WO2014085529A1 - Very low cte slope doped silica-titania glass - Google Patents

Very low cte slope doped silica-titania glass Download PDF

Info

Publication number
WO2014085529A1
WO2014085529A1 PCT/US2013/072146 US2013072146W WO2014085529A1 WO 2014085529 A1 WO2014085529 A1 WO 2014085529A1 US 2013072146 W US2013072146 W US 2013072146W WO 2014085529 A1 WO2014085529 A1 WO 2014085529A1
Authority
WO
WIPO (PCT)
Prior art keywords
glass
less
titania
doped silica
silica
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2013/072146
Other languages
English (en)
French (fr)
Inventor
Sezhian Annamalai
Carlos Alberto DURAN
Kenneth Edward HRDINA
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Corning Inc
Original Assignee
Corning Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Corning Inc filed Critical Corning Inc
Priority to JP2015545421A priority Critical patent/JP6291505B2/ja
Priority to EP13803404.6A priority patent/EP2925686A1/en
Publication of WO2014085529A1 publication Critical patent/WO2014085529A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F1/00Originals for photomechanical production of textured or patterned surfaces, e.g., masks, photo-masks, reticles; Mask blanks or pellicles therefor; Containers specially adapted therefor; Preparation thereof
    • G03F1/22Masks or mask blanks for imaging by radiation of 100nm or shorter wavelength, e.g. X-ray masks, extreme ultraviolet [EUV] masks; Preparation thereof
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00Other methods of shaping glass
    • C03B19/12Other methods of shaping glass by liquid-phase reaction processes
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B19/00Other methods of shaping glass
    • C03B19/14Other methods of shaping glass by gas- or vapour- phase reaction processes
    • C03B19/1453Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering
    • C03B19/1461Thermal after-treatment of the shaped article, e.g. dehydrating, consolidating, sintering for doping the shaped article with flourine
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C3/00Glass compositions
    • C03C3/04Glass compositions containing silica
    • C03C3/06Glass compositions containing silica with more than 90% silica by weight, e.g. quartz
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C4/00Compositions for glass with special properties
    • C03C4/0085Compositions for glass with special properties for UV-transmitting glass
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00Type of glass produced
    • C03B2201/06Doped silica-based glasses
    • C03B2201/07Impurity concentration specified
    • C03B2201/075Hydroxyl ion (OH)
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00Type of glass produced
    • C03B2201/06Doped silica-based glasses
    • C03B2201/08Doped silica-based glasses doped with boron or fluorine or other refractive index decreasing dopant
    • C03B2201/12Doped silica-based glasses doped with boron or fluorine or other refractive index decreasing dopant doped with fluorine
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00Type of glass produced
    • C03B2201/06Doped silica-based glasses
    • C03B2201/20Doped silica-based glasses doped with non-metals other than boron or fluorine
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00Type of glass produced
    • C03B2201/06Doped silica-based glasses
    • C03B2201/20Doped silica-based glasses doped with non-metals other than boron or fluorine
    • C03B2201/23Doped silica-based glasses doped with non-metals other than boron or fluorine doped with hydroxyl groups
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00Type of glass produced
    • C03B2201/06Doped silica-based glasses
    • C03B2201/30Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi
    • C03B2201/32Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with aluminium
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00Type of glass produced
    • C03B2201/06Doped silica-based glasses
    • C03B2201/30Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi
    • C03B2201/40Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03BMANUFACTURE, SHAPING, OR SUPPLEMENTARY PROCESSES
    • C03B2201/00Type of glass produced
    • C03B2201/06Doped silica-based glasses
    • C03B2201/30Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi
    • C03B2201/40Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
    • C03B2201/42Doped silica-based glasses doped with metals, e.g. Ga, Sn, Sb, Pb or Bi doped with transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn doped with titanium
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2201/00Glass compositions
    • C03C2201/06Doped silica-based glasses
    • C03C2201/08Doped silica-based glasses containing boron or halide
    • C03C2201/12Doped silica-based glasses containing boron or halide containing fluorine
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2201/00Glass compositions
    • C03C2201/06Doped silica-based glasses
    • C03C2201/20Doped silica-based glasses containing non-metals other than boron or halide
    • C03C2201/23Doped silica-based glasses containing non-metals other than boron or halide containing hydroxyl groups
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2201/00Glass compositions
    • C03C2201/06Doped silica-based glasses
    • C03C2201/30Doped silica-based glasses containing metals
    • C03C2201/32Doped silica-based glasses containing metals containing aluminium
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2201/00Glass compositions
    • C03C2201/06Doped silica-based glasses
    • C03C2201/30Doped silica-based glasses containing metals
    • C03C2201/40Doped silica-based glasses containing metals containing transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2201/00Glass compositions
    • C03C2201/06Doped silica-based glasses
    • C03C2201/30Doped silica-based glasses containing metals
    • C03C2201/40Doped silica-based glasses containing metals containing transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn
    • C03C2201/42Doped silica-based glasses containing metals containing transition metals other than rare earth metals, e.g. Zr, Nb, Ta or Zn containing titanium
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2203/00Production processes
    • C03C2203/40Gas-phase processes
    • C03C2203/42Gas-phase processes using silicon halides as starting materials
    • C03C2203/44Gas-phase processes using silicon halides as starting materials chlorine containing
    • CCHEMISTRY; METALLURGY
    • C03GLASS; MINERAL OR SLAG WOOL
    • C03CCHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C2203/00Production processes
    • C03C2203/50After-treatment
    • C03C2203/52Heat-treatment
    • C03C2203/54Heat-treatment in a dopant containing atmosphere

Definitions

  • This disclosure is directed to a silica-titania glass doped with halogens and metal oxides having a very low CTE slope and a method for making such glass.
  • EUVL Extreme Ultra- Violet Lithography
  • MPU/DRAMs MPU - Micro Processing Unit , and DRAM - Dynamic Random Access Memory
  • the EUVL scanners which are used to produce these Integrated Chips are presently being produced in small numbers to demonstrate this new technology.
  • Optics, particularly reflective optics, are an important part of these scanners.
  • Low thermal expansion glass for example ULE ® glass (Corning Incorporated) is currently being used for making the projection optics systems.
  • ULE ® Glass is currently being used for making the projection optics systems.
  • the major advantages of a low thermal expansion glass such as ULE ® Glass are polishability to the required finish, its CTE (coefficient of thermal expansion or expansivity) control, and its dimensional stability.
  • the specifications are becoming more stringent for the newer optics systems.
  • the specifications for the materials used in the optics systems are required to meet tighter and tighter requirements.
  • the present disclosure is directed to a material that can meet these tighter requirements.
  • the material disclosed herein has an expansivity slope, that is significantly improved over that of the materials presently available. Summary
  • the present disclosure is directed to a doped silica-titania glass D-Si0 2 -Ti0 2 , herein also called DST glass, having an expansivity (or CTE) slope that is significantly improved over the expansivity slope of the presently available binary silica-titania glass Si0 2 -Ti0 2 with the dopants being halogens and one or more oxides of Al, Nb and Ta.
  • DST glass the improvement in the glass' expansivity slope exceeds the improvements that are possible by adjustment of the annealing cycle alone and/or allows for the same improvement in expansivity slope to be obtained via faster annealing cycles which greatly reduces costs. This is accomplished via a combination of both structural and compositional changes.
  • the DST glass has a halogen, for example fluorine, F, and one or more of the oxides of Al, Ta and Nb, added to a titania doped silica glass system.
  • the DST glass contains 0.1 wt.% to 5 wt.% fluorine, 50 ppm-wt. to 6 wt.%) of oxides of Al, Ta and Nb, 3 wt.%> to 10 wt.%> Ti0 2 and the remainder Si0 2 .
  • the DST glass contains 0.2 wt.%> to 3 wt.%> F, 50 ppm-wt.
  • the DST glass contains 1 wt.% to 2 wt.% F, 50 ppm-wt. to 6 wt.%) of oxides of Al, Ta and Nb, 5 wt.%> to 8 wt.%> Ti0 2 and the remainder Si0 2 .
  • the OH concentration in the DST glass is less than
  • the OH concentration is less than 50 ppm. In a further embodiment the OH concentration is less than 30 ppm. In an additional embodiment the OH concentration is less than 20 ppm.
  • the annealing cycle is controlled to yield the desired glass structure(s). It has been found that while annealing alone can provide a structural improvement leading to an expansivity slope reduction of up to 40% for a silica-titania glass that does not contain fluorine, the addition of dopants, in an amount in the range disclosed herein, provides for structural improvements that can lead to a CTE slope reduction in excess of 70%>.
  • the DST glass of this disclosure has an expansivity slope at 20°C of less than 1 ppb/K 2 . In an embodiment the DST glass' expansivity slope at 20°C is less than 0.8 ppb/K 2 . In another embodiment the DST glass' expansivity slope at 20°C is less than 0.6 ppb/K 2 .
  • the annealing cycle is controlled in such a manner that it would yield the desired homogeneity of the fictive temperature of the DST glass.
  • This aspect is particularly important due to the presence of the dopants whose concentration distribution could be non-uniform.
  • the halogens especially, affect the fictive temperature significantly and any non-uniformity in their distribution could cause large variations in properties and render the glass useless.
  • the DST glass has a fictive temperature, T f , of less than 875°C. In an embodiment the DST glass has a fictive temperature of less than 825°C. In another embodiment the DST glass has a fictive temperature of less than 775°C.
  • This DST glass disclosed herein is not process limited. That is, the DST glass can be made by different manufacturing processes, for example, sol-gel, soot blank, soot pressing, overhead vapor deposition, the direct process, the indirect process, plasma process and other processes known in the art.
  • the DST glass has two crossover temperatures, Tzc (temperature at which the CTE of the glass is zero, also called herein a Tzc point) within the normal operational range for the glass when used in lithographic processes, including processes using the 13.5 nm wavelength radiation.
  • Tzc temperature at which the CTE of the glass is zero
  • Tzc point within the normal operational range for the glass when used in lithographic processes, including processes using the 13.5 nm wavelength radiation.
  • the two Tzcs are in the range of 0°C to 150°C.
  • the two T ZC 'S are in the range of 20°C to 100°C.
  • the two Tzc values are in the range of 20°C to 80°C.
  • the two Tzcs are in the range of 10°C to 60°C or even 10 to 40°C.
  • the DST glass has a crossover temperature (Tzc) in the range of 0°C to 100°C in combination with an expansivity slope which substantially equals zero within this temperature range.
  • Tzc crossover temperature
  • the DST glass has a strain point of less than 900°C. In another embodiment the strain point is less than 850°C. In a further embodiment the strain point is less than 810°C.
  • the DST glass has a viscosity that is significantly reduced over that of the ordinary binary silica-titania glass Si0 2 -Ti0 2 .
  • the ordinary binary silica-titania glass has a Anneal Point of 1001 °C and Strain Point of 892°C, whereas the DST glass has Anneal Point and Strain Point of 885°C and 770°C.
  • T f varies less than ⁇ 10°C within an entire part. In another embodiment the T f variation is less than ⁇ 5°C within an entire part. In a further embodiment the T f variation is less than ⁇ 2°C within an entire part. In one embodiment the Tzc variation is less than ⁇ 5°C within an entire part. In another embodiment the Tzc variation is less than ⁇ 3°C within an entire part. In an additional embodiment the Tzc variation is less than ⁇ 2°C within an entire part. The variation in these average values in the entire part satisfy the above limits. It should be noted that this requires both good control of composition as well as tight control of the annealing process. Both will be needed to be within the scope of this invention.
  • the an article or part made of the DST glass has an MSFR (Mid Spatial Frequency Roughness) of less than 0.2nm. In another embodiment the MSFR is less than 0.15 nm. Ina further embodiment the MSFR is than 0.12nm rms.
  • MSFR Mobile Spatial Frequency Roughness
  • the peak CTE within the two crossover temperatures does not exceed 30 ppb/K and has a slope of zero ppb/K 2 within the two cross over temperatures. In another embodiment peak CTE within the two crossover temperatures do not exceed 20 ppb/K. In a further embodiment the peak CTE within two crossover temperatures is less than 15 ppb/K. In an additional embodiment the peak CTE within the two crossover temperatures is less than 10 ppb/K.
  • the DST glass of this disclosure can be used to make photo mask blanks or as projection optics mirror substrates.
  • the DST glass can also be used to make smaller blanks which can then be used to form the critical zone of a mirror blank of a projection optics system in a EUVL stepper.
  • Halogen doping can be achieved during
  • Figure 1 is a graph of CTE vs. T f illustrating the effect of F-dopant addition (in this example the halogen is fluorine, wt.%), represented by diamonds 10, on the CTE slope of a silica-titania glass. Silica-titania glass without the added dopant is represented by the square 20.
  • Figure 2 is a graph of the Anneal and Strain Points (left vertical axis) and the Log of the Viscosity (right vertical axis) versus dopant addition (in this example the halogen is fluorine, wt.%) for silica-titania glasses containing 0 wt.% up to 1.6 wt.%) dopants.
  • Figure 3 is a graph of expansivity versus temperature for (a) a silica-titania glass without dopants and (b) a doped silica-titania glass after a fast annealing cycle and a slow annealing cycle as described herein.
  • Figure 4 is a graph of expansivity versus temperature illustrating the expansivity behavior between 20 °C and 100 °C for different doped Si0 2 -Ti0 2 glasses which differ only in Ti0 2 concentration in order to yield different values of Tzcl .
  • Figure 5 is a graph of expansivity versus temperature for doped silica-titania glasses that differ only in titania content, each glass having been annealed to have the same Active temperature T f of 730°C.
  • the base glass is a silica- titania glass.
  • a dopant is added to the base glass to make a low expansion glass according to this disclosure the composition of the resulting glass is given as wt.% or ppm-wt. of the added dopant, wt.% Ti0 2 and the remainder being wt.% Si0 2 .
  • the expansivity of a material over a given temperature range, ACTE is the difference between the maximum CTE, (CTE max ) and the minimum CTE (CTE m i n ) over the temperature range and can be determined using the equation:
  • FIG. 6 is Curve 52 of Figure 5 with CTE max and CTE m i n indicated.
  • CTE max is 3.8 ppb/K and CTEmin is -2 ppb/K.
  • Silica-titania glass with reduced expansivity is an important requirement for the projection optics mirror blanks as well as photomask blanks for EUVL steppers.
  • the DST glass described herein has a reduced CTE slope (the slope is a measurement of the instantaneous change in CTE (ppb/K) versus temperature (in K)) which will allow EUVL stepper makers to use higher source power because of the materials described herein offering improved thermal/dimensional stability.
  • the DST glass described herein will also enable EUVL users to achieve much higher resolution.
  • the DST glass described herein can be used in small quantities for the critical zone of projection optics mirror which will help lower the cost of large projection optics mirrors which can have a diameter in the range of 10 cm to 60 cm.
  • the use of inserts in the critical zone of EUVL systems elements is disclosed in commonly owned U.S. Patent Application No. 13/563,882 and 13/564,215.
  • Tzcl can be adjusted by manipulation of Ti0 2 concentration alone.
  • Slow annealing can be used to lower the expansivity slope and bring Tzc2 lower.
  • an extremely low expansivity of +/- 3 ppb/K over a range of tens of degrees Celsius (°C) can only be obtained at temperatures in the neighborhood of the expansivity maximum, and thus such desirable regime can only be obtained in the undoped- standard annealed glass at temperatures starting at ⁇ 150 °C.
  • This disclosure describes a doped titania-silica glass containing up to 5 wt.% halogens and 50 ppm-wt. to 6 wt.% one or more oxides of Al, Ta and Nb.
  • the halogen doping was done during the consolidation step of the glass process. Halogen doping during the consolidation enables the making of an initial oxide doped soot blank by different methods, for example:
  • a sol-gel process in which silica-titania soot is made and formed into a shape using the sol-gel process and dried to form porous silica-titania articles that are then treated with a halogen containing gas during consolidation.
  • additional oxide dopants precursors are added to the sol-gel before it is formed into a shape, dried and treated with halogen during consolidation. Consolidation may be carried out in air or an air-inert gas mixture.
  • the soot used in the sol-gel process is one in which the additional oxide precursors were added during the formation of the silica-titania soot as described above in Item (2).
  • the fluorine containing gas can be F 2 , CF 4 , SF 4 , SiF 4 or other volatile fluorine compounds mixed with a carrier gas, for example air.
  • a carrier gas for example air.
  • compounds such as CF 4 and SF 4 are used as the fluorinating agent oxygen is present in the carrier gas in order to convert the non- fluorine portion of the fluorinating agent ( C, Si or S) to a volatile species, for example C0 2 , SiO or S0 2 , which is swept out of the system by the carrier gas.
  • the carrier gas can also be an inert gas, for example nitrogen, helium or argon, However, when these are used as the carrier gas for CF 4 , SiF 4 and SF 4 oxygen should be present as indicated above.
  • Halogens in addition to doping the glass, can dehydrate the glass. That is, the halogen will reduce the number of hydroxyl groups, OH, that may be present in the glass. Dehydration can also be done using a mixture of chlorine and fluorine, or sequentially by first dehydrating using chlorine and then using a fluorine containing species such as those described above to fluorine dope the glass.
  • the consolidation temperature will depend on the method of soot blank preparation and can vary from 1300°C for a OVD process to 1670°C for other processes such as soot pressing and sol-gel.
  • the DST glass was annealed by heating to a temperature in the range of 1000°C to 1100°C for a time in the range of 0.5 hour to 2 hours. In one embodiment the annealing temperature was 1050°C and the holding time at the annealing temperature was 1 hour.
  • the glass was cooled from the annealing temperature, for example 1050°C, to 700°C at the rate of 3°C per hour, and then cooled from 700°C to room temperature naturally; natural cooling being to turn off the heat source and allowing the glass to cool to room temperature at the cooling rate of the furnace.
  • Example 1 the target halogen content of the glass is 1.5 wt.% F and Example 2, 0.8 wt.% F. Annealing cycles and there effect of Active temperature have been described and discussed U.S. Patent Application Publication Nos. 2011/0048075, 2011/0207593 and 2011/0207592/
  • Titania doped silica soot particles were made by flame hydrolysis using TiCl 4 and SiCLt, and the soot was deposited on a bait rod in a lathe using the OVD process for more than 10 hours. The resulting soot blank was then consolidated in a muffle furnace as follows:
  • the resulting blank was bluish gray in color due to the presence of Ti0 2 crystallites.
  • Discs of 15 mm diameter were cut from the consolidated blank and were heated to a temperature of 1670°C for 1 hour to dissolve the crystallites and obtain a clear glass. These discs were then annealed by heating them to 1050°C for 1 hour followed by cooling to 700°C at a rate of either (a) 3°C/h or (b) 30°C/h to achieve two different Active temperatures.
  • the Active temperature of samples (a) and (b) were 772°C and 785°C, respectively.
  • the samples with a T f of 772°C has a CTE slope of less than 0.7 ppb/K 2 and the samples with a T f of 785°C had an average CTE slope of less than 0.8 ppb/K 2 at 20°C.
  • Code 7973 glass has a CTE slope of 1.60ppb/K 2 .
  • Titania doped silica soot particles were made by flame hydrolysis of TiCl 4 and SiCl 4 and the soot was deposited on a bait rod in a lathe using the OVD process for about 16.5 hours.
  • the soot blank thus made was 5992 g in mass with a density of 0.42 g/cc and a diameter of 135.7 mm.
  • the soot blank was then consolidated in a muffle furnace as follows:
  • the resulting blank was bluish gray in color due to the presence of Ti0 2 crystallites.
  • Discs 15 mm in diameter were cut from the consolidated blank and were heated to 1670°C for 1 hour to dissolve the crystallites and obtain a clear glass. These discs were then annealed by heating them to 1050°C for 1 hour followed by cooling to 700°C at either (a) 3°C/hour (slow anneal cycle) or (b) 30°C/hour (fast anneal cycle) rate to achieve two different Active temperatures which were 870°C and 918°C, respectively. These samples were then polished and assembled in to sandwich seals with a regular ULE® glass (7973) as the central piece between two experimental samples of the same composition and T f .
  • the sandwich seal samples are approximately of the size 1.5" X 1" X 1/8" (38mm x 25.4 mm x 3.2mm). Stress on the center piece (the meat of the sandwich) exerted by the two experimental pieces (the bread pieces of the sandwich) was measured as the sandwich is heated from -100°C to +125°C from which the difference in the CTE slope between the experimental material and the Code 7973 ULE glass, whose CTE slope is known, is extracted.
  • the samples with a T f of 870°C has a CTE slope of less than 1.2 ppb/K 2 at 20°C and the samples with a T f of 918°C had an average CTE slope of less than 1.5 ppb/K 2 at 20°C.
  • Figure 1 illustrates the effect of fluorine addition to a silica-titania glass on the CTE slope of the resulting DST glass as compared to the CTE slope of a binary silica-titania glass without added fluorine.
  • the DST glass is represented by
  • diamonds 10 and the binary silica-titania glass without fluorine is represented by square 20.
  • the fluorine addition decreases the viscosity of the glass and thereby decreases the Active temperature of the glass.
  • Fictive temperature reduction is the prime driver for CTE slope reduction in silica-titania glass. However, while it has been found that fluorine addition does reduce the CTE slope, that reduction is greater than that which would be expected from the fictive temperature reduction alone.
  • Figure 2 is a graph illustrating the effect of fluorine addition on the Anneal and Strain Points (left vertical axis) and the Viscosity (right vertical axis) of silica-titania glasses containing from 0 wt.% F up to 1.6 wt.% F.
  • the graph shows the anneal and strains points decreasing at substantially the same rate as the fluorine content increases, and that the viscosity of the glass is also reduced with increasing fluorine content..
  • Figure 3 is a graph of expansivity versus temperature for (1) silica-titania glass without fluorine and (2) a fluorine doped silica-titania glass after a fast annealing cycle and a slow annealing cycle as described herein. All the glasses in Figure 3 have the same first crossover temperature Tzcl of 20°C which is accomplished by adjusting the wt.,% Ti0 2 in the glass. The F content in the DST glasses is 1.5 wt.% as indicated in Table 1. The Figure 3 shows the behavior of each glass after undergoing two different annealing cycles a fast annealing cycle in which the cooling rate is 30°C/hour and a slow annealing cycle in which the cooling rate is 3°C/hour. Ti0 2 and F values are in wt.%
  • ACTE is in ppb/K over the temperature range 0°C to 150°C
  • the numeral 30 curve which represents ULE glass after the fast anneal, has a maximum expansivity (black dot ⁇ ) of ⁇ 70 ppb/K, a first crossover temperature Tzcl at 20°C and a second zero crossover temperature Tzc2 at T > 300 °C.
  • the numeral 32 curve which represents a ULE glass after the slow anneal, has a maximum expansivity (black dot ⁇ ) of -50 ppb/K, a first crossover temperature Tzcl of 20°C and second crossover temperature Tzc2 of approximately 230 °C.
  • the second crossover temperature Tzc2 for the glasses of curves 30 and 32 is off the scale to the right in Figure 3.
  • the numeral 34 curve which represents the DST glass after annealing at 30°C/hour, has maximum expansivity (black dot ⁇ ) of approximately 12 ppb/K and a first crossover temperature Tzcl of 20°C and a second crossover temperature Tzc2 of approximately 100°C.
  • the numeral 36 curve which represents the DST glass after the slow anneal, has a maximum expansivity (black dot ⁇ ) of approximately 6 ppb/K, a first crossover temperature Tzcl of 20°C and second crossover temperature of approximately 65°C.
  • Figure 4 is a graph of expansivity versus temperature illustrating the expansivity behavior between 20 °C and 100 °C of four different doped Si0 2 -Ti0 2 glasses which differ only in Ti0 2 concentration in order to yield different values of Tzcl .
  • the titania value for each curve is given in Table 2 A.
  • the halogen content in each sample is 1.5 wt.% and all four samples have been annealed to the same T f of approximately 780°C using the fast anneal cycle.
  • Table 2B gives the ACTE value for all for curves over two temperature ranges.
  • the glass 44 with Tzcl of 30 °C has a ACTE of 11 and provides a Tzc2 of - 87°C.
  • Figure 5 is a graph of expansivity versus temperature in the range of 20°C to 60°C for four different doped silica-titania glass that differ only in titania content.
  • the halogen content of each glass is 1.5 wt.% and each glass has been annealed using the slow anneal cycle to have the same Active temperature T f of 730°C.
  • Tzc2 within the temperature range of interest, that is a Tzc2 of less than or substantially equal to 60°C.
  • optimum properties would be obtained with a glass having a Ti0 2 concentration such as to bring Tzcl to ⁇ 26 °C and Tzc2 to ⁇ 58 °C. Based on the data that has been obtained, the Ti0 2 concentration would be 8.9 to 9.0 wt.%.
  • Table 3B gives the ACTE value for all for curves over two temperature ranges.
  • the glass made according to the present disclosure can be used to make photo mask blanks or as projection optics mirror substrates; and it can also be used to make smaller blanks which can then be used to form the critical zone of a mirror blank of a projection optics system in a EUVL stepper.
  • Halogen doping can be achieved during consolidation of a regular titania-silica OVD blank.
  • doped silica-titania glass and glass shapes can be made using either soot-pressing or sol-gel methods in which halogen doping us carried out during a drying, heating or consolidation step.

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Organic Chemistry (AREA)
  • Manufacturing & Machinery (AREA)
  • Physics & Mathematics (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Thermal Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Glass Compositions (AREA)
  • Glass Melting And Manufacturing (AREA)
PCT/US2013/072146 2012-11-30 2013-11-27 Very low cte slope doped silica-titania glass Ceased WO2014085529A1 (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
JP2015545421A JP6291505B2 (ja) 2012-11-30 2013-11-27 非常に低いcte勾配のドープされたシリカ−チタニアガラス
EP13803404.6A EP2925686A1 (en) 2012-11-30 2013-11-27 Very low cte slope doped silica-titania glass

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201261731621P 2012-11-30 2012-11-30
US61/731,621 2012-11-30
US13/835,039 US8901019B2 (en) 2012-11-30 2013-03-15 Very low CTE slope doped silica-titania glass
US13/835,039 2013-03-15

Publications (1)

Publication Number Publication Date
WO2014085529A1 true WO2014085529A1 (en) 2014-06-05

Family

ID=50826009

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2013/072146 Ceased WO2014085529A1 (en) 2012-11-30 2013-11-27 Very low cte slope doped silica-titania glass

Country Status (4)

Country Link
US (1) US8901019B2 (enExample)
EP (1) EP2925686A1 (enExample)
JP (1) JP6291505B2 (enExample)
WO (1) WO2014085529A1 (enExample)

Cited By (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015138665A1 (en) * 2014-03-14 2015-09-17 Corning Incorporated Boron-doped titania-silica glass having very low cte slope
WO2016085915A1 (en) * 2014-11-26 2016-06-02 Corning Incorporated Doped silica-titania glass having low expansivity and methods of making the same
WO2016130604A1 (en) * 2015-02-13 2016-08-18 Corning Incorporated Ultralow expansion titania-silica glass
WO2016154190A1 (en) * 2015-03-26 2016-09-29 Corning Incorporated Glass composite for use in extreme ultra-violet lithography
US9580350B2 (en) 2014-11-19 2017-02-28 Corning Incorporated High hydroxyl TiO2-SiO2 glass
EP3222592A1 (en) * 2013-09-13 2017-09-27 Corning Incorporated Ultralow expansion glass
JP2018503585A (ja) * 2014-12-12 2018-02-08 コーニング インコーポレイテッド ドープト超低膨張ガラス及びその作製方法

Families Citing this family (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102013112396B3 (de) * 2013-11-12 2014-11-13 Heraeus Quarzglas Gmbh & Co. Kg Verfahren zur Herstellung eines Rohlings aus Titan- und Fluor-dotiertem, hochkieselsäurehaltigem Glas
EP3000791B1 (de) * 2014-09-24 2017-04-26 Heraeus Quarzglas GmbH & Co. KG Verfahren zur Herstellung eines Rohlings aus Fluor- und Titan-dotiertem, hochkieselsäurehaltigem Glas für den Einsatz in der EUV-Lithographie und danach hergestellter Rohling
EP3224211B1 (en) * 2014-11-26 2021-05-05 Corning Incorporated Method for making halogen doped optical element
US9932261B2 (en) * 2015-11-23 2018-04-03 Corning Incorporated Doped ultra-low expansion glass and methods for annealing the same
US10464840B2 (en) * 2016-10-05 2019-11-05 Corning Incorporated Near infrared shielding and laser-resistant window
KR102710639B1 (ko) 2016-12-21 2024-09-27 코닝 인코포레이티드 소결 시스템 및 소결된 물품
US11270724B1 (en) * 2021-03-04 2022-03-08 Western Digital Technologies, Inc. Glass substrates for heat assisted magnetic recording (HAMR) and methods and apparatus for use with the glass substrates

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060179879A1 (en) * 2004-12-29 2006-08-17 Ellison Adam J G Adjusting expansivity in doped silica glasses
US20090143213A1 (en) * 2007-11-30 2009-06-04 Kenneth Edward Hrdina Low expansion glass material having low expansivity gradient
US20100261597A1 (en) * 2007-12-27 2010-10-14 Asahi Glass Company Limited Tio2-containing silica glass
WO2011078414A2 (en) * 2009-12-25 2011-06-30 Asahi Glass Company, Limited. Substrate for euvl optical member

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4792706B2 (ja) 2003-04-03 2011-10-12 旭硝子株式会社 TiO2を含有するシリカガラスおよびその製造方法
EP1471038A3 (de) 2003-04-26 2005-11-23 Schott Ag Verfahren zur Herstellung von Glaskörpern aus dotiertem Quarzglas
DE102004060600A1 (de) 2003-12-18 2005-07-14 Schott Ag Mit Fluor dotiertes Silicatglas und Verwendung eines solchen
DE102007029403A1 (de) * 2006-06-28 2008-01-03 Corning Incorporated Glas mit sehr geringer Ausdehnung und Verfahren zu dessen Herstellung
JP5042714B2 (ja) * 2007-06-06 2012-10-03 信越化学工業株式会社 ナノインプリントモールド用チタニアドープ石英ガラス
JP5428323B2 (ja) * 2007-12-27 2014-02-26 旭硝子株式会社 TiO2を含有するシリカガラス
KR20100118125A (ko) 2008-02-29 2010-11-04 아사히 가라스 가부시키가이샤 TiO₂ 함유 실리카 유리 및 이를 사용한 리소그래피용 광학 부재
JP5644058B2 (ja) 2008-03-21 2014-12-24 旭硝子株式会社 TiO2を含有するシリカガラス
JP2010135732A (ja) 2008-08-01 2010-06-17 Asahi Glass Co Ltd Euvマスクブランクス用基板
US8735308B2 (en) 2009-01-13 2014-05-27 Asahi Glass Company, Limited Optical member comprising TiO2-containing silica glass
WO2010131662A1 (ja) 2009-05-13 2010-11-18 旭硝子株式会社 TiO2-SiO2ガラス体の製造方法及び熱処理方法、TiO2-SiO2ガラス体、EUVL用光学基材
JP5572016B2 (ja) 2009-08-04 2014-08-13 シスメックス株式会社 組織液抽出用デバイス、その製造方法、及び該デバイスを用いた組織液の分析方法
US8713969B2 (en) 2009-08-31 2014-05-06 Corning Incorporated Tuning Tzc by the annealing of ultra low expansion glass
US8541325B2 (en) 2010-02-25 2013-09-24 Corning Incorporated Low expansivity, high transmission titania doped silica glass
US20110207593A1 (en) 2010-02-25 2011-08-25 Carlos Duran Expansivity in Low Expansion Silica-Titania Glasses
US20130047669A1 (en) 2011-08-31 2013-02-28 Sezhian Annamalai Method of making a silica-titania glass having a ternary doped critical zone
US9034450B2 (en) 2011-08-31 2015-05-19 Corning Incorporated Binary silica-titania glass articles having a ternary doped silica-titania critical zone

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20060179879A1 (en) * 2004-12-29 2006-08-17 Ellison Adam J G Adjusting expansivity in doped silica glasses
US20090143213A1 (en) * 2007-11-30 2009-06-04 Kenneth Edward Hrdina Low expansion glass material having low expansivity gradient
US20100261597A1 (en) * 2007-12-27 2010-10-14 Asahi Glass Company Limited Tio2-containing silica glass
WO2011078414A2 (en) * 2009-12-25 2011-06-30 Asahi Glass Company, Limited. Substrate for euvl optical member

Cited By (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9890071B2 (en) 2013-09-13 2018-02-13 Corning Incorporated Ultralow expansion glass
EP3222592A1 (en) * 2013-09-13 2017-09-27 Corning Incorporated Ultralow expansion glass
US9382150B2 (en) 2014-03-14 2016-07-05 Corning Incorporated Boron-doped titania-silica glass having very low CTE slope
WO2015138665A1 (en) * 2014-03-14 2015-09-17 Corning Incorporated Boron-doped titania-silica glass having very low cte slope
JP2017508713A (ja) * 2014-03-14 2017-03-30 コーニング インコーポレイテッド 非常に小さいcte勾配を有するホウ素ドープチタニア−シリカガラス
US9580350B2 (en) 2014-11-19 2017-02-28 Corning Incorporated High hydroxyl TiO2-SiO2 glass
WO2016085915A1 (en) * 2014-11-26 2016-06-02 Corning Incorporated Doped silica-titania glass having low expansivity and methods of making the same
JP2018503585A (ja) * 2014-12-12 2018-02-08 コーニング インコーポレイテッド ドープト超低膨張ガラス及びその作製方法
US10329184B2 (en) 2015-02-13 2019-06-25 Corning Incorporated Ultralow expansion titania-silica glass
US9822030B2 (en) 2015-02-13 2017-11-21 Corning Incorporated Ultralow expansion titania-silica glass
JP2018508453A (ja) * 2015-02-13 2018-03-29 コーニング インコーポレイテッド 超低膨張チタニア・シリカガラス
WO2016130604A1 (en) * 2015-02-13 2016-08-18 Corning Incorporated Ultralow expansion titania-silica glass
US11028006B2 (en) 2015-02-13 2021-06-08 Corning Incorporated Ultralow expansion titania-silica glass
WO2016154190A1 (en) * 2015-03-26 2016-09-29 Corning Incorporated Glass composite for use in extreme ultra-violet lithography
JP2020079199A (ja) * 2015-03-26 2020-05-28 コーニング インコーポレイテッド 極紫外線リソグラフィーに使用するためのガラス複合体
JP7012761B2 (ja) 2015-03-26 2022-01-28 コーニング インコーポレイテッド 極紫外線リソグラフィーに使用するためのガラス複合体

Also Published As

Publication number Publication date
EP2925686A1 (en) 2015-10-07
US20140155246A1 (en) 2014-06-05
JP2016502495A (ja) 2016-01-28
JP6291505B2 (ja) 2018-03-14
US8901019B2 (en) 2014-12-02

Similar Documents

Publication Publication Date Title
US8901019B2 (en) Very low CTE slope doped silica-titania glass
EP2178804B1 (en) Method of making fused silica having low oh and od levels
JP5202959B2 (ja) 高屈折率均一性溶融シリカガラスおよびその製造方法
US9382150B2 (en) Boron-doped titania-silica glass having very low CTE slope
EP3222592B1 (en) Ultralow expansion glass
JP2005104820A (ja) TiO2を含有するシリカガラスおよびその製造方法
TWI689476B (zh) 摻雜的超低膨脹玻璃及用於製造其之方法
TWI651277B (zh) 製造用於euv微影術之高矽酸含量的氟與鈦摻雜玻璃底板的方法及由該方法製造之底板
JP2018508453A (ja) 超低膨張チタニア・シリカガラス
EP3380441B1 (en) Doped ultra-low expansion glass and methods for annealing the same
JP2007186412A (ja) 脈理が低減された低膨張率ガラスおよび素子ならびにその製造方法
JPH0952719A (ja) 合成石英ガラス母材の製造方法
JP5402975B2 (ja) TiO2を含有するシリカガラスおよびその製造法

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 13803404

Country of ref document: EP

Kind code of ref document: A1

ENP Entry into the national phase

Ref document number: 2015545421

Country of ref document: JP

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 2013803404

Country of ref document: EP

NENP Non-entry into the national phase

Ref country code: DE