WO2011105692A3 - 국소 표면 플라즈몬 공명 기반의 초고해상도 전반사 형광 영상 장치 및 이를 위함 검출 모듈 - Google Patents

국소 표면 플라즈몬 공명 기반의 초고해상도 전반사 형광 영상 장치 및 이를 위함 검출 모듈 Download PDF

Info

Publication number
WO2011105692A3
WO2011105692A3 PCT/KR2010/009519 KR2010009519W WO2011105692A3 WO 2011105692 A3 WO2011105692 A3 WO 2011105692A3 KR 2010009519 W KR2010009519 W KR 2010009519W WO 2011105692 A3 WO2011105692 A3 WO 2011105692A3
Authority
WO
WIPO (PCT)
Prior art keywords
imaging device
internal reflection
total internal
fluorescence imaging
detection module
Prior art date
Application number
PCT/KR2010/009519
Other languages
English (en)
French (fr)
Other versions
WO2011105692A2 (ko
Inventor
김동현
김규정
최종률
이원주
오영진
Original Assignee
연세대학교 산학협력단
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from KR1020100017210A external-priority patent/KR101084018B1/ko
Application filed by 연세대학교 산학협력단 filed Critical 연세대학교 산학협력단
Priority to US13/581,104 priority Critical patent/US9019599B2/en
Publication of WO2011105692A2 publication Critical patent/WO2011105692A2/ko
Publication of WO2011105692A3 publication Critical patent/WO2011105692A3/ko

Links

Classifications

    • G—PHYSICS
    • G02—OPTICS
    • G02B—OPTICAL ELEMENTS, SYSTEMS OR APPARATUS
    • G02B5/00—Optical elements other than lenses
    • G02B5/008—Surface plasmon devices
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/6456—Spatial resolved fluorescence measurements; Imaging
    • G01N21/6458—Fluorescence microscopy
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/62—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light
    • G01N21/63—Systems in which the material investigated is excited whereby it emits light or causes a change in wavelength of the incident light optically excited
    • G01N21/64—Fluorescence; Phosphorescence
    • G01N21/645—Specially adapted constructive features of fluorimeters
    • G01N21/648—Specially adapted constructive features of fluorimeters using evanescent coupling or surface plasmon coupling for the excitation of fluorescence

Landscapes

  • Health & Medical Sciences (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Nuclear Medicine, Radiotherapy & Molecular Imaging (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Microscoopes, Condenser (AREA)

Abstract

본 발명의 실시예에 따른 전반사 형광 영상 장치는 금속 박막과 상기 금속 박막 상에 형성된 나노구조를 포함하는 금속 나노구조층; 상기 금속 나노구조층에서 전반사되어 상기 금속 나노구조층과 그 위에 배치된 시료와의 사이에서 수평 방향으로 국소화된 소실파를 일으키는 입사광을 제공하는 광원부; 및 상기 수평 방향으로 국소화된 소실파에 의해 상기 시료에서 발생하는 형광 신호를 추출하고 영상화하는 형광 영상 추출부를 포함한다.
PCT/KR2010/009519 2010-02-25 2010-12-29 국소 표면 플라즈몬 공명 기반의 초고해상도 전반사 형광 영상 장치 및 이를 위함 검출 모듈 WO2011105692A2 (ko)

Priority Applications (1)

Application Number Priority Date Filing Date Title
US13/581,104 US9019599B2 (en) 2010-02-25 2010-12-29 Localized surface plasmon resonance based super resolved total internal reflection fluorescence imaging apparatus, and detection module therefor

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
KR10-2010-0017210 2010-02-25
KR1020100017210A KR101084018B1 (ko) 2009-12-22 2010-02-25 국소 표면 플라즈몬 공명 기반의 초고해상도 전반사 형광 현미경 및 전반사 형광 현미경용 검출 모듈
KR20100084735A KR101198476B1 (ko) 2010-08-31 2010-08-31 나노 구조 기반의 초고해상도 영상 방법 및 장치
KR10-2010-0084735 2010-08-31

Publications (2)

Publication Number Publication Date
WO2011105692A2 WO2011105692A2 (ko) 2011-09-01
WO2011105692A3 true WO2011105692A3 (ko) 2011-11-10

Family

ID=44507327

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/KR2010/009519 WO2011105692A2 (ko) 2010-02-25 2010-12-29 국소 표면 플라즈몬 공명 기반의 초고해상도 전반사 형광 영상 장치 및 이를 위함 검출 모듈

Country Status (3)

Country Link
US (1) US9019599B2 (ko)
KR (1) KR101198476B1 (ko)
WO (1) WO2011105692A2 (ko)

Families Citing this family (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20140327909A1 (en) * 2011-12-16 2014-11-06 Mikael Käll Method for exciting a sub-wavelength inclusion structure
US9223084B2 (en) 2012-12-18 2015-12-29 Pacific Biosciences Of California, Inc. Illumination of optical analytical devices
KR101431958B1 (ko) * 2013-01-31 2014-08-21 연세대학교 산학협력단 초고해상도 광학 영상 장치 및 이를 이용한 광학 영상 방법
FR3004537A1 (fr) * 2013-04-10 2014-10-17 Centre Nat Rech Scient Procede de mesure d'un milieu d'interet par resonance de plasmon de surface et systeme associe
JP2017520237A (ja) 2014-04-22 2017-07-27 キュー−ステート バイオサイエンシーズ， インコーポレイテッドＱ−Ｓｔａｔｅ Ｂｉｏｓｃｉｅｎｃｅｓ， Ｉｎｃ． ニューロン障害のための診断方法
US9425109B2 (en) * 2014-05-30 2016-08-23 Taiwan Semiconductor Manufacturing Co., Ltd. Planarization method, method for polishing wafer, and CMP system
KR101710570B1 (ko) * 2015-02-05 2017-02-27 부산대학교 산학협력단 특이 광 투과 현상을 위한 나노홀 어레이 기판 및 이를 이용하는 초고해상도 이미지 시스템
US10288863B2 (en) 2015-05-21 2019-05-14 Q-State Biosciences, Inc. Optogenetics microscope
DE102015218422A1 (de) 2015-09-24 2017-03-30 Universität Stuttgart Sensorelement für Photolumineszenz-Messungen, Photolumineszenz-Detektionseinrichtung, Verfahren zum Betreiben einer Photolumineszenz-Detektionseinrichtung, Verfahren zur Herstellung eines Sensorelements, und Verwendung eines Sensorelements
US10371874B2 (en) 2016-06-20 2019-08-06 Yonsei University, University—Industry Foundation (UIF) Substrate unit of nanostructure assembly type, optical imaging apparatus including the same, and controlling method thereof
TWI664397B (zh) * 2018-07-10 2019-07-01 精準基因生物科技股份有限公司 感測裝置
ES2953289T3 (es) 2018-08-03 2023-11-10 Insingulo Ab Un procedimiento para determinar la interacción entre un ligando y un receptor
WO2023243849A1 (ko) * 2022-06-16 2023-12-21 서울대학교산학협력단 카이랄성 센서

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020063587A (ko) * 1999-12-07 2002-08-03 더 세크러터리 오브 스테이트 포 디펜스 표면 플라스몬 공진
JP2003075337A (ja) * 2001-09-03 2003-03-12 Mitsubishi Heavy Ind Ltd 集積型表面プラズモン共鳴センサ
JP2004156911A (ja) * 2002-11-01 2004-06-03 Osaka Industrial Promotion Organization 表面プラズモン蛍光顕微鏡、および表面プラズモンにより励起された蛍光を測定する方法
JP2009244018A (ja) * 2008-03-31 2009-10-22 Fujifilm Corp 蛍光検出方法および蛍光検出装置

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050250094A1 (en) * 2003-05-30 2005-11-10 Nanosphere, Inc. Method for detecting analytes based on evanescent illumination and scatter-based detection of nanoparticle probe complexes
US20050285128A1 (en) * 2004-02-10 2005-12-29 California Institute Of Technology Surface plasmon light emitter structure and method of manufacture
US20090263912A1 (en) * 2004-05-13 2009-10-22 The Regents Of The University Of California Nanowires and nanoribbons as subwavelength optical waveguides and their use as components in photonic circuits and devices
US20080007852A1 (en) * 2005-02-09 2008-01-10 Kyoto University Reflectance Control Optical Element and Ultrathin Film Light Absorption Enhancing Element
US7939333B2 (en) * 2005-06-17 2011-05-10 University Of Maryland, Baltimore County Metal enhanced fluorescence-based sensing methods
EP1913392A4 (en) * 2005-08-02 2010-03-10 Univ Utah Res Found BIOSENSORS WITH METALLIC NANOCONITIES
US7892739B2 (en) * 2007-03-27 2011-02-22 Lehigh University Systems, compositions and methods for nucleic acid detection
KR101084018B1 (ko) 2009-12-22 2011-11-16 연세대학교 산학협력단 국소 표면 플라즈몬 공명 기반의 초고해상도 전반사 형광 현미경 및 전반사 형광 현미경용 검출 모듈

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20020063587A (ko) * 1999-12-07 2002-08-03 더 세크러터리 오브 스테이트 포 디펜스 표면 플라스몬 공진
JP2003075337A (ja) * 2001-09-03 2003-03-12 Mitsubishi Heavy Ind Ltd 集積型表面プラズモン共鳴センサ
JP2004156911A (ja) * 2002-11-01 2004-06-03 Osaka Industrial Promotion Organization 表面プラズモン蛍光顕微鏡、および表面プラズモンにより励起された蛍光を測定する方法
JP2009244018A (ja) * 2008-03-31 2009-10-22 Fujifilm Corp 蛍光検出方法および蛍光検出装置

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
LEE ET AL.: "Quantitative study of the gold-enhanced fluorescence of CdSe/ZnS nanocrystals as a function of distance using an AFM probe", PHYSICAL CHEMISTRY CHEMICAL PHYSICS, 26 March 2009 (2009-03-26) *

Also Published As

Publication number Publication date
KR101198476B1 (ko) 2012-11-06
WO2011105692A2 (ko) 2011-09-01
US9019599B2 (en) 2015-04-28
US20130050813A1 (en) 2013-02-28
KR20120020848A (ko) 2012-03-08

Similar Documents

Publication Publication Date Title
WO2011105692A3 (ko) 국소 표면 플라즈몬 공명 기반의 초고해상도 전반사 형광 영상 장치 및 이를 위함 검출 모듈
WO2010062116A3 (en) High resolution surface plasmon resonance sensor and sensor system thereof
WO2014197899A3 (en) Methods, systems and apparatus of an all-optics ultrasound sensor
WO2011055952A3 (ko) 지시물체의 위치인식장치
CA3010578A1 (en) Ocular surface interferometry (osi) devices, systems, and methods for imaging, processing, and/or displaying an ocular tear film and/or measuring ocular tear film layer thickness(es)
IN2014CN02504A (ko)
EP2546707A3 (en) Atomic oscillator and method for fabricating atomic oscillator
WO2012006431A3 (en) Apparatus and method for surface and subsurface tactile sensation imaging
WO2010117599A3 (en) Optoelectronic methods and devices for detection of analytes
WO2012176106A3 (en) Method and apparatus for inspection of light emitting semiconductor devices using photoluminescence imaging
WO2011105679A3 (ko) 고감도 표면 플라즈몬 공명 센서, 표면 플라즈몬 공명 센서칩, 및 표면 플라즈몬 공명 센서 소자의 제조 방법
SG169314A1 (en) Method and device for detecting defects in an object
EP2889736A3 (en) Apparatus and method for detecting surface shear force on a display device
JP2014508922A5 (ko)
WO2012096847A3 (en) Apparatus for euv imaging and methods of using same
WO2009007977A3 (en) Method and apparatus for duv transmission mapping
WO2013105989A3 (en) Optical touch detection
EP2584543A3 (en) Image sensor unit and image reading apparatus
WO2011137547A3 (de) Vorrichtung zur berührungslosen und zerstörungsfreien prüfung von oberflächen
JP2012168362A5 (ko)
Usukura et al. Highly confined, enhanced surface fluorescence imaging with two-dimensional silver nanoparticle sheets
JP2012233880A5 (ko)
EP2487717A3 (en) Photoelectric conversion element, photoelectric conversion apparatus and image sensing system
WO2015067961A3 (en) Skin-print fluorescence analysis method and apparatus
EP2793016A3 (en) Analysis device, analysis method, optical element and electronic apparatus for analysis device and analysis method, and method of designing optical element

Legal Events

Date Code Title Description
121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 10846719

Country of ref document: EP

Kind code of ref document: A2

NENP Non-entry into the national phase

Ref country code: DE

WWE Wipo information: entry into national phase

Ref document number: 13581104

Country of ref document: US

122 Ep: pct application non-entry in european phase

Ref document number: 10846719

Country of ref document: EP

Kind code of ref document: A2