WO2011137584A1 - 微型光谱仪的光学机构 - Google Patents
微型光谱仪的光学机构 Download PDFInfo
- Publication number
- WO2011137584A1 WO2011137584A1 PCT/CN2010/072462 CN2010072462W WO2011137584A1 WO 2011137584 A1 WO2011137584 A1 WO 2011137584A1 CN 2010072462 W CN2010072462 W CN 2010072462W WO 2011137584 A1 WO2011137584 A1 WO 2011137584A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- optical
- reflective surface
- micro
- waveguide plate
- optical signal
- Prior art date
Links
- 230000003287 optical effect Effects 0.000 title claims abstract description 101
- 230000008033 biological extinction Effects 0.000 claims description 14
- 230000001681 protective effect Effects 0.000 claims description 8
- 230000003595 spectral effect Effects 0.000 claims description 8
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N Silicium dioxide Chemical compound O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 claims description 4
- 239000011521 glass Substances 0.000 claims description 4
- 230000000295 complement effect Effects 0.000 claims description 3
- 239000004065 semiconductor Substances 0.000 claims description 3
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 claims description 2
- NIXOWILDQLNWCW-UHFFFAOYSA-N acrylic acid group Chemical group C(C=C)(=O)O NIXOWILDQLNWCW-UHFFFAOYSA-N 0.000 claims description 2
- 229910052782 aluminium Inorganic materials 0.000 claims description 2
- XAGFODPZIPBFFR-UHFFFAOYSA-N aluminium Chemical compound [Al] XAGFODPZIPBFFR-UHFFFAOYSA-N 0.000 claims description 2
- 229910052710 silicon Inorganic materials 0.000 claims description 2
- 239000010703 silicon Substances 0.000 claims description 2
- 235000012239 silicon dioxide Nutrition 0.000 claims description 2
- 239000000377 silicon dioxide Substances 0.000 claims description 2
- 229910001220 stainless steel Inorganic materials 0.000 claims description 2
- 239000010935 stainless steel Substances 0.000 claims description 2
- 229910044991 metal oxide Inorganic materials 0.000 claims 1
- 150000004706 metal oxides Chemical class 0.000 claims 1
- 238000001228 spectrum Methods 0.000 abstract description 4
- 239000000463 material Substances 0.000 description 9
- 238000000034 method Methods 0.000 description 4
- 239000000203 mixture Substances 0.000 description 3
- 239000000126 substance Substances 0.000 description 3
- 238000010586 diagram Methods 0.000 description 2
- 238000010521 absorption reaction Methods 0.000 description 1
- 238000003339 best practice Methods 0.000 description 1
- 239000012141 concentrate Substances 0.000 description 1
- 230000001066 destructive effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000013307 optical fiber Substances 0.000 description 1
- 230000035515 penetration Effects 0.000 description 1
- 238000002310 reflectometry Methods 0.000 description 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
-
- G—PHYSICS
- G02—OPTICS
- G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
- G02B6/00—Light guides; Structural details of arrangements comprising light guides and other optical elements, e.g. couplings
- G02B6/24—Coupling light guides
- G02B6/26—Optical coupling means
- G02B6/34—Optical coupling means utilising prism or grating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0256—Compact construction
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/02—Details
- G01J3/0291—Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J3/00—Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J3/12—Generating the spectrum; Monochromators
- G01J3/18—Generating the spectrum; Monochromators using diffraction elements, e.g. grating
Definitions
- the present invention relates to an optical mechanism for a miniature spectrometer, and more particularly to an optical mechanism for a micro spectrometer that allows an optical signal to be transmitted in a waveguide to avoid divergence of the optical signal.
- a spectrometer is a non-destructive instrument that can be used, for example, to identify the composition and characteristics of a substance. After the light is applied to the material, the principle of light reflection, and the difference in reflection, absorption or penetration of different frequency bands of the light within the material composition, the spectrometer receives the light reflected from the material and presents a corresponding spectrum. Since different substances will reveal the spectrum of individual features, the composition and characteristics of the substance can be identified.
- FIG. 1 is a schematic diagram of a conventional spectrometer.
- the traditional spectrometer 500 is easy to cause the light to be concentrated and diverged due to multiple reflections, free space of divergence and long path of light travel, and even the traditional spectrometer is not easy to be cleaned of stray light. It will cause too much background noise for the corresponding image. Both of the above disadvantages will affect the image quality produced by the detector 508, and the accuracy of the latter circuit when determining the magnitude of the light intensity at different wavelengths is reduced. Summary of the invention
- the invention mainly provides an optical mechanism of a miniature spectrometer, which utilizes an optical channel to make the spectrometer's light more concentrated and less prone to divergence, thereby improving the accuracy of the subsequent stage circuit in judging the light intensity of different wavelengths. .
- the so-called miniature spectrometer has a micro-diffraction grating, which is generally fabricated by microelectromechanical process (MEMS), semiconductor process, Lithographie GaVanoformung Abformung (LIGA) or other processes.
- MEMS microelectromechanical process
- LIGA Lithographie GaVanoformung Abformung
- the grating height of the micro-diffraction grating is generally about several tens of micrometers to several hundreds of micrometers.
- the grating profile is a curved surface, and the optical signal after being split can be focused on the image capturing component of the rear end without saving.
- Focusing mirror of traditional spectrometer (of course, if a planar micro-diffraction grating is used, the focusing mirror cannot be omitted, otherwise the image capturing component will become very
- the width is sufficient to receive the complete signal), but also because the height of the micro-diffraction grating is generally much smaller than that of the conventional spectrometer, the amount of optical signal that can be split to reach the micro-diffraction grating is of course small, so that the amount of light can be Fully utilized, constructing an appropriate light path to concentrate incident light becomes a major challenge for miniature spectrometers.
- an optical mechanism of a miniature spectrometer comprising an input portion, an upper waveguide plate, a lower waveguide plate and a micro-diffraction grating.
- the input unit is for receiving an optical signal.
- the upper waveguide plate has a first reflecting surface.
- the lower waveguide plate is disposed substantially parallel to the upper waveguide plate and has a second reflective surface, wherein the first reflective surface is opposite to the second reflective surface.
- An optical path is formed between the first reflective surface and the second reflective surface to cause an optical signal from the input to travel within the optical channel.
- the micro-diffraction grating is used to separate the optical signal transmitted in the optical channel into a plurality of spectral components and direct the spectral components to the image capturing assembly.
- Figure 1 is a schematic diagram of a conventional spectrometer.
- FIG. 2 is an exploded perspective view showing the optical mechanism of the micro spectrometer according to the first embodiment of the present invention.
- Figure 3 is a schematic illustration of light traveling in the optical path of the optical mechanism of the microspectrometer of Figure 2.
- 4 is a schematic view showing an example of an upper waveguide plate.
- Fig. 5 is a schematic view showing an example of a slit plate.
- FIG. 6 is an exploded perspective view showing the optical mechanism of the micro spectrometer according to the second embodiment of the present invention.
- Figure 7 is a schematic view showing the extinction mechanism of the matting assembly of Figure 6.
- first protective film 122 First reflecting surface
- FIG. 2 is an exploded perspective view of the optical mechanism of the micro spectrometer according to the first embodiment of the present invention
- FIG. 3 is a schematic view showing the light traveling in the optical path of the optical mechanism of the micro spectrometer of FIG. Please refer to FIG. 2 and FIG. 3 for the description of this embodiment below.
- the optical mechanism 100 of the micro spectrometer includes an input portion 110, an upper waveguide plate 120, a lower waveguide plate 130, and a micro diffraction grating 160.
- the back end of the optical mechanism 100 of the micro spectrometer may further include an image capturing assembly 150.
- the components of this embodiment are described in more detail below.
- the input 110 in the optical mechanism 100 of the micro spectrometer is used to receive an optical signal 50.
- the upper waveguide plate 120 has a first reflective surface 122.
- the lower waveguide plate 130 is disposed substantially parallel to the upper waveguide plate 120 and has a second reflective surface 132, wherein the first reflective surface 122 is opposite to the second reflective surface 132.
- An optical channel 140 is formed between the first reflective surface 122 and the second reflective surface 132 to allow the optical signal 50 from the input portion 110 to travel within the optical channel 140.
- the optical channel 140 formed between the two reflecting surfaces 132 is generally a cavity type, which is different from the principle of total reflection used for transmitting light in the optical fiber. The present invention limits optical signals to repeated reflections between the reflecting surfaces.
- the micro-diffraction grating 160 is used to separate the optical signal 50 transmitted in the optical channel 140 into a plurality of spectral components 51, and direct the spectral components 51 to the image capturing component 150 to obtain corresponding images.
- the material of the upper waveguide plate 120 and the lower waveguide plate 130 is, for example, stainless steel, silicon chip, glass, optical disk or hard disk.
- a high-reflection film may be disposed on the first reflective surface 122 and the second reflective surface 132 to solve the problem.
- the material of the highly reflective film is an aluminum film.
- the flatness and reflectance of the surface of the reflective surface are reduced, and the first reflective surface 122 and the second reflective surface are provided.
- a first protective film and a second protective film are respectively disposed on the high reflection film of the surface 132, and the material of the protective film is, for example, silicon dioxide.
- the upper waveguide plate 120 may have a high reflection film 120a and a first protection film 120b as shown in FIG.
- the materials exemplified in the present embodiment are not intended to limit the spirit and scope of the present invention.
- the input portion 110 includes, for example, a slit plate 134 having a slit 136 as shown in FIG. After the optical signal 50 is incident by the slit 136, it is directed toward the micro-diffraction grating 160 via the optical channel 140.
- CCD Charge Coupled Device
- CMOS Complementary Metal- ⁇ xide-Semiconductor
- the width of the slit 136 is, for example, about 25 micrometers ( ⁇ m), and the height is, for example, about 150 micrometers ( ⁇ m), and the distance between the first reflective surface 122 and the second reflective surface 132 is, for example, about 100 to 150 micrometers (um). .
- the first The height difference between the local maximum point and the local minimum point of the reflecting surface 122 and the second reflecting surface 132 is, for example, about one tenth of a wavelength to about one tenth of a wavelength to achieve high flatness, and the first reflecting surface 122
- the reflectance with the second reflecting surface 132 is, for example, 90%.
- the optical path of the optical signal 50 traveling from the slit plate 134 to the micro-diffraction grating 160 is, for example, 28 millimeters (mm), and the light traveling path from the micro-diffraction grating 160 to the image capturing assembly 150 is about 40 mm. (mm).
- the optical mechanism 100 of the micro spectrometer of the present embodiment is compared with the conventional spectrometer 500 shown in FIG. 1.
- the light of the conventional spectrometer 500 is transmitted through the cavity in the spectrometer 500, and there is a possibility that the light is divergent and the optical signal is too weak to be stray light.
- the problem of excessive interference, and the spectrometer 500 occupies a large volume.
- the optical signal 50 By causing the optical signal 50 to travel in the optical channel 140, the light of the spectrometer is more concentrated and less divergent, and the efficiency of the optical mechanism 100 of the micro spectrometer can be effectively improved.
- the optical mechanism 100 of the micro spectrometer of the embodiment can be additionally provided with a suitable stray light removing mechanism (described in detail below), it is less affected by stray light, so that the image capturing assembly 150 can be more generated. Accurate image, when the corresponding image is transmitted to the subsequent circuit, the accuracy of the subsequent physical or biochemical significance of the optical signal at different wavelengths can be further improved.
- FIG. 6 is an exploded perspective view showing the optical mechanism of the micro spectrometer according to the second embodiment of the present invention
- FIG. 7 is a schematic view showing the extinction mechanism of the extinction assembly of FIG.
- the embodiment is different from the first embodiment in that the optical mechanism 200 of the micro spectrometer further includes a first matting component 270 and a second extinction component 272.
- One side of the cross-section of the first matt component 270 and the second matte component 272 is serrated, and the zigzag sides face the optical channel 140.
- one side 270a of the first matting component 270 and one side 272a of the second matting component 272 face the light tunnel 140.
- the first extinction assembly 270 and the second extinction assembly 272 are respectively disposed on both sides of the optical channel 140 for absorbing an optical signal emitted from the input portion 110 by an angle greater than a specific angle.
- this particular angle is, for example, an angle of 0, which is related to the sawtooth structure of the first matt component 270 and the second matte component 272. It is assumed that the angle of travel from the optical signal 52 is greater than the angle ⁇ . When the angle of travel away from the optical signal 52 is greater than the angle ⁇ , the offset optical signal 52 may impinge into one of the triangular recesses of the sawtooth structure.
- the serrated structure of the matte assembly can be made weak by the off-axis optical signal 52 as reflected in the notch of the sawtooth structure as shown in FIG. In this way, the off-axis optical signal 52, which would otherwise cause the stray light signal, can be eliminated by the sawtooth structure, thereby making the desired spectral component clearer and clearer.
- the rest of the embodiment is the same as the first embodiment, and therefore will not be described again.
- the optical mechanism of the micro spectrometer disclosed in the above embodiments of the present invention regulates the optical signal entering from the input portion to travel in the optical path between the upper and lower waveguide plates, so that the optical signal is more concentrated and less likely to diverge.
- the optical signal with too large incident angle can be eliminated, thereby reducing the stray light reaching the image capturing component, so that the desired spectral components are not interfered by stray light, resulting in clearer Image.
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- Physics & Mathematics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- General Physics & Mathematics (AREA)
- Optics & Photonics (AREA)
- Spectrometry And Color Measurement (AREA)
- Optical Couplings Of Light Guides (AREA)
Abstract
Description
Claims
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN2010800644812A CN102869963A (zh) | 2010-05-05 | 2010-05-05 | 微型光谱仪的光学机构 |
PCT/CN2010/072462 WO2011137584A1 (zh) | 2010-05-05 | 2010-05-05 | 微型光谱仪的光学机构 |
US13/642,264 US9122014B2 (en) | 2010-05-05 | 2010-05-05 | Optical mechanism of miniaturized optical spectrometers |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/CN2010/072462 WO2011137584A1 (zh) | 2010-05-05 | 2010-05-05 | 微型光谱仪的光学机构 |
Publications (1)
Publication Number | Publication Date |
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WO2011137584A1 true WO2011137584A1 (zh) | 2011-11-10 |
Family
ID=44903571
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/CN2010/072462 WO2011137584A1 (zh) | 2010-05-05 | 2010-05-05 | 微型光谱仪的光学机构 |
Country Status (3)
Country | Link |
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US (1) | US9122014B2 (zh) |
CN (1) | CN102869963A (zh) |
WO (1) | WO2011137584A1 (zh) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130293961A1 (en) * | 2010-05-07 | 2013-11-07 | Cheng-Hao KO | Optical System and Reflection Type Diffraction Grating Thereof |
US10393586B2 (en) | 2016-07-12 | 2019-08-27 | Oto Photonics Inc. | Spectrometer and manufacturing method thereof |
Families Citing this family (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9091827B2 (en) | 2012-07-09 | 2015-07-28 | Luxtera, Inc. | Method and system for grating couplers incorporating perturbed waveguides |
US10782479B2 (en) | 2013-07-08 | 2020-09-22 | Luxtera Llc | Method and system for mode converters for grating couplers |
CN103557939B (zh) * | 2013-09-26 | 2015-12-09 | 中国科学院安徽光学精密机械研究所 | 小型红外光栅光谱仪 |
WO2016115720A1 (zh) * | 2015-01-23 | 2016-07-28 | 台湾超微光学股份有限公司 | 光谱仪及其光输入部 |
US20160282558A1 (en) * | 2015-03-27 | 2016-09-29 | Intel Corporation | Optical higher-order mode frustration in a rib waveguide |
JP2017187603A (ja) * | 2016-04-05 | 2017-10-12 | ミツミ電機株式会社 | 1軸回転アクチュエーター |
DE102017206066A1 (de) * | 2017-04-10 | 2018-10-11 | Anvajo GmbH | Spektrometer |
CN109491073B (zh) * | 2019-01-25 | 2021-06-15 | 深圳市捷迅光电有限公司 | 一种光学的滤波器 |
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JPH04262282A (ja) * | 1991-02-18 | 1992-09-17 | Nec Corp | レーザ光入射方向検出装置 |
WO1997027460A1 (de) * | 1996-01-25 | 1997-07-31 | Mueller Joerg | Miniaturisiertes optisches dünnschichtwellenleiterspektrometer |
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CN101263372A (zh) * | 2005-05-17 | 2008-09-10 | 霍尼韦尔国际公司 | 光学微型光谱仪 |
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-
2010
- 2010-05-05 CN CN2010800644812A patent/CN102869963A/zh active Pending
- 2010-05-05 WO PCT/CN2010/072462 patent/WO2011137584A1/zh active Application Filing
- 2010-05-05 US US13/642,264 patent/US9122014B2/en not_active Expired - Fee Related
Patent Citations (5)
Publication number | Priority date | Publication date | Assignee | Title |
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JPH04262282A (ja) * | 1991-02-18 | 1992-09-17 | Nec Corp | レーザ光入射方向検出装置 |
WO1997027460A1 (de) * | 1996-01-25 | 1997-07-31 | Mueller Joerg | Miniaturisiertes optisches dünnschichtwellenleiterspektrometer |
CN1315656A (zh) * | 2000-03-29 | 2001-10-03 | 中国科学院长春光学精密机械与物理研究所 | 新型集成光路结构光谱仪及其集成光路组件的制备方法 |
CN100468045C (zh) * | 2004-07-09 | 2009-03-11 | 鸿富锦精密工业(深圳)有限公司 | 光栅光谱仪 |
CN101263372A (zh) * | 2005-05-17 | 2008-09-10 | 霍尼韦尔国际公司 | 光学微型光谱仪 |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20130293961A1 (en) * | 2010-05-07 | 2013-11-07 | Cheng-Hao KO | Optical System and Reflection Type Diffraction Grating Thereof |
US9372290B2 (en) * | 2010-05-07 | 2016-06-21 | Yung-Chuan Wu | Spectrum analyzer and reflection type diffraction grating thereof |
US10393586B2 (en) | 2016-07-12 | 2019-08-27 | Oto Photonics Inc. | Spectrometer and manufacturing method thereof |
Also Published As
Publication number | Publication date |
---|---|
US9122014B2 (en) | 2015-09-01 |
US20130294727A1 (en) | 2013-11-07 |
CN102869963A (zh) | 2013-01-09 |
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