WO2016084195A1 - Dispositif d'interférence de lumière blanche et procédé de détection de position et de déplacement au moyen d'un dispositif d'interférence de lumière blanche - Google Patents

Dispositif d'interférence de lumière blanche et procédé de détection de position et de déplacement au moyen d'un dispositif d'interférence de lumière blanche Download PDF

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Publication number
WO2016084195A1
WO2016084195A1 PCT/JP2014/081401 JP2014081401W WO2016084195A1 WO 2016084195 A1 WO2016084195 A1 WO 2016084195A1 JP 2014081401 W JP2014081401 W JP 2014081401W WO 2016084195 A1 WO2016084195 A1 WO 2016084195A1
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light
measurement
white light
displacement
interference
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PCT/JP2014/081401
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English (en)
Japanese (ja)
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智浩 青戸
恭平 林
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株式会社東京精密
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Priority to PCT/JP2014/081401 priority Critical patent/WO2016084195A1/fr
Publication of WO2016084195A1 publication Critical patent/WO2016084195A1/fr

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B9/00—Measuring instruments characterised by the use of optical techniques
    • G01B9/02—Interferometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques

Definitions

  • the present invention relates to a white interference device that measures the position and displacement of a measurement object in a non-contact manner using a white interference method (low coherence interference method), and a position and displacement measurement method using the white interference device.
  • a white interference method low coherence interference method
  • An interferometer using an interferometry that detects interference fringes caused by coherent light interference is known.
  • the interferometry is characterized in that when a single wavelength is interfered by an optical interferometer such as a Michelson interferometer, the brightness increases as it approaches an integral multiple of the wavelength, and decreases as it approaches the middle.
  • an optical interferometer such as a Michelson interferometer
  • white interferometry low coherence interferometry
  • a white light source with a short coherence length maximum optical path difference that can obtain interference fringes. It is known that measurement can be performed without contact (see, for example, Patent Document 1).
  • the white interference device of Patent Document 1 includes a white light source, an optical coupler, a reference optical path length scanner unit, a sensor unit, a photodetector, a processing device, and the like.
  • the optical coupler serves as a half mirror or a beam splitter that divides white light from the white light source into reference light and measurement light.
  • the reference optical path length scanner unit reciprocally moves an optical element that changes a traveling direction of reference light entering from an optical coupler through an optical fiber, a reflecting element that reverses the traveling direction of reference light emitted from the optical element, and an optical element.
  • a linear motion stage and a reference scale head for acquiring the position of the optical element are provided.
  • the sensor unit adjusts the spot size of the measurement light by moving the condensing lens in synchronism with the condensing lens for diverging or converging the measurement light entering from the optical coupler through the optical fiber, and the reference optical path length scanner unit.
  • a lens moving unit is provided.
  • the photodetector detects interference fringes between the reference light returned from the reference light path length scanner unit and the measurement light returned from the sensor unit, and outputs an interference signal to the processing device.
  • the interference fringes detected by the photodetector are seen when there is no optical path difference between the measurement light and the reference light, that is, when the optical path lengths are almost equal, and when the optical path lengths match.
  • the amplitude of the interference fringes is maximized.
  • the maximum contrast position of the interference fringes at that time is the surface position of the measurement object.
  • the accuracy of determining the position of the optical element on the linear motion stage of the reference optical path length scanner unit indicating the maximum amplitude of the interference fringes is the measurement accuracy when measuring the position and displacement of the measurement object.
  • the white light interference device of Patent Document 1 can measure the position and displacement of the measurement object with nanometer accuracy by accurately scanning the optical path length of the reference light and obtaining phase information of the white light interference fringes.
  • the white light interference device in order to accurately measure the position and displacement of the measurement object, the accuracy (performance) of the linear motion stage that reciprocates the optical element greatly affects.
  • the white light interference device cannot accurately measure the position and displacement of the measurement object unless the straightness error of the linear motion stage and the error of pitching and yawing operations of the linear motion stage during movement are removed.
  • a linear motion stage is moved by irradiating measurement light onto a reference plane (for example, a mirror or a block gauge whose position is known) as a reference, and is obtained at that time.
  • the error is acquired based on reference data.
  • the measurement object is irradiated with measurement light to move the linear motion stage, and the difference between the measurement data obtained at that time and the reference data is taken to remove the error from the measurement data. .
  • the white light interference device of Patent Document 1 has a problem that the measurement needs to be acquired after acquiring the reference data, so that the measurement is troublesome twice. Also, if the measurement environment (disturbance effects: temperature, atmospheric pressure, humidity, etc.) at the time of acquisition of reference data and measurement data changes, the optical path length of the reference light due to linear motion stage, fiber thermal expansion and contraction, etc. Therefore, there is a problem that the error cannot be accurately removed from the measurement data.
  • the present invention has been made in view of such circumstances, and an object thereof is to provide a white interference device that is easy to measure and has high measurement accuracy, and a position and displacement measurement method using the white interference device.
  • a white light source a first optical coupler that divides white light emitted from the white light source into first reference light and first measurement light
  • a second optical coupler that divides white light emitted from the white light source into second reference light and second measurement light
  • a first reference emitted from the first optical coupler via an optical fiber a first optical coupler that divides white light emitted from the white light source into first reference light and first measurement light
  • a first reflecting element that reverses the traveling direction of light and returns it to the first optical coupler, and a traveling direction of the second reference light emitted from the second optical coupler through the optical fiber is reversed, and A second reflecting element to be returned to the second optical coupler, a linear motion stage for reciprocating the first reflecting element and the second reflecting element, and positions of the first reflecting element and the second reflecting element;
  • a reference optical path length scanner unit comprising a scale head for acquiring the first light and the first light
  • a first condenser lens that converges the first measurement light irradiated from the plastic via an optical fiber to irradiate the first measurement object and receives light reflected by the first measurement object.
  • the second measurement light emitted from the second optical coupler through the optical fiber is converged to irradiate the second measurement object and receive the light reflected by the second measurement object.
  • the second condensing lens, the first reference light returned from the reference optical path length scanner unit, and the first measurement light returned from the first condensing lens are caused to interfere with each other, and the interference intensity is determined as an electric signal.
  • a white light interference device includes a first optical coupler that divides white light emitted from a white light source into first reference light and first measurement light, and white light emitted from the white light source.
  • This is a so-called biaxial white interference device including a second reference light and a second optical coupler that divides the light into second measurement light.
  • the reference optical path length scanner unit is characterized in that the first reflective element and the second reflective element are not mounted on independent linear motion stages, but are mounted on one linear motion stage.
  • the straightness, pitching, and yawing of the linear motion stage are provided by mounting the first reflective element and the second reflective element on one linear motion stage of the reference optical path length scanner unit. Since it is only necessary to acquire such an error with only one linear motion stage, the optical axes of the first reflective element and the second reflective element can be easily adjusted. Also, the measurement error is reduced and the variation in measurement results is reduced compared to the case where the first reflective element and the second reflective element are mounted on the linear motion stages having different performances. Accuracy is improved.
  • a white interference device having three or more axes is also included in the scope of the present invention. In this case, the reflective elements after the third reflective element may be mounted on one linear motion stage.
  • the position and displacement of the first measurement object and the position and displacement of the second measurement object are simultaneously obtained using the white light interference device of one aspect of the present invention.
  • a position and displacement measurement method using a white light interference device wherein two or more points can be simultaneously measured by obtaining the difference.
  • the first measurement object in a biaxial form is irradiated onto the first measurement object to measure the position and displacement of the first measurement object, and the second measurement light is used.
  • the position and displacement of the reference target are simultaneously measured by irradiating a reference target (for example, a mirror) that is a second measurement object whose position is known in advance. That is, according to one embodiment of the present invention, the position and displacement of the first measurement object and the position and displacement of the reference target that is the second measurement object are simultaneously acquired, and the difference is obtained.
  • true measurement data can be obtained by removing errors in the measurement environment due to changes in temperature, atmospheric pressure, and humidity, in addition to the operation errors of pitching and yawing of the linear motion stage.
  • the linear motion stage of the reference optical path length scanner unit is adjusted while finely moving the calibration target on the high-accuracy stage using the white light interferometer of one aspect of the present invention.
  • a step of measuring the position of the calibration target and its displacement a plurality of times by moving a plurality of times, and generating first data obtained by extracting pitching and yawing components of the linear motion stage of the reference optical path length scanner unit, and a first measurement Obtaining the position and displacement of the object and the position and displacement of the second measurement object at the same time, obtaining the difference and removing the influence of the disturbance, and creating the second data; And a step of acquiring third data from a reference comparison with the second data.
  • a method for measuring position and displacement by a white light interference device is provided.
  • the linear motion stage of the reference optical path length scanner unit is moved a plurality of times to change the position of the calibration target and its displacement a plurality of times.
  • the first data obtained by measuring and extracting the pitching and yawing components of the linear motion stage of the reference optical path length scanner unit is created.
  • the errors of pitching and yawing of the linear motion stage are averaged by taking a plurality of data and averaging them. This improves the measurement accuracy.
  • the first data is used for data correction as a function of the position of the reference optical path length scanner.
  • Second data is created by removing the error in the measurement environment due to the change in.
  • the third data is obtained by comparing and referring to the first data and the second data. That is, it is possible to obtain true measurement data from which the error in the measurement environment due to changes in temperature, pressure, and humidity, and the averaged pitching and yawing operation errors of the linear motion stage of the reference optical path length scanner unit can be obtained.
  • a white interference device and a position and displacement measurement method using a white interference device that are easy to perform multipoint simultaneous measurement and have high measurement accuracy.
  • Reference diagram showing the basic configuration of the white light interference device Block diagram showing the configuration of the white light interference device of the embodiment (A) is a graph showing the intensity of the interference fringes of the reference target with respect to the position of the reference beam scanning stage, and (B) is the interference fringes of the calibration target on the high-precision stage (piezo stage, etc.) with respect to the position of the reference beam scanning stage.
  • FIG. 1 is a reference diagram showing a basic configuration of a white light interference device 10 for explaining a white light interference device according to an embodiment described later.
  • the white light interference device 10 includes an interferometer unit 12, a reference optical path length scanner unit 14, a sensor unit 16, and a processing device 18, and is a device that measures the position and displacement of a measurement object.
  • the interferometer unit 12 includes a white light source 20, an optical coupler 22, and a photodetector 24.
  • the optical coupler 22, the white light source 20, the reference optical path length scanner unit 14, the sensor unit 16, and the photodetector 24 are connected via an optical fiber 26.
  • the interferometer unit 12 divides the white light 20a from the white light source 20 into reference light and measurement light, and further causes the reference light and measurement light to interfere with each other.
  • the white light source 20 is a device that emits white light 20a, and has a high luminance and low coherence SLD (Super Luminescence Diode), a femtosecond laser whose pulse width is a femtosecond level, and a wavelength. A scanning laser or the like can be used.
  • the white light source 20 has low coherence and is selected from a wavelength range of about 600 nm to 800 nm, for example.
  • the optical coupler 22 is a device that splits light passing through the optical fiber 26.
  • the incident white light 20 a is divided into reference light 22 b and measurement light 22 c, the reference light 22 b is sent to the reference optical path length scanner unit 14, and the measurement light 22 c is sent to the sensor unit 16.
  • the optical coupler 22 may be, for example, a half mirror, a beam splitter, or other means having the same function. That is, the optical coupler 22 has a function of dividing light passing through the optical fiber 26 into two or more paths at a ratio of 1: 1 or other.
  • the photodetector 24 combines the reference light 22b returned from the reference optical path length scanner unit 14 and the measurement light 22c returned from the sensor unit 16 in the optical coupler 22, and supplies the signal to the processing device 18 as an interference signal 26a which is an electrical signal (analog). Output.
  • the optical fiber 26 is a light transmission path and has a function of transmitting and receiving light between devices.
  • the optical fiber 26 is made of quartz glass or plastic having a high transmittance, and propagates light only to the core by making the refractive index of the core higher than that of the outside.
  • the reference optical path length scanner unit 14 has a function of reflecting the reference light 22 b incident from the optical coupler 22 and returning it to the optical coupler 22. In the process of reflecting the reference light 22b incident from the interferometer unit 12 and returning it to the interferometer unit 12, the optical path length of the reference light 22b is changed.
  • the reference optical path length scanner unit 14 includes an optical element 28, a linear motion stage 30, a scale head 32, a linear scale 34, a reflective element 36, a fiber connector 38, and the like, and is connected to the optical fiber 26 and exits from the interferometer unit 12.
  • the reference light 22b is incident from the fiber connector 38.
  • a linear scale 34 indicating the position is disposed, and the linear motion stage 30 is installed so as to be able to reciprocate. By reading the scale on the linear scale 34 with the scale head 32 attached to the linear motion stage 30, the position of the linear motion stage 30 is acquired.
  • the optical element 28 is placed on the linear motion stage 30 so as to face the fiber connector 38 connected to the optical fiber 26, and the housing 40 so that the reflective element 36 faces the optical element 28 adjacent to the fiber connector 38. Fixed to.
  • the optical element 28 is a right-angle prism mirror or CCP (corner cube prism) that can be retroreflected, and makes light incident on surfaces combined at right angles, and reflects light in the incident direction by several reflections.
  • CCP corner cube prism
  • the linear motion stage 30 is a movable body that can slide in the same direction as the traveling direction of the reference light 22b or in the opposite direction. By moving the linear motion stage 30, the optical path length of the reference light 22b can be changed.
  • the movement of the linear motion stage 30 is generated when the processing device 18 generates a movement control signal 26 d based on the interference signal 26 a from the photodetector 24 and the scale signal 26 b from the scale head 32 and outputs it to the linear motion stage 30. Be controlled.
  • the scale head 32 reads position information on the linear scale 34 while moving together with the linear motion stage 30.
  • the linear motion stage 30 moves with rotating bodies, such as a wheel and a roller, you may grasp
  • the position of the linear motion stage 30 acquired by the scale head 32 is output by the scale head 32 as a scale signal 26 b and is subjected to signal processing by the processing device 18.
  • the linear scale 34 is obtained by adding a scale or the like to the movable range of the linear motion stage 30. By acquiring the movement amount of the linear motion stage 30, the optical path length of the reference light 22b can be grasped.
  • the reflection element 36 uses a mirror or the like and changes the traveling direction of light to the opposite direction.
  • the reflection element 36 is a terminal, and the light may be reciprocated a plurality of times from the fiber connector 38 to the reflection element 36 using a plurality of optical elements 28 therebetween.
  • change_quantity of the optical path length of the reference light 22b can be lengthened. That is, measurement is possible even when the distance from the sensor unit 16 to the measurement object 42 is long.
  • the fiber connector 38 is fixed to the casing 44 so as to hold the tip of the optical fiber 26 connected to the interferometer unit 12 and irradiate the optical element 28 of the linear motion stage 30 with the reference light 22b emitted from the optical fiber 26.
  • the optical path length of the reference light 22b reaches from the optical coupler 22 through the fiber connector 38 and the optical element 28 to the reflection element 36. Therefore, the optical path length of the reference light 22b is changed to the linear motion stage. It can be changed by twice the moving amount of 30.
  • the reference light 22 b reflected by the reflecting element 36 returns to the fiber connector 38 that holds the tip of the optical fiber 26 as it is, and returns to the interferometer unit 12 through the optical fiber 26.
  • the sensor unit 16 includes a fiber connector 46, condensing lenses 48 and 50, a lens moving mechanism 52, and the like, and irradiates the measuring light 22c toward the condensing lens 48 via the optical fiber 26 extending from the optical coupler 22. Then, the measurement light 22 c incident from the optical coupler 22 is reflected by the measurement object 42 and returned to the optical coupler 22.
  • the fiber connector 46 holds the end of the measurement light 22c of the optical fiber 26 on the measurement object 42 side.
  • the measurement light 22 c emitted from the optical fiber 26 reaches the condenser lens 48.
  • the condensing lenses 48 and 50 diverge or converge the measurement light 22c using two or more convex lenses or the like, thereby changing the focal length of the measurement light 22c, and the spot of the measurement light 22c with respect to the measurement object 42. Used for optimization of size (irradiation area).
  • the lens moving mechanism 52 is a device that moves the condenser lens 50 to change the focus of the measurement light 22c.
  • Examples of the lens moving mechanism 52 include a hollow voice coil motor, a small stage, and means using a liquid lens.
  • the A / D converter 54 is a device that converts the interference signal 26a, which is an analog signal, into a digital signal.
  • the counter 56 is a device that converts the scale signal 26b acquired from the scale head 32 into a numerical value. The counter value is regarded as equivalent because it has only converted the scale signal 26b into a numerical value.
  • the processing device 18 is a computer device that performs operation control of each member and calculation processing of acquired data as necessary.
  • the lens movement control signal 26c is output to the lens movement mechanism 52 in accordance with the scale signal 26b acquired from the reference optical path length scanner unit 14, and the spot size of the measurement light 22c is optimized.
  • an interference fringe 58 showing the maximum amplitude is determined based on the interference signal 26a from the photodetector 24.
  • the interference fringe 58 showing the maximum amplitude is determined by obtaining the intensity of the interference signal 26a with respect to the movement amount of the linear motion stage 30, that is, the scale signal 26b.
  • the processing device 18 controls the positions of the condenser lenses 50 and 48 of the lens moving mechanism 52 and the position of the linear motion stage 30 based on the interference signal 26a and the scale signal 26b. These position controls are performed synchronously.
  • the measurement method using the white interference method includes the steps of white light irradiation, sensor unit movement / fixation, optical path length scanning of reference light, spot size optimization of measurement light, interference fringe detection step, and displacement amount calculation.
  • white light 20 a is irradiated from the white light source 20, and the white light 20 a is sent to the optical coupler 22 via the optical fiber 26.
  • the optical coupler 22 divides the white light 20 a into reference light 22 b and measurement light 22 c, and sends the reference light 22 b to the reference optical path length scanner unit 14 and the measurement light 22 c to the sensor unit 16.
  • the tip of the sensor unit 16 is fixed toward the measurement object 42.
  • the linear motion stage 30 In the optical path length scanning step of the reference light, the linear motion stage 30 is moved over the entire range or a part of which the linear motion stage 30 is movable.
  • the interference signal 26 a is output from the photodetector 24 to the processing device 18 as the linear motion stage 30 moves.
  • the processing device 18 In the measurement light spot size optimization step, the processing device 18 generates a lens movement control signal 26c in synchronization with the optical path length scanning step of the reference light, drives the lens movement mechanism 52, and moves the condenser lens 50. . Then, the spot size of the measurement light 22c on the measurement object 42 is optimized.
  • the movement of the linear motion stage 30 of the reference optical path length scanner unit 14 and the movement of the condensing lens 50 of the sensor unit 16 are performed. , Work together to optimize the spot size of the measurement position.
  • the processing device 18 determines the position of the linear motion stage 30 showing the maximum amplitude of the interference fringe 58 based on the interference signal 26a.
  • the position of the linear motion stage 30 at that time, that is, the position indicated by the scale signal 26 b is set as the measurement position of the measurement object 42.
  • the amount of displacement of the measurement object 42 is obtained by the calculation unit of the processing device 18. And after calculating
  • the white light interference device 10 it is possible to measure the position of the measurement object with high accuracy on the order of micrometers without contacting the measurement object 42.
  • FIG. 2 is a block diagram illustrating a configuration of the white light interference device 100 according to the embodiment. Note that members that are the same as or similar to the reference white light interference device 10 shown in FIG. 1 are assigned the same reference numerals, and descriptions thereof are omitted. Further, since the measurement principle of the white light interference device 100 is the same as that of the white light interference device 10, the description thereof is also omitted.
  • a white light interference device 100 in FIG. 2 includes a white light source 20, a first optical coupler 106 that divides white light emitted from the white light source 20 into a first reference light 102 and a first measurement light 104, and a white light source.
  • 20 includes a second optical coupler 112 that splits the white light emitted from 20 into the second reference light 108 and the second measurement light 110.
  • the white light interference device 100 also reverses the traveling direction of the first reference light 102 irradiated from the first optical coupler 106 via the optical fiber 114 and the collimator lens 116 and returns the first reference light 102 to the first optical coupler.
  • the second reflection light 118 is reflected from the second optical coupler 112 via the optical fiber 120 and the collimator lens 122, and the second reflection light is reversed and returned to the second optical coupler 112.
  • a linear movement stage 126 that reciprocates the element 124, the first reflecting element 118, and the second reflecting element 124 in the optical axis direction, and a scale head that acquires the positions of the first reflecting element 118 and the second reflecting element 124.
  • a reference beam scanning stage (reference beam path length scanner unit) 130 is provided.
  • the white light interference device 100 converges the first measurement light 104 emitted from the first optical coupler 106 via the optical fiber 132 to converge the calibration target (for example, mirror) 134 that is the first measurement object. And a first condenser lens 136 that receives the light (first measurement light) reflected by the calibration target 134.
  • the white light interference device 100 converges the second measurement light 110 irradiated from the second optical coupler 112 via the optical fiber 138 and irradiates the reference target 140 as the second measurement object.
  • a second condenser lens 142 that receives the light reflected by the reference target 140 (second measurement light) is provided.
  • the white light interference device 100 causes the first reference light 102 returned from the reference light scanning stage 130 to interfere with the first measurement light 104 returned from the first condenser lens 136, and the interference intensity is an electric signal.
  • a first photodetector 144 that outputs as a first interference signal is provided.
  • the white light interference device 100 causes the second reference light 108 returned from the reference light scanning stage 130 to interfere with the second measurement light 110 returned from the second condenser lens 142, and the interference intensity is an electric signal.
  • a second photodetector 146 that outputs the second interference signal is provided.
  • the white light interference device 100 includes a processing device 148 that acquires the first interference signal and the second interference signal and acquires a displacement amount of the measurement object.
  • reference numeral 150 denotes an optical circulator, which has a function of transmitting white light from the white light source 20 only to the first optical coupler 106.
  • Reference numeral 152 denotes an optical circulator, which has a function of transmitting white light from the white light source 20 only to the second optical coupler 112.
  • Reference numeral 154 denotes a high-precision stage that moves the calibration target 134 in the optical axis direction with high accuracy.
  • the white light interference device 100 is irradiated from the white light source 20 and the first optical coupler 106 that divides the white light emitted from the white light source 20 into the first reference light 102 and the first measurement light 104.
  • This is a so-called biaxial white interference device that includes a second optical coupler 112 that splits white light into second reference light 108 and second measurement light 110.
  • the first reflecting element (corresponding to the optical element 28 of the white light interference device 10 in FIG. 1) 118 and the second reflecting element 124 are mounted on independent linear motion stages. Instead, it is mounted on one linear motion stage 126.
  • the biaxial white interference device 100 by mounting the first reflective element 118 and the second reflective element 124 on one linear motion stage 126, the straightness of the linear motion stage 126, pitching, yawing, etc. Since it is only necessary to acquire the above error with only one linear motion stage 126, the optical axes of the first reflecting element 118 and the second reflecting element 124 can be easily adjusted.
  • two-point simultaneous measurement is possible because measurement errors are reduced and variations in measurement results are reduced as compared to a case where the first reflective element 118 and the second reflective element 124 are mounted on linear motion stages having different performances. This improves the measurement accuracy.
  • white light is branched from one white light source 20 and used while measuring and comparing the reference target 140, measurement errors due to temperature dependence of the light source wavelength can also be removed.
  • a white interference device having three or more axes is also included in the scope of the present invention.
  • the reflecting elements after the third reflecting element may be mounted on one linear motion stage 126.
  • the displacement amount of the calibration target 134 and the displacement amount of the reference target 140 are simultaneously obtained, and the difference is obtained by the processing device 148.
  • the first measurement light 104 is irradiated onto the calibration target 134 to measure the position and displacement of the calibration target 134
  • the second measurement light 110 is irradiated onto the reference target 140 to position the reference target 140.
  • the displacement is measured simultaneously, and the difference is obtained.
  • true measurement data can be obtained by removing errors in the measurement environment due to changes in temperature, atmospheric pressure, and humidity, in addition to operation errors in pitching and yawing of the linear motion stage for reference light.
  • the linear movement stage 126 is moved a plurality of times to measure the position and displacement of the calibration target 134 a plurality of times, and the first data obtained by extracting the pitching and yawing components of the linear movement stage 126. Create That is, by taking a plurality of data, the pitching and yawing errors of the linear motion stage 126 are averaged. This improves the measurement accuracy.
  • the amount of displacement of the calibration target 134 and the amount of displacement of the reference target 140 are simultaneously acquired while being finely moved by the high-precision stage 154, and the difference is obtained to determine the influence of disturbance, that is, temperature, pressure, and humidity. Second data from which errors in the measurement environment are removed is created.
  • the third data is acquired from the reference comparison between the first data and the second data. It is possible to obtain true measurement data from which the error in the measurement environment due to changes in temperature, atmospheric pressure, and humidity is eliminated, and the averaged pitching and yawing operation errors of the linear motion stage 126 are obtained.
  • 3A is a graph showing the intensity (interference waveform) of the interference fringes of the reference target 140 with respect to the position of the reference beam scanning stage 130
  • FIG. 3B is for calibration with respect to the position of the reference beam scanning stage. It is the graph which showed the intensity
  • FIG. 4 shows a displacement measurement value (A) measured while finely moving the calibration target 134 by the high-precision stage 154 for a certain period of time, and a displacement measurement value (B) obtained by measuring the fixed reference target 140.
  • the amount of change in the displacement measurement value (B) is due to environmental influences (temperature, pressure, and humidity changes).
  • Both measured values (A) and (B) include time-varying errors such as environmental influences.
  • the error of the measurement value (B) of the reference target 140 is mainly due to the influence of the environment. Since both measurements are performed at the same time, errors such as environmental influences included in the measurement values (A) and (B) are equal. Therefore, the difference between the measured value (A) and the measured value (B) is taken to remove the error of the environmental influence.
  • FIG. 5 is a graph after the error of the environmental influence is removed. That is, this data becomes data for removing an error of the environmental influence from the actually measured value.
  • FIG. 6 shows calibration data obtained by measuring the calibration target 134 a plurality of times and averaging the plurality of measurement data.
  • FIG. 6 includes averaged pitching and yawing operation error data of the linear motion stage 126.
  • FIG. 7 shows the white light interference device 101 that measures the position and displacement of the measurement object 156 using the calibration data shown in FIG.
  • the first measuring beam 104 is irradiated to the measuring object 156, and at the same time, the second measuring beam 110 is irradiated to the fixed reference target 140.
  • FIG. 8 is a block diagram showing a method for calculating the position and displacement of the measurement object 156 by the processing device 148.
  • FIG. 8 first, the difference between the measured value of the measurement object 156 and the measured value of the reference target 140 is taken, and the error of the environmental influence is removed.
  • FIG. 9 is a graph showing the measurement value (C) of the measurement object 156 and the measurement value (D) of the reference target 140.
  • the measured value from which the error of the environmental influence is removed is compared with the calibration data in FIG. That is, the averaged pitching and yawing operation error data (calibration data) of the linear motion stage 126 shown in FIG. 10B is removed from the measured value obtained by removing the environmental influence error shown in FIG. Then, the corrected measurement value shown in FIG. 10C is acquired as true measurement data.
  • a method for calculating back the position and displacement (after compensation) from an arbitrary measurement value a method of linearly interpolating calibration data can be mentioned.
  • First reference light 104 ... First Measurement light, 106 ... first optical coupler, 108 ... second reference light, 110 ... second measurement light, 112 ... second optical coupler, 114 ... optical fiber, 116 ... collimator lens, 1 DESCRIPTION OF SYMBOLS 8 ... 1st reflective element, 120 ... Optical fiber, 122 ... Collimator lens, 124 ... 2nd reflective element, 126 ... Linear motion stage, 128 ... Scale head, 130 ... Reference light scanning stage, 132 ... Optical fiber, 134 ... calibration target, 136 ... first condenser lens, 138 ... optical fiber, 140 ... reference target, 142 ... second condenser lens, 144 ... first photodetector, 146 ... second photodetector 148 ... Processing device, 150, 152 ... Optical circulator, 154 ... High precision stage

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  • General Physics & Mathematics (AREA)
  • Instruments For Measurement Of Length By Optical Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

L'invention concerne un dispositif d'interférence de lumière blanche et un procédé de détection de position et de déplacement au moyen d'un dispositif d'interférence de lumière blanche. Dans le dispositif d'interférence de lumière blanche (101), un premier faisceau de mesure (104) est irradié sur un objet devant être mesuré (156), et en même temps, un deuxième faisceau de mesure (110) est irradié sur une cible de référence fixe (140). Initialement, la différence entre des valeurs mesurées de l'objet devant être mesuré (156) et des valeurs mesurées de la cible de référence (140) est acquise et toute erreur due à des perturbations externes est éliminée. Ensuite, une comparaison est effectuée à l'aide des valeurs mesurées, dans lesquelles toute erreur due à des perturbations externes a été éliminée, et des données d'étalonnage. De manière spécifique, à partir des valeurs mesurées, dans lesquelles toute erreur due à des perturbations externes a été éliminée, les données d'erreur de fonctionnement de la moyenne du tangage et du lacet d'un étage linéaire (126) sont éliminées et de vraies données mesurées sont acquises.
PCT/JP2014/081401 2014-11-27 2014-11-27 Dispositif d'interférence de lumière blanche et procédé de détection de position et de déplacement au moyen d'un dispositif d'interférence de lumière blanche WO2016084195A1 (fr)

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EP4279861A1 (fr) * 2022-05-19 2023-11-22 Unity Semiconductor Procédé et système de caractérisation de structures gravées dans un substrat

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CN108332748A (zh) * 2017-12-18 2018-07-27 中国电子科技集团公司电子科学研究院 一种室内可见光定位方法及装置
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EP4279861A1 (fr) * 2022-05-19 2023-11-22 Unity Semiconductor Procédé et système de caractérisation de structures gravées dans un substrat
WO2023222393A1 (fr) * 2022-05-19 2023-11-23 Unity Semiconductor Procédé et système de caractérisation de structures gravées dans un substrat
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