WO2013186365A1 - Optoelektronisches halbleiterbauelement - Google Patents
Optoelektronisches halbleiterbauelement Download PDFInfo
- Publication number
- WO2013186365A1 WO2013186365A1 PCT/EP2013/062384 EP2013062384W WO2013186365A1 WO 2013186365 A1 WO2013186365 A1 WO 2013186365A1 EP 2013062384 W EP2013062384 W EP 2013062384W WO 2013186365 A1 WO2013186365 A1 WO 2013186365A1
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- WO
- WIPO (PCT)
- Prior art keywords
- metal phosphate
- optoelectronic semiconductor
- matrix
- semiconductor component
- phosphor
- Prior art date
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- 239000004065 semiconductor Substances 0.000 title claims abstract description 47
- 230000005693 optoelectronics Effects 0.000 title claims abstract description 44
- 229910001463 metal phosphate Inorganic materials 0.000 claims abstract description 110
- 239000011159 matrix material Substances 0.000 claims abstract description 86
- 238000006243 chemical reaction Methods 0.000 claims abstract description 57
- 229910052736 halogen Inorganic materials 0.000 claims abstract description 7
- 150000002367 halogens Chemical class 0.000 claims abstract description 7
- 239000000126 substance Substances 0.000 claims abstract description 6
- OAICVXFJPJFONN-UHFFFAOYSA-N Phosphorus Chemical compound [P] OAICVXFJPJFONN-UHFFFAOYSA-N 0.000 claims description 72
- 239000000843 powder Substances 0.000 claims description 42
- 229910019142 PO4 Inorganic materials 0.000 claims description 19
- 239000000758 substrate Substances 0.000 claims description 19
- 235000021317 phosphate Nutrition 0.000 claims description 18
- ILRRQNADMUWWFW-UHFFFAOYSA-K aluminium phosphate Chemical group O1[Al]2OP1(=O)O2 ILRRQNADMUWWFW-UHFFFAOYSA-K 0.000 claims description 14
- 230000005855 radiation Effects 0.000 claims description 10
- 238000002156 mixing Methods 0.000 claims description 9
- 239000010452 phosphate Substances 0.000 claims description 9
- NBIIXXVUZAFLBC-UHFFFAOYSA-K phosphate Chemical compound [O-]P([O-])([O-])=O NBIIXXVUZAFLBC-UHFFFAOYSA-K 0.000 claims description 8
- 150000003013 phosphoric acid derivatives Chemical class 0.000 claims description 8
- 239000000463 material Substances 0.000 claims description 7
- 230000017525 heat dissipation Effects 0.000 claims description 6
- 239000000945 filler Substances 0.000 claims description 4
- 230000003595 spectral effect Effects 0.000 claims description 4
- 230000003287 optical effect Effects 0.000 claims description 3
- 229910000272 alkali metal oxide Inorganic materials 0.000 claims description 2
- 239000000470 constituent Substances 0.000 claims description 2
- 230000001771 impaired effect Effects 0.000 claims description 2
- 238000011144 upstream manufacturing Methods 0.000 claims description 2
- 239000003513 alkali Substances 0.000 abstract description 5
- 239000010410 layer Substances 0.000 description 62
- 239000000243 solution Substances 0.000 description 31
- 239000011521 glass Substances 0.000 description 21
- 238000009833 condensation Methods 0.000 description 16
- 230000005494 condensation Effects 0.000 description 16
- 239000000203 mixture Substances 0.000 description 12
- 239000000919 ceramic Substances 0.000 description 11
- 150000004767 nitrides Chemical class 0.000 description 11
- 239000002245 particle Substances 0.000 description 11
- 239000000654 additive Substances 0.000 description 10
- 229910052751 metal Inorganic materials 0.000 description 9
- 239000002184 metal Substances 0.000 description 9
- 239000000853 adhesive Substances 0.000 description 7
- 230000001070 adhesive effect Effects 0.000 description 7
- 238000010304 firing Methods 0.000 description 7
- 239000002223 garnet Substances 0.000 description 7
- 239000007787 solid Substances 0.000 description 7
- 239000000725 suspension Substances 0.000 description 7
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 5
- 229910052782 aluminium Inorganic materials 0.000 description 5
- 239000007795 chemical reaction product Substances 0.000 description 5
- 238000001035 drying Methods 0.000 description 5
- 150000003839 salts Chemical class 0.000 description 5
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 description 4
- 239000007864 aqueous solution Substances 0.000 description 4
- 229910052799 carbon Inorganic materials 0.000 description 4
- 239000011777 magnesium Substances 0.000 description 4
- 239000011701 zinc Substances 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 3
- 239000012298 atmosphere Substances 0.000 description 3
- 239000011248 coating agent Substances 0.000 description 3
- 238000000576 coating method Methods 0.000 description 3
- 238000004132 cross linking Methods 0.000 description 3
- 230000001419 dependent effect Effects 0.000 description 3
- 238000009826 distribution Methods 0.000 description 3
- 230000008030 elimination Effects 0.000 description 3
- 238000003379 elimination reaction Methods 0.000 description 3
- 238000004519 manufacturing process Methods 0.000 description 3
- 239000000155 melt Substances 0.000 description 3
- 239000011858 nanopowder Substances 0.000 description 3
- 230000001590 oxidative effect Effects 0.000 description 3
- 239000001205 polyphosphate Substances 0.000 description 3
- 235000011176 polyphosphates Nutrition 0.000 description 3
- 229920001296 polysiloxane Polymers 0.000 description 3
- 108090000623 proteins and genes Proteins 0.000 description 3
- 230000001698 pyrogenic effect Effects 0.000 description 3
- -1 rare earth phosphates Chemical class 0.000 description 3
- 229910002012 Aerosil® Inorganic materials 0.000 description 2
- 229910018072 Al 2 O 3 Inorganic materials 0.000 description 2
- NBIIXXVUZAFLBC-UHFFFAOYSA-N Phosphoric acid Chemical compound OP(O)(O)=O NBIIXXVUZAFLBC-UHFFFAOYSA-N 0.000 description 2
- 229920000388 Polyphosphate Polymers 0.000 description 2
- 230000006978 adaptation Effects 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 2
- 238000004455 differential thermal analysis Methods 0.000 description 2
- 239000005337 ground glass Substances 0.000 description 2
- 229910052749 magnesium Inorganic materials 0.000 description 2
- 125000005341 metaphosphate group Chemical group 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910052605 nesosilicate Inorganic materials 0.000 description 2
- 150000004762 orthosilicates Chemical class 0.000 description 2
- 229910052698 phosphorus Inorganic materials 0.000 description 2
- 239000011574 phosphorus Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 229910052761 rare earth metal Inorganic materials 0.000 description 2
- 239000002994 raw material Substances 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 229910052714 tellurium Inorganic materials 0.000 description 2
- PORWMNRCUJJQNO-UHFFFAOYSA-N tellurium atom Chemical compound [Te] PORWMNRCUJJQNO-UHFFFAOYSA-N 0.000 description 2
- 239000001226 triphosphate Substances 0.000 description 2
- 235000011178 triphosphate Nutrition 0.000 description 2
- UNXRWKVEANCORM-UHFFFAOYSA-N triphosphoric acid Chemical compound OP(O)(=O)OP(O)(=O)OP(O)(O)=O UNXRWKVEANCORM-UHFFFAOYSA-N 0.000 description 2
- 229910052727 yttrium Inorganic materials 0.000 description 2
- 229910000164 yttrium(III) phosphate Inorganic materials 0.000 description 2
- UXBZSSBXGPYSIL-UHFFFAOYSA-K yttrium(iii) phosphate Chemical compound [Y+3].[O-]P([O-])([O-])=O UXBZSSBXGPYSIL-UHFFFAOYSA-K 0.000 description 2
- 229910052725 zinc Inorganic materials 0.000 description 2
- ZOXJGFHDIHLPTG-UHFFFAOYSA-N Boron Chemical compound [B] ZOXJGFHDIHLPTG-UHFFFAOYSA-N 0.000 description 1
- 229910052765 Lutetium Inorganic materials 0.000 description 1
- FYYHWMGAXLPEAU-UHFFFAOYSA-N Magnesium Chemical compound [Mg] FYYHWMGAXLPEAU-UHFFFAOYSA-N 0.000 description 1
- 241001676573 Minium Species 0.000 description 1
- 229910004298 SiO 2 Inorganic materials 0.000 description 1
- HCHKCACWOHOZIP-UHFFFAOYSA-N Zinc Chemical compound [Zn] HCHKCACWOHOZIP-UHFFFAOYSA-N 0.000 description 1
- 239000002253 acid Substances 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
- 150000001340 alkali metals Chemical class 0.000 description 1
- 150000004703 alkoxides Chemical class 0.000 description 1
- DHAHRLDIUIPTCJ-UHFFFAOYSA-K aluminium metaphosphate Chemical compound [Al+3].[O-]P(=O)=O.[O-]P(=O)=O.[O-]P(=O)=O DHAHRLDIUIPTCJ-UHFFFAOYSA-K 0.000 description 1
- 229910000147 aluminium phosphate Inorganic materials 0.000 description 1
- 239000002585 base Substances 0.000 description 1
- 239000011230 binding agent Substances 0.000 description 1
- 230000033228 biological regulation Effects 0.000 description 1
- 229910052797 bismuth Inorganic materials 0.000 description 1
- JCXGWMGPZLAOME-UHFFFAOYSA-N bismuth atom Chemical compound [Bi] JCXGWMGPZLAOME-UHFFFAOYSA-N 0.000 description 1
- 229910052796 boron Inorganic materials 0.000 description 1
- 230000015556 catabolic process Effects 0.000 description 1
- 239000003795 chemical substances by application Substances 0.000 description 1
- 229910052801 chlorine Inorganic materials 0.000 description 1
- 239000003086 colorant Substances 0.000 description 1
- 229940000425 combination drug Drugs 0.000 description 1
- 239000002131 composite material Substances 0.000 description 1
- 150000001875 compounds Chemical class 0.000 description 1
- 238000006482 condensation reaction Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000007423 decrease Effects 0.000 description 1
- 238000006731 degradation reaction Methods 0.000 description 1
- 238000002845 discoloration Methods 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000000295 emission spectrum Methods 0.000 description 1
- 229910052731 fluorine Inorganic materials 0.000 description 1
- 229910021485 fumed silica Inorganic materials 0.000 description 1
- 229910052733 gallium Inorganic materials 0.000 description 1
- 238000007496 glass forming Methods 0.000 description 1
- 229910010272 inorganic material Inorganic materials 0.000 description 1
- 239000011147 inorganic material Substances 0.000 description 1
- 239000000543 intermediate Substances 0.000 description 1
- 238000011068 loading method Methods 0.000 description 1
- 238000010309 melting process Methods 0.000 description 1
- 229910044991 metal oxide Inorganic materials 0.000 description 1
- 239000005300 metallic glass Substances 0.000 description 1
- 150000002739 metals Chemical class 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000006060 molten glass Substances 0.000 description 1
- NFSAPTWLWWYADB-UHFFFAOYSA-N n,n-dimethyl-1-phenylethane-1,2-diamine Chemical compound CN(C)C(CN)C1=CC=CC=C1 NFSAPTWLWWYADB-UHFFFAOYSA-N 0.000 description 1
- 239000002105 nanoparticle Substances 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- SIWVEOZUMHYXCS-UHFFFAOYSA-N oxo(oxoyttriooxy)yttrium Chemical compound O=[Y]O[Y]=O SIWVEOZUMHYXCS-UHFFFAOYSA-N 0.000 description 1
- 239000005365 phosphate glass Substances 0.000 description 1
- 125000002467 phosphate group Chemical group [H]OP(=O)(O[H])O[*] 0.000 description 1
- 239000011148 porous material Substances 0.000 description 1
- 229910052700 potassium Inorganic materials 0.000 description 1
- 238000002360 preparation method Methods 0.000 description 1
- 239000000047 product Substances 0.000 description 1
- 239000011241 protective layer Substances 0.000 description 1
- 239000010453 quartz Substances 0.000 description 1
- 230000001105 regulatory effect Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 230000035945 sensitivity Effects 0.000 description 1
- 238000010008 shearing Methods 0.000 description 1
- 229910052708 sodium Inorganic materials 0.000 description 1
- 238000003980 solgel method Methods 0.000 description 1
- 239000002904 solvent Substances 0.000 description 1
- 239000007921 spray Substances 0.000 description 1
- 238000012360 testing method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 229920002554 vinyl polymer Polymers 0.000 description 1
- 239000002918 waste heat Substances 0.000 description 1
- 238000009736 wetting Methods 0.000 description 1
- VWQVUPCCIRVNHF-UHFFFAOYSA-N yttrium atom Chemical compound [Y] VWQVUPCCIRVNHF-UHFFFAOYSA-N 0.000 description 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
- H01L33/502—Wavelength conversion materials
- H01L33/504—Elements with two or more wavelength conversion materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/483—Containers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/501—Wavelength conversion elements characterised by the materials, e.g. binder
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/508—Wavelength conversion elements having a non-uniform spatial arrangement or non-uniform concentration, e.g. patterned wavelength conversion layer, wavelength conversion layer with a concentration gradient of the wavelength conversion material
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/62—Arrangements for conducting electric current to or from the semiconductor body, e.g. lead-frames, wire-bonds or solder balls
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/64—Heat extraction or cooling elements
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/12—Light sources with substantially two-dimensional radiating surfaces
- H05B33/14—Light sources with substantially two-dimensional radiating surfaces characterised by the chemical or physical composition or the arrangement of the electroluminescent material, or by the simultaneous addition of the electroluminescent material in or onto the light source
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/4805—Shape
- H01L2224/4809—Loop shape
- H01L2224/48091—Arched
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/42—Wire connectors; Manufacturing methods related thereto
- H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
- H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
- H01L2224/481—Disposition
- H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
- H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
- H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
- H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/50—Wavelength conversion elements
- H01L33/507—Wavelength conversion elements the elements being in intimate contact with parts other than the semiconductor body or integrated with parts other than the semiconductor body
Definitions
- the invention is based on an optoelectronic semiconductor component according to the preamble of claim 1.
- DE-A 10 11 8630 and DE-A 10 15 9544 disclose LEDs with glass components.
- US-A-5965469 discloses a phosphate glass used as an adhesive.
- DE-Az 10 2010 028 776.8 discloses metal phosphates as a matrix for conversion elements, it also being possible for a plurality of phosphors to be present in one layer.
- An object of the present invention wherein an optoelectronic semiconductor device such as egg ⁇ ner LED or a laser diode according to the preamble of claim 1.
- an optoelectronic semiconductor device such as egg ⁇ ner LED or a laser diode according to the preamble of claim 1.
- the present invention solves the problem of an LED or La ⁇ serdiode or other optoelectronic semiconductor Specify component that is still temperature and weather resistant even at high power density. This increases the service life of such devices Le ⁇ . An increase in efficiency results if at the same time the heat dissipation in the conversion element is improved, since the phosphor is then damaged less during operation by temperature. Last ⁇ res is all the more pronounced, the higher the power is dense ⁇ and the greater the resultant heat through the conversion by the so-called. Stokes shift. In addition, in the case of conversion elements having at least two phosphors, as a rule, efficiency is also lost by remission. The following is a LED is used as Demonstrationsob ⁇ ject example mostly.
- Organic components than the fluorescent surrounding matrix typically have a poor thermal conductivity and tem ⁇ peraturability.
- silicone which holds the rule of a continuous load of about 160 ° C and at a short-term load (a few seconds) of about 300 ° C.
- the temperature resistance of polyvinyl lycarbonat, which often is used as a matrix for remote applications is ⁇ sets, is more even lower and possibly leading to Verfor ⁇ regulations. As the LEDs become more powerful, these temperature resistances will soon be insufficient. In order to avoid that at high load the efficiency, due to a discoloration of the matrix or a damage of the
- Phosphorus reduced by the insufficient heat dissipation it requires other matrix materials. These are known as inorganic materials such as glass, ceramics or a Mi ⁇ research it. At the same time, the efficiency of the LED can be further improved by reducing the remission. This is solved by using the different fluorescent Fe are not present as a mixture in a matrix, but separated from each other.
- this is achieved by using at least one metal phosphate as the matrix for at least one phosphor, or different components of metal phosphate are used.
- a further conversion element connects directly, which consists of the same or a different metal phosphate matrix or different components of metal phosphate, in which another phosphor is embedded.
- the metal phosphate matrix is formed by condensation (chemical setting) of a metal phosphate solution. As the temperature increases, cross-linking progresses, increasing the viscosity of the metal phosphate matrix.
- the metal phosphate is preferably lead-free.
- Ide ⁇ allay is the condensed matrix addition even blow ⁇ poor.
- Amorphous or predominantly amorphous means that the matrix itself has no or max. 25 vol.%, Ideally max. Has 10% by volume of crystalline phases. The embedded crystalline phosphor powder is excluded from this.
- Additives and / or radiation-absorbing elements and / or components which change the refractive index can be added to the metal phosphate. These components are preferably inorganic.
- the metal phosphate may be playing, be aluminum phosphate, yttrium phosphate, alkaline earth ⁇ phosphate, phosphates III at ⁇ . Main group and the Maugrup ⁇ pen or other rare earth phosphates or mixtures thereof.
- additives such as SiO 2 , for example in the form of Aerosil, pyrogenic Al 2 O 3 or TIO 2 etc. may also be added to the phosphate. These additives are preferably added as nano-powder, in particular their average particle size is in the range 1 to 40 nm.
- Ground glasses such as hard glasses or ground glass solder may also be added. These additives may optionally increase the thermal conductivity again, serve as a reflector or scattering agent, or adjust the thermal expansion coefficient. However, it is preferred to use only additives that absorb no or no significant levels of radiation as this would reduce the efficiency.
- the condensed metal phosphate is inorganic, optically stable and moisture resistant, and is preferably produced at low temperatures. Therefore, this Me ⁇ tallphosphat is suitable for embedding of phosphors, so as a matrix for a conversion element.
- the proportion of additives ⁇ can be so high that the condensed Metallphos ⁇ phat primarily serves as a binder.
- metal phosphates With such metal phosphates leads to increased efficiency and increased life.
- at least one component of metal phosphate is preferably used, optionally with additives that are scattering or changing the refractive index.
- a He ⁇ heightening the thermal conductivity, improving the temperature stability and possibly an increased refractive index is obtained.
- the phosphor can be applied with such a matrix on various docu ⁇ gene (chip, glass, ceramics, various metals, etc.) without an additional adhesive to be used, which is an advantage over conversion ceramics, which are also temperature and weather resistant and a good Have thermal conductivity.
- a part or all of the added components may be selected such that it chemically rea ⁇ yaw with the metal phosphate, and modify it thereby.
- Matrix is embedded based on a metal phosphate and fi xed ⁇ and at least a second phosphor powder in a second matrix based on a metal phosphate is a ⁇ embedded and fixed.
- Optoelectronic semiconductor component according to claim 1 characterized in that the second matrix is arranged above or next to the first matrix.
- Optoelectronic semiconductor component according to claim 3 characterized in that the metal phosphate at most
- Optoelectronic semiconductor component according to claim 1 characterized in that the metal phosphate as the main ⁇ component phosphate.
- Optoelectronic semiconductor component according to claim 6 characterized in that the metal phosphate is aluminum phosphate ⁇ or predominantly contains.
- the optoelectronic semiconductor device according to claim 3 characterized in that the metal phosphate holds 5 to 90 mol .-% and in particular 10 P205 ⁇ ent to 90 mol .-% A1203.
- Optoelectronic semiconductor component according to Claim 3 characterized in that the metal phosphate contains 50 to 90 mol% P205 and in particular 10 to 50 mol% A1203.
- the optoelectronic semiconductor device according to claim 1 characterized in that the metal phosphate anorgani ⁇ specific components are added which increase the refractive index and / or serve as fillers and / or act as optical shearing filter and / or scatter and / or increase heat dissipation and / or the thermal Ausdehnungsverhal ⁇ th to the substrate adjust optoelectronic semiconductor device according to claim 2, characterized in that the first loading with fluorescent aufschlagte matrix layer and further with fluorescent be ⁇ aufschlagte matrix layers follow each other directly without mixing, said matrix layers preferably with either the Semiconductor component are connected or spaced therefrom.
- Optoelectronic semiconductor component according to one of the preceding claims characterized in that at least one metal phosphate in combination with the zuge ⁇ impaired phosphor powder has a curing temperature of at most 400 ° C, preferably at most 350 ° C.
- Optoelectronic semiconductor component characterized in that at least one metal phosphate solution has a pH of 1 to 7.
- FIG. 1 an LED with vertically stacked conversion element
- Figure 2 shows another embodiment of an LED with ver ⁇ tically layered conversion element
- Figure 3 shows another embodiment of an LED with ver ⁇ tically layered conversion element
- Figure 4 shows an embodiment of an LED with horizontally layered conversion element
- Figure 5 shows another embodiment of a semiconductor device in plan view.
- FIG. 1 shows an optoelectronic semiconductor component 19 in section.
- the core is a primary UV-emitting chip 20, which is connected to electrical terminals 21, 22, which are formed as a ladder frame parts. One of the parts is connected via a bonding wire 23 to the chip.
- the chip 20 is seated directly on a wide first terminal 21 which is arranged on the surface of a rectangular basic body or sub ⁇ strate 25 made of glass (preferably quartz, hard, soft glass or glass solder) or ceramic.
- On the base an annular attachment 26 is placed, which leaves a recess in its interior.
- the inner inclined wall 27 of the attachment is shaped as a reflector.
- the attachment is connected to the base body and the leadframe formed by the terminals by an adhesive 30.
- the attachment 26 is also made of glass.
- the recess within the reflector has a conversion element.
- the recess is filled with a first layer 31 based on a matrix of metal phosphate 31 which contains a first converting phosphor. closes.
- a second layer 32 and a third layer 33 is disposed on the basis of a metal phosphate, keeping the respective second and third phosphors ⁇ ent.
- the LED is in particular with a cover (not constitute provided ⁇ ) is completed, and thus hermetically sealed.
- a metal phosphate which contains at most 1 mol .-% of oxides of alkali and halogen elements.
- the conversion element has, generally speaking, each egg ne thin layer which has as a matrix metal ⁇ condensed phosphate.
- Embedded therein are one or more phosphors, as known per se. Typical phosphors are YAG: Ce, Sione, nitrides or also orthosilicates or calsines. In particular, they serve to generate white light with the aid of a blue or UV-emitting chip.
- the phosphor particles are protected by the condensed metal phosphate bonded only to each other (reduct ⁇ exercise) or from this enclosed (protective layer). In the latter case, the thus passivated phosphor particles can also be present in another condensed metal phosphate matrix.
- the conversion element can be applied directly to the chip 2 as a so-called thin-film element .
- It is a first layer 5 of a metal phosphate, in the red-emitting nitride type M2Si5N8: Eu is embedded applied di rectly ⁇ on the chip.
- a second layer 6, following the first layer, has a similar matrix of this metal phosphate, and there is a green emitting garnet A3B5012: Eu embedded as a phosphor.
- A is preferably Y or Lu alone or in combination
- B is preferably Al or Ga alone or in combination.
- the metal phosphate is low in alkali and halogen. It is preferably free from alkali and halogen.
- FIG. 3 shows an optoelectronic semiconductor component 35 with a conversion element 37, which is spaced apart from the chip 36, from two layers in accordance with the remote phosphor concept. The first
- Phosphor 38 (schematically) is here embedded in a first metal phosphate matrix 39 as the first layer or enclosed by it.
- the second phosphor 138 (schematically) is here embedded in a second metal phosphate matrix 139 as a second layer or enclosed by it. Both matrices are adapted to the respective phosphor. Therefore, their matrix material is different from one another, for example as regards the content of A1203 or a possible addition of Y203.
- the conversion element 37 also has a substrate 40.
- the phosphors 38 and 138 are preferably facing the chip 36 ⁇ and therefore arranged in the beam direction in front of the substrate.
- the substrate 40 is transparent, for example made of glass.
- the conversion element 37 consisting of conversion layers and substrate, homogenizes the radiation of the secondary radiation.
- the phosphor-free side 41 of the substrate can be additionally roughened.
- the phosphors 38 and / or 138 may be selectively applied inhomogeneous in the horizontal direction, so that a good color homogeneity over all angles ensures and the phosphor is optimally utilized.
- the remote phosphor solution described here can also be used if the radiation of several chips is to be converted together. In the latter case, also phosphor-free locations can be present on the substrate.
- FIG. 4 shows a further exemplary embodiment of an LED with a horizontal layering of the conversion element.
- the conversion element is applied directly to the chip 2. It has at least two, and preferably up to four different ⁇ like strips of layers.
- a first type of layer 8 is a metal phosphate, to which a nitride is admixed as the phosphor.
- a second type of layer 9 is a metal phosphate to which a garnet is added as a phosphor.
- the horizonta ⁇ le arrangement may be strip-like or even checkered like a grid, see Figure 5 in plan view, or even diamond-shaped like a hunter fence.
- Phosphates have a high temperature and a good moisture resistance. have. When embedding phosphor, it is important that it is not damaged by a chemical reaction with the solution or resulting reaction products or by excessive temperatures.
- the metal phosphate may be in amorphous, semi-crystalline or crystalline form. It is preferably predominantly amorphous.
- the presented system comprising at least two layers of condensed metal phosphate serves in each case as an inorganic matrix of a conversion element, into which in each case the
- the condensed metal phosphate matrix is preferably colorless and amorphous or predominantly amorphous, with good transmission in the UV up to the visible spectral range.
- the here presented conversion element of at least two layers with a matrix of condensed metal phosphate reduces the remission and also allows a simpler process management by a separate processing
- conversion elements for LEDs are currently used with organic components such as e.g. Made of silicone, embedded in the phosphor powder. These organic components have a bad one
- Bonding is not necessary, as one layer can be applied directly to the other or to the substrate and so the composite automatically over the condensing
- Metal phosphate matrix is done.
- a substrate such.
- the matrix will then be at higher
- the next step is the coating with a second, similar or different, matrix solution and a second phosphor powder, such as a nitride corresponding to the first coating. Due to the temperature sensitivity of these phosphors a temperature of 350 ° C should not be exceeded for the condensation of this matrix as possible. An upper temperature limit for the condensate ⁇ sation of 350 ° C has also an advantageous effect on the effi ciency of embedded ⁇ garnet phosphors. The same applies if the order is made on the chip, since it can be damaged at higher temperatures. if the
- Layers are condensed at different temperatures, it is advantageous if the first layer is condensed at the highest temperature and the temperature then decreases with each further layer.
- the metal phosphate matrix in the temperature treatment As the metal phosphate matrix in the temperature treatment
- the maximum applicable condensation Tempe ⁇ temperature Ta (max) is given by the temperature stability of a ⁇ zubettenden phosphor powder and through which the substrates on which they are applied.
- the minimal erfor ⁇ derliche condensation temperature Ta (min) depends on the composition from the matrix which must be condensed at least in so far as that a certain weatherability is contraindicated ⁇ ben. This condensation is preferably carried out at temperatures of 200-550 ° C, especially at 200-350 ° C. It is advantageous if the condensation temperature is above the later use temperature in order to obtain a certain temperature and optical stability.
- the color location is controlled by the concentration and / or the layer thickness of the at least two layers.
- solids in powder form nanoparticles, scattering particles, glass powder
- solutions of other soluble metal salts may additionally be added to any suspension containing such a metal phosphate solution.
- the invention finally relates to conversion elements (both of the type CLC and of the remote type) with at least two
- Layers of inorganic matrix in each of which at least one type of phosphor is embedded in powder form.
- the second layer is vertical or relative to the first one
- the invention can also be used, for example, for conversion elements of the RGB type.
- the primary radiation is UV
- Metal phosphate can be accommodated, or two of the three
- Phosphor powders may be embedded together in a layer of condensed metal phosphate.
- the blue portion is not through
- a condensed metal phosphate can be added to each matrix solution.
- the various properties of a condensed metal phosphate are achieved by its composition - in the example of aluminum phosphate, it is essentially the A1203-P205-H20 ratio - and the degree of crosslinking in the temperature treatment of the respective phosphor can be adjusted. As a result, however, properties such as transparency, turbidity, opacity can also be regulated.
- the metal phosphate may also contain glassy or ceramic fillers that do not melt with it.
- the proportion of the phosphor powder possibly with filler may be so high that the condensed metal phosphate acts only as quasi Bin ⁇ DEMITTEL / adhesive that holds the particles, similar to a ceramic adhesive.
- functional components may be added to the metal phosphate solution.
- the thermal expansion coefficient of the condensed Me ⁇ tallphosphates is preferably at least 5.0 x 10 ⁇ 6 / K. In the case of using different compositions care should be taken that the thermal expansion coefficient of the different metal phosphates does not differ too much (preferably at most 5 to 10%).
- the condensed metal phosphate as the main component includes phosphate, which in various modifications, ie as orthophosphate, Triphosphate, metaphosphate, polyphosphate, ultraphosphate, as well as in all possible intermediates can be present.
- Example 1
- the mixing ratio is about 1: 1 by weight.
- the suspension is applied to a substrate, for example a glass substrate, as a layer about 50 ⁇ m thick. Afterwards drying takes place at low temperatures ( ⁇ 150 ° C), if necessary additionally at reduced ambient pressure. The condensation takes place in an oxidizing Atmo- sphere in the temperature range of 150-800 ° C, preferably 300- 550 ° C for a few seconds to one hour.
- the pure Mo ⁇ noaluminiumphosphataims shows after drying at ⁇ 100 ° C in the DTA (differential thermal analysis) following stages: Above 250 ° C, the triphosphate (AIH2P3O10) and above 500 ° C aluminum metaphosphate (A1 (P03) 3) or long-chain and ring-shaped Aluminum polyphosphates [ ⁇ 1 ( ⁇ 3) 3] ⁇ ⁇ In combi nation ⁇ with the phosphor YAG: Ce are shifted the reactions at lower temperatures.
- the condensation reactions and products can be affected by glass forming additives in the monoaluminum phosphate solution. For example, zinc, magnesium or boron-containing additives.
- the first already condensed layer is then coated with a second layer containing a second phosphor in powder form, for example a nitride, and treated analogously to the first conversion layer.
- a second layer containing a second phosphor in powder form for example a nitride
- a chip surface is coated with phosphor powder such as LuAG: Ce.
- the powder layer is then treated with an aqueous solution of metal phosphate according to example 1 sprühbeschich ⁇ tet. Following the drying at low Tempe ⁇ temperatures ( ⁇ 150 ° C) is carried out if necessary in addition at reduced ambient pressure ⁇ . The condensation takes place in an oxidizing atmosphere in the temperature range of 200-350 ° C for a few seconds to one hour.
- the first already condensed layer is now coated with a second phosphor powder such as a nitride. This powder layer is treated with an aqueous solu ⁇ solution of a metal phosphate z.
- Garnet phosphor powder and e.g. an aqueous monoaluminum phosphate solution according to Example 1, as a web
- Example 2 Prior to coating the substrate to bes ⁇ sera wetting may be irradiated with UV. Subsequently, a further suspension is applied as a web to the narrow side of this web. This consists of an aqueous solution a metal phosphate z. As monoaluminum phosphate A1 (H 2 P0 4 ) 3, which additionally contains other phosphates or oxides such as Mg and / or Zn and / or B, and another phosphor powder such as a nitride. This layer is dried and condensed according to Example 2. In this way, for example, color wheels for laser applications can be produced, which are described in more detail in the simultaneous German patent application with the official file number 10 2012 210195.0. In a similar way and in different combinations, other substrates with vertical and horizontal layers can be produced.
- the solids content of phosphor in the matrix can be varied depending on the desired color location of the LED. It is also possible to produce conversion elements that convert the light emitted by the chip to 100%. In this case, the solid content of the phosphor is so high that the metal phosphate is ⁇ sat surrounds the phosphor particles with a thin layer and thereby glued together. The latter is limited to the use of eg RGB (see Figure 4).
- Solids in powder form and / or solutions of other soluble metal salts may also be added to the suspensions according to the examples.
- Solids are preferably nanopowders such as fumed silica (eg Aerosil from Evonik) and / or pyrogenic Al 2 O 3 (eg Aeroxide Alu C from Evonik) and / or pyrogenic T1O 2 (eg Aeroperl P25 from Evonik), which then also be enclosed by the matrix.
- the expansion coefficient can be adjusted by these particles, but materials with negative expansion coefficients, such as, for example, can also be used for this purpose serve ß-Eukryptit.
- an addition of another soluble metal salt to the suspension is, for example, the addition of an aqueous solution of yttrium acetate or yttrium phosphate.
- the components react with each other and the metal phosphate is modified by ⁇ .
- the refractive index, such as yttrium oxide or tellurium may also as soluble metal salts or be added as oxide particles.
- phosphates includes explicitly in particular Mo no-phosphate as the water-soluble A1 (H 2 P0 4) 3, as well as what ⁇ serunlösliches poly-phosphate as [ ⁇ 1 ( ⁇ 3) 3] ⁇ ⁇ Depending proces ⁇ processing can thereby meta- Phosphate such as (A1 (P03) 3) or tertiary phosphate such as A1P04 arise.
- the conversion element from the chip should be beabstan ⁇ det (remote phosphor solution)
- a transparent substrate eg glass with a high
- the invention particularly relates to power LEDs with a power of at least 5 W, particularly min ⁇ least 10 W power.
- the advantages of such an inorganic matrix of the conversion element come into their own as the inorganic matrix is thermally interpreting ⁇ Lich stable and better heat conduction has, com- pared with an organic matrix, and therefore lower
- the phosphor powder with the same composition of the matrix, can be embedded at lower temperatures if the matrix has been produced from a condensed metal phosphate solution. As already mentioned, this leads to less damage to the phosphor during embedding.
- the amorphous or predominantly amorphous metal phosphates prepared by condensation are structurally indistinguishable from those made from the melt of a batch unless a glass having the corresponding amorphous portions in this composition is above it Way not possible.
- an un ⁇ ter Kunststofferies behavior seen during the embedding of the phosphor powder As glasses become less viscous as the temperature increases, the viscosity of the metal phosphate solutions increases with increasing temperature. This behavior is due to the fact that with increasing temperature more and more water or carbon-containing reaction products split off, which leads to an increasing cross-linking of the matrix.
- this layer does not soften again with the same temperature treatment, which is why, for a multilayer conversion element, the same matrix and condensation temperature can be used for the different layers without mixing.
- the same matrix and condensation temperature can be used for the different layers without mixing.
- An amorphous or predominantly amorphous glass matrix which was prepared from the melt of a batch, this would lead to a mixing, at least in the region of the interfaces, as both layers soften again.
- Characterized can advantageously be differentsetsbei ⁇ play a multilayer conversion element realisie ⁇ ren.
- One example is explained with the two phosphors, the stacked (vertical ranking) are. ⁇ hnli ⁇ ches applies well in horizontal, lattice-like or strip-like succession.
- the same metal phosphate solution is used for the matrix.
- the direct connection there is no ⁇ be hired by the adhesive refraction differences or deviant thermal behavior.
- ceramic platelets must always be glued extra, which on the one hand consuming, for ⁇ on problematic in terms of thermal stability.
- Organic matrices are not usable at high LED power anyway because of the lack of thermal capacity. But also glasses as matrices are problematic because when applying the second layer always the first layer is softened again when the same glass is used. We ⁇ gene of the contrary behavior of condensed metal phosphates relative to the molten glass, these are ideal for vertical as well as horizontal layers geeig ⁇ net.
- a metal phosphate can be tailor-made for each ⁇ a phosphor ⁇ the. This is not possible when incorporating several phosphors in a single matrix, it must always be sought a compromise in the selection of the metal phosphate. However, a tailor-made solution makes it possible to make a targeted adjustment.
- Orientation points for an adaptation are, for example, the pH of a solution of the metal phosphate. This is u.a. Depending on the phosphate content and is usually in a range between 1 and 7.
- the introduced phosphors are different sensitive to exposure to acidic environment. Orthosilicates are particularly sensitive, but garnets and nitrides are less sensitive. Other
- Phosphors are usually between these extremes.
- a second important aspect is the Aushärtungstempe ⁇ temperature Ta of the metal phosphate, or the temperature at which condenses the metal phosphate in combination with the phosphor and, if necessary, other additives, and form polymeric phosphates.
- Ta the temperature at which condenses the metal phosphate in combination with the phosphor and, if necessary, other additives, and form polymeric phosphates.
- the elimination of water is completed or substantially completed.
- a maximum Ta of 350 ° C is recommended because these phosphors, especially red emitting nitride phosphors of the type M2Si5N8: Eu or calsine variants, are relatively temperature sensitive.
- a metal phosphate is recommended, with a Ta of Hoechsmann ⁇ least 400 ° C is obtained.
- Limit in this sense is an upper limit of Ta of 350 ° C.
- amorphous or predominantly amorphous, transparent and colorless matrix of Aluminiumphos ⁇ phat proved, which forms by condensation at elevated temperature from a mono-aluminum phosphate solution.
- oxidation-sensitive phosphors such as Nitri ⁇ de showed after investing in such matrices place at temperatures ⁇ 350 ° C no noticeable loss of efficiency. Moisture tests of such patterns have shown that these matrices react neutrally and thus indicate good setting and chemical resistance.
- the required temperature Ta for the setting reaction can be further reduced if other metal phosphates or oxides such as Zn, Mg and / or B are included in the solution.
- Typical layer thicknesses of the individual layers of the conversion element are from 10 to 200 ⁇ m, depending on the particle size distribution of the embedded phosphor powder, the mixing ratio of solid to matrix and the desired degree of conversion.
- the first layer and the second layer do not necessarily have to be the same thickness.
- the result is usually a mixing ratio of 1: 9 parts by weight for red to green / yellow, depending on the density and efficiency of the phosphors and on the emission spectra.
- the achievable with different phosphors tailor ⁇ -made efficiency thus also depends on the condensation Tempe ⁇ ture ( "firing temperature").
- Garnets are generally less sensitive than nitride phosphors such as nitrido- silicates or calsins.
- a matrix based on mono-aluminum phosphate with an firing temperature of 200 to 350 ° C is also a good candidate for embedding garnet phosphors, as these phosphors are less sensitive to temperature, so the "firing temperature" in this Fall up to 400 ° C lie.
- the loss of efficiency compared to the starting powder can then be limited to a few percent.
- Phosphors are embedded in two different matrices, for example, to gradually adjust the refractive index or the expansion coefficient or scattering properties.
- a particular advantage of the invention described here it's also conversion elements by embedding luminescent ⁇ materials in powder form can be prepared that are not or only expensive to manufacture than ceramic. Even such a conversion ceramics could be coated in this way with at least one further conversion layer.
- the process described here is also much simpler and more cost-effective and can optionally be combined with this.
- Typical particle size distributions of the phosphor powders are a D50 between 5-50 ⁇ m, in particular 5-30 ⁇ m.
- the mixing ratio of solution to solid is
- the concentration of the metal phosphate solution is typically between 5-60% by weight, ideally 40-60% by weight.
- the condensed matrix is preferably low in pores.
- the conversion element forms an at least two-layer converter.
- the metal phosphate matrix is formed by condensation (chemical bonding) of a metal phosphate solution.
- the metal phosphate is preferably colorless and predominantly amorphous, ie more than 50%.
- Y203 for example, can be hold ent ⁇ .
- the invention is not limited to this by the description with reference to the embodiments, but includes any novel feature and any combination of features contained in the claims, even if this feature or this combination itself is not explicitly given in the claims or embodiments.
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Abstract
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US14/408,221 US10297729B2 (en) | 2012-06-15 | 2013-06-14 | Optoelectronics semiconductor component |
DE112013002930.8T DE112013002930B4 (de) | 2012-06-15 | 2013-06-14 | Optoelektronisches Halbleiterbauelement |
CN201380031585.7A CN104365181B (zh) | 2012-06-15 | 2013-06-14 | 光电子半导体器件 |
JP2015516632A JP6178413B2 (ja) | 2012-06-15 | 2013-06-14 | オプトエレクトロニクス半導体素子およびその製造方法 |
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US11009205B2 (en) | 2017-02-28 | 2021-05-18 | Osram Oled Gmbh | Conversion element, optoelectronic component and method for producing a conversion element |
US11387391B2 (en) | 2017-02-28 | 2022-07-12 | Osram Gmbh | Conversion element, optoelectronic component and method for producing a conversion element |
US11430922B2 (en) | 2017-02-28 | 2022-08-30 | Oskam Oled Gmbh | Optoelectronic component and method for producing an optoelectronic component |
Also Published As
Publication number | Publication date |
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US20150123156A1 (en) | 2015-05-07 |
US10297729B2 (en) | 2019-05-21 |
DE102012210083A1 (de) | 2013-12-19 |
JP2015521791A (ja) | 2015-07-30 |
DE112013002930B4 (de) | 2023-03-23 |
JP6178413B2 (ja) | 2017-08-09 |
DE112013002930A5 (de) | 2015-04-23 |
CN104365181B (zh) | 2017-10-31 |
CN104365181A (zh) | 2015-02-18 |
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