WO2015027604A1 - 液晶面板的亮点检测方法 - Google Patents
液晶面板的亮点检测方法 Download PDFInfo
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- WO2015027604A1 WO2015027604A1 PCT/CN2013/088661 CN2013088661W WO2015027604A1 WO 2015027604 A1 WO2015027604 A1 WO 2015027604A1 CN 2013088661 W CN2013088661 W CN 2013088661W WO 2015027604 A1 WO2015027604 A1 WO 2015027604A1
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- liquid crystal
- crystal panel
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
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- G—PHYSICS
- G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
- G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
- G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
- G09G3/20—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
- G09G3/34—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source
- G09G3/36—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters by control of light from an independent source using liquid crystals
- G09G3/3611—Control of matrices with row and column drivers
- G09G3/3648—Control of matrices with row and column drivers using an active matrix
Definitions
- the invention belongs to the field of display, and in particular relates to a method for detecting a bright spot of a liquid crystal panel. Background technique
- TFT-LCD Thin Film Transistor Liquid Crystal Display
- the bright spot detection method of the existing liquid crystal panel is: performing a cyclic scan on the gate line of the liquid crystal panel, and simultaneously outputting a low level signal on the data line. Under normal conditions, the LCD panel will display a black screen. If the TFT of a certain pixel is faulty, such as a short circuit between the pixel electrode and the gate, the pixel electrode is input with a high level signal, and the corresponding pixel is displayed as a bright spot, and is detected.
- the driving method is a row inversion driving represented by a Gate Driver On Array (GOA) technology.
- GOA Gate Driver On Array
- the above problem is particularly prominent. Specifically, with the bright spot detection method of the existing liquid crystal panel, while the gate line 5 is being scanned, and the data line 3 outputs a low level signal, the pixel electrode on the liquid crystal panel is input with a low level signal.
- the pixel electrode 1 short-circuited with the data line 3 is also input with a low-level signal, so that the pixel of the pixel electrode 1 short-circuited with the data line 3 is not displayed as a bright spot. Therefore, the bright spot detection method of the conventional liquid crystal panel cannot detect a bright spot caused by a short circuit between the pixel electrode and the data line, and the miss detection is likely to occur during the bright spot detection process. Summary of the invention The embodiment of the invention provides a bright spot detection method for a liquid crystal panel, which can detect a bright spot caused by a short circuit between the data line and the pixel electrode, and solves the technical problem that the bright spot detection method of the existing liquid crystal panel is prone to miss detection.
- the present invention provides a method for detecting a bright spot of a liquid crystal panel, comprising the steps of: scanning a gate line of a liquid crystal panel, and simultaneously outputting a data line of the liquid crystal panel Flat signal
- the scanning of the gate lines of the liquid crystal panel is stopped while the data lines output a high level signal.
- the step of scanning the gate line of the liquid crystal panel is specifically: performing progressive scan on the gate line of the liquid crystal panel.
- the step of scanning the gate lines of the liquid crystal panel may include scanning only a portion of the gate lines of the liquid crystal panel.
- the liquid crystal panel is an advanced super-dimensional field conversion liquid crystal panel.
- the gate driving circuit of the liquid crystal panel is an array substrate row driving mode.
- the low level signal corresponds to a lowest gray level of the liquid crystal panel.
- the high level signal corresponds to a highest gray level of the liquid crystal panel.
- the above technical solution provided by the present invention has the following advantages:
- the gate line of the liquid crystal panel is scanned first, and the data line outputs a low level signal. Since the low-level signals are input to the respective rows of pixel electrodes scanned by the data lines, the pixels in which the pixel electrodes are located are displayed as black images. Then, the gate line of the liquid crystal panel is turned off, that is, the scanning of the gate line is stopped, and the data line outputs a high level signal. Under normal conditions, because the gate line is turned off, a high level signal on the data line is not input to the pixel electrode, so that the black picture continues to be maintained.
- a pixel electrode is short-circuited with the data line, the pixel electrode is not controlled by the TFT, and a high-level signal on the data line is input to the pixel electrode, and a strong electrode is formed between the pixel electrode and the common electrode.
- the electric field causes the liquid crystal molecules to deflect, so that the pixel where the pixel electrode is located is displayed as a bright spot in the black screen, thereby detecting a bright spot caused by the short circuit between the data line and the pixel electrode, and solving the existing liquid crystal panel.
- the bright spot detection method is prone to technical problems of missed detection.
- FIG. 1 is a schematic diagram of a bright spot caused by a short circuit between a pixel electrode and a data line;
- FIG. 2 is a signal timing diagram of a bright spot detecting method of a liquid crystal panel according to an embodiment of the present invention.
- Fig. 3 is a view showing the effect of detecting a bright spot by the bright spot detecting method in the embodiment of the present invention. detailed description
- the bright spot detecting method of the liquid crystal panel provided in this embodiment is described by taking an example of detecting an ADS type liquid crystal panel, and a gate driving circuit based on the G0A technology is used in the liquid crystal panel.
- the bright spot detection method of the liquid crystal panel includes:
- Step S1 Scanning the gate line of the liquid crystal panel, and the data line of the liquid crystal panel outputs a low level signal.
- the low level signal output by the data line data can be 0V, that is, no output signal.
- the low level signal may be an output signal equal to the voltage of the common electrode (about 0.2 V) to correspond to the lowest gray level of the liquid crystal panel.
- all the gate lines may be grouped, and each group may include one or more rows of gate lines, and only one group of gate lines is scanned at a time, that is, only one liquid at a time. A portion of the gate lines of the crystal panel are progressively scanned. If the grid line is scanned in groups, it is equivalent to dividing the liquid crystal panel into corresponding parts, and it is divided into several times to perform bright spot detection, and only a part of the gate line is subjected to bright spot detection at a time.
- the bright spot detecting method of the liquid crystal panel provided by the embodiment of the present invention is mainly used for detecting a bright spot caused by a short circuit between the pixel electrode and the data line.
- the pixel electrode short-circuited to the gate is detected as a bright spot after being input with a high-level signal after step S1, and is detected.
- Step S2 Stop scanning the gate line of the liquid crystal panel, and the data line outputs a high level signal.
- a cutoff voltage (usually -8V) is applied to the gate, and the gate lines G1 to Gn of the liquid crystal panel are turned off, and the data line data outputs a high level signal.
- the high level signal output by the data line corresponds to the highest gray level of the liquid crystal panel, so that the displayed bright point is most obvious compared with the previously formed black picture, and the bright point is most easily recognized.
- the LCD panel will continue to maintain a black screen.
- the pixel electrode is not controlled by the TFT, and a high-level signal on the data line is input to the pixel electrode, and a comparison is formed between the pixel electrode and the common electrode.
- a strong electric field deflects the liquid crystal molecules.
- the pixel where the pixel electrode is located is displayed as a bright spot 7 in the black screen 6, so that the bright spot caused by the short circuit between the data line and the pixel electrode can be detected, and the bright spot detection of the existing liquid crystal panel is solved.
- the method is prone to technical problems of missed detection.
- the defective product can be intercepted in the step of detecting the bright spot, and the defective product having the bright spot is prevented from flowing to the subsequent module process, thereby reducing the manpower and material resources in the module process.
- the cost is wasted and the detection pressure of the module process is reduced.
- the ADS type liquid crystal panel detected by the bright spot detecting method of the liquid crystal panel provided in this embodiment does not use a gate driving circuit based on G0A technology, but an integrated circuit. (Integrated Circuit, referred to as IC) is made into a gate drive circuit.
- IC Integrated Circuit
- the method for detecting a bright spot of the liquid crystal panel in this embodiment is basically the same as that of the first embodiment, and the difference is that the step S 1 in the embodiment does not need to scan the gate line progressively, but only needs to scan twice. Among them, the first scanning of all the odd-numbered grid lines in the liquid crystal panel, the second scanning of all the even-numbered row-gate lines in the liquid crystal panel, and the output of the low-level signal of the data line, the liquid crystal panel can display a black picture.
- Step S2 in this embodiment is the same as step S2 in Embodiment 1, BP stops scanning the gate line, and the data line outputs a high level. Therefore, only the pixel electrode short-circuited with the data line is input with a high-level signal, so that the pixel where the pixel electrode is located is displayed as a bright spot in the black screen, so that a bright spot caused by the short-circuiting of the data line and the pixel electrode can be detected.
- the bright spot detecting method of the liquid crystal panel provided by the first embodiment and the second embodiment of the present invention can be used not only for detecting the ADS type liquid crystal panel, but also for detecting the twisted nematic (TN), etc. Type of LCD panel.
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- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
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- Liquid Crystal Display Device Control (AREA)
Abstract
一种液晶面板的亮点（7）检测方法，属于显示领域。解决了现有的液晶面板的亮点（7）检测方法无法检测出由于数据线与像素电极短路造成的亮点（7），导致容易发生漏检的技术问题。该液晶面板的亮点（7）检测方法，包括：对液晶面板的栅线（Gl-Gn）进行扫描，同时液晶面板的数据线（data）输出低电平信号；停止对液晶面板的栅线（Gl-Gn）的扫描，同时数据线（data）输出高电平信号。该方法可用于检测ADS型液晶面板。
Description
液晶面板的亮点检测方法 技术领域
本发明属于显示领域， 具体涉及一种液晶面板的亮点检测方法。 背景技术
随着显示技术的不断发展， 薄膜晶体管液晶显示器 （Thin Fi lm Transi stor Liqui d Crystal Di splay, 简称 TFT-LCD) 具有体积小、 功耗低、无辐射等优点， 在平板显示领域中占据了主导地位。在液晶 面板制成之后，需要对其进行质量检测，亮点检测是其中重要的一项。
现有的液晶面板的亮点检测方法为： 对液晶面板的栅线进行循 环扫描， 同时数据线输出低电平信号。正常情况下， 液晶面板会显示 黑色画面。如果某个像素的 TFT存在故障，比如像素电极与栅极短路， 该像素电极就会被输入高电平信号， 其对应的像素就会显示为亮点， 而被检测出来。
本发明人在实现本发明的过程中发现， 现有技术至少存在以下 问题： 如图 1所示， 现在很多的亮点不良都是由于像素区域有异物 1 (或膜层残留） ， 使像素电极 2与数据线 3短路， 而不受 TFT 4的控 制造成的。 例如针对高级超维场转换 （Advanced super Dimension Switch, 简称 ADS )型液晶面板， 特别是其驱动方式采用的是以阵列 基板行驱动 （Gate driver On Array, 简称 GOA) 技术为代表的行反 转驱动模式的情况下， 则上述问题尤为突出。具体来说， 利用现有的 液晶面板的亮点检测方法，在扫描栅线 5的同时，数据线 3输出的是 低电平信号，那么液晶面板上的像素电极就会被输入低电平信号，其 中，与数据线 3短路的像素电极 1也被输入了低电平信号，所以该与 数据线 3短路的像素电极 1所在的像素不会显示为亮点。因此，现有 的液晶面板的亮点检测方法无法检测出由于像素电极与数据线短路 造成的亮点， 导致亮点检测过程中容易发生漏检。 发明内容
本发明实施例提供了一种液晶面板的亮点检测方法， 能够检测 出由于数据线与像素电极短路而造成的亮点，解决了现有的液晶面板 的亮点检测方法容易发生漏检的技术问题。
为达到上述目的， 本发明的实施例采用如下技术方案： 本发明提供一种液晶面板的亮点检测方法， 包括步骤： 对液晶面板的栅线进行扫描， 同时所述液晶面板的数据线输出 低电平信号；
停止对所述液晶面板的栅线的扫描， 同时所述数据线输出高电 平信号。
其中， 所述对液晶面板的栅线进行扫描的步骤具体为： 对液晶面板的栅线进行逐行扫描。
其中， 所述对液晶面板的栅线进行扫描的步骤可以包括只对液 晶面板的部分栅线进行扫描。
优选的， 所述液晶面板为高级超维场转换液晶面板。
优选的， 所述液晶面板的栅极驱动电路为阵列基板行驱动模式。 优选的， 所述低电平信号对应所述液晶面板的最低灰阶。
优选的， 所述高电平信号对应所述液晶面板的最高灰阶。
与现有技术相比， 本发明所提供的上述技术方案具有如下优点： 本发明提供的液晶面板的亮点检测方法中，先对液晶面板的栅线进行 扫描， 同时数据线输出低电平信号。由于通过数据线对被扫描的各行 像素电极输入低电平信号，因此使得这些像素电极所在的像素显示为 黑色画面。然后关闭液晶面板的栅线， 也就是停止对栅线的扫描， 同 时数据线输出高电平信号。正常情况下， 由于栅线的关闭， 数据线上 的高电平信号不会输入至像素电极，从而继续保持黑色画面。如果某 个像素电极与数据线短路，则该像素电极就不受 TFT的控制，数据线 上的高电平信号会输入至该像素电极，该像素电极与公共电极之间就 会形成的较强的电场，使液晶分子发生偏转，于是该像素电极所在的 像素就会在黑色画面中显示为亮点，从而能够检测出由于数据线与像 素电极短路而造成的亮点，解决了现有的液晶面板的亮点检测方法容 易发生漏检的技术问题。
附图说明
为了更清楚地说明本发明实施例中的技术方案， 下面将对实施 例描述中所需要使用的附图作简单地介绍。
图 1为由于像素电极与数据线短路造成亮点的示意图； 图 2 为本发明的实施例所提供的液晶面板的亮点检测方法的信 号时序图；
图 3 为利用本发明的实施例中的亮点检测方法检测出亮点的效 果图。 具体实施方式
下面将结合本发明实施例中的附图， 对本发明实施例中的技术 方案进行清楚、完整的描述。应当理解， 提出以下示例实施例是为了 使本领域技术人员更易于了解和实施本发明，而并不旨在将本发明的 范围限制于以下所阐述的具体示例实施例。
实施例 1 :
本实施例所提供的液晶面板的亮点检测方法是以检测 ADS型液 晶面板为例进行说明的，且该液晶面板中采用了基于 G0A技术的栅极 驱动电路。 该液晶面板的亮点检测方法包括：
步骤 S1 : 对液晶面板的栅线进行扫描， 同时液晶面板的数据线 输出低电平信号。
具体的， 如图 2所示， 在 T1时间段， 在 G0A模式下， 对液晶面 板的全部栅线进行逐行扫描，也就是从 G1至 Gn逐行施加高电平信号， 同时液晶面板的数据线 data输出低电平信号。 由于通过数据线 data 对各行像素电极输入低电平信号， 因此使得液晶面板显示为黑色画 面。 优选的， 数据线 data所输出的低电平信号可以为 0V， 也就是无 输出信号。 或者该低电平信号可以是与公共电极的电压相等 （约为 0. 2V) 的输出信号， 以对应液晶面板的最低灰阶。
在其他实施方式中， 还可以将全部的栅线进行分组， 每组可以 包括一行或多行栅线，而每次只对一组栅线进行扫描， 即每次只对液
晶面板的一部分栅线进行逐行扫描。如果对栅线进行分组扫描，相当 于将液晶面板也分为相应的几部分，并分为几次进行亮点检测，每次 只对一组栅线所对应的部分进行亮点检测。
应当说明的是， 本发明实施例提供的液晶面板的亮点检测方法， 主要用于检测由于像素电极与数据线短路造成的亮点。但是如果该液 晶面板中存在与栅极短路的像素电极，那么该与栅极短路的像素电极 在步骤 S 1之后就会由于被输入高电平信号而显示为亮点， 从而被检 测出来。
步骤 S2 : 停止对液晶面板的栅线的扫描， 同时数据线输出高电 平信号。
具体的， 如图 2所示， 在 T2时间段， 对栅极施加截止电压 （通 常为 -8V) ， 关闭液晶面板的栅线 G1至 Gn， 同时数据线 data输出高 电平信号。优选的，数据线输出的该高电平信号对应液晶面板的最高 灰阶，这样显示出的亮点与之前形成的黑色画面的对比最明显，最容 易识别出亮点。
正常情况下， 由于栅线的关闭， 数据线上的高电平信号不会输 入至像素电极， 因此液晶面板会继续保持黑色画面。然而， 如果某个 像素电极与数据线短路，该像素电极就不受 TFT的控制，数据线上的 高电平信号会输入至该像素电极，该像素电极与公共电极之间就会形 成的较强的电场， 使液晶分子发生偏转。如图 3所示， 该像素电极所 在的像素就会在黑色画面 6中显示为亮点 7，从而能够检测出由于数 据线与像素电极短路而造成的亮点，解决了现有的液晶面板的亮点检 测方法容易发生漏检的技术问题。
利用本发明实施例提供的液晶面板的亮点检测方法， 能够在亮 点检测这一步将不良产品拦截，避免此种存在亮点的不良产品流到后 续的模组工序，减少了模组工序中人力和物力成本的浪费，并且减小 了模组工序的检测压力。
实施例 2 :
本实施例提供的液晶面板的亮点检测方法所检测的 ADS型液晶 面板中没有采用基于 G0A 技术的栅极驱动电路， 而是以集成电路
( Integrated Circuit, 简称 IC) 的形式制成栅极驱动电路。
本实施例中的液晶面板的亮点检测方法与实施例 1基本相同， 其不同点在于： 本实施例中的步骤 S 1不需要对栅线进行逐行扫描， 而只需扫描两次即可。其中，第一次扫描液晶面板中所有的奇数行栅 线，第二次扫描液晶面板中所有的偶数行栅线， 同时数据线输出低电 平信号， 即可使液晶面板显示黑色画面。
本实施例中的步骤 S2与实施例 1中的步骤 S2相同， BP , 停止 对栅线进行扫描， 同时数据线输出高电平。从而只有与数据线短路的 像素电极被输入高电平信号，使得该像素电极所在的像素就会在黑色 画面中显示为亮点，从而能够检测出由于数据线与像素电极短路而造 成的亮点。
应当说明的是， 本发明实施例 1和实施例 2所提供的液晶面板 的亮点检测方法不只是能用于检测 ADS型液晶面板，还可用于检测扭 曲向列 （Twisted Neraatic, 简称 TN) 等其他类型的液晶面板。
以上所述， 仅为本发明的具体实施方式， 但本发明的保护范围 并不局限于此，任何熟悉本技术领域的技术人员在本发明揭露的技术 范围内，可轻易想到的变化或替换，都应涵盖在本发明的保护范围之 内。 因此， 本发明的保护范围应以权利要求的保护范围为准。
Claims
1. 一种液晶面板的亮点检测方法， 其特征在于， 包括步骤： 对液晶面板的栅线进行扫描， 同时所述液晶面板的数据线输出 低电平信号；
停止对所述液晶面板的栅线的扫描， 同时所述数据线输出高电 平信号。
2. 根据权利要求 1所述的液晶面板的亮点检测方法， 其特征在 于， 所述对液晶面板的栅线进行扫描的步骤具体为：
对液晶面板的栅线进行逐行扫描。
3. 根据权利要求 1所述的液晶面板的亮点检测方法， 其特征在 于，所述对液晶面板的栅线进行扫描的步骤包括只对液晶面板的部分 栅线进行扫描。
4. 根据权利要求 1至 3中任意一项所述的液晶面板的亮点检测 方法， 其特征在于： 所述液晶面板为高级超维场转换液晶面板。
5. 根据权利要求 4所述的液晶面板的亮点检测方法， 其特征在 于： 所述液晶面板的栅极驱动电路采用阵列基板行驱动模式。
6. 根据权利要求 1所述的液晶面板的亮点检测方法， 其特征在 于： 所述低电平信号对应所述液晶面板的最低灰阶。
7. 根据权利要求 1所述的液晶面板的亮点检测方法， 其特征在 于： 所述高电平信号对应所述液晶面板的最高灰阶。
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| US14/403,705 US9881533B2 (en) | 2013-08-27 | 2013-12-05 | Method for detecting bright spot of liquid crystal display panel |
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| CN201310378441.0A CN103454792B (zh) | 2013-08-27 | 2013-08-27 | 液晶面板的亮点检测方法 |
| CN201310378441.0 | 2013-08-27 |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN103513477B (zh) * | 2012-06-26 | 2018-03-09 | 富泰华工业（深圳）有限公司 | 液晶显示器及其检测方法 |
| CN104237725B (zh) * | 2014-09-04 | 2017-03-29 | 京东方科技集团股份有限公司 | 一种确定光栅器件中的短路点的位置的方法 |
| CN104183206B (zh) * | 2014-09-10 | 2017-04-19 | 南京中电熊猫液晶显示科技有限公司 | 显示面板的检测方法 |
| TWI552126B (zh) | 2014-10-08 | 2016-10-01 | 友達光電股份有限公司 | 亮點偵測方法及顯示面板 |
| CN104460148B (zh) * | 2014-11-20 | 2017-09-01 | 深圳市华星光电技术有限公司 | 提升不良检出率的像素结构及检测方法 |
| CN109389919B (zh) * | 2017-08-08 | 2020-07-28 | 京东方科技集团股份有限公司 | 显示面板的检测方法及装置 |
| CN108169935A (zh) * | 2017-12-19 | 2018-06-15 | 武汉华星光电技术有限公司 | 拦截显示面板的漏电像素的方法及显示面板 |
| CN107966840B (zh) * | 2017-12-20 | 2020-08-25 | 苏州华兴源创科技股份有限公司 | 一种液晶面板不良像素点的检测方法 |
| CN108231036B (zh) * | 2018-01-10 | 2019-12-06 | Oppo广东移动通信有限公司 | 显示面板、显示屏、电子装置、显示控制方法及存储装置 |
| CN108803097B (zh) * | 2018-06-28 | 2021-03-26 | Tcl华星光电技术有限公司 | 像素暗态漏光的检测方法及检测装置 |
| CN109061914B (zh) * | 2018-08-07 | 2021-08-17 | 京东方科技集团股份有限公司 | 显示基板的制造方法、显示基板、显示装置 |
| CN110379344A (zh) * | 2019-09-03 | 2019-10-25 | 福建华佳彩有限公司 | Goa驱动电路检测方法 |
| CN111897148B (zh) * | 2020-07-31 | 2023-07-18 | 深圳同兴达科技股份有限公司 | 一种液晶显示晶体管半导体层短路的测试方法 |
| CN116434684A (zh) * | 2023-04-26 | 2023-07-14 | 京东方科技集团股份有限公司 | 检测方法及其检测装置 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007140130A (ja) * | 2005-11-18 | 2007-06-07 | Epson Imaging Devices Corp | 液晶パネルの点灯検査方法 |
| JP2009216621A (ja) * | 2008-03-12 | 2009-09-24 | Seiko Epson Corp | 電気光学装置の製造方法、電気光学装置の欠陥検出装置及び欠陥検出方法 |
| US7847914B2 (en) * | 2003-06-26 | 2010-12-07 | Samsung Electronics Co., Ltd. | Thin film transistor array panel and method for repairing liquid crystal display including the same |
| CN102931189A (zh) * | 2012-11-01 | 2013-02-13 | 京东方科技集团股份有限公司 | 阵列基板及其制作和维修方法、显示装置 |
Family Cites Families (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2002050603A1 (en) * | 2000-12-19 | 2002-06-27 | Matsushita Electric Industrial Co., Ltd. | Liquid crystal display and its driving method |
| CN1666242A (zh) * | 2002-04-26 | 2005-09-07 | 东芝松下显示技术有限公司 | 用于场致发光显示屏的驱动电路 |
| CN100433337C (zh) * | 2006-06-23 | 2008-11-12 | 北京京东方光电科技有限公司 | 一种防止dgs的像素电极结构及其制造方法 |
| JP5111072B2 (ja) * | 2007-11-22 | 2012-12-26 | 三菱電機株式会社 | 液晶表示装置 |
| CN101661169B (zh) * | 2008-08-27 | 2011-12-28 | 北京京东方光电科技有限公司 | 液晶显示器亮点或暗点检测方法及其装置 |
| CN101819337B (zh) * | 2009-02-27 | 2012-02-29 | 北京京东方光电科技有限公司 | 液晶显示器的检测电路和检测方法 |
| RU2012100253A (ru) * | 2009-06-11 | 2013-07-20 | Шарп Кабусики Кайся | Устройство жидкокристаллического дисплея |
| CN103777379B (zh) * | 2012-10-17 | 2017-01-04 | 北京京东方光电科技有限公司 | 一种液晶显示屏亮点检测方法 |
| KR102125281B1 (ko) * | 2013-08-16 | 2020-06-23 | 삼성디스플레이 주식회사 | 표시 장치 및 이의 구동 방법 |
-
2013
- 2013-08-27 CN CN201310378441.0A patent/CN103454792B/zh not_active Expired - Fee Related
- 2013-12-05 US US14/403,705 patent/US9881533B2/en not_active Expired - Fee Related
- 2013-12-05 WO PCT/CN2013/088661 patent/WO2015027604A1/zh not_active Ceased
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7847914B2 (en) * | 2003-06-26 | 2010-12-07 | Samsung Electronics Co., Ltd. | Thin film transistor array panel and method for repairing liquid crystal display including the same |
| JP2007140130A (ja) * | 2005-11-18 | 2007-06-07 | Epson Imaging Devices Corp | 液晶パネルの点灯検査方法 |
| JP2009216621A (ja) * | 2008-03-12 | 2009-09-24 | Seiko Epson Corp | 電気光学装置の製造方法、電気光学装置の欠陥検出装置及び欠陥検出方法 |
| CN102931189A (zh) * | 2012-11-01 | 2013-02-13 | 京东方科技集团股份有限公司 | 阵列基板及其制作和维修方法、显示装置 |
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| CN103454792B (zh) | 2016-04-20 |
| US20150294608A1 (en) | 2015-10-15 |
| US9881533B2 (en) | 2018-01-30 |
| CN103454792A (zh) | 2013-12-18 |
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