WO2018001263A1 - 电源噪声测量的方法及装置 - Google Patents

电源噪声测量的方法及装置 Download PDF

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Publication number
WO2018001263A1
WO2018001263A1 PCT/CN2017/090503 CN2017090503W WO2018001263A1 WO 2018001263 A1 WO2018001263 A1 WO 2018001263A1 CN 2017090503 W CN2017090503 W CN 2017090503W WO 2018001263 A1 WO2018001263 A1 WO 2018001263A1
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time domain
domain amplitude
amplitude data
frequency
file
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PCT/CN2017/090503
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English (en)
French (fr)
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付毓
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中兴通讯股份有限公司
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Publication of WO2018001263A1 publication Critical patent/WO2018001263A1/zh

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/26Measuring noise figure; Measuring signal-to-noise ratio
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere

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  • the present disclosure relates to the field of communications, for example, to a method and apparatus for power supply noise measurement.
  • the oscilloscope In the power supply noise measurement in the related art, the oscilloscope is usually directly tested.
  • the bandwidth limitation of the oscilloscope is generally 20MHz low-pass setting, that is, the collected noise includes 0-20MHz; but in the actual noise measurement, only 0-20MHz is needed. Measurement of a certain frequency band, which will introduce unnecessary band noise.
  • the noise in the 50KHz-20MHz band is usually the focus of the test, and the noise in the 0-50KHz band is introduced, which will result in the loss of test data. Reference value. To reduce the error, measurements need to be made in a test environment with a high-pass filter, which complicates the test environment and requires expensive filter costs.
  • the present disclosure provides a method and apparatus for power supply noise measurement to solve the problem that noise measurement introduces unnecessary band noise in a test environment without a filter, resulting in loss of reference value of test data.
  • the embodiment provides a method for measuring power supply noise, the method comprising:
  • a time domain waveform within a predetermined frequency band is drawn according to the first time domain amplitude data, and a peak-to-peak value for storing the first time domain amplitude data is calculated.
  • the steps to the processed first time domain amplitude data include:
  • the processed first time domain amplitude data is calculated according to the second time domain amplitude data, the low corner frequency, the steepness of the high pass filter corner frequency, and the sampling frequency.
  • the step of obtaining the sampling frequency includes:
  • the sampling frequency is calculated based on the number of second time domain amplitude data and the time difference.
  • the step of calculating the processed first time domain amplitude data according to the second time domain amplitude data, the low turning frequency, the steepness of the high pass filter corner frequency, and the sampling frequency comprises:
  • the first time domain amplitude data is calculated based on the normalized sampling frequency, the steepness of the high pass filter corner frequency, the high pass filter type, and the second time domain amplitude data.
  • the step of drawing the time domain waveform in the predetermined frequency band according to the first time domain amplitude data, and calculating the peak to peak value of the first time domain amplitude data is:
  • the peak-to-peak value of the first time domain amplitude data is stored in a pre-created log file.
  • the log file is a text file.
  • the original sampled data file is a character separated value CSV file.
  • the embodiment provides a device for measuring power supply noise, the device comprising:
  • the acquisition module is set to: obtain the original sample data file of the voltage ripple test;
  • the first processing module is configured to: perform digital filtering processing of a predetermined frequency band range according to the original sampled data file, and obtain the processed first time domain amplitude data;
  • the second processing module is configured to: draw a time domain waveform within a predetermined frequency band according to the first time domain amplitude data, and calculate a peak to peak value of the first time domain amplitude data.
  • the first processing module includes:
  • Obtaining a submodule configured to: obtain second time domain amplitude data of the original sampled data file, a low corner frequency of the predetermined frequency band range, a steepness of the high pass filter corner frequency, and a sampling frequency;
  • the calculation submodule is configured to: calculate the processed first time domain amplitude data according to the second time domain amplitude data, the low corner frequency, the steepness of the high pass filter corner frequency, and the sampling frequency.
  • the obtaining submodule includes:
  • the obtaining unit is configured to: obtain the number of the second time domain amplitude data and the time difference between the first and last two time domain amplitude data;
  • the first calculating unit is configured to: calculate the sampling frequency according to the number of the second time domain amplitude data and the time difference.
  • the calculating submodule comprises:
  • a second calculating unit configured to: calculate a Nyquist sampling frequency according to the sampling frequency
  • a third calculating unit configured to: calculate a normalized sampling frequency according to the low turning frequency and the Nyquist sampling frequency
  • the fourth calculating unit is configured to: calculate the first time domain amplitude data according to the normalized sampling frequency, the steepness of the high pass filter corner frequency, the high pass filter type, and the second time domain amplitude data.
  • the second processing module includes:
  • the storage submodule is configured to: store the peak-to-peak value of the first time domain amplitude data in a pre-created log file.
  • the log file is a text file.
  • the original sampled data file is a character separated value CSV file.
  • the embodiment further provides a computer readable storage medium storing computer executable instructions for performing the above method.
  • the embodiment further provides a power supply noise measuring device including one or more processors, a memory, and one or more programs, the one or more programs being stored in the memory when being one or more When the processors are executed, the above method is executed.
  • the embodiment further provides a computer program product comprising a computer program stored on a non-transitory computer readable storage medium, the computer program comprising program instructions, when the program instructions are executed by a computer Having the computer perform any of the methods described above.
  • the method and device for measuring power supply noise obtain the original sampled data file of the voltage ripple test; perform digital filtering processing of a predetermined frequency band according to the original sampled data file, and obtain the processed First time domain amplitude data; plotting a time domain waveform within a predetermined frequency band according to the first time domain amplitude data, and calculating a peak to peak value of the first time domain amplitude data, which can be performed in a test environment without a filter Accurate measurement, provide data guarantee for power supply PDN analysis, reduce test difficulty and cost, and solve the problem that the existing noise measurement introduces unnecessary frequency band noise in the test environment without filter, resulting in loss of reference value of test data. .
  • FIG. 1 is a schematic flow chart showing a method for measuring power supply noise provided by this embodiment
  • FIG. 2 is a schematic structural diagram of an apparatus for measuring power supply noise provided by the embodiment
  • FIG. 3 is a view showing an example of the recorded content of the original sampled data file in the embodiment
  • FIG. 4 is a diagram showing an example of acquiring an original sample data file in the embodiment
  • FIG. 5 is a schematic diagram showing waveform images respectively drawn according to the first time domain amplitude data and the second time domain amplitude data in the embodiment
  • Figure 6 is a view showing an example of the recorded contents of the recorded file in the embodiment.
  • FIG. 7 is a schematic diagram showing the steepness of the filter corner frequency under different order values in the embodiment.
  • FIG. 8 is a schematic diagram showing the hardware structure of a power supply noise measuring device according to this embodiment.
  • the embodiment provides a method for measuring power supply noise, which can accurately measure in a test environment without a filter, provide data guarantee for power supply PDN analysis, and reduce test difficulty and cost.
  • FIG. 1 is a schematic flowchart diagram of a method for measuring power supply noise provided by this embodiment, where the method may include:
  • step 110 the raw sample data file of the voltage ripple test is acquired.
  • the original sample data file is obtained in advance according to the voltage ripple test, and the original sample data file may include a sampling time point and original sample data corresponding to the sampling time point.
  • the unit of the sampling time point can be set according to the actual application scenario, such as seconds.
  • the sampling rate of the original sampled data file is not less than 100 MHz, and the sampling point is not less than 1 M points. In this way, frequency aliasing of the data after the noise digital filtering process can be avoided.
  • the raw sampled data file can be derived from an oscilloscope export.
  • step 120 digital filtering processing of a predetermined frequency band range is performed according to the original sampled data file and the processed first time domain amplitude data is obtained.
  • a predetermined frequency band range is set in advance, which is a test frequency band range required in an actual voltage ripple test.
  • the data of the unnecessary frequency band can be filtered out to prepare for the subsequent steps.
  • the unit of the first time domain amplitude data is volts.
  • step 130 a time domain waveform within a predetermined frequency band is drawn according to the first time domain amplitude data, and a peak-to-peak value for storing the first time domain amplitude data is calculated.
  • the corresponding time domain waveform is drawn according to the first time domain amplitude data obtained after the processing, and the corresponding peak-to-peak value is saved, that is, the power supply noise test in the predetermined frequency band is completed.
  • the time domain waveform corresponding to the first time domain amplitude data is drawn by using the plot function plot function according to the first time domain amplitude data.
  • the raw sample data file is a Comma-Separated Values (CSV) file.
  • CSV Comma-Separated Values
  • step 120 the step of performing digital filtering processing and obtaining the processed first time domain amplitude data according to the original sampled data file and the predetermined frequency band range may include:
  • the second time domain amplitude data of the original sampled data file, the low corner frequency of the predetermined frequency band range, the steepness of the high pass filter corner frequency, and the sampling frequency are obtained.
  • the original sample data in the original sampled data file includes second time domain amplitude data
  • the second time domain amplitude data is a sample amplitude corresponding to the sampling time point.
  • the processed first time domain amplitude data is calculated according to the second time domain amplitude data, the low corner frequency, the steepness of the high pass filter corner frequency, and the sampling frequency.
  • the first time domain amplitude data is obtained by a function operation according to the second time domain amplitude data, the low corner frequency, the steepness of the high pass filter corner frequency, and the sampling frequency.
  • the step of acquiring the sampling frequency may include:
  • the sampling frequency is calculated according to the number of second time domain amplitude data and the time difference.
  • the number of the second time domain amplitude data is obtained, that is, the number of samples of the original data file is obtained; and the time difference between the first and last two time domain amplitude data is obtained, that is, the first sample corresponding to the sampling start is obtained.
  • Get the sampling frequency For example, when the sampling time point is in seconds, the sampling frequency is obtained as the number of sampling points in 1 second.
  • step 120 the step of calculating the processed first time domain amplitude data is performed according to the second time domain amplitude data, the low corner frequency, the steepness of the high pass filter corner frequency, and the sampling frequency.
  • the Nyquist sampling frequency is calculated based on the sampling frequency.
  • the Nyquist sampling frequency is calculated.
  • the normalized sampling frequency is calculated based on the low corner frequency and the Nyquist sampling frequency.
  • the first time domain amplitude data is calculated based on the normalized sampling frequency, the steepness of the high pass filter corner frequency, the high pass filter type, and the second time domain amplitude data.
  • the first time domain amplitude data can be obtained by a function operation according to the normalized sampling frequency, the steepness of the high-pass filter corner frequency, the high-pass filter type, and the second time-domain amplitude data.
  • the a, b parameters are the normalized filter corner frequency, and the order is Qualcomm.
  • step 130 the time domain waveform in the predetermined frequency band is drawn according to the first time domain amplitude data, and the step of storing the peak-to-peak value of the first time domain amplitude data is calculated to include:
  • the peak-to-peak value of the first time domain amplitude data is stored in a pre-created log file.
  • the peak-to-peak value (Vpk-pk) is calculated from the first time-domain amplitude data, and then the peak-to-peak value is stored in the log file, and the test waveform name can be correspondingly stored in the log file.
  • the record file is a text file, for example, a txt file.
  • the record file can be named record.
  • the peak-to-peak value before processing that is, the peak-to-peak value corresponding to the second time-domain amplitude data is also stored in the record file.
  • the power supply noise measurement method obtains the original sample data file of the voltage ripple test; performs digital filtering processing of the predetermined frequency band range according to the original sample data file, and obtains the processed first time domain amplitude data; And calculating a time domain waveform in a predetermined frequency band according to the first time domain amplitude data, and calculating a peak value and peak value of the first time domain amplitude data, and acquiring measurement data in a predetermined frequency band required for actual noise measurement, Accurate measurement in a test environment without filters, providing data guarantee for power supply PDN analysis, while reducing test difficulty and cost, and solving the noise measurement in related art will introduce unnecessary in the test environment without filter Band noise, which causes the test data to lose reference value.
  • the embodiment further provides a system for implementing the above method.
  • FIG. 2 a schematic structural diagram of an apparatus for power supply noise measurement provided by this embodiment is shown.
  • the apparatus may include: an acquisition module 210, a first processing module 220, and a second processing module 230.
  • the obtaining module 210 is configured to: obtain an original sampling data file of the voltage ripple test;
  • the first processing module 220 is configured to: perform digital filtering processing of a predetermined frequency band range according to the original sampling data file, and obtain the processed first time domain amplitude data;
  • the second processing module 230 is configured to: draw a time domain waveform within a predetermined frequency band according to the first time domain amplitude data, and calculate a peak-to-peak value for storing the first time domain amplitude data.
  • the first processing module 220 may include: an acquisition submodule and a calculation submodule.
  • Obtaining a submodule configured to: obtain second time domain amplitude data of the original sampled data file, a low corner frequency of the predetermined frequency band range, a steepness of the high pass filter corner frequency, and a sampling frequency;
  • the calculation submodule is configured to: calculate the processed first time domain amplitude data according to the second time domain amplitude data, the low corner frequency, the steepness of the high pass filter corner frequency, and the sampling frequency.
  • the obtaining submodule may include: an obtaining unit and a first calculating unit.
  • the obtaining unit is configured to: obtain the number of the second time domain amplitude data and the time difference between the first and last two time domain amplitude data;
  • the first calculating unit is configured to: calculate the sampling frequency according to the number of the second time domain amplitude data and the time difference.
  • the calculation sub-module may include: a second calculation unit, a third calculation unit, and a fourth calculation unit.
  • a second calculating unit configured to: calculate a Nyquist sampling frequency according to the sampling frequency
  • a third calculating unit configured to: calculate a normalized sampling frequency according to the low turning frequency and the Nyquist sampling frequency
  • the fourth calculating unit is configured to: calculate the first time domain amplitude data according to the normalized sampling frequency, the steepness of the high pass filter corner frequency, the high pass filter type, and the second time domain amplitude data.
  • the second processing module 230 can include: a storage submodule.
  • the storage submodule is configured to: store the peak-to-peak value of the first time domain amplitude data in a pre-created log file.
  • the record file is a text file.
  • the original sampled data file is a character-separated value CSV file.
  • the device for measuring power supply noise provided by the above embodiments belongs to the same concept as the method for measuring power supply noise, and has corresponding functions and effects.
  • the device for measuring power supply noise obtains the original sampled data file of the voltage ripple test; performs digital filtering processing of the predetermined frequency band range according to the original sampled data file, and obtains the processed first time domain amplitude data; And calculating a time domain waveform in a predetermined frequency band according to the first time domain amplitude data, and calculating a peak value and peak value of the first time domain amplitude data, and acquiring measurement data in a predetermined frequency band required for actual noise measurement, Accurate measurement in a test environment without a filter, providing data guarantee for power supply PDN analysis, reducing test difficulty and cost, and solving the noise measurement in the related art to introduce unnecessary frequency bands in a test environment without a filter Noise, which causes the test data to lose reference value.
  • the open source software Python (using Python 3.4 as an example) is used as a programming language.
  • the method steps provided in this embodiment are completed by running a Python script.
  • the Python script is a text format file with a suffix named py, for example, filter_bandpass.py;
  • the operating system in the example is a windows system.
  • the original sampled data file is a CSV file.
  • each voltage ripple test result will be exported.
  • the original sampling data file includes a sampling time point and second time domain amplitude data corresponding to the sampling time point.
  • column A is a sampling time point
  • the unit is second (second), B. Listed as second time domain magnitude data in Volt.
  • sys retrieves the windows system information of the command console to get the current path and file name.
  • the Python script only gets the CSV file (ie, 'PCIE_PVDD.csv' in Figure 4, 'WC14_VDD1V0.csv', 'WC16_PVDD1V0.csv', 'WC7_VDD1V0 .csv') identifies and imports.
  • the parameter data is the second time domain amplitude data (in the form of a list);
  • the lowcut is a low turning frequency of the predetermined frequency band range, for example, a turning frequency of 50 KHz, lowcut is equal to 50000;
  • fs is the sampling frequency, and the sampling frequency is calculated: calculating data The time difference between [n-1] (that is, the last second time domain amplitude data) and data[0] (that is, the first second time domain amplitude data), and the number of data points in the data list is divided by the time difference.
  • y is the first time domain amplitude data; then the (y, t) filtered time domain waveform is drawn by the plot function, and Calculate the peak-to-peak size in y: traverse the y list and subtract the minimum value from the maximum value to get the peak-to-peak value.
  • t is the time list, that is, the sampling time point
  • y is the first time domain amplitude data
  • label is the peak-to-peak value displayed on the drawn image.
  • the value corresponding to the time t[0] is y[0].
  • the Python script draws the waveform image of the first time domain amplitude data processed by the digital filtering of each CSV file, that is, the waveform diagram of the white background in FIG. 5, and the waveform diagram of the black matrix in FIG.
  • the waveform diagram drawn by the second time domain amplitude data shows that the first time domain amplitude data has filtered out noise relative to the second time domain amplitude data, and the second time domain amplitude data has a peak-to-peak value of 4.0 mV.
  • the peak-to-peak value (pk2pk) of the processed first time domain amplitude data is 1.24874 mV.
  • the peak-to-peak value corresponding to the second time-domain amplitude data, the peak-to-peak value of the first time-domain amplitude data, and the test waveform name are stored in a log file, wherein the record file is a txt file, and the record file is The name is record, the first column "signal name" in the log file is the test waveform name, "unprocessed pk2pk” is the peak-to-peak value corresponding to the second time-domain amplitude data, and "processed pk2pk” is the first time-domain amplitude data. Corresponding peak-to-peak value.
  • the record file record.txt is a text file that is automatically created in the same level directory of the script each time the Python script is run. Running it again will overwrite the original text.
  • Python scripts need to pass parameters, that is, low frequency corner frequency values.
  • the following functions can be used.
  • each functional module in this embodiment may be integrated into one processing unit, or each functional module may exist physically separately, or two or more functional modules may be integrated into one unit.
  • the functional modules if implemented in the form of software functional modules and sold or used as separate products, may be stored in a computer readable storage medium. Based on such understanding, a portion of the technical solution of the present disclosure that contributes in essence or to the related art or a part of the technical solution may be embodied in the form of a software product stored in a storage medium, including several The instructions are for causing a computer device (which may be a personal computer, server, or network device, etc.) to perform all or part of the steps of the method described in this embodiment.
  • the foregoing storage medium includes a medium such as a USB flash drive, a mobile hard disk, a ROM, a RAM, a magnetic disk, or an optical disk that can store program codes.
  • FIG. 8 is a schematic diagram showing the hardware structure of a power supply noise measuring apparatus according to the present embodiment.
  • the power supply noise measuring apparatus includes one or more processors 410 and a memory 420.
  • One processor 410 is taken as an example in FIG.
  • the power supply noise measuring device may further include: an input device 430 and an output device 440.
  • the processor 410, the memory 420, the input device 430, and the output device 440 in the power supply noise measuring device may be connected by a bus or other means, and the bus connection is taken as an example in FIG.
  • the input device 430 can receive input numeric or character information
  • the output device 440 can include a display device such as a display screen.
  • the memory 420 is a computer readable storage medium that can be used to store software programs, computer executable programs, and modules.
  • the processor 410 executes various functional applications and data processing by executing software programs, instructions, and modules stored in the memory 420 to implement any of the above-described embodiments.
  • the memory 420 may include a storage program area and an storage data area, wherein the storage program area may store an operating system, an application required for at least one function; the storage data area may store data created according to use of the power supply noise measuring device, and the like.
  • the memory may include a volatile memory such as a random access memory (RAM), and may also include a non-volatile memory. For example, at least one disk storage device, flash memory device, or other non-transitory solid state storage device.
  • Memory 420 can be a non-transitory computer storage medium or a transitory computer storage medium.
  • the non-transitory computer storage medium such as at least one magnetic disk storage device, flash memory device, or other non-volatile solid state storage device.
  • memory 420 can optionally include memory remotely located relative to processor 410, which can be connected to a power supply noise measurement device over a network. Examples of the above networks may include the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.
  • Input device 430 can be used to receive input digital or character information and to generate key signal inputs related to user settings and function control of the power supply noise measuring device.
  • Output device 440 can include a display device such as a display screen.
  • the power supply noise measuring apparatus of this embodiment may further include a communication device 450 that transmits and/or receives information over the communication network.
  • a person skilled in the art can understand that all or part of the process of implementing the above embodiment method can be completed by executing related hardware by a computer program, and the program can be stored in a non-transitory computer readable storage medium.
  • the program when executed, may include the flow of an embodiment of the method as described above, wherein the non-transitory computer readable storage medium may be a magnetic disk, an optical disk, a read only memory (ROM), or a random access memory (RAM). Wait.
  • the present disclosure provides a method and apparatus for power supply noise measurement, which can accurately measure in a test environment without a filter, provide data guarantee for power supply PDN analysis, reduce test difficulty and cost, and solve test without filter.
  • the noise measurement in the related art introduces unnecessary band noise, resulting in the problem that the test data loses the reference value.

Abstract

一种电源噪声测量的方法及装置,其中,该方法包括:获取电压纹波测试的原始采样数据文件(110);根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据(120);根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值(130)。

Description

电源噪声测量的方法及装置 技术领域
本公开涉及通信领域,例如是指一种电源噪声测量的方法及装置。
背景技术
在通信领域中,单板的交换能力以及处理能力越来越大,随之带来的是能耗的增加。为减少能耗,对于单板的电源的要求越来越高,并且,很多重要的芯片,例如:交换芯片,处理器CPU等,对于电源纹波是有要求的。因此,在实际单板加工后,要对其进行电源噪声测量,来评估整板的电源分配网络(Power Distribution Network,PDN),以分析电源完整性。
相关技术中的电源噪声测量中,通常采用示波器直接测试,示波器的带宽限制一般为20MHz低通设置,即采集到的噪声包含0-20MHz;但在实际噪声测量中,只需要对0-20MHz中的某一频带范围进行测量,这样则会引入不必要的频带噪声,例如,通常50KHz-20MHz频带范围的噪声是测试所关注的,则引入0-50KHz频带的噪声,这样,将导致测试数据失去参考价值。若要减小误差,则需要在设置有高通滤波器的测试环境下进行测量,这使得测试环境复杂,且需要支付昂贵的滤波器费用。
发明内容
本公开提供一种电源噪声测量的方法及装置,以解决在没有滤波器的测试环境下,噪声测量会引入不必要的频带噪声,导致测试数据失去参考价值的问题。
第一方面,本实施例提供一种电源噪声测量的方法,该方法包括:
获取电压纹波测试的原始采样数据文件;
根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;
根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值。
可选地,根据原始采样数据文件,进行预定频带范围的数字滤波处理并得 到处理后的第一时域幅值数据的步骤包括:
获取原始采样数据文件的第二时域幅值数据、预定频带范围的低转折频率、高通滤波器转折频率的陡峭程度以及采样频率;
根据第二时域幅值数据、低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据。
可选地,获取采样频率的步骤包括:
获取第二时域幅值数据的个数以及首尾两个第二时域幅值数据之间的时间差;
根据第二时域幅值数据的个数以及时间差,计算采样频率。
可选地,根据第二时域幅值数据、低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据的步骤包括:
根据采样频率计算乃奎斯特采样频率;
根据低转折频率以及乃奎斯特采样频率计算归一化后采样频率;
根据归一化后采样频率、高通滤波器转折频率的陡峭程度、高通滤波器类型以及第二时域幅值数据,计算第一时域幅值数据。
可选地,根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值的步骤包括:
将第一时域幅值数据的峰峰值存储在预先创建的记录文件中。
可选地,记录文件为文本文件。
可选地,原始采样数据文件为字符分隔值CSV文件。
第二方面,本实施例提供一种电源噪声测量的装置,该装置包括:
获取模块,设置为:获取电压纹波测试的原始采样数据文件;
第一处理模块,设置为:根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;
第二处理模块,设置为:根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值。
可选地,第一处理模块包括:
获取子模块,设置为:获取原始采样数据文件的第二时域幅值数据、预定频带范围的低转折频率、高通滤波器转折频率的陡峭程度以及采样频率;
计算子模块,设置为:根据第二时域幅值数据、低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据。
可选地,获取子模块包括:
获取单元,设置为:获取第二时域幅值数据的个数以及首尾两个第二时域幅值数据之间的时间差;
第一计算单元,设置为:根据第二时域幅值数据的个数以及时间差,计算采样频率。
可选地,计算子模块包括:
第二计算单元,设置为:根据采样频率计算乃奎斯特采样频率;
第三计算单元,设置为:根据低转折频率以及乃奎斯特采样频率计算归一化后采样频率;
第四计算单元,设置为:根据归一化后采样频率、高通滤波器转折频率的陡峭程度、高通滤波器类型以及第二时域幅值数据,计算第一时域幅值数据。
可选地,第二处理模块包括:
存储子模块,设置为:将第一时域幅值数据的峰峰值存储在预先创建的记录文件中。
可选地,记录文件为文本文件。
可选地,原始采样数据文件为字符分隔值CSV文件。
本实施例还提供一种计算机可读存储介质,存储有计算机可执行指令,所述计算机可执行指令用于执行上述方法。
本实施例还提供一种电源噪声测量设备,该电源噪声测量设备包括一个或多个处理器、存储器以及一个或多个程序,所述一个或多个程序存储在存储器中,当被一个或多个处理器执行时,执行上述方法。
本实施例还提供了一种计算机程序产品,所述计算机程序产品包括存储在非暂态计算机可读存储介质上的计算机程序,所述计算机程序包括程序指令,当所述程序指令被计算机执行时,使所述计算机执行上述任意一种方法。
与相关技术相比,本实施例提供的电源噪声测量的方法及装置,通过获取电压纹波测试的原始采样数据文件;根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值,能够在没有滤波器的测试环境下做到准确测量,为电源PDN分析提供数据保障,同时降低测试难度和费用,解决了在没有滤波器的测试环境下,现有的噪声测量引入不必要的频带噪声,导致测试数据失去参考价值的问题。
附图说明
图1表示本实施例提供的电源噪声测量的方法的流程示意图;
图2表示本实施例提供的电源噪声测量的装置的结构示意图;
图3表示本实施例中原始采样数据文件的记录内容示例图;
图4表示本实施例中获取原始采样数据文件的示例图;
图5表示本实施例中分别根据第一时域幅值数据和第二时域幅值数据绘制的波形图像的示意图;
图6表示本实施例中记录文件的记录内容示例图;
图7表示本实施例中不同order值下滤波器转折频率陡峭程度的示意图;
图8是本实施例提供的一种电源噪声测量设备的硬件结构示意图。
具体实施方式
在不冲突的情况下,以下实施例和实施例中的特征可以相互组合。
在相关技术中的噪声测量过程中,采用示波器直接测试,这样会引入不必要的频带噪声,例如,通常测试的0-20MHz频带噪声为6mVp-p,而实际需要的50KHz-20MHz频带噪声为3mVp-p,则由于引入不必要的0-50KHz频带噪声,使得测试数据失去参考价值。若需要准确测量噪声,则需要在进入示波器前加上高通滤波器,以滤除0-50KHz的噪声,以减少误差,但是采用高通滤波器器件会使得测试环境复杂,且需要支付昂贵的滤波器费用,成本高昂。为此,本实施例提供一种电源噪声测量的方法,能够在没有滤波器的测试环境下做到准确测量,为电源PDN分析提供数据保障,同时降低测试难度和费用。
请参见图1,图1示出的是本实施例提供的电源噪声测量的方法的流程示意图,该方法可以包括:
在步骤110中,获取电压纹波测试的原始采样数据文件。
这里,预先根据电压纹波测试得到原始采样数据文件,该原始采样数据文件中可以包括采样时间点以及与采样时间点对应的原始采样数据。其中,该采样时间点的单位可以根据实际应用场景进行设定,例如秒。另外,在实际应用中,该原始采样数据文件的采样率不小于100MHz,且采样点不少于1M个点, 这样,可以避免噪声数字滤波处理后的数据发生频率混叠。在一种示例中,该原始采样数据文件可以根据示波器导出获取。
在步骤120中,根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据。
这里,预先设定了预定频带范围,该预定频带范围为实际电压纹波测试中所需的测试频带范围。根据原始采样数据文件,通过预定频带范围的数字滤波处理,得到所需的第一时域幅值数据,即可滤除不需要的频段的数据,以为后续步骤做准备。该第一时域幅值数据的单位为伏特。
在步骤130中,根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值。
这里,根据处理后得到的第一时域幅值数据绘制对应的时域波形,并计算保存对应的峰峰值,即完成预定频带范围内的电源噪声测试。其中,可以根据第一时域幅值数据采用绘图函数plot函数绘制第一时域幅值数据绘制对应的时域波形。
在一实施例中,原始采样数据文件为字符分隔值(Comma-Separated Values,CSV)文件。
在一实施例中,在步骤120中,根据原始采样数据文件以及预定频带范围,进行数字滤波处理并得到处理后的第一时域幅值数据的步骤可以包括:
获取原始采样数据文件的第二时域幅值数据、预定频带范围的低转折频率、高通滤波器转折频率的陡峭程度以及采样频率。
这里,原始采样数据文件中的原始采样数据包括第二时域幅值数据,该第二时域幅值数据为与采样时间点对应的采样幅值。获取第二时域幅值数据、预定频带范围的低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,为后续计算第一时域幅值数据做准备。
根据第二时域幅值数据、低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据。
这里,根据第二时域幅值数据、低转折频率、高通滤波器转折频率的陡峭程度以及采样频率通过函数运算得到第一时域幅值数据。
其中,在步骤120中,获取采样频率的步骤可以包括:
获取第二时域幅值数据的个数以及首尾两个第二时域幅值数据之间的时间 差;根据第二时域幅值数据的个数以及时间差,计算采样频率。
这里,获取第二时域幅值数据的个数,即获取原始数据文件的采样个数;获取首尾两个第二时域幅值数据之间的时间差,即获取采样开始对应的第一个采样时间点与采样结束对应的最后一个采样时间点之间的时间差;然后根据获得的第二时域幅值数据的个数以及时间差,通过第二时域幅值数据的个数除以时间差,计算得到采样频率。例如,当采样时间点的单位为秒时,得到采样频率为1秒中采样点的个数。
在一实施例中,在步骤120中,根据第二时域幅值数据、低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据的步骤可以包括:
根据采样频率计算乃奎斯特采样频率。
这里,计算乃奎斯特采样频率,该乃奎斯特采样频率为采样频率的一半,公式为:nyq=0.5*fs,其中,nyq为乃奎斯特采样频率,fs为采样频率。
根据低转折频率以及乃奎斯特采样频率计算归一化后采样频率。
这里,根据获得的预定频带范围的低转折频率以及计算得到乃奎斯特采样频率,计算得到归一化后采样频率,计算公式为low=lowcut/nyq,其中,low为归一化后采样频率,lowcut为低转折频率,例如当低转折频率为50KHz,则lowcut=50000。
根据归一化后采样频率、高通滤波器转折频率的陡峭程度、高通滤波器类型以及第二时域幅值数据,计算第一时域幅值数据。
这里,根据归一化后采样频率、高通滤波器转折频率的陡峭程度、高通滤波器类型以及第二时域幅值数据即可通过函数运算得到第一时域幅值数据。通过函数运算公式:b,a=butter(order,low,btype=′high′),计算a,b参数值,其中,该a,b参数为归一化后的滤波器转折频率,order为高通滤波器转折频率的陡峭程度,缩写为ord,例如取5,btype表示滤波器类型,btype=′high′表示为高通滤波器类型,btype还可以为表示低通滤波器类型的′low′以及表示带通滤波器类型的′band′;通过函数运算公式:y=lfilter(b,a,data),计算得到第一时域幅值数据,其中,y表示第一时域幅值数据,data表示第二时域幅值数据。
在一实施例中,在步骤130中,根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值的步骤可以包括:
将第一时域幅值数据的峰峰值存储在预先创建的记录文件中。
这里,根据第一时域幅值数据计算得到峰峰值(Vpk-pk),然后将峰峰值存储在记录文件中,同时可以将测试波形名称对应存储在该记录文件中。其中,记录文件为文本文件,例如,txt文件,这里,可以将该记录文件命名为record。另外,为便于对比及分析,记录文件中还存储有处理前的峰峰值,即第二时域幅值数据对应的峰峰值。
本实施例提供的电源噪声测量的方法,通过获取电压纹波测试的原始采样数据文件;根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值,能够获取到实际噪声测量所需的预定频带范围内的测量数据,能够在没有滤波器的测试环境下做到准确测量,为电源PDN分析提供数据保障,同时降低测试难度和费用,解决了在没有滤波器的测试环境下,相关技术中的噪声测量会引入不必要的频带噪声,导致测试数据失去参考价值的问题。
基于以上方法,本实施例还提供一种用以实施上述方法的系统。请参见图2,示出的是本实施例提供的电源噪声测量的装置的结构示意图,该装置可以包括:获取模块210、第一处理模块220以及第二处理模块230。
获取模块210,设置为:获取电压纹波测试的原始采样数据文件;
第一处理模块220,设置为:根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;
第二处理模块230,设置为:根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值。
其中,第一处理模块220可以包括:获取子模块以及计算子模块。
获取子模块,设置为:获取原始采样数据文件的第二时域幅值数据、预定频带范围的低转折频率、高通滤波器转折频率的陡峭程度以及采样频率;
计算子模块,设置为:根据第二时域幅值数据、低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据。
其中,获取子模块可以包括:获取单元以及第一计算单元。
获取单元,设置为:获取第二时域幅值数据的个数以及首尾两个第二时域幅值数据之间的时间差;
第一计算单元,设置为:根据第二时域幅值数据的个数以及时间差,计算采样频率。
其中,计算子模块可以包括:第二计算单元、第三计算单元以及第四计算单元。
第二计算单元,设置为:根据采样频率计算乃奎斯特采样频率;
第三计算单元,设置为:根据低转折频率以及乃奎斯特采样频率计算归一化后采样频率;
第四计算单元,设置为:根据归一化后采样频率、高通滤波器转折频率的陡峭程度、高通滤波器类型以及第二时域幅值数据,计算第一时域幅值数据。
其中,第二处理模块230可以包括:存储子模块。
存储子模块,设置为:将第一时域幅值数据的峰峰值存储在预先创建的记录文件中。
其中,记录文件为文本文件。
其中,原始采样数据文件为字符分隔值CSV文件。
上述实施例提供的电源噪声测量的装置与电源噪声测量的方法属于同一构思,具备相应的功能和效果。
本实施例提供的电源噪声测量的装置,通过获取电压纹波测试的原始采样数据文件;根据原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值,能够获取到实际噪声测量所需的预定频带范围内的测量数据,能够在没有滤波器的测试环境下做到准确测量,为电源PDN分析提供数据保障,同时降低测试难度和费用,解决了在没有滤波器的测试环境下,相关技术中的噪声测量引入不必要的频带噪声,导致测试数据失去参考价值的问题。
下面再通过一个示例,对本公开作更为详细的说明。
该示例中采用开源软件Python(以Python 3.4为例)作为编程语言,通过运行Python脚本完成本实施例提供的方法步骤,Python脚本为文本格式的文件,后缀名为py,例如filter_bandpass.py;该示例中的操作系统为windows系统。首先,安装Python脚本交互解析器,并且安装有scipy模块、pandas模块、matplotlib模块,并且预先通过将示波器的时基调整为10ms档,待噪声信号稳 定下来,停止示波器,保存波形图片,并将原始采样数据文件导出,原始采样数据文件为CSV文件,通常测试时,会测量多个不同点的电压纹波,每个电压纹波测试结果会导出对应的一个CSV文件。如图3所示,该原始采样数据文件中包括采样时间点以及与采样时间点对应的第二时域幅值数据,图3中,A列为采样时间点,单位为秒(second),B列为第二时域幅值数据,单位为伏特(Volt)。
另外,可以将多个测试点的电压纹波测试得到的CSV文件存放在Python脚本的同级目录下。这里,通过python自带库中的import os,sys调取命令台的windows系统信息以获取当前路径和文件名。利用windows系统的批处理命令dir,获取当前目录信息(Python脚本所在目录),存放在dir列表当中;然后借助str.split,以回车拆分a字符串,提取有效目录的绝对地址,存放在dir列表中;通过Os.listdir(str(dir))获取该目录下的所有文件名字,以字符串列表形式存放在filenamesl中;遍历filenamesl查找有效文件名字*.cvs,存放在filenames,字符串列表中;然后,通过遍历filenames获取CSV文件(这里即为原始采样数据文件),通过pandas导入并解读CSV文件。这样,可以利用遍历filenames获取到的文件的扩展名为CSV,即认为该文件是要处理的文件,即原始采样数据文件。如图4所示,在Python脚本所在目录中存有多个文件,Python脚本只获取CSV文件(即图4中的′PCIE_PVDD.csv′,′WC14_VDD1V0.csv′,′WC16_PVDD1V0.csv′,′WC7_VDD1V0.csv′)识别并导入。
这里采用Python提供的numpy和pylab开源库。预先自定义函数def butter_highpass_filter(data,lowcut,fs,order=5)。其中,参数data为第二时域幅值数据(采用列表形式);lowcut为预定频带范围的低转折频率,例如50KHz的转折频率,lowcut等于50000;fs为采样频率,采样频率的计算:计算data[n-1](即最后一个第二时域幅值数据)与data[0](即第一个第二时域幅值数据)的时间差,用data列表数据点的个数除以时间差,得到1秒中采样点的个数,即采样频率fs;order是表示高通滤波器转折频率的陡峭程度,默认是5,该参数也可以根据需要选择,如图7所示(图7中横坐标为频率(Frequency),单位Hz;纵坐标为增益(Gain)),当order(缩写为ord)等于不同值时,滤波器转折频率的陡峭程度不同,order值越大,则越陡峭。自定义函数def butter_highpass_filter调用了butter函数(from scipy.signal import butter),butter用于计算a,b参数,该a,b参数为归一化后的滤波器转折频率。
nyq=0.5*fs
low=lowcut/nyq
b,a=butter(order,low,btype=′high′)
然后将a,b代入y=lfilter(b,a,data)函数计算y值,y表示第一时域幅值数据;再通过plot函数绘出(y,t)滤波后的时域波形,并计算y中峰峰值大小:遍历y列表,用最大值减去最小值得到峰峰值。
plt.plot(t,y,label=′pk2pk:%g mV′%((max(y)-min(y))*1000))
其中,t为时间列表,即采样时间点,y为第一时域幅值数据,label是在绘制图像上显示峰峰值。其中,t[0]时刻对应的值是y[0]。如图5所示,Python脚本把每个CSV文件数字滤波处理后的第一时域幅值数据绘制出波形图像,即图5中白底的波形图,图5中黑底的波形图为第二时域幅值数据绘制出的波形图,可以看出,第一时域幅值数据相对第二时域幅值数据已经过滤掉噪声,第二时域幅值数据的峰峰值为4.0mV,处理后的第一时域幅值数据的峰峰值(pk2pk)为1.24874mV。
如图6所示,将第二时域幅值数据对应的峰峰值、第一时域幅值数据的峰峰值及测试波形名称存储在记录文件中,其中,记录文件为txt文件,记录文件的名称为record,在记录文件中的第一列“signal name”为测试波形名称,“unprocessed pk2pk”为第二时域幅值数据对应的峰峰值,“processed pk2pk”为第一时域幅值数据对应的峰峰值。记录文件record.txt是每次运行Python脚本在脚本同级目录下自动创建的文本文件,再次运行会覆盖原先的文本。
另外,Python脚本需要传参,即低频转折频率数值。可以采用下述函数。
if_name_==′_main_′:
main(sys.argv)
需要在命令提示符下进入到Python脚本所在目录,输入:python filter_bandpass.py***(***为低频转折频率,如50000),该参数会传递给sys.argv[1]。
另外,出于使用方便考虑,在Python脚本的同级目录下,建立批处理文件,在批处理文件中写入python filter_bandpass.py****(****为低频转折频率),如python filter_bandpass.py 50000。每次双击该批处理文件即可运行Python脚本执行方法操作。这样,使用Python脚本处理,实现批量处理功能,统一测试,统 一换算处理,减少工作量。
需要说明的是,在实施例中,诸如第一和第二等之类的关系术语仅仅用来将一个实体或者操作与另一个实体或操作区分开来,而不一定要求或者暗示这些实体或操作之间存在任何这种实际的关系或者顺序。
另外,在本实施例中的每个功能模块可以集成在一个处理单元中,也可以是每个功能模块单独物理存在,也可以两个或两个以上功能模块集成在一个单元中。
所述功能模块如果以软件功能模块的形式实现并作为独立的产品销售或使用时,可以存储在一个计算机可读取存储介质中。基于这样的理解,本公开的技术方案本质上或者说对相关技术做出贡献的部分或者该技术方案的部分可以以软件产品的形式体现出来,该计算机软件产品存储在一个存储介质中,包括若干指令用以使得一台计算机设备(可以是个人计算机,服务器,或者网络设备等)执行本实施例所述方法的全部或部分步骤。而前述的存储介质包括:U盘、移动硬盘、ROM、RAM、磁碟或者光盘等可以存储程序代码的介质。
图8是根据本实施例的一种电源噪声测量设备的硬件结构示意图,如图8所示,该电源噪声测量设备包括:一个或多个处理器410和存储器420。图8中以一个处理器410为例。
所述电源噪声测量设备还可以包括:输入装置430和输出装置440。
所述电源噪声测量设备中的处理器410、存储器420、输入装置430和输出装置440可以通过总线或者其他方式连接,图8中以通过总线连接为例。
输入装置430可以接收输入的数字或字符信息,输出装置440可以包括显示屏等显示设备。
存储器420作为一种计算机可读存储介质,可用于存储软件程序、计算机可执行程序以及模块。处理器410通过运行存储在存储器420中的软件程序、指令以及模块,从而执行多种功能应用以及数据处理,以实现上述实施例中的任意一种方法。
存储器420可以包括存储程序区和存储数据区,其中,存储程序区可存储操作系统、至少一个功能所需要的应用程序;存储数据区可存储根据电源噪声测量设备的使用所创建的数据等。此外,存储器可以包括随机存取存储器(Random Access Memory,RAM)等易失性存储器,还可以包括非易失性存储器, 例如至少一个磁盘存储器件、闪存器件或者其他非暂态固态存储器件。
存储器420可以是非暂态计算机存储介质或暂态计算机存储介质。该非暂态计算机存储介质,例如至少一个磁盘存储器件、闪存器件、或其他非易失性固态存储器件。在一些实施例中,存储器420可选包括相对于处理器410远程设置的存储器,这些远程存储器可以通过网络连接至电源噪声测量设备。上述网络的实例可以包括互联网、企业内部网、局域网、移动通信网及其组合。
输入装置430可用于接收输入的数字或字符信息,以及产生与电源噪声测量设备的用户设置以及功能控制有关的键信号输入。输出装置440可包括显示屏等显示设备。
本实施例的电源噪声测量设备还可以包括通信装置450,通过通信网络传输和/或接收信息。
本领域普通技术人员可理解实现上述实施例方法中的全部或部分流程,是可以通过计算机程序来执行相关的硬件来完成的,该程序可存储于一个非暂态计算机可读存储介质中,该程序在执行时,可包括如上述方法的实施例的流程,其中,该非暂态计算机可读存储介质可以为磁碟、光盘、只读存储记忆体(ROM)或随机存储记忆体(RAM)等。
工业实用性
本公开提供一种电源噪声测量的方法及装置,可以在没有滤波器的测试环境下做到准确测量,为电源PDN分析提供数据保障,同时降低测试难度和费用,解决了在没有滤波器的测试环境下,相关技术中的噪声测量引入不必要的频带噪声,导致测试数据失去参考价值的问题。

Claims (15)

  1. 一种电源噪声测量的方法,包括:
    获取电压纹波测试的原始采样数据文件;
    根据所述原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;
    根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值。
  2. 根据权利要求1所述的方法,所述根据所述原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据的步骤包括:
    获取所述原始采样数据文件的第二时域幅值数据、预定频带范围的低转折频率、高通滤波器转折频率的陡峭程度以及采样频率;
    根据所述第二时域幅值数据、所述低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据。
  3. 根据权利要求2所述的方法,获取所述采样频率的步骤包括:
    获取所述第二时域幅值数据的个数以及首尾两个第二时域幅值数据之间的时间差;
    根据所述第二时域幅值数据的个数以及所述时间差,计算所述采样频率。
  4. 根据权利要求2所述的方法,所述根据所述第二时域幅值数据、所述低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据的步骤包括:
    根据所述采样频率计算乃奎斯特采样频率;
    根据所述低转折频率以及所述乃奎斯特采样频率计算归一化后采样频率;
    根据所述归一化后采样频率、所述高通滤波器转折频率的陡峭程度、高通滤波器类型以及所述第二时域幅值数据,计算所述第一时域幅值数据。
  5. 根据权利要求1所述的方法,所述根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值的步骤包括:
    将所述第一时域幅值数据的峰峰值存储在预先创建的记录文件中。
  6. 根据权利要求5所述的方法,所述记录文件为文本文件。
  7. 根据权利要求1所述的方法,所述原始采样数据文件为字符分隔值CSV文件。
  8. 一种电源噪声测量的装置,所述装置包括:
    获取模块,设置为:获取电压纹波测试的原始采样数据文件;
    第一处理模块,设置为:根据所述原始采样数据文件,进行预定频带范围的数字滤波处理并得到处理后的第一时域幅值数据;
    第二处理模块,设置为:根据第一时域幅值数据绘制预定频带范围内的时域波形,并计算保存第一时域幅值数据的峰峰值。
  9. 根据权利要求8所述的装置,所述第一处理模块包括:
    获取子模块,设置为:获取所述原始采样数据文件的第二时域幅值数据、预定频带范围的低转折频率、高通滤波器转折频率的陡峭程度以及采样频率;
    计算子模块,设置为:根据所述第二时域幅值数据、所述低转折频率、高通滤波器转折频率的陡峭程度以及采样频率,计算得到处理后的第一时域幅值数据。
  10. 根据权利要求9所述的装置,所述获取子模块包括:
    获取单元,设置为:获取所述第二时域幅值数据的个数以及首尾两个第二时域幅值数据之间的时间差;
    第一计算单元,设置为:根据所述第二时域幅值数据的个数以及所述时间差,计算所述采样频率。
  11. 根据权利要求9所述的装置,所述计算子模块包括:
    第二计算单元,设置为:根据所述采样频率计算乃奎斯特采样频率;
    第三计算单元,设置为:根据所述低转折频率以及所述乃奎斯特采样频率计算归一化后采样频率;
    第四计算单元,设置为:根据所述归一化后采样频率、所述高通滤波器转折频率的陡峭程度、高通滤波器类型以及所述第二时域幅值数据,计算所述第一时域幅值数据。
  12. 根据权利要求8所述的装置,所述第二处理模块包括:
    存储子模块,设置为:将所述第一时域幅值数据的峰峰值存储在预先创建的记录文件中。
  13. 根据权利要求12所述的装置,所述记录文件为文本文件。
  14. 根据权利要求8所述的装置,所述原始采样数据文件为字符分隔值CSV文件。
  15. 一种计算机可读存储介质,存储有计算机可执行指令,所述计算机可执 行指令用于执行权利要求1-7任一项的方法。
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