WO2018192198A1 - 一种显示面板 - Google Patents

一种显示面板 Download PDF

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Publication number
WO2018192198A1
WO2018192198A1 PCT/CN2017/106314 CN2017106314W WO2018192198A1 WO 2018192198 A1 WO2018192198 A1 WO 2018192198A1 CN 2017106314 W CN2017106314 W CN 2017106314W WO 2018192198 A1 WO2018192198 A1 WO 2018192198A1
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WO
WIPO (PCT)
Prior art keywords
active switch
display panel
line
unit
disposed
Prior art date
Application number
PCT/CN2017/106314
Other languages
English (en)
French (fr)
Inventor
陈猷仁
Original Assignee
惠科股份有限公司
重庆惠科金渝光电科技有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 惠科股份有限公司, 重庆惠科金渝光电科技有限公司 filed Critical 惠科股份有限公司
Priority to US15/855,714 priority Critical patent/US10288913B2/en
Publication of WO2018192198A1 publication Critical patent/WO2018192198A1/zh

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    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13452—Conductors connecting driver circuitry and terminals of panels

Definitions

  • the present application relates to the field of display technology, and more particularly to a display panel.
  • the liquid crystal display has many advantages such as thin body, power saving, no radiation, and has been widely used.
  • Most of the liquid crystal displays on the market are backlight type liquid crystal displays, which include a liquid crystal panel and a backlight module.
  • the working principle of the liquid crystal panel is to place liquid crystal molecules in two parallel glass substrates, and apply a driving voltage on the two glass substrates to control the rotation direction of the liquid crystal molecules to refract the light of the backlight module to generate a picture.
  • a thin film transistor liquid crystal display includes a liquid crystal panel including a color filter substrate (CF Substrate, also referred to as a color filter substrate), and a thin film transistor array substrate (Thin Film Transistor Substrate, TFT Substrate). And a mask, a transparent electrode is present on the opposite inner side of the substrate. A layer of liquid crystal molecules (LC) is sandwiched between the two substrates.
  • CF Substrate also referred to as a color filter substrate
  • TFT Substrate Thin Film Transistor Substrate, TFT Substrate
  • the large size frame of the display panel often affects the visual perception of the user when viewing, resulting in poor visual sense and cannot be improved. Good display tastes.
  • the display panel with a narrow bezel often requires more processes to implement the cell test, which is not conducive to saving process and cost.
  • the technical problem to be solved by the present application is to provide a display panel with reduced process and time saving.
  • a display panel the display surface
  • the board includes a unit test structure
  • the unit test structure is disposed at a frame position of the display panel
  • the unit test structure includes
  • a unit testing unit for providing power of the unit test structure
  • At least one first shorting bar is disposed between the unit testing portion and the connecting line and connects the unit testing portion and the connecting line;
  • the active switch is disposed on the connecting line, and the active switch is electrically connected to the unit testing portion.
  • the unit test structure includes an active switch control line intersecting the connection line, and the plurality of active switches are disposed on the active switch control line.
  • the active switch is set on multiple connection lines to control the connection of the connection lines, and at the same time, the active switch control lines intersecting at the same time are arranged to work at the same time, thereby reducing the complicated setting and cost saving of the separate control of the single active switch. Easy to manage.
  • the active switch control unit of the active switch is disposed at two ends of the active switch control line.
  • the active switch control unit provided at both ends can effectively control the opening and closing of the active switch in real time through an external input, and the input form is more varied and adapted to be stronger.
  • the active switch control line is coupled to the driving chip of the display panel.
  • the internal signal of the display panel controls the opening and closing of the active switch, and the original electrical component setting and wiring setting of the display panel can be utilized, thereby reducing the structural setting of the unit testing structure and saving cost.
  • the active switch adopts a width of 30 ⁇ m.
  • the use of an active switch with a small width facilitates the use of the unit test structure on a narrow bezel or even an ultra-narrow bezel display panel, without consuming too much space and facilitating wiring.
  • the first shorting bar is provided with a connecting portion connected to the unit testing portion, and at least two connecting portions are disposed on the first shorting bar. At least two connecting portions, that is, at least two unit testing portions are connected to the first shorting bar, and the unit testing structure is often used for testing the display panel. For example, two test areas adjacent in the same direction may share the same one.
  • First shorting bar, in the first short Three unit test sections are provided at both ends and the middle of the pole, and the corresponding structure is fully utilized to optimize the layout of the structure.
  • connection line is connected to the data line of the display area of the display panel, and the frame position of the display panel is disposed with a first conductive line fan-out area of the data line, and the plurality of the data lines are The first conductive fan-out areas are arranged in a non-parallel manner, and the distance between the data lines in the fan-out area of the first conductive line is from a display area close to the display panel to a border of the display panel The position is reduced.
  • This is an embodiment of unit testing when the connection line is connected to the data line.
  • the data line in the display area is connected to the connection line after passing through the fan-out area.
  • connection line is connected to the scan line of the display area of the display panel, and the frame position of the display panel is provided with a second conductive line fan-out area of the scan line, and the plurality of scan lines are The second conductive line fan-out areas are arranged in a non-parallel manner, and the distance between the scan lines in the fan-out area of the second conductive line is from a display area close to the display panel to a border of the display panel The position is reduced.
  • This is an embodiment in which the unit test is performed when the connection line is connected to the scan line, and the scan line in the display area is connected to the connection line after passing through the fan-out area.
  • the active switch uses a thin film transistor.
  • Thin-film transistors TFTs are widely used, mature, and easy to use.
  • the unit test structure includes an active switch control line intersecting the connecting line, and one end of each of the first shorting bars is respectively provided with one unit testing portion, and the middle and three strips of the first shorting bar
  • the connecting lines are connected, and the three connecting lines are respectively provided with one active switch at corresponding positions, three of the active switches are disposed on one active switch control line, and two ends of the active switch control line
  • An active switch control unit is provided with two of the active switches.
  • the active switch is arranged on the connection line, the active switch and the electrical connection of the unit test part are used to realize communication and disconnection, and the display panel is unit tested, thereby maximizing space saving, eliminating redundant processes and saving beats. time.
  • FIG. 1 is a schematic structural diagram of a unit test structure of a display panel according to an embodiment of the present application
  • FIG. 2 is a schematic structural diagram of a unit test structure of a display panel according to an embodiment of the present application
  • FIG. 3 is a schematic structural diagram of a display panel according to an embodiment of the present application.
  • first and second are used for descriptive purposes only and are not to be construed as indicating or implying a relative importance or implicitly indicating the number of technical features indicated. Thus, features defining “first” and “second” may include one or more of the features either explicitly or implicitly.
  • a plurality means two or more unless otherwise stated.
  • the term “comprises” and its variations are intended to cover a non-exclusive inclusion.
  • connection In the description of the present application, it should be noted that the terms “installation”, “connected”, and “connected” are to be understood broadly, and may be fixed or detachable, for example, unless otherwise specifically defined and defined. Connected, or connected in one piece; it can be a mechanical connection or an electrical connection; it can be directly connected, It can also be connected indirectly through an intermediate medium, which can be the internal communication between two components.
  • an intermediate medium which can be the internal communication between two components.
  • the display panel includes a unit test structure, the unit test structure is disposed at a position of a frame 2 of the display panel, and the unit test structure includes a unit test portion. 3, for providing power of the unit test structure; a plurality of connecting lines 4 for connecting conductive lines of the display area 1 of the display panel; at least one first shorting bar 5, the first shorting bar 5 is set Between the unit testing portion 3 and the connecting line 4, the unit testing portion 3 and the connecting line 4 are connected; a plurality of active switches 6 are disposed on the connecting line 4, The active switch 6 is electrically connected to the unit test unit 3.
  • the active switch 6 since the active switch 6 is disposed on the connecting line 4, the electrical connection between the active switch 6 and the unit testing unit 3 is used to achieve communication and disconnection, and the display panel is unit tested to maximize space saving and reduce redundant Process, saving tact time.
  • the unit test unit 3 is first powered; at the same time, the unit test unit is connected to the signal of the control end of the active switch 6, and the active switch 6 is in an on state; A shorting bar 5 is routed to the lead 4 until the conductive line of the area 1 is displayed; the cell test of the display panel is completed.
  • the unit test is not required, the unit test structure does not work, the unit test unit 3 does not apply power, and the active switch 6 connected to the signal is not turned on, and the shorting bar and the lead are disconnected.
  • the display panel includes a unit test structure, and the unit test structure is disposed at a position of the frame 2 of the display panel, and the unit test structure a unit testing unit 3 for supplying power of the unit testing structure, a plurality of connecting lines 4 for connecting conductive lines of the display area 1 of the display panel, and at least one first shorting bar 5, the first a shorting bar 5 is disposed between the unit testing portion 3 and the connecting line 4 and connects the unit testing portion 3 and the connecting line 4; a plurality of active switches 6, the active switch 6 being disposed on the connecting line 4 The active switch 6 is electrically connected to the unit testing unit 3 .
  • the active switch 6 is disposed on the connecting line 4, and the electrical connection between the active switch 6 and the unit testing unit 3 is used to realize communication and disconnection, and unit testing is performed on the display panel, thereby maximizing space saving, eliminating redundant processes, and saving Beat time.
  • the unit test structure includes an active switch control line 61 that intersects the connection line 4, and a plurality of the active switches 6 are disposed on the active switch control line 61.
  • the active switch 6 is disposed on the plurality of connecting lines 4 to control the connection of the connecting lines 4, and is simultaneously disposed in the active switch control line 61 where the connecting lines 4 intersect to operate at the same time, reducing the complicated control of the single active switch 6 respectively. Settings, cost savings, and ease of management.
  • the active switch control line 61 is shown disposed perpendicular to the connecting line 4.
  • the active switch control unit 62 of the active switch 6 is disposed at both ends of the active switch control line 61.
  • the active switch control unit 62 provided at both ends can effectively control the opening and closing of the active switch 6 in real time through an external input, and the input form is more varied and adapted.
  • the active switch control portion 62 can take the form of a pad.
  • the display panel includes a unit test structure, the unit test structure is disposed at a position of a frame 2 of the display panel, and the unit test structure includes a unit test. a portion 3 for supplying power of the unit test structure; a plurality of connecting lines 4 for connecting conductive lines of the display area 1 of the display panel; at least one first shorting bar 5, the first shorting bar 5 Provided between the unit test portion 3 and the connection line 4 and connected to the unit test portion 3 and the connection line 4; a plurality of active switches 6, the active switch 6 being disposed on the connecting line 4, The active switch 6 is electrically connected to the unit test unit 3.
  • the active switch 6 is disposed on the connecting line 4, and the electrical connection between the active switch 6 and the unit testing unit 3 is used to realize communication and disconnection, and unit testing is performed on the display panel, thereby maximizing space saving, eliminating redundant processes, and saving Beat time.
  • the unit test structure includes an active switch control line 61 that intersects the connection line 4, and a plurality of the active switches 6 are disposed on the active switch control line 61.
  • the active switch 6 is disposed on a plurality of connecting lines 4 to control Whether the connection lines 4 are connected or not is simultaneously disposed in the active switch control line 61 where the connection lines 4 intersect to work at the same time, which reduces the complicated setting of the separate control of the single active switch 6, saves costs, and is easy to manage.
  • the active switch control line 61 is shown disposed perpendicular to the connecting line 4.
  • the active switch control line 61 is coupled to a drive chip of the display panel.
  • the internal switch of the display panel controls the opening and closing of the active switch 6, and the original electrical component setting and wiring setting of the display panel can be utilized to reduce the structural setting of the unit test structure and save costs.
  • an active switch 6 can be disposed on the active switch control line 61 coupled to the driver chip, and the active switch 6 controls the operation of the active switch 6 disposed on the connection line 4.
  • the display panel includes a unit test structure, the unit test structure is disposed at a position of the frame 2 of the display panel, and the unit test structure includes a unit test portion 3. And a plurality of connecting lines 4 for connecting the conductive lines of the display area 1 of the display panel; at least one first shorting bar 5, wherein the first shorting bar 5 is disposed at The unit test portion 3 and the connection line 4 are connected to the unit test portion 3 and the connection line 4; a plurality of active switches 6 are disposed on the connecting line 4, and the active The switch 6 is electrically connected to the unit test unit 3.
  • the active switch 6 is disposed on the connecting line 4, and the electrical connection between the active switch 6 and the unit testing unit 3 is used to realize communication and disconnection, and unit testing is performed on the display panel, thereby maximizing space saving, eliminating redundant processes, and saving Beat time.
  • the connecting line 4 is connected to the data line 7 of the display area 1 of the display panel.
  • the frame 2 of the display panel is disposed with the first conductive line fan-out area of the data line 7 and a plurality of the data lines. 7 is arranged in a non-parallel manner via the first conductive line fan-out area, and the distance between the data lines 7 in the first conductive line fan-out area is close to the display area 1 of the display panel The position of the bezel 2 of the display panel is reduced.
  • the unit test structure includes an active switch control line 61 intersecting the connection line 4, and one of the unit short test bars 5 is respectively provided with one unit test portion 3, and the first short circuit bar 5
  • the middle portion is connected to the three connecting lines 4, and the three connecting lines 4 are respectively provided with one active switch 6 at corresponding positions, and the three active switches 6 are disposed on one of the active switch control lines 61.
  • Two active switches 6 are provided at both ends of the active switch control line 61.
  • Switch control unit 62 Two test areas adjacent in the same direction may share the same first shorting bar 5, and three unit testing sections 3 are disposed at both ends and the middle of the first shorting bar 5, and the corresponding structure is fully utilized to optimize the structural layout.
  • the active switch 6 has a width of 30 ⁇ m.
  • the use of the active switch 6 with a small width facilitates the use of the unit test structure on the narrow bezel 2 or even the ultra-narrow bezel 2 display panel, which does not occupy excessive space and facilitates wiring.
  • the active switch 6 can employ a thin film transistor. Thin-film transistors (TFTs) are widely used, mature, and easy to use. Applicants have considered using a laser to interrupt the connection between the shorting bar and the lead after the test is completed. However, the laser cutting precision is generally around 100 ⁇ m, which not only increases the laser cut process. It also wastes space, which is not conducive to the ultra-narrow bezel 2.
  • the schematic diagram of the active switch 6 being turned on and off as shown in FIG. 1-2 is electrically connected through the first shorting bar (Shorting Bar) 5 through the cell test pad 3, and transmitted.
  • a lead 4 is routed through the first conductive fanout and finally led to the pixels of the display area 1.
  • the signal connection between the unit test section and the control terminal of the active switch 6 is simultaneously applied to the TFT pad at a high potential, at which time the voltage can be given to the lead through the shorting bar; when the lighting is not between the shorting bar and the lead is disconnected , save the laser cut process.
  • the unit test structure includes an active switch control line 61 intersecting the connection line 4, and a plurality of the active switch 6 are disposed on the active switch control line 61.
  • the active switch 6 is disposed on the plurality of connecting lines 4 to control the connection of the connecting lines 4, and is simultaneously disposed in the active switch control line 61 where the connecting lines 4 intersect to operate at the same time, reducing the complicated control of the single active switch 6 respectively. Settings, cost savings, and ease of management.
  • the active switch control line 61 is shown disposed perpendicular to the connecting line 4.
  • the active switch control unit 62 of the active switch 6 is disposed at both ends of the active switch control line 61.
  • the active switch control unit 62 provided at both ends can effectively control the opening and closing of the active switch 6 in real time through an external input, and the input form is more varied and adapted.
  • the active switch control portion 62 can take the form of a pad.
  • the active switch control line 61 is coupled to a drive chip of the display panel.
  • the internal switch of the display panel controls the opening and closing of the active switch 6, and the original electrical components of the display panel can be used and arranged. Line settings, etc., reduce the structural setup of the unit test structure and save costs.
  • an active switch 6 can be disposed on the active switch control line 61 coupled to the driver chip, and the active switch 6 controls the operation of the active switch 6 disposed on the connection line 4.
  • the first shorting bar is provided with a connecting portion connected to the unit testing portion 3, and the first shorting bar 5 is provided with at least two connecting portions. At least two connections, that is to say at least two unit test sections 3, are connected to the first shorting bar 5, which is often partition tested when the unit test structure is used to test the display panel.
  • the unit test section 3 can take the form of a pad.
  • the display panel includes a unit test structure, the unit test structure is disposed at a position of the frame 2 of the display panel, and the unit test structure includes a unit test portion 3 for providing the The power of the unit test structure; a plurality of connecting lines 4 for connecting the conductive lines of the display area 1 of the display panel; a first shorting bar 5, the first shorting bar 5 is disposed at the unit testing part 3 and connected The unit test portion 3 and the connecting line 4 are connected between the wires 4; a plurality of active switches 6 are disposed on the connecting line 4, the active switch 6 and the unit testing portion 3 electrical connection.
  • the active switch 6 is disposed on the connecting line 4, and the electrical connection between the active switch 6 and the unit testing unit 3 is used to realize communication and disconnection, and unit testing is performed on the display panel, thereby maximizing space saving, eliminating redundant processes, and saving Beat time.
  • the connecting line 4 is connected to the scan line of the display area 1 of the display panel, and the frame 2 of the display panel is disposed with a second conductive line fan-out area of the scan line, and the plurality of scan lines are The second conductive line fan-out areas are arranged in a non-parallel manner, and the distance between the scan lines in the second conductive line fan-out area is from the display area 1 near the display panel to the display panel The position of the border 2 is reduced.
  • the unit test structure includes an active switch control line 61 intersecting the connection line 4, and one of the unit short test bars 5 is respectively provided with one unit test portion 3, and the first short circuit bar 5
  • the middle portion is connected to the three connecting lines 4, and the three connecting lines 4 are respectively provided with one active switch 6 at corresponding positions, and the three active switches 6 are disposed on one of the active switch control lines 61.
  • Active switch control of two active switches 6 is provided at both ends of the active switch control line 61 Section 62. Two test areas adjacent in the same direction may share the same first shorting bar 5, and three unit testing sections 3 are disposed at both ends and the middle of the first shorting bar 5, and the corresponding structure is fully utilized to optimize the structural layout.
  • the active switch 6 has a width of 30 ⁇ m.
  • the use of the active switch 6 with a small width facilitates the use of the unit test structure on the narrow bezel 2 or even the ultra-narrow bezel 2 display panel, which does not occupy excessive space and facilitates wiring.
  • the active switch 6 can employ a thin film transistor. Thin-film transistors (TFTs) are widely used, mature, and easy to use. Applicants have considered using a laser to interrupt the connection between the shorting bar and the lead after the test is completed. However, the laser cutting precision is generally around 100 ⁇ m, which not only increases the laser cut process. It also wastes space, which is not conducive to the ultra-narrow bezel 2.
  • the schematic diagram of the active switch 6 being turned on and off as shown in FIG. 1-2 is electrically connected through the first shorting bar (Shorting Bar) 5 through the cell test pad 3, and transmitted.
  • a lead 4 is routed through the second conductive fanout and finally led to the pixels of the display area 1.
  • the signal connection between the unit test section and the control terminal of the active switch 6 is simultaneously applied to the TFT pad at a high potential, at which time the voltage can be given to the lead through the shorting bar; when the lighting is not between the shorting bar and the lead is disconnected , save the laser cut process.
  • the unit test structure includes an active switch control line 61 intersecting the connection line 4, and a plurality of the active switch 6 are disposed on the active switch control line 61.
  • the active switch 6 is disposed on the plurality of connecting lines 4 to control the connection of the connecting lines 4, and is simultaneously disposed in the active switch control line 61 where the connecting lines 4 intersect to operate at the same time, reducing the complicated control of the single active switch 6 respectively. Settings, cost savings, and ease of management.
  • the active switch control line 61 is shown disposed perpendicular to the connecting line 4.
  • the active switch control unit 62 of the active switch 6 is disposed at both ends of the active switch control line 61.
  • the active switch control unit 62 provided at both ends can effectively control the opening and closing of the active switch 6 in real time through an external input, and the input form is more varied and adapted.
  • the active switch control portion 62 can take the form of a pad.
  • the active switch control line 61 is coupled to a drive chip of the display panel.
  • the internal switch of the display panel controls the opening and closing of the active switch 6, and the original electrical components of the display panel can be used and arranged. Line settings, etc., reduce the structural setup of the unit test structure and save costs.
  • an active switch 6 can be disposed on the active switch control line 61 coupled to the driver chip, and the active switch 6 controls the operation of the active switch 6 disposed on the connection line 4.
  • the first shorting bar 5 is provided with a connecting portion connected to the unit testing portion 3, and the first shorting bar 5 is provided with at least two connecting portions. At least two connections, that is to say at least two unit test sections 3, are connected to the first shorting bar 5, which is often partition tested when the unit test structure is used to test the display panel.
  • the unit test section 3 can take the form of a pad.
  • the material of the substrate may be glass, plastic or the like.
  • the display panel includes a liquid crystal panel, an OLED (Organic Light-Emitting Diode) panel, a curved panel, a plasma panel, etc.
  • the liquid crystal panel includes an array substrate (Thin Film Transistor Substrate, TFT Substrate) and a color filter substrate (CF Substrate), the array substrate is disposed opposite to the color filter substrate, and a liquid crystal and a spacer (PS) are disposed between the array substrate and the color filter substrate, and the array substrate A thin film transistor (TFT) is disposed on the color film substrate, and a color filter layer is disposed on the color filter substrate.
  • TFT Thin Film Transistor Substrate
  • CF Substrate color filter substrate
  • PS liquid crystal and a spacer
  • the color filter substrate may include a TFT array
  • the color film and the TFT array may be formed on the same substrate
  • the array substrate may include a color filter layer
  • the display panel of the present application may be a curved type panel.

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Abstract

一种显示面板，显示面板包括单元测试结构，单元测试结构设置于显示面板的边框（2）位置，单元测试结构包括单元测试部（3），用于提供单元测试结构的电力；多条连接线（4），用于连接显示面板的显示区域（1）的导电线；第一短路棒（5），第一短路棒（5）设置在单元测试部（3）和连接线（4）之间并连接单元测试部（3）和连接线（4）；多个主动开关（6），主动开关（6）设置在连接线（4）上，主动开关（6）与单元测试部（3）电性连接。

Description

一种显示面板 【技术领域】
本申请涉及显示技术领域，更具体的说，涉及一种显示面板。
【背景技术】
液晶显示器具有机身薄、省电、无辐射等众多优点，得到了广泛的应用。现有市场上的液晶显示器大部分为背光型液晶显示器，其包括液晶面板及背光模组(backlight module)。液晶面板的工作原理是在两片平行的玻璃基板当中放置液晶分子，并在两片玻璃基板上施加驱动电压来控制液晶分子的旋转方向，以将背光模组的光线折射出来产生画面。
其中，薄膜晶体管液晶显示器(Thin Film Transistor-Liquid Crystal Display，TFT-LCD)由于具有低的功耗、优异的画面品质以及较高的生产良率等性能，目前已经逐渐占据了显示领域的主导地位。同样，薄膜晶体管液晶显示器包含液晶面板和背光模组，液晶面板包括彩膜基板(Color Filter Substrate，CF Substrate，也称彩色滤光片基板)、薄膜晶体管阵列基板(Thin Film Transistor Substrate，TFT Substrate)和光罩(Mask)，上述基板的相对内侧存在透明电极。两片基板之间夹一层液晶分子(Liquid Crystal，LC)。
随着显示器比如薄膜晶体管液晶显示器逐渐往超大尺寸、高驱动频率、高分辨率等方面发展，显示面板的大尺寸边框往往会影响使用者观看时的视觉感受，造成视觉的感官不佳，不能提高好的显示品味体现。但窄边框的显示面板在做单元检测(cell test)时往往需要更多的制程来实现，不利于节省工序和成本。
【发明内容】
本申请所要解决的技术问题是提供一种减少制程、节省时间的显示面板。
本申请的目的是通过以下技术方案来实现的：一种显示面板，所述显示面 板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框位置，所述单元测试结构包括
单元测试部，用于提供所述单元测试结构的电力；
多条连接线，用于连接所述显示面板的显示区域的导电线；
至少一第一短路棒，所述第一短路棒设置在所述单元测试部和连接线之间并连接所述单元测试部和所述连接线；
多个主动开关，所述主动开关设置在所述连接线上，所述主动开关与所述单元测试部电性连接。
其中，所述单元测试结构包括与所述连接线相交的主动开关控制线，多个所述主动开关设置在所述主动开关控制线上。主动开关不管设置在多条连接线上以控制连接线的连接与否，同时共同设置在于连接线相交的主动开关控制线以便同时工作，减少对单个主动开关分别控制的繁复设置、节省成本，同时便于管理。
其中，所述主动开关控制线的两端设置有所述主动开关的主动开关控制部。两端设置有的主动开关控制部可以通过外部的输入实时有效的控制主动开关的开启与断开，输入的形式更多样、适应下更强。
其中，所述主动开关控制线与所述显示面板的驱动芯片耦合。与驱动芯片耦合则由显示面板的内部信号控制主动开关的开启与断开，可以利用显示面板的原有电元件设置及布线设置等，减少单元测试结构的结构设置，节省成本。
其中，所述主动开关采用的宽度为30μm。采用宽度小的主动开关便于单元测试结构在窄边框甚至超窄边框显示面板上的使用，不占用过多的空间、方便布线。
其中，所述第一短路棒上设置有与所述单元测试部连接的连接部，所述第一短路棒上至少设置有两个所述连接部。至少两个连接部也就是至少两个单元测试部与第一短路棒连接，在单元测试结构用于测试显示面板时常常分区测试，比如两个在同一方向上相邻的测试区域可以共用同一个第一短路棒，在第一短 路棒的两端和中部同设置三个单元测试部，充分利用相应结构，优化结构布设。
其中，所述连接线与所述显示面板的显示区域的数据线连接，所述显示面板的边框位置设置有所述数据线的第一导电线扇出区，多条所述数据线经所述第一导电线扇出区以不平行的形式排布，在所述第一导电线扇出区内所述数据线之间的距离由靠近所述显示面板的显示区域向所述显示面板的边框位置缩小。这是连接线与数据线连接时进行单元测试的一个实施方式，显示区域内的数据线通过扇出区后与连接线连接。
其中，所述连接线与所述显示面板的显示区域的扫描线连接，所述显示面板的边框位置设置有所述扫描线的第二导电线扇出区，多条所述扫描线经所述第二导电线扇出区以不平行的形式排布，在所述第二导电线扇出区内所述扫描线之间的距离由靠近所述显示面板的显示区域向所述显示面板的边框位置缩小。这是连接线与扫描线连接时进行单元测试的一个实施方式，显示区域内的扫描线通过扇出区后与连接线连接。
其中，所述主动开关采用薄膜晶体管。薄膜晶体管(Thin-film transistor，TFT)取材广泛、技术成熟、便于利用。
其中，所述单元测试结构包括与所述连接线相交的主动开关控制线，一条所述第一短路棒的两端分别设置有一个所述单元测试部，所述第一短路棒的中部与三条所述连接线连接，三条所述连接线在对应位置上分别设置有一个所述主动开关，三个所述主动开关设置在一条所述主动开关控制线上，所述主动开关控制线的两端设置有两个所述主动开关的主动开关控制部。这是单元测试结构进行分区测试时的一种实施方式。
本申请由于设置主动开关在连接线上，利用主动开关与单元测试部的电性连接共同实现连通、断开，对显示面板进行单元测试，最大限度的节省空间，减去多余的制程，节省节拍时间。
【附图说明】
所包括的附图用来提供对本申请实施例的进一步的理解，其构成了说明书的一部分，用于例示本申请的实施方式，并与文字描述一起来阐释本申请的原理。显而易见地，下面描述中的附图仅仅是本申请的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动性的前提下，还可以根据这些附图获得其他的附图。在附图中：
图1是本申请实施例一种显示面板的单元测试结构的结构示意图；
图2是本申请实施例一种显示面板的单元测试结构的结构示意图；
图3是本申请实施例一种显示面板的结构示意图。
【具体实施方式】
这里所公开的具体结构和功能细节仅仅是代表性的，并且是用于描述本申请的示例性实施例的目的。但是本申请可以通过许多替换形式来具体实现，并且不应当被解释成仅仅受限于这里所阐述的实施例。
在本申请的描述中，需要理解的是，术语“中心”、“横向”、“上”、“下”、“左”、“右”、“竖直”、“水平”、“顶”、“底”、“内”、“外”等指示的方位或位置关系为基于附图所示的方位或位置关系，仅是为了便于描述本申请和简化描述，而不是指示或暗示所指的装置或元件必须具有特定的方位、以特定的方位构造和操作，因此不能理解为对本申请的限制。此外，术语“第一”、“第二”仅用于描述目的，而不能理解为指示或暗示相对重要性或者隐含指明所指示的技术特征的数量。由此，限定有“第一”、“第二”的特征可以明示或者隐含地包括一个或者更多个该特征。在本申请的描述中，除非另有说明，“多个”的含义是两个或两个以上。另外，术语“包括”及其任何变形，意图在于覆盖不排他的包含。
在本申请的描述中，需要说明的是，除非另有明确的规定和限定，术语“安装”、“相连”、“连接”应做广义理解，例如，可以是固定连接，也可以是可拆卸连接，或一体地连接；可以是机械连接，也可以是电连接；可以是直接相连， 也可以通过中间媒介间接相连，可以是两个元件内部的连通。对于本领域的普通技术人员而言，可以具体情况理解上述术语在本申请中的具体含义。
这里所使用的术语仅仅是为了描述具体实施例而不意图限制示例性实施例。除非上下文明确地另有所指，否则这里所使用的单数形式“一个”、“一项”还意图包括复数。还应当理解的是，这里所使用的术语“包括”和/或“包含”规定所陈述的特征、整数、步骤、操作、单元和/或组件的存在，而不排除存在或添加一个或更多其他特征、整数、步骤、操作、单元、组件和/或其组合。
下面结合附图和较佳的实施例对本申请作进一步详细说明。
下面参考图1至图3描述本申请实施例的显示面板结构示意图。
作为本申请的一个实施例，如图1-2所示，所述显示面板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框2位置，所述单元测试结构包括单元测试部3，用于提供所述单元测试结构的电力；多条连接线4，用于连接所述显示面板的显示区域1的导电线；至少一第一短路棒5，所述第一短路棒5设置在所述单元测试部3和连接线4之间并连接所述单元测试部3和所述连接线4；多个主动开关6，所述主动开关6设置在所述连接线4上，所述主动开关6与所述单元测试部3电性连接。本申请由于设置主动开关6在连接线4上，利用主动开关6与单元测试部3的电性连接共同实现连通、断开，对显示面板进行单元测试，最大限度的节省空间，减去多余的制程，节省节拍时间(tact time)。
此时，当单元测试结构开启工作时，先对单元测试部3加电；于此同时通过单位测试部与主动开关6的控制端的信号连接，主动开关6处于导通状态；电力通过所述第一短路棒(Shorting Bar)5走线，传给连接线(lead)4，直至显示区域1的导电线；完成对显示面板的单元测试(cell test)。不需要进行单元测试时，单元测试结构不工作，单元测试部3不加电，与之信号连接的主动开关6也不导通，shorting bar和lead之间是断开的。
作为本申请的又一个实施例，如图1-2所示，所述显示面板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框2位置，所述单元测试结构 包括单元测试部3，用于提供所述单元测试结构的电力；多条连接线4，用于连接所述显示面板的显示区域1的导电线；至少一第一短路棒5，所述第一短路棒5设置在所述单元测试部3和连接线4之间并连接所述单元测试部3和所述连接线4；多个主动开关6，所述主动开关6设置在所述连接线4上，所述主动开关6与所述单元测试部3电性连接。设置主动开关6在连接线4上，利用主动开关6与单元测试部3的电性连接共同实现连通、断开，对显示面板进行单元测试，最大限度的节省空间，减去多余的制程，节省节拍时间。所述单元测试结构包括与所述连接线4相交的主动开关控制线61，多个所述主动开关6设置在所述主动开关控制线61上。主动开关6不管设置在多条连接线4上以控制连接线4的连接与否，同时共同设置在于连接线4相交的主动开关控制线61以便同时工作，减少对单个主动开关6分别控制的繁复设置、节省成本，同时便于管理。所示主动开关控制线61与所述连接线4相垂直设置。所述主动开关控制线61的两端设置有所述主动开关6的主动开关控制部62。两端设置有的主动开关控制部62可以通过外部的输入实时有效的控制主动开关6的开启与断开，输入的形式更多样、适应下更强。主动开关控制部62可以采用焊盘的形式。
作为本申请的又一个实施例，如图1-2所示，所述显示面板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框2位置，所述单元测试结构包括单元测试部3，用于提供所述单元测试结构的电力；多条连接线4，用于连接所述显示面板的显示区域1的导电线；至少一第一短路棒5，所述第一短路棒5设置在所述单元测试部3和连接线4之间并连接所述单元测试部3和所述连接线4；多个主动开关6，所述主动开关6设置在所述连接线4上，所述主动开关6与所述单元测试部3电性连接。设置主动开关6在连接线4上，利用主动开关6与单元测试部3的电性连接共同实现连通、断开，对显示面板进行单元测试，最大限度的节省空间，减去多余的制程，节省节拍时间。所述单元测试结构包括与所述连接线4相交的主动开关控制线61，多个所述主动开关6设置在所述主动开关控制线61上。主动开关6不管设置在多条连接线4上以控制 连接线4的连接与否，同时共同设置在于连接线4相交的主动开关控制线61以便同时工作，减少对单个主动开关6分别控制的繁复设置、节省成本，同时便于管理。所示主动开关控制线61与所述连接线4相垂直设置。所述主动开关控制线61与所述显示面板的驱动芯片耦合。与驱动芯片耦合则由显示面板的内部信号控制主动开关6的开启与断开，可以利用显示面板的原有电元件设置及布线设置等，减少单元测试结构的结构设置，节省成本。比如，与驱动芯片耦合的主动开关控制线61上可以设置一个主动开关6，通过此主动开关6来调控设置在连接线4上的主动开关6的工作情况。
作为本申请的又一个实施例，如图3所示，所述显示面板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框2位置，所述单元测试结构包括单元测试部3，用于提供所述单元测试结构的电力；多条连接线4，用于连接所述显示面板的显示区域1的导电线；至少一第一短路棒5，所述第一短路棒5设置在所述单元测试部3和连接线4之间并连接所述单元测试部3和所述连接线4；多个主动开关6，所述主动开关6设置在所述连接线4上，所述主动开关6与所述单元测试部3电性连接。设置主动开关6在连接线4上，利用主动开关6与单元测试部3的电性连接共同实现连通、断开，对显示面板进行单元测试，最大限度的节省空间，减去多余的制程，节省节拍时间。
所述连接线4与所述显示面板的显示区域1的数据线7连接，所述显示面板的边框2位置设置有所述数据线7的第一导电线扇出区，多条所述数据线7经所述第一导电线扇出区以不平行的形式排布，在所述第一导电线扇出区内所述数据线7之间的距离由靠近所述显示面板的显示区域1向所述显示面板的边框2位置缩小。所述单元测试结构包括与所述连接线4相交的主动开关控制线61，一条所述第一短路棒5的两端分别设置有一个所述单元测试部3，所述第一短路棒5的中部与三条所述连接线4连接，三条所述连接线4在对应位置上分别设置有一个所述主动开关6，三个所述主动开关6设置在一条所述主动开关控制线61上，所述主动开关控制线61的两端设置有两个所述主动开关6的主动 开关控制部62。两个在同一方向上相邻的测试区域可以共用同一个第一短路棒5，在第一短路棒5的两端和中部同设置三个单元测试部3，充分利用相应结构，优化结构布设。所述主动开关6采用的宽度为30μm。采用宽度小的主动开关6便于单元测试结构在窄边框2甚至超窄边框2显示面板上的使用，不占用过多的空间、方便布线。所述主动开关6可采用薄膜晶体管。薄膜晶体管(Thin-film transistor，TFT)取材广泛、技术成熟、便于利用。申请人考虑过在不使用主动开关6时采用激光(laser)在测试完成后把shorting bar和lead之间的连接打断，然而激光切割的精度一般在100μm左右，不仅平白增加laser cut这一制程，还浪费空间，不利于超窄边框2。
此时，如图1-2所示的主动开关6导通、断开的示意图，通过单元测试部(cell test pad)3加电通过所述第一短路棒(Shorting Bar)5走线，传给连接线(lead)4，通过所述第一导电线扇出区(fanout)走线，最终导给显示区域1的像素。当cell test点灯时，通过单位测试部与主动开关6的控制端的信号连接同时给TFT pad高电位，这时候电压可以通过shorting bar给到lead；不点灯的时候shorting bar和lead之间是断开的，节省laser cut制程。
具体的，所述单元测试结构包括与所述连接线4相交的主动开关控制线61，多个所述主动开关6设置在所述主动开关控制线61上。主动开关6不管设置在多条连接线4上以控制连接线4的连接与否，同时共同设置在于连接线4相交的主动开关控制线61以便同时工作，减少对单个主动开关6分别控制的繁复设置、节省成本，同时便于管理。所示主动开关控制线61与所述连接线4相垂直设置。所述主动开关控制线61的两端设置有所述主动开关6的主动开关控制部62。两端设置有的主动开关控制部62可以通过外部的输入实时有效的控制主动开关6的开启与断开，输入的形式更多样、适应下更强。这里是一种通过外部控制的形式。主动开关控制部62可以采用焊盘的形式。或者，所述主动开关控制线61与所述显示面板的驱动芯片耦合。与驱动芯片耦合则由显示面板的内部信号控制主动开关6的开启与断开，可以利用显示面板的原有电元件设置及布 线设置等，减少单元测试结构的结构设置，节省成本。这里是一种通过显示面板的内部控制的形式。比如，与驱动芯片耦合的主动开关控制线61上可以设置一个主动开关6，通过此主动开关6来调控设置在连接线4上的主动开关6的工作情况。
具体的，所述第一短路棒上设置有与所述单元测试部3连接的连接部，所述第一短路棒5上至少设置有两个所述连接部。至少两个连接部也就是至少两个单元测试部3与第一短路棒5连接，在单元测试结构用于测试显示面板时常常分区测试。单元测试部3可以采用焊盘的形式。
作为本申请的又一个实施例，所述显示面板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框2位置，所述单元测试结构包括单元测试部3，用于提供所述单元测试结构的电力；多条连接线4，用于连接所述显示面板的显示区域1的导电线；第一短路棒5，所述第一短路棒5设置在所述单元测试部3和连接线4之间并连接所述单元测试部3和所述连接线4；多个主动开关6，所述主动开关6设置在所述连接线4上，所述主动开关6与所述单元测试部3电性连接。设置主动开关6在连接线4上，利用主动开关6与单元测试部3的电性连接共同实现连通、断开，对显示面板进行单元测试，最大限度的节省空间，减去多余的制程，节省节拍时间。
所述连接线4与所述显示面板的显示区域1的扫描线连接，所述显示面板的边框2位置设置有所述扫描线的第二导电线扇出区，多条所述扫描线经所述第二导电线扇出区以不平行的形式排布，在所述第二导电线扇出区内所述扫描线之间的距离由靠近所述显示面板的显示区域1向所述显示面板的边框2位置缩小。所述单元测试结构包括与所述连接线4相交的主动开关控制线61，一条所述第一短路棒5的两端分别设置有一个所述单元测试部3，所述第一短路棒5的中部与三条所述连接线4连接，三条所述连接线4在对应位置上分别设置有一个所述主动开关6，三个所述主动开关6设置在一条所述主动开关控制线61上，所述主动开关控制线61的两端设置有两个所述主动开关6的主动开关控制 部62。两个在同一方向上相邻的测试区域可以共用同一个第一短路棒5，在第一短路棒5的两端和中部同设置三个单元测试部3，充分利用相应结构，优化结构布设。所述主动开关6采用的宽度为30μm。采用宽度小的主动开关6便于单元测试结构在窄边框2甚至超窄边框2显示面板上的使用，不占用过多的空间、方便布线。所述主动开关6可采用薄膜晶体管。薄膜晶体管(Thin-film transistor，TFT)取材广泛、技术成熟、便于利用。申请人考虑过在不使用主动开关6时采用激光(laser)在测试完成后把shorting bar和lead之间的连接打断，然而激光切割的精度一般在100μm左右，不仅平白增加laser cut这一制程，还浪费空间，不利于超窄边框2。
此时，如图1-2所示的主动开关6导通、断开的示意图，通过单元测试部(cell test pad)3加电通过所述第一短路棒(Shorting Bar)5走线，传给连接线(lead)4，通过所述第二导电线扇出区(fanout)走线，最终导给显示区域1的像素。当cell test点灯时，通过单位测试部与主动开关6的控制端的信号连接同时给TFT pad高电位，这时候电压可以通过shorting bar给到lead；不点灯的时候shorting bar和lead之间是断开的，节省laser cut制程。
具体的，所述单元测试结构包括与所述连接线4相交的主动开关控制线61，多个所述主动开关6设置在所述主动开关控制线61上。主动开关6不管设置在多条连接线4上以控制连接线4的连接与否，同时共同设置在于连接线4相交的主动开关控制线61以便同时工作，减少对单个主动开关6分别控制的繁复设置、节省成本，同时便于管理。所示主动开关控制线61与所述连接线4相垂直设置。所述主动开关控制线61的两端设置有所述主动开关6的主动开关控制部62。两端设置有的主动开关控制部62可以通过外部的输入实时有效的控制主动开关6的开启与断开，输入的形式更多样、适应下更强。这里是一种通过外部控制的形式。主动开关控制部62可以采用焊盘的形式。或者，所述主动开关控制线61与所述显示面板的驱动芯片耦合。与驱动芯片耦合则由显示面板的内部信号控制主动开关6的开启与断开，可以利用显示面板的原有电元件设置及布 线设置等，减少单元测试结构的结构设置，节省成本。这里是一种通过显示面板的内部控制的形式。比如，与驱动芯片耦合的主动开关控制线61上可以设置一个主动开关6，通过此主动开关6来调控设置在连接线4上的主动开关6的工作情况。
具体的，所述第一短路棒5上设置有与所述单元测试部3连接的连接部，所述第一短路棒5上至少设置有两个所述连接部。至少两个连接部也就是至少两个单元测试部3与第一短路棒5连接，在单元测试结构用于测试显示面板时常常分区测试。单元测试部3可以采用焊盘的形式。
需要说明的是，在上述实施例中，所述基板的材料可以选用玻璃、塑料等。
在上述实施例中，显示面板包括液晶面板、OLED(Organic Light-Emitting Diode)面板、曲面面板、等离子面板等，以液晶面板为例，液晶面板包括阵列基板(Thin Film Transistor Substrate，TFT Substrate)和彩膜基板(Color Filter Substrate，CF Substrate)，所述阵列基板与彩膜基板相对设置，所述阵列基板与彩膜基板之间设有液晶和间隔单元(PS，photo spacer)，所述阵列基板上设有薄膜晶体管(TFT，Thin Film Transistor)，彩膜基板上设有彩色滤光层。
在上述实施例中，彩膜基板可包括TFT阵列，彩膜及TFT阵列可形成于同一基板上，阵列基板可包括彩色滤光层。
在上述实施例中，本申请的显示面板可为曲面型面板。
以上内容是结合具体的优选实施方式对本申请所作的进一步详细说明，不能认定本申请的具体实施只局限于这些说明。对于本申请所属技术领域的普通技术人员来说，在不脱离本申请构思的前提下，还可以做出若干简单推演或替换，都应当视为属于本申请的保护范围。

Claims (17)

  1. 一种显示面板，所述显示面板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框位置，所述单元测试结构包括：
    单元测试部，用于提供所述单元测试结构的电力；
    多条连接线，用于连接所述显示面板的显示区域的导电线；
    至少一第一短路棒，所述第一短路棒设置在所述单元测试部和连接线之间并连接所述单元测试部和所述连接线；
    多个主动开关，所述主动开关设置在所述连接线上，所述主动开关与所述单元测试部电性连接。
  2. 如权利要求1所述的显示面板，其中所述单元测试结构包括与所述连接线相交的主动开关控制线，多个所述主动开关设置在所述主动开关控制线上。
  3. 如权利要求2所述的显示面板，其中所述主动开关控制线的两端设置有所述主动开关的主动开关控制部。
  4. 如权利要求1所述的显示面板，其中所述单元测试结构包括与所述连接线相交的主动开关控制线，多个所述主动开关设置在所述主动开关控制线上；
    所述主动开关控制线的两端设置有所述主动开关的主动开关控制部。
  5. 如权利要求2所述的显示面板，其中所述主动开关控制线与所述显示面板的驱动芯片耦合。
  6. 如权利要求5所述的显示面板，其中与所述驱动芯片耦合的所述主动开关控制线上可以设置一个第一主动开关，所述第一主动开关调控设置在所述连接线上的所述主动开关的工作。
  7. 如权利要求1所述的显示面板，其中所述单元测试结构包括与所述连接线相交的主动开关控制线，多个所述主动开关设置在所述主动开关控制线上；
    所述主动开关控制线与所述显示面板的驱动芯片耦合；
    与所述驱动芯片耦合的所述主动开关控制线上可以设置一个第一主动开 关，所述第一主动开关调控设置在所述连接线上的所述主动开关的工作。
  8. 如权利要求1所述的显示面板，其中所述主动开关采用的宽度为30μm。
  9. 如权利要求1所述的显示面板，其中所述连接线与所述显示面板的显示区域的数据线连接，所述显示面板的边框位置设置有所述数据线的第一导电线扇出区，多条所述数据线经所述第一导电线扇出区以不平行的形式排布，在所述第一导电线扇出区内所述数据线之间的距离由靠近所述显示面板的显示区域向所述显示面板的边框位置缩小。
  10. 如权利要求1所述的显示面板，其中所述连接线与所述显示面板的显示区域的扫描线连接，所述显示面板的边框位置设置有所述扫描线的第二导电线扇出区，多条所述扫描线经所述第二导电线扇出区以不平行的形式排布，在所述第二导电线扇出区内所述扫描线之间的距离由靠近所述显示面板的显示区域向所述显示面板的边框位置缩小。
  11. 如权利要求1所述的显示面板，其中所述主动开关采用薄膜晶体管。
  12. 如权利要求1所述的显示面板，其中所述单元测试结构包括与所述连接线相交的主动开关控制线，一条所述第一短路棒的两端分别设置有一个所述单元测试部，所述第一短路棒的中部与三条所述连接线连接，三条所述连接线在对应位置上分别设置有一个所述主动开关，三个所述主动开关设置在一条所述主动开关控制线上，所述主动开关控制线的两端设置有两个所述主动开关的主动开关控制部。
  13. 如权利要求12所述的显示面板，其中两个在同一方向上相邻的测试区域可以共用同一个所述第一短路棒，在所述第一短路棒的两端和中部同设置三个单元测试部。
  14. 如权利要求12所述的显示面板，其中所述第一短路棒上设置有与所述单元测试部连接的连接部，所述第一短路棒上至少设置有两个所述连接部。
  15. 如权利要求12所述的显示面板，其中单元测试部可以采用焊盘的形式。
  16. 如权利要求1所述的显示面板，其中所述单元测试结构包括与所述连 接线相交的主动开关控制线，一条所述第一短路棒的两端分别设置有一个所述单元测试部，所述第一短路棒的中部与三条所述连接线连接，三条所述连接线在对应位置上分别设置有一个所述主动开关，三个所述主动开关设置在一条所述主动开关控制线上，所述主动开关控制线的两端设置有两个所述主动开关的主动开关控制部；
    在同一方向上相邻的测试区域可以共用同一个所述第一短路棒，在所述第一短路棒的两端和中部同设置三个单元测试部，单元测试部可以采用焊盘的形式；
    所述第一短路棒上设置有与所述单元测试部连接的连接部，所述第一短路棒上至少设置有两个所述连接部。
  17. 一种显示面板，所述显示面板包括单元测试结构，所述单元测试结构设置于所述显示面板的边框位置，所述单元测试结构包括
    单元测试部，用于提供所述单元测试结构的电力；
    多条连接线，用于连接所述显示面板的显示区域的导电线；
    第一短路棒，所述第一短路棒设置在所述单元测试部和连接线之间并连接所述单元测试部和所述连接线；
    多个主动开关，所述主动开关设置在所述连接线上，所述主动开关与所述单元测试部电性连接；
    其中，所述单元测试结构包括与所述连接线相交的主动开关控制线，多个所述主动开关设置在所述主动开关控制线上，所述主动开关控制线的两端设置有所述主动开关的主动开关控制部；
    其中，所述主动开关采用的宽度为30μm。
PCT/CN2017/106314 2017-04-19 2017-10-16 一种显示面板 WO2018192198A1 (zh)

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