WO2017154773A1 - 光検出装置 - Google Patents
光検出装置 Download PDFInfo
- Publication number
- WO2017154773A1 WO2017154773A1 PCT/JP2017/008483 JP2017008483W WO2017154773A1 WO 2017154773 A1 WO2017154773 A1 WO 2017154773A1 JP 2017008483 W JP2017008483 W JP 2017008483W WO 2017154773 A1 WO2017154773 A1 WO 2017154773A1
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- WIPO (PCT)
- Prior art keywords
- fabry
- interference filter
- perot interference
- light
- photodetector
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- 238000001514 detection method Methods 0.000 title claims abstract description 57
- 230000005540 biological transmission Effects 0.000 claims description 80
- 238000010521 absorption reaction Methods 0.000 claims description 23
- 239000000853 adhesive Substances 0.000 claims description 12
- 230000001070 adhesive effect Effects 0.000 claims description 12
- 230000020169 heat generation Effects 0.000 claims description 12
- 239000010410 layer Substances 0.000 description 66
- 239000004065 semiconductor Substances 0.000 description 22
- 239000000758 substrate Substances 0.000 description 20
- 238000009833 condensation Methods 0.000 description 19
- 230000005494 condensation Effects 0.000 description 19
- 239000000463 material Substances 0.000 description 15
- 229910052751 metal Inorganic materials 0.000 description 12
- 239000002184 metal Substances 0.000 description 12
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 7
- 229910052581 Si3N4 Inorganic materials 0.000 description 6
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 6
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 6
- 229920005591 polysilicon Polymers 0.000 description 6
- 239000011241 protective layer Substances 0.000 description 6
- 229910052710 silicon Inorganic materials 0.000 description 6
- 239000010703 silicon Substances 0.000 description 6
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 6
- 230000004048 modification Effects 0.000 description 5
- 238000012986 modification Methods 0.000 description 5
- 230000003287 optical effect Effects 0.000 description 5
- 238000001816 cooling Methods 0.000 description 4
- 239000011521 glass Substances 0.000 description 4
- 239000010453 quartz Substances 0.000 description 4
- 239000000919 ceramic Substances 0.000 description 3
- 230000008859 change Effects 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 239000004033 plastic Substances 0.000 description 3
- 239000011347 resin Substances 0.000 description 3
- 229920005989 resin Polymers 0.000 description 3
- 229910052814 silicon oxide Inorganic materials 0.000 description 3
- 230000009471 action Effects 0.000 description 2
- 229910052782 aluminium Inorganic materials 0.000 description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 2
- BJQHLKABXJIVAM-UHFFFAOYSA-N bis(2-ethylhexyl) phthalate Chemical group CCCCC(CC)COC(=O)C1=CC=CC=C1C(=O)OCC(CC)CCCC BJQHLKABXJIVAM-UHFFFAOYSA-N 0.000 description 2
- 238000005336 cracking Methods 0.000 description 2
- 238000010438 heat treatment Methods 0.000 description 2
- 239000012535 impurity Substances 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 238000004519 manufacturing process Methods 0.000 description 2
- 230000003595 spectral effect Effects 0.000 description 2
- 238000001228 spectrum Methods 0.000 description 2
- 238000012546 transfer Methods 0.000 description 2
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- JOYRKODLDBILNP-UHFFFAOYSA-N Ethyl urethane Chemical compound CCOC(N)=O JOYRKODLDBILNP-UHFFFAOYSA-N 0.000 description 1
- 229910000530 Gallium indium arsenide Inorganic materials 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- BQCADISMDOOEFD-UHFFFAOYSA-N Silver Chemical compound [Ag] BQCADISMDOOEFD-UHFFFAOYSA-N 0.000 description 1
- 229910010413 TiO 2 Inorganic materials 0.000 description 1
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 description 1
- 230000015572 biosynthetic process Effects 0.000 description 1
- 229910052802 copper Inorganic materials 0.000 description 1
- 239000010949 copper Substances 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 238000005530 etching Methods 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 229910052732 germanium Inorganic materials 0.000 description 1
- GNPVGFCGXDBREM-UHFFFAOYSA-N germanium atom Chemical compound [Ge] GNPVGFCGXDBREM-UHFFFAOYSA-N 0.000 description 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 1
- 229910052737 gold Inorganic materials 0.000 description 1
- 239000010931 gold Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 238000012423 maintenance Methods 0.000 description 1
- 238000000034 method Methods 0.000 description 1
- TWNQGVIAIRXVLR-UHFFFAOYSA-N oxo(oxoalumanyloxy)alumane Chemical compound O=[Al]O[Al]=O TWNQGVIAIRXVLR-UHFFFAOYSA-N 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 230000008569 process Effects 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 229910052709 silver Inorganic materials 0.000 description 1
- 239000004332 silver Substances 0.000 description 1
- 229910000679 solder Inorganic materials 0.000 description 1
- WFKWXMTUELFFGS-UHFFFAOYSA-N tungsten Chemical compound [W] WFKWXMTUELFFGS-UHFFFAOYSA-N 0.000 description 1
- 229910052721 tungsten Inorganic materials 0.000 description 1
- 239000010937 tungsten Substances 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- 239000011800 void material Substances 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/26—Generating the spectrum; Monochromators using multiple reflection, e.g. Fabry-Perot interferometer, variable interference filters
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/02—Details
- G01J1/04—Optical or mechanical part supplementary adjustable parts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
- G01J3/0259—Monolithic
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0286—Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0289—Field-of-view determination; Aiming or pointing of a spectrometer; Adjusting alignment; Encoding angular position; Size of measurement area; Position tracking
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/28—Investigating the spectrum
- G01J3/45—Interferometric spectrometry
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/46—Measurement of colour; Colour measuring devices, e.g. colorimeters
- G01J3/50—Measurement of colour; Colour measuring devices, e.g. colorimeters using electric radiation detectors
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B26/00—Optical devices or arrangements for the control of light using movable or deformable optical elements
- G02B26/001—Optical devices or arrangements for the control of light using movable or deformable optical elements based on interference in an adjustable optical cavity
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/21—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour by interference
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L27/00—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate
- H01L27/14—Devices consisting of a plurality of semiconductor or other solid-state components formed in or on a common substrate including semiconductor components sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation
- H01L27/144—Devices controlled by radiation
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0203—Containers; Encapsulations, e.g. encapsulation of photodiodes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0216—Coatings
- H01L31/02161—Coatings for devices characterised by at least one potential jump barrier or surface barrier
- H01L31/02162—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors
- H01L31/02165—Coatings for devices characterised by at least one potential jump barrier or surface barrier for filtering or shielding light, e.g. multicolour filters for photodetectors using interference filters, e.g. multilayer dielectric filters
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/0232—Optical elements or arrangements associated with the device
- H01L31/02325—Optical elements or arrangements associated with the device the optical elements not being integrated nor being directly associated with the device
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L31/02—Details
- H01L31/024—Arrangements for cooling, heating, ventilating or temperature compensation
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/21—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour by interference
- G02F1/213—Fabry-Perot type
Definitions
- the present disclosure relates to a light detection device including a Fabry-Perot interference filter having a first mirror and a second mirror whose distances are variable.
- Patent Document 1 includes a Fabry-Perot interferometer, a holder that holds the Fabry-Perot interferometer, a Peltier element attached to the holder, and a vacuum container that houses the Fabry-Perot interferometer, the holder, and the Peltier element.
- the etalon part of the interferometer is described.
- a Peltier element is attached to the side of the holder with respect to the optical path from the light entrance window of the vacuum vessel to the light exit window of the vacuum vessel via the Fabry-Perot interferometer.
- the Fabry-Perot interferometer is cooled from the side by the Peltier element, so that when the Fabry-Perot interference filter and the photodetector are accommodated in the package, the Fabry-Perot interference filter and the photodetector are uniform. Therefore, the Fabry-Perot interference filter and the photodetector may not be maintained at a uniform temperature.
- the vicinity of the light incident window of the vacuum vessel is cooled by the Peltier element, so that when the light transmitting member is provided in the opening of the package that houses the Fabry-Perot interference filter and the photodetector, the light transmission Condensation may occur in the member.
- the present disclosure maintains a Fabry-Perot interference filter and a photodetector housed in a package at a uniform temperature while suppressing the occurrence of condensation and cracking in a light transmitting member for allowing light to enter the package.
- An object of the present invention is to provide a photodetection device capable of performing
- a light detection device includes a first mirror and a second mirror that are variable in distance from each other, and transmits light according to the distance between the first mirror and the second mirror.
- a Fabry-Perot interference filter having a region provided on a predetermined line, a photodetector arranged on one side of the line with respect to the Fabry-Perot interference filter, and detecting light transmitted through the light transmission region;
- a package having an opening located on the other side of the Fabry-Perot interference filter and housing the Fabry-Perot interference filter and the photodetector, a light transmitting member provided in the package so as to close the opening, and a Fabry-Perot
- a temperature control element having a first region that is thermally connected to the interference filter and the photodetector and functions as one of the heat absorption region and the heat generation region, It is located on one side with respect to the optical detector at least on the line.
- the first region of the temperature control element that functions as one of the heat absorption region and the heat generation region is located on one side at least on the line with respect to the light detector.
- the Fabry-Perot interference filter and the photo detector have a uniform temperature. Maintained.
- a Fabry-Perot interference filter and a photodetector are disposed between the light transmission member and the first region of the temperature control element.
- the light transmission member is excessively cooled, and the occurrence of condensation on the light transmission member due to the difference between the temperature of the light transmission member and the outside air temperature (usage environment temperature of the light detection device) is suppressed. .
- production of the crack in the light transmissive member resulting from the difference between the temperature of a light transmissive member and external temperature becoming large by heating a light transmissive member excessively is suppressed. Therefore, according to this photodetection device, the Fabry-Perot interference filter and the photodetector housed in the package can be uniformly distributed while suppressing the occurrence of condensation and cracks in the light transmission member for allowing light to enter the package. Temperature can be maintained.
- the outer edge of the opening is located on the inner side of the outer edge of the Fabry-Perot interference filter when viewed from a direction parallel to the line
- the temperature adjustment element includes the package and A second region that is thermally connected and functions as the other of the heat absorption region and the heat generation region may be included.
- the second region of the temperature adjustment element that functions as the other of the heat absorption region and the heat generation region, and the light transmission member Heat is easily transferred through the package. Therefore, according to this structure, it can suppress more reliably that dew condensation and a crack generate
- the outer edge of the light transmission member may be located outside the outer edge of the Fabry-Perot interference filter when viewed from a direction parallel to the line.
- the contact area between the light transmissive member and the package is increased as compared with the case where the outer edge of the light transmissive member is located inside the outer edge of the Fabry-Perot interference filter. Heat is easily transmitted between them. Therefore, according to this structure, it can suppress more reliably that dew condensation and a crack generate
- the temperature adjustment element is disposed in the package
- the light detector is disposed on the temperature adjustment element
- the Fabry-Perot interference filter includes the light detector. You may arrange
- a light detection device includes a support member that supports a portion of a bottom surface of a Fabry-Perot interference filter that is outside a light transmission region, a side surface of the Fabry-Perot interference filter, and a heat conductive member that contacts the support member. And may be further provided.
- the support member is disposed between the Fabry-Perot interference filter and the first region of the temperature control element as compared with the case where the heat conducting member that contacts the side surface of the Fabry-Perot interference filter and the support member is not provided. Heat is easy to be transmitted through. Therefore, according to this configuration, the Fabry-Perot interference filter and the photodetector can be efficiently maintained at a uniform temperature.
- the heat conducting member may be an adhesive member that adheres the Fabry-Perot interference filter and the support member. According to this configuration, the holding state of the Fabry-Perot interference filter on the support member can be stabilized.
- the support member has a mounting surface on which a portion outside the light transmission region of the bottom surface of the Fabry-Perot interference filter is mounted. At least a portion is located on the placement surface such that a portion of the placement surface is disposed outside the side surface, and the heat conducting member is formed by the side surface and a portion of the placement surface. It is arrange
- the temperature adjustment element may be embedded in a wall portion of the package. According to this configuration, the volume of the space in the package can be reduced, and as a result, the Fabry-Perot interference filter and the photodetector can be maintained at a uniform temperature more efficiently.
- the Fabry-Perot interference filter and the photodetector housed in the package are maintained at a uniform temperature while suppressing the occurrence of condensation and cracking in the light transmitting member for allowing light to enter the package. It is possible to provide a photodetection device that can be used.
- FIG. 1 is a cross-sectional view of the photodetecting device according to the first embodiment.
- FIG. 2 is a plan view of the photodetecting device of FIG.
- FIG. 3 is a plan view of a portion including a Fabry-Perot interference filter, a support member, and a heat conduction member in the light detection device of FIG.
- FIG. 4 is a perspective view of a Fabry-Perot interference filter of the light detection device of FIG.
- FIG. 5 is a cross-sectional view of the Fabry-Perot interference filter along the line VV in FIG.
- FIG. 6 is a cross-sectional view of the photodetecting device of the second embodiment.
- FIG. 7 is a cross-sectional view of a modification of the photodetecting device of the second embodiment.
- FIG. 8 is a cross-sectional view of a modification of the photodetecting device of the second embodiment.
- the light detection device 1 ⁇ / b> A includes a package 2.
- the package 2 is a CAN package having a stem 3 and a cap 4.
- the cap 4 is integrally formed by the side wall 5 and the top wall 6.
- the top wall 6 faces the stem 3 in a direction parallel to a predetermined line L that is a straight line.
- the stem 3 and the cap 4 are made of, for example, metal and are airtightly joined to each other.
- the temperature adjusting element 50 is fixed to the inner surface 3a of the stem 3.
- the temperature adjustment element 50 is, for example, a Peltier element, and has a heat absorption region 50a and a heat generation region 50b that face each other in a direction parallel to the line L.
- the temperature adjusting element 50 is arranged in the package 2 so that the heat generating region 50b is located on the inner surface 3a side of the stem 3 and the heat absorbing region 50a is located on the opposite side. Thereby, the heat generating region 50b of the temperature adjusting element 50 is thermally connected to the package 2.
- the wiring board 7 is fixed on the endothermic region 50 a of the temperature control element 50.
- a substrate material of the wiring substrate 7 for example, silicon, ceramic, quartz, glass, plastic, or the like can be used.
- a photodetector 8 and a temperature compensation element (not shown) such as a thermistor are mounted on the wiring board 7.
- the heat absorption region 50 a of the temperature adjustment element 50 is thermally connected to the photodetector 8 and the temperature compensation element (not shown) via the wiring board 7.
- the photodetector 8 is arranged on the line L. More specifically, the photodetector 8 is arranged so that the center line of the light receiving portion coincides with the line L.
- the photodetector 8 is an infrared detector such as a quantum sensor using InGaAs or the like, or a thermal sensor using a thermopile or bolometer. When detecting light in each of the ultraviolet, visible, and near-infrared wavelength regions, for example, a silicon photodiode can be used as the photodetector 8.
- the photodetector 8 may be provided with one light receiving portion, or a plurality of light receiving portions may be provided in an array. Furthermore, a plurality of photodetectors 8 may be mounted on the wiring board 7.
- a plurality of support members 9 are fixed on the wiring board 7 via heat conduction members (not shown).
- a material of each support member 9 for example, silicon, ceramic, quartz, glass, plastic, or the like can be used.
- a Fabry-Perot interference filter 10 is fixed on the plurality of support members 9 via a heat conducting member 15. Thereby, the heat absorption region 50a of the temperature control element 50 is thermally connected to the Fabry-Perot interference filter 10 via the wiring board 7, the heat conductive member (not shown), the plurality of support members 9, and the heat conductive member 15. It is connected.
- the heat conducting member 15 is an adhesive member that bonds the Fabry-Perot interference filter 10 and the support member 9 in addition to being a heat conducting member that transfers heat from the Fabry-Perot interference filter 10 to the support member 9.
- the heat conduction member (not shown) arranged between the wiring board 7 and each support member 9 is a heat conduction member that conducts heat from each support member 9 to the wiring board 7, and each support member. It is also an adhesive member that bonds the member 9 and the wiring board 7 together.
- a resin material for example, a resin material such as silicone, urethane, epoxy, acrylic, hybrid, etc., which is conductive
- Fabry-Perot interference filter 10 is arranged on line L. More specifically, the Fabry-Perot interference filter 10 is arranged so that the center line of the light transmission region 10a coincides with the line L.
- the Fabry-Perot interference filter 10 may be supported by one support member 9 instead of by the plurality of support members 9.
- the Fabry-Perot interference filter 10 may be supported by a support member 9 that is integrally formed with the wiring board 7.
- a plurality of lead pins 11 are fixed to the stem 3. More specifically, each lead pin 11 penetrates the stem 3 while maintaining electrical insulation and airtightness with the stem 3.
- Each lead pin 11 includes an electrode pad provided on the wiring board 7, a terminal of the temperature adjustment element 50, a terminal of the photodetector 8, a terminal of the temperature compensation element, and a terminal of the Fabry-Perot interference filter 10. 12 are electrically connected. Thereby, it is possible to input / output electric signals to / from each of the temperature adjusting element 50, the photodetector 8, the temperature compensating element, and the Fabry-Perot interference filter 10.
- the package 2 has an opening 2a. More specifically, the opening 2 a is provided in the top wall 6 of the cap 4 so that the center line thereof coincides with the line L.
- a light transmitting member 13 is disposed on the inner surface 6a of the top wall 6 so as to close the opening 2a. That is, the light transmission member 13 is provided in the package 2 so as to close the opening 2a.
- the light transmitting member 13 is airtightly joined to the inner surface 6 a of the top wall 6.
- the light transmission member 13 transmits at least light in the measurement wavelength range of the light detection device 1A.
- the light transmitting member 13 is a plate-like member including a light incident surface 13a, a light emitting surface 13b, and a side surface 13c that face each other in a direction parallel to the line L.
- the light transmitting member 13 is made of, for example, glass, quartz, silicon, germanium, plastic, or the like.
- the light transmissive member 13 is made of a material having a lower thermal conductivity than the material constituting the package 2.
- a band pass filter 14 is provided on the light emitting surface 13 b of the light transmitting member 13.
- the bandpass filter 14 is disposed on the light emitting surface 13b of the light transmitting member 13 by, for example, vapor deposition or pasting.
- the bandpass filter 14 selectively transmits light in the measurement wavelength range of the photodetecting device 1A.
- the bandpass filter 14 is a dielectric multilayer film made of a combination of a high refractive material such as TiO 2 or Ta 2 O 5 and a low refractive material such as SiO 2 or MgF 2 .
- the package 2 includes a temperature adjustment element 50, a wiring board 7, a photodetector 8, a temperature compensation element (not shown), a plurality of support members 9, a heat conduction member 15, and a Fabry-Perot interference filter 10. Is housed.
- the photodetector 8 is disposed on the heat absorption region 50 a of the temperature adjustment element 50 via the wiring board 7.
- the Fabry-Perot interference filter 10 is connected via the wiring substrate 7, the plurality of support members 9, and the heat conducting member 15 so that the photodetector 8 is positioned between the temperature adjustment element 50 and the Fabry-Perot interference filter 10. It is disposed on the endothermic region 50 a of the temperature adjustment element 50.
- the photodetector 8 is located on one side (here, the stem 3 side) with respect to the Fabry-Perot interference filter 10 on the line L, and the heat absorption region 50a of the temperature control element 50 is light on the line L. It is located on one side (here, the stem 3 side) with respect to the detector 8.
- the opening 2a of the package 2 and the light transmission member 13 are located on the other side (opposite side of one side) (here, opposite to the stem 3) with respect to the Fabry-Perot interference filter 10 on the line L. .
- the Fabry-Perot interference filter 10 and the light transmission member 13 are separated from each other via a gap.
- the positional relationship and the size relationship of each part when viewed from the direction parallel to the line L are as follows. As shown in FIG. 2, the center line of the light receiving portion of the photodetector 8, the center line of the light transmission region 10a of the Fabry-Perot interference filter 10, and the center line of the opening 2a of the package 2 coincide with the line L. Yes.
- the outer edge of the light transmission region 10a of the Fabry-Perot interference filter 10 and the outer edge of the opening 2a of the package 2 are, for example, circular.
- the outer edge of the photodetector 8 and the outer edge of the Fabry-Perot interference filter 10 are, for example, rectangular.
- the outer edge of the light transmission region 10 a of the Fabry-Perot interference filter 10 is located outside the outer edge of the photodetector 8.
- the outer edge of the opening 2 a of the package 2 is located outside the outer edge of the light transmission region 10 a of the Fabry-Perot interference filter 10 and is located inside the outer edge of the Fabry-Perot interference filter 10.
- the outer edge of the light transmitting member 13 is located outside the outer edge of the Fabry-Perot interference filter 10.
- the outer edge of the temperature adjustment element 50 is located outside the outer edge of the Fabry-Perot interference filter 10.
- one outer edge when viewed from a predetermined direction, one outer edge is located outside of the other outer edges” means that “one outer edge surrounds the other outer edge when viewed from a predetermined direction”. Means that “one outer edge includes another outer edge when viewed from a predetermined direction”. In addition, “when viewed from a predetermined direction, one outer edge is positioned inside the other outer edges” means that “when viewed from a predetermined direction, one outer edge is surrounded by other outer edges. Means that “one outer edge is included in the other outer edge when viewed from a predetermined direction”.
- the Fabry-Perot interference filter 10 is supported by a pair of support members 9.
- the pair of support members 9 face each other across the light transmission region 10 a of the Fabry-Perot interference filter 10 when viewed from a direction parallel to the line L.
- a portion of the bottom surface 10 b of the Fabry-Perot interference filter 10 that is outside the light transmission region 10 a and along a part of the side surface 10 c of the Fabry-Perot interference filter 10. Is placed.
- the support member 9 supports a portion of the bottom surface 10b of the Fabry-Perot interference filter 10 outside the light transmission region 10a.
- a part of the side surface 10c of the Fabry-Perot interference filter 10 is such that a part of the mounting surface 9a of each support member 9 is outside the part of the side surface 10c (when viewed from a direction parallel to the line L). It is located on the mounting surface 9a of each support member 9 so as to be arranged on a part of the outer side. Accordingly, a part of the side surface 10c and a part of the placement surface 9a of each support member 9 (a part of the side surface 10c outside the part, that is, the Fabry-Perot interference filter 10 on the placement surface 9a is placed. A corner portion C is formed with a portion that is not.
- the heat conducting member 15 is disposed on the placement surface 9a of each support member 9 along the corner C.
- the heat conducting member 15 includes a first portion 15a and a second portion 15b.
- the first portion 15 a is a portion arranged along the corner C.
- the second portion 15 b is a portion disposed between the mounting surface 9 a of the support member 9 and the bottom surface 10 b of the Fabry-Perot interference filter 10.
- the heat conducting member 15 is in contact with a part of the bottom surface 10 b and part of the side surface 10 c of the Fabry-Perot interference filter 10 and a part of the mounting surface 9 a of the support member 9.
- the first portion 15a reaches the side surface of the substrate 21 of the Fabry-Perot interference filter 10 described later.
- the Fabry-Perot interference filter 10 is provided from the outside via the opening 2a of the package 2, the light transmission member 13, and the bandpass filter 14.
- the light transmission region 10a When light enters the light transmission region 10a, light having a predetermined wavelength is selectively transmitted (details will be described later).
- the light transmitted through the light transmission region 10 a of the Fabry-Perot interference filter 10 enters the light receiving portion of the photodetector 8 and is detected by the photodetector 8.
- a light transmission region 10 a that transmits light according to the distance between the first mirror and the second mirror is provided on the line L.
- the distance between the first mirror and the second mirror is controlled with extremely high accuracy. That is, the light transmission region 10a can control the distance between the first mirror and the second mirror to a predetermined distance in order to selectively transmit light having a predetermined wavelength in the Fabry-Perot interference filter 10.
- This region is a region through which light having a predetermined wavelength according to the distance between the first mirror and the second mirror can be transmitted.
- the Fabry-Perot interference filter 10 includes a substrate 21. On the light incident side surface 21a of the substrate 21, an antireflection layer 31, a first stacked body 32, an intermediate layer 33, and a second stacked body 34 are stacked in this order. A gap (air gap) S is formed by the frame-shaped intermediate layer 33 between the first stacked body 32 and the second stacked body 34.
- the substrate 21 is made of, for example, silicon, quartz, glass or the like.
- the antireflection layer 31 and the intermediate layer 33 are made of, for example, silicon oxide.
- the thickness of the intermediate layer 33 is preferably an integral multiple of 1/2 of the center transmission wavelength (that is, the center wavelength of the wavelength range that can be transmitted by the Fabry-Perot interference filter 10).
- the portion of the first stacked body 32 corresponding to the light transmission region 10 a functions as the first mirror 35.
- the first mirror 35 is supported on the substrate 21 via the antireflection layer 31.
- the first stacked body 32 is configured by alternately stacking a plurality of polysilicon layers and a plurality of silicon nitride layers one by one.
- the optical thickness of each of the polysilicon layer and the silicon nitride layer constituting the first mirror 35 is preferably an integral multiple of 1/4 of the center transmission wavelength. Note that a silicon oxide layer may be used instead of the silicon nitride layer.
- the portion of the second stacked body 34 corresponding to the light transmission region 10a functions as the second mirror 36 that faces the first mirror 35 with the gap S therebetween.
- the second mirror 36 is supported on the substrate 21 via the antireflection layer 31, the first stacked body 32, and the intermediate layer 33.
- the second stacked body 34 is configured by alternately stacking a plurality of polysilicon layers and a plurality of silicon nitride layers one by one.
- the optical thickness of each of the polysilicon layer and the silicon nitride layer constituting the second mirror 36 is preferably an integral multiple of 1/4 of the center transmission wavelength. Note that a silicon oxide layer may be used instead of the silicon nitride layer.
- a plurality of through holes (not shown) extending from the surface 34 a of the second stacked body 34 to the space S are provided in a portion corresponding to the space S in the second stacked body 34.
- the plurality of through holes are formed to such an extent that the function of the second mirror 36 is not substantially affected.
- the plurality of through-holes are used for forming a void S by removing a part of the intermediate layer 33 by etching.
- the first electrode 22 is formed on the first mirror 35 so as to surround the light transmission region 10a.
- a second electrode 23 is formed on the first mirror 35 so as to include the light transmission region 10a.
- the first electrode 22 and the second electrode 23 are formed by doping the polysilicon layer with impurities to reduce the resistance.
- the size of the second electrode 23 is preferably a size including the entire light transmission region 10a, but may be substantially the same as the size of the light transmission region 10a.
- the third electrode 24 is formed on the second mirror 36.
- the third electrode 24 faces the first electrode 22 and the second electrode 23 with the gap S in the direction parallel to the line L.
- the third electrode 24 is formed by doping the polysilicon layer with impurities to reduce the resistance.
- the second electrode 23 is located on the opposite side of the first electrode 22 from the third electrode 24 in the direction parallel to the line L. That is, the first electrode 22 and the second electrode 23 are not located on the same plane in the first mirror 35. The second electrode 23 is farther from the third electrode 24 than the first electrode 22.
- a pair of terminals 25 are provided so as to face each other with the light transmission region 10a interposed therebetween.
- Each terminal 25 is disposed in a through hole extending from the surface 34 a of the second stacked body 34 to the first stacked body 32.
- Each terminal 25 is electrically connected to the first electrode 22 via a wiring 22a.
- a pair of terminals 26 are provided so as to face each other with the light transmission region 10a interposed therebetween.
- Each terminal 26 is disposed in a through hole extending from the surface 34 a of the second stacked body 34 to the front of the intermediate layer 33.
- Each terminal 26 is electrically connected to the second electrode 23 via the wiring 23a and is also electrically connected to the third electrode 24 via the wiring 24a. Note that the direction in which the pair of terminals 25 face each other and the direction in which the pair of terminals 26 face each other are orthogonal (see FIG. 4).
- the trenches 27 and 28 are provided on the surface 32 a of the first stacked body 32.
- the trench 27 extends in an annular shape so as to surround the wiring 23 a extending from the terminal 26 along the direction parallel to the line L.
- the trench 27 electrically insulates the first electrode 22 and the wiring 23a.
- the trench 28 extends in a ring shape along the inner edge of the first electrode 22.
- the trench 28 electrically insulates the first electrode 22 and a region inside the first electrode 22.
- the region in each of the trenches 27 and 28 may be an insulating material or a gap.
- a trench 29 is provided on the surface 34 a of the second stacked body 34.
- the trench 29 extends in an annular shape so as to surround the terminal 25.
- the trench 29 electrically insulates the terminal 25 from the third electrode 24.
- the region in the trench 28 may be an insulating material or a gap.
- An antireflection layer 41, a third laminated body 42, an intermediate layer 43, and a fourth laminated body 44 are laminated in this order on the surface 21b on the light emitting side of the substrate 21.
- the antireflection layer 41 and the intermediate layer 43 have the same configurations as the antireflection layer 31 and the intermediate layer 33, respectively.
- the third stacked body 42 and the fourth stacked body 44 have symmetrical stacked structures with the first stacked body 32 and the second stacked body 34, respectively, with respect to the substrate 21.
- the antireflection layer 41, the third stacked body 42, the intermediate layer 43, and the fourth stacked body 44 have a function of suppressing the warpage of the substrate 21.
- the opening 40a is provided in the antireflection layer 41, the third laminated body 42, the intermediate layer 43, and the fourth laminated body 44 so as to include the light transmission region 10a.
- the opening 40a has a diameter substantially the same as the size of the light transmission region 10a.
- the opening 40 a is opened on the light emitting side, and the bottom surface of the opening 40 a reaches the antireflection layer 41.
- a light shielding layer 45 is formed on the light emitting surface of the fourth stacked body 44.
- the light shielding layer 45 is made of, for example, aluminum.
- a protective layer 46 is formed on the surface of the light shielding layer 45 and the inner surface of the opening 40a.
- the protective layer 46 is made of, for example, aluminum oxide. Note that the optical influence of the protective layer 46 can be ignored by setting the thickness of the protective layer 46 to 1 to 100 nm (preferably about 30 nm).
- the Fabry-Perot interference filter 10 configured as described above, when a voltage is applied between the first electrode 22 and the third electrode 24 via the terminals 25 and 26, an electrostatic force corresponding to the voltage is generated. Occurs between the first electrode 22 and the third electrode 24. Due to the electrostatic force, the second mirror 36 is attracted to the first mirror 35 fixed to the substrate 21, and the distance between the first mirror 35 and the second mirror 36 is adjusted. Thus, in the Fabry-Perot interference filter 10, the distance between the first mirror 35 and the second mirror 36 is variable.
- the wavelength of light transmitted through the Fabry-Perot interference filter 10 depends on the distance between the first mirror 35 and the second mirror 36 in the light transmission region 10a. Therefore, by adjusting the voltage applied between the first electrode 22 and the third electrode 24, the wavelength of the transmitted light can be appropriately selected.
- the second electrode 23 is at the same potential as the third electrode 24. Therefore, the second electrode 23 functions as a compensation electrode for keeping the first mirror 35 and the second mirror 36 flat in the light transmission region 10a.
- the Fabry-Perot interference filter is changed while changing the voltage applied to the Fabry-Perot interference filter 10 (that is, while changing the distance between the first mirror 35 and the second mirror 36 in the Fabry-Perot interference filter 10).
- the photodetector 8 By detecting the light transmitted through the ten light transmission regions 10a with the photodetector 8, a spectral spectrum can be obtained.
- the endothermic region 50a of the temperature adjusting element 50 is located on one side of the line L with respect to the photodetector 8.
- the Fabry-Perot interference filter 10 and the photodetector are compared. 8 is cooled uniformly.
- the lower surfaces of the interference filters 10 are in surface contact with each other via an adhesive or the like. Thereby, compared with the case where each member is in point contact, for example, cooling is performed efficiently.
- the Fabry-Perot interference filter 10 and the photodetector 8 are arranged between the light transmission member 13 and the heat absorption region 50 a of the temperature adjustment element 50.
- the light transmissive member 13 is excessively cooled, and condensation occurs in the light transmissive member 13 due to the difference between the temperature of the light transmissive member 13 and the outside air temperature (use environment temperature of the light detection device 1A) being increased. Is suppressed. Therefore, according to the photodetector 1A, the Fabry-Perot interference filter 10 and the photodetector housed in the package 2 while suppressing the occurrence of dew condensation in the light transmitting member 13 for allowing light to enter the package 2. 8 can be maintained at a uniform temperature.
- the Fabry-Perot interference filter 10 is uniformly cooled by the temperature adjusting element 50, so that the temperature of the Fabry-Perot interference filter 10 is kept constant regardless of the operating environment temperature of the light detection device 1A.
- the thin film-like second mirror 36 is operated with extremely high precision so that the first mirror 35 and the first mirror 35 It is necessary to control the distance to the two mirrors 36 with extremely high accuracy.
- the Fabry-Perot interference filter 10 has a non-uniform temperature for each part, it becomes difficult to control the distance between the first mirror 35 and the second mirror 36 with extremely high accuracy. Therefore, it is very important to maintain the Fabry-Perot interference filter 10 at a uniform temperature. Furthermore, since the photodetector 8 is uniformly cooled by the temperature adjusting element 50, the dark current generated in the photodetector 8 can be reduced.
- the configuration in which the temperature adjustment element 50 is arranged in the package 2 tends to increase the volume in the package 2 as compared with the configuration in which the temperature adjustment element 50 is arranged outside the package 2. Therefore, in the configuration in which the temperature adjustment element 50 is disposed in the package 2, it is difficult to maintain the temperature in the package 2 uniformly as the volume in the package 2 increases.
- the configuration of the light detection device 1A it is possible to effectively maintain the Fabry-Perot interference filter 10 and the light detector 8 that greatly affect the accuracy of the measurement result at a uniform temperature.
- the risk resulting from the occurrence of condensation in the light transmitting member 13 will be described.
- the amount of light incident on the package 2 may decrease, and the sensitivity of the photodetector 8 may decrease.
- multiple reflections, scattering, lens effects, etc. occur in the light incident into the package 2, which causes stray light, and the resolution of the transmitted light incident on the photodetector 8, the S / N ratio, etc. May decrease.
- the stability of the detection characteristics of the photodetector 8 may be reduced.
- the peak wavelength of transmitted light with respect to the control voltage applied to the Fabry-Perot interference filter 10 may change. Further, the first mirror 35 and the second mirror 36 may stick to each other due to moisture, leading to failure.
- the configuration of the photodetecting device 1A that can suppress the occurrence of condensation in the light transmitting member 13 is effective. Furthermore, since the configuration of the photodetecting device 1A is a configuration that can suppress the occurrence of dew condensation in the light transmitting member 13, it is possible to reduce the size of the photodetecting device 1A by reducing the distance between the members.
- the outer edge of the opening 2a of the package 2 when viewed from a direction parallel to the line L, the outer edge of the opening 2a of the package 2 is located inside the outer edge of the Fabry-Perot interference filter 10, and the heat generation region of the temperature adjusting element 50 50 b is thermally connected to the package 2.
- the package 2 is placed between the heat generating region 50b of the temperature control element 50 and the light transmitting member 13 as compared with the case where the outer edge of the opening 2a is located outside the outer edge of the Fabry-Perot interference filter 10.
- Heat is easily transmitted through (specifically, heat is easily transmitted from the heat generating region 50b of the temperature control element 50 to the light transmitting member 13 through the package 2). Therefore, it is possible to more reliably suppress the occurrence of condensation in the light transmission member 13.
- the outer edge of the light transmission member 13 when viewed from a direction parallel to the line L, the outer edge of the light transmission member 13 is located outside the outer edge of the Fabry-Perot interference filter 10.
- the contact area between the light transmissive member 13 and the package 2 is increased as compared with the case where the outer edge of the light transmissive member 13 is located inside the outer edge of the Fabry-Perot interference filter 10. Heat is likely to be transferred between the package 2 and the package 2 (specifically, heat is easily transferred from the heat generating region 50b of the temperature adjusting element 50 to the light transmitting member 13 via the package 2).
- the contact area between the light transmitting member 13 and the package 2 becomes larger. Therefore, it is possible to more reliably suppress the occurrence of condensation in the light transmission member 13. Further, according to this configuration, even if the wire 12 connected to the Fabry-Perot interference filter 10 is bent, the insulating light transmitting member 13 prevents the wire 12 from contacting the package 2. Thereby, it is possible to prevent an electrical signal for controlling the Fabry-Perot interference filter 10 from flowing into the package 2 and to control the Fabry-Perot interference filter 10 with high accuracy.
- the temperature adjustment element 50 is disposed in the package 2
- the light detector 8 is disposed on the temperature adjustment element 50
- the light detector 8 includes the temperature adjustment element 50 and the Fabry-Perot interference filter.
- the Fabry-Perot interference filter 10 is disposed on the temperature adjustment element 50 so as to be positioned between the temperature adjustment element 50 and the temperature adjustment element 50. Thereby, the Fabry-Perot interference filter 10 and the photodetector 8 can be maintained at a uniform temperature efficiently with a small and simple configuration.
- the thickness of the temperature adjusting element 50 is 0.7 to 2 mm
- the thickness of the wiring board 7 is 0.3 mm
- the thickness of the support member 9 is 0.6 mm.
- the thickness of the Fabry-Perot interference filter 10 is 0.6 mm.
- the height of the portion of the lead pin 11 that protrudes from the upper surface of the stem 3 is 0.2 to 1 mm, for example, 0.5 mm. That is, the temperature adjustment element 50 is thicker than each of the wiring substrate 7, the support member 9, and the Fabry-Perot interference filter 10.
- the temperature adjusting element 50 Since the temperature adjusting element 50 is thick, the photodetector 8 and the Fabry-Perot interference filter 10 are not easily affected by the heat generated from the heat generating region 50b. On the other hand, since the wiring board 7, the support member 9, and the Fabry-Perot interference filter 10 are thin, cooling by the heat absorption region 50a is efficiently performed.
- the upper surface of the lead pin 11 is at a position lower than the upper surfaces of the temperature adjustment element 50, the wiring board 7, the support member 9, and the Fabry-Perot interference filter 10. This facilitates the connection of the wire 12 from the photodetector 8 and the Fabry-Perot interference filter 10 to the lead pin 11 (particularly the photodetector 8 arranged so as to be covered by the Fabry-Perot interference filter 10 and the temperature compensation). It is possible to suppress the wire 12 drawn from the element from interfering with the Fabry-Perot interference filter 10).
- the height of the Fabry-Perot interference filter 10 from the stem 3 is preferably not too high. Therefore, in the configuration in which the temperature adjustment element 50 is disposed under the laminate of the wiring board 7, the support member 9, and the Fabry-Perot interference filter 10, the height of the Fabry-Perot interference filter 10 from the stem 3 is increased. From the viewpoint of connecting the wire to the lead pin 11, it is not preferable.
- the thickness of the wiring board 7, the support member 9, and the Fabry-Perot interference filter 10 is kept thin, so that the height of the Fabry-Perot interference filter 10 from the stem 3 is suppressed and the disadvantage is minimized. It is limited.
- the Fabry-Perot interference filter 10 and the light transmission member 13 are separated from each other through a gap. Thereby, it is possible to suppress the Fabry-Perot interference filter 10 from being affected by the use environment temperature of the light detection device 1 ⁇ / b> A and the heat from the package 2 and the light transmission member 13.
- the volume of the space above the Fabry-Perot interference filter 10 is equal to the Fabry-Perot interference filter 10.
- the support member 9 that supports a portion of the bottom surface 10b of the Fabry-Perot interference filter 10 outside the light transmission region 10a, the side surface 10c of the Fabry-Perot interference filter 10, and the heat conduction that contacts the support member 9.
- a member 15 is provided. Thereby, for example, compared with the case where the heat conducting member 15 in contact with the side surface 10c of the Fabry-Perot interference filter 10 and the support member 9 is not provided, the Fabry-Perot interference filter 10 and the endothermic region 50a of the temperature adjustment element 50 are reduced.
- Heat is easily transferred through the support member 9 (specifically, heat is easily transferred from the Fabry-Perot interference filter 10 to the heat absorbing region 50a of the temperature adjusting element 50 through the support member 9). Therefore, the Fabry-Perot interference filter 10 and the photodetector 8 can be efficiently maintained at a uniform temperature.
- the heat conducting member 15 is an adhesive member that adheres the Fabry-Perot interference filter 10 and the support member 9. Thereby, the holding state of the Fabry-Perot interference filter 10 on the support member 9 can be stabilized.
- the heat conducting member 15 is disposed at the corner C and is in contact with a part of the side surface 10c of the Fabry-Perot interference filter 10 and a part of the mounting surface 9a of the support member 9.
- the Fabry-Perot interference filter 10 and the photodetector 8 can be more efficiently maintained at a uniform temperature, and the holding state of the Fabry-Perot interference filter 10 on the support member 9 can be more reliably stabilized. it can.
- disposing the heat conducting member 15 at the corner C is effective because the volume of the heat conducting member 15 can be increased and the posture of the heat conducting member 15 can be stabilized.
- the light detection device 1B is different from the light detection device 1A described above in that it is configured as an SMD (Surface Mount Device).
- the light detection device 1 ⁇ / b> B includes a main body 200 that constitutes a package 2 that houses the light detector 8 and the Fabry-Perot interference filter 10.
- As a material of the main body 200 for example, ceramic, resin, or the like can be used.
- a plurality of wires (not shown) are laid on the main body 200.
- a plurality of mounting electrode pads 207 are provided on the bottom surface 200 a of the main body 200. Corresponding wirings (not shown) and the mounting electrode pads 207 are electrically connected to each other.
- the main body 200 is formed with a first widened portion 201, a second widened portion 202, a third widened portion 203, a fourth widened portion 204, and a concave portion 205.
- the concave portion 205, the fourth widened portion 204, the third widened portion 203, the second widened portion 202, and the first widened portion 201 are arranged in this order from the bottom surface 200a side with the predetermined line L being a straight line as the center line. Thus, one space is formed on the opposite side of the bottom surface 200a.
- the photodetector 8 is fixed to the bottom surface of the recess 205.
- the bottom surface of the recess 205 and the bottom surface of the photodetector 8 are bonded to each other through, for example, an adhesive member (not shown) having good thermal conductivity.
- the photodetector 8 is disposed on the line L. More specifically, the photodetector 8 is arranged so that the center line of the light receiving portion coincides with the line L.
- the Fabry-Perot interference filter 10 is fixed to the bottom surface of the third widened portion 203 via the heat conducting member 15. That is, the bottom surface of the third widened portion 203 and the bottom surface 10 b of the Fabry-Perot interference filter 10 are bonded via the heat conducting member 15.
- the Fabry-Perot interference filter 10 is disposed on the line L. More specifically, the Fabry-Perot interference filter 10 is arranged so that the center line of the light transmission region 10a coincides with the line L.
- a plate-like light transmission member 13 is fixed to the bottom surface of the first widened portion 201 via, for example, an adhesive member having good heat conduction.
- a band pass filter 14 is provided on the light emitting surface 13 b of the light transmitting member 13. Note that a temperature compensating element (not shown) is embedded in the main body 200.
- Each of the terminals of the photodetector 8, the temperature compensation element, and the Fabry-Perot interference filter 10 is supported via the wire 12 and wiring (not shown) or only via the wiring (not shown).
- the mounting electrode pad 207 is electrically connected. Thereby, it is possible to input / output electric signals to / from each of the photodetector 8, the temperature compensating element, and the Fabry-Perot interference filter 10.
- a temperature adjustment element 50 is embedded in a predetermined portion of the main body 200 that is the wall of the package 2. More specifically, in the main body 200, a portion between the bottom surface of the recess 205 and the bottom surface 200a of the main body portion 200, a portion between the bottom surface of the fourth widened portion 204 and the bottom surface 200a of the main body portion 200, and the first 3 The temperature control element 50 is embedded over the entire portion between the bottom surface of the widened portion 203 and the bottom surface 200a of the main body 200.
- the temperature adjustment element 50 is, for example, a Peltier element.
- a plurality of N-type semiconductor layers 51 and a plurality of P-type semiconductor layers 52 are alternately arranged.
- the ends on the opposite side of the bottom surface 200a of the adjacent N-type semiconductor layers 51 and P-type semiconductor layers 52 so that all the N-type semiconductor layers 51 and P-type semiconductor layers 52 that are alternately arranged are connected in series.
- the first metal member 53 When attention is paid to the N-type semiconductor layer 51 and the P-type semiconductor layer 52 connected to each other by the first metal member 53, if a current flows from the N-type semiconductor layer 51 to the P-type semiconductor layer 52, the first metal An endothermic phenomenon occurs in the member 53. Accordingly, the bottom surface of the third widened portion 203, the bottom surface of the fourth widened portion 204, and the bottom surface of the concave portion 205 function as the heat absorption region 50a.
- the second metal member 54 When attention is paid to the P-type semiconductor layer 52 and the N-type semiconductor layer 51 connected to each other by the second metal member 54, if a current flows from the P-type semiconductor layer 52 to the N-type semiconductor layer 51, the second metal A heat generation phenomenon occurs in the member 54. Thereby, the bottom surface 200a of the main body 200 functions as a heat generating region 50b.
- the terminal of the temperature control element 50 is electrically connected to the corresponding mounting electrode pad 207 via wiring (not shown). Thereby, input / output of an electric signal to the temperature control element 50 is possible.
- the temperature control element 50 all the N-type semiconductor layers 51 and the P-type semiconductor layers 52 that are alternately arranged are connected in series. Therefore, when a current flows in a predetermined direction, a current flows in the direction from the N-type semiconductor layer 51 to the P-type semiconductor layer 52 in the first metal member 53, and the bottom surface of the third widened portion 203 and the fourth widened portion 204. And the bottom surface of the recess 205 function as the heat absorption region 50a.
- the second metal member 54 current flows from the P-type semiconductor layer 52 to the N-type semiconductor layer 51, and the bottom surface 200a of the main body 200 is It functions as a heat generating area 50b.
- the package 2 contains the light detector 8, the heat conducting member 15, and the Fabry-Perot interference filter 10.
- a temperature compensation element (not shown) and a temperature adjustment element 50 are embedded in the wall portion of the package 2.
- the photodetector 8 is disposed on the bottom surface of the recess 205 which is the heat absorption region 50 a of the temperature adjustment element 50.
- the bottom surface of the recess 205 which is the heat absorption region 50 a is thermally connected to the photodetector 8.
- the Fabry-Perot interference filter 10 is a first heat absorption region 50a of the temperature adjustment element 50 via the heat conducting member 15 so that the photodetector 8 is positioned between the temperature adjustment element 50 and the Fabry-Perot interference filter 10.
- 3 is disposed on the bottom surface of the widened portion 203.
- the bottom surface of the third widened portion 203 that is the heat absorption region 50 a is thermally connected to the Fabry-Perot interference filter 10.
- the heat sink 60 is bonded to the bottom surface 200a of the main body 200, which is the heat generating region 50b of the temperature adjusting element 50, via an adhesive member having good heat conduction, for example. Thereby, the heat generated from the heat generating region 50 b can be efficiently radiated through the heat sink 60.
- the heat sink 60 is thicker than the electrode pad 207, by providing a through-hole so that the heat sink 60 does not interfere with the external wiring board on which the light detection device 1B is mounted, the light detection device 1B is provided on the external wiring board. Can be implemented.
- the through hole is not provided in the external wiring board, the electrode pad 207 is disposed on the side surface of the main body 200, and the light detection device 1B is mounted so that the line L is substantially horizontal to the surface of the external wiring board. Also good.
- a metal plate thinner than the electrode pad 207 may be bonded to the bottom surface 200 a of the main body 200 and used as the heat sink 60. In this case, if the metal plate is made of the same material as the electrode pad 207 (for example, gold, silver, copper, aluminum, tungsten, etc.), the formation process on the bottom surface 200a can be performed simultaneously.
- the light detector 8 is located on one side of the line L with respect to the Fabry-Perot interference filter 10 (here, on the bottom surface 200a side of the main body 200), and is a recess that is a heat absorption region 50a of the temperature adjustment element 50.
- the bottom surface of 205 is positioned on one side with respect to the photodetector 8 on the line L (here, on the bottom surface 200a side of the main body 200).
- the opening (first widened portion 201) of the package 2 and the light transmitting member 13 are on the other side (opposite side of one side) of the Fabry-Perot interference filter 10 on the line L (here, the bottom surface of the main body 200). (Opposite side of 200a).
- the Fabry-Perot interference filter 10 and the light transmission member 13 are separated from each other via a gap.
- the heat conducting member 15 is disposed on the bottom surface of the third widened portion 203 so as to be along the gap between the side surface of the Fabry-Perot interference filter 10 and the inner surface of the third widened portion 203.
- the heat conducting member 15 includes a first portion disposed along a gap between the side surface of the Fabry-Perot interference filter 10 and the inner surface of the third widened portion 203, the bottom surface of the third widened portion 203, and the bottom surface of the Fabry-Perot interference filter 10. And a second portion disposed between the two.
- the heat conducting member 15 is in contact with part of the bottom surface and part of the side surface of the Fabry-Perot interference filter 10 and the bottom surface of the third widened portion 203.
- the first portion reaches the side surface of the substrate 21 of the Fabry-Perot interference filter 10.
- the light transmission of the Fabry-Perot interference filter 10 from the outside through the opening (first widened portion 201) of the package 2, the light transmission member 13, and the bandpass filter 14.
- light having a predetermined wavelength is selectively transmitted according to the distance between the first mirror 35 and the second mirror 36 in the light transmission region 10a.
- the light transmitted through the light transmission region 10 a of the Fabry-Perot interference filter 10 enters the light receiving portion of the photodetector 8 and is detected by the photodetector 8.
- the Fabry-Perot interference filter is changed while changing the voltage applied to the Fabry-Perot interference filter 10 (that is, while changing the distance between the first mirror 35 and the second mirror 36 in the Fabry-Perot interference filter 10).
- the photodetector 8 By detecting the light transmitted through the ten light transmission regions 10a with the photodetector 8, a spectral spectrum can be obtained.
- the bottom surface of the recess 205 in the endothermic region 50a of the temperature adjustment element 50 is located on one side of the line L with respect to the light detector 8. Further, the bottom surface of the third widened portion 203 in the endothermic region 50 a of the temperature control element 50 is located on one side with respect to the Fabry-Perot interference filter 10. As a result, the Fabry-Perot interference filter 10 and the photodetector 8 are uniformly cooled.
- the bottom surface of the recess 205 and the bottom surface of the photodetector 8, and the bottom surface of the third widened portion 203 and the bottom surface of the Fabry-Perot interference filter 10 are in surface contact with each other via an adhesive or the like. Thereby, compared with the case where each member is in point contact, for example, cooling is performed efficiently.
- the Fabry-Perot interference filter 10 and the photodetector 8 are disposed between the light transmission member 13 and the bottom surface of the recess 205. Further, the Fabry-Perot interference filter 10 is disposed between the light transmission member 13 and the bottom surface of the third widened portion 203.
- the light transmission member 13 is excessively cooled, and the difference between the temperature of the light transmission member 13 and the outside air temperature (use environment temperature of the light detection device 1B) is increased. Is suppressed. Therefore, according to the photodetecting device 1B, it is possible to suppress the occurrence of dew condensation in the light transmitting member 13 for allowing light to enter the package 2, and the Fabry-Perot interference filter 10 housed in the package 2 and The photodetector 8 can be maintained at a uniform temperature.
- the heat conducting member 15 is an adhesive member that adheres the Fabry-Perot interference filter 10 and the main body 200. Thereby, the holding
- the heat conducting member 15 is disposed on the bottom surface of the third widened portion 203 so as to follow the gap between the side surface of the Fabry-Perot interference filter 10 and the inner surface of the third widened portion 203, and the Fabry-Perot interference filter 10 is in contact with each of a part of the side surface and the bottom surface of the third widened portion 203.
- the Fabry-Perot interference filter 10 and the photodetector 8 can be more efficiently maintained at a uniform temperature, and the holding state of the Fabry-Perot interference filter 10 in the third widened portion 203 of the main body 200 can be more reliably ensured. Can be stabilized.
- the temperature adjustment element 50 is embedded in the wall portion of the package 2. Thereby, the volume of the space in the package 2 can be reduced, and as a result, the Fabry-Perot interference filter 10 and the photodetector 8 can be maintained at a uniform temperature more efficiently.
- the photodetector of the present disclosure is not limited to the first embodiment and the second embodiment described above.
- the materials and shapes of each component are not limited to the materials and shapes described above, and various materials and shapes can be employed.
- the main body 200 may be formed. According to this configuration, the temperature adjustment element 50, the photodetector 8, the heat conducting member 15, and the Fabry-Perot interference filter 10 can be thermally separated. As a result, the Fabry-Perot interference filter 10 and the light can be more efficiently separated.
- the detector 8 can be maintained at a uniform temperature.
- the Fabry-Perot interference filter 10 terminal and the photodetector 8 terminal are wired ( (Not shown) may be connected by bumps 16. According to this configuration, since the wire 12 is not necessary, the photodetector 1B can be reduced in size.
- the bandpass filter 14 may be provided on the light incident surface 13a of the light transmission member 13 or light. It may be provided on both the light incident surface 13 a and the light emitting surface 13 b of the transmissive member 13.
- the Fabry-Perot interference filter 10 has a laminated structure (antireflection) provided on the surface 21b on the light emitting side of the substrate 21.
- the layer 41, the third stacked body 42, the intermediate layer 43, the fourth stacked body 44, the light shielding layer 45, and the protective layer 46) may not be provided. Further, only a part of layers (for example, only the antireflection layer 41 and the protective layer 46) may be provided as necessary.
- the outer edge of the light transmission region 10a of the Fabry-Perot interference filter 10 when viewed from a direction parallel to the line L, the outer edge of the light transmission region 10a of the Fabry-Perot interference filter 10 is You may be located outside the outer edge of the opening 2a. In this case, the ratio of the light entering the light transmission region 10a out of the light incident from the opening 2a is increased, and the utilization efficiency of the light incident from the opening 2a is increased. Further, even if the position of the opening 2a with respect to the light transmission region 10a is slightly shifted, the light incident from the opening 2a enters the light transmission region 10a, so that the requirement for positional accuracy during assembly of the light detection devices 1A and 1B is eased. Is done.
- the heat conducting member 15 does not include the second portion 15b as long as it includes the first portion 15a. May be.
- the heat conducting member 15 is not limited to the above-described material, and may be a metal such as solder.
- the endothermic region 50a of the temperature adjustment element 50 is in direct contact with the Fabry-Perot interference filter 10 so that the Fabry-Perot interference filter is in contact. 10 may be thermally connected to the Fabry-Perot interference filter 10 via some member. Similarly, the endothermic region 50a of the temperature control element 50 may be thermally connected to the photodetector 8 by directly contacting the photodetector 8, or may be thermally connected to the photodetector 8 through some member. May be connected to each other.
- the heat generating region 50b of the temperature adjusting element 50 may be thermally connected to the package 2 by directly contacting the package 2, or via some member.
- the package 2 may be thermally connected.
- the light detector 8 may be disposed directly on the temperature adjustment element 50, or through some member. May be disposed on the temperature control element 50.
- the temperature adjustment element 50 is used for the purpose of cooling the inside of the package 2. This is effective when the use environment temperature of the light detection devices 1A and 1B is higher than the set temperature (appropriate operation temperature) of the Fabry-Perot interference filter 10 and the light detector 8. On the other hand, when the use environment temperature of the light detection devices 1A and 1B is lower than the set temperature of the Fabry-Perot interference filter 10 and the light detector 8, the temperature adjustment element 50 is used for the purpose of heating the inside of the package 2. Also good.
- the region functioning as the heat absorption region 50a (the first region thermally connected to the Fabry-Perot interference filter 10 and the photodetector 8) functions as the heat generation region 50b, and the heat generation region 50b
- the region functioning as (in the photodetecting device 1A of the first embodiment, the second region thermally connected to the package 2) may function as the heat absorption region 50a.
- the light transmission member 13 is excessively heated and the difference between the temperature of the light transmission member 13 and the outside air temperature (the use environment temperature of the light detection devices 1A and 1B) is increased. It is possible to suppress the occurrence of cracks and the like due to a stress difference between the light incident surface 13a that contracts due to a low outside air temperature and the light emitting surface 13b that is heated and expands. If a Peltier element is used as the temperature adjusting element 50, the heat absorption region and the heat generation region can be easily switched by switching the direction in which the current flows in the Peltier element.
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Abstract
Description
[第1実施形態]
[光検出装置の構成]
[ファブリペロー干渉フィルタの構成]
[作用及び効果]
[第2実施形態]
[光検出装置の構成]
[作用及び効果]
[変形例]
Claims (8)
- 互いの距離が可変とされた第1ミラー及び第2ミラーを有し、前記第1ミラーと前記第2ミラーとの距離に応じた光を透過させる光透過領域が所定のライン上に設けられたファブリペロー干渉フィルタと、
前記ライン上において前記ファブリペロー干渉フィルタに対して一方の側に配置され、前記光透過領域を透過した光を検出する光検出器と、
前記ライン上において前記ファブリペロー干渉フィルタに対して他方の側に位置する開口を有し、前記ファブリペロー干渉フィルタ及び前記光検出器を収容するパッケージと、
前記開口を塞ぐように前記パッケージに設けられた光透過部材と、
前記ファブリペロー干渉フィルタ及び前記光検出器と熱的に接続されて吸熱領域及び発熱領域の一方として機能する第1領域を有する温度調節素子と、を備え、
前記第1領域は、少なくとも前記ライン上において前記光検出器に対して前記一方の側に位置している、光検出装置。 - 前記ラインに平行な方向から見た場合に、前記開口の外縁は、前記ファブリペロー干渉フィルタの外縁よりも内側に位置しており、
前記温度調節素子は、前記パッケージと熱的に接続されて前記吸熱領域及び前記発熱領域の他方として機能する第2領域を有する、請求項1記載の光検出装置。 - 前記ラインに平行な方向から見た場合に、前記光透過部材の外縁は、前記ファブリペロー干渉フィルタの外縁よりも外側に位置している、請求項2記載の光検出装置。
- 前記温度調節素子は、前記パッケージ内に配置されており、
前記光検出器は、前記温度調節素子上に配置されており、
前記ファブリペロー干渉フィルタは、前記光検出器が前記温度調節素子と前記ファブリペロー干渉フィルタとの間に位置するように前記温度調節素子上に配置されている、請求項1~3のいずれか一項記載の光検出装置。 - 前記ファブリペロー干渉フィルタの底面のうち前記光透過領域の外側の部分を支持する支持部材と、
前記ファブリペロー干渉フィルタの側面、及び前記支持部材と接触する熱伝導部材と、を更に備える、請求項1~4のいずれか一項記載の光検出装置。 - 前記熱伝導部材は、前記ファブリペロー干渉フィルタと前記支持部材とを接着する接着部材である、請求項5記載の光検出装置。
- 前記支持部材は、前記ファブリペロー干渉フィルタの前記底面のうち前記光透過領域の外側の前記部分が載置された載置面を有し、
前記ファブリペロー干渉フィルタの前記側面の少なくとも一部は、前記載置面の一部が前記側面の外側に配置されるように、前記載置面上に位置しており、
前記熱伝導部材は、前記側面、及び前記載置面の前記一部によって形成された隅部に配置され、前記側面、及び前記載置面の前記一部のそれぞれと接触している、請求項5又は6記載の光検出装置。 - 前記温度調節素子は、前記パッケージの壁部に埋設されている、請求項1~7のいずれか一項記載の光検出装置。
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CN202210293509.4A CN114659632A (zh) | 2016-03-09 | 2017-03-03 | 光检测装置 |
EP17763113.2A EP3428589B1 (en) | 2016-03-09 | 2017-03-03 | Light detection device |
CN201780015575.2A CN108780007B (zh) | 2016-03-09 | 2017-03-03 | 光检测装置 |
EP24189138.1A EP4425574A2 (en) | 2016-03-09 | 2017-03-03 | Light detection device |
KR1020187026622A KR102487457B1 (ko) | 2016-03-09 | 2017-03-03 | 광 검출 장치 |
FIEP17763113.2T FI3428589T3 (fi) | 2016-03-09 | 2017-03-03 | Valonilmaisulaite |
US16/082,616 US11448553B2 (en) | 2016-03-09 | 2017-03-03 | Light detection device |
EP24159648.5A EP4350430A3 (en) | 2016-03-09 | 2017-03-03 | Light detection device |
US17/847,881 US20220333988A1 (en) | 2016-03-09 | 2022-06-23 | Light detection device |
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JP7039160B2 (ja) * | 2016-03-09 | 2022-03-22 | 浜松ホトニクス株式会社 | 光検出装置 |
JP6871043B2 (ja) * | 2017-03-31 | 2021-05-12 | 浜松ホトニクス株式会社 | 光検出装置 |
JP6899314B2 (ja) * | 2017-11-17 | 2021-07-07 | 浜松ホトニクス株式会社 | 吸着方法 |
US10295482B1 (en) * | 2017-12-22 | 2019-05-21 | Visera Technologies Company Limited | Spectrum-inspection device and method for forming the same |
JP7202160B2 (ja) * | 2018-12-05 | 2023-01-11 | 浜松ホトニクス株式会社 | 光学フィルタ装置、及び光学フィルタ装置の制御方法 |
DE102019213285A1 (de) * | 2019-09-03 | 2021-03-04 | Robert Bosch Gmbh | Interferometereinrichtung und Verfahren zum Herstellen einer Interferometereinrichtung |
DE102019213286A1 (de) * | 2019-09-03 | 2021-03-04 | Robert Bosch Gmbh | Spektrometer-Package mit MEMS Fabry-Pérot-Interferometer |
DE102019213284A1 (de) * | 2019-09-03 | 2021-03-04 | Robert Bosch Gmbh | Interferometereinrichtung und Verfahren zum Herstellen einer Interferometereinrichtung |
DE102019213270A1 (de) * | 2019-09-03 | 2021-03-04 | Robert Bosch Gmbh | Interferometereinrichtung und Verfahren zum Herstellen einer Interferometereinrichtung |
WO2021192244A1 (ja) * | 2020-03-27 | 2021-09-30 | ギガフォトン株式会社 | センサ劣化判定方法 |
JP2022170447A (ja) * | 2021-04-28 | 2022-11-10 | 株式会社ジャパンディスプレイ | 検出装置 |
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EP4425574A2 (en) | 2024-09-04 |
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EP3428589B1 (en) | 2024-04-10 |
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US20190072431A1 (en) | 2019-03-07 |
US11448553B2 (en) | 2022-09-20 |
JP7039160B2 (ja) | 2022-03-22 |
TWI747887B (zh) | 2021-12-01 |
KR20180122353A (ko) | 2018-11-12 |
FI3428589T3 (fi) | 2024-05-07 |
EP3428589A4 (en) | 2019-11-13 |
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EP3428589A1 (en) | 2019-01-16 |
TW201735330A (zh) | 2017-10-01 |
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US20220333988A1 (en) | 2022-10-20 |
KR102487457B1 (ko) | 2023-01-12 |
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