
- the operating parameters include but are not limited to: firmware configuration write error, OTP read parameter error (such as chip ID, TCode value, check sum value, etc.) chip reset failure, power-on restart return error, chip mode switch error or The error interrupt value at the time of failure, the content of the interrupt report waveform and the standard specified by the chip set are inconsistent in the specific mode, and the like.
- the test instruction for testing the life of the fingerprint chip is repeatedly executed by controlling the fingerprint chip to detect the service life of the fingerprint chip. If the fingerprint chip is abnormal when the test result is executed, the service life is terminated, and further, the operation parameter at this time can further analyze the cause of the end of the life of the fingerprint chip, and determine the final detection result; If the fingerprint chip does not have an abnormality within the set test time, the state of the fingerprint chip can be determined according to the operating parameters when the test reaches the set test time, and the service life of the fingerprint chip is evaluated according to this, and the final test result is obtained. It can be seen that, by the solution of the embodiment, the detection efficiency is effectively improved compared with the existing detection mode, and the detection result is determined by the corresponding operation parameter, so that the detection result is relatively accurate, and the detection error is reduced.
- FIG. 2 a flow chart of steps of a fingerprint chip detecting method according to a second embodiment of the present invention is shown.
- Step S202 The control fingerprint chip repeatedly executes the test instruction for testing the service life of the fingerprint chip according to the set frequency until the test result reaches the set abnormal condition and/or the test reaches the set test time.
- the set frequency can be appropriately set by a person skilled in the art according to the test instruction, so that the test instruction can be completely executed in one test period.
- it can be set to the shortest time setting in which the test instruction is completely executed once or the time setting slightly longer than the shortest time.
- the issuing device of the test instruction such as the basic development board, regularly sends out test instructions, which improves the test efficiency and reduces the cost of the test instruction.
- the test instruction may include at least one of the following instructions: a drawing instruction indicating that the fingerprint chip performs biometric collection, an identification instruction indicating that the fingerprint chip identifies the biometric, and a power-on instruction indicating that the fingerprint chip is powered on. a power-off instruction indicating that the fingerprint chip is powered off, and a sleep instruction indicating that the fingerprint chip is sleeping.
- the drawing instruction may collect an empty picture, or may be a preset biometric picture, such as a fingerprint picture.
- the setting of the abnormal condition and the setting of the test time may also be appropriately set by a person skilled in the art according to the actual situation, which is not limited by the embodiment of the present invention.
- the abnormal condition may be set to indicate that the test result indicates that the operating parameter of the fingerprint chip exceeds a corresponding standard value or a normal value, etc.; the test time needs to satisfy a certain length of time so that the test instruction can be executed a sufficient number of times.
- the test instruction may be sent to the fingerprint chip, and the test result is obtained; and then the test result is judged whether the set abnormal condition is satisfied; if yes, the following execution is performed according to the fingerprint chip when the test result reaches the set abnormal condition
- the operation parameter determines the detection result of the fingerprint chip; if not, it determines whether the test reaches the set test time; if the set test time is not reached, returns the step of sending a test command to the fingerprint chip and obtaining the test result
- the execution continues; otherwise, the following steps are performed to determine the detection result of the fingerprint chip according to the operating parameters of the fingerprint chip when the test reaches the set test time.
- Step S204 Obtain an operation parameter of the fingerprint chip when the test result reaches a set abnormal condition or the test reaches a set test time.
- the operating parameters include, but are not limited to, an operating parameter of a register running in the terminal device where the fingerprint chip is located when the fingerprint chip executes the test instruction.
- the registers include, but are not limited to, a chip read/write control register, a mode switch control register, an instruction register, an interrupt response register, and the like.
- Step S206 Determine the detection result of the fingerprint chip according to the obtained operating parameters.
- the operation parameter includes the operation parameter of the register obtained in step S204
- the operation parameter of the register and the set operation parameter may be compared, and the detection result of the fingerprint chip is determined according to the comparison result.
- setting the running parameter may be an operating parameter corresponding to the register when the test instruction is normally executed.
- the test report may be generated according to the operating parameters of the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time; and further, the detection result of the fingerprint chip is determined according to the test report.
- the generated test report only the running parameters may be recorded; the abnormal running parameters may also be given in a setting manner, for example, in a bold manner or in a different color font manner; or according to the running parameters, according to certain rules.
- the reason for the abnormal operation parameter is determined, and the like, the embodiment of the present invention does not limit the specific content in the test report.
- the fingerprint chip detecting method of the embodiment can not only accurately and efficiently detect the service life of the fingerprint chip, but also further analyze the cause of the end of the life of the fingerprint chip according to the operating parameters, and maintain the subsequent fingerprint chip. Provide a reference for improvement.
- the fingerprint chip detecting method may be implemented by a device or device having a data processing function in any suitable terminal device, including but not limited to a processor in the touch screen development board.
- FIG. 3 a flow chart of steps of a fingerprint chip detecting method according to a third embodiment of the present invention is shown.
- a fingerprint chip detecting method according to an embodiment of the present invention will be described with the basic development board as an execution main body.
- the basic environment for detecting the fingerprint chip will first be described below.
- the fingerprint chip detection system includes a fingerprint chip 100 to be detected, an interface adapter 200, and a basic development board 300.
- the fingerprint chip 100 can be a fingerprint chip module, and can normally collect fingerprint data, and communicate with the basic development board 300 through an interface provided by the interface adapter 200.
- the interface adapter 200 connects the fingerprint chip 100 and the basic development board 300 to provide a chip communication protocol.
- the basic development board 300 is a hardware device that can run operating system software, and can communicate with the fingerprint chip 100 through the interface adapter 200 using its software.
- the basic development board 300 is provided with a system test software 3001 and a display screen 3002.
- the system test software 3001 can execute and implement a corresponding test function through a processing unit (such as a microprocessor) of the basic development board 300 (for example, the basic development board 300).
- Processing unit can perform corresponding fingerprint chip detection in multiple method embodiments of the present invention
- the test method is used to test the service life of the fingerprint chip 100; the basic development board 300 tests the life of the fingerprint chip 100 through the system test software 3001, and the display screen 3002 in the basic development board 300 is used to interact with the user to display the current test. Parameters and execution status, etc.
- the display screen 3002 can be a common display for display or a touch screen, which can be used for display or for input. The above arrangement forms the basic environment for detecting the fingerprint chip.
- the fingerprint chip detecting method of this embodiment includes the following steps:
- Step S302 The basic development board 300 is powered on.
- Step S304 The base development board 300 runs the system test software 3001 thereon.
- Step S306 The basic development board 300 sets the test time (ie, sets the test time) through the system test software 3001.
- a suitable input device such as through a keyboard, a mouse, or when the display screen 3002 is a touch screen, settings or the like are input through the touch screen.
- Step S308 The basic development board 300 sends a test command to the fingerprint chip 100 through the system test software 3001.
- the test command may be a combination of any one or more of a power-on command, a power-off command, a drawing command, and a sleep command.
- the basic development board 300 communicates with the fingerprint chip 100 via the interface adapter 200.
- the steps in this embodiment omits the description of the transmission processing of the interface adapter 200 between the two, but those skilled in the art should It is to be understood that the communication between the basic development board 300 and the fingerprint chip 100 in this embodiment is transmitted via the interface adapter 200.
- Step S310 The basic development board 300 controls the fingerprint chip 100 to execute a test instruction, and obtains a test result.
- Step S312 The basic development board 300 determines whether the execution of the test instruction is successful according to the test result. If the execution is unsuccessful, step S314 is performed; if the execution is successful, step S318 is performed.
- Step S314 The basic development board 300 detects the current state of the fingerprint chip 100.
- the fingerprint chip 100 is currently in a power-on state, or a power-off state, or a drawing state, or a sleep state. That is, one of the states corresponding to the specific command such as the electric command, the power-off command, the drawing command, the sleep command, and the like.
- Step S316 The basic development board 300 records the current operating parameters of the fingerprint chip 100, and then performs step S322.
- These current operating parameters may be current parameters such as a chip read/write control register, a mode switch control register, an instruction register, an interrupt response register, and the like.
- Step S318 The basic development board 300 determines whether the test has reached the test time. If the test time has been reached, step S320 is performed; if the test time is not reached, the process returns to step S308 to continue execution.
- Step S320 The basic development board 300 records the current operating parameters of the fingerprint chip 100, and then performs step S322.
- this step is an optional step. In actual implementation, if the test has reached the test time, it indicates that the service life of the fingerprint chip is substantially up to standard, and step S322 may be directly performed.
- Step S322 The basic development board 300 generates a test report.
- Step S324 Stop the test.
- the system test software 3001 installed in the basic development board 300 controls the fingerprint chip 100 through the interface adapter 200, and controls the fingerprint chip 100 to perform operations such as drawing, recognition, power-on, and hibernation by issuing test instructions.
- various components in the fingerprint chip 100 will continuously switch state and charge and discharge, resulting in loss of various components during such long-term operation.
- the loss is very slow in the normal operation process, and it is difficult to quantify.
- each operation time interval can be set in a specific detection process (that is, the set frequency of executing the test command, that is, the setting Constant frequency), such as 100 milliseconds, continuously perform the same operation 7*24 hours (set test time).
- the fingerprint chip 100 is detected, such as image quality, recognition rate, FRR (False).
- Basic indicators such as Rejection Rate, FAR (False Acceptance Rate). It is even possible for the fingerprint chip 100 to perform this process all the time until the fingerprint chip 100 is inoperable. Then, the process of recording and quantifying how many times the fingerprint chip 100 is performed in total is performed. Alternatively, multiple fingerprint chips can be simultaneously counted as a basic test sample data for production and development of a fingerprint chip reference. In order to continuously optimize the parameters of each chip and the packaging method, the use time of the fingerprint chip can be extended as much as possible.
- the test command can be issued according to the test time cycle, or can be issued according to a certain frequency, such as the operation time interval set according to the foregoing, or can be configured at the same time when the test time is set. If the test command issued successfully indicates that the current state of the fingerprint chip is normal, if the test command is unsuccessful, the current fingerprint chip may be repeatedly subjected to high-intensity running instructions for a long time. Depletion occurs and it is necessary to analyze which parameters are abnormal through the test report. For simple preliminary analysis (such as incorrect operating parameters, etc.) can be directly displayed on the display for viewing; for more specific analysis, test logs can be exported from the basic development board for further detailed analysis.
- a certain frequency such as the operation time interval set according to the foregoing
- the service life of the fingerprint chip is detected without increasing the hardware cost, and after the test process is completed, the analysis of the operating parameters of the fingerprint chip can be initially determined in the case of long-term repeated use. How long the fingerprint chip can be used normally, which makes the quality assurance of the fingerprint chip more reliable before production, reduces unnecessary product quality problems, and provides more accurate data describing the life of the fingerprint chip for reference and optimization of products. Design and development production.
- FIG. 5 a block diagram of a fingerprint chip detecting apparatus according to a fourth embodiment of the present invention is shown.
- the fingerprint chip detecting device can be applied to the basic development board 300 of the fingerprint chip detecting system shown in FIG. 4 for performing a corresponding fingerprint chip detecting function.
- the fingerprint chip detecting apparatus of this embodiment includes: a test execution module 402, configured to control the fingerprint chip to repeatedly execute a test instruction for testing the service life of the fingerprint chip until the test result reaches the set abnormal condition and/or the test reaches the set test time
- the result determining module 404 is configured to determine the detection result of the fingerprint chip according to the operating parameter of the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time.
- the test instruction for testing the life of the fingerprint chip is repeatedly executed by controlling the fingerprint chip to detect the service life of the fingerprint chip. If the fingerprint chip is abnormal when the test result is executed, the service life is terminated, and further, the operation parameter at this time can further analyze the cause of the end of the life of the fingerprint chip, and determine the final detection result; If the fingerprint chip does not have an abnormality within the set test time, the state of the fingerprint chip can be determined according to the operating parameters when the test reaches the set test time, and the service life of the fingerprint chip is evaluated according to this, and the final test result is obtained. It can be seen that, by the solution of the embodiment, the detection efficiency is effectively improved compared with the existing detection mode, and the detection result is determined by the corresponding operation parameter, so that the detection result is relatively accurate, and the detection error is reduced.
- FIG. 6 a block diagram of a fingerprint chip detecting apparatus according to a fifth embodiment of the present invention is shown.
- the fingerprint chip detecting apparatus of this embodiment includes: a test execution module 502, configured to control the fingerprint chip to repeatedly execute a test instruction for testing the service life of the fingerprint chip until the test result reaches a set abnormal condition and/or the test reaches the set
- the test time module is configured to determine the detection result of the fingerprint chip according to the operating parameter of the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time.
- the test instruction includes at least one of: a mapping instruction indicating that the fingerprint chip performs biometric collection, an identification instruction indicating that the fingerprint chip identifies the biometric, a power-on instruction indicating that the fingerprint chip is powered on, an indication The power-off instruction of the fingerprint chip is powered off, and the sleep instruction indicating the sleep of the fingerprint chip.
- the test execution module 502 includes: an instruction sending module 5022, configured to send a test instruction to the fingerprint chip, and obtain a test result; the first determining module 5024 is configured to determine whether the test result meets the set abnormal condition; The module 5026 is configured to execute the result determining module 504 if the determining result of the first determining module 5024 is satisfied, and the second determining module 5028 is configured to determine whether the test is reached if the determining result of the first determining module 5024 is not satisfied.
- the second execution module 50210 is configured to return to the instruction sending module 5022 if the determination result of the second determining module 5028 is that the set test time is not reached; otherwise, the result determining module 504 is executed.
- the operating parameter includes: an operating parameter of a register running in the terminal device where the fingerprint chip is located when the fingerprint chip executes the test instruction.
- the result determining module 504 is configured to compare the running parameter of the register with the set operating parameter, and determine the detection result of the fingerprint chip according to the comparison result.
- the test execution module 502 is configured to control the fingerprint chip to repeatedly execute the test instruction for testing the service life of the fingerprint chip according to the set frequency until the test result reaches the set abnormal condition and/or the test reaches the set test time.
- the result determining module 504 includes: a report generating module 5042, configured to generate a test report according to the running parameter of the fingerprint chip when the test result reaches the set abnormal condition or the test reaches the set test time; the report result module 5044, The detection result of the fingerprint chip is determined according to the test report.
- the fingerprint chip detecting device of this embodiment is used to implement the corresponding finger in the foregoing plurality of method embodiments.
- the chip chip detection method has the beneficial effects of the corresponding method embodiments, and details are not described herein again.
- the device embodiments described above are merely illustrative, wherein the modules described as separate components may or may not be physically separate, and the components displayed as modules may or may not be physical modules, ie may be located A place, or it can be distributed to multiple network modules. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the embodiment. Those of ordinary skill in the art can understand and implement without deliberate labor.
- a machine-readable medium includes read only memory (ROM), random access memory (RAM), magnetic disk storage media, optical storage media, flash storage media, electrical, optical, acoustic, or other forms of propagation signals (eg, carrier waves) , an infrared signal, a digital signal, etc., etc., the computer software product comprising instructions for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform the various embodiments or portions of the embodiments described Methods.
- ROM read only memory
- RAM random access memory
- magnetic disk storage media e.g., magnetic disks, magnetic disk storage media, optical storage media, flash storage media, electrical, optical, acoustic, or other forms of propagation signals (eg, carrier waves) , an infrared signal, a digital signal, etc., etc.
- the computer software product comprising instructions for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform the various embodiments or portions of the embodiment
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Abstract
一种指纹芯片检测方法、装置、触摸屏开发板及电子终端，其中，指纹芯片检测方法包括：控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间（S102）；根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果（S104）。有效提升了检测效率，并且，通过相应的运行参数确定检测结果，使得检测结果比较准确，减小了检测误差。
Description
本发明实施例涉及芯片检测技术领域，尤其涉及一种指纹芯片检测方法、装置及系统。
生物特征识别的芯片，如指纹芯片，因可以实现终端设备使用者的身份识别验证，被广泛应用于终端设备中。但随着指纹芯片的广泛使用，对其产品质量的要求也越来越高，指纹芯片的使用寿命就是其中重要的一项质量指标。因为指纹芯片中的电子元件在正常使用的过程中会因为发热、空气氧化等外界因素导致最终损坏，影响了其使用寿命，因此，需要在生产前即对其使用寿命这一质量指标进行检测，以确定其是否符合产品质量标准，满足用户的使用需求。
然而，目前对指纹芯片的质量检测多采用人工检测的方式，使得检测效率低下且检测误差较大，对指纹芯片的生产和使用造成了严重影响。
发明内容
本发明实施例提供一种指纹芯片检测方案，以解决现有指纹芯片检测方案效率低下且检测误差较大的问题。
根据本发明实施例的第一方面，提供了一种指纹芯片检测方法，包括：控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间；根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果。
根据本发明实施例的第二方面，还提供了一种指纹芯片检测装置，包括：测试执行模块，用于控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间；结果确定模块，用于根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果。
根据本发明实施例的第三方面，还提供了一种指纹芯片检测系统，包
括基础开发板、指纹芯片和适配器，其中所述基础开发板通过所述适配器连接到所述指纹芯片，所述基础开发板包括处理单元，所述处理单元用于执行如第一方面所述的指纹芯片检测方法所对应的操作。
根据本发明实施例的第四方面，还提供了一种计算机存储介质，所述计算机可读存储介质存储有：用于控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间的可执行指令；用于根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果的可执行指令。
根据本发明实施例提供的指纹芯片检测方案，通过控制指纹芯片重复执行用于测试指纹芯片使用寿命的测试指令，以检测指纹芯片的使用寿命。若指纹芯片在执行某次测试指令时，出现测试结果异常，则说明指纹芯片的某个或某些电子元件出现了异常，使用寿命终止，进而，通过此时的运行参数，可以进一步对导致指纹芯片使用寿命终止的原因进行分析，确定最终的检测结果；若指纹芯片在设定测试时间内未出现异常，则可根据测试达到设定测试时间时的运行参数，确定指纹芯片的状态，据此评估指纹芯片的使用寿命，获得最终的检测结果。可见，通过本发明实施例的方案，相比较于现有检测方式，有效提升了检测效率，并且，通过相应的运行参数确定检测结果，使得检测结果比较准确，减小了检测误差。
为了更清楚地说明本发明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明的一些实施例，对于本领域技术人员来讲，在不付出创造性劳动性的前提下，还可以根据这些附图获得其他的附图。
图1为根据本发明实施例一的一种指纹芯片检测方法的步骤流程图；
图2为根据本发明实施例二的一种指纹芯片检测方法的步骤流程图；
图3为根据本发明实施例三的一种指纹芯片检测方法的步骤流程图；
图4为图3所示实施例中的检测指纹芯片的环境示意图；
图5为根据本发明实施例四的一种指纹芯片检测装置的结构框图；
图6为根据本发明实施例五的一种指纹芯片检测装置的结构框图。
为使得本发明实施例的发明目的、特征、优点能够更加的明显和易懂，下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅仅是本发明实施例一部分实施例，而非全部实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其他实施例，都属于本发明实施例保护的范围。
实施例一
参照图1，示出了根据本发明实施例一的一种指纹芯片检测方法的步骤流程图。
本实施例的指纹芯片检测方法包括以下步骤：
步骤S102：控制指纹芯片重复执行用于测试指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间。
本发明实施例中，指纹芯片检测方法可以由任意适当的终端设备中的具有数据处理功能的装置或者设备实现，包括但不限于基础开发板。
其中，用于测试指纹芯片使用寿命的测试指令可以由本领域技术人员根据实际需求适当设置，可测试出指纹芯片使用寿命即可。例如，上电指令、采图指令、识别指令、休眠指令、断电指令、中断上报指令、写入固件配置指令、读取OTP(One Time Programable，一次性可编程芯片)指令、ESD(Electro-Static discharge，静电释放)检测指令、芯片重置指令等等。
设定异常条件和设定测试时间也可以由本领域技术人员根据实际情况适当设置，如，异常条件可以设置为测试结果指示指纹芯片的运行参数超出对应的标准值或者正常值等等；测试时间需要满足一定的时间长度，以使测试指令能够被执行足够多的次数。
步骤S104：根据指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定指纹芯片的检测结果。
若指纹芯片在执行某次测试指令时，出现测试结果异常，则说明指纹芯片的某个或某些电子元件出现了异常，使用寿命终止，得到指纹芯片使用寿命的检测结果，进而，可以根据出现异常时的运行参数，确定异常原因，得到更为准确的检测结果；若指纹芯片在设定测试时间内未出现异常，则可根
据测试达到设定测试时间时的运行参数，确定指纹芯片的状态，据此评估指纹芯片的使用寿命，获得最终的检测结果。其中，运行参数包括但不限于：与固件配置写入错误、OTP读取参数错误(如芯片ID、TCode值、check sum值等)芯片重置失败、上电重启返回错误、芯片模式切换错误或失败时的错误中断值、中断上报波形内容与芯片设定规定的标准在特定模式下不一致等等有关的参数。
根据本实施例，通过控制指纹芯片重复执行用于测试指纹芯片使用寿命的测试指令，以检测指纹芯片的使用寿命。若指纹芯片在执行某次测试指令时，出现测试结果异常，则使用寿命终止，进而，通过此时的运行参数，可以进一步对导致指纹芯片使用寿命终止的原因进行分析，确定最终的检测结果；若指纹芯片在设定测试时间内未出现异常，则可根据测试达到设定测试时间时的运行参数，确定指纹芯片的状态，据此评估指纹芯片的使用寿命，获得最终的检测结果。可见，通过本实施例的方案，相比较于现有检测方式，有效提升了检测效率，并且，通过相应的运行参数确定检测结果，使得检测结果比较准确，减小了检测误差。
实施例二
参照图2，示出了根据本发明实施例二的一种指纹芯片检测方法的步骤流程图。
本实施例的指纹芯片检测方法包括以下步骤：
步骤S202：控制指纹芯片按照设定频率重复执行用于测试指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间。
本实施例中，设定频率可以由本领域技术人员根据测试指令适当设置，使得一个测试周期内，测试指令可被完整执行即可。例如，可以设置为按照测试指令被完整执行一次的最短时间设置或者稍长于最短时间的时间设置。
但不限于此，在实际使用中，也可以不设定频率，循环执行测试指令即可。
通过设置设定频率，使得测试指令的下发设备如基础开发板有规律地下发测试指令，提升了测试效率，降低了测试指令下发成本。
用于测试指纹芯片使用寿命的测试指令可以由本领域技术人员根据实际需求适当设置，可测试出指纹芯片使用寿命即可。在一种可行方式中，测试指令可以包括以下指令至少之一：指示指纹芯片进行生物特征采集的采图指令、指示指纹芯片对生物特征进行识别的识别指令、指示指纹芯片上电的上电指令、指示指纹芯片断电的断电指令、指示指纹芯片休眠的休眠指令。在具体应用时，采图指令可以采集的是空图，也可以是预先设置的生物特征图片，如指纹图片等。
本实施例中，设定异常条件和设定测试时间也可以由本领域技术人员根据实际情况适当设置，本发明实施例对此不作限制。如，异常条件可以设置为测试结果指示指纹芯片的运行参数超出对应的标准值或者正常值等等；测试时间需要满足一定的时间长度，以使测试指令能够被执行足够多的次数。
在一种可行方式中，可以向指纹芯片发送测试指令，并获得测试结果；进而判断测试结果是否满足设定异常条件；若满足，则执行下述根据指纹芯片在测试结果达到设定异常条件时的运行参数，确定指纹芯片的检测结果的步骤；若不满足，则判断测试是否达到设定测试时间；若未达到设定测试时间，则返回向指纹芯片发送测试指令，并获得测试结果的步骤继续执行；否则，执行下述根据指纹芯片在测试达到设定测试时间时的运行参数，确定指纹芯片的检测结果的步骤。
步骤S204：获得指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数。
其中，运行参数包括但不限于：指纹芯片执行测试指令时，指纹芯片所在的终端设备中运行的寄存器的运行参数。其中，所述寄存器包括但不限于：芯片读写控制寄存器、模式切换控制寄存器、指令寄存器、中断响应寄存器等。
步骤S206：根据获得的运行参数，确定指纹芯片的检测结果。
当运行参数包括步骤S204中获得的寄存器的运行参数时，在一种可行方式中，可以比较寄存器的运行参数与设定运行参数，根据比较结果确定指纹芯片的检测结果。其中，设定运行参数可以是测试指令正常执行时寄存器对应的运行参数。通过比对测试结果中的寄存器运行参数与该设定运行参数，可以有效确定指纹芯片是否发生异常，使用寿命是否终止，确定指纹芯片的
检测结果。
在一种可行方式中，可以根据指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，生成测试报告；进而，根据测试报告确定指纹芯片的检测结果。其中，在生成的测试报告中，可以仅记录运行参数；也可以以设定方式给出异常运行参数，如，以加粗方式或以不同颜色字体方式；还可以根据运行参数，按照一定的规则判断出出现异常运行参数的原因等等，本发明实施例对测试报告中的具体内容不作限制。
通过本实施例的指纹芯片检测方法，不仅可以准确、高效地检测出指纹芯片的使用寿命，还可以进一步根据运行参数，对导致指纹芯片使用寿命终止的原因进行分析，为后续指纹芯片的维护和改进提供参考。
本发明实施例中，指纹芯片检测方法可以由任意适当的终端设备中的具有数据处理功能的装置或者设备实现，包括但不限于触摸屏开发板中的处理器。
实施例三
参照图3，示出了根据本发明实施例三的一种指纹芯片检测方法的步骤流程图。
本实施例中，以基础开发板为执行主体，对本发明实施例的指纹芯片检测方法进行说明。为便于理解本实施例的方案，以下首先对检测指纹芯片的基本环境进行说明。
请参阅图4，其为本发明提供的指纹芯片检测系统一种实施例的示意图，如图4所示，所述指纹芯片检测系统包括待检测的指纹芯片100、接口适配器200和基础开发板300。其中，指纹芯片100可以是指纹芯片模组，可正常采集指纹数据，通过接口适配器200提供的接口与基础开发板300通信；接口适配器200连接指纹芯片100和基础开发板300，提供符合芯片通讯协议的接口；基础开发板300是一种可运行操作系统软件的硬件设备，可使用其软件通过接口适配器200与指纹芯片100通信。基础开发板300上设置有系统测试软件3001和显示屏3002，系统测试软件3001可以通过基础开发板300的处理单元(比如微处理器)来执行并实现相应的测试功能(如，基础开发板300的处理单元可以执行本发明多个方法实施例中相应的指纹芯片检
测方法，以测试指纹芯片100的使用寿命)；基础开发板300通过系统测试软件3001对指纹芯片100进行使用寿命测试，基础开发板300中的显示屏3002用于与用户交互，显示当前测试的参数和执行状态等。其中，显示屏3002可以是普通的用于显示的显示屏，也可以是触摸屏，即可用于显示也可用于输入。上述设置形成了检测指纹芯片的基本环境。
基于以上环境，本实施例的指纹芯片检测方法包括以下步骤：
步骤S302：基础开发板300上电。
步骤S304：基础开发板300运行其上的系统测试软件3001。
步骤S306：基础开发板300通过系统测试软件3001设置测试时间(即设定测试时间)。
如，通过适当的输入设备，如通过键盘、鼠标、或者当显示屏3002为触摸屏时，通过触摸屏输入设置等。
步骤S308：基础开发板300通过系统测试软件3001向指纹芯片100下发测试指令。
本实施例中，测试指令可以是上电指令、断电指令、采图指令和休眠指令中的任意一种或多种的组合。
如前所述，基础开发板300经接口适配器200与指纹芯片100通信，为便于描述，本实施例中的步骤省略了接口适配器200在二者之间的传输处理描述，但本领域技术人员应当明了，本实施例中的基础开发板300与指纹芯片100之间的通信，均经由接口适配器200进行传输。
步骤S310：基础开发板300控制指纹芯片100执行测试指令，并获得测试结果。
步骤S312：基础开发板300根据测试结果判断测试指令的执行是否成功，若执行不成功，则执行步骤S314；若执行成功，则执行步骤S318。
步骤S314：基础开发板300检测指纹芯片100的当前状态。
如，指纹芯片100当前处于上电状态、或者断电状态、或者采图状态、或者休眠状态。也即，与具体的指令如上电指令、断电指令、采图指令和休眠指令等相对应的状态中的一种。
步骤S316：基础开发板300记录指纹芯片100的当前运行参数，然后执行步骤S322。
这些当前运行参数可以是例如芯片读写控制寄存器、模式切换控制寄存器、指令寄存器、中断响应寄存器等的当前参数。
步骤S318：基础开发板300判断测试是否已达测试时间，若已达测试时间，则执行步骤S320；若未达测试时间，则返回步骤S308继续执行。
本步骤中，判断测试是否已达步骤S306中设置的测试时间。
步骤S320：基础开发板300记录指纹芯片100的当前运行参数，然后执行步骤S322。
需要说明的是，本步骤为可选步骤，在实际执行中，若测试已达测试时间，则说明指纹芯片的使用寿命基本达标，也可以直接执行步骤S322。
步骤S322：基础开发板300生成测试报告。
步骤S324：停止测试。
在一种具体实现中，基础开发板300中搭载的系统测试软件3001通过接口适配器200控制指纹芯片100，通过下发测试指令控制指纹芯片100执行采图、识别、上电、休眠等操作。在这一过程中，指纹芯片100中各种元器件会不停的切换状态以及充放电，导致各种元器件在长期的这种操作过程中有所损耗。但该损耗在正常的这一操作过程中非常缓慢，也很难量化，为此，可以在具体的检测过程中设置每一次的操作时间间隔(即设定的执行测试指令的频率，也即设定频率)，比如100毫秒一次，不断执行相同的操作7*24小时(设定测试时间)，待设定测试时间执行完毕后，再来检测指纹芯片100在诸如图像质量、识别率、FRR(False Rejection Rate，拒真率)/FAR(False Acceptance Rate，认假率)等基本指标情况。甚至可以让指纹芯片100一直执行这一过程，直到指纹芯片100不能工作为止。然后，记录并量化分析指纹芯片100总共执行了多少次这样的过程，可选地，还可以同时统计多颗指纹芯片的情况，以此作为一项基本的测试样本数据供生产和开发指纹芯片参考，以便不断优化各个芯片参数和封装方式，尽最大可能延长指纹芯片的使用时间。
测试指令可以依据测试时间循环下发，也可以按照一定频率下发，如按照前述设置的操作时间间隔下发，或者也可以在设置测试时间的时候同时配置。如果下发的测试指令执行成功说明指纹芯片当前的状态正常，如果测试指令执行不成功，说明当前指纹芯片可能由于长时间的反复高强度运行指令
出现了耗损，需要通过测试报告分析哪些参数有异常。对于简单初步的分析(如错误的运行参数等)可直接显示在显示屏上以供查看；对于更加具体的分析，可以从基础开发板导出测试日志进行进一步的详细分析。
通过本实施例，在不增加硬件成本的基础上实现了对指纹芯片的使用寿命检测，并且，在测试过程完成后，通过对指纹芯片运行参数的分析可以初步判断在长期反复使用的情况下，指纹芯片最终可以正常使用多少时间，使得指纹芯片量产前的质量保证更加可靠，减少不必要的产品质量问题，也为产品提供更加准确的描述指纹芯片使用寿命的数据，以供参考和优化产品设计和开发生产。
实施例四
参照图5，示出了根据本发明实施例四的一种指纹芯片检测装置的结构框图。所述指纹芯片检测装置可以应用在图4所示的指纹芯片检测系统的基础开发板300，用于执行相应的指纹芯片检测功能。
本实施例的指纹芯片检测装置包括：测试执行模块402，用于控制指纹芯片重复执行用于测试指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间；结果确定模块404，用于根据指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定指纹芯片的检测结果。
根据本实施例，通过控制指纹芯片重复执行用于测试指纹芯片使用寿命的测试指令，以检测指纹芯片的使用寿命。若指纹芯片在执行某次测试指令时，出现测试结果异常，则使用寿命终止，进而，通过此时的运行参数，可以进一步对导致指纹芯片使用寿命终止的原因进行分析，确定最终的检测结果；若指纹芯片在设定测试时间内未出现异常，则可根据测试达到设定测试时间时的运行参数，确定指纹芯片的状态，据此评估指纹芯片的使用寿命，获得最终的检测结果。可见，通过本实施例的方案，相比较于现有检测方式，有效提升了检测效率，并且，通过相应的运行参数确定检测结果，使得检测结果比较准确，减小了检测误差。
实施例五
参照图6，示出了根据本发明实施例五的一种指纹芯片检测装置的结构框图。
本实施例的指纹芯片检测装置包括：测试执行模块502，用于控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间；结果确定模块504，用于根据指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定指纹芯片的检测结果。
可选地，测试指令包括以下指令至少之一：指示指纹芯片进行生物特征采集的采图指令、指示指纹芯片对所述生物特征进行识别的识别指令、指示指纹芯片上电的上电指令、指示指纹芯片断电的断电指令、指示指纹芯片休眠的休眠指令。
可选地，测试执行模块502包括：指令发送模块5022，用于向指纹芯片发送测试指令，并获得测试结果；第一判断模块5024，用于判断测试结果是否满足设定异常条件；第一执行模块5026，用于若第一判断模块5024的判断结果为满足，则执行结果确定模块504；第二判断模块5028，用于若第一判断模块5024的判断结果为不满足，则判断测试是否达到设定测试时间；第二执行模块50210，用于若第二判断模块5028的判断结果为未达到设定测试时间，则返回指令发送模块5022；否则，执行结果确定模块504。
可选地，运行参数包括：指纹芯片执行测试指令时，指纹芯片所在的终端设备中运行的寄存器的运行参数。
可选地，结果确定模块504用于比较寄存器的运行参数与设定运行参数，根据比较结果确定指纹芯片的检测结果。
可选地，测试执行模块502用于控制指纹芯片按照设定频率重复执行用于测试指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间。
可选地，结果确定模块504包括：报告生成模块5042，用于根据指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，生成测试报告；报告结果模块5044，用于根据测试报告确定指纹芯片的检测结果。
本实施例的指纹芯片检测装置用于实现前述多个方法实施例中相应的指
纹芯片检测方法，并具有相应的方法实施例的有益效果，在此不再赘述。
以上所描述的装置实施例仅仅是示意性的，其中所述作为分离部件说明的模块可以是或者也可以不是物理上分开的，作为模块显示的部件可以是或者也可以不是物理模块，即可以位于一个地方，或者也可以分布到多个网络模块上。可以根据实际的需要选择其中的部分或者全部模块来实现本实施例方案的目的。本领域普通技术人员在不付出创造性的劳动的情况下，即可以理解并实施。
通过以上的实施方式的描述，本领域的技术人员可以清楚地了解到各实施方式可借助软件加必需的通用硬件平台的方式来实现，当然也可以通过硬件。基于这样的理解，上述技术方案本质上或者说对现有技术做出贡献的部分可以以软件产品的形式体现出来，该计算机软件产品可以存储在计算机可读存储介质中，所述计算机可读记录介质包括用于以计算机(例如计算机)可读的形式存储或传送信息的任何机制。例如，机器可读介质包括只读存储器(ROM)、随机存取存储器(RAM)、磁盘存储介质、光存储介质、闪速存储介质、电、光、声或其他形式的传播信号(例如，载波、红外信号、数字信号等)等，该计算机软件产品包括若干指令用以使得一台计算机设备(可以是个人计算机，服务器，或者网络设备等)执行各个实施例或者实施例的某些部分所述的方法。
最后应说明的是：以上实施例仅用以说明本发明实施例的技术方案，而非对其限制；尽管参照前述实施例对本发明实施例进行了详细的说明，本领域的普通技术人员应当理解：其依然可以对前述各实施例所记载的技术方案进行修改，或者对其中部分技术特征进行等同替换；而这些修改或者替换，并不使相应技术方案的本质脱离本发明各实施例技术方案的精神和范围。
Claims (16)
- 一种指纹芯片检测方法，包括：控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间；根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果。
- 根据权利要求1所述的方法，其中，所述测试指令包括以下指令至少之一：指示所述指纹芯片进行生物特征采集的采图指令、指示所述指纹芯片对所述生物特征进行识别的识别指令、指示所述指纹芯片上电的上电指令、指示所述指纹芯片断电的断电指令、指示所述指纹芯片休眠的休眠指令。
- 根据权利要求1或2所述的方法，其中，所述控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间的步骤包括：向所述指纹芯片发送所述测试指令，并获得测试结果；判断所述测试结果是否满足设定异常条件；若满足，则执行所述根据所述指纹芯片在测试结果达到设定异常条件时的运行参数，确定所述指纹芯片的检测结果的步骤；若不满足，则判断测试是否达到设定测试时间；若未达到所述设定测试时间，则返回所述向所述指纹芯片发送所述测试指令，并获得测试结果的步骤继续执行；否则，执行所述根据所述指纹芯片在测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果的步骤。
- 根据权利要求1-3任一项所述的方法，其中，所述运行参数包括：所述指纹芯片执行所述测试指令时，所述指纹芯片所在的终端设备中运行的寄存器的运行参数。
- 根据权利要求4所述的方法，其中，根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果的步骤包括：比较所述寄存器的运行参数与设定运行参数，根据比较结果确定所述指 纹芯片的检测结果。
- 根据权利要求1-4任一项所述的方法，其中，所述控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令的步骤包括：控制指纹芯片按照设定频率重复执行用于测试所述指纹芯片使用寿命的测试指令。
- 根据权利要求1-6任一项所述的方法，其中，根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果的步骤包括：根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，生成测试报告；根据所述测试报告确定所述指纹芯片的检测结果。
- 一种指纹芯片检测装置，包括：测试执行模块，用于控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间；结果确定模块，用于根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果。
- 根据权利要求8所述的装置，其中，所述测试指令包括以下指令至少之一：指示所述指纹芯片进行生物特征采集的采图指令、指示所述指纹芯片对所述生物特征进行识别的识别指令、指示所述指纹芯片上电的上电指令、指示所述指纹芯片断电的断电指令、指示所述指纹芯片休眠的休眠指令。
- 根据权利要求8或9所述的装置，其中，所述测试执行模块包括：指令发送模块，用于向所述指纹芯片发送所述测试指令，并获得测试结果；第一判断模块，用于判断所述测试结果是否满足设定异常条件；第一执行模块，用于若所述第一判断模块的判断结果为满足，则执行所述结果确定模块；第二判断模块，用于若所述第一判断模块的判断结果为不满足，则判断测试是否达到设定测试时间；第二执行模块，用于若所述第二判断模块的判断结果为未达到所述设定测试时间，则返回所述指令发送模块；否则，执行所述结果确定模块。
- 根据权利要求8-10任一项所述的装置，其中，所述运行参数包括：所述指纹芯片执行所述测试指令时，所述指纹芯片所在的终端设备中运行的寄存器的运行参数。
- 根据权利要求11所述的装置，其中，所述结果确定模块，用于比较所述寄存器的运行参数与设定运行参数，根据比较结果确定所述指纹芯片的检测结果。
- 根据权利要求8-12任一项所述的装置，其中，所述测试执行模块，用于控制指纹芯片按照设定频率重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间。
- 根据权利要求8-13任一项所述的装置，其中，所述结果确定模块包括：报告生成模块，用于根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，生成测试报告；报告结果模块，用于根据所述测试报告确定所述指纹芯片的检测结果。
- 一种指纹芯片检测系统，其特征在于，包括基础开发板、指纹芯片和适配器，其中所述基础开发板通过所述适配器连接到所述指纹芯片，所述基础开发板包括处理单元，所述处理单元用于执行如权利要求1-7中任一项所述的指纹芯片检测方法所对应的操作。
- 一种计算机存储介质，所述计算机可读存储介质存储有：用于控制指纹芯片重复执行用于测试所述指纹芯片使用寿命的测试指令，直至测试结果达到设定异常条件和/或测试达到设定测试时间的可执行指令；用于根据所述指纹芯片在测试结果达到设定异常条件或者测试达到设定测试时间时的运行参数，确定所述指纹芯片的检测结果的可执行指令。
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