WO2011064221A3 - Sensormodul und herstellungsverfahren eines sensormoduls - Google Patents

Sensormodul und herstellungsverfahren eines sensormoduls Download PDF

Info

Publication number
WO2011064221A3
WO2011064221A3 PCT/EP2010/068053 EP2010068053W WO2011064221A3 WO 2011064221 A3 WO2011064221 A3 WO 2011064221A3 EP 2010068053 W EP2010068053 W EP 2010068053W WO 2011064221 A3 WO2011064221 A3 WO 2011064221A3
Authority
WO
WIPO (PCT)
Prior art keywords
sensor module
production method
recess
sensor
chip
Prior art date
Application number
PCT/EP2010/068053
Other languages
English (en)
French (fr)
Other versions
WO2011064221A2 (de
Inventor
Jan-Erik Hauschel
Thorsten Knittel
Stefan Pesahl
Willibald Reitmeier
Andreas Wildgen
Original Assignee
Continental Automotive Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Continental Automotive Gmbh filed Critical Continental Automotive Gmbh
Priority to RU2012126539/28A priority Critical patent/RU2012126539A/ru
Priority to BR112012012671A priority patent/BR112012012671A2/pt
Priority to US13/512,304 priority patent/US20130145844A1/en
Priority to CN201080053818XA priority patent/CN102741664A/zh
Priority to JP2012540406A priority patent/JP2013512422A/ja
Priority to EP10793180A priority patent/EP2504669A2/de
Publication of WO2011064221A2 publication Critical patent/WO2011064221A2/de
Publication of WO2011064221A3 publication Critical patent/WO2011064221A3/de

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/24Housings ; Casings for instruments
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01DMEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D11/00Component parts of measuring arrangements not specially adapted for a specific variable
    • G01D11/24Housings ; Casings for instruments
    • G01D11/245Housings for sensors
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/14Housings
    • G01L19/141Monolithic housings, e.g. molded or one-piece housings
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L19/00Details of, or accessories for, apparatus for measuring steady or quasi-steady pressure of a fluent medium insofar as such details or accessories are not special to particular types of pressure gauges
    • G01L19/14Housings
    • G01L19/148Details about the circuit board integration, e.g. integrated with the diaphragm surface or encapsulation
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01LMEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER, MECHANICAL EFFICIENCY, OR FLUID PRESSURE
    • G01L9/00Measuring steady of quasi-steady pressure of fluid or fluent solid material by electric or magnetic pressure-sensitive elements; Transmitting or indicating the displacement of mechanical pressure-sensitive elements, used to measure the steady or quasi-steady pressure of a fluid or fluent solid material, by electric or magnetic means
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805Shape
    • H01L2224/4809Loop shape
    • H01L2224/48091Arched
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/31Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape
    • H01L23/3107Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the arrangement or shape the device being completely enclosed
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/34Arrangements for cooling, heating, ventilating or temperature compensation ; Temperature sensing arrangements
    • H01L23/36Selection of materials, or shaping, to facilitate cooling or heating, e.g. heatsinks
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10TTECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
    • Y10T29/00Metal working
    • Y10T29/49Method of mechanical manufacture
    • Y10T29/49002Electrical device making

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Measuring Fluid Pressure (AREA)
  • Measuring Volume Flow (AREA)
  • Pressure Sensors (AREA)
  • Investigating Or Analyzing Materials By The Use Of Fluid Adsorption Or Reactions (AREA)

Abstract

Ein Sensormodul umfasst einen Chipträger und einen darauf angeordneten Sensorchip. Das Sensormodul weist an einer zweiten Seite des Chipträgers mindestens eine teilweise Abdeckung mit einer Aussparung auf, so dass Wärme von dem Chipträger und/oder Sensorchip an der Aussparung abführbar ist. Weiterhin ist ein Herstellungsverfahren eines abgedeckten Sensormoduls beschrieben, wobei die Abdeckung eine Aussparung aufweist.
PCT/EP2010/068053 2009-11-26 2010-11-23 Sensormodul und herstellungsverfahren eines sensormoduls WO2011064221A2 (de)

Priority Applications (6)

Application Number Priority Date Filing Date Title
RU2012126539/28A RU2012126539A (ru) 2009-11-26 2010-11-23 Сенсорный модуль и способ изготовления сенсорного модуля
BR112012012671A BR112012012671A2 (pt) 2009-11-26 2010-11-23 "módulo de sensor e método de produção de um módulo de sensor"
US13/512,304 US20130145844A1 (en) 2009-11-26 2010-11-23 Sensor module and production method of a sensor module
CN201080053818XA CN102741664A (zh) 2009-11-26 2010-11-23 传感器模块以及传感器模块的制造方法
JP2012540406A JP2013512422A (ja) 2009-11-26 2010-11-23 センサモジュールおよびセンサモジュールの製造方法
EP10793180A EP2504669A2 (de) 2009-11-26 2010-11-23 Sensormodul und herstellungsverfahren eines sensormoduls

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
DE102009055717.2 2009-11-26
DE102009055717A DE102009055717A1 (de) 2009-11-26 2009-11-26 Sensormodul und Herstellungsverfahren eines Sensormoduls

Publications (2)

Publication Number Publication Date
WO2011064221A2 WO2011064221A2 (de) 2011-06-03
WO2011064221A3 true WO2011064221A3 (de) 2012-01-26

Family

ID=43927069

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/EP2010/068053 WO2011064221A2 (de) 2009-11-26 2010-11-23 Sensormodul und herstellungsverfahren eines sensormoduls

Country Status (9)

Country Link
US (1) US20130145844A1 (de)
EP (1) EP2504669A2 (de)
JP (1) JP2013512422A (de)
KR (1) KR20120098743A (de)
CN (1) CN102741664A (de)
BR (1) BR112012012671A2 (de)
DE (1) DE102009055717A1 (de)
RU (1) RU2012126539A (de)
WO (1) WO2011064221A2 (de)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5640892B2 (ja) * 2011-05-23 2014-12-17 三菱電機株式会社 半導体装置
DE112013007328B4 (de) * 2013-08-09 2020-06-18 Therm-O-Disc, Incorporated Drahtlose Temperatur- und/oder Feuchtigkeitssensoranordnung
DE102014218702A1 (de) * 2014-09-17 2016-03-17 Continental Teves Ag & Co. Ohg Sensor mit Wärmeableitflächen am Leadframe
FR3040833B1 (fr) * 2015-09-04 2017-09-08 Delphi France Sas Systeme de distribution de courant electrique pour vehicule
BE1025973B1 (nl) * 2018-02-01 2019-09-03 Niko Nv Sensor module en behuizing

Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5369550A (en) * 1992-09-02 1994-11-29 Vlsi Technology, Inc. Method and apparatus for cooling a molded-plastic integrated-circuit package
US6670692B1 (en) * 2002-10-09 2003-12-30 Silicon Integrated Systems Corp. Semiconductor chip with partially embedded decoupling capacitors
DE102007057903A1 (de) * 2007-11-29 2009-06-04 Continental Automotive Gmbh Sensormodul und Verfahren zur Herstellung des Sensormoduls

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5817421B2 (ja) * 1979-02-02 1983-04-07 日産自動車株式会社 半導体圧力センサ
CN1006562B (zh) * 1986-04-14 1990-01-24 德商福兰克及凯尔西纳股份有限公司及电动机与电器装置厂分公司 电动变速及控制传动装置
JPS62197036U (de) * 1986-06-06 1987-12-15
JPH0428258A (ja) * 1990-05-23 1992-01-30 Sumitomo Metal Ind Ltd 半導体装置
JP2616587B2 (ja) * 1991-01-25 1997-06-04 日本電気株式会社 半導体装置の樹脂ばり除去方法
JPH0617245U (ja) * 1992-07-30 1994-03-04 沖電気工業株式会社 半導体デバイス
JPH07221234A (ja) * 1994-02-02 1995-08-18 Canon Inc 半導体装置
TW278225B (de) * 1994-10-31 1996-06-11 At & T Corp
JPH0926371A (ja) * 1995-07-12 1997-01-28 Hitachi Ltd 半導体式圧力センサ
JPH11326089A (ja) * 1999-01-18 1999-11-26 Hokuriku Electric Ind Co Ltd 半導体圧力センサ―とその製造方法
JP2000356561A (ja) * 1999-04-14 2000-12-26 Denso Corp 半導体歪みセンサ
DE19929026B4 (de) * 1999-06-25 2011-02-24 Robert Bosch Gmbh Verfahren zur Herstellung eines Drucksensors
JP2001033328A (ja) * 1999-07-27 2001-02-09 Matsushita Electric Works Ltd 半導体圧力センサ
JP2001124646A (ja) * 1999-10-27 2001-05-11 Matsushita Electric Works Ltd 半導体圧力検出器及びその製造方法
JP4127396B2 (ja) * 2001-10-18 2008-07-30 株式会社日立製作所 センサ装置
DE102005016008B4 (de) * 2005-04-07 2020-06-18 Robert Bosch Gmbh Bauelementemodul zur Anbringung auf einem Substrat
DE102006044442A1 (de) * 2006-09-21 2008-03-27 Robert Bosch Gmbh Sensoranordnung mit einem Substrat und mit einem Gehäuse und Verfahren zur Herstellung einer Sensoranordnung
CN100552941C (zh) * 2006-12-27 2009-10-21 日月光半导体制造股份有限公司 影像感测模块
US7880347B2 (en) * 2007-08-02 2011-02-01 Remy Technologies, Inc. Airflow cooling pattern for belt-driven vehicle electrical power generator
DE102007057902A1 (de) * 2007-11-29 2009-06-04 Continental Automotive Gmbh Sensormodul und Verfahren zu seiner Herstellung

Patent Citations (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5369550A (en) * 1992-09-02 1994-11-29 Vlsi Technology, Inc. Method and apparatus for cooling a molded-plastic integrated-circuit package
US6670692B1 (en) * 2002-10-09 2003-12-30 Silicon Integrated Systems Corp. Semiconductor chip with partially embedded decoupling capacitors
DE102007057903A1 (de) * 2007-11-29 2009-06-04 Continental Automotive Gmbh Sensormodul und Verfahren zur Herstellung des Sensormoduls

Also Published As

Publication number Publication date
RU2012126539A (ru) 2014-01-10
EP2504669A2 (de) 2012-10-03
BR112012012671A2 (pt) 2019-09-24
CN102741664A (zh) 2012-10-17
US20130145844A1 (en) 2013-06-13
DE102009055717A1 (de) 2011-06-01
JP2013512422A (ja) 2013-04-11
KR20120098743A (ko) 2012-09-05
WO2011064221A2 (de) 2011-06-03

Similar Documents

Publication Publication Date Title
WO2010089261A3 (de) Sensormodul und verfahren zum herstellen von sensormodulen
EP2405474A4 (de) Löthöcker, verfahren zur formung des löthöckers sowie verfahren zur montage eines substrats mit darauf geformtem löthöcker
WO2011066178A3 (en) Diode leadframe for solar module assembly
WO2012057517A3 (ko) 화합물 반도체 장치 및 화합물 반도체 제조방법
EP2315508A4 (de) Sammelkeramiksubstrat, verfahren zur herstellung des substrats, keramiksubstrat und keramiksubstrat für eine schaltung
EP2381018A4 (de) Verbundhalbleitersubstrat, halbleiterbauelement und verfahren zur herstellung des halbleiterbauelements
EP2301906A4 (de) Siliciumnitridplatte, verfahren zur herstellung der siliciumnitridplatte und siliciumnitrid-leiterplatte und halbleitermodul unter verwendung der siliciumnitridplatte
WO2011147399A3 (de) Optoelektronisches bauelement und verfahren zur herstellung eines optoelektronischen bauelements und eines verbunds
EP2315268A4 (de) Substrat zur herstellung eines vertikal strukturierten lichtemittierenden halbleiterbauelements und vertikal strukturiertes lichtemittierendes halbleiterbauelement damit
EP2326155A4 (de) Substratmodul und verfahren zu seiner herstellung
EP2377976A4 (de) Gruppe-iii-nitrid-substrat, halbleitervorrichtung damit sowie verfahren zur herstellung eines oberflächenbehandelten gruppe-iii-nitrid-substrats
EP2426795A4 (de) Kühlmodul für laser, herstellungsverfahren dafür und halbleiterlaser damit
WO2010009945A3 (de) Gekühltes turboladergehäuse mit einer oder mehreren elektronikeinrichtungen
WO2012021196A3 (en) Method for manufacturing electronic devices and electronic devices thereof
EP2244288A4 (de) Halbleiterelementmodul und verfahren zu seiner herstellung
WO2013017364A3 (de) Optoelektronische anordnung und verfahren zur herstellung einer optoelektronischen anordnung
WO2009009690A3 (en) Wavelength division sensing method and apparatus for doppler radar vital sign monitoring and mechanical vibration monitoring
WO2012107263A3 (de) Optoelektronisches bauelement mit lichtdurchlässiger abdeckung und verfahren zu dessen herstellung
EP2172415A4 (de) Silizium-struktur, methode zu deren herstellung und sensorchip
WO2014049052A3 (de) Optoelektronisches bauelement und verfahren zum herstellen eines optoelektronischen bauelements
WO2009056235A3 (de) Mehrschichtsystem mit kontaktelementen und verfahren zum erstellen eines kontaktelements für ein mehrschichtsystem
WO2011098187A3 (de) Halbleiter-bauelement und entsprechendes herstellungsverfahren
WO2011124205A3 (de) Verpackung für metall-keramik-substrate sowie verfahren zum verpacken solcher substrate
WO2011064221A3 (de) Sensormodul und herstellungsverfahren eines sensormoduls
EP2495585A4 (de) Verfahren und elektronische schaltung zur auslesung der von einem oder mehreren pixelierten sensoren erzeugten signale

Legal Events

Date Code Title Description
WWE Wipo information: entry into national phase

Ref document number: 201080053818.X

Country of ref document: CN

121 Ep: the epo has been informed by wipo that ep was designated in this application

Ref document number: 10793180

Country of ref document: EP

Kind code of ref document: A1

DPE1 Request for preliminary examination filed after expiration of 19th month from priority date (pct application filed from 20040101)
WWE Wipo information: entry into national phase

Ref document number: 2010793180

Country of ref document: EP

ENP Entry into the national phase

Ref document number: 20127013266

Country of ref document: KR

Kind code of ref document: A

WWE Wipo information: entry into national phase

Ref document number: 2012540406

Country of ref document: JP

NENP Non-entry into the national phase

Ref country code: DE

WWE Wipo information: entry into national phase

Ref document number: 2012126539

Country of ref document: RU

WWE Wipo information: entry into national phase

Ref document number: 13512304

Country of ref document: US

REG Reference to national code

Ref country code: BR

Ref legal event code: B01A

Ref document number: 112012012671

Country of ref document: BR

ENP Entry into the national phase

Ref document number: 112012012671

Country of ref document: BR

Kind code of ref document: A2

Effective date: 20120525