WO2017181499A1 - 一种面板检测电路及液晶显示面板 - Google Patents

一种面板检测电路及液晶显示面板 Download PDF

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Publication number
WO2017181499A1
WO2017181499A1 PCT/CN2016/084743 CN2016084743W WO2017181499A1 WO 2017181499 A1 WO2017181499 A1 WO 2017181499A1 CN 2016084743 W CN2016084743 W CN 2016084743W WO 2017181499 A1 WO2017181499 A1 WO 2017181499A1
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Prior art keywords
test
line
switch
test switch
control line
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Ceased
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PCT/CN2016/084743
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English (en)
French (fr)
Inventor
甘启明
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TCL China Star Optoelectronics Technology Co Ltd
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Shenzhen China Star Optoelectronics Technology Co Ltd
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Priority to US15/312,447 priority Critical patent/US20180180959A1/en
Publication of WO2017181499A1 publication Critical patent/WO2017181499A1/zh
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136286—Wiring, e.g. gate line, drain line
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/13306—Circuit arrangements or driving methods for the control of single liquid crystal cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/1368—Active matrix addressed cells in which the switching element is a three-electrode device
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
    • G02F1/1362—Active matrix addressed cells
    • G02F1/136254—Checking; Testing

Definitions

  • the present invention relates to the field of detection circuits, and in particular, to a panel detection circuit and a liquid crystal display panel.
  • Liquid crystal display It is one of the most widely used flat panel displays, and is widely used as a display for notebook computers or mobile phones. Due to the large market demand, the design of the process or panel structure has been continuously improved and improved, in order to ensure the display quality of the liquid crystal display. Generally, the liquid crystal display panel is tested to find the problem product as early as possible, thereby reducing the waste of subsequent processes.
  • a test line is usually disposed on the array substrate of the liquid crystal display panel to connect the signal lines of the liquid crystal display panel.
  • the liquid crystal display panel has red sub-pixels, green sub-pixels, and blue.
  • the color sub-pixel when testing the liquid crystal display panel, inputs a red sub-pixel test signal, a green sub-pixel test signal, and a green sub-pixel test signal to the liquid crystal display panel through the red sub-pixel test line 103, the green sub-pixel test line 102, and the blue sub-pixel test line 101.
  • the blue sub-pixel test signal at the data end, the blue sub-pixel test signal is input to the data signal line by the blue sub-pixel test line 101, at this time, because the data signal line and the green sub-pixel test line 102 and the red sub-pixel test
  • the line 103 has overlapping regions, and the two overlapping regions 104 and 105 may have a short circuit phenomenon during the process. When a short circuit occurs at any one place, the blue sub-pixel test signal input by the blue sub-pixel test line 101 will Passed to other data signal lines, so it is impossible to distinguish whether there is an abnormal problem in the panel display area; similarly, it is tested by green sub-pixels.
  • the line 102 inputs the green sub-pixel test signal to the data signal line.
  • the overlap region 106 may be short-circuited during the process, and the green sub-pixel test line
  • the input green sub-pixel test signal of 102 will be transmitted to other data signal lines, so that it is impossible to distinguish whether there is an abnormality in the panel display area.
  • the invention provides a panel detecting circuit, which can effectively solve the technical problem that the short-circuit phenomenon occurs in the overlapping area in the prior art, so that the entire panel test cannot be performed.
  • the present invention provides a panel detecting circuit, including:
  • test switch connected to the data signal line, the test switch being a thin film transistor
  • test line connected to the test switch, comprising: a first test line for inputting a red sub-pixel test signal to the test switch, and a second test line for inputting a green sub-pixel test signal to the test switch And a third test line for inputting a blue sub-pixel test signal to the test switch;
  • a control line connected to the test switch comprising: a first control line, a second control line, and a third control line; wherein the first control line is used to open a test switch connected to the first test line
  • the second control line is configured to open a test switch connected to the second test line
  • the third control line is used to open a test switch connected to the third test line.
  • the test switch has a source, a drain and a gate, the source is connected to the test line, the drain is connected to the data signal line, and the gate is connected to the control line.
  • the test signal input by the test line has a minimum display level value.
  • the test switch has a minimum activation level value that is less than the lowest display level value.
  • the panel detecting circuit further includes a driving circuit component disposed on the substrate, wherein the driving circuit component is electrically connected to the data signal line.
  • the data signal line has a metal terminal for receiving the test signal.
  • the invention also provides a panel detecting circuit, comprising:
  • test line connected to the test switch, comprising: a first test line for inputting a red sub-pixel test signal to the test switch, and a second test line for inputting a green sub-pixel test signal to the test switch And a third test line for inputting a blue sub-pixel test signal to the test switch;
  • a control line connected to the test switch comprising: a first control line, a second control line, and a third control line; wherein the first control line is used to open a test switch connected to the first test line
  • the second control line is configured to open a test switch connected to the second test line
  • the third control line is used to open a test switch connected to the third test line.
  • the test switch is a thin film transistor.
  • the test switch has a source, a drain and a gate, the source is connected to the test line, the drain is connected to the data signal line, and the gate is connected to the control line.
  • the test signal input by the test line has a minimum display level value.
  • the test switch has a minimum activation level value that is less than the lowest display level value.
  • the panel detecting circuit further includes a driving circuit component disposed on the substrate, wherein the driving circuit component is electrically connected to the data signal line.
  • the data signal line has a metal terminal for receiving the test signal.
  • a liquid crystal display panel comprising: a panel detecting circuit, comprising:
  • test line connected to the test switch, comprising: a first test line for inputting a red sub-pixel test signal to the test switch, and a second test line for inputting a green sub-pixel test signal to the test switch And a third test line for inputting a blue sub-pixel test signal to the test switch;
  • a control line connected to the test switch comprising: a first control line, a second control line, and a third control line; wherein the first control line is used to open a test switch connected to the first test line
  • the second control line is configured to open a test switch connected to the second test line
  • the third control line is used to open a test switch connected to the third test line.
  • the test signal input by the test line has a minimum display level value.
  • the test switch has a minimum activation level value that is less than the lowest display level value.
  • the panel detecting circuit provided by the present invention sets a plurality of test switches on the plurality of data signal lines, and controls the test switches with a control line, so that when a short circuit occurs in an overlapping area, the entire panel test can continue After the test, the test line can be cut without using a laser, and an additional laser cutting step can be avoided. Furthermore, the test switch can be formed simultaneously with the active elements of the pixel without requiring additional processing steps.
  • FIG. 1 is a schematic diagram of a conventional panel detecting circuit
  • FIG. 2 is a schematic diagram of an embodiment of a panel detecting circuit of the present invention.
  • FIG. 2 is a schematic diagram of an embodiment of a panel detecting circuit of the present invention.
  • a test switch 207 connected to the data signal line 217; and a test line connected to the test switch 207, including: a red sub-pixel test signal for inputting the test switch 207 a first test line 203, a second test line 202 for inputting a green sub-pixel test signal to the test switch 207, and a third test line 201 for inputting a blue sub-pixel test signal to the test switch 207; a control line connected to the test switch 207, comprising: a first control line 206, a second control line 205, and a third control line 204; wherein the first control line 206 is used to open and the first a test switch 207 connected to the test line 203, the second control line 205 is used to open a test switch 207 connected to the second test line 202, and the third control line 204 is used to open the third test line 201 connected test switch 207.
  • the data signal line 217 has an external drain input terminal 208 for receiving the input signal.
  • the input terminal 208 is disposed on one side of the data signal line 217 and is connected to the test switch 207.
  • the test switch 207 is connected between the input terminal 208 of the data signal line 217 and the test line, and can be turned on or off when the liquid crystal display panel is tested to allow or prevent the test signal from being transmitted from the test line to the data signal line 217.
  • the test switch 207 is a thin film transistor.
  • the test switch 207 has a source, a drain and a gate. The source is connected to the test line, and the drain is connected to the data signal line 217. The gate is connected to the control line.
  • the test switch 207 and the active component of the liquid crystal display panel can be simultaneously formed on the substrate to reduce the process step, that is, in the process of the active component of the liquid crystal display panel, the active component and the test can be simultaneously formed. About the substrate. Therefore, an additional process step may not be required to form the test switch 207.
  • the test line is connected to the test switch 207 for inputting a test signal to the data signal line 217, and an external test unit or test system can transmit the test signal to the data signal line 217 through the test line.
  • the data signal line 217 has a red sub-pixel signal line, a green sub-pixel signal line, and a blue sub-pixel signal line.
  • the data end of the liquid crystal display panel is provided with three test lines, including the first test line 203, a second test line 203 for inputting a red sub-pixel test signal to the test switch 207, and a second test line 202 for inputting green to the test switch 207
  • the sub-pixel test signal is used to input a blue sub-pixel test signal to the test switch 207.
  • the control lines are respectively connected to the test switch 207 for inputting a control signal to the test switch 207 when the liquid crystal display panel is tested, and turning on the switch.
  • the panel detection circuit is provided with three control lines, including a first control line 206, a second control line 205, and a third control line 204.
  • the first control line 206 is used to open and a first test line 203 connected to the test switch 207
  • the second control line 205 is used to open a test switch 207 connected to the second test line 202
  • the third control line 204 is used to open and the third A test switch 207 connected to the test line 201.
  • a test signal is input to the blue sub-pixel signal line through the third test line 201, and the control signal should be input to the blue through the third control line 204.
  • the test switch 207 connected to the sub-pixel signal line is turned on, and the test switch 207 connected to the red sub-pixel signal line and the test switch 207 connected to the green sub-pixel signal are turned off.
  • the test switch 207 connected to the red sub-pixel signal line and the test switch 207 connected to the green sub-pixel signal are turned off, and the test is performed.
  • the signal cannot be passed through the test switch 207 to the data signal line 217 so that the entire panel test can proceed as usual.
  • a test signal is input to the red sub-pixel signal line through the first test line 203, and the control signal should be input to the red sub-pixel signal through the third control line 206.
  • the line-connected test switch 207 is placed in an on state, and the test switch 207 connected to the blue sub-pixel signal line and the test switch 207 connected to the green sub-pixel signal are in a closed state, and the third When the overlap region 211 and the fourth overlap region 212 are short-circuited, the test switch 207 connected to the blue sub-pixel signal line and the test switch 207 connected to the green sub-pixel signal are turned on, but this When the third test line 201 and the second test line 202 have no test signal input, the entire panel test can be performed as usual; the test signal has a lowest level value, that is, only when the level of the test signal is higher than the The lowest level value, the liquid crystal panel will be displayed, and the test switch has a startup level value lower than the lowest level value, when
  • a test signal is input to the green sub-pixel signal line through the second test line 202, and the control signal should be input to the green sub-pixel signal through the second control line 205.
  • the line-connected test switch 207 is placed in an on state, and the test switch 207 connected to the blue sub-pixel signal line and the test switch 207 connected to the red sub-pixel signal are in a closed state, and the seventh
  • the test signal cannot be transmitted to the data signal line 217 through the test switch 207, so that the entire panel test can be performed as usual;
  • the test signal has a lowest level value, that is, only when the level value of the test signal is higher than the lowest level value, the liquid crystal panel displays, and the start level value of the test switch is lower than the lowest level a value, when a short circuit occurs in the eighth overlap region 216, since the start level value of
  • the control signal is stopped from being input to the control line to turn off the test switch 207 so that the test signal cannot be transmitted from the test line to the data signal line 217. Therefore, by testing the switch 207, the path between the test line and the data signal line 217 can be directly turned off, and the test line is not required to be cut by the laser to avoid an additional laser cutting step.
  • the driver circuit assembly (not shown) It can be disposed on the non-display area of the substrate, that is, outside the data signal line 217, for providing a signal to the data signal line 217.
  • the electrical contacts of the driver circuit assembly (not shown)
  • the input terminal 208 of the data signal line 217 can be directly coupled such that the driving circuit component can be electrically connected to the data signal line 217.
  • the drive circuit assembly can be directly bonded to the input terminal 208 of the data signal line 217, and the test line can remain On the liquid crystal display panel after the test, it is not necessary to be cut off to avoid an additional laser cutting step.
  • the panel detecting circuit provided by the present invention controls the test switch by setting a plurality of test switches on the plurality of signal lines, so that when a short circuit occurs in the overlapping area, the entire panel test can continue. And after the test, the test line can be cut without using a laser, and an additional laser cutting step can be avoided. Furthermore, the test switch can be formed simultaneously with the active elements of the pixel without additional process steps.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Mathematical Physics (AREA)
  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Control Of Indicators Other Than Cathode Ray Tubes (AREA)
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  • Liquid Crystal Display Device Control (AREA)

Abstract

一种面板检测电路，包括：多条数据信号线（217）；测试开关（207）；测试线，包括：第一测试线（203）、第二测试线（202）及第三测试线（201）；以及，控制线，包括：第一控制线（206）、第二控制线（205）及第三控制线（204）；其中，第一控制线（206）用于开启与第一测试线（203）连接的测试开关（207），第二控制线（205）用于开启与第二测试线（202）连接的测试开关（207），第三控制线（204）用于开启与第三测试线（201）连接的测试开关（207）。

Description

一种面板检测电路及液晶显示面板 技术领域
本发明涉及一种检测电路技术领域，尤其涉及一种面板检测电路及液晶显示面板。
 背景技术
液晶显示器 (LCD) 是最广泛使用的平板显示器之一，广泛地应用为笔记本电脑或是手机的显示器，且由于市场需求量大，其制程或面板结构的设计方面也有不断的研发改良，为了确保液晶显示器的显示质量，一般都要对液晶显示面板进行测试以尽早发现问题产品，从而减少后续制程的浪费。
目前，在液晶显示面板的检测中，通常在液晶显示面板的阵列基板上设置测试线来连接液晶显示面板的信号线，如图1所示，液晶显示面板具有红色子像素、绿色子像素及蓝色子像素，在液晶显示面板测试时，通过红色子像素测试线103、绿色子像素测试线102及蓝色子像素测试线101向液晶显示面板输入红色子像素测试信号、绿色子像素测试信号及蓝色子像素测试信号，在数据端，由蓝色子像素测试线101输入蓝色子像素测试信号至数据信号线，这时，由于数据信号线与绿色子像素测试线102和红色子像素测试线103有重叠区域，在工艺过程中这两个重叠区域104和105有可能出现短路现象，当任意一处出现短路现象时，蓝色子像素测试线101输入的蓝色子像素测试信号就会传到其它数据信号线上，从而不能区分面板显示区是否有异常问题；同理，由绿色子像素测试线102输入绿色子像素测试信号至数据信号线，这时，由于数据信号线与红色子像素测试线103有重叠区域，在工艺过程中这个重叠区域106有可能出现短路现象，绿色子像素测试线102输入的绿色子像素测试信号就会传到其他数据信号线上，从而不能区分面板显示区是否有异常问题。
当出现重叠区域短路现象时，使得整个面板测试无法进行，故需提供一种面板检测电路，以解决现有技术所存在的问题。
 技术问题
本发明提供一种面板检测电路，可以有效的解决现有技术中因重叠区域出现短路现象，使得整个面板测试无法进行的技术问题。
 技术解决方案
为了解决上述技术问题，本发明提供一种面板检测电路，包括：
多条数据信号线；
测试开关，其与所述数据信号线连接，所述测试开关为薄膜晶体管；
测试线，其与所述测试开关连接，包括：用于向所述测试开关输入红色子像素测试信号的第一测试线、用于向所述测试开关输入绿色子像素测试信号的第二测试线及用于向所述测试开关输入蓝色子像素测试信号的第三测试线；以及，
控制线，其与所述测试开关连接，包括：第一控制线、第二控制线及第三控制线；其中，所述第一控制线用于开启与所述第一测试线连接的测试开关，所述第二控制线用于开启与所述第二测试线连接的测试开关，所述第三控制线用于开启与所述第三测试线连接的测试开关。
所述测试开关具有源极、漏极及栅极，所述源极与所述测试线连接，所述漏极与所述数据信号线连接，所述栅极与所述控制线连接。
所述测试线输入的测试信号具有一最低显示电平值。
所述测试开关具有一最低启动电平值，所述最低启动电平值小于所述最低显示电平值。
所述面板检测电路还包括驱动电路组件，设置于基板上，其中所述驱动电路组件电性连接所述数据信号线。
所述数据信号线具有金属端子，用于接收所述测试信号。
本发明还提供一种面板检测电路，包括：
多条数据信号线；
测试开关，其与所述数据信号线连接；
测试线，其与所述测试开关连接，包括：用于向所述测试开关输入红色子像素测试信号的第一测试线、用于向所述测试开关输入绿色子像素测试信号的第二测试线及用于向所述测试开关输入蓝色子像素测试信号的第三测试线；以及，
控制线，其与所述测试开关连接，包括：第一控制线、第二控制线及第三控制线；其中，所述第一控制线用于开启与所述第一测试线连接的测试开关，所述第二控制线用于开启与所述第二测试线连接的测试开关，所述第三控制线用于开启与所述第三测试线连接的测试开关。
所述测试开关为薄膜晶体管。
所述测试开关具有源极、漏极及栅极，所述源极与所述测试线连接，所述漏极与所述数据信号线连接，所述栅极与所述控制线连接。
所述测试线输入的测试信号具有一最低显示电平值。
所述测试开关具有一最低启动电平值，所述最低启动电平值小于所述最低显示电平值。
所述面板检测电路还包括驱动电路组件，设置于基板上，其中所述驱动电路组件电性连接所述数据信号线。
所述数据信号线具有金属端子，用于接收所述测试信号。
依据本发明的上述目的，提出一种液晶显示面板，包括：面板检测电路，包括：
多条数据信号线；
测试开关，其与所述数据信号线连接；
测试线，其与所述测试开关连接，包括：用于向所述测试开关输入红色子像素测试信号的第一测试线、用于向所述测试开关输入绿色子像素测试信号的第二测试线及用于向所述测试开关输入蓝色子像素测试信号的第三测试线；以及，
控制线，其与所述测试开关连接，包括：第一控制线、第二控制线及第三控制线；其中，所述第一控制线用于开启与所述第一测试线连接的测试开关，所述第二控制线用于开启与所述第二测试线连接的测试开关，所述第三控制线用于开启与所述第三测试线连接的测试开关。
所述测试线输入的测试信号具有一最低显示电平值。
所述测试开关具有一最低启动电平值，所述最低启动电平值小于所述最低显示电平值。
 有益效果
本发明所提供的面板检测电路通过在所述多条数据信号线上设置多个测试开关，并且用控制线控制所述测试开关，使得当在重叠区域出现短路现象时，整个面板测试仍能继续进行，并且检测后可不用通过激光来切断测试线，可以避免额外的激光切断步骤，再者，测试开关可以与像素的主动元件同时形成，而不需要额外的制程步骤。
 附图说明
为了更清楚地说明实施例或现有技术中的技术方案，下面将对实施例或现有技术描述中所需要使用的附图作简单介绍，显而易见地，下面描述中的附图仅仅是发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其他的附图。
图1为现有的面板检测电路示意图；
图2 为本发明面板检测电路实施例示意图。
 本发明的最佳实施方式
以下各实施例的说明是参考附加的图示，用以例示本发明可用以实施的特定实施例。本发明所提到的方向用语，例如[上]、[下]、[前]、[后]、[左]、[右]、[内]、[外]、[侧面]等，仅是参考附加图式的方向。因此，使用的方向用语是用以说明及理解本发明，而非用以限制本发明。在图中，结构相似的单元是用以相同标号表示。
下面结合附图详细本发明实施例的实现过程。
参见图2，为本发明面板检测电路实施例示意图。
本实施例的面板检测电路，包括：
多条数据信号线217；测试开关207，其与所述数据信号线217连接；测试线，其与所述测试开关207连接，包括：用于向所述测试开关207输入红色子像素测试信号的第一测试线203、用于向所述测试开关207输入绿色子像素测试信号的第二测试线202及用于向所述测试开关207输入蓝色子像素测试信号的第三测试线201；以及，控制线，其与所述测试开关207连接，包括：第一控制线206、第二控制线205及第三控制线204；其中，所述第一控制线206用于开启与所述第一测试线203连接的测试开关207，所述第二控制线205用于开启与所述第二测试线202连接的测试开关207，所述第三控制线204用于开启与所述第三测试线201连接的测试开关207。
本实施例中，数据信号线217具有外漏的输入端子208，用于接收输入的信号。输入端子208是设置于数据信号线217的一侧，并连接于测试开关207。
测试开关207连接在数据信号线217的输入端子208与测试线之间，并可在测试液晶显示面板时被开启或关闭，以允许或阻止测试信号由测试线传入数据信号线217。所述测试开关207为薄膜晶体管，此时，测试开关207具有源极、漏极及栅极，所述源极与所述测试线连接，所述漏极与所述数据信号线217连接，所述栅极与所述控制线连接。当然，在本实施例中，测试开关207与液晶显示面板的主动元件可同时形成于基板上，以减少制程步骤，即在液晶显示面板的主动元件的制程中，可同时形成主动元件及测试开关于基板上。因此，可不需要额外的制程步骤来形成测试开关207。
测试线连接于测试开关207，用于输入测试信号至数据信号线217，外部的测试单元或测试系统可通过测试线来传送测试信号至数据信号线217。本实施例中，所述数据信号线217具有红色子像素信号线、绿色子像素信号线及蓝色子像素信号线，液晶显示面板数据端设有三条测试线，包括第一测试线203、第二测试线202及第三测试线201，所述第一测试线203用于向所述测试开关207输入红色子像素测试信号，所述第二测试线202用于向所述测试开关207输入绿色子像素测试信号，所述第三测试线201用于向所述测试开关207输入蓝色子像素测试信号。
控制线分别连接于测试开关207，用于在测试液晶显示面板时输入控制信号至测试开关207，开启开关。本实施例中，所述面板检测电路设有三条控制线，包括第一控制线206、第二控制线205及第三控制线204；其中，所述第一控制线206用于开启与所述第一测试线203连接的测试开关207，所述第二控制线205用于开启与所述第二测试线202连接的测试开关207，所述第三控制线204用于开启与所述第三测试线201连接的测试开关207。
当测试液晶显示面板的蓝色子像素是否正常时，通过第三测试线201输入一测试信号至蓝色子像素信号线，此时应通过第三控制线204输入控制信号至与所述蓝色子像素信号线连接的测试开关207上，使其处于开启状态，同时，与所述红色子像素信号线连接的测试开关207和与所述绿色子像素信号连接的测试开关207处于关闭状态，当第一个重叠区域209和第二个重叠区域210出现短路现象时，由于与所述红色子像素信号线连接的测试开关207和与所述绿色子像素信号连接的测试开关207处于关闭状态，测试信号无法通过测试开关207传至数据信号线217，从而整个面板测试可以照常进行。
当测试液晶显示面板的红色子像素是否正常时，通过第一测试线203输入一测试信号至红色子像素信号线，此时应通过第三控制线206输入控制信号至与所述红色子像素信号线连接的测试开关207上，使其处于开启状态，同时，与所述蓝色子像素信号线连接的测试开关207和与所述绿色子像素信号连接的测试开关207处于关闭状态，当第三个重叠区域211和第四个重叠区域212出现短路现象时，使得与所述蓝色子像素信号线连接的测试开关207和与所述绿色子像素信号连接的测试开关207处于开启状态，但是此时第三测试线201和第二测试线202并无测试信号输入，从而整个面板测试可以照常进行；所述测试信号具有一最低电平值，即只有当测试信号的电平值高于所述最低电平值，液晶面板才会显示，并且所述测试开关的启动电平值低于所述最低电平值，当第五个重叠区域213和第六个重叠区域214出现短路现象时，由于所述测试开关的启动电平值低于所述最低电平值，故即使第五个重叠区域213和第六个重叠区域214出现短路现象，控制信号的启动电平值也不足以使液晶面板有显示，整个面板测试可以照常进行。
当测试液晶显示面板的绿色子像素是否正常时，通过第二测试线202输入一测试信号至绿色子像素信号线，此时应通过第二控制线205输入控制信号至与所述绿色子像素信号线连接的测试开关207上，使其处于开启状态，同时，与所述蓝色子像素信号线连接的测试开关207和与所述红色子像素信号连接的测试开关207处于关闭状态，当第七个重叠区域215出现短路现象时，由于与所述红色子像素信号连接的测试开关207处于关闭状态，测试信号无法通过测试开关207传至数据信号线217，从而整个面板测试可以照常进行；所述测试信号具有一最低电平值，即只有当测试信号的电平值高于所述最低电平值，液晶面板才会显示，并且所述测试开关的启动电平值低于所述最低电平值，当第八个重叠区域216出现短路现象时，由于所述控制信号的启动电平值低于所述最低电平值，故即使第八个重叠区域216出现短路现象，使得与所述红色子像素信号线连接的测试开关207处于开启状态，但是此时第一测试线203并无测试信号输入，从而整个面板测试可以照常进行。
在测试液晶显示面板后，停止向控制线输入控制信号，以关闭测试开关207，使得测试信号无法由测试线传送至数据信号线217。因此，通过测试开关207，可直接关闭测试线与数据信号线217之间的路径，二不需要通过激光来切断测试线，以避免额外的激光切断步骤。
在液晶显示面板 经过测试且确认为正常之后，驱动电路组件 (未显示) 可设置于基板的非显示区上，亦即数据信号线217的外侧，用于提供信号至数据信号线217。此时，驱动电路组件的电性接点 (未显示) 可直接接合于数据信号线217的输入端子208，使得驱动电路组件可电性连接于数据信号线217。在测试液晶显示面板之后，由于数据信号线217与测试线之间的测试开关207为关闭状态，因此，驱动电路组件可直接接合于数据信号线217的输入端子208上，且测试线可仍保留在测试后的液晶显示面板上，而不需被切断，以避免额外的激光切断步骤。
本发明所提供的面板检测电路通过在所述多条信号线上设置多个测试开关，并且用控制线控制所述测试开关，使得当在重叠区域出现短路时，整个面板测试仍能继续进行，并且检测后可不用通过激光来切断测试线，可以避免额外的激光切断步骤，再者，测试开关可以与像素的主动元件同时形成，而不需要额外的制程步骤。
以上所述是本发明的优选实施方式，应当指出，对于本技术领域的普通技术人员来说，在不脱离本发明原理的前提下，还可以做出若干改进和润饰，这些改进和润饰也视为本发明的保护范围。

Claims (20)

  1. 一种面板检测电路，其包括：
    多条数据信号线；
    测试开关，其与所述数据信号线连接，所述测试开关为薄膜晶体管；
    测试线，其与所述测试开关连接，包括：用于向所述测试开关输入红色子像素测试信号的第一测试线、用于向所述测试开关输入绿色子像素测试信号的第二测试线及用于向所述测试开关输入蓝色子像素测试信号的第三测试线；以及，
    控制线，其与所述测试开关连接，包括：第一控制线、第二控制线及第三控制线；其中，所述第一控制线用于开启与所述第一测试线连接的测试开关，所述第二控制线用于开启与所述第二测试线连接的测试开关，所述第三控制线用于开启与所述第三测试线连接的测试开关。
  2. 根据权利要求1所述的面板检测电路，其中所述测试开关具有源极、漏极及栅极，所述源极与所述测试线连接，所述漏极与所述数据信号线连接，所述栅极与所述控制线连接。
  3. 根据权利要求2所述的面板检测电路，其中所述测试线输入的测试信号具有一最低显示电平值。
  4. 根据权利要求3所述的面板检测电路，其中所述测试开关具有一最低启动电平值，所述最低启动电平值小于所述最低显示电平值。
  5. 根据权利要求4所述的面板检测电路，其中还包括驱动电路组件，设置于基板上，其中所述驱动电路组件电性连接所述数据信号线。
  6. 根据权利要求5所述的面板检测电路，其中所述数据信号线具有金属端子，用于接收所述测试信号。
  7. 一种面板检测电路，其包括：
    多条数据信号线；
    测试开关，其与所述数据信号线连接；
    测试线，其与所述测试开关连接，包括：用于向所述测试开关输入红色子像素测试信号的第一测试线、用于向所述测试开关输入绿色子像素测试信号的第二测试线及用于向所述测试开关输入蓝色子像素测试信号的第三测试线；以及，
    控制线，其与所述测试开关连接，包括：第一控制线、第二控制线及第三控制线；其中，所述第一控制线用于开启与所述第一测试线连接的测试开关，所述第二控制线用于开启与所述第二测试线连接的测试开关，所述第三控制线用于开启与所述第三测试线连接的测试开关。
  8. 根据权利要求7所述的面板检测电路，其中所述测试开关为薄膜晶体管。
  9. 根据权利要求8所述的面板检测电路，其中所述测试开关具有源极、漏极及栅极，所述源极与所述测试线连接，所述漏极与所述数据信号线连接，所述栅极与所述控制线连接。
  10. 根据权利要求9所述的面板检测电路，其中所述测试线输入的测试信号具有一最低显示电平值。
  11. 根据权利要求10所述的面板检测电路，其中所述测试开关具有一最低启动电平值，所述最低启动电平值小于所述最低显示电平值。
  12. 根据权利要求11所述的面板检测电路，其中还包括驱动电路组件，设置于基板上，其中所述驱动电路组件电性连接所述数据信号线。
  13. 根据权利要求12所述的面板检测电路，其中所述数据信号线具有金属端子，用于接收所述测试信号。
  14. 一种液晶显示面板，其包括面板检测电路，包括：
    多条数据信号线；
    测试开关，其与所述数据信号线连接；
    测试线，其与所述测试开关连接，包括：用于向所述测试开关输入红色子像素测试信号的第一测试线、用于向所述测试开关输入绿色子像素测试信号的第二测试线及用于向所述测试开关输入蓝色子像素测试信号的第三测试线；以及，
    控制线，其与所述测试开关连接，包括：第一控制线、第二控制线及第三控制线；其中，所述第一控制线用于开启与所述第一测试线连接的测试开关，所述第二控制线用于开启与所述第二测试线连接的测试开关，所述第三控制线用于开启与所述第三测试线连接的测试开关。
  15. 根据权利要求14所述的面板检测电路，其中所述测试开关为薄膜晶体管。
  16. 根据权利要求15所述的面板检测电路，其中所述测试开关具有源极、漏极及栅极，所述源极与所述测试线连接，所述漏极与所述数据信号线连接，所述栅极与所述控制线连接。
  17. 根据权利要求16所述的面板检测电路，其中所述测试线输入的测试信号具有一最低显示电平值。
  18. 根据权利要求17所述的面板检测电路，其中所述测试开关具有一最低启动电平值，所述最低启动电平值小于所述最低显示电平值。
  19. 根据权利要求18所述的面板检测电路，其中还包括驱动电路组件，设置于基板上，其中所述驱动电路组件电性连接所述数据信号线。
  20. 根据权利要求19所述的面板检测电路，其中所述数据信号线具有金属端子，用于接收所述测试信号。
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