WO2010103594A1 - 単結晶の製造方法 - Google Patents
単結晶の製造方法 Download PDFInfo
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- WO2010103594A1 WO2010103594A1 PCT/JP2009/006416 JP2009006416W WO2010103594A1 WO 2010103594 A1 WO2010103594 A1 WO 2010103594A1 JP 2009006416 W JP2009006416 W JP 2009006416W WO 2010103594 A1 WO2010103594 A1 WO 2010103594A1
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- heater
- single crystal
- crucible
- melt
- aging
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/14—Heating of the melt or the crystallised materials
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
Definitions
- the present invention relates to a method for producing a single crystal by a Czochralski method (hereinafter abbreviated as CZ method), particularly using a large diameter crucible.
- CZ method Czochralski method
- Crystal production can be started only after the process of melting the crystal raw material charged in the crucible and the process of lowering the temperature of the melt to the melt state suitable for the start of crystal production.
- the time for each of the above steps is shortened as much as possible so that the production of crystals can be started as soon as possible.
- a technique for improving the operability by providing a process for aging the substrate, for example, by providing a process for eliminating the undissolved residue of the dopant and the crystal raw material (see Patent Documents 1 and 2).
- DF Dislocation Free (no dislocation)
- dislocations enter approximately the length of the diameter up to the dislocation-free part. Since the part having dislocations does not naturally become a product, if the length of the crystal part that can be made into the product is short, the crystal is remelted again. Conversely, if the crystal part that can be made into a product is longer than a predetermined length, the product part can be secured to some extent, and may be taken out without being remelted.
- remelting rate An average of how much remelting of crystals is performed per crystal is referred to as remelting rate. Further, among the pulled crystals, the number of crystals that have been pulled up by DF up to the end is converted to the total number of crystals and is defined as the DF conversion rate. Previously, the above remelting rate was small for small diameters (ie crucibles and small diameters), but for large diameter crystals (ie crucibles and large diameters), the remelting rate increased and the DF conversion rate was reduced to small diameters. Larger diameter is worse than that.
- the remelting rate and the DF conversion rate can be improved to some extent, but there is still much room for improvement. Furthermore, the quality and yield of the single crystal may deteriorate due to variations in time, crucible position, heater power, and the like.
- the present invention has been made in view of the above problems, and in the production of a single crystal, particularly when pulling up a large-diameter single crystal, it is possible to effectively suppress dislocation, and to achieve high quality.
- An object of the present invention is to provide a method for producing a single crystal capable of producing a single crystal with a high yield.
- the present invention includes at least a step of heating and melting a crystal raw material with a heater in a crucible to form a melt, a step of aging while maintaining the melt at a high temperature,
- a method of producing a single crystal by the Czochralski method including a step of growing a single crystal by immersing a seed crystal in a later melt, and in the aging step, the heater and the crucible are relatively Provided is a method for producing a single crystal characterized by being moved up and down.
- the dopant and the like can be sufficiently dissolved in the melt. And since the entire melt in the crucible can be heated uniformly by moving the heater and the crucible relatively up and down during the aging, especially the dopant in the melt in the crucible having a large diameter. The effect of dissolving the undissolved residue is further increased. In addition, since the local alteration of the crucible surface due to the heater heat can be made uniform by relative vertical movement, the crucible surface area is not excessively deteriorated and the crucible surface is changed to a part of the surface or the surface. The attached oxide can be prevented from peeling off.
- the oxide in the furnace falls into the melt, it can be sufficiently dissolved in the melt by uniform heating.
- the method for producing a single crystal of the present invention it is possible to effectively suppress undissolved residues of dopants in the melt and oxides from peeling off from the crucible surface in the aging step.
- the heater power in the ripening step is larger than that at the start of the step of growing the single crystal at the start of the ripening step, and is equal to or smaller than that at the step of generating the melt.
- the end time is preferably smaller than the step of generating the melt and the same or larger value than the start of the step of growing the single crystal.
- the melt is preferably aged for 2 hours or more. As described above, by aging for 2 hours or more, even if a poorly soluble dopant is added in a large amount, the undissolved residue in the melt can be sufficiently dissolved.
- the heater and the crucible are moved up and down relatively at a speed of 2 mm / min or less in the aging step. With such a speed, it can be moved up and down more safely during heating by the heater.
- the heater and the crucible are moved up and down relatively with a width of 10 cm or more.
- the heater and the crucible are moved up and down relatively with a width of 10 cm or more.
- the heater and the crucible are relatively moved so that the lower limit movement position of the heater slit lower end of the heater is lower than 5 cm above the lowest end of the melt in the crucible. It is preferable to move it up and down. By moving up and down in this way, the crucible and the melt can be heated uniformly downward, and dislocation can be prevented more effectively.
- the relative vertical movement of the heater and the crucible and / or the heater power is automatically adjusted to determine the final position of the heater and the crucible in the aging step, It is preferable to adjust the heater power to a value at the start of the growth, with the crystal growth start position in the step of growing the single crystal.
- the heater power is adjusted to a value at the start of the growth, with the crystal growth start position in the step of growing the single crystal.
- the method for producing a single crystal of the present invention it is possible to reduce undissolved residues of dopants and the like in the melt in the ripening step, and to further suppress the removal of oxides and the like from the crucible surface. In addition, it is possible to produce a single crystal with a high yield while effectively preventing the occurrence of dislocation.
- the present inventors have described that “(1) the undissolved raw material in the melt adheres to the crystal to dislocation” “(2) the undissolved oxide remaining in the melt is crystallized. And (3) the crucible surface state is poor, and the material peeled off from the surface adheres to the crystal to cause dislocation.
- a step of aging the melt is provided between the end of melting of the crystal raw material and the temperature drop, and at this time, the heater and the crucible are moved up and down relatively.
- heating evenly rather than concentrating on one place has a higher effect of melting the undissolved residue and uniforming the surface of the crucible uniformly.
- both the remelting rate and the DF conversion rate can be further improved by moving the heater up and down as compared with the case where the heater and the crucible position are fixed and matured at the same time. Completed.
- FIG. 1 is an explanatory diagram for explaining a method for producing a single crystal of the present invention.
- 2A is a development view and
- FIG. 2B is a side view of a heater of a single crystal production apparatus that can be used in the method for producing a single crystal of the present invention.
- FIG. 3 is a schematic view showing an example of a single crystal production apparatus that can be used in the method for producing a single crystal of the present invention.
- the apparatus for carrying out the method for producing a single crystal of the present invention is not particularly limited, and a general apparatus can be used.
- a single crystal production apparatus as shown in FIG. 3 can be used.
- a single crystal manufacturing apparatus 10 shown in FIG. 3 is provided in a main chamber 12 with a quartz crucible 16 for containing a melt 15 in which a crystal raw material is melted and a graphite crucible 17 for supporting the quartz crucible 16. , 17 are supported on the shaft 19 by a drive mechanism 26 so as to be rotatable up and down.
- the driving mechanism 26 of the crucibles 16 and 17 raises the crucibles 16 and 17 by the amount corresponding to the lowering of the liquid level in order to compensate for the lowering of the melt 15 accompanying the pulling of the single crystal 18 during the growth of the single crystal. ing.
- a pulling wire 13 is disposed on the same axis as the central axis of the crucibles 16 and 17, and a seed crystal 20 is held at the lower end of the pulling wire 13.
- a single crystal 18 is formed on the lower end surface of the seed crystal 20.
- a magnetic field application device 21 is installed outside the main chamber 12 so as to be coaxially opposed across the crucibles 16 and 17 so as to apply a horizontal magnetic field to the melt 15.
- a heater 14 for heating and melting the raw material is disposed so as to surround the crucibles 16 and 17.
- a heat insulating member 11 is provided outside the heater 14 so as to surround the periphery thereof.
- a graphite heater is shown in FIG. 2 as (a) a developed view and (b) a side view.
- the graphite heater 14 has a cylindrical shape, and is mainly made of isotropic graphite.
- two terminal portions 23 are provided, and the graphite heater 14 is supported by the terminal portions 23.
- the graphite heater 14 has two to several tens of heater slits 25, 22, an upper heater slit 25 extending downward from the upper end and a lower heater slit 22 extending upward from the lower end so that heat can be generated more efficiently. It is carved.
- such a graphite heater 14 mainly generates heat from each heating slit portion 24 which is a portion between the lower end of the upper heater slit 25 and the upper end of the lower heater slit.
- a heater drive mechanism 27 is attached so that the heater 14 can move up and down while being heated.
- a crystal raw material is placed in the quartz crucible 16 of the single crystal production apparatus 10 as described above, and heated and melted by the heater 14 to generate a melt 15.
- a crystal material such as silicon polycrystal and a dopant are charged in a crucible and melted.
- the temperature of the melt in the quartz crucible is the melting point of the crystal raw material. It is also important to maintain high productivity by quickly performing operations such as lowering the heater power after the crystal raw material has completely melted and reaching the desired maintenance temperature in the next step in a short time. .
- examples of the dopant that is added together with the crystal raw material and melted include those for imparting conductivity to a single crystal such as boron, or those for suppressing crystal defects such as nitrogen and carbon. These are singly or combined and melted together with the crystal raw material. These dopants may be added after the crystal raw material is melted. At this time, even if the raw material in the crucible is completely melted by visual inspection, the fine unmelted material that cannot be visually recognized is liberated on the surface of the melt, or the inner wall of the crucible in the melt The unmelted raw material adheres to (especially the bottom). These cause dislocations in subsequent single crystal growth. Therefore, in the present invention, the following aging process is performed.
- the diameter of the crucible 16 to be used is 32 inches (81 cm) or more, the effect on the operability of the present invention is great.
- Such a crucible having a relatively large diameter has a large amount of undissolved residue in the melt and is liable to cause local degradation of the crucible surface, which is suitable for applying the production method of the present invention.
- the melt 15 obtained by melting the crystal raw material is kept at a high temperature and aged.
- the heater 14 and the crucibles 16 and 17 are relatively moved up and down as shown in FIG. In this way, by maintaining the melt at a high temperature and aging, unmelted raw materials and dopants can be dissolved in the melt as it is, but if the heater and crucible are fixed and aged as before, , The same place will be heated for a long time with the same heat generation distribution, and a heated part and a relatively low temperature part will be locally generated, so that unmelted raw materials and dopants are partly insufficiently dissolved In addition, there is a problem in that the crucible deterioration is accelerated in the locally heated portion.
- the entire melt in the crucible can be heated uniformly by moving the heater and the crucible relatively up and down during the ripening.
- the effect of dissolving the remaining undissolved dopant in the melt is further increased.
- the crucible surface area is not excessively deteriorated and the crucible surface is changed to a part of the surface or the surface.
- the attached oxide can be prevented from peeling off. Even if the oxide in the furnace falls into the melt, it can be sufficiently dissolved in the melt by uniform heating.
- the heater and the crucible are relatively moved, the local temperature distribution is eliminated, thereby eliminating problems such as unmelted residue.
- the heater power in the aging step is not particularly limited as long as the surface of the melt 15 is not solidified, but is smaller than that in the step of generating the melt 15 and is a step of growing the single crystal 18 in the next step. It is preferable to make it larger than that at the start of. By using such heater power, it is possible to efficiently prevent the melt from solidifying during aging without excessively increasing the heater power. In addition, by setting the heater power within the above range, the heater can be moved up and down more safely, and cost increases can be suppressed.
- the time for maintaining the melt 15 at a high temperature in the aging step is not particularly limited, but it is preferable to maintain the melt 15 at a high temperature for 2 hours or more for aging.
- the longer the aging time is the more the unmelted residue is reduced and the operability is improved.However, if the aging time is too long, the overall operation time becomes longer, so the time required for remelting, the remelting rate, etc.
- the upper limit of the aging time is preferably 10 hours.
- the heater 14 and the crucibles 16 and 17 up and down relatively at a speed of 2 mm / min or less in the aging step. With such a speed, it can be moved up and down more safely during heating by the heater.
- the heater 14 and the crucibles 16 and 17 up and down relatively with a width of 10 cm or more, more preferably 15 cm or more.
- a width of 10 cm or more more preferably 15 cm or more.
- the lower limit position of movement of the heater slit 25 of the heater 14 is a position below 5 cm above the lowest end (melt bottom) of the melt 15 in the crucibles 16 and 17. It is preferable to move the heater 14 and the crucibles 16 and 17 relatively up and down. By moving up and down in this manner, the crucible and the melt can be heated uniformly downward, and dislocations in the subsequent process can be more effectively prevented.
- a magnetic field by the magnetic field application device 21 it is preferable to apply a magnetic field by the magnetic field application device 21 to the melt in the crucibles 16 and 17 in the aging step.
- a magnetic field is applied to the melt during the ripening step, and dislocation formation during single-crystal pulling in the subsequent step can be further suppressed. This is presumed to be because the improvement by crystallization of the crucible surface by applying the magnetic field is made even by the relative movement of the heater and crucible.
- the relative vertical movement of the heater 14 and the crucibles 16 and 17 and / or the heater power is automatically adjusted to determine the final position of the heater 14 and the crucibles 16 and 17 in the aging process.
- the crystal growth start position in the step of growing the single crystal 18 is preferably used, and the heater power is preferably adjusted to the value at the start of the growth.
- the single crystal 18 is grown by immersing the seed crystal 20 in the melt 15 after ripening and pulling it up with the pulling wire 13.
- an MCZ method Magnetic field applied CZ method in which the single crystal is pulled up while controlling the convection of the melt while applying a magnetic field can also be used.
- Example 1 Using a crucible having a diameter of 32 inches (81 cm), a single crystal rod having a diameter of 300 mm was manufactured. First, after the initial melting of the crystal raw material is carried out, the temperature (heater power) is not lowered immediately, but once according to the middle of the heater power at the time of melting and the heater power at the start of crystal growth. A process of aging while maintaining the time was provided, and then the temperature was lowered to an appropriate temperature at the start of crystal growth to grow a single crystal.
- the heater was moved up and down with a width of 12 cm at a speed of 2 mm / min (12 cm rise, 12 cm drop).
- the lower limit movement position of the lower end of the heater slit was set to a position 3 cm above the melt bottom (the lowest end of the melt).
- the heater power at the time of melting was 200 kW
- the heater power at the start of crystal growth was 150 kW
- the heater power during aging was 175 kW.
- the positional relationship at the start of crystal growth immediately after the completion of the ripening step was such that the “distance between the heater slit bottom and the melt bottom” was 150 mm.
- the remelting rate when the 30 wires were pulled up under these conditions was 0.3, and the DF conversion rate was 80%.
- Example 2 Next, the position of the heater and the crucible during the aging process and the width of the vertical movement were changed, and other conditions such as heater power were the same as in Example 1 to produce a single crystal.
- the heater is initially lowered so that the lower end of the heater slit is aligned with the melt bottom, and raised 15 cm during the aging for 2 hours, so that the final crucible or heater position is simply It was automatically performed so as to match the crystal growth start conditions (same as Example 1). Under this condition, the remelting rate is 0.29 and the DF conversion rate is 80% when pulled up by 30. This is almost the same as in Example 1, and because it is automatic, the operator can manually move the heater. The same operability improvement effect was obtained.
- Example 3 Furthermore, the single crystal was manufactured by changing the position of the heater and crucible during the aging process and the width of the vertical movement, and other conditions such as heater power were the same as in Example 1.
- the heater is first lowered so that the position of the lower end of the heater slit is 10 cm above the melt bottom, and raised 5 cm during the aging for 2 hours, and the final crucible and heater positions are adjusted. This was automatically carried out so as to match the start conditions for single crystal growth (same as in Example 1). Under these conditions, the remelting rate was 0.5 and the DF conversion rate was 77% when pulled up to 30%. It can be said that it is desirable that the width of the vertical movement is 10 cm or more and that the distance between the lower end of the heater slit and the melt bottom is once 5 cm or less.
- Comparative Example 2 Under the same conditions as in Comparative Example 1, however, the temperature (heater power) is not lowered immediately after the initial melting of the crystal raw material, but the heater power at the time of melting and the heater power at the start of crystal growth A process of aging by maintaining for 2 hours was then provided. Thereafter, the temperature was lowered to an appropriate temperature at the start of crystal growth, and crystal growth was performed. The crucible and the heater were fixed during the aging process. Under the above conditions, the remelting rate was 0.8 and the DF conversion rate was 70% when 30 wires were pulled up.
- Example 1-3 by providing a ripening step and moving the crucible and the heater relatively up and down, the remelting rate is reduced by half and the DF conversion rate is improved by about 10%. I understood that. In the above embodiment, only the heater was moved up and down, but similar results were obtained when only the crucible was moved up and down and when both the crucible and the heater were moved up and down.
- the present invention is not limited to the above embodiment.
- the above-described embodiment is an exemplification, and the present invention has substantially the same configuration as the technical idea described in the claims of the present invention, and any device that exhibits the same function and effect is the present invention. It is included in the technical scope of the invention.
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Abstract
Description
ところで、CZ法で大直径結晶を育成する際に、特に直径が150mm以上の結晶を育成するようになった時代から、有転位化が発生しやすいという問題が生じている。特に、大直径の窒素ドープ結晶や低抵抗率結晶を製造する際に、有転位化の発生が顕著に増えている。
但し、単結晶の大直径化に伴い、このような方法では、低抵抗品の単結晶の育成などの条件で操業性が悪くなることがあるため、最近では、結晶原料の溶融終了後に溶融液を熟成する工程を設け、例えばドーパントや結晶原料の溶け残りをなくすような工程をわざわざ設ける事により、操業性の改善を図る技術もある(特許文献1、2参照)。
以上のように、本発明の単結晶の製造方法によれば、熟成工程において溶融液中のドーパント等の溶け残りや、ルツボ表面から酸化物等がはがれるのを効果的に抑制することができるため、有転位化の発生を防止しながら単結晶の製造を歩留まり良く行うことができる。
このようなヒーターパワーにすることで、ヒーターパワーを過剰に大きくせずに熟成中に溶融液が固化することを効率的に防止できる。また、ヒーターパワーを上記範囲にすることで、ヒーターの上下動を、より安全に実施できる。
このように、2時間以上熟成することで、難溶性のドーパントを多量に投入した場合等でも、溶融液中の溶け残りを十分に溶け込ませることができる。
このような速さであれば、ヒーターによる加熱中に、より安全に上下動させることができる。
このような幅で上下動させることにより、ルツボと溶融液がより均一に加熱されて、溶融液中の溶け残りをより低減でき、さらにルツボ表面の局所的な劣化が抑制されるため、後工程の単結晶引き上げ中に、より効果的に有転位化を防止することができる。
このように上下動させることにより、ルツボや溶融液を下方まで均一に加熱することができ、より効果的に有転位化を防止することができる。
このように、熟成工程中に溶融液に磁場を印加することにより、後工程での単結晶引き上げ中の有転位化をさらに効果的に抑制することができる。
このように、熟成工程中にルツボとヒーターの移動位置やヒーターパワーを、熟成工程終了時には単結晶育成工程の結晶育成開始位置、結晶育成開始温度になるように調整することで、溶融液やヒーターの状態を熟成工程から育成工程にスムーズに移行することができるため、生産性がより向上する。さらに、この移動やヒーターパワーの調整を自動で行うことで、実際のルツボの位置や温度等と製造条件とのずれがほとんど生じ無いため、品質のバラツキが無く、高品質の単結晶をより確実に製造することができる。
このような、比較的大きな直径のルツボは、溶融液中の溶け残りも多く、ルツボ表面の局所的な劣化も生じやすいため、本発明の製造方法を適用するのに好適である。
このような問題に対して、本発明者らが鋭意検討した結果、以下のことを見出した。
これにより、一箇所に集中するよりも、満遍なく加熱する方が、溶け残りを溶かす効果と、ルツボ表面の変質を満遍なく均一にできるという効果が高いことを見出した。結果、同じ時間でヒーターとルツボ位置を固定して熟成した場合に比べて、ヒーターを上下動させた方が、再溶融率とDF化率のどちらも、さらに改善できることを見出して、本発明を完成させた。
図1は、本発明の単結晶の製造方法を説明するための説明図である。図2は、本発明の単結晶の製造方法に用いることができる単結晶製造装置のヒーターの(a)展開図と(b)側面図である。図3は、本発明の単結晶の製造方法に用いることができる単結晶製造装置の一例を示す概略図である。
図3に示す単結晶製造装置10はメインチャンバー12内に、結晶原料が溶融された溶融液15を収容する石英ルツボ16とその石英ルツボ16を支持する黒鉛ルツボ17が設けられ、これらのルツボ16、17は駆動機構26によって回転昇降自在にシャフト19で支持されている。このルツボ16、17の駆動機構26は、単結晶の育成中は単結晶18の引き上げに伴う溶融液15の液面低下を補償すべく、ルツボ16、17を液面低下分だけ上昇させるようにしている。このルツボ16、17の中心軸と同一軸上には引き上げワイヤー13が配設されており、引き上げワイヤー13の下端には種結晶20が保持されている。そして、種結晶20の下端面には単結晶18が形成される。
また、特に本発明の製造方法に用いる装置として、ヒーター14が加熱しながら上下動可能とするためにヒーター駆動機構27が取り付けられていることが好適である。
このような、比較的大きな直径のルツボは、溶融液中の溶け残りも多く、ルツボ表面の局所的な劣化も生じやすいため、本発明の製造方法を適用するのに好適である。
また、ドーパントを多量に添加する低抵抗率結晶の製造の際には、溶融液中の溶け残りを低減できる本発明の製造方法を適用するのに好適である。
このように、溶融液を高温に維持して熟成させることにより、未溶融原料やドーパント等を溶融液中にそれなりに溶け込ますことができるが、従来のようにヒーター及びルツボを固定して熟成すると、同じ発熱分布で長時間同じ所が加熱されることとなり、局所的に加熱部分と比較的低温部分が生じてしまうため、未溶融原料やドーパント等の溶かし込みが一部不十分であることに加え、局所加熱部分では、ルツボの劣化が促進してしまうという問題があった。これに対し、本発明の製造方法では、その熟成中にヒーターとルツボを相対的に上下動させることにより、満遍無くルツボ内の融液全体を加熱することができるため、特に直径の大きなルツボ内の溶融液中のドーパント等の溶け残りを溶かす効果がさらに増す。また、相対的な上下動によりルツボ表面のヒーター熱による局所的な変質を均一にすることができるため、ルツボ表面の局所を過剰に劣化させることが無く、ルツボ表面から表面の一部や表面に付着した酸化物が剥がれることを防止できる。また、炉内の酸化物が溶融液中に落ちた場合でも、均一な加熱により溶融液中に十分に溶かし込むことができる。このように、本発明では、相対的にヒーターとルツボを移動させるので、局所的な温度分布が解消されて、それにより溶け残り等の問題も解消される。
ヒーターのみを上下動させる方が、溶融液が入ったルツボを上下動させるより容易であり、上下動の幅の微調整も簡便に行うことができる。
また、この相対的な上下動は熟成工程中ずっと動き続けてもよいし、定期的に上下動してもよいが、熟成工程中に少なくとも一回は上下動すれば、本発明の効果を発揮することができる。
このようなヒーターパワーにすることで、ヒーターパワーを過剰に大きくせずに熟成中に溶融液が固化することを効率的に防止できる。また、ヒーターパワーを上記範囲にすることで、ヒーターの上下動を、より安全に実施できるし、コストの上昇も抑えられる。
このように、2時間以上高温に維持することで、難溶性のドーパントを多量に投入した場合等でも、溶融液中の溶け残りを十分に溶け込ませることができる。また、熟成時間が長いほうが、より溶け残りが低減されて操業性は良くなるが、あまりに熟成時間が長いと全体の操業時間が長くなってしまうので、再溶融にかかる時間や再溶融率等を考慮すると、熟成時間の上限を10時間とするのが好ましい。
このような速さであれば、ヒーターによる加熱中に、より安全に上下動させることができる。
このような幅で上下動させることにより、ルツボと溶融液がより均一に加熱されて、溶融液中の溶け残りをより低減でき、さらにルツボ表面の局所的な劣化が抑制されるため、後工程の単結晶引き上げ中に、より効果的に有転位化を防止することができる。
このように上下動させることにより、ルツボや溶融液を下方まで均一に加熱することができ、より効果的に後工程での有転位化を防止することができる。
これにより、熟成工程中に溶融液に磁場が印加され、後工程の単結晶引き上げ中の有転位化をさらに抑制することができる。これは、磁場を印加することにより、ルツボ表面の結晶化による改善が、ヒーター・ルツボの相対位置移動により、満遍無くなされるためと推測される。
このように、熟成工程中にルツボとヒーターの移動位置やヒーターパワーを、熟成工程終了時には単結晶育成工程の結晶育成開始位置、結晶育成開始温度になるように調整することで、溶融液やヒーターの状態を熟成工程から単結晶育成工程にスムーズに移行することができるため、生産性がより向上する。さらに、この熟成の開始から、最期のヒーター移動やヒーターパワーの調整を自動で行うことで、毎回同じ条件での熟成を実施することができ、操業性のバラツキがなく、単結晶の製造を実施することができ、作業負担も軽減される。
このとき、上記熟成工程に続いて、磁場を印加したまま溶融液の対流を制御しながら単結晶を引き上げるMCZ法(Magnetic field applied CZ法)を用いることもできる。
(実施例1)
直径32インチ(81cm)のルツボを用いて、直径300mmの単結晶棒の製造を行った。まず、結晶原料の初期溶融を実施した後、すぐに温度(ヒーターパワー)を下げるのではなく、一度、溶融時のヒーターパワーと、結晶成長開始時のヒーターパワーの丁度中間に合わせて、その後2時間維持して熟成する工程を設け、その後結晶成長開始時適正温度まで下げて、単結晶育成を行った。
このときのヒーターパワーは、溶融時のヒーターパワーを200kW、結晶成長を開始する時のヒーターパワーを150kW、熟成している間のヒーターパワーを175kWとした。また、熟成工程終了直後の結晶成長開始時点の位置関係は「ヒータースリット下端~メルト底の間の距離」を150mmとした。
この条件で30本引上げた時の再溶融率は0.3、DF化率は80%となった。
次に、熟成工程中のヒーターとルツボの位置、上下動の幅を変えて、それ以外のヒーターパワー等の条件は実施例1と同じにして、単結晶製造を行った。
熟成工程において、ヒータースリットの下端が、メルト底と同じになる位置に合わせるようにヒーターを最初は下げておき、2時間の熟成の間に15cm上昇させ、最終的なルツボやヒーターの位置を単結晶育成の開始条件(実施例1と同じ)と合わせるように、自動で実施した。
この条件で30本引上げた時の再溶融率0.29、DF化率80%と、実施例1とほぼ同等となり、且つ、自動になった事により、作業者は、手動でヒーター移動などをすることなく、同等の操業性改善効果が得られた。
さらに、熟成工程中のヒーターとルツボの位置、上下動の幅を変えて、それ以外のヒーターパワー等の条件は実施例1と同じにして、単結晶製造を行った。
熟成工程において、ヒータースリット下端の位置を、メルト底から10cm上の位置に合わせるように最初はヒーターを下げておき、2時間の熟成の間に5cm上昇させ、最終的なルツボやヒーターの位置を、単結晶育成の開始条件(実施例1と同じ)と合わせるように、自動で実施した。
この条件で30本引上げた時の再溶融率0.5、DF化率77%と、移動させないよりは改善するものの、実施例1、2には及ばない結果となった。やはり、上下動の幅は10cm以上、そして、ヒータースリット下端~メルト底の間隔を一旦は5cm以下にする事が望ましいと言える。
直径32インチ(81cm)のルツボを用いて、直径300mmの結晶製造を行った。まず、結晶原料の初期溶融を実施した後、すぐに温度(ヒーターパワー)を、結晶育成を開始する適正温度まで下げてから結晶育成を行った。
このときのヒーターパワーは、溶融時のヒーターパワーを200kW、結晶成長を開始する時のヒーターパワーを150kWとした。また、結晶成長開始時点の位置関係は「ヒータースリット下端~メルト底の間の距離」を150mmとした。溶融終了から結晶成長開始までの時間は温度が安定するまでの時間を含めて30分程度であった。
この条件で30本引上げた時の再溶融率は1.2、DF化率は70%となった。
比較例1と同じ条件で、ただし、結晶原料の初期溶融を実施した後、すぐに温度(ヒーターパワー)を下げるのではなく、ヒーターパワーを溶融時のヒーターパワーと、結晶成長開始時のヒーターパワーの丁度中間に合わせて、その後2時間維持して熟成する工程を設けた。その後、結晶成長開始時の適正温度まで下げて、結晶育成を行った。この熟成する工程中にはルツボとヒーターは固定された状態にした。
この条件で30本引上げた時の再溶融率は0.8、DF化率は70%となった。
Claims (9)
- 少なくとも、結晶原料をルツボ内でヒーターにより加熱溶融して溶融液を生成する工程と、該溶融液を高温に維持して熟成させる工程と、該熟成後の溶融液に種結晶を浸漬して単結晶を育成する工程とを含む、チョクラルスキー法により単結晶を製造する方法であって、
前記熟成工程において、前記ヒーターと前記ルツボを相対的に上下動させることを特徴とする単結晶の製造方法。
- 前記熟成工程におけるヒーターパワーを、前記熟成工程開始時は、前記単結晶を育成する工程の開始時より大きく、前記溶融液を生成する工程の時と同じか小さい値とし、前記熟成工程終了時は、前記溶融液を生成する工程より小さく、前記単結晶を育成する工程の開始時と同じか大きい値とすることを特徴とする請求項1に記載の単結晶の製造方法。
- 前記熟成工程において、前記溶融液を2時間以上熟成させることを特徴とする請求項1又は請求項2に記載の単結晶の製造方法。
- 前記熟成工程において、前記ヒーターと前記ルツボを相対的に2mm/min以下の速さで上下動させることを特徴とする請求項1乃至請求項3のいずれか一項に記載の単結晶の製造方法。
- 前記熟成工程において、前記ヒーターと前記ルツボを相対的に10cm以上の幅で上下動させることを特徴とする請求項1乃至請求項4のいずれか一項に記載の単結晶の製造方法。
- 前記熟成工程において、前記ヒーターのヒータースリット下端の移動下限位置が、前記ルツボ内の溶融液の最下端から5cm上より下の位置になるように、前記ヒーターと前記ルツボを相対的に上下動させることを特徴とする請求項1乃至請求項5のいずれか一項に記載の単結晶の製造方法。
- 前記熟成工程において、前記ルツボ内の溶融液に磁場を印加することを特徴とする請求項1乃至請求項6のいずれか一項に記載の単結晶の製造方法。
- 前記熟成工程において、前記ヒーターと前記ルツボの相対的な上下動の移動、及び/又は、前記ヒーターパワーを自動で調節して、前記ヒーターと前記ルツボの熟成工程における最終位置を、前記単結晶を育成する工程における結晶育成開始位置とし、前記ヒーターパワーを育成開始時の値になるように調節することを特徴とする請求項1乃至請求項7のいずれか一項に記載の単結晶の製造方法。
- 前記ルツボの直径を、32インチ(81cm)以上にすることを特徴とする請求項1乃至請求項8のいずれか一項に記載の単結晶の製造方法。
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| US7179330B2 (en) * | 2002-04-24 | 2007-02-20 | Shin-Etsu Handotai Co., Ltd. | Method of manufacturing silicon single crystal, silicon single crystal and silicon wafer |
| JP4829176B2 (ja) * | 2007-06-08 | 2011-12-07 | シルトロニック・ジャパン株式会社 | 単結晶の製造方法 |
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