WO2018211924A1 - 有機電子デバイスの製造方法 - Google Patents
有機電子デバイスの製造方法 Download PDFInfo
- Publication number
- WO2018211924A1 WO2018211924A1 PCT/JP2018/016642 JP2018016642W WO2018211924A1 WO 2018211924 A1 WO2018211924 A1 WO 2018211924A1 JP 2018016642 W JP2018016642 W JP 2018016642W WO 2018211924 A1 WO2018211924 A1 WO 2018211924A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sealing member
- protective film
- organic
- sealing
- substrate
- Prior art date
Links
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Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/02—Details
- H05B33/04—Sealing arrangements, e.g. against humidity
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/80—Constructional details
- H10K50/84—Passivation; Containers; Encapsulations
- H10K50/844—Encapsulations
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/811—Controlling the atmosphere during processing
Definitions
- the present invention relates to a method for manufacturing an organic electronic device.
- the organic electronic device has a device base material in which a first electrode, a device function part (including an organic layer), and a second electrode are provided in this order on a substrate, and a sealing member that seals the device function part.
- a sealing member for example, a member obtained by laminating an adhesive layer (resin composition layer) on a sealing substrate (support) as described in Patent Document 1 is known. Such a sealing member is bonded to the device substrate via an adhesive layer.
- a protective film is provided on the adhesive layer of the sealing member until the sealing member is bonded to the device substrate. Since the sealing member is for preventing deterioration of the organic layer of the device function unit due to moisture, it is preferable that the sealing member itself is also dehydrated.
- the sealing member provided with the protective film is dehydrated using infrared rays, and the ambient atmosphere of the sealing member with protective film being dehydrated is set to a predetermined dew point.
- the fact that it is set is disclosed.
- the sealing member with the protective film since water is discharged from the sealing member with the protective film when the sealing member with the protective film is dehydrated, the dew point of the ambient atmosphere of the sealing member with the protective film deteriorates from the predetermined dew point, and the protective film There is a possibility that moisture is hardly released from the attached sealing member. Therefore, there is a possibility that the sealing member with the protective film cannot be sufficiently dehydrated.
- the sealing member with the protective film may be deformed by, for example, bubbles generated due to the release of moisture from the adhesive layer.
- the present invention can suppress the deformation of the sealing member with the protective film due to the bubbles in the dehydrating step of the sealing member with the protective film, and can more reliably dehydrate the sealing member with the protective film. It aims at providing the manufacturing method of an organic electronic device.
- An organic electronic device manufacturing method includes a device base material that forms a device base material in which a first electrode, a device function unit including an organic layer, and a second electrode are sequentially provided on a substrate.
- the above-mentioned protection under a pressure of 1000 Pa or more while conveying the forming member and the sealing member with the protective film laminated with the protective film through the adhesive layer to the sealing member laminated with the adhesive layer on the sealing substrate.
- an atmospheric gas having a dew point of ⁇ 40 ° C. or lower is caused to flow from the downstream side to the upstream side in the transport direction of the sealing member with the protective film.
- an atmospheric gas having a dew point of ⁇ 40 ° C. or lower is allowed to flow from the downstream side to the upstream side in the conveying direction of the sealing member with the protective film. If dehydration is performed while transporting the sealing member with the protective film, moisture is released as the sealing member with the protective film is transported, so that the moisture content of the downstream sealing member with the protective film is lower. Therefore, if an atmospheric gas having a dew point of ⁇ 40 ° C. or lower is flowed from the downstream side to the upstream side, the moisture released from the sealing member with the protective film is surrounded around the sealing member with the protective film having a low moisture content. Atmospheric gas that is not affected by the flow.
- the dew point of the ambient atmosphere of the sealing member with the protective film that has undergone the dehydration step from the start of the dehydration step to the end of the sealing member bonding step is ⁇ 40 ° C. or less.
- the dehydrated state (water content) Etc.) can be bonded to the device substrate.
- the manufacturing method of the organic electronic device which concerns on one Embodiment conveys the said sealing member with a protective film toward the winding-up part after the said dehydration process, and the said sealing member with a protective film is conveyed in the said winding-up part.
- a winding process may be provided, and in the winding process, an atmospheric gas having a dew point of ⁇ 40 ° C. or lower may be flowed from the downstream side to the upstream side in the transport direction of the sealing member with the protective film.
- the sealing member with the protective film is dehydrated in a heating chamber, and in the winding step, the protection member is provided in a winding chamber provided at a stage subsequent to the heating chamber and having an atmosphere with a dew point of ⁇ 40 ° C. or lower. You may wind up the sealing member with a film.
- the deformation of the sealing member with the protective film due to bubbles can be suppressed, and the sealing member with the protective film can be more reliably dehydrated.
- a method for manufacturing an organic electronic device can be provided.
- FIG. 1 is a side view of a sealing member with a protective film according to an embodiment.
- FIG. 2 is a flowchart showing a method of manufacturing an organic EL device (organic electronic device) using the sealing member with a protective film shown in FIG.
- FIG. 3 is a cross-sectional view illustrating an example of a configuration of a device substrate included in an organic EL device to be manufactured.
- FIG. 4 is a drawing for explaining the preparation step shown in FIG.
- FIG. 5 is a drawing for explaining a sealing member bonding step in the method for manufacturing an organic EL device (organic electronic device).
- FIG. 1 is a side view of a sealing member 10 with a protective film used for manufacturing an organic EL device (organic electronic device) according to an embodiment.
- FIG. 1 schematically shows a configuration of a sealing member 10 with a protective film.
- the sealing member with a protective film 10 includes a sealing member 20 and a protective film 30.
- the sealing member 10 with the protective film may have a strip shape or a single wafer shape.
- the sealing member 10 with a protective film exhibits a strip shape.
- the sealing member 20 is a member for preventing deterioration of the organic layer included in the organic EL device.
- the sealing member 20 includes a sealing substrate 21, an adhesive layer 22, and a resin film 23.
- the sealing substrate 21 has a moisture barrier function.
- An example of the water permeability of the sealing substrate 21 is 5 ⁇ 10 ⁇ 5 g / (m 2 ⁇ 24 hr) or less in an environment of a temperature of 40 ° C. and a humidity of 90% RH.
- the sealing substrate 21 may have a gas barrier function.
- Examples of the sealing substrate 21 include a metal foil, a barrier film having a barrier functional layer formed on one side or both sides of a transparent plastic film, a thin film glass having flexibility, and a metal having a barrier property on the plastic film. Examples include laminated films.
- An example of the thickness of the sealing substrate 21 is 10 ⁇ m to 300 ⁇ m.
- the metal foil is preferably a copper foil, an aluminum foil, or a stainless steel foil from the viewpoint of barrier properties.
- the thickness of the metal foil is preferably as thick as possible from the viewpoint of suppressing pinholes, but is preferably 10 ⁇ m to 50 ⁇ m from the viewpoint of flexibility.
- the adhesive layer 22 is laminated on one surface of the sealing substrate 21.
- the adhesive layer 22 is a layer arranged to adhere at least two adjacent layers to each other.
- the adhesive layer 22 should just have the thickness which can embed the part which should be sealed with the sealing member 20 in an organic EL device.
- An example of the thickness of the adhesive layer 22 is 5 ⁇ m to 100 ⁇ m.
- Examples of the material of the adhesive layer 22 include a photocurable or thermosetting acrylate resin, a photocurable or thermosetting epoxy resin, and the like.
- Other commonly used resin films that can be fused with an impulse sealer such as ethylene vinyl acetate copolymer (EVA), polypropylene (PP) film, polyethylene (PE) film, polybutadiene film and the like as the adhesive layer 22 Can be used.
- EVA ethylene vinyl acetate copolymer
- PP polypropylene
- PE polyethylene
- polybutadiene film and the like can be used.
- a thermoplastic resin can also be used as the material of the adhesive layer 22, and examples thereof include olefin elastomers, styrene elastomers, and butadiene elastomers.
- the adhesive layer 22 may contain a hygroscopic agent.
- the hygroscopic agent is an agent that absorbs moisture, but may absorb oxygen or the like in addition to moisture.
- the moisture absorption rate of the hygroscopic agent is preferably 1 wt% / hr or more in an environment of a temperature of 24 ° C. and a humidity of 55% RH.
- the resin film 23 is laminated on the other surface of the sealing substrate 21 (the surface opposite to the surface in contact with the adhesive layer 22).
- Examples of the material of the resin film 23 include polyethylene terephthalate (PET) and polyimide (PI).
- PET polyethylene terephthalate
- PI polyimide
- FIG. 1 the sealing member 20 including the resin film 23 is illustrated, but the sealing member 20 does not include the resin film 23 as long as the sealing member 20 includes the sealing substrate 21 and the adhesive layer 22. Also good.
- the protective film 30 is laminated on the surface of the adhesive layer 22 opposite to the surface in contact with the sealing substrate 21. That is, the protective film 30 is laminated on the sealing member 20 via the adhesive layer 22.
- the protective film 30 is a member for preventing dust from adhering to the adhesive layer 22 and preventing the adhesive layer 22 from adhering to a later-described transport roll R until the organic EL device is manufactured.
- the protective film 30 may be a release film that can be peeled from the adhesive layer 22.
- Examples of the material of the protective film 30 include polyethylene naphthalate (PEN), PET, PP, PE, PI, cycloolefin polymer, cycloolefin copolymer, and the like.
- Examples of the thickness of the protective film 30 include 9 ⁇ m to 50 ⁇ m.
- a coating layer may be formed on the surface of the protective film 30 that contacts the adhesive layer 22.
- the material of the coating layer are a silicone resin release agent, a fluorine release agent, an alkyd release agent, an acrylic release agent, and the like.
- the manufacturing method of an organic EL device includes a device substrate forming step S10, a preparation step S20 for the sealing member 10 with a protective film, and a sealing member bonding step S30.
- the case where the organic EL device to be manufactured is a bottom emission type will be described.
- the organic EL device may be a top emission type.
- an anode (first electrode) 42, an organic EL part (device function part including an organic layer) 43, and a cathode (second electrode) 44 are formed on the substrate 41. Are sequentially laminated to form the device substrate 40.
- the device substrate 40 will be described.
- the substrate 41 is translucent to light (including visible light having a wavelength of 400 nm to 800 nm) emitted from the organic EL device to be manufactured.
- substrate 41 used for manufacture of an organic EL device exhibits strip
- An example of the thickness of the substrate 41 is 30 ⁇ m to 700 ⁇ m.
- the substrate 41 is preferably a flexible substrate.
- the flexibility is a property that allows the substrate to be bent without being sheared or broken even when a predetermined force is applied to the substrate.
- An example of the substrate 41 is a plastic film or a polymer film.
- the substrate 41 may further include a barrier layer having a moisture barrier function.
- the barrier layer may have a function of barriering gas (for example, oxygen) in addition to the function of barriering moisture.
- the anode 42 is provided on the substrate 41.
- an electrode having optical transparency is used.
- the electrode exhibiting light transmittance a thin film of metal oxide, metal sulfide, metal or the like having high electrical conductivity can be used, and a thin film having high light transmittance is preferably used.
- the anode 42 may have a network structure made of a conductor (for example, metal).
- the thickness of the anode 42 can be determined in consideration of light transmittance, electrical conductivity, and the like.
- the thickness of the anode 42 is usually 10 nm to 10 ⁇ m, preferably 20 nm to 1 ⁇ m, and more preferably 50 nm to 500 nm.
- Examples of the material of the anode 42 include indium oxide, zinc oxide, tin oxide, indium tin oxide (Indium Tin Oxide: abbreviated as ITO), indium zinc oxide (Indium Zinc Oxide: abbreviated as IZO), gold, platinum, silver, and copper. Among these, ITO, IZO, or tin oxide is preferable.
- the anode 42 can be formed as a thin film made of the exemplified materials.
- organic substances such as polyaniline and derivatives thereof, polythiophene and derivatives thereof may be used. In this case, the anode 42 can be formed as a transparent conductive film.
- the anode 42 can be formed by a dry film forming method, a plating method, a coating method, or the like.
- the dry film forming method include a vacuum deposition method, a sputtering method, an ion plating method, and a CVD method.
- the coating method for example, inkjet printing method, slit coating method, micro gravure coating method, gravure coating method, bar coating method, roll coating method, wire bar coating method, spray coating method, screen printing method, flexographic printing method, offset Examples thereof include a printing method and a nozzle printing method, and among these, an inkjet printing method is preferable.
- the organic EL unit 43 is a functional unit that contributes to light emission of the organic EL device such as charge transfer and charge recombination according to the voltage applied to the anode 42 and the cathode 44.
- the organic EL unit 43 has an organic layer such as a light emitting layer.
- the light emitting layer is a functional layer having a function of emitting light (including visible light).
- the light emitting layer is usually composed of an organic substance that mainly emits at least one of fluorescence and phosphorescence, or an organic substance and a dopant material that assists the organic substance. Therefore, the light emitting layer is an organic layer.
- the dopant material is added, for example, in order to improve the light emission efficiency or change the light emission wavelength.
- the organic substance may be a low molecular compound or a high molecular compound.
- the thickness of the light emitting layer is, for example, 2 nm to 200 nm.
- dye-based materials include cyclopentamine derivatives, tetraphenylbutadiene derivative compounds, triphenylamine derivatives, oxadiazole derivatives, pyrazoloquinoline derivatives, distyrylbenzene derivatives, distyrylarylene derivatives, pyrrole derivatives, thiophene ring compounds. Pyridine ring compounds, perinone derivatives, perylene derivatives, oligothiophene derivatives, oxadiazole dimers, pyrazoline dimers, quinacridone derivatives, coumarin derivatives, and the like.
- Metal complex materials examples include rare earth metals such as Tb, Eu, and Dy, or Al, Zn, Be, Ir, Pt, and the like as a central metal, and oxadiazole, thiadiazole, phenylpyridine, phenylbenzimidazole, and quinoline.
- Examples include metal complexes having a structure as a ligand, such as iridium complexes, metal complexes having a light emission from a triplet excited state such as platinum complexes, aluminum quinolinol complexes, benzoquinolinol beryllium complexes, benzoxazolyl zinc complexes, Examples include benzothiazole zinc complex, azomethyl zinc complex, porphyrin zinc complex, phenanthroline europium complex and the like.
- Polymer material As polymer materials, polyparaphenylene vinylene derivatives, polythiophene derivatives, polyparaphenylene derivatives, polysilane derivatives, polyacetylene derivatives, polyfluorene derivatives, polyvinyl carbazole derivatives, the above dye materials and metal complex light emitting materials are polymerized. Things.
- Dopant material examples include perylene derivatives, coumarin derivatives, rubrene derivatives, quinacridone derivatives, squalium derivatives, porphyrin derivatives, styryl dyes, tetracene derivatives, pyrazolone derivatives, decacyclene, phenoxazone, and the like.
- the light emitting layer can be formed by a dry film forming method, a coating method, or the like. Examples of the dry film forming method and the coating method are the same as those of the anode 42.
- the light emitting layer is preferably formed by an ink jet printing method.
- the organic EL unit 43 may have various functional layers in addition to the light emitting layer.
- Examples of the functional layer disposed between the anode 42 and the light emitting layer are a hole injection layer and a hole transport layer.
- Examples of the functional layer disposed between the cathode 44 and the light emitting layer are an electron injection layer and an electron transport layer.
- the electron injection layer may be a part of the cathode 44.
- These functional layers may be organic layers containing organic substances.
- An example of the layer configuration of the organic EL unit 43 is shown below.
- the anode and the cathode are also shown in parentheses in order to show the positional relationship between the anode 42, the cathode 44, and various functional layers.
- the hole injection layer is a functional layer having a function of improving the hole injection efficiency from the anode to the light emitting layer.
- the hole transport layer is a functional layer having a function of improving the hole injection efficiency from the portion closer to the anode to the light emitting layer among the anode, the hole injection layer, or the hole transport layer.
- An electron carrying layer is a functional layer which has a function which improves the electron injection efficiency to the light emitting layer from the part nearer to a cathode among a cathode, an electron injection layer, or an electron carrying layer.
- the electron injection layer is a functional layer having a function of improving the electron injection efficiency from the cathode to the light emitting layer.
- a known material can be used as a material of a functional layer (for example, a hole injection layer, a hole transport layer, an electron injection layer, an electron transport layer, etc.) other than the light emitting layer of the organic EL unit 43.
- the thickness of the functional layer included in the organic EL unit 43 varies depending on the material used, and is set in consideration of electrical conductivity, durability, and the like.
- Functional layers other than the light emitting layer included in the organic EL portion 43 can also be formed by the same method as that for the light emitting layer.
- the cathode 44 is provided on the organic EL unit 43.
- the thickness of the cathode 44 varies depending on the material used, and is set in consideration of electrical conductivity, durability, and the like.
- the thickness of the cathode 44 is usually 10 nm to 10 ⁇ m, preferably 20 nm to 1 ⁇ m, and more preferably 50 nm to 500 nm.
- the material of the cathode 44 is from the light emitting layer of the organic EL unit 43 so that light from the organic EL unit 43 (specifically, light from the light emitting layer) is reflected by the cathode 44 and travels to the anode 42 side.
- a material having a high reflectance with respect to light (particularly visible light) is preferable.
- the material of the cathode 44 include alkali metals, alkaline earth metals, transition metals, and Group 13 metals of the periodic table.
- a transparent conductive electrode made of a conductive metal oxide, a conductive organic material, or the like may be used as the cathode 44.
- Examples of the method for forming the cathode 44 include an inkjet method, a slit coater method, a gravure printing method, a screen printing method, a spray coating method, and other coating methods, a vacuum deposition method, a sputtering method, and a laminating method for thermocompression bonding a metal thin film. Can be mentioned.
- the anode 42 and the organic EL are respectively formed on a plurality of device formation regions virtually set on the substrate 41 while the belt-like substrate 41 is conveyed in the longitudinal direction by a roll-to-roll method.
- the device substrate 40 is formed by sequentially laminating the portion 43 and the cathode 44.
- the anode 42, the organic EL part 43, and the cathode 44 can be formed by the method described above.
- each layer may be formed in order from the anode 42 side.
- preparatory process S20 (henceforth preparatory process S20) of sealing member 10 with a protective film
- sealing member 10 with a protective film is spin-dry
- the preparation process S20 includes an unwinding process S21, a dehydrating process S22, and a winding process S23.
- FIG. 4 is a drawing for explaining the preparation step S20 for a sealing member with a protective film.
- the sealing member 10 with a protective film is schematically shown by a thick solid line.
- the resin film 23 may contact the conveyance roll R.
- unwinding process In unwinding process S21, as shown in FIG. 4, after setting sealing member 10 with a protective film in roll form to unwinding part 61 arranged in unwinding room 51, sealing member 10 with a protective film Unwind.
- the unrolled sealing member 10 with the protective film is transported to the heating chamber 52 by the transport roll R.
- the unwinding chamber 51 and the heating chamber 52 may be connected by a connecting portion 54 or may be directly connected.
- dehydration heat dehydration
- dehydration is performed by heating the sealing member 10 with the protective film conveyed from the unwind chamber 51 with infrared rays while being conveyed by the conveyance roll R.
- the sealing member 10 with the protective film is heated and dehydrated by irradiating the sealing member 10 with the protective film with infrared rays from the infrared irradiation unit 56 disposed on the conveyance path of the sealing member 10 with the protective film.
- the infrared irradiation unit 56 only needs to have a configuration capable of outputting infrared rays used for heat dehydration.
- An example of the infrared irradiation unit 56 is an infrared heater.
- the infrared irradiation part 56 may be arrange
- the infrared ray irradiated to the sealing member 10 with a protective film is preferably a mid-infrared ray (wavelength of 1.8 ⁇ m to 3.0 ⁇ m) including an absorption wavelength of water in order to efficiently heat and dehydrate the sealing member 10 with a protective film.
- the heating temperature (surface temperature of the sealing member 10 with a protective film) and the heating time during the dehydration step S22 are adjusted according to the member used in the sealing member 10 with a protective film.
- the inside of the heating chamber 52 is dehydrated by heating the sealing member 10 with the protective film under a pressure of 1000 Pa or more.
- Atmospheric gas G1 is flowed.
- an atmosphere gas G ⁇ b> 1 supply port 52 a is provided on the winding chamber 53 side described later, and the atmosphere gas G ⁇ b> 1 exhaust port 52 b is provided on the unwind chamber 51 side.
- the atmosphere gas G1 is a gas for creating an atmosphere (environment) for performing the dehydration step S22.
- the atmospheric gas G1 include dry air, nitrogen, and argon.
- the protective film-equipped sealing member 10 that has been heat-dehydrated in the heating chamber 52 is wound in a roll shape by the winding portion 62 in the winding chamber 53 that is provided at the subsequent stage of the heating chamber 52.
- the protective film-equipped sealing member 10 transported from the heating chamber 52 is transported toward the winding portion 62 by the transport roll R.
- the heating chamber 52 and the winding chamber 53 may be connected by a connecting portion 55, or they may be directly connected.
- the winding step S23 is performed by adjusting the dew point of the ambient atmosphere of the sealing member 10 with the protective film to ⁇ 40 ° C. or lower.
- the ambient atmosphere of the sealing member 10 with the protective film is preferably a dew point of ⁇ 70 ° C. or less.
- a dew point of ⁇ 40 ° C. or less (preferably a dew point of ⁇ 70) from the downstream side (winding portion 62 side) to the upstream side (opposite side of the winding portion 62 in the transport direction) in the transport direction of the sealing member 10 with the protective film.
- the winding step S23 may be performed while flowing the atmospheric gas G2 at a temperature equal to or lower than 0.degree.
- the atmosphere gas G ⁇ b> 2 flows as described above by providing an air supply port 53 a for the atmospheric gas G ⁇ b> 2 on the winding portion 62 side, and the inlet of the sealing member 10 with the protective film from the heating chamber 52.
- This can be realized by providing an exhaust port 53b on the side.
- An example of the atmospheric gas G2 is the same as that of the atmospheric gas G1.
- the atmospheric gases G1, G2 can be the same gas.
- the winding step S23 is preferably performed under higher pressure conditions than the dehydration step S22, that is, under a pressure exceeding 1000 Pa.
- the sealing member 10 with the protective film wound up in a roll shape is stored in an atmosphere having a dew point of ⁇ 40 ° C. or lower, preferably a dew point of ⁇ 70 ° C. or lower, and the next sealing member
- the sealing member with the protective film up to the unwinding chamber where the unwinding part of the sealing member 10 with the protective film for carrying out the bonding step S30, specifically the sealing member bonding step S30 for carrying out the sealing member bonding step S30 is arranged.
- the sealing member 10 with a roll-shaped protective film may be accommodated in a sealed container in which the atmosphere is maintained, and the sealed container may be transported to the place where the sealing member bonding step S30 is performed.
- the organic EL device manufacturing method includes sealing with a protective film in an atmosphere having a dew point of ⁇ 40 ° C. or lower, preferably a dew point of ⁇ 70 ° C. or lower, between the winding step S23 and the sealing member bonding step S30. It may have a transporting process (or storing process) for transporting the member 10 while storing it.
- sealing member bonding process S30 the protective film 30 is peeled from the sealing member 10 with a protective film that has undergone the dehydration process S22, and the sealing member 20 is attached to the device base via the adhesive layer 22 as shown in FIG. By bonding to the material 40, an organic EL device is obtained.
- Sealing member bonding process S30 may be implemented by a roll-to-roll system, conveying the sealing member 10 with a protective film, and the device base material 40 to a longitudinal direction, respectively.
- the heat-dehydrated roll-shaped sealing member 10 with the protective film is set in the unwinding portion disposed in the unwinding chamber of the sealing member 10 with the protective film for the sealing member bonding step S30.
- the unwinding chamber is preferably an atmosphere having a dew point of ⁇ 40 ° C. or lower, more preferably a dew point of ⁇ 70 ° C. or lower.
- the sealing member 20 obtained by peeling the protective film 30 from the sealing member 10 with the protective film is continuously bonded to the device substrate 40 being transported in the longitudinal direction while being transported in the longitudinal direction. .
- the thickness of the sealing member 20 and the device substrate 40 in the state where the adhesive layer 22 of the sealing member 20 is opposed to the device substrate 40 as shown in FIG. The sealing member 20 is bonded to the device substrate 40 by pressing and heating in the direction.
- the device base material 40 transported in the longitudinal direction may be the device base material 40 that has been transported continuously after the formation of the cathode 44 in the device base material formation step S10, or the cathode 44 is formed. After the device substrate 40 once wound in a roll shape is set in the unwinding part 61 for the device substrate 40, the device substrate 40 unwound may be used.
- sealing member bonding process S30 is implemented on the conditions whose dew point of the surrounding atmosphere of the sealing member 10 with a protective film is -40 degrees C or less.
- the device base material 40 is schematically illustrated in a simplified manner.
- the anode 42 and the cathode 44 are each a sealing member so that a voltage can be applied to the anode 42 and the cathode 44.
- a part of each of the anode 42 and the cathode 44 can be extracted from the anode 20.
- an electrode part that is provided corresponding to each of the anode 42 and the cathode 44 and a part of which is disposed outside the sealing member 20 is formed on the substrate 41, and the anode 42 and the cathode 44 are You may form so that it may electrically connect with a corresponding electrode part.
- the organic EL device is formed for every device formation area by passing sealing member bonding process S30. Therefore, the manufacturing method of an organic EL device may include a singulation step of dividing the substrate 41 that has undergone the sealing member bonding step S30 into each device formation region. In the individualization step, the substrate 41 is divided for each device formation region, so that an organic EL device having a product size can be obtained.
- the sealing member 20 can be bonded to the device substrate 40 by removing moisture from the sealing member 20. Therefore, good sealing performance can be realized, and deterioration due to moisture of the organic layer in the organic EL device can be suppressed.
- dehydration step S22 since the moisture in the sealing member 10 with the protective film is directly heated using infrared rays, the heat dehydration can be performed efficiently. Furthermore, dehydration process S22 is easy to implement, conveying the sealing member 10 with a protective film by utilizing infrared rays. Therefore, the time required for the dehydration step S22 can be shortened, and as a result, the productivity of the organic EL device can be improved.
- the sealing member 10 with the protective film is heated and dehydrated, moisture is released from the sealing member 10 with the protective film into the heating chamber 52.
- the present inventors have found that the dew point in the heating chamber 52 is deteriorated from the initially assumed dew point due to the released moisture, and the sealing member 10 with the protective film may not be dehydrated to a desired moisture content.
- the sealing substrate 21 does not contain moisture in the sealing member 10 with the protective film.
- the volume of the moisture-containing portion in the sealing member 10 with the protective film corresponds to the total volume of the protective film 30, the adhesive layer 22, and the resin film 23.
- the thickness of the protective film 30 is 12 ⁇ m
- the thickness of the adhesive layer 22 is 30 ⁇ m
- the thickness of the resin film 23 is 38 ⁇ m
- the thickness of the moisture-containing portion is 80 ⁇ m. Therefore, when the length of the sealing member 10 with the protective film is 25 m and the width is 600 mm, the volume of the moisture-containing portion is 1.2.
- the protective film with a sealing member containing the maximum amount of discharged water, the initial dew point is set at -70 ° C. (vapor density 0.0028 g / m 3), and heated and dehydrated at the heating chamber 52 having a volume of 6 m 3 Assuming that, the dew point worsens to at least ⁇ 24 ° C. (vapor density: 0.6 g / m 3 ).
- the sealing member 10 with the protective film is heated and dehydrated while being transported in the heating chamber 52, for example, the dew point is deteriorated on the downstream side in the transport direction. In this case, it becomes difficult for moisture to be released from the sealing member 10 with the protective film on the downstream side of the heating chamber 52, and as a result, there is a possibility that dehydration cannot be achieved to a desired moisture content.
- the atmospheric gas G1 having a dew point of ⁇ 40 ° C. or less is introduced from the downstream side in the transport direction of the sealing member 10 with the protective film, and the upstream It is flowing toward the side. If it dehydrates, conveying the sealing member 10 with a protective film, a water
- the atmospheric gas G1 that is not affected by the released moisture flows around the sealing member 10 with the protective film having a low moisture content. Furthermore, the moisture released from the sealing member 10 with the protective film flows and is discharged to the upstream side according to the flow of the atmospheric gas G1. As a result, since the sealing member 10 with the protective film can be dehydrated while reducing the influence of moisture released from the sealing member 10 with the protective film, the sealing with the protective film having a desired moisture content can be efficiently performed in the dehydration step S22. The stop member 10 is obtained.
- the ambient atmosphere of the sealing member 10 with the protective film is adjusted to a dew point of ⁇ 40 ° C. or lower from the start of the dehydration step S22 to the end of the sealing member bonding step S30. Yes.
- the deterioration of the moisture content of the sealing member 10 with the protective film dehydrated in the dehydration step S22 can be prevented, and the sealing member 20 having the content dehydrated in the dehydration step S22 can be bonded to the device substrate 40.
- the organic EL device for example, moisture permeation from the sealing member 20 into the organic layer is suppressed, and good sealing performance can be realized.
- the ambient atmosphere of the sealing member 10 with the protective film is adjusted to, for example, a dew point of ⁇ 40 ° C. or lower (preferably a dew point of ⁇ 70 ° C. or lower) in the winding step S23, the sealing with the protective film is performed in the winding step S23. Deterioration of the moisture content of the member 10 can be prevented. Also in the winding step S23, if an atmospheric gas G2 having a dew point of ⁇ 40 ° C. or less (preferably, a dew point of ⁇ 70 ° C. or less) is flowed from the downstream side to the upstream side in the conveying direction of the sealing member 10 with the protective film, dehydration is performed. It is easy to maintain the moisture content of the sealing member 10 with the protective film wound in a roll shape at a desired moisture content.
- a dew point of ⁇ 40 ° C. or lower preferably a dew point of ⁇ 70 ° C. or lower
- the sealing member 10 with the protective film is heated and dehydrated.
- the protective film 30 is laminated
- bubbles are generated, for example, deformation of the sealing member with a protective film 10 such as deformation of the sealing substrate 21 and peeling of the protective film 30 is likely to occur due to the bubbles.
- the dehydration step S22 is performed under a pressure of 1000 Pa or more. Under such pressure, moisture is released without forming the bubbles. Therefore, the manufacturing method of the organic EL device can prevent deformation of the sealing member 10 with the protective film such as deformation of the sealing substrate 21 due to bubbles and peeling of the protective film 30 from the adhesive layer 22 in the dehydration step S22. . Since deformation of the sealing substrate 21 in the dehydration step S22 is suppressed, when the sealing member 20 is bonded to the device substrate 40, the organic EL portion 43 is reliably sealed, and good sealing performance Can be realized.
- the upper limit of the pressure in the heating chamber 52 in the dehydration step S22 may be a pressure at which moisture can be released from the sealing member 10 with the protective film.
- the upper limit of the pressure in the heating chamber 52 is less than the saturated water vapor pressure at the surface temperature of the sealing member 10 with the protective film.
- Example 1 the sealing member 10 with a protective film cut out to 10 cm square was prepared.
- the sealing member with a protective film 10 was provided with a sealing substrate 21, an adhesive layer 22, and a protective film 30. Specifically, the adhesive layer 22 was laminated on the sealing substrate 21, and the protective film 30 was further laminated on the adhesive layer 22.
- the sealing substrate 21 was a 35 ⁇ m thick copper foil (CF-T8G-STD-35 manufactured by Fukuda Metal Foil Powder Co., Ltd.).
- the adhesive layer 22 was 30 ⁇ m thick.
- PET25TP01 manufactured by Panac Co., Ltd. was used, and the thickness of the protective film 30 was 25 ⁇ m.
- the prepared sealing member 10 with protective film was irradiated with infrared rays under atmospheric pressure in a heating furnace (heating chamber), and the sealing member 10 with protective film was heated and dehydrated at a temperature of 160 ° C. As a result, no bubbles were observed between the protective film 30 and the adhesive layer 22 during heat dehydration.
- Example 2 In Experimental Example 2, the same sealing member 10 with a protective film as in Experimental Example 1 was prepared. The sealing member 10 with the protective film was heat dehydrated under the same conditions as in Experimental Example 1 except that the pressure in the heating furnace (heating chamber) was reduced to 1000 Pa. As a result, no bubbles were observed between the protective film 30 and the adhesive layer 22 during heat dehydration.
- Comparative Experiment Example 1 In Comparative Experimental Example 1, the same sealing member 10 with a protective film as in Experimental Example 1 was prepared. The sealing member 10 with the protective film was heated and dehydrated under the same conditions as in Experimental Example 1 except that the pressure in the heating furnace (heating chamber) was reduced to 1 ⁇ 10 ⁇ 5 Pa. As a result, bubbles were generated between the protective film 30 and the adhesive layer 22 during heat dehydration.
- Example 3 In Example 3, the same sealing member 10 with the protective film as in Experimental Example 1 was heated and dehydrated under the same conditions as in Experimental Example 1. As a result, as in Experimental Example 1, generation of bubbles was not observed between the protective film 30 and the adhesive layer 22 during heat dehydration.
- the sealing member 10 with the protective film that had been heat-dehydrated as described above was left to stand in an atmosphere with a dew point of ⁇ 70 ° C. for 1 hour and stored. Then, the sealing member 20 (laminated body of the sealing base material 21 and the contact bonding layer 22) obtained by peeling the protective film 30 was bonded to the device base material 40, and the light emission test was done. As a result, there were few dark spots (non-light-emitting part), and favorable sealing performance was obtained.
- the configuration of the organic EL unit 43 included in the device substrate 40 used in Experimental Example 1 was the configuration example (g).
- Example 4 In Experimental Example 4, the same sealing member 10 with a protective film as in Experimental Example 1 was prepared. This sealing member 10 with a protective film was dehydrated by heating under the same conditions as in Experimental Example 2. As a result, as in Experimental Example 2, no bubbles were observed between the protective film 30 and the adhesive layer 22 during heat dehydration.
- the sealing member 10 with the protective film that had been heat-dehydrated as described above was left to stand for 1 hour in an atmosphere with a dew point of ⁇ 70 ° C. and stored. Then, the same sealing member 20 as Experimental Example 1 obtained by peeling off the protective film 30 was bonded to the device substrate 40, and a light emission test was performed. As a result, there were few dark spots (non-light-emitting part), and favorable sealing performance was obtained.
- the configuration of the device substrate 40 was the same as in Experimental Example 1.
- the sealing member with the protective film may be in a sheet shape.
- the device base material (or the substrate included in the device base material) may be a single wafer.
- the air supply port and the exhaust port may not be provided in each of the heating chamber for performing the dehydration process and the winding chamber for performing the winding process.
- an air supply port may be provided on the winding side in the processing chamber and an exhaust port may be provided on the unwinding side in the processing chamber.
- An unwinding step may also be performed in the processing chamber.
- the preparation process of the sealing member with a protective film including the unwinding process and the winding process has been described.
- the preparation process of the sealing member with the protective film may not include at least one of the unwinding process and the winding process.
- the method of dehydrating the sealing member with the protective film is not limited to the method using infrared rays.
- the sealing member bonding step may be performed continuously while continuously transporting the dehydrated sealing film-attached sealing member.
- the transport path of the sealing member with the protective film from the dehydration step to the sealing member with the protective film may be set to an atmosphere with a dew point of ⁇ 40 ° C.
- the organic EL device manufactured by the method for manufacturing an organic EL device is not limited to a form that emits light from the substrate side, and can also be applied to an organic EL device that emits light from the opposite side of the substrate.
- the first electrode and the second electrode of the device substrate are the anode and the cathode
- the first electrode may be a cathode
- the second electrode may be an anode.
- the present invention is also applicable to organic electronic devices other than organic EL devices, such as organic solar cells, organic photodetectors, and organic transistors.
- SYMBOLS 10 Sealing member with protective film, 20 ... Sealing member, 21 ... Sealing base material, 22 ... Adhesive layer, 23 ... Resin film, 30 ... Protective film, 40 ... Device base material, 41 ... Substrate, 42 ... Anode (1st electrode), 43 ... Organic EL part (device function part), 44 ... Cathode (2nd electrode), 52 ... Heating chamber, 53 ... Winding chamber, 56 ... Infrared irradiation part, G1, G2 ... Atmospheric gas.
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Abstract
Description
デバイス基材形成工程S10では、図3に示したように、基板41上に、陽極(第1電極)42、有機EL部(有機層を含むデバイス機能部)43及び陰極(第2電極)44を順に積層することによってデバイス基材40を形成する。デバイス基材40を説明する。
基板41は、製造する有機ELデバイスが出射する光(波長400nm~800nmの可視光を含む)に対して透光性を有する。本実施形態において、有機ELデバイスの製造に使用する基板41は帯状を呈する。基板41の厚さの例は、30μm~700μmである。
陽極42は、基板41上に設けられている。陽極42には、光透過性を示す電極が用いられる。光透過性を示す電極としては、電気伝導度の高い金属酸化物、金属硫化物及び金属等の薄膜を用いることができ、光透過率の高い薄膜が好適に用いられる。陽極42は、導電体(例えば金属)からなるネットワーク構造を有してもよい。陽極42の厚さは、光の透過性、電気伝導度等を考慮して決定され得る。陽極42の厚さは、通常、10nm~10μmであり、好ましくは20nm~1μmであり、さらに好ましくは50nm~500nmである。
有機EL部43は、陽極42及び陰極44に印加された電圧に応じて、電荷の移動及び電荷の再結合などの有機ELデバイスの発光に寄与する機能部である。有機EL部43は、発光層等の有機層を有する。
色素系材料としては、例えば、シクロペンダミン誘導体、テトラフェニルブタジエン誘導体化合物、トリフェニルアミン誘導体、オキサジアゾール誘導体、ピラゾロキノリン誘導体、ジスチリルベンゼン誘導体、ジスチリルアリーレン誘導体、ピロール誘導体、チオフェン環化合物、ピリジン環化合物、ペリノン誘導体、ペリレン誘導体、オリゴチオフェン誘導体、オキサジアゾールダイマー、ピラゾリンダイマー、キナクリドン誘導体、クマリン誘導体などが挙げられる。
金属錯体系材料としては、例えばTb、Eu、Dyなどの希土類金属、又はAl、Zn、Be、Ir、Ptなどを中心金属に有し、オキサジアゾール、チアジアゾール、フェニルピリジン、フェニルベンゾイミダゾール、キノリン構造などを配位子に有する金属錯体が挙げられ、例えばイリジウム錯体、白金錯体などの三重項励起状態からの発光を有する金属錯体、アルミニウムキノリノール錯体、ベンゾキノリノールベリリウム錯体、ベンゾオキサゾリル亜鉛錯体、ベンゾチアゾール亜鉛錯体、アゾメチル亜鉛錯体、ポルフィリン亜鉛錯体、フェナントロリンユーロピウム錯体などが挙げられる。
高分子系材料としては、ポリパラフェニレンビニレン誘導体、ポリチオフェン誘導体、ポリパラフェニレン誘導体、ポリシラン誘導体、ポリアセチレン誘導体、ポリフルオレン誘導体、ポリビニルカルバゾール誘導体、上記色素系材料や金属錯体系発光材料を高分子化したものなどが挙げられる。
ドーパント材料としては、例えばペリレン誘導体、クマリン誘導体、ルブレン誘導体、キナクリドン誘導体、スクアリウム誘導体、ポルフィリン誘導体、スチリル系色素、テトラセン誘導体、ピラゾロン誘導体、デカシクレン、フェノキサゾンなどが挙げられる。
(a)(陽極)/発光層/(陰極)
(b)(陽極)/正孔注入層/発光層/(陰極)
(c)(陽極)/正孔注入層/発光層/電子注入層/(陰極)
(d)(陽極)/正孔注入層/発光層/電子輸送層/電子注入層/(陰極)
(e)(陽極)/正孔注入層/正孔輸送層/発光層/(陰極)
(f)(陽極)/正孔注入層/正孔輸送層/発光層/電子注入層/(陰極)
(g)(陽極)/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/(陰極)
(h)(陽極)/発光層/電子注入層/(陰極)
(i)(陽極)/発光層/電子輸送層/電子注入層/(陰極)
記号「/」は、記号「/」の両側の層同士が接合していることを意味している。
陰極44は、有機EL部43上に設けられている。陰極44の厚さは、用いる材料によって最適値が異なり、電気伝導度、耐久性等を考慮して設定される。陰極44の厚さは、通常、10nm~10μmであり、好ましくは20nm~1μmであり、さらに好ましくは50nm~500nmである。
保護フィルム付き封止部材10の準備工程S20(以下、準備工程S20と称する)では、ロールツーロール方式で、保護フィルム付き封止部材10を脱水する。図2に示したように、準備工程S20は、巻出し工程S21と、脱水工程S22と、巻取り工程S23とを有する。
巻出し工程S21では、図4に示したように、巻出し室51内に配置された巻出し部61にロール状の保護フィルム付き封止部材10をセットした後、保護フィルム付き封止部材10を巻き出す。巻き出された保護フィルム付き封止部材10は、搬送ロールRで加熱室52に搬送される。巻出し室51と加熱室52とは連結部54で連結されていてもよいし、直接連結されていてもよい。
脱水工程S22では、巻出し室51から搬送されてきた保護フィルム付き封止部材10を搬送ロールRで搬送しながら赤外線で加熱することで脱水(加熱脱水)する。具体的には、保護フィルム付き封止部材10の搬送経路上に配置された赤外線照射部56から保護フィルム付き封止部材10に赤外線を照射して保護フィルム付き封止部材10を加熱脱水する。
巻取り工程S23では、加熱室52で加熱脱水された保護フィルム付き封止部材10を、加熱室52の後段に設けられた巻取り室53内の巻取り部62でロール状に巻き取る。巻取り室53内では、加熱室52から搬送されてきた保護フィルム付き封止部材10を搬送ロールRで巻取り部62に向けて搬送する。加熱室52と巻取り室53とは連結部55で連結されてもよいし、それらが直接連結されていてもよい。
封止部材貼合工程S30では、脱水工程S22を経た保護フィルム付き封止部材10から保護フィルム30を剥離し、図5に示したように、接着層22を介して封止部材20をデバイス基材40に貼合することによって、有機ELデバイスを得る。封止部材貼合工程S30は、保護フィルム付き封止部材10及びデバイス基材40をそれぞれ長手方向に搬送しながらロールツーロール方式で実施され得る。
実施例1では、10cm角に切り出した保護フィルム付き封止部材10を準備した。保護フィルム付き封止部材10は、封止基材21と、接着層22と、保護フィルム30とを備えていた。具体的には、封止基材21上に接着層22が積層され、その接着層22上に更に保護フィルム30が積層されていた。
実験例2では、実験例1と同じ保護フィルム付き封止部材10を準備した。この保護フィルム付き封止部材10を、加熱炉(加熱室)内の圧力を1000Paに減圧した点以外は、実験例1と同じ条件で、加熱脱水した。その結果、加熱脱水時に、保護フィルム30と接着層22との間に気泡の発生は見られなかった。
比較実験例1では、実験例1と同じ保護フィルム付き封止部材10を準備した。この保護フィルム付き封止部材10を、加熱炉(加熱室)内を1×10―5Paに減圧した点以外は、実験例1と同じ条件で、加熱脱水した。その結果、加熱脱水時に、保護フィルム30と接着層22との間に気泡が発生した。
実施例3では、実験例1と同じ保護フィルム付き封止部材10を、実験例1と同じ条件で加熱脱水した。その結果、実験例1と同様に、加熱脱水時に、保護フィルム30と接着層22との間に気泡の発生は見られなかった。
実験例4では、実験例1と同じ保護フィルム付き封止部材10を準備した。この保護フィルム付き封止部材10を、実験例2と同じ条件で、加熱脱水した。その結果、実験例2と同様に、加熱脱水時に、保護フィルム30と接着層22との間に気泡の発生は見られなかった。
Claims (4)
- 基板上に第1電極と、有機層を含むデバイス機能部と、第2電極とが順に設けられたデバイス基材を形成するデバイス基材形成工程と、
封止基材に接着層が積層された封止部材に前記接着層を介して保護フィルムが積層された保護フィルム付き封止部材を搬送しながら、1000Pa以上の圧力下で前記保護フィルム付き封止部材を脱水する脱水工程と、
前記脱水工程を経た前記保護フィルム付き封止部材から前記保護フィルムを剥離して、前記接着層を介して前記封止部材を前記デバイス基材に貼合する封止部材貼合工程と、
を備え、
前記脱水工程では、前記保護フィルム付き封止部材の搬送方向において下流側から上流側に、露点-40℃以下の雰囲気ガスを流す、
有機電子デバイスの製造方法。 - 前記脱水工程開始から前記封止部材貼合工程終了までの間における前記脱水工程を経た前記保護フィルム付き封止部材の周囲雰囲気の露点が-40℃以下である、
請求項1に記載の有機電子デバイスの製造方法。 - 前記脱水工程の後に、巻取り部に向けて前記保護フィルム付き封止部材を搬送し、前記巻取り部で、前記保護フィルム付き封止部材を巻き取る巻取り工程を備え、前記巻取り工程では、前記保護フィルム付き封止部材の搬送方向において下流側から上流側に向けて露点-40℃以下の雰囲気ガスを流す、
請求項1又は2に記載の有機電子デバイスの製造方法。 - 前記脱水工程では、前記保護フィルム付き封止部材を加熱室内で脱水し、
前記巻取り工程では、前記加熱室の後段に設けられており露点-40℃以下の雰囲気の巻取り室内で、前記保護フィルム付き封止部材を巻き取る、
請求項3に記載の有機電子デバイスの製造方法。
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