WO2016185673A1 - はんだ合金 - Google Patents
はんだ合金 Download PDFInfo
- Publication number
- WO2016185673A1 WO2016185673A1 PCT/JP2016/002170 JP2016002170W WO2016185673A1 WO 2016185673 A1 WO2016185673 A1 WO 2016185673A1 JP 2016002170 W JP2016002170 W JP 2016002170W WO 2016185673 A1 WO2016185673 A1 WO 2016185673A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- solder
- mass
- additive element
- electrode
- balance
- Prior art date
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Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
- B23K35/262—Sn as the principal constituent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/02—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
- B23K35/0222—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
- B23K35/0244—Powders, particles or spheres; Preforms made therefrom
- B23K35/025—Pastes, creams, slurries
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K35/00—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
- B23K35/22—Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
- B23K35/24—Selection of soldering or welding materials proper
- B23K35/26—Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C1/00—Making non-ferrous alloys
- C22C1/04—Making non-ferrous alloys by powder metallurgy
- C22C1/0483—Alloys based on the low melting point metals Zn, Pb, Sn, Cd, In or Ga
-
- C—CHEMISTRY; METALLURGY
- C22—METALLURGY; FERROUS OR NON-FERROUS ALLOYS; TREATMENT OF ALLOYS OR NON-FERROUS METALS
- C22C—ALLOYS
- C22C13/00—Alloys based on tin
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/18—Printed circuits structurally associated with non-printed electric components
- H05K1/181—Printed circuits structurally associated with non-printed electric components associated with surface mounted components
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/3457—Solder materials or compositions; Methods of application thereof
- H05K3/3463—Solder compositions in relation to features of the printed circuit board or the mounting process
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B23—MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
- B23K—SOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
- B23K2101/00—Articles made by soldering, welding or cutting
- B23K2101/36—Electric or electronic devices
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/10—Details of components or other objects attached to or integrated in a printed circuit board
- H05K2201/10613—Details of electrical connections of non-printed components, e.g. special leads
- H05K2201/10621—Components characterised by their electrical contacts
- H05K2201/10734—Ball grid array [BGA]; Bump grid array
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
- H05K3/3436—Leadless components having an array of bottom contacts, e.g. pad grid array or ball grid array components
Definitions
- the present invention relates to a solder alloy used for soldering.
- the melting point of the solder alloy increases.
- the amount of the intermetallic compound precipitated at the joint interface is reduced, there is a concern that the strength and reliability of the solder may be reduced.
- Patent Documents 1 to 3 disclose solder paste using a solder alloy powder to which Bi is not added.
- Japanese Patent No. 5553181 Japanese Patent No. 2752258 JP 2008-31550 A
- the solder alloy of the present invention comprises Ag 2.0 to 4.0% by mass, Cu 0.5 to 1.0% by mass, an additive element 0.1 to 0.5% by mass selected from the group consisting of Ca and Mn, and the balance Sn Consists of.
- Ca suppresses the growth of Sn, CuSn, and AgSn intermetallic compounds. Mn shortens the wetting time.
- a solder composed of Ag 2.0 to 4.0 mass%, Cu 0.5 to 1.0 mass%, Mn 0.1 to 0.5 mass%, and remaining Sn.
- a more preferable composition is Ag 2.0 to 4.0% by mass, Cu 0.5 to 1.0% by mass, Mn 0.1 to 0.45% by mass, and the balance Sn.
- the composition may be composed of Ag 2.0 to 4.0% by mass, Cu 0.5 to 1.0% by mass, Ca 0.1 to 0.5% by mass, Mn 0.1 to 0.5% by mass, and remaining Sn. .
- a more preferable composition is composed of Ag 2.0 to 4.0 mass%, Cu 0.5 to 1.0 mass%, Ca 0.1 to 0.33 mass%, Mn 0.1 to 0.45 mass%, and the balance Sn. Composition.
- the additive element having a value close to the solid solubility limit is dissolved in such a manner that it does not become excessive, so that the possibility that the additive element is reprecipitated is low. Furthermore, if the additive element is made not more than the solid solubility limit, the possibility that the additive element is reprecipitated becomes lower.
- FIG. 1 is a conceptual diagram showing an example in which a substrate electrode 21 and a component electrode 31 are joined by a solder 10 including a solder alloy according to the present embodiment.
- FIG. 2 is an enlarged conceptual diagram of the rectangle A (inside the broken line) in FIG.
- FIG. 3 is a conceptual diagram showing an example of joining the substrate electrode 210 and the component electrode 310 with the solder 100 containing Bi.
- FIG. 4 is an enlarged conceptual diagram of the rectangle B (inside the broken line) in FIG.
- Bi has a eutectic point (139 ° C.) with Sn. Therefore, when the molten solder solidifies, Bi is biased to a portion where the temperature is high and the solidification is slow (near the bonding interface) due to the temperature gradient, and the Bi concentration near the bonding interface increases. Furthermore, when a compound phase (400 in FIG. 4) of Cu or Ni and Sn at the bonding interface grows due to a temperature load or the like, Sn in the vicinity of the compound phase is consumed. It rises further. And in the location where Bi density
- the solder powder used for the solder balls of this example has the solder composition shown in this embodiment.
- the additive element is diffused in Sn, which is the main component of the solder, or is included in the compound phase precipitated at the bonding interface.
- Example 6 The electronic component of Example 6 is a BGA (Ball Grid Array) type device using the solder balls described above.
- the electronic component of this example has high reliability when mounted on a substrate and has a long life. Further, in the electronic device in which the electronic component of this embodiment is mounted, the reliability is improved and the life is extended.
Abstract
Description
まず、本実施形態に係るはんだ合金について説明する。本実施形態においては、主成分である錫(以下、Sn)に銀(以下、Ag)や銅(以下、Cu)を添加したSnAgCuはんだ合金の特性を向上させる組成を示す。
ここで、Snを主成分とするはんだ合金にBiを添加したはんだで接合されたはんだ接合部において、接合界面にBiが層状に析出してクラックの起点となるメカニズムについて説明する。
実施例1のはんだ粉末は、部品電極と基板電極とをはんだで接合するために用いる。本実施例のはんだ粉末の製造方法については後述する。
実施例2のはんだボールは、主に電子部品の部品電極に搭載され、その部品電極と基板電極とを接合するために用いる。本実施例のはんだボールの製造方法については後述する。
実施例3では、上記組成のはんだ粉末およびはんだボールの製造方法について説明する。
実施例4のはんだペーストは、部品電極と基板電極とをはんだで接合するために用いる。本実施例のはんだペーストは、はんだ粉末、フラックス、溶剤およびチクソトロピック剤(チクソ剤とも呼ぶ)等の材料を混練して作製される。なお、本実施例のはんだペーストに含まれるフラックス、溶剤およびチクソ剤等の材料については限定を加えない。
実施例5のはんだ接合構造は、主成分であるSn中に拡散した添加元素、または析出した化合物相中に置換した添加元素を含む。本実施例のはんだ接合構造に用いるはんだは、本実施形態に示したはんだ組成を有する。
実施例6の電子部品は、前述したはんだボールを用い、BGA(Ball Grid Array)タイプのデバイスとしたものである。
20 基板
21 基板電極
22 基材
23 レジスト
30 電子部品
31 部品電極
32 基材
33 ソルダマスク
40 化合物相
Claims (10)
- Ag2.0乃至4.0質量%、Cu0.5乃至1.0質量%、CaおよびMnからなる群より選ばれる添加元素0.1乃至0.5質量%、残部Snからなるはんだ合金。
- Ag2.0乃至4.0質量%、Cu0.5乃至1.0質量%、Ca0.1乃至0.33質量%、残部Snからなる請求項1に記載のはんだ合金。
- Ag2.0乃至4.0質量%、Cu0.5乃至1.0質量%、Mn0.1乃至0.45質量%、残部Snからなる請求項1に記載のはんだ合金。
- Ag2.0乃至4.0質量%、Cu0.5乃至1.0質量%、Ca0.1乃至0.33質量%、Mn0.1乃至0.45質量%、残部Snからなる請求項1に記載のはんだ合金。
- 請求項1乃至4のいずれか一項に記載のはんだ合金を含むはんだ粉末。
- 請求項5に記載のはんだ粉末と、フラックスと、チクソトロピック剤と、溶剤とを混練させたはんだペースト。
- 電子部品の電極と、前記電子部品を実装する基板の電極とを請求項1乃至4のいずれかに記載のはんだ合金を用いて接合したはんだ接合構造。
- 請求項1乃至4のいずれか一項に記載のはんだ合金を含むはんだボール。
- 請求項8に記載のはんだボールを電極に搭載した電子部品。
- 請求項9に記載の電子部品を実装した基板を含む電子機器。
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2017518741A JP6848859B2 (ja) | 2015-05-20 | 2016-04-25 | はんだ合金 |
US15/569,106 US10307868B2 (en) | 2015-05-20 | 2016-04-25 | Solder alloy |
CN201680028679.2A CN107614186A (zh) | 2015-05-20 | 2016-04-25 | 焊料合金 |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2015-102915 | 2015-05-20 | ||
JP2015102915 | 2015-05-20 |
Publications (1)
Publication Number | Publication Date |
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WO2016185673A1 true WO2016185673A1 (ja) | 2016-11-24 |
Family
ID=57319783
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/JP2016/002170 WO2016185673A1 (ja) | 2015-05-20 | 2016-04-25 | はんだ合金 |
Country Status (4)
Country | Link |
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US (1) | US10307868B2 (ja) |
JP (1) | JP6848859B2 (ja) |
CN (1) | CN107614186A (ja) |
WO (1) | WO2016185673A1 (ja) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017221861A1 (ja) * | 2016-06-21 | 2017-12-28 | 日本電気株式会社 | はんだペーストおよびはんだ接合体 |
Families Citing this family (1)
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JP6355092B1 (ja) * | 2017-05-11 | 2018-07-11 | パナソニックIpマネジメント株式会社 | はんだ合金およびそれを用いた接合構造体 |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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US5527628A (en) * | 1993-07-20 | 1996-06-18 | Iowa State University Research Foudation, Inc. | Pb-free Sn-Ag-Cu ternary eutectic solder |
JP2004261863A (ja) * | 2003-01-07 | 2004-09-24 | Senju Metal Ind Co Ltd | 鉛フリーはんだ |
JP2008031550A (ja) * | 2006-06-26 | 2008-02-14 | Hitachi Cable Ltd | PbフリーのSn系材料及び配線用導体並びに端末接続部並びにPbフリーはんだ合金 |
US20100203353A1 (en) * | 2009-02-06 | 2010-08-12 | Iowa State University Research Foundation, Inc. | Pb-Free Sn-Ag-Cu-Mn Solder |
JP2010247167A (ja) * | 2009-04-14 | 2010-11-04 | Nippon Steel Materials Co Ltd | 無鉛ハンダ合金、ハンダボール及びハンダバンプを有する電子部材 |
JP2014160822A (ja) * | 2014-02-24 | 2014-09-04 | Agere Systems Inc | 改良された機械的特性を有するPbフリーのハンダ・バンプ |
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US5405577A (en) | 1993-04-29 | 1995-04-11 | Seelig; Karl F. | Lead-free and bismuth-free tin alloy solder composition |
US7282175B2 (en) | 2003-04-17 | 2007-10-16 | Senju Metal Industry Co., Ltd. | Lead-free solder |
US20050100474A1 (en) * | 2003-11-06 | 2005-05-12 | Benlih Huang | Anti-tombstoning lead free alloys for surface mount reflow soldering |
US20080159904A1 (en) * | 2005-08-24 | 2008-07-03 | Fry's Metals, Inc. | Solder alloy |
US9175368B2 (en) * | 2005-12-13 | 2015-11-03 | Indium Corporation | MN doped SN-base solder alloy and solder joints thereof with superior drop shock reliability |
KR101436714B1 (ko) | 2010-06-01 | 2014-09-01 | 센주긴조쿠고교 가부시키가이샤 | 납프리 솔더 페이스트 |
CN103906598A (zh) * | 2011-08-02 | 2014-07-02 | 阿尔法金属公司 | 高冲击韧性的焊料合金 |
WO2014057261A1 (en) * | 2012-10-09 | 2014-04-17 | Alpha Metals, Inc. | Lead-free and antimony-free tin solder reliable at high temperatures |
-
2016
- 2016-04-25 US US15/569,106 patent/US10307868B2/en active Active
- 2016-04-25 JP JP2017518741A patent/JP6848859B2/ja active Active
- 2016-04-25 WO PCT/JP2016/002170 patent/WO2016185673A1/ja active Application Filing
- 2016-04-25 CN CN201680028679.2A patent/CN107614186A/zh active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
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US5527628A (en) * | 1993-07-20 | 1996-06-18 | Iowa State University Research Foudation, Inc. | Pb-free Sn-Ag-Cu ternary eutectic solder |
JP2004261863A (ja) * | 2003-01-07 | 2004-09-24 | Senju Metal Ind Co Ltd | 鉛フリーはんだ |
JP2008031550A (ja) * | 2006-06-26 | 2008-02-14 | Hitachi Cable Ltd | PbフリーのSn系材料及び配線用導体並びに端末接続部並びにPbフリーはんだ合金 |
US20100203353A1 (en) * | 2009-02-06 | 2010-08-12 | Iowa State University Research Foundation, Inc. | Pb-Free Sn-Ag-Cu-Mn Solder |
JP2010247167A (ja) * | 2009-04-14 | 2010-11-04 | Nippon Steel Materials Co Ltd | 無鉛ハンダ合金、ハンダボール及びハンダバンプを有する電子部材 |
JP2014160822A (ja) * | 2014-02-24 | 2014-09-04 | Agere Systems Inc | 改良された機械的特性を有するPbフリーのハンダ・バンプ |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2017221861A1 (ja) * | 2016-06-21 | 2017-12-28 | 日本電気株式会社 | はんだペーストおよびはんだ接合体 |
Also Published As
Publication number | Publication date |
---|---|
US10307868B2 (en) | 2019-06-04 |
US20180117715A1 (en) | 2018-05-03 |
JP6848859B2 (ja) | 2021-03-24 |
CN107614186A (zh) | 2018-01-19 |
JPWO2016185673A1 (ja) | 2018-03-08 |
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