WO2013071659A1 - 液晶显示模组及其制造方法 - Google Patents

液晶显示模组及其制造方法 Download PDF

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Publication number
WO2013071659A1
WO2013071659A1 PCT/CN2011/083367 CN2011083367W WO2013071659A1 WO 2013071659 A1 WO2013071659 A1 WO 2013071659A1 CN 2011083367 W CN2011083367 W CN 2011083367W WO 2013071659 A1 WO2013071659 A1 WO 2013071659A1
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Prior art keywords
wires
curing test
test unit
liquid crystal
curing
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PCT/CN2011/083367
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English (en)
French (fr)
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施明宏
李蒙
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深圳市华星光电技术有限公司
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Application filed by 深圳市华星光电技术有限公司 filed Critical 深圳市华星光电技术有限公司
Priority to US13/379,650 priority Critical patent/US9251750B2/en
Priority to DE112011105741.5T priority patent/DE112011105741B4/de
Publication of WO2013071659A1 publication Critical patent/WO2013071659A1/zh

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    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
    • G02F1/1333—Constructional arrangements; Manufacturing methods
    • G02F1/1345—Conductors connecting electrodes to cell terminals
    • G02F1/13452—Conductors connecting driver circuitry and terminals of panels

Definitions

  • Embodiments of the present invention relate to the field of liquid crystal display technologies, and in particular, to a liquid crystal display module and a method of fabricating the same.
  • Liquid crystal display devices have been widely used in mobile phones, personal digital assistants (PDAs), notebook computers, notebook computers, personal computers (PCs), and televisions (TVs) due to their low radiation, small size, and low power consumption. .
  • PDAs personal digital assistants
  • PCs personal computers
  • TVs televisions
  • the liquid crystal display device mainly includes a liquid crystal panel and a backlight module that provides a light source for the liquid crystal panel.
  • the liquid crystal panel includes oppositely disposed thin film transistors (Thin Film Transistor, TFT) Substrate and Color Filter (Color a filter, a CF substrate and a liquid crystal layer interposed between the thin film transistor substrate and the color filter substrate.
  • TFT Thin Film Transistor
  • a general liquid crystal display device has a weak point of a small viewing angle range, that is, the contrast is remarkably lowered when viewed from the normal direction of the display liquid crystal panel, and this weakness is particularly prominent in the case where the liquid crystal display device is developed to a large size. Therefore, many techniques for increasing the viewing angle range of the liquid crystal display device (i.e., wide viewing angle) have emerged.
  • the curing test block is first fabricated on the thin film transistor substrate, and the thin film transistor substrate and the color filter substrate are pasted together and the liquid crystal material is poured therebetween to remove the color.
  • the filter substrate corresponds to an edge portion of the curing test block, and the curing test block located on the thin film transistor substrate is exposed, and the voltage signal is input to the curing test block for detection.
  • the main disadvantage of the above manufacturing process is that when the cured test block is formed on the thin film transistor substrate, since the liquid crystal display device requires the effective display area to be as large as possible, the cured test block and the thin film transistor substrate The range of the pitch of the edges has been limited to a small range, so that the thin film transistor substrate is prone to arcing during chemical vapor deposition (CVD) coating, affecting the process yield.
  • CVD chemical vapor deposition
  • the technical problem mainly solved by the present invention is to avoid the phenomenon of arc discharge in the process of chemical vapor deposition coating of the thin film transistor substrate.
  • the embodiment of the invention discloses a liquid crystal display module, comprising: a relatively disposed thin film transistor substrate, a color filter substrate, and a liquid crystal layer between the thin film transistor substrate and the color filter substrate,
  • the thin film transistor substrate includes a plurality of wires, the plurality of wires including at least a first group of wires and a second group of wires, and the second group of wires includes at least two wires;
  • the color filter substrate comprises a transparent conductive layer, and the first curing is insulated from each other
  • the test unit and the second curing test unit, the first curing test unit and the second curing test unit are cut from a transparent conductive layer, and the first curing test unit and the second curing test unit form a set of curing test components, and the same curing test
  • the first curing test unit and the second curing test unit in the assembly are located on the same side of the color filter substrate, and the first curing test unit is electrically connected to the first set of wires, the second curing test unit and the
  • the color filter substrate includes two sets of curing test components, and the two sets of curing test components are respectively located on opposite sides of the color filter substrate.
  • the two sets of curing test components are respectively located at opposite edges of the surface of the color filter substrate adjacent to the thin film transistor substrate.
  • the first set of wires includes a first common electrode
  • the second set of wires includes a second common electrode and a plurality of traces
  • two of the two sets of curing test components are electrically connected to the first common electrode.
  • the two second curing test units are electrically connected to the second common electrode and the plurality of traces.
  • the thin film transistor substrate includes a plurality of relay conductive units, and the ends of the first set of wires and the second set of wires are respectively connected to the plurality of relay conductive units, and the first curing test unit is electrically connected to the first common electrode by the relay conductive unit.
  • the second curing test unit is electrically connected to the second common electrode and the plurality of traces through the plurality of relay conductive units.
  • the first common electrode is a color filter common electrode
  • the second common electrode is a thin film transistor common electrode.
  • the transparent conductive layer is indium tin oxide or indium zinc oxide.
  • an embodiment of the present invention further discloses a liquid crystal display module, comprising: a relatively disposed thin film transistor substrate, a color filter substrate, and a liquid crystal layer between the thin film transistor substrate and the color filter substrate ,
  • the thin film transistor substrate includes a plurality of wires, the plurality of wires including at least a first group of wires and a second group of wires, and the second group of wires includes at least two wires;
  • the color filter substrate includes a first curing test unit and a second insulated from each other The curing test unit is electrically connected to the first set of wires, and the second curing test unit is electrically connected to all the wires of the second set of wires.
  • first curing test unit and the second curing test unit form a set of curing test components, and the first curing test unit and the second curing test unit of the same set of curing test components are located on the same side of the color filter substrate.
  • the color filter substrate includes two sets of curing test components, and the two sets of curing test components are respectively located on opposite sides of the color filter substrate.
  • the two sets of curing test components are respectively located at opposite edges of the surface of the color filter substrate adjacent to the thin film transistor substrate.
  • the first set of wires includes a first common electrode
  • the second set of wires includes a second common electrode and a plurality of traces
  • two of the two sets of curing test components are electrically connected to the first common electrode.
  • the two second curing test units are electrically connected to the second common electrode and the plurality of traces.
  • the thin film transistor substrate includes a plurality of relay conductive units, and the ends of the first set of wires and the second set of wires are respectively connected to the plurality of relay conductive units, and the first curing test unit is electrically connected to the first common electrode by the relay conductive unit.
  • the second curing test unit is electrically connected to the second common electrode and the plurality of traces through the plurality of relay conductive units.
  • the first common electrode is a color filter common electrode
  • the second common electrode is a thin film transistor common electrode.
  • the color filter substrate comprises a transparent conductive layer, and the first curing test unit and the second curing test unit are cut by a transparent conductive layer.
  • the transparent conductive layer is indium tin oxide or indium zinc oxide.
  • the embodiment of the invention further discloses a method for manufacturing a liquid crystal display module, comprising: fabricating a plurality of wires on a surface of a thin film transistor substrate, the plurality of wires comprising at least a first set of wires and a second set of wires,
  • the second set of wires includes at least two wires; a first curing test unit and a second curing test unit are formed on the surface of the color filter substrate; the thin film transistor substrate and the color filter substrate are bonded together, and the liquid crystal material is poured therebetween; And electrically connecting the first curing test unit to the first set of wires, so that the second curing test unit is electrically connected to all the wires of the second set of wires; and the thin film transistor substrate is corresponding to the first curing test unit and the second curing test Partial removal of the unit.
  • the input voltage signals of the first curing test unit and the second curing test unit are detected.
  • the invention has the beneficial effects that the liquid crystal display module and the manufacturing method thereof according to the embodiments of the present invention have the curing test unit disposed on the surface of the color filter substrate opposite to the thin film transistor substrate, thereby avoiding the prior art.
  • the arc discharge phenomenon in the chemical vapor deposition coating of the thin film transistor substrate improves the process yield, and the multi-product sharing jig can be realized, thereby reducing the manufacturing cost of the product.
  • FIG. 1 is a side view showing the structure of a liquid crystal display module according to a preferred embodiment of the present invention
  • FIG. 2 is a schematic view showing a wiring structure of the liquid crystal display module shown in FIG. 1;
  • FIG. 3 is a schematic diagram showing the steps of a method of fabricating a liquid crystal display module in accordance with a preferred embodiment of the present invention.
  • FIG. 1 is a schematic side view of a liquid crystal display module according to a preferred embodiment of the present invention
  • FIG. 2 is a liquid crystal display module of FIG. Schematic diagram of the trace structure.
  • the liquid crystal display module 1 includes a thin film transistor substrate 10, a color filter substrate 12, and a liquid crystal layer between the thin film transistor substrate 10 and the color filter substrate 12 (not shown). .
  • the thin film transistor substrate 10 includes a plurality of wires, the plurality of wires including at least a first group of wires and a second group of wires, and the second group of wires includes at least two wires.
  • the color filter substrate 12 includes a first curing test unit 122 and a second curing test unit 124 that are insulated from each other, and the first curing test unit 122 and the second curing test unit 124 respectively
  • the wires are electrically connected, the first curing test unit 122 is electrically connected to the first group of wires, and the second curing test unit 124 is electrically connected to all wires of the second group of wires.
  • the first set of wires includes a first common electrode 102
  • the second set of wires includes a second common electrode 104 and an odd row gate line (gate Odd)105, even row gate line (gate Even 106 and RGB (red, green, blue) pixel electrode lines 107, 108, 109, the first set of wires and the second set of wires are insulated from each other in parallel.
  • the first common electrode 102 is a color filter common electrode (CF Com)
  • the second common electrode 104 is a thin film transistor common electrode (TFT com).
  • the first curing test unit 122 is electrically connected to the first common electrode 102.
  • the second curing test unit 124 is electrically connected to the second common electrode 104, the odd row gate line 105, the even row gate line 106, and the RGB pixel electrode lines 107, 108, and 109.
  • the color filter substrate 12 further includes a transparent conductive layer (not shown), and the first curing test unit 122 and the second curing test unit 124 can be repaired by laser (laser)
  • the repairing machine is formed by laser cutting the transparent conductive layer on the surface of the color filter substrate 12.
  • the transparent conductive layer may be indium tin oxide (ITO) or indium zinc oxide (IZO).
  • first curing test unit 122 and the second curing test unit 124 form a set of curing test components 120, the first curing test unit 122 and the second curing in the same set of curing test components 120.
  • the test unit 124 is located on the same side of the color filter substrate 12.
  • the color filter substrate 12 includes two sets of curing test assemblies 120 respectively located on opposite sides of the color filter substrate 12. Further, the two sets of curing test assemblies 120 are adjacent to opposite edges of the color filter substrate 12 adjacent to the surface of the thin film transistor substrate 10, respectively.
  • each set of curing test assemblies 120 is electrically connected to the first set of wires and the second set of wires, respectively.
  • the two first curing test units 122 of the two sets of curing test components 120 are electrically connected to the first common electrode 102, and the two second curing test units 124 are both
  • the two common electrodes 104, the odd row gate lines 105, the even row gate lines 106, and the RGB pixel electrode lines 107, 108, and 109 are electrically connected.
  • the thin film transistor substrate 10 further includes a plurality of relay conductive units 103, the first common electrode 102, the second common electrode 104, the odd row gate lines 105, the even row gate lines 106, and The electrical ends of the RGB pixel electrode lines 107, 108, and 109 are respectively connected to the plurality of relay conductive units 103.
  • the first curing test unit 122 is electrically connected to the first common electrode 102 of the first group of wires through the relay conductive unit 103, and the second curing test unit 124 respectively passes the a plurality of relay conductive units 103 and the second common electrode 104 of the second group of wires, the odd row gate line 105, the even row gate line 106, and the RGB pixel electrode line 107, 108, 109 electrical connection.
  • the embodiment of the invention further discloses a method for manufacturing a liquid crystal display module.
  • the manufacturing method includes:
  • Step S1 forming a plurality of wires on the surface of the thin film transistor substrate, the plurality of wires including at least a first group of wires and a second group of wires, the second group of wires comprising at least two wires; being fabricated on a surface of the color filter substrate a first curing test unit and a second curing test unit;
  • Step S2 bonding the thin film transistor substrate and the color filter substrate, and injecting a liquid crystal material therebetween, and electrically connecting the first curing test unit and the first group of wires, so that the The second curing test unit is electrically connected to all the wires of the second group of wires;
  • Step S3 removing the thin film transistor substrate corresponding to the portions of the first curing test unit and the second curing test unit.
  • the removal process may be performed by an existing edge cut process, and details are not described herein again.
  • the manufacturing method further includes a step S4, the first curing test unit and the The second curing test unit inputs a voltage signal for detection.
  • the invention has the beneficial effects that the liquid crystal display module and the manufacturing method thereof according to the embodiments of the present invention have the curing test unit disposed on the surface of the color filter substrate opposite to the thin film transistor substrate, thereby avoiding the prior art.
  • the corresponding jig mechanism is designed to be movable to realize the sharing of the jig, thereby reducing the product. manufacturing cost.
  • the liquid crystal display module and the manufacturing method thereof of the embodiment of the invention can avoid the arc discharge phenomenon during the chemical vapor deposition coating of the thin film transistor substrate and realize the sharing of the fixture, thereby improving the product yield and reducing the product.

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Liquid Crystal (AREA)
  • Mathematical Physics (AREA)
  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
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Abstract

一种液晶显示模组（1）和液晶显示模组（1）的制造方法，该液晶显示模组（1）包括：相对设置的薄膜晶体管基板（10）、彩色滤光片基板（12）及位于所述薄膜晶体管基板（10）和所述彩色滤光片基板（12）之间的液晶层，所述薄膜晶体管基板（10）包括多个导线，所述多个导线包括至少第一组导线和第二组导线，所述第二组导线包括至少两个导线，所述彩色滤光片基板（12）包括相互绝缘的第一固化测试单元（122）和第二固化测试单元（124），所述第一固化测试单元（122）与所述第一组导线电性连接，所述第二固化测试单元（124）与所述第二组导线的所有导线电性连接，从而可以避免对薄膜晶体管基板（10）进行化学气相沉积镀膜时的电弧放电现象，还能提高工艺良率和降低制造成本。

Description

液晶显示模组及其制造方法
【技术领域】
本发明实施例涉及液晶显示技术领域，尤其涉及一种液晶显示模组及其制造方法。
【背景技术】
液晶显示装置因具有低辐射性、体积轻薄短小及耗电低等特点，已广泛应用于手机、个人数字助理（PDA）、笔记本电脑（Notebook）、个人电脑（PC）及电视（TV）等领域。
液晶显示装置主要包括液晶面板及为所述液晶面板提供光源的背光模组。所述液晶面板包括相对设置的薄膜晶体管（Thin Film Transistor，TFT）基板和彩色滤光片（Color Filter，CF）基板及夹设在所述薄膜晶体管基板和所述彩色滤光片基板之间的液晶层。
一般的液晶显示装置具有视角范围较小的弱点，即在离开显示液晶面板的法线方向观察时，对比度明显下降，在液晶显示装置向大尺寸发展的情况下，这一弱点尤为突出。因此，众多提高液晶显示装置的视角范围（即广视角）的技术应运而生。
其中一种广视角技术中的制造过程中，先将固化测试块制作于薄膜晶体管基板上，在将所述薄膜晶体管基板与彩色滤光片基板贴合并在其间灌注液晶材料后，去除所述彩色滤光片基板对应于所述固化测试块的边缘部分，将位于所述薄膜晶体管基板上的所述固化测试块露出，再对所述固化测试块输入电压讯号进行检测。
上述的制造过程主要存在的缺陷在于：将所述固化测试块形成于所述薄膜晶体管基板上时，由于液晶显示装置要求有效显示区尽可能大，因此所述固化测试块与所述薄膜晶体管基板边缘的间距范围已被限定在一较小范围内，使得所述薄膜晶体管基板在化学气相沉积（CVD）镀膜过程中容易产生电弧放电（arcing）现象，影响工艺良率。
【发明内容】
本发明主要解决的技术问题是避免薄膜晶体管基板在化学气相沉积镀膜过程中产生电弧放电现象。
为了解决上述技术问题，本发明实施例公开了一种液晶显示模组，包括：相对设置的薄膜晶体管基板、彩色滤光片基板及位于薄膜晶体管基板和彩色滤光片基板之间的液晶层，薄膜晶体管基板包括多个导线，多个导线包括至少第一组导线和第二组导线，第二组导线包括至少两个导线；彩色滤光片基板包括透明导电层、以及相互绝缘的第一固化测试单元和第二固化测试单元，第一固化测试单元和第二固化测试单元由透明导电层切割而成，第一固化测试单元和第二固化测试单元形成一组固化测试组件，同一组固化测试组件中的第一固化测试单元和第二固化测试单元位于彩色滤光片基板的同一侧，并且，第一固化测试单元与第一组导线电性连接，第二固化测试单元与第二组导线的所有导线电性连接。
其中，彩色滤光片基板包括两组固化测试组件，两组固化测试组件分别位于彩色滤光片基板的相对两侧。
其中，两组固化测试组件分别位于彩色滤光片基板邻近薄膜晶体管基板的表面的两相对边缘。
其中，第一组导线包括第一公共电极，第二组导线包括第二公共电极和多个走线，两组固化测试组件中的两个第一固化测试单元均与第一公共电极电性连接，两个第二固化测试单元均与第二公共电极和多个走线电性连接。
其中，薄膜晶体管基板包括多个中继导电单元，第一组导线和第二组导线的末端分别与多个中继导电单元连接，第一固化测试单元通过中继导电单元与第一公共电极电性连接，第二固化测试单元分别通过多个中继导电单元与第二公共电极和多个走线电性连接。
其中，第一公共电极为彩色滤光片公共电极，第二公共电极为薄膜晶体管公共电极。
其中，透明导电层为氧化铟锡或者氧化铟锌。
为了解决上述技术问题，本发明实施例还公开了一种液晶显示模组，包括：相对设置的薄膜晶体管基板、彩色滤光片基板及位于薄膜晶体管基板和彩色滤光片基板之间的液晶层， 薄膜晶体管基板包括多个导线，多个导线包括至少第一组导线和第二组导线，第二组导线包括至少两个导线；彩色滤光片基板包括相互绝缘的第一固化测试单元和第二固化测试单元，第一固化测试单元与第一组导线电性连接，第二固化测试单元与第二组导线的所有导线电性连接。
其中，第一固化测试单元和第二固化测试单元形成一组固化测试组件，同一组固化测试组件中的第一固化测试单元和第二固化测试单元位于彩色滤光片基板的同一侧。
其中，彩色滤光片基板包括两组固化测试组件，两组固化测试组件分别位于彩色滤光片基板的相对两侧。
其中，两组固化测试组件分别位于彩色滤光片基板邻近薄膜晶体管基板的表面的两相对边缘。
其中，第一组导线包括第一公共电极，第二组导线包括第二公共电极和多个走线，两组固化测试组件中的两个第一固化测试单元均与第一公共电极电性连接，两个第二固化测试单元均与第二公共电极和多个走线电性连接。
其中，薄膜晶体管基板包括多个中继导电单元，第一组导线和第二组导线的末端分别与多个中继导电单元连接，第一固化测试单元通过中继导电单元与第一公共电极电性连接，第二固化测试单元分别通过多个中继导电单元与第二公共电极和多个走线电性连接。
其中，第一公共电极为彩色滤光片公共电极，第二公共电极为薄膜晶体管公共电极。
其中，彩色滤光片基板包括透明导电层，第一固化测试单元和第二固化测试单元由透明导电层切割而成。
其中，透明导电层为氧化铟锡或者氧化铟锌。
为了解决上述技术问题，本发明实施例又公开了一种液晶显示模组的制造方法，包括：在薄膜晶体管基板表面制作多个导线，多个导线包括至少第一组导线和第二组导线，第二组导线包括至少两个导线；在彩色滤光片基板表面制作第一固化测试单元和第二固化测试单元；将薄膜晶体管基板和彩色滤光片基板贴合，并在其间灌注液晶材料，并使第一固化测试单元与第一组导线电性连接，使第二固化测试单元与第二组导线的所有导线电性连接；将薄膜晶体管基板对应于第一固化测试单元和第二固化测试单元的部分移除。
其中，在薄膜晶体管基板对应于第一固化测试单元和第二固化测试单元的部分移除后，对第一固化测试单元和第二固化测试单元输入电压讯号进行检测。
本发明的有益效果是：区别于现有技术的情况，本发明实施例的液晶显示模组及其制造方法将固化测试单元设置在与薄膜晶体管基板相对的彩色滤光片基板表面，因此可以避免在对所述薄膜晶体管基板进行化学气相沉积镀膜时的电弧放电现象，从而提高工艺良率，还可以实现多产品共用治具，降低产品制造成本。
【附图说明】
为了更清楚地说明本发明实施例中的技术方案，下面将对实施例描述中所需要使用的附图作简单地介绍，显而易见地，下面描述中的附图仅仅是本发明的一些实施例，对于本领域普通技术人员来讲，在不付出创造性劳动的前提下，还可以根据这些附图获得其它的附图，其中：
图1是本发明优选实施例液晶显示模组的侧视结构示意图；
图2是图1所示液晶显示模组的走线结构示意图；
图3是本发明优选实施例液晶显示模组的制造方法的步骤示意图。
【具体实施方式】
下面将结合本发明实施例中的附图，对本发明实施例中的技术方案进行清楚、完整地描述，显然，所描述的实施例仅是本发明的一部分实施例，而不是全部的实施例。基于本发明中的实施例，本领域普通技术人员在没有做出创造性劳动前提下所获得的所有其它实施例，都属于本发明保护的范围。
本发明实施例公开了一种液晶显示模组，请参阅图1和图2，图1是本发明优选实施例液晶显示模组的侧视结构示意图，图2是图1所示液晶显示模组的走线结构示意图。
所述液晶显示模组1包括：相对设置的薄膜晶体管基板10、彩色滤光片基板12及位于所述薄膜晶体管基板10和所述彩色滤光片基板12之间的液晶层（图未示）。
所述薄膜晶体管基板10，包括多个导线，所述多个导线包括至少第一组导线和第二组导线，所述第二组导线包括至少两个导线。
所述彩色滤光片基板12，包括相互绝缘的第一固化测试单元122和第二固化测试单元124，所述第一固化测试单元122和所述第二固化测试单元124分别与所述多个导线电性连接，所述第一固化测试单元122与所述第一组导线电性连接，所述第二固化测试单元124与所述第二组导线的所有导线电性连接。
其中，所述第一组导线包括第一公共电极102，所述第二组导线包括第二公共电极104、奇数行闸极线（gate odd）105、偶数行闸极线（gate even）106以及RGB（red，green，blue）像素电极线107、108、109，所述第一组导线和所述第二组导线相互平行绝缘设置。进一步，所述第一公共电极102为彩色滤光片公共电极（CF com），所述第二公共电极104为薄膜晶体管公共电极（TFT com）。
所述第一固化测试单元122与所述第一公共电极102电性连接。所述第二固化测试单元124与所述第二公共电极104、所述奇数行闸极线105、所述偶数行闸极线106以及所述RGB像素电极线107、108、109电性连接。
所述彩色滤光片基板12还包括透明导电层（图未示），所述第一固化测试单元122和所述第二固化测试单元124可以通过激光修复（laser repair）机台在所述彩色滤光片基板12表面对所述透明导电层进行激光切割而形成。优选的，所述透明导电层可以为氧化铟锡（ITO）或者氧化铟锌（IZO）。
进一步的，所述第一固化测试单元122和所述第二固化测试单元124形成一组固化测试组件120，同一组固化测试组件120中的所述第一固化测试单元122和所述第二固化测试单元124位于所述彩色滤光片基板12的同一侧。在本实施例中，所述彩色滤光片基板12包括两组固化测试组件120，所述两组固化测试组件120分别位于所述彩色滤光片基板12的相对两侧。进一步的，所述两组固化测试组件120分别相邻所述彩色滤光片基板12邻近所述薄膜晶体管基板10的表面的两相对边缘。
也就是说，每组固化测试组件120分别与所述第一组导线和所述第二组导线电性连接。其中，所述两组固化测试组件120中的两个所述第一固化测试单元122均与所述第一公共电极102电性连接，两个所述第二固化测试单元124均与所述第二公共电极104、所述奇数行闸极线105、所述偶数行闸极线106以及所述RGB像素电极线107、108、109电性连接。
所述薄膜晶体管基板10还包括多个中继导电单元103，所述第一公共电极102、所述第二公共电极104、所述奇数行闸极线105、所述偶数行闸极线106以及所述RGB像素电极线107、108、109电性的末端分别与所述多个中继导电单元103连接。即，所述第一固化测试单元122通过所述中继导电单元103与所述第一组导线中的所述第一公共电极102电性连接，所述第二固化测试单元124分别通过所述多个中继导电单元103与所述第二组导线中的所述第二公共电极104、所述奇数行闸极线105、所述偶数行闸极线106以及所述RGB像素电极线107、108、109电性连接。
本发明实施例还公开了一种液晶显示模组的制造方法，请参阅图3，所述制造方法包括：
步骤S1，在薄膜晶体管基板表面制作多个导线，所述多个导线包括至少第一组导线和第二组导线，所述第二组导线包括至少两个导线；在彩色滤光片基板表面制作第一固化测试单元和第二固化测试单元；
步骤S2，将所述薄膜晶体管基板和所述彩色滤光片基板贴合，并在其间灌注液晶材料，并使所述第一固化测试单元与所述第一组导线电性连接，使所述第二固化测试单元与所述第二组导线的所有导线电性连接；
步骤S3，将所述薄膜晶体管基板对应于所述第一固化测试单元和所述第二固化测试单元的部分移除。
其中，所述步骤S3中，所述移除处理可以通过现有的边缘切割（edge cut）工艺进行，在此不再赘述。
此外，在所述薄膜晶体管基板对应于所述第一固化测试单元和所述第二固化测试单元的部分移除后，所述制造方法还包括步骤S4，对所述第一固化测试单元和所述第二固化测试单元输入电压讯号进行检测。
本发明的有益效果是：区别于现有技术的情况，本发明实施例的液晶显示模组及其制造方法将固化测试单元设置在与薄膜晶体管基板相对的彩色滤光片基板表面，因此可以避免在对所述薄膜晶体管基板进行化学气相沉积镀膜时的电弧放电现象，从而提高工艺良率。此外，由于仅需两组固化测试组件，且每组固化测试组件中的固化测试单元的数目仅需两个，因此将相应治具机构设计为可移动式即可实现治具共用，从而降低产品制造成本。
综上所述，本发明实施例的液晶显示模组及其制造方法可以避免所述薄膜晶体管基板进行化学气相沉积镀膜时的电弧放电现象和实现治具共用，因此具有提高产品良率和降低产品制造成本的优点。
以上所述仅为本发明的实施例，并非因此限制本发明的专利范围，凡是利用本发明说明书及附图内容所作的等效结构或等效流程变换，或直接或间接运用在其它相关的技术领域，均同理包括在本发明的专利保护范围内。

Claims (18)

  1. 一种液晶显示模组，包括：
    相对设置的薄膜晶体管基板、彩色滤光片基板及位于所述薄膜晶体管基板和所述彩色滤光片基板之间的液晶层，其特征在于：
    所述薄膜晶体管基板包括多个导线，所述多个导线包括至少第一组导线和第二组导线，所述第二组导线包括至少两个导线；
    所述彩色滤光片基板包括透明导电层、以及相互绝缘的第一固化测试单元和第二固化测试单元，所述第一固化测试单元和所述第二固化测试单元由所述透明导电层切割而成，所述第一固化测试单元和所述第二固化测试单元形成一组固化测试组件，同一组固化测试组件中的所述第一固化测试单元和所述第二固化测试单元位于所述彩色滤光片基板的同一侧，并且，所述第一固化测试单元与所述第一组导线电性连接，所述第二固化测试单元与所述第二组导线的所有导线电性连接。
  2. 根据权利要求1所述的液晶显示模组，其特征在于：所述彩色滤光片基板包括两组固化测试组件，所述两组固化测试组件分别位于所述彩色滤光片基板的相对两侧。
  3. 根据权利要求2所述的液晶显示模组，其特征在于：所述两组固化测试组件分别位于所述彩色滤光片基板邻近所述薄膜晶体管基板的表面的两相对边缘。
  4. 根据权利要求2所述的液晶显示模组，其特征在于：所述第一组导线包括第一公共电极，所述第二组导线包括第二公共电极和多个走线，所述两组固化测试组件中的两个所述第一固化测试单元均与所述第一公共电极电性连接，两个所述第二固化测试单元均与所述第二公共电极和所述多个走线电性连接。
  5. 根据权利要求4所述的液晶显示模组，其特征在于：所述薄膜晶体管基板包括多个中继导电单元，所述第一组导线和所述第二组导线的末端分别与所述多个中继导电单元连接，所述第一固化测试单元通过所述中继导电单元与所述第一公共电极电性连接，所述第二固化测试单元分别通过所述多个中继导电单元与所述第二公共电极和所述多个走线电性连接。
  6. 根据权利要求4所述的液晶显示模组，其特征在于：所述第一公共电极为彩色滤光片公共电极，所述第二公共电极为薄膜晶体管公共电极。
  7. 根据权利要求1所述的液晶显示模组，其特征在于：所述透明导电层为氧化铟锡或者氧化铟锌。
  8. 一种液晶显示模组，包括：
    相对设置的薄膜晶体管基板、彩色滤光片基板及位于所述薄膜晶体管基板和所述彩色滤光片基板之间的液晶层，其特征在于：
    所述薄膜晶体管基板包括多个导线，所述多个导线包括至少第一组导线和第二组导线，所述第二组导线包括至少两个导线；
    所述彩色滤光片基板包括相互绝缘的第一固化测试单元和第二固化测试单元，所述第一固化测试单元与所述第一组导线电性连接，所述第二固化测试单元与所述第二 组导线的所有导线电性连接。
  9. 根据权利要求8所述的液晶显示模组，其特征在于：所述第一固化测试单元和所述第二固化测试单元形成一组固化测试组件，同一组固化测试组件中的所述第一固化测试单元和所述第二固化测试单元位于所述彩色滤光片基板的同一侧。
  10. 根据权利要求9所述的液晶显示模组，其特征在于：所述彩色滤光片基板包括两组固化测试组件，所述两组固化测试组件分别位于所述彩色滤光片基板的相对两侧。
  11. 根据权利要求10所述的液晶显示模组，其特征在于：所述两组固化测试组件分别位于所述彩色滤光片基板邻近所述薄膜晶体管基板的表面的两相对边缘。
  12. 根据权利要求10所述的液晶显示模组，其特征在于：所述第一组导线包括第一公共电极，所述第二组导线包括第二公共电极和多个走线，所述两组固化测试组件中的两个所述第一固化测试单元均与所述第一公共电极电性连接，两个所述第二固化测试单元均与所述第二公共电极和所述多个走线电性连接。
  13. 根据权利要求12所述的液晶显示模组，其特征在于：所述薄膜晶体管基板包括多个中继导电单元，所述第一组导线和所述第二组导线的末端分别与所述多个中继导电单元连接，所述第一固化测试单元通过所述中继导电单元与所述第一公共电极电性连接，所述第二固化测试单元分别通过所述多个中继导电单元与所述第二公共电极和所述多个走线电性连接。
  14. 根据权利要求12所述的液晶显示模组，其特征在于：所述第一公共电极为彩色滤光片公共电极，所述第二公共电极为薄膜晶体管公共电极。
  15. 根据权利要求8所述的液晶显示模组，其特征在于：所述彩色滤光片基板包括透明导电层，所述第一固化测试单元和所述第二固化测试单元由所述透明导电层切割而成。
  16. 根据权利要求15所述的液晶显示模组，其特征在于：所述透明导电层为氧化铟锡或者氧化铟锌。
  17. 一种液晶显示模组的制造方法，其特征在于，包括：
    在薄膜晶体管基板表面制作多个导线，所述多个导线包括至少第一组导线和第二组导线，所述第二组导线包括至少两个导线；在彩色滤光片基板表面制作第一固化测 试单元和第二固化测试单元；
    将所述薄膜晶体管基板和所述彩色滤光片基板贴合，并在其间灌注液晶材料，并使所述第一固化测试单元与所述第一组导线电性连接，使所述第二固化测试单元与所述第二组导线的所有导线电性连接；
    将所述薄膜晶体管基板对应于所述第一固化测试单元和所述第二固化测试单元的部分移除。
  18. 根据权利要求17所述的制造方法，其特征在于：在所述薄膜晶体管基板对应于所述第一固化测试单元和所述第二固化测试单元的部分移除后，对所述第一固化测试单元和所述第二固化测试单元输入电压讯号进行检测。
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Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010020988A1 (en) * 2000-03-06 2001-09-13 Kimitoshi Ohgiichi Liquid crystal display device and manufacturing method thereof
CN1512219A (zh) * 2002-12-27 2004-07-14 Lg.菲利浦Lcd株式会社 液晶显示装置的制造方法
CN1897094A (zh) * 2005-07-11 2007-01-17 中华映管股份有限公司 液晶显示面板及其检测方法
CN1922500A (zh) * 2004-02-27 2007-02-28 东芝松下显示技术有限公司 检查阵列基板的方法及制造阵列基板的方法
CN101446699A (zh) * 2008-12-30 2009-06-03 友达光电股份有限公司 检测装置与用于此检测装置的检测方法

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI279630B (en) * 2004-12-17 2007-04-21 Au Optronics Corp Liquid crystal display
KR101487427B1 (ko) * 2008-07-09 2015-01-29 삼성디스플레이 주식회사 표시 패널 및 그 제조 방법
CN101826505A (zh) * 2009-03-05 2010-09-08 南茂科技股份有限公司 封装基板以及芯片封装结构
CN101923236A (zh) * 2009-06-16 2010-12-22 友达光电股份有限公司 液晶显示面板及其测试方法
KR101358223B1 (ko) * 2009-12-10 2014-02-06 엘지디스플레이 주식회사 배향막과 액정표시소자, 배향막 형성방법 및 액정표시소자 제조방법
CN201765799U (zh) * 2010-02-24 2011-03-16 福州华映视讯有限公司 具有检测电路布线的数组基板
KR101107165B1 (ko) * 2010-03-23 2012-01-25 삼성모바일디스플레이주식회사 액정 표시 패널
CN102012595A (zh) * 2010-10-08 2011-04-13 友达光电股份有限公司 一种液晶显示器

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20010020988A1 (en) * 2000-03-06 2001-09-13 Kimitoshi Ohgiichi Liquid crystal display device and manufacturing method thereof
CN1512219A (zh) * 2002-12-27 2004-07-14 Lg.菲利浦Lcd株式会社 液晶显示装置的制造方法
CN1922500A (zh) * 2004-02-27 2007-02-28 东芝松下显示技术有限公司 检查阵列基板的方法及制造阵列基板的方法
CN1897094A (zh) * 2005-07-11 2007-01-17 中华映管股份有限公司 液晶显示面板及其检测方法
CN101446699A (zh) * 2008-12-30 2009-06-03 友达光电股份有限公司 检测装置与用于此检测装置的检测方法

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