WO2015194278A1 - Polishing pad and method for producing polishing pad - Google Patents

Polishing pad and method for producing polishing pad Download PDF

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Publication number
WO2015194278A1
WO2015194278A1 PCT/JP2015/063234 JP2015063234W WO2015194278A1 WO 2015194278 A1 WO2015194278 A1 WO 2015194278A1 JP 2015063234 W JP2015063234 W JP 2015063234W WO 2015194278 A1 WO2015194278 A1 WO 2015194278A1
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WO
WIPO (PCT)
Prior art keywords
polishing
polishing pad
layer
binder
polishing layer
Prior art date
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PCT/JP2015/063234
Other languages
French (fr)
Japanese (ja)
Inventor
史博 向
歳和 田浦
Original Assignee
バンドー化学株式会社
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Application filed by バンドー化学株式会社 filed Critical バンドー化学株式会社
Priority to CN201580032108.1A priority Critical patent/CN106457523A/en
Priority to KR1020167036276A priority patent/KR20170013315A/en
Priority to JP2016529161A priority patent/JPWO2015194278A1/en
Publication of WO2015194278A1 publication Critical patent/WO2015194278A1/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B7/00Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor
    • B24B7/20Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground
    • B24B7/22Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain
    • B24B7/24Machines or devices designed for grinding plane surfaces on work, including polishing plane glass surfaces; Accessories therefor characterised by a special design with respect to properties of the material of non-metallic articles to be ground for grinding inorganic material, e.g. stone, ceramics, porcelain for grinding or polishing glass
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/11Lapping tools
    • B24B37/20Lapping pads for working plane surfaces
    • B24B37/24Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D18/00Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for
    • B24D18/0045Manufacture of grinding tools or other grinding devices, e.g. wheels, not otherwise provided for by stacking sheets of abrasive material
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/04Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic
    • B24D3/06Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic metallic or mixture of metals with ceramic materials, e.g. hard metals, "cermets", cements
    • B24D3/10Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially inorganic metallic or mixture of metals with ceramic materials, e.g. hard metals, "cermets", cements for porous or cellular structure, e.g. for use with diamonds as abrasives
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24DTOOLS FOR GRINDING, BUFFING OR SHARPENING
    • B24D3/00Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
    • B24D3/02Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
    • B24D3/20Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
    • B24D3/28Resins or natural or synthetic macromolecular compounds

Definitions

  • the present invention relates to a polishing pad and a method for manufacturing the polishing pad.
  • Such processing of a substrate is mainly divided into lapping processing and polishing processing.
  • polishing process a chemical polishing process using fine particles such as ceria is performed, and the planarization accuracy of the substrate surface is improved.
  • the present invention has been made on the basis of the above-described circumstances, and an object thereof is to provide a polishing pad capable of achieving both processing efficiency and finished flatness at a high level.
  • the present inventors have found that the processing efficiency of the object to be polished and the finished flatness can be compatible at a high level by using diamond grains having an average shape factor within a certain range, and the present invention has been completed. I let you.
  • the invention made to solve the above problems is a polishing pad having a base material and a polishing layer laminated on the surface thereof, wherein the polishing layer is a binder mainly composed of a resin or an inorganic substance. And diamond abrasive grains dispersed in the binder, wherein the diamond abrasive grains have an average shape factor of 1 or more and 1.33 or less.
  • the polishing pad has diamond abrasive grains having an average shape factor within the above range, the polishing pad can achieve both high processing efficiency and finished flatness of the object to be polished. Therefore, the polishing pad can flatten the surface of the object to be polished such as a glass substrate in a short time.
  • the main component of the binder is preferably a thermosetting resin or a photocurable resin.
  • a thermosetting resin or a photocurable resin when the binder is composed mainly of a thermosetting resin or a photocurable resin, it is easy to ensure good dispersibility of diamond abrasive grains and good adhesion to the substrate when the binder is constituted. Moreover, it is easy to form a polishing layer. As a result, the durability of the polishing layer can be improved and the processing efficiency during polishing can be improved.
  • the main component of the binder is preferably silicate.
  • the abrasive particle retention power of a polishing layer can be improved by making the main component of a binder into a silicate.
  • the polishing layer may have a plurality of convex portions on the surface, and the plurality of convex portions may be regularly arranged.
  • the polishing layer has a plurality of convex portions on the surface, and the plurality of convex portions are regularly arranged, so that the anisotropy of polishing is reduced and the surface to be polished is further flattened. Can be easily converted.
  • the polishing pad can be easily and reliably fixed to a support for mounting the polishing pad on a polishing apparatus.
  • the adhesive layer is preferably composed of an adhesive.
  • a polishing pad can be peeled off from a support body and can be replaced, reuse of a polishing pad and a support body becomes easy.
  • the base material has flexibility or ductility.
  • a polishing pad follows the surface shape of a to-be-polished body and it becomes easy to contact a grinding
  • a polishing layer composition comprising a binder component mainly composed of a resin or an inorganic substance and diamond abrasive grains having an average shape factor of 1 or more and 1.33 or less. It is characterized by.
  • the manufacturing method of the polishing pad has high manufacturing efficiency because the polishing layer can be formed by printing the composition for polishing layer. Moreover, since the manufacturing method of the said polishing pad forms the polishing layer which has a diamond abrasive grain whose average shape factor is 1 or more and 1.33 or less, it is compatible with the processing efficiency and finished flatness of a to-be-polished body at a high level. A polishing pad can be manufactured.
  • the “average shape factor” is (D 2 / A) where D ( ⁇ m) is the diameter of a circle circumscribing the projection surface of the abrasive grains, and A ( ⁇ m 2 ) is the area of the projection surface of the abrasive grains. ) ⁇ ( ⁇ / 4).
  • the polishing pad of the present invention both processing efficiency and finished flatness can be achieved at a high level. Therefore, the polishing pad can flatten the surface of the object to be polished such as a glass substrate in a short time.
  • FIG. 1 is a schematic plan view showing a polishing pad according to an embodiment of the present invention.
  • FIG. 1B is a schematic end view taken along line AA in FIG. 1A. It is a typical end elevation showing a polishing pad of an embodiment different from Drawing 1B.
  • a polishing pad 1 shown in FIGS. 1A and 1B includes a resin-made base material 10, a polishing layer 20 laminated on the front surface side of the base material 10, and an adhesive layer 30 laminated on the back surface side of the base material 10. Is provided.
  • the substrate 10 is a plate-like member for supporting the polishing layer 20.
  • PET polyethylene terephthalate
  • PP polypropylene
  • PE polyethylene
  • PI polyimide
  • PEN polyethylene naphthalate
  • an aramid aluminum, copper etc.
  • PET and PI that have good adhesion to the polishing layer 20 are preferable.
  • the process which improves adhesiveness such as a chemical process, a corona process, and a primer process, may be performed on the surface of the base material 10.
  • the base material 10 may be flexible or ductile.
  • the polishing pad 1 follows the surface shape of the object to be polished, and the polishing surface and the object to be polished are easily in contact with each other, thereby further improving the processing efficiency.
  • the material of the flexible base material 10 include PET and PI.
  • aluminum and copper can be mentioned as a material of the base material 10 which has ductility.
  • the shape and size of the substrate 10 are not particularly limited, but may be, for example, a 150 mm ⁇ 150 mm square shape or an annular shape having an outer diameter of 637 mm and an inner diameter of 234 mm. Moreover, the structure by which the several base material 10 juxtaposed on the plane is supported by a single support body may be sufficient.
  • the average thickness of the substrate 10 is not particularly limited, but can be, for example, 75 ⁇ m or more and 1 mm or less. When the average thickness of the substrate 10 is less than the lower limit, the polishing pad 1 may have insufficient strength and flatness. On the other hand, when the average thickness of the substrate 10 exceeds the upper limit, the polishing pad 1 is unnecessarily thick and may be difficult to handle.
  • the polishing layer 20 has a binder 21 and diamond abrasive grains 22 dispersed in the binder 21.
  • the polishing layer 20 has a plurality of convex portions 23 on the surface.
  • the average thickness of the polishing layer 20 (average thickness of only the convex portion 23) is not particularly limited, but the lower limit of the average thickness of the polishing layer 20 is preferably 100 ⁇ m, and more preferably 130 ⁇ m.
  • the upper limit of the average thickness of the polishing layer 20 is preferably 1000 ⁇ m, and more preferably 800 ⁇ m. When the average thickness of the polishing layer 20 is less than the lower limit, the durability of the polishing layer 20 may be insufficient. On the other hand, when the average thickness of the polishing layer 20 exceeds the upper limit, the polishing pad 1 is unnecessarily thick and may be difficult to handle.
  • the binder 21 contains a resin or an inorganic material as a main component.
  • thermosetting resin examples include polyurethane, polyphenol, epoxy resin, polyester, cellulose, ethylene copolymer, polyvinyl acetal, polyacryl, acrylic ester resin, polyvinyl alcohol, polyvinyl chloride, polyvinyl acetate, and polyamide. it can.
  • photocurable resin examples include acrylic ester resins, urethane acrylate resins, vinyl ester resins, polyester alkyds, and the like. Of these, thermosetting epoxy resins are preferred.
  • the thermosetting epoxy resin constitutes the binder 21, it is easy to ensure good dispersibility of the diamond abrasive grains 22 and good adhesion to the substrate 10.
  • the good dispersibility of the diamond abrasive grain 22 and the favorable to the base material 10 are similarly obtained. Adhesion is easy to ensure.
  • the resin of the binder 21 may be at least partially crosslinked.
  • examples of the inorganic substance include silicate, phosphate, and polyvalent metal alkoxide. Of these, silicates that are excellent in the abrasive particle retention of the polishing layer 20 are preferred.
  • the binder 21 may appropriately contain various auxiliaries and additives such as a dispersant, a coupling agent, a surfactant, a lubricant, an antifoaming agent, and a colorant depending on the purpose.
  • auxiliaries and additives such as a dispersant, a coupling agent, a surfactant, a lubricant, an antifoaming agent, and a colorant depending on the purpose.
  • the lower limit of the average particle diameter of the diamond abrasive grains 22 is preferably 1 ⁇ m and more preferably 3 ⁇ m. Moreover, as an upper limit of the average particle diameter of the said diamond abrasive grain 22, 20 micrometers is preferable and 15 micrometers is more preferable. When the average particle diameter of the diamond abrasive grains 22 is less than the lower limit, the polishing rate may be insufficient. On the other hand, when the average particle diameter of the diamond abrasive grains 22 exceeds the upper limit, the object to be polished may be damaged.
  • the lower limit of the average shape factor of the diamond abrasive grains 22 is 1. Moreover, as an upper limit of the average shape factor of the said diamond abrasive grain 22, it is 1.33, and 1.3 is more preferable. When the average shape factor of the diamond abrasive grains 22 exceeds the above upper limit, it may be difficult to achieve both high processing efficiency and finished flatness of the object to be polished.
  • the average shape factor of the diamond abrasive grains 22 is not less than 1 from the definition.
  • the lower limit of the content of the diamond abrasive grains 22 with respect to the polishing layer 20 is preferably 35% by mass, and more preferably 40% by mass. Moreover, as an upper limit of content with respect to the polishing layer 20 of the said diamond abrasive grain 22, 70 mass% is preferable and 65 mass% is more preferable. When the content of the diamond abrasive grains 22 with respect to the polishing layer 20 is less than the lower limit, the polishing power of the polishing layer 20 may be insufficient. On the other hand, when the content of the diamond abrasive grains 22 with respect to the polishing layer 20 exceeds the upper limit, the object to be polished may be damaged.
  • the polishing layer 20 has a plurality of convex portions 23 arranged on the surface in a lattice pattern with equal intervals.
  • the shapes of the plurality of convex portions 23 are regularly arranged block pattern shapes.
  • the bottom surface of the portion (groove portion) other than the convex portion 23 of the polishing layer 20 is constituted by the surface of the substrate 10.
  • the lower limit of the average area of the convex portion 23 is preferably 0.5 mm 2, 1 mm 2 is more preferable.
  • the upper limit of the average area of the convex portions 23 is preferably 3 mm 2, 2.5 mm 2 is more preferable.
  • the convex portion 23 of the polishing layer 20 may be peeled off.
  • the average area of the convex portion 23 exceeds the above upper limit, the frictional resistance during polishing of the polishing layer 20 increases, and the object to be polished may be damaged.
  • the lower limit of the area occupation ratio of the plurality of convex portions 23 with respect to the entire polishing layer 20 is preferably 15% and more preferably 20%.
  • an upper limit of the area occupation rate with respect to the said whole polishing layer 20 of the said some convex-shaped part 23 40% is preferable and 35% is more preferable.
  • the area occupation ratio of the plurality of convex portions 23 with respect to the entire polishing layer 20 is less than the lower limit, the convex portions 23 of the polishing layer 20 may be peeled off.
  • the area occupancy ratio of the plurality of convex portions 23 with respect to the entire polishing layer 20 exceeds the upper limit, the frictional resistance during polishing of the polishing layer 20 is increased and the object to be polished may be damaged.
  • the “area of the entire polishing layer” is a concept including the area of voids in the polishing layer.
  • the adhesive layer 30 is a layer that supports the polishing pad 1 and fixes the polishing pad 1 to a support for mounting on the polishing apparatus.
  • the adhesive used for the adhesive layer 30 is not particularly limited, and examples thereof include a reactive adhesive, an instantaneous adhesive, a hot melt adhesive, and an adhesive.
  • a pressure-sensitive adhesive is preferable.
  • a pressure-sensitive adhesive is preferable.
  • an adhesive is not particularly limited.
  • the lower limit of the average thickness of the adhesive layer 30 is preferably 0.05 mm, more preferably 0.1 mm. Moreover, as a minimum of the average thickness of the contact bonding layer 30, 0.3 mm is preferable and 0.2 mm is more preferable. When the average thickness of the adhesive layer 30 is less than the above lower limit, the adhesive force is insufficient and the polishing pad 1 may be peeled off from the support. On the other hand, when the average thickness of the adhesive layer 30 exceeds the above upper limit, for example, due to the thickness of the adhesive layer 30, there is a risk that workability may be lowered, such as causing trouble when the polishing pad 1 is cut into a desired shape.
  • the polishing pad 1 can be manufactured by a step of preparing a polishing layer composition and a step of forming the polishing layer 20 by printing the polishing layer composition.
  • a solution in which the polishing layer composition (the material for forming the binder 21 and the diamond abrasive grains 22) is dispersed in a solvent is prepared as a coating solution.
  • the solvent is not particularly limited as long as the material for forming the binder 21 is soluble. Specifically, methyl ethyl ketone (MEK), isophorone, terpineol, N methylpyrrolidone, cyclohexanone, propylene carbonate, or the like can be used.
  • MEK methyl ethyl ketone
  • isophorone isophorone
  • terpineol N methylpyrrolidone
  • cyclohexanone propylene carbonate, or the like
  • a diluent such as water, alcohol, ketone, acetate ester and aromatic compound may be added.
  • the coating liquid prepared in the polishing layer composition preparation step is applied to the surface of the base material 10, and the polishing layer 20 having the convex portions 23 is formed by a printing method.
  • a mask having a shape corresponding to the shape of the convex portion 23 is used.
  • the coating liquid is applied (printed) using this mask.
  • this coating method for example, bar coating, reverse roll coating, knife coating, screen printing, gravure coating, die coating and the like can be used.
  • the polishing layer 20 is formed by drying and reaction-curing the applied coating liquid. Specifically, for example, after the solvent of the coating liquid is evaporated by heat of 100 ° C. or higher and 120 ° C. or lower, the solvent of the coating liquid is cured by heat of 80 ° C. or higher and 120 ° C. or lower to form the binder 21.
  • the polishing pad 1 since the polishing layer 20 has diamond abrasive grains 22 having an average shape factor of 1 or more and 1.33 or less, the processing efficiency of the object to be polished and the finished flatness can be achieved at a high level. Therefore, the polishing pad 1 can flatten the surface of the object to be polished such as a glass substrate in a short time. Further, the polishing pad 1 has a block pattern shape in which the polishing layer 20 has a plurality of convex portions 23 on the surface, and the shapes of the plurality of convex portions 23 are regularly arranged. The anisotropy is reduced, and the surface to be polished can be further flattened.
  • the said polishing pad 1 can be easily and reliably fixed to the support body with which the said polishing pad 1 is mounted
  • FIG. Furthermore, since the manufacturing method of the said polishing pad 1 can form the polishing layer 20 by printing of the composition for polishing layers, manufacturing efficiency is good.
  • the present invention is not limited to the above-described embodiment, and can be implemented in a mode in which various changes and improvements are made in addition to the above-described mode.
  • the convex portions are configured in an equally spaced grid pattern.
  • the grid spacing does not have to be evenly spaced.
  • the spacing may be changed between the vertical direction and the horizontal direction.
  • anisotropy may occur in the polishing, and therefore equal intervals are preferable.
  • planar shape of the convex portion may not be a lattice shape, and may be, for example, a shape in which a polygon other than a quadrangle is repeated, a circular shape, a shape having a plurality of parallel lines, or the like.
  • the depth of a groove part is smaller than the average thickness of an abrasive layer, and a groove part does not reach the surface of a base material, Good.
  • the depth of the groove can be 50% or more of the average thickness of the polishing layer.
  • the convex portion is formed by etching or laser processing. May be.
  • the polishing layer has a convex portion, but the convex portion is not an essential component.
  • a polishing layer may be uniformly laminated on the substrate surface.
  • the polishing pad 2 may include a support 40 laminated via an adhesive layer 30 on the back side and a second adhesive layer 31 laminated on the back side of the support 40.
  • the polishing pad 2 can be easily handled.
  • the material of the support 40 examples include thermoplastic resins such as polypropylene, polyethylene, polytetrafluoroethylene, and polyvinyl chloride, and engineering plastics such as polycarbonate, polyamide, and polyethylene terephthalate.
  • thermoplastic resins such as polypropylene, polyethylene, polytetrafluoroethylene, and polyvinyl chloride
  • engineering plastics such as polycarbonate, polyamide, and polyethylene terephthalate.
  • the average thickness of the support 40 can be, for example, 0.5 mm or more and 2 mm or less.
  • the strength of the polishing pad 2 may be insufficient.
  • the average thickness of the support 40 exceeds the upper limit, it may be difficult to attach the support 40 to a polishing apparatus or the flexibility of the support 40 may be insufficient.
  • Example 1 Diamond abrasive grains ("LS series” from Lands) were prepared, and average particle diameter and average shape factor were measured using Malvern "Morphology G3". The results are shown in Table 1.
  • a PET film (“Melenex S” manufactured by Teijin DuPont Films Ltd.) having an average thickness of 75 ⁇ m was used as a substrate, and a polishing layer having convex portions was formed on the surface of the substrate by printing.
  • the convex part was formed in the grinding
  • the convex portion had a square shape with a side of 1.5 mm in plan view and an average thickness of 135 ⁇ m.
  • the convex portions were in the form of regularly arranged block patterns, and the area occupation ratio of the convex portions with respect to the entire polishing layer was 36%.
  • a hard vinyl chloride resin plate (“SP770” from Takiron Co., Ltd.) having an average thickness of 1 mm is used as a support that supports the polishing pad and is fixed to the polishing apparatus, and the back surface of the substrate and the surface of the support are It bonded together with the adhesive material of average thickness 130micrometer.
  • a double-sided tape (“# 5605HGD” from Sekisui Chemical Co., Ltd.) was used as the adhesive material.
  • Example 2 and 3 Comparative Examples 1 to 3
  • Examples 2 and 3 and Comparative Examples 1 to 3 were obtained by changing the average grain size and average shape factor of the diamond abrasive grains of Example 1 as shown in Table 1.
  • Example 4 The same diamond abrasive grains as in Example 1 were used, and the silicate ("Sodium silicate seal brand” of Fuji Chemical Co., Ltd.) and the curing agent ("Recassette No. 5" of Kobe Riken Co., Ltd.) were used. )) was mixed and adjusted so that the content of diamond abrasive grains was 65% by mass, the content of silicate was 34% by mass, and the content of curing agent was 1% by mass to obtain a molding liquid. .
  • silicate sodium silicate seal brand of Fuji Chemical Co., Ltd.
  • the curing agent (“Recassette No. 5" of Kobe Riken Co., Ltd.)
  • the molding liquid is poured into a polytetrafluoroethylene resin mold having a side of 3 mm and a depth of 1 mm, dehydrated at 90 ° C. for 1 hour or more, then released from the resin mold, and fired at 300 ° C. for 1 hour. A shaped part was produced.
  • An aluminum plate having an average thickness of 500 ⁇ m was used as the base material, and the convex portions obtained by the firing were arranged in a block pattern at a pitch of 5 mm on the surface of the base material. Bonded with ceramic D "). The area occupation ratio of the convex portion with respect to the entire polishing layer is 36%. Then, the convex part surface was planarized using WA # 800 grindstone.
  • a hard vinyl chloride resin plate (“SP770” from Takiron Co., Ltd.) having an average thickness of 1 mm is used as a support that supports the polishing pad and is fixed to the polishing apparatus, and the back surface of the substrate and the surface of the support are It bonded together with the adhesive material of average thickness 130micrometer.
  • a double-sided tape (“# 5605HGD” from Sekisui Chemical Co., Ltd.) was used as the adhesive material.
  • Example 5 and Comparative Example 4 were obtained by changing the average particle size and average shape factor of the diamond abrasive grains of Example 4 as shown in Table 1.
  • the glass substrate was polished using the polishing pads obtained in Examples 1 to 5 and Comparative Examples 1 to 4.
  • Three soda lime glasses made by Hiraoka Special Glass Manufacturing Co., Ltd. having a diameter of 6.25 cm and a specific gravity of 2.4 were used for the glass substrate.
  • a commercially available double-side polishing machine (Nippon Engis Co., Ltd. “EJD-5B-3W”) was used for the polishing.
  • the carrier of the double-side polishing machine is an epoxy glass having a thickness of 0.6 mm.
  • Polishing was performed at a polishing pressure of 200 g / cm 2 for 15 minutes under the conditions of an upper surface plate rotation speed of 60 rpm, a lower surface plate rotation speed of 90 rpm, and a SUN gear rotation speed of 30 rpm. At that time, 120 cc of “Tool Mate GR-20” supplied by Moresco Co., Ltd. was supplied as a coolant.
  • the polishing rate was calculated by dividing the weight change (g) of the glass substrate before and after polishing by the surface area (cm 2 ) of the glass substrate, the specific gravity (g / cm 3 ) of the glass substrate, and the polishing time (minutes).
  • the coexistence level obtained by dividing the polishing rate by Ra from Table 1 is high in Examples 1 to 5 in which the average shape factor is 1.33 or less, regardless of the average grain size or the amount of the diamond abrasive grains. Low in Comparative Examples 1 to 4 where the shape factor exceeds 1.33. Therefore, it can be seen that the processing efficiency and the finished flatness can be compatible at a high level by setting the average shape factor of the diamond abrasive grains to 1.33 or less.
  • the polishing pad of the present invention both processing efficiency and finished flatness can be achieved at a high level. Therefore, the polishing pad can flatten the surface of the object to be polished such as a glass substrate in a short time.

Abstract

The purpose of the present invention is to provide a polishing pad that is capable of achieving a good balance between processing efficiency and finish flatness at high levels. A polishing pad according to the present invention has a base and a polishing layer that is laminated on the front surface of the base. This polishing pad is characterized in that: the polishing layer comprises a binder that is mainly composed of a resin or an inorganic material and diamond abrasive grains that are dispersed in the binder; and the diamond abrasive grains have an average shape factor of from 1 to 1.33 (inclusive). It is preferable that a main component of the binder is a thermosetting resin or a photocurable resin. It is preferable that a main component of the binder is a silicate salt. It is preferable that the polishing layer has a plurality of projected portions in the front surface and the plurality of projected portions are regularly arranged. It is preferable that an adhesive layer is provided on the back surface of the base. It is preferable that the adhesive layer is configured of an adhesive. It is preferable that the base has flexibility or ductility.

Description

研磨パッド及び研磨パッドの製造方法Polishing pad and polishing pad manufacturing method
 本発明は、研磨パッド及び研磨パッドの製造方法に関する。 The present invention relates to a polishing pad and a method for manufacturing the polishing pad.
 近年、ハードディスク等の電子機器の精密化が進んでいる。このような電子機器の基板材料には、小型化や薄型化に対応できる剛性、耐衝撃性及び耐熱性を考慮し、ガラス等が用いられる。 In recent years, electronic devices such as hard disks have been refined. As a substrate material for such an electronic device, glass or the like is used in consideration of rigidity, impact resistance, and heat resistance that can be reduced in size and thickness.
 このような基板(被研磨体)の加工は、主にラッピング加工とポリッシング加工とに大別される。まず、ラッピング加工においてダイヤモンド等の硬質粒子を用いた物理的な研磨加工が行われ、基板の厚さ制御や平坦化が行われる。次に、ポリッシング加工においてセリア等の微細粒子を用いた化学的な研磨加工が行われ、基板表面の平坦化精度向上が行われる。 Such processing of a substrate (object to be polished) is mainly divided into lapping processing and polishing processing. First, physical lapping using hard particles such as diamond is performed in lapping, and substrate thickness control and planarization are performed. Next, in the polishing process, a chemical polishing process using fine particles such as ceria is performed, and the planarization accuracy of the substrate surface is improved.
 一般に仕上がりの平坦化精度を向上しようとすると加工時間は長くなる傾向にあり、加工効率と平坦化精度とはトレードオフの関係となる。このため加工効率と平坦化精度とを両立することが難しい。これに対し、ラッピング加工時の加工効率と平坦化精度との両立のため、バインダーと砥粒とを含む研磨層を有し、その研磨層が凸状部を有する研磨パッドが提案されている(特表2002-542057号公報参照)。 Generally, when trying to improve the flattening accuracy of the finish, the processing time tends to be long, and the processing efficiency and the flattening accuracy are in a trade-off relationship. For this reason, it is difficult to achieve both processing efficiency and flattening accuracy. On the other hand, a polishing pad having a polishing layer containing a binder and abrasive grains and having a convex portion has been proposed in order to achieve both processing efficiency at the time of lapping and flattening accuracy ( (See JP-T 2002-542057).
 しかしながら、この従来技術の研磨パッドを用いても、加工効率と平坦化精度とが十分に両立しているとは言えず、さらに高い水準の加工効率と仕上がり平坦性との両立が要望されている。 However, even if this conventional polishing pad is used, it cannot be said that the processing efficiency and the flattening accuracy are sufficiently compatible, and a higher level of processing efficiency and finished flatness are both required. .
特表2002-542057号公報JP-T 2002-542057
 本発明は、上述のような事情に基づいてなされたものであり、加工効率と仕上がり平坦性とを高い水準で両立できる研磨パッドを提供することを目的とする。 The present invention has been made on the basis of the above-described circumstances, and an object thereof is to provide a polishing pad capable of achieving both processing efficiency and finished flatness at a high level.
 本発明者らは、鋭意検討した結果、平均形状係数が一定範囲内のダイヤモンド砥粒を用いることで被研磨体の加工効率と仕上がり平坦性とが高い水準で両立できることを見出し、本発明を完成させた。 As a result of intensive studies, the present inventors have found that the processing efficiency of the object to be polished and the finished flatness can be compatible at a high level by using diamond grains having an average shape factor within a certain range, and the present invention has been completed. I let you.
 すなわち、上記課題を解決するためになされた発明は、基材と、その表面側に積層される研磨層とを有する研磨パッドであって、上記研磨層が、樹脂又は無機物を主成分とするバインダー及びこのバインダー中に分散されるダイヤモンド砥粒を有し、上記ダイヤモンド砥粒の平均形状係数が、1以上1.33以下であることを特徴とする。 That is, the invention made to solve the above problems is a polishing pad having a base material and a polishing layer laminated on the surface thereof, wherein the polishing layer is a binder mainly composed of a resin or an inorganic substance. And diamond abrasive grains dispersed in the binder, wherein the diamond abrasive grains have an average shape factor of 1 or more and 1.33 or less.
 当該研磨パッドは、平均形状係数が上記範囲内のダイヤモンド砥粒を研磨層が有するので、被研磨体の加工効率と仕上がり平坦性とを高い水準で両立できる。従って、当該研磨パッドは、ガラス基板等の被研磨体の表面を短時間で平坦化することができる。 Since the polishing pad has diamond abrasive grains having an average shape factor within the above range, the polishing pad can achieve both high processing efficiency and finished flatness of the object to be polished. Therefore, the polishing pad can flatten the surface of the object to be polished such as a glass substrate in a short time.
 上記バインダーの主成分が熱硬化性樹脂又は光硬化性樹脂であるとよい。このようにバインダーの主成分が熱硬化性樹脂又は光硬化性樹脂とすることで、バインダーを構成した際にダイヤモンド砥粒の良好な分散性と基材への良好な密着性とが確保し易く、また研磨層の形成が容易である。その結果、研磨層の耐久性を向上できると共に研磨時の加工効率を向上できる。 The main component of the binder is preferably a thermosetting resin or a photocurable resin. Thus, when the binder is composed mainly of a thermosetting resin or a photocurable resin, it is easy to ensure good dispersibility of diamond abrasive grains and good adhesion to the substrate when the binder is constituted. Moreover, it is easy to form a polishing layer. As a result, the durability of the polishing layer can be improved and the processing efficiency during polishing can be improved.
 上記バインダーの主成分がケイ酸塩であるとよい。このようにバインダーの主成分をケイ酸塩とすることで、研磨層の研磨粒子保持力が向上できる。 The main component of the binder is preferably silicate. Thus, the abrasive particle retention power of a polishing layer can be improved by making the main component of a binder into a silicate.
 上記研磨層が表面に複数の凸状部を有し、上記複数の凸状部が規則的に配列されているとよい。このように上記研磨層が表面に複数の凸状部を有し、上記複数の凸状部が規則的に配列されていることで、研磨の異方性が低減され、被研磨面をさらに平坦化し易くできる。 The polishing layer may have a plurality of convex portions on the surface, and the plurality of convex portions may be regularly arranged. Thus, the polishing layer has a plurality of convex portions on the surface, and the plurality of convex portions are regularly arranged, so that the anisotropy of polishing is reduced and the surface to be polished is further flattened. Can be easily converted.
 上記基材の裏面側に接着層を有するとよい。このように上記基材の裏面側に接着層を有することで、研磨パッドを研磨装置に装着するための支持体に容易かつ確実に固定することができる。 It is good to have an adhesive layer on the back side of the substrate. Thus, by having an adhesive layer on the back side of the substrate, the polishing pad can be easily and reliably fixed to a support for mounting the polishing pad on a polishing apparatus.
 上記接着層が粘着剤で構成されるとよい。このように上記接着層を粘着剤で構成することで、支持体から研磨パッドを剥がして貼り替えることができるため研磨パッド及び支持体の再利用が容易になる。 The adhesive layer is preferably composed of an adhesive. Thus, by comprising the said adhesive layer with an adhesive, since a polishing pad can be peeled off from a support body and can be replaced, reuse of a polishing pad and a support body becomes easy.
 上記基材が可撓性又は延性を有するとよい。このように上記基材が可撓性又は延性を有することで、研磨パッドが被研磨体の表面形状に追従し、研磨面と被研磨体とが接触し易くなるため加工効率がさらに向上する。 It is preferable that the base material has flexibility or ductility. Thus, since the said base material has flexibility or ductility, since a polishing pad follows the surface shape of a to-be-polished body and it becomes easy to contact a grinding | polishing surface and a to-be-polished body, processing efficiency further improves.
 上記課題を解決するためになされた別の発明は、基材と、その表面側に積層される研磨層とを有する研磨パッドの製造方法であって、上記研磨層を研磨層用組成物の印刷により形成する工程を備え、上記研磨層形成工程で、樹脂又は無機物を主成分とするバインダー成分及び平均形状係数が1以上1.33以下であるダイヤモンド砥粒を有する研磨層用組成物を用いることを特徴とする。 Another invention made to solve the above problems is a method for producing a polishing pad having a substrate and a polishing layer laminated on the surface thereof, and the polishing layer is printed on the polishing layer composition. A polishing layer composition comprising a binder component mainly composed of a resin or an inorganic substance and diamond abrasive grains having an average shape factor of 1 or more and 1.33 or less. It is characterized by.
 当該研磨パッドの製造方法は、研磨層を研磨層用組成物の印刷により形成できるので、製造効率がよい。また、当該研磨パッドの製造方法は、平均形状係数が1以上1.33以下であるダイヤモンド砥粒を有する研磨層を形成するので、被研磨体の加工効率と仕上がり平坦性とを高い水準で両立できる研磨パッドを製造できる。 The manufacturing method of the polishing pad has high manufacturing efficiency because the polishing layer can be formed by printing the composition for polishing layer. Moreover, since the manufacturing method of the said polishing pad forms the polishing layer which has a diamond abrasive grain whose average shape factor is 1 or more and 1.33 or less, it is compatible with the processing efficiency and finished flatness of a to-be-polished body at a high level. A polishing pad can be manufactured.
 ここで、「平均形状係数」とは、砥粒の投影面に外接する円の直径をD(μm)、砥粒の投影面の面積をA(μm)とするとき、(D/A)×(π/4)で表される量の平均値である。 Here, the “average shape factor” is (D 2 / A) where D (μm) is the diameter of a circle circumscribing the projection surface of the abrasive grains, and A (μm 2 ) is the area of the projection surface of the abrasive grains. ) × (π / 4).
 以上説明したように、本発明の研磨パッドによれば、加工効率と仕上がり平坦性とが高い水準で両立できる。従って、当該研磨パッドは、ガラス基板等の被研磨体の表面を短時間で平坦化することができる。 As described above, according to the polishing pad of the present invention, both processing efficiency and finished flatness can be achieved at a high level. Therefore, the polishing pad can flatten the surface of the object to be polished such as a glass substrate in a short time.
本発明の実施形態に係る研磨パッドを示す模式的平面図である。1 is a schematic plan view showing a polishing pad according to an embodiment of the present invention. 図1AのA-A線での模式的端面図である。FIG. 1B is a schematic end view taken along line AA in FIG. 1A. 図1Bとは異なる実施形態の研磨パッドを示す模式的端面図である。It is a typical end elevation showing a polishing pad of an embodiment different from Drawing 1B.
[第一実施形態]
 以下、本発明の実施の形態を適宜図面を参照しつつ詳説する。
[First embodiment]
Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings as appropriate.
<研磨パッド>
 図1A及び図1Bに示す研磨パッド1は、樹脂製の基材10と、この基材10の表面側に積層される研磨層20と、基材10の裏面側に積層される接着層30とを備える。
<Polishing pad>
A polishing pad 1 shown in FIGS. 1A and 1B includes a resin-made base material 10, a polishing layer 20 laminated on the front surface side of the base material 10, and an adhesive layer 30 laminated on the back surface side of the base material 10. Is provided.
(基材)
 上記基材10は、研磨層20を支持するための板状の部材である。
(Base material)
The substrate 10 is a plate-like member for supporting the polishing layer 20.
 上記基材10の材質としては、特に限定されないが、ポリエチレンテレフタレート(PET)、ポリプロピレン(PP)、ポリエチレン(PE)、ポリイミド(PI)、ポリエチレンナフタレート(PEN)、アラミド、アルミニウム、銅等が挙げられる。中でも研磨層20との接着性が良好なPET、PIが好ましい。また、基材10の表面に化学処理、コロナ処理、プライマー処理等の接着性を高める処理が行われてもよい。 Although it does not specifically limit as a material of the said base material 10, A polyethylene terephthalate (PET), a polypropylene (PP), a polyethylene (PE), a polyimide (PI), a polyethylene naphthalate (PEN), an aramid, aluminum, copper etc. are mentioned. It is done. Among these, PET and PI that have good adhesion to the polishing layer 20 are preferable. Moreover, the process which improves adhesiveness, such as a chemical process, a corona process, and a primer process, may be performed on the surface of the base material 10.
 上記基材10は可撓性又は延性を有するとよい。このように上記基材10が可撓性又は延性を有することで、研磨パッド1が被研磨体の表面形状に追従し、研磨面と被研磨体とが接触し易く加工効率がさらに向上する。このような可撓性を有する基材10の材質としては、例えばPETやPIを挙げることができる。また、延性を有する基材10の材質としては、アルミニウムや銅を挙げることができる。 The base material 10 may be flexible or ductile. Thus, since the base material 10 has flexibility or ductility, the polishing pad 1 follows the surface shape of the object to be polished, and the polishing surface and the object to be polished are easily in contact with each other, thereby further improving the processing efficiency. Examples of the material of the flexible base material 10 include PET and PI. Moreover, aluminum and copper can be mentioned as a material of the base material 10 which has ductility.
 上記基材10の形状及び大きさとしては、特に制限されないが、例えば150mm×150mmの方形状や外径637mm及び内径234mmの円環状とすることができる。また、平面上に並置した複数の基材10が単一の支持体により支持される構成であってもよい。 The shape and size of the substrate 10 are not particularly limited, but may be, for example, a 150 mm × 150 mm square shape or an annular shape having an outer diameter of 637 mm and an inner diameter of 234 mm. Moreover, the structure by which the several base material 10 juxtaposed on the plane is supported by a single support body may be sufficient.
 上記基材10の平均厚さとしては、特に制限されないが、例えば75μm以上1mm以下とできる。上記基材10の平均厚さが上記下限未満である場合、当該研磨パッド1の強度や平坦性が不足するおそれがある。一方、上記基材10の平均厚さが上記上限を超える場合、当該研磨パッド1が不要に厚くなり取扱いが困難になるおそれがある。 The average thickness of the substrate 10 is not particularly limited, but can be, for example, 75 μm or more and 1 mm or less. When the average thickness of the substrate 10 is less than the lower limit, the polishing pad 1 may have insufficient strength and flatness. On the other hand, when the average thickness of the substrate 10 exceeds the upper limit, the polishing pad 1 is unnecessarily thick and may be difficult to handle.
(研磨層)
 研磨層20は、バインダー21及びこのバインダー21中に分散されるダイヤモンド砥粒22を有する。また、上記研磨層20は表面に複数の凸状部23を有する。
(Polishing layer)
The polishing layer 20 has a binder 21 and diamond abrasive grains 22 dispersed in the binder 21. The polishing layer 20 has a plurality of convex portions 23 on the surface.
 上記研磨層20の平均厚さ(凸状部23部分のみの平均厚さ)は特に制限されないが、上記研磨層20の平均厚さの下限としては、100μmが好ましく、130μmがより好ましい。また、上記研磨層20の平均厚さの上限としては、1000μmが好ましく、800μmがより好ましい。上記研磨層20の平均厚さが上記下限未満である場合、研磨層20の耐久性が不足するおそれがある。一方、上記研磨層20の平均厚さが上記上限を超える場合、当該研磨パッド1が不要に厚くなり取扱いが困難になるおそれがある。 The average thickness of the polishing layer 20 (average thickness of only the convex portion 23) is not particularly limited, but the lower limit of the average thickness of the polishing layer 20 is preferably 100 μm, and more preferably 130 μm. The upper limit of the average thickness of the polishing layer 20 is preferably 1000 μm, and more preferably 800 μm. When the average thickness of the polishing layer 20 is less than the lower limit, the durability of the polishing layer 20 may be insufficient. On the other hand, when the average thickness of the polishing layer 20 exceeds the upper limit, the polishing pad 1 is unnecessarily thick and may be difficult to handle.
(バインダー)
 上記バインダー21は、樹脂又は無機物を主成分とする。
(binder)
The binder 21 contains a resin or an inorganic material as a main component.
 上記樹脂としては、特に限定されないが、熱硬化性樹脂及び光硬化性樹脂が好ましい。熱硬化性樹脂としては、ポリウレタン、ポリフェノール、エポキシ樹脂、ポリエステル、セルロース、エチレン共重合体、ポリビニルアセタール、ポリアクリル、アクリルエステル樹脂、ポリビニルアルコール、ポリ塩化ビニル、ポリ酢酸ビニル、ポリアミド等を挙げることができる。また、光硬化性樹脂としては、アクリルエステル樹脂、ウレタンアクリレート樹脂、ビニルエステル樹脂、ポリエステル・アルキド等を挙げることができる。中でも熱硬化性エポキシ樹脂が好ましい。熱硬化性エポキシ樹脂は、バインダー21を構成する際にダイヤモンド砥粒22の良好な分散性と基材10への良好な密着性とが確保し易い。また、紫外線硬化剤を添加した紫外線硬化性樹脂やポリアクリル等の熱可塑性樹脂に硬化剤を添加した樹脂を用いても同様にダイヤモンド砥粒22の良好な分散性と基材10への良好な密着性とが確保し易い。また、上記バインダー21の樹脂は、少なくとも一部が架橋していてもよい。 The resin is not particularly limited, but a thermosetting resin and a photocurable resin are preferable. Examples of the thermosetting resin include polyurethane, polyphenol, epoxy resin, polyester, cellulose, ethylene copolymer, polyvinyl acetal, polyacryl, acrylic ester resin, polyvinyl alcohol, polyvinyl chloride, polyvinyl acetate, and polyamide. it can. Examples of the photocurable resin include acrylic ester resins, urethane acrylate resins, vinyl ester resins, polyester alkyds, and the like. Of these, thermosetting epoxy resins are preferred. When the thermosetting epoxy resin constitutes the binder 21, it is easy to ensure good dispersibility of the diamond abrasive grains 22 and good adhesion to the substrate 10. Moreover, even if it uses the resin which added the hardening | curing agent to the ultraviolet curable resin which added the ultraviolet curing agent, or thermoplastic resins, such as a polyacryl, the good dispersibility of the diamond abrasive grain 22 and the favorable to the base material 10 are similarly obtained. Adhesion is easy to ensure. The resin of the binder 21 may be at least partially crosslinked.
 上記無機物としては、ケイ酸塩、リン酸塩、多価金属アルコキシド等を挙げることができる。中でも研磨層20の研磨粒子保持力に優れるケイ酸塩が好ましい。 Examples of the inorganic substance include silicate, phosphate, and polyvalent metal alkoxide. Of these, silicates that are excellent in the abrasive particle retention of the polishing layer 20 are preferred.
 上記バインダー21には、分散剤、カップリング剤、界面活性剤、潤滑剤、消泡剤、着色剤等の各種助剤及び添加剤等を目的に応じて適宜含有させてもよい。 The binder 21 may appropriately contain various auxiliaries and additives such as a dispersant, a coupling agent, a surfactant, a lubricant, an antifoaming agent, and a colorant depending on the purpose.
(砥粒)
 上記ダイヤモンド砥粒22の平均粒子径の下限としては、1μmが好ましく、3μmがより好ましい。また、上記ダイヤモンド砥粒22の平均粒子径の上限としては、20μmが好ましく、15μmがより好ましい。上記ダイヤモンド砥粒22の平均粒子径が上記下限未満である場合、研磨レートが不十分となるおそれがある。一方、上記ダイヤモンド砥粒22の平均粒子径が上記上限を超える場合、被研磨体が傷付くおそれがある。
(Abrasive grains)
The lower limit of the average particle diameter of the diamond abrasive grains 22 is preferably 1 μm and more preferably 3 μm. Moreover, as an upper limit of the average particle diameter of the said diamond abrasive grain 22, 20 micrometers is preferable and 15 micrometers is more preferable. When the average particle diameter of the diamond abrasive grains 22 is less than the lower limit, the polishing rate may be insufficient. On the other hand, when the average particle diameter of the diamond abrasive grains 22 exceeds the upper limit, the object to be polished may be damaged.
 上記ダイヤモンド砥粒22の平均形状係数の下限としては、1である。また、上記ダイヤモンド砥粒22の平均形状係数の上限としては、1.33であり、1.3がより好ましい。上記ダイヤモンド砥粒22の平均形状係数が上記上限を超える場合、被研磨体の加工効率と仕上がり平坦性との高い水準での両立が困難となるおそれがある。なお、上記ダイヤモンド砥粒22の平均形状係数は、その定義から1未満とはならない。 The lower limit of the average shape factor of the diamond abrasive grains 22 is 1. Moreover, as an upper limit of the average shape factor of the said diamond abrasive grain 22, it is 1.33, and 1.3 is more preferable. When the average shape factor of the diamond abrasive grains 22 exceeds the above upper limit, it may be difficult to achieve both high processing efficiency and finished flatness of the object to be polished. The average shape factor of the diamond abrasive grains 22 is not less than 1 from the definition.
 上記ダイヤモンド砥粒22の研磨層20に対する含有量の下限としては、35質量%が好ましく、40質量%がより好ましい。また、上記ダイヤモンド砥粒22の研磨層20に対する含有量の上限としては、70質量%が好ましく、65質量%がより好ましい。上記ダイヤモンド砥粒22の研磨層20に対する含有量が上記下限未満である場合、研磨層20の研磨力が不足するおそれがある。一方、上記ダイヤモンド砥粒22の研磨層20に対する含有量が上記上限を超える場合、被研磨体が傷付くおそれがある。 The lower limit of the content of the diamond abrasive grains 22 with respect to the polishing layer 20 is preferably 35% by mass, and more preferably 40% by mass. Moreover, as an upper limit of content with respect to the polishing layer 20 of the said diamond abrasive grain 22, 70 mass% is preferable and 65 mass% is more preferable. When the content of the diamond abrasive grains 22 with respect to the polishing layer 20 is less than the lower limit, the polishing power of the polishing layer 20 may be insufficient. On the other hand, when the content of the diamond abrasive grains 22 with respect to the polishing layer 20 exceeds the upper limit, the object to be polished may be damaged.
(凸状部)
 上記研磨層20は、表面に等間隔の格子状に配設される複数の凸状部23を有する。上記複数の凸状部23の形状は、規則的に配列されたブロックパターン状である。研磨層20の凸状部23以外の部分(溝部)の底面は、基材10の表面で構成される。
(Convex part)
The polishing layer 20 has a plurality of convex portions 23 arranged on the surface in a lattice pattern with equal intervals. The shapes of the plurality of convex portions 23 are regularly arranged block pattern shapes. The bottom surface of the portion (groove portion) other than the convex portion 23 of the polishing layer 20 is constituted by the surface of the substrate 10.
 上記凸状部23の平均面積の下限としては、0.5mmが好ましく、1mmがより好ましい。また、上記凸状部23の平均面積の上限としては、3mmが好ましく、2.5mmがより好ましい。上記凸状部23の平均面積が上記下限未満である場合、研磨層20の凸状部23が剥離するおそれがある。一方、上記凸状部23の平均面積が上記上限を超える場合、研磨層20の研磨時の摩擦抵抗が高くなり、被研磨体が傷付くおそれがある。 The lower limit of the average area of the convex portion 23 is preferably 0.5 mm 2, 1 mm 2 is more preferable. The upper limit of the average area of the convex portions 23 is preferably 3 mm 2, 2.5 mm 2 is more preferable. When the average area of the convex portion 23 is less than the lower limit, the convex portion 23 of the polishing layer 20 may be peeled off. On the other hand, when the average area of the convex portion 23 exceeds the above upper limit, the frictional resistance during polishing of the polishing layer 20 increases, and the object to be polished may be damaged.
 上記複数の凸状部23の上記研磨層20全体に対する面積占有率の下限としては、15%が好ましく、20%がより好ましい。また、上記複数の凸状部23の上記研磨層20全体に対する面積占有率の上限としては、40%が好ましく、35%がより好ましい。上記複数の凸状部23の上記研磨層20全体に対する面積占有率が上記下限未満である場合、研磨層20の凸状部23が剥離するおそれがある。一方、上記複数の凸状部23の上記研磨層20全体に対する面積占有率が上記上限を超える場合、研磨層20の研磨時の摩擦抵抗が高くなり被研磨体が傷付くおそれがある。なお、「研磨層全体の面積」は、研磨層の空隙の面積も含む概念である。 The lower limit of the area occupation ratio of the plurality of convex portions 23 with respect to the entire polishing layer 20 is preferably 15% and more preferably 20%. Moreover, as an upper limit of the area occupation rate with respect to the said whole polishing layer 20 of the said some convex-shaped part 23, 40% is preferable and 35% is more preferable. When the area occupation ratio of the plurality of convex portions 23 with respect to the entire polishing layer 20 is less than the lower limit, the convex portions 23 of the polishing layer 20 may be peeled off. On the other hand, when the area occupancy ratio of the plurality of convex portions 23 with respect to the entire polishing layer 20 exceeds the upper limit, the frictional resistance during polishing of the polishing layer 20 is increased and the object to be polished may be damaged. The “area of the entire polishing layer” is a concept including the area of voids in the polishing layer.
(接着層)
 接着層30は、当該研磨パッド1を支持し研磨装置に装着するための支持体に当該研磨パッド1を固定する層である。
(Adhesive layer)
The adhesive layer 30 is a layer that supports the polishing pad 1 and fixes the polishing pad 1 to a support for mounting on the polishing apparatus.
 この接着層30に用いられる接着剤としては、特に限定されないが、例えば反応型接着剤、瞬間接着剤、ホットメルト接着剤、粘着剤等が挙げられる。 The adhesive used for the adhesive layer 30 is not particularly limited, and examples thereof include a reactive adhesive, an instantaneous adhesive, a hot melt adhesive, and an adhesive.
 この接着層30に用いられる接着剤としては、粘着剤が好ましい。接着層30に用いられる接着剤として粘着剤を用いることで、支持体から当該研磨パッド1を剥がして貼り替えることができるため当該研磨パッド1及び支持体の再利用が容易になる。このような粘着剤としては、特に限定されないが、例えばアクリル系粘着剤、アクリル-ゴム系粘着剤、天然ゴム系粘着剤、ブチルゴム系等の合成ゴム系粘着剤、シリコーン系粘着剤、ポリウレタン系粘着剤、エポキシ系粘着剤、ポリエチレン系粘着剤、ポリエステル系粘着剤等が挙げられる。 As the adhesive used for the adhesive layer 30, a pressure-sensitive adhesive is preferable. By using a pressure-sensitive adhesive as the adhesive used for the adhesive layer 30, the polishing pad 1 and the support can be easily reused because the polishing pad 1 can be peeled off from the support and replaced. Such an adhesive is not particularly limited. For example, an acrylic adhesive, an acrylic-rubber adhesive, a natural rubber adhesive, a synthetic rubber adhesive such as butyl rubber, a silicone adhesive, and a polyurethane adhesive. Agents, epoxy adhesives, polyethylene adhesives, polyester adhesives, and the like.
 接着層30の平均厚さの下限としては、0.05mmが好ましく、0.1mmがより好ましい。また、接着層30の平均厚さの下限としては、0.3mmが好ましく、0.2mmがより好ましい。接着層30の平均厚さが上記下限未満である場合、接着力が不足し、研磨パッド1が支持体から剥離するおそれがある。一方、接着層30の平均厚さが上記上限を超える場合、例えば接着層30の厚みのため当該研磨パッド1を所望する形状に切る際に支障をきたすなど、作業性が低下するおそれがある。 The lower limit of the average thickness of the adhesive layer 30 is preferably 0.05 mm, more preferably 0.1 mm. Moreover, as a minimum of the average thickness of the contact bonding layer 30, 0.3 mm is preferable and 0.2 mm is more preferable. When the average thickness of the adhesive layer 30 is less than the above lower limit, the adhesive force is insufficient and the polishing pad 1 may be peeled off from the support. On the other hand, when the average thickness of the adhesive layer 30 exceeds the above upper limit, for example, due to the thickness of the adhesive layer 30, there is a risk that workability may be lowered, such as causing trouble when the polishing pad 1 is cut into a desired shape.
(研磨パッドの製造方法)
 当該研磨パッド1は、研磨層用組成物を準備する工程、及び上記研磨層20を研磨層用組成物の印刷により形成する工程により製造できる。
(Polishing pad manufacturing method)
The polishing pad 1 can be manufactured by a step of preparing a polishing layer composition and a step of forming the polishing layer 20 by printing the polishing layer composition.
 まず、研磨層用組成物準備工程において、研磨層用組成物(バインダー21の形成材料及びダイヤモンド砥粒22)を溶剤に分散させた溶液を塗工液として準備する。上記溶剤としては、バインダー21の形成材料が可溶であれば特に限定されない。具体的には、メチルエチルケトン(MEK)、イソホロン、テルピネオール、Nメチルピロリドン、シクロヘキサノン、プロピレンカーボネート等を用いることができる。塗工液の粘度や流動性を制御するために、水、アルコール、ケトン、酢酸エステル、芳香族化合物等の希釈剤等を添加してもよい。 First, in the polishing layer composition preparation step, a solution in which the polishing layer composition (the material for forming the binder 21 and the diamond abrasive grains 22) is dispersed in a solvent is prepared as a coating solution. The solvent is not particularly limited as long as the material for forming the binder 21 is soluble. Specifically, methyl ethyl ketone (MEK), isophorone, terpineol, N methylpyrrolidone, cyclohexanone, propylene carbonate, or the like can be used. In order to control the viscosity and fluidity of the coating liquid, a diluent such as water, alcohol, ketone, acetate ester and aromatic compound may be added.
 次に、研磨層形成工程において、上記研磨層用組成物準備工程で準備した塗工液を基材10表面に塗布し、印刷法により凸状部23を有する研磨層20を形成する。この凸状部23を形成するために、凸状部23の形状に対応する形状を有するマスクを用いる。このマスクを用いて上記塗工液を塗工(印刷)する。この塗工方式としては、例えばバーコーティング、リバースロールコーティング、ナイフコーティング、スクリーン印刷、グラビアコーティング、ダイコーティング等を用いることができる。そして、塗布した塗工液を乾燥及び反応硬化させることで研磨層20を形成する。具体的には、例えば100℃以上120℃以下の熱で塗工液の溶媒を蒸発させた後、80℃以上120℃以下の熱で塗工液の溶剤を硬化させ、バインダー21を形成する。 Next, in the polishing layer formation step, the coating liquid prepared in the polishing layer composition preparation step is applied to the surface of the base material 10, and the polishing layer 20 having the convex portions 23 is formed by a printing method. In order to form the convex portion 23, a mask having a shape corresponding to the shape of the convex portion 23 is used. The coating liquid is applied (printed) using this mask. As this coating method, for example, bar coating, reverse roll coating, knife coating, screen printing, gravure coating, die coating and the like can be used. Then, the polishing layer 20 is formed by drying and reaction-curing the applied coating liquid. Specifically, for example, after the solvent of the coating liquid is evaporated by heat of 100 ° C. or higher and 120 ° C. or lower, the solvent of the coating liquid is cured by heat of 80 ° C. or higher and 120 ° C. or lower to form the binder 21.
(利点)
 当該研磨パッド1は、平均形状係数が1以上1.33以下のダイヤモンド砥粒22を研磨層20が有するので、被研磨体の加工効率と仕上がり平坦性とを高い水準で両立できる。従って、当該研磨パッド1は、ガラス基板等の被研磨体の表面を短時間で平坦化することができる。また、当該研磨パッド1は、上記研磨層20が表面に複数の凸状部23を有し、上記複数の凸状部23の形状が規則的に配列されたブロックパターン状であることで、研磨の異方性が低減され、被研磨面をさらに平坦化し易くできる。また、当該研磨パッド1は、上記基材10の裏面側に接着層30を有することで、当該研磨パッド1を研磨装置に装着するための支持体に容易かつ確実に固定することができる。さらに、当該研磨パッド1の製造方法は、研磨層20を研磨層用組成物の印刷により形成できるので、製造効率がよい。
(advantage)
In the polishing pad 1, since the polishing layer 20 has diamond abrasive grains 22 having an average shape factor of 1 or more and 1.33 or less, the processing efficiency of the object to be polished and the finished flatness can be achieved at a high level. Therefore, the polishing pad 1 can flatten the surface of the object to be polished such as a glass substrate in a short time. Further, the polishing pad 1 has a block pattern shape in which the polishing layer 20 has a plurality of convex portions 23 on the surface, and the shapes of the plurality of convex portions 23 are regularly arranged. The anisotropy is reduced, and the surface to be polished can be further flattened. Moreover, the said polishing pad 1 can be easily and reliably fixed to the support body with which the said polishing pad 1 is mounted | worn with a polishing apparatus by having the contact bonding layer 30 on the back surface side of the said base material 10. FIG. Furthermore, since the manufacturing method of the said polishing pad 1 can form the polishing layer 20 by printing of the composition for polishing layers, manufacturing efficiency is good.
[その他の実施形態]
 本発明は上記実施形態に限定されるものではなく、上記態様の他、種々の変更、改良を施した態様で実施することができる。上記実施形態では、凸状部を等間隔の格子状に構成したが、格子の間隔は、等間隔でなくともよく、例えば縦方向と横方向とで間隔を変えてもよい。ただし、凸状部の間隔が異なる場合、研磨に異方性が生じるおそれがあるため、等間隔が好ましい。また、凸状部の平面形状は格子状でなくともよく、例えば四角形以外の多角形が繰り返される形状、円形状、平行な線を複数有する形状等であってもよい。
[Other Embodiments]
The present invention is not limited to the above-described embodiment, and can be implemented in a mode in which various changes and improvements are made in addition to the above-described mode. In the above-described embodiment, the convex portions are configured in an equally spaced grid pattern. However, the grid spacing does not have to be evenly spaced. For example, the spacing may be changed between the vertical direction and the horizontal direction. However, when the intervals between the convex portions are different, anisotropy may occur in the polishing, and therefore equal intervals are preferable. Further, the planar shape of the convex portion may not be a lattice shape, and may be, for example, a shape in which a polygon other than a quadrangle is repeated, a circular shape, a shape having a plurality of parallel lines, or the like.
 また、上記実施形態において、上記複数の溝部の底面が基材の表面である構成としたが、溝部の深さが研磨層の平均厚さよりも小さく、溝部が基材の表面に達さなくともよい。その場合、溝部の深さは、研磨層の平均厚さの50%以上とできる。溝部の深さが上記下限未満である場合、摩耗による溝部が消失するおそれがあり、研磨パッドが耐久性に劣る場合がある。 Moreover, in the said embodiment, although it was set as the structure which the bottom face of said several groove part is the surface of a base material, even if the depth of a groove part is smaller than the average thickness of an abrasive layer, and a groove part does not reach the surface of a base material, Good. In that case, the depth of the groove can be 50% or more of the average thickness of the polishing layer. When the depth of the groove is less than the above lower limit, the groove due to wear may be lost, and the polishing pad may be inferior in durability.
 上記実施形態において、凸状部の形成方法としてマスクを用いる方法を示したが、基材表面の全面に研磨層用組成物を印刷した後、エッチング加工やレーザー加工等により凸状部を形成してもよい。 In the above embodiment, a method using a mask was shown as a method for forming the convex portion. However, after the polishing layer composition is printed on the entire surface of the substrate, the convex portion is formed by etching or laser processing. May be.
 また、上記実施形態において、研磨層が凸状部を有する構成としたが、凸状部は必須の構成要素ではない。例えば基材表面に研磨層を一様に積層してもよい。 In the above embodiment, the polishing layer has a convex portion, but the convex portion is not an essential component. For example, a polishing layer may be uniformly laminated on the substrate surface.
 さらに、図2に示すように当該研磨パッド2は裏面側の接着層30を介して積層される支持体40及びその支持体40の裏面側に積層される第二接着層31を備えてもよい。当該研磨パッド2が支持体40を備えることにより、当該研磨パッド2の取扱いが容易となる。 Further, as shown in FIG. 2, the polishing pad 2 may include a support 40 laminated via an adhesive layer 30 on the back side and a second adhesive layer 31 laminated on the back side of the support 40. . When the polishing pad 2 includes the support body 40, the polishing pad 2 can be easily handled.
 上記支持体40の材質としては、ポリプロピレン、ポリエチレン、ポリテトラフルオロエチレン、ポリ塩化ビニル等の熱可塑性を有する樹脂やポリカーボネート、ポリアミド、ポリエチレンテレフタレート等のエンジニアリングプラスチックを挙げることができる。上記支持体40にこのような材質を用いることにより上記支持体40が可撓性を有し、当該研磨パッド2が被研磨体の表面形状に追従し、研磨面と被研磨体とが接触し易くなるため加工効率がさらに向上する。 Examples of the material of the support 40 include thermoplastic resins such as polypropylene, polyethylene, polytetrafluoroethylene, and polyvinyl chloride, and engineering plastics such as polycarbonate, polyamide, and polyethylene terephthalate. By using such a material for the support 40, the support 40 has flexibility, the polishing pad 2 follows the surface shape of the object to be polished, and the polishing surface and the object to be polished come into contact with each other. Since it becomes easy, processing efficiency further improves.
 上記支持体40の平均厚さとしては、例えば0.5mm以上2mm以下とすることができる。上記支持体40の平均厚さが上記下限未満である場合、当該研磨パッド2の強度が不足するおそれがある。一方、上記支持体40の平均厚さが上記上限を超える場合、上記支持体40を研磨装置に取り付け難くなるおそれや上記支持体40の可撓性が不足するおそれがある。 The average thickness of the support 40 can be, for example, 0.5 mm or more and 2 mm or less. When the average thickness of the support 40 is less than the lower limit, the strength of the polishing pad 2 may be insufficient. On the other hand, when the average thickness of the support 40 exceeds the upper limit, it may be difficult to attach the support 40 to a polishing apparatus or the flexibility of the support 40 may be insufficient.
 以下、実施例及び比較例を挙げて本発明をさらに詳細に説明するが、当該発明は以下の実施例に限定されるものではない。 Hereinafter, the present invention will be described in more detail with reference to examples and comparative examples, but the present invention is not limited to the following examples.
[実施例1]
 ダイヤモンド砥粒(ランズ社の「LSシリーズ」)を用意し、マルバーン社「モルフォロギG3」を用いて平均粒径及び平均形状係数を計測した。その結果を表1に示す。
[Example 1]
Diamond abrasive grains ("LS series" from Lands) were prepared, and average particle diameter and average shape factor were measured using Malvern "Morphology G3". The results are shown in Table 1.
 エポキシ樹脂(三菱化学株式会社の「JER828」)に希釈溶剤(イソホロン)、硬化剤(三菱化学株式会社の「YH306」及び四国化成工業株式会社の「キュアゾール1B2MZ」)及び上記ダイヤモンド砥粒を加えて混合し、ダイヤモンド砥粒の研磨層に対する含有量が55質量%となるよう調整し塗工液を得た。 Add epoxy solvent ("JER828" from Mitsubishi Chemical Corporation), diluting solvent (isophorone), curing agent ("YH306" from Mitsubishi Chemical Corporation and "Cureazole 1B2MZ" from Shikoku Kasei Corporation) and the above diamond abrasive The mixture was mixed and adjusted so that the content of the diamond abrasive grains with respect to the polishing layer was 55% by mass to obtain a coating solution.
 基材として平均厚さ75μmのPETフィルム(帝人デュポンフィルム株式会社の「メリネックスS」)を用い、この基材の表面に印刷により凸状部を有する研磨層を形成した。なお、印刷のパターンとして凸状部に対応するマスクを用いることで、研磨層に凸状部を形成した。凸状部は、平面視で1辺1.5mmの正方形状とし、平均厚さを135μmとした。凸状部は規則的に配列されたブロックパターン状とし、凸状部の研磨層全体に対する面積占有率は36%とした。 A PET film (“Melenex S” manufactured by Teijin DuPont Films Ltd.) having an average thickness of 75 μm was used as a substrate, and a polishing layer having convex portions was formed on the surface of the substrate by printing. In addition, the convex part was formed in the grinding | polishing layer by using the mask corresponding to a convex part as a printing pattern. The convex portion had a square shape with a side of 1.5 mm in plan view and an average thickness of 135 μm. The convex portions were in the form of regularly arranged block patterns, and the area occupation ratio of the convex portions with respect to the entire polishing layer was 36%.
 また、研磨パッドを支持し研磨装置に固定する支持体として平均厚さ1mmの硬質塩化ビニル樹脂板(タキロン株式会社の「SP770」)を用い、上記基材の裏面と上記支持体の表面とを平均厚さ130μmの粘着材で貼り合わせた。上記粘着材としては、両面テープ(積水化学株式会社の「#5605HGD」)を用いた。 Further, a hard vinyl chloride resin plate (“SP770” from Takiron Co., Ltd.) having an average thickness of 1 mm is used as a support that supports the polishing pad and is fixed to the polishing apparatus, and the back surface of the substrate and the surface of the support are It bonded together with the adhesive material of average thickness 130micrometer. A double-sided tape (“# 5605HGD” from Sekisui Chemical Co., Ltd.) was used as the adhesive material.
[実施例2、3、比較例1~3]
 実施例1のダイヤモンド砥粒の平均粒径及び平均形状係数を表1のように変化させて、実施例2、3及び比較例1~3を得た。
[Examples 2 and 3, Comparative Examples 1 to 3]
Examples 2 and 3 and Comparative Examples 1 to 3 were obtained by changing the average grain size and average shape factor of the diamond abrasive grains of Example 1 as shown in Table 1.
[実施例4]
 実施例1と同様のダイヤモンド砥粒を用い、このダイヤモンド砥粒にケイ酸塩(富士化学株式会社の「ケイ酸ソーダ シールブランド」)及び硬化剤(神戸理化学工業株式会社の「リカセットNo.5」)を混合し、ダイヤモンド砥粒の含有量が65質量%、ケイ酸塩の含有量が34質量%、及び硬化剤の含有量が1質量%となるように調整し、成型液を得た。
[Example 4]
The same diamond abrasive grains as in Example 1 were used, and the silicate ("Sodium silicate seal brand" of Fuji Chemical Co., Ltd.) and the curing agent ("Recassette No. 5" of Kobe Riken Co., Ltd.) were used. )) Was mixed and adjusted so that the content of diamond abrasive grains was 65% by mass, the content of silicate was 34% by mass, and the content of curing agent was 1% by mass to obtain a molding liquid. .
 1辺3mmの正方形状で深さ1mmのポリテトラフルオロエチレンの樹脂型に上記成型液を流し込み、90℃で1hr以上脱水した後、樹脂型から離型し、300℃で1hr焼成することで凸状部を作製した。 The molding liquid is poured into a polytetrafluoroethylene resin mold having a side of 3 mm and a depth of 1 mm, dehydrated at 90 ° C. for 1 hour or more, then released from the resin mold, and fired at 300 ° C. for 1 hour. A shaped part was produced.
 基材として平均厚さ500μmのアルミニウム板を用い、この基材表面に、上記焼成により得られた凸状部を5mmピッチでブロックパターン状に配列し、無機接着剤(東亜合成株式会社の「アロンセラミックD」)により接着した。凸状部の研磨層全体に対する面積占有率は36%である。その後、WA#800砥石を用いて凸状部表面の平坦化を行った。 An aluminum plate having an average thickness of 500 μm was used as the base material, and the convex portions obtained by the firing were arranged in a block pattern at a pitch of 5 mm on the surface of the base material. Bonded with ceramic D "). The area occupation ratio of the convex portion with respect to the entire polishing layer is 36%. Then, the convex part surface was planarized using WA # 800 grindstone.
 また、研磨パッドを支持し研磨装置に固定する支持体として平均厚さ1mmの硬質塩化ビニル樹脂板(タキロン株式会社の「SP770」)を用い、上記基材の裏面と上記支持体の表面とを平均厚さ130μmの粘着材で貼り合わせた。上記粘着材としては、両面テープ(積水化学株式会社の「#5605HGD」)を用いた。 Further, a hard vinyl chloride resin plate (“SP770” from Takiron Co., Ltd.) having an average thickness of 1 mm is used as a support that supports the polishing pad and is fixed to the polishing apparatus, and the back surface of the substrate and the surface of the support are It bonded together with the adhesive material of average thickness 130micrometer. A double-sided tape (“# 5605HGD” from Sekisui Chemical Co., Ltd.) was used as the adhesive material.
[実施例5、比較例4]
 実施例4のダイヤモンド砥粒の平均粒径及び平均形状係数を表1のように変化させて、実施例5及び比較例4を得た。
[Example 5, Comparative Example 4]
Example 5 and Comparative Example 4 were obtained by changing the average particle size and average shape factor of the diamond abrasive grains of Example 4 as shown in Table 1.
[研磨条件]
 上記実施例1~5及び比較例1~4で得られた研磨パッドを用いて、ガラス基板の研磨を行った。上記ガラス基板には、直径6.25cm、比重2.4の3枚のソーダライムガラス(平岡特殊硝子製作株式会社製)を用いた。上記研磨には、市販の両面研磨機(日本エンギス株式会社「EJD-5B-3W」)を用いた。両面研磨機のキャリアは、厚さ0.6mmのエポキシガラスである。研磨は、研磨圧力を200g/cmとし、上定盤回転数60rpm、下定盤回転数90rpm及びSUNギア回転数30rpmの条件で15分間行った。その際、クーラントとして、株式会社モレスコの「ツールメイトGR-20」を毎分120cc供給した。
[Polishing conditions]
The glass substrate was polished using the polishing pads obtained in Examples 1 to 5 and Comparative Examples 1 to 4. Three soda lime glasses (made by Hiraoka Special Glass Manufacturing Co., Ltd.) having a diameter of 6.25 cm and a specific gravity of 2.4 were used for the glass substrate. A commercially available double-side polishing machine (Nippon Engis Co., Ltd. “EJD-5B-3W”) was used for the polishing. The carrier of the double-side polishing machine is an epoxy glass having a thickness of 0.6 mm. Polishing was performed at a polishing pressure of 200 g / cm 2 for 15 minutes under the conditions of an upper surface plate rotation speed of 60 rpm, a lower surface plate rotation speed of 90 rpm, and a SUN gear rotation speed of 30 rpm. At that time, 120 cc of “Tool Mate GR-20” supplied by Moresco Co., Ltd. was supplied as a coolant.
[評価方法]
 実施例1~5及び比較例1~4の研磨パッドを用いて研磨したガラス基板について、研磨レートと研磨後の被研磨体の表面粗さ(Ra)とを求め、加工効率と仕上がり平坦性との両立の評価として、上記研磨レートを上記表面粗さ(Ra)で除した値(両立水準)の評価を行った。この両立水準は研磨レートが高く加工効率が高い場合及び表面粗さが低く仕上がり平坦性が高い場合に大きな数値となり、加工効率と仕上がり平坦性との両立性の高さを示す。結果を表1に示す。なお、研磨レート及び表面粗さ(Ra)は以下に示す方法で求めた。
[Evaluation methods]
For the glass substrates polished using the polishing pads of Examples 1 to 5 and Comparative Examples 1 to 4, the polishing rate and the surface roughness (Ra) of the polished object were determined, and the processing efficiency and the finished flatness As the evaluation of coexistence, the value (compatibility level) obtained by dividing the polishing rate by the surface roughness (Ra) was evaluated. This level of compatibility becomes a large value when the polishing rate is high and the processing efficiency is high, and when the surface roughness is low and the finished flatness is high, and shows high compatibility between the working efficiency and the finished flatness. The results are shown in Table 1. The polishing rate and the surface roughness (Ra) were determined by the following methods.
(研磨レート)
 研磨レートについて、研磨前後のガラス基板の重量変化(g)を、ガラス基板の表面積(cm)、ガラス基板の比重(g/cm)及び研磨時間(分)で除し、算出した。
(Polishing rate)
The polishing rate was calculated by dividing the weight change (g) of the glass substrate before and after polishing by the surface area (cm 2 ) of the glass substrate, the specific gravity (g / cm 3 ) of the glass substrate, and the polishing time (minutes).
(表面粗さ)
 表面粗さについて、接触式表面粗さ計(株式会社ミツトヨの「S-3000」)を用い、表面及び裏面それぞれ任意の4カ所を測定し、合計8カ所の平均値を求めた。
(Surface roughness)
Regarding the surface roughness, a contact type surface roughness meter (“S-3000” manufactured by Mitutoyo Corporation) was used to measure any four locations on the front and back surfaces, and the average value of a total of 8 locations was determined.
Figure JPOXMLDOC01-appb-T000001
Figure JPOXMLDOC01-appb-T000001
 表1から研磨レートをRaで除した両立水準は、ダイヤモンド砥粒の砥粒平均粒径や砥粒量によらず、平均形状係数が1.33以下である実施例1~5で高く、平均形状係数が1.33を超える比較例1~4で低い。従って、ダイヤモンド砥粒の平均形状係数を1.33以下とすることで、加工効率と仕上がり平坦性とが高い水準で両立できることが分かる。 The coexistence level obtained by dividing the polishing rate by Ra from Table 1 is high in Examples 1 to 5 in which the average shape factor is 1.33 or less, regardless of the average grain size or the amount of the diamond abrasive grains. Low in Comparative Examples 1 to 4 where the shape factor exceeds 1.33. Therefore, it can be seen that the processing efficiency and the finished flatness can be compatible at a high level by setting the average shape factor of the diamond abrasive grains to 1.33 or less.
 本発明の研磨パッドによれば、加工効率と仕上がり平坦性とが高い水準で両立できる。従って、当該研磨パッドは、ガラス基板等の被研磨体の表面を短時間で平坦化することができる。 According to the polishing pad of the present invention, both processing efficiency and finished flatness can be achieved at a high level. Therefore, the polishing pad can flatten the surface of the object to be polished such as a glass substrate in a short time.
1、2 研磨パッド
10 基材
20 研磨層
21 バインダー
22 ダイヤモンド砥粒
23 凸状部
30 接着層
31 第二接着層
40 支持体
DESCRIPTION OF SYMBOLS 1, 2 Polishing pad 10 Base material 20 Polishing layer 21 Binder 22 Diamond abrasive grain 23 Convex part 30 Adhesive layer 31 Second adhesive layer 40 Support body

Claims (8)

  1.  基材と、その表面側に積層される研磨層とを有する研磨パッドであって、
     上記研磨層が、樹脂又は無機物を主成分とするバインダー及びこのバインダー中に分散されるダイヤモンド砥粒を有し、
     上記ダイヤモンド砥粒の平均形状係数が、1以上1.33以下であることを特徴とする研磨パッド。
    A polishing pad having a substrate and a polishing layer laminated on the surface side thereof,
    The polishing layer has a binder mainly composed of a resin or an inorganic substance and diamond abrasive grains dispersed in the binder,
    An average shape factor of the diamond abrasive grains is 1 or more and 1.33 or less.
  2.  上記バインダーの主成分が熱硬化性樹脂又は光硬化性樹脂である請求項1に記載の研磨パッド。 The polishing pad according to claim 1, wherein the main component of the binder is a thermosetting resin or a photocurable resin.
  3.  上記バインダーの主成分がケイ酸塩である請求項1に記載の研磨パッド。 The polishing pad according to claim 1, wherein the main component of the binder is silicate.
  4.  上記研磨層が、表面に複数の凸状部を有し、
     上記複数の凸状部が規則的に配列されている請求項1、請求項2又は請求項3に記載の研磨パッド。
    The polishing layer has a plurality of convex portions on the surface,
    The polishing pad according to claim 1, wherein the plurality of convex portions are regularly arranged.
  5.  上記基材の裏面側に接着層を有する請求項1から請求項4のいずれか1項に記載の研磨パッド。 The polishing pad according to any one of claims 1 to 4, further comprising an adhesive layer on the back side of the substrate.
  6.  上記接着層が粘着剤で構成される請求項5に記載の研磨パッド。 The polishing pad according to claim 5, wherein the adhesive layer is composed of an adhesive.
  7.  上記基材が可撓性又は延性を有する請求項1から請求項6のいずれか1項に記載の研磨パッド。 The polishing pad according to any one of claims 1 to 6, wherein the substrate has flexibility or ductility.
  8.  基材と、その表面側に積層される研磨層とを有する研磨パッドの製造方法であって、
     上記研磨層を研磨層用組成物の印刷により形成する工程を備え、
     上記研磨層形成工程で、樹脂又は無機物を主成分とするバインダー成分及び平均形状係数が1以上1.33以下であるダイヤモンド砥粒を有する研磨層用組成物を用いることを特徴とする研磨パッドの製造方法。
    A method for producing a polishing pad having a substrate and a polishing layer laminated on the surface side,
    Comprising the step of forming the polishing layer by printing the composition for polishing layer,
    In the polishing layer forming step, a polishing pad composition comprising a binder component mainly composed of a resin or an inorganic substance and diamond abrasive grains having an average shape factor of 1 or more and 1.33 or less is used. Production method.
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