WO2011001903A1 - Glass paste for forming a photosensitive sealing layer, plasma display manufacturing method using the same, and plasma display - Google Patents
Glass paste for forming a photosensitive sealing layer, plasma display manufacturing method using the same, and plasma display Download PDFInfo
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- WO2011001903A1 WO2011001903A1 PCT/JP2010/060806 JP2010060806W WO2011001903A1 WO 2011001903 A1 WO2011001903 A1 WO 2011001903A1 JP 2010060806 W JP2010060806 W JP 2010060806W WO 2011001903 A1 WO2011001903 A1 WO 2011001903A1
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- Prior art keywords
- photosensitive
- paste
- forming
- sealing layer
- refractive index
- Prior art date
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Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J11/00—Gas-filled discharge tubes with alternating current induction of the discharge, e.g. alternating current plasma display panels [AC-PDP]; Gas-filled discharge tubes without any main electrode inside the vessel; Gas-filled discharge tubes with at least one main electrode outside the vessel
- H01J11/20—Constructional details
- H01J11/48—Sealing, e.g. seals specially adapted for leading-in conductors
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- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/02—Frit compositions, i.e. in a powdered or comminuted form
- C03C8/04—Frit compositions, i.e. in a powdered or comminuted form containing zinc
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/14—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions
- C03C8/16—Glass frit mixtures having non-frit additions, e.g. opacifiers, colorants, mill-additions with vehicle or suspending agents, e.g. slip
-
- C—CHEMISTRY; METALLURGY
- C03—GLASS; MINERAL OR SLAG WOOL
- C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
- C03C8/00—Enamels; Glazes; Fusion seal compositions being frit compositions having non-frit additions
- C03C8/24—Fusion seal compositions being frit compositions having non-frit additions, i.e. for use as seals between dissimilar materials, e.g. glass and metal; Glass solders
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/02—Manufacture of electrodes or electrode systems
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/24—Manufacture or joining of vessels, leading-in conductors or bases
- H01J9/26—Sealing together parts of vessels
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J9/00—Apparatus or processes specially adapted for the manufacture, installation, removal, maintenance of electric discharge tubes, discharge lamps, or parts thereof; Recovery of material from discharge tubes or lamps
- H01J9/24—Manufacture or joining of vessels, leading-in conductors or bases
- H01J9/26—Sealing together parts of vessels
- H01J9/261—Sealing together parts of vessels the vessel being for a flat panel display
Definitions
- the present invention relates to a glass paste for forming a photosensitive sealing layer and a method for producing a plasma display.
- Plasma display panels are capable of high-speed display compared to liquid crystal panels and are easy to increase in size, and thus have penetrated into fields such as OA equipment and public information display devices. It is also used in the field of high-definition television.
- a slight gap formed between two glass substrates, a front plate and a back plate, is used as a discharge space, and plasma discharge is generated between the anode and the cathode electrode, and the gas enclosed in the discharge space is used.
- Display is performed by emitting the emitted ultraviolet light to a phosphor provided in the discharge space.
- the electrodes are arranged in stripes on the front plate and the back plate, respectively, a plurality of electrodes are parallel, the electrodes on the front plate and the electrodes on the back plate face each other with a slight gap and are orthogonal to each other. Formed as follows.
- a surface discharge type PDP having a three-electrode structure suitable for color display using a phosphor includes a plurality of electrode pairs each composed of a pair of display electrodes adjacent in parallel to each other, and a plurality of address electrodes orthogonal to each electrode pair. And have.
- a barrier rib for preventing crosstalk of light and securing a discharge space is formed in the space between the electrodes on the back plate. Further, a phosphor is formed in the discharge space.
- the front plate and the back plate are usually sealed by applying a paste containing a sealing glass frit to the peripheral part of the panel and then performing a heat treatment at a temperature at which the sealing glass frit softens.
- a paste containing a sealing glass frit to the peripheral part of the panel and then performing a heat treatment at a temperature at which the sealing glass frit softens.
- As a method for forming the partition walls with high accuracy a method using a photosensitive paste has been proposed. According to this method, a high-definition partition wall can be formed with high accuracy, but when the substrate warps, the height is high. With respect to the variation in direction, the accuracy cannot be sufficiently controlled (for example, Patent Document 1).
- Patent Document 2 a method of providing a partition height adjustment layer between the partition formed on the back plate and the front plate has been proposed (for example, Patent Document 2).
- Patent Document 2 a method of providing a partition height adjustment layer between the partition formed on the back plate and the front plate.
- An object of the present invention is to provide a glass paste for forming a photosensitive sealing layer capable of preventing a crosstalk and noise and obtaining a low power consumption plasma display.
- the present invention comprises (A) a glass powder having a glass transition point of 410 to 480 ° C., a yield point of 470 to 510 ° C., and a softening point of 515 to 550 ° C., (B) a photosensitive organic component, and (C) an ultraviolet ray absorbing material. And (D) a photosensitive paste containing a solvent, wherein the average refractive index N1 of an inorganic component containing glass powder satisfies the following formula (1). 1.75 ⁇ N1 ⁇ 1.95 (1) N1 preferably satisfies the following formula (2).
- the average refractive index N2 of the organic component including the photosensitive organic component preferably satisfies the following formula (3). 1.45 ⁇ N2 ⁇ 1.65 (3)
- the average refractive index N1 of the inorganic component and the average refractive index N2 of the organic component preferably satisfy the following formula (4). 0.2 ⁇ N1-N2 ⁇ 0.5 (4)
- the ultraviolet absorber is an organic dye, and the content in the paste is preferably 0.01 to 2% by weight.
- the present invention includes a step of applying a photosensitive barrier rib forming paste on a substrate, a step of applying a photosensitive sealing layer forming glass paste after a step of exposing through a photomask, and a photomasking step.
- a method for manufacturing a plasma display wherein a barrier rib for partitioning a discharge space and a sealing layer are formed through a step of exposing through a mask, a developing step, and a baking step, wherein the inorganic component in the photosensitive barrier rib forming paste And the average refractive index N1 of the inorganic component in the photosensitive sealing layer-forming glass paste satisfies the following formulas (5) and (6).
- the present invention includes a step of applying a first photosensitive barrier rib forming paste on a substrate, a step of exposing through a photomask, a step of applying a second photosensitive barrier rib forming paste, and a photomask.
- Barrier ribs for partitioning the discharge space through a step of applying the glass paste for forming a photosensitive sealing layer, a step of exposing via a photomask, a development step, and a baking step A method for manufacturing a plasma display for forming a sealing layer, comprising: an average refractive index Na of an inorganic component in the first photosensitive barrier rib forming paste; and an inorganic component in the second photosensitive barrier rib forming paste.
- Production of plasma display characterized in that average refractive index Nb and average refractive index N1 of the inorganic component in said photosensitive sealing layer forming glass paste satisfy the following formulas (5) to (8): It is the law.
- the average refractive index Na of the inorganic component in the first photosensitive barrier rib forming paste and the average refractive index Nb of the inorganic component in the second photosensitive barrier rib forming paste are low. It is preferable to satisfy Formula (9). ⁇ 0.1 ⁇ Nb—Na ⁇ 0.1 (9) Furthermore, this invention relates to the plasma display obtained by the said manufacturing method.
- the glass paste for forming a photosensitive sealing layer of the present invention can form a uniform sealing layer with high accuracy at the top of the partition wall at low cost. Moreover, by using this, a high-performance plasma display can be manufactured at low cost.
- the present invention relates to a glass paste for forming a photosensitive sealing layer containing glass powder, a photosensitive organic component, an ultraviolet absorber, and a solvent.
- the glass paste for forming a photosensitive sealing layer of the present invention is a photosensitive glass paste used for forming a sealing layer of a display.
- the sealing layer refers to a layer that fuses a member constituting the display, for example, a front plate and a back plate.
- the glass paste for forming a photosensitive sealing layer of the present invention is preferably used for producing a patterned sealing layer, particularly a sealing layer provided on top of another pattern layer. In particular, it is preferably used when the barrier ribs are provided on the barrier ribs of the back plate of the plasma display panel, and when the barrier ribs are formed by the photosensitive glass paste method, the barrier ribs and the sealing layer are simultaneously provided.
- the glass paste for forming a photosensitive sealing layer of the present invention contains a glass powder, a photosensitive organic component for forming a fine pitch pattern, an ultraviolet absorber, and a solvent for ensuring coating stability. Containing.
- a glass frit having a relatively high softening point is used to maintain the barrier rib shape during firing, and a high pitch and high pitch are used.
- a glass frit having a relatively low refractive index has been used for the purpose of matching the refractive index of the glass powder with the refractive index of the organic component.
- crosstalk or noise occurs when the substrate warps or the partition wall height varies. In order to solve this problem, it is effective to bond the top of the partition wall and the front plate in a heating process at the time of sealing.
- the sealing layer forming step increases in addition to the conventional barrier rib forming step, so there is a problem in cost, and the accuracy of applying the sealing layer paste only on the top of the barrier rib formed with high definition There was a problem.
- the photosensitive barrier rib paste is applied, the photosensitive sealing layer forming glass paste of the present invention is applied onto the coating film exposed through the photomask, exposed through the photomask, and developed in a batch. After that, the sealing layer can be accurately formed on the top of the partition wall by firing.
- the glass paste for forming a photosensitive sealing layer of the present invention needs to be softened to such an extent that it adheres to the front plate at the heating temperature in the sealing process. Therefore, the glass transition point of the glass powder to be contained needs to be 410 to 480 ° C. When the temperature is lower than 410 ° C., the shape retention is poor, and when it exceeds 480 ° C., the adhesion to the front plate becomes insufficient. Similarly, the yield point of the glass powder needs to be 470 to 510 ° C. When the temperature is lower than 470 ° C., the binder removal property at the time of firing is deteriorated, voids are formed in the sealing layer after firing, and defects such as chipping may occur at the time of sealing.
- the adhesion to the front plate becomes insufficient. Furthermore, the softening point of the glass powder needs to be 515 to 550 ° C. When the temperature is lower than 515 ° C., the binder removal property is insufficient, the shape retention during firing is poor, and a uniform sealing layer cannot be obtained. When it is higher than 550 ° C., the adhesion to the front plate becomes insufficient.
- the average refractive index N1 of the inorganic component contained satisfies the following formula 1. 1.75 ⁇ N1 ⁇ 1.95 (1)
- a photosensitive glass paste that forms a pattern such as a partition wall contains a photosensitive organic component for the purpose of forming a pattern with a large aspect ratio by suppressing scattering of light used for exposure (hereinafter referred to as exposure light).
- exposure light The average refractive index of the organic component and the average refractive index of the inorganic component are often matched.
- the glass paste for forming a photosensitive sealing layer of the present invention is formed on the top of the partition wall, and is developed and fired together with the partition wall to form a sealing layer. It is necessary to prevent exposure light from reaching the photosensitive barrier rib forming paste coating film that has been exposed. For this reason, an ultraviolet absorber is added, but if the transmittance of the exposure light is adjusted only by the ultraviolet absorber, the exposure light necessary for curing is exposed at the bottom portion of the paste coating film for forming the photosensitive sealing layer. Does not reach the point, and peels off or deforms during development.
- the difference in refractive index from the organic component containing the organic component in the photosensitive sealing layer forming paste is appropriately increased, and the exposure light is reduced. It can be prevented that the photosensitive barrier rib forming paste coating film as the lower layer reaches the lower layer.
- a glass powder smaller than 1.75 is produced in accordance with the required glass transition point, yield point, and softening point, it is necessary to contain a large amount of an alkali metal component.
- the alkali metal component is not preferable because it reacts with the photosensitive organic component to gel or thicken the paste.
- N1 it is possible to prevent the difference in refractive index from the organic component in the photosensitive sealing layer forming paste from becoming too large, and the bottom of the sealing layer forming paste coating film is Insufficient exposure can be prevented. If it exceeds 1.95, the refractive index difference with the organic component becomes too large, and a desired pattern cannot be obtained. Preferably it is 1.90 or less.
- the refractive index measurement of glass powder and a filler can be performed by glass powder and the Becke method, and it is preferable to perform a measurement by g line
- the average refractive index of the inorganic powder contained in the paste is preferably determined by the volume average of the refractive index of each powder.
- the average refractive index of the inorganic component is determined by dispersing only the inorganic component contained in the paste in a solvent and applying it to soften the glass powder, or applying the paste and the glass powder softening temperature or higher. It can also be determined by measuring the refractive index of the inorganic component layer obtained by firing to remove the organic component.
- the average refractive index N2 of the organic component including the photosensitive organic component in the photosensitive sealing layer forming paste of the present invention satisfies the following formula (3). It is preferable. 1.45 ⁇ N2 ⁇ 1.65 (3) Further, N1 and N2 preferably satisfy the following formula (4). 0.2 ⁇ N1-N2 ⁇ 0.5 (4) When N1 and N2 satisfy the above formulas (1), (3), and (4), it is possible to scatter the exposure light in particular, and it is sufficiently cured to the bottom of the paste coating film for forming the photosensitive sealing layer. Further, the photosensitive barrier rib forming paste coating film as the lower layer can be prevented from further curing.
- N2 is smaller than 1.45 or N1-N2 is larger than 0.5, the exposure light may be scattered too much and the bottom of the photosensitive sealing layer forming paste coating film may not be sufficiently cured. If it is smaller than 0.2, the exposure light may be transmitted too much and the exposure pattern of the photosensitive barrier rib forming paste coating film may change.
- the average refractive index of the organic component in the present invention is the average refractive index of the organic component in the paste coating film.
- the paste is obtained by removing the inorganic component from the paste and drying to remove the solvent. It can obtain
- a glass material containing silicon and boron oxides is preferably used.
- a glass transition suitable for forming a sealing layer is contained by containing at least one of bismuth oxide, lead oxide, and zinc oxide in a total amount of 5 to 85% by weight.
- a glass paste having temperature characteristics such as a point, a yield point, and a softening point can be obtained.
- the use of glass powder containing 5 to 85% by weight of bismuth oxide provides advantages such as a long pot life of the paste.
- glass powder containing 3 to 20% by weight of at least one of lithium oxide, sodium oxide, and potassium oxide may be used.
- the addition amount of the alkali metal oxide 20% by weight or less, preferably 15% by weight or less the pot life of the paste can be kept long.
- glass powder containing both metal oxides such as lead oxide, bismuth oxide and zinc oxide and alkali metal oxides such as lithium oxide, sodium oxide and potassium oxide is used, with a lower alkali content, A glass paste having temperature characteristics such as a glass transition point, a yield point, and a softening point suitable for forming a sealing layer can be obtained.
- the volume ratio of the inorganic component containing the glass powder and the volume ratio of the organic component excluding the organic solvent are preferably controlled to 30:70 to 60:40. If the inorganic component ratio is smaller than 30:70, the organic component becomes too much, and pattern deformation may be observed during firing shrinkage. When the inorganic component ratio exceeds 60:40, the pattern forming property deteriorates, and a problem that a high-definition pattern cannot be obtained occurs.
- the addition amount of the glass powder in the paste is changed so as to satisfy the aforementioned volume ratio in accordance with the specific gravity of the glass powder.
- the volume average particle diameter of the glass powder may be appropriately selected in consideration of the line width and height of the partition to be produced, but is preferably greater than 1.5 ⁇ m and less than 5.0 ⁇ m, preferably from 1.7 ⁇ m. More preferably, it is less than 4.0 ⁇ m.
- the volume average particle diameter is 1.5 ⁇ m or less, the low-melting glass powders tend to aggregate in the paste, which tends to hinder a uniform partition wall shape.
- the thickness is 5.0 ⁇ m or more, there is a problem that a good shape cannot be obtained at the time of pattern formation, and disconnection or chipping is likely to occur in the partition walls.
- volume average particle diameter refers to the volume average diameter of the powder measured using a laser diffraction / scattering particle size distribution meter.
- the maximum particle size of the glass powder is preferably 20 ⁇ m or less, and more preferably 15 ⁇ m or less. If the maximum particle size exceeds 20 ⁇ m, disconnection or chipping is likely to occur during pattern formation, and giant particles remain as abnormal protrusions, and tend to contact the front plate during panel production and easily cause disconnection or front plate failure.
- the specific surface area of the glass powder is preferably 1.0 ⁇ 4.0cm 2 / g, more preferably 1.5 ⁇ 3cm 2 / g. When the specific surface area of the glass powder satisfies this range, aggregation of the glass powders in the paste can be suppressed, and the glass powder in the paste can be uniformly dispersed. This makes it possible to form a pattern with high accuracy.
- the photosensitive organic component used in the glass paste for forming a photosensitive sealing layer of the present invention contains a photosensitive organic component selected from at least one of a photosensitive monomer, a photosensitive oligomer, and a photosensitive polymer, and Additive components such as photopolymerization initiators, sensitizers, sensitizers, polymerization inhibitors, plasticizers, thickeners, antioxidants, dispersants, organic or inorganic precipitation inhibitors as required Additions are listed.
- the glass paste for photosensitive sealing layer formation of this invention contains a solvent so that it may mention later, when using the organic solvent which does not react with a photosensitive organic component as a solvent, such an organic solvent is a photosensitive organic component. Is not included in the organic component.
- the glass paste for forming a photosensitive sealing layer of the present invention contains an ultraviolet absorber.
- an organic dye is preferable.
- azo dyes, aminoketone dyes, xanthene dyes, quinoline dyes, anthraquinone dyes, benzophenone dyes, triazine dyes, p-aminobenzoic acid dyes cyanoacrylate compounds, salicylic acid compounds, benzoates examples include triazole compounds and indole compounds. Among these, azo dyes, benzophenone compounds, cyanoacrylate compounds, and indole compounds are particularly effective.
- the glass paste for forming a photosensitive sealing layer of the present invention is mainly used for forming a sealing layer on the top of a partition wall.
- a method for forming the glass paste for example, refraction of inorganic powder containing glass frit on a substrate is used.
- the glass paste for forming a photosensitive sealing layer of the present invention is applied and the photomask is used.
- a partition for partitioning the discharge space and a sealing layer are formed through a baking process.
- the glass paste coating film for forming a photosensitive sealing layer it is necessary to prevent exposure light from reaching the photosensitive paste coating film for forming barrier ribs that has been previously exposed. Therefore, it is necessary to contain a relatively large amount of ultraviolet absorber that absorbs exposure light.
- the content depends on the thickness of the sealing layer, but is preferably 0.01 to 2% by weight in the photosensitive paste. If it is less than 0.01% by weight, the exposure light absorption is insufficient, and the desired partition wall shape may not be obtained. If it exceeds 2% by weight, curing of the coating film for forming the sealing layer becomes insufficient. There is a risk of peeling or deformation after development.
- the glass paste for forming a photosensitive sealing layer of the present invention contains a solvent in order to obtain a uniform coating film.
- a solvent an organic solvent is preferable.
- the content of the organic solvent varies depending on the specific gravity of the glass powder, but is preferably 15 to 45% by weight in the paste. In other ranges, the paste cannot be applied well and a uniform film cannot be obtained.
- Examples of the organic solvent used at this time include methyl cellosolve, ethyl cellosolve, butyl cellosolve, methyl ethyl ketone, dioxane, acetone, cyclohexanone, cyclopentanone, isobutyl alcohol, isopropyl alcohol, tetrahydrofuran, dimethyl sulfoxide, ⁇ -butyrolactone, bromo Benzene, chlorobenzene, dibromobenzene, dichlorobenzene, bromobenzoic acid, chlorobenzoic acid, terpineol, diethylene glycol monobutyl ether acetate and the like, and an organic solvent mixture containing one or more of these are preferably used.
- the photosensitive organic component of the present invention will be described.
- the photosensitive monomer is a compound containing a carbon-carbon unsaturated bond, and specific examples thereof include monofunctional and polyfunctional (meth) acrylates, vinyl compounds, allyl compounds, and the like.
- monofunctional and polyfunctional (meth) acrylates for example, methyl acrylate, ethyl acrylate, n-propyl acrylate, isopropyl acrylate, n-butyl acrylate, sec-butyl acrylate, iso-butyl acrylate, tert-butyl acrylate, n-pentyl acrylate, allyl acrylate, benzyl acrylate , Butoxyethyl acrylate, butoxytriethylene glycol acrylate, cyclohexyl acrylate, dicyclopentanyl acrylate, dicyclopentenyl acrylate, 2-ethylhexyl acrylate, Serol acrylate, glycidyl acrylate, heptade
- the developability after exposure can be improved by adding an unsaturated acid such as an unsaturated carboxylic acid.
- unsaturated carboxylic acid include acrylic acid, methacrylic acid, itaconic acid, crotonic acid, maleic acid, fumaric acid, vinyl acetic acid, and acid anhydrides thereof.
- the content of these photosensitive monomers is preferably in the range of 7 to 15% by weight in the paste. In other ranges, the pattern formability is deteriorated and the hardness after curing is not preferable.
- the photosensitive oligomer and the photosensitive polymer an oligomer or a polymer obtained by polymerizing at least one of the compounds containing the carbon-carbon unsaturated bond can be used.
- the content of the compound containing a carbon-carbon unsaturated bond is preferably 10% by weight or more, and more preferably 35% by weight or more in the total amount of the photosensitive oligomer and the photosensitive polymer.
- a photosensitive oligomer or photosensitive polymer with an unsaturated acid such as an unsaturated carboxylic acid to improve developability after exposure.
- unsaturated carboxylic acid include acrylic acid, methacrylic acid, itaconic acid, crotonic acid, maleic acid, fumaric acid, vinyl acetic acid, and acid anhydrides thereof.
- the acid value (AV) of the oligomer or polymer having an acidic group such as a carboxyl group in the side chain thus obtained is preferably 30 to 150, more preferably 70 to 120. If the acid value is less than 30, the solubility of the unexposed area in the developing solution is lowered. Therefore, when the developing solution concentration is increased, the exposed area is peeled off, and a high-definition pattern tends to be difficult to obtain. Further, when the acid value exceeds 150, the development allowable width tends to be narrowed.
- photo-sensitive oligomers and photo-polymers can be used as photo-sensitive photo-polymers and photo-oligomers by adding a photoreactive group to the side chain or molecular end.
- Preferred photoreactive groups are those having an ethylenically unsaturated group. Examples of the ethylenically unsaturated group include a vinyl group, an allyl group, an acrylic group, and a methacryl group.
- Such a side chain can be added to an oligomer or polymer by using an ethylenically unsaturated compound having a glycidyl group or an isocyanate group relative to a mercapto group, amino group, hydroxyl group or carboxyl group in the polymer.
- an ethylenically unsaturated compound having a glycidyl group or an isocyanate group relative to a mercapto group, amino group, hydroxyl group or carboxyl group in the polymer There is a method of addition reaction of acid chloride or allyl chloride.
- Examples of the ethylenically unsaturated compound having a glycidyl group include glycidyl acrylate, glycidyl methacrylate, allyl glycidyl ether, glycidyl ethyl acrylate, crotonyl glycidyl ether, glycidyl crotonic acid, and glycidyl ether of isocrotonic acid.
- Examples of the ethylenically unsaturated compound having an isocyanate group include (meth) acryloyl isocyanate and (meth) acryloylethyl isocyanate.
- the ethylenically unsaturated compound having glycidyl group or isocyanate group, acrylic acid chloride, methacrylic acid chloride or allyl chloride is 0.05 to 1 molar equivalent to the mercapto group, amino group, hydroxyl group or carboxyl group in the polymer. It is preferable to add.
- the content of the photosensitive oligomer and / or the photosensitive polymer in the glass paste for forming a photosensitive sealing layer of the present invention is 7 to 15% by weight in the paste from the viewpoint of pattern formability and shrinkage after baking. It is preferable to be within the range. Outside this range, it is not preferable because pattern formation is impossible or the pattern becomes thick.
- photopolymerization initiators include benzophenone, methyl o-benzoylbenzoate, 4,4′-bis (dimethylamino) benzophenone, 4,4′-bis (diethylamino) benzophenone, 4,4′-dichloro.
- the photopolymerization initiator is preferably added in an amount of 0.05 to 20% by weight, more preferably 0.1 to 15% by weight, based on the photosensitive organic component.
- the photopolymerization initiator is less than 0.05% by weight, the photosensitivity tends to be poor, and when the photopolymerization initiator exceeds 20% by weight, the residual ratio of the exposed portion tends to be too small.
- Sensitizers are added as necessary to improve sensitivity.
- Specific examples of the sensitizer include 2,4-diethylthioxanthone, isopropylthioxanthone, 2,3-bis (4-diethylaminobenzal) cyclopentanone, 2,6-bis (4-dimethylaminobenzal) cyclohexanone, 2,6-bis (4-dimethylaminobenzal) -4-methylcyclohexanone, Michler's ketone, 4,4'-bis (diethylamino) -benzophenone, 4,4'-bis (dimethylamino) chalcone, 4,4'- Bis (diethylamino) chalcone, p-dimethylaminocinnamylidene indanone, p-dimethylaminobenzylidene indanone, 2- (p-dimethylaminophenylvinylene) -isononafthiazole, 1,3-bis (4
- sensitizers can also be used as photopolymerization initiators.
- the addition amount is usually preferably 0.05 to 30% by weight, more preferably 0.1 to 20% by weight, based on the photosensitive organic component. It is. If it is less than 0.05% by weight, the effect of improving the photosensitivity tends to be hardly exhibited, and if it exceeds 30% by weight, the residual ratio of the exposed portion tends to be too small.
- Polymerization inhibitor is added as necessary to improve the thermal stability during storage.
- Specific examples of the polymerization inhibitor include hydroquinone, monoester of hydroquinone, N-nitrosodiphenylamine, phenothiazine, pt-butylcatechol, N-phenylnaphthylamine, 2,6-di-tert-butyl-p- Examples thereof include methylphenol, chloranil, pyrogallol and p-methoxyphenol. Further, by adding, the threshold value of the photocuring reaction is increased, the pattern line width is reduced, and the pattern upper portion with respect to the gap is eliminated.
- the addition amount of the polymerization inhibitor is preferably 0.01 to 1% by weight in the glass paste for forming the photosensitive sealing layer. If it is less than 0.01% by weight, the effect of addition tends to be difficult, and if it exceeds 1% by weight, the sensitivity tends to decrease, so that a large amount of exposure tends to be required for pattern formation.
- plasticizer examples include dibutyl phthalate, dioctyl phthalate, polyethylene glycol, glycerin and the like.
- An antioxidant is added as necessary to prevent oxidation of the acrylic copolymer during storage.
- Specific examples of the antioxidant include 2,6-di-t-butyl-p-cresol, butylated hydroxyanisole, 2,6-di-t-butyl-4-ethylphenol, 2,2′- Methylene-bis (4-methyl-6-t-butylphenol), 2,2'-methylene-bis (4-ethyl-6-t-butylphenol), 4,4'-bis (3-methyl-6-t- Butylphenol), 1,1,3-tris (2-methyl-4-hydroxy-6-tert-butylphenyl) butane, bis [3,3-bis- (4-hydroxy-3-tert-butylphenyl) butyric Acid] glycol ester, dilauryl thiodipropionate, triphenyl phosphite and the like.
- the addition amount is preferably 0.01 to 1% by weight in the glass paste.
- the glass paste for forming a photosensitive sealing layer of the present invention is usually at least one of the above-mentioned photosensitive monomer, photosensitive oligomer, and photosensitive polymer, and further, if necessary, a photopolymerization initiator, an ultraviolet absorber, an increase agent.
- Additive components such as sensitizers, sensitization aids, polymerization inhibitors, plasticizers, thickeners, organic solvents, antioxidants, dispersants, organic or inorganic precipitation inhibitors are formulated to have a predetermined composition After that, it is prepared by uniformly mixing and dispersing with an inorganic component containing glass powder using a three roller or kneader.
- the viscosity of the glass paste for forming a photosensitive sealing layer is appropriately adjusted, but the range is preferably 0.2 to 200 Pa ⁇ s.
- the range is preferably 0.2 to 200 Pa ⁇ s.
- 10 to 100 Pa ⁇ s is more preferable.
- 10 to 50 Pa ⁇ s is more preferable.
- the present invention also includes a step of applying and drying the above-mentioned glass paste for forming a photosensitive sealing layer to form a paste coating film, a step of exposing the paste coating film through a photomask, and an exposed paste coating film.
- the present invention relates to a method for manufacturing a plasma display including a developing step and a step of forming a pattern by baking.
- the average refractive index Na of the inorganic component contained in the paste for forming the photosensitive partition is the refractive index difference of the organic component excluding the solvent. It is necessary to make it small, and it is preferable to satisfy the following formula (5). 1.45 ⁇ Na ⁇ 1.65 (5)
- the sealing layer is 2 to 10 ⁇ m after firing, which is relatively thin compared to the barrier ribs. The exposure of the glass paste coating film for forming the photosensitive sealing layer is first performed so as not to affect the barrier rib pattern of the lower layer. It is necessary to adjust so that the exposure light does not reach the barrier rib forming paste coating film.
- the average refractive index N1 of the inorganic component in the glass paste for forming a photosensitive sealing layer of the present invention needs to control the refractive index difference from the organic component excluding the solvent.
- the average refractive index Na of the inorganic component of the conductive partition wall forming paste needs to be controlled so as to satisfy the following formula (6). 0.2 ⁇ N1-Na ⁇ 0.5 (6)
- the sealing layer pattern formed on the top of the partition wall if the partition pattern is a simple stripe structure, there is no problem even if the sealing layer is formed on the entire top surface of the partition wall.
- the sealing layer is formed in exactly the same manner as the barrier rib pattern, the cell surrounded by the barrier ribs and the sealing layer is completely sealed after sealing with the front plate. For this reason, gas cannot be exhausted sufficiently.
- a partition pattern such as a cross-beam structure or a waffle structure, the problem of exhaust can be solved by forming a sealing layer only on the top of the partition formed parallel to the address electrodes.
- the sealing layer is formed as thin as 2 to 10 ⁇ m after firing, the thickness of the sealing layer alone may result in insufficient exhaust after sealing.
- the barrier rib pattern formed parallel to the address electrode is formed higher than the height of the barrier rib pattern formed to be perpendicular to or intersecting with the address electrode, and the sealing layer is formed only on the high barrier rib pattern, Can solve the problem of exhaust.
- a step of applying a first photosensitive barrier rib forming paste on the substrate a step of exposing through a photomask having a pattern perpendicular to or intersecting with the address electrodes, the first photosensitive barrier rib forming paste
- a step of applying a second photosensitive barrier rib forming paste on the coating film a step of exposing through a photomask having a pattern parallel to the address electrodes, and then applying a photosensitive sealing layer forming glass paste of the present invention.
- exposure is performed through a photomask having a sealing layer pattern, and then a development process and a baking process are performed, so that a partition wall pattern formed in parallel to the address electrode is formed to be perpendicular to or intersecting with the address electrode.
- the sealing layer can be formed only on the high partition wall pattern.
- the first and second photosensitive partition forming photosensitive pastes need to be adjusted to reduce the average refractive index of the inorganic material contained and the refractive index of the organic component excluding the solvent.
- the average refractive index Na of the inorganic component in the photosensitive barrier rib forming paste and the average refractive index Nb of the inorganic component in the second photosensitive barrier rib forming paste satisfy the following expressions (5) and (7). Important.
- the exposure light does not reach the barrier rib forming paste coating film that has been previously exposed so that the exposure of the photosensitive sealing layer forming glass paste coating film does not affect the barrier rib pattern of the lower layer.
- the photosensitive sealing layer of the present invention since it is necessary to transmit the exposure light to the bottom of the glass paste coating film for forming the photosensitive sealing layer, it is necessary to cure firmly, so that the photosensitive sealing layer of the present invention is formed.
- the average refractive index N1 of the inorganic component in the glass paste must be controlled for the difference in refractive index with the organic component excluding the solvent, and it is important that the following formulas (6), (8), and (9) are satisfied. is there.
- a stepper exposure machine, a proximity exposure machine, or the like can be used.
- the active light source used include visible light, near ultraviolet light, ultraviolet light, electron beam, X-ray, and laser light.
- ultraviolet rays are most preferable, and as the light source, for example, a low-pressure mercury lamp, a high-pressure mercury lamp, an ultrahigh-pressure mercury lamp, a halogen lamp, or a germicidal lamp can be used.
- an ultrahigh pressure mercury lamp is suitable.
- exposure conditions vary depending on the coating thickness, exposure is usually performed for 0.1 to 10 minutes using an ultrahigh pressure mercury lamp with an output of 1 to 100 mW / cm 2 .
- the glass paste for forming a photosensitive sealing layer of the present invention is applied on the exposed coating film of the photosensitive glass paste for forming a partition wall.
- a coating method a general method such as a screen printing method, a bar coater, a roll coater, a die coater, or a blade coater can be used.
- the coating thickness is adjusted according to the sealing layer to be formed after firing.
- mask exposure is performed using a photomask that matches the sealing layer pattern formed on the top of the partition wall.
- the exposure apparatus and the light source the same ones as used for forming the partition walls can be used.
- the exposure method is determined by the structure of the partition wall to be formed and the structure of the sealing layer.
- a sealing layer forming photomask having the same pattern as the partition wall pattern forming photomask is used.
- the opening width of the photomask is adjusted as appropriate, but in order to form the sealing layer only on the top of the partition wall with high accuracy, the opening width of the photomask for partition wall formation is W1, and the opening width W2 of the photomask for sealing layer formation is In this case, it is preferable to satisfy the following formula.
- the barrier rib pattern is not a simple stripe structure but a cross beam structure or a waffle structure
- the sealing layer is formed in exactly the same manner as the barrier rib pattern, the barrier rib pattern is surrounded by the barrier rib and the sealing layer. After the inside of the cell is sealed with the front plate, the gas is not completely exhausted because the cell is completely sealed. For this reason, in the case of a barrier rib pattern such as a cross-beam structure or a waffle structure, the height of the barrier rib pattern formed perpendicular to the barrier rib pattern formed parallel to the address electrodes is changed, and the sealing layer is formed only on the high barrier rib pattern. The problem of exhaust can be solved by forming.
- the partition wall parallel to the address electrode is the main partition wall, the partition wall is formed to have a high height.
- Developing methods can be performed by dipping, showering, spraying, or brushing.
- a solution that can dissolve the organic component to be dissolved in the photosensitive glass paste is used.
- a compound having an acidic group such as a carboxyl group is present in the photosensitive glass paste, development can be performed with an alkaline aqueous solution.
- an alkaline aqueous solution sodium hydroxide, sodium carbonate, sodium carbonate aqueous solution, calcium hydroxide aqueous solution or the like can be used.
- an organic alkaline aqueous solution because an alkaline component can be easily removed during firing.
- a general amine compound can be used.
- the concentration of the alkaline aqueous solution is preferably 0.01 to 10% by weight, and more preferably 0.1 to 5% by weight. If the concentration of the aqueous alkali solution is less than 0.01% by weight, the soluble part tends to be removed, and if it exceeds 10% by weight, the pattern part tends to be peeled off and the insoluble part tends to corrode. Further, the development temperature at the time of development is preferably 20 to 50 ° C. for process control.
- the firing atmosphere and temperature vary depending on the type of paste and substrate.
- the firing furnace a batch-type firing furnace or a belt-type continuous firing furnace can be used.
- the firing temperature is usually 500 to 600 ° C.
- the firing temperature is determined by the glass powder to be used, but it is preferable to fire at an appropriate temperature that does not break the shape after pattern formation and does not leave the shape of the glass powder.
- the temperature is lower than the appropriate temperature, the porosity and the unevenness at the upper part of the partition wall are increased, so that the discharge life is shortened and erroneous discharge is easily caused.
- the temperature is higher than the appropriate temperature, the shape at the time of pattern formation collapses, the height becomes extremely low, or a desired height cannot be obtained, which is not preferable.
- a heating step at 50 to 300 ° C. may be introduced for the purpose of drying and preliminary reaction during each of the above coating, exposure and development steps and between any of the coating, exposure, development and baking steps. .
- a phosphor layer can be formed by forming a phosphor paste containing phosphor powder, an organic binder and an organic solvent as main components between predetermined partitions.
- a method of forming the phosphor paste between the predetermined partition walls a screen printing method for pattern printing using a screen printing plate, a dispenser method for pattern ejection of the phosphor paste from the tip of the ejection nozzle, and the organic binder described above
- a photosensitive phosphor paste can be prepared, and each color phosphor layer can be formed in a predetermined place by a photosensitive paste method.
- the substrate for plasma display of the present invention can be produced by firing the substrate on which the phosphor layer is formed, if necessary, at 400 to 550 ° C.
- the plasma display substrate as a back plate, sealing with the front plate is performed.
- a paste containing glass powder for sealing around the panel and heat-treating it the impure gas is exhausted simultaneously with sealing.
- the sealing paste is applied to the periphery of the back plate, and the heat treatment temperature is in the range of 450 to 520 ° C. because it is performed at a temperature at which the phosphor does not deteriorate.
- the sealing layer of the partition top part formed previously can also be adhere
- a plasma display can be manufactured by mounting a drive circuit.
- the front plate is a substrate in which a transparent electrode, bus electrode, dielectric, and protective film (MgO) are formed in a predetermined pattern on the substrate, and the color corresponding to the RGB color phosphor layers formed on the back substrate is colored.
- a filter layer may be formed.
- a black stripe may be formed in order to improve contrast.
- the display of the present invention obtained by the above manufacturing method has various patterns with reduced surface roughness and waviness, generation of erroneous discharge (crosstalk) due to leakage of plasma discharge and vibration due to vibration, which are conventional problems, are present. Since generation
- Table 1 shows the glass powder used in the examples.
- the following glass powder and the average particle diameter (D50) and maximum particle diameter (Dmax) of a filler are the values measured using the Nikkiso Co., Ltd microtrac particle size distribution measuring apparatus (MT3000).
- the glass transition point and softening point of the glass powder are heated in air at a heating rate of 10 ° C./min using differential thermal analysis, and the temperature is plotted on the horizontal axis and the amount of heat is plotted on the vertical axis to draw a DTA curve.
- the yield point of the glass powder is a value measured by heating in air at a heating rate of 5 ° C./min using a thermal expansion measuring device.
- the refractive index measurement of the glass powder and the filler was performed by the Becke method, and the measurement was performed with g-line (436 nm).
- the average refractive index of the inorganic powder was determined by the volume average of the powder refractive index contained.
- the refractive index of the organic component was measured by applying a material obtained by removing the inorganic component from the paste composition and drying the resultant at 100 ° C. for 30 minutes to remove the solvent and measuring the refractive index of the organic component coating film. The measurement was performed with g-line (436 nm).
- the glass powder of Table 1 and the raw material containing the filler are weighed in the compositions and ratios shown in Tables 2 and 3, mixed, kneaded with three rollers to produce a photosensitive sealing layer forming glass paste, and after firing Exposure was performed after applying the partition wall forming paste and the sealing layer forming paste so as to have respective heights.
- Filler J 40 parts by weight of silicon oxide, 10 parts by weight of boron oxide, 5 parts by weight of zinc oxide, 30 parts by weight of aluminum oxide, 5 parts by weight of magnesium oxide, 5 parts by weight of barium oxide, 5 parts by weight of calcium oxide.
- High melting point glass filler K having a glass transition point of 650 ° C., a softening point of 740 ° C.
- glass powder composed of Bi 2 O 3 / SiO 2 / Al 2 O 3 / ZnO / B 2 O 3 / BaO 60/20/5/10/2/3 (weight%) (average particle diameter 2 ⁇ m) ) 60 parts by weight, 10 parts by weight of titanium oxide powder having a volume average particle diameter of 0.2 ⁇ m, 5% by weight of ethyl cellulose, and 20% by weight of terpineol, and then baked at 580 ° C. to form a dielectric having a thickness of 10 ⁇ m. A layer was formed.
- a partition wall forming paste 1 was prepared by adding parts by weight and 20 parts by weight of butyl carbitol acetate and kneading with three rollers.
- a partition wall forming paste 2 was prepared by adding 20 parts by weight of tall acetate and kneading with three rollers.
- the partition wall forming paste 1 was applied with a die coater so as to have a thickness of 100 ⁇ m after firing, and then dried in a clean oven at 100 ° C. for 40 minutes. Thus, a coating film was formed. Thereafter, exposure is performed through the photomasks shown in Tables 2 and 3. Further, the partition wall forming paste 2 was applied with a die coater so as to have a predetermined thickness, and then dried in a clean oven at 100 ° C. for 30 minutes to form a coating film. Exposure is performed through the photomask shown. Each photomask pattern is shown below.
- Photomask A stripe pattern perpendicular to address electrodes, pitch 480 ⁇ m, opening 40 ⁇ m
- Photomask B stripe pattern parallel to address electrodes, pitch 160 ⁇ m
- Photomask C lattice pattern, pattern pitch 480 ⁇ m perpendicular to the address electrodes, pattern pitch parallel to the address electrodes 160 ⁇ m, and openings 40 ⁇ m in all.
- Photomask D stripe pattern parallel to address electrodes, pitch 160 ⁇ m, opening 20 ⁇ m
- the photosensitive sealing layer forming glass pastes of Examples and Comparative Examples were applied on the exposed partition wall forming paste coating film by a die coater so that the dry film thickness was 10 ⁇ m. Thereafter, exposure was performed through the photomask pattern D. Thereafter, development was performed collectively with a 0.5 wt% sodium carbonate aqueous solution, followed by baking at 590 ° C. for 15 minutes to form a partition wall pattern and a sealing layer pattern.
- the partition wall forming paste 1 was applied by a die coater so as to have a thickness of 115 ⁇ m after firing, and then dried in a clean oven at 100 ° C. for 40 minutes, whereby a coating film And exposure is performed through the photomask C. Then, the glass paste for photosensitive sealing layer formation of each Example was apply
- Each phosphor phosphor paste was applied to the barrier ribs thus formed by screen printing and baked (500 ° C., 30 minutes) to form a phosphor layer on the side and bottom of the barrier ribs.
- a 42-inch PD-200 (Asahi Glass Co., Ltd.) measuring 980 ⁇ 554 ⁇ 1.8 mm was used as a glass substrate.
- a resist was applied, and a transparent electrode having a thickness of 0.1 ⁇ m and a line width of 200 ⁇ m was formed by exposure / development processing and etching processing.
- a photosensitive glass paste containing a black pigment was applied onto the substrate by screen printing, dried, and exposed through a photomask.
- the photosensitive silver paste was applied and dried by screen printing on the exposed black paste coating film, exposed through a predetermined photomask, and developed to form an unfired pattern. After pattern formation, baking was performed at 570 ° C. for 15 minutes, or IR drying was performed at 190 ° C. for 10 minutes.
- glass powder containing 70% by weight of bismuth oxide, 10% by weight of silicon oxide, 5% by weight of aluminum oxide, 5% by weight of zinc oxide, and 10% by weight of boron oxide, 10 parts by weight of ethyl cellulose, and 20% of terpineol
- a glass paste obtained by kneading the parts by weight was applied by screen printing to a thickness of 50 ⁇ m so as to cover the bus electrode of the display part, and then baked at 570 ° C. for 15 minutes to form a transparent dielectric.
- a magnesium oxide layer having a thickness of 0.5 ⁇ m was formed as a protective film by electron beam evaporation on the substrate on which the dielectric was formed, and a front plate was produced.
- the obtained front substrate was bonded to the above-mentioned rear substrate, kept at 490 ° C. for 20 minutes, and then kept at 400 ° C. for 3 hours, thereby sealing and exhausting. Thereafter, a discharge gas was sealed and a drive circuit was joined to produce a full high-definition plasma display panel with a resolution of 1920 ⁇ 1080.
- the plasma display panels obtained in Examples 1 to 14 and Comparative Examples 1 to 4 were evaluated by the following methods.
- the produced plasma display was placed horizontally with the front plate side facing up, and an alumina ceramic ball having a weight of 300 g was dropped from a height of 1 m to confirm the occurrence of partition wall chipping and micro chipping. This was repeated 10 times, and the occurrence of partition wall chipping and micro chipping was confirmed. This evaluation was performed on 10 samples of each level of the panel, and when the panel in which chipping occurred was 1 sample, it was expressed as 1/10.
- the minute chipping is a chipping of 5 ⁇ m or less that does not cause a problem when the PDP is turned on. Evaluation was performed according to the following evaluation criteria.
- AA partition wall chip 0/10 and minute chip 0/10
- A partition wall chip 0/10 and minute chip 1/10
- B Separation of the partition wall 0/10 and minute chipping 2/10 to 4/10 C: 1/10 or more of partition wall chipping or 5/10 or more of micro chipping
- a driving circuit was mounted to produce a PDP.
- a voltage was applied to the scan electrode of the PDP to emit light.
- Crosstalk evaluation raises the voltage from the applied voltages V 1 to full lighting were measured voltage difference between the applied voltage V 2 crosstalk occurs V 2 -V 1 (V). Evaluation was performed according to the following evaluation criteria.
- the external pressure was changed from atmospheric pressure to 600 hPa sequentially, and the presence or absence of noise generation was confirmed when voltage was applied to the PDP scan electrode to emit light, and the following evaluation criteria were used.
- AA No noise is generated at an external pressure of 600 hPa
- A Noise is not generated at an external pressure of 700 hPa, but noise is generated at 600 hPa
- B Noise is not generated at an external pressure of 800 hPa, but noise is generated at 700 hPa
- C Noise is generated at an external pressure of 800 hPa Evaluation result Is shown in Table 4.
- the plasma display panels obtained in Examples 1 to 14 were able to form good partition walls and sealing layer patterns. In addition, good results were obtained with respect to partition wall strength and panel characteristics. In Comparative Examples 1 to 4, satisfactory results were not obtained in terms of partition wall and sealing layer pattern formation, partition wall strength, panel characteristics, and the like.
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Abstract
Description
1.75≦N1≦1.95 (1)
N1は、下式(2)を満たすことが好ましい。
1.75≦N1≦1.90 (2)
前記感光性有機成分を含む有機成分の平均屈折率N2は下式(3)を満たすことが好ましい。
1.45≦N2≦1.65 (3)
前記無機成分の平均屈折率N1と前記有機成分の平均屈折率N2は下式(4)を満たすことが好ましい。
0.2≦N1-N2≦0.5 (4)
前記紫外線吸収剤は有機染料であり、ペースト中の含有量が0.01~2重量%であることが好ましい。 That is, the present invention comprises (A) a glass powder having a glass transition point of 410 to 480 ° C., a yield point of 470 to 510 ° C., and a softening point of 515 to 550 ° C., (B) a photosensitive organic component, and (C) an ultraviolet ray absorbing material. And (D) a photosensitive paste containing a solvent, wherein the average refractive index N1 of an inorganic component containing glass powder satisfies the following formula (1).
1.75 ≦ N1 ≦ 1.95 (1)
N1 preferably satisfies the following formula (2).
1.75 ≦ N1 ≦ 1.90 (2)
The average refractive index N2 of the organic component including the photosensitive organic component preferably satisfies the following formula (3).
1.45 ≦ N2 ≦ 1.65 (3)
The average refractive index N1 of the inorganic component and the average refractive index N2 of the organic component preferably satisfy the following formula (4).
0.2 ≦ N1-N2 ≦ 0.5 (4)
The ultraviolet absorber is an organic dye, and the content in the paste is preferably 0.01 to 2% by weight.
1.45<Na<1.65 (5)
0.2≦N1-Na≦0.5 (6)
さらに、本発明は、基板上に、第1の感光性隔壁形成用ペーストを塗布する工程、フォトマスクを介して露光する工程、第2の感光性隔壁形成用ペーストを塗布する工程、フォトマスクを介して露光する工程を経た後に、上述の感光性封着層形成用ガラスペーストを塗布する工程、フォトマスクを介して露光する工程、現像工程、焼成工程を経て、放電空間を仕切るための隔壁および封着層を形成するプラズマディスプレイの製造方法であって、前記第1の感光性隔壁形成用ペースト中の無機成分の平均屈折率Na、前記第2の感光性隔壁形成用ペースト中の無機成分の平均屈折率Nbおよび前記感光性封着層形成用ガラスペースト中の無機成分の平均屈折率N1が下式(5)~(8)を満たすことを特徴とするプラズマディスプレイの製造方法である。
1.45<Na<1.65 (5)
0.2≦N1-Na≦0.5 (6)
1.45<Nb<1.65 (7)
0.2≦N1-Nb≦0.5 (8)
前記プラズマディスプレイの製造方法においては、前記第1の感光性隔壁形成用ペースト中の無機成分の平均屈折率Naおよび前記第2の感光性隔壁形成用ペースト中の無機成分の平均屈折率Nbが下式(9)を満たすことが好ましい。
-0.1≦Nb-Na≦0.1 (9)
さらに、本発明は、前記製造方法により得られたプラズマディスプレイに関する。 In addition, the present invention includes a step of applying a photosensitive barrier rib forming paste on a substrate, a step of applying a photosensitive sealing layer forming glass paste after a step of exposing through a photomask, and a photomasking step. A method for manufacturing a plasma display, wherein a barrier rib for partitioning a discharge space and a sealing layer are formed through a step of exposing through a mask, a developing step, and a baking step, wherein the inorganic component in the photosensitive barrier rib forming paste And the average refractive index N1 of the inorganic component in the photosensitive sealing layer-forming glass paste satisfies the following formulas (5) and (6).
1.45 <Na <1.65 (5)
0.2 ≦ N1-Na ≦ 0.5 (6)
Furthermore, the present invention includes a step of applying a first photosensitive barrier rib forming paste on a substrate, a step of exposing through a photomask, a step of applying a second photosensitive barrier rib forming paste, and a photomask. Barrier ribs for partitioning the discharge space through a step of applying the glass paste for forming a photosensitive sealing layer, a step of exposing via a photomask, a development step, and a baking step A method for manufacturing a plasma display for forming a sealing layer, comprising: an average refractive index Na of an inorganic component in the first photosensitive barrier rib forming paste; and an inorganic component in the second photosensitive barrier rib forming paste. Production of plasma display, characterized in that average refractive index Nb and average refractive index N1 of the inorganic component in said photosensitive sealing layer forming glass paste satisfy the following formulas (5) to (8): It is the law.
1.45 <Na <1.65 (5)
0.2 ≦ N1-Na ≦ 0.5 (6)
1.45 <Nb <1.65 (7)
0.2 ≦ N1-Nb ≦ 0.5 (8)
In the plasma display manufacturing method, the average refractive index Na of the inorganic component in the first photosensitive barrier rib forming paste and the average refractive index Nb of the inorganic component in the second photosensitive barrier rib forming paste are low. It is preferable to satisfy Formula (9).
−0.1 ≦ Nb—Na ≦ 0.1 (9)
Furthermore, this invention relates to the plasma display obtained by the said manufacturing method.
1.75≦N1≦1.95 (1)
通常、隔壁などのパターン形成を行う感光性ガラスペーストにおいては、露光に用いる光(以下、露光光という)の散乱を抑えることによってアスペクト比の大きなパターンを形成する目的で、感光性有機成分を含む有機成分の平均屈折率と無機成分の平均屈折率を整合させることが多い。しかし、本発明の感光性封着層形成用ガラスペーストは、先にも述べたとおり、隔壁頂部に形成し、隔壁と一括して現像、焼成を行い封着層を形成するために、先に露光を施した感光性隔壁形成用ペースト塗布膜に露光光を届かせないようにする必要がある。このため、紫外線吸収剤を添加するが、紫外線吸収剤のみで露光光の透過率を調整しようとすると、硬化のために必要な露光光が感光性封着層形成用ペースト塗布膜の底の部分にまで到達せず、現像時に剥がれたり、変形したりする。 In the glass paste for forming a photosensitive sealing layer of the present invention, it is necessary that the average refractive index N1 of the inorganic component contained satisfies the following formula 1.
1.75 ≦ N1 ≦ 1.95 (1)
Usually, a photosensitive glass paste that forms a pattern such as a partition wall contains a photosensitive organic component for the purpose of forming a pattern with a large aspect ratio by suppressing scattering of light used for exposure (hereinafter referred to as exposure light). The average refractive index of the organic component and the average refractive index of the inorganic component are often matched. However, as described above, the glass paste for forming a photosensitive sealing layer of the present invention is formed on the top of the partition wall, and is developed and fired together with the partition wall to form a sealing layer. It is necessary to prevent exposure light from reaching the photosensitive barrier rib forming paste coating film that has been exposed. For this reason, an ultraviolet absorber is added, but if the transmittance of the exposure light is adjusted only by the ultraviolet absorber, the exposure light necessary for curing is exposed at the bottom portion of the paste coating film for forming the photosensitive sealing layer. Does not reach the point, and peels off or deforms during development.
1.45≦N2≦1.65 (3)
さらに、N1およびN2は下式(4)を満たすことが好ましい。
0.2≦N1-N2≦0.5 (4)
N1、N2が上式(1)、(3)、(4)を満たすことによって、特に露光光を適度に散乱させることができ、感光性封着層形成用ペースト塗布膜の底部まで十分硬化し、下層である感光性隔壁形成用ペースト塗布膜をさらに硬化させないようにすることができる。N2が1.45より小さいか、N1-N2が0.5よりも大きいと露光光が散乱しすぎて感光性封着層形成用ペースト塗布膜の底部まで十分硬化しない場合があり、N1-N2が0.2よりも小さいと露光光が透過しすぎて感光性隔壁形成用ペースト塗布膜の露光パターンが変化してしまう場合がある。 Further, in order to appropriately scatter the exposure light as described above, the average refractive index N2 of the organic component including the photosensitive organic component in the photosensitive sealing layer forming paste of the present invention satisfies the following formula (3). It is preferable.
1.45 ≦ N2 ≦ 1.65 (3)
Further, N1 and N2 preferably satisfy the following formula (4).
0.2 ≦ N1-N2 ≦ 0.5 (4)
When N1 and N2 satisfy the above formulas (1), (3), and (4), it is possible to scatter the exposure light in particular, and it is sufficiently cured to the bottom of the paste coating film for forming the photosensitive sealing layer. Further, the photosensitive barrier rib forming paste coating film as the lower layer can be prevented from further curing. If N2 is smaller than 1.45 or N1-N2 is larger than 0.5, the exposure light may be scattered too much and the bottom of the photosensitive sealing layer forming paste coating film may not be sufficiently cured. If it is smaller than 0.2, the exposure light may be transmitted too much and the exposure pattern of the photosensitive barrier rib forming paste coating film may change.
以下、本発明の感光性有機成分について記載する。 The glass paste for forming a photosensitive sealing layer of the present invention contains a solvent in order to obtain a uniform coating film. As the solvent, an organic solvent is preferable. The content of the organic solvent varies depending on the specific gravity of the glass powder, but is preferably 15 to 45% by weight in the paste. In other ranges, the paste cannot be applied well and a uniform film cannot be obtained. Examples of the organic solvent used at this time include methyl cellosolve, ethyl cellosolve, butyl cellosolve, methyl ethyl ketone, dioxane, acetone, cyclohexanone, cyclopentanone, isobutyl alcohol, isopropyl alcohol, tetrahydrofuran, dimethyl sulfoxide, γ-butyrolactone, bromo Benzene, chlorobenzene, dibromobenzene, dichlorobenzene, bromobenzoic acid, chlorobenzoic acid, terpineol, diethylene glycol monobutyl ether acetate and the like, and an organic solvent mixture containing one or more of these are preferably used.
Hereinafter, the photosensitive organic component of the present invention will be described.
1.45<Na<1.65 (5)
一方、封着層は焼成後2~10μmと隔壁と比べて比較的薄く、感光性封着層形成用ガラスペースト塗布膜の露光は、下層の隔壁パターンに影響しないように、先に露光を施している隔壁形成用ペースト塗布膜へ露光光が届かないように調整する必要がある。一方で、感光性封着層形成用ガラスペースト塗布膜底部まで露光光を透過させて、しっかりと硬化させる必要がある。このことから、本発明の感光性封着層形成用ガラスペースト中の無機成分の平均屈折率N1は、溶剤を除く有機成分との屈折率差を制御する必要があり、結果として、先の感光性隔壁形成用ペーストの無機成分の平均屈折率Naとは、下式(6)を満たす用制御する必要がある。
0.2≦N1-Na≦0.5 (6)
また、隔壁頂部に形成する封着層パターンについては、隔壁パターンが単純なストライプ構造であれば、隔壁頂部全面に封着層を形成しても問題はないが、隔壁構造が井桁構造やワッフル構造などの場合には、封着層を隔壁パターンと全く同じように形成してしまうと、隔壁および封着層に囲まれたセル内が前面板との封着後には、完全に密閉されてしまうため、ガスの排気が十分に行われなくなってしまう。このため、井桁構造やワッフル構造などの隔壁パターンの場合には、アドレス電極に平行に形成される隔壁頂部にのみ封着層を形成することで、排気の問題を解決できる。 As a method of forming the sealing layer on the top of the partition wall that partitions the discharge space of the plasma display using the glass paste for forming the photosensitive sealing layer of the present invention, an application in which the photosensitive partition wall forming paste is applied on the substrate After the film is exposed through a photomask having a final partition wall pattern, the coating film coated with the photosensitive sealing layer forming glass paste of the present invention is applied through a photomask having a sealing layer pattern. After exposure and development in a lump, baking is performed, whereby barrier ribs and a sealing layer for partitioning the discharge space can be formed. At this time, since the partition height of the plasma display needs to be about 70 to 150 μm after firing, the average refractive index Na of the inorganic component contained in the paste for forming the photosensitive partition is the refractive index difference of the organic component excluding the solvent. It is necessary to make it small, and it is preferable to satisfy the following formula (5).
1.45 <Na <1.65 (5)
On the other hand, the sealing layer is 2 to 10 μm after firing, which is relatively thin compared to the barrier ribs. The exposure of the glass paste coating film for forming the photosensitive sealing layer is first performed so as not to affect the barrier rib pattern of the lower layer. It is necessary to adjust so that the exposure light does not reach the barrier rib forming paste coating film. On the other hand, it is necessary to transmit the exposure light to the bottom of the glass paste coating film for forming the photosensitive sealing layer and to cure it firmly. Therefore, the average refractive index N1 of the inorganic component in the glass paste for forming a photosensitive sealing layer of the present invention needs to control the refractive index difference from the organic component excluding the solvent. The average refractive index Na of the inorganic component of the conductive partition wall forming paste needs to be controlled so as to satisfy the following formula (6).
0.2 ≦ N1-Na ≦ 0.5 (6)
As for the sealing layer pattern formed on the top of the partition wall, if the partition pattern is a simple stripe structure, there is no problem even if the sealing layer is formed on the entire top surface of the partition wall. In such a case, if the sealing layer is formed in exactly the same manner as the barrier rib pattern, the cell surrounded by the barrier ribs and the sealing layer is completely sealed after sealing with the front plate. For this reason, gas cannot be exhausted sufficiently. For this reason, in the case of a partition pattern such as a cross-beam structure or a waffle structure, the problem of exhaust can be solved by forming a sealing layer only on the top of the partition formed parallel to the address electrodes.
1.45<Na<1.65 (5)
0.2≦N1-Na≦0.5 (6)
1.45<Nb<1.65 (7)
0.2≦N1-Nb≦0.5 (8)
-0.1 ≦ Nb-Na ≦ 0.1 (9)
隔壁形成用の感光性ガラスペーストを塗布した後、露光装置を用いて露光を行うが、露光は、通常のフォトリソグラフィー法で行われるように、フォトマスクを用いてマスク露光する方法が一般的である。 Further, as described above, since the sealing layer is formed as thin as 2 to 10 μm after firing, the thickness of the sealing layer alone may result in insufficient exhaust after sealing. For this reason, the barrier rib pattern formed parallel to the address electrode is formed higher than the height of the barrier rib pattern formed to be perpendicular to or intersecting with the address electrode, and the sealing layer is formed only on the high barrier rib pattern, Can solve the problem of exhaust. In this case, a step of applying a first photosensitive barrier rib forming paste on the substrate, a step of exposing through a photomask having a pattern perpendicular to or intersecting with the address electrodes, the first photosensitive barrier rib forming paste A step of applying a second photosensitive barrier rib forming paste on the coating film, a step of exposing through a photomask having a pattern parallel to the address electrodes, and then applying a photosensitive sealing layer forming glass paste of the present invention Then, exposure is performed through a photomask having a sealing layer pattern, and then a development process and a baking process are performed, so that a partition wall pattern formed in parallel to the address electrode is formed to be perpendicular to or intersecting with the address electrode. It can be formed higher than the height of the partition wall pattern, and the sealing layer can be formed only on the high partition wall pattern. At this time, the first and second photosensitive partition forming photosensitive pastes need to be adjusted to reduce the average refractive index of the inorganic material contained and the refractive index of the organic component excluding the solvent. The average refractive index Na of the inorganic component in the photosensitive barrier rib forming paste and the average refractive index Nb of the inorganic component in the second photosensitive barrier rib forming paste satisfy the following expressions (5) and (7). Important. In addition, as described above, the exposure light does not reach the barrier rib forming paste coating film that has been previously exposed so that the exposure of the photosensitive sealing layer forming glass paste coating film does not affect the barrier rib pattern of the lower layer. On the other hand, since it is necessary to transmit the exposure light to the bottom of the glass paste coating film for forming the photosensitive sealing layer, it is necessary to cure firmly, so that the photosensitive sealing layer of the present invention is formed. The average refractive index N1 of the inorganic component in the glass paste must be controlled for the difference in refractive index with the organic component excluding the solvent, and it is important that the following formulas (6), (8), and (9) are satisfied. is there.
1.45 <Na <1.65 (5)
0.2 ≦ N1-Na ≦ 0.5 (6)
1.45 <Nb <1.65 (7)
0.2 ≦ N1-Nb ≦ 0.5 (8)
-0.1 ≤ Nb-Na ≤ 0.1 (9)
After the photosensitive glass paste for forming the barrier ribs is applied, exposure is performed using an exposure apparatus, and the exposure is generally performed by a mask exposure using a photomask, as in a normal photolithography method. is there.
W2<W1
また、隔壁パターンが、単純なストライプ構造ではなく、井桁構造やワッフル構造などの場合には、封着層を隔壁パターンと全く同じように形成してしまうと、隔壁および封着層に囲まれたセル内が前面板との封着後には、完全に密閉されてしまうため、ガスの排気が十分に行われなくなってしまう。このため、井桁構造やワッフル構造などの隔壁パターンの場合には、アドレス電極に平行に形成される隔壁パターンと垂直に形成される隔壁パターンの高さを変え、高い隔壁パターン上にのみ封着層を形成することで、排気の問題を解決できる。 The exposure method is determined by the structure of the partition wall to be formed and the structure of the sealing layer. When the sealing layer is simply formed on the entire top surface of the partition wall, a sealing layer forming photomask having the same pattern as the partition wall pattern forming photomask is used. The opening width of the photomask is adjusted as appropriate, but in order to form the sealing layer only on the top of the partition wall with high accuracy, the opening width of the photomask for partition wall formation is W1, and the opening width W2 of the photomask for sealing layer formation is In this case, it is preferable to satisfy the following formula.
W2 <W1
In addition, when the barrier rib pattern is not a simple stripe structure but a cross beam structure or a waffle structure, if the sealing layer is formed in exactly the same manner as the barrier rib pattern, the barrier rib pattern is surrounded by the barrier rib and the sealing layer. After the inside of the cell is sealed with the front plate, the gas is not completely exhausted because the cell is completely sealed. For this reason, in the case of a barrier rib pattern such as a cross-beam structure or a waffle structure, the height of the barrier rib pattern formed perpendicular to the barrier rib pattern formed parallel to the address electrodes is changed, and the sealing layer is formed only on the high barrier rib pattern. The problem of exhaust can be solved by forming.
表1に実施例に用いたガラス粉末を示す。 (Examples 1 to 14, Comparative Examples 1 to 4)
Table 1 shows the glass powder used in the examples.
フィラーK:平均粒子径0.2μmの酸化ケイ素
ポリマー:酸価=85、重量平均分子量(Mw)32,000の感光性アクリルポリマー(東レ(株)製APX-716)
モノマー:プロピレンオキシド変性トリメチロールプロパントリアクリレート(第一工業製薬(株)製)
光重合開始剤:2-ベンジル-2-ジメチルアミノ-1-(4-モルフォリノフェニル)-ブタノン-1(チバ・スペシャルティ・ケミカルズ(株)製、IC-369)
増感剤:4,4-ビス(ジエチルアミノ)ベンゾフェノン
分散剤:ポリカルボン酸化合物の高分子活性剤(共栄社化学(株)製、“フローノン”G-700DMEA)
脂肪族アミド化合物:N,N’-12-ヒドロキシステアリン酸ブチレンジアミン
紫外線吸収剤:ベーシックブルー26
重合禁止剤:p-メトキシフェノール
有機溶剤:ジエチレングリコールモノブチルエーテルアセテート
ガラス基板として、590×964×1.8mmの42インチサイズのPD-200(旭硝子(株)製)を使用した。この基板上に、アドレス電極として、平均粒径2.0μmの銀粉末を70重量部、Bi2O3/SiO2/Al2O3/B2O3/BaO=69/20/4/7(重量%)からなるガラス粉末(平均粒径2.2μm)を2重量部、アクリル酸、メチルメタクリレート、スチレンの共重合ポリマー8重量部、トリメチロールプロパントリアクリレート7重量部、ベンゾフェノン3重量部、ブチルカルビトールアクリレート7重量部、ベンジルアルコール3重量部からなる感光性銀ペーストを用いて、フォトリソグラフィー法により、ピッチ160μm、線幅60μm、焼成後厚み3μmのストライプ状電極を形成した。 Filler J: 40 parts by weight of silicon oxide, 10 parts by weight of boron oxide, 5 parts by weight of zinc oxide, 30 parts by weight of aluminum oxide, 5 parts by weight of magnesium oxide, 5 parts by weight of barium oxide, 5 parts by weight of calcium oxide. High melting point glass filler K having a glass transition point of 650 ° C., a softening point of 740 ° C. and a refractive index of 1.58: a silicon oxide polymer having an average particle diameter of 0.2 μm: an acid value = 85, and a photosensitivity having a weight average molecular weight (Mw) of 32,000 Acrylic polymer (APX-716 manufactured by Toray Industries, Inc.)
Monomer: Propylene oxide modified trimethylolpropane triacrylate (Daiichi Kogyo Seiyaku Co., Ltd.)
Photopolymerization initiator: 2-benzyl-2-dimethylamino-1- (4-morpholinophenyl) -butanone-1 (Ciba Specialty Chemicals Co., Ltd., IC-369)
Sensitizer: 4,4-bis (diethylamino) benzophenone Dispersant: Polymer activator of polycarboxylic acid compound (“Kuroei” G-700DMEA, manufactured by Kyoeisha Chemical Co., Ltd.)
Aliphatic amide compound: N, N′-12-hydroxystearic acid butylenediamine UV absorber: Basic Blue 26
Polymerization inhibitor: p-methoxyphenol Organic solvent: diethylene glycol monobutyl ether acetate A 42-inch PD-200 (manufactured by Asahi Glass Co., Ltd.) of 590 × 964 × 1.8 mm was used as a glass substrate. On this substrate, as an address electrode, 70 parts by weight of silver powder having an average particle diameter of 2.0 μm, Bi 2 O 3 / SiO 2 / Al 2 O 3 / B 2 O 3 / BaO = 69/20/4/7 2 parts by weight of glass powder (average particle size 2.2 μm), 8 parts by weight of a copolymer of acrylic acid, methyl methacrylate and styrene, 7 parts by weight of trimethylolpropane triacrylate, 3 parts by weight of benzophenone, Using a photosensitive silver paste composed of 7 parts by weight of butyl carbitol acrylate and 3 parts by weight of benzyl alcohol, a striped electrode having a pitch of 160 μm, a line width of 60 μm, and a thickness of 3 μm after firing was formed by photolithography.
フォトマスクB:アドレス電極と平行なストライプパターン、ピッチ160μm、開口40μm
フォトマスクC:格子状パターン、アドレス電極と垂直なパターンピッチ480μm、アドレス電極と平行なパターンピッチ160μm、開口はいずれも40μm
フォトマスクD:アドレス電極と平行なストライプパターン、ピッチ160μm、開口20μm
露光を施した隔壁形成用ペースト塗布膜上に、乾燥膜厚が10μmとなるように、各実施例、および比較例の感光性封着層形成用ガラスペーストをダイコーターにより塗布した。その後、フォトマスクパターンDを介して露光を実施した。その後0.5重量%の炭酸ナトリウム水溶液で一括して現像し、さらに、590℃で15分間焼成することにより、隔壁パターンおよび、封着層パターンを形成した。 Photomask A: stripe pattern perpendicular to address electrodes, pitch 480 μm, opening 40 μm
Photomask B: stripe pattern parallel to address electrodes, pitch 160 μm, opening 40 μm
Photomask C: lattice pattern, pattern pitch 480 μm perpendicular to the address electrodes, pattern pitch parallel to the address electrodes 160 μm, and openings 40 μm in all.
Photomask D: stripe pattern parallel to address electrodes, pitch 160 μm, opening 20 μm
The photosensitive sealing layer forming glass pastes of Examples and Comparative Examples were applied on the exposed partition wall forming paste coating film by a die coater so that the dry film thickness was 10 μm. Thereafter, exposure was performed through the photomask pattern D. Thereafter, development was performed collectively with a 0.5 wt% sodium carbonate aqueous solution, followed by baking at 590 ° C. for 15 minutes to form a partition wall pattern and a sealing layer pattern.
<パターン形成性(隔壁・封着層)>
作製した42インチ背面板の隔壁形状不良箇所、パターン太りやパターン欠け、封着層の形状不良の発生状況を確認した。この評価をパネル10サンプルについて実施し、10枚中の隔壁不良箇所をカウントし、以下の評価基準により評価した。
AA:表示不良となる隔壁欠陥0箇所、かつ表示不良とならない欠陥1箇所以下
A:表示不良となる隔壁欠陥0箇所、かつ表示不良とならない欠陥2~5箇所
B:表示不良となる隔壁欠陥0箇所、かつ表示不良とならない欠陥6~10箇所
C:表示不良となる隔壁欠陥1箇所以上、または表示不良とならない欠陥11箇所以上
<封着層密着性>
作製した前面基板と背面基板を重ねた状態で(周辺部の封着フリット塗布せずに)封着条件にて温度をかけた後、前面板と背面板を剥がす方向に2kg重の力を加えた際の封着層の剥がれ状態をパネル10サンプルについて確認した。以下の評価基準により評価した。
A:剥がれ箇所0箇所
B:剥がれ箇所1箇所
C:剥がれ箇所2箇所以上
<隔壁強度>
作製したプラズマディスプレイを前面板側を上にして水平に床置きし、1mの高さから重さ300gのアルミナ製セラミックボールを落下させ、隔壁欠け、および微小欠けの発生状況を確認した。これを10回繰り返し、隔壁欠け、および微小欠けの発生状況を確認した。この評価を各水準のパネル10サンプルについて行い、欠けが発生したパネルが1サンプルであった場合1/10として表記した。微小欠けはPDPを点灯した際に問題とならない5μm以下の欠けとする。以下の評価基準により評価した。
AA:隔壁欠け0/10、かつ微小欠け0/10
A:隔壁欠け0/10、かつ微小欠け1/10
B:隔壁欠け0/10、かつ微小欠け2/10~4/10
C:隔壁欠け1/10以上、または微小欠け5/10以上
<クロストーク評価>
作製した前面基板と背面基板を封着して、Xe15%含有のNeガスを内部ガス圧66500Paになるように封入した。さらに、駆動回路を実装してPDPを作製した。PDPのスキャン電極に電圧を印加して発光させた。クロストーク評価は、全面点灯する印可電圧V1から電圧を上昇させ、クロストークが発生する印可電圧V2間の電圧差V2-V1(V)を測定した。以下の評価基準により評価した。
AA:90≦V2-V1
A:70≦V2-V1<90
B:50≦V2-V1<70
C:V2-V1<50
<残留ガス量評価>
作製した前面基板と背面基板を封着した後、パネル全体を400℃に加熱し、パネル内から排出される水分、CH系ガス量を測定した。封着層を形成していないパネルのガス量を規準として、評価した。
<ノイズ評価>
作製した前面基板と背面基板を封着して、Xe15%含有のNeガスを内部ガス圧66500Paになるように封入した。さらに、駆動回路を実装してPDPを作製した。外気圧を大気圧から600hPaまで順次変化させ、PDPのスキャン電極に電圧を印加して発光させた際のノイズ発生の有無を確認し、以下の評価基準により評価した。
AA:外気圧600hPaでノイズ発生しない
A:外気圧700hPaではノイズ発生しないが600hPaでノイズ発生する
B:外気圧800hPaではノイズ発生しないが700hPaでノイズ発生する
C:外気圧800hPaでノイズ発生する
評価結果を表4に示す。 The plasma display panels obtained in Examples 1 to 14 and Comparative Examples 1 to 4 were evaluated by the following methods.
<Pattern formability (partition / sealing layer)>
The state of occurrence of defective partition wall shape, pattern thickening and pattern chipping, and defective sealing layer shape of the 42-inch back plate was confirmed. This evaluation was carried out on 10 panel samples, and the defective partition walls in 10 sheets were counted and evaluated according to the following evaluation criteria.
AA: 0 partition wall defect that causes display failure and 1 defect or less that does not cause display failure A: 0 partition wall defect that causes display failure and 2 to 5 defects that do not cause display failure B: 0 partition wall defect that causes display failure 6 to 10 defects that do not cause display defects C: 1 or more partition wall defects that cause display defects or 11 or more defects that do not cause display defects <Sealing layer adhesion>
After applying the temperature under the sealing conditions with the front substrate and the rear substrate overlapped (without applying the peripheral frit on the periphery), a force of 2 kg is applied in the direction to peel off the front plate and the back plate. The panel 10 sample was checked for the peeled state of the sealing layer. Evaluation was performed according to the following evaluation criteria.
A: Peeling part 0 part B: Peeling part 1 part C: Peeling part 2 or more <partition wall strength>
The produced plasma display was placed horizontally with the front plate side facing up, and an alumina ceramic ball having a weight of 300 g was dropped from a height of 1 m to confirm the occurrence of partition wall chipping and micro chipping. This was repeated 10 times, and the occurrence of partition wall chipping and micro chipping was confirmed. This evaluation was performed on 10 samples of each level of the panel, and when the panel in which chipping occurred was 1 sample, it was expressed as 1/10. The minute chipping is a chipping of 5 μm or less that does not cause a problem when the PDP is turned on. Evaluation was performed according to the following evaluation criteria.
AA: partition wall chip 0/10 and minute chip 0/10
A: partition wall chip 0/10 and minute chip 1/10
B: Separation of the partition wall 0/10 and minute chipping 2/10 to 4/10
C: 1/10 or more of partition wall chipping or 5/10 or more of micro chipping <Crosstalk evaluation>
The produced front substrate and back substrate were sealed, and Ne gas containing Xe 15% was sealed so as to have an internal gas pressure of 66500 Pa. Further, a driving circuit was mounted to produce a PDP. A voltage was applied to the scan electrode of the PDP to emit light. Crosstalk evaluation raises the voltage from the applied voltages V 1 to full lighting were measured voltage difference between the applied voltage V 2 crosstalk occurs V 2 -V 1 (V). Evaluation was performed according to the following evaluation criteria.
AA: 90 ≦ V 2 −V 1
A: 70 ≦ V 2 −V 1 <90
B: 50 ≦ V 2 −V 1 <70
C: V 2 −V 1 <50
<Residual gas amount evaluation>
After sealing the produced front substrate and back substrate, the whole panel was heated to 400 ° C., and the moisture and CH gas content discharged from the panel were measured. Evaluation was made with reference to the gas amount of the panel on which the sealing layer was not formed.
<Noise evaluation>
The produced front substrate and back substrate were sealed, and Ne gas containing Xe 15% was sealed so as to have an internal gas pressure of 66500 Pa. Further, a driving circuit was mounted to produce a PDP. The external pressure was changed from atmospheric pressure to 600 hPa sequentially, and the presence or absence of noise generation was confirmed when voltage was applied to the PDP scan electrode to emit light, and the following evaluation criteria were used.
AA: No noise is generated at an external pressure of 600 hPa A: Noise is not generated at an external pressure of 700 hPa, but noise is generated at 600 hPa B: Noise is not generated at an external pressure of 800 hPa, but noise is generated at 700 hPa C: Noise is generated at an external pressure of 800 hPa Evaluation result Is shown in Table 4.
Claims (9)
- (A)ガラス転移点が410~480℃、屈伏点が470~510℃、軟化点が515~550℃のガラス粉末、(B)感光性有機成分、(C)紫外線吸収剤、および(D)溶剤を含む感光性ペーストであって、ガラス粉末を含む無機成分の平均屈折率N1が下式(1)を満たすことを特徴とする感光性封着層形成用ガラスペースト。
1.75≦N1≦1.95 (1) (A) Glass powder having a glass transition point of 410 to 480 ° C., a yield point of 470 to 510 ° C., and a softening point of 515 to 550 ° C., (B) a photosensitive organic component, (C) an ultraviolet absorber, and (D) A photosensitive paste containing a solvent, wherein an average refractive index N1 of an inorganic component containing glass powder satisfies the following formula (1).
1.75 ≦ N1 ≦ 1.95 (1) - 前記ガラス粉末を含む無機成分の平均屈折率N1が下式(2)を満たすことを特徴とする請求項1に記載の感光性封着層形成用ガラスペースト。
1.75≦N1≦1.90 (2) The average refractive index N1 of the inorganic component containing the said glass powder satisfy | fills the following Formula (2), The glass paste for photosensitive sealing layer formation of Claim 1 characterized by the above-mentioned.
1.75 ≦ N1 ≦ 1.90 (2) - 前記感光性有機成分を含む有機成分の平均屈折率N2が下式(3)を満たすことを特徴とする請求項1または2記載の感光性封着層形成用ガラスペースト。
1.45≦N2≦1.65 (3) The glass paste for forming a photosensitive sealing layer according to claim 1 or 2, wherein an average refractive index N2 of the organic component containing the photosensitive organic component satisfies the following formula (3).
1.45 ≦ N2 ≦ 1.65 (3) - 前記無機成分の平均屈折率N1と前記有機成分の平均屈折率N2が下式(4)を満たすことを特徴とする請求項1、2または3に記載の感光性封着層形成用ガラスペースト。
0.2≦N1-N2≦0.5 (4) 4. The glass paste for forming a photosensitive sealing layer according to claim 1, wherein an average refractive index N <b> 1 of the inorganic component and an average refractive index N <b> 2 of the organic component satisfy the following formula (4).
0.2 ≦ N1-N2 ≦ 0.5 (4) - 前記紫外線吸収剤が有機染料であり、ペースト中の含有量が0.01~2重量%であることを特徴とする請求項1、2、3または4記載の感光性封着層形成用ガラスペースト。 5. The glass paste for forming a photosensitive sealing layer according to claim 1, wherein the ultraviolet absorber is an organic dye, and the content in the paste is 0.01 to 2% by weight. .
- 基板上に、感光性隔壁形成用ペーストを塗布する工程、フォトマスクを介して露光する工程を経た後に、請求項1、2、3、4または5記載の感光性封着層形成用ガラスペーストを塗布する工程、フォトマスクを介して露光する工程、現像工程、焼成工程を経て、放電空間を仕切るための隔壁および封着層を形成するプラズマディスプレイの製造方法であって、前記感光性隔壁形成用ペースト中の無機成分の平均屈折率Naおよび前記感光性封着層形成用ガラスペースト中の無機成分の平均屈折率N1が下式(5)および(6)を満たすことを特徴とするプラズマディスプレイの製造方法。
1.45<Na<1.65 (5)
0.2≦N1-Na≦0.5 (6) The glass paste for forming a photosensitive sealing layer according to claim 1, 2, 3, 4, or 5, after a step of applying a photosensitive partition wall forming paste on a substrate and a step of exposing through a photomask. A method for manufacturing a plasma display, wherein a barrier rib for partitioning a discharge space and a sealing layer are formed through a coating step, an exposure step through a photomask, a development step, and a baking step. An average refractive index Na of an inorganic component in the paste and an average refractive index N1 of the inorganic component in the photosensitive sealing layer forming glass paste satisfy the following expressions (5) and (6): Production method.
1.45 <Na <1.65 (5)
0.2 ≦ N1-Na ≦ 0.5 (6) - 基板上に、第1の感光性隔壁形成用ペーストを塗布する工程、フォトマスクを介して露光する工程、第2の感光性隔壁形成用ペーストを塗布する工程、フォトマスクを介して露光する工程を経た後に、請求項1、2、3、4または5記載の感光性封着層形成用ガラスペーストを塗布する工程、フォトマスクを介して露光する工程、現像工程、焼成工程を経て、放電空間を仕切るための隔壁および封着層を形成するプラズマディスプレイの製造方法であって、前記第1の感光性隔壁形成用ペースト中の無機成分の平均屈折率Na、前記第2の感光性隔壁形成用ペースト中の無機成分の平均屈折率Nbおよび前記感光性封着層形成用ガラスペースト中の無機成分の平均屈折率N1が下式(5)~(8)を満たすことを特徴とするプラズマディスプレイの製造方法。
1.45<Na<1.65 (5)
0.2≦N1-Na≦0.5 (6)
1.45<Nb<1.65 (7)
0.2≦N1-Nb≦0.5 (8) A step of applying a first photosensitive barrier rib forming paste on a substrate, a step of exposing via a photomask, a step of applying a second photosensitive barrier rib forming paste, and a step of exposing via a photomask After passing, the discharge space is formed through a step of applying the glass paste for forming a photosensitive sealing layer according to claim 1, a step of exposing through a photomask, a developing step, and a baking step. A plasma display manufacturing method for forming partition walls and a sealing layer for partitioning, wherein the average refractive index Na of the inorganic component in the first photosensitive partition wall forming paste, the second photosensitive partition wall forming paste An average refractive index Nb of the inorganic component therein and an average refractive index N1 of the inorganic component in the photosensitive sealing layer forming glass paste satisfy the following formulas (5) to (8): Manufacturing method of the stomach.
1.45 <Na <1.65 (5)
0.2 ≦ N1-Na ≦ 0.5 (6)
1.45 <Nb <1.65 (7)
0.2 ≦ N1-Nb ≦ 0.5 (8) - 請求項7記載のプラズマディスプレイの製造方法であって、前記第1の感光性隔壁形成用ペースト中の無機成分の平均屈折率Naおよび前記第2の感光性隔壁形成用ペースト中の無機成分の平均屈折率Nbが下式(9)を満たすことを特徴とするプラズマディスプレイの製造方法。
-0.1 ≦ Nb-Na ≦ 0.1 (9) 8. The method of manufacturing a plasma display according to claim 7, wherein the average refractive index Na of the inorganic component in the first photosensitive barrier rib forming paste and the average of the inorganic component in the second photosensitive barrier rib forming paste. A method of manufacturing a plasma display, wherein the refractive index Nb satisfies the following formula (9).
-0.1 ≤ Nb-Na ≤ 0.1 (9) - 請求項6、7または8記載のプラズマディスプレイの製造方法によって得られるプラズマディスプレイ。 The plasma display obtained by the manufacturing method of the plasma display of Claim 6, 7 or 8.
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CN2010800258935A CN102471138A (en) | 2009-07-01 | 2010-06-25 | Glass paste for forming a photosensitive sealing layer, plasma display manufacturing method using the same, and plasma display |
JP2010526083A JP5375827B2 (en) | 2009-07-01 | 2010-06-25 | Glass paste for forming photosensitive sealing layer, method for producing plasma display using the same, and plasma display |
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Cited By (2)
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JP2012246175A (en) * | 2011-05-27 | 2012-12-13 | Toray Ind Inc | Glass paste, method for manufacturing plasma display member, and plasma display member |
JP2022000694A (en) * | 2015-12-25 | 2022-01-04 | 日東電工株式会社 | Polarizing film with pressure-sensitive adhesive layer, and image display device |
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TWI575317B (en) * | 2013-10-04 | 2017-03-21 | Daxin Mat Corp | A photosensitive resin composition and a gap formed |
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JPH11314937A (en) * | 1997-11-27 | 1999-11-16 | Toray Ind Inc | Inorganic fine powder, photosensitive paste, member of display panel and its production |
JP2002012442A (en) * | 2000-06-23 | 2002-01-15 | Asahi Glass Co Ltd | Low fusing point glass |
JP2008039872A (en) * | 2006-08-02 | 2008-02-21 | Toray Ind Inc | Photosensitive composition for baking and display member using the same |
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JPH08185802A (en) * | 1994-12-28 | 1996-07-16 | Noritake Co Ltd | Discharge display device |
CN1250478C (en) * | 1996-06-17 | 2006-04-12 | 东丽株式会社 | Photosensitive ceramic blank plate, ceramic package and process for producing same |
TW396365B (en) * | 1997-08-27 | 2000-07-01 | Toray Industries | Plasma display decive and its method of manufacture |
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2010
- 2010-06-25 CN CN2010800258935A patent/CN102471138A/en active Pending
- 2010-06-25 KR KR1020117031479A patent/KR20120069614A/en not_active Application Discontinuation
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Patent Citations (3)
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JPH11314937A (en) * | 1997-11-27 | 1999-11-16 | Toray Ind Inc | Inorganic fine powder, photosensitive paste, member of display panel and its production |
JP2002012442A (en) * | 2000-06-23 | 2002-01-15 | Asahi Glass Co Ltd | Low fusing point glass |
JP2008039872A (en) * | 2006-08-02 | 2008-02-21 | Toray Ind Inc | Photosensitive composition for baking and display member using the same |
Cited By (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2012246175A (en) * | 2011-05-27 | 2012-12-13 | Toray Ind Inc | Glass paste, method for manufacturing plasma display member, and plasma display member |
JP2022000694A (en) * | 2015-12-25 | 2022-01-04 | 日東電工株式会社 | Polarizing film with pressure-sensitive adhesive layer, and image display device |
JP2023075141A (en) * | 2015-12-25 | 2023-05-30 | 日東電工株式会社 | Polarizing film with pressure-sensitive adhesive layer, and image display device |
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JP5375827B2 (en) | 2013-12-25 |
KR20120069614A (en) | 2012-06-28 |
JPWO2011001903A1 (en) | 2012-12-13 |
CN102471138A (en) | 2012-05-23 |
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