WO2015012516A1 - 실리콘 나노 와이어 어레이의 제조방법 - Google Patents
실리콘 나노 와이어 어레이의 제조방법 Download PDFInfo
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- WO2015012516A1 WO2015012516A1 PCT/KR2014/006294 KR2014006294W WO2015012516A1 WO 2015012516 A1 WO2015012516 A1 WO 2015012516A1 KR 2014006294 W KR2014006294 W KR 2014006294W WO 2015012516 A1 WO2015012516 A1 WO 2015012516A1
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- H10D62/00—Semiconductor bodies, or regions thereof, of devices having potential barriers
- H10D62/10—Shapes, relative sizes or dispositions of the regions of the semiconductor bodies; Shapes of the semiconductor bodies
- H10D62/117—Shapes of semiconductor bodies
- H10D62/118—Nanostructure semiconductor bodies
- H10D62/119—Nanowire, nanosheet or nanotube semiconductor bodies
- H10D62/122—Nanowire, nanosheet or nanotube semiconductor bodies oriented at angles to substrates, e.g. perpendicular to substrates
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- B81C1/00—Manufacture or treatment of devices or systems in or on a substrate
- B81C1/00015—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems
- B81C1/00023—Manufacture or treatment of devices or systems in or on a substrate for manufacturing microsystems without movable or flexible elements
- B81C1/00031—Regular or irregular arrays of nanoscale structures, e.g. etch mask layer
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- B82Y—SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES; MANUFACTURE OR TREATMENT OF NANOSTRUCTURES
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- H10D62/83—Semiconductor bodies, or regions thereof, of devices having potential barriers characterised by the materials being Group IV materials, e.g. B-doped Si or undoped Ge
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- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/63—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the formation processes
- H10P14/6326—Deposition processes
- H10P14/6342—Liquid deposition, e.g. spin-coating, sol-gel techniques or spray coating
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- H10P14/66—Formation of materials, e.g. in the shape of layers or pillars of insulating materials characterised by the type of materials
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- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/68—Organic materials, e.g. photoresists
- H10P14/683—Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC
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- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/60—Wet etching
- H10P50/64—Wet etching of semiconductor materials
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- H10P50/00—Etching of wafers, substrates or parts of devices
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- H10P50/691—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials
- H10P50/692—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials characterised by their composition, e.g. multilayer masks or materials
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- H10P50/00—Etching of wafers, substrates or parts of devices
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- H10P50/691—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials
- H10P50/693—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials characterised by their size, orientation, disposition, behaviour or shape, in horizontal or vertical plane
- H10P50/695—Etching of wafers, substrates or parts of devices using masks for semiconductor materials for Group V materials or Group III-V materials characterised by their size, orientation, disposition, behaviour or shape, in horizontal or vertical plane characterised by the process involved to create the mask, e.g. lift-off masks or sidewalls or to modify the mask
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- B81—MICROSTRUCTURAL TECHNOLOGY
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- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0128—Processes for removing material
- B81C2201/013—Etching
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- B81C2201/00—Manufacture or treatment of microstructural devices or systems
- B81C2201/01—Manufacture or treatment of microstructural devices or systems in or on a substrate
- B81C2201/0101—Shaping material; Structuring the bulk substrate or layers on the substrate; Film patterning
- B81C2201/0147—Film patterning
- B81C2201/0149—Forming nanoscale microstructures using auto-arranging or self-assembling material
Definitions
- the present invention relates to a method for producing a silicon nanowire array.
- Nano wire refers to a wire structure having a size in nanometers as one of various semiconductor nanostructures. Generally referred to as nanowires with diameters from less than 10 nm to several hundred nm.
- Proposed manufacturing methods for such nanowires can be classified into three types.
- a method of fabricating two-dimensional silicon nanowires by patterning a photoresist to a nano size using an electron beam lithography apparatus and etching silicon to a nano size using a patterned photoresist as a mask Proposed.
- VLS Vapor-Liquid-Solid is a self-aligning method for growing two-dimensional silicon nanowires by injecting a reaction gas (SiH 4 ) while maintaining a high temperature of about 950 ° C.
- a reaction gas SiH 4
- the etching method using the solution process has the effect of saving time and cost compared to the self-aligning method, and precisely controlling geometrical parameters (diameter, height, density, etc.) of the silicon nanowires in the method of manufacturing the silicon nanowires using the solution process.
- geometrical parameters diameter, height, density, etc.
- Hexagonal lattice pattern using nano structure was used as the main method.
- this method cannot independently control the geometrical parameters of the nanowires, and it is particularly difficult to fabricate them in large areas.
- One aspect of the present invention is to provide a method for manufacturing a nanowire array capable of independently controlling the geometrical parameters (diameter, length, density, position, etc.) of the nanowire, and is cost-effective and mass-produced.
- the step of positioning the plastic particles on the silicon substrate spaced apart from each other in a uniform random pattern comprising the step of removing the catalyst layer.
- the process is simple, cost-effective, large-area process can be mass-produced and the production of nanowires in a resource-limited location.
- the nanostructures are expected to be utilized in various industries such as electronic energy, optical energy industries such as solar cells, and biosensors.
- FIG. 1 is a process diagram of a method of manufacturing a nanowire array according to an embodiment of the present invention.
- FIG. 2 is a view showing a mechanism of metal catalyst chemical etching according to an embodiment of the present invention.
- Figure 3 is a photograph showing the diameter of the silicon nanowires according to the size of the polystyrene beads according to an embodiment of the present invention.
- FIG. 4 is a photograph showing the height of the silicon nanowires according to the etching time according to an embodiment of the present invention.
- FIG. 5 is a photograph showing the density of the silicon nanowire array according to the density of the polystyrene beads according to an embodiment of the present invention.
- FIG. 6 is a TEM and EDX analysis of the silicon nanowires prepared in accordance with an embodiment of the present invention.
- FIG. 7 is a view illustrating a patterning process of a vertical silicon nanowire array (vSiNWA) according to an embodiment of the present invention.
- FIG. 8 is a photograph of a core-shell structure of FeO x formed using a silicon nanowire as a template.
- FIG. 9 is a graph illustrating the results of observing the distribution of plastic particles having different sizes while varying the number of lamination of the polymer layer.
- nano size or “nano” as used herein may be interpreted as, but not limited to, less than 1 to 1,000 nanometers.
- Nano-sized materials have recently emerged as a very important field of research because of their new physical and chemical properties such as unique electrical, optical and mechanical properties.
- research on nanostructures that have been carried out so far shows the potential as a new optical device material in the future.
- nano-sized devices have a small size, which increases the surface area / volume ratio, so that the electrochemical reaction occurring on the surface becomes superior, and thus it is applicable to various kinds of sensors.
- vertical silicon nanowire arrays vSiNWA
- vSiNWA vertical silicon nanowire arrays
- Nanowires can be widely applied to various fields such as biosensors, optical devices such as lasers, transistors, and memory devices.
- nanowires are usually manufactured by using a growth method using a catalyst.
- the catalyst used is removed.
- an aspect of the present invention is to position the plastic particles on a silicon substrate spaced apart from each other in a uniform random pattern, forming a catalyst layer between the plastic particles, the plastic It provides a method of manufacturing a silicon nanowire array comprising the step of removing particles, vertical etching of the silicon substrate portion in contact with the catalyst layer, and removing the catalyst layer.
- crystalline silicon is selected as a material of the nanowires, but the present invention is not limited thereto, and large-area nanowires and nanowires may be used in a similar solution process for amorphous silicon (a-Si) and polycrystalline silicon (polycrystalline-Si). I can make a pattern
- the plastic particles are placed on the silicon substrate so as to be spaced apart from each other.
- the polymer layer may be formed on the silicon substrate before the plastic particles are placed on the silicon substrate.
- a layer-by-layer process is performed by alternately applying a solution containing a cationic polymer electrolyte and a process of applying a solution containing an anionic polymer electrolyte on the silicon substrate.
- the process can be repeated a plurality of times.
- the cationic polymer electrolyte may be selected from the group consisting of polyarylamine hydrochloric acid, polyethyleneimine, polydimethyldiallylamide, polylysine, and a combination thereof, but is not limited thereto.
- the anionic polymer electrolyte may be polystyrenesulfonate. , Polyacrylic acid, polyvinyl sulfate, heparin and may be selected from the group consisting of, but is not limited thereto.
- a solution containing a cationic polymer electrolyte having a charge opposite to that of the substrate is first applied to the substrate, and then a solution containing an anionic polymer electrolyte is applied. It is preferable that the polymer electrolyte solution finally applied can have a charge opposite to that of the plastic particles.
- the polymer layer may be formed as a single layer or a plurality of layers on the substrate.
- the method of applying the polymer electrolyte solution to the substrate is not particularly limited and may be by a known method, and may be a method of supporting the substrate in the solution.
- the polymer layer formed on the substrate may act as an adhesive so that the plastic particles may be attached onto the substrate.
- the distribution of the plastic particles having a size of 100nm, 150nm, 200nm, 350nm spaced apart on the substrate.
- the polymer layer was formed of 1 layer, 3 layers, 5 layers, and 7 layers, the distribution of particles was uniform as the number of stacks of the polymer layer increased. Through this, it can be seen that the polymer layer helps to uniform distribution of the plastic particles.
- the plastic particles are preferably spherical and can vary in shape as needed.
- the plastic particles may be scattered on a silicon substrate in which a polymer layer is formed in a granular state, but the plastic particles may be mixed with a specific solution and applied by spin coating or the like.
- the plastic particles may be periodic in the arrangement, but may be aperiodic in nature. As a result, the plastic particles may be located apart from each other in a uniform random pattern.
- the plastic may be selected from the group consisting of polyethylene, polypropylene, polystyrene, polyethylene terephthalate, polybutylene terephthalate, polycarbonate, polymethyl methacrylate, polyphenylene oxide, polyacetal, but is not limited thereto.
- the diameter of these plastic particles is preferably nano size.
- oxygen plasma treatment is used to remove the polymer layer or the solution component.
- a method of depositing a catalyst layer on a silicon substrate to which the plastic particles are attached may be used. Specifically, it may be by a method such as sputtering, electron beam deposition, vacuum deposition, chemical vapor deposition, physical vapor deposition, atomic layer deposition (ALD).
- the catalyst layer is formed in the space between the plastic particles as well as the exposed surface of the plastic particles. Subsequently, when the plastic particles are removed, the catalyst layer is not formed at the position where the plastic particles stayed.
- the catalyst layer may include silver (Ag), gold (Au), platinum (Pt), copper (Cu), or a combination thereof.
- the present invention forms a nanowire array through chemical wet etching using a metal catalyst.
- Wet etching refers to a method of etching a material to be etched by etching a chemical reaction.
- the etching solution may include an acid and a peroxide.
- Representative examples of the acid include hydrofluoric acid (HF), and representative examples of the peroxide include hydrogen peroxide (H 2 O 2 ).
- HF hydrofluoric acid
- H 2 O 2 hydrogen peroxide
- the portion of the silicon substrate in contact with the catalyst layer including the metal catalyst forms holes in the silicon while hydrogen peroxide is reduced by the metal catalyst, and the hole-rich region is exposed to an acid and dissolved.
- the silicon in the lower portion of the catalyst layer is dissolved while being vertically etched, and the metal included in the catalyst layer falls into the silicon below. After the etching process is repeated after this process is repeated, the desired nanowire array can be obtained by finally removing the metal.
- the metal included in the catalyst layer may be removed using aqua regia, which is a mixture of hydrochloric acid and nitric acid.
- the structural parameters of the nanowires can be controlled by appropriately adjusting the process conditions. These structural variables, that is, nanowires whose diameter, height, density, and position are independently controlled may be used to observe the interface of nerve units.
- One way to control the structural parameters is to control the size of the plastic particles to control the diameter of the nanowires.
- Figure 3 (a) is 100nm in diameter
- Figure 3 (b) is 150nm in diameter
- Figure 3 ( c) can confirm that a wire having a diameter of 240nm was obtained.
- the etching time is 1 minute (Fig. 4 (a)), 1.4 minutes, 3 minutes when (2) (Fig. 4 (b)) ( 4 (c)) was found to be 1.8 ⁇ m.
- the density of the plastic particles included in the solution may be adjusted by adjusting the magnification of diluting the solution containing the plastic particles with deionized water, and the interval between the applied plastic particles may be controlled by applying the solution.
- the structure of the nanowire array of the present invention may be manufactured in a structure having a periodicity by forming a predetermined pattern. That is, the present invention can be realized by combining a metal assisted chemical etching (MACE) method and a photolithography method.
- MACE metal assisted chemical etching
- the photoresist is coated on a silicon substrate by spin coating, and a photolithography process is performed using a desired pattern mask.
- a polymer layer is formed by layered self-assembly on the patterned silicon substrate and plastic particles of a desired size are loaded.
- the chemical reaction is carried out in an etching solution to form a vertical nanowire array structure only on a desired patterned portion.
- the plastic particles may be manufactured into a nano-periodic structure. That is, by combining the layer-by-layer self-assembly method and the nanosphere lithography method, the geometrical parameters of the nanowires are obtained by uniformly dispersing and coating the nanospheres instead of the hexagonal lattice pattern. Independently controlled and array-aperiodic nanowire arrays can be fabricated.
- the crystallinity and surface structure of the manufactured silicon nanowires can be confirmed.
- the surface of the nanowires is present in an amorphous form, and it can be seen that there are many micropores, which are characteristics that are exhibited when manufactured through etching etching.
- the interior of the nanowires is crystalline, showing the [100] crystallinity of the original silicon wafer.
- silicon nanowires as a template, on the outer surface, for example, Si, Ge, Cu, Ni, Cr, Fe, Ag, Ti, Co, Zn, Mg, Pt, Pd, Os, Au, Pb, Metals such as Ir, Mo, V, Al, alloys thereof, SnO 2 , Cr 2 O 3 , Fe 2 O 3 , Fe 3 O 4 , FeO, NiO, AgO, TiO 2 , Co 2 O 3 , Co 3 O 4 , metal oxides such as CoO, ZnO, PtO, PdO, VO 2 , MoO 2 and PbO, polymers such as polyimide, or combinations of these materials having a laminated structure, for example Ti / TiO 2 Coating at least one layer of material may provide a core-shell nanowire structure capable of providing certain optical, electrical, magnetic, mechanical or chemical functions.
- the materials coated on the silica nanowires may be formed by a known thin film deposition method such as chemical vapor deposition, atomic layer deposition
- the silicon nanowires may be removed to provide a nanotube array structure having a structure in which only the at least one material layer is left.
- the silicon nanowires used as a template may be present inside the nanotube array structure according to a device fabrication method, or may be removed by dry etching using plasma or wet etching using HF.
- the method of making the core-shell nanowire structure is as follows. It is necessary to replace the surface of the silicon nanowire template made by the method described above. A sol-gel method is used to make a FeO x solution and the surface-treated silicon nanowire template is added to the resulting solution. Subsequently, when treated with oxidized water, as shown in FIG. 8, a core-shell structure of FeO x is formed along the shape of the silicon nanowire.
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Abstract
Description
Claims (12)
- 층상 자기조립 고분자층이 형성된 실리콘 기판 상에 플라스틱 입자들을 균일한 무작위 패턴으로 서로 이격하여 위치시키는 단계;상기 플라스틱 입자들 사이에 촉매층을 형성하는 단계;상기 플라스틱 입자들을 제거하는 단계;상기 촉매층과 접촉하는 실리콘 기판 부위를 수직적으로 식각하는 단계; 및상기 촉매층을 제거하는 단계를 포함하는, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 층상 자기조립 고분자층은 상기 실리콘 기판 상에 양이온성 고분자 전해질이 함유된 용액을 도포하는 공정과 음이온성 고분자 전해질이 함유된 용액을 도포하는 공정을 교대로 실시하여 형성하는 것인, 실리콘 나노 와이어 어레이의 제조방법.
- 제 2항에 있어서,상기 양이온성 고분자 전해질은 폴리아릴아민염소산, 폴리에틸렌이민, 폴리디메틸다이알릴아마이드, 폴리라이신 및 이들의 조합으로 이루어지는 군에서 선택되는 것인, 실리콘 나노 와이어 어레이의 제조방법.
- 제 2항에 있어서,상기 음이온성 고분자 전해질은 폴리스티렌술포네이트, 폴리아크릴산, 폴리비닐황산염, 헤파린 및 이들의 조합으로 이루어지는 군에서 선택되는 것인, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 플라스틱은 폴리에틸렌, 폴리프로필렌, 폴리스티렌, 폴리에틸렌 테레프탈레이트, 폴리부틸렌테레프탈레이트, 폴리카보네이트, 폴리메틸메타크릴레이트, 폴리페닐렌 옥사이드, 폴리아세탈로 이루어지는 군에서 선택되는 것인, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 촉매층은 은(Ag), 금(Au), 백금(Pt), 구리(Cu) 또는 이들의 조합을 포함하는 것인, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 촉매층을 형성하는 단계는 증착방법에 의하는 것인, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 식각하는 단계는 습식식각 공정에 의하여 이루어지는 것인, 실리콘 나노 와이어 어레이의 제조방법.
- 제 5항에 있어서,상기 습식식각 공정은 산(acid) 및 과산화물을 포함하는 용액을 사용하여 수행되는, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 플라스틱 입자들의 크기를 제어하여 실리콘 나노 와이어의 직경을 조절하는, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 플라스틱 입자들 사이의 간격을 제어하여 실리콘 나노 와이어 어레이의 밀도를 조절하는, 실리콘 나노 와이어 어레이의 제조방법.
- 제 1항에 있어서,상기 식각하는 단계의 식각 시간을 제어하여 실리콘 나노 와이어의 높이를 조절하는, 실리콘 나노 와이어 어레이의 제조방법.
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| Application Number | Priority Date | Filing Date | Title |
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| US14/908,930 US9780167B2 (en) | 2013-07-22 | 2014-07-14 | Method of manufacturing silicon nanowire array |
| CN201480052091.1A CN105555705B (zh) | 2013-07-22 | 2014-07-14 | 硅纳米线阵列的制备方法 |
| KR1020167003982A KR101827656B1 (ko) | 2013-07-22 | 2014-07-14 | 실리콘 나노 와이어 어레이의 제조방법 |
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| KR10-2013-0086180 | 2013-07-22 | ||
| KR20130086180 | 2013-07-22 |
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| WO2015012516A1 true WO2015012516A1 (ko) | 2015-01-29 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/KR2014/006294 Ceased WO2015012516A1 (ko) | 2013-07-22 | 2014-07-14 | 실리콘 나노 와이어 어레이의 제조방법 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US9780167B2 (ko) |
| KR (1) | KR101827656B1 (ko) |
| CN (1) | CN105555705B (ko) |
| WO (1) | WO2015012516A1 (ko) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN111803231A (zh) * | 2020-06-28 | 2020-10-23 | 深圳大学 | 一种仿生微/纳米抗菌结构及其制造方法与应用 |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN104157675A (zh) * | 2014-08-05 | 2014-11-19 | 京东方科技集团股份有限公司 | 一种oled显示器件及其制作方法、显示装置 |
| CN106637127A (zh) * | 2016-12-12 | 2017-05-10 | 陕西科技大学 | 一种利用二氧化锡制备Si纳米线多线阵列的方法 |
| CN106587068A (zh) * | 2016-12-12 | 2017-04-26 | 陕西科技大学 | 一种利用二氧化锡制备单根Si纳米线的方法 |
| CN106684175B (zh) * | 2017-02-15 | 2019-02-19 | 中国科学院合肥物质科学研究院 | 具有色彩调变的太阳能电池及其制备方法 |
| CN113264498A (zh) * | 2021-04-08 | 2021-08-17 | 哈尔滨工业大学(深圳) | 金属氧化物界面装置及其制备方法与应用 |
| CN115321474B (zh) * | 2022-09-06 | 2024-07-09 | 杭州电子科技大学 | 一种基于soi硅片的硅纳米线陀螺仪的制备方法 |
| CN119079929B (zh) * | 2024-08-28 | 2025-10-21 | 大连理工大学 | 一种微球模板辅助刻蚀的可控纳米线复合微流道的制备方法 |
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- 2014-07-14 US US14/908,930 patent/US9780167B2/en not_active Expired - Fee Related
- 2014-07-14 CN CN201480052091.1A patent/CN105555705B/zh not_active Expired - Fee Related
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Also Published As
| Publication number | Publication date |
|---|---|
| KR101827656B1 (ko) | 2018-02-08 |
| KR20160041935A (ko) | 2016-04-18 |
| CN105555705A (zh) | 2016-05-04 |
| CN105555705B (zh) | 2018-10-16 |
| US20160308001A1 (en) | 2016-10-20 |
| US9780167B2 (en) | 2017-10-03 |
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