WO2014010056A1 - Dispositif de détection de photons et procédé associé - Google Patents

Dispositif de détection de photons et procédé associé Download PDF

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Publication number
WO2014010056A1
WO2014010056A1 PCT/JP2012/067800 JP2012067800W WO2014010056A1 WO 2014010056 A1 WO2014010056 A1 WO 2014010056A1 JP 2012067800 W JP2012067800 W JP 2012067800W WO 2014010056 A1 WO2014010056 A1 WO 2014010056A1
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Prior art keywords
photon detection
signal
circuit
bias
phase shift
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PCT/JP2012/067800
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English (en)
Japanese (ja)
Inventor
創 小林
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三菱電機株式会社
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Priority to JP2014505429A priority Critical patent/JP5649759B2/ja
Priority to PCT/JP2012/067800 priority patent/WO2014010056A1/fr
Publication of WO2014010056A1 publication Critical patent/WO2014010056A1/fr

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    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00—Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/02—Details
    • H01L31/02016—Circuit arrangements of general character for the devices
    • H01L31/02019—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier
    • H01L31/02027—Circuit arrangements of general character for the devices for devices characterised by at least one potential jump barrier or surface barrier for devices working in avalanche mode
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
    • G01J1/00—Photometry, e.g. photographic exposure meter
    • G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
    • G01J1/44—Electric circuits
    • G01J1/46—Electric circuits using a capacitor

Definitions

  • the present invention relates to a photon detection apparatus and method used in an optical communication system such as quantum cryptography communication or a peripheral circuit thereof.
  • an APD Anagonal Photo-Diode: avalanche photodiode
  • a communication wavelength band 1550 nm band.
  • a drive signal obtained by combining a DC bias voltage slightly lower than the breakdown voltage of the APD and a pulsed or sinusoidal AC bias voltage is applied to the APD to perform a Geiger mode operation.
  • a weak photon detection signal can be acquired.
  • the electrical signal output from the APD includes not only the photon detection signal but also a periodic noise signal derived from the APD drive signal.
  • the periodic noise signal becomes noticeable when the repetition frequency of the AC bias voltage is large, and becomes a factor that hinders extraction of the photon detection signal by threshold detection.
  • the repetition frequency of the AC bias voltage reaches several hundreds of MHz or more, the amplitude of the periodic noise signal exceeds that of the photon detection signal, making it difficult to extract the photon detection signal.
  • Patent Document 1 the APD drive signal is a sine wave
  • the periodic noise signal is also a sine wave (single frequency). Easy to remove.
  • the APD drive signal is a rectangular wave (can be a sine wave)
  • the APD output signal is divided into two by a demultiplexer, and one of the two divided signals is set as a delay line.
  • the periodical noise signal including a plurality of frequency components is removed by combining the two divided signals and taking a difference by delaying the time by the period of the drive signal via the.
  • the noise signal is periodic, the photon detection signal is randomly generated, so that only the photon detection signal can be acquired.
  • the conventional photon detection device can extract only the photon detection signal by removing the periodic noise signal superimposed on the photon detection signal by some means. Since a highly reliable characteristic is required for the band elimination filter for removing the noise signal, there is a problem that the drive frequency cannot be flexibly changed due to the frequency dependence of the band elimination filter. .
  • the present invention has been made in order to solve the above-described problems, and it is possible to correct the periodic noise signal by changing the phase of only the periodic noise signal without constructing a means for removing the periodic noise signal. It is an object of the present invention to provide a photon detection device and method that facilitates extraction of a photon detection signal by threshold detection by superimposing a photon detection signal on the vertex position of the image and making only the photon detection signal stand out.
  • a photon detection element an anode circuit connected to the anode of the photon detection element, an AC bias generation circuit that generates an AC bias voltage of a drive signal applied to the photon detection element, and a DC that generates a DC bias voltage of the drive signal
  • a bias generating circuit an AC / DC combining circuit that applies a drive signal obtained by combining the AC bias voltage and the DC bias voltage to the cathode of the photon detection element via the cathode circuit, an AC bias generating circuit, and an AC / DC
  • a phase shift that delays only a periodic noise signal derived from the AC bias voltage by a predetermined phase shift amount among the electrical signals output from the cathode circuit inserted between the multiplexing circuit and the photon detection element anode.
  • a predetermined phase shift amount is obtained by detecting a photon detection signal and a periodic noise included in the electrical signal when output from the anode. It corresponds to the phase difference between the items.
  • the photon detection signal can be reliably extracted at the time of threshold detection.
  • FIG. 1 is a block diagram showing a circuit configuration of a photon detection apparatus according to Embodiment 1 of the present invention.
  • a photon detection device includes, for example, a photon detection element 1 made of APD, an anode circuit 2 made of a detection resistor 2a, a cathode circuit 3 made of a capacitor 3a and a resistor 3b, a sinusoidal bias generation circuit 4, and a DC A bias generation circuit 5, an AC / DC multiplexing circuit 6, and phase shift means 7 are provided.
  • a cathode circuit 3 is connected to the cathode (electric signal input terminal) of the photon detection element 1 via an AC / DC combining circuit 6, and an anode circuit 2 is connected to the anode (electric signal output terminal) of the photon detection element 1.
  • the phase shift means 7 is connected.
  • the photon detection element 1 is an optical device whose output waveform changes depending on whether or not a photon in the communication wavelength band (1550 nm) is input, and outputs an electrical signal from the anode in response to an external photon input.
  • the detection resistor 2a of the anode circuit 2 is inserted between the anode of the photon detection element 1 and the ground.
  • the capacitor 3a is inserted between the sinusoidal bias generating circuit 4 and the AC / DC combining circuit 6, and the resistor 3b is connected between the connection point of the sinusoidal bias generating circuit 4 and the capacitor 3a and the ground. Is inserted in between.
  • the sinusoidal bias generation circuit 4 generates a sinusoidal AC bias voltage
  • the DC bias generation circuit 5 generates a DC bias voltage slightly lower than the breakdown voltage of the photon detection element 1.
  • the AC bias voltage from the sinusoidal bias generation circuit 4 is input to the AC / DC multiplexing circuit 6 via the cathode circuit 3.
  • the AC / DC combining circuit 6 combines the AC bias voltage via the cathode circuit 3 and the DC bias voltage from the DC bias generating circuit 5 to generate a drive signal and applies it to the cathode of the photon detection element 1. To do.
  • the phase shift means 7 delays only the periodic noise signal N derived from the drive signal among the electrical signals output from the anode of the photon detection element 1 to make the waveform of the photon detection signal S stand out.
  • the electric signal via the phase shift means 7 is input to a signal processing circuit (not shown) at the subsequent stage.
  • the phase shift means 7 has a BEF (for example, 101 MHz) whose center frequency is slightly shifted from the sinusoidal frequency (for example, 100 MHz). ) May be used.
  • the phase shift means 7 may have a circuit configuration that combines an electrical signal output from the anode of the photon detection element 1 and another AC signal.
  • the shape (frequency, amplitude, phase) of the AC signal to be combined may be arbitrarily set.
  • using a sine wave as the AC signal to be combined can make the photon detection signal S stand out more easily.
  • FIG. 2 is a waveform diagram showing the photon detection signal S by the photon detection element 1 together with the periodic noise signal N, and shows an example of an integrated waveform of the electric signal before passing through the phase shift means 7.
  • the photon detection signal S having a signal waveform before passing through the phase shift means 7 is superimposed on the positive vertex portion of the periodic noise signal N derived from the drive signal, the photon is detected using the threshold Th1. It is difficult to detect only the detection signal S.
  • FIG. 3 is a waveform diagram showing the photon detection signal S after passing through the phase shift means 7 together with the periodic noise signal N, and shows an example of an integrated waveform of the electric signal after passing through the phase shift means 7.
  • the phase shift amount can be set to an appropriate value in advance according to the design specifications of the optical communication system.
  • the AC / DC combining circuit 6 combines the DC bias voltage generated from the DC bias generating circuit 5 and the AC bias voltage generated from the sine wave bias generating circuit 4 and then via the cathode circuit 3 to drive the AC / DC combining circuit 6.
  • a signal is applied to the cathode of the photon detection element 1.
  • the photon detection element 1 operates, and an output waveform of an electric signal corresponding to the photon input is generated from the anode.
  • the electrical signal output from the photon detection element 1 includes not only the photon detection signal S but also a sine-wave periodic noise signal N derived from the drive signal.
  • the amplitude of the static noise signal N reaches the photon detection signal S or more, it becomes a factor that hinders extraction of only the photon detection signal S by threshold detection.
  • the phase amount that delays the periodic noise signal N corresponds to the phase difference between the photon detection signal S and the periodic noise signal N included in the electrical signal output from the anode of the photon detection element 1.
  • the photon detection signal S is distributed over a wide frequency band, but the periodic noise signal N follows the frequency of the drive signal (sine wave). Therefore, by using a circuit element having a frequency dependency with respect to the frequency of the drive signal as the phase shift means 7, only the periodic noise signal N can be selectively delayed in time.
  • the photon detection signal S is arranged at the positive vertex of the periodic noise signal N.
  • the influence is limited only to the time of the positive apex portion of the periodic noise signal N, and it is not necessary to consider the periodic noise signal N over the entire time axis.
  • an unexpected noise signal may occur suddenly, and the overall performance of the photon detection device may be degraded due to the sudden noise signal.
  • the photon detection signal S to be observed deviates from the positive vertex of the sinusoidal periodic noise signal N, which is unnecessary for threshold detection. Disadvantages due to extraction can be avoided.
  • the waveform shape of the photon detection signal S may be complicated, and this also may cause a disadvantage in the overall performance of the photon detection device. is there.
  • the waveforms of the photon detection signal S and the periodic noise signal N can be adjusted so that the most effective threshold detection is possible.
  • the photon detection signal S cannot be placed strictly at the positive vertex of the sinusoidal periodic noise signal N, the photon detection signal S is placed near the positive vertex to detect the photon more than the periodic noise signal N. If the signal S can be made to stand out sufficiently, the above-described effects can be obtained.
  • Embodiment 1 of the present invention an effect equivalent to the function of the active mechanism can be achieved by a passive method.
  • the photon detection apparatus As described above, the photon detection apparatus according to Embodiment 1 (FIG. 1) of the present invention is applied to the photon detection element 1, the anode circuit 2 connected to the anode of the photon detection element 1, and the photon detection element 1.
  • a sinusoidal bias generation circuit 4 (AC bias generation circuit) that generates an AC bias voltage of the drive signal to be generated, a DC bias generation circuit 5 that generates a DC bias voltage of the drive signal, and an AC bias voltage and a DC bias voltage
  • the combined drive signal is inserted between the AC / DC combining circuit 6 for applying the combined drive signal to the cathode of the photon detection element 1 via the cathode circuit 3, and the sine wave bias generating circuit 4 and the AC / DC combining circuit 6.
  • the periodic noise signal N derived from the AC bias voltage is delayed by a predetermined phase shift amount.
  • the predetermined phase shift amount corresponds to the phase difference between the photon detection signal S and the periodic noise signal N included in the electrical signal when output from the anode of the photon detection element 1.
  • the photon detection element 1 is made of APD
  • the anode circuit 2 is constituted by a detection resistor 2a inserted between the anode of the photon detection element 1 and the ground.
  • the cathode circuit 3 includes a capacitor 3a inserted between the sinusoidal bias generation circuit 4 and the AC / DC multiplexing circuit 6, and a connection point between the sinusoidal bias generation circuit 4 and the capacitor 3a and the ground. And an inserted resistor 3b.
  • the photon detection method includes a step of applying a drive signal obtained by combining an AC bias voltage and a DC bias voltage to the photon detection element 1, and an electrical signal from the anode of the photon detection element 1. And a step of delaying only the periodic noise signal N included in the electrical signal by a predetermined phase shift amount to make only the photon detection signal S included in the electrical signal stand out.
  • phase shift means 7 only the periodic noise signal N derived from the drive signal of the photon detection element 1 is time-delayed, and the photon detection signal S is superimposed on the positive vertex position of the periodic noise signal N. Then, by performing threshold detection after making it stand out, an electrical signal in which the photon detection signal S and the periodic noise signal N are mixed in quantum cryptography communication or the like can be obtained without constructing means for removing the periodic noise signal N. Only the photon detection signal S can be detected with a threshold value easily and reliably.
  • FIG. 1 the specific circuit configuration of the phase shift means 7 is not mentioned. However, as shown in FIG. 4, the phase shift is performed by the sinusoidal bias generator 8 and the multiplexing circuit 9.
  • the means 7A may be configured.
  • FIG. 4 is a block diagram showing a circuit configuration of the photon detection device according to the second embodiment of the present invention. Components similar to those described above (see FIG. 1) are denoted by the same reference numerals as those described above. A detailed description will be omitted with “A” attached later.
  • the phase shift means 7A combines a sine wave bias generator 8 for generating a pulse signal (sine wave signal), a pulse signal from the sine wave bias generator 8 and an electric signal from the photon detection element 1. And a wave multiplexing circuit 9.
  • the pulse signal from the sinusoidal bias generator 8 has the same frequency as the periodic noise signal N (AC bias voltage) included in the electric signal and a phase of a predetermined amount. It has a center frequency that is different or slightly different from the frequency of the periodic noise signal N.
  • the sinusoidal bias generator 8 and the multiplexing circuit 9 realize the function as the phase shift means 7A, and the multiplexing circuit 9 generates the electric signal from the photon detection element 1 and the sinusoidal bias generation.
  • the pulse signal from the device 8 is input.
  • the multiplexing circuit 9 combines the electrical signal from the photon detection element 1 with a pulse signal (sine wave signal) having a different frequency or phase to thereby generate periodic noise derived from the drive signal as described above. Only the signal N is delayed in time so that only the photon detection signal S stands out. At this time, it is desirable that the amplitude of the pulse signal combined by the multiplexing circuit 9 is set to be the same as the amplitude of the periodic noise signal N.
  • the phase shift means 7A of the photon detection device includes the sine wave bias generator 8 (AC bias generator) and the multiplexing circuit 9, and is sinusoidal.
  • a pulse signal (sine wave signal) having the same amplitude as the periodic noise signal N derived from the drive signal of the photon detection element 1 is generated using the bias generator 8, and the photon detection element 1 is generated using the multiplexing circuit 9.
  • a predetermined phase shift function is realized by combining with the electrical signal from the.
  • Embodiment 3 FIG.
  • the phase shift means 7A comprising the sine wave bias generator 8 and the multiplexing circuit 9 is used.
  • the sine wave bias generator 8B and the multiplexing circuit are combined.
  • Phase shift means 7B in which an attenuation circuit 10 and a delay circuit 11 are inserted between the circuit 9 and the circuit 9 may be used.
  • FIG. 5 is a block diagram showing a circuit configuration of the photon detection device according to the third embodiment of the present invention. Components similar to those described above (see FIG. 4) are denoted by the same reference numerals as those described above, or A detailed description will be omitted with “B” attached later.
  • the phase shift means 7B includes an attenuation circuit 10 that attenuates the pulse signal, and a delay circuit that delays the pulse signal and inputs it to the multiplexing circuit 9. 11.
  • the electrical signal output from the photon detection element 1 is input to the multiplexing circuit 9.
  • the pulse signal generated from the sinusoidal bias generator 8B is input to the multiplexing circuit 9 through the attenuation circuit 10 and the delay circuit 11 connected in series.
  • the attenuation circuit 10 adjusts the amplitude of the pulse signal so that the photon detection signal S stands out when combined with the output signal from the photon detection element 1.
  • the delay circuit 11 delays the phase of the pulse signal by a predetermined amount in order to make the photon detection signal S stand out.
  • the sinusoidal bias generator 8B, the attenuation circuit 10, the delay circuit 11, and the multiplexing circuit 9 realize the function of the phase shift means 7B.
  • the multiplexing circuit 9 combines only the periodic noise signal N derived from the drive signal, as described above, by combining the electrical signal output from the photon detection element 1 with a sine wave signal having a different phase. Only the photon detection signal S is made to stand out with a time delay.
  • a predetermined phase shift function can be realized by adjusting the pulse signal so that the photon detection signal S stands out and combining the pulse signal with the electrical signal from the photon detection element 1 in the multiplexing circuit 9. .
  • the photon detection signal S can be made to stand out with a simple circuit configuration as shown in FIG. 5, and the same effect as described above can be obtained.
  • amplitude and phase of the auxiliary signal can be adjusted by the attenuation circuit 10 and the delay circuit 11, a more accurate phase shift function can be realized as compared with the second embodiment.
  • Embodiment 4 FIG. In the second and third embodiments (FIGS. 4 and 5), the sine wave bias generation circuit 4 and the sine wave bias generators 8 and 8B are used. However, as shown in FIG. An AC bias generator 8C may be used.
  • FIG. 6 is a block diagram showing a circuit configuration of a photon detection device according to Embodiment 4 of the present invention. Components similar to those described above (see FIG. 4) are denoted by the same reference numerals as those described above, or “C” will be attached later and detailed description will be omitted.
  • the photon detection device includes an AC bias generation circuit 4C and an AC bias generator 8C in place of the sine wave bias generation circuit 4 and the sine wave bias generator 8 described above (FIG. 5).
  • FIG. 6 shows a case where the circuit configuration described above (FIG. 5) is generalized, and the drive signal for the photon detection element 1 and the auxiliary signal for phase shift are not limited to sine waves.
  • the AC bias generation circuit 4 ⁇ / b> C generates an AC bias voltage of the drive signal and inputs the AC bias voltage to the AC / DC multiplexing circuit 6.
  • the AC bias generator 8 ⁇ / b> C generates an AC bias signal serving as an auxiliary signal and inputs the AC bias signal to the multiplexing circuit 9.
  • the AC bias voltage of the drive signal for the photon detection element 1 and the auxiliary signal for making the photon detection signal S stand out by being combined with the electrical signal are either Also comprises a pulse signal not limited to a sine wave.
  • the AC signal to be handled is not a single-frequency sine wave signal
  • the basic purpose of making the photon detection signal S stand out can be achieved, although the difficulty of constructing the signal processing system is slightly increased.
  • the auxiliary signal combined with the drive signal and the electrical signal of the photon detection element 1 does not need to be a sine wave signal, and even in the circuit configuration of FIG. Can stand out.
  • Embodiment 5 FIG.
  • the phase shift means 7C including the AC bias generator 8C and the multiplexing circuit 9 is used.
  • the AC bias generator 8D and the multiplexing circuit 9 are used as shown in FIG.
  • the phase shift means 7D in which the attenuation circuit 10 and the delay circuit 11 are inserted may be used.
  • FIG. 7 is a block diagram showing a circuit configuration of the photon detection device according to the fifth embodiment of the present invention.
  • the same components as those described above (see FIGS. 5 and 6) are denoted by the same reference numerals, and Alternatively, “D” is appended to the reference numeral and the detailed description is omitted.
  • the phase shift means 7D includes an attenuation circuit 10 that attenuates the pulse signal, and a delay circuit 11 that delays the pulse signal and inputs the delayed signal to the multiplexing circuit 9. And.
  • the AC bias generator 8D generates an AC bias signal as an auxiliary signal and inputs the AC bias signal to the multiplexing circuit 9 via the attenuation circuit 10 and the delay circuit 11.
  • the multiplexing circuit 9 multiplexes the electric signal from the photon detection element 1 and the auxiliary signal via the attenuation circuit 10 and the delay circuit 11.
  • the photon detection signal S can be made to stand out with a simple circuit configuration, and the same effect as described above can be obtained. Further, since the amplitude and phase of the auxiliary signal can be adjusted by the attenuation circuit 10 and the delay circuit 11, a more accurate phase shift function can be realized as compared with the fourth embodiment described above.
  • Embodiment 6 FIG.
  • the electric signal from the photon detection element 1 is directly input to the phase shift means 7 or the multiplexing circuit 9, but FIG.
  • the band elimination filter 12 may be interposed on the input side of the phase shift means 7 (or the multiplexing circuit 9).
  • FIG. 8 is a block diagram showing a circuit configuration of a photon detection apparatus according to Embodiment 6 of the present invention.
  • the same components as those described above (see FIG. 1) are denoted by the same reference numerals as those described above, and detailed description thereof is omitted. To do.
  • the circuit configuration of FIG. 8 shows a state in which the phase shift means 7 in FIG. 1 is connected to the subsequent stage of the circuit configuration of Patent Document 1 described above.
  • phase shift means 7 of the first embodiment is applied, but any of the phase shift means 7A to 7D of the other embodiments 2 to 5 (FIGS. 4 to 7) is applied. Needless to say, the same effects can be obtained.
  • the AC bias generator in the phase shift means 7A to 7D is not limited to the sine wave bias generator, but may be a rectangular wave bias generator. Further, the rectangular wave bias generator And a combination of a high frequency rejection filter (low pass filter) inserted on the output side of the rectangular wave bias generator is also applicable.
  • phase shift means 7 may be a frequency delay filter.
  • the frequency delay filter the shift of the removal frequency is slightly smaller than the output signal frequency from the sine wave bias generation circuit 4 and the removal frequency of the band removal filter 12.
  • a frequency elimination filter may be used.
  • any combination of the above-described first to fifth embodiments is possible, and the AC bias generation circuit for driving signals is not limited to the sine wave bias generation circuit 4 shown in FIG. Even a combination of a rectangular wave bias generation circuit and a high frequency elimination filter inserted on the output side of the rectangular wave bias generation circuit is applicable.
  • the characteristics of the band elimination filter 12 in the circuit configuration of Patent Document 1 are insufficient, and the periodic noise signal N is generated from the electric signal. Even if it is not completely removed, the phase shift process (or the auxiliary signal is combined) after passing through the band elimination filter 12 makes the photon detection signal S stand out, and the performance as a photon detection device Can be improved.
  • Embodiment 7 FIG.
  • the band elimination filter 12 is interposed on the input side of the phase shift means 7 or the multiplexing circuit 9, but as shown in FIG. 9, the multiplexing circuit 9 (phase shifting means). 7D), the difference acquisition circuit 13 may be interposed on the input side.
  • FIG. 9 is a block diagram showing a circuit configuration of a photon detection apparatus according to Embodiment 7 of the present invention.
  • the same components as those described above (see FIG. 7) are denoted by the same reference numerals as those described above, and detailed description thereof is omitted. To do.
  • the difference acquisition circuit 13 inserted on the input side of the multiplexer circuit 9 includes a duplexer 13a, a delay line 13b, and a multiplexer 13c.
  • the demultiplexer 13a demultiplexes the electric signal from the photon detection element 1, and the delay line 13b delays one of the demultiplexed electric signals.
  • the multiplexer 13c multiplexes the electrical signal that has passed through the duplexer 13a and the electrical signal that has passed through the duplexer 13a and the delay line 13b, and inputs the multiplexed signal to the multiplexing circuit 9.
  • the circuit configuration of FIG. 9 shows a state where the phase shift means 7D of FIG. 7 is connected to the subsequent stage of the circuit configuration of Patent Document 2 described above.
  • a rectangular wave bias generation circuit 4E is used as an AC bias generation circuit for drive signals, and a difference acquisition circuit 13 is connected to the anode of the photon detection element 1.
  • the multiplexing circuit 9 shows a circuit configuration for acquiring an electrical signal that is sufficiently optimized to enable threshold detection using the auxiliary signal multiplexing processing according to FIG.
  • phase shift unit 7D is used in FIG. 9, the phase shift unit 7C shown in FIG. 6 may be used.
  • the rectangular wave bias generation circuit 4E is used as the AC bias generation circuit for the drive signal, the sine wave bias generation circuit 4 may be used instead of the rectangular wave bias generation circuit 4E.
  • the characteristics of the difference acquisition circuit 13 (the duplexer 13a, the delay line 13b, and the multiplexer 13c) in the circuit configuration of Patent Document 2 are as follows. Even when the periodic noise signal N is not completely removed from the electrical signal, the photon detection signal S alone is made to stand out by multiplexing the auxiliary signal after passing through the difference acquisition circuit 13. Thus, the performance as a photon detection device can be improved.
  • Photon detection element 2 anode circuit, 2a detection resistor, 3 cathode circuit, 3a capacitor, 3b resistance, 4 sinusoidal bias generation circuit, 4C AC bias generation circuit, 4E rectangular wave bias generation circuit, 5 DC bias generation circuit, 6 AC / DC multiplexing circuit, 7, 7A-7D phase shift means, 8, 8B sinusoidal bias generator, 8C, 8D AC bias generator, 9 multiplexing circuit, 10 attenuation circuit, 11 delay circuit, 12 band elimination filter , 13 Difference acquisition circuit, 13a demultiplexer, 13b delay line, 13c multiplexer, N periodic noise signal, S photon detection signal, Th1, Th2 threshold.

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Abstract

Selon la présente invention, un dispositif de détection de photons et un procédé associé sont obtenus, lesquels permettent une détection de valeur seuil, dans une communication cryptographique quantique et similaire, d'uniquement un signal de détection de photons S à partir d'un signal électrique dans lequel le signal de détection de photons S et un signal de bruit périodique N sont mélangés, sans construire un moyen d'élimination pour le signal de bruit périodique N. A l'aide d'un moyen de déphasage (7), seul le signal de bruit périodique N, provenant d'un signal de commande d'un élément de détection de photons (1), est soumis à un retard temporel, et le signal de détection d'électrons S est superposé au niveau de la position de pic positif du signal de bruit périodique N et accentué, et sur ce la valeur seuil est détectée.
PCT/JP2012/067800 2012-07-12 2012-07-12 Dispositif de détection de photons et procédé associé WO2014010056A1 (fr)

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JP2014505429A JP5649759B2 (ja) 2012-07-12 2012-07-12 光子検出装置および方法
PCT/JP2012/067800 WO2014010056A1 (fr) 2012-07-12 2012-07-12 Dispositif de détection de photons et procédé associé

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2016015678A (ja) * 2014-07-03 2016-01-28 三菱電機株式会社 光子検出装置
US11177409B2 (en) 2017-03-10 2021-11-16 Kabushiki Kaisha Toshiba On-chip integration of MMIC and single photon detectors

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JP2001507168A (ja) * 1997-06-06 2001-05-29 アルカテル アバランシフォトダイオード装置
WO2007102430A1 (fr) * 2006-03-06 2007-09-13 Nihon University Detecteur monophotonique a bande de longueur d'onde de communication optique a grande vitesse
WO2010029638A1 (fr) * 2008-09-12 2010-03-18 三菱電機株式会社 Détecteur de photons
JP2011252919A (ja) * 2007-03-01 2011-12-15 Toshiba Corp 光子検出器

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Publication number Priority date Publication date Assignee Title
JP2001507168A (ja) * 1997-06-06 2001-05-29 アルカテル アバランシフォトダイオード装置
WO2007102430A1 (fr) * 2006-03-06 2007-09-13 Nihon University Detecteur monophotonique a bande de longueur d'onde de communication optique a grande vitesse
JP2011252919A (ja) * 2007-03-01 2011-12-15 Toshiba Corp 光子検出器
WO2010029638A1 (fr) * 2008-09-12 2010-03-18 三菱電機株式会社 Détecteur de photons

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JP2016015678A (ja) * 2014-07-03 2016-01-28 三菱電機株式会社 光子検出装置
US11177409B2 (en) 2017-03-10 2021-11-16 Kabushiki Kaisha Toshiba On-chip integration of MMIC and single photon detectors

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