WO2018014445A1 - 显示装置及其修复方法 - Google Patents

显示装置及其修复方法 Download PDF

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WO2018014445A1
WO2018014445A1 PCT/CN2016/099508 CN2016099508W WO2018014445A1 WO 2018014445 A1 WO2018014445 A1 WO 2018014445A1 CN 2016099508 W CN2016099508 W CN 2016099508W WO 2018014445 A1 WO2018014445 A1 WO 2018014445A1
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line
tft
repair
display device
chip
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PCT/CN2016/099508
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English (en)
French (fr)
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黄笑宇
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深圳市华星光电技术有限公司
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Priority to US15/304,520 priority Critical patent/US20180180958A1/en
Publication of WO2018014445A1 publication Critical patent/WO2018014445A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13452—Conductors connecting driver circuitry and terminals of panels
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136286—Wiring, e.g. gate line, drain line
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
    • H01L27/02—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers
    • H01L27/12—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body
    • H01L27/1214—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs
    • H01L27/124—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components specially adapted for rectifying, oscillating, amplifying or switching and having potential barriers; including integrated passive circuit elements having potential barriers the substrate being other than a semiconductor body, e.g. an insulating body comprising a plurality of TFTs formed on a non-semiconducting substrate, e.g. driving circuits for AMLCDs with a particular composition, shape or layout of the wiring layers specially adapted to the circuit arrangement, e.g. scanning lines in LCD pixel circuits
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136259—Repairing; Defects
    • G02F1/136263—Line defects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • H01L22/20—Sequence of activities consisting of a plurality of measurements, corrections, marking or sorting steps
    • H01L22/22—Connection or disconnection of sub-entities or redundant parts of a device in response to a measurement

Definitions

  • the invention belongs to the field of manufacturing of display devices, and in particular to a display device and a repairing method thereof.
  • TFT-LCD Thin Film Transistor Liquid Crystal Display
  • the system motherboard connects the R/G/B compression signal, control signal and power through the wire to the connector on the printed circuit board (PCB), and the data is processed by the timing controller integrated circuit on the PCB.
  • the source chip S-COF on the film and the gate chip G-COF on the film are connected to the display area, so that the LCD obtains the required power and signal.
  • the existing repairing manner is as shown in FIG. 1 , in which the on-film gate chip 20 and the on-film source chip 30 are respectively disposed around the display region 100, wherein the on-film gate chip is disposed on the printed circuit board 10 and the display Between areas 100.
  • the point A on the output line 5 is a break point, it is impossible to display from A to the ground side, and it appears as a broken line.
  • the overlapping points B and C of the repairing line 4 and the output line 5 are laser-welded, the data of the AB section is transmitted through the original output line, and the data of the AC section is transmitted through the repairing line, and finally the line is repaired. .
  • the Chinese Patent Application No. CN201110402001.5 discloses a repair method of a liquid crystal display device.
  • the source line of the disconnected line overlaps with the corresponding repair signal line overlapping the same.
  • the controller controls the closing of the corresponding compensation voltage switch according to the length of the repair line, and then the phase is closed.
  • the corresponding compensation voltage V is input into the repairing unit, and is combined with the repaired signal voltage to be output as a repair voltage to the repair line, and the overlapping repair line intersecting the other end of the source line where the disconnection occurs is passed at the overlapping portion.
  • the laser is welded, so that the repair voltage is transmitted to the other end of the source line corresponding to the broken line through the repair line, and the repair process of the source line is completed.
  • An object of the present invention is to overcome the above-mentioned deficiencies of the prior art and to provide a display device which can reduce one laser welding process, simplify the process, and improve the repair efficiency.
  • Another object of the present invention is to overcome the above-mentioned deficiencies of the prior art and to provide a repair method for a display device which can reduce one laser welding process, simplify the process, and improve the repair efficiency.
  • a display device includes a display area and a non-display area, wherein the display apparatus further includes: a repair line disposed at a periphery of the display area; and a TFT disposed on the chip
  • the gate of the TFT is connected to the control line
  • the source of the TFT is connected to the repair line
  • the drain of the TFT is connected to the data line or the scan line.
  • the repair line may include a first portion and a second portion insulated from and intersecting the data line and/or the scan line, the first portion may be close to the TFT, and the second portion may be away from the TFT.
  • the gate of the TFT is controlled by the control line to disconnect or connect the repair line to the data line or the scan line.
  • the chip may be a source chip on the film and/or a gate chip on the film.
  • a repair method of a display device comprising the steps of: detecting whether there is a disconnection in a display area; determining that there is a disconnection, causing the control line to output a predetermined voltage to cause the TFT to be turned on, Thereby connecting the repair line to the data line or the scan line; repairing by laser welding The portion of the line that intersects and is insulated from the data line and/or scan line.
  • 1 and 2 are a repair method of a display device of the prior art
  • line defects of the display device may be caused due to process defects.
  • the existing repair method is to laserly weld the two overlapping points of the repair line and the output line to finally achieve line repair.
  • the repair process is cumbersome because two laser weldings are required.
  • the inventive concept provides a display device capable of reducing a laser welding process, simplifying a process, and improving repair efficiency, and a repairing method thereof.
  • a display device including a display area and a non-display area.
  • the display area is arranged with a plurality of pixels that emit three-color lights such as red, yellow, and blue by control of the control lines.
  • the non-display area is located on the periphery of the display area, and metal wiring is disposed on the non-display area.
  • the display device further includes a repairing line 4 disposed around the display area, wherein the repairing line 4 may include a portion 41 disposed on the chip 20 and a portion 42 disposed outside the chip 20.
  • the TFT is disposed in the chip 20, wherein the gate of the TFT is connected to the control line 6, the source of the TFT is connected to the repair line 4, and the drain of the TFT is connected to the data line or the scan line 5.
  • the TFT when it is detected that the scan line/data line 5 is broken, the TFT can be controlled to be turned on (for example, the gate control signal is applied to the TFT through the control line 6) to make the scan line/data line 5 is connected to the repairing line 1 while the second portion of the scanning/data line 5 insulated from and intersecting with the repairing line 1 is laser welded.
  • the above chip may include a source-on-film chip and/or a gate-on-film chip.
  • the plurality of on-film source chips may be disposed outside the display area and may be disposed between the printed circuit board and the display area. In this case, the plurality of on-film source chips may be spaced apart along the outside of the display area.
  • the above chip may further include a gate-on-chip chip.
  • a plurality of on-film gate chips may be disposed outside the display region, and may be disposed at a position adjacent to a position where the source chip is disposed on the film, wherein the plurality of on-gate gate chips may be displayed along the display The outer sides of the area are spaced apart.
  • the TFTs are respectively connected to the repair line 4 and the data lines and/or the scan lines 5.
  • the connection of the repair line 4 and the data line and/or the scan line 5 to the TFT side can be controlled by the TFT (for example, the TFT can be controlled by the TFT to be near the point B shown in FIG.
  • the repair line 4 is connected to the data line and/or the scan line 5), so that the step of welding the point B such as shown in FIG. 1 by laser can be omitted.
  • Fig. 1 of the prior art it is necessary to separately perform laser welding on points B and C.
  • the C point needs to be laser welded, and the connection of the repair line 4 and the data line and/or the scan line 5 near the point B is realized by the conduction of the TFT (the laser point B is not required to be welded).
  • the step of laser welding at point B is omitted.
  • a TFT connecting a repair line and a scan line/data line may be disposed on a source chip such as a film, wherein a gate of the TFT is controlled by the control line 6, detecting When the scan line/data line is disconnected, the control signal can be applied through the control line 6 (for example, a control voltage of 3.3 V is applied through the control line 6) to open the TFT, thereby causing the repair line 4 to communicate with the scan line/data line 5.
  • the repair process of the scan line and/or the data line 5 can be completed by laser welding by laser repair. .

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  • Optics & Photonics (AREA)
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  • Crystallography & Structural Chemistry (AREA)
  • Mathematical Physics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
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Abstract

一种显示装置及其修复方法，所述显示装置包括显示区域和非显示区域，其中，所述显示装置还包括：修补线（4），设置在显示区域的外围；TFT，设置在芯片（20）上，其中，TFT的栅极连接至控制线（6），TFT的源极连接至修补线（4），TFT的漏极连接至数据线或扫描线（5）。

Description

显示装置及其修复方法 技术领域
本发明属于显示装置的制造领域，具体地讲，涉及一种显示装置及其修复方法。
背景技术
TFT-LCD(薄膜晶体管液晶显示器)是当前平板显示的主要品种之一，已经成为了现代IT、视讯产品中重要的显示平台。TFT-LCD主要驱动原理，系统主板将R/G/B压缩信号、控制信号及动力通过线材与印刷电路板(PCB)上的连接器相连接，数据经过PCB上的时序控制器集成电路处理后，经PCB，通过膜上源极芯片S-COF和膜上栅极芯片G-COF与显示区域连接，从而使得LCD获得所需的电源、信号。
实际的使用中，因为制程缺陷，可能会造成线缺陷。现有的修复方式如图1所示，其中，显示区域100的周围分别设置有膜上栅极芯片20和膜上源极芯片30，其中，膜上栅极芯片设置在印刷电路板10和显示区域100之间。当输出线5上的A点为断点时，造成从A至地侧无法显示，表现为断线。为修复此断线，将修补线4和输出线5的交叠点B、C通过镭射熔接，AB段的数据通过原有的输出线传输，AC段的数据通过修复线传输，最终实现线修复。
申请号为CN201110402001.5的中国专利申请公开了一种液晶显示装置的修复方法，当有一源极线发生断线时，将发生断线的源极线与其相交叠的对应修复信号线在交叠部分通过激光熔接，将发生断线的源极线的信号电压经修复信号线引出至修复单元进行信号修复，控制器根据修复线的走线长短控制相对应的补偿电压开关的闭合，然后将相对应的补偿电压V输入修复单元内，和经过修复的信号电压合并后作为修复电压输出至修复线，通过将发生断线的源极线的另一端与其相交叠的对应修复线在交叠部分通过激光熔接，从而经修复线将修复电压输送至对应断线的源极线另一端，完成源极线的修复过程。
然而，现有技术的显示装置的上述修复方法较为繁琐，且需要两次镭射熔接工序，修复效率低。
发明内容
本发明的一个目的在于克服上述现有技术的不足，提供一种可以减少一次镭射熔接工序，简化过程，提高修复效率的显示装置。
本发明的另一目的在于克服上述现有技术的不足，提供一种可以减少一次镭射熔接工序，简化过程，提高修复效率的显示装置的修复方法。
根据本发明的一方面，提供了一种显示装置，所述显示装置包括显示区域和非显示区域，其中，所述显示装置还包括：修补线，设置在显示区域的外围；TFT，设置在芯片上，其中，TFT的栅极连接至控制线，TFT的源极连接至修补线，TFT的漏极连接至数据线或扫描线。
根据本发明的示例性实施例，修补线可以包括与数据线和/或扫描线绝缘并交叉的第一部分和第二部分，第一部分可以靠近TFT，第二部分可以远离TFT。
根据本发明的示例性实施例，TFT的栅极受控制线控制可以使修补线与数据线或扫描线断开或连接。
根据本发明的示例性实施例，芯片可以为膜上源极芯片和/或膜上栅极芯片。
根据本发明的示例性实施例，膜上源极芯片可以设置在显示区域的外侧，并且可以设置在印刷电路板与显示区域之间，其中，多个膜上源极芯片可以沿着显示区域的外侧间隔布置。
根据本发明的示例性实施例，膜上栅极芯片可以设置在显示区域的外侧，并且可以设置在与膜上源极芯片被设置的位置处相邻的位置处，其中，多个膜上栅极芯片可以沿显示区域的外侧间隔布置。
根据本发明的另一方面，提供了一种显示装置的修复方法，所述方法包括以下步骤：检测显示区域是否存在断线；确定存在断线，使控制线输出预定电压，以使TFT开启，从而使修补线与数据线或扫描线连通；通过镭射熔接修补 线与数据线和/或扫描线交叉并绝缘的部分。
根据本发明的示例性实施例，修补线与数据线和/或扫描线交叉并绝缘的部分可以为修补线的第二部分。
附图说明
图1和图2是现有技术的显示装置的修复方法；
图3是根据本发明的示例性实施例的显示装置的修复方法。
具体实施方式
以下，将结合示例性实施例来描述根据本发明的示例性实施例的显示装置及其修复方法，但本发明并不限制于以下的示例性实施例。相反，这些示例只是解释性和说明性的，并将权利要求的保护范围完整地传递给本领域技术人员。
在本发明的权利要求和说明书中会出现顺序描述的步骤，然而，这些步骤不必须是顺序地执行。也就是说，对于两个顺序描述的步骤，它们可以按照描述的顺序依次执行，也可以根据工艺的需要选择同时执行，或者也可以以相反的顺序执行，或者它们之间也可以存在中间步骤。
在现有技术中，因为制程缺陷，可能会造成显示装置的线缺陷。然而，对于上述线缺陷，现有的修复方式为将修复线和输出线的两处交叠点通过镭射熔接以最终实现线修复。然而，对于上述修复方法，由于需要两次镭射熔接，使得修复过程繁琐。
本发明构思提供了一种可以减少一次镭射熔接工序，简化过程，提高修复效率的显示装置及其修复方法。
以下，将参照图3来详细描述根据本发明构思的显示装置及其修复方法。
根据本发明的一方面，提供了一种显示装置，所述显示装置包括显示区域和非显示区域。显示区域布置有多个像素，所述多个像素通过控制线的控制而发射诸如红、黄和蓝的三色光。非显示区域位于显示区域的外围，非显示区域上布置有金属布线。
此外，所述显示装置还包括：修补线4，围绕显示区域设置，其中修补线4可以包括设置在芯片20上的部分41和设置在芯片20外部的部分42。TFT，设置在芯片20内，其中，TFT的栅极连接至控制线6，TFT的源极连接至修补线4，TFT的漏极连接至数据线或扫描线5。
根据本发明的示例性实施例，修补线4可以包括与数据线和/或扫描线5绝缘并交叉的第一部分和第二部分，其中，第一部分靠近TFT，第二部分远离TFT。例如，可以参照图1中示出的现有技术，所述第一部分可以类似地对应于图1所示的现有技术中的修补线4的与数据线和/或扫描线5交叉并绝缘的B点，所述第二部分可以类似地对应于图1所示的现有技术中的修补线4的与数据线和/或扫描线5交叉并绝缘的C点。根据本发明的示例性实施例，当检测出扫描线/数据线5断线时，可以控制TFT打开(例如，通过控制线6施加栅极控制信号使TFT打开)，以使扫描线/数据线5与修补线1连通，同时将扫描线/数据线5与修补线1绝缘并交叉的第二部分通过镭射熔接。
根据本发明的示例性实施例，上述芯片可以包括膜上源极芯片和/或膜上栅极芯片。其中，多个膜上源极芯片可以设置在显示区域的外侧，并且可以设置在印刷电路板与显示区域之间。这种情况下，所述多个膜上源极芯片可以沿显示区域的外侧间隔布置。
根据本发明的示例性实施例，上述芯片还可以包括膜上栅极芯片。其中，多个膜上栅极芯片可以设置在显示区域的外侧，并且可以设置在与膜上源极芯片被设置的位置处相邻的位置处，其中，多个膜上栅极芯片可以沿显示区域的外侧间隔布置。
现有技术中，如图1中所示，当输出线5上的A点为断点时，造成从A至地侧无法显示，表现为断线。为修复此断线，将修补线4和输出线5的交叠点B、C通过镭射熔接，AB段的数据通过原有的输出线传输，AC段的数据通过修复线传输，最终实现线修复。
相比之下，根据上面描述的本发明的示例性实施例的包括修补线和TFT的显示装置，TFT分别连接至修补线4及数据线和/或扫描线5。在对显示装置的线缺陷进行修复时，由于可以通过TFT来控制修补线4与数据线和/或扫描线5靠近TFT侧的连接(例如，可以通过TFT控制图1中示出的B点附近处 的修补线4与数据线和/或扫描线5的连接)，从而可以省略通过镭射熔接诸如图1中示出的B点的步骤。
换言之，在现有技术的图1中，需要对B点和C点分别进行激光熔接。然而根据本发明，则仅需要对C点进行激光熔接，B点附近处的修补线4及数据线和/或扫描线5的连接通过TFT的导通来实现(无需通过激光熔接B点)，从而省略了例如B点的一次激光熔接的步骤。
综上所述，根据本发明的示例性实施例，连接修补线和扫描线/数据线的TFT可以设置在诸如膜上源极芯片上，其中，TFT的栅极受控制线6的控制，检测出扫描线/数据线断线时，可以通过控制线6施加控制信号(例如，通过控制线6施加3.3V的控制电压)使TFT打开，从而使修补线4与扫描线/数据线5连通。此外，对于扫描线/数据线5与修补线4交叉并绝缘的部分(例如，修补线的第二部分)，可以通过镭射熔接，从而经修补线完成扫描线和/或数据线5的修复过程。
应当理解，虽然本说明书按照实施方式加以描述，但并非每个实施方式仅包含一个独立的技术方案，说明书的这种叙述方式仅仅是为清楚起见，本领域技术人员应当将说明书作为一个整体，各实施方式中的技术方案也可以经适当组合，形成本领域技术人员可以理解的其他实施方式。
上文所列出的一系列的详细说明仅仅是针对本发明的可行性实施方式的具体说明，它们并非用以限制本发明的保护范围，凡未脱离本发明技术的精神所作的等效实施方式或变更均应包含在本发明的保护范围之内。

Claims (8)

  1. 一种显示装置，所述显示装置包括显示区域和非显示区域，其中，所述显示装置还包括：
    修补线，设置在显示区域的外围；
    TFT，设置在芯片上，其中，TFT的栅极连接至控制线，TFT的源极连接至修补线，TFT的漏极连接至数据线或扫描线。
  2. 如权利要求1所述的显示装置，其中，修补线包括与数据线和/或扫描线绝缘并交叉的第一部分和第二部分，第一部分靠近TFT，第二部分远离TFT。
  3. 如权利要求1所述的显示装置，其中，TFT的栅极受控制线控制使修补线与数据线或扫描线断开或连接。
  4. 如权利要求1所述的显示装置，其中，芯片为膜上源极芯片和/或膜上栅极芯片。
  5. 如权利要求4所述的显示装置，其中，膜上源极芯片设置在显示区域的外侧，并且设置在印刷电路板与显示区域之间，其中，多个膜上源极芯片沿着显示区域的外侧间隔布置。
  6. 如权利要求5所述的显示装置，其中，膜上栅极芯片设置在显示区域的外侧，并且设置在与膜上源极芯片被设置的位置处相邻的位置处，其中，多个膜上栅极芯片沿显示区域的外侧间隔布置。
  7. 一种如权利要求1的显示装置的修复方法，所述方法包括以下步骤：
    检测显示区域是否存在断线；
    确定存在断线，使控制线输出预定电压，以使TFT开启，从而使修补线与数据线或扫描线连通；
    通过镭射熔接修补线与数据线和/或扫描线交叉并绝缘的部分。
  8. 如权利要求7所述的显示装置的修复方法，其中，修补线与数据线和/或扫描线交叉并绝缘的部分为修补线的第二部分。
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