WO2017159773A1 - Flexible circuit board and method for manufacturing same - Google Patents

Flexible circuit board and method for manufacturing same Download PDF

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Publication number
WO2017159773A1
WO2017159773A1 PCT/JP2017/010599 JP2017010599W WO2017159773A1 WO 2017159773 A1 WO2017159773 A1 WO 2017159773A1 JP 2017010599 W JP2017010599 W JP 2017010599W WO 2017159773 A1 WO2017159773 A1 WO 2017159773A1
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WO
WIPO (PCT)
Prior art keywords
wiring
mass
adhesive
concentration
less
Prior art date
Application number
PCT/JP2017/010599
Other languages
French (fr)
Japanese (ja)
Inventor
田嶋 久容
博和 奥薗
町田 英明
金子 美晴
Original Assignee
東レエンジニアリング株式会社
東レ・デュポン株式会社
レイテック株式会社
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 東レエンジニアリング株式会社, 東レ・デュポン株式会社, レイテック株式会社 filed Critical 東レエンジニアリング株式会社
Priority to CN201780017461.1A priority Critical patent/CN109076704B/en
Priority to JP2018505995A priority patent/JP6955481B2/en
Priority to KR1020187029099A priority patent/KR102312182B1/en
Publication of WO2017159773A1 publication Critical patent/WO2017159773A1/en

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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • H05K3/281Applying non-metallic protective coatings by means of a preformed insulating foil
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/0011Working of insulating substrates or insulating layers
    • H05K3/0017Etching of the substrate by chemical or physical means
    • H05K3/002Etching of the substrate by chemical or physical means by liquid chemical etching
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/22Secondary treatment of printed circuits
    • H05K3/28Applying non-metallic protective coatings
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0154Polyimide

Definitions

  • the present invention relates to a flexible circuit board and a method for manufacturing the same.
  • FPC flexible wiring board
  • circuit wiring is formed on an insulating resin film
  • various apparatuses and devices incorporating electronic components mounted on FPCs and FPCs are always required to be small, thin, and light, more thin FPCs that can be bent are used.
  • the wiring pitch of the FPC is small, and the component mounting density on the circuit board is increasing.
  • the cover lay film is an insulating resin film coated with an adhesive. After opening the part corresponding to the circuit wiring connection part or component mounting part in the FPC, the cover lay film is pasted on the circuit wiring.
  • the connection part of circuit wiring and the part mounting part in FPC correspond to the opening part of a coverlay film, it will be in the exposed state. By bonding the coverlay film, the mechanical strength of the FPC is also improved, the circuit is protected, and the resistance to bending is also improved.
  • the cover coat is formed by applying and curing on a portion of the circuit wiring other than the connection portion using a material that has an insulating property and is cured by heat or light.
  • the photosensitive cover lay is a sheet of a material that has insulating properties and is cured by light, and is cured by light after being attached to circuit wiring.
  • the coverlay film is provided with an opening in advance and then bonded to the FPC, it takes time to align the opening and a specific part of the circuit wiring in the FPC, and if the bonding position is shifted, it is a defective product. End up.
  • the shape and size of the opening are naturally limited, and the design of the circuit wiring of the FPC is limited. End up.
  • the circuit wiring of the FPC located in the opening of the cover lay film the opposing side surfaces of the adjacent wiring are exposed and there is a possibility that a problem occurs in the insulation between the wirings as the wiring pitch becomes smaller.
  • the wiring at this portion has low peel strength, and the wiring is easy to peel off.
  • the cover coat is applied to the FPC by a printing method, particularly when a photosensitive material is used, the opening can be formed small, so this is an effective method for high-density mounting.
  • the thickness of the FPC is not uniform and the FPC tends to curl after curing. Further, the function of increasing the mechanical strength of FPC is weak, and there is a problem in bending resistance.
  • the present invention has been made in view of such points, and the object of the present invention is to provide a coverlay film having a high degree of freedom in designing the shape and size of the opening bonded to the FPC so that the coverlay It is an object of the present invention to provide a flexible circuit board in which insulation between adjacent wirings is sufficiently secured in wirings positioned in an opening.
  • the flexible circuit board of the present invention includes an insulating film, a wiring formed on the insulating film, and an insulating protective film disposed on the insulating film and a part of the wiring. Is bonded to the insulating film and the wiring via an adhesive, and a portion of the wiring where the protective film is not disposed is exposed to the side or the periphery while the upper surface is exposed. The adhesive is attached. That is, the protective film is not disposed on the wiring except for the part, and the upper surface of the wiring is exposed at that part.
  • the protective film is preferably made of any one of polyimide resin and polyester resin.
  • Another flexible circuit board of the present invention includes an insulating film, a wiring formed on the insulating film, and an insulating protective film disposed on the insulating film and a part of the wiring,
  • the protective film is bonded to the insulating film and the wiring via an adhesive, and the adhesive adheres to the side or the periphery of the wiring in a portion where the protective film is not disposed on the protective film.
  • the adhesive is provided on the insulating film on which the wiring is not formed, and a conductive layer made of a conductive member is placed on the surface of the adhesive and the upper surface of the wiring.
  • the conductive layer may be a plating layer.
  • the method for producing a flexible circuit board of the present invention includes a step of preparing a wiring forming film in which wiring is formed on an insulating film, and a cover sheet in which an adhesive is formed on one surface of the insulating protective film.
  • the protective film is preferably made of any one of polyimide resin and polyester resin, and the adhesive exposing step is preferably performed by etching.
  • the wiring exposure step is preferably performed by etching using a solution containing permanganate and sodium hydroxide.
  • the permanganate is a salt of permanganic acid and a base, and examples thereof include potassium permanganate and sodium permanganate.
  • the solution used in the wiring exposure step has a potassium permanganate concentration of 2 mass% to 18.15 mass% and a sodium hydroxide concentration of 20 mass% or less, or a potassium permanganate concentration of 1. % By mass or more and less than 2% by mass and the concentration of sodium hydroxide is 0.05% by mass or more and 20% by mass or less, or the concentration of potassium permanganate is 0.5% by mass or more and less than 1% by mass and the concentration of sodium hydroxide 0.05 mass% or more and less than 18 mass%, or the concentration of potassium permanganate is 0.1 mass% or more and less than 0.5 mass% and the concentration of sodium hydroxide is 1.5 mass% or more and less than 18 mass% Or the concentration of potassium permanganate is 0.05% by mass or more and less than 0.1% by mass and the concentration of sodium hydroxide is 1.5% by mass or more and less than 5% by mass. It is preferred.
  • the solution used in the wiring exposure step has a sodium permanganate concentration of 2 mass% to 20 mass% and a sodium hydroxide concentration of 20 mass% or less, or a sodium permanganate concentration of 1 mass%. Or more and less than 2% by mass and the concentration of sodium hydroxide is 0.05 to 20% by mass, or the concentration of sodium permanganate is 0.5 to 1% by mass and the concentration of sodium hydroxide is 0 0.05 mass% or more and less than 18 mass%, or a sodium permanganate concentration of 0.1 mass% or more and less than 0.5 mass% and a sodium hydroxide concentration of 1.5 mass% or more and less than 18 mass%. Either is preferable.
  • the wiring in the portion where the protective film is not disposed is surrounded by the adhesive around the side, the wiring is mechanically and electrically protected by the adhesive, and the wiring The peel strength and insulation between the wires are sufficiently secured.
  • cover sheet in the present invention is a type of cover lay, and refers to a sheet provided with an adhesive that ensures the peel strength of the wiring and the insulation between the wirings.
  • Embodiment 1 an adhesive is formed on one surface of the insulating protective film, and a step (preparation step) of preparing a wiring forming film (corresponding to FPC) in which wiring is formed on the insulating film.
  • a cover sheet is bonded to the wiring-forming film with the adhesive facing the wiring (bonding process), and a part of the protective film is removed to expose a part of the adhesive.
  • a flexible circuit board is manufactured by a step (adhesive exposing step) and a step (wiring exposing step) of removing the upper part of the exposed part of the adhesive to expose the upper surface of the wiring.
  • FIG. 1 is a view showing a cross section of the wiring forming film 20 and the cover sheet 10 in the preparation process.
  • the wiring forming film 20 has a plurality of wirings 31 formed on the insulating film 22.
  • the cover sheet 10 is one in which an insulating adhesive 14 is formed on one surface of an insulating protective film 12. Note that it is not necessary to provide an opening in the cover sheet 10.
  • the wiring 31 is formed by bonding a copper foil to the insulating film 22 and patterning the copper foil by etching, or by patterning by a semi-additive method using a metalizing material, or by an additive method. Or formed by printing using conductive ink or the like. Note that there is generally a form in which an adhesive made of the same or different material as the insulating film 22 exists between the insulating film 22 and the wiring 31.
  • the protective film 12 a film made of polyimide resin, polyester resin, PPS (polyphenylene sulfide) resin, aramid resin, LCP (liquid crystal polymer) or the like and having a thickness of about 2.5 ⁇ m to 25 ⁇ m is generally used. From the viewpoint of heat resistance, dimensional stability, and bending resistance, a polyimide resin is preferable.
  • the adhesive 14 is mainly composed of an epoxy resin, an acrylic resin, a polyimide resin, or the like, and is generally a thermosetting resin, but may be a photo-curing type and has a thickness of 5 ⁇ m. To about 35 ⁇ m.
  • the wiring forming film 20 and the cover sheet 10 are bonded together (FIG. 2, bonding process).
  • the adhesive 14 formed on one surface of the cover sheet 10 is stacked facing the wiring 31 of the wiring forming film 20, and heated or irradiated with UV light while applying pressure, thereby the adhesive. 14 is cured. Since it is not necessary to provide an opening in the cover sheet 10 in the bonding step, it is not necessary to align the wiring forming film 20 with the wiring 31 (alignment between the opening and the wiring portion to be exposed), and it is easy to roll. Bonding can be performed by toe roll. In addition, you may bond the wiring formation film 20 and the cover sheet 10 in the sheet unit (what is called a sheet
  • exact alignment between the opening and the exposed wiring portion is not necessary.
  • strict alignment at the time of bonding is not required, defective products that have failed in alignment do not occur, and the process speed can be increased, so that bonding can be performed at low cost and at high speed. it can.
  • a guide hole or the like may be previously formed in the cover sheet as a guide in order to send or install the material in the bonding process.
  • the protective film 12 existing above the portion of the wiring 32a to be exposed is removed to form the opening 40 (FIG. 3, adhesive exposing step).
  • the protective film 12 there are various methods for removing the protective film 12, such as a method using etching and a method using a laser.
  • the etching method uses the method disclosed in Patent Document 2 to form an etching resistant resist in a portion other than the portion where the opening is formed, and then an etching solution is applied. This step is the same as the wiring formation by etching, and can be easily performed with high accuracy. A method using a laser can also be performed with high accuracy.
  • the opening 40 is formed in the protective film 12, but since the cured adhesive 15 is placed on the upper surface of the wiring 30a located in the opening 40, the upper surface of the wiring 30a is exposed. Not. Then, the cured adhesive 15 on the upper surface of the wiring 30a is removed (FIG. 4, wiring exposure process). Removal of the cured adhesive 15 is preferably performed using a solution that dissolves the adhesive 15, and the type of the solution may be selected depending on the type of the adhesive 15. For example, in the case of the epoxy adhesive 15, it may be dissolved using an aqueous solution of potassium permanganate and sodium hydroxide, washed with water, and then neutralized.
  • the wiring 30a is preferably filled with the adhesive 15 and only the upper surface is exposed. For that purpose, it is preferable to control the dissolution rate by reducing the concentration of the solution in which the adhesive 15 is dissolved.
  • a part of the wiring 30 of the wiring forming film 20 is located in the opening 40 of the protective film 12 and is filled with the adhesive 15 so that the upper surface 39 is exposed.
  • the other wirings 32 are embedded with the adhesive 15 and the protective film 12 is present above. That is, a part of the wirings 30 of the wiring forming film 20 is in a state where the protective film 12 is not disposed on the upper surface 39 and the adhesive 15 is present on the side or the periphery. .
  • the adhesive 15 is present on the side or the periphery of the wiring 30 positioned in the opening 40 of the protective film 12, the inter-line insulation reliability between the adjacent wirings 30 and 30 is improved. Can be kept high. In particular, the insulation reliability between lines can be kept high even when the wiring pitch is reduced. And the protective film 12 is excellent in bending resistance.
  • the exposed wiring 30 is electrically connected to an external terminal using an anisotropic conductive adhesive (ACF or ACP), if it is a normal cover lay film or cover coat, the adjacent wiring (wiring) Since the anisotropic conductive adhesive also enters between the side surfaces of the conductive conductive particles in the anisotropic conductive adhesive, there is a possibility that the conductive particles in the anisotropic conductive adhesive may conduct between adjacent wirings. There is no such a fear, and also in this respect, the insulation reliability between the adjacent wirings 30 can be kept high.
  • ACF or ACP anisotropic conductive adhesive
  • the coverlay film it is necessary to form an opening by punching before bonding to the wiring forming film.
  • a mold is required.
  • the mold is unnecessary and the cost can be reduced accordingly.
  • the size, shape, and opening ratio of the opening are limited. Therefore, it is not possible to design a small opening and the design of the opening shape is not free. If it is a flexible circuit board, the size and shape of the opening can be designed freely.
  • the flexible circuit board of this embodiment is used, it is not necessary to perform half-cut punching, the release film for the coverlay can be thinned, and the change in dimensional accuracy such as curl due to stress at the time of peeling is greatly increased. Therefore, the cost can be reduced. Furthermore, the flexible circuit board according to the present embodiment can easily process roll-to-roll, and can easily align the cover sheet and the wiring forming film at the time of bonding. Time can be shortened.
  • ⁇ Polyimide film> For the cover sheet used in the present invention, it is preferable to use a polyimide resin in view of heat resistance, dimensional stability, and bending resistance of the FPC, and it is further preferable to use a polyimide film having specific physical properties.
  • the polyamic acid solution can be obtained by polymerizing a chemical substance mainly composed of an aromatic diamine component and an aromatic acid anhydride component in an organic solvent.
  • aromatic diamine component examples include paraphenylene diamine, metaphenylene diamine, benzidine, paraxylylene diamine, 4,4′-diaminodiphenyl ether, 3,4′-diaminodiphenyl ether, 4,4′-diaminodiphenylmethane, 4, 4'-diaminodiphenylsulfone, 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 1,5-diaminonaphthalene, 3,3'-dimethoxybenzidine, 1,4-bis (3-methyl-5-amino Phenyl) benzene and their amide-forming derivatives. These may be used individually by 1 type, and 2 or more types may be mixed and used for them.
  • the aromatic diamine component is preferably at least one selected from the group consisting of paraphenylenediamine and 4,4'-diaminodiphenyl ether from the viewpoint of excellent heat resistance and dimensional stability due to heat.
  • aromatic acid anhydride component examples include, for example, pyromellitic acid, 3,3 ′, 4,4′-biphenyltetracarboxylic acid, 2,3 ′, 3,4′-biphenyltetracarboxylic acid, 3, 3 ′, 4,4′-benzophenonetetracarboxylic acid, 2,3,6,7-naphthalenetetracarboxylic acid, 2,2-bis (3,4-dicarboxyphenyl) ether, pyridine-2,3,5
  • acid anhydride components of aromatic tetracarboxylic acids such as 6-tetracarboxylic acid and amide-forming derivatives thereof. These may be used individually by 1 type, and 2 or more types may be mixed and used for them.
  • aromatic acid anhydride component pyromellitic dianhydride and / or 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride are used from the viewpoint of excellent heat resistance and dimensional stability due to heat. Is preferred.
  • the combination of the aromatic diamine component and the acid anhydride component includes one or more aromatic diamine components selected from the group consisting of paraphenylenediamine, 4,4′-diaminodiphenyl ether and 3,4′-diaminodiphenyl ether.
  • aromatic diamine components selected from the group consisting of paraphenylenediamine, 4,4′-diaminodiphenyl ether and 3,4′-diaminodiphenyl ether.
  • a combination of pyromellitic dianhydride and / or an aromatic acid anhydride component of 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride is particularly preferable.
  • the aromatic diamine component contains paraphenylene diamine and 4,4′-diaminodiphenyl ether
  • the molar ratio of paraphenylene diamine to 4,4′-diaminodiphenyl ether is preferably 50/50 to 0/100, More preferred is / 60 to 0/100.
  • the aromatic acid anhydride component comprises pyromellitic dianhydride and 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride
  • pyromellitic dianhydride and 3,3 ′, 4,4 The molar ratio of '-biphenyltetracarboxylic dianhydride is preferably 100/0 to 50/50, and more preferably 100/0 to 60/40.
  • a method for producing a polyimide film for example, a method in which a polyamic acid solution is cast into a film and thermally decyclized and desolvated to obtain a polyimide film, a cyclization catalyst and a dehydrating agent are mixed in the polyamic acid solution, and a chemical is obtained.
  • a method of obtaining a polyimide film by preparing a gel film by decyclizing it and heating and desolvating it is preferred, but the latter is preferred.
  • the polyimide film thus obtained can be further annealed to reduce the heat shrinkage rate (specifically, the heat shrinkage rate after heating at 200 ° C. for 60 minutes is 0.2% or less.
  • the method of annealing treatment is not particularly limited, and may be according to a conventional method.
  • the annealing temperature is not particularly limited, but is preferably 200 to 500 ° C, more preferably 200 to 370 ° C, and particularly preferably 210 to 350 ° C. Specifically, it is preferable to carry out the annealing treatment by running the film in a furnace heated to the above temperature range under low tension.
  • the time during which the film stays in the furnace is the processing time, but it is controlled by changing the running speed, and the processing time is preferably 5 seconds to 5 minutes.
  • the film tension during running is preferably 10 to 50 N / m, more preferably 20 to 30 N / m.
  • the polyimide film has a heat shrinkage ratio after heating at 200 ° C. for 60 minutes, usually 0.2% or less (eg, 0.01 to 0.15%), preferably 0.15. % Or less (for example, 0.01 to 0.1%), preferably 0.1% or less (for example, 0.01 to 0.07%).
  • the heat shrinkage rate after heating the polyimide film at 200 ° C. for 60 minutes is the CNC image processing system NEXIV VM- after the film size (L1) after being left in a room adjusted to 25 ° C. and 60% RH for 2 hours or more.
  • the film dimensions (L2) after measurement using a 250 (Nikon), followed by heating at 200 ° C.
  • the average linear expansion coefficient of the polyimide film is not particularly limited, but is, for example, 0 to 100 ppm / ° C., preferably 0 to 50 ppm / ° C., more preferably 3 to 35 ppm / ° C.
  • the thermal expansion coefficient can be measured by using TMA-50 manufactured by Shimadzu Corporation under the conditions of a measurement temperature range: 50 to 200 ° C. and a temperature increase rate: 10 ° C./min.
  • Example 1 a cover sheet manufactured by Unon Giken Co., Ltd. was used, in which the protective film was Kapton 50EN having a thickness of 12.5 ⁇ m and an epoxy adhesive 20 ⁇ m was formed thereon. This cover sheet was affixed to a circuit-forming substrate having a circuit formed on one side under a bonding condition of 150 ° C., 3 MPa, 30 minutes.
  • a part of the protective film of the flexible circuit board with the cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 35 mm ⁇ 22 within a range including the opening from the sheet-like substrate after the removal.
  • a test piece of 5 mm was prepared.
  • the adhesive was etched in 100 g of an etching solution containing at least one of potassium permanganate and sodium hydroxide, washed with water, and then neutralized.
  • the etching rate until the wiring of the test piece was exposed was changed in various concentrations of potassium permanganate and sodium hydroxide contained in the etching solution.
  • any concentration of sodium hydroxide or potassium permanganate is 1.2 mass% or less and sodium hydroxide is not present. If less than 0.05% by weight, or if potassium permanganate is 0.1% by weight or less and sodium hydroxide is less than 1.5% by weight, or if potassium permanganate is less than 1% by weight And when sodium hydroxide is 18% by mass or more, or when potassium permanganate is less than 0.1% by mass and sodium hydroxide is 5% by mass or more, the adhesive may be etched. could not.
  • the concentration of potassium permanganate is 2% by mass or more and 18.15% by mass or less and the concentration of sodium hydroxide is 20% by mass or less, or the concentration of potassium permanganate is 1% by mass or more and less than 2% by mass and water.
  • the concentration of sodium oxide is 0.05% by mass or more and 20% by mass or less, or the concentration of potassium permanganate is 0.5% by mass or more and less than 1% by mass, and the concentration of sodium hydroxide is 0.05% by mass or more and 18% by mass.
  • the concentration of potassium permanganate is 0.1% by mass or more and less than 0.5% by mass and the concentration of sodium hydroxide is 1.5% by mass or more and less than 18% by mass, or the concentration of potassium permanganate was 0.05 mass% or more and less than 0.1 mass% and the concentration of sodium hydroxide was 1.5 mass% or more and less than 5 mass%, the adhesive could be etched.
  • the 10 ⁇ m thick adhesive can be etched within 60 minutes, and cannot be etched in the table.
  • the adhesive having a thickness of 10 ⁇ m cannot be etched within 60 minutes under the conditions indicated by “x”.
  • the etching time was shorter as the concentration of each chemical solution was higher in the etching conditions.
  • Example 2 In Example 2, the same test piece as in Example 1 was used, and the adhesive was etched using a solution containing at least one of sodium permanganate and sodium hydroxide as an adhesive etchant. That is, in this example, unlike in Example 1, the permanganate contained in the etching solution is sodium permanganate.
  • any concentration of sodium hydroxide or sodium permanganate is 1.2% by mass or less and When sodium is not contained, or when sodium permanganate is 0.1 mass% or less and sodium hydroxide is less than 1.5 mass%, or sodium permanganate is 0.5 mass% or less However, when the amount of sodium hydroxide was 18% by mass or more, the adhesive could not be etched.
  • the concentration of sodium permanganate is 2% by mass to 20% by mass and the concentration of sodium hydroxide is 20% by mass or less, or the concentration of sodium permanganate is 1% by mass to less than 2% by mass and sodium hydroxide Concentration of 0.05% to 20% by mass, or sodium permanganate concentration of 0.5% to less than 1% by mass and sodium hydroxide concentration of 0.05% to less than 18% by mass
  • the adhesive can be etched when the concentration of sodium permanganate is 0.1% by weight or more and less than 0.5% by weight and the concentration of sodium hydroxide is 1.5% by weight or more and less than 18% by weight. It was.
  • Example 3 In Example 3, etching was performed using two types of cover sheets.
  • the first cover sheet a cover sheet manufactured by Unon Giken Co., Ltd. was used, in which the protective film was Kapton 50EN having a thickness of 12.5 ⁇ m and an epoxy adhesive 20 ⁇ m was formed thereon.
  • This cover sheet was affixed on both surfaces of the circuit formation board in which the circuit was formed in both surfaces.
  • This adhesive is made of a material different from that of the cover sheet of Example 1. The pasting conditions are the same as those in the first embodiment.
  • a part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 40 mm ⁇ 90 mm within a range including the opening from the sheet-like substrate after the removal.
  • a test piece was prepared.
  • the cover sheet was affixed to both sides of a circuit-forming substrate on which circuits were formed on both sides.
  • the bonding conditions were 160 ° C., 3 MPa, and 40 minutes.
  • a part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 40 mm ⁇ 90 mm within a range including the opening from the sheet-like substrate after the removal.
  • a test piece was prepared.
  • the adhesive was etched in 100 g of an etching solution containing sodium permanganate and sodium hydroxide using the above-mentioned two types of test pieces, washed with water, and then neutralized.
  • the adhesive could be etched although the etching time was different at a concentration of 8.5% by mass of sodium permanganate and 5% by mass of sodium hydroxide.
  • Example 4 etching was performed using two types of cover sheets.
  • the first cover sheet a cover sheet made of Kyocera Chemical Co., Ltd. was used, in which the protective film was Kapton 50ENC having a thickness of 12.5 ⁇ m and an epoxy adhesive 25 ⁇ m was formed thereon.
  • This cover sheet was affixed on both surfaces of the circuit formation board in which the circuit was formed in both surfaces.
  • This adhesive is different in material from the adhesives of the cover sheets of Examples 1 and 2.
  • the pasting conditions are the same as those in the first embodiment.
  • a part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 20 mm ⁇ 20 mm within the range including the opening from the sheet-like substrate after the removal.
  • a test piece was prepared.
  • the cover sheet was affixed to both sides of a circuit-forming substrate on which circuits were formed on both sides.
  • the bonding conditions are the same as in Example 1.
  • the cover sheet adhesive is different in material from the cover sheets of Examples 1 and 2 and the first cover sheet of this example.
  • a part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 20 mm ⁇ 20 mm within the range including the opening from the sheet-like substrate after the removal.
  • a test piece was prepared.
  • the adhesive was etched in 100 g of an etching solution containing sodium permanganate and sodium hydroxide using the above-mentioned two types of test pieces, washed with water, and then neutralized.
  • the adhesive could be etched although the etching time was different at a concentration of 8.5% by mass of sodium permanganate and 5% by mass of sodium hydroxide.
  • the flexible circuit board according to the second embodiment is shown in FIG. 5 in the part of the flexible circuit board shown in FIG. 4 from which the adhesive 15 is removed in the opening formed in the protective film 12 and the wiring exposure process.
  • the conductive layer 50 made of a conductive member is formed.
  • the conductive layer 50 is placed on the upper surface 39 of the wiring 33 and is formed so as to fill the entire depression formed in the adhesive exposing step and the wiring exposing step.
  • the conductive layer 50 can be formed by applying a conductive paste or plating.
  • the conductive layer 50 is formed so as to cover them. It doesn't matter.
  • the flexible circuit board according to the third embodiment is shown in FIG. 6 in the part of the flexible circuit board shown in FIG. 4 where the adhesive 15 is removed in the opening formed in the protective film 12 and the wiring exposure process.
  • a conductive layer 52 made of a conductive member is formed, and this conductive layer 52 is a plating layer.
  • the conductive layer 52 is placed on the upper surface 39 of the wiring 34 and is formed so as to cover the entire bottom surface and side surfaces of the recess formed in the adhesive exposing step and the wiring exposing step.
  • the plating method for forming the conductive layer 52 that is a plating layer is not particularly limited.
  • the conductive layer 52 is formed so as to cover them. It doesn't matter.
  • the material and thickness of the insulating film and the protective film may be any material as long as they have insulating properties and satisfy various characteristics as a flexible circuit board.
  • a polyester resin film may be used as the protective film.
  • the polyester resin film may be etched using an alkaline solution (for example, an aqueous hydrazine solution).
  • the material is not particularly limited as long as the adhesive is also used for the cover sheet.
  • the type of the adhesive is not particularly limited as long as it has insulating properties.
  • the upper part of the side surface may be partially exposed. If at least half of the side surface is surrounded by the adhesive (that is, at least half of the side surface of the wiring is buried in the adhesive), an effect of insulation and mechanical strength is obtained.
  • the adhesive on the wiring may be removed using a laser. Further, the adhesive may be removed using a sand blast method.
  • the wiring of the flexible circuit board is divided into a high-definition part and other parts, this technology is applied only to the high-definition part, and the other parts are provided with a conventional cover coat and an opening in advance. It is also possible to use a composite (so-called hybrid type) that uses the covered cover.
  • the flexible circuit board may be a type in which wiring is formed on one side, a type in which wiring is formed on both sides, or a multilayer type having three or more circuit layers.
  • the cover sheet is formed on the surface on which the wiring is formed, and in the double-sided wiring type, the cover sheet is formed on both sides.
  • the single-sided type may be laminated
  • the double-sided type may be laminated
  • the single-sided and double-sided may be laminated together. Cover sheets are formed on the circuit surfaces of the outer layer and the inner layer.
  • the present technology can be used as an inner cover sheet structure even in a so-called rigid flex board in which a flexible circuit board and a printed board are combined.
  • a plurality of flexible circuit boards according to the above embodiment may be stacked to electrically connect the wirings of two adjacent flexible circuit boards.
  • the wiring reaches an insulating film.
  • a through hole is formed, and the conductive member is embedded in the through hole, and at the same time, the conductive member is protruded on the side opposite to the surface on which the wiring of the insulating film is arranged, and the protruding portion and another flexible circuit board
  • the method of making it contact with wiring is mentioned, It is not limited to this method.

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  • Engineering & Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Non-Metallic Protective Coatings For Printed Circuits (AREA)
  • Structure Of Printed Boards (AREA)
  • Manufacturing Of Printed Wiring (AREA)

Abstract

Provided is a flexible circuit board in which a coverlay film that offers a high degree of freedom in regard to the shape and size of an opening part is laminated on an FPC, with sufficient insulation between adjacent wiring being ensured for wiring positioned in the coverlay opening part. This flexible circuit board is provided with an insulation film 22, wiring 30, 32 formed on the insulation film, and a protective film 12 that has insulating properties disposed on a portion of the insulation film and the wiring. The protective film is laminated on the insulation film and the wiring with an adhesive agent 15 interposed therebetween, and the part of the wiring on which the protective film is not disposed is exposed on the top surface, the adhesive agent being adhered on the side or periphery of said part.

Description

フレキシブル回路基板およびその製造方法Flexible circuit board and manufacturing method thereof
 本発明は、フレキシブル回路基板およびその製造方法に関するものである。 The present invention relates to a flexible circuit board and a method for manufacturing the same.
 従来より絶縁性樹脂フィルム上に回路配線を形成したフレキシブル配線基板(以下、FPCという)は一般に使用されている。FPCおよびFPCに搭載された電子部品が組み込まれた各種の装置や機器は、小さく、薄く、軽くすることが常に求められているので、薄くて折り曲げることができるFPCはより多く使用されるようになってきており、また、FPCの配線ピッチも小さく、回路基板上の部品実装密度は高くなる方向に進んでいる。 Conventionally, a flexible wiring board (hereinafter referred to as FPC) in which circuit wiring is formed on an insulating resin film is generally used. Since various apparatuses and devices incorporating electronic components mounted on FPCs and FPCs are always required to be small, thin, and light, more thin FPCs that can be bent are used. In addition, the wiring pitch of the FPC is small, and the component mounting density on the circuit board is increasing.
 上述のように、電子機器や電子部品を小さく、薄く、軽くするためには、回路配線同士や回路配線と周囲の部品や配線等との短絡を防止することが必要であり、そのためにFPCの回路配線を可能な限り絶縁材料で覆い隠して、絶縁信頼性を保つことが必要になってくる。その目的のため、FPCの回路配線のうち、端子や電子部品との接続部分以外の部分をカバーレイフィルムやカバーコートで保護することが一般的に行われている。 As described above, in order to make electronic devices and electronic components small, thin, and light, it is necessary to prevent short circuit between circuit wirings and between circuit wirings and surrounding components and wirings. It is necessary to cover the circuit wiring with an insulating material as much as possible to maintain insulation reliability. For this purpose, it is common practice to protect portions of the FPC circuit wiring other than the connection portions with terminals and electronic components with a coverlay film or a cover coat.
 カバーレイフィルムは、絶縁性の樹脂フィルムに接着剤を塗布したものであり、FPCにおける回路配線の接続部分や部品実装部分に該当する部分を開口させた後、回路配線の上に貼り合わせるものである(例えば、特許文献1)。FPCにおける回路配線の接続部分や部品実装部分はカバーレイフィルムの開口部分に該当するため、露出した状態になる。カバーレイフィルムを貼り合わせることにより、FPCの機械的強度も向上し、回路が保護されると共に、屈曲に対する耐性も向上する。 The cover lay film is an insulating resin film coated with an adhesive. After opening the part corresponding to the circuit wiring connection part or component mounting part in the FPC, the cover lay film is pasted on the circuit wiring. There is (for example, Patent Document 1). Since the connection part of circuit wiring and the part mounting part in FPC correspond to the opening part of a coverlay film, it will be in the exposed state. By bonding the coverlay film, the mechanical strength of the FPC is also improved, the circuit is protected, and the resistance to bending is also improved.
 カバーコートは、絶縁性を備えているとともに熱や光等によって硬化する物質を用いて、回路配線のうち接続部分以外の上に塗布して硬化させて形成される。 The cover coat is formed by applying and curing on a portion of the circuit wiring other than the connection portion using a material that has an insulating property and is cured by heat or light.
 また感光性カバーレイは、絶縁性を備え、光で硬化する物質をあらかじめシート化したもので、回路配線に貼り合わせた後に光で硬化させる。 Also, the photosensitive cover lay is a sheet of a material that has insulating properties and is cured by light, and is cured by light after being attached to circuit wiring.
特開平9-283895号公報JP-A-9-283895 特開平10-97081号公報JP-A-10-97081
 しかしながら、カバーレイフィルムは予め開口部を設けてからFPCに貼り合わせるため、開口部とFPCのうち回路配線の特定部分との位置合わせに手間がかかり、貼り合わせ位置がずれた場合には不良品となってしまう。また、開口部を形成する金型の大きさや、材料のフィルムの物理的な特性などから、開口部の形状や大きさには自ずと制限が生じ、FPCの回路配線の設計に制限が課されてしまう。さらに、カバーレイフィルムの開口部に位置するFPCの回路配線では、隣合う配線の対向している側面が露出しており配線ピッチが小さくなるほど配線間の絶縁性に問題が生じるおそれがあるとともに、この部分の配線は剥離強度が低く、配線が剥離しやすい。 However, since the coverlay film is provided with an opening in advance and then bonded to the FPC, it takes time to align the opening and a specific part of the circuit wiring in the FPC, and if the bonding position is shifted, it is a defective product. End up. In addition, due to the size of the mold for forming the opening and the physical characteristics of the material film, the shape and size of the opening are naturally limited, and the design of the circuit wiring of the FPC is limited. End up. Furthermore, in the circuit wiring of the FPC located in the opening of the cover lay film, the opposing side surfaces of the adjacent wiring are exposed and there is a possibility that a problem occurs in the insulation between the wirings as the wiring pitch becomes smaller. The wiring at this portion has low peel strength, and the wiring is easy to peel off.
 一方、カバーコートは印刷手法によりFPCに塗布を行うので、特に感光材料を用いる場合は、開口部を小さく形成することができるため、高密度実装を行う上では有効な手法であるが、絶縁材料の厚みが均一ではなく、硬化後にFPCがカールしやすいという問題がある。また、FPCの機械強度を上げる働きは弱く、屈曲耐性の点でも問題がある。 On the other hand, since the cover coat is applied to the FPC by a printing method, particularly when a photosensitive material is used, the opening can be formed small, so this is an effective method for high-density mounting. There is a problem that the thickness of the FPC is not uniform and the FPC tends to curl after curing. Further, the function of increasing the mechanical strength of FPC is weak, and there is a problem in bending resistance.
 また、感光性カバーレイをFPCの回路面に貼り合わせ、その後で光により硬化させてFPC上の絶縁保護膜を形成するプロセスも提案されているが、この場合も硬化後にカールしやすいという問題があり、また回路保護に対する機械強度の不足、屈曲耐性の不足の問題を抱えている。 Also, a process has been proposed in which a photosensitive coverlay is bonded to the circuit surface of the FPC and then cured by light to form an insulating protective film on the FPC. There are also problems of insufficient mechanical strength and insufficient bending resistance for circuit protection.
 本発明は、かかる点に鑑みてなされたものであり、その目的とするところは、開口部の形状や大きさの設計の自由度が高いカバーレイフィルムがFPCに貼り合わせられていてカバーレイの開口部に位置する配線において隣合う配線間の絶縁性が十分に確保されたフレキシブル回路基板を提供することにある。 The present invention has been made in view of such points, and the object of the present invention is to provide a coverlay film having a high degree of freedom in designing the shape and size of the opening bonded to the FPC so that the coverlay It is an object of the present invention to provide a flexible circuit board in which insulation between adjacent wirings is sufficiently secured in wirings positioned in an opening.
 本発明のフレキシブル回路基板は、絶縁フィルムと、前記絶縁フィルム上に形成された配線と、前記絶縁フィルム及び前記配線の一部の上に配置された絶縁性の保護フィルムとを備え、前記保護フィルムは、前記絶縁フィルム及び前記配線に接着剤を介して貼り合わせられており、前記配線のうち、前記保護フィルムが上に配置されていない部分は、上面が露出しているとともに側方あるいは周囲に前記接着剤が付着している構成を備えている。すなわち、配線のうち、前記一部以外では保護フィルムが上に配置されておらず、その部分では配線の上面が露出している。 The flexible circuit board of the present invention includes an insulating film, a wiring formed on the insulating film, and an insulating protective film disposed on the insulating film and a part of the wiring. Is bonded to the insulating film and the wiring via an adhesive, and a portion of the wiring where the protective film is not disposed is exposed to the side or the periphery while the upper surface is exposed. The adhesive is attached. That is, the protective film is not disposed on the wiring except for the part, and the upper surface of the wiring is exposed at that part.
 前記保護フィルムはポリイミド樹脂及びポリエステル樹脂のいずれか一つからなることが好ましい。 The protective film is preferably made of any one of polyimide resin and polyester resin.
 本発明の他のフレキシブル回路基板は、絶縁フィルムと、前記絶縁フィルム上に形成された配線と、前記絶縁フィルム及び前記配線の一部の上に配置された絶縁性の保護フィルムとを備え、前記保護フィルムは、前記絶縁フィルム及び前記配線に接着剤を介して貼り合わせられており、前記保護フィルムが上に配置されていない部分においては、前記配線の側方あるいは周囲に前記接着剤が付着しており、前記配線が形成されていない前記絶縁フィルム上に前記接着剤が設けられているとともに、前記接着剤の表面及び前記配線の上面には導電性部材からなる導電層が載せられている。 Another flexible circuit board of the present invention includes an insulating film, a wiring formed on the insulating film, and an insulating protective film disposed on the insulating film and a part of the wiring, The protective film is bonded to the insulating film and the wiring via an adhesive, and the adhesive adheres to the side or the periphery of the wiring in a portion where the protective film is not disposed on the protective film. The adhesive is provided on the insulating film on which the wiring is not formed, and a conductive layer made of a conductive member is placed on the surface of the adhesive and the upper surface of the wiring.
 前記導電層はめっき層であってもよい。 The conductive layer may be a plating layer.
 本発明のフレキシブル回路基板の製造方法は、絶縁フィルム上に配線が形成された配線形成フィルムを準備する工程と、絶縁性の保護フィルムの一方の面に接着剤が形成されているカバーシートを、前記接着剤を前記配線に向かい合わせて前記配線形成フィルムに載せて貼り合わせる貼り合わせ工程と、前記保護フィルムの一部を除去して前記接着剤の一部を露出させる接着剤露出工程と、露出した前記接着剤の前記一部のうち上部を除去して前記配線の上面を露出させる配線露出工程とを含む構成を備えている。 The method for producing a flexible circuit board of the present invention includes a step of preparing a wiring forming film in which wiring is formed on an insulating film, and a cover sheet in which an adhesive is formed on one surface of the insulating protective film. A bonding process in which the adhesive is placed facing the wiring and placed on the wiring forming film, an adhesive exposing process of removing a part of the protective film to expose a part of the adhesive, and an exposure And a wiring exposure step of exposing an upper surface of the wiring by removing an upper portion of the part of the adhesive.
 前記保護フィルムはポリイミド樹脂及びポリエステル樹脂のいずれか一つからなり、前記接着剤露出工程はエッチングにより行われることが好ましい。 The protective film is preferably made of any one of polyimide resin and polyester resin, and the adhesive exposing step is preferably performed by etching.
 前記配線露出工程は、過マンガン酸塩と水酸化ナトリウムとを含む溶液を用いたエッチングにより行われることが好ましい。ここで過マンガン酸塩とは、過マンガン酸と塩基とによる塩のことであり、例えば過マンガン酸カリウムや過マンガン酸ナトリウムなどを挙げることができる。 The wiring exposure step is preferably performed by etching using a solution containing permanganate and sodium hydroxide. Here, the permanganate is a salt of permanganic acid and a base, and examples thereof include potassium permanganate and sodium permanganate.
 前記配線露出工程において用いられる前記溶液は、過マンガン酸カリウムの濃度が2質量%以上18.15質量%以下かつ水酸化ナトリウムの濃度が20質量%以下、又は、過マンガン酸カリウムの濃度が1質量%以上2質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上20質量%以下、又は、過マンガン酸カリウムの濃度が0.5質量%以上1質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上18質量%未満、又は、過マンガン酸カリウムの濃度が0.1質量%以上0.5質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上18質量%未満、又は、過マンガン酸カリウムの濃度が0.05質量%以上0.1質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上5質量%未満、のいずれかであることが好ましい。 The solution used in the wiring exposure step has a potassium permanganate concentration of 2 mass% to 18.15 mass% and a sodium hydroxide concentration of 20 mass% or less, or a potassium permanganate concentration of 1. % By mass or more and less than 2% by mass and the concentration of sodium hydroxide is 0.05% by mass or more and 20% by mass or less, or the concentration of potassium permanganate is 0.5% by mass or more and less than 1% by mass and the concentration of sodium hydroxide 0.05 mass% or more and less than 18 mass%, or the concentration of potassium permanganate is 0.1 mass% or more and less than 0.5 mass% and the concentration of sodium hydroxide is 1.5 mass% or more and less than 18 mass% Or the concentration of potassium permanganate is 0.05% by mass or more and less than 0.1% by mass and the concentration of sodium hydroxide is 1.5% by mass or more and less than 5% by mass. It is preferred.
 前記配線露出工程において用いられる前記溶液は、過マンガン酸ナトリウムの濃度が2質量%以上20質量%以下かつ水酸化ナトリウムの濃度が20質量%以下、又は、過マンガン酸ナトリウムの濃度が1質量%以上2質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上20質量%以下、又は、過マンガン酸ナトリウムの濃度が0.5質量%以上1質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上18質量%未満、又は、過マンガン酸ナトリウムの濃度が0.1質量%以上0.5質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上18質量%未満、のいずれかであることが好ましい。 The solution used in the wiring exposure step has a sodium permanganate concentration of 2 mass% to 20 mass% and a sodium hydroxide concentration of 20 mass% or less, or a sodium permanganate concentration of 1 mass%. Or more and less than 2% by mass and the concentration of sodium hydroxide is 0.05 to 20% by mass, or the concentration of sodium permanganate is 0.5 to 1% by mass and the concentration of sodium hydroxide is 0 0.05 mass% or more and less than 18 mass%, or a sodium permanganate concentration of 0.1 mass% or more and less than 0.5 mass% and a sodium hydroxide concentration of 1.5 mass% or more and less than 18 mass%. Either is preferable.
 本発明のフレキシブル回路基板においては、保護フィルムが配置されていない部分の配線が側方周囲を接着剤に囲まれているので、配線間が接着剤によって機械的、電気的に保護されて、配線の剥離強度、配線間の絶縁性が十分に担保されている。 In the flexible circuit board of the present invention, since the wiring in the portion where the protective film is not disposed is surrounded by the adhesive around the side, the wiring is mechanically and electrically protected by the adhesive, and the wiring The peel strength and insulation between the wires are sufficiently secured.
準備工程を示す断面模式図である。It is a cross-sectional schematic diagram which shows a preparatory process. 貼り合わせ工程を示す断面模式図である。It is a cross-sectional schematic diagram which shows a bonding process. 接着剤露出工程を示す断面模式図である。It is a cross-sectional schematic diagram which shows an adhesive agent exposure process. 配線露出工程を示す断面模式図である。It is a cross-sectional schematic diagram which shows a wiring exposure process. 別の実施形態に係るフレキシブル回路基板を示す断面模式図である。It is a cross-sectional schematic diagram which shows the flexible circuit board which concerns on another embodiment. 他の実施形態に係るフレキシブル回路基板を示す断面模式図である。It is a cross-sectional schematic diagram which shows the flexible circuit board which concerns on other embodiment.
 以下、本発明の実施形態を図面に基づいて詳細に説明する。以下の好ましい実施形態の説明は、本質的に例示に過ぎず、本発明、その適用物或いはその用途を制限することを意図するものではない。なお、本願発明における「カバーシート」とは、カバーレイの一類型であって、配線の剥離強度や配線間の絶縁性を担保する接着剤を配したものをいう。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. The following description of the preferred embodiments is merely exemplary in nature and is not intended to limit the invention, its application, or its use. The “cover sheet” in the present invention is a type of cover lay, and refers to a sheet provided with an adhesive that ensures the peel strength of the wiring and the insulation between the wirings.
 (実施形態1)
 実施形態1においては、絶縁フィルム上に配線が形成された配線形成フィルム(FPCに該当)を準備する工程(準備工程)と、絶縁性の保護フィルムの一方の面に接着剤が形成されているカバーシートを、前記接着剤を前記配線に向かい合わせて前記配線形成フィルムに載せて貼り合わせる工程(貼り合わせ工程)と、前記保護フィルムの一部を除去して前記接着剤の一部を露出させる工程(接着剤露出工程)と、露出した前記接着剤の前記一部のうち上部を除去して前記配線の上面を露出させる工程(配線露出工程)によってフレキシブル回路基板を製造する。
(Embodiment 1)
In Embodiment 1, an adhesive is formed on one surface of the insulating protective film, and a step (preparation step) of preparing a wiring forming film (corresponding to FPC) in which wiring is formed on the insulating film. A cover sheet is bonded to the wiring-forming film with the adhesive facing the wiring (bonding process), and a part of the protective film is removed to expose a part of the adhesive. A flexible circuit board is manufactured by a step (adhesive exposing step) and a step (wiring exposing step) of removing the upper part of the exposed part of the adhesive to expose the upper surface of the wiring.
 図1は、準備工程における配線形成フィルム20とカバーシート10との断面を示す図である。配線形成フィルム20は、絶縁フィルム22の上に複数の配線31が形成されているものである。カバーシート10は、絶縁性の保護フィルム12の一方の面に絶縁性の接着剤14が形成されているものである。なお、カバーシート10には開口部を設ける必要はない。 FIG. 1 is a view showing a cross section of the wiring forming film 20 and the cover sheet 10 in the preparation process. The wiring forming film 20 has a plurality of wirings 31 formed on the insulating film 22. The cover sheet 10 is one in which an insulating adhesive 14 is formed on one surface of an insulating protective film 12. Note that it is not necessary to provide an opening in the cover sheet 10.
 絶縁フィルム22は、ポリイミド樹脂、ポリエステル樹脂、PPS(ポリフェニレンサルファイド)樹脂、アラミド樹脂、LCP(液晶ポリマー)などからなる、厚みが5μmから75μm程度のフィルムが一般的に用いられる。配線31は、絶縁フィルム22に銅箔を貼り合わせ、その銅箔をエッチングによりパターニングして形成されたり、メタライジング材を使用してセミアディティブ法でパターニングして形成されたり、アディティブ法により形成されたり、導電性のインク等を用いて印刷により形成されたりしたものである。なお、絶縁フィルム22と配線31との間に絶縁フィルム22と同種あるいは異種素材による接着剤が存在する形態も一般的に存在する。保護フィルム12は、ポリイミド樹脂、ポリエステル樹脂、PPS(ポリフェニレンサルファイド)樹脂、アラミド樹脂、LCP(液晶ポリマー)などからなる、厚みが2.5μmから25μm程度のフィルムが一般的に用いられる。耐熱性、寸法安定性、屈曲耐性の観点からはポリイミド樹脂であることが好ましい。接着剤14は、エポキシ系樹脂、アクリル系樹脂やポリイミド系樹脂等を主体としたもので、一般的には熱硬化型の樹脂であるが、光硬化型であっても構わなく、厚みは5μmから35μm程度である。 As the insulating film 22, a film made of polyimide resin, polyester resin, PPS (polyphenylene sulfide) resin, aramid resin, LCP (liquid crystal polymer) or the like and having a thickness of about 5 μm to 75 μm is generally used. The wiring 31 is formed by bonding a copper foil to the insulating film 22 and patterning the copper foil by etching, or by patterning by a semi-additive method using a metalizing material, or by an additive method. Or formed by printing using conductive ink or the like. Note that there is generally a form in which an adhesive made of the same or different material as the insulating film 22 exists between the insulating film 22 and the wiring 31. As the protective film 12, a film made of polyimide resin, polyester resin, PPS (polyphenylene sulfide) resin, aramid resin, LCP (liquid crystal polymer) or the like and having a thickness of about 2.5 μm to 25 μm is generally used. From the viewpoint of heat resistance, dimensional stability, and bending resistance, a polyimide resin is preferable. The adhesive 14 is mainly composed of an epoxy resin, an acrylic resin, a polyimide resin, or the like, and is generally a thermosetting resin, but may be a photo-curing type and has a thickness of 5 μm. To about 35 μm.
 次に、配線形成フィルム20とカバーシート10とを貼り合わせる(図2、貼り合わせ工程)。貼り合わせ工程では、カバーシート10の一方の面に形成されている接着剤14を、配線形成フィルム20の配線31に向かい合わせて重ね、圧力を加えながら加熱あるいはUV光を照射して、接着剤14を硬化させる。貼り合わせ工程では、カバーシート10に開口部を設ける必要がないため、配線形成フィルム20の配線31との位置合わせ(開口部と露出させる配線部分との位置合わせ)が不要であり、容易にロールトゥロールで貼り合わせを行うことができる。なお、配線形成フィルム20とカバーシート10とを、単一又は複数の回路が含まれるシート単位(いわゆる枚葉)で貼り合わせを行ってもよい。この場合も、開口部と露出させる配線部分との厳密な位置合わせが不要である。このように本実施形態では貼り合わせ時の厳密な位置合わせが不要であるため、位置合わせが失敗した不良品は発生せず、工程スピードも上げられるので低コストかつ高速で貼り合わせを行うことができる。なお、開口部の位置合わせを目的としないが、貼り合わせ工程に材料を送り込みあるいは設置するのに、ガイドとしてあらかじめカバーシートにガイド穴などを開けておいてもよいことは言うまでもない。 Next, the wiring forming film 20 and the cover sheet 10 are bonded together (FIG. 2, bonding process). In the bonding step, the adhesive 14 formed on one surface of the cover sheet 10 is stacked facing the wiring 31 of the wiring forming film 20, and heated or irradiated with UV light while applying pressure, thereby the adhesive. 14 is cured. Since it is not necessary to provide an opening in the cover sheet 10 in the bonding step, it is not necessary to align the wiring forming film 20 with the wiring 31 (alignment between the opening and the wiring portion to be exposed), and it is easy to roll. Bonding can be performed by toe roll. In addition, you may bond the wiring formation film 20 and the cover sheet 10 in the sheet unit (what is called a sheet | seat) in which a single or several circuit is included. Also in this case, exact alignment between the opening and the exposed wiring portion is not necessary. As described above, in the present embodiment, since strict alignment at the time of bonding is not required, defective products that have failed in alignment do not occur, and the process speed can be increased, so that bonding can be performed at low cost and at high speed. it can. Although not intended to align the opening, it goes without saying that a guide hole or the like may be previously formed in the cover sheet as a guide in order to send or install the material in the bonding process.
 貼り合わせ工程が終了すると、全ての配線32、32aはカバーシート10によって保護された状態となる。それから、露出させるべき配線32a部分の上方に存する保護フィルム12を除去して開口部40を形成する(図3、接着剤露出工程)。保護フィルム12の除去方法は、エッチングによる方法、レーザーを用いる方法など種々存在する。例えばエッチングによる方法は、特許文献2に開示されている方法を利用して、耐エッチング性のレジストを開口部を形成する部分以外に形成した後、エッチング液を作用させる。この工程は、エッチングによる配線形成と同様の工程であり、容易に精度良く行うことができる。レーザーを用いる方法も精度良く行うことができる。 When the bonding process is completed, all the wirings 32 and 32a are protected by the cover sheet 10. Then, the protective film 12 existing above the portion of the wiring 32a to be exposed is removed to form the opening 40 (FIG. 3, adhesive exposing step). There are various methods for removing the protective film 12, such as a method using etching and a method using a laser. For example, the etching method uses the method disclosed in Patent Document 2 to form an etching resistant resist in a portion other than the portion where the opening is formed, and then an etching solution is applied. This step is the same as the wiring formation by etching, and can be easily performed with high accuracy. A method using a laser can also be performed with high accuracy.
 接着剤露出工程では、保護フィルム12に開口部40が形成されるが、開口部40内に位置する配線30aの上面には硬化した接着剤15が載っているため、配線30aの上面は露出していない。そこで次に配線30a上面の硬化した接着剤15を除去する(図4、配線露出工程)。硬化した接着剤15の除去は、接着剤15を溶解させる溶液を用いて行うことが好ましく、接着剤15の種類によって溶液の種類を選択すればよい。例えばエポキシ系の接着剤15の場合は、過マンガン酸カリウムと水酸化ナトリウムとの水溶液を用いて溶解させ、水洗し、その後に中和を行えばよい。なお、配線30aは、接着剤15によって埋められていて上面のみが露出する状態とすることが好ましい。そのためには、接着剤15を溶解させる溶液の濃度を小さくして、溶解速度をコントロールすることが好ましい。 In the adhesive exposing step, the opening 40 is formed in the protective film 12, but since the cured adhesive 15 is placed on the upper surface of the wiring 30a located in the opening 40, the upper surface of the wiring 30a is exposed. Not. Then, the cured adhesive 15 on the upper surface of the wiring 30a is removed (FIG. 4, wiring exposure process). Removal of the cured adhesive 15 is preferably performed using a solution that dissolves the adhesive 15, and the type of the solution may be selected depending on the type of the adhesive 15. For example, in the case of the epoxy adhesive 15, it may be dissolved using an aqueous solution of potassium permanganate and sodium hydroxide, washed with water, and then neutralized. The wiring 30a is preferably filled with the adhesive 15 and only the upper surface is exposed. For that purpose, it is preferable to control the dissolution rate by reducing the concentration of the solution in which the adhesive 15 is dissolved.
 以上の工程を行うことにより、配線形成フィルム20の一部の配線30は、保護フィルム12の開口部40内に位置していると共に、接着剤15によって埋められていて上面39が露出しており、それ以外の配線32は接着剤15によって埋め込まれていると共に、上方に保護フィルム12が存している。つまり、配線形成フィルム20の一部の配線30は、保護フィルム12が上に配置されておらず、上面39が露出していると共に側方あるいは周囲に接着剤15が存在している状態である。 By performing the above steps, a part of the wiring 30 of the wiring forming film 20 is located in the opening 40 of the protective film 12 and is filled with the adhesive 15 so that the upper surface 39 is exposed. The other wirings 32 are embedded with the adhesive 15 and the protective film 12 is present above. That is, a part of the wirings 30 of the wiring forming film 20 is in a state where the protective film 12 is not disposed on the upper surface 39 and the adhesive 15 is present on the side or the periphery. .
 このように、保護フィルム12の開口部40内に位置している配線30がその側方あるいは周囲に接着剤15が存在しているので、隣合う配線30,30間の線間絶縁信頼性を高く保つことができる。特に、配線ピッチが小さくなってきた時でも線間絶縁信頼性を高く保つことができる。そして、保護フィルム12は、耐屈曲性にすぐれている。 In this way, since the adhesive 15 is present on the side or the periphery of the wiring 30 positioned in the opening 40 of the protective film 12, the inter-line insulation reliability between the adjacent wirings 30 and 30 is improved. Can be kept high. In particular, the insulation reliability between lines can be kept high even when the wiring pitch is reduced. And the protective film 12 is excellent in bending resistance.
 また、通常のカバーレイフィルムやカバーコートを使用した場合は、露出した配線の幅が小さくなる(すなわち配線ピッチが小さくなる)と、配線の配線形成フィルム20からの剥離強度が低下していき、FPCの使用環境の変化や、経時的劣化、外部からの外圧や屈曲によって配線がフレキシブル回路基板から剥離したり、割れたりするおそれがある。しかし、本実施形態のフレキシブル回路基板であれば、配線30の側方あるいは周囲が接着剤15に囲まれているので、配線30幅が小さくなっても剥離強度が十分大きく保たれ、配線30がフレキシブル回路基板から剥離したり、配線が割れたりするおそれはない。さらには、露出した配線30を異方導電性接着剤(ACFやACP)を用いて外部端子と電気的に接続する場合、通常のカバーレイフィルムやカバーコートであれば、隣合う配線間(配線の側面間)にも異方導電性接着剤が入り込むため、異方導電性接着剤中の導電粒子が隣合う配線間を導通させてしまうおそれがあるが、本実施形態のフレキシブル回路基板であればそのようなおそれがなく、この点でも隣合う配線30,30間の線間絶縁信頼性を高く保つことができる。 In addition, when a normal cover lay film or cover coat is used, when the width of the exposed wiring is reduced (that is, the wiring pitch is reduced), the peel strength of the wiring from the wiring forming film 20 is reduced, There is a risk that the wiring may be peeled off from the flexible circuit board or cracked due to changes in the FPC usage environment, deterioration over time, external pressure or bending from the outside. However, in the case of the flexible circuit board according to the present embodiment, the side or the periphery of the wiring 30 is surrounded by the adhesive 15, so that the peel strength can be kept sufficiently large even if the width of the wiring 30 is reduced. There is no risk of peeling from the flexible circuit board or cracking of the wiring. Furthermore, when the exposed wiring 30 is electrically connected to an external terminal using an anisotropic conductive adhesive (ACF or ACP), if it is a normal cover lay film or cover coat, the adjacent wiring (wiring) Since the anisotropic conductive adhesive also enters between the side surfaces of the conductive conductive particles in the anisotropic conductive adhesive, there is a possibility that the conductive particles in the anisotropic conductive adhesive may conduct between adjacent wirings. There is no such a fear, and also in this respect, the insulation reliability between the adjacent wirings 30 can be kept high.
 従来のカバーレイフィルムでは、配線形成フィルムに貼り合わせる前に、打ち抜きにより開口を形成する必要がある。そのための金型が必要であるが、本実施形態のフレキシブル回路基板であれば金型は不要でその分コストを下げられる。また、開口を打ち抜きにより形成するためには、開口の大きさや形状、開口率に制限があるため、小さな開口を設計することができず、開口形状の設計が自由ではないが、本実施形態のフレキシブル回路基板であれば開口の大きさ、形状等を自由に設計できる。また、本実施形態のフレキシブル回路基板であれば、ハーフカット打ち抜きをする必要が無く、カバーレイ用の離型フィルムを薄くすることができ、剥離時の応力によるカール等の寸法精度の変化を大幅に少なくできるので、コストダウンできる。さらには、本実施形態のフレキシブル回路基板であれば、ロールトゥロールの加工が容易に行え、貼り合わせ時のカバーシートと配線形成フィルムとの位置合わせが容易なため、コストを下げられると共に、製造時間も短縮できる。そして、従来のカバーレイフィルムでは開口を形成してから貼り合わせを行うので、開口部において接着剤の浸み出しが生じ、それを防止するために貼り合わせ工程において、柔軟性、耐熱性、剥離性などを兼ね備える複雑なクッション材料の構成が必要であったが、本実施形態のフレキシブル回路基板であればそのようなクッション材は不要となり、コストダウンできる。 In the conventional coverlay film, it is necessary to form an opening by punching before bonding to the wiring forming film. For this purpose, a mold is required. However, if the flexible circuit board of this embodiment is used, the mold is unnecessary and the cost can be reduced accordingly. In addition, in order to form the opening by punching, the size, shape, and opening ratio of the opening are limited. Therefore, it is not possible to design a small opening and the design of the opening shape is not free. If it is a flexible circuit board, the size and shape of the opening can be designed freely. In addition, if the flexible circuit board of this embodiment is used, it is not necessary to perform half-cut punching, the release film for the coverlay can be thinned, and the change in dimensional accuracy such as curl due to stress at the time of peeling is greatly increased. Therefore, the cost can be reduced. Furthermore, the flexible circuit board according to the present embodiment can easily process roll-to-roll, and can easily align the cover sheet and the wiring forming film at the time of bonding. Time can be shortened. In addition, since the conventional cover lay film is bonded after forming an opening, the adhesive oozes out in the opening, and in order to prevent it, in the bonding process, flexibility, heat resistance, peeling However, if the flexible circuit board of this embodiment is used, such a cushioning material is not necessary and the cost can be reduced.
 <ポリイミドフィルム>
 本発明に用いられるカバーシートはポリイミド樹脂を使用することがFPCの耐熱性、寸法安定性、屈曲耐性の点では好ましく、さらには特定の物性を有するポリイミドフィルムを使用することが望ましい。
<Polyimide film>
For the cover sheet used in the present invention, it is preferable to use a polyimide resin in view of heat resistance, dimensional stability, and bending resistance of the FPC, and it is further preferable to use a polyimide film having specific physical properties.
 [ポリイミドフィルムの製造方法]
 ポリイミドフィルムを得るに際しては、まず、芳香族ジアミン成分及び芳香族酸無水物成分を有機溶媒中で重合させることにより、ポリアミック酸溶液(以下、ポリアミド酸溶液ともいう)を得る。
[Production method of polyimide film]
In obtaining a polyimide film, first, an aromatic diamine component and an aromatic acid anhydride component are polymerized in an organic solvent to obtain a polyamic acid solution (hereinafter also referred to as a polyamic acid solution).
 ポリアミック酸溶液は、芳香族ジアミン成分と芳香族酸無水物成分を主成分とする化学物質を有機溶媒中で重合させることによって得ることができる。 The polyamic acid solution can be obtained by polymerizing a chemical substance mainly composed of an aromatic diamine component and an aromatic acid anhydride component in an organic solvent.
 芳香族ジアミン成分としては、例えば、パラフェニレンジアミン、メタフェニレンジアミン、ベンジジン、パラキシリレンジアミン、4,4’-ジアミノジフェニルエーテル、3,4’-ジアミノジフェニルエーテル、4,4’-ジアミノジフェニルメタン、4,4’-ジアミノジフェニルスルホン、3,3’-ジメチル-4,4’-ジアミノジフェニルメタン、1,5-ジアミノナフタレン、3,3’-ジメトキシベンジジン、1,4-ビス(3-メチル-5-アミノフェニル)ベンゼン及びこれらのアミド形成性誘導体が挙げられる。これらは、1種単独で使用してもよく、2種以上を混合して用いてもよい。 Examples of the aromatic diamine component include paraphenylene diamine, metaphenylene diamine, benzidine, paraxylylene diamine, 4,4′-diaminodiphenyl ether, 3,4′-diaminodiphenyl ether, 4,4′-diaminodiphenylmethane, 4, 4'-diaminodiphenylsulfone, 3,3'-dimethyl-4,4'-diaminodiphenylmethane, 1,5-diaminonaphthalene, 3,3'-dimethoxybenzidine, 1,4-bis (3-methyl-5-amino Phenyl) benzene and their amide-forming derivatives. These may be used individually by 1 type, and 2 or more types may be mixed and used for them.
 芳香族ジアミン成分としては、耐熱性や熱による寸法安定性が優れるなどの観点から、パラフェニレンジアミン、4,4’-ジアミノジフェニルエーテルからなる群から選ばれる1以上が好ましい。 The aromatic diamine component is preferably at least one selected from the group consisting of paraphenylenediamine and 4,4'-diaminodiphenyl ether from the viewpoint of excellent heat resistance and dimensional stability due to heat.
 芳香族酸無水物成分の具体例としては、例えば、ピロメリット酸、3,3’,4,4’-ビフェニルテトラカルボン酸、2,3’,3,4’-ビフェニルテトラカルボン酸、3,3’,4,4’-ベンゾフェノンテトラカルボン酸、2,3,6,7-ナフタレンテトラカルボン酸、2,2-ビス(3,4-ジカルボキシフェニル)エーテル、ピリジン-2,3,5,6-テトラカルボン酸及びこれらのアミド形成性誘導体等の芳香族テトラカルボン酸の酸無水物成分が挙げられる。これらは、1種単独で使用してもよく、2種以上を混合して用いてもよい。 Specific examples of the aromatic acid anhydride component include, for example, pyromellitic acid, 3,3 ′, 4,4′-biphenyltetracarboxylic acid, 2,3 ′, 3,4′-biphenyltetracarboxylic acid, 3, 3 ′, 4,4′-benzophenonetetracarboxylic acid, 2,3,6,7-naphthalenetetracarboxylic acid, 2,2-bis (3,4-dicarboxyphenyl) ether, pyridine-2,3,5 Examples thereof include acid anhydride components of aromatic tetracarboxylic acids such as 6-tetracarboxylic acid and amide-forming derivatives thereof. These may be used individually by 1 type, and 2 or more types may be mixed and used for them.
 芳香族酸無水物成分としては、耐熱性や熱による寸法安定性が優れるなどの観点から、ピロメリット酸二無水物及び/又は3,3’,4,4’-ビフェニルテトラカルボン酸二無水物が好ましい。 As the aromatic acid anhydride component, pyromellitic dianhydride and / or 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride are used from the viewpoint of excellent heat resistance and dimensional stability due to heat. Is preferred.
 本発明において、芳香族ジアミン成分及び酸無水物成分の組み合わせとしては、パラフェニレンジアミン、4,4’-ジアミノジフェニルエーテル及び3,4’-ジアミノジフェニルエーテルからなる群から選ばれる1以上の芳香族ジアミン成分と、ピロメリット酸二無水物及び/又は3,3',4,4'-ビフェニルテトラカルボン酸二無水物の芳香族酸無水物成分の組み合わせが特に好ましい。 In the present invention, the combination of the aromatic diamine component and the acid anhydride component includes one or more aromatic diamine components selected from the group consisting of paraphenylenediamine, 4,4′-diaminodiphenyl ether and 3,4′-diaminodiphenyl ether. And a combination of pyromellitic dianhydride and / or an aromatic acid anhydride component of 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride is particularly preferable.
 芳香族ジアミン成分がパラフェニレンジアミンと4,4'-ジアミノジフェニルエーテルを含む場合、パラフェニレンジアミンと4,4'-ジアミノジフェニルエーテルのモル比は、50/50~0/100であることが好ましく、40/60~0/100であることがより好ましい。 When the aromatic diamine component contains paraphenylene diamine and 4,4′-diaminodiphenyl ether, the molar ratio of paraphenylene diamine to 4,4′-diaminodiphenyl ether is preferably 50/50 to 0/100, More preferred is / 60 to 0/100.
 芳香族酸無水物成分がピロメリット酸二無水物と3,3',4,4'-ビフェニルテトラカルボン酸二無水物を含む場合、ピロメリット酸二無水物と3,3',4,4'-ビフェニルテトラカルボン酸二無水物のモル比は、100/0~50/50であることが好ましく、100/0~60/40であることがより好ましい。 When the aromatic acid anhydride component comprises pyromellitic dianhydride and 3,3 ′, 4,4′-biphenyltetracarboxylic dianhydride, pyromellitic dianhydride and 3,3 ′, 4,4 The molar ratio of '-biphenyltetracarboxylic dianhydride is preferably 100/0 to 50/50, and more preferably 100/0 to 60/40.
 ポリイミドフィルムを製造する方法としては、例えば、ポリアミック酸溶液をフィルム状にキャストし熱的に脱環化脱溶媒させてポリイミドフィルムを得る方法、ポリアミック酸溶液に環化触媒及び脱水剤を混合し化学的に脱環化させてゲルフィルムを作製し、これを加熱脱溶媒することによりポリイミドフィルムを得る方法が挙げられるが、後者の方が好ましい。 As a method for producing a polyimide film, for example, a method in which a polyamic acid solution is cast into a film and thermally decyclized and desolvated to obtain a polyimide film, a cyclization catalyst and a dehydrating agent are mixed in the polyamic acid solution, and a chemical is obtained. A method of obtaining a polyimide film by preparing a gel film by decyclizing it and heating and desolvating it is preferred, but the latter is preferred.
 このようにして得られたポリイミドフィルムに対して、さらにアニール処理を行うことが、熱収縮率を小さくできる(具体的には、200℃で60分加熱後の熱収縮率を0.2%以下とできる。)などの観点から、好ましい。アニール処理の方法は、特に限定されず、常法に従ってよい。アニール処理の温度としては、特に限定されないが、200~500℃が好ましく、200~370℃がより好ましく、210~350℃が特に好ましい。具体的には、前記温度範囲に加熱された炉の中を、低張力下にてフィルムを走行させ、アニール処理を行うことが好ましい。炉の中でフィルムが滞留する時間が処理時間となるが、走行速度を変えることでコントロールすることになり、5秒~5分の処理時間であることが好ましい。また走行時のフィルム張力は10~50N/mが好ましく、さらには20~30N/mが好ましい。 The polyimide film thus obtained can be further annealed to reduce the heat shrinkage rate (specifically, the heat shrinkage rate after heating at 200 ° C. for 60 minutes is 0.2% or less. From the viewpoint of the above. The method of annealing treatment is not particularly limited, and may be according to a conventional method. The annealing temperature is not particularly limited, but is preferably 200 to 500 ° C, more preferably 200 to 370 ° C, and particularly preferably 210 to 350 ° C. Specifically, it is preferable to carry out the annealing treatment by running the film in a furnace heated to the above temperature range under low tension. The time during which the film stays in the furnace is the processing time, but it is controlled by changing the running speed, and the processing time is preferably 5 seconds to 5 minutes. The film tension during running is preferably 10 to 50 N / m, more preferably 20 to 30 N / m.
 ポリイミドフィルムは、FPCの寸法精度を高めるために、200℃で60分加熱後の熱収縮率が、通常0.2%以下(例えば、0.01~0.15%)、好ましくは0.15%以下(例えば、0.01~0.1%)、好ましくは0.1%以下(例えば、0.01~0.07%)である。ポリイミドフィルムの200℃で60分加熱後の熱収縮率は、25℃、60%RHに調整された部屋に2時間以上放置した後のフィルム寸法(L1)を、CNC画像処理装置システムNEXIV VM-250(ニコン製)を用いて測定し、続いて200℃で60分間加熱した後再び25℃、60%RHに調整された部屋に1日間放置した後のフィルム寸法(L2)を、前記CNC画像処理装置システムを用いて測定し、下記式により算出することができる。
 熱収縮率(%)=-{(L2-L1)/L1}×100
In order to increase the dimensional accuracy of the FPC, the polyimide film has a heat shrinkage ratio after heating at 200 ° C. for 60 minutes, usually 0.2% or less (eg, 0.01 to 0.15%), preferably 0.15. % Or less (for example, 0.01 to 0.1%), preferably 0.1% or less (for example, 0.01 to 0.07%). The heat shrinkage rate after heating the polyimide film at 200 ° C. for 60 minutes is the CNC image processing system NEXIV VM- after the film size (L1) after being left in a room adjusted to 25 ° C. and 60% RH for 2 hours or more. The film dimensions (L2) after measurement using a 250 (Nikon), followed by heating at 200 ° C. for 60 minutes and then leaving again in a room adjusted to 25 ° C. and 60% RH for one day are measured with the CNC image. It can be measured using a processing apparatus system and calculated by the following formula.
Thermal contraction rate (%) =-{(L2-L1) / L1} × 100
 ポリイミドフィルムの平均線膨張係数は、特に限定されないが、例えば0~100ppm/℃、好ましくは0~50ppm/℃、より好ましくは3~35ppm/℃である。前記熱膨張係数は、島津製作所製TMA-50を使用し、測定温度範囲:50~200℃、昇温速度:10℃/分の条件で測定することができる。 The average linear expansion coefficient of the polyimide film is not particularly limited, but is, for example, 0 to 100 ppm / ° C., preferably 0 to 50 ppm / ° C., more preferably 3 to 35 ppm / ° C. The thermal expansion coefficient can be measured by using TMA-50 manufactured by Shimadzu Corporation under the conditions of a measurement temperature range: 50 to 200 ° C. and a temperature increase rate: 10 ° C./min.
 <実施例1>
 実施例1では、カバーシートとして、保護フィルムが厚さ12.5μmのカプトン50ENであって、その上にエポキシ系の接着剤20μmが形成された(株)ウノン技研製のカバーシートを用いた。このカバーシートを、片面に回路が形成された回路形成基板に、150℃、3MPa、30分の貼り合わせ条件にて貼り付けた。
<Example 1>
In Example 1, a cover sheet manufactured by Unon Giken Co., Ltd. was used, in which the protective film was Kapton 50EN having a thickness of 12.5 μm and an epoxy adhesive 20 μm was formed thereon. This cover sheet was affixed to a circuit-forming substrate having a circuit formed on one side under a bonding condition of 150 ° C., 3 MPa, 30 minutes.
 このカバーシート付きフレキシブル回路基板の保護フィルムの一部を東レエンジニアリング(株)製のポリイミドエッチング液TPE3000Nにてエッチングして除去し、除去後のシート状の基板から開口部を含む範囲で35mm×22.5mmの試験片を作成した。 A part of the protective film of the flexible circuit board with the cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 35 mm × 22 within a range including the opening from the sheet-like substrate after the removal. A test piece of 5 mm was prepared.
 上述の試験片を用いて、過マンガン酸カリウム及び水酸化ナトリウムの少なくとも一方が含有されたエッチング液100g中で接着剤をエッチングし、水洗した後、中和した。 Using the above-mentioned test piece, the adhesive was etched in 100 g of an etching solution containing at least one of potassium permanganate and sodium hydroxide, washed with water, and then neutralized.
 その際、前記試験片の配線が露出するまでのエッチング速度を、エッチング液中に含まれる過マンガン酸カリウム及び水酸化ナトリウムの濃度を各種に変化させた。 At that time, the etching rate until the wiring of the test piece was exposed was changed in various concentrations of potassium permanganate and sodium hydroxide contained in the etching solution.
 その結果を表1に示す。なお、このときの保護フィルムのエッチング条件は、特許第3251515号の条件を使用した。 The results are shown in Table 1. In addition, the conditions of patent 3251515 were used for the etching conditions of the protective film at this time.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
 この結果によれば、過マンガン酸カリウムが含まれない場合は水酸化ナトリウムがどのような濃度であっても、又は、過マンガン酸カリウムが1.2質量%以下であって且つ水酸化ナトリウムが0.05質量%未満の場合、又は、過マンガン酸カリウムが0.1質量%以下であって且つ水酸化ナトリウムが1.5質量%未満の場合、又は、過マンガン酸カリウムが1質量%未満であって且つ水酸化ナトリウムが18質量%以上の場合、又は、過マンガン酸カリウムが0.1質量%未満であって且つ水酸化ナトリウムが5質量%以上の場合では接着剤をエッチングすることができなかった。 According to this result, when potassium permanganate is not included, any concentration of sodium hydroxide or potassium permanganate is 1.2 mass% or less and sodium hydroxide is not present. If less than 0.05% by weight, or if potassium permanganate is 0.1% by weight or less and sodium hydroxide is less than 1.5% by weight, or if potassium permanganate is less than 1% by weight And when sodium hydroxide is 18% by mass or more, or when potassium permanganate is less than 0.1% by mass and sodium hydroxide is 5% by mass or more, the adhesive may be etched. could not.
 一方、過マンガン酸カリウムの濃度が2質量%以上18.15質量%以下かつ水酸化ナトリウムの濃度が20質量%以下、又は、過マンガン酸カリウムの濃度が1質量%以上2質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上20質量%以下、又は、過マンガン酸カリウムの濃度が0.5質量%以上1質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上18質量%未満、又は、過マンガン酸カリウムの濃度が0.1質量%以上0.5質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上18質量%未満、又は、過マンガン酸カリウムの濃度が0.05質量%以上0.1質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上5質量%未満の場合では接着剤をエッチングすることができた。 On the other hand, the concentration of potassium permanganate is 2% by mass or more and 18.15% by mass or less and the concentration of sodium hydroxide is 20% by mass or less, or the concentration of potassium permanganate is 1% by mass or more and less than 2% by mass and water. The concentration of sodium oxide is 0.05% by mass or more and 20% by mass or less, or the concentration of potassium permanganate is 0.5% by mass or more and less than 1% by mass, and the concentration of sodium hydroxide is 0.05% by mass or more and 18% by mass. %, Or the concentration of potassium permanganate is 0.1% by mass or more and less than 0.5% by mass and the concentration of sodium hydroxide is 1.5% by mass or more and less than 18% by mass, or the concentration of potassium permanganate Was 0.05 mass% or more and less than 0.1 mass% and the concentration of sodium hydroxide was 1.5 mass% or more and less than 5 mass%, the adhesive could be etched.
 そのため、表中に数字が表示された条件及び○が示された条件、すなわち太線で囲まれた範囲では、厚さ10μmの接着剤を60分以内でエッチングすることができ、表中にエッチング不可又は×が示された条件では、厚さ10μmの接着剤を60分以内でエッチングすることができないと推定される。 Therefore, in the conditions indicated by numbers in the table and the conditions indicated by ◯, that is, the range surrounded by the thick line, the 10 μm thick adhesive can be etched within 60 minutes, and cannot be etched in the table. Alternatively, it is presumed that the adhesive having a thickness of 10 μm cannot be etched within 60 minutes under the conditions indicated by “x”.
 また、エッチングできる条件のなかではそれぞれの薬液とも濃度が高いほどエッチング時間は短かった。 In addition, the etching time was shorter as the concentration of each chemical solution was higher in the etching conditions.
 <実施例2>
 実施例2では、実施例1と同じ試験片を用いて、接着剤のエッチング液として過マンガン酸ナトリウムと水酸化ナトリウムとの少なくとも一方が含有されている溶液を用いて接着剤をエッチングした。すなわち、本実施例ではエッチング液に含まれる過マンガン酸塩は、実施例1とは異なり、過マンガン酸ナトリウムである。
<Example 2>
In Example 2, the same test piece as in Example 1 was used, and the adhesive was etched using a solution containing at least one of sodium permanganate and sodium hydroxide as an adhesive etchant. That is, in this example, unlike in Example 1, the permanganate contained in the etching solution is sodium permanganate.
 その結果を表2に示す。なお、このときの保護フィルムのエッチング条件は、特許第3251515号の条件を使用した。 The results are shown in Table 2. In addition, the conditions of patent 3251515 were used for the etching conditions of the protective film at this time.
Figure JPOXMLDOC01-appb-T000002
Figure JPOXMLDOC01-appb-T000002
 この結果によれば、過マンガン酸ナトリウムが0.05質量%の場合は水酸化ナトリウムがどのような濃度であっても、又は、過マンガン酸ナトリウムが1.2質量%以下であって水酸化ナトリウムが含有されていない場合、又は、過マンガン酸ナトリウム0.1質量%以下であって且つ水酸化ナトリウムが1.5質量%未満の場合、又は、過マンガン酸ナトリウムが0.5質量%以下であって且つ水酸化ナトリウム18質量%以上である場合では接着剤をエッチングすることができなかった。 According to this result, when sodium permanganate is 0.05% by mass, any concentration of sodium hydroxide or sodium permanganate is 1.2% by mass or less and When sodium is not contained, or when sodium permanganate is 0.1 mass% or less and sodium hydroxide is less than 1.5 mass%, or sodium permanganate is 0.5 mass% or less However, when the amount of sodium hydroxide was 18% by mass or more, the adhesive could not be etched.
 一方、過マンガン酸ナトリウムの濃度が2質量%以上20質量%以下かつ水酸化ナトリウムの濃度が20質量%以下、又は、過マンガン酸ナトリウムの濃度が1質量%以上2質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上20質量%以下、又は、過マンガン酸ナトリウムの濃度が0.5質量%以上1質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上18質量%未満、又は、過マンガン酸ナトリウムの濃度が0.1質量%以上0.5質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上18質量%未満の場合は接着剤をエッチングすることができた。 On the other hand, the concentration of sodium permanganate is 2% by mass to 20% by mass and the concentration of sodium hydroxide is 20% by mass or less, or the concentration of sodium permanganate is 1% by mass to less than 2% by mass and sodium hydroxide Concentration of 0.05% to 20% by mass, or sodium permanganate concentration of 0.5% to less than 1% by mass and sodium hydroxide concentration of 0.05% to less than 18% by mass Alternatively, the adhesive can be etched when the concentration of sodium permanganate is 0.1% by weight or more and less than 0.5% by weight and the concentration of sodium hydroxide is 1.5% by weight or more and less than 18% by weight. It was.
 <実施例3>
 実施例3では、2種類のカバーシートを使用してエッチングを行った。
<Example 3>
In Example 3, etching was performed using two types of cover sheets.
 まず1番目のカバーシートとして、保護フィルムが厚さ12.5μmのカプトン50ENであって、その上にエポキシ系の接着剤20μmが形成された(株)ウノン技研製のカバーシートを用いた。このカバーシートを、両面に回路が形成された回路形成基板の両面に貼り付けた。なお、この接着剤は、実施例1のカバーシートの接着剤とは材質が異なっている。貼り付け条件は実施例1と同じである。 First, as the first cover sheet, a cover sheet manufactured by Unon Giken Co., Ltd. was used, in which the protective film was Kapton 50EN having a thickness of 12.5 μm and an epoxy adhesive 20 μm was formed thereon. This cover sheet was affixed on both surfaces of the circuit formation board in which the circuit was formed in both surfaces. This adhesive is made of a material different from that of the cover sheet of Example 1. The pasting conditions are the same as those in the first embodiment.
 このカバーシート付きフレキシブル回路基板の保護フィルムの一部を東レエンジニアリング(株)製のポリイミドエッチング液TPE3000Nにてエッチングして除去し、除去後のシート状の基板から開口部を含む範囲で40mm×90mmの試験片を作成した。 A part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 40 mm × 90 mm within a range including the opening from the sheet-like substrate after the removal. A test piece was prepared.
 次に、2番目のカバーシートとして、保護フィルムが厚さ12.5μmのカプトン50Hであって、その上にエポキシ系の接着剤20μmが形成されたニッカン工業(株)製のカバーシートを用いて、このカバーシートを両面に回路が形成された回路形成基板の両面に貼り付けた。貼り合わせ条件は、160℃、3MPa、40分とした。 Next, as a second cover sheet, a cover sheet made by Nikkan Kogyo Co., Ltd., in which the protective film is Kapton 50H having a thickness of 12.5 μm and an epoxy adhesive 20 μm formed thereon, is used. The cover sheet was affixed to both sides of a circuit-forming substrate on which circuits were formed on both sides. The bonding conditions were 160 ° C., 3 MPa, and 40 minutes.
 このカバーシート付きフレキシブル回路基板の保護フィルムの一部を東レエンジニアリング(株)製のポリイミドエッチング液TPE3000Nにてエッチングして除去し、除去後のシート状の基板から開口部を含む範囲で40mm×90mmの試験片を作成した。 A part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 40 mm × 90 mm within a range including the opening from the sheet-like substrate after the removal. A test piece was prepared.
 上述の2種類の試験片を用いて、過マンガン酸ナトリウム及び水酸化ナトリウム含有のエッチング液100g中で接着剤をエッチングし、水洗した後、中和した。 The adhesive was etched in 100 g of an etching solution containing sodium permanganate and sodium hydroxide using the above-mentioned two types of test pieces, washed with water, and then neutralized.
 その結果を表3に示す。なお、このときの保護フィルムのエッチング条件は、特許第3251515号の条件を使用した。 The results are shown in Table 3. In addition, the conditions of patent 3251515 were used for the etching conditions of the protective film at this time.
Figure JPOXMLDOC01-appb-T000003
Figure JPOXMLDOC01-appb-T000003
 この結果によれば、過マンガン酸ナトリウム8.5質量%、水酸化ナトリウムが5質量%の濃度ではエッチング時間は異なるが、接着剤をエッチングすることができた。 According to this result, the adhesive could be etched although the etching time was different at a concentration of 8.5% by mass of sodium permanganate and 5% by mass of sodium hydroxide.
 <実施例4>
 実施例4では、2種類のカバーシートを使用してエッチングを行った。
<Example 4>
In Example 4, etching was performed using two types of cover sheets.
 まず1番目のカバーシートとして、保護フィルムが厚さ12.5μmのカプトン50ENCであって、その上にエポキシ系の接着剤25μmが形成された京セラケミカル(株)製のカバーシートを用いた。このカバーシートを、両面に回路が形成された回路形成基板の両面に貼り付けた。なお、この接着剤は、実施例1、2のカバーシートの接着剤とは材質が異なっている。貼り付け条件は実施例1と同じである。 First, as the first cover sheet, a cover sheet made of Kyocera Chemical Co., Ltd. was used, in which the protective film was Kapton 50ENC having a thickness of 12.5 μm and an epoxy adhesive 25 μm was formed thereon. This cover sheet was affixed on both surfaces of the circuit formation board in which the circuit was formed in both surfaces. This adhesive is different in material from the adhesives of the cover sheets of Examples 1 and 2. The pasting conditions are the same as those in the first embodiment.
 このカバーシート付きフレキシブル回路基板の保護フィルムの一部を東レエンジニアリング(株)製のポリイミドエッチング液TPE3000Nにてエッチングして除去し、除去後のシート状の基板から開口部を含む範囲で20mm×20mmの試験片を作成した。 A part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 20 mm × 20 mm within the range including the opening from the sheet-like substrate after the removal. A test piece was prepared.
 次に、2番目のカバーシートとして、保護フィルムが厚さ12.5μmのカプトン50ENCであって、その上にエポキシ系の接着剤25μmが形成された京セラケミカル(株)製のカバーシートを用いて、このカバーシートを両面に回路が形成された回路形成基板の両面に貼り付けた。貼り合わせ条件は、実施例1と同じである。なお、このカバーシートの接着剤は、実施例1,2のカバーシート及び本実施例の1番目のカバーシートの接着剤とは材質が異なっている。 Next, as the second cover sheet, a cover sheet made by Kyocera Chemical Co., Ltd., in which the protective film is Kapton 50ENC having a thickness of 12.5 μm and an epoxy adhesive 25 μm formed thereon, is used. The cover sheet was affixed to both sides of a circuit-forming substrate on which circuits were formed on both sides. The bonding conditions are the same as in Example 1. The cover sheet adhesive is different in material from the cover sheets of Examples 1 and 2 and the first cover sheet of this example.
 このカバーシート付きフレキシブル回路基板の保護フィルムの一部を東レエンジニアリング(株)製のポリイミドエッチング液TPE3000Nにてエッチングして除去し、除去後のシート状の基板から開口部を含む範囲で20mm×20mmの試験片を作成した。 A part of the protective film of the flexible circuit board with cover sheet is removed by etching with a polyimide etching solution TPE3000N manufactured by Toray Engineering Co., Ltd., and 20 mm × 20 mm within the range including the opening from the sheet-like substrate after the removal. A test piece was prepared.
 上述の2種類の試験片を用いて、過マンガン酸ナトリウム及び水酸化ナトリウム含有のエッチング液100g中で接着剤をエッチングし、水洗した後、中和した。 The adhesive was etched in 100 g of an etching solution containing sodium permanganate and sodium hydroxide using the above-mentioned two types of test pieces, washed with water, and then neutralized.
 その結果を表4に示す。なお、このときの保護フィルムのエッチング条件は、特許第3251515号の条件を使用した。 The results are shown in Table 4. In addition, the conditions of patent 3251515 were used for the etching conditions of the protective film at this time.
Figure JPOXMLDOC01-appb-T000004
Figure JPOXMLDOC01-appb-T000004
 この結果によれば、過マンガン酸ナトリウム8.5質量%、水酸化ナトリウムが5質量%の濃度ではエッチング時間は異なるが、接着剤をエッチングすることができた。 According to this result, the adhesive could be etched although the etching time was different at a concentration of 8.5% by mass of sodium permanganate and 5% by mass of sodium hydroxide.
 (実施形態2)
 実施形態2に係るフレキシブル回路基板は、図4に示すフレキシブル回路基板の、保護フィルム12に形成された開口部及び配線露出工程において一部の接着剤15が除去された部分に、図5に示すように、導電部材からなる導電層50が形成されている。導電層50は配線33の上面39の上に載せられていて、接着剤露出工程及び配線露出工程において形成された窪み全体を満たすように形成されている。導電層50は、導電性ペーストの塗布や、めっきなどによって形成することができる。なお、図4に示す実施形態1に係るフレキシブル回路基板の接着剤層15及び配線30の一部に導電層50以外の部材を載置した後に、それらを覆うように導電層50を形成しても構わない。
(Embodiment 2)
The flexible circuit board according to the second embodiment is shown in FIG. 5 in the part of the flexible circuit board shown in FIG. 4 from which the adhesive 15 is removed in the opening formed in the protective film 12 and the wiring exposure process. Thus, the conductive layer 50 made of a conductive member is formed. The conductive layer 50 is placed on the upper surface 39 of the wiring 33 and is formed so as to fill the entire depression formed in the adhesive exposing step and the wiring exposing step. The conductive layer 50 can be formed by applying a conductive paste or plating. In addition, after mounting members other than the conductive layer 50 on a part of the adhesive layer 15 and the wiring 30 of the flexible circuit board according to Embodiment 1 shown in FIG. 4, the conductive layer 50 is formed so as to cover them. It doesn't matter.
 (実施形態3)
 実施形態3に係るフレキシブル回路基板は、図4に示すフレキシブル回路基板の、保護フィルム12に形成された開口部及び配線露出工程において一部の接着剤15が除去された部分に、図6に示すように、導電部材からなる導電層52が形成されており、この導電層52はめっき層である。導電層52は配線34の上面39の上に載せられていて、接着剤露出工程及び配線露出工程において形成された窪みの底面全体及び側面を被覆するように形成されている。めっき層である導電層52を形成するめっき方法は特に限定されない。なお、図4に示す実施形態1に係るフレキシブル回路基板の接着剤層15及び配線30の一部に導電層52以外の部材を載置した後に、それらを被覆するように導電層52を形成しても構わない。
(Embodiment 3)
The flexible circuit board according to the third embodiment is shown in FIG. 6 in the part of the flexible circuit board shown in FIG. 4 where the adhesive 15 is removed in the opening formed in the protective film 12 and the wiring exposure process. Thus, a conductive layer 52 made of a conductive member is formed, and this conductive layer 52 is a plating layer. The conductive layer 52 is placed on the upper surface 39 of the wiring 34 and is formed so as to cover the entire bottom surface and side surfaces of the recess formed in the adhesive exposing step and the wiring exposing step. The plating method for forming the conductive layer 52 that is a plating layer is not particularly limited. In addition, after mounting members other than the conductive layer 52 on a part of the adhesive layer 15 and the wiring 30 of the flexible circuit board according to Embodiment 1 shown in FIG. 4, the conductive layer 52 is formed so as to cover them. It doesn't matter.
 (その他の実施形態)
 上述の実施形態は本願発明の例示であって、本願発明はこれらの例に限定されず、これらの例に周知技術や慣用技術、公知技術を組み合わせたり、一部置き換えたりしてもよい。また当業者であれば容易に思いつく改変発明も本願発明に含まれる。
(Other embodiments)
The above-described embodiment is an exemplification of the present invention, and the present invention is not limited to these examples, and these examples may be combined or partially replaced with known techniques, common techniques, and known techniques. Also, modified inventions easily conceived by those skilled in the art are included in the present invention.
 絶縁フィルムや保護フィルムの材質や厚み等は、絶縁性を有していてフレキシブル回路基板としての諸特性を満たすものであれば、どのようなものであっても構わない。例えば保護フィルムとしてポリエステル樹脂のフィルムを用いても構わない。この場合、アルカリ性溶液(例えばヒドラジン水溶液)を用いてポリエステル樹脂フィルムのエッチングを行えばよい。また、接着剤もカバーシート用に使用されるものであれば材質は特に限定されない。 The material and thickness of the insulating film and the protective film may be any material as long as they have insulating properties and satisfy various characteristics as a flexible circuit board. For example, a polyester resin film may be used as the protective film. In this case, the polyester resin film may be etched using an alkaline solution (for example, an aqueous hydrazine solution). The material is not particularly limited as long as the adhesive is also used for the cover sheet.
 また、接着剤も絶縁性を有しているものであれば種類は特に限定されない。 Also, the type of the adhesive is not particularly limited as long as it has insulating properties.
 保護フィルムが上に配置されていない部分の配線は、上面のみが露出していることが好ましいが、側面の上方も一部露出していても構わない。側面の1/2以上が接着剤に囲まれている(すなわち、少なくとも配線の側面の半分が接着剤に埋まっている)状態であれば、絶縁性や機械的強度の効果を奏する。 It is preferable that only the upper surface of the wiring where the protective film is not disposed is exposed, but the upper part of the side surface may be partially exposed. If at least half of the side surface is surrounded by the adhesive (that is, at least half of the side surface of the wiring is buried in the adhesive), an effect of insulation and mechanical strength is obtained.
 保護フィルムを除去した後に、レーザーを用いて配線上の接着剤を除去しても構わない。また、接着剤を、サンドブラスト法を用いて除去しても構わない。 After removing the protective film, the adhesive on the wiring may be removed using a laser. Further, the adhesive may be removed using a sand blast method.
 また、フレキシブル回路基板の配線が高精細部とそれ以外に分かれている場合は、高精細部のみに本技術を適用し、それ以外の部分には従来技術であるカバーコートやあらかじめ開口部が設けられたカバーレイを使用する複合体(いわゆる、ハイブリッドタイプ)とすることもできる。 Also, if the wiring of the flexible circuit board is divided into a high-definition part and other parts, this technology is applied only to the high-definition part, and the other parts are provided with a conventional cover coat and an opening in advance. It is also possible to use a composite (so-called hybrid type) that uses the covered cover.
 また、フレキシブル回路基板は配線が片面に形成されているタイプでもよいし、両面に形成されているタイプでもよいし、回路層を3層以上備える多層タイプでもよい。このとき、配線が片面に形成されているタイプでは、配線が形成されている面にカバーシートが形成されるし、両面配線のタイプでは両面にカバーシートが形成される。多層タイプの場合は、積層方法に応じて、片面タイプが積層される場合と、両面タイプが積層される場合、あるいは片面と両面とが混在して積層される場合があるが、いずれにせよ最外層と内層の回路面にカバーシートが形成される。 Also, the flexible circuit board may be a type in which wiring is formed on one side, a type in which wiring is formed on both sides, or a multilayer type having three or more circuit layers. At this time, in the type in which the wiring is formed on one side, the cover sheet is formed on the surface on which the wiring is formed, and in the double-sided wiring type, the cover sheet is formed on both sides. In the case of the multi-layer type, depending on the laminating method, the single-sided type may be laminated, the double-sided type may be laminated, or the single-sided and double-sided may be laminated together. Cover sheets are formed on the circuit surfaces of the outer layer and the inner layer.
 また、本技術はフレキシブル回路基板とプリント基板とを組み合わせた、いわゆるリジッドフレックス基板においても内層カバーシート構造として使用できる。 In addition, the present technology can be used as an inner cover sheet structure even in a so-called rigid flex board in which a flexible circuit board and a printed board are combined.
 上記の実施形態に係るフレキシブル回路基板を複数枚積層して、隣合う2つのフレキシブル回路基板の配線同士を電気的に導通をさせてもよく、その導通方法としては、例えば絶縁フィルムに配線まで達する貫通孔を形成し、その貫通孔に導電部材を埋め込むと同時に絶縁フィルムの配線が配置されている面とは反対面側にその導電部材を突出させ、その突出部ともう一つのフレキシブル回路基板の配線とを接触させる、という方法が挙げられるが、この方法に限定されない。 A plurality of flexible circuit boards according to the above embodiment may be stacked to electrically connect the wirings of two adjacent flexible circuit boards. As a conduction method, for example, the wiring reaches an insulating film. A through hole is formed, and the conductive member is embedded in the through hole, and at the same time, the conductive member is protruded on the side opposite to the surface on which the wiring of the insulating film is arranged, and the protruding portion and another flexible circuit board Although the method of making it contact with wiring is mentioned, It is not limited to this method.
10            カバーシート
12            保護フィルム
14、15      接着剤
20            配線形成フィルム
22            絶縁フィルム
30,30a    配線
31            配線
32,32a    配線
33            配線
34            配線
39            上面
50,52   導電層
DESCRIPTION OF SYMBOLS 10 Cover sheet 12 Protective film 14, 15 Adhesive 20 Wiring formation film 22 Insulating film 30, 30a Wiring 31 Wiring 32, 32a Wiring 33 Wiring 34 Wiring 39 Upper surface 50, 52 Conductive layer

Claims (10)

  1.  絶縁フィルムと、前記絶縁フィルム上に形成された配線と、前記絶縁フィルム及び前記配線の一部の上に配置された絶縁性の保護フィルムとを備え、
     前記保護フィルムは、前記絶縁フィルム及び前記配線に接着剤を介して貼り合わせられており、
     前記配線のうち、前記保護フィルムが上に配置されていない部分は、上面が露出しているとともに側方あるいは周囲に前記接着剤が付着している、フレキシブル回路基板。
    Insulating film, wiring formed on the insulating film, and an insulating protective film disposed on a part of the insulating film and the wiring,
    The protective film is bonded to the insulating film and the wiring via an adhesive,
    Of the wiring, the portion where the protective film is not disposed on the upper surface is exposed, and the adhesive is attached to the side or the periphery.
  2.  前記保護フィルムはポリイミド樹脂及びポリエステル樹脂のいずれか一つからなる、請求項1に記載されているフレキシブル回路基板。 The flexible circuit board according to claim 1, wherein the protective film is made of any one of a polyimide resin and a polyester resin.
  3.  絶縁フィルムと、前記絶縁フィルム上に形成された配線と、前記絶縁フィルム及び前記配線の一部の上に配置された絶縁性の保護フィルムとを備え、
     前記保護フィルムは、前記絶縁フィルム及び前記配線に接着剤を介して貼り合わせられており、
     前記保護フィルムが上に配置されていない部分においては、前記配線の側方あるいは周囲に前記接着剤が付着しており、前記配線が形成されていない前記絶縁フィルム上に前記接着剤が設けられているとともに、前記接着剤の表面及び前記配線の上面には導電性部材からなる導電層が載せられている、フレキシブル回路基板。
    Insulating film, wiring formed on the insulating film, and an insulating protective film disposed on a part of the insulating film and the wiring,
    The protective film is bonded to the insulating film and the wiring via an adhesive,
    In the portion where the protective film is not disposed on, the adhesive is attached to the side or the periphery of the wiring, and the adhesive is provided on the insulating film where the wiring is not formed. And a flexible circuit board on which a conductive layer made of a conductive member is placed on the surface of the adhesive and the upper surface of the wiring.
  4.  前記導電層はめっき層である、請求項3に記載されているフレキシブル回路基板。 The flexible circuit board according to claim 3, wherein the conductive layer is a plating layer.
  5.  絶縁フィルム上に配線が形成された配線形成フィルムを準備する工程と、
     絶縁性の保護フィルムの一方の面に接着剤が形成されているカバーシートを、前記接着剤を前記配線に向かい合わせて前記配線形成フィルムに載せて貼り合わせる貼り合わせ工程と、
     前記保護フィルムの一部を除去して前記接着剤の一部を露出させる接着剤露出工程と、
     露出した前記接着剤の前記一部のうち上部を除去して前記配線の上面を露出させる配線露出工程と
     を含む、フレキシブル回路基板の製造方法。
    Preparing a wiring forming film in which wiring is formed on an insulating film;
    A bonding step in which an adhesive is formed on one surface of the insulating protective film, and a bonding step in which the adhesive is placed on the wiring forming film so that the adhesive faces the wiring.
    An adhesive exposing step of removing a part of the protective film to expose a part of the adhesive;
    And a wiring exposing step of removing an upper part of the exposed part of the adhesive to expose an upper surface of the wiring.
  6.  前記保護フィルムはポリイミド樹脂及びポリエステル樹脂のいずれか一つからなり、前記接着剤露出工程はエッチングにより行われる、請求項5に記載されているフレキシブル回路基板の製造方法。 The method for manufacturing a flexible circuit board according to claim 5, wherein the protective film is made of any one of a polyimide resin and a polyester resin, and the adhesive exposing step is performed by etching.
  7.  前記配線露出工程は、過マンガン酸塩を含む溶液を用いたエッチングにより行われる、請求項5又は6に記載されているフレキシブル回路基板の製造方法。 The method for manufacturing a flexible circuit board according to claim 5 or 6, wherein the wiring exposure step is performed by etching using a solution containing a permanganate.
  8.  前記配線露出工程において用いられる前記溶液は、さらに水酸化ナトリウムを含んでいる、請求項7に記載されているフレキシブル回路基板の製造方法。 The method for manufacturing a flexible circuit board according to claim 7, wherein the solution used in the wiring exposure step further contains sodium hydroxide.
  9.  前記配線露出工程において用いられる前記溶液は、
     過マンガン酸カリウムの濃度が2質量%以上18.15質量%以下かつ水酸化ナトリウムの濃度が20質量%以下、
     又は、過マンガン酸カリウムの濃度が1質量%以上2質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上20質量%以下、
     又は、過マンガン酸カリウムの濃度が0.5質量%以上1質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上18質量%未満、
     又は、過マンガン酸カリウムの濃度が0.1質量%以上0.5質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上18質量%未満、
     又は、過マンガン酸カリウムの濃度が0.05質量%以上0.1質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上5質量%未満、
     のいずれかである、請求項7又は8に記載されているフレキシブル回路基板の製造方法。
    The solution used in the wiring exposure step is
    The concentration of potassium permanganate is 2% by mass or more and 18.15% by mass or less, and the concentration of sodium hydroxide is 20% by mass or less,
    Or the concentration of potassium permanganate is 1% by mass or more and less than 2% by mass and the concentration of sodium hydroxide is 0.05% by mass or more and 20% by mass or less,
    Alternatively, the concentration of potassium permanganate is 0.5% by mass or more and less than 1% by mass and the concentration of sodium hydroxide is 0.05% by mass or more and less than 18% by mass,
    Or the concentration of potassium permanganate is 0.1% by mass or more and less than 0.5% by mass and the concentration of sodium hydroxide is 1.5% by mass or more and less than 18% by mass,
    Or the concentration of potassium permanganate is 0.05% by weight or more and less than 0.1% by weight and the concentration of sodium hydroxide is 1.5% by weight or more and less than 5% by weight,
    The method for producing a flexible circuit board according to claim 7, which is any one of the above.
  10.  前記配線露出工程において用いられる前記溶液は、
     過マンガン酸ナトリウムの濃度が2質量%以上20質量%以下かつ水酸化ナトリウムの濃度が20質量%以下、
     又は、過マンガン酸ナトリウムの濃度が1質量%以上2質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上20質量%以下、
     又は、過マンガン酸ナトリウムの濃度が0.5質量%以上1質量%未満かつ水酸化ナトリウムの濃度が0.05質量%以上18質量%未満、
     又は、過マンガン酸ナトリウムの濃度が0.1質量%以上0.5質量%未満かつ水酸化ナトリウムの濃度が1.5質量%以上18質量%未満、
     のいずれかである、請求項7又は8に記載されているフレキシブル回路基板の製造方法。
    The solution used in the wiring exposure step is
    The concentration of sodium permanganate is 2% by mass or more and 20% by mass or less, and the concentration of sodium hydroxide is 20% by mass or less,
    Alternatively, the concentration of sodium permanganate is 1% by mass or more and less than 2% by mass and the concentration of sodium hydroxide is 0.05% by mass or more and 20% by mass or less,
    Or the concentration of sodium permanganate is 0.5% by weight or more and less than 1% by weight and the concentration of sodium hydroxide is 0.05% by weight or more and less than 18% by weight,
    Or, the concentration of sodium permanganate is 0.1% by mass or more and less than 0.5% by mass and the concentration of sodium hydroxide is 1.5% by mass or more and less than 18% by mass,
    The method for producing a flexible circuit board according to claim 7, which is any one of the above.
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CN110628346A (en) * 2018-06-25 2019-12-31 昆山雅森电子材料科技有限公司 Ultrathin high-transparency PI film, protective film containing PI film and preparation method
CN111182735A (en) * 2020-02-26 2020-05-19 东莞市天晖电子材料科技有限公司 High-transmission single panel for LED lamp strip and preparation method thereof
CN111182735B (en) * 2020-02-26 2024-01-26 东莞市天晖电子材料科技有限公司 High-transmission single panel for LED lamp strip and preparation method thereof
WO2024095811A1 (en) * 2022-10-31 2024-05-10 日本発條株式会社 Method for producing circuit board

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KR20180122672A (en) 2018-11-13
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