WO2013037102A1 - Encapsulation method for embedding chip into substrate and structure thereof - Google Patents

Encapsulation method for embedding chip into substrate and structure thereof Download PDF

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Publication number
WO2013037102A1
WO2013037102A1 PCT/CN2011/079575 CN2011079575W WO2013037102A1 WO 2013037102 A1 WO2013037102 A1 WO 2013037102A1 CN 2011079575 W CN2011079575 W CN 2011079575W WO 2013037102 A1 WO2013037102 A1 WO 2013037102A1
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WO
WIPO (PCT)
Prior art keywords
chip
substrate
contact surface
groove
layer
Prior art date
Application number
PCT/CN2011/079575
Other languages
French (fr)
Chinese (zh)
Inventor
霍如肖
谷新
丁鲲鹏
Original Assignee
深南电路有限公司
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 深南电路有限公司 filed Critical 深南电路有限公司
Priority to PCT/CN2011/079575 priority Critical patent/WO2013037102A1/en
Priority to CN201180070104.4A priority patent/CN103477423B/en
Publication of WO2013037102A1 publication Critical patent/WO2013037102A1/en

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/12Mountings, e.g. non-detachable insulating substrates
    • H01L23/13Mountings, e.g. non-detachable insulating substrates characterised by the shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/538Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates
    • H01L23/5389Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames the interconnection structure between a plurality of semiconductor chips being formed on, or in, insulating substrates the chips being integrally enclosed by the interconnect and support structures
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/18High density interconnect [HDI] connectors; Manufacturing methods related thereto
    • H01L24/19Manufacturing methods of high density interconnect preforms
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/02Bonding areas; Manufacturing methods related thereto
    • H01L2224/04Structure, shape, material or disposition of the bonding areas prior to the connecting process
    • H01L2224/04105Bonding areas formed on an encapsulation of the semiconductor or solid-state body, e.g. bonding areas on chip-scale packages
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73267Layer and HDI connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/13Discrete devices, e.g. 3 terminal devices
    • H01L2924/1304Transistor
    • H01L2924/1306Field-effect transistor [FET]
    • H01L2924/13091Metal-Oxide-Semiconductor Field-Effect Transistor [MOSFET]
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151Die mounting substrate
    • H01L2924/1515Shape
    • H01L2924/15153Shape the die mounting substrate comprising a recess for hosting the device

Definitions

  • the present invention relates to the field of chip packaging, and in particular to a method of packaging a chip embedded in a substrate and a structure thereof.
  • the semiconductor chip is embedded in the package substrate, because it can effectively shorten the connection distance between the semiconductor and the package substrate, and can provide strong guarantee for high-frequency and high-speed signal transmission, and the chip embedded in the substrate can satisfy the high integration degree of the package structure and the electronic product.
  • Active devices such as Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs), diodes, and transistors have single-sided or double-sided electrical connections, and different types of active devices have different thicknesses.
  • MOSFETs Metal-Oxide-Semiconductor Field-Effect Transistors
  • Buried semiconductor chips of different thicknesses are embedded in the substrate.
  • the thickness of the substrate is required to be different from the thickness of the chip due to the necessity of insulation, it is necessary to ensure that at least one side of the chip is coplanar with the substrate, and the chip is ensured.
  • Single-sided or double-sided with good electrical connection to the substrate the prior art is usually achieved by lamination, which requires a lot of pressure during lamination, and requires laser drilling, copper sinking and electroplating to achieve electrical connection. Bringing a lot of risk to the integrity of the chip.
  • the embodiment of the invention provides a method for packaging a chip embedded in a substrate and a structure thereof, which are used for solving the coplanarity of the chip and the substrate and the electrical connection between the chip contact surface and the lower layer when the chip is integrally packaged, thereby improving the reliability of the chip package. .
  • a method for packaging a chip embedded substrate, the chip having a first contact surface and a second contact surface comprising the following steps:
  • Step S1 at least one chip embedding portion is disposed on the substrate, the chip embedding portion is a through hole and/or a groove, and the number of the chip embedding portion is the same as the number of required packaged chips, and the chip embedding portion is The depth matches the chip thickness of the desired package;
  • Step S2 embedding the chip into the chip embedding portion;
  • Step S3 forming a wiring layer on the first contact surface and/or the second contact surface of the chip, and corresponding wiring on the substrate, so that the substrate and the chip are electrically connected.
  • a package structure of a chip embedded in a substrate includes a substrate, a chip, and a wiring layer.
  • the substrate is provided with at least one chip embedding portion, the chip has a first contact surface and a second contact surface, the chip embedding portion is a through hole and/or a groove, and the depth of the chip embedding portion and the corresponding embedding Chip thickness matching,
  • the wiring layer includes a wiring disposed on the first contact surface and/or the second contact surface of the chip, and a wiring disposed on the substrate corresponding to the wiring of the chip for realizing electrical connection between the chip and the substrate .
  • the embodiments of the present invention have the following advantages:
  • connection methods are selected to electrically connect the chip, so that the packaging process has good expandability and strong applicability.
  • FIG. 1 is a schematic flow chart of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention
  • FIG. 2 is a schematic diagram showing a process step of a first embodiment of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention
  • 3a to 3g are schematic diagrams showing process steps of a second embodiment of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention
  • FIGS. 4a to 4h are schematic diagrams showing three steps of an application example of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention.
  • FIG. 5 is a schematic diagram showing four steps of an application example of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention
  • FIG. 6 is a schematic flow chart of a method for packaging a chip embedded substrate according to a second embodiment of the present invention
  • FIG. 7 is a schematic diagram showing a process step of a method for packaging a chip embedded substrate according to a second embodiment of the present invention
  • FIG. 8 is a schematic flow chart of a method for packaging a chip embedded in a substrate according to Embodiment 3 of the present invention
  • 9a to 9d are schematic diagrams showing process steps of an application example of a method of packaging a chip embedded in a substrate according to a third embodiment of the present invention
  • FIG. 10 is a schematic diagram of a package structure of a chip embedded in a substrate according to Embodiment 4 of the present invention.
  • FIG. 11 is a schematic diagram of a package structure of a chip embedded in a substrate according to Embodiment 5 of the present invention.
  • FIG. 12 is a schematic diagram of a package structure of a chip embedded substrate according to Embodiment 6 of the present invention.
  • Embodiments of the present invention provide a method for packaging a chip embedded in a substrate and a structure thereof, which are used to solve the problem of coplanarity and electrical connection between the chip and the substrate in the chip package, and realize high frequency and high speed transmission of the electrical signal.
  • the implementation of the present invention will be described in detail below with reference to the specific embodiments, and some of the more common technical means are not described in detail to avoid the unnecessary limitation of the present invention.
  • FIG. 1 a schematic flow chart of a method for packaging a chip embedded in a substrate according to the present embodiment is shown, and a method for packaging a chip embedded in a substrate, wherein the chip has a first contact surface and a second contact surface, and the following steps are included:
  • At least one chip embedding portion is disposed on the substrate, the chip embedding portion is a through hole and/or a groove, the number of the chip embedding portion is the same as the number of the required packaged chips, and the depth of the chip embedding portion matches the chip thickness of the required package. ;
  • the chip embedding portion there are through holes and/or grooves.
  • at least one of the chip embedding portions may be a groove or a through hole, or may be a groove or a through hole.
  • the substrate may be a single-sided board, a double-sided board or a multi-layer board in which an inner layer circuit has been processed. In the embodiment, a more intuitive representation process is performed, and a double-panel is taken as an example to describe the process.
  • a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102 is selected, and a substrate is opened from the first metal layer 101 to the dielectric layer 100;
  • the first metal layer 101 and the second metal layer 102 of the substrate are copper-clad layers, that is, the substrate is a copper-clad substrate, and aluminum or other metals may be selected according to actual application requirements.
  • the dielectric layer 100 is an insulating material and may be epoxy resin (Epoxy Resin), cyanate Ester, glass fiber (Glass Fiber), polyimide (Polyimide), bismaleimide triazine ( Bismaleimide Triazine, BT) or a mixture of insulating materials, or other insulating medium.
  • epoxy resin epoxy resin
  • cyanate Ester glass fiber
  • Glass Fiber Glass Fiber
  • polyimide Polyimide
  • bismaleimide triazine Bismaleimide Triazine, BT
  • a mixture of insulating materials or other insulating medium.
  • the manufacturing process of the groove is controlled by deep milling.
  • deep milling is a milling machine technology that controls the depth in the Z direction. Due to the limitation of the Z-direction controlled deep milling precision of the milling machine, in order to ensure the integrity of the second metal layer 102 layer. It can also be milled to a safe depth using a milling machine and then burnt through the dielectric layer using laser ablation.
  • the depth of the groove matches the thickness of the chip to be buried.
  • the length and width of the groove are larger than the size of the chip to be buried, so that the groove can accommodate the chip to be buried.
  • the shape of the groove may be a regular rectangular parallelepiped, or a trapezoidal shape, or a stepped shape, which may be designed according to actual process requirements, and is not limited herein.
  • the groove is uniformly represented.
  • the adhesive layer 103 is applied in such a manner that when the chip is in contact with the bottom surface of the groove, the first contact surface of the chip has no pad, and the non-conductive bonding material can be coated by stencil printing or dispensing. Covering, the adhesion between the chip and the substrate bonded to the substrate groove through the adhesive layer has greater adhesion, so that the reliability of the connection is higher.
  • the first contact surface of the chip 107 is butt-bonded to the adhesive layer 103, so that the chip 107 is buried in the recess;
  • the first metal layer 101 and the second contact surface of the chip are coated with a photosensitive material to form a photosensitive material coating layer 108;
  • the recesses and the apertures around the chip 109 may also be filled with a photosensitive material or filled with other insulating filler material;
  • the filling effect between the chip and the substrate can be better by filling the groove with the pores around the chip.
  • Figure 2f blocking the gap portion of the pad on the second contact surface of the chip;
  • the photosensitive material coating layer 108 is exposed, developed, and cured to block the gap portion of the pad on the second contact surface of the chip and block the portion of the first metal layer 101 where the copper surface needs to be retained.
  • the wiring is disposed on the first contact surface and the second contact surface of the chip, and the corresponding arrangement on the substrate Place the wiring to form a wiring layer.
  • the wiring may be disposed on the second contact surface of the chip by sputtering or copper plating, electroplating, exposure, development, etching, or the like, and wiring is formed on the first metal layer 101 of the substrate corresponding to the second contact surface to form a wiring layer
  • wiring is provided on the adhesive layer 103
  • wiring is provided on the second metal layer 102 of the substrate corresponding to the adhesive layer 103 to form a wiring layer.
  • the lamination technique or the layer-adding method can be used to continue to produce the multilayer wiring.
  • FIG. 3a to FIG. 3g there are shown schematic diagrams of process steps of another application example of the method for packaging a chip embedded substrate of an embodiment, including the following steps:
  • a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102 is selected, and a recess penetrating from the first metal layer 101 to the dielectric layer 100 is formed on the substrate;
  • the depth of the groove is matched with the thickness of the chip to be buried.
  • the chip of different thickness is ensured to be coplanar after being encapsulated into the substrate, and the length and width of the groove are Both are larger than the size of the desired embedded chip so that the recess is sufficient to accommodate the chip to be buried.
  • the first contact surface of the chip has a pad, and the bottom surface of the groove communicates with the second metal layer 102, that is, the groove penetrates the first metal layer 101 and the dielectric layer 100, and reaches the second metal layer 102, which can be more conveniently implemented.
  • the bottom surface of the groove may not abut the second metal layer 204, and the first contact surface of the chip is electrically connected to the substrate by using a metal via hole.
  • the conductive bonding material is formed on the bottom surface of the groove forming a solder joint 104;
  • a solder joint 104 may be formed on the bottom surface of the groove by screen printing or dispensing.
  • the recesses 109 and the apertures 109 around the chip 107 can also be filled with photosensitive material or other The insulating filling material is filled so that the chip 107 is better fixed to the groove of the substrate; FIG. 3f, the gap portion between the pads on the second contact surface of the chip 107 is blocked;
  • the photosensitive material coating layer 108 is exposed, developed, and cured to block the gap portion between the pads on the second contact surface of the chip.
  • wiring is formed on the first contact surface and/or the second contact surface of the chip by sputtering or copper plating, plating, etching, or the like, and wiring is formed correspondingly on the substrate to form a wiring layer.
  • the first contact surface and the second contact surface of the chip 107 have pads, which can be used in the first contact surface and the second contact of the chip by sputtering or copper plating, electroplating, exposure, development, etching, and the like.
  • Wiring is provided on the surface, and a corresponding wiring connected to the wiring on the chip is provided on the substrate to electrically connect the chip to the substrate.
  • FIG. 4a to FIG. 4h a schematic diagram of a process step of another application example of the method for packaging a chip embedded substrate of the embodiment is shown, which includes the following steps:
  • a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102 is selected, and a recess from the first metal layer 101 to the dielectric layer 100 is formed on the substrate;
  • the depth of the groove is matched with the thickness of the chip to be buried.
  • the chip of different thickness is ensured to be coplanar after being recessed into the groove of the substrate, and the length and width of the groove are Both are larger than the size of the desired embedded chip so that the recess is sufficient to accommodate the chip to be buried.
  • the first contact surface of the chip has a pad, and the bottom surface of the groove communicates with the second metal layer 102, that is, the groove penetrates the first metal layer 101 and the dielectric layer 100, which can facilitate the subsequent electrical connection between the first contact surface of the chip and the substrate. connection.
  • the bottom surface of the groove may not communicate with the second metal layer 204, and then the electrical connection between the first contact surface of the chip and the substrate is realized by using a metal via blind via.
  • the dimples 105 can be formed on the underside of the recess by a laser drill process or etching technique.
  • solder ball or a conductive bonding material is implanted in the pit 105 to form a solder joint 106;
  • the bonding of the subsequent chip 107 and the solder joint 106 is realized by forming the solder joint 106 in the recess 105, and the contact area of the second metal layer 102 and the solder joint 106 is increased, and the bonding of the chip 107 and the solder joint 106 is performed. better result.
  • the first contact surface of the chip 107 is butt-bonded to the solder joint 106, thereby making the chip 107 Buried into the groove;
  • the first metal layer 101 and the second contact surface of the chip are coated with a photosensitive material to form a photosensitive material coating layer 108;
  • the recesses and the apertures 109 around the chip may also be filled with a photosensitive material or filled with other insulating filler material;
  • Figure 4g blocking the gap portion of the pad on the second contact surface of the chip, and blocking the portion of the first metal layer 101 where the copper surface needs to be retained, by the exposure, development and curing of the photosensitive layer;
  • Figure 4h Techniques such as sputtering or copper immersion, electroplating, etching, etc., are provided with wiring on the first contact surface and/or the second contact surface of the chip, and corresponding wirings are formed on the substrate to form a wiring layer to electrically connect the chip to the substrate.
  • the first contact surface and the second contact surface of the chip have pads, which can be on the first contact surface and the second contact surface of the chip by sputtering or copper plating, electroplating, exposure, development, etching, and the like.
  • a wiring is provided, and a corresponding wiring connected to the wiring on the chip is provided on the substrate to form a wiring layer, and electrical connection between the chip and the substrate is realized.
  • FIG. 5 there is shown a process step diagram of another application example of a package embedding method of a chip embedded substrate of an embodiment, for packaging a plurality of chips of different thicknesses, including the following steps:
  • FIG. 5 is a cross-sectional view of the substrate 200A-A, the substrate 200 is opened from the first metal layer 203 to the dielectric layer 202 with different depths of the same number of chips as the desired package;
  • the groove is carved by the deep milling process.
  • the depth of the groove matches the thickness of the chip to be buried, which ensures the coplanarity of the front side of the chip when multiple chips are buried.
  • the length and width of the groove are larger than The size of the chip needs to be buried so that the recess can accommodate enough of the chip to be buried.
  • the bottom surface of the groove communicates with the second metal layer 204 or does not communicate with the second metal layer 204; when the first contact surface of the chip has a pad, the bottom surface of the groove and the second The metal layer 204 is connected to ensure that the first contact surface of the chip is easy to form an electrical connection.
  • the bottom surface of the groove may not communicate with the second metal layer 204, but the metal is used instead. The method of guiding the blind vias realizes the electrical connection between the first contact surface of the chip and the substrate.
  • the bottom surface of the groove can be coated with a non-conductive bonding material, a solder joint is formed directly on the bottom surface of the groove, or a corresponding pit is formed on the bottom surface of the groove to form a pit.
  • a wiring layer may be disposed on the first contact surface and the second contact surface of the chip by sputtering or copper plating, electroplating, exposure, development, etching, etc., and a corresponding wiring connected to the wiring layer on the chip may be disposed on the substrate
  • the layer is used to electrically connect the chip to the substrate.
  • the wiring layer is composed of sputtered Ti/Cu, deposited Cu, electroplated Cu or other conductive metal.
  • FIG. 6 there is shown a flow chart of still another embodiment of a method of packaging a chip embedded in a substrate.
  • the chip has a first contact surface and a second contact surface, and includes the following steps:
  • the substrate is opened at least one through hole, the number of the through holes is the same as the number of required packaged chips, and the through holes penetrate the substrate;
  • the substrate may be a single panel, a double panel or a multilayer panel.
  • the substrate and the thick copper foil are laminated and connected through the insulating dielectric layer, the through hole and the convex portion form a groove, and the depth of the groove matches the thickness of the chip to be buried, when the substrate needs to be embedded with a plurality of different thicknesses When the chip is used, it is used to ensure that chips of different thicknesses are packaged into the substrate and remain coplanar;
  • a wiring is disposed on the first contact surface and/or the second contact surface of the chip, and a wiring is disposed on the substrate, and a wiring layer is formed to electrically connect the substrate and the chip.
  • FIG. 7a to FIG. 7c a schematic diagram of a process packaging step is shown.
  • the method for packaging a chip embedded in a substrate for packaging a plurality of chips of different thicknesses includes the following steps: FIG. 7a Opening the same number of through holes 301 as the desired package, the through holes penetrating through the first metal layer 303, the dielectric layer 302 and the second metal layer 304; FIG. 7b, taking the thick copper foil 305 to etch and the via position a uniformly distributed convex portion; wherein the height of the convex portion is designed according to the thickness of the chip, and the height of the convex portion is equal to the thickness of the chip Anti-proportional relationship.
  • the substrate 300 and the thick copper foil 305 are laminated and connected through the insulating dielectric layer 306, and the through hole 301 and the convex portion form a groove; the depth of the groove matches the thickness of the chip to be buried, when the substrate needs to be buried When there are multiple chips with different thicknesses, the chips of different thicknesses are ensured to be coplanar after being encapsulated into the substrate, and the length and width of the grooves are larger than the size of the embedded chip, so that the grooves can be sufficiently accommodated. Buried chip.
  • FIG. 8 is a schematic flow chart of still another embodiment of a method for packaging a chip embedded in a substrate.
  • the chip has a first contact surface and a second contact surface, and includes the following steps:
  • the substrate is opened with at least one through hole, and the number of the through holes is the same as the number of required packaged chips;
  • FIG. 9a to FIG. 9d are schematic diagrams showing specific steps of a specific application example of a method for packaging a chip embedded in a substrate, and a chip embedded in a substrate package provided in this embodiment.
  • the method includes the following steps: In FIG. 9a, the substrate 400 is opened with the same number of through holes 401 as the required package, and the through hole
  • a UV film 405 is adhered on the surface of the second metal layer 404.
  • the UV film is a film-like substance having a bonding effect, and loses viscosity after UV light irradiation;
  • the coplanarity of the chips of different thicknesses can be ensured by the adhesion between the coplanar UV film and the second contact surface of the chips of different thicknesses.
  • the gap between the chip 406 and the through hole 401 is filled with a bonding material to form a filling adhesive layer 407 for fixing the chip 406;
  • the bonding material layer 407 is a photosensitive resin or other bonding material, and is adhered.
  • the junction material is thermally conductive or thermally non-conductive, depending on the electrical connection needs.
  • the photosensitive resin is printed on the second contact surface of the chip; the first contact surface and/or the second contact surface of the chip are disposed, and a corresponding wiring layer is formed on the substrate to electrically connect the substrate to the chip.
  • a package structure of a chip embedded in a substrate includes a substrate, a chip and a wiring layer, the substrate is provided with at least one chip embedding portion, the chip has a first contact surface and a second contact surface, and the chip embedding portion is a through hole or a groove, and the chip is buried
  • the depth of the entrance portion is matched with the thickness of the corresponding embedded chip
  • the wiring layer includes a wiring disposed on the first contact surface and/or the second contact surface of the chip, and a wiring disposed on the substrate corresponding to the chip for realizing the chip and the substrate Wiring for electrical connections.
  • the through hole and/or the recess in different application embodiments, at least one of the chip embedding portions may be a groove or a through hole, or may be a groove and a through hole.
  • the substrate may be a single-panel, a double-panel or a multi-layered board that has been processed with an inner layer.
  • the dual-panel is taken as an example to describe the embedded substrate package structure.
  • a specific application example of the chip-embedded substrate package structure will be described in more detail below. It can be understood that the corresponding structures in the following embodiments can be used in combination.
  • Embodiment 4 Referring to FIG.
  • a package structure in which a chip is embedded in a substrate includes: a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102;
  • the groove is formed by slotting the first metal layer 101 of the substrate to the dielectric layer 100; the depth of the groove is matched with the thickness of the chip to be buried, and the chip is coplanar when the plurality of chips are buried, and the groove is Both the length and the width are larger than the size of the desired embedded chip so that the recess can accommodate the chip to be buried.
  • the chip 107 has a first contact surface and a second contact surface.
  • the first contact surface of the chip is connected to the bottom surface of the recess through the solder joint 103 disposed on the bottom surface of the recess, and the chip is initially buried in the recess, so that the chip and the recess are The fixing effect is better, and the groove 109 and the pores 109 around the chip are filled with the photosensitive material or filled with other insulating filling materials;
  • the wiring layer is provided with wirings on the first contact surface and the second contact surface of the chip, and corresponding wirings are formed on the substrate such that the substrate and the chip are electrically connected.
  • the build-up line is formed.
  • the insulating dielectric layer 110 is formed of sputtered copper or deposited copper, electroplated copper, or the like, or may be composed of other conductive metals.
  • the structure of the fifth embodiment of the package structure of the chip embedded substrate includes: a substrate; at least one groove formed in the substrate, the depth of the groove is matched with the thickness of the chip to be buried, and the substrate needs to be buried more When chips of different thicknesses are ensured, chips of different thicknesses are packaged into the chip.
  • the groove of the substrate is coplanar, the length and the width of the groove are larger than the size of the desired embedded chip, so that the groove can be enough to accommodate the chip to be buried; at least one chip, the chip has a first contact surface and The second contact surface is embedded in the corresponding recess; the wiring layer is provided with wiring on the first contact surface and/or the second contact surface of the chip, and the corresponding wiring is formed on the substrate, so that the substrate and the chip are electrically connected.
  • the substrate may be a single panel, a double panel or a multi-panel.
  • the non-conductive bonding material forms a bonding layer on the bottom surface of the groove, and the first contact surface and the groove are formed by the bonding layer.
  • the bottom is connected.
  • the second contact surface of the chip has a pad
  • the second contact surface pad is formed with a conductive bonding material to form a solder joint corresponding to the pad, and the first contact surface and the bottom surface of the groove are connected by the solder joint, or in the second
  • the metal layer etches the pit corresponding to the second contact surface pad, and then implants a solder ball or a conductive bonding material on the pit to form a solder joint, and connects the second contact surface and the bottom surface of the recess through the solder joint, and then
  • the wiring layer and the second contact surface solder joint are connected by a metal blind hole. As shown in FIG.
  • the chip-embedded substrate package structure includes: a substrate further comprising an insulating layer 300, a line 301 formed by the second metal layer, a first metal layer laminated insulating medium or an insulating medium 303 coated in other forms. Thereafter, after exposure development and conduction through a process such as sputtering, chemical deposition, electroplating, etching, etc., the line 301 and the line 302 are made of a first metal layer, sputtered Ti/Cu or other metal, chemical copper, Electroplated copper and the like; because the chips to be buried have different thicknesses, the four grooves opened on the substrate have a depth matching the chip to be buried, and the groove corresponds to the buried single-sided conduction chip 306 or double The surface conduction chip 308, the gap between the groove and the chip is filled with the underfill 304.
  • the solder joint 309 and the via blind via 310 may be connected to the line 301, or the solder joint of the chip 308 may be directly connected to the line 301. .
  • the electrical connection between line 301 and line 302 is achieved by providing vias 307. It can be seen from the above package structure that the depth of the groove matches the thickness of the chip to be buried. When the substrate needs to be embedded with a plurality of chips of different thicknesses, the chips of different thicknesses are ensured.
  • the grooves of the substrate are coplanar, and the electrical connection between the single side of the chip and the substrate or the electrical connection of the both sides to the substrate can be conveniently realized.
  • the package structure of the chip embedded in the substrate is characterized in that: the package structure of the chip embedded in the substrate comprises: a substrate having a same number of through holes as the required packaged chip; the copper foil and the copper foil have a pass a convex portion having a uniform hole position distribution, the height of the convex portion being inversely proportional to the thickness of the chip; an insulating dielectric layer for connecting the substrate and the copper foil, so that the through hole and the convex portion are fitted to form a groove, and the depth of the groove is The thickness of the chip to be embedded is matched.
  • the chips of different thicknesses are ensured to be coplanar after being recessed into the groove of the substrate, and the length and width of the groove are larger than required.
  • the chip is sized such that the recess is sufficient to accommodate the chip to be buried; at least one chip having a first contact surface and a second contact surface, and the chip is buried by connecting the first contact surface to the bottom surface of the recess a wiring layer, a wiring disposed on the first contact surface and/or the second contact surface of the chip, and a corresponding wiring formed on the substrate, such that the substrate and the chip are electrically connected .
  • the substrate may be a single panel, a double panel or a multi-panel.
  • the non-conductive bonding material forms a bonding layer on the bottom surface of the groove, and the first contact surface and the groove are formed by the bonding layer.
  • the bottom is connected.
  • the second contact surface of the chip has a pad
  • the second contact surface pad is formed with a conductive bonding material to form a solder joint corresponding to the pad, and the first contact surface and the bottom surface of the groove are connected by the solder joint, or in the second
  • the metal layer etches the pit corresponding to the second contact surface pad, and then implants a solder ball or a conductive bonding material on the pit to form a solder joint, and connects the second contact surface and the bottom surface of the recess through the solder joint, and then
  • the wiring layer and the second contact surface solder joint are connected by a metal blind hole.
  • the chip-embedded substrate package structure includes: a substrate, further including an insulating layer 300, a line 301 formed by the second metal layer, a first metal layer laminated insulating medium or an insulating medium 303 coated in other forms.
  • the line 301 and line 302 are composed of a first metal layer, sputtered Ti/Cu or other metal, chemical copper, electroplated copper, etc.; since the chips to be buried have different thicknesses, the four grooves opened on the substrate have and are required
  • the buried chip matching depth matching, the corresponding buried single-sided conducting chip 306 or the double-sided conductive via chip is connected to the line 301 by the contact surface of the groove bottom surface, by providing the conductive bonding material layer 308 and
  • the line 309 formed by the thick copper foil is in communication with the line 301, and the electrical connection between the line 301 and the line 302 is realized by providing the via hole 307, and the wiring layer 301 is connected to the outside by providing the conduction blind hole 310.
  • the depth of the groove matches the thickness of the chip to be buried.
  • the chip of different thickness is packaged into the groove of the substrate and is coplanar.
  • the electrical connection between the single side of the chip and the substrate or the electrical connection of both sides to the substrate can be conveniently realized.

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Abstract

Provided are an encapsulation method for embedding a chip into a substrate and a structure thereof. The method includes: providing at least one chip embedding part inside a substrate, the chip embedding part being a through-hole and/or a recess, the number of chip embedding parts being equal to that of the chip (107) to be encapsulated, the depth of the chip embedding part matched with the thickness of the chip (107) to be encapsulated; embedding the chip (107) into the chip embedding part; wiring on a first contact face and/or a second contact face of the chip (107), and wiring correspondingly on the substrate to form a wiring layer, so that the substrate and the chip (107) are electrically connected to each other.

Description

芯片埋入 的封装方法及其结构 技术领域  Chip embedding method and structure thereof
本发明涉及芯片封装领域,尤其涉及一种芯片埋入基板的封装方法及其结 构。  The present invention relates to the field of chip packaging, and in particular to a method of packaging a chip embedded in a substrate and a structure thereof.
背景技术 Background technique
随着信息社会的发展, 各种电子设备的信息处理量不断增大, 对于高频、 高速信号传输的需求日益增长。将半导体芯片埋入封装基板, 因其可有效缩短 半导体与封装基板的连接距离, 可为高频、 高速信号传输提供有力的保证, 同 时棵芯片埋入基板可以满足封装结构高集成度以及电子产品微型化的发展需 求。  With the development of the information society, the amount of information processing of various electronic devices continues to increase, and the demand for high-frequency, high-speed signal transmission is increasing. The semiconductor chip is embedded in the package substrate, because it can effectively shorten the connection distance between the semiconductor and the package substrate, and can provide strong guarantee for high-frequency and high-speed signal transmission, and the chip embedded in the substrate can satisfy the high integration degree of the package structure and the electronic product. The development needs of miniaturization.
在半导体封装有一类特殊的棵芯片, 例如金属氧化物半导体场效应管 There is a special type of chip in the semiconductor package, such as a metal oxide semiconductor field effect transistor.
( Metal-Oxide-Semiconductor Field-Effect Transistor , MOSFET )、 二极管 ( diode )和晶体管等有源器件, 具有单面或双面电气连接结构, 且不同种类 有源器件具有不同的厚度。 Active devices such as Metal-Oxide-Semiconductor Field-Effect Transistors (MOSFETs), diodes, and transistors have single-sided or double-sided electrical connections, and different types of active devices have different thicknesses.
将不同厚度的半导体芯片埋入基板, 由于绝缘性的需要,要求基板的厚度 与棵芯片的厚度不一样时, 由于丝网印刷等制程需要, 需保证芯片至少一面与 基板共面, 同时保证芯片单面或双面与基板具有良好的电气连接, 现有技术通 常通过层压的方式实现, 层压时需要很大的压力, 同时需要激光钻孔、 沉铜和 电镀等工序来实现电气连接, 给棵芯片的完好性带来很大的风险。  Buried semiconductor chips of different thicknesses are embedded in the substrate. When the thickness of the substrate is required to be different from the thickness of the chip due to the necessity of insulation, it is necessary to ensure that at least one side of the chip is coplanar with the substrate, and the chip is ensured. Single-sided or double-sided with good electrical connection to the substrate, the prior art is usually achieved by lamination, which requires a lot of pressure during lamination, and requires laser drilling, copper sinking and electroplating to achieve electrical connection. Bringing a lot of risk to the integrity of the chip.
发明内容 Summary of the invention
本发明实施例提供了芯片埋入基板的封装方法及其结构,用于解决芯片整 体封装时芯片与基板的共面性以及芯片接触面与下层线路之间的电气连接问 题, 提高芯片封装可靠性。  The embodiment of the invention provides a method for packaging a chip embedded in a substrate and a structure thereof, which are used for solving the coplanarity of the chip and the substrate and the electrical connection between the chip contact surface and the lower layer when the chip is integrally packaged, thereby improving the reliability of the chip package. .
依据本发明一实施例提供的一种芯片埋入基板的封装方法,所述芯片具有 第一接触面和第二接触面, 包括以下步骤:  According to an embodiment of the invention, a method for packaging a chip embedded substrate, the chip having a first contact surface and a second contact surface, comprising the following steps:
步骤 S1 : 在所述基板设置至少一个芯片埋入部, 所述芯片埋入部为通孔 和 /或凹槽, 所述芯片埋入部的数目与所需封装芯片的数目相同, 所述芯片埋 入部的深度与所需封装的芯片厚度匹配;  Step S1: at least one chip embedding portion is disposed on the substrate, the chip embedding portion is a through hole and/or a groove, and the number of the chip embedding portion is the same as the number of required packaged chips, and the chip embedding portion is The depth matches the chip thickness of the desired package;
步骤 S2: 将所述芯片埋入所述芯片埋入部; 步骤 S3: 在芯片的第一接触面和 /或第二接触面布线, 以及基板上对应布 线, 形成布线层, 使得所述基板和所述芯片之间电气连接。 Step S2: embedding the chip into the chip embedding portion; Step S3: forming a wiring layer on the first contact surface and/or the second contact surface of the chip, and corresponding wiring on the substrate, so that the substrate and the chip are electrically connected.
依据本发明又一实施例提供的一种芯片埋入基板的封装结构,所述芯片埋 入基板的封装结构包括基板、 芯片和布线层,  According to still another embodiment of the present invention, a package structure of a chip embedded in a substrate, the package structure of the chip embedded in the substrate includes a substrate, a chip, and a wiring layer.
所述基板设置有至少一个芯片埋入部,所述芯片具有第一接触面和第二接 触面, 所述芯片埋入部为通孔和 /或凹槽, 所述芯片埋入部的深度与对应埋入 的芯片的厚度匹配,  The substrate is provided with at least one chip embedding portion, the chip has a first contact surface and a second contact surface, the chip embedding portion is a through hole and/or a groove, and the depth of the chip embedding portion and the corresponding embedding Chip thickness matching,
所述布线层包括布设在所述芯片第一接触面和 /或第二接触面的布线, 以 及基板上对应所述芯片的布线而布设的用于实现所述芯片与基板之间电气连 接的布线。  The wiring layer includes a wiring disposed on the first contact surface and/or the second contact surface of the chip, and a wiring disposed on the substrate corresponding to the wiring of the chip for realizing electrical connection between the chip and the substrate .
从以上技术方案可以看出, 本发明实施例具有以下优点:  As can be seen from the above technical solutions, the embodiments of the present invention have the following advantages:
( 1 )通过深度不同的凹槽放置厚度不同的芯片, 且凹槽的深度与所需埋 入的芯片厚度匹配, 保证不同厚度的芯片封装入该基板后保持共面;  (1) placing chips of different thicknesses through grooves having different depths, and the depth of the grooves is matched with the thickness of the chip to be buried, so as to ensure that the chips of different thickness are coplanar after being packaged into the substrate;
( 2 )根据芯片一面设置焊盘还是两面都设有焊盘的不同焊盘设置方式选 择不同的连接方式对芯片进行电气连接,使得封装工艺具有良好的扩展性, 适 用性强。  (2) According to different setting methods of setting the pad on one side of the chip or different pads on both sides of the chip, different connection methods are selected to electrically connect the chip, so that the packaging process has good expandability and strong applicability.
附图说明 DRAWINGS
图 1是本发明实施例一的芯片埋入基板的封装方法流程示意图; 图 2a至图 2g是本发明实施例一的芯片埋入基板的封装方法应用实例一的 工序步骤示意图;  1 is a schematic flow chart of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention; and FIG. 2 is a schematic diagram showing a process step of a first embodiment of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention;
图 3a至图 3g是本发明实施例一的芯片埋入基板的封装方法应用实例二的 工序步骤示意图;  3a to 3g are schematic diagrams showing process steps of a second embodiment of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention;
图 4a至图 4h是本发明实施例一的芯片埋入基板的封装方法应用实例三工 序步骤示意图;  4a to 4h are schematic diagrams showing three steps of an application example of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention;
图 5 是本发明实施例一的芯片埋入基板的封装方法应用实例四步骤示意 图;  5 is a schematic diagram showing four steps of an application example of a method for packaging a chip embedded in a substrate according to Embodiment 1 of the present invention;
图 6是本发明实施例二的芯片埋入基板的封装方法流程示意图; 图 7a至图 7c是本发明实施例二的芯片埋入基板的封装方法应用实例工序 步骤示意图;  6 is a schematic flow chart of a method for packaging a chip embedded substrate according to a second embodiment of the present invention; FIG. 7 is a schematic diagram showing a process step of a method for packaging a chip embedded substrate according to a second embodiment of the present invention;
图 8是本发明实施例三的芯片埋入基板的封装方法流程示意图; 图 9a至图 9d是本发明实施例三的芯片埋入基板的封装方法应用实例工序 步骤示意图; 8 is a schematic flow chart of a method for packaging a chip embedded in a substrate according to Embodiment 3 of the present invention; 9a to 9d are schematic diagrams showing process steps of an application example of a method of packaging a chip embedded in a substrate according to a third embodiment of the present invention;
图 10是本发明实施例四的芯片埋入基板的封装结构示意图;  10 is a schematic diagram of a package structure of a chip embedded in a substrate according to Embodiment 4 of the present invention;
图 11是本发明实施例五的芯片埋入基板的封装结构示意图;  11 is a schematic diagram of a package structure of a chip embedded in a substrate according to Embodiment 5 of the present invention;
图 12是本发明实施例六的芯片埋入基板的封装结构示意图。  FIG. 12 is a schematic diagram of a package structure of a chip embedded substrate according to Embodiment 6 of the present invention.
具体实施方式 detailed description
本发明实施例提供了芯片埋入基板的封装方法及其结构,用于解决芯片封 装中芯片与基板的共面性和电气连接问题, 实现电信号的高频和高速传输。 以 下将结合具体实施例详细描述本发明的实施过程,对本领域技术人员一些较常 用的工艺技术手段不做详细描述, 以避免造成对本发明不必要的限制。  Embodiments of the present invention provide a method for packaging a chip embedded in a substrate and a structure thereof, which are used to solve the problem of coplanarity and electrical connection between the chip and the substrate in the chip package, and realize high frequency and high speed transmission of the electrical signal. The implementation of the present invention will be described in detail below with reference to the specific embodiments, and some of the more common technical means are not described in detail to avoid the unnecessary limitation of the present invention.
实施例一  Embodiment 1
参考图 1 , 所示为本实施例芯片埋入基板的封装方法流程示意图, 一种芯 片埋入基板的封装方法, 其中芯片具有第一接触面和第二接触面, 包括以下步 骤:  Referring to FIG. 1, a schematic flow chart of a method for packaging a chip embedded in a substrate according to the present embodiment is shown, and a method for packaging a chip embedded in a substrate, wherein the chip has a first contact surface and a second contact surface, and the following steps are included:
S101 , 在基板设置至少一个芯片埋入部, 芯片埋入部为通孔和 /或凹槽, 芯片埋入部的数目与所需封装芯片的数目相同,芯片埋入部的深度与所需封装 的芯片厚度匹配;  S101, at least one chip embedding portion is disposed on the substrate, the chip embedding portion is a through hole and/or a groove, the number of the chip embedding portion is the same as the number of the required packaged chips, and the depth of the chip embedding portion matches the chip thickness of the required package. ;
5102, 将芯片埋入芯片埋入部;  5102, embedding the chip in the chip embedding portion;
5103 , 在芯片的第一接触面和 /或第二接触面布线, 以及基板上对应布线, 形成布线层, 使得基板和芯片之间电气连。  5103, wiring on the first contact surface and/or the second contact surface of the chip, and corresponding wiring on the substrate, forming a wiring layer, so that the substrate and the chip are electrically connected.
对于芯片埋入部为通孔和 /或凹槽, 在不同的应用实施例中, 至少一个芯 片埋入部可以都为凹槽或通孔 ,也可以凹槽和通孔都有。其中基板可以为单面 板,双面板或是已经加工好内层线路的多层板, 实施例中为了更直观的表述工 序过程, 以双面板为例对工序过程进行详述。  For the chip embedding portion, there are through holes and/or grooves. In different application embodiments, at least one of the chip embedding portions may be a groove or a through hole, or may be a groove or a through hole. The substrate may be a single-sided board, a double-sided board or a multi-layer board in which an inner layer circuit has been processed. In the embodiment, a more intuitive representation process is performed, and a double-panel is taken as an example to describe the process.
以下将对芯片埋入基板封装方法的具体应用实例作更详细的说明,可以理 解的是, 以下实施例中各步骤中的方式可以结合使用。  A specific application example of the chip-embedded substrate encapsulation method will be described in more detail below, and it can be understood that the modes in the respective steps in the following embodiments can be used in combination.
参考图 2a至图 2g, 所示为对单个芯片封装的工序步骤示意图, 其过程如 下:  Referring to Figures 2a to 2g, there are shown process steps for a single chip package, the process of which is as follows:
图 2a,选择一具有第一金属层 101、介电层 100和第二金属层 102的基板, 将基板从第一金属层 101至介电层 100开一凹槽; 其中基板的第一金属层 101和第二金属层 102为覆铜层,即基板为覆铜基 板, 也可以根据实际应用的要求选择铝或其他的金属。 2a, a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102 is selected, and a substrate is opened from the first metal layer 101 to the dielectric layer 100; The first metal layer 101 and the second metal layer 102 of the substrate are copper-clad layers, that is, the substrate is a copper-clad substrate, and aluminum or other metals may be selected according to actual application requirements.
介电层 100为绝缘材料,可以为环氧树脂( Epoxy Resin )、氰酸酯( Cyanate Ester )、 玻璃纤维 (Glass Fiber ), 聚酰亚胺(Polyimide )、 双马来酰亚胺三嗪 ( Bismaleimide Triazine, BT )或以上绝缘材料的混合物, 或其它绝缘介质。  The dielectric layer 100 is an insulating material and may be epoxy resin (Epoxy Resin), cyanate Ester, glass fiber (Glass Fiber), polyimide (Polyimide), bismaleimide triazine ( Bismaleimide Triazine, BT) or a mixture of insulating materials, or other insulating medium.
凹槽的制作工艺釆用控深铣,所谓控深铣就是控制 Z方向的深度的一种铣 床技术, 由于受到铣床 Z 方向控深铣精度的限制, 为了保证第二金属层 102 层的完好性,也可以使用铣床铣到一个保险的深度后,再使用激光烧蚀将介电 层烧透。 凹槽的深度与所需埋入的芯片厚度匹配, 凹槽的长度、 宽度的都大于 所需埋入芯片的尺寸, 以使凹槽能足够容纳所需埋入的芯片。 凹槽的形状可以 为规则的长方体,或为梯形体,或阶梯状,可以根据实际的工艺要求进行设计, 在此不做限制,说明书附图中为了较直观的表述, 统一的将凹槽表示成长方体 的形状。  The manufacturing process of the groove is controlled by deep milling. The so-called deep milling is a milling machine technology that controls the depth in the Z direction. Due to the limitation of the Z-direction controlled deep milling precision of the milling machine, in order to ensure the integrity of the second metal layer 102 layer. It can also be milled to a safe depth using a milling machine and then burnt through the dielectric layer using laser ablation. The depth of the groove matches the thickness of the chip to be buried. The length and width of the groove are larger than the size of the chip to be buried, so that the groove can accommodate the chip to be buried. The shape of the groove may be a regular rectangular parallelepiped, or a trapezoidal shape, or a stepped shape, which may be designed according to actual process requirements, and is not limited herein. For the more intuitive expression in the drawings, the groove is uniformly represented. The shape of the growing cube.
图 2b, 将非导电粘结材料涂覆于凹槽底面, 形成粘结层 103;  Figure 2b, a non-conductive bonding material is applied to the bottom surface of the groove to form a bonding layer 103;
此种粘结层 103涂覆方式适用于芯片与凹槽底面接触时,芯片的第一接触 面没有焊盘的情况,非导电粘结材料可以通过钢网印刷或点胶机点胶的方式涂 覆,通过粘结层粘接于基板凹槽的芯片和基板之间具有更大的附着力,使得连 接的可靠性更高。  The adhesive layer 103 is applied in such a manner that when the chip is in contact with the bottom surface of the groove, the first contact surface of the chip has no pad, and the non-conductive bonding material can be coated by stencil printing or dispensing. Covering, the adhesion between the chip and the substrate bonded to the substrate groove through the adhesive layer has greater adhesion, so that the reliability of the connection is higher.
图 2c, 将芯片 107第一接触面与粘结层 103对接粘结, 使得芯片 107埋 入凹槽;  2c, the first contact surface of the chip 107 is butt-bonded to the adhesive layer 103, so that the chip 107 is buried in the recess;
通过这一步骤, 完成了芯片 107初步固定于基板的凹槽的步骤。  Through this step, the step of initially fixing the chip 107 to the groove of the substrate is completed.
图 2d, 在第一金属层 101和芯片第二接触面上涂覆感光材料, 形成感光 材料涂覆层 108;  Figure 2d, the first metal layer 101 and the second contact surface of the chip are coated with a photosensitive material to form a photosensitive material coating layer 108;
图 2e, 凹槽与芯片四周的孔隙 109也可填入感光材料或使用其他的绝缘 填充材料进行填充;  Figure 2e, the recesses and the apertures around the chip 109 may also be filled with a photosensitive material or filled with other insulating filler material;
通过对凹槽与芯片四周孔隙的填充可使芯片和基板之间的固定效果更好。 图 2f, 将芯片第二接触面上的焊盘的间隙部位阻挡;  The filling effect between the chip and the substrate can be better by filling the groove with the pores around the chip. Figure 2f, blocking the gap portion of the pad on the second contact surface of the chip;
通过感光材料涂覆层 108曝光、显影和固化,将芯片第二接触面上的焊盘 的间隙部位阻挡, 并阻挡住第一金属层 101的需保留铜面的部分。  The photosensitive material coating layer 108 is exposed, developed, and cured to block the gap portion of the pad on the second contact surface of the chip and block the portion of the first metal layer 101 where the copper surface needs to be retained.
图 2g, 在芯片的第一接触面和第二接触面设置布线, 以及基板上对应设 置布线, 形成布线层。 Figure 2g, the wiring is disposed on the first contact surface and the second contact surface of the chip, and the corresponding arrangement on the substrate Place the wiring to form a wiring layer.
可通过溅射或沉铜、 电镀、 曝光、 显影、 蚀刻等技术, 在芯片的第二接触 面设置布线, 并在与第二接触面对应的基板第一金属层 101设置布线, 形成布 线层, 同时, 在粘结层 103设置布线, 并在与粘结层 103对应的基板第二金属 层 102设置布线,形成布线层。此时,双面板的制作已经完成,如果需要增层, 便可以釆取层压技术或者增层法继续制作多层线路。  The wiring may be disposed on the second contact surface of the chip by sputtering or copper plating, electroplating, exposure, development, etching, or the like, and wiring is formed on the first metal layer 101 of the substrate corresponding to the second contact surface to form a wiring layer At the same time, wiring is provided on the adhesive layer 103, and wiring is provided on the second metal layer 102 of the substrate corresponding to the adhesive layer 103 to form a wiring layer. At this point, the production of the double-panel has been completed. If it is necessary to add layers, the lamination technique or the layer-adding method can be used to continue to produce the multilayer wiring.
以下两个应用实例将针对芯片的第一接触面上也有焊盘的情况进行描述。 第一接触面上也有焊盘, 第一接触面上也需要与基板的电气连接, 因此不能釆 用应用实例一中直接将非导电粘结材料涂覆于凹槽底面,形成粘结层的方式对 芯片进行粘结。  The following two application examples will describe the case where there are also pads on the first contact surface of the chip. There is also a pad on the first contact surface, and the first contact surface also needs to be electrically connected to the substrate. Therefore, the method of directly applying the non-conductive bonding material to the bottom surface of the groove to form the bonding layer cannot be applied. Bond the chip.
参考图 3a至图 3g, 所示为实施例的芯片埋入基板的封装方法又一应用实 例的工序步骤示意图, 包括以下步骤:  Referring to FIG. 3a to FIG. 3g, there are shown schematic diagrams of process steps of another application example of the method for packaging a chip embedded substrate of an embodiment, including the following steps:
图 3a,选择一具有第一金属层 101、介电层 100和第二金属层 102的基板, 在基板上开设从第一金属层 101贯通至介电层 100的凹槽;  3a, a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102 is selected, and a recess penetrating from the first metal layer 101 to the dielectric layer 100 is formed on the substrate;
凹槽的深度与所需埋入的芯片厚度匹配,当该基板需埋设有多个厚度不同 的芯片的时候, 保证不同厚度的芯片封装入该基板后保持共面, 凹槽的长度、 宽度的都大于所需埋入芯片的尺寸, 以使凹槽能足够容纳所需埋入的芯片。  The depth of the groove is matched with the thickness of the chip to be buried. When the substrate needs to be embedded with a plurality of chips having different thicknesses, the chip of different thickness is ensured to be coplanar after being encapsulated into the substrate, and the length and width of the groove are Both are larger than the size of the desired embedded chip so that the recess is sufficient to accommodate the chip to be buried.
芯片的第一接触面有焊盘, 凹槽的底面与第二金属层 102相通, 即凹槽贯 通第一金属层 101和介电层 100, 抵达第二金属层 102, 可更方便的实现后续 芯片的第一接触面与基板的电气连接。 当然, 芯片的第一接触面有焊盘时, 凹 槽的底面也可不抵接至第二金属层 204, 通过釆用金属导盲通孔的方式实现芯 片第一接触面与基板的电气连接。  The first contact surface of the chip has a pad, and the bottom surface of the groove communicates with the second metal layer 102, that is, the groove penetrates the first metal layer 101 and the dielectric layer 100, and reaches the second metal layer 102, which can be more conveniently implemented. An electrical connection of the first contact surface of the chip to the substrate. Of course, when the first contact surface of the chip has a pad, the bottom surface of the groove may not abut the second metal layer 204, and the first contact surface of the chip is electrically connected to the substrate by using a metal via hole.
图 3b, 将导电粘结材料在凹槽的底面形成焊点 104;  Figure 3b, the conductive bonding material is formed on the bottom surface of the groove forming a solder joint 104;
此步骤中可釆用丝网印刷或点胶机点胶的方式在凹槽的底面形成焊点 104。  In this step, a solder joint 104 may be formed on the bottom surface of the groove by screen printing or dispensing.
图 3c, 将芯片 107第一接触面与焊点 104对接粘结, 使得芯片 107固设 于凹槽;  Figure 3c, the first contact surface of the chip 107 is butt-bonded to the solder joint 104, so that the chip 107 is fixed to the recess;
图 3d, 在第一金属层 101和芯片 107第二接触面上涂覆感光材料, 形成 感光材料涂覆层 108;  Figure 3d, the first metal layer 101 and the second contact surface of the chip 107 coated with a photosensitive material to form a photosensitive material coating layer 108;
图 3e, 凹槽与芯片 107四周的孔隙 109也可填入感光材料或使用其他的 绝缘填充材料进行填充, 使得芯片 107更好的固定在基板的凹槽; 图 3f, 将芯片 107第二接触面上的焊盘之间的间隙部位阻挡; Figure 3e, the recesses 109 and the apertures 109 around the chip 107 can also be filled with photosensitive material or other The insulating filling material is filled so that the chip 107 is better fixed to the groove of the substrate; FIG. 3f, the gap portion between the pads on the second contact surface of the chip 107 is blocked;
此步骤中通过感光材料涂覆层 108曝光、显影和固化将芯片第二接触面上 焊盘之间的间隙部位阻挡。  In this step, the photosensitive material coating layer 108 is exposed, developed, and cured to block the gap portion between the pads on the second contact surface of the chip.
图 3g, 通过溅射或沉铜、 电镀、 蚀刻等技术, 在芯片的第一接触面和 /或 第二接触面设置布线, 以及基板上对应设置布线, 形成布线层。  In Fig. 3g, wiring is formed on the first contact surface and/or the second contact surface of the chip by sputtering or copper plating, plating, etching, or the like, and wiring is formed correspondingly on the substrate to form a wiring layer.
本实施例中芯片 107的第一接触面和第二接触面都有焊盘,可通过溅射或 沉铜、 电镀、 曝光、 显影、 蚀刻等技术, 在芯片的第一接触面和第二接触面设 置布线, 并在基板上设置对应的与芯片上的布线连接的布线, 实现芯片与基板 的电气连接。 此时, 双面板的制作已经完成, 如果需要增层, 便可以釆取传统 层压的技术或者增层法继续制作多层线路。  In the embodiment, the first contact surface and the second contact surface of the chip 107 have pads, which can be used in the first contact surface and the second contact of the chip by sputtering or copper plating, electroplating, exposure, development, etching, and the like. Wiring is provided on the surface, and a corresponding wiring connected to the wiring on the chip is provided on the substrate to electrically connect the chip to the substrate. At this time, the production of the double-panel has been completed, and if it is necessary to add layers, the conventional lamination technique or the build-up method can be used to continue to fabricate the multilayer wiring.
参考图 4a到图 4h, 所示为实施例的芯片埋入基板的封装方法又一应用实 例的工序步骤示意图, 包括以下步骤:  Referring to FIG. 4a to FIG. 4h, a schematic diagram of a process step of another application example of the method for packaging a chip embedded substrate of the embodiment is shown, which includes the following steps:
图 4a, 选择具有第一金属层 101、 介电层 100和第二金属层 102的基板, 在基板上开设从第一金属层 101至介电层 100的凹槽;  4a, a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102 is selected, and a recess from the first metal layer 101 to the dielectric layer 100 is formed on the substrate;
凹槽的深度与所需埋入的芯片厚度匹配,当基板需埋入多个不同厚度的芯 片时, 保证不同厚度的芯片封装入该基板的凹槽后共面, 凹槽的长度、 宽度的 都大于所需埋入芯片的尺寸, 以使凹槽能足够容纳所需埋入的芯片。  The depth of the groove is matched with the thickness of the chip to be buried. When the substrate needs to be embedded with a plurality of chips of different thicknesses, the chip of different thickness is ensured to be coplanar after being recessed into the groove of the substrate, and the length and width of the groove are Both are larger than the size of the desired embedded chip so that the recess is sufficient to accommodate the chip to be buried.
芯片的第一接触面有焊盘, 凹槽的底面与第二金属层 102相通, 即凹槽贯 通第一金属层 101和介电层 100, 可方便后续实现芯片第一接触面与基板的电 气连接。 当然, 芯片的第一接触面有焊盘时, 凹槽的底面也可不与第二金属层 204相通, 后续通过釆用金属导盲通孔的方式实现芯片第一接触面与基板的电 气连接。  The first contact surface of the chip has a pad, and the bottom surface of the groove communicates with the second metal layer 102, that is, the groove penetrates the first metal layer 101 and the dielectric layer 100, which can facilitate the subsequent electrical connection between the first contact surface of the chip and the substrate. connection. Of course, when the first contact surface of the chip has a pad, the bottom surface of the groove may not communicate with the second metal layer 204, and then the electrical connection between the first contact surface of the chip and the substrate is realized by using a metal via blind via.
图 4b, 在凹槽底面打出相对应的凹坑 105;  Figure 4b, the corresponding recess 105 is punched in the bottom surface of the groove;
凹坑 105可通过激光钻机工艺或蚀刻技术在凹槽底面形成。  The dimples 105 can be formed on the underside of the recess by a laser drill process or etching technique.
图 4c, 在凹坑 105内植入锡球或点上导电粘结材料, 形成焊点 106;  Figure 4c, a solder ball or a conductive bonding material is implanted in the pit 105 to form a solder joint 106;
本实施例釆用凹坑 105 内形成焊点 106的方式实现后续芯片 107和焊点 106的粘结,增加第二金属层 102和焊点 106的接触面积,芯片 107和焊点 106 的粘结效果更好。  In this embodiment, the bonding of the subsequent chip 107 and the solder joint 106 is realized by forming the solder joint 106 in the recess 105, and the contact area of the second metal layer 102 and the solder joint 106 is increased, and the bonding of the chip 107 and the solder joint 106 is performed. better result.
图 4d, 将芯片 107第一接触面与焊点 106对接粘结, 从而使得芯片 107 埋入凹槽; 4d, the first contact surface of the chip 107 is butt-bonded to the solder joint 106, thereby making the chip 107 Buried into the groove;
图 4e, 在第一金属层 101和芯片第二接触面上涂覆感光材料, 形成感光 材料涂覆层 108;  Figure 4e, the first metal layer 101 and the second contact surface of the chip are coated with a photosensitive material to form a photosensitive material coating layer 108;
图 4f,凹槽与芯片四周的孔隙 109也可填入感光材料或使用其他的绝缘填 充材料进行填充;  Figure 4f, the recesses and the apertures 109 around the chip may also be filled with a photosensitive material or filled with other insulating filler material;
图 4g, 将芯片第二接触面上的焊盘的间隙部位阻挡, 并阻挡住第一金属 层 101的需保留铜面的部分, 通过感光层曝光、 显影和固化等工序完成; 图 4h, 通过溅射或沉铜、 电镀、 蚀刻等技术, 在芯片的第一接触面和 /或 第二接触面设置布线, 以及基板上对应设置布线, 形成布线层, 使得芯片与基 板电气连接。  Figure 4g, blocking the gap portion of the pad on the second contact surface of the chip, and blocking the portion of the first metal layer 101 where the copper surface needs to be retained, by the exposure, development and curing of the photosensitive layer; Figure 4h, Techniques such as sputtering or copper immersion, electroplating, etching, etc., are provided with wiring on the first contact surface and/or the second contact surface of the chip, and corresponding wirings are formed on the substrate to form a wiring layer to electrically connect the chip to the substrate.
本实施例中芯片的第一接触面和第二接触面都有焊盘, 可通过溅射或沉 铜、 电镀、 曝光、 显影、 蚀刻等技术, 在芯片的第一接触面和第二接触面设置 布线, 并在基板上设置对应的与芯片上的布线连接的布线, 形成布线层, 实现 芯片与基板的电气连接。 此时, 双面板的制作已经完成, 如果需要增层, 便可 以釆取层压技术或者增层法继续制作多层线路。  In this embodiment, the first contact surface and the second contact surface of the chip have pads, which can be on the first contact surface and the second contact surface of the chip by sputtering or copper plating, electroplating, exposure, development, etching, and the like. A wiring is provided, and a corresponding wiring connected to the wiring on the chip is provided on the substrate to form a wiring layer, and electrical connection between the chip and the substrate is realized. At this point, the production of the double-panel has been completed, and if it is necessary to add layers, the lamination technique or the layer-adding method can be used to continue to fabricate the multilayer wiring.
参考图 5 , 所示为实施例的芯片埋入基板的封装方法又一应用实例的工序 步骤示意图, 用于封装不同厚度的多个芯片, 包括以下步骤:  Referring to FIG. 5, there is shown a process step diagram of another application example of a package embedding method of a chip embedded substrate of an embodiment, for packaging a plurality of chips of different thicknesses, including the following steps:
图 5所示为基板 200 A-A面的剖视图,将基板 200从第一金属层 203至介 电层 202开出深度不同的与所需封装的芯片个数相同的凹槽 201;  5 is a cross-sectional view of the substrate 200A-A, the substrate 200 is opened from the first metal layer 203 to the dielectric layer 202 with different depths of the same number of chips as the desired package;
釆用控深铣工艺刻出凹槽, 凹槽的深度与所需埋入的芯片厚度匹配, 可保 证埋入多个芯片时芯片正面的共面性, 凹槽的长度、 宽度的都大于所需埋入芯 片的尺寸, 以使凹槽能足够容纳所需埋入的芯片。  凹槽The groove is carved by the deep milling process. The depth of the groove matches the thickness of the chip to be buried, which ensures the coplanarity of the front side of the chip when multiple chips are buried. The length and width of the groove are larger than The size of the chip needs to be buried so that the recess can accommodate enough of the chip to be buried.
芯片的第一接触面没有焊盘时,凹槽的底面与第二金属层 204相通或不与 第二金属层 204相通; 芯片的第一接触面有焊盘时, 凹槽的底面与第二金属层 204相通, 可保证芯片的第一接触面容易形成电气连接, 当然, 芯片的第一接 触面有焊盘时, 凹槽的底面也可不与第二金属层 204相通, 而是釆用金属导盲 通孔的方式实现芯片第一接触面与基板的电气连接。  When the first contact surface of the chip has no pad, the bottom surface of the groove communicates with the second metal layer 204 or does not communicate with the second metal layer 204; when the first contact surface of the chip has a pad, the bottom surface of the groove and the second The metal layer 204 is connected to ensure that the first contact surface of the chip is easy to form an electrical connection. Of course, when the first contact surface of the chip has a pad, the bottom surface of the groove may not communicate with the second metal layer 204, but the metal is used instead. The method of guiding the blind vias realizes the electrical connection between the first contact surface of the chip and the substrate.
因以下步骤过程同上应用实例的实施过程,因此没有给出以下各步骤的示 意图, 包括:  Since the following steps are the same as the implementation of the application example, the following steps are not given, including:
将具有第一接触面和第二接触面的芯片的第一接触面与第一金属层连接 的方式对应的埋入与其对应的凹槽; Connecting the first contact surface of the chip having the first contact surface and the second contact surface to the first metal layer The way corresponding to the buried groove corresponding thereto;
此步骤与上述的应用例相同,按照实际工艺需求, 可釆取凹槽底面涂覆非 导电粘结材料、直接在凹槽底面形成焊点或先在凹槽底面打出相对应的凹坑再 形成焊点的方式对芯片与基板进行粘结。  This step is the same as the above application example. According to the actual process requirements, the bottom surface of the groove can be coated with a non-conductive bonding material, a solder joint is formed directly on the bottom surface of the groove, or a corresponding pit is formed on the bottom surface of the groove to form a pit. The way of solder joints bonds the chip to the substrate.
可通过溅射或沉铜、 电镀、 曝光、 显影、 蚀刻等技术, 在芯片的第一接触 面和第二接触面设置布线层,并在基板上设置对应的与芯片上的布线层连接的 布线层, 实现芯片与基板的电气连接, 布线层由溅射 Ti/Cu、 沉积 Cu、 电镀 Cu或其它导电金属组成。  A wiring layer may be disposed on the first contact surface and the second contact surface of the chip by sputtering or copper plating, electroplating, exposure, development, etching, etc., and a corresponding wiring connected to the wiring layer on the chip may be disposed on the substrate The layer is used to electrically connect the chip to the substrate. The wiring layer is composed of sputtered Ti/Cu, deposited Cu, electroplated Cu or other conductive metal.
实施例二  Embodiment 2
参考图 6, 所示为芯片埋入基板的封装方法又一实施例的流程示意图, 芯 片具有第一接触面和第二接触面, 包括以下步骤:  Referring to FIG. 6, there is shown a flow chart of still another embodiment of a method of packaging a chip embedded in a substrate. The chip has a first contact surface and a second contact surface, and includes the following steps:
S601 , 将基板开至少一个通孔, 通孔的数目与所需封装芯片的数目相同, 通孔贯通基板;  S601, the substrate is opened at least one through hole, the number of the through holes is the same as the number of required packaged chips, and the through holes penetrate the substrate;
其中, 基板可以为单面板, 双面板或多层板。  The substrate may be a single panel, a double panel or a multilayer panel.
S602, 取厚铜箔蚀刻出与通孔位置分布一致的凸部;  S602, taking a thick copper foil to etch a convex portion consistent with the position distribution of the through hole;
5603 ,将基板和厚铜箔通过绝缘介质层进行层压连接,通孔与凸部形成凹 槽, 凹槽的深度与所需埋入的芯片厚度匹配, 当该基板需埋设有多个不同厚度 芯片的时候, 用于保证不同厚度的芯片封装入该基板后保持共面;  5603, the substrate and the thick copper foil are laminated and connected through the insulating dielectric layer, the through hole and the convex portion form a groove, and the depth of the groove matches the thickness of the chip to be buried, when the substrate needs to be embedded with a plurality of different thicknesses When the chip is used, it is used to ensure that chips of different thicknesses are packaged into the substrate and remain coplanar;
5604, 将芯片埋入凹槽;  5604, embedding the chip into the recess;
S605 , 在芯片的第一接触面和 /或第二接触面设置布线, 以及基板上对应 设置布线, 形成布线层, 使得基板和芯片之间电气连接。  S605, a wiring is disposed on the first contact surface and/or the second contact surface of the chip, and a wiring is disposed on the substrate, and a wiring layer is formed to electrically connect the substrate and the chip.
以下结合图 7a至图 7e对本实施例的具体应用实例作更详细的说明。  The specific application examples of this embodiment will be described in more detail below with reference to Figs. 7a to 7e.
参考图 7a至图 7c, 所示为工序封装步骤示意图, 本实施例提供的一 种芯片埋入基板的封装方法, 用于封装不同厚度的多个芯片, 包括以下步 骤: 图 7a, 将基板 300开出与所需封装的芯片个数相同的通孔 301 , 通孔 贯通第一金属层 303、 介电层 302和第二金属层 304; 图 7b, 取厚铜箔 305蚀刻出与通孔位置分布一致的凸部; 其中凸部的高度根据芯片的厚度进行设计,凸部的高度与芯片厚度成 反比例关系。 图 7c, 将基板 300和厚铜箔 305通过绝缘介质层 306进行层压连接, 通孔 301与凸部形成凹槽; 凹槽的深度与所需埋入的芯片厚度匹配,当该基板需埋设有多个厚度 不同的芯片的时候,保证不同厚度的芯片封装入该基板后保持共面, 凹槽 的长度、 宽度的都大于所需埋入芯片的尺寸, 以使凹槽能足够容纳所需埋 入的芯片。 将具有第一接触面和第二接触面的芯片的第一接触面与第一金属层 连接, 埋入与芯片对应的凹槽; 在芯片的第一接触面和第二接触面设置,以及基板上对应设置形成布 线层, 用于实现基板与芯片的电气连接。 Referring to FIG. 7a to FIG. 7c, a schematic diagram of a process packaging step is shown. The method for packaging a chip embedded in a substrate for packaging a plurality of chips of different thicknesses includes the following steps: FIG. 7a Opening the same number of through holes 301 as the desired package, the through holes penetrating through the first metal layer 303, the dielectric layer 302 and the second metal layer 304; FIG. 7b, taking the thick copper foil 305 to etch and the via position a uniformly distributed convex portion; wherein the height of the convex portion is designed according to the thickness of the chip, and the height of the convex portion is equal to the thickness of the chip Anti-proportional relationship. 7c, the substrate 300 and the thick copper foil 305 are laminated and connected through the insulating dielectric layer 306, and the through hole 301 and the convex portion form a groove; the depth of the groove matches the thickness of the chip to be buried, when the substrate needs to be buried When there are multiple chips with different thicknesses, the chips of different thicknesses are ensured to be coplanar after being encapsulated into the substrate, and the length and width of the grooves are larger than the size of the embedded chip, so that the grooves can be sufficiently accommodated. Buried chip. Connecting a first contact surface of the chip having the first contact surface and the second contact surface to the first metal layer, embedding a recess corresponding to the chip; disposing on the first contact surface and the second contact surface of the chip, and the substrate The corresponding arrangement is formed to form a wiring layer for realizing electrical connection between the substrate and the chip.
上述两步骤与前述应用实例的实施方式相同, 所以没有图示出,按照 实际工艺需求, 可釆取凹槽底面涂覆非导电粘结材料、直接在凹槽底面形 成焊点或先在凹槽底面打出相对应的凹坑再形成焊点的方式对芯片与基 板进行粘结, 再根据需要实现基板和芯片之间的电气连接。 实施例三 图 8所示为芯片埋入基板的封装方法又一实施例的流程示意图,芯片 具有第一接触面和第二接触面, 包括以下步骤:  The above two steps are the same as the embodiment of the foregoing application example, so there is no illustration. According to the actual process requirements, the bottom surface of the groove can be coated with a non-conductive bonding material, and a solder joint can be directly formed on the bottom surface of the groove or first in the groove. The chip and the substrate are bonded in such a manner that the bottom surface is formed by corresponding pits and then solder joints are formed, and electrical connection between the substrate and the chip is realized as needed. Embodiment 3 FIG. 8 is a schematic flow chart of still another embodiment of a method for packaging a chip embedded in a substrate. The chip has a first contact surface and a second contact surface, and includes the following steps:
5801 ,将基板开至少一个通孔,通孔的数目与所需封装芯片的数目相 同; 5801, the substrate is opened with at least one through hole, and the number of the through holes is the same as the number of required packaged chips;
5802, 在第二金属层所在面涂覆一层感光材料, 形成感光材料层;  5802, coating a surface of the second metal layer with a photosensitive material to form a photosensitive material layer;
5803 , 将芯片的第二接触面与感光材料层连接, 使得芯片埋入通孔; 5803, connecting the second contact surface of the chip to the photosensitive material layer, so that the chip is buried in the through hole;
5804, 将芯片与通孔存在的间隙中填入粘结材料, 用于固定芯片; 5804, filling a gap between the chip and the through hole into the bonding material for fixing the chip;
5805 , 去除感光材料层; 5805, removing the photosensitive material layer;
5806, 在第一接触面印刷导电浆料; 5806, printing a conductive paste on the first contact surface;
5807, 在芯片的第一接触面和 /或第二接触面设置布线, 以及基板上 对应设置布线, 形成布线层, 使得所述基板和所述芯片之间电气连接。 以下结合图 9a至图 9d对上述步骤作进一步的说明,所示为芯片埋入 基板的封装方法又一实施例的具体应用实例工序步骤示意图,本实施例提 供的一种芯片埋入基板的封装方法, 包括以下步骤: 图 9a, 基板 400开出与所需封装的芯片个数相同的通孔 401 , 通孔5807, providing wiring on the first contact surface and/or the second contact surface of the chip, and on the substrate Corresponding to the provision of wiring, a wiring layer is formed to electrically connect the substrate and the chip. The following steps are further described in conjunction with FIG. 9a to FIG. 9d, which are schematic diagrams showing specific steps of a specific application example of a method for packaging a chip embedded in a substrate, and a chip embedded in a substrate package provided in this embodiment. The method includes the following steps: In FIG. 9a, the substrate 400 is opened with the same number of through holes 401 as the required package, and the through hole
401贯通第一金属层 403、 介电层 402和第二金属层 404; 401 through the first metal layer 403, the dielectric layer 402 and the second metal layer 404;
图 9b, 在第二金属层 404所在面粘接一层 UV膜 405 , UV膜是一种 具有粘接作用的膜状物质, 在 UV光照射后失去粘性;  Figure 9b, a UV film 405 is adhered on the surface of the second metal layer 404. The UV film is a film-like substance having a bonding effect, and loses viscosity after UV light irradiation;
图 9c, 将芯片 406的第二接触面与 UV膜 405粘结;  Figure 9c, bonding the second contact surface of the chip 406 to the UV film 405;
通过共面的 UV膜和不同厚度芯片的第二接触面之间的粘结,可保证 不同厚度芯片的共面性。  The coplanarity of the chips of different thicknesses can be ensured by the adhesion between the coplanar UV film and the second contact surface of the chips of different thicknesses.
图 9d, 将芯片 406与通孔 401之间的间隙中填入粘结材料, 形成填 充粘结材料层 407, 用于固定芯片 406; 粘结材料层 407为感光树脂或其它粘结材料,粘结材料的导热导电或 导热非导电, 根据电气连接需要而定。  9d, the gap between the chip 406 and the through hole 401 is filled with a bonding material to form a filling adhesive layer 407 for fixing the chip 406; the bonding material layer 407 is a photosensitive resin or other bonding material, and is adhered. The junction material is thermally conductive or thermally non-conductive, depending on the electrical connection needs.
填充粘结材料层 407与芯片 406固定后, 去除 UV膜 405;  After the filling adhesive material layer 407 is fixed to the chip 406, the UV film 405 is removed;
在芯片第二接触面印刷感光树脂; 在芯片的第一接触面和 /或第二接触面设置, 以及基板上对应设置形 成布线层, 使得基板与芯片之间电气连接。  The photosensitive resin is printed on the second contact surface of the chip; the first contact surface and/or the second contact surface of the chip are disposed, and a corresponding wiring layer is formed on the substrate to electrically connect the substrate to the chip.
以上工序步骤中和上述应用实施例相同的步骤, 在此不再赘述。 以下详细说明芯片埋入基板的封装结构。  The same steps in the above process steps as those in the above application examples are not described herein. The package structure in which the chip is buried in the substrate will be described in detail below.
一种芯片埋入基板的封装结构包括基板、 芯片和布线层,基板设置有 至少一个芯片埋入部, 芯片具有第一接触面和第二接触面, 芯片埋入部为 通孔或凹槽, 芯片埋入部的深度与对应埋入的芯片的厚度匹配, 布线层包 括布设在芯片第一接触面和 /或第二接触面的布线, 以及基板上对应芯片 的布线而布设的用于实现芯片与基板之间电气连接的布线。 对于芯片埋入部为通孔和 /或凹槽, 在不同的应用实施例中, 至少一 个芯片埋入部可以都为凹槽或通孔,也可以凹槽和通孔都有。其中基板可 以为单面板,双面板或是已经加工好内层线路的多层板, 实施例中为了更 直观的表述, 以双面板为例对芯片埋入基板封装结构进行详述。 以下将对芯片埋入基板封装结构的具体应用实例作更详细的说明,可 以理解的是, 以下实施例中相对应的各结构可以结合使用。 实施例四 参考图 10, 所示为芯片埋入基板的封装结构一实施例的结构示意图, 一种芯片埋入基板的封装结构, 包括: 基板, 具有第一金属层 101、 介电层 100和第二金属层 102; A package structure of a chip embedded in a substrate includes a substrate, a chip and a wiring layer, the substrate is provided with at least one chip embedding portion, the chip has a first contact surface and a second contact surface, and the chip embedding portion is a through hole or a groove, and the chip is buried The depth of the entrance portion is matched with the thickness of the corresponding embedded chip, and the wiring layer includes a wiring disposed on the first contact surface and/or the second contact surface of the chip, and a wiring disposed on the substrate corresponding to the chip for realizing the chip and the substrate Wiring for electrical connections. For the chip embedding portion, the through hole and/or the recess, in different application embodiments, at least one of the chip embedding portions may be a groove or a through hole, or may be a groove and a through hole. The substrate may be a single-panel, a double-panel or a multi-layered board that has been processed with an inner layer. In the embodiment, for a more intuitive expression, the dual-panel is taken as an example to describe the embedded substrate package structure. A specific application example of the chip-embedded substrate package structure will be described in more detail below. It can be understood that the corresponding structures in the following embodiments can be used in combination. Embodiment 4 Referring to FIG. 10, a schematic structural view of an embodiment of a package structure in which a chip is embedded in a substrate is shown. A package structure in which a chip is embedded in a substrate includes: a substrate having a first metal layer 101, a dielectric layer 100, and a second metal layer 102;
凹槽, 从基板的第一金属层 101至介电层 100开槽形成; 凹槽的深度与所需埋入的芯片厚度匹配,可保证埋入多个芯片时芯片 共面性, 凹槽的长度、 宽度的都大于所需埋入芯片的尺寸, 以使凹槽能足 够容纳所需埋入的芯片。 芯片 107, 具有第一接触面和第二接触面, 通过设置于凹槽底面的焊 点 103将芯片的第一接触面与凹槽底面连接, 芯片初步埋入凹槽, 为了使 得芯片与凹槽的固定效果更好,凹槽与芯片四周的孔隙 109填入感光材料 或使用其他的绝缘填充材料进行填充;  The groove is formed by slotting the first metal layer 101 of the substrate to the dielectric layer 100; the depth of the groove is matched with the thickness of the chip to be buried, and the chip is coplanar when the plurality of chips are buried, and the groove is Both the length and the width are larger than the size of the desired embedded chip so that the recess can accommodate the chip to be buried. The chip 107 has a first contact surface and a second contact surface. The first contact surface of the chip is connected to the bottom surface of the recess through the solder joint 103 disposed on the bottom surface of the recess, and the chip is initially buried in the recess, so that the chip and the recess are The fixing effect is better, and the groove 109 and the pores 109 around the chip are filled with the photosensitive material or filled with other insulating filling materials;
布线层,在芯片的第一接触面和第二接触面设置布线, 以及基板上对 应设置布线形成,使得基板与芯片之间电气连接。接着进行增层线路的制 作, 绝缘介质层 110, 线路层 111由溅射铜或沉积铜、 电镀铜等生成, 或 者也可以由其他导电金属组成。 实施例五 芯片埋入基板的封装结构的又一实施例的结构包括: 基板; 开设于基板的至少一个凹槽, 凹槽的深度与所需埋入的芯片厚度匹 配, 当基板需埋入多个不同厚度的芯片时,保证不同厚度的芯片封装入该 基板的凹槽后共面, 凹槽的长度、 宽度的都大于所需埋入芯片的尺寸, 以 使凹槽能足够容纳所需埋入的芯片; 至少一个芯片, 芯片具有第一接触面和第二接触面, 芯片埋设于对应 的凹槽; 布线层, 在芯片的第一接触面和 /或第二接触面设置布线, 以及基板 上对应设置布线形成, 使得基板和芯片之间电气连接。 基板可以为单面板、 双面板或多面板, 芯片第一接触面没有焊盘时, 釆用非导电粘结材料在凹槽底面形成粘结层,通过粘结层将第一接触面和 凹槽底面连接。 芯片第二接触面有焊盘时,在第二接触面焊盘釆用导电粘 结材料形成与焊盘对应的焊点, 通过焊点将第一接触面和凹槽底面连接, 或者在第二金属层蚀刻与第二接触面焊盘对应的凹坑,再在凹坑中植入锡 球或点上导电粘结材料形成焊点, 通过焊点将第二接触面和凹槽底面连 接, 再通过金属盲孔的方式连接布线层和第二接触面焊点。 如图 11所示, 芯片埋入基板封装结构包括: 基板, 其进一步包括绝缘层 300, 第二金属层形成的线路 301 , 第一 金属层层压绝缘介质或以其它形式涂布的绝缘介质 303之后,再经曝光显 影和通过溅射、 化学沉积、 电镀、 蚀刻等工序后形成的导通线路 302, 线 路 301和线路 302由第一金属层、 溅射 Ti/Cu或其它金属、 化学铜、 电镀 铜等组成; 因需要埋入的芯片具有不同的厚度,开设于基板的四个凹槽具有与所 需埋入的芯片匹配的深度,凹槽对应的埋入单面导通芯片 306或双面导通 芯片 308, 凹槽与芯片之间的间隙用底部填充料 304进行填充。 为了实现 双面导通芯片的与凹槽底面的接触面与线路 301的连接,可通过设置焊点 309和导盲通孔 310与线路 301连通, 或者通过芯片 308的焊点直接与线 路 301连通。通过设置导通孔 307实现了线路 301和线路 302之间的电连 接。 通过以上封装结构可以看出, 凹槽的深度与所需埋入的芯片厚度匹 配, 当基板需埋入多个不同厚度的芯片时,保证不同厚度的芯片封装入该 基板的凹槽后共面,且能方便的实现芯片的单面与基板的电气连接或双面 同时与基板的电气连接。 The wiring layer is provided with wirings on the first contact surface and the second contact surface of the chip, and corresponding wirings are formed on the substrate such that the substrate and the chip are electrically connected. Next, the build-up line is formed. The insulating dielectric layer 110 is formed of sputtered copper or deposited copper, electroplated copper, or the like, or may be composed of other conductive metals. The structure of the fifth embodiment of the package structure of the chip embedded substrate includes: a substrate; at least one groove formed in the substrate, the depth of the groove is matched with the thickness of the chip to be buried, and the substrate needs to be buried more When chips of different thicknesses are ensured, chips of different thicknesses are packaged into the chip. The groove of the substrate is coplanar, the length and the width of the groove are larger than the size of the desired embedded chip, so that the groove can be enough to accommodate the chip to be buried; at least one chip, the chip has a first contact surface and The second contact surface is embedded in the corresponding recess; the wiring layer is provided with wiring on the first contact surface and/or the second contact surface of the chip, and the corresponding wiring is formed on the substrate, so that the substrate and the chip are electrically connected. The substrate may be a single panel, a double panel or a multi-panel. When the first contact surface of the chip has no pad, the non-conductive bonding material forms a bonding layer on the bottom surface of the groove, and the first contact surface and the groove are formed by the bonding layer. The bottom is connected. When the second contact surface of the chip has a pad, the second contact surface pad is formed with a conductive bonding material to form a solder joint corresponding to the pad, and the first contact surface and the bottom surface of the groove are connected by the solder joint, or in the second The metal layer etches the pit corresponding to the second contact surface pad, and then implants a solder ball or a conductive bonding material on the pit to form a solder joint, and connects the second contact surface and the bottom surface of the recess through the solder joint, and then The wiring layer and the second contact surface solder joint are connected by a metal blind hole. As shown in FIG. 11, the chip-embedded substrate package structure includes: a substrate further comprising an insulating layer 300, a line 301 formed by the second metal layer, a first metal layer laminated insulating medium or an insulating medium 303 coated in other forms. Thereafter, after exposure development and conduction through a process such as sputtering, chemical deposition, electroplating, etching, etc., the line 301 and the line 302 are made of a first metal layer, sputtered Ti/Cu or other metal, chemical copper, Electroplated copper and the like; because the chips to be buried have different thicknesses, the four grooves opened on the substrate have a depth matching the chip to be buried, and the groove corresponds to the buried single-sided conduction chip 306 or double The surface conduction chip 308, the gap between the groove and the chip is filled with the underfill 304. In order to realize the connection between the contact surface of the double-sided conductive chip and the bottom surface of the recess and the line 301, the solder joint 309 and the via blind via 310 may be connected to the line 301, or the solder joint of the chip 308 may be directly connected to the line 301. . The electrical connection between line 301 and line 302 is achieved by providing vias 307. It can be seen from the above package structure that the depth of the groove matches the thickness of the chip to be buried. When the substrate needs to be embedded with a plurality of chips of different thicknesses, the chips of different thicknesses are ensured. The grooves of the substrate are coplanar, and the electrical connection between the single side of the chip and the substrate or the electrical connection of the both sides to the substrate can be conveniently realized.
实施例六 一种芯片埋入基板的封装结构, 其特征在于, 芯片埋入基板的封装结 构包括: 基板, 基板具有与所需封装芯片个数相同的通孔; 铜箔,铜箔具有与通孔位置分布一致的凸部, 凸部的高度与芯片厚度 成反比关系; 绝缘介质层, 用于连接基板和铜箔, 以使通孔和凸部嵌合形成凹槽, 凹槽的深度与所需埋入的芯片厚度匹配,当基板需埋入多个不同厚度的芯 片时, 保证不同厚度的芯片封装入该基板的凹槽后共面, 凹槽的长度、 宽 度的都大于所需埋入芯片的尺寸, 以使凹槽能足够容纳所需埋入的芯片; 至少一个芯片, 芯片具有第一接触面和第二接触面, 釆用第一接触面 与凹槽底面连接的方式将芯片埋入凹槽; 布线层, 在芯片的第一接触面和 /或第二接触面设置布线, 以及基板 上对应设置布线形成, 使得所述基板和所述芯片之间电气连接。 基板可以为单面板、 双面板或多面板, 芯片第一接触面没有焊盘时, 釆用非导电粘结材料在凹槽底面形成粘结层,通过粘结层将第一接触面和 凹槽底面连接。 芯片第二接触面有焊盘时,在第二接触面焊盘釆用导电粘 结材料形成与焊盘对应的焊点, 通过焊点将第一接触面和凹槽底面连接, 或者在第二金属层蚀刻与第二接触面焊盘对应的凹坑,再在凹坑中植入锡 球或点上导电粘结材料形成焊点, 通过焊点将第二接触面和凹槽底面连 接, 再通过金属盲孔的方式连接布线层和第二接触面焊点。 如图 12所示, 芯片埋入基板封装结构包括: 基板, 进一步包括绝缘层 300, 第二金属层形成的线路 301 , 第一金 属层层压绝缘介质或以其它形式涂布的绝缘介质 303之后,再经曝光显影 和通过溅射、 化学沉积、 电镀、 蚀刻等工序后形成的导通线路 302, 线路 301和线路 302由第一金属层、 溅射 Ti/Cu或其它金属、 化学铜、 电镀铜 等组成; 因需要埋入的芯片具有不同的厚度,开设于基板的四个凹槽具有与所 需埋入的芯片匹配的深度匹配,对应的埋入单面导通芯片 306或双面导通 导通芯片的与凹槽底面的接触面与线路 301的连接,通过设置导电粘结材 料层 308和厚铜箔形成的线路 309与线路 301连通, 通过设置导通孔 307 实现线路 301和线路 302之间的电连接,通过设置导通盲孔 310实现线路 层 301与外部连接。 The package structure of the chip embedded in the substrate is characterized in that: the package structure of the chip embedded in the substrate comprises: a substrate having a same number of through holes as the required packaged chip; the copper foil and the copper foil have a pass a convex portion having a uniform hole position distribution, the height of the convex portion being inversely proportional to the thickness of the chip; an insulating dielectric layer for connecting the substrate and the copper foil, so that the through hole and the convex portion are fitted to form a groove, and the depth of the groove is The thickness of the chip to be embedded is matched. When the substrate needs to be embedded with a plurality of chips of different thicknesses, the chips of different thicknesses are ensured to be coplanar after being recessed into the groove of the substrate, and the length and width of the groove are larger than required. The chip is sized such that the recess is sufficient to accommodate the chip to be buried; at least one chip having a first contact surface and a second contact surface, and the chip is buried by connecting the first contact surface to the bottom surface of the recess a wiring layer, a wiring disposed on the first contact surface and/or the second contact surface of the chip, and a corresponding wiring formed on the substrate, such that the substrate and the chip are electrically connected . The substrate may be a single panel, a double panel or a multi-panel. When the first contact surface of the chip has no pad, the non-conductive bonding material forms a bonding layer on the bottom surface of the groove, and the first contact surface and the groove are formed by the bonding layer. The bottom is connected. When the second contact surface of the chip has a pad, the second contact surface pad is formed with a conductive bonding material to form a solder joint corresponding to the pad, and the first contact surface and the bottom surface of the groove are connected by the solder joint, or in the second The metal layer etches the pit corresponding to the second contact surface pad, and then implants a solder ball or a conductive bonding material on the pit to form a solder joint, and connects the second contact surface and the bottom surface of the recess through the solder joint, and then The wiring layer and the second contact surface solder joint are connected by a metal blind hole. As shown in FIG. 12, the chip-embedded substrate package structure includes: a substrate, further including an insulating layer 300, a line 301 formed by the second metal layer, a first metal layer laminated insulating medium or an insulating medium 303 coated in other forms. , through exposure development and through the sputtering, chemical deposition, electroplating, etching and other processes formed after the conduction line 302, the line 301 and line 302 are composed of a first metal layer, sputtered Ti/Cu or other metal, chemical copper, electroplated copper, etc.; since the chips to be buried have different thicknesses, the four grooves opened on the substrate have and are required The buried chip matching depth matching, the corresponding buried single-sided conducting chip 306 or the double-sided conductive via chip is connected to the line 301 by the contact surface of the groove bottom surface, by providing the conductive bonding material layer 308 and The line 309 formed by the thick copper foil is in communication with the line 301, and the electrical connection between the line 301 and the line 302 is realized by providing the via hole 307, and the wiring layer 301 is connected to the outside by providing the conduction blind hole 310.
通过以上封装结构可以看出, 凹槽的深度与所需埋入的芯片厚度匹 配, 当基板需埋入多个不同厚度的芯片时,保证不同厚度的芯片封装入该 基板的凹槽后共面,且能方便的实现芯片的单面与基板的电气连接或双面 同时与基板的电气连接。  It can be seen from the above package structure that the depth of the groove matches the thickness of the chip to be buried. When the substrate needs to be embedded with a plurality of chips of different thicknesses, the chip of different thickness is packaged into the groove of the substrate and is coplanar. Moreover, the electrical connection between the single side of the chip and the substrate or the electrical connection of both sides to the substrate can be conveniently realized.
以上对本发明所提供的芯片埋入基板封装方法及其结构进行了详细 介绍, 对于本领域的一般技术人员, 依据本发明实施例的思想, 在具体实 施方式及应用范围上均会有改变之处, 综上所述, 本说明书内容不应理解 为对本发明的限制。  The chip-embedded substrate encapsulation method and the structure thereof provided by the present invention are described in detail above. For those skilled in the art, according to the idea of the embodiment of the present invention, there are some changes in the specific implementation manner and application range. In conclusion, the contents of this specification are not to be construed as limiting the invention.

Claims

权 利 要 求 Rights request
1、 一种芯片埋入基板的封装方法, 其特征在于, 所述芯片具有第一接触 面和第二接触面, 包括以下步骤:  A method of packaging a chip embedded in a substrate, wherein the chip has a first contact surface and a second contact surface, and the method comprises the following steps:
步骤 S1 : 在所述基板设置至少一个芯片埋入部, 所述芯片埋入部为通孔 和 /或凹槽, 所述芯片埋入部的数目与所需封装芯片的数目相同, 所述芯片埋 入部的深度与所需封装的芯片厚度匹配;  Step S1: at least one chip embedding portion is disposed on the substrate, the chip embedding portion is a through hole and/or a groove, and the number of the chip embedding portion is the same as the number of required packaged chips, and the chip embedding portion is The depth matches the chip thickness of the desired package;
步骤 S2: 将所述芯片埋入所述芯片埋入部;  Step S2: embedding the chip into the chip embedding portion;
步骤 S3 : 在芯片的第一接触面和 /或第二接触面布线, 以及基板上对应布 线, 形成布线层, 使得所述基板和所述芯片之间电气连接。  Step S3: a wiring layer is formed on the first contact surface and/or the second contact surface of the chip, and the corresponding wiring on the substrate, so that the substrate and the chip are electrically connected.
2、 根据权利要求 1所述的芯片埋入基板的封装方法, 其特征在于, 所需 封装的芯片具有不同的厚度。  2. The method of packaging a chip embedded substrate according to claim 1, wherein the chips to be packaged have different thicknesses.
3、 根据权利要求 1所述的芯片埋入基板的封装方法, 其特征在于, 步骤 S1中形成所述凹槽的具体过程为:  The method of encapsulating a chip embedded substrate according to claim 1, wherein the specific process of forming the groove in step S1 is:
取厚铜箔蚀刻出与所述通孔位置分布一致的凸部;  Taking a thick copper foil to etch a convex portion consistent with the position distribution of the through hole;
将所述基板和厚铜箔通过绝缘介质层进行层压连接,所述凸部与所述通孔 嵌合形成所述凹槽;  Laminating the substrate and the thick copper foil through an insulating dielectric layer, the convex portion being fitted into the through hole to form the groove;
或直接于基板开设所述凹槽。  Or opening the groove directly to the substrate.
4、 根据权利要求 1所述的芯片埋入基板的封装方法, 其特征在于, 将所 述芯片埋入所述凹槽的具体过程为:  4. The method of packaging a chip embedded substrate according to claim 1, wherein the specific process of embedding the chip in the recess is:
将非导电粘结材料涂覆于所述凹槽底面, 形成粘结层;  Applying a non-conductive bonding material to the bottom surface of the groove to form a bonding layer;
将所述芯片第一接触面与所述粘结层对接粘结,使得所述芯片埋入所述凹 槽。  The first contact surface of the chip is butt bonded to the bonding layer such that the chip is buried in the recess.
5、 根据权利要求 1所述的芯片埋入基板的封装方法, 其特征在于, 将所 述芯片埋入所述凹槽的具体过程为:  5. The method of packaging a chip embedded substrate according to claim 1, wherein the specific process of embedding the chip in the recess is:
将导电粘结材料点在所述凹槽的底面, 在所述凹槽的底面形成焊点; 将所述芯片第一接触面与所述焊点对接粘结, 使得所述芯片埋入所述凹 槽。  Pointing a conductive bonding material on a bottom surface of the recess, forming a solder joint on a bottom surface of the recess; bonding the first contact surface of the chip to the solder joint, such that the chip is buried in the Groove.
6、 根据权利要求 1所述的芯片埋入基板的封装方法, 其特征在于: 将所 述芯片埋入所述凹槽的具体过程为:  6. The method of packaging a chip embedded substrate according to claim 1, wherein: the specific process of embedding the chip in the recess is:
在所述凹槽底面打出凹坑; 在所述凹坑处植入锡球或点上导电粘结材料, 在所述凹坑内形成焊点; 将所述芯片第一接触面与所述焊点对接粘结, 使得所述芯片埋入所述凹 槽。 Pitting a pit on the bottom surface of the groove; Depositing a solder ball or a conductive bonding material at the pit, forming a solder joint in the recess; bonding the first contact surface of the chip to the solder joint, so that the chip is buried The groove.
7、 根据权利要求 1所述的芯片埋入基板的封装方法, 其特征在于, 步骤 S2具体为:  The method of packaging a chip embedded substrate according to claim 1, wherein the step S2 is specifically:
在所述基板的一个表面涂覆感光材料, 形成感光材料层;  Coating a photosensitive material on one surface of the substrate to form a photosensitive material layer;
将所述芯片的第二接触面与所述感光材料层连接,使得所述芯片固定于所 述通孑 L;  Connecting the second contact surface of the chip to the photosensitive material layer, so that the chip is fixed to the overnight L;
在所述芯片与所述通孔之间的间隙中填入用于固定所述芯片的粘结材料; 去除所述感光材料层。  A bonding material for fixing the chip is filled in a gap between the chip and the through hole; and the photosensitive material layer is removed.
8、 一种芯片埋入基板的封装结构, 其特征在于, 所述芯片埋入基板的封 装结构包括基板、 芯片和布线层,  8. A package structure in which a chip is embedded in a substrate, wherein the package structure in which the chip is embedded in the substrate comprises a substrate, a chip, and a wiring layer.
所述基板设置有至少一个芯片埋入部,所述芯片具有第一接触面和第二接 触面, 所述芯片埋入部为通孔和 /或凹槽, 所述芯片埋入部的深度与对应埋入 的芯片的厚度匹配,  The substrate is provided with at least one chip embedding portion, the chip has a first contact surface and a second contact surface, the chip embedding portion is a through hole and/or a groove, and the depth of the chip embedding portion and the corresponding embedding Chip thickness matching,
所述布线层包括布设在所述芯片第一接触面和 /或第二接触面的布线, 以 及基板上对应所述芯片的布线而布设的用于实现所述芯片与基板之间电气连 接的布线。  The wiring layer includes a wiring disposed on the first contact surface and/or the second contact surface of the chip, and a wiring disposed on the substrate corresponding to the wiring of the chip for realizing electrical connection between the chip and the substrate .
9、 根据权利要求 8所述的芯片封装结构, 其特征在于, 还包括铜箔和绝 缘介质层, 所述铜箔具有与所述通孔位置分布一致的凸部, 所述凸部的高度与 所述芯片厚度成反比关系,所述绝缘介质层设置于所述基板和所述铜箔之间以 连接所述基板和所述铜箔, 且所述通孔和所述凸部嵌合形成所述凹槽。  The chip package structure according to claim 8, further comprising a copper foil and an insulating dielectric layer, wherein the copper foil has a convex portion conforming to a position distribution of the through hole, and the height of the convex portion is The thickness of the chip is inversely proportional. The insulating dielectric layer is disposed between the substrate and the copper foil to connect the substrate and the copper foil, and the through hole and the convex portion are formed to be formed. Said groove.
10、 根据权利要求 8所述的芯片封装结构, 其特征在于, 所述至少一个芯 片具有不同的厚度。  10. The chip package structure of claim 8, wherein the at least one chip has a different thickness.
11、 根据权利要求 8所述的芯片埋入基板的封装结构, 其特征在于: 所述 芯片第一接触面没有焊盘时, 釆用非导电粘结材料在所述凹槽底面形成粘结 层, 通过所述粘结层将所述第一接触面和所述凹槽底面连接。  The package structure of the chip embedded substrate according to claim 8, wherein: when the first contact surface of the chip has no pad, the non-conductive bonding material forms a bonding layer on the bottom surface of the groove. And connecting the first contact surface and the bottom surface of the groove by the bonding layer.
12、 根据权利要求 8所述的芯片埋入基板的封装结构, 其特征在于: 所述 芯片第二接触面有焊盘时,在所述第二接触面焊盘釆用导电粘结材料形成与所 述焊盘对应的焊点, 通过所述焊点将所述第一接触面和所述凹槽底面连接, 和 /或 The package structure of the chip embedded substrate according to claim 8, wherein: when the second contact surface of the chip has a pad, the second contact surface pad is formed by using a conductive bonding material a solder joint corresponding to the pad, connecting the first contact surface and the bottom surface of the groove through the solder joint, and / or
在所述第二金属层蚀刻与所述第二接触面焊盘对应的凹坑,再在所述凹坑 中植入锡球或点上导电粘结材料形成焊点 ,通过所述焊点将所述第一接触面和 所述凹槽底面连接。  Etching a pit corresponding to the second contact surface pad in the second metal layer, and then implanting a solder ball or a conductive bonding material on the pit to form a solder joint through the solder joint The first contact surface is connected to the bottom surface of the groove.
PCT/CN2011/079575 2011-09-13 2011-09-13 Encapsulation method for embedding chip into substrate and structure thereof WO2013037102A1 (en)

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