WO2010072044A1 - 一种基于金属钛的mems机械继电器的制备方法 - Google Patents

一种基于金属钛的mems机械继电器的制备方法 Download PDF

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Publication number
WO2010072044A1
WO2010072044A1 PCT/CN2009/001163 CN2009001163W WO2010072044A1 WO 2010072044 A1 WO2010072044 A1 WO 2010072044A1 CN 2009001163 W CN2009001163 W CN 2009001163W WO 2010072044 A1 WO2010072044 A1 WO 2010072044A1
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Prior art keywords
glass
titanium
substrate
etching
titanium substrate
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PCT/CN2009/001163
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English (en)
French (fr)
Inventor
陈兢
舒琼
张轶铭
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Peking University
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Peking University
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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01HELECTRIC SWITCHES; RELAYS; SELECTORS; EMERGENCY PROTECTIVE DEVICES
    • H01H1/00Contacts
    • H01H1/0036Switches making use of microelectromechanical systems [MEMS]
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81CPROCESSES OR APPARATUS SPECIALLY ADAPTED FOR THE MANUFACTURE OR TREATMENT OF MICROSTRUCTURAL DEVICES OR SYSTEMS
    • B81C1/00Manufacture or treatment of devices or systems in or on a substrate
    • B81C1/00436Shaping materials, i.e. techniques for structuring the substrate or the layers on the substrate
    • B81C1/00523Etching material
    • B81C1/00547Etching processes not provided for in groups B81C1/00531 - B81C1/00539
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B81MICROSTRUCTURAL TECHNOLOGY
    • B81BMICROSTRUCTURAL DEVICES OR SYSTEMS, e.g. MICROMECHANICAL DEVICES
    • B81B2201/00Specific applications of microelectromechanical systems
    • B81B2201/01Switches
    • B81B2201/012Switches characterised by the shape
    • B81B2201/018Switches not provided for in B81B2201/014 - B81B2201/016

Definitions

  • the invention relates to a microelectromechanical system (MEMS) micromachining technology, in particular to a preparation method of a metal titanium based MEMS mechanical relay.
  • MEMS microelectromechanical system
  • Micromechanical relays rely on mechanical movement to achieve relay control of signal transmission lines, with low insertion loss, high linearity, high isolation and other advantages that CMOS relays can't match.
  • MEMS Micro Electro Mechanical System
  • MEMS relays use silicon as a structural material.
  • the silicon material itself has poor electrical conductivity, so it is necessary to form a layer of metal on the side wall contact surface. It is difficult to complete the side wall covering by the common deposition method, although partial plating, sputtering, evaporation, etc., or special processes such as Shadow Mask are used.
  • MEMS relay uses metal as a structural material, and their function and reliability have been tested in practice. If a MEMS relay can be fabricated from a metal material, it not only solves the contact resistance problem well, but also reduces system failure. Compared with silicon, metal materials not only have good electrical conductivity, but also have good ductility and impact strength. Their fracture toughness is usually two orders of magnitude higher than that of silicon materials. Metallic materials are used to make movable contact parts. More reliable. However, there is currently no mature method for processing high-aspect ratio metal micro-mechanical relays. Summary of the invention
  • the present invention overcomes the deficiencies in the prior art and provides a method of fabricating a MEMS mechanical relay based on titanium metal.
  • a method for preparing a MEMS mechanical relay based on metal ruthenium the steps of which include:
  • the titanium substrate is back-thinned, lithographically patterned, and etched deep, through a titanium substrate to form a MEMS mechanical relay.
  • the glass is D263T, soda lime glass, FOTURAN glass, B270 glass.
  • the step 1) forms a shallow groove having a height of 5 ⁇ m - 10 ⁇ m.
  • the anodic bonding of the metal titanium substrate and the glass substrate may be performed at a temperature of 350-450 Torr, a voltage of 350-750 V, and a pressure of 1000-2000 N.
  • the deep etching in the step 4) is specifically that the etching gas is chlorine gas, and the etching parameters are: coil power 300-500 W, plate power 50W-200W, gas flow 30-70 sccm.
  • Figure 1 is a process flow diagram for preparing a MEMS mechanical relay of the present invention. detailed description
  • titanium substrate is selected as structural material; glass with thermal expansion coefficient matching titanium substrate (thermal expansion coefficient of 8.6-9.4 ppm/°C) is selected.
  • the substrate serves as a substrate such as D263T glass (7.2), soda lime glass (9.4), FOTURAN glass (8.6), B270 glass (9.4), and the like.
  • the surface of the titanium substrate is lithographically patterned and etched to form shallow trenches, such as 5-10 ⁇ m, as shown in Figure 1 (a).
  • a layer of metal is deposited on the surface of the glass, such as 200 nm gold, copper, etc., and lithographically patterned to form a metal wiring, as shown in Figure 1 (b).
  • the titanium substrate and the glass substrate are anodic bonded. As shown in Fig. 1 (c), the bonding parameters are: temperature 350-450 ° C, voltage 350-750 V, pressure 1000-2000 N, vacuum, lasting 30 min.
  • the titanium substrate is thinned and deep etched, and the titanium substrate is etched through; Specifically, the titanium substrate is thinned, and the substrate is thinned to a suitable thickness by chemical mechanical polishing, such as
  • a deep etching mask such as a SU8 photoresist having a thickness of about 20 m, a metal or oxide hard mask, etc., is deposited on the surface of the titanium substrate, and patterned;
  • the titanium substrate is etched through (Fig. le), and the etching gas is chlorine gas.
  • the etching parameters are: coil power 300-500W, plate power 50-200W, gas flow 30-70sccm, gas pressure 3mT.

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Micromachines (AREA)

Description

一种基于金属钛的 MEMS机械继电器的制备方法 技术领域
本发明是关于微电子机械系统 (MEMS) 微加工技术, 具体涉及一种基于金属钛的 MEMS机械继电器的制备方法。 背景技术
微机械继电器依靠机械移动实现对信号传输线的继电器控制,具有低插损、高线性、 高隔离度等 CMOS继电器无法比拟的优点。 随着 MEMS (微电子机械系统) 技术的发 展, 在同一衬底上大批量、低成本、高密度集成包括继电器 /继电器在内的微小机械结构 成为可能, 但目前 MEMS继电器都使用硅作为结构材料, 硅材料本身导电性能不佳, 所以需要在侧墙接触面形成一层金属, 普通淀积方法难以完成侧墙覆盖, 虽然采用局部 电鍍、 溅射、 蒸发等方法, 或使用 Shadow Mask等特殊工艺能形成侧墙覆盖, 但膜的质 量仍然不如平面生长, 长时间工作将导致接触失效, 包括接触点融合造成的无法关断和 接触退化造成的接触电阻激增甚至绝缘, 在传输大电流和使用热驱动继电器时, 失效问 题尤其严重。
传统继电器均使用金属做为结构材料, 其功能和可靠性已经过大量实践考验。 如果 能使用金属材料制作 MEMS继电器, 不仅能很好的解决接触电阻问题, 还可以减小系 统失效。 与硅相比, 金属材料不仅具有很好的导电性, 还具有很好的延展性和抗冲击强 度, 其断裂韧度通常比硅材料高两个数量级, 使用金属材料制作可动接触零部件其可靠 性更高。 但目前对于高深宽比的金属微机械继电器的加工, 还没有一种成熟的方法。 发明内容
本发明克服了现有技术中的不足,提供了一种基于金属钛的 MEMS机械继电器的制 备方法。
本发明的技术方案是:
一种基于金属钕的 MEMS机械继电器的制备方法, 其步骤包括:
1)对钛基底光刻图形化, 刻蚀形成浅槽;
2)选择热膨胀系数与钛匹配的玻璃, 在玻璃的表面制备金属连线; 3)将钛基底和玻璃基底进行阳极键合;
4)对钛基底进行背面减薄, 光刻图形化, 并进行深刻蚀, 穿通钛基底, 形成 MEMS 机械继电器。
所述玻璃为 D263T、 钠钙玻璃、 FOTURAN玻璃、 B270玻璃。
所述步骤 1) 形成的浅槽的高度为 5 μ m— 10 μ m。
所述金属钛基底和玻璃基底阳极键合的参数可为:温度 350-450Ό ,电压 350-750V, 压力 1000-2000N。
所述步骤 4)中所述深刻蚀具体为, 刻蚀气体为氯气, 刻蚀参数为: 线圈功率 300-500 W, 平板功率 50W-200W, 气体流量 30-70sccm。
与现有技术相比, 本发明的有益效果是:
通过钛-玻璃阳极键合、 化学机械抛光和钛深刻蚀等工艺, 可在玻璃衬底上实现低 成本、高精度、高深宽比的金属钛三维可动结构的加工,从而实现了基于金属钛的 MEMS 机械继电器。 附图说明
图 1为制备本发明 MEMS机械继电器的工艺流程图。 具体实施方式
下面结合附图和具体实施方式对本发明作进一步详细描述- 一、 衬底的制备: 选用钛基底作为结构材料; 选用热膨胀系数与钛基底(热膨胀系 数为 8.6-9.4ppm/°C )匹配的玻璃基底作为衬底, 比如 D263T玻璃(7.2)、钠钙玻璃 (9.4)、 FOTURAN玻璃 (8.6), B270玻璃 (9.4) 等。
二、 钛基底表面光刻图形化, 并刻蚀形成浅槽, 如 5-10 μ ιη深, 如图 1 (a)。
三、 玻璃表面淀积一层金属, 比如 200nm 的金、 铜等, 光刻图形化, 形成金属连 线, 如图 1 ( b)。
四、 钛基底和玻璃基底进行阳极键合, 如图 1 (c), 键合参数为: 温度 350-450°C, 电压 350-750V, 压力 1000-2000N, 真空, 持续 30min。
五、 钛基底减薄, 并进行深刻蚀, 将钛基底刻蚀穿通; 具体为, 钛基底减薄, 通过化学机械抛光的方法, 将基片减薄至合适的厚度, 如
20-100 rn (图 ld)。
然后, 钛基底表面淀积深刻蚀掩膜, 如厚约 20 m 的 SU8光刻胶、 金属或氧化物 硬掩膜等, 并图形化;
通过深刻蚀, 将钛基底刻蚀穿通 (图 le), 刻蚀气体为氯气, 刻蚀参数为: 线圈功 率 300-500W, 平板功率 50-200W, 气体流量 30-70sccm, 气压 3mT。 以上通过详细实施例描述了本发明所提供的 MEMS机械继电器的制备方法, 本领 域的技术人员应当理解, 在不脱离本发明实质的范围内, 可以对本发明做一定的变形或 修改; 其制备方法也不限于实施例中所公开的内容。

Claims

权利要求书
1、 一种基于金属钛的 MEMS机械继电器的制备方法, 其步骤包括:
1)对钛基底光刻图形化, 刻蚀形成浅槽;
2)选择热膨胀系数与金属钛匹配的玻璃, 在玻璃的表面制备金属连线;
3)将钛基底和玻璃基底进行阳极键合;
4)对钛基底进行背面减薄, 光刻图形化, 并进行深刻蚀, 穿通钛基底, 形成 MEMS 机械继电器。
2、 如权利要求 1所述的制备方法, 其特征在于, 所述玻璃为 D263T玻璃、 钠钙玻 璃 FOTURAN玻璃或 B270玻璃。
3、 如权利要求 1或 2所述的制备方法, 其特征在于, 所述步骤 1) 形成的浅槽的高 度为 5 μ ιη― 10 μ πι。
4、 如权利要求 1或 2所述的制备方法, 其特征在于, 所述钛基底和玻璃基底阳极 键合的参数为: 温度 350-450°C, 电压 350-750V, 压力 1000-2000N。
5、 如权利要求 1或 2所述的制备方法, 其特征在于, 所述步骤 4)中所述深刻蚀具 体为, 刻蚀气体为氯气, 刻蚀参数为: 线圈功率 300-500W, 平板功率 50W-200W, 气 体流量 30-70sccm。
PCT/CN2009/001163 2008-12-25 2009-10-20 一种基于金属钛的mems机械继电器的制备方法 Ceased WO2010072044A1 (zh)

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Publication number Priority date Publication date Assignee Title
CN101447369B (zh) * 2008-12-25 2011-11-09 北京大学 一种基于金属钛的mems机械继电器的制备方法
CN102044380A (zh) * 2010-12-31 2011-05-04 航天时代电子技术股份有限公司 一种金属mems电磁继电器
CN102938350B (zh) * 2012-11-23 2014-12-03 北京大学 一种可延长接触时间的微冲击开关及其制备方法
CN109033555A (zh) * 2018-07-04 2018-12-18 哈尔滨工业大学 结合制造工艺及仿真的继电器类单机贮存可靠性评估方法
CN114199428A (zh) * 2021-12-31 2022-03-18 南京芯源麦姆斯科技有限公司 一种mems内腔局部减薄工艺方法及其应用

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CN1301665A (zh) * 1999-12-24 2001-07-04 森桑诺尔有限公司 对微机电装置的某些改进
WO2002057180A2 (en) * 2000-12-27 2002-07-25 Honeywell International Inc. Soi/glass process for forming thin silicon micromachined structures
CN1817784A (zh) * 2006-03-10 2006-08-16 中国科学院上海微系统与信息技术研究所 凸点连接气密封装微机械系统器件的结构及制作方法
US20070234794A1 (en) * 2006-04-06 2007-10-11 Chin-Chang Pan Micro sample heating apparatus and method of making the same
CN101447369A (zh) * 2008-12-25 2009-06-03 北京大学 一种基于金属钛的mems机械继电器的制备方法

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN1301665A (zh) * 1999-12-24 2001-07-04 森桑诺尔有限公司 对微机电装置的某些改进
WO2002057180A2 (en) * 2000-12-27 2002-07-25 Honeywell International Inc. Soi/glass process for forming thin silicon micromachined structures
CN1817784A (zh) * 2006-03-10 2006-08-16 中国科学院上海微系统与信息技术研究所 凸点连接气密封装微机械系统器件的结构及制作方法
US20070234794A1 (en) * 2006-04-06 2007-10-11 Chin-Chang Pan Micro sample heating apparatus and method of making the same
CN101447369A (zh) * 2008-12-25 2009-06-03 北京大学 一种基于金属钛的mems机械继电器的制备方法

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