WO2011149090A1 - 倒立顕微鏡 - Google Patents

倒立顕微鏡 Download PDF

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Publication number
WO2011149090A1
WO2011149090A1 PCT/JP2011/062287 JP2011062287W WO2011149090A1 WO 2011149090 A1 WO2011149090 A1 WO 2011149090A1 JP 2011062287 W JP2011062287 W JP 2011062287W WO 2011149090 A1 WO2011149090 A1 WO 2011149090A1
Authority
WO
WIPO (PCT)
Prior art keywords
inverted microscope
stage
objective lens
optical device
microscope
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2011/062287
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English (en)
French (fr)
Japanese (ja)
Inventor
北原　章広
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Olympus Corp
Original Assignee
Olympus Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Olympus Corp filed Critical Olympus Corp
Priority to EP11786787.9A priority Critical patent/EP2579086B1/en
Publication of WO2011149090A1 publication Critical patent/WO2011149090A1/ja
Priority to US13/683,237 priority patent/US8749883B2/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/0004—Microscopes specially adapted for specific applications
    • G02B21/0088—Inverse microscopes
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/241—Devices for focusing
    • G02B21/245—Devices for focusing using auxiliary sources, detectors
    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B21/00—Microscopes
    • G02B21/24—Base structure
    • G02B21/26—Stages; Adjusting means therefor

Definitions

  • the present invention relates to an inverted microscope for observing a specimen to be observed from below.
  • An inverted microscope has been proposed in which an optical device constituting a new optical system can be mounted between the objective lens and the imaging lens.
  • a spacer member can be disposed between a stage and a stage support member that supports the stage so that an optical device can be mounted between the objective lens and the imaging lens. Then, by selecting and arranging a spacer member corresponding to the thickness of the optical device to be newly installed, the stage is raised, and the space provided by the raising is used to provide a space between the objective lens and the coupling lens.
  • a new optical device is mounted (see, for example, Patent Document 1).
  • stage unit in which the stage and the objective lens are unitized, a microscope main body to which the stage unit can be attached and detached, and the microscope main body and the stage unit can be mounted.
  • An inverted microscope provided with an optical device that changes is proposed (for example, see Patent Document 2).
  • the stage is greatly raised because the rigidity of the stage is lowered, and the stage is easily affected by vibration or the like, or is easily affected by heat.
  • the inverted microscope described in Patent Document 2 described above mounts the optical device between the microscope main body and the stage unit, the upper surface and the lower surface of the optical device serve as mounting surfaces, and accuracy such as parallelism and rigidity
  • the optical device cannot be provided at a low cost.
  • the optical device cannot be easily recombined.
  • the present invention has been made in view of the above, and provides an inverted microscope that can be mounted with an optical device on an observation optical system from an objective lens to an eyepiece, and is inexpensive and excellent in rigidity. Objective.
  • the present invention provides a microscope main body, a stage supported by the microscope main body, and an observation optical system for observing a sample placed on the stage from below.
  • the microscope body can be mounted with an optical device between an objective lens and an imaging lens constituting the observation optical system, and a plurality of stage support parts for supporting the stage, And a beam portion that connects the stage support portions that are paired at least in the front-rear direction among the plurality of stage support portions in a mode that is positioned between the imaging lens and the objective lens.
  • the present invention is characterized in that the inverted microscope includes a focusing device that is attached at least partially to the stage support portion or the beam portion and moves the objective lens in the optical axis direction.
  • the present invention is characterized in that, in the inverted microscope, the semi-focus device is an autofocus device that detects reflected light from a sample or a sample container and focuses the objective lens.
  • the present invention is the above inverted microscope, wherein the stage support portion is formed together with the support portion main body and the beam portion, so that the optical axis of the mounted optical device and the optical axis of the objective lens match. And a slide body attached to the support body so as to be slidable.
  • the beam portion has a size that covers the entire upper surface of the mounted optical device, and has an edge protruding upward at least at a part of the outer peripheral portion of the upper surface. It is characterized by that.
  • the present invention is the above inverted microscope, wherein the microscope body has a lower structure to which the coupling lens is attached and the optical device can be mounted, the plurality of stage support portions, and the beam portions. And an upper structure attached to the lower structure so as to be slidably adjustable so that the optical axis of the mounted optical device and the optical axis of the objective lens coincide with each other. And
  • the beam portion has a size that covers the entire upper surface of the mounted optical device, and has an edge protruding upward at least at a part of the outer peripheral portion of the upper surface. It is characterized by that.
  • the microscope main body of the inverted microscope according to the present invention can be equipped with an optical device between the objective lens and the imaging lens constituting the observation optical system, and has a plurality of stage support portions for supporting the stage, and the imaging lens Observation beam extending from the objective lens to the eyepiece because it has a beam portion that interconnects the stage support portions that are paired at least before and after the plurality of stage support portions. It is possible to provide an inverted microscope that can be equipped with an optical device in the system and is inexpensive and excellent in rigidity.
  • the stage support part of the inverted microscope according to the present invention has a support part main body and a slide part that is formed together with the beam part and is attached to the support part main body so that the slide can be adjusted. Adjustment can be made so that the optical axis of the objective lens coincides.
  • FIG. 1 is a conceptual perspective view showing an inverted microscope according to Embodiment 1 of the present invention.
  • FIG. 2 is a cross-sectional view showing the internal structure of the inverted microscope shown in FIG.
  • FIG. 3A is a conceptual perspective view showing the inverted microscope according to the second embodiment of the present invention, and shows a state where the upper structure is slid forward.
  • FIG. 3-2 is a conceptual perspective view showing the inverted microscope according to the second embodiment of the present invention, and shows a state in which the upper structure is slid rearwardly.
  • 4 is a cross-sectional view showing the internal structure of the inverted microscope shown in FIG.
  • FIG. 5 is an exploded perspective view showing the structure of the inverted microscope shown in FIG. FIG.
  • FIG. 6 is an explanatory diagram for explaining the reason why the optical axis is shifted.
  • FIG. 7 is a conceptual perspective view showing an inverted microscope according to Embodiment 3 of the present invention.
  • FIG. 8 is an exploded perspective view showing the structure of the inverted microscope shown in FIG.
  • FIG. 9 is a conceptual perspective view showing an inverted microscope according to the fourth embodiment of the present invention.
  • FIG. 1 is a conceptual perspective view showing an inverted microscope according to Embodiment 1 of the present invention
  • FIG. 2 is a cross-sectional view showing an internal structure of the inverted microscope shown in FIG.
  • the inverted microscope is a microscope for observing a sample to be observed from below, and includes a microscope main body 1, a stage 2 supported by the microscope main body 1, and a stage 2. And an observation optical system 3 for observing the placed sample from below.
  • the microscope main body 1 has a box shape, and includes a base 1a extending in the front-rear direction, a rear wall 1b extending upward from the rear edge of the base 1a, and a front wall 1c extending upward from the front edge of the base 1a. And a beam portion 1d that interconnects the upper portion of the rear wall portion 1b and the upper portion of the front wall portion 1c.
  • a mounting region for the optical device 4 is defined in the lower region of the beam portion 1d, and a mounting region for the objective lens 31 (see FIG. 2) is defined in the upper region.
  • Three fitting grooves 1b1 and 1c1 are formed in the vertical direction on the inner side of the rear wall 1b and the inner side of the front wall 1c that define the mounting region.
  • the pair of fitting grooves 1b1 and 1c1 are for mounting the optical device 4 and extend in the left-right direction, and a prismatic convex portion 4a provided in the optical device 4 can be fitted therein.
  • the projections 4 a provided on the optical device 4 are guided in the fitting grooves 1 b 1 and 1 c 1, and the optical device 4 is mounted on the microscope body 1.
  • the mounted optical device 4 is positioned and fixed by the convex portion 4a and the fitting grooves 1b1 and 1c1.
  • fitting holes 1b2 communicating with each of the above-described three fitting grooves 1b1 are formed in the rear wall 1b side by side in the vertical direction.
  • the fitting hole 1b2 is for mounting the light source 5, and a cylindrical convex portion 5a provided in the light source 5 can be fitted therein.
  • a convex portion 5 a provided in the light source 5 is guided in the fitting hole 1 b 2, and the light source 5 is attached to the microscope body 1.
  • the mounted light source 5 is positioned and fixed by the convex portion 5a and the fitting hole 1b2.
  • the revolver 6 and the semi-focusing device 7 are attached to the upper surface of the beam portion 1d that defines the attachment area.
  • the revolver 6 is rotatable and can be raised and lowered, and a plurality of objective lenses 31 can be attached thereto.
  • One objective lens 31 among the objective lenses 31 attached to the revolver 6 is arranged on the optical axis.
  • the semi-focus device 7 is for focusing the objective lens 31 on the sample. By operating the semi-focus device 7, the revolver 6 moves up and down, and the focus of the objective lens 31 mounted on the revolver 6 focuses on the sample. To do.
  • the upper surface 1b3 of the rear wall portion 1b and the upper surface 1c3 of the front wall portion 1c constitute the same plane extending in the horizontal direction, and the stage 2 is the upper surface of the rear wall portion 1b. 1b3 and the upper surface 1c3 of the front wall 1c are attached and supported.
  • the stage 2 is a plate-like body whose upper surface and lower surface are flat, and a sample is placed on the upper surface.
  • an opening (through hole) 2a is provided at almost the center of the stage 2 so that the sample does not fall, and the observation light passes therethrough.
  • the observation optical system 3 enables observation of a sample, and is provided across the microscope body 1 and the lens barrel 8 attached to the microscope body 1.
  • the observation optical system 3 has an imaging lens 32, a mirror 33, a relay lens 34, an imaging lens 35, and an eyepiece lens 36.
  • the imaging lens 32, the mirror 33, and the relay lens 34 are attached to the inside of the microscope body 1, and the observation light that has become a parallel light beam by passing through the objective lens 31 is connected by passing through the imaging lens 32.
  • the image is incident on the lens barrel 8 via the mirror 33 and the relay lens 34.
  • the imaging lens 35 and the eyepiece lens 36 are attached to the inside of the lens barrel 8, and the observation light incident from the microscope main body 1 is imaged by passing through the imaging lens 35 and looking into the eyepiece lens 36. Observed.
  • the inverted microscope shown in FIGS. 1 and 2 includes a transmission illumination device 9.
  • the transmitted illumination device 9 is attached to the upper area of the microscope body 1.
  • the transmitted illumination device 9 includes a support column 91, a light source 92 attached to the support column 91, a light projecting device 93 attached to the support column 91, and a condenser lens 94 attached to the support column 91.
  • the convex portion 4a provided in the optical device 4 is inserted into the fitting grooves 1b1 and 1c1 provided in the microscope main body 1. .
  • the convex portion 4 a provided in the optical device 4 is guided by fitting grooves 1 b 1 and 1 c 1 provided in the microscope main body 1, and the optical device 4 is attached to the microscope main body 1.
  • the mounted optical device 4 is positioned and fixed by the convex portion 4a and the fitting grooves 1b1 and 1c1.
  • the convex portion 5 a provided in the light source 5 is inserted into the fitting hole 1 b 2 provided in the microscope body 1.
  • the convex portion 5 a provided in the light source 5 is guided by a fitting hole 1 b 2 provided in the microscope main body 1, and the light source 5 is attached to the microscope main body 1.
  • the mounted light source 5 is positioned and fixed by the convex portion 5a and the fitting hole 1b2.
  • the microscope main body 1 of the inverted microscope according to the first embodiment described above has the beam portion 1d that connects the upper portion of the rear wall portion 1b and the upper portion of the front wall portion 1c, and the optical device 4 in the lower region of the beam portion 1d.
  • the mounting area of the objective lens 31 is defined in the upper area. Therefore, the beam portion 1d is located between the imaging lens 32 and the objective lens 31, and connects the rear wall portion 1b and the front wall portion 1c which are paired in the front and rear directions, so that the microscope body 1 is rigid. It will be excellent.
  • the semi-focusing device 7 is disposed in the vicinity of the stage 2 regardless of the number of the optical devices 4 mounted, the size can be reduced and the rigidity can be improved.
  • the rear wall portion 1b and the front wall portion 1c are used as support portions for supporting the stage 2.
  • the rear wall portion 1b and the front wall portion 1c are formed on the wall body.
  • the support is not limited, and may be a support (not shown) as long as it is paired in the front and rear and supports the stage 2.
  • the semi-focus device 7 is attached to the upper surface of the beam portion 1d, but at least a part of the semi-focus device 7 is attached to the beam portion 1d or the stage support portion (rear wall portion 1b or front wall portion 1c). I just need it.
  • FIG. 3 is a conceptual perspective view showing an inverted microscope according to the second embodiment of the present invention.
  • FIG. 3A is a diagram showing a state in which the upper structure is slid forward
  • FIG. It is a figure which shows the state which carried out slide adjustment of the upper structure backward.
  • 4 is a cross-sectional view showing the internal structure of the inverted microscope shown in FIG. 3
  • FIG. 5 is an exploded perspective view showing the structure of the inverted microscope shown in FIG.
  • the inverted microscope according to the second embodiment is not different from the inverted microscope according to the first embodiment except that the microscope main body 1 is composed of the lower structure 10 and the upper structure 11. For this reason, the microscope main body 1 will be described, and the same components as those of the inverted microscope according to the first embodiment will be denoted by the same reference numerals and description thereof will be omitted.
  • the optical device 4 when the optical device 4 is mounted between the objective lens 31 and the imaging lens 32, the light passes through the mirror 41 built in the optical device 4.
  • the optical axis O shifts backward.
  • the optical axis O is greatly shifted backward.
  • the microscope body 1 of the inverted microscope is composed of a lower structure (support body) 10 and an upper structure (slide body) 11.
  • the lower structure 10 is a portion constituting the lower portion of the microscope body 1, and includes a base portion 10 a extending in the front-rear direction and a rear wall lower portion 10 b extending upward from the rear edge portion of the base portion 10 a. And a front wall lower portion 10c extending upward from the front edge portion of the base portion 10a.
  • the upper surface 10b3 (see FIG. 5) of the rear wall lower portion 10b and the upper surface 10c3 (see FIG. 5) of the front wall lower portion 10c constitute the same plane extending in the horizontal direction, and the upper structure 11 is formed of the rear wall lower portion 10b. It is attached across the upper surface 10b3 and the upper surface 10c3 of the front wall lower portion 10c.
  • the upper structure 11 is a part constituting the upper part of the microscope body 1 and is mounted on the lower structure 10.
  • the rear wall upper part 11b extending upward from the rear wall lower part 10b of the lower structure 10
  • the front wall upper part extending upward from the front wall lower part 10c of the lower structure 10 11c
  • the rear wall upper part 11b and the front wall upper part 11c are connected to each other at the center in the height direction 11d.
  • the upper surface 11b3 of the rear wall upper portion 11b and the upper surface 11c3 of the front wall upper portion 11c constitute the same surface extending in the horizontal direction, and the stage 2 has the upper surface 11b3 of the rear wall upper portion 11b and the upper surface 11c3 of the front wall upper portion 11c. Attached across the.
  • the above-described upper structure 11 includes a female screw 12 (see FIG. 8) in which a screw 12 (see FIG. 8) inserted through the long holes 11 b 4 and 11 c 4 (see FIG. 8) provided in the upper structure 11 is provided in the lower structure.
  • the lower structure 10 is fixed by being screwed to 10b4 and 10c4.
  • a click mechanism and an abutment surface (not shown) for positioning are provided between the lower structure 10 and the upper structure 11, and the upper structure 11 is provided according to the case where the optical device 4 is not attached or according to the number of attachments. May be positioned at a predetermined position.
  • the revolver 6 and the semi-focusing device 7 are attached to the upper surface of the beam portion 11d of the upper structure 11. Therefore, when the upper structure 11 is removed from the lower structure 10, the revolver 6 and the focusing device 7 are removed together with the upper structure 11. When the screw 12 is loosened and the upper structure is moved with respect to the lower structure 10, the revolver 6 and the focusing device 7 move together with the upper structure 11.
  • a transmission illumination device 9 is attached to the rear wall upper portion 11 b of the upper structure 11. Therefore, when the upper structure 11 is removed from the lower structure 10, the transmission illumination device 9 is removed together with the upper structure 11. Further, when the screw 12 is loosened and the upper structure 11 is moved with respect to the lower structure 10, the transmitted illumination device 9 moves together with the upper structure 11.
  • the microscope main body 1 of the inverted microscope according to the second embodiment described above includes a lower structure 10 and an upper structure 11 attached to the lower structure 10, and moves the upper structure 11 relative to the lower structure 10. Therefore, the optical axis O 1 of the optical device 4 mounted on the lower structure 10 and the optical axis O 2 of the objective lens 31 mounted on the revolver 6 can be adjusted.
  • the revolver 6 and the focusing device 7 are attached to the upper surface of the beam portion 11d of the upper structure 11, and the transmission illumination device 9 is attached to the rear wall upper portion 11b of the upper structure 11, so that the transmission illumination device 9 If the optical axis and the optical axis of the objective lens 31 attached to the revolver 6 are adjusted so as to coincide with each other, the optical axis and the revolver of the transmission illumination device 9 can be obtained even if the upper structure 11 is moved relative to the lower structure 10. No deviation occurs with respect to the optical axis of the objective lens 31 attached to 6 and measurement with high reliability can be performed.
  • FIG. 7 is a conceptual perspective view showing an inverted microscope according to an embodiment of the present invention
  • FIG. 8 is an exploded perspective view showing the structure of the inverted microscope shown in FIG.
  • the inverted microscope according to the third embodiment is not different from the inverted microscope according to the second embodiment except that the edge portions 11d1 and 11d2 are provided on the upper surface of the beam portion 11d. Therefore, the beam portion 11d will be described, and the same components as those in the second embodiment are denoted by the same reference numerals and description thereof is omitted.
  • oil used for the oil immersion objective lens, solvent for dissolving the sample, liquid used for temperature or humidity control, etc. are dropped from the stage 2 so that the lower area of the stage 2 is easily contaminated.
  • the beam portion 11d of the inverted microscope according to the third embodiment has a size that covers the entire upper surface of the mounted optical device 4, and the beam portion 11d has an oil, solvent, liquid, or the like dropped from the stage 2 on the upper surface. I will take it for a while.
  • the edge part 11d1 which protrudes upwards is formed in the upper surface both-sides edge of the beam part 11d, and surrounds the upper surface outer periphery of the beam part 11d with the rear wall upper part 11b and the front wall upper part 11c.
  • an edge portion 11d2 protruding upward is formed around the through hole through which the observation light is transmitted, and surrounds the through hole.
  • a notch 11d3 is provided in a part of the edge part 11d1, and oil, solvent, liquid, etc. accumulated on the upper surface of the beam part 11d flows out from the notch 11d3.
  • the beam portion 11d of the inverted microscope according to the third embodiment covers the entire upper surface of the mounted optical device 4, even if oil, solvent, or liquid drops from the stage 2, it can be received by the beam portion 11d. Contamination of the device 4 can be prevented. Further, since the received oil, solvent, liquid, and the like flow out of the notch 11d3 provided on the outer periphery of the upper surface of the beam portion 11d, the mounted optical device 4 is not contaminated by overflowing from the edge portions 11d1 and 11d2.
  • FIG. 9 is a conceptual perspective view showing an inverted microscope according to Embodiment 4 of the present invention.
  • the inverted microscope according to the fourth embodiment is not different from the inverted microscope according to the second embodiment except that the semi-focus device 7 is configured by the autofocus device 70. For this reason, the same components as those of the inverted microscope according to the second embodiment are denoted by the same reference numerals and description thereof is omitted.
  • the semi-focus device 7 is composed of an autofocus device 70.
  • the autofocus device 70 is for automatically focusing the objective lens 31 and includes a light source, a lens, and a light receiver.
  • the autofocus device is based on, for example, an active method, and detects the reflected light from the sample placed on the stage or the bottom surface of the sample container to automatically focus the objective lens 31.
  • the focusing device 7 is configured by the autofocus device 70, so that the focus of the objective lens 31 is automatically focused, and the focusing operation is easy.

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  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Optics & Photonics (AREA)
  • Microscoopes, Condenser (AREA)
PCT/JP2011/062287 2010-05-28 2011-05-27 倒立顕微鏡 Ceased WO2011149090A1 (ja)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP11786787.9A EP2579086B1 (en) 2010-05-28 2011-05-27 Inverted microscope
US13/683,237 US8749883B2 (en) 2010-05-28 2012-11-21 Inverted microscope

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2010-123440 2010-05-28
JP2010123440A JP5586326B2 (ja) 2010-05-28 2010-05-28 倒立顕微鏡

Related Child Applications (1)

Application Number Title Priority Date Filing Date
US13/683,237 Continuation US8749883B2 (en) 2010-05-28 2012-11-21 Inverted microscope

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WO2011149090A1 true WO2011149090A1 (ja) 2011-12-01

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US (1) US8749883B2 (https=)
EP (1) EP2579086B1 (https=)
JP (1) JP5586326B2 (https=)
WO (1) WO2011149090A1 (https=)

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JP2014006395A (ja) * 2012-06-25 2014-01-16 Olympus Corp 顕微鏡および保温部材

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JP6133571B2 (ja) * 2012-10-30 2017-05-24 株式会社ジンズ 透過光観測装置
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US20130258457A1 (en) * 2012-03-30 2013-10-03 Olympus Corporation Inverted microscope
US9494780B2 (en) 2012-03-30 2016-11-15 Olympus Corporation Inverted microscope
JP2014006395A (ja) * 2012-06-25 2014-01-16 Olympus Corp 顕微鏡および保温部材

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EP2579086B1 (en) 2021-07-07
JP2011248245A (ja) 2011-12-08

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