WO2016068244A1 - 単結晶ダイヤモンド材料、ならびにそれを含む工具、放射温度モニター、および赤外光学部品 - Google Patents
単結晶ダイヤモンド材料、ならびにそれを含む工具、放射温度モニター、および赤外光学部品 Download PDFInfo
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- WO2016068244A1 WO2016068244A1 PCT/JP2015/080571 JP2015080571W WO2016068244A1 WO 2016068244 A1 WO2016068244 A1 WO 2016068244A1 JP 2015080571 W JP2015080571 W JP 2015080571W WO 2016068244 A1 WO2016068244 A1 WO 2016068244A1
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- single crystal
- crystal diamond
- diamond material
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- light
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- 239000010432 diamond Substances 0.000 title claims abstract description 213
- 239000013078 crystal Substances 0.000 title claims abstract description 211
- 229910003460 diamond Inorganic materials 0.000 title claims abstract description 204
- 239000000463 material Substances 0.000 title claims abstract description 164
- 230000003287 optical effect Effects 0.000 title claims abstract description 27
- 230000005855 radiation Effects 0.000 title claims description 18
- 238000002834 transmittance Methods 0.000 claims abstract description 79
- 238000011156 evaluation Methods 0.000 claims abstract description 24
- 239000000615 nonconductor Substances 0.000 claims abstract description 20
- IJGRMHOSHXDMSA-UHFFFAOYSA-N Atomic nitrogen Chemical compound N#N IJGRMHOSHXDMSA-UHFFFAOYSA-N 0.000 claims description 268
- 229910052757 nitrogen Inorganic materials 0.000 claims description 154
- 239000012535 impurity Substances 0.000 claims description 85
- 150000002829 nitrogen Chemical class 0.000 claims description 23
- 229910052782 aluminium Inorganic materials 0.000 claims description 22
- 229910052710 silicon Inorganic materials 0.000 claims description 22
- 229910052796 boron Inorganic materials 0.000 claims description 21
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 claims description 19
- 239000011777 magnesium Substances 0.000 claims description 15
- 229910052698 phosphorus Inorganic materials 0.000 claims description 15
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 14
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 13
- 239000010703 silicon Substances 0.000 claims description 13
- 229910052717 sulfur Inorganic materials 0.000 claims description 13
- 229910052749 magnesium Inorganic materials 0.000 claims description 11
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 9
- NINIDFKCEFEMDL-UHFFFAOYSA-N Sulfur Chemical compound [S] NINIDFKCEFEMDL-UHFFFAOYSA-N 0.000 claims description 9
- 239000011574 phosphorus Substances 0.000 claims description 9
- 239000011593 sulfur Substances 0.000 claims description 9
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 claims description 7
- 239000000758 substrate Substances 0.000 description 51
- VNWKTOKETHGBQD-UHFFFAOYSA-N methane Chemical compound C VNWKTOKETHGBQD-UHFFFAOYSA-N 0.000 description 40
- 238000000034 method Methods 0.000 description 21
- 239000007789 gas Substances 0.000 description 18
- 238000005520 cutting process Methods 0.000 description 17
- 125000004433 nitrogen atom Chemical group N* 0.000 description 17
- 238000009413 insulation Methods 0.000 description 15
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 12
- 230000007547 defect Effects 0.000 description 12
- 238000001004 secondary ion mass spectrometry Methods 0.000 description 12
- 238000005498 polishing Methods 0.000 description 11
- 229910052799 carbon Inorganic materials 0.000 description 9
- 230000005457 Black-body radiation Effects 0.000 description 8
- 239000007787 solid Substances 0.000 description 8
- 238000010521 absorption reaction Methods 0.000 description 7
- 229910001873 dinitrogen Inorganic materials 0.000 description 7
- 238000005468 ion implantation Methods 0.000 description 7
- 238000005268 plasma chemical vapour deposition Methods 0.000 description 7
- 230000001747 exhibiting effect Effects 0.000 description 6
- 239000010936 titanium Substances 0.000 description 6
- RTAQQCXQSZGOHL-UHFFFAOYSA-N Titanium Chemical compound [Ti] RTAQQCXQSZGOHL-UHFFFAOYSA-N 0.000 description 5
- 230000015572 biosynthetic process Effects 0.000 description 5
- 230000005611 electricity Effects 0.000 description 5
- 229910002804 graphite Inorganic materials 0.000 description 5
- 239000010439 graphite Substances 0.000 description 5
- 238000004519 manufacturing process Methods 0.000 description 5
- 238000005259 measurement Methods 0.000 description 5
- 238000000926 separation method Methods 0.000 description 5
- 238000003786 synthesis reaction Methods 0.000 description 5
- 229910052719 titanium Inorganic materials 0.000 description 5
- 239000012808 vapor phase Substances 0.000 description 5
- 230000005540 biological transmission Effects 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000012544 monitoring process Methods 0.000 description 4
- 230000000704 physical effect Effects 0.000 description 4
- 238000012360 testing method Methods 0.000 description 4
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 description 3
- 238000004458 analytical method Methods 0.000 description 3
- 125000004429 atom Chemical group 0.000 description 3
- 230000000903 blocking effect Effects 0.000 description 3
- 238000005229 chemical vapour deposition Methods 0.000 description 3
- 230000000052 comparative effect Effects 0.000 description 3
- 238000006467 substitution reaction Methods 0.000 description 3
- 230000003746 surface roughness Effects 0.000 description 3
- 238000004435 EPR spectroscopy Methods 0.000 description 2
- GQPLMRYTRLFLPF-UHFFFAOYSA-N Nitrous Oxide Chemical compound [O-][N+]#N GQPLMRYTRLFLPF-UHFFFAOYSA-N 0.000 description 2
- 238000009529 body temperature measurement Methods 0.000 description 2
- 125000004432 carbon atom Chemical group C* 0.000 description 2
- 238000009826 distribution Methods 0.000 description 2
- 239000011521 glass Substances 0.000 description 2
- 239000012212 insulator Substances 0.000 description 2
- 230000031700 light absorption Effects 0.000 description 2
- 230000010355 oscillation Effects 0.000 description 2
- 238000002360 preparation method Methods 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 1
- QGZKDVFQNNGYKY-UHFFFAOYSA-N Ammonia Chemical compound N QGZKDVFQNNGYKY-UHFFFAOYSA-N 0.000 description 1
- -1 C Mg Inorganic materials 0.000 description 1
- 241001465754 Metazoa Species 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
- QVGXLLKOCUKJST-UHFFFAOYSA-N atomic oxygen Chemical compound [O] QVGXLLKOCUKJST-UHFFFAOYSA-N 0.000 description 1
- 238000005219 brazing Methods 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 238000000151 deposition Methods 0.000 description 1
- 239000000428 dust Substances 0.000 description 1
- 238000010891 electric arc Methods 0.000 description 1
- 230000005684 electric field Effects 0.000 description 1
- 238000010292 electrical insulation Methods 0.000 description 1
- 239000012777 electrically insulating material Substances 0.000 description 1
- 230000017525 heat dissipation Effects 0.000 description 1
- 238000004050 hot filament vapor deposition Methods 0.000 description 1
- 239000011261 inert gas Substances 0.000 description 1
- 239000004922 lacquer Substances 0.000 description 1
- 229910052751 metal Inorganic materials 0.000 description 1
- 239000002184 metal Substances 0.000 description 1
- 238000003801 milling Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- QJGQUHMNIGDVPM-UHFFFAOYSA-N nitrogen group Chemical group [N] QJGQUHMNIGDVPM-UHFFFAOYSA-N 0.000 description 1
- 235000013842 nitrous oxide Nutrition 0.000 description 1
- 230000000422 nocturnal effect Effects 0.000 description 1
- 229910052760 oxygen Inorganic materials 0.000 description 1
- 239000001301 oxygen Substances 0.000 description 1
- 239000012071 phase Substances 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 1
- 239000004071 soot Substances 0.000 description 1
- 238000001308 synthesis method Methods 0.000 description 1
- 238000007740 vapor deposition Methods 0.000 description 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 1
- 238000005491 wire drawing Methods 0.000 description 1
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/04—Diamond
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01B—NON-METALLIC ELEMENTS; COMPOUNDS THEREOF; METALLOIDS OR COMPOUNDS THEREOF NOT COVERED BY SUBCLASS C01C
- C01B32/00—Carbon; Compounds thereof
- C01B32/25—Diamond
- C01B32/26—Preparation
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/22—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
- C23C16/26—Deposition of carbon only
- C23C16/27—Diamond only
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B25/00—Single-crystal growth by chemical reaction of reactive gases, e.g. chemical vapour-deposition growth
- C30B25/02—Epitaxial-layer growth
- C30B25/18—Epitaxial-layer growth characterised by the substrate
- C30B25/20—Epitaxial-layer growth characterised by the substrate the substrate being of the same materials as the epitaxial layer
- C30B25/205—Epitaxial-layer growth characterised by the substrate the substrate being of the same materials as the epitaxial layer the substrate being of insulating material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K11/00—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00
- G01K11/12—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance
- G01K11/18—Measuring temperature based upon physical or chemical changes not covered by groups G01K3/00, G01K5/00, G01K7/00 or G01K9/00 using changes in colour, translucency or reflectance of materials which change translucency
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B5/00—Optical elements other than lenses
- G02B5/20—Filters
- G02B5/208—Filters for use with infrared or ultraviolet radiation, e.g. for separating visible light from infrared and/or ultraviolet radiation
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/40—Electric properties
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/60—Optical properties, e.g. expressed in CIELAB-values
-
- C—CHEMISTRY; METALLURGY
- C01—INORGANIC CHEMISTRY
- C01P—INDEXING SCHEME RELATING TO STRUCTURAL AND PHYSICAL ASPECTS OF SOLID INORGANIC COMPOUNDS
- C01P2006/00—Physical properties of inorganic compounds
- C01P2006/80—Compositional purity
Definitions
- the present invention relates to a black body applied material, a heat radiation temperature monitor material, a window material, an infrared optical component material, a single crystal diamond material suitably used as a heat dissipation substrate (heat sink) or a tool chip, and the single crystal diamond material. Including tools, radiation temperature monitors, and infrared optics.
- a material that is transparent to light in the visible region such as a diamond material, is generally used, and the light in the visible region is not completely blocked. If there is a material that blocks light in the visible region and transmits light in the infrared region, it can be used as a reference for temperature measurement of a heated object in vacuum as a visible region temperature monitor chip for ideal blackbody radiation. If it is insulative, it can also be used on an electrically heated body. Moreover, it can be used as a window for monitoring the inside with infrared light while the inside is dark. It is used for windows for observation of nocturnal animals. Also, temperature measurement is possible when monitoring the tool tip temperature.
- Non-Patent Document 1 Takashi Tsukino, Nobuaki Ota, Yoshiaki Kumazawa, Ninth Diamond Symposium Abstracts p61
- Patent Document 2 Robert Linares, Patrick Doering, Diamond and Related Materials 8 (1999) p909
- Patent Document 1 Japanese Tsukino, Nobuaki Ota, Yoshiaki Kumazawa, Ninth Diamond Symposium Abstracts p61
- Patent Document 2 Robert Linares, Patrick Doering, Diamond and Related Materials 8 (1999) p909
- JP-A-2005-512929 Patent Document 1
- Patent Document 1 JP-T-2005-512929
- nitrogen added as an impurity to diamond is related to vacancy defects, and absorption occurs in the wavelength range from 500 nm to 640 nm. It has been. It is known that diamonds become transparent yellow or transparent red due to such absorption.
- boron As a method for absorbing light in the entire visible light region, the following methods are conceivable.
- a graphite component can be included by forming polycrystalline and poor quality diamond. This can absorb and block light in the visible light region. Since diamond contains a lot of graphite components, its electrical resistance is high for direct current, but its electrical resistance is low for alternating current, and it absorbs and blocks light in the infrared region. . Further, a method of absorbing and blocking light in the visible light region by ion implantation has the same result because a graphite component (SP2 component) layer is formed in the ion implantation layer.
- the single-crystal diamond material according to an embodiment of the present invention has a light transmittance of 410% or more and a wavelength of 750 nm or less of 15% or less at any wavelength, and an electrical insulator based on optical evaluation and electrical evaluation. It is at least one of electrical insulators.
- a tool according to another aspect of the present invention includes the single crystal diamond material according to the above aspect.
- a radiation temperature monitor according to still another aspect of the present invention includes the single crystal diamond material according to the above aspect.
- An infrared optical component according to still another aspect of the present invention includes the single crystal diamond material according to the above aspect.
- a diamond having a low light transmittance in the entire visible light region and exhibiting a black color a tool including the single crystal diamond material, a radiation temperature monitor, and an infrared optical component.
- the single crystal diamond material according to an embodiment of the present invention has a light transmittance of 410% or more and a wavelength of 750 nm or less of 15% or less at any wavelength, and an electrical insulator and an electrical evaluation by optical evaluation. And / or an electrical insulator.
- the light transmittance is substantially flat as specified in any single crystal diamond material regardless of the wavelength of the light (specified in JIS B0601: 2013).
- both parallel planes with a parallelism of 0.1 ° or less
- the arithmetic average roughness Ra of the surface is 2 nm or less (substantially perpendicular to one principal plane (from the vertical direction)
- Transmittance of light entering and exiting from the other main surface with a deviation angle of 0.1 ° or less
- the electrical insulator by optical evaluation refers to an optically evaluated electrical insulator (an object that does not conduct electricity substantially), and the optical evaluation preferably transmits light having a wavelength of 10.6 ⁇ m. An object whose rate is 1% or more.
- the electrical insulator by electrical evaluation refers to an electrical insulator (an object that does not conduct electricity substantially) that has been electrically evaluated.
- the electrical evaluation preferably has an average resistivity of 1 ⁇ 10. It is an object of 6 ⁇ cm or more.
- the single crystal diamond material of the present embodiment is an electrical insulator as a whole within a range that is substantially used for the purpose of use, and does not include a conductive layer on the surface or a part of the inside. Means.
- the single crystal diamond material of the present embodiment is black because the transmittance of light with a wavelength of 410 nm or more and 750 nm or less is 15% or less at any wavelength and is an optically or electrically insulating material. Has color and insulation.
- the optical evaluation can set the transmittance of light having a wavelength of 10.6 ⁇ m to 1% or more.
- a single crystal diamond material further has a light transmittance of 10.6 ⁇ m in wavelength of 1% or more, and thus has a black color tone and infrared light transmittance, that is, optical insulation.
- the electrical evaluation can be made such that the average resistivity is 1 ⁇ 10 6 ⁇ cm or more.
- the average resistivity of the single crystal diamond material of the present embodiment is that when a current is passed at 25 ° C. under a voltage of 50 V using a titanium vapor-deposited electrode, the voltage, the current, the area of the titanium vapor-deposited electrode, The average resistivity calculated from the distance between the main surfaces.
- Such a single crystal diamond material has a black color tone and electrical insulation.
- the transmittance of light having a wavelength of 410 nm or more and 750 nm or less can be 3% or less at any wavelength.
- this single crystal diamond has a jet black color tone and insulation.
- the total nitrogen concentration can be 8 times or more of the isolated substitutional nitrogen concentration.
- the total nitrogen concentration is measured by secondary ion mass spectrometry (SIMS), and the isolated substitutional nitrogen concentration is measured by electron spin resonance analysis (ESR).
- SIMS secondary ion mass spectrometry
- ESR electron spin resonance analysis
- the total nitrogen concentration can be 1 ppm or more. Thereby, such a single crystal diamond has a black color tone and insulation.
- the non-substituted nitrogen concentration obtained by subtracting the isolated substituted nitrogen concentration from the total nitrogen concentration can be 0.875 ppm or more.
- the non-substituted nitrogen concentration is a value obtained by subtracting the isolated substituted nitrogen measured by ESR from the total nitrogen concentration measured by SIMS.
- the vacancy concentration can be made higher than 0.1 times the non-substituted nitrogen concentration.
- the vacancy concentration can be higher than at least one of the isolated substitutional nitrogen concentration, the non-substitutional nitrogen concentration, the total nitrogen concentration, and 1 ppm.
- the vacancy concentration is obtained by a positron annihilation method quantified and calibrated by an ion implantation method.
- the concentration of vacancies combined with impurities measured by ESR is supplementarily used.
- the total impurity element concentration of at least one impurity element selected from the group consisting of magnesium, aluminum, silicon, phosphorus, and sulfur can be 50 ppb or more.
- the total impurity element concentration is measured by SIMS.
- the total impurity element concentration of at least one impurity element selected from the group consisting of magnesium, aluminum, silicon, phosphorus and sulfur is the total substitutional impurity element concentration of the above impurity elements. It can be 8 times or more.
- the total impurity element concentration is measured by SIMS, and the total substitutional impurity element concentration is measured by ESR.
- the total boron concentration can be made equal to or less than the total nitrogen concentration.
- the total boron concentration and the total nitrogen concentration are measured by SIMS.
- Such single crystal diamond can contain a large amount of nitrogen without being imparted with conductivity, and has a black color tone and insulation.
- a tool according to another embodiment of the present invention includes the single crystal diamond material of the above embodiment. For this reason, the tool of this embodiment can be made into a tool with few cracks at the time of tool manufacture and use.
- a radiation temperature monitor according to still another embodiment of the present invention includes the single crystal diamond material of the above embodiment. For this reason, the radiation temperature monitor of this embodiment is closer to black body radiation and can evaluate the true temperature.
- An infrared optical component according to still another embodiment of the present invention includes the single crystal diamond material of the above embodiment. For this reason, the infrared optical component of this embodiment has very little leakage of visible light, and can sufficiently detect infrared light.
- the transmittance of light having a wavelength of 410 nm or more and 750 nm or less is 15% or less at any wavelength, preferably 10% or less, and more preferably 8% or less.
- the single crystal diamond material of the present embodiment is at least one of an electrical insulator by optical evaluation and an electrical insulator by electrical evaluation.
- the single crystal diamond of the present embodiment has a light transmittance of 410% or more and a wavelength of 750 nm or less at 15% or less at any wavelength, and is an electrical insulator in at least one of optical evaluation and electrical evaluation. Therefore, it has a black color tone and insulation.
- the light transmittance of the single crystal diamond material of the present embodiment is important because the light path is important, and the light path is specified and defined as follows. That is, regardless of the wavelength of the light, it is substantially flat (arbitrary average roughness Ra of the surface specified in JIS B0601: 2013) specified arbitrarily in the single crystal diamond material and parallel ( When both principal planes (with a parallelism of 0.1 ° or less) are defined as both principal surfaces, they are incident on one principal surface substantially perpendicularly (with a deviation angle of 0.1 ° or less from the vertical direction) and the other Transmittance of light emitted from the main surface, in other words, when both main surfaces having an arithmetic average roughness Ra of 2 nm or less and a parallelism of 0.1 ° or less are formed by processing, It refers to the transmittance of light incident on the principal surface with a deviation angle of 0.1 ° or less from the vertical direction and emitted from the other principal surface.
- the electrical insulator by optical evaluation refers to an optically evaluated electrical insulator (an object that does not conduct electricity substantially), and the transmittance in the infrared wavelength region of 10.6 ⁇ m is zero. This is preferably an object having a transmittance of light of 10.6 ⁇ m in wavelength of 1% or more.
- the electrical insulator by electrical evaluation means an electrical insulator (an object that does not conduct electricity substantially) evaluated electrically, and can be indicated by an average resistivity not being zero, preferably An object having an average resistivity of 1 ⁇ 10 6 ⁇ cm or more.
- the average resistivity of the single crystal diamond material of the present embodiment is that when a current is passed at 25 ° C. under a voltage of 50 V using a titanium vapor-deposited electrode, the voltage, the current, the area of the titanium vapor-deposited electrode, The average resistivity calculated from the distance between the main surfaces.
- the single crystal diamond material of the present embodiment has a low light transmittance in the visible region of 410 nm or more and 750 nm or less, and is an insulator in at least one of optical and electrical. It can be ideal black body radiation and can heat the object to be insulated. In addition, it is not just a black object such as soot, it is not metallic, but it has a sense of depth and a three-dimensional appearance.
- the single crystal diamond material of the present embodiment is not a black body due to the SP2 bond of carbon, but is a pure diamond formed by the SP3 bond of carbon, and is easily cracked or chipped even at high temperatures. There is no.
- the transmittance of light with a wavelength of 530 nm which is highly visible to humans, is 20% or less, it becomes a diamond whose color tone is black (hereinafter also referred to as a black diamond), but it is insufficient in terms of blocking light.
- a diamond having a dark color tone hereinafter referred to as a black diamond.
- the black color tone is improved when the light transmittance is 1/2 or less, preferably 1/3 or less, more preferably about 1/4 or less of the reflectance. And is sufficiently blocked by light absorption.
- both main surfaces are flat (the arithmetic average roughness Ra of the surface is 2 nm or less) and parallel (parallelism is 0.1 ° or less) What has a shape should just make light incident on one main surface substantially perpendicularly (the deviation angle from a perpendicular direction is 0.1 degrees or less).
- the shortest distance is What is necessary is to produce a flat parallel surface as described above and to make light incident perpendicularly to one flat parallel surface.
- reflection and scattering are measured with an integrating sphere-type reflection / scattering measurement device. Then, while maintaining the same optical incidence, the transmittance can be measured by measuring the amount of light absorbed by the laser calorimeter by increasing the temperature and subtracting the reflected light and the absorbed light from the incident light. Further, in order to prevent a unique value depending on the shape of the single crystal diamond material, the incident direction can be changed randomly, and the average value of the values measured five times can be used as the transmittance.
- the transmittance of light having a wavelength of 410 nm or more and 750 nm or less can be measured by scanning the wavelength between 410 nm and 750 nm using a spectrophotometer. In the case of measuring with laser light, it is sufficient that the opposing flat and parallel surfaces have an area corresponding to at least a diameter of 3 mm.
- the light transmittance T is a percentage of the intensity I 1 of the transmitted light with respect to the intensity I 0 of the incident light.
- T (%) I 1 / I 0 ⁇ 100 (1) Defined by
- the transmittance defined by the above formula (1) takes into account multiple reflections on the principal surface parallel to the reflectance (parallelism is 0.1% or less), and air and single crystal diamond.
- ⁇ is an absorption coefficient (unit: cm ⁇ 1 )
- D is a distance between parallel main surfaces (unit: cm ⁇ 1 ).
- n 1 is the refractive index of the single crystal diamond material
- n 0 is the refractive index of the air.
- R 1 (n 0 ⁇ n 1 ) 2 / (n 0 + n 1 ) 2
- T 1 4n 0 n 1 / (n 0 + n 1 ) 2 (4)
- Formula (3) and Formula (4) are represented by Formula (3) and Formula (4).
- the average resistivity is 1 ⁇ 10 6 ⁇ cm or more, preferably 1 ⁇ 10 9 ⁇ cm or more, and more preferably 1 ⁇ 10 12 ⁇ cm or more from the viewpoint of ensuring insulation.
- the single crystal diamond material preferably has a higher average resistivity because it is less likely to reflect minute light.
- the transmittance of light having a wavelength of 410 nm or more and 750 nm or less is preferably 3% or less, and 1.5% or less at any wavelength. More preferred is 1% or less.
- a diamond with a jet black tone hereinafter referred to as black lacquer
- jet black diamond Since the reflectance of diamond is usually about 30%, a jet black color tone is obtained when the light transmittance is 1/10 or less, 1/20 or less, and further 1/30 or less of the reflectance. The blockage by absorption becomes more sufficient.
- the light is incident on one main surface substantially perpendicularly and emitted from the other main surface 10.
- the transmittance of light having a wavelength of .6 ⁇ m is 1% or more is an index indicating an insulator.
- the transmittance at a wavelength of 10.6 ⁇ m is preferably 10% or more, preferably 40% or more, and more preferably 50% or more in order to obtain the function as the window.
- the transmittance of light having a wavelength of 1 to 2 ⁇ m is preferably 10% or more, more preferably 40% or more, and further preferably 50% or more.
- the method for measuring the transmittance of infrared light is the same as the method for measuring the transmittance of light in the visible region.
- Far-infrared light having a wavelength of 10.6 ⁇ m is an index of infrared light from the viewpoint that it is often used by a CO 2 laser having an oscillation wavelength of 10.6 ⁇ m.
- Near-infrared light having a wavelength of 1 to 2 ⁇ m can use the second and third harmonics of a YAG laser having an oscillation wavelength of 1.06 ⁇ m and a quantum cascade laser having a wavelength of 4 to 6 ⁇ m.
- the total nitrogen concentration is 8 times or more, preferably 10 times or more of the isolated substitutional nitrogen concentration, from the viewpoint of having a black color tone, insulation and infrared light transmission.
- it is 20 times or more, More preferably, it is 50 times or more, More preferably, it can be 100 times or more.
- the total nitrogen concentration is measured by SIMS (secondary ion mass spectrometry), and the isolated substitutional nitrogen concentration is measured by ESR (electron spin resonance analysis).
- a black diamond such as the single crystal diamond material of this embodiment, preferably jet black diamond
- it is necessary to contain a large amount of impurities in the diamond but if the diamond is excessively doped with a large amount of impurities, The crystal lattice is broken, and at least a part becomes SP2 bond and graphitizes. Therefore, it is necessary to devise a balance so that the diamond crystal lattice is relaxed but not broken while a large amount of impurities is contained in the diamond. Therefore, it is important to first contain nitrogen.
- the non-substituted nitrogen atom refers to a nitrogen atom that is not isolatedly substituted at a diamond lattice position composed of carbon atoms, and is an isolated substituted nitrogen atom that is measured by ESR from all nitrogen atoms that are measured by SIMS.
- N all and the vacancy concentration V are: 8 ⁇ N S ⁇ N all , 7 ⁇ N S ⁇ N N , N N ⁇ N all , 0.875 ppm ⁇ N N , and / or 1 ppm ⁇ N all are preferable, 10 ⁇ N S ⁇ N all , 9 ⁇ N S ⁇ N N , N N ⁇ N all , 4.50 ppm ⁇ N N , and / or 5 ppm ⁇ N all are more preferable, and 13 ⁇ N S ⁇ N all , 12 ⁇ N S ⁇ N N , N N ⁇ N all , 7.38 ppm ⁇ N N , and / or 8 ppm ⁇ N all are more preferable, 20 ⁇ N S ⁇ N all ,
- the vacancy concentration V is preferably V ⁇ 1000 ⁇ N all and more preferably V ⁇ 100 ⁇ N all . This is because when V> 1000 ⁇ N all , only the vacancies increase and the crystals become brittle. More preferably N S ⁇ V, preferably 10 ⁇ N S ⁇ V. This is because when N S ⁇ V, the single crystal diamond material has no room for the entire crystal, most of the unsubstituted nitrogen atoms and isolated substituted atoms are cramped, and the crystal is very easily lost. Further, 0.1 ⁇ N N ⁇ V is preferable, and N N ⁇ V is more preferable.
- N S ⁇ V ⁇ N N in the single crystal diamond material, a part of the non-substituted nitrogen atom and the isolated substituted atom becomes cramped, and the crystal easily lacks. Furthermore, 0.1 ⁇ N all ⁇ V is preferable, and N all ⁇ V is more preferable. This is because in N N ⁇ V ⁇ N all , in the single crystal diamond material, only a part of the non-substituted nitrogen atom and the isolated substituted nitrogen atom becomes cramped, and the crystal may be easily lost. Alternatively, V> 1 ppm is preferable, and V> 5 ppm is more preferable.
- the vacancy concentration is determined by the positron annihilation method quantified and calibrated by the ion implantation method.
- the lower limit vacancy concentration is estimated by supplementally using the vacancy concentration combined with impurities by the ESR method.
- vacancies do not greatly distort the crystal lattice of diamond, they may exist alone. In this way, a large amount of nitrogen other than the isolated single substitution type can be contained in diamond by introducing defects on the growth surface of the single crystal diamond material under a high methane concentration condition. Defects include crystal defects such as dislocations, but also include surface irregularities and polishing damage.
- Nitrogen is introduced into the single crystal diamond by introducing nitrogen gas (N 2 ) into the synthesis atmosphere.
- the gas is not limited to nitrogen gas, but may be nitrogen-containing gas such as ammonia gas (NH 3 ) or laughing gas (N 2 O).
- the non-substituted nitrogen concentration is preferably 0.875 ppm or more from the viewpoint of having a dark color tone, preferably jet black color tone, insulation and infrared light transmission. 4.50 ppm or more, more preferably 7.38 ppm or more, further preferably 9.50 ppm or more, further preferably 19.6 ppm or more, and 29.7 ppm or more. It is particularly preferred. Both the vacancies and the non-substituted nitrogen are effective in the present invention, so it is preferable that the vacancy and the non-substituted nitrogen are in a certain amount or more, and both contribute to the effect of maintaining the lattice and the reduction in the visible region light transmittance. Even if vacancies are formed by irradiation, carbon atoms are always ejected from the lattice positions, and only the SP2 bonds increase, so the single crystal diamond material of this embodiment cannot be obtained.
- the total nitrogen concentration is 8 times or more of the isolated substitutional nitrogen concentration.
- the nitrogen concentration is preferably 1 ppm or more.
- the total nitrogen concentration is more preferably 5 ppm or more, and the total nitrogen concentration is 13 times the isolated substitutional nitrogen concentration.
- the total nitrogen concentration is more preferably 8 ppm or more, and when the total nitrogen concentration is 20 times or more of the isolated substitutional nitrogen concentration, the total nitrogen concentration is more preferably 10 ppm or more, and the total nitrogen concentration is the isolated substitutional type.
- the nitrogen concentration is 50 times or more, the total nitrogen concentration is more preferably 20 ppm or more, and when the total nitrogen concentration is 100 times or more of the isolated substitutional nitrogen concentration, It is particularly preferred oxygen concentration is 30ppm or more.
- the single crystal diamond material of this embodiment a large amount of nitrogen can be contained, and magnesium (Mg), aluminum (Al), silicon from the viewpoint of having a black color tone, insulating properties, and infrared light transmittance.
- the total impurity concentration of at least one impurity element selected from the group consisting of (Si), phosphorus (P) and sulfur (S) is preferably 50 ppb or more, more preferably 1 ppm or more, and 5 ppm or more. More preferably, it is more preferably 10 ppm or more.
- the total impurity concentration of the impurity elements is measured by SIMS.
- the concentrations of Si, P, Al, Mg, and S are C Si , C P , C Al , C Mg, and C S , respectively
- the sum of the total nitrogen concentration N all and the total impurity element concentration of the impurity elements is 1 ppm ⁇ (N all + C Si + C P + C Al + C Mg + C S ) ⁇ 1000 ppm is preferable, and 1 ppm ⁇ (N all + C Si + C P + C Al + C Mg + C S ) ⁇ 100 ppm is more preferable.
- the single crystal diamond material of the present embodiment has the same effect as long as the total impurity element concentration is within the above range even if it does not contain nitrogen atoms. That is, the single-crystal diamond material of the present embodiment has (Mg), aluminum (Al), silicon (Si), phosphorus (P), and black from the viewpoint of having a black color tone, insulation and infrared light transmission.
- the total impurity element concentration of at least one impurity element selected from the group consisting of sulfur (S) is preferably 50 ppb or more, more preferably 1 ppm or more, further preferably 5 ppm or more, and 10 ppm or more. More preferably.
- concentrations of Si, P, Al, Mg and S are C Si , C P , C Al , C Mg and C S , respectively, 1 ppm ⁇ (N all + C Si + C P + C Al + C Mg + C S ) ⁇ 1000 ppm 1 ppm ⁇ (N all + C Si + C P + C Al + C Mg + C S ) ⁇ 100 ppm is more preferable.
- the impurity elements other than nitrogen that is, at least one impurity element selected from the group consisting of (Mg), aluminum (Al), silicon (Si), phosphorus (P), and sulfur (S) are also used.
- the total impurity element concentration is preferably 8 times or more of the total substitutional impurity element concentration, more preferably 10 times or more, still more preferably 20 times or more, and more preferably 50 times or more. Particularly preferred.
- the total impurity concentration of the impurity element is measured by SIMS, and the total substitutional impurity element concentration of the impurity element is measured by ESR.
- the point is to include surface defects and crystal defects.
- an element having an atomic radius larger than that of carbon is easy to introduce crystal defects.
- These impurities can be supplied in the state of a gas such as SH 4 , PH 3 , and Al (CH 3 ) 3, but a solid source such as Si, P 2 O 5 (or InP), and Al is placed near the substrate. Easy to keep. If it is at a short distance within 10 cm from the substrate, it can be sufficiently introduced into the single crystal diamond.
- a solid source such as heavy P-doped Si or AlP can also be used.
- Another method for incorporating a large amount of nitrogen into single-crystal diamond is a method of incorporating boron (B) together with nitrogen (N) as impurities other than nitrogen (N). Since boron has the same atomic radius as carbon, it is easy to enter the lattice position. Moreover, it is contained in a large amount when it is added simultaneously with nitrogen. Here, if the boron concentration C B and the nitrogen concentration C N are added under the condition of C B > C N , conductivity is imparted, so it is necessary to satisfy the condition of C B ⁇ C N.
- Boron can be introduced using B 2 H 6 , (CH 3 ) 3 B or B (OCH 3 ) 3 as a source. In the case of introducing it in combination with other impurities, a solid source such as BP or heavy B-doped Si can be used.
- the total is measured by at least one secondary ion mass spectrometry selected from the group consisting of the above impurity elements (ie, magnesium, aluminum, silicon, phosphorus and sulfur).
- the impurity element concentration is preferably 50 ppb or more, more preferably 1 ppm or more, further preferably 5 ppm or more, and particularly preferably 10 ppm or more.
- the single crystal diamond material of the present embodiment a large amount of impurities are mixed in the single crystal, and “black diamond” or “black diamond” is produced.
- the long-range order in the single crystal is reduced or lost, and a thick crystal cannot be formed. That is, even if the short-range order in the single crystal is reduced or lost, only local defects are generated and the single crystal can be repaired as a whole, but crystal defects (vacancies, interstitial impurities, etc.) are enlarged. And if it increases, the long-range order in the single crystal is reduced or lost, so that it becomes amorphous, polycrystallized, or crystal breakage occurs. Impurities are contained even if it is impossible in amorphous.
- Polycrystals tend to contain impurities at grain boundaries.
- a method of mixing a large amount of impurities while maintaining crystallinity can be achieved by mixing in a substitution type.
- the transmittance cannot be reduced over the entire visible region, or electrical conduction occurs.
- impurities are mixed well, electric conduction is not generated, and black body radiation and infrared window characteristics are obtained. I came to get.
- the single crystal diamond material of the present embodiment is advantageous in that it is thin as a plate material when used as an infrared optical component material such as an infrared window or a radiation temperature monitor material such as a black body for radiation temperature monitoring.
- the thickness is preferably 5 mm or less, more preferably 3 mm or less, further preferably 2 mm or less, and particularly preferably 1.2 mm or less. This is not the case for applications that use colors that do not need to be concerned about thickness.
- a single crystal diamond seed substrate is prepared as a seed substrate of a single crystal diamond material.
- plate-shaped materials such as natural single crystal diamond, high-pressure synthetic single crystal diamond, and vapor-phase synthetic single crystal diamond are prepared.
- 6 mm square or 8 mm square high pressure synthetic single crystal diamond seed substrates can be prepared.
- a mosaic single crystal diamond seed substrate in which a plurality of single crystals are connected can be prepared. The size can be 16 mm square or more.
- the mosaic is also referred to as a single crystal because the individual single crystals are aligned within a plane orientation of 0.5 ° or less, and are considered single crystals in a broad sense. .
- the seed substrate is mechanically polished flat.
- the density of crystal defects such as dislocations in the seed substrate is preferably 1000 / mm 2 or more.
- a special substrate formed by high-load polishing
- having a surface arithmetic average roughness Ra (referred to as arithmetic average roughness Ra specified in JIS B0601: 2013, hereinafter the same) of 5 nm to 100 nm.
- high load polishing means, for example, polishing with a high load 1.5 times or more of normal polishing conditions, and not only the surface is roughened, but also damage to crystals near the surface of the diamond is increased. This makes it easier to introduce non-substitutional impurities and vacancies than usual.
- a seed substrate having a surface arithmetic average roughness Ra specified in JIS B0601: 2013 of 10 nm to 30 nm is prepared.
- a substrate (step substrate) on which a growth step is formed by inserting one groove per 100 ⁇ m can be prepared.
- the step substrate one having an off angle of preferably 1 ° to 15 °, more preferably 3 ° to 10 °, and further preferably 5 ° to 8 ° is used.
- the normal surface of the seed substrate for epitaxially growing a normal single crystal diamond material other than the present invention should have an arithmetic average roughness Ra of less than 3 nm.
- the present invention is a seed having the above normal surface. It is important to use a seed substrate having a surface suitable for the present invention by controlling defects and surface conditions without using a substrate.
- a single crystal diamond material is epitaxially grown on the seed substrate by a CVD (chemical vapor deposition) method.
- CVD chemical vapor deposition
- a hot filament CVD method a microwave plasma CVD method, a direct current plasma CVD method, a direct current arc discharge plasma CVD method, or the like can be used.
- the microwave plasma CVD method and the direct current plasma CVD method are preferable because impurities can be easily controlled.
- a single crystal diamond material is epitaxially grown by generating plasma by applying a microwave of 45 GHz ( ⁇ 50 MHz) or 915 MHz ( ⁇ 50 MHz) with a power of 100 W to 60 kW and depositing active species on the seed substrate. be able to.
- the furnace pressure is preferably 4 kPa or more and 53.2 kPa or less, more preferably 8 kPa or more and 40 kPa or less, and further preferably 10 kPa or more and 20 kPa or less. If the pressure in the furnace is less than 4 kPa, it takes time to grow, or the polycrystal tends to grow. On the other hand, when the pressure in the furnace exceeds 53.2 kPa, the discharge becomes unstable or concentrates in one place during the growth, making it difficult to grow for a long time.
- the temperature of the seed substrate is preferably 800 ° C. or higher and 1300 ° C. or lower, and more preferably 900 ° C. or higher and 1100 ° C. or lower. If the substrate temperature is less than 800 ° C., it takes time to grow. On the other hand, when the temperature of the substrate exceeds 1300 ° C., graphite tends to grow.
- the ratio of the methane gas concentration to the hydrogen gas concentration is preferably 7% to 30%, and the ratio of the nitrogen gas concentration to the methane gas concentration is preferably 0.1% to 10%.
- This also has the effect of using a special seed substrate (rough surface seed substrate formed by high load polishing) having a surface arithmetic average roughness Ra of 5 nm to 100 nm, and the total number of nitrogen atoms in the single crystal diamond.
- a single crystal diamond material in which the ratio of the number of isolated substitutional nitrogen atoms in the single crystal diamond is 0.1% or more and 20% or less can be obtained.
- a single crystal diamond in which the concentration of all nitrogen atoms in the single crystal diamond material is 0.5 ppm to 100 ppm and the concentration of isolated substitutional nitrogen atoms is 30 ppb to 5 ppm can be obtained.
- the ratio of the methane gas concentration to the hydrogen gas concentration is more preferably 10% or more and 25% or less, and further preferably 16% or more and 25% or less.
- the ratio of the nitrogen gas concentration to the methane gas concentration is more preferably 0.5% to 10%, and further preferably 1% to 10%.
- the nitrogen gas concentration Cn (%) and the methane gas concentration Cc (%) are expressed by the following equation (6).
- a + B ⁇ log10Cn Cc (6) (In formula (6), 10 ⁇ A ⁇ 20, 2 ⁇ B ⁇ 7) It is preferable to satisfy the relationship.
- Special seed substrate (rough surface formed by high-load polishing) with an arithmetic average roughness Ra of 5 nm to 100 nm while the nitrogen gas concentration Cn (%) and the methane gas concentration Cc (%) satisfy the above relationship.
- a single crystal diamond material is grown on a seed substrate. The single crystal diamond material thus obtained can reduce the light transmittance in the visible region to 15% or less, and can improve the fracture resistance while maintaining the hardness of the single crystal diamond material.
- a solid piece is placed near the single crystal substrate and exposed to microwave plasma to be mixed into the synthesis gas atmosphere and doping is performed.
- the impurity is silicon, semiconductor silicon or quartz can be used as the solid, and when the impurity is aluminum, the solid can be single crystal sapphire or polycrystalline alumina.
- the growth under the condition ⁇ in which a large amount of impurities (for example, nitrogen) is added is continued for a certain period of time to obtain a certain thickness D A. comes to the growth in conditions eliminate all impurities (nitrogen including) beta, also continued another certain time, after a certain thickness D B, repeats to grow again in a subsequent original condition ⁇ It is preferable.
- impurities nitrogen including
- D A and D B In the epitaxial growth of single crystal diamond material, the preferred relationship between D A and D B is: When 10 ppm ⁇ N all , D A ⁇ 0.5 mm and 0.008 mm ⁇ D B When 5 ppm ⁇ N all ⁇ 10 ppm, D A ⁇ 0.8 mm and 0.005 mm ⁇ D B When 1 ppm ⁇ N all ⁇ 5 ppm, D A ⁇ 1.2 mm and 0.003 mm ⁇ D B It is. N all is the total amount of nitrogen. D B is better as thin as possible, but if it is too thin than the above-mentioned conditions, can not be completely reset, not the floor well. D A also graphite component is rapidly many too thick than the above conditions.
- n is the number of repetition cycles. Increasing the number of repetitions can increase the thickness and decrease the transmittance. If N all is less than 1 ppm, an unrealizable thickness is required to produce the black of the present invention.
- Separation of Single Crystal Diamond Material from Seed Substrate the epitaxially grown single crystal diamond is separated from the seed substrate to obtain a single crystal diamond material.
- Separation methods include, for example, a method of cutting by laser irradiation, a method in which a separation boundary is formed in advance by ion implantation, a single crystal diamond material is grown on the ion implantation surface, and then separated at the separation boundary surface of ion implantation, etc. Is mentioned.
- a tool according to another embodiment of the present invention includes the single crystal diamond material of the above embodiment. For this reason, the tool of this embodiment can be made into a tool with few cracks at the time of tool manufacture and use.
- the tool of this embodiment is not particularly limited, and examples thereof include cutting tools, milling wipers, end mills, drills, reamers, cutters, dressers, wire guides, wire drawing dies, water jet nozzles, diamond knives, glass cutters, scribers, and the like. .
- a radiation temperature monitor according to still another embodiment of the present invention includes the single crystal diamond material of the above embodiment. For this reason, the radiation temperature monitor of this embodiment is closer to black body radiation and can evaluate the true temperature. There is no restriction
- An infrared optical component according to still another embodiment of the present invention includes the single crystal diamond material of the above embodiment. For this reason, the infrared optical component of the present embodiment has a minimum visible light leakage and can sufficiently detect infrared light.
- the infrared optical component of the present embodiment is not particularly limited, and specific examples include an infrared window, an infrared lens, an infrared window screen that shields scattered objects and dust, and the like.
- Example I Preparation of Seed Substrate
- three substrates (thickness 500 ⁇ m, 5 mm square) made of Ib type single crystal diamond prepared by a high temperature / high pressure synthesis method were prepared.
- the plane orientation of the main surface of these substrates was the (001) plane.
- the main surfaces of these prepared seed substrates were mechanically polished so as to be off by 3 ° in the [001] direction from the (001) plane.
- the surface of these seed substrates was roughened by forming a polishing flaw by controlling the speed with a metal bond diamond grindstone so that the arithmetic average roughness Ra was 10 nm.
- the above three seed substrates were placed in a known microwave plasma CVD apparatus, and three single crystal diamond materials having different nitrogen concentrations were epitaxially grown on the three seed substrates.
- the microwave frequency was 2.45 GHz
- the microwave power was 5 kW
- the growth time was 60 hours.
- three types of vapor phase synthetic single crystal diamond materials having a thickness of 1.2 mm were formed.
- Samples I-1 to I-3 are single crystal diamond materials prepared using a seed substrate having a surface arithmetic average roughness Ra of 10 nm, and the total nitrogen concentrations are 10 ppm, 20 ppm, and 30 ppm, respectively.
- the substitutional nitrogen concentrations were 100 ppb, 180 ppb, and 250 ppb, respectively.
- the comparative sample had a total nitrogen concentration of 150 ppm and an isolated substitutional nitrogen concentration of 150 ppm.
- Samples I-1 to I-3 have light transmittances of 14%, 9%, and 1.5% at wavelengths exhibiting the maximum transmittance in the visible region of 410 nm to 750 nm, respectively. , "Black Diamond” and “Black Jet Diamond”. Samples I-1 to I-3 were all used for radiation temperature monitoring and showed accurate temperatures that were suitable for the actual situation.
- a cutting tool was prepared and tested using the obtained single crystal diamond material. The test was performed using an aluminum material A5052 as a work material, a cutting speed of 500 m / min, a cutting depth of 0.01 mm, and a feed amount of 0.01 mm / rev. As a result, it was confirmed that there were few chips and excellent wear resistance.
- Samples I-1 to I-3 are all black as the window material, substantially blocking visible light, and transmitting infrared light with a wavelength of 10.6 ⁇ m for 40% or more, 62% and 55 respectively. %, 48%.
- the comparative sample was a yellow transparent plate and transmitted light with a wavelength of 750 nm.
- a Ti electrode having a diameter of 1.6 mm is formed on both sides of a plate which is polished on both sides so that the plate thickness of each sample is 0.5 mm, the arithmetic average roughness Ra of the surface is 1 nm or less, and the parallelism is 0.1 ° or less. It vapor-deposited to thickness and applied 50V at room temperature (25 degreeC), and measured the current-voltage characteristic. In all the samples, almost no current flowed, and it was found to be 1 ⁇ 10 12 ⁇ cm or more.
- Example II In this example, a single crystal diamond material was prepared and the physical properties were measured in the same manner as in Example I except that the surface roughness Ra of the seed substrate and the methane concentration and nitrogen concentration during crystal growth were changed.
- the total nitrogen concentration contained in the single crystal diamond material is 10 ppm or less, the methane concentration is 10%, and when the total nitrogen concentration contained in the single crystal diamond material is higher than 10 ppm and 90 ppm or less, the methane concentration is 18%.
- the methane concentration was 25%.
- the nitrogen concentration was changed in the range of 0.1 to 10% to adjust the nitrogen concentration contained in the single crystal diamond material.
- the single crystal diamond material was produced by crystal growth under the condition that nitrogen was not occasionally added, and the same nitrogen was added again to grow the crystal.
- the total nitrogen concentration is aimed at less than 5 ppm
- the target is 5 ppm or more and less than 10 ppm
- 5 ⁇ m growth is performed when the thickness of the single crystal diamond is 0.7 to 0.8 mm
- the total nitrogen concentration is 10 ppm or more and less than 90 ppm
- the growth is 8 ⁇ m.
- the total nitrogen concentration is larger than the isolated substitutional nitrogen concentration depending on the surface condition of the seed substrate and the crystal growth synthesis conditions of the single crystal diamond material ( That is, the total nitrogen concentration is higher than the isolated substitutional nitrogen concentration), vacancies are introduced, the light transmittance in the desired visible region is 15% or less, and the light transmittance in the infrared region having a wavelength of 10.6 ⁇ m is transmitted.
- the rate was 40% or more, and the resistivity was 1 ⁇ 10 6 ⁇ cm or more.
- Samples II-1 to II-8 could be used as infrared windows or as radiation temperature monitors for blackbody radiation. Cutting tools were made and tested.
- the cutting tip was cut into a thickness of 1 to 2 mm, and the cutting edge was processed after brazing to a tool shank.
- the test was performed using an aluminum material A5052 as a work material, a cutting speed of 500 m / min, a cutting depth of 0.01 mm, and a feed amount of 0.01 mm / rev. As a result, it was confirmed that there were few chips and excellent wear resistance. In Samples II-1 to II-8, it was considered that the high ratio of the total nitrogen concentration to the isolated substitutional nitrogen contributed to their high chipping resistance and high wear resistance.
- Example III the surface roughness Ra of the seed substrate, the methane concentration and the nitrogen concentration during crystal growth, the total impurity element concentration and the total substitutional impurity element of at least one impurity element of Mg, Al, Si, P, and S
- a single crystal diamond material was prepared and the physical properties were measured in the same manner as in Example I except that the concentration was changed.
- the addition of at least one impurity element of Mg, Al, Si, P, and S is performed by placing a small piece (1 mm ⁇ 2 mm) of MgO, Al 2 O 3 , Si, InP, ZnS or the like near the seed substrate. The amount added was controlled by the number of pieces.
- the methane concentration contained in the single crystal diamond material When the total nitrogen concentration contained in the single crystal diamond material is 10 ppm or less, the methane concentration is 10%, and when the total nitrogen concentration contained in the single crystal diamond material is higher than 10 ppm and 90 ppm or less, the methane concentration is 18%. Synthesized. The nitrogen concentration contained in the single crystal diamond material was adjusted within the range of 0.1 to 10% to adjust the nitrogen concentration contained in the single crystal diamond material. The production of the single crystal diamond material was performed in the same manner as in Example II, where the crystal was grown from time to time without nitrogen addition, and the same nitrogen was added again to grow the crystal. However, since impurity sources other than nitrogen used a solid source, the conditions were not completely absent.
- the ratio of the total nitrogen concentration to the isolated substitutional nitrogen concentration is 2.5 depending on the surface state of the seed substrate and the crystal growth conditions of the single crystal diamond material.
- the ratio of the total impurity element concentration to the total substitutional impurity element concentration is large in impurity elements other than nitrogen (the ratio is larger than 8 in Samples III-1 to III-7), and vacancies are also larger.
- the transmittance of light in the desired visible region is 15% or less
- the transmittance of light in the infrared region with a wavelength of 10.6 ⁇ m is 40% or more
- the resistivity is 1 ⁇ 10 6 ⁇ cm or more. It was.
- Samples III-1 to III-5 even when the total nitrogen concentration is low, other impurity elements are introduced in a large amount into the unsubstituted type, and the light transmittance in the desired visible region is 15% or less. It was. Samples III-1 to III-8 could be used as infrared windows or as radiation temperature monitors for blackbody radiation. Cutting tools were made and tested. The test was performed using an aluminum material A5052 as a work material, a cutting speed of 500 m / min, a cutting depth of 0.01 mm, and a feed amount of 0.01 mm / rev. As a result, it was confirmed that there were few chips and excellent wear resistance.
- Example IV In this example, the same procedure as in Example I was performed, except that the surface roughness Ra of the seed substrate, the methane concentration and nitrogen concentration during crystal growth, and the concentration of at least one impurity element of B, Al, and Si were changed.
- a single crystal diamond material was prepared and measured for physical properties. Boron was added by introducing B 2 H 6 gas, and Al and Si were added in the same manner as in Example III.
- the methane concentration is 10%
- the methane concentration is 18%. Synthesized.
- the nitrogen concentration was changed in the range of 0.1 to 10% to adjust the nitrogen concentration contained in the single crystal diamond material.
- crystals were sometimes grown under conditions without addition of nitrogen and boron, and the same nitrogen and boron were added again for crystal growth.
- impurity elements other than nitrogen and boron used a solid source, the conditions were not completely absent. Only at that time, 10% of methane gas was added to the CO 2 gas to suppress the inclusion of impurities.
- the standard for starting conditions without nitrogen was the same as in Example II. This is because the non-substituted impurity element is mixed in the single crystal diamond material at a high concentration without breaking the crystal lattice.
- Table 3 “visible light transmittance” indicates the light transmittance at a wavelength exhibiting the maximum transmittance in the visible region of 410 nm to 750 nm.
- samples IV-1 to IV-8 the total nitrogen concentration was increased compared to the isolated substitutional nitrogen concentration depending on the surface condition of the seed substrate and the crystal growth synthesis conditions of the single crystal diamond material. , Holes are also introduced, the light transmittance in the desired visible region is 15% or less, the light transmittance in the infrared region with a wavelength of 10.6 ⁇ m is 40% or more, and the resistivity is 1 ⁇ 10 6. It was ⁇ cm or more. Samples IV-1 to IV-8 could be used as infrared windows or radiation temperature monitors for blackbody radiation. Cutting tools were made and tested.
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Abstract
Description
本発明のある実施形態にかかる単結晶ダイヤモンド材料は、410nm以上750nm以下の波長の光の透過率がいずれの波長においても15%以下であり、かつ、光学的評価による電気絶縁体および電気的評価による電気絶縁体の少なくともいずれかである。本実施形態の単結晶ダイヤモンド材料において、光の透過率とは、その光の波長の如何を問わず、単結晶ダイヤモンド材料の任意に特定される実質的に平坦で(JIS B0601:2013に規定する表面の算術平均粗さRaが2nm以下で)平行な(平行度が0.1°以下の)両平面を両主面とするとき、一方の主面に実質的に垂直に(垂直方向からのずれ角が0.1°以下で)入射して他方の主面から出射する光の透過率、換言すれば、加工により平行度が0.1°以下の両主面を形成したときに、一方の主面の垂直方向からのずれ角が0.1°以下で入射して他方の主面から出射する光の透過率をいう。光学的評価による電気絶縁体とは、光学的に評価した電気的絶縁体(実質的に電気を通さない物体)をいい、光学的評価とは、好ましくは、10.6μmの波長の光の透過率が1%以上である物体である。また、電気的評価による電気絶縁体とは、電気的に評価した電気的絶縁体(実質的に電気を通さない物体)をいい、電気的評価とは、好ましくは、平均抵抗率が1×106Ωcm以上の物体である。補足すると、本実施形態の単結晶ダイヤモンド材料は、実質的に使用目的に利用される範囲において、全体が電気的絶縁体であって、表面や内部の一部に導電層を備えるものではないことを意味している。本実施形態の単結晶ダイヤモンド材料は、410nm以上750nm以下の波長の光の透過率がいずれの波長においても15%以下であり、かつ、光学的または電気的に絶縁体であるため、黒々とした色調と絶縁性を有する。
本実施形態の単結晶ダイヤモンド材料は、410nm以上750nm以下の波長の光の透過率がいずれの波長においても15%以下であり、好ましくは10%以下であり、より好ましくは8%以下である。かつ、本実施形態の単結晶ダイヤモンド材料は、光学的評価による電気絶縁体および電気的評価による電気絶縁体の少なくともいずれかである。本実施形態の単結晶ダイヤモンドは、410nm以上750nm以下の波長の光の透過率がいずれの波長においても15%以下であり、かつ、光学的評価および電気的評価の少なくともいずれかにおいて電気絶縁体であるため、黒々とした色調と絶縁性を有する。
T(%)= I1/I0 × 100 ・・・(1)
により定義される。
T=T1 2・exp(-αD)/(1-R1 2・exp(-αD)) ・・・(2)
と式(2)で表されるものである。ここで、αは吸収係数(単位:cm-1)であり、Dは平行な両主面間の距離(単位:cm-1)である。
R1=(n0-n1)2/(n0+n1)2 ・・・(3)
T1=4n0n1 /(n0+n1)2 ・・・(4)
と式(3)および式(4)で表される。式(3)および(4)において単結晶ダイヤモンド材料の屈折率n1を2.4、空気の屈折率n0を1.0として計算される反射率R1および透過率T1の値を、式(2)に代入して得られる全透過率Tは、透明な場合(α=0と近似される場合)、約71%であり、実測に合う結果である。
T=T1 2・exp(-αD) ・・・(5)
と式(5)で表しても構わない領域である。
1.種基板の準備
まず、単結晶ダイヤモンド材料の種基板として単結晶ダイヤモンド種基板を準備する。種基板は、天然単結晶ダイヤモンド、高圧合成単結晶ダイヤモンド、気相合成単結晶ダイヤモンドなどの板状のものを準備する。たとえば、6mm角や8mm角の高圧合成単結晶ダイヤモンド種基板が準備できる。また、気相合成単結晶ダイヤモンドの場合は、単結晶を複数つなぎ合わせたモザイク状の単結晶ダイヤモンド種基板を用意することもできる。大きさは16mm角あるいはそれ以上も可能である。モザイク状でも単結晶であると称しているのは、それぞれ個々の単結晶が、面方位が0.5°以内の範囲で揃っているためであり、広義の単結晶と考えているからである。
上記の種基板上に、CVD(化学気相堆積)法により、単結晶ダイヤモンド材料をエピタキシャル成長させる。CVD法としては、熱フィラメントCVD法、マイクロ波プラズマCVD法、直流プラズマCVD法、直流アーク放電プラズマCVD法などを用いることができる。これらの中でも、マイクロ波プラズマCVD法と直流プラズマCVD法は、不純物を制御しやすいので、好ましい。
A + B×log10Cn = Cc ・・・(6)
(式(6)中、10≦A≦20、2≦B≦7)
の関係を満たすことが好ましい。窒素ガス濃度Cn(%)とメタンガス濃度Cc(%)とが上式の関係を満たしながら、表面の算術平均粗さRaが5nm~100nmの特殊な種基板(高荷重研磨により形成された粗表面種基板)上に単結晶ダイヤモンド材料を成長させる。こうして得られる単結晶ダイヤモンド材料は、可視領域の光の透過率を15%以下にするとともに、単結晶ダイヤモンド材料の硬度を維持しつつ、耐欠損性を向上させることができる。
10ppm≦Nallのとき、DA≦0.5mmかつ0.008mm≦DB
5ppm≦Nall<10ppmのとき、DA≦0.8mmかつ0.005mm≦DB
1ppm≦Nall<5ppmのとき、DA≦1.2mmかつ0.003mm≦DB
である。Nallは全窒素量である。DBはできるだけ薄い方がよいが、上記条件より薄すぎると、リセットしきれず、うまくゆかない。DAも上記条件より厚すぎるとグラファイト成分が急激に多くなる。
Dtotal = n×(DA+DB) ・・・(7)
と式(7)で表される。ここで、nは、繰り返し周期の回数である。繰り返しを増やせば厚くでき、透過率も低くできる。Nallが1ppmより小さいと、本発明の黒を出すためには、実現できないほどの厚さが必要となる。
次に、エピタキシャル成長させた単結晶ダイヤモンドを種基板から分離して、単結晶ダイヤモンド材料を得る。分離方法は、たとえば、レーザー照射により切断する方法、イオン注入で予め分離境界を形成しておき、イオン注入面上に単結晶ダイヤモンド材料を成長させ、その後イオン注入の分離境界面で分離する方法などが挙げられる。
1.種基板の準備
種基板として、高温高圧合成法によって作製されたIb型の単結晶ダイヤモンドからなる基板(厚み500μm、5mm角)を3つ準備した。これらの基板の主面の面方位は(001)面であった。準備したこれらの種基板の主面を、(001)面から[001]方向に3°オフするように機械研磨した。その後、これらの種基板の表面を算術平均粗さRaが10nmになるようにメタルボンドダイヤ砥石で速度を制御して研磨傷を形成し、粗面化した。
上記の3つの種基板を公知のマイクロ波プラズマCVD装置内に配置して、3つの種基板上に窒素含有濃度が異なる3つの単結晶ダイヤモンド材料をそれぞれエピタキシャル成長させた。ここで、マイクロ波周波数は2.45GHz、マイクロ波電力は5kW、成長時間は60時間であった。こうして、厚さが1.2mmの3種類の気相合成単結晶ダイヤモンド材料が形成された。
得られた3種類の気相合成単結晶ダイヤモンド材料をレーザーで切断することにより、それぞれの種基板から分離し、その後、3種類の気相合成単結晶ダイヤモンド材料の表面を平坦に研磨した。
得られた3種類の単結晶ダイヤモンド材料(試料1~試料3)および準備した高温高圧合成Ib型ダイヤモンド材料(比較試料)について、全窒素濃度、孤立置換型窒素濃度、光透過率を測定した。全窒素濃度は、SIMSにより測定した。孤立置換型窒素濃度は、ESR分析により測定した。光透過率は、市販の分光光度計を用いて測定した。
本実施例では、種基板の表面粗さRaと結晶成長時のメタン濃度および窒素濃度を変えたこと以外は、実施Iと同様にして単結晶ダイヤモンド材料を作製し物性を測定した。
単結晶ダイヤモンド材料に含有させる全窒素濃度が10ppm以下の場合はメタン濃度は10%で合成し、単結晶ダイヤモンド材料に含有させる全窒素濃度が10ppmより高く90ppm以下の場合はメタン濃度は18%で合成し、結晶ダイヤモンド材料に含有させる全窒素濃度が90ppmより高い場合はメタン濃度は25%で合成した。窒素濃度は0.1~10%の範囲で変えて、単結晶ダイヤモンド材料に含有させる窒素濃度を調整した。単結晶ダイヤモンド材料の作製は、時々窒素添加の無い条件で結晶成長させ、再度同じ窒素を添加して結晶成長させた。窒素添加の無い条件を開始する目安としては、全窒素濃度が5ppm未満を目指す場合は、単結晶ダイヤモンドの厚さが1.0~1.2mmとなった時に、3μm成長を行い、全窒素濃度が5ppm以上10ppm未満を目指す場合は、単結晶ダイヤモンドの厚さが0.7~0.8mmとなった時に5μm成長を行い、全窒素濃度が10ppm以上90ppm未満を目指す場合は、単結晶ダイヤモンドの厚さが0.4~0.5mmとなった時に8μm成長を行い、全窒素濃度が90ppm以上を目指す場合は、単結晶ダイヤモンドの厚さが0.3~0.4mmとなった時に8μm成長を行った。これは、結晶格子を壊すことなく単結晶ダイヤモンド材料に高濃度で非置換型不純物を混入させるためであった。作製した試料II-1~試料II-9の結果を表1にまとめた。表1において、「可視光透過率」とは、410nm~750nmの可視領域において最大の透過率を示す波長における光の透過率を示した。
本実施例では、種基板の表面粗さRaと結晶成長時のメタン濃度および窒素濃度およびMg、Al、Si、P、およびSの少なくとも1つの不純物元素の総不純物元素濃度および総置換型不純物元素濃度を変えたこと以外は、実施例Iと同様にして単結晶ダイヤモンド材料を作製し物性を測定した。Mg、Al、Si、P、およびSの少なくとも1つの不純物元素の添加は、種基板の近くにMgO、Al2O3、Si、InP、ZnSなどの小片(1mm×2mm)を置くことにより行ない、小片の数で添加量を制御した。単結晶ダイヤモンド材料に含有させる全窒素濃度が10ppm以下の場合はメタン濃度は10%で合成し、単結晶ダイヤモンド材料に含有させる全窒素濃度が10ppmより高く90ppm以下の場合はメタン濃度は18%で合成した。単結晶ダイヤモンド材料に含有させる窒素濃度は0.1~10%の範囲で変えて、単結晶ダイヤモンド材料に含有させる窒素濃度を調整した。単結晶ダイヤモンド材料の作製は、実施例IIと同じ要領で、時々窒素添加の無い条件で結晶成長させ、再度同じ窒素を添加して結晶成長させた。ただし、窒素以外の不純物元素は固体ソースを利用したので、完全にない条件というわけではなく、その時だけCO2ガスをメタンガスの10%を添加して、不純物元素が含有すること抑制した。窒素がない条件の開始の目安は、実施例IIと同じにした。これは、結晶格子を壊すことなく単結晶ダイヤモンド材料に高濃度で非置換型不純物を混入させるためであった。作製した試料III-1~試料III-10の結果を表2にまとめた。表2において、「可視光透過率」とは、410nm~750nmの可視領域において最大の透過率を示す波長における光の透過率を示した。
本実施例では、種基板の表面粗さRaと結晶成長時のメタン濃度および窒素濃度およびB、Al、およびSiの少なくとも1つの不純物元素の濃度を変えたこと以外は、実施例Iと同様にして単結晶ダイヤモンド材料を作製し物性を測定した。ホウ素の添加はB2H6ガスの導入により行ない、AlおよびSiの添加は実施例IIIと同様に行なった。単結晶ダイヤモンド材料に含有させる全窒素濃度が10ppm以下の場合はメタン濃度は10%で合成し、単結晶ダイヤモンド材料に含有させる全窒素濃度が10ppmより高く90ppm以下の場合はメタン濃度は18%で合成した。窒素濃度は0.1~10%の範囲で変えて、単結晶ダイヤモンド材料に含有させる窒素濃度を調整した。単結晶ダイヤモンド材料の作製は、時々窒素添加およびホウ素添加の無い条件で結晶成長させ、再度同じ窒素およびホウ素を添加して結晶成長させた。ただし、窒素およびホウ素以外の不純物元素は固体ソースを利用したので、完全にない条件というわけではなく、その時だけCO2ガスをメタンガスの10%を添加して、不純物が含有すること抑制した。窒素がない条件の開始の目安は、実施例IIと同じにした。これは、結晶格子を壊すことなく単結晶ダイヤモンド材料に高濃度で非置換型不純物元素を混入させるためであった。作製した試料IV-1~試料IV-10の結果を表3にまとめた。表3において、「可視光透過率」とは、410nm~750nmの可視領域において最大の透過率を示す波長における光の透過率を示した。
Claims (13)
- 410nm以上750nm以下の波長の光の透過率がいずれの波長においても15%以下であり、かつ、
光学的評価による電気絶縁体および電気的評価による電気絶縁体の少なくともいずれかである単結晶ダイヤモンド材料。 - 前記光学的評価は、10.6μmの波長の光の透過率が1%以上である請求項1に記載の単結晶ダイヤモンド材料。
- 前記電気的評価は、平均抵抗率が1×106Ωcm以上である請求項1または請求項2に記載の単結晶ダイヤモンド材料。
- 410nm以上750nm以下の波長の光の透過率がいずれの波長においても3%以下である請求項1から請求項3のいずれか1項に記載の単結晶ダイヤモンド材料。
- 全窒素濃度が、孤立置換型窒素濃度の8倍以上である請求項1から請求項4のいずれか1項に記載の単結晶ダイヤモンド材料。
- 全窒素濃度から孤立置換型窒素濃度を引いた非置換型窒素濃度が、0.875ppm以上である請求項1から請求項5のいずれか1項に記載の単結晶ダイヤモンド材料。
- 空孔濃度が、孤立置換窒素濃度、非置換型窒素濃度、全窒素濃度および1ppmの少なくともいずれかよりも高い請求項1から請求項6のいずれか1項に記載の単結晶ダイヤモンド材料。
- マグネシウム、アルミニウム、ケイ素、リンおよびイオウからなる群から選ばれる少なくとも1種類の不純物元素の総不純物元素濃度が、50ppb以上である請求項1から請求項7のいずれか1項に記載の単結晶ダイヤモンド材料。
- マグネシウム、アルミニウム、ケイ素、リンおよびイオウからなる群から選ばれる少なくとも1種類の不純物元素の総不純物元素濃度が、前記不純物元素の総置換型不純物元素濃度の8倍以上である請求項1から請求項8のいずれか1項に記載の単結晶ダイヤモンド材料。
- 全ホウ素濃度が、全窒素濃度以下である請求項1から請求項9のいずれか1項に記載の単結晶ダイヤモンド材料。
- 請求項1から請求項10のいずれか1項に記載の単結晶ダイヤモンド材料を含む工具。
- 請求項1から請求項10のいずれか1項に記載の単結晶ダイヤモンド材料を含む放射温度モニター。
- 請求項1から請求項10のいずれか1項に記載の単結晶ダイヤモンド材料を含む赤外光学部品。
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WO2017014311A1 (ja) * | 2015-07-22 | 2017-01-26 | 住友電気工業株式会社 | 単結晶ダイヤモンド材、単結晶ダイヤモンドチップおよび穿孔工具 |
WO2019077888A1 (ja) * | 2017-10-20 | 2019-04-25 | 住友電気工業株式会社 | 合成単結晶ダイヤモンド、工具、及び、合成単結晶ダイヤモンドの製造方法 |
WO2020004373A1 (ja) * | 2018-06-27 | 2020-01-02 | 住友電工ハードメタル株式会社 | 貫通孔付工具、ダイヤモンド部品、及び、ダイヤモンド素材 |
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JP6795521B2 (ja) * | 2016-01-22 | 2020-12-02 | 住友電気工業株式会社 | 単結晶ダイヤモンド、単結晶ダイヤモンドの製造方法およびそれに用いられる化学気相堆積装置 |
CN113728254B (zh) * | 2019-04-25 | 2023-08-22 | 京瓷株式会社 | 光学部件 |
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Cited By (11)
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WO2017014311A1 (ja) * | 2015-07-22 | 2017-01-26 | 住友電気工業株式会社 | 単結晶ダイヤモンド材、単結晶ダイヤモンドチップおよび穿孔工具 |
JP6118954B1 (ja) * | 2015-07-22 | 2017-04-19 | 住友電気工業株式会社 | 単結晶ダイヤモンド材、単結晶ダイヤモンドチップおよび穿孔工具 |
US10287708B2 (en) | 2015-07-22 | 2019-05-14 | Sumitomo Electric Industries, Ltd. | Single-crystal diamond material, single-crystal diamond chip, and perforated tool |
US10774442B2 (en) | 2015-07-22 | 2020-09-15 | Sumitomo Electric Industries, Ltd. | Single-crystal diamond material, single-crystal diamond chip, and perforated tool |
WO2019077888A1 (ja) * | 2017-10-20 | 2019-04-25 | 住友電気工業株式会社 | 合成単結晶ダイヤモンド、工具、及び、合成単結晶ダイヤモンドの製造方法 |
JPWO2019077888A1 (ja) * | 2017-10-20 | 2020-11-05 | 住友電気工業株式会社 | 合成単結晶ダイヤモンド、工具、及び、合成単結晶ダイヤモンドの製造方法 |
WO2020004373A1 (ja) * | 2018-06-27 | 2020-01-02 | 住友電工ハードメタル株式会社 | 貫通孔付工具、ダイヤモンド部品、及び、ダイヤモンド素材 |
CN112351843A (zh) * | 2018-06-27 | 2021-02-09 | 住友电工硬质合金株式会社 | 具有贯通孔的工具、金刚石部件和金刚石材料 |
JPWO2020004373A1 (ja) * | 2018-06-27 | 2021-08-05 | 住友電工ハードメタル株式会社 | 貫通孔付工具、ダイヤモンド部品、及び、ダイヤモンド素材 |
EP3815806A4 (en) * | 2018-06-27 | 2022-04-06 | Sumitomo Electric Hardmetal Corp. | THROUGH HOLE TOOL, DIAMOND COMPONENT AND DIAMOND MATERIAL |
CN112351843B (zh) * | 2018-06-27 | 2024-05-14 | 住友电工硬质合金株式会社 | 具有贯通孔的工具、金刚石部件和金刚石材料 |
Also Published As
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US20170314159A1 (en) | 2017-11-02 |
CN107109690B (zh) | 2019-08-20 |
EP3214208B1 (en) | 2021-08-04 |
US10697088B2 (en) | 2020-06-30 |
SG11201703383WA (en) | 2017-06-29 |
EP3214208A1 (en) | 2017-09-06 |
JP6594889B2 (ja) | 2019-10-23 |
JPWO2016068244A1 (ja) | 2017-08-31 |
EP3214208A4 (en) | 2018-06-27 |
KR20170074973A (ko) | 2017-06-30 |
CN107109690A (zh) | 2017-08-29 |
KR102475053B1 (ko) | 2022-12-06 |
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