WO2011105443A1 - ネガ型感光性樹脂組成物、層間絶縁膜及びその形成方法 - Google Patents
ネガ型感光性樹脂組成物、層間絶縁膜及びその形成方法 Download PDFInfo
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/60—Formation of materials, e.g. in the shape of layers or pillars of insulating materials
- H10P14/68—Organic materials, e.g. photoresists
- H10P14/683—Organic materials, e.g. photoresists carbon-based polymeric organic materials, e.g. polyimides, poly cyclobutene or PVC
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F2/00—Processes of polymerisation
- C08F2/46—Polymerisation initiated by wave energy or particle radiation
- C08F2/48—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light
- C08F2/50—Polymerisation initiated by wave energy or particle radiation by ultraviolet or visible light with sensitising agents
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F222/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
- C08F222/10—Esters
- C08F222/1006—Esters of polyhydric alcohols or polyhydric phenols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F222/00—Copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical and containing at least one other carboxyl radical in the molecule; Salts, anhydrides, esters, amides, imides, or nitriles thereof
- C08F222/10—Esters
- C08F222/1006—Esters of polyhydric alcohols or polyhydric phenols
- C08F222/103—Esters of polyhydric alcohols or polyhydric phenols of trialcohols, e.g. trimethylolpropane tri(meth)acrylate
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08F—MACROMOLECULAR COMPOUNDS OBTAINED BY REACTIONS ONLY INVOLVING CARBON-TO-CARBON UNSATURATED BONDS
- C08F277/00—Macromolecular compounds obtained by polymerising monomers on to polymers of carbocyclic or heterocyclic monomers as defined respectively in group C08F32/00 or in group C08F34/00
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/027—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds
- G03F7/032—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders
- G03F7/033—Non-macromolecular photopolymerisable compounds having carbon-to-carbon double bonds, e.g. ethylenic compounds with binders the binders being polymers obtained by reactions only involving carbon-to-carbon unsaturated bonds, e.g. vinyl polymers
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/004—Photosensitive materials
- G03F7/038—Macromolecular compounds which are rendered insoluble or differentially wettable
- G03F7/0382—Macromolecular compounds which are rendered insoluble or differentially wettable the macromolecular compound being present in a chemically amplified negative photoresist composition
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/40—Treatment after imagewise removal, e.g. baking
- G03F7/405—Treatment with inorganic or organometallic reagents after imagewise removal
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P76/00—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography
- H10P76/20—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials
- H10P76/204—Manufacture or treatment of masks on semiconductor bodies, e.g. by lithography or photolithography of masks comprising organic materials of organic photoresist masks
- H10P76/2041—Photolithographic processes
Definitions
- the present invention relates to a negative photosensitive resin composition, an interlayer insulating film, and a method for forming the same.
- TFT Thin film transistor
- magnetic head elements integrated circuit elements
- solid-state image pickup tube elements solid-state image pickup tube elements
- other electronic components are generally provided with interlayer insulation to insulate the wiring arranged in layers.
- a film is provided (see Patent Document 1).
- a negative photosensitive resin composition is widely used since the number of steps for obtaining a required pattern shape is small and a material having sufficient flatness is preferable (see Patent Document 2). ).
- JP 2000-10089 A Japanese Patent No. 3650985
- the TFT type liquid crystal display element is manufactured through a process of forming a transparent electrode film on an interlayer insulating film and further forming a liquid crystal alignment film thereon. At this time, since the interlayer insulating film is exposed to high temperature conditions in the process of forming the transparent electrode film, sufficient resistance to this is required.
- the present invention has been made in view of the above circumstances, and forms an interlayer insulating film having sufficiently excellent properties such as resolution, transparency, heat resistance, heat discoloration resistance, and solvent resistance even when the film thickness is increased.
- An object of the present invention is to provide a negative photosensitive resin composition.
- an object of this invention is to provide the interlayer insulation film formed from the negative photosensitive resin composition which concerns, and its formation method.
- the present invention is a negative type containing (A) a cyclic olefin resin containing a repeating unit represented by the following general formula (1), (B) a polyfunctional acrylic monomer, and (C) a photopolymerization initiator.
- a photosensitive resin composition is provided.
- R 1 , R 2 , R 3 and R 4 each independently represent a hydrogen atom, an alkyl group having 1 to 15 carbon atoms, an alkenyl group having 2 to 20 carbon atoms, or a cyclohexane having 5 to 15 carbon atoms.
- the negative photosensitive resin composition having the above-described configuration can form an interlayer insulating film having sufficiently excellent properties such as resolution, transparency, heat resistance, heat discoloration resistance, and solvent resistance even when the film thickness is increased.
- a cyclic olefin resin is represented by the general formula (1) preferably contains a structural unit R 1, R 2, R 3 and R 4 are hydrogen atoms.
- the cyclic olefin resin (A) is a structural unit represented by the above general formula (1), and any one of R 1 , R 2 , R 3 and R 4 is an alkylcarbonyloxy group having 2 to 20 carbon atoms. It is preferable to contain.
- the present invention relates to a negative photosensitive resin composition used in a method for forming an interlayer insulating film having a step of irradiating an ultraviolet ray having a wavelength of 400 nm or less onto at least a part of a film formed from the negative photosensitive resin composition.
- I will provide a.
- the negative photosensitive resin composition of the present invention preferably further contains (D) an alkali-soluble resin.
- the present invention provides an interlayer insulating film formed from the above negative photosensitive resin composition.
- the present invention includes a step of irradiating at least a part of a film formed from the negative photosensitive resin composition, a step of developing the film after the light irradiation, and the film after development. And a step of forming an interlayer insulating film by baking.
- a negative photosensitive resin composition capable of forming an interlayer insulating film having excellent properties such as resolution, transparency, heat resistance, heat discoloration resistance and solvent resistance even when the film thickness is increased. It becomes possible to provide.
- the negative photosensitive resin composition according to this embodiment contains (A) a cyclic olefin resin, (B) a polyfunctional acrylic monomer, and (C) a photopolymerization initiator.
- A a cyclic olefin resin
- B a polyfunctional acrylic monomer
- C a photopolymerization initiator
- Cyclic olefin resin- (A) Cyclic olefin resin which concerns on this embodiment is a polymer which has a repeating unit represented by following General formula (1).
- R 1 , R 2 , R 3 and R 4 are each independently a hydrogen atom, an alkyl group having 1 to 15 carbon atoms, an alkenyl group having 2 to 20 carbon atoms, a cycloalkyl group having 5 to 15 carbon atoms, a carbon atom
- R 1 , R 2 , R 3 , and R 4 are each independently a hydrogen atom, an alkyl group having 1 to 15 carbon atoms, an alkenyl group having 2 to 20 carbon atoms, an aryl group having 6 to 15 carbon atoms, or The substituent is selected from an alkoxy group having 6 to 20 carbon atoms and an alkylcarbonyloxy group having 2 to 20 carbon atoms.
- hydrolyzable silyl group examples include trimethoxysilyl and methyldimethoxysilyl.
- alkylcarbonyloxy group having 2 to 20 carbon atoms include methyl ester, t-butyl ester, 2-ethylhexyl ester, benzyl ester, cyclopentyl ester, cyclohexyl ester and allyl ester.
- methyl ester and benzyl ester are particularly preferably used from the viewpoint of heat resistance.
- the cyclic olefin resin (A) used in this embodiment is represented by the above general formula (1), and R 1 , R 2 , R 3, and R 4 are each a structural unit represented by the formula (1 ), Preferably 1 mol% or more, more preferably 10 mol% or more, based on the total amount of structural units. When this ratio is 1 mol% or more, the heat resistance of the obtained negative photosensitive resin composition tends to be improved.
- the proportion is preferably 60 mol% or less, and more preferably 50 mol% or less. When the said ratio is 60 mol% or less, it exists in the tendency for the solubility to the solvent for negative photosensitive resin composition preparation to improve.
- the (A) cyclic olefin resin used in the present embodiment is represented by the above general formula (1), and any one of R 1 , R 2 , R 3 and R 4 is an alkylcarbonyloxy group having 2 to 20 carbon atoms. It is preferable that 1 mol% or more is included on the basis of the whole quantity of the structural unit of Formula (1) in a cyclic olefin, and it is more preferable that 10 mol% or more is included. When this ratio is 1 mol% or more, there exists a tendency for the effect that the solubility to the solvent for negative photosensitive resin composition preparation improves. The proportion is preferably 60 mol% or less, and more preferably 50 mol% or less. When the said ratio is 60 mol% or less, it exists in the tendency for the effect that the heat resistance of the negative photosensitive resin composition obtained improves.
- the (A) cyclic olefin resin can be produced by addition copolymerization of a monomer represented by the following general formula (2) in a solvent in the presence of a metal catalyst.
- a solvent used for manufacture of cyclic olefin resin for example, aliphatic hydrocarbons such as pentane, hexane and heptane, alicyclic hydrocarbons such as cyclohexane, aromatic hydrocarbons such as benzene, toluene and xylene, Examples include halogenated hydrocarbons such as dichloromethane, chloroform and chlorobenzene, nitrogen-containing hydrocarbons such as nitromethane, nitrobenzene and acetonitrile, and ethers such as diethyl ether, dioxane and tetrahydrofuran. These solvents may be used alone or in combination of two or more.
- the catalyst (E) used for the polymerization of the cyclic olefin resin includes at least cyclopentadienyl as one transition metal selected from Group 8 element, Group 9 element and Group 10 element of the periodic table.
- a complex in which a system ligand is coordinated is preferred. Specific examples include iron (Fe), cobalt (Co), nickel (Ni), ruthenium (Ru), rhodium (Rh), palladium (Pd), and platinum (Pt).
- preferred elements from the viewpoint of increasing the polymerization activity of the catalyst are cobalt, nickel, palladium, and platinum, and it is particularly preferable to use palladium.
- co-catalyst (F) used for the polymerization of the cyclic olefin resin one that promotes dissociation of the ligand of the complex forming the catalyst (E) is preferable.
- the ionic compound which combined the non-coordinating anion and cation illustrated below is mentioned.
- Non-coordinating anions include, for example, tetra (phenyl) borate, tetra (fluorophenyl) borate, tetrakis (difluorophenyl) borate, tetrakis (trifluorophenyl) borate, tetrakis (tetrafluorophenyl) borate, tetrakis (pentafluoro) Phenyl) borate, tetrakis (tetrafluoromethylphenyl) borate, tetra (triyl) borate, tetra (xylyl) borate, (triphenyl, pentafluorophenyl) borate, [tris (pentafluorophenyl), phenyl] borate and tridecahydride -7,8-dicarbaound decaborate.
- Examples of the cation include a carbonium cation, an oxonium cation, an ammonium cation, a phosphonium cation, a cycloheptyltrienyl cation, and a ferrocenium cation having a transition metal.
- the carbonium cation include trisubstituted carbonium cations such as triphenylcarbonium cation and trisubstituted phenylcarbonium cation.
- the tri-substituted phenyl carbonium cation include tri (methylphenyl) carbonium cation and tri (dimethylphenyl) carbonium cation.
- ammonium cations include trialkylammonium cations such as trimethylammonium cation, triethylammonium cation, tripropylammonium cation, tributylammonium cation and tri (n-butyl) ammonium cation, N, N-diethylanilinium cation and N N, N-dialkylanilinium cations such as N, N-2,4,6-pentamethylanilinium cation, and dialkylammonium cations such as di (isopropyl) ammonium cation and dicyclohexylammonium cation.
- trialkylammonium cations such as trimethylammonium cation, triethylammonium cation, tripropylammonium cation, tributylammonium cation and tri (n-butyl) ammonium cation, N, N-diethylanilinium cation
- phosphonium cation examples include triarylphosphonium cations such as triphenylphosphonium cation, tri (methylphenyl) phosphonium cation and tri (dimethylphenyl) phosphonium cation.
- Examples of the ionic compound include trityl tetra (pentafluorophenyl) borate, triphenylcarbonium tetra (fluorophenyl) borate, N, N-dimethylanilinium tetra (pentafluorophenyl) borate, and 1,1′-dimethyl. Ferrocenium tetra (pentafluorophenyl) borate.
- the ratio between the catalyst (E) and the cocatalyst (F) varies depending on various conditions and is not uniquely determined, but is usually 1 / 0.1 in terms of E / F (molar ratio). Is preferably 1 / 10,000, more preferably 1 / 0.5 to 1/5000, and still more preferably 1/1 to 1/2000.
- the polystyrene-equivalent weight average molecular weight (hereinafter referred to as “Mw”) of the (A) cyclic olefin resin in the present embodiment is preferably 2 ⁇ 10 3 to 2 ⁇ 10 5 , and preferably 2 ⁇ 10 4 to 1.8 ⁇ 10 5. More preferred.
- Mw is less than 2 ⁇ 10 3 , the resulting film tends to have reduced heat resistance and surface hardness.
- Mw exceeds 2 ⁇ 10 5 , developability and solubility in a solvent for preparing a photosensitive resin composition tend to be lowered.
- a bifunctional or higher polyfunctional (meth) acrylate is used. Specifically, dipentaerythritol hexaacrylate, dipentaerythritol hexamethacrylate, dipentaerythritol pentaacrylate, dipentaerythritol pentamethacrylate, pentaerythritol tetraacrylate, pentaerythritol tetramethacrylate, pentaerythritol triacrylate, pentaerythritol trimethacrylate, penta Erythritol diacrylate, pentaerythritol dimethacrylate, tetramethylolpropane tetraacrylate, tetramethylolpropane tetramethacrylate, tetramethylolmethane tetra
- the polyfunctional acrylic monomer can be easily obtained as a commercial product.
- Pentaerythritol tetramethacrylate, pentaerythritol triacrylate, pentaerythritol trimethacrylate, pentaerythritol diacrylate and pentaerythritol dimethacrylate are particularly preferred.
- Photopolymerization initiator examples include a photosensitive radical polymerization initiator.
- the photosensitive radical polymerization initiator include ⁇ -diketones such as benzyl and diacetyl, acyloins such as benzoin, acyloin ethers such as benzoin methyl ether, benzoin ethyl ether and benzoin isopropyl ether, thioxanthone, 2,4 Benzophenones such as diethylthioxanthone, thioxanthone-4-sulfonic acid, benzophenone, 4,4′-bis (dimethylamino) benzophenone and 4,4′-bis (diethylamino) benzophenone, acetophenone, p-dimethylaminoacetophenone, ⁇ , ⁇ '-dimethoxyacetoxybenzophenone, 2,2'-d
- photosensitive radical polymerization initiators examples include IRGACURE-184, 369, 500, 651, 907, 1700, 819, 124, 1000, 2959, 149, 1800, 1850, OXE-01, Darocur-1173, 1116, 2959, 1664, 4043 (above, manufactured by Ciba Specialty Chemicals), KAYACURE-DETX, MBP, DMBI, EPA, Same OA (manufactured by Nippon Kayaku Co., Ltd.), LUCIRINTPO (manufactured by BASF Co. LTD), VICURE-10, same as 55 (manufactured by STAFFFER Co. LTD), TRIGONALP1 (manufactured by AKZO Co.
- ⁇ , ⁇ '-dimethoxyacetoxybenzophenone, 2-methyl (4- (methylthio) phenyl) is considered because of its solubility in the photosensitive resin composition preparation liquid and transparency after exposure.
- 2-Morpholin-1-propanone and 2-methyl (4- (methylthio) phenyl) -2-morpholino-1-propanone are particularly preferred.
- the alkali-soluble resin according to the present embodiment is a linear organic high molecular polymer, and has at least one molecule (preferably, a molecule having an acrylic copolymer or a styrene copolymer as a main chain). It can be suitably selected from alkali-soluble resins having a group that promotes alkali solubility (for example, carboxyl group, phosphoric acid group, sulfonic acid group, etc.). Among these, more preferably, it is soluble in an organic solvent and can be developed with a weak alkaline aqueous solution.
- a known radical polymerization method For the production of the alkali-soluble resin, for example, a known radical polymerization method can be applied. Polymerization conditions such as temperature, pressure, type and amount of radical polymerization initiator, and type of solvent when producing an alkali-soluble resin by radical polymerization can be easily set by those skilled in the art, and experimental conditions It is also possible to determine.
- a polymer having a carboxylic acid in the side chain is preferable.
- JP-A-59-44615, JP-B-54-34327, JP-B-58-12777, JP-B-54-25957, JP-A-59-53836 and JP-A-59-71048 As described, methacrylic acid copolymer, acrylic acid copolymer, itaconic acid copolymer, crotonic acid copolymer, maleic acid copolymer, partially esterified maleic acid copolymer, carboxyl in side chain Examples include acidic cellulose derivatives having an acid and polymer having an acid anhydride added to a polymer having a hydroxyl group, and a polymer having a (meth) acryloyl group in the side chain is also preferred.
- benzyl (meth) acrylate / (meth) acrylic acid copolymers and multi-component copolymers composed of benzyl (meth) acrylate / (meth) acrylic acid / other monomers are preferable.
- those obtained by copolymerizing 2-hydroxyethyl methacrylate are also useful.
- the polymer can be used by mixing in an arbitrary amount.
- 2-hydroxypropyl (meth) acrylate / polystyrene macromonomer / benzyl methacrylate / methacrylic acid copolymer 2-hydroxy-3-phenoxypropyl acrylate / polymethyl methacrylate macro described in JP-A-7-140654
- Monomer / benzyl methacrylate / methacrylic acid copolymer, 2-hydroxyethyl methacrylate / polystyrene macromonomer / methyl methacrylate / methacrylic acid copolymer and 2-hydroxyethyl methacrylate / polystyrene macromonomer / benzyl methacrylate / methacrylic acid copolymer Can be mentioned.
- a specific structural unit of the alkali-soluble resin is particularly preferably a copolymer of (meth) acrylic acid and another monomer copolymerizable therewith.
- examples of other monomers copolymerizable with the (meth) acrylic acid include alkyl (meth) acrylate, aryl (meth) acrylate, and vinyl compounds.
- the hydrogen atom of the alkyl group and the aryl group may be substituted with a substituent.
- alkyl (meth) acrylate and aryl (meth) acrylate include methyl (meth) acrylate, ethyl (meth) acrylate, propyl (meth) acrylate, butyl (meth) acrylate, isobutyl (meth) acrylate, pentyl ( Mention may be made of (meth) acrylate, hexyl (meth) acrylate, octyl (meth) acrylate, phenyl (meth) acrylate, benzyl acrylate, tolyl acrylate, naphthyl acrylate and cyclohexyl acrylate.
- R 5 represents a hydrogen atom or an alkyl group having 1 to 5 carbon atoms
- R 7 represents an alkyl group having 1 to 8 carbon atoms or 6 carbon atoms. Represents -12 aralkyl groups. Can be mentioned.
- the negative photosensitive resin composition is prepared by mixing the components of (A) cyclic olefin resin, (B) polyfunctional acrylic monomer, and (C) photopolymerization initiator.
- the negative photosensitive resin composition is preferably used in the form of a solution after being dissolved in an appropriate solvent.
- (A) a cyclic olefin resin, (B) a polyfunctional acrylic monomer, (C) a photopolymerization initiator, and, if necessary, other compounding agents are mixed at a predetermined ratio to obtain a negative type solution.
- a photosensitive resin composition can be prepared.
- the polyfunctional acrylic monomer is preferably 10 to 150 parts by weight, more preferably 40 to 40 parts by weight with respect to 10 parts by weight of the (A) cyclic olefin resin. It is contained at a ratio of 120 parts by weight.
- B When the polyfunctional acrylic monomer is less than 10 parts by weight, sufficient photosensitivity tends not to be obtained. On the other hand, when it exceeds 150 parts by weight, the breaking strength tends to decrease.
- the (C) photopolymerization initiator is preferably contained in an amount of 1 to 40 parts by weight, more preferably 3 to 35 parts by weight.
- C When the photopolymerization initiator is less than 1 part by weight, heat resistance, surface hardness and chemical resistance tend not to be obtained. On the other hand, when it exceeds 40 weight part, it exists in the tendency for transparency to fall.
- (A) a cyclic olefin resin, (B) a polyfunctional acrylic monomer, and (C) a photopolymerization initiator are dissolved. Those that do not react with each component are used.
- alcohols such as methanol and ethanol, ethers such as tetrahydrofuran, glycol ethers such as ethylene glycol monomethyl ether and ethylene glycol monoethyl ether, ethylene glycol alkyl ether acetates such as methyl cellosolve acetate and ethyl cellosolve acetate
- Diethylene glycols such as diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol dimethyl ether, diethylene glycol ethyl methyl ether and diethylene glycol diethyl ether, propylene glycol methyl ether, propylene glycol ethyl ether, propylene glycol propyl ether and propylene glycol butyl ether
- Propylene glycol monoalkyl ethers such as propylene glycol methyl ether acetate, propylene glycol ethyl ether acetate, propylene glycol alkyl ether
- propylene glycol alkyl ether acetates propylene glycol alkyl ether acetates and aromatic hydrocarbons are preferably used because of their solubility, reactivity with each component, and ease of formation of a coating film. .
- a high boiling point solvent can be used in combination with the above solvent.
- the high boiling point solvent that can be used in combination include N-methylformamide, N, N-dimethylformamide, N-methylformanilide, N-methylacetamide, N, N-dimethylacetamide, N-methylpyrrolidone, dimethylsulfoxide, and benzylethyl.
- the negative photosensitive resin composition of the present embodiment may contain other components in addition to the above as necessary, as long as the object of the present invention is not impaired.
- the negative photosensitive resin composition prepared as described above can be used after being filtered using a Millipore filter having a pore diameter of about 0.2 to 0.5 ⁇ m.
- the method for forming an interlayer insulating film includes at least the following steps. (1) a step of forming a film of the negative photosensitive resin composition on a substrate, (2) a step of irradiating at least a part of the film with light (hereinafter sometimes referred to as “exposure”); 3) a step of developing the film after exposure, and (4) a step of baking the film after development (hereinafter sometimes referred to as “baking”) to form an interlayer insulating film.
- light in the present embodiment means light including ultraviolet rays, far ultraviolet rays, X-rays, electron beams, molecular beams, ⁇ rays, synchrotron light, proton beams, and the like.
- the negative photosensitive resin composition is preferably formed as a liquid composition, a film is formed on the substrate surface, the solvent is removed by pre-baking, and the negative photosensitive resin composition A film is formed.
- the film forming method of the composition solution is not particularly limited, but a method by coating is preferable.
- a coating method an appropriate method such as a spray method, a roll coating method, a spin coating method, a slit die coating method, a bar coating method, and an ink jet method can be employed.
- the pre-baking conditions vary depending on the types of constituent components of the negative photosensitive resin composition and the usage ratio, but can be, for example, 60 to 130 ° C. for 30 seconds to 15 minutes.
- the film thickness of the film to be formed is preferably 5 to 20 ⁇ m after pre-baking.
- Process- (2) In the step, at least a part of the formed film is exposed.
- the exposure is usually performed through a photomask having a pattern of a predetermined shape.
- Examples of light used for exposure include ultraviolet rays such as i-rays (wavelength 365 nm), far ultraviolet rays such as KrF excimer laser and ArF excimer laser, X-rays such as synchrotron light, and charged particle beams such as electron beams. Can be mentioned. Of these lights, ultraviolet rays are preferred, ultraviolet rays having a wavelength of 400 nm or less are more preferred, and ultraviolet rays containing i-rays are even more preferred.
- the exposure amount is preferably about 50 to 10,000 J / m 2 .
- step (3) the film after exposure is developed to remove unexposed portions, thereby forming a pattern having a predetermined shape.
- Developers used for development include sodium hydroxide, potassium hydroxide, sodium carbonate, sodium silicate, sodium metasilicate, ammonia, ethylamine, n-propylamine, diethylamine, diethylaminoethanol, di-n-propylamine, triethylamine Methyldiethylamine, dimethylethanolamine, triethanolamine, tetramethylammonium hydroxide, tetraethylammonium hydroxide, pyrrole, piperidine, 1,8-diazabicyclo [5,4,0] -7-undecene and 1,5-diazabicyclo [
- An aqueous solution of an alkaline compound such as 4,3,0] -5-nonene is preferred.
- An appropriate amount of a water-soluble organic solvent such as methanol and ethanol and a surfactant can be added to the aqueous solution of the alkaline compound.
- the negative photosensitive resin composition does not contain insoluble components such as fillers and pigments
- various organic solvents that dissolve the constituent components can also be used as the developer.
- an appropriate method such as a liquid filling method, a dipping method, a rocking dipping method, a shower method, or the like can be employed.
- the development time varies depending on the composition of the negative photosensitive resin composition, but can be, for example, 30 to 300 seconds.
- the negative photosensitive resin composition conventionally used for forming an interlayer insulating film has a development time of more than 20 seconds from the optimum condition, a defect such as peeling occurs in the formed pattern.
- a good pattern can be formed even if the excess time from the optimum development time is 30 seconds or more, and the product yield is increased. improves.
- the film after development is post-exposed as necessary, and then baked by a heating device such as a hot plate and an oven to cure the film and form an interlayer insulating film.
- a heating device such as a hot plate and an oven to cure the film and form an interlayer insulating film.
- the light used for the post-exposure include ultraviolet rays such as i-rays (wavelength 365 nm), far ultraviolet rays such as KrF excimer laser and ArF excimer laser, X-rays such as synchrotron light, and charged particle beams such as electron beams. Can be mentioned.
- ultraviolet rays are preferred, ultraviolet rays having a wavelength of 400 nm or less are more preferred, and ultraviolet rays containing i-rays are even more preferred.
- the exposure amount for post-exposure is preferably 50 to 10,000 J / m 2 .
- the baking conditions vary depending on the types and proportions of the constituent components of the negative photosensitive resin composition, the desired pattern shape, and the heating device used. In the case of a hot plate, for example, 150 to 240 ° C. In the case of an oven, for example, the temperature is 150 to 240 ° C. for 30 to 90 minutes. Moreover, the step baking method etc. which heat-process twice or more can also be employ
- the desired interlayer insulating film can be formed on the substrate.
- the obtained interlayer insulating film is excellent in various properties such as resolution, transparency, heat resistance, heat discoloration resistance and solvent resistance even when it is thickened.
- various liquid crystals including TFT-type liquid crystal display elements It can be used very suitably for electronic components such as display elements, magnetic head elements, integrated circuit elements, and solid-state imaging elements.
- an interlayer insulating film having excellent characteristics can be easily formed with a high product yield.
- Example 1 Preparation of negative photosensitive resin composition- (B) 10 g of Aronix M-305 (trade name, manufactured by Toagosei Co., Ltd.) as a polyfunctional acrylic monomer is dissolved in 36.4 g of toluene, and R 1 , R 2 and R 4 are hydrogenated in the resulting solution.
- Aronix M-305 trade name, manufactured by Toagosei Co., Ltd.
- a monomer in which R 3 is a methyl ester group and a monomer in which R 1 , R 2 , R 3 and R 4 are hydrogen atoms were copolymerized at a 1: 1 (molar ratio)
- A 1 g of cyclic olefin resin and
- C 2-methyl-1- (4-methylthiophenyl) -2-morpholinopropan-1-one (manufactured by Ciba Specialty Chemicals, trade name: IRGACURE- as photopolymerization initiator) 907) 0.6 g is added, and filtered through a membrane filter having a pore size of 0.5 ⁇ m, and the negative photosensitive resin composition (S-1) in a solution state in which the total solid content concentration is 30% by mass Adjust Made.
- the negative photosensitive resin composition (S-1) was applied on a glass substrate using a desktop coater, and then pre-baked in an explosion-proof dryer at 80 ° C. for 10 minutes to form a coating film.
- the coating film was exposed to ultraviolet rays having a wavelength of 365 nm so that the integrated exposure amount was 100 mJ / cm 2 through a photomask having a pattern of a predetermined shape.
- a 2.38 mass% tetramethylammonium hydroxide aqueous solution is used for dipping development at 25 ° C. for 5 minutes, and then washed with pure water for 1 minute to remove unnecessary portions and obtain a patterned thin film. It was.
- the obtained patterned thin film was baked in an oven at 200 ° C. for 30 minutes and cured to obtain an interlayer insulating film having a predetermined pattern shape and a film thickness of 50 ⁇ m.
- the transmittance at a wavelength of 400 nm was measured and evaluated using a double beam spectrophotometer U-2900 (trade name, manufactured by Hitachi, Ltd.). When this transmittance exceeds 90%, it can be said that the transparency is good (A).
- Example 2 In Example 1, in the same manner as in Example 1 except that 10 g of Aronix M-402 (trade name, manufactured by Toagosei Co., Ltd.) was used instead of 10 g of Aronix M-305.
- a photosensitive resin composition (S-2) was prepared to obtain an interlayer insulating film having a predetermined pattern shape and a film thickness of 40 ⁇ m. The evaluation results are shown in Table 1.
- both the interlayer insulating films of Examples 1 and 2 were excellent in resolution, transparency, heat resistance, heat discoloration resistance and solvent resistance even when the film thickness was increased.
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Abstract
Description
本実施形態に係る(A)環状オレフィン樹脂は、下記一般式(1)で表される繰り返し単位を有する重合体である。
本実施形態に係る(B)多官能性アクリルモノマーとしては、2官能以上の多官能(メタ)アクリレートが用いられる。具体的には、ジペンタエリスリトールヘキサアクリレート、ジペンタエリスリトールヘキサメタクリレート、ジペンタエリスリトールペンタアクリレート、ジペンタエリスリトールペンタメタクリレート、ペンタエリスリトールテトラアクリレート、ペンタエリスリトールテトラメタクリレート、ペンタエリスリトールトリアクリレート、ペンタエリスリトールトリメタクリレート、ペンタエリスリトールジアクリレート、ペンタエリスリトールジメタクリレート、テトラメチロールプロパンテトラアクリレート、テトラメチロールプロパンテトラメタクリレート、テトラメチロールメタンテトラアクリレート、テトラメチロールメタンテトラメタクリレート、トリメチロールプロパントリアクリレート、トリメチロールプロパントリメタクリレート、1,3,5-トリアクリロイルヘキサヒドロ-S-トリアジン、1,3,5-トリメタクリロイルヘキサヒドロ-S-トリアジン、トリス(ヒドロキシエチルアクリロイル)イソシアヌレート、トリス(ヒドロキシエチルメタクリロイル)イソシアヌレート、トリアクリロイルホルマール、トリメタクリロイルホルマール、1,6-ヘキサンジオールアクリレート、1,6-ヘキサンジオールメタクリレート、ネオペンチルグリコールジアクリレート、ネオペンチルグリコールジメタクリレート、エタンジオールジアクリレート、エタンジオールジメタクリレート、2-ヒドロキシプロパンジオールジアクリレート、2-ヒドロキシプロパンジオールジメタクリレート、ジエチレングリコールジアクリレート、ジエチレングリコールジメタクリレート、イソプロピレングリコールジアクリレート、イソプロピレングリコールジメタクリレート、トリエチレングリコールジアクリレート、トリエチレングリコールジメタクリレート、N,N’-ビス(アクリロイル)システイン、N,N’-ビス(メタクリロイル)システイン、チオジグリコールジアクリレート、チオジグリコールジメタクリレート、ビスフェノールAジアクリレート、ビスフェノールAジメタクリレート、ビスフェノールFジアクリレート、ビスフェノールFジメタクリレート、ビスフェノールSジアクリレート、ビスフェノールSジメタクリレート、ビスフェノキシエタノールフルオレンジアクリレート、ビスフェノキシエタノールフルオレンジメタクリレート、ジアリルエーテルビスフェノールA、o-ジアリルビスフェノールA、マレイン酸ジアリル及びトリアリルトリメリテートが挙げられる。2官能以上の多官能(メタ)アクリレートを用いることで、機械的強度が増すといった効果が得られる。
本実施形態に係る(C)光重合開始剤としては、感光性ラジカル重合開始剤を挙げることができる。感光性ラジカル重合開始剤としては、例えば、ベンジル及びジアセチル等のα-ジケトン類、ベンゾイン等のアシロイン類、ベンゾインメチルエーテル、ベンゾインエチルエーテル及びベンゾインイソプロピルエーテル等のアシロインエーテル類、チオキサントン、2,4-ジエチルチオキサントン、チオキサントン-4-スルホン酸、ベンゾフェノン、4,4’-ビス(ジメチルアミノ)ベンゾフェノン及び4,4’-ビス(ジエチルアミノ)ベンゾフェノン等のベンゾフェノン類、アセトフェノン、p-ジメチルアミノアセトフェノン、α,α’-ジメトキシアセトキシベンゾフェノン、2,2’-ジメトキシ-2-フェニルアセトフェノン、p-メトキシアセトフェノン、2-メチル(4-(メチルチオ)フェニル)-2-モルフォリノ-1-プロパノン及び2-ベンジル-2-ジメチルアミノ-1-(4-モルフォリノフェニル)-ブタン-1-オン等のアセトフェノン類、アントラキノン及び1,4-ナフトキノン等のキノン類、フェナシルクロライド、トリブロモメチルフェニルスルホン及びトリス(トリクロロメチル)-s-トリアジン等のハロゲン化合物、2,4,6-トリメチルベンゾイルジフェニルホスフィンオキサイド、ビス(2,6-ジメトキシベンゾイル)-2,4,4-トリメチル-ペンチルホスフィンオキサイド及びビス(2,4,6-トリメチルベンゾイル)フェニルホスフィンオキサイド等のアシルホスフィンオキサイド、並びに、ジ-t-ブチルパーオキサイド等の過酸化物等が挙げられる。感光性ラジカル重合開始剤を用いることで、ネガ型感光性樹脂組成物の光に対する感度が向上するといった効果が得られる。
本実施形態に係るアルカリ可溶性樹脂としては、線状有機高分子重合体であって、分子(好ましくは、アクリル系共重合体、スチレン系共重合体を主鎖とする分子)中に少なくとも1つのアルカリ可溶性を促進する基(例えばカルボキシル基、リン酸基及びスルホン酸基等)を有するアルカリ可溶性樹脂の中から適宜選択することができる。このうち、更に好ましくは、有機溶媒に可溶で弱アルカリ水溶液によって現像可能なものである。
本実施形態に係るネガ型感光性樹脂組成物は、上記(A)環状オレフィン樹脂、(B)多官能性アクリルモノマー及び(C)光重合開始剤の各成分を混合することによって調製される。上記ネガ型感光性樹脂組成物は、好適には、適当な溶媒に溶解して溶液状態で用いられる。例えば(A)環状オレフィン樹脂、(B)多官能性アクリルモノマー、(C)光重合開始剤、及び必要に応じ、その他の配合剤を、所定の割合で混合することによって、溶液状態のネガ型感光性樹脂組成物を調製することができる。
本実施形態に係る層間絶縁膜の形成方法は、少なくとも下記の工程を含んでいる。(1)上記ネガ型感光性樹脂組成物の膜を基板上に形成する工程、(2)上記膜の少なくとも一部に光を照射(以下、「露光」という場合がある。)する工程、(3)露光後の上記膜を現像する工程、(4)現像後の上記膜を焼成し(以下、「ベーク」という場合がある。)、層間絶縁膜を形成する工程。
(1)工程においては、ネガ型感光性樹脂組成物を、好ましくは液状組成物として、基板表面に膜を形成し、プレベークを行うことによって溶媒を除去して、ネガ型感光性樹脂組成物の膜を形成する。
(2)工程においては、形成された上記膜の少なくとも一部に露光する。この場合、上記膜の一部のみに露光する際には、通常、所定形状のパターンを有するフォトマスクを介して露光する。
(3)工程においては、露光後の上記膜を現像して、未露光部を除去することによって、所定形状のパターンを形成する。
(4)工程においては、現像後の上記膜を、必要に応じて後露光したのち、ホットプレート及びオーブン等の加熱装置によってベークすることで、上記膜を硬化させ、層間絶縁膜を形成する。後露光に用いられる光としては、例えば、i線(波長365nm)等の紫外線、KrFエキシマレーザー及びArFエキシマレーザー等の遠紫外線、シンクロトロン光等のX線、並びに、電子線等の荷電粒子線を挙げることができる。
-ネガ型感光性樹脂組成物の調製-
(B)多官能性アクリルモノマーとしてアロニックスM-305(東亞合成(株)製、商品名)10gをトルエン36.4gに溶解し、得られた溶液に、R1、R2及びR4が水素原子であり、R3がメチルエステル基であるモノマーと、R1、R2、R3及びR4が水素原子であるモノマーと、を1:1(モル比)で共重合させた(A)環状オレフィン樹脂1gと、(C)光重合開始剤として2-メチル-1-(4-メチルチオフェニル)-2-モルフォリノプロパン-1-オン(チバ・スペシャルティ・ケミカルズ社製、商品名:IRGACURE-907)0.6gと、を加え、孔径0.5μmのメンブランフィルターでろ過して、全体の固形分濃度が30質量%であるような溶液状態のネガ型感光性樹脂組成物(S-1)を調製した。
ネガ型感光性樹脂組成物(S-1)をガラス基板上に、卓上塗工機を用いて塗布した後、80℃の防爆乾燥機内で10分間プレベークして、塗膜を形成した。次いで、この塗膜に所定形状のパターンを有するフォトマスクを介して、波長365nmの紫外線を積算露光量が100mJ/cm2となるように露光した。その後、2.38質量%のテトラメチルアンモニウムヒドロキシド水溶液を用い、25℃で5分間ディッピング現像したのち、純水で1分間洗浄することによって、不要な部分を除去して、パターン状薄膜を得た。
次いで、下記の要領で評価を行った。評価結果を、層間絶縁膜の膜厚と併せて(以下同様)、表1に示す。
得られた層間絶縁膜において、直径50μmのマスクパターンを用いて解像度を評価した。50μm平方のホールパターンが解像できる場合を良好(A)、50μm平方のホールパターンが解像できない場合を不良(B)として評価した。
得られた層間絶縁膜の連続膜部分について、波長400nmにおける透過率を、ダブルビーム分光光度計 U-2900((株)日立製作所製、商品名)を用いて測定して評価した。この透過率が90%を超えるとき、透明性が良好(A)であるといえる。
得られた層間絶縁膜を、220℃のオーブン中で60分加熱し、加熱前後での膜厚の変化率(%)〔=(加熱前の膜厚-加熱後の膜厚)×100/加熱前の膜厚〕を(株)ミツトヨ製デジマチックインジケーターを用いて測定して評価した。この変化率が5%以内のとき、耐熱性が良好(A)であるといえる。
得られた層間絶縁膜を、250℃のオーブンを窒素パージし、その中で60分加熱し、層間絶縁膜の連続膜部分について、波長400nmにおける透過率を、ダブルビーム分光光度計 U-2900(商品名、(株)日立製作所製)を用いて測定して、加熱前後での透過率の変化率(%)〔=(加熱前の透過率-加熱後の透過率)×100/加熱前の透過率〕によって評価した。この変化率が5%以内のとき、耐熱変色性が良好(A)であるといえる。
層間絶縁膜を形成したガラス基板を、50℃のN-メチルピロリドン中に15分間浸漬し、浸漬前後における層間絶縁膜の膜厚の変化率(%)〔=(浸漬後の膜厚-浸漬前の膜厚)×100/浸漬前の膜厚〕を(株)ミツトヨ製デジマチックインジケーターを用いて測定して評価した。この変化率が±10%以内のとき、耐溶媒性が良好(A)であるといえる。
実施例1において、アロニックスM-305 10gの代わりにアロニックスM-402(東亞合成(株)製、商品名)、10gを用いたこと以外は、実施例1と同様にして、溶液状態のネガ型感光性樹脂組成物(S-2)を調製して、所定のパターン形状を有する膜厚40μmの層間絶縁膜を得た。評価結果を表1に示す。
Claims (7)
- 下記一般式(1)で表される繰り返し単位:
(式中R1、R2、R3及びR4は、各々独立して水素原子、炭素数1~15のアルキル基、炭素数2~20のアルケニル基、炭素数5~15のシクロアルキル基、炭素数6~20のアリール基若しくは炭素数1~20のアルコキシ基、又は、加水分解性シリル基、炭素数2~20のアルコキシカルボニル基、炭素数4~20のトリアルキルシロキシカルボニル基、炭素数2~20のアルキルカルボニルオキシ基、炭素数3~20のアルケニルカルボニルオキシ基及びオキセタニル基から選ばれる置換基を示し、直接、又は、酸素原子、窒素原子若しくは硫黄原子を介して互いに連結されていてもよい。)を含む(A)環状オレフィン樹脂と、
(B)多官能性アクリルモノマーと、
(C)光重合開始剤と、を含有するネガ型感光性樹脂組成物。 - (A)環状オレフィン樹脂が、前記一般式(1)で表され、R1、R2、R3及びR4が水素原子である構成単位を含む請求項1に記載のネガ型感光性樹脂組成物。
- (A)環状オレフィン樹脂が、前記一般式(1)で表され、R1、R2、R3及びR4のいずれか一つが炭素数2~20のアルキルカルボニルオキシ基である構成単位を含む請求項1又は2に記載のネガ型感光性樹脂組成物。
- 当該ネガ型感光性樹脂組成物から形成された膜の少なくとも一部に波長400nm以下の紫外線を照射する工程を有する層間絶縁膜の形成方法に用いられる、請求項1~3のいずれか1項に記載のネガ型感光性樹脂組成物。
- (D)アルカリ可溶性樹脂を更に含有する請求項1~4のいずれか1項に記載のネガ型感光性樹脂組成物。
- 請求項1~5のいずれか1項に記載のネガ型感光性樹脂組成物から形成された層間絶縁膜。
- 請求項1~5のいずれか1項に記載のネガ型感光性樹脂組成物から形成された膜の少なくとも一部に光を照射する工程と、
光が照射された後の前記膜を現像する工程と、
現像後の前記膜を焼成し、層間絶縁膜を形成する工程と、を有する層間絶縁膜の形成方法。
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| JP2012211988A (ja) * | 2011-03-31 | 2012-11-01 | Nippon Zeon Co Ltd | ネガ型感光性樹脂組成物および電子部品 |
| JP2014232233A (ja) * | 2013-05-29 | 2014-12-11 | 住友ベークライト株式会社 | 感光性樹脂組成物および電子装置 |
| JP2014232232A (ja) * | 2013-05-29 | 2014-12-11 | 住友ベークライト株式会社 | 感光性樹脂組成物および電子装置 |
| WO2015080073A1 (ja) * | 2013-11-28 | 2015-06-04 | 日本ゼオン株式会社 | 積層体 |
| JPWO2015083395A1 (ja) * | 2013-12-03 | 2017-03-16 | 住友ベークライト株式会社 | ネガ型フォトレジスト用樹脂組成物、硬化膜及び電子装置 |
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| JP6183029B2 (ja) * | 2013-07-25 | 2017-08-23 | 日本ゼオン株式会社 | ネガ型感光性樹脂組成物および電子部品 |
| KR101564872B1 (ko) * | 2015-02-10 | 2015-10-30 | 동우 화인켐 주식회사 | 네가티브형 감광성 수지 조성물 |
| CN114265284B (zh) * | 2021-12-10 | 2024-11-08 | 深圳迪道微电子科技有限公司 | 一种高耐热共聚型负性光刻胶组合物及其制备方法 |
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- 2011-02-23 JP JP2011509751A patent/JP5333581B2/ja not_active Expired - Fee Related
- 2011-02-23 KR KR1020127024435A patent/KR20120132509A/ko not_active Withdrawn
- 2011-02-23 CN CN2011800109403A patent/CN102782579A/zh active Pending
- 2011-02-23 WO PCT/JP2011/054019 patent/WO2011105443A1/ja not_active Ceased
- 2011-02-25 TW TW100106488A patent/TWI413861B/zh not_active IP Right Cessation
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| JP2006293094A (ja) * | 2005-04-12 | 2006-10-26 | Mitsubishi Chemicals Corp | 光重合性組成物、画像形成材料及び画像形成材 |
| JP2008076860A (ja) * | 2006-09-22 | 2008-04-03 | Showa Highpolymer Co Ltd | 感光性樹脂組成物 |
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| JP2012211988A (ja) * | 2011-03-31 | 2012-11-01 | Nippon Zeon Co Ltd | ネガ型感光性樹脂組成物および電子部品 |
| JP2014232233A (ja) * | 2013-05-29 | 2014-12-11 | 住友ベークライト株式会社 | 感光性樹脂組成物および電子装置 |
| JP2014232232A (ja) * | 2013-05-29 | 2014-12-11 | 住友ベークライト株式会社 | 感光性樹脂組成物および電子装置 |
| WO2015080073A1 (ja) * | 2013-11-28 | 2015-06-04 | 日本ゼオン株式会社 | 積層体 |
| KR20160090826A (ko) * | 2013-11-28 | 2016-08-01 | 제온 코포레이션 | 적층체 |
| JPWO2015080073A1 (ja) * | 2013-11-28 | 2017-03-16 | 日本ゼオン株式会社 | 積層体 |
| KR102406577B1 (ko) | 2013-11-28 | 2022-06-07 | 제온 코포레이션 | 적층체 |
| JPWO2015083395A1 (ja) * | 2013-12-03 | 2017-03-16 | 住友ベークライト株式会社 | ネガ型フォトレジスト用樹脂組成物、硬化膜及び電子装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPWO2011105443A1 (ja) | 2013-06-20 |
| TW201133144A (en) | 2011-10-01 |
| JP2013101365A (ja) | 2013-05-23 |
| JP5333581B2 (ja) | 2013-11-06 |
| CN102782579A (zh) | 2012-11-14 |
| TWI413861B (zh) | 2013-11-01 |
| KR20120132509A (ko) | 2012-12-05 |
| CN104597712A (zh) | 2015-05-06 |
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