WO2017126184A1 - プラズマ処理方法およびプラズマ処理装置 - Google Patents
プラズマ処理方法およびプラズマ処理装置 Download PDFInfo
- Publication number
- WO2017126184A1 WO2017126184A1 PCT/JP2016/082508 JP2016082508W WO2017126184A1 WO 2017126184 A1 WO2017126184 A1 WO 2017126184A1 JP 2016082508 W JP2016082508 W JP 2016082508W WO 2017126184 A1 WO2017126184 A1 WO 2017126184A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- plasma
- power
- frequency power
- plasma processing
- processing method
- Prior art date
Links
- 238000012545 processing Methods 0.000 title claims abstract description 55
- 238000003672 processing method Methods 0.000 title claims description 30
- 150000002500 ions Chemical class 0.000 claims abstract description 30
- 238000000034 method Methods 0.000 claims description 17
- 230000008569 process Effects 0.000 claims description 10
- 238000007599 discharging Methods 0.000 claims 2
- -1 ion ions Chemical class 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract description 16
- 238000005530 etching Methods 0.000 description 56
- 238000009826 distribution Methods 0.000 description 32
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 16
- 229910004298 SiO 2 Inorganic materials 0.000 description 12
- 238000010586 diagram Methods 0.000 description 9
- 238000001514 detection method Methods 0.000 description 7
- 230000002093 peripheral effect Effects 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 6
- 230000007423 decrease Effects 0.000 description 4
- 230000005684 electric field Effects 0.000 description 4
- 238000004519 manufacturing process Methods 0.000 description 3
- 230000001360 synchronised effect Effects 0.000 description 3
- 238000009827 uniform distribution Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000008878 coupling Effects 0.000 description 2
- 238000010168 coupling process Methods 0.000 description 2
- 238000005859 coupling reaction Methods 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 230000000630 rising effect Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 1
- 229910052782 aluminium Inorganic materials 0.000 description 1
- 201000009310 astigmatism Diseases 0.000 description 1
- 238000005513 bias potential Methods 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 238000010494 dissociation reaction Methods 0.000 description 1
- 230000005593 dissociations Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000011156 evaluation Methods 0.000 description 1
- 230000005669 field effect Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 238000010030 laminating Methods 0.000 description 1
- 230000007246 mechanism Effects 0.000 description 1
- 238000001020 plasma etching Methods 0.000 description 1
- 238000009832 plasma treatment Methods 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000004044 response Effects 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 230000002194 synthesizing effect Effects 0.000 description 1
Images
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/306—Chemical or electrical treatment, e.g. electrolytic etching
- H01L21/3065—Plasma etching; Reactive-ion etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32146—Amplitude modulation, includes pulsing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32155—Frequency modulation
- H01J37/32165—Plural frequencies
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32174—Circuits specially adapted for controlling the RF discharge
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32697—Electrostatic control
- H01J37/32706—Polarising the substrate
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3105—After-treatment
- H01L21/311—Etching the insulating layers by chemical or physical means
- H01L21/31105—Etching inorganic layers
- H01L21/31111—Etching inorganic layers by chemical means
- H01L21/31116—Etching inorganic layers by chemical means by dry-etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32135—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only
- H01L21/32136—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas
- H01L21/32137—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by vapour etching only using plasmas of silicon-containing layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67063—Apparatus for fluid treatment for etching
- H01L21/67069—Apparatus for fluid treatment for etching for drying etching
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05H—PLASMA TECHNIQUE; PRODUCTION OF ACCELERATED ELECTRICALLY-CHARGED PARTICLES OR OF NEUTRONS; PRODUCTION OR ACCELERATION OF NEUTRAL MOLECULAR OR ATOMIC BEAMS
- H05H1/00—Generating plasma; Handling plasma
- H05H1/24—Generating plasma
- H05H1/46—Generating plasma using applied electromagnetic fields, e.g. high frequency or microwave energy
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
- H01J2237/32—Processing objects by plasma generation
- H01J2237/33—Processing objects by plasma generation characterised by the type of processing
- H01J2237/334—Etching
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3244—Gas supply means
- H01J37/32449—Gas control, e.g. control of the gas flow
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32715—Workpiece holder
Definitions
- the present invention relates to a plasma processing method and a plasma processing apparatus used for manufacturing a semiconductor device or the like.
- Plasma etching technology is used to manufacture semiconductor devices, such as MOS FET (Metal-Oxide-Semiconductor Field-Effect Transistor) devices used for electronic devices.
- MOS FET Metal-Oxide-Semiconductor Field-Effect Transistor
- the uniformity of the processing within the substrate surface is required to improve the yield of the substrate.
- a plasma processing technique used for manufacturing a semiconductor device for example, as described in Patent Document 1, as an apparatus for etching a film structure having a step with high accuracy, a vacuum container and a processing of a vacuum container are performed.
- a plasma processing apparatus comprising: a supply means; an electric field supply means for supplying an electric field for generating plasma in the processing chamber; and an adjustment device for adjusting the energy distribution of ions in the plasma incident on the wafer by high-frequency power. It has been known.
- the adjusting device is a mechanism for independently changing the energy and distribution of ions incident on the wafer by controlling the output ratio (mixing ratio) of bias power at a plurality of frequencies by a plurality of bias applying devices. .
- an AM-modulated high frequency voltage is applied by a cathode coupling type plasma processing apparatus, or anode coupling is performed.
- a technique of applying an FM-modulated high-frequency voltage with a plasma processing apparatus of the type is known.
- the waveform of the high-frequency power obtained by synthesizing different frequencies changes in a complex manner, and it may not be easy to determine the optimum conditions. Furthermore, it is necessary to match the impedance in accordance with the problem of crosstalk in which the electrical signals are mixed with each other and the mixing ratio of the power, and measures for these structures are required.
- Patent Document 2 is a technique for generating plasma with a modulated high-frequency voltage and controlling the electron temperature distribution in the plasma and the types and amounts of generated ions and radicals.
- the incident energy of ions cannot be controlled independently. For this reason, it is insufficient to further improve the controllability of ions incident on the substrate. Since FM modulation of the high frequency voltage is performed by a single power source, switching at the time of frequency change is inferior in speed and is not suitable for more accurate control.
- An object of the present invention is to provide a plasma processing method and apparatus capable of further improving the controllability of ion incidence onto a substrate.
- the purpose of the above is to convert the processing gas supplied into the processing chamber into a plasma with high-frequency power for plasma generation, and to apply high-frequency bias power of a different frequency to the sample stage on which the sample is placed, to generate plasma and to ion
- the plasma is generated by the continuous discharge generated by the continuously supplied power or the duty ratio is set by the intermittently supplied power.
- a plasma processing method in which at least two bias powers of different frequencies are switched and repeatedly applied to the sample stage when plasma is generated, and the pulse discharge is generated;
- a processing chamber having a sample stage therein and supplied with a processing gas and evacuated to a desired pressure; a plasma generation power source that is coupled to the processing chamber and converts the processing gas supplied into the processing chamber into plasma;
- a bias power source that is connected to the sample stage and supplies bias power of different frequencies, and generates plasma by the plasma generation power source and controls the incident energy of ions to the sample placed on the sample stage by the bias power source.
- the plasma generation power source can be set to supply power for continuous discharge of plasma and power supply for pulse discharge of plasma, and the bias power source has different frequencies. It consists of at least two power supplies that output bias power.
- the setting range of bias power of different frequencies can be expanded, and the controllability of ion incidence onto the substrate can be further improved.
- FIG. 1 It is a figure which shows the example of a switching output of the output mixing area
- FIG. 2nd Example of this invention It is a figure which shows the trigger signal for control of the high frequency power supply for plasma generation and the high frequency power supply for bias in the apparatus of FIG.
- the embodiment shown below uses the change in the incident energy distribution of ions from the plasma, which changes depending on the frequency of the high frequency bias power, to the substrate to be processed (hereinafter referred to as “wafer”), thereby improving the controllability of ion incidence onto the wafer.
- the in-plane uniformity of the etching process of the wafer that is, the in-plane uniformity of the etching rate and the in-plane uniformity of the etching shape can be obtained. is there.
- the means controls the bias voltage to the wafer independently, that is, the sample stage for applying energy to the ions incident on the wafer separately from the control of the high frequency power for generating the plasma.
- the high frequency power to be applied is controlled independently, and the high frequency power to be applied to the sample stage is controlled by using a plurality of high frequency bias power sources having different frequencies, and alternately and repeatedly supplying the high frequency bias power having different frequencies.
- the high frequency bias of each frequency up to the maximum allowable value of Vpp of the high frequency bias voltage that can be applied to the sample stage during processing.
- the power supply can be set, and the controllability of ion incidence to the wafer is further improved.
- Fig. 1 shows the configuration of the plasma processing apparatus.
- the vacuum vessel 101 constituting the processing chamber is a cylindrical vessel made of a conductive material such as aluminum and is electrically grounded (grounded).
- the upper opening of the vacuum vessel 101 is sealed by a top plate 102 made of a material that can transmit electromagnetic waves, for example, quartz.
- a vacuum evacuation device for evacuating the inside to a predetermined pressure is connected to the lower center of the vacuum vessel 101.
- a waveguide 103 is provided on the top plate 102 so as to cover the top plate 102, and a high-frequency power source for plasma generation (hereinafter referred to as “plasma power source 105”) is connected via a matching unit 104.
- plasma power source 105 a high-frequency power source for plasma generation
- the plasma power source 105 oscillates a microwave of 2.45 GHz.
- the oscillated microwave propagates through the waveguide 103 and is introduced into the vacuum vessel 101 through the top plate 102.
- a solenoid coil 106 for forming a magnetic field in the vacuum vessel 101 is wound around the vacuum vessel 101.
- a shower plate 108 is provided above the vacuum vessel 101 below the top plate 102, and a gas supply device 107 is connected between the top plate 102 of the vacuum vessel 101 and the shower plate 108.
- the processing gas is supplied from the gas supply device 107 to the space between the top plate 102 and the shower plate 108, and the processing gas is supplied to the processing chamber formed in the vacuum vessel via the shower plate 108.
- a sample stage 109 is provided in the vacuum container 101, and a wafer is loaded from a wafer carry-in entrance (not shown) and placed and held on the sample stage 109.
- the sample stage 109 includes a plurality of, in this case, two high frequency power sources for bias of different frequencies, a first high frequency bias power source having a frequency of 13.56 MHz (hereinafter referred to as “first bias power source 113”) and a frequency of 400 KHz.
- a second high-frequency bias power source (hereinafter referred to as “second bias power source 114”) is electrically connected in parallel via the filter 110 and the first and second matching units 111 and 112.
- the filter 110 in this case performs a power supply (not shown) during output of the first bias power supply 113 (for example, a power supply of an electrostatic chuck for holding a wafer connected to the sample stage 109 and a wafer temperature control).
- a function eg, High Pass Filter
- From a power source other than the second bias power source 114 including the omitted power source for example, the power source of an electrostatic chuck for holding a wafer connected to the sample stage 109 or the power source of a heater for controlling the temperature of the wafer).
- a function of not allowing the output to pass to the second bias power source 114 side (for example, Low Pass Filter).
- the plasma power source 105 and the first and second bias power sources 113 and 114 are connected to the control device 115, and output control of each power source described later is performed.
- the processing gas supplied into the vacuum vessel 101 acts on the action of a microwave electric field introduced through the top plate 102 and a magnetic field formed by a solenoid coil (for example, an electron Plasma is formed by cyclotron resonance (Electron Cyclotron Resonance (ECR)), and plasma is formed in a space between the shower plate 108 and the sample stage 109.
- a microwave electric field introduced through the top plate 102 and a magnetic field formed by a solenoid coil for example, an electron Plasma is formed by cyclotron resonance (Electron Cyclotron Resonance (ECR)
- ECR Electro Cyclotron Resonance
- high frequency power having a frequency of 13.56 MHz is applied to the sample stage 109 from the first bias power source 113, and high frequency power having a frequency of 400 KHz is applied from the second bias power source 114.
- These high-frequency powers applied to the sample stage 109 are controlled independently of the generation of the plasma, and generate a bias voltage that causes ions in the plasma to enter the wafer.
- the distribution of ion incident energy differs depending on the frequency of the high frequency bias.
- the distribution width of the ion energy distribution is narrow at high frequencies, and the ion energy distribution is low at low frequencies.
- the width of the distribution is wide and has peaks near both ends of the distribution.
- the processing state of the wafer differs.
- the output control of the plasma power source 105 and the first and second bias power sources 113 and 114 performed by the control device 115 is performed, for example, as shown in FIG.
- the plasma power source 105 continuously outputs microwaves and continuously generates plasma in any of FIGS. 2 (a), 2 (b), and 2 (c).
- the first and second bias power supplies 113 and 114 are continuously switched. As shown in FIG. 2A, the switching between the first and second bias power supplies 113 and 114 is performed at a high frequency (13.56 MHz) after the supply of high-frequency power at a low frequency (400 KHz) (time t (b)).
- the high frequency power is supplied (time t (c)), and this is repeated with the time t (a) of one switching cycle as one cycle.
- the repetition frequency is set between 100 Hz and 3 kHz, and in this case, 1 kHz.
- the ratio of the output times (t (b), t (c)) of the first and second bias power supplies 113, 114 within one cycle (time t (a)) is 0%.
- the ratio of time t (b) to time t (c) within time t (a) is 20% for time t (b) and 80% for time t (c).
- both time t (b) and time t (c) are 50%.
- the time t (b) is 80% and the time t (c) is 20%.
- the etching process is a planar gate formed by sequentially laminating a SiO 2 film 202, a Poly-Si film 203, and a mask film 204 made of a hard mask on the Si substrate 201, that is, the film structure shown in FIG. The wafer on which electrodes are formed was targeted.
- Etching conditions include a mixed gas of HBr and O 2 as a processing gas, a total gas flow rate of 200 ml / min, a pressure of 0.4 Pa, an output of the plasma power source 105 of 800 W, an output of the first bias power source 113 and a second bias.
- Each output of the power supply 114 was set to 25W.
- the etching rates of the Poly-Si film and the SiO 2 film were evaluated.
- FIG. 3 (a) shows an etching rate distribution corresponding to the output control of FIG. 2 (a).
- FIG. 3B shows an etching rate distribution corresponding to the output control of FIG. 2B.
- FIG. 3C shows an etching rate distribution corresponding to the output control of FIG. 2C.
- the wafer outer periphery It has been found that the etching rate distribution in the wafer surface can be controlled because the etching rate of the portion decreases.
- the plasma processing apparatus used in this example is a plasma processing apparatus that utilizes the interaction between the microwave electric field and the magnetic field generated by the solenoid coil.
- a current flows between the sample stage 109 and the grounded vacuum container 101 through plasma by the high frequency bias power applied to the sample stage 109
- a magnetic field formed in the vacuum container 101 is formed.
- the electrons in the plasma will cross.
- the movement distance of electrons to the inner wall surface of the vacuum vessel 101 serving as a ground is different between the central portion and the outer peripheral portion of the wafer, that is, the wafer central portion is closer to the inner wall surface of the vacuum vessel 101 than the outer peripheral portion. Since the distance becomes longer, the impedance at the center of the wafer increases to the ground than the outer periphery of the wafer.
- the impedance is related to the frequency of the high frequency power, and the impedance increases as the frequency increases. For this reason, with high frequency high frequency power, the current flows easily in the outer periphery of the wafer where the impedance is smaller than that in the center of the wafer, and the amount of ions from the plasma incident on the wafer increases due to the application of the high frequency bias. The etching rate at the outer peripheral portion is increased.
- the gas flow in the vacuum vessel 101 is exhausted from the upper part to the lower part of the vacuum vessel 101 through the peripheral space of the sample stage 109.
- the active species from the plasma supplied to the periphery of the wafer is less than that in the central portion of the wafer, the etching rate is reduced, and the amount of the medium and high etching rates is reduced. It is considered that the etching rate distribution, that is, the middle-high etching rate distribution is obtained.
- the etching rate distribution is also affected by temperature control within the wafer surface, but is not considered in this discussion.
- the etching rate distribution is changed from the external high to the medium high by changing the ratio of the output time of the high frequency power of the low frequency (400 KHz) and the high frequency (13.56 MHz).
- the condition that the etching rate distribution is substantially uniform that is, the ratio of the output time of the low frequency and high frequency high frequency power.
- the etching rate in the wafer surface can be made uniform. In this way, by switching the output of high-frequency power at a low frequency and high-frequency power at a low frequency alternately so that the ratio of the output time of each power can be controlled, the controllability of ion incidence on the wafer is possible. Can be further improved.
- high-frequency power having two different frequencies is supplied to the sample stage 109.
- the high-frequency power is supplied from the other bias power source. Therefore, no current flows into the sample stage 109 from the other bias power source. Therefore, occurrence of crosstalk can be prevented, and high frequency power for bias can be stably supplied to the sample stage 109.
- a high frequency power source of 13.56 MHz and a high frequency power source of 400 KHz are used as the bias power source.
- the frequency is such that ions in the plasma can follow and the difference in impedance becomes large. It is better to select the frequency. Further, whichever of the low-frequency and high-frequency high-frequency powers may be switched first.
- the output voltage (Vpp) is the same for both the low frequency and high frequency high frequency power sources, but as shown in FIG. (Vpp1) and the output voltage (Vpp2) of the high frequency high frequency power supply can be set to different values. In this case, Vpp1> Vpp2, but this can be reversed.
- the ratio of the output of each of the first bias power source and the second bias power source within one cycle is changed, and the output is alternately switched and periodically applied to the sample stage.
- the etching rate distribution can be controlled, and the uniformity within the wafer surface can be improved. This also makes it possible to control the distribution of the etching shape in the wafer surface.
- the maximum allowable power is set to the respective high frequency in the electrical allowable range of the sample stage to which the high frequency power for bias is applied. Output from the power source is possible, and the degree of freedom of setting according to processing is improved.
- the output of the bias power source is continuously switched without switching time between high frequency power of low frequency and high frequency power of high frequency.
- a mixing region may be provided at the time of switching.
- the output from each high-frequency power source at the time of switching in the mixed region gradually decreases the output of the previous high-frequency power source and gradually increases the output of the subsequent high-frequency power source as shown in FIG.
- FIG. 7B the output of the previous high frequency power supply is lowered stepwise and the output of the subsequent high frequency power supply is raised stepwise.
- the outputs from the respective high frequency power sources in the mixed region must be such that the sum (total) of the outputs does not exceed the maximum allowable value. Further, it is desirable that the matching between the low frequency high frequency power and the high frequency high frequency power is performed in a period other than the mixed region. By doing in this way, the low frequency high frequency power and the high frequency high frequency power can be stably matched.
- Fig. 8 shows the configuration of the plasma processing apparatus.
- the same reference numerals as those in FIG. 1 differs from the apparatus of FIG. 1 in that the outputs of the plasma power supply and the bias power supply are detected and the outputs of the bias power supply are synchronized when the output of the plasma power supply is intermittently time-modulated. The point is that the timing can be controlled.
- a Vpp detector 301 is connected to the matching unit 104 for the plasma power source 105, the rising of the output of the plasma power source 105 is detected by the Vpp detector 301, and the detection signal is transmitted to the output detection unit 305 as a trigger signal 302.
- a Vpp detector 303 is connected to the sample stage 109, rising edges of the outputs of the first bias power supply 113 and the second bias power supply 114 are detected by the Vpp detector 303, and the detection signal is transmitted to the output detection unit 305 as a trigger signal 304. To do.
- the output detection unit 305 calculates the time difference (t) between the trigger signals 302 and 304 shown in FIG. 9 transmitted from the Vpp detectors 301 and 303 and transmits the time difference signal 306 to the output control unit 307.
- the output control unit 307 corrects the time difference (t) based on the received time difference signal 306, and synchronizes the outputs of the plasma power source 105, the first bias power source 113, and the second bias power source 114 controlled by the control device 115 ′. .
- the output detection unit 305 and the output control unit 307 are incorporated in the control device 115 ′, but these are separated from the control device, and the values corrected by the output control unit 307 are used as respective correction signals for the plasma.
- the power may be transmitted to the power source 105, the first bias power source 113, and the second bias power source 114 and fed back to synchronize the outputs of the first bias power source 113 and the second bias power source 114 with the output of the plasma power source 105. .
- FIG. 10 (a) shows the same output state as FIG. 2 (b), the same control as in the previous embodiment is possible, and it is high after the supply of high frequency power at a low frequency (time t (b)).
- Supply of high frequency power of a frequency (time t (c)) is performed, and this is repeated with time t (a) as one cycle.
- FIG. 10B shows the case where the high frequency power for plasma is continuous and the high frequency power for bias is duty ratio controlled to output intermittently alternately.
- the outputs of the first and second bias power supplies 113 and 114 are respectively controlled with a duty ratio of 50%, a power supply stop period is provided after the supply of the low frequency high frequency power (time t (d)), and the high frequency After the supply of high-frequency power (time t (e)), a power supply stop period is provided, and this is repeated with time t (a) as one cycle.
- FIG. 10C shows a case where the output of the high frequency power for the plasma and the output of the high frequency power for the bias are controlled with the same duty ratio, and the output is controlled intermittently.
- one of the high-frequency powers for plasma generation has time (b) as one cycle, power is supplied for a time t (d) at a duty ratio of 50%, and intermittent discharge, that is, pulse discharge is performed. Is called.
- time t (b) and time t (c) are equal
- time t (d) and time t (e) are equal.
- the outputs of the first and second bias power supplies 113 and 114 are performed in the same manner as in FIG. 10B, and this is repeated with time t (a) as one cycle.
- the repetition frequency of the output of the plasma power supply is twice the repetition frequency of the output of the bias power supply, and the supply of the low frequency high frequency power for bias (time t ( d)) and a high frequency high frequency power supply (time t (e)) are performed.
- the etching rate distribution as shown in FIG. 11 is obtained.
- the wafer etching rate distribution shown in FIG. 11 is obtained when the wafer having the laminated structure shown in FIG. FIG. 11 (a) corresponds to the control of FIG. 10 (a), and the etching rate has a substantially uniform distribution in the wafer surface as in FIG. 3 (b).
- the Poly-Si etching rate was 51.6 nm / min
- the SiO 2 etching rate was 1.7 nm / min
- the selection ratio of Poly-Si / SiO 2 was 30.4.
- FIG. 11B corresponds to the control of FIG. 10B.
- the bias RF power output is controlled to be turned on / off at a duty ratio of 50%, and the etching rate distribution is almost uniform on the wafer surface. was gotten.
- the Poly-Si etching rate is 51.6 nm / as shown in FIG.
- the SiO 2 etch rate decreased from 1.7 nm / min to 0.9 nm / min from min to 45.2 nm / min, the selectivity ratio of Poly-Si / SiO 2 was improved from 30.4 to 50.2 and high. The selectivity can be obtained.
- FIG. 11 (c) corresponds to the control of FIG. 10 (c), and the output of the high frequency power for plasma generation and the output of the high frequency power for bias is on / off controlled at a duty ratio of 50%, respectively.
- the Poly-Si etching rate is 45.2 nm / as shown in FIG.
- FIG. 12 shows an etching shape when the wafer is etched by the control shown in FIGS. 10 (b) and 10 (c).
- FIG. 12A shows an initial shape before etching in which a dense and dense pattern is formed on the wafer having the laminated structure shown in FIG.
- FIG. 12B shows the etched shape after the processing in the output control of FIG. 10B.
- the control as shown in FIG. 10B that is, when only the high frequency power for bias is controlled on and off in the continuous discharge state.
- the dense Poly-Si film 203 is etched vertically, but the sparse Poly-Si film 203 has a tapered shape.
- FIG. 12C shows the etched shape after the process in the output control of FIG. 10C, and control as shown in FIG. 10C, that is, the high frequency power for plasma generation and the high frequency power for bias are synchronized.
- the dense Poly-Si film 203 is etched vertically, and the sparse Poly-Si film 203 is also etched substantially vertically.
- the control of FIG. 10C resulted in a lower etching rate as described above.
- the on / off control in which the high frequency power for plasma generation and the high frequency power for bias are synchronized in the etching process for a wafer having a sparse / dense pattern. In-plane uniformity of shape was obtained and effective. This is because, as shown in FIG. 10C, the degree of plasma dissociation can be controlled by using pulse discharge for plasma generation, and the generation of sedimentary species in the plasma is suppressed, and the plasma is supplied to the etched sidewall surface of the dense portion. Therefore, it is considered that an etching process having a substantially vertical shape that can be tolerated in the sparse / dense portion can be performed.
- FIGS. 10B and 10C show examples in which the high-frequency power for plasma generation and / or bias is controlled to be turned on / off at a duty ratio of 50%.
- the optimum duty ratio at ON is changed according to the material and structure, that is, the ratio of the time t (d) to the time t (b) and the ratio of the time t (e) to the time t (c) are arbitrarily set. It goes without saying that it can be changed.
- the duty ratio is set so that the high frequency power of the high and low frequencies for bias is intermittently controlled on and off, but the duty ratio of the high frequency power of either high or low frequency is set to 100%.
- the other high-frequency power can be intermittently controlled on and off.
- the on / off timings of the high frequency power for plasma generation and the bias are controlled substantially simultaneously, but the high frequency power for bias is within the on time of the high frequency power for plasma generation. If ON / OFF is performed, the ON / OFF timing of the high frequency power for bias is not limited to this.
- the in-plane distribution of the etching rate can be adjusted similarly to the above-described one embodiment, and the in-plane distribution of the etching rate can be made uniform.
- in-plane uniformity of the etching shape can be improved by applying time modulation for turning on / off the high-frequency power. In this way, by using a configuration in which the output of the high-frequency power of the low frequency and the high-frequency power of the high frequency is alternately switched and the ratio of the output time of each power can be controlled, the controllability of ion incidence to the wafer is achieved. Can be further improved.
- FIG. 10 (c) shows that time t (b) and time t (c) in which ON / OFF of the high-frequency power for plasma generation is one cycle are made equal, and time (b)
- time t (f) the time during which the high-frequency power for plasma generation is turned on is defined as the time t (f) within one period of time t (a) in which switching between the low frequency and high frequency high-frequency power is performed.
- switching between a low frequency for bias and high frequency power of a high frequency may be performed.
- the ratio of the output time t (b) of the high-frequency high-frequency power and the output time t (c) of the high-frequency high-frequency power within the period (a) of one cycle is set, and each time t (b ) And t (c), the time t (d) and t (e) when the output of the high frequency power is turned on is set (or the duty ratio of the on time is set), and the output of the low frequency high frequency power for bias is set.
- the on-time t (f) of the high-frequency power for plasma generation is set (or the duty ratio of the on-time is set) within the time (a) of one cycle, and the bias is used within the time t (f).
- the time during which the high-frequency power for plasma generation is turned off within one period of time t (a) is the time when the high-frequency power for bias is also turned off.
- FIG. 15 shows the on-time t (i) and t of the high frequency power in the output time t (g) of the low frequency high frequency power for bias and the output time t (h) of the high frequency high frequency power in FIG. This is an example in which (k) is set (or the duty ratio of each on-time is set).
- the first and second bias power sources 113 and 114 are connected to the sample stage corresponding to the entire surface of the wafer so that the bias high frequency power acts on the entire surface of the wafer.
- the sample stage is divided into a plurality of regions.
- the first and second bias power supplies 113 and 114 are connected to each region in the radial direction, the circumferential direction, or a combination thereof, and bias control is performed under different conditions for each region. May be.
- the bias power supply in this case may be (1) a plurality of sets provided and controlled independently for each set, or (2) one set of bias power supplies connected in parallel to each region.
- the high-frequency power that is always output from the control unit may be controlled by changing the conditions for each region through a control circuit that can control the output by changing the ratio of the output time for each region.
- the plasma processing apparatus is not limited to this, and the inductively coupled type or capacitively coupled type plasma processing apparatus may also be used. Needless to say, it can be applied.
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- General Chemical & Material Sciences (AREA)
- Electromagnetism (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Inorganic Chemistry (AREA)
- Plasma Technology (AREA)
- Drying Of Semiconductors (AREA)
Abstract
Description
試料台をその内部に有し処理ガスが供給されると共に所望の圧力に減圧排気される処理室と、処理室に結合され処理室内に供給される処理ガスをプラズマ化するプラズマ生成用電源と、試料台に接続され異なる周波数のバイアス電力を供給するバイアス用電源とを有し、プラズマ生成用電源によるプラズマの生成とバイアス用電源による試料台に配置される試料へのイオンの入射エネルギー制御とを独立に行い、試料をプラズマ処理する装置において、プラズマ生成用電源は、プラズマを連続放電させる電力の供給と、プラズマをパルス放電させる電力の供給とを設定可能であり、バイアス電源は、異なる周波数のバイアス電力を出力する少なくとも2つの電源から成り、プラズマ生成用電源によるプラズマの生成のとき、異なる周波数のバイアス電力を切り替えて試料台に交互に繰り返し供給するようにバイアス電源を制御する制御装置を具備したプラズマ処理装置とすることにより、達成される。
また、図7(b)に示すように先の高周波電源の出力を段階的に下げるとともに後の高周波電源の出力を段階的に上げる。なお、混合領域におけるそれぞれの高周波電源からの出力は、それぞれの出力の和(合計)が、許容される最大値を超えないようにする必要がある。また、低い周波数の高周波電力と高い周波数の高周波電力のそれぞれの整合は、混合領域以外の期間に行うことが望ましい。このようにすることにより、低い周波数の高周波電力と高い周波数の高周波電力のそれぞれの整合を安定して行うことができる。次に本発明の第2の実施例を図8ないし図12により説明する。
102 天板
103 導波管
104 整合器
105 プラズマ電源
106 ソレノイドコイル
107 ガス供給装置
108 シャワープレート
109 試料台
110 フィルター
111 第1整合器
112 第2整合器
113 第1バイアス電源
114 第2バイアス電源
115、115’ 制御装置
201 Si基板
202 SiO2膜
203 Poly-Si膜
204 マスク膜
301、303 Vpp検出器
302、304 トリガー信号
305 出力検出部
306 時間差信号
307 出力制御部
Claims (18)
- プラズマ生成用の高周波電力によって処理室内に供給される処理ガスをプラズマ化するとともに試料が配置される試料台に異なる周波数の高周波バイアス電力を印加し、前記プラズマの生成と前記試料へのイオンの入射エネルギー制御とを独立に行い、前記処理室内で前記試料をプラズマ処理する方法において、
前記プラズマは、連続的に供給される電力により生成される連続放電またはデューティー比設定され間欠的に供給される電力により生成されるパルス放電とし、
前記プラズマが生成されているときに前記試料台に少なくとも2つの異なる周波数のバイアス電力を切り替え交互に繰り返し印加することを特徴とするプラズマ処理方法。 - 請求項1に記載のプラズマ処理方法において、
前記2つの異なる周波数のバイアス電力の切り替えを周期的に行い、1周期内で一方のバイアス電力から他方のバイアス電力に切り替え、前記1周期内での前記一方および他方のバイアス電力の出力時間をそれぞれ設定可能にしたプラズマ処理方法。 - 請求項1に記載のプラズマ処理方法において、
前記2つの異なる周波数のバイアス電力の出力値を同じにしたプラズマ処理方法。 - 請求項1に記載のプラズマ処理方法において、
前記2つの異なる周波数のバイアス電力の出力値が異なるプラズマ処理方法。 - 請求項1に記載のプラズマ処理方法において、
前記プラズマの生成をパルス放電とし、パルスの発生に同期させパルス毎に異なる周波数のバイアス電力に切り替えるプラズマ処理方法。 - 請求項1に記載のプラズマ処理方法において、
前記プラズマの生成をパルス放電とし、1つのパルスでプラズマを生成している間に異なる周波数のバイアス電力を切り替えるプラズマ処理方法。 - プラズマを用いて試料台に載置された試料を処理するプラズマ処理方法において、
第一の高周波電力および前記第一の高周波電力の周波数と異なる周波数の第二の高周波電力を周期的に切り替えながら前記試料台に供給することを特徴とするプラズマ処理方法。 - 請求項7に記載のプラズマ処理方法において、
前記第一の高周波電力を前記試料台へ供給する時間と前記第二の高周波電力を前記試料台へ供給する時間との比をステップまたは前記ステップの集合体であるプラズマ処理条件に基づいて規定することを特徴とするプラズマ処理方法。 - 請求項8に記載のプラズマ処理方法において、
前記試料台に供給されている高周波電力の整合を前記第一の高周波電力と前記第二の高周波電力が重畳していない期間に行うことを特徴とするプラズマ処理方法。 - 請求項8に記載のプラズマ処理方法において、
前記第一の高周波電力と前記第二の高周波電力を切り替える時、前記第一の高周波電力と前記第二の高周波電力を重畳させることを特徴とするプラズマ処理方法。 - 請求項8に記載のプラズマ処理方法において、
前記第一の高周波電力または前記第二の高周波電力を時間変調することを特徴とするプラズマ処理方法。 - 請求項8に記載のプラズマ処理方法において、
前記プラズマを生成するための高周波電力を時間変調することを特徴とするプラズマ処理方法。 - 請求項12に記載のプラズマ処理方法において、
前記第一の高周波電力および前記第二の高周波電力を時間変調し、
前記第一の高周波電力を前記試料台へ供給する時間は、前記第二の高周波電力を前記試料台へ供給する時間と同じであって、
前記高周波電力の時間変調の周期と前記第一の高周波電力の時間変調の周期と前記第二の高周波電力の時間変調の周期は、全て同じ周期であることを特徴とするプラズマ処理方法。 - 請求項8に記載のプラズマ処理方法において、
前記第一の高周波電力の値と前記第二の高周波電力の値を異ならせることを特徴とするプラズマ処理方法。 - 試料台をその内部に有し処理ガスが供給されると共に所望の圧力に減圧排気される処理室と、前記処理室に結合され処理室内に供給される前記処理ガスをプラズマ化するプラズマ生成用電源と、前記試料台に接続され異なる周波数のバイアス電力を供給するバイアス用電源とを有し、プラズマ生成用電源によるプラズマの生成と前記バイアス用電源による前記試料台に配置される試料へのイオンの入射エネルギー制御とを独立に行い、前記試料をプラズマ処理するプラズマ処理装置において、
前記プラズマ生成用電源は、前記プラズマを連続放電させる電力の供給と、前記プラズマをパルス放電させる電力の供給とを設定可能であり、
前記バイアス電源は、異なる周波数のバイアス電力を出力する少なくとも2つの電源から成り、
前記プラズマ生成用電源によるプラズマの生成のとき、前記異なる周波数のバイアス電力を切り替えて前記試料台に交互に繰り返し供給するように前記バイアス電源を制御する制御装置を具備したことを特徴とするプラズマ処理装置。 - 請求項15に記載のプラズマ処理装置において、
前記制御装置は、前記プラズマを連続で生成するように前記プラズマ生成用電源を制御し、前記プラズマが生成されている間に前記異なる周波数のバイアス電源を交互に間欠的に制御するプラズマ処理装置。 - 請求項15に記載のプラズマ処理装置において、
前記制御装置は、前記プラズマをパルス放電させるように前記プラズマ生成用電源を制御し、前記プラズマのオンに合わせ前記異なる周波数のバイアス電源を交互に切替制御するプラズマ処理装置。 - 請求項15に記載のプラズマ処理装置において、
前記制御装置は、前記プラズマをパルス放電させるように前記プラズマ生成用電源を制御し、前記プラズマのオンの間に前記異なる周波数のバイアス電源を交互に切替制御するプラズマ処理装置。
Priority Applications (7)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
KR1020197034086A KR102145815B1 (ko) | 2016-01-18 | 2016-11-02 | 플라스마 처리 방법 및 플라스마 처리 장치 |
KR1020177020322A KR102124407B1 (ko) | 2016-01-18 | 2016-11-02 | 플라스마 처리 방법 및 플라스마 처리 장치 |
JP2017562440A JP6548748B2 (ja) | 2016-01-18 | 2016-11-02 | プラズマ処理方法およびプラズマ処理装置 |
US15/556,455 US10090162B2 (en) | 2016-01-18 | 2016-11-02 | Plasma processing method and plasma processing device |
TW106101699A TWI689986B (zh) | 2016-01-18 | 2017-01-18 | 電漿處理方法及電漿處理裝置 |
TW108145363A TWI711085B (zh) | 2016-01-18 | 2017-01-18 | 電漿處理方法及電漿處理裝置 |
US16/111,853 US20180366335A1 (en) | 2016-01-18 | 2018-08-24 | Plasma processing method and plasma processing device |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016-006752 | 2016-01-18 | ||
JP2016006752 | 2016-01-18 |
Related Child Applications (2)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US15/556,455 A-371-Of-International US10090162B2 (en) | 2016-01-18 | 2016-11-02 | Plasma processing method and plasma processing device |
US16/111,853 Continuation US20180366335A1 (en) | 2016-01-18 | 2018-08-24 | Plasma processing method and plasma processing device |
Publications (1)
Publication Number | Publication Date |
---|---|
WO2017126184A1 true WO2017126184A1 (ja) | 2017-07-27 |
Family
ID=59362698
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2016/082508 WO2017126184A1 (ja) | 2016-01-18 | 2016-11-02 | プラズマ処理方法およびプラズマ処理装置 |
Country Status (5)
Country | Link |
---|---|
US (2) | US10090162B2 (ja) |
JP (1) | JP6548748B2 (ja) |
KR (2) | KR102124407B1 (ja) |
TW (2) | TWI689986B (ja) |
WO (1) | WO2017126184A1 (ja) |
Cited By (14)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2019099937A1 (en) * | 2017-11-17 | 2019-05-23 | Advanced Energy Industries, Inc. | Improved application of modulating supplies in a plasma processing system |
WO2019244697A1 (ja) * | 2018-06-22 | 2019-12-26 | 東京エレクトロン株式会社 | プラズマ処理方法及びプラズマ処理装置 |
US10607813B2 (en) | 2017-11-17 | 2020-03-31 | Advanced Energy Industries, Inc. | Synchronized pulsing of plasma processing source and substrate bias |
US10707055B2 (en) | 2017-11-17 | 2020-07-07 | Advanced Energy Industries, Inc. | Spatial and temporal control of ion bias voltage for plasma processing |
US11011349B2 (en) | 2009-05-01 | 2021-05-18 | Aes Global Holdings, Pte. Ltd. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
US11189454B2 (en) | 2012-08-28 | 2021-11-30 | Aes Global Holdings, Pte. Ltd. | Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system |
KR20220031988A (ko) | 2020-09-02 | 2022-03-15 | 주식회사 히타치하이테크 | 플라스마 처리 장치 및 플라스마 처리 방법 |
WO2022259868A1 (ja) * | 2021-06-08 | 2022-12-15 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
US11615941B2 (en) | 2009-05-01 | 2023-03-28 | Advanced Energy Industries, Inc. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
US11670487B1 (en) | 2022-01-26 | 2023-06-06 | Advanced Energy Industries, Inc. | Bias supply control and data processing |
WO2023223866A1 (ja) * | 2022-05-19 | 2023-11-23 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
US11887812B2 (en) | 2019-07-12 | 2024-01-30 | Advanced Energy Industries, Inc. | Bias supply with a single controlled switch |
US11942309B2 (en) | 2022-01-26 | 2024-03-26 | Advanced Energy Industries, Inc. | Bias supply with resonant switching |
US11978613B2 (en) | 2022-09-01 | 2024-05-07 | Advanced Energy Industries, Inc. | Transition control in a bias supply |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR20180077392A (ko) * | 2016-12-28 | 2018-07-09 | 삼성전자주식회사 | 플라즈마 처리 장치 및 그를 이용한 반도체 소자의 제조 방법 |
KR102475069B1 (ko) * | 2017-06-30 | 2022-12-06 | 삼성전자주식회사 | 반도체 제조 장치, 이의 동작 방법 |
JP6997642B2 (ja) * | 2018-01-30 | 2022-01-17 | 株式会社日立ハイテク | プラズマ処理装置およびプラズマ処理方法 |
JP7101096B2 (ja) * | 2018-10-12 | 2022-07-14 | 東京エレクトロン株式会社 | プラズマ処理方法及びプラズマ処理装置 |
JP7061981B2 (ja) | 2019-03-28 | 2022-05-02 | 東京エレクトロン株式会社 | プラズマエッチング装置およびプラズマエッチング方法 |
CN111916327B (zh) * | 2019-05-10 | 2023-04-28 | 中微半导体设备(上海)股份有限公司 | 多频率多阶段的等离子体射频输出的方法及其装置 |
JP7285742B2 (ja) * | 2019-09-02 | 2023-06-02 | 東京エレクトロン株式会社 | プラズマ処理装置及び処理方法 |
JP7285377B2 (ja) * | 2019-12-24 | 2023-06-01 | イーグル ハーバー テクノロジーズ,インク. | プラズマシステム用ナノ秒パルサrf絶縁 |
WO2022177846A1 (en) * | 2021-02-22 | 2022-08-25 | Advanced Energy Industries, Inc. | Integrated control of a plasma processing system |
Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007509506A (ja) * | 2003-10-21 | 2007-04-12 | ウナクシス ユーエスエイ、インコーポレイテッド | 時分割多重法及びrfバイアス変調を用いた高アスペクトsoi構造の無ノッチエッチング |
JP2010512031A (ja) * | 2006-12-05 | 2010-04-15 | アプライド マテリアルズ インコーポレイテッド | チャンバ中央のガス分配プレート、同調型プラズマ流制御グリッド及び電極 |
Family Cites Families (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH10150025A (ja) * | 1996-11-20 | 1998-06-02 | Mitsubishi Electric Corp | プラズマ反応装置 |
JP2000150196A (ja) | 1999-01-01 | 2000-05-30 | Hitachi Ltd | プラズマ処理方法およびその装置 |
CN100492598C (zh) | 2003-10-21 | 2009-05-27 | 优利讯美国有限公司 | 使用交替淀积/蚀刻工序蚀刻衬底中特征的方法和设备 |
JP4515755B2 (ja) * | 2003-12-24 | 2010-08-04 | 東京エレクトロン株式会社 | 処理装置 |
JP5014166B2 (ja) | 2007-02-13 | 2012-08-29 | 株式会社日立ハイテクノロジーズ | プラズマ処理方法およびプラズマ処理装置 |
JP5128421B2 (ja) | 2008-09-04 | 2013-01-23 | 東京エレクトロン株式会社 | プラズマ処理方法およびレジストパターンの改質方法 |
JP2011192664A (ja) | 2010-03-11 | 2011-09-29 | Tokyo Electron Ltd | プラズマエッチング方法及びプラズマエッチング装置 |
JP5571996B2 (ja) | 2010-03-31 | 2014-08-13 | 東京エレクトロン株式会社 | プラズマ処理方法及びプラズマ処理装置 |
JP2011228436A (ja) * | 2010-04-19 | 2011-11-10 | Hitachi High-Technologies Corp | プラズマ処理装置およびプラズマ処理方法 |
-
2016
- 2016-11-02 KR KR1020177020322A patent/KR102124407B1/ko active IP Right Grant
- 2016-11-02 JP JP2017562440A patent/JP6548748B2/ja active Active
- 2016-11-02 US US15/556,455 patent/US10090162B2/en active Active
- 2016-11-02 WO PCT/JP2016/082508 patent/WO2017126184A1/ja active Application Filing
- 2016-11-02 KR KR1020197034086A patent/KR102145815B1/ko active IP Right Grant
-
2017
- 2017-01-18 TW TW106101699A patent/TWI689986B/zh active
- 2017-01-18 TW TW108145363A patent/TWI711085B/zh active
-
2018
- 2018-08-24 US US16/111,853 patent/US20180366335A1/en active Pending
Patent Citations (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2007509506A (ja) * | 2003-10-21 | 2007-04-12 | ウナクシス ユーエスエイ、インコーポレイテッド | 時分割多重法及びrfバイアス変調を用いた高アスペクトsoi構造の無ノッチエッチング |
JP2010512031A (ja) * | 2006-12-05 | 2010-04-15 | アプライド マテリアルズ インコーポレイテッド | チャンバ中央のガス分配プレート、同調型プラズマ流制御グリッド及び電極 |
Cited By (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US11011349B2 (en) | 2009-05-01 | 2021-05-18 | Aes Global Holdings, Pte. Ltd. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
US11615941B2 (en) | 2009-05-01 | 2023-03-28 | Advanced Energy Industries, Inc. | System, method, and apparatus for controlling ion energy distribution in plasma processing systems |
US11189454B2 (en) | 2012-08-28 | 2021-11-30 | Aes Global Holdings, Pte. Ltd. | Systems and methods for monitoring faults, anomalies, and other characteristics of a switched mode ion energy distribution system |
US10811228B2 (en) | 2017-11-17 | 2020-10-20 | Advanced Energy Industries, Inc. | Control of plasma processing systems that include plasma modulating supplies |
TWI767088B (zh) * | 2017-11-17 | 2022-06-11 | 新加坡商Aes全球公司 | 電漿處理系統,用於調變其中的電源的控制方法及相關的電漿處理控制系統 |
CN111788654A (zh) * | 2017-11-17 | 2020-10-16 | 先进工程解决方案全球控股私人有限公司 | 等离子体处理系统中的调制电源的改进应用 |
WO2019099937A1 (en) * | 2017-11-17 | 2019-05-23 | Advanced Energy Industries, Inc. | Improved application of modulating supplies in a plasma processing system |
US10811227B2 (en) | 2017-11-17 | 2020-10-20 | Advanced Energy Industries, Inc. | Application of modulating supplies in a plasma processing system |
US10811229B2 (en) | 2017-11-17 | 2020-10-20 | Advanced Energy Industries, Inc. | Synchronization with a bias supply in a plasma processing system |
US10896807B2 (en) | 2017-11-17 | 2021-01-19 | Advanced Energy Industries, Inc. | Synchronization between an excitation source and a substrate bias supply |
JP2021503702A (ja) * | 2017-11-17 | 2021-02-12 | エーイーエス グローバル ホールディングス, プライベート リミテッド | プラズマ処理システムにおける変調供給源の改良された印加 |
US10607813B2 (en) | 2017-11-17 | 2020-03-31 | Advanced Energy Industries, Inc. | Synchronized pulsing of plasma processing source and substrate bias |
JP7432781B2 (ja) | 2017-11-17 | 2024-02-16 | エーイーエス グローバル ホールディングス, プライベート リミテッド | プラズマ処理源および基板バイアスの同期パルス化 |
US11842884B2 (en) | 2017-11-17 | 2023-12-12 | Advanced Energy Industries, Inc. | Spatial monitoring and control of plasma processing environments |
US10707055B2 (en) | 2017-11-17 | 2020-07-07 | Advanced Energy Industries, Inc. | Spatial and temporal control of ion bias voltage for plasma processing |
CN111788654B (zh) * | 2017-11-17 | 2023-04-14 | 先进工程解决方案全球控股私人有限公司 | 等离子体处理系统中的调制电源的改进应用 |
WO2019244697A1 (ja) * | 2018-06-22 | 2019-12-26 | 東京エレクトロン株式会社 | プラズマ処理方法及びプラズマ処理装置 |
JP2019220650A (ja) * | 2018-06-22 | 2019-12-26 | 東京エレクトロン株式会社 | プラズマ処理方法及びプラズマ処理装置 |
US11887812B2 (en) | 2019-07-12 | 2024-01-30 | Advanced Energy Industries, Inc. | Bias supply with a single controlled switch |
KR20220031988A (ko) | 2020-09-02 | 2022-03-15 | 주식회사 히타치하이테크 | 플라스마 처리 장치 및 플라스마 처리 방법 |
WO2022259868A1 (ja) * | 2021-06-08 | 2022-12-15 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
US11670487B1 (en) | 2022-01-26 | 2023-06-06 | Advanced Energy Industries, Inc. | Bias supply control and data processing |
US11942309B2 (en) | 2022-01-26 | 2024-03-26 | Advanced Energy Industries, Inc. | Bias supply with resonant switching |
WO2023223866A1 (ja) * | 2022-05-19 | 2023-11-23 | 東京エレクトロン株式会社 | プラズマ処理装置及びプラズマ処理方法 |
US11978613B2 (en) | 2022-09-01 | 2024-05-07 | Advanced Energy Industries, Inc. | Transition control in a bias supply |
Also Published As
Publication number | Publication date |
---|---|
KR102145815B1 (ko) | 2020-08-19 |
KR20170101251A (ko) | 2017-09-05 |
KR20190131616A (ko) | 2019-11-26 |
US20180366335A1 (en) | 2018-12-20 |
KR102124407B1 (ko) | 2020-06-18 |
US20180047573A1 (en) | 2018-02-15 |
JP6548748B2 (ja) | 2019-07-24 |
TWI689986B (zh) | 2020-04-01 |
US10090162B2 (en) | 2018-10-02 |
TW202017043A (zh) | 2020-05-01 |
TW201737338A (zh) | 2017-10-16 |
JPWO2017126184A1 (ja) | 2018-03-15 |
TWI711085B (zh) | 2020-11-21 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
WO2017126184A1 (ja) | プラズマ処理方法およびプラズマ処理装置 | |
US10811231B2 (en) | Plasma processing apparatus and plasma processing method | |
US20200058469A1 (en) | Systems and methods of control for plasma processing | |
US10121640B2 (en) | Method and apparatus for plasma processing | |
JP6002556B2 (ja) | プラズマ処理装置およびプラズマ処理方法 | |
TW202135128A (zh) | 用於電漿處理之方法和系統以及相關的非暫時性電腦可讀取媒體 | |
JP6643212B2 (ja) | プラズマ処理装置及びプラズマ処理方法 | |
KR101702477B1 (ko) | 플라즈마 처리장치 및 플라즈마 처리방법 | |
JP6491888B2 (ja) | プラズマ処理方法およびプラズマ処理装置 | |
TWI603368B (zh) | Plasma processing apparatus and plasma processing method | |
TW201715562A (zh) | 電漿處理裝置及電漿處理方法 | |
US11062884B2 (en) | Plasma processing apparatus and plasma processing method | |
TW201526099A (zh) | 電漿處理裝置及電漿處理方法 | |
JP6180890B2 (ja) | プラズマ処理方法 | |
JPH11219938A (ja) | プラズマエッチング方法 | |
JP2013214583A (ja) | プラズマ処理装置およびプラズマ処理方法 | |
US20230187174A1 (en) | Plasma processing apparatus and plasma processing method | |
JP2012129429A (ja) | プラズマ処理方法 | |
JP2017147381A (ja) | プラズマ処理方法 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
ENP | Entry into the national phase |
Ref document number: 20177020322 Country of ref document: KR Kind code of ref document: A |
|
ENP | Entry into the national phase |
Ref document number: 2017562440 Country of ref document: JP Kind code of ref document: A |
|
WWE | Wipo information: entry into national phase |
Ref document number: 15556455 Country of ref document: US |
|
121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 16886423 Country of ref document: EP Kind code of ref document: A1 |
|
NENP | Non-entry into the national phase |
Ref country code: DE |
|
122 | Ep: pct application non-entry in european phase |
Ref document number: 16886423 Country of ref document: EP Kind code of ref document: A1 |