WO2010115332A1 - 闪存坏块的利用方法 - Google Patents

闪存坏块的利用方法 Download PDF

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Publication number
WO2010115332A1
WO2010115332A1 PCT/CN2009/074566 CN2009074566W WO2010115332A1 WO 2010115332 A1 WO2010115332 A1 WO 2010115332A1 CN 2009074566 W CN2009074566 W CN 2009074566W WO 2010115332 A1 WO2010115332 A1 WO 2010115332A1
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Prior art keywords
flash
bad
data
flash memory
block
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PCT/CN2009/074566
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English (en)
French (fr)
Inventor
孙迎彤
翁俊宏
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国民技术股份有限公司
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Publication of WO2010115332A1 publication Critical patent/WO2010115332A1/zh
Priority to US13/269,636 priority Critical patent/US8732519B2/en

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    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F12/00—Accessing, addressing or allocating within memory systems or architectures
    • G06F12/02—Addressing or allocation; Relocation
    • G06F12/0223—User address space allocation, e.g. contiguous or non contiguous base addressing
    • G06F12/023—Free address space management
    • G06F12/0238—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory
    • G06F12/0246—Memory management in non-volatile memory, e.g. resistive RAM or ferroelectric memory in block erasable memory, e.g. flash memory
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/78—Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/80—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout
    • G11C29/816—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout
    • G11C29/82—Masking faults in memories by using spares or by reconfiguring using programmable devices with improved layout for an application-specific layout for EEPROMs
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70—Masking faults in memories by using spares or by reconfiguring
    • G11C29/88—Masking faults in memories by using spares or by reconfiguring with partially good memories
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2212/00—Indexing scheme relating to accessing, addressing or allocation within memory systems or architectures
    • G06F2212/72—Details relating to flash memory management
    • G06F2212/7209—Validity control, e.g. using flags, time stamps or sequence numbers

Definitions

  • the present invention relates to the verification of the correct operation of the memory, and more particularly to the verification of the correct operation of the flash memory, and in particular to the use of the bad blocks of the flash memory. Background technique
  • Flash memory is a non-volatile semiconductor memory chip that has the advantages of small size, low power consumption, and low physical damage. It is an ideal storage medium for mobile digital products.
  • Flash memory can be divided into AND, NAND, NOR and DiNOR according to internal architecture and implementation technology.
  • NAND is the mainstream.
  • NAND technology has a fast flash write speed, a small chip area, and especially a large capacity.
  • the basic storage unit in NAND technology is "page".
  • One page is usually 512, 2048, 4096 or 8192 bytes.
  • Several pages are composed of blocks.
  • the block capacity is equal to the product of the page capacity and the number of pages in the block.
  • the number of pages in different flash memory varies, usually from 16 pages to 128 pages. Flash writes are in page units and must be erased before writing; flash erase is in blocks, and NAND flash is composed of multiple blocks in series.
  • NAND-type flash memory is a sequential read device that can access page-by-page data using only 8-bit I/O ports. NAND reads and erases files, especially continuous large files, at a fairly fast rate, but random access is slower because it cannot be written in bytes. NAND flash memory is prone to bad blocks. The physical mechanism of flash bad block corruption is generally that some byte bits in the page cannot be programmed. Usually, 1 cannot be programmed to 0. In order to ensure the security of flash access data, avoid bad block access. Data, usually at design time, uses a controller to manage bad blocks. When accessing data to bad blocks, the controller transfers data to a predetermined free storage interval without using bad blocks to ensure data integrity. The prior art production of flash memory generally has to undergo mass production.
  • Chinese patent application CN10139462A discloses "a method and device for dynamic compensation of flash memory", which includes preserving a set of good blocks in a flash memory as replacement blocks; by detecting, if a bad block is found, the group is good. A block in the block replaces the bad block; the bad block that is replaced is placed behind the good block of the group.
  • the method is to ensure the security of data access by reserving a good block of flash memory as a replacement block. Since NAND flash memory is prone to generate bad blocks, when the flash memory capacity increases, the number of bad blocks also increases, and only a good block is reserved. The bad blocks that are only sensitive to certain data are not fully utilized, and the capacity of the entire flash memory will also decrease.
  • FIG. 4 is a flow chart showing the prior art method of processing a bad block of flash memory.
  • the present invention is directed to avoiding the deficiencies of the prior art described above, and proposes a method for utilizing a bad block of a flash memory, the method comprising the following steps:
  • the flash bad block found by the mass production tool software scan is scanned again according to the preset "available" filter condition, and the bad block that meets the selection condition is marked and recorded in the flash controller, etc. To be used; bad blocks that do not meet the selection criteria are marked as true bad blocks are recorded in the flash controller and are no longer used; the scanning and marking process is repeated until all flash bad blocks are marked and recorded;
  • step C Place the bad blocks in the flash memory found in step B scan that meet the "available" filter condition in the replacement area for use.
  • the bad block described in step A refers to a flash block that exceeds the ECC error correction range of the flash controller.
  • the "available" filter condition described in step B is that the flash bad block is "a special bad block sensitive to data", which means that programming of certain data cannot be successful, and programming of another data can be successful. Flash bad block.
  • the step C also includes the following sub-steps:
  • the bad block indicating the "available” filter condition can accept the written data, and the write is successful; if the write data is unsuccessful, it indicates that the "available” filter condition is bad. The block cannot accept the data being written, and the write fails;
  • step C3. Execute step C2. After the write fails, the bad block of the "available" filter condition is placed in the replacement area again, waiting for the next data to be written.
  • the present invention has the following beneficial effects:
  • the prior art confirms that the bad blocks of the flash memory are determined by the ECC error correction range of the flash controller. Such a bad block error correction physical mechanism may cause some data-sensitive bad blocks to be confirmed as bad. Blocks and records are never used in the controller; the method of the present invention breaks through the prior art to confirm the mechanism of flash bad blocks, which will be beyond the ECC error correction range of the flash controller, but because it is only for certain Data cannot be accessed, and flash bad blocks that some data can access are not marked as bad blocks and are never used, as a usable flash block.
  • the available capacity of the flash memory is expanded; the use of the prior art flash memory mainly confirms the access to the flash block data according to the information recorded in the flash controller, and in the mass production phase of the flash memory, the flash block exceeding the controller ECC error correction range is confirmed. As bad blocks and recorded in the controller, therefore, these marked flash bad blocks will never be used again during the use of the flash memory, and these flash bad blocks may only be inaccessible to certain data; Method: From the mass production stage of the flash memory, the "data-sensitive flash bad block" is recorded in the controller for later use, and it is not used by the cartridge; when the flash memory is used, Putting these "data-sensitive flash bad blocks" into the replacement area is used as a normal block, thus maximizing the available capacity of the flash memory.
  • FIG. 1 is a scanning flow chart of a method for utilizing a flash memory block of the present invention in mass production of a flash memory
  • FIG. 2 is a flow chart of a method for utilizing a flash bad block in the present invention
  • FIG. 4 is a flow chart of a prior art method for processing a bad block of a flash memory. detailed description
  • the method for utilizing the flash memory block of the present invention firstly scans the flash memory block using the mass production tool software in the mass production phase of the flash memory, and finds the bad block therein and records it in the flash memory controller;
  • a good "available” filter condition scans the bad blocks scanned by the mass production tool software again, wherein the "available” filter condition is that the flash bad block is "a special bad block sensitive to data". It refers to a flash block that can't be successful in programming a particular piece of data, but can succeed in programming another piece of data. If the "available" condition is met, the flash bad block is marked as "special bad block sensitive to data”. If the "available" condition is not met, the flash bad block is marked as true.
  • the flash memory block repeat the above scanning and marking process until all flash bad blocks are marked and recorded; this stage is mainly to scan out "available""data-sensitive special bad blocks", this "pair” Data-sensitive special bad blocks "Because it is not successful to program a particular data, but other data can be successfully programmed, these special bad blocks are not completely unusable.
  • FIG. 2 shows the method of the present invention.
  • step C3. Execute step C2. After the write fails, put the "special bad block sensitive to data" into the replacement area again, waiting for the next data to be written.

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  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Read Only Memory (AREA)

Description

说 明 书
闪存坏块的利用方法
技术领域
本发明涉及存储器正确运行的校验， 尤其涉及闪存正确运行的校验， 特别 是涉及闪存坏块的利用方法。 背景技术
闪存（F lash Memory )是一种非挥发性的半导体存储芯片， 具有体积小、 功耗低、 不易受物理破坏的优点， 是移动数码产品的理想存储介质。
闪存根据内部架构和实现技术可以分为 AND、 NAND、 NOR和 DiNOR等几种， 目前以 NAND为主流。 NAND技术的闪存写回速度快、芯片面积小，特别是容量大， 因而很有优势。 NAND技术中的基本存贮单元为 "页"， 一页一般为 512、 2048、 4096 或 8192 字节， 若干页组成块， 块容量等于页容量与块内页数的乘积。 不 同闪存的块内页数不尽相同， 通常为 16 页〜 128 页。 闪存的写入以页为单位， 在写之前必须先擦除； 闪存的擦除则以块为单位， NAND闪存由多个块串行排列 组成。 实际上， NAND型闪存是一种顺序读取的设备， 它仅用 8比特的 I /O端口 就可以存取按页为单位的数据。 NAND在读和擦写文件， 特别是连续的大容量文 件时， 速度相当快， 但随机存取速度则比较慢， 因为它不能按字节写。 NAND 闪 存容易产生坏块， 闪存坏块损坏的物理机制一般是页中某些字节位不能被编程， 通常是 1不能被编程为 0; 为了保证闪存存取数据的安全， 避免坏块存取数据， 通常在设计时， 用一个控制器管理坏块， 当向坏块存取数据时， 控制器即将数 据转移到预定空闲存储区间， 而不使用坏块以保证数据安全完整。 现有技术生产闪存一般都要经过量产的过程， 量产的目的是通过一定的手 段， 识别并标记出坏块， 且预留一定数量好块作为备用块， 当使用过程出现坏 块时， 就可以用这些备用块来做替换； 图 3所示为现有技术闪存量产阶段扫描闪 存并标记坏块的流程示意图。
中国专利申请 CN10139462A公开了 "一种用于瑕疵闪存动态补偿方法及装 置" ， 该专利包括在闪存中预留一组好块作为替换块； 通过检测， 若发现有坏 块， 则将该组好块中的一块替换坏块； 将被替换掉的坏块放在该组好块后面。 该方法是通过预留闪存好块作为替换块来保证数据存取的安全， 由于 NAND闪存 容易产生坏块， 当闪存容量增加时， 坏块的数量也会随之增加， 仅仅只预留好 块使那些只对某些数据敏感的坏块得不到充分利用， 整个闪存的容量也会随之 下降。 可见， 现有技术并没有利用闪存坏块， 而这些闪存坏块中可能存在那种 只对某些数据敏感的坏块， 并不是所有的闪存坏块都不可以使用， 如果将这些 只是对某些数据敏感的闪存坏块全部弃之不用， 这在闪存容量不断增加的情况 下， 浪费的闪存空间就会越来越大。 图 4所示为现有技术处理闪存坏块方法的流 程示意图。
发明内容
本发明旨在避免上述现有技术的不足之处， 提出一种闪存坏块的利用方法， 所述方法包括以下步骤：
A. 借助量产工具软件扫描所有闪存， 发现其中的坏块并记录在闪存控制器 内；
B. 对量产工具软件扫描发现的闪存坏块根据事先设定的 "可供利用" 之筛 选条件再次扫描， 符合 选条件的所述坏块被标记并记录在闪存控制器内， 等 待使用； 不符合 选条件的坏块则标记为真正的坏块被记录在闪存控制器内， 不再使用； 重复所述扫描和标记过程直到所有闪存坏块都被标记和记录；
C 将步骤 B扫描发现的闪存中符合 "可供利用" 之筛选条件的坏块放在替 换区等待使用。
步骤 A中所述的坏块是指超过闪存控制器 ECC纠错范围的闪存块。
步骤 B 中所述 "可供利用" 之筛选条件是闪存坏块为 "对数据敏感的特殊 坏块"， 是指那种对某些特定数据编程不能成功， 而对另外的数据编程能够成功 的闪存坏块。
所述步骤 C还包括以下分步骤：
C1. 在替换区中符合 "可供利用" 之筛选条件的坏块收到使用请求时， 固 化软件尝试对其写入数据；
C2. 如果写数据成功， 表示该 "可供利用" 之筛选条件的坏块可以接受被 写入的数据， 写入成功； 如果写数据不成功， 表示该 "可供利用" 之筛选条件 的坏块不能接受被写入的数据， 写入失败；
C3. 执行步骤 C2 , 写入失败后， 则将该 "可供利用" 之筛选条件的坏块再 次放入替换区， 等待下次被写入其他数据。
与现有技术相比较， 本发明具有以下有益效果：
能够充分利用闪存的坏块； 现有技术确认闪存坏块是以闪存控制器 ECC纠错 范围来确定的， 这种闪存坏块纠错物理机制可能导致一些对数据敏感的坏块被 确认为坏块并记录在控制器中永远不被使用； 本发明方法突破现有技术确认闪 存坏块的机制， 将那些虽然超出闪存控制器 ECC纠错范围， 但由于仅仅是对某些 数据不能存取， 而某些数据能够存取的闪存坏块不被标记为坏块永远不被使用， 将其作为一种能使用的闪存块。
扩大了闪存的可用容量； 现有技术闪存的使用主要根据闪存控制器中记录的 信息来确认对闪存块数据的存取， 在闪存量产阶段， 超出控制器 ECC纠错范围的 闪存块被确认为坏块并记录在控制器内， 因此， 在闪存的使用过程中， 这些被 标记的闪存坏块将永远不再被使用， 而这些闪存坏块可能只是对某些数据不能 存取； 本发明方法从闪存量产阶段即通过量产工具软件将那些 "对数据敏感的 闪存坏块" 记录在控制器中以便以后使用， 并不是筒单的将其不再使用； 在闪 存被使用时， 可以将这些 "对数据敏感的闪存坏块" 放入替换区作为正常的块 使用， 因此， 最大程度地扩大了闪存的可用容量。 附图说明
图 1是本发明闪存坏块的利用方法在量产闪存时的扫描流程图；
图 2是本发明利用闪存坏块方法流程图；
图 3是现有技术量产闪存的扫描流程图；
图 4是现有技术处理闪存坏块方法流程图。 具体实施方式
以下结合附图所示之优选实施例作进一步详述。
如图 1所示， 本发明闪存坏块的利用方法首先要在闪存的量产阶段使用量产 工具软件对闪存块进行扫描， 发现其中的坏块并记录在闪存控制器内； 根据事 先设定好的 "可供利用" 之筛选条件对量产工具软件扫描出的坏块进行再次扫 描，其中所述 "可供利用"之筛选条件是闪存坏块为 "对数据敏感的特殊坏块"， 是指那种对某种特定数据编程不能成功， 而对另外的数据编程能够成功的闪存 坏块。 如果符合 "可供利用" 之 选条件， 则将该闪存坏块标记为 "对数据敏 感的特殊坏块" ， 如果不符合 "可供利用" 之 选条件， 则将该闪存坏块标记 为真正的闪存坏块； 重复上述扫描和标记的过程， 直到所有闪存坏块都被标记 和记录； 此阶段主要是扫描出 "可供利用" 之 "对数据敏感的特殊坏块" ， 这 种 "对数据敏感的特殊坏块" 因为只是对某种特定数据编程不能成功， 而对其 他的数据编程能够成功， 所以， 这些特殊坏块并不是完全不能使用。
将上述阶段闪存中 "对数据敏感的特殊坏块" 扫描标记出来后， 即可对这些 "对某种特定数据编程不能成功， 而对其他的数据编程能够成功" 的特殊闪存 坏块进行利用； 在闪存的使用阶段， 将这些 "对数据敏感的特殊坏块" 放入替 换区中和好块一起备用， 而不是现有技术将其完全弃之不用； 图 2所示为本发明 方法对这种 "对数据敏感的特殊坏块" 的利用流程示意图， 使用具体步骤如下：
C1. 在替换区中 "对数据敏感的特殊坏块" 收到使用请求时， 固化软件尝试 对其写入数据；
C2. 如果写数据成功， 表示该 "对数据敏感的特殊坏块" 可以接受被写入的 数据， 写入成功； 如果写数据不成功， 表示该 "对数据敏感的特殊坏块" 不能 接受被写入的数据， 写入失败；
C3. 执行步骤 C2 , 写入失败后， 则将该 "对数据敏感的特殊坏块" 再次放入 替换区， 等待下次被写入其他数据。

Claims

权 利 要 求 书
1.一种闪存坏块的利用方法， 包括以下步骤：
A. 借助量产工具软件扫描所有闪存， 发现其中的坏块并记录在闪存控制器 内；
B. 对量产工具软件扫描发现的闪存坏块根据事先设定的 "可供利用" 之筛 选条件再次扫描， 符合 选条件的所述坏块被标记并记录在闪存控制器内， 等 待使用； 不符合 选条件的坏块则标记为真正的坏块被记录在闪存控制器内， 不再使用； 重复所述扫描和标记过程直到所有闪存坏块都被标记和记录；
C 将步骤 B扫描发现的闪存中符合 "可供利用" 之筛选条件的坏块放在替 换区等待使用。
2.根据权利要求 1所述的闪存坏块的利用方法， 其特征在于： 步骤 A中所 述的坏块是指超过闪存控制器 ECC糾错范围的闪存块。
3.根据权利要求 1所述的闪存坏块的利用方法， 其特征在于： 步骤 B中所 述 "可供利用" 之筛选条件是闪存坏块为 "对数据敏感的特殊坏块"， 是指那种 对某些特定数据编程不能成功， 而对另外的数据编程能够成功的闪存坏块。
4.根据权利要求 1 所述的闪存坏块的利用方法， 其特征在于： 所述步骤 C 还包括以下分步骤：
C1.在替换区中符合 "可供利用" 之筛选条件的坏块收到使用请求时， 固化 软件尝试对其写入数据； C2.如果写数据成功， 表示该 "可供利用" 之筛选条件的坏块可以接受被写 入的数据， 写入成功； 如果写数据不成功， 表示该 "可供利用" 之筛选条件的 坏块不能接受被写入的数据， 写入失败；
C3.执行步骤 C2 , 写入失败后， 则将该 "可供利用"之筛选条件的坏块再次 放入替换区， 等待下次被写入其他数据。
PCT/CN2009/074566 2009-04-10 2009-10-22 闪存坏块的利用方法 WO2010115332A1 (zh)

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